WO2024011935A1 - 一种高端电压差分采样校准系统及方法 - Google Patents

一种高端电压差分采样校准系统及方法 Download PDF

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WO2024011935A1
WO2024011935A1 PCT/CN2023/081501 CN2023081501W WO2024011935A1 WO 2024011935 A1 WO2024011935 A1 WO 2024011935A1 CN 2023081501 W CN2023081501 W CN 2023081501W WO 2024011935 A1 WO2024011935 A1 WO 2024011935A1
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operational amplifier
resistor
input terminal
output
voltage
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PCT/CN2023/081501
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English (en)
French (fr)
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钟兴
包智杰
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南京宏泰半导体科技股份有限公司
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Publication of WO2024011935A1 publication Critical patent/WO2024011935A1/zh

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2503Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)

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  • the invention relates to a high-end voltage differential sampling calibration system and method, belonging to the technical field of voltage detection.
  • the existing technology has deviations in voltage output accuracy and cannot reach the ideal state when stable output is required. If the voltage required in the circuit wants to reach a precise value, the tested voltage cannot achieve the ideal precision effect through various devices. During the test, the voltage changed frequently and the stability was slightly poor. Therefore, the value obtained by sampling the voltage signal in the existing technology is not accurate, and there are unstable factors in the output voltage jitter. During the actual test of the voltage output, test data will be lost due to excessive upper and lower bias of some voltages, resulting in inaccurate measurement data and test results will fail. During the testing process, the results of the test items are at the edge of the numerical range, and it is time-consuming and laborious to find the specific causes when encountering problems.
  • the present invention provides a high-end voltage differential sampling calibration system and method.
  • a high-end voltage differential sampling calibration system including an accuracy detector, a calibration controller, a differential operational amplifier, a comparator, a memory, and a DAC converter.
  • the differential operational amplifier is used to collect the positive and negative phase voltages of the device under test, and output the obtained positive and negative phase voltages to the comparator.
  • the comparator is used to collect the positive and negative phase voltages output by the differential operational amplifier, and output the collected positive and negative phase voltages to the storage.
  • the accuracy detector is used to detect the difference between the forward and reverse phase voltages of the device under test collected by the differential operational amplifier, and send the detected difference to the calibration controller.
  • the calibration controller compensates the forward and reverse phase voltages stored in the memory according to the difference value transmitted by the accuracy detector, and obtains the forward and reverse phase voltages that need to be compensated.
  • the DAC converter is used to convert the positive and negative phase voltages that need to be compensated obtained by the calibration controller into signals, and compensate the converted signals into the output voltage of the differential operational amplifier.
  • the inverting input terminal of the second operational amplifier U2 is connected to the power input terminal IN1, the non-inverting input terminal of the second operational amplifier U2 is connected to ground, and the output terminal of the second operational amplifier U2 is connected to the reference signal input terminal of the DAC converter U1. .
  • the inverting input terminal of the operational amplifier three U3 is connected to the signal output terminal one of the DAC converter U1, the non-inverting input terminal of the operational amplifier three U3 is connected to the signal output terminal two of the DAC converter U1, and the operational amplifier three U3 is connected to the signal output terminal two of the DAC converter U1.
  • the non-inverting input terminal of U3 is connected to ground, the output terminal of the operational amplifier U3 is connected to the feedback signal terminal Rfb of the DAC converter U1, one end of the capacitor C2 is connected to the feedback signal terminal Rfb of the DAC converter U1, and the other end is connected to the feedback signal terminal Rfb of the DAC converter U1.
  • Signal output of DAC converter U1 One connection.
  • the inverting input terminal of the operational amplifier six U6 is connected to the output terminal of the operational amplifier three U3 through the resistor R10, the non-inverting input terminal of the operational amplifier six U6 is grounded, and the output terminal of the operational amplifier six U6 is connected to the output terminal of the operational amplifier six U6.
  • Two Forces are connected, one end of the capacitor C2 is connected to the inverting input end of the operational amplifier six U6, and the other end is connected to the output end of the operational amplifier six U6.
