AU1129500A - Environmentally controllable sample holder for x-ray diffractometer (xrd) - Google Patents

Environmentally controllable sample holder for x-ray diffractometer (xrd)

Info

Publication number
AU1129500A
AU1129500A AU11295/00A AU1129500A AU1129500A AU 1129500 A AU1129500 A AU 1129500A AU 11295/00 A AU11295/00 A AU 11295/00A AU 1129500 A AU1129500 A AU 1129500A AU 1129500 A AU1129500 A AU 1129500A
Authority
AU
Australia
Prior art keywords
xrd
sample holder
ray diffractometer
controllable sample
environmentally controllable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU11295/00A
Inventor
Charles Amick Buckner Iii
William Christopher Kidd III
Peter Gregory Varlashkin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Glaxo Group Ltd
Original Assignee
Glaxo Group Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Glaxo Group Ltd filed Critical Glaxo Group Ltd
Publication of AU1129500A publication Critical patent/AU1129500A/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor
AU11295/00A 1998-10-21 1999-10-21 Environmentally controllable sample holder for x-ray diffractometer (xrd) Abandoned AU1129500A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10510398P 1998-10-21 1998-10-21
US60105103 1998-10-21
PCT/US1999/024678 WO2000023795A1 (en) 1998-10-21 1999-10-21 Environmentally controllable sample holder for x-ray diffractometer (xrd)

Publications (1)

Publication Number Publication Date
AU1129500A true AU1129500A (en) 2000-05-08

Family

ID=22304039

Family Applications (1)

Application Number Title Priority Date Filing Date
AU11295/00A Abandoned AU1129500A (en) 1998-10-21 1999-10-21 Environmentally controllable sample holder for x-ray diffractometer (xrd)

Country Status (2)

Country Link
AU (1) AU1129500A (en)
WO (1) WO2000023795A1 (en)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10232172B4 (en) 2002-07-16 2005-03-10 Proteros Biostructures Gmbh Apparatus and method for creating a defined environment for particulate samples
DE10322040A1 (en) * 2003-05-16 2004-12-09 Forschungszentrum Karlsruhe Gmbh Coupling and adjustment device for an X-ray diffractometer
FR2856793B1 (en) * 2003-06-24 2006-04-14 Inst Francais Du Petrole POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION
EP1947448B1 (en) 2007-01-19 2013-07-03 Panalytical B.V. X-ray diffraction equipment for X-ray scattering
ES2378045B1 (en) * 2009-04-13 2013-02-15 Consejo Superior De Investigaciones Científicas (Csic) DEVICE FOR HOUSING A SAMPLE INSIDE A DISPERSION CHAMBER OR X-RAY DIFFACTION.
FR2978246B1 (en) * 2011-07-21 2014-06-06 Commissariat Energie Atomique INTEGRATED THERMOCOUPLE SAMPLE HOLDER
GB2514125B (en) 2013-05-13 2016-10-05 Nikon Metrology Nv X-ray imaging system with climate control
EP2848924B1 (en) 2013-09-11 2016-08-24 Anton Paar GmbH Tempering chamber for compact x-ray apparatus
EP2927943A1 (en) 2014-04-04 2015-10-07 Nordson Corporation X-ray inspection apparatus for inspecting semiconductor wafers
RU2650836C1 (en) * 2016-12-14 2018-04-17 федеральное государственное автономное образовательное учреждение высшего образования "Московский физико-технический институт (государственный университет)" Sample assembly block, intended for conducting combined measurements by x-ray structural analysis in a sliding bundle and additional physico-chemical methods of the study
US11921062B2 (en) 2018-05-11 2024-03-05 Universite De Rouen-Normandie Anti-frosting and anti-dew device for spectroscopic measurements
WO2020105725A1 (en) * 2018-11-23 2020-05-28 株式会社リガク Single-crystal x-ray structural analysis sample occlusion device and occlusion method
CN110031362A (en) * 2019-02-26 2019-07-19 中国科学技术大学 A kind of steam stretching, extension rheometer
CN111933832B (en) * 2020-09-03 2023-10-20 广州阳瑞仪器科技有限公司 In-situ battery accessory of X-ray diffractometer and assembling method
CN113049618B (en) * 2021-03-10 2022-12-09 华研环科(北京)科技有限公司 High-temperature high-pressure in-situ XRD testing device
CN113406128B (en) * 2021-07-23 2022-11-11 重庆大学 Temperature control accessory for X-ray diffractometer
CN113945594B (en) * 2021-10-11 2023-03-24 安徽科技学院 Rotary sample table for X-ray diffraction analysis for assembling vertical goniometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2683933B2 (en) * 1989-01-20 1997-12-03 信越半導体株式会社 Inspection device for front and back and orientation of semiconductor wafer
US5084910A (en) * 1990-12-17 1992-01-28 Dow Corning Corporation X-ray diffractometer sample holder
US5390230A (en) * 1993-03-30 1995-02-14 Valence Technology, Inc. Controlled atmosphere, variable volume sample holder for x-ray diffractomer
JP3166638B2 (en) * 1996-11-29 2001-05-14 株式会社島津製作所 X-ray fluorescence analyzer
US5848122A (en) * 1997-03-25 1998-12-08 Advanced Technology Materials, Inc. Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers

Also Published As

Publication number Publication date
WO2000023795A9 (en) 2000-08-24
WO2000023795A1 (en) 2000-04-27

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase