WO2023283848A1 - Contrôle de rouleau de batterie avec des systèmes d'imagerie - Google Patents

Contrôle de rouleau de batterie avec des systèmes d'imagerie Download PDF

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Publication number
WO2023283848A1
WO2023283848A1 PCT/CN2021/106361 CN2021106361W WO2023283848A1 WO 2023283848 A1 WO2023283848 A1 WO 2023283848A1 CN 2021106361 W CN2021106361 W CN 2021106361W WO 2023283848 A1 WO2023283848 A1 WO 2023283848A1
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WIPO (PCT)
Prior art keywords
electrode
layer
battery roll
image
radiation
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PCT/CN2021/106361
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English (en)
Inventor
Peiyan CAO
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Shenzhen Xpectvision Technology Co., Ltd.
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Publication date
Application filed by Shenzhen Xpectvision Technology Co., Ltd. filed Critical Shenzhen Xpectvision Technology Co., Ltd.
Priority to PCT/CN2021/106361 priority Critical patent/WO2023283848A1/fr
Priority to CN202180100418.8A priority patent/CN117651858A/zh
Priority to TW111120368A priority patent/TWI822069B/zh
Publication of WO2023283848A1 publication Critical patent/WO2023283848A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Definitions

  • a radiation detector is a device that measures a property of a radiation. Examples of the property may include a spatial distribution of the intensity, phase, and polarization of the radiation.
  • the radiation measured by the radiation detector may be a radiation that has transmitted through an object.
  • the radiation measured by the radiation detector may be an electromagnetic radiation such as infrared light, visible light, ultraviolet light, X-ray, or ⁇ -ray.
  • the radiation may be of other types such as ⁇ -rays and ⁇ -rays.
  • An imaging system may include one or more image sensors each of which may have one or more radiation detectors.
  • a method comprising: capturing a first image of a first perimeter portion of a first end of a battery roll, wherein the first perimeter portion comprises a first electrode, wherein the battery roll comprises an anode layer, a cathode layer, and an electrolyte layer which is sandwiched between and in direct physical contact with the anode layer and the cathode layer, wherein the anode layer, the cathode layer, and the electrolyte layer are rolled about an axis resulting in the battery roll, and wherein the first electrode is electrically connected to a first layer which is the anode layer or the cathode layer; and identifying a first defect of the battery roll related to the first electrode based on the first image.
  • said capturing the first image is performed with an image sensor.
  • the battery roll further comprises a separation layer such that a layer of the anode layer and the cathode layer is sandwiched between the electrolyte layer and the separation layer.
  • the battery roll has a cylindrical shape.
  • the first image is captured using radiation that has transmitted through the first electrode and the first perimeter portion.
  • the radiation comprises X-ray photons.
  • each photon of the X-ray photons has energy of at least 100 KeV.
  • the radiation is part of a cone beam.
  • the battery roll has a shape of a cylinder, and a radiation ray of the radiation being used for capturing the first image and intersecting the first electrode and an image sensor is perpendicular to a plane which contains the axis and intersects the first electrode.
  • the first end of the battery roll is not entirely in the first image.
  • the first defect comprises an electrical disconnection between the first electrode and the first layer.
  • the first defect comprises a short circuit between the first electrode and a second layer which is not the first layer and which is the anode layer or the cathode layer.
  • the method further comprises capturing a second image of a second perimeter portion of the first end of the battery roll, wherein the second perimeter portion comprises a second electrode, and wherein the second electrode is electrically connected to the anode layer or the cathode layer; and identifying a second defect of the battery roll related to the second electrode based on the second image.
  • the battery roll has a shape of a cylinder, wherein said capturing the second image comprises rotating the battery roll about the axis, and wherein a radiation ray of radiation being used for capturing the second image and intersecting the second electrode and an image sensor is perpendicular to a plane which contains the axis and intersects the second electrode.
  • the method further comprises capturing a third image of a third perimeter portion of a second end of the battery roll, wherein the third perimeter portion comprises a third electrode, wherein the third electrode is electrically connected to the anode layer or the cathode layer; and identifying a third defect of the battery roll related to the third electrode based on the third image.