  • Test point two TP2 is set on the connection line between output terminal two Force and the output terminal of operational amplifier six U6.
  • Test point two TP2 is connected to the inverting input terminal of operational amplifier six U6 through resistor two RN2.
  • the inverting input terminal of the operational amplifier U5 is connected to the power input terminal IN1 through the resistor RN1, the non-inverting input terminal of the operational amplifier U5 is grounded, and the output terminal of the operational amplifier U5 is connected through the resistor R9
  • the second resistor RN2 is connected to the inverting input terminal of the operational amplifier six U6, and the inverting input terminal of the operational amplifier five U5 is connected to the output terminal of the fifth operational amplifier U5 through the excluded resistor RN1.
  • the inverting input terminal of the operational amplifier U4 is connected to the test point TP1.
  • the positive input terminal of the operational amplifier U4 is connected to the power input terminal IN2 through the resistor R4.
  • the output terminal of the operational amplifier U4 is
  • the test point TP1 is connected to the test point TP1 through the resistor R5.
  • the test point TP1 is connected to the positive input end of the operational amplifier U5 through the resistor R6 and the exclusion resistor RN1.
  • the resistor R7 is connected in parallel to both ends of the resistor R6. end.
  • a sampling resistor RF is connected between the second power input terminal IN2 and the first power input terminal IN1.
  • a high-end voltage differential sampling calibration method includes the following steps:
  • Step 1 The first power input terminal IN1 provides an inverting voltage source, and the second power input terminal IN2 provides a positive phase voltage source.
  • Step 2 The sampling resistor RF serves as the voltage value collection point for the voltage sampling at both ends.
  • Step 3 when it is necessary to collect the inverting voltage, the inverted voltage flows to the inverting input terminal of operational amplifier five U5 through resistor one RN1, and is output to resistor nine R9 and resistor two RN2 through the output terminal of operational amplifier five U5 in turn.
  • operational amplifier six U6, output terminal 2 Force flows out of the output port through the output terminal 2 Force. At this time, the output port voltage of the output terminal 2 Force is not within the test range. It is necessary to use the accuracy detector and calibration control box to test the data. The difference obtained after comparison is transferred to the memory.
  • the calibration controller compensates the forward and reverse voltages stored in the memory according to the difference obtained by the accuracy detector to obtain the forward and reverse voltages that need to be compensated; the DAC converter U1 will need to compensate.
  • the positive and negative phase voltages are used for signal conversion, and the converted signals are compensated into the output voltage of the differential operational amplifier.
  • the present invention has the following beneficial effects:
  • the present invention uses the characteristics of the conversion output of the DAC converter U1 to realize the numerical conversion of the collected voltage signal to achieve a high-precision output voltage difference, and uses a high-precision detector, a high-precision calibration controller to compare the output voltage of the differential operational amplifier to calibrate and compensate the difference to the output end, achieving a stable output voltage state and improving the stability and accuracy of voltage output. It has high measurement accuracy, high efficiency and excellent stability.
  • Figure 1 is a schematic structural diagram of the present invention.
  • FIG. 2 is a circuit diagram of the present invention.
  • a high-end voltage differential sampling calibration system includes an accuracy detector, a calibration controller, a differential operational amplifier, a comparator, a memory, and a DAC converter.
  • the differential operational amplifier is used to collect the positive and negative phase voltages of the device under test, and output the obtained positive and negative phase voltages to the comparator.
  • the comparator is used to collect the positive and negative phase voltages output by the differential operational amplifier, and output the collected positive and negative phase voltages to the storage.
  • the accuracy detector is used to detect the difference between the forward and reverse phase voltages of the device under test collected by the differential operational amplifier, and send the detected difference to the calibration controller.
  • the calibration controller compensates the forward and reverse phase voltages stored in the memory according to the difference value transmitted by the accuracy detector, and obtains the forward and reverse phase voltages that need to be compensated.
