WO2023140648A1 - Broche pogo haute performance à faible coût - Google Patents

Broche pogo haute performance à faible coût Download PDF

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Publication number
WO2023140648A1
WO2023140648A1 PCT/KR2023/000946 KR2023000946W WO2023140648A1 WO 2023140648 A1 WO2023140648 A1 WO 2023140648A1 KR 2023000946 W KR2023000946 W KR 2023000946W WO 2023140648 A1 WO2023140648 A1 WO 2023140648A1
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WO
WIPO (PCT)
Prior art keywords
probe
contact
coil spring
cylinder
plunger
Prior art date
Application number
PCT/KR2023/000946
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English (en)
Korean (ko)
Inventor
박호준
Original Assignee
(주)아이윈솔루션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020220034427A external-priority patent/KR20230113483A/ko
Application filed by (주)아이윈솔루션 filed Critical (주)아이윈솔루션
Publication of WO2023140648A1 publication Critical patent/WO2023140648A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Definitions

  • the present invention relates to a pogo pin that can be manufactured at low cost and has high performance by improving performance.
  • the Pogo Pin is a widely used part for inspection equipment such as semiconductor wafers, LCD modules and semiconductor packages, as well as various sockets and battery connection parts of mobile phones.
  • a socket for mounting a semiconductor package on a PCB such as a main board or a socket for inspection equipment for testing a semiconductor package
  • a CPU, GPU, or application processor has at least hundreds to thousands of pins or terminals.
  • the manufacturing cost of one pogo pin is insignificant, the number of pins and terminals required for a single socket is enormous, which is an absolute factor in increasing the manufacturing cost of the socket.
  • the pogo pin's own impedance including resistance, must be very low for error-free signal transmission.
  • the outer diameter occupied by a single pogo pin (the outer diameter of a pogo pin when a pogo pin extending in the vertical direction is cut in the horizontal direction) is driven to a very small size, which inevitably increases its own impedance.
  • the resistance is inversely proportional to the cross-sectional area of the electrical signal path, the smaller the outer diameter of the pogo pin, and therefore the smaller the available cross-sectional area on the electrical path, the smaller the resistance increases in inverse proportion to the performance of the pogo pin.
  • An object of the present invention is to provide a pogo pin having high performance by improving performance while being manufactured at low cost.
  • an object of the present invention is to provide a high-performance and low-cost pogo pin in the application field driven into a very small outer diameter size.
  • the pogo pin according to one aspect of the present invention is electrically connected through a first probe and a second probe, and has compressive elasticity and is variable in length.
  • first probe 10 a single metal flat plate is cut and bent to be integrally connected, and a cylinder portion 13 having a cylindrical shape and coil spring portions 12 and 12′ functioning as compression springs are disposed in the longitudinal direction, and the second probe 10 (20) extends through the insides of the coil springs (12, 12′), and the second probe (20) includes a contact cantilever portion (21) having one or a plurality of contact cantilevers, and the contact cantilever is in elastic contact with the inner surface of the cylinder portion (13) and is slidable to perform electrical connection.
  • the first probe 10 includes a cylindrical portion 13 having a cylindrical shape, and coil spring portions 12 and 12' connected to the cylinder portion 13 and functioning as compression springs, and is integrally connected by cutting and bending a single metal plate member. 2) and a contact cantilever part 21 provided with one or a plurality of contact cantilevers capable of sliding in elastic contact with the inner surface of the cylinder part 13 and connected to one side of the plunger part 22, characterized in that it is integrally connected by cutting and bending a single metal plate material.
  • the outer diameter D of the contact cantilever part 21 may be larger than the inner diameter d of the cylinder part 13.
  • the pogo pin may be composed of two pieces of the first probe 10 and the second probe 30.
  • the coil spring part 12' may be formed by winding a metal flat plate cut into a 'V' shape in one direction.
  • each of the contact cantilevers 21a in the contact cantilever part 21 has one end connected to one end of the plunger part 22 and the other end as a free end, and the free end may be in a rod shape inwardly folded inward.
  • the first probe further includes a coupling tube 11 extending on the opposite side of the cylinder portion 13 with the coil springs 12 and 12' interposed therebetween, and the coupling tube 11 surrounds the other side of the plunger unit 22 and is mutually fixed with the plunger 22.
  • the protrusion 22a protruding from the other side of the plunger part 22 is seated in the protrusion groove 11a formed in the fastening tube part 11, so that the fastening tube part 11 and the plunger 22 can be fixed to each other.