  • the second end of the battery roll is not entirely in the third image.
  • the first perimeter portion comprises a fourth electrode, wherein the fourth electrode is electrically connected to the anode layer or the cathode layer, and wherein the fourth electrode is not electrically connected to the first layer.
  • the first defect comprises a short circuit between the first electrode and the fourth electrode.
  • the method further comprises capturing additional images, wherein the battery roll has a shape of a cylinder, wherein each point of a perimeter of the first end of the battery roll is in at least an image of the first and additional images, and wherein a radiation ray of radiation being used for capturing the image and intersecting the point and a same image sensor is essentially perpendicular to a plane which contains the axis and intersects the point.
  • the method further comprises rotating the battery roll about the axis, wherein the first and additional images are captured as the battery roll rotates about the axis.
  • the method further comprises capturing additional images such that each point of a perimeter of the first end of the battery roll is in at least an image of the first and additional images; and rotating the battery roll about the axis, wherein the first and additional images are captured as the battery roll rotates about the axis.
  • Fig. 1 schematically shows a radiation detector, according to an embodiment.
  • Fig. 2 schematically shows a simplified cross-sectional view of the radiation detector, according to an embodiment.
  • Fig. 3 schematically shows a detailed cross-sectional view of the radiation detector, according to an embodiment.
  • Fig. 4 schematically shows a detailed cross-sectional view of the radiation detector, according to an alternative embodiment.
  • Fig. 5 schematically shows a top view of a package including the radiation detector and a printed circuit board (PCB) , according to an embodiment.
  • PCB printed circuit board
  • Fig. 6A schematically shows a cross-sectional view of an image sensor including the packages of Fig. 5 mounted to a system PCB (printed circuit board) , according to an embodiment.
  • PCB printed circuit board
  • Fig. 6B schematically shows a top view of the image sensor, according to an alternative embodiment.
  • Fig. 7 schematically shows a perspective view of a battery layer stack, according to an embodiment.
  • Fig. 8 schematically shows a perspective view of a battery roll, according to an embodiment.
  • Fig. 9 schematically shows a perspective view of an imaging system, according to an embodiment.
  • FIG. 10A -Fig. 10B schematically show the imaging system in operation, according to an embodiment.
  • Fig. 11 shows a flowchart generalizing the operation of the imaging system.
  • FIG. 12A -Fig. 13B schematically show the imaging system in operation, according to different embodiments.
  • Fig. 1 schematically shows a radiation detector 100, as an example.
  • the radiation detector 100 may include an array of pixels 150 (also referred to as sensing elements 150) .
  • the array may be a rectangular array (as shown in Fig. 1) , a honeycomb array, a hexagonal array, or any other suitable array.
  • the array of pixels 150 in the example of Fig. 1 has 4 rows and 7 columns; however, in general, the array of pixels 150 may have any number of rows and any number of columns.
  • Each pixel 150 may be configured to detect radiation from a radiation source (not shown) incident thereon and may be configured to measure a characteristic (e.g., the energy of the particles, the wavelength, and the frequency) of the radiation.
  • a radiation may include particles such as photons and subatomic particles.
  • Each pixel 150 may be configured to count numbers of particles of radiation incident thereon whose energy falls in a plurality of bins of energy, within a period of time. All the pixels 150 may be configured to count the numbers of particles of radiation incident thereon within a plurality of bins of energy within the same period of time. When the incident particles of radiation have similar energy, the pixels 150 may be simply configured to count numbers of particles of radiation incident thereon within a period of time, without measuring the energy of the individual particles of radiation.
  • Each pixel 150 may have its own analog-to-digital converter (ADC) configured to digitize an analog signal representing the energy of an incident particle of radiation into a digital signal, or to digitize an analog signal representing the total energy of a plurality of incident particles of radiation into a digital signal.
  • ADC analog-to-digital converter
  • the pixels 150 may be configured to operate in parallel. For example, when one pixel 150 measures an incident particle of radiation, another pixel 150 may be waiting for a particle of radiation to arrive. The pixels 150 may not have to be individually addressable.