  • the DAC converter is used to convert the positive and negative phase voltages that need to be compensated obtained by the calibration controller into signals, and compensate the converted signals into the output voltage of the differential operational amplifier.
  • the accuracy detector and calibration controller are used as calibration tools to compare the voltage values between the output terminals of the differential operational amplifier and the output terminals of the differential operation amplifier.
  • the data signal is stored in the memory.
  • the output voltage of output one is not ideal, the output terminal two is detected by the accuracy detector.
  • the difference in the ideal voltage value is then converted by the calibration controller through DAC conversion to compensate the difference to the output terminals to achieve a highly accurate state of the output terminal voltage.
  • the tools provided include accuracy detectors and calibration controllers.
  • the devices provided by the circuit include differential operational amplifiers, comparators, memories, and DAC chips. Input one and input two are the positive and negative input voltages of the operational amplifier voltage, output one is the output terminal voltage of the differential operational amplifier, and output two is the compensated voltage.
  • the data is sampled via a comparator and transferred to memory.
  • the difference that needs to be compensated through the accuracy detector and the calibration control box is added to or subtracted from the output voltage value through the DAC conversion to the output end to obtain the ideal output voltage state.
  • FIG. 2 it includes operational amplifier two U2, resistor one R1, resistor two R2, DAC converter U1, capacitor C2, operational amplifier three U3, resistor ten R10, resistor two RN2, operational amplifier six U6, and capacitor three.
  • the inverting input terminal of the second operational amplifier U2 is connected to the power input terminal IN1, the non-inverting input terminal of the second operational amplifier U2 is connected to ground, and the output terminal of the second operational amplifier U2 is connected to the reference signal input terminal of the DAC converter U1. .
  • the inverting input terminal of the operational amplifier three U3 is connected to the signal output terminal one of the DAC converter U1, the non-inverting input terminal of the operational amplifier three U3 is connected to the signal output terminal two of the DAC converter U1, and the operational amplifier three U3 is connected to the signal output terminal two of the DAC converter U1.
  • the non-inverting input terminal of U3 is connected to ground
  • the output terminal of the operational amplifier U3 is connected to the feedback signal terminal Rfb of the DAC converter U1
  • one end of the capacitor C2 is connected to the feedback signal terminal Rfb of the DAC converter U1
  • the other end is connected to the feedback signal terminal Rfb of the DAC converter U1.
  • the signal output terminal of DAC converter U1 is connected.
  • the inverting input terminal of the operational amplifier six U6 is connected to the output terminal of the operational amplifier three U3 through the resistor R10, the non-inverting input terminal of the operational amplifier six U6 is grounded, and the output terminal of the operational amplifier six U6 is connected to the output terminal of the operational amplifier six U6.
  • Two Forces are connected, one end of the capacitor C2 is connected to the inverting input end of the operational amplifier six U6, and the other end is connected to the output end of the operational amplifier six U6.
  • Test point two TP2 is set on the connection line between output terminal two Force and the output terminal of operational amplifier six U6.
  • Test point two TP2 is connected to the inverting input terminal of operational amplifier six U6 through resistor two RN2.
  • the inverting input terminal of the operational amplifier U5 is connected to the power input terminal IN1 through the resistor RN1, the non-inverting input terminal of the operational amplifier U5 is grounded, and the output terminal of the operational amplifier U5 is connected through the resistor R9 , resistor two RN2 is connected to the inverting input terminal of operational amplifier six U6, and the inverting input terminal of operational amplifier five U5 is connected to the operational amplifier The output end of device 5 U5 is connected through resistor RN1.
  • the inverting input terminal of the operational amplifier U4 is connected to the test point TP1.
  • the positive input terminal of the operational amplifier U4 is connected to the power input terminal IN2 through the resistor R4.
  • the output terminal of the operational amplifier U4 is
  • the test point TP1 is connected to the test point TP1 through the resistor R5.
  • the test point TP1 is connected to the positive input end of the operational amplifier U5 through the resistor R6 and the exclusion resistor RN1.
  • the resistor R7 is connected in parallel to both ends of the resistor R6. end.
