FR2856793B1 - POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION - Google Patents

POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION

Info

Publication number
FR2856793B1
FR2856793B1 FR0307641A FR0307641A FR2856793B1 FR 2856793 B1 FR2856793 B1 FR 2856793B1 FR 0307641 A FR0307641 A FR 0307641A FR 0307641 A FR0307641 A FR 0307641A FR 2856793 B1 FR2856793 B1 FR 2856793B1
Authority
FR
France
Prior art keywords
ray diffraction
analysis device
powder analysis
powder
diffraction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0307641A
Other languages
French (fr)
Other versions
FR2856793A1 (en
Inventor
Herve Palancher
Christophe Pichon
Sylvain Prevot
Gerard Conan
Jean Louis Hodeau
Jean Francois Berar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IFP Energies Nouvelles IFPEN
Original Assignee
IFP Energies Nouvelles IFPEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IFP Energies Nouvelles IFPEN filed Critical IFP Energies Nouvelles IFPEN
Priority to FR0307641A priority Critical patent/FR2856793B1/en
Priority to DE200410029721 priority patent/DE102004029721A1/en
Publication of FR2856793A1 publication Critical patent/FR2856793A1/en
Application granted granted Critical
Publication of FR2856793B1 publication Critical patent/FR2856793B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G01N23/20033—Sample holders or supports therefor provided with temperature control or heating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
FR0307641A 2003-06-24 2003-06-24 POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION Expired - Fee Related FR2856793B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0307641A FR2856793B1 (en) 2003-06-24 2003-06-24 POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION
DE200410029721 DE102004029721A1 (en) 2003-06-24 2004-06-21 Powder analyzer by diffraction of X-rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0307641A FR2856793B1 (en) 2003-06-24 2003-06-24 POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION

Publications (2)

Publication Number Publication Date
FR2856793A1 FR2856793A1 (en) 2004-12-31
FR2856793B1 true FR2856793B1 (en) 2006-04-14

Family

ID=33515376

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0307641A Expired - Fee Related FR2856793B1 (en) 2003-06-24 2003-06-24 POWDER ANALYSIS DEVICE BY X-RAY DIFFRACTION

Country Status (2)

Country Link
DE (1) DE102004029721A1 (en)
FR (1) FR2856793B1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2729791B1 (en) 2011-07-05 2020-10-21 University of Cape Town Sample presentation device for radiation-based analytical equipment
US8597598B2 (en) 2011-07-12 2013-12-03 University Of Cape Town Sample presentation device for radiation-based analytical equipment
EP2848924B1 (en) 2013-09-11 2016-08-24 Anton Paar GmbH Tempering chamber for compact x-ray apparatus
WO2015040123A2 (en) * 2013-09-19 2015-03-26 Flsmidth A/S Front-loading sample preparation apparatus and methods thereof
US10359376B2 (en) * 2016-07-20 2019-07-23 Malvern Panalytical B.V. Sample holder for X-ray analysis
FR3072777B1 (en) * 2017-10-23 2019-12-27 Centre National De La Recherche Scientifique PORTABLE ANALYSIS OVEN FOR RADIATION LINE

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1072397A (en) * 1963-12-11 1967-06-14 Inst Obschchei I Neorganichesk X-ray testing apparatus
SU1081492A1 (en) * 1983-04-07 1984-03-23 Днепропетровский химико-технологический институт им.Ф.Э.Дзержинского Device for radiographic investigation of solid body - gas reaction products
US4641329A (en) * 1985-04-23 1987-02-03 The United States Of America As Represented By The United States Department Of Energy Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus
WO2000023795A1 (en) * 1998-10-21 2000-04-27 Glaxo Group Limited Environmentally controllable sample holder for x-ray diffractometer (xrd)
FR2785680B1 (en) * 1998-11-09 2000-12-08 Inst Francais Du Petrole DEVICE FOR TESTING ROCK SAMPLES AT RELATIVELY HIGH PRESSURE AND TEMPERATURE

Also Published As

Publication number Publication date
FR2856793A1 (en) 2004-12-31
DE102004029721A1 (en) 2005-01-13

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Legal Events

Date Code Title Description
CD Change of name or company name
ST Notification of lapse

Effective date: 20120229