  • the radiation detector 100 described here may have applications such as in an X-ray telescope, X-ray mammography, industrial X-ray defect detection, X-ray microscopy or microradiography, X-ray casting inspection, X-ray non-destructive testing, X-ray weld inspection, X-ray digital subtraction angiography, etc. It may be suitable to use this radiation detector 100 in place of a photographic plate, a photographic film, a PSP plate, an X-ray image intensifier, a scintillator, or another semiconductor X-ray detector.
  • Fig. 2 schematically shows a simplified cross-sectional view of the radiation detector 100 of Fig. 1 along a line 2-2, according to an embodiment.
  • the radiation detector 100 may include a radiation absorption layer 110 and an electronics layer 120 (which may include one or more ASICs or application-specific integrated circuits) for processing or analyzing electrical signals which incident radiation generates in the radiation absorption layer 110.
  • the radiation detector 100 may or may not include a scintillator (not shown) .
  • the radiation absorption layer 110 may include a semiconductor material such as silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof.
  • the semiconductor material may have a high mass attenuation coefficient for the radiation of interest.
  • the radiation absorption layer 110 may include one or more diodes (e.g., p-i-n or p-n) formed by a first doped region 111, one or more discrete regions 114 of a second doped region 113.
  • the second doped region 113 may be separated from the first doped region 111 by an optional intrinsic region 112.
  • the discrete regions 114 may be separated from one another by the first doped region 111 or the intrinsic region 112.
  • the first doped region 111 and the second doped region 113 may have opposite types of doping (e.g., region 111 is p-type and region 113 is n-type, or region 111 is n-type and region 113 is p-type) .
  • each of the discrete regions 114 of the second doped region 113 forms a diode with the first doped region 111 and the optional intrinsic region 112.
  • the radiation absorption layer 110 has a plurality of diodes (more specifically, 7 diodes corresponding to 7 pixels 150 of one row in the array of Fig. 1, of which only 2 pixels 150 are labeled in Fig. 3 for simplicity) .
  • the plurality of diodes may have an electrical contact 119A as a shared (common) electrode.
  • the first doped region 111 may also have discrete portions.
  • the electronics layer 120 may include an electronic system 121 suitable for processing or interpreting signals generated by the radiation incident on the radiation absorption layer 110.
  • the electronic system 121 may include an analog circuitry such as a filter network, amplifiers, integrators, and comparators, or a digital circuitry such as a microprocessor, and memory.
  • the electronic system 121 may include one or more ADCs (analog to digital converters) .
  • the electronic system 121 may include components shared by the pixels 150 or components dedicated to a single pixel 150.
  • the electronic system 121 may include an amplifier dedicated to each pixel 150 and a microprocessor shared among all the pixels 150.
  • the electronic system 121 may be electrically connected to the pixels 150 by vias 131. Space among the vias may be filled with a filler material 130, which may increase the mechanical stability of the connection of the electronics layer 120 to the radiation absorption layer 110. Other bonding techniques are possible to connect the electronic system 121 to the pixels 150 without using the vias 131.
  • the radiation absorption layer 110 including diodes
  • particles of the radiation may be absorbed and generate one or more charge carriers (e.g., electrons, holes) by a number of mechanisms.
  • the charge carriers may drift to the electrodes of one of the diodes under an electric field.
  • the electric field may be an external electric field.
  • the electrical contact 119B may include discrete portions each of which is in electrical contact with the discrete regions 114.
  • the term “electrical contact” may be used interchangeably with the word “electrode.
  • the charge carriers may drift in directions such that the charge carriers generated by a single particle of the radiation are not substantially shared by two different discrete regions 114 ( “not substantially shared” here means less than 2%, less than 0.5%, less than 0.1%, or less than 0.01%of these charge carriers flow to a different one of the discrete regions 114 than the rest of the charge carriers) .
  • Charge carriers generated by a particle of the radiation incident around the footprint of one of these discrete regions 114 are not substantially shared with another of these discrete regions 114.