  • a sampling resistor RF is connected between the second power input terminal IN2 and the first power input terminal IN1.
  • the power supply input terminal IN2 passes the operational amplifier four U4 to the positive phase input of the isolated operational amplifier, and the input and output are equal. After resistor one RN1 is connected to the positive input terminal of operational amplifier five U5, the other voltage passes through the negative input terminal of operational amplifier five U5, operational amplifier five U5 takes the positive and negative difference, and operational amplifier six U6 is connected to the inverting voltage, the inverted voltage Summed with the output voltage of DAC converter U1.
  • the voltage of operational amplifier two U2 is output to the Vref of DAC converter U1 as a reference voltage.
  • DAC converter U1 receives the signal through the program and receives the calibration data and outputs it to operational amplifier three U3, which is compensated by the operational amplifier of operational amplifier three U3. to the voltage output.
  • the program uses a high-precision detector to compare the difference measured by the differential operational amplifier, and uses DAC converter U1 to convert the difference into DAC converter U1 to compensate the difference to the output of the differential operational amplifier.
  • a high-end voltage differential sampling calibration method includes the following steps:
  • Step 1 The first power input terminal IN1 provides an inverting voltage source, and the second power input terminal IN2 provides a positive phase voltage source.
  • Step 2 The sampling resistor RF serves as the voltage value collection point for the voltage sampling at both ends.
  • Step 3 when it is necessary to collect the inverting voltage, the inverted voltage flows to the inverting input terminal of operational amplifier five U5 through resistor one RN1, and is output to resistor nine R9 and resistor two RN2 through the output terminal of operational amplifier five U5 in turn.
