ZA202207869B - Anti-interference detection system of metering chip and computer readable storage medium - Google Patents

Anti-interference detection system of metering chip and computer readable storage medium

Info

Publication number
ZA202207869B
ZA202207869B ZA2022/07869A ZA202207869A ZA202207869B ZA 202207869 B ZA202207869 B ZA 202207869B ZA 2022/07869 A ZA2022/07869 A ZA 2022/07869A ZA 202207869 A ZA202207869 A ZA 202207869A ZA 202207869 B ZA202207869 B ZA 202207869B
Authority
ZA
South Africa
Prior art keywords
storage medium
computer readable
readable storage
detection system
interference detection
Prior art date
Application number
ZA2022/07869A
Inventor
Li Qingxian
Liu Liangjiang
Bai Wenqi
Yang Ye
Xiang De
Wang Jinwei
Zhu Xianyu
Liu Qing
ZUO Congrui
Original Assignee
Hunan Inst Of Metrology And Test
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hunan Inst Of Metrology And Test filed Critical Hunan Inst Of Metrology And Test
Publication of ZA202207869B publication Critical patent/ZA202207869B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R22/00—Arrangements for measuring time integral of electric power or current, e.g. electricity meters
    • G01R22/06—Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods
    • G01R22/061—Details of electronic electricity meters
    • G01R22/066—Arrangements for avoiding or indicating fraudulent use
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
ZA2022/07869A 2021-08-17 2022-07-15 Anti-interference detection system of metering chip and computer readable storage medium ZA202207869B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202110939875.8A CN113406483B (en) 2021-08-17 2021-08-17 Anti-interference detection system of metering chip and computer readable storage medium

Publications (1)

Publication Number Publication Date
ZA202207869B true ZA202207869B (en) 2022-11-30

Family

ID=77688601

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA2022/07869A ZA202207869B (en) 2021-08-17 2022-07-15 Anti-interference detection system of metering chip and computer readable storage medium

Country Status (3)

Country Link
CN (1) CN113406483B (en)
LU (1) LU502568B1 (en)
ZA (1) ZA202207869B (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101750580B (en) * 2008-12-01 2012-05-09 豪雅微电子(苏州)有限公司 Test method of functional module chip in integrated circuit
CN104635190B (en) * 2014-12-31 2017-05-03 漳州科能电器有限公司 Measuring chip anti-interference detection and error correction method and device
US10551423B1 (en) * 2015-01-13 2020-02-04 The United States Of America As Represented By The Secretary Of The Army System and method for simultaneous testing of radiation, environmental and electrical reliability of multiple semiconductor electrical devices
CN110673075B (en) * 2019-09-03 2021-12-10 国网江西省电力有限公司电力科学研究院 Method for evaluating electromagnetic interference resistance of ultrahigh frequency partial discharge detector
CN111487489A (en) * 2020-03-26 2020-08-04 珠海格力电器股份有限公司 Method and device for evaluating anti-interference degree of chip
CN112611956B (en) * 2020-12-25 2021-07-06 深圳群芯微电子有限责任公司 New energy automobile integrated circuit chip test system

Also Published As

Publication number Publication date
CN113406483B (en) 2021-10-29
LU502568B1 (en) 2023-01-26
CN113406483A (en) 2021-09-17

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