  • a pixel 150 associated with a discrete region 114 may be an area around the discrete region 114 in which substantially all (more than 98%, more than 99.5%, more than 99.9%, or more than 99.99%of) charge carriers generated by a particle of the radiation incident therein flow to the discrete region 114. Namely, less than 2%, less than 1%, less than 0.1%, or less than 0.01%of these charge carriers flow beyond the pixel 150.
  • Fig. 4 schematically shows a detailed cross-sectional view of the radiation detector 100 of Fig. 1 along the line 2-2, according to an alternative embodiment.
  • the radiation absorption layer 110 may include a resistor of a semiconductor material such as silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof, but does not include a diode.
  • the semiconductor material may have a high mass attenuation coefficient for the radiation of interest.
  • the electronics layer 120 of Fig. 4 is similar to the electronics layer 120 of Fig. 3 in terms of structure and function.
  • the radiation When the radiation hits the radiation absorption layer 110 including the resistor but not diodes, it may be absorbed and generate one or more charge carriers by a number of mechanisms.
  • a particle of the radiation may generate 10 to 100,000 charge carriers.
  • the charge carriers may drift to the electrical contacts 119A and 119B under an electric field.
  • the electric field may be an external electric field.
  • the electrical contact 119B may include discrete portions.
  • the charge carriers may drift in directions such that the charge carriers generated by a single particle of the radiation are not substantially shared by two different discrete portions of the electrical contact 119B ( “not substantially shared” here means less than 2%, less than 0.5%, less than 0.1%, or less than 0.01%of these charge carriers flow to a different one of the discrete portions than the rest of the charge carriers) .
  • a pixel 150 associated with a discrete portion of the electrical contact 119B may be an area around the discrete portion in which substantially all (more than 98%, more than 99.5%, more than 99.9%or more than 99.99%of) charge carriers generated by a particle of the radiation incident therein flow to the discrete portion of the electrical contact 119B. Namely, less than 2%, less than 0.5%, less than 0.1%, or less than 0.01%of these charge carriers flow beyond the pixel associated with the one discrete portion of the electrical contact 119B.
  • Fig. 5 schematically shows a top view of a package 500 including the radiation detector 100 and a printed circuit board (PCB) 510.
  • PCB printed circuit board
  • the term “PCB” as used herein is not limited to a particular material.
  • a PCB may include a semiconductor.
  • the radiation detector 100 may be mounted to the PCB 510.
  • the wiring between the radiation detector 100 and the PCB 510 is not shown for the sake of clarity.
  • the PCB 510 may have one or more radiation detectors 100.
  • the PCB 510 may have an area 512 not covered by the radiation detector 100 (e.g., for accommodating bonding wires 514) .
  • the radiation detector 100 may have an active area 190 which is where the pixels 150 (Fig. 1) are located.
  • the radiation detector 100 may have a perimeter zone 195 near the edges of the radiation detector 100.
  • the perimeter zone 195 has no pixels 150, and the radiation detector 100 does not detect particles of radiation incident on the perimeter zone 195.
  • Fig. 6A schematically shows a cross-sectional view of an image sensor 600, according to an embodiment.
  • the image sensor 600 may include one or more packages 500 of Fig. 5 mounted to a system PCB 650.
  • Fig. 6A shows 2 packages 500 as an example.
  • the electrical connection between the PCBs 510 and the system PCB 650 may be made by bonding wires 514.
  • the PCB 510 may have the area 512 not covered by the radiation detector 100.
  • the packages 500 may have gaps in between. The gaps may be approximately 1 mm or more.
  • a dead zone of a radiation detector (e.g., the radiation detector 100) is the area of the radiation-receiving surface of the radiation detector, on which incident particles of radiation cannot be detected by the radiation detector.
  • a dead zone of a package (e.g., package 500) is the area of the radiation-receiving surface of the package, on which incident particles of radiation cannot be detected by the radiation detector or detectors in the package.
  • the dead zone of the package 500 includes the perimeter zones 195 and the area 512.