  • operational amplifier six U6, output terminal 2 Force flows out of the output port through the output terminal 2 Force. At this time, the output port voltage of the output terminal 2 Force is not within the test range. It is necessary to use the accuracy detector and calibration control box to test the data. The difference obtained after comparison is transferred to the memory.
  • the calibration controller compensates the forward and reverse voltages stored in the memory according to the difference obtained by the accuracy detector to obtain the forward and reverse voltages that need to be compensated; the DAC converter U1 will need to compensate.
  • the positive and negative phase voltages are converted into signals, and the converted signals are compensated into the output voltage of the differential operational amplifier, so that the voltage value converted by the converter U1 is compensated (added or subtracted) to the voltage at the output terminal of the operational amplifier U6. Do the summation to achieve the ideal output voltage value.
  • Step 3 when the positive phase voltage needs to be collected, it passes through resistor four R4, operational amplifier four U4, resistor five R5, resistor six R6, resistor seven R7, exclusion resistor one RN1, operational amplifier five U5, resistor nine R9, and operational amplifier six U6 goes to the output end, and after calibration, the output data compensation value is converted by DAC converter U1 and summed to obtain a stable voltage.

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Abstract

一种高端电压差分采样校准系统及方法,系统包括精度检测仪、校准控制器、差分运算放大器、比较器、储存器、DAC转换器,通过DAC转换器U1转换输出的特性实现采集电压信号数值转换达到高精度输出电压差,使用高精度检测仪、高精密校准控制器与差分运算放大器输出电压做比较将差值校准补偿到输出端,实现输出电压稳定状态。本系统提高了电压输出的稳定性与精准性,其测量精度高,成效高,稳定性极佳。

Description

一种高端电压差分采样校准系统及方法 技术领域
本发明涉及一种高端电压差分采样校准系统及方法,属于电压检测技术领域。
背景技术
现有技术对于电压输出精度存在偏差,对于需要稳定输出时达不到理想状态。如果在电路中需求的电压想要达到精准值时,测试的电压通过各方面器件无法实现精度理想效果存在的不足。测试过程中,电压变化频繁,稳定性稍差。因此现有技术对电压信号采样所得的数值不精准,对输出电压跳动大小存在不稳定因素。电压输出实际测试中,因为一些电压上下偏置过大问题会出现测试数据丢失,从而导致测量数据不准,测试结果就会失败。在测试过程中,测试项的结果在数值范围边沿,遇到问题点查找具体原因费时费力。
发明内容
发明目的:为了克服现有技术中存在的不足,本发明提供一种高端电压差分采样校准系统及方法。
