ZA202207869B - Anti-interference detection system of metering chip and computer readable storage medium - Google Patents

Anti-interference detection system of metering chip and computer readable storage medium

Info

Publication number
ZA202207869B
ZA202207869B ZA2022/07869A ZA202207869A ZA202207869B ZA 202207869 B ZA202207869 B ZA 202207869B ZA 2022/07869 A ZA2022/07869 A ZA 2022/07869A ZA 202207869 A ZA202207869 A ZA 202207869A ZA 202207869 B ZA202207869 B ZA 202207869B
Authority
ZA
South Africa
Prior art keywords
storage medium
computer readable
readable storage
detection system
interference detection
Prior art date
Application number
ZA2022/07869A
Other languages
English (en)
Inventor
Li Qingxian
Liu Liangjiang
Bai Wenqi
Yang Ye
Xiang De
Wang Jinwei
Zhu Xianyu
Liu Qing
ZUO Congrui
Original Assignee
Hunan Inst Of Metrology And Test
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hunan Inst Of Metrology And Test filed Critical Hunan Inst Of Metrology And Test
Publication of ZA202207869B publication Critical patent/ZA202207869B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
    • G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
    • G01R22/061—Details of electronic electricity meters
    • G01R22/066—Arrangements for avoiding or indicating fraudulent use
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
ZA2022/07869A 2021-08-17 2022-07-15 Anti-interference detection system of metering chip and computer readable storage medium ZA202207869B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202110939875.8A CN113406483B (zh) 2021-08-17 2021-08-17 一种计量芯片的抗干扰检测系统及计算机可读存储介质

Publications (1)

Publication Number Publication Date
ZA202207869B true ZA202207869B (en) 2022-11-30

Family

ID=77688601

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA2022/07869A ZA202207869B (en) 2021-08-17 2022-07-15 Anti-interference detection system of metering chip and computer readable storage medium

Country Status (3)

Country Link
CN (1) CN113406483B (zh)
LU (1) LU502568B1 (zh)
ZA (1) ZA202207869B (zh)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101750580B (zh) * 2008-12-01 2012-05-09 豪雅微电子(苏州)有限公司 集成电路中功能模块芯片的测试方法
CN104635190B (zh) * 2014-12-31 2017-05-03 漳州科能电器有限公司 一种计量芯片抗干扰检测及纠错方法和装置
US10551423B1 (en) * 2015-01-13 2020-02-04 The United States Of America As Represented By The Secretary Of The Army System and method for simultaneous testing of radiation, environmental and electrical reliability of multiple semiconductor electrical devices
CN110673075B (zh) * 2019-09-03 2021-12-10 国网江西省电力有限公司电力科学研究院 一种特高频局部放电检测仪抗电磁干扰性能的评价方法
CN111487489A (zh) * 2020-03-26 2020-08-04 珠海格力电器股份有限公司 一种芯片抗干扰度的评估方法及装置
CN112611956B (zh) * 2020-12-25 2021-07-06 深圳群芯微电子有限责任公司 一种新能源汽车集成电路芯片测试系统

Also Published As

Publication number Publication date
CN113406483B (zh) 2021-10-29
LU502568B1 (en) 2023-01-26
CN113406483A (zh) 2021-09-17

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