  • a dead zone (e.g., 688) of an image sensor (e.g., image sensor 600) with a group of packages (e.g., packages 500 mounted on the same PCB and arranged in the same layer or in different layers) includes the combination of the dead zones of the packages in the group and the gaps between the packages.
  • the radiation detector 100 (Fig. 1) operating by itself may be considered an image sensor.
  • the package 500 (Fig. 5) operating by itself may be considered an image sensor.
  • the image sensor 600 including the radiation detectors 100 may have the dead zone 688 among the active areas 190 of the radiation detectors 100. However, the image sensor 600 may capture multiple partial images of an object or scene (not shown) , and then these captured partial images may be stitched to form an image of the entire object or scene.
  • image in the present specification is not limited to spatial distribution of a property of a radiation (such as intensity) .
  • image may also include the spatial distribution of density of a substance or element.
  • Fig. 6B schematically shows a top view of the image sensor 600, according to an alternative embodiment.
  • the image sensor 600 may include multiple radiation detectors 100 arranged in an overlapping manner such that there is no dead zone 688 (Fig. 6A) among the active areas 190 of the radiation detectors 100. For simplicity, only the active areas 190 of the radiation detectors 100 are shown in Fig. 6B.
  • Fig. 7 schematically shows a perspective view of a battery layer stack 700, according to an embodiment.
  • the battery layer stack 700 may include an anode layer 710, an electrolyte layer 720, and a cathode layer 730, wherein the electrolyte layer 720 is sandwiched between and in direct physical contact with the anode layer 710 and cathode layer 730.
  • the anode layer 710, the electrolyte layer 720, and the cathode layer 730 may form a lithium-ion battery.
  • the battery layer stack 700 may further include (A) a first electrode 712 electrically connected to the anode layer 710, and (B) a second electrode 732 electrically connected to the cathode layer 730.
  • the battery layer stack 700 may further include a separation layer 740 such that the cathode layer 730 is sandwiched between the electrolyte layer 720 and the separation layer 740.
  • the separation layer 740 may include an insulator.
  • the battery layer stack 700 may be rolled about an axis 790 resulting in a battery roll 800 (Fig. 8) .
  • the battery roll 800 may have a cylindrical shape as shown.
  • the battery roll 800 may have a first end 810 and a second end 820 as shown.
  • Fig. 9 schematically shows a perspective view of an imaging system 900, according to an embodiment.
  • the imaging system 900 may include a radiation source 910 and the image sensor 600.
  • the battery roll 800 may be arranged such that a perimeter portion 812 of the first end 810 of the battery roll 800 is between the radiation source 910 and the image sensor 600.
  • the perimeter portion 812 may contain a section of the perimeter 819 of the first end 810 of the battery roll 800.
  • the first electrode 712 may be part of the perimeter portion 812.
  • the radiation source 910 may generate a radiation beam 912 toward the perimeter portion 812 and then toward the image sensor 600.
  • the radiation beam 912 may be used for imaging the perimeter portion 812 (including the first electrode 712) .
  • the radiation beam 912 may be X-rays with high energy (e.g., each X-ray photon of the radiation beam 912 may have energy of at least 100 KeV) .
  • the radiation beam 912 may be a cone beam.
  • At least a radiation ray (not shown) of the radiation beam 912 that intersects the first electrode 712 and the image sensor 600 is perpendicular to a plane which (a) contains the axis 790 and (b) intersects the first electrode 712.
  • Fig. 10A shows a side view of the battery roll 800.
  • an image 812i (Fig. 10B) of the perimeter portion 812 (including the first electrode 712) may be captured using the radiation of the radiation beam 912 that has transmitted through the perimeter portion 812 (including the first electrode 712) .
  • the image sensor 600 may capture the image 812i (Fig. 10B) .
  • the first end 810 of the battery roll 800 is not entirely in the image 812i. In other words, some portion of the first end 810 is not captured in the image 812i.
  • a first defect of the battery roll 800 related to the first electrode 712 may be identified based on the image 812i (Fig. 10B) of the perimeter portion 812.