技术方案:为实现上述目的,本发明采用的技术方案为:
一种高端电压差分采样校准系统,包括精度检测仪、校准控制器、差分运算放大器、比较器、储存器、DAC转换器,
所述差分运算放大器用于采集待测试器件的正反相电压,并将得到的正反相电压输出给比较器。
所述比较器用于采集差分运算放大器输出的正反相电压,并将采集到的正反相电压输出给储存器。
所述精度检测仪用于检测差分运算放大器采集的待测试器件的正反相电压的差值,并将检测到的差值发送给校准控制器。
所述校准控制器根据精度检测仪输送的差值对储存器存储的正反相电压做补偿,得到需要补偿的正反相电压。
所述DAC转换器用于将校准控制器得到的需要补偿的正反相电压进行信号转换,并将转换后的信号补偿到差分运算放大器的输出电压中。
优选的:包括运算放大器二U2、电阻一R1、电阻二R2、DAC转换器U1、电容二C2、运算放大器三U3、电阻十R10、排阻二RN2、运算放大器六U6、电容三C3、运算放大器五U5、排阻一RN1、电阻九R9、电阻六R6、电阻七R7、电阻五R5、电阻四R4、运算放大器四U4,其中:
所述运算放大器二U2的反相输入端与电源输入端一IN1连接,所述运算放大器二U2的正相输入端接地,运算放大器二U2的输出端与DAC转换器U1的参考信号输入端连接。
所述运算放大器三U3的反相输入端与DAC转换器U1的信号输出端一连接,所述运算放大器三U3的正相输入端与DAC转换器U1的信号输出端二连接,且运算放大器三U3的正相输入端接地,所述运算放大器三U3的输出端与DAC转换器U1的反馈信号端Rfb连接,所述电容二C2一端与DAC转换器U1的反馈信号端Rfb连接,另一端与DAC转换器U1的信号输出端 一连接。
所述运算放大器六U6的反相输入端通过电阻十R10与运算放大器三U3的输出端连接,所述运算放大器六U6的正相输入端接地,所述算放大器六U6的输出端与输出端二Force连接,所述电容二C2一端与运算放大器六U6的反相输入端连接,另一端与运算放大器六U6的输出端连接。测试点二TP2设置于输出端二Force与运算放大器六U6的输出端的连接线上,测试点二TP2通过排阻二RN2与运算放大器六U6的反相输入端连接。
所述运算放大器五U5的反相输入端通过排阻一RN1与电源输入端一IN1连接,所述运算放大器五U5的正相输入端接地,所述运算放大器五U5的输出端通过电阻九R9、排阻二RN2与运算放大器六U6的反相输入端连接,所述运算放大器五U5的反相输入端与运算放大器五U5的输出端通过排阻一RN1连接。
所述运算放大器四U4的反相输入端与测试点一TP1连接,所述运算放大器四U4的正相输入端通过电阻四R4与电源输入端二IN2连接,所述运算放大器四U4的输出端通过电阻五R5与测试点一TP1连接,所述测试点一TP1通过电阻六R6、排阻一RN1与运算放大器五U5的正相输入端连接,所述电阻七R7并联在电阻六R6的两端。
电源输入端二IN2与电源输入端一IN1之间连接有采样电阻RF。
一种高端电压差分采样校准方法,包括以下步骤:
步骤1,电源输入端一IN1提供反相电压源,电源输入端二IN2提供正相电压源。
步骤2,采样电阻RF作为两端电压采样电压值采集点。
步骤3,当需要采集反相电压时,反相电压经过排阻一RN1流到运算放大器五U5的反相输入端,通过运算放大器五U5的输出端依次输出到电阻九R9、排阻二RN2、运算放大器六U6、输出端二Force,通过输出端二Force流出输出口,这个时候输出端二Force的输出口电压不在测试范围内,需要用精度检测仪、校准控制盒经过测试后的数据进行比较后得到的差值传输到储存器,校准控制器根据精度检测仪得到的差值对储存器存储的正反相电压做补偿,得到需要补偿的正反相电压;DAC转换器U1将需要补偿的正反相电压进行信号转换,并将转换后的信号补偿到差分运算放大器的输出电压中。
本发明相比现有技术,具有以下有益效果:
本发明通过DAC转换器U1转换输出的特性实现采集电压信号数值转换达到高精度输出电压差,使用高精度检测仪、高精密校准控制器与差分运算放大器输出电压做比较将差值校准补偿到输出端,实现输出电压稳定状态,提高了电压输出的稳定性与精准性,其测量精度高,成效高,稳定性极佳。
附图说明
图1为本发明的结构示意图。
图2位本发明的电路图。
具体实施方式
下面结合附图和具体实施例,进一步阐明本发明,应理解这些实例仅用于说明本发明而不用于限制本发明的范围,在阅读了本发明之后,本领域技术人员对本发明的各种等价形式的修改均落于本申请所附权利要求所限定的范围。
一种高端电压差分采样校准系统,如图1所示,包括精度检测仪、校准控制器、差分运算放大器、比较器、储存器、DAC转换器,
所述差分运算放大器用于采集待测试器件的正反相电压,并将得到的正反相电压输出给比较器。
所述比较器用于采集差分运算放大器输出的正反相电压,并将采集到的正反相电压输出给储存器。
所述精度检测仪用于检测差分运算放大器采集的待测试器件的正反相电压的差值,并将检测到的差值发送给校准控制器。
所述校准控制器根据精度检测仪输送的差值对储存器存储的正反相电压做补偿,得到需要补偿的正反相电压。
所述DAC转换器用于将校准控制器得到的需要补偿的正反相电压进行信号转换,并将转换后的信号补偿到差分运算放大器的输出电压中。
精度检测仪、校准控制器作为校准工具给差分运算放大器输出一端与输出二端电压值做比较将数据信号储存在储存器中,输出一作为输出电压不理想状态时,输出二通过精度检测仪检测的差值再通过校准控制器将理想电压值的差值通过DAC转换将差值补偿到输出二端,达到输出端电压高精准状态。提供的工具有精度检测仪、校准控制器。电路提供的器件有差分运算放大器、比较器、储存器、DAC芯片。输入一、输入二为运算放大器电压正反相输入电压,输出一为差分运算放大器的输出端电压,输出二为补偿后的电压。当输出需要一个准确的范围内电压时,通过比较器进行采样把数据传输到储存器。在通过精度检测仪与校准控制盒所得需补偿的差值,经过DAC转换输出电压值加入或减去到输出端,得到理想输出电压状态。
如图2所示,包括运算放大器二U2、电阻一R1、电阻二R2、DAC转换器U1、电容二C2、运算放大器三U3、电阻十R10、排阻二RN2、运算放大器六U6、电容三C3、运算放大器五U5、排阻一RN1、电阻九R9、电阻六R6、电阻七R7、电阻五R5、电阻四R4、运算放大器四U4,其中:
所述运算放大器二U2的反相输入端与电源输入端一IN1连接,所述运算放大器二U2的正相输入端接地,运算放大器二U2的输出端与DAC转换器U1的参考信号输入端连接。
所述运算放大器三U3的反相输入端与DAC转换器U1的信号输出端一连接,所述运算放大器三U3的正相输入端与DAC转换器U1的信号输出端二连接,且运算放大器三U3的正相输入端接地,所述运算放大器三U3的输出端与DAC转换器U1的反馈信号端Rfb连接,所述电容二C2一端与DAC转换器U1的反馈信号端Rfb连接,另一端与DAC转换器U1的信号输出端一连接。
所述运算放大器六U6的反相输入端通过电阻十R10与运算放大器三U3的输出端连接,所述运算放大器六U6的正相输入端接地,所述算放大器六U6的输出端与输出端二Force连接,所述电容二C2一端与运算放大器六U6的反相输入端连接,另一端与运算放大器六U6的输出端连接。测试点二TP2设置于输出端二Force与运算放大器六U6的输出端的连接线上,测试点二TP2通过排阻二RN2与运算放大器六U6的反相输入端连接。
所述运算放大器五U5的反相输入端通过排阻一RN1与电源输入端一IN1连接,所述运算放大器五U5的正相输入端接地,所述运算放大器五U5的输出端通过电阻九R9、排阻二RN2与运算放大器六U6的反相输入端连接,所述运算放大器五U5的反相输入端与运算放大 器五U5的输出端通过排阻一RN1连接。
所述运算放大器四U4的反相输入端与测试点一TP1连接,所述运算放大器四U4的正相输入端通过电阻四R4与电源输入端二IN2连接,所述运算放大器四U4的输出端通过电阻五R5与测试点一TP1连接,所述测试点一TP1通过电阻六R6、排阻一RN1与运算放大器五U5的正相输入端连接,所述电阻七R7并联在电阻六R6的两端。
电源输入端二IN2与电源输入端一IN1之间连接有采样电阻RF。
IN提供电源输入端采样电阻RF两端电压值,电源输入端二IN2通过运算放大器四U4隔离运放正相输入,输入输出相等。经过排阻一RN1接入运算放大器五U5正输入端,另一路电压经过运算放大器五U5负输入端,运算放大器五U5取正负差值,运算放大器六U6接入反相电压,反相电压与DAC转换器U1输出电压做求和。
2、运算放大器二U2电压输出给DAC转换器U1的Vref作为参考电压,DAC转换器U1通过程序接收信号收到校准数据做输出传输给运算放大器三U3,通过运算放大器三U3的运算放大器补偿给到电压输出端。程序运用对差分运算放大器测试出的差值使用高精度检测仪做比较,运用DAC转换器U1转换成DAC转换器U1将差值补偿到差分运算放大器输出端。
3、U4起到一个保护作用
一种高端电压差分采样校准方法,包括以下步骤:
步骤1,电源输入端一IN1提供反相电压源,电源输入端二IN2提供正相电压源。
步骤2,采样电阻RF作为两端电压采样电压值采集点。
步骤3,当需要采集反相电压时,反相电压经过排阻一RN1流到运算放大器五U5的反相输入端,通过运算放大器五U5的输出端依次输出到电阻九R9、排阻二RN2、运算放大器六U6、输出端二Force,通过输出端二Force流出输出口,这个时候输出端二Force的输出口电压不在测试范围内,需要用精度检测仪、校准控制盒经过测试后的数据进行比较后得到的差值传输到储存器,校准控制器根据精度检测仪得到的差值对储存器存储的正反相电压做补偿,得到需要补偿的正反相电压;DAC转换器U1将需要补偿的正反相电压进行信号转换,并将转换后的信号补偿到差分运算放大器的输出电压中,使得转换器U1转换输出的电压值补偿(加入或减去)到运算放大器六U6输出端的电压中做求和,达到理想输出电压值目的。