  • the first defect of the battery roll 800 related to the first electrode 712 may include an electrical disconnection between the first electrode 712 and the anode layer 710.
  • the first defect of the battery roll 800 related to the first electrode 712 may include a short circuit between the first electrode 712 and the cathode layer 730.
  • the first defect of the battery roll 800 related to the first electrode 712 may include both (A) an electrical disconnection between the first electrode 712 and the anode layer 710, and (B) a short circuit between the first electrode 712 and the cathode layer 730.
  • Fig. 11 shows a flowchart 1100 generalizing the operation of the imaging system 900 (Fig. 9 -Fig. 10B) described above.
  • a first image of a first perimeter portion of a first end of a battery roll is captured.
  • the image 812i of the perimeter portion 812 of the first end 810 of the battery roll 800 is captured.
  • the first perimeter portion comprises a first electrode.
  • the perimeter portion 812 includes the first electrode 712.
  • the battery roll comprises an anode layer, a cathode layer, and an electrolyte layer which is sandwiched between and in direct physical contact with the anode layer and the cathode layer.
  • the battery roll 800 includes the anode layer 710, the cathode layer 730, and the electrolyte layer 720 which is sandwiched between and in direct physical contact with the anode layer 710 and the cathode layer 730.
  • the anode layer, the cathode layer, and the electrolyte layer are rolled about an axis resulting in the battery roll.
  • the anode layer 710, the cathode layer 730, and the electrolyte layer 720 are rolled about the axis 790 resulting in the battery roll 800.
  • the first electrode is electrically connected to a first layer which is the anode layer or the cathode layer.
  • the first electrode 712 is electrically connected to the anode layer 710.
  • a first defect of the battery roll related to the first electrode is identified based on the first image.
  • the first defect of the battery roll 800 related to the first electrode 712 is identified based on the image 812i.
  • the battery roll 800 may be rotated about the axis 790 counterclockwise until a perimeter portion 832 which includes the second electrode 732 is positioned between the radiation source 910 and the image sensor 600 as shown in Fig. 12A.
  • the perimeter portion 832 may contain a section of the perimeter 819 of the first end 810 of the battery roll 800.
  • an image 832i (Fig. 12B) of the perimeter portion 832 (including the second electrode 732) may be captured using the radiation of the radiation beam 912 that has transmitted through the perimeter portion 832 (including the second electrode 732) .
  • the image sensor 600 may capture the image 832i (Fig. 12B) .
  • At least a radiation ray (not shown) of the radiation beam 912 that intersects the second electrode 732 and the image sensor 600 is perpendicular to a plane which (a) contains the axis 790 and (b) intersects the second electrode 732.
  • the first end 810 of the battery roll 800 is not entirely in the image 832i (Fig. 12B) . In other words, some portion of the first end 810 is not captured in the image 832i.
  • a second defect of the battery roll 800 related to the second electrode 732 may be identified based on the image 832i (Fig. 12B) of the perimeter portion 832.
  • the second defect of the battery roll 800 related to the second electrode 732 may include an electrical disconnection between the second electrode 732 and the cathode layer 730.
  • the second defect of the battery roll 800 related to the second electrode 732 may include a short circuit between the second electrode 732 and the anode layer 710.
  • the second defect of the battery roll 800 related to the second electrode 732 may include both (A) an electrical disconnection between the second electrode 732 and the cathode layer 730, and (B) a short circuit between the second electrode 732 and the anode layer 710.
  • the first electrode 712 and the second electrode 732 are far away from each other, and therefore, 2 different images 812i and 832i are needed for identifying defects related to the electrodes 712 and 732 respectively.
  • the first electrode 712 and the second electrode 732 may be close to each other such that the perimeter portion 812 includes both the electrodes 712 and 732.
  • the image 812i of the perimeter portion 812 of Fig. 13A is shown in Fig. 13B.
  • both the first defect of the battery roll 800 related to the electrode 712 and the second defect of the battery roll 800 related to the electrode 732 may be identified based on the image 812i of Fig. 13B.