步骤3,当需要采集正相电压时,经过电阻四R4、运算放大器四U4、电阻五R5、电阻六R6、电阻七R7、排阻一RN1、运算放大器五U5、电阻九R9、运算放大器六U6到输出端,同样经过校准后用DAC转换器U1转换输出数据补偿值做求和得出稳定电压。
以上所述仅是本发明的优选实施方式,应当指出:对于本技术领域的普通技术人员来说,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。

Claims (2)

  1. 一种高端电压差分采样校准系统,其特征在于:包括精度检测仪、校准控制器、差分运算放大器、比较器、储存器、DAC转换器,
    所述差分运算放大器用于采集待测试器件的正反相电压,经差分运算放大器计算得到的正反相电压的差值输出给比较器;
    所述比较器用于采集差分运算放大器输出的正反相电压的差值,并将采集到的正反相电压的差值输出给储存器;
    所述精度检测仪用于检测差分运算放大器采集的待测试器件的正反相电压的差值,并将检测到的差值发送给校准控制器;
    所述校准控制器根据精度检测仪输送的差值对储存器存储的正反相电压做补偿,将精度检测仪输送的差值与理想电压作比较,将两者的差值作为需要补偿的正反相电压;
    所述DAC转换器用于将校准控制器得到的需要补偿的正反相电压进行信号转换,并将转换后的信号补偿到差分运算放大器的输出电压中;
    采样校准系统包括运算放大器二U2、电阻一R1、电阻二R2、DAC转换器U1、电容二C2、运算放大器三U3、电阻十R10、排阻二RN2、运算放大器六U6、电容三C3、运算放大器五U5、排阻一RN1、电阻九R9、电阻六R6、电阻七R7、电阻五R5、电阻四R4、运算放大器四U4,其中:
    所述运算放大器二U2的反相输入端通过电阻二R2与电源输入端一IN1连接,所述运算放大器二U2的正相输入端接地,运算放大器二U2的输出端与DAC转换器U1的参考信号输入端连接,所述电阻一R1一端与运算放大器二U2的反相输入端连接,另一端与运算放大器二U2的输出端连接;
    所述运算放大器三U3的反相输入端与DAC转换器U1的信号输出端一连接,所述运算放大器三U3的正相输入端与DAC转换器U1的信号输出端二连接,且运算放大器三U3的正相输入端接地,所述运算放大器三U3的输出端与DAC转换器U1的反馈信号端Rfb连接,所述电容二C2一端与DAC转换器U1的反馈信号端Rfb连接,另一端与DAC转换器U1的信号输出端一连接;
    所述运算放大器六U6的反相输入端通过电阻十R10与运算放大器三U3的输出端连接,所述运算放大器六U6的正相输入端接地,所述运算放大器六U6的输出端与输出端二Force连接,所述电容三C3一端与运算放大器六U6的反相输入端连接,另一端与运算放大器六U6的输出端连接;测试点二TP2设置于输出端二Force与运算放大器六U6的输出端的连接线上,测试点二TP2通过排阻二RN2与运算放大器六U6的反相输入端连接;
    所述运算放大器五U5的反相输入端通过排阻一RN1与电源输入端一IN1连接,所述运算放大器五U5的正相输入端接地,所述运算放大器五U5的输出端通过电阻九R9、排阻二RN2与运算放大器六U6的反相输入端连接,所述运算放大器五U5的反相输入端与运算放大器五U5的输出端通过排阻一RN1连接;
    所述运算放大器四U4的反相输入端与测试点一TP1连接,所述运算放大器四U4的正相输入端通过电阻四R4与电源输入端二IN2连接,所述运算放大器四U4的输出端通过电阻五R5与测试点一TP1连接,所述测试点一TP1通过电阻六R6、排阻一RN1与运算放大器五U5的正相输入端连接,所述电阻七R7并联在电阻六R6的两端;
    电源输入端二IN2与电源输入端一IN1之间连接有采样电阻RF。
  2. 一种基于权利要求1所述高端电压差分采样校准系统的校准方法,其特征在于,包括 以下步骤:
    步骤1,电源输入端一IN1提供反相电压源,电源输入端二IN2提供正相电压源;
    步骤2,采样电阻RF作为两端电压采样电压值采集点;
    步骤3,当需要采集反相电压时,反相电压经过排阻一RN1流到运算放大器五U5的反相输入端,通过运算放大器五U5的输出端依次输出到电阻九R9、排阻二RN2、运算放大器六U6、输出端二Force,通过输出端二Force流出输出口,这个时候如果输出端二Force的输出口电压不在测试范围内,需要对精度检测仪、校准控制器经过测试后的数据进行比较得到差值,得到的差值传输到储存器,校准控制器根据精度检测仪得到的差值对储存器存储的正反相电压做补偿,得到需要补偿的正反相电压;DAC转换器U1将需要补偿的正反相电压进行信号转换,并将转换后的信号补偿到差分运算放大器的输出电压中。
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