  • the first defect of the battery roll 800 related to the first electrode 712 and the second defect of the battery roll 800 related to the second electrode 732 may also include a short circuit between the electrodes 712 and 732.
  • both the electrodes 712 and 732 are on the same end (i.e., the first end 810) of the battery roll 800.
  • the electrodes 712 and 732 may be on different ends of the battery roll 800.
  • the first electrode 712 may be on the first end 810 of the battery roll 800
  • the second electrode 732 may be on the second end 820 of the battery roll 800.
  • the battery roll 800 may be rotated 90 degrees about a vertical axis (not shown) and then rotated about the axis 790 so that the second electrode 732 and its corresponding perimeter portion 832 is between the radiation source 910 and the image sensor 600 for imaging.
  • the imaging of the second electrode 732 and its corresponding perimeter portion 832 may be similar to the imaging of the first electrode 712 and its corresponding perimeter portion 812 described above.
  • each of the anode layer 710 and the cathode layer 730 has a single electrode.
  • the anode layer 710 has a single electrode (i.e., the first electrode 712)
  • the cathode layer 730 has a single electrode (i.e., the second electrode 732)
  • each of the anode layer 710 and the cathode layer 730 may have multiple electrodes. In that case, the imaging of each electrode and its corresponding perimeter portion may be similar to the imaging of the first electrode 712 and its corresponding perimeter portion 812 described above.
  • the perimeter portions 812 and 832 are in turn scanned.
  • the entire perimeter 819 may be scanned.
  • the battery roll 800 may be rotated about the axis 790 as the image sensor 600 captures multiple images of perimeter portions of the first end 810 of the battery roll 800.
  • each of the perimeter portions contains a section of the perimeter 819.
  • each point of the perimeter 819 is in at least an image of the multiple images captured by the image sensor 600.
  • a radiation ray of the radiation beam 912 being used for capturing an image of the point and intersecting the point and the image sensor 600 is essentially perpendicular to a plane which (a) contains the axis 790 and (b) intersects the point.
  • “essentially perpendicular” means perpendicular or almost perpendicular.
  • the anode layer 710 from bottom to top are the anode layer 710, the electrolyte layer 720, the cathode layer 730, and the separation layer 740.
  • the anode layer 710 and the cathode layer 730 may switch their respective positions in the battery layer stack 700. In other words, in Fig. 7, from bottom to top would be the cathode layer 730, the electrolyte layer 720, the anode layer 710, and the separation layer 740.

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

L'invention concerne un procédé comprenant la capture d'une première image (812i) d'une première partie de périmètre (812) d'une première extrémité (810) d'un rouleau de batterie (800), la première partie de périmètre (812) comprenant une première électrode (712), le rouleau de batterie (800) comprenant une couche d'anode (710), une couche de cathode (730) et une couche d'électrolyte (720) qui est prise en sandwich entre la couche d'anode (710) et la couche de cathode (730) et en contact physique direct avec celles-ci, la couche d'anode (710), la couche de cathode (730) et la couche d'électrolyte (720) étant enroulées autour d'un axe (790), ce qui permet d'obtenir le rouleau de batterie (800), et la première électrode (712) étant électriquement connectée à une première couche qui est la couche d'anode (710) ou la couche de cathode (730) ; et l'identification d'un premier défaut du rouleau de batterie (800) associé à la première électrode (712) sur la base de la première image (812i).
PCT/CN2021/106361 2021-07-15 2021-07-15 Contrôle de rouleau de batterie avec des systèmes d'imagerie WO2023283848A1 (fr)

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PCT/CN2021/106361 WO2023283848A1 (fr) 2021-07-15 2021-07-15 Contrôle de rouleau de batterie avec des systèmes d'imagerie
CN202180100418.8A CN117651858A (zh) 2021-07-15 2021-07-15 使用成像系统的电池卷测试
TW111120368A TWI822069B (zh) 2021-07-15 2022-06-01 使用成像系統的電池卷測試方法

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PCT/CN2021/106361 WO2023283848A1 (fr) 2021-07-15 2021-07-15 Contrôle de rouleau de batterie avec des systèmes d'imagerie

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