  • outer diameters of the cylinder portion 13, the coil spring portions 12 and 12', and the fastening cylinder portion 11 may be the same.
  • the second probe 20 has an outer diameter larger than the outer diameter of the plunger portion 22 to form a stepped portion and is connected to the other side of the plunger portion 22.
  • An enlarged diameter portion 23 is further provided, and the end of the fastening tube portion 11 can be caught on the stepped portion.
  • the first probe 10 may further include a first contact portion 14 connected to the cylinder portion 13 via the length extension portion 13 and electrically contacting the outside
  • the second probe 20 may further include a second contact portion 14 connected to the enlarged diameter portion 23 and electrically contacting the outside.
  • a method for manufacturing a pogo pin according to an aspect of the present invention is a method for manufacturing a pogo pin that is electrically connected through a first probe and a second probe and has compressive elasticity and is variable in length.
  • a metal flat material is cut and bent to prepare a first probe 10 connected to a cylinder part 13 having a cylinder shape and coil spring parts 12 and 12′ functioning as a compression spring, and the metal flat material is cut and bent to form a plunger part ( 22) and a first step of preparing the second probe 20 to which the contact cantilever unit 21 having one or a plurality of contact cantilevers is connected; a second step of plating the first probe 10 and the second probe 20 respectively; and a third step of assembling the first probe 10 and the second probe 20 plated in the second step.
  • the contact tilt lever part 21 passes through the through-hole surrounded by the coil spring parts 12 and 12' and reaches the inside of the cylinder part 13.
  • the pogo pin of the present invention there is an advantage in that a high-performance pogo pin can be manufactured at low cost.
  • a pogo pin with better performance can be manufactured at low cost even when applied to a high integration field driven into a very small outer diameter size.
  • the pogo pin of the present invention stable electrical contact is possible using the cylinder part and the contact cantilever part, and the impedance of the electric path of the pogo pin can be significantly reduced, and the assembly is easy despite the structure of the contact cantilever.
  • the application of the plating process is easy, the tolerance management is easy, the flexibility of design change is high, and the characteristics are advantageous for optimization.
  • FIG. 1 shows the appearance of a low-cost, high-performance pogo pin according to a first embodiment of the present invention.
  • FIG. 1 (a) shows a coil spring in a compressed state and
  • FIG. 1 (b) shows a coil spring in an uncompressed state (free state).
  • FIG. 2 is a view showing the first probe 10 and the second probe 20 of the pogo pin according to the first embodiment of the present invention in isolation.
  • FIG. 3 is a cross-sectional view of a pogo pin according to a first embodiment of the present invention, wherein FIG. 3(a) shows a coil spring in a compressed state and FIG. 3(b) shows a coil spring in an uncompressed state (free state).
  • FIG. 4 shows the appearance of a low-cost, high-performance pogo pin according to a second embodiment of the present invention.
  • FIG. 4(a) shows a coil spring in a compressed state
  • FIG. 4(b) shows a coil spring in an uncompressed state (free state).
  • FIG 5 is a view separately showing the first probe 10 and the second probe 20 of the pogo pin according to the second embodiment of the present invention.
  • FIG. 6 is a cross-sectional view of a pogo pin according to a second embodiment of the present invention, wherein FIG. 6(a) shows a coil spring in a compressed state and FIG. 6(b) shows a coil spring in an uncompressed state (free state).
  • FIG. 7 is a development view for manufacturing a pogo pin according to a first embodiment of the present invention
  • a low-cost, high-performance pogo pin according to the present invention is electrically connected through a first probe and a second probe, and relates to a pogo pin having compressive elasticity and having a variable length.
  • the first probe is an upper probe and the second probe is a lower probe.
  • the upper probe contacts a terminal, pin, or pad for inputting/outputting signals or power in a semiconductor package, and the lower probe contacts a conductive pad such as a PCB.
  • FIG. 1 shows the appearance of a low-cost, high-performance pogo pin according to a first embodiment of the present invention.
  • FIG. 1(a) shows a coil spring in a compressed state and
  • FIG. 1(b) shows a coil spring in an uncompressed state (Free state).
  • Figure 2 is a view showing the first probe 10 and the second probe 20 of the pogo pin according to the first embodiment of the present invention in isolation
  • Figure 3 is a cross-sectional view of the pogo pin according to the first embodiment of the present invention.
  • the pogo pin of the present invention is composed of a two-piece part consisting of a first probe 10 of one piece and a second probe 30 of one piece.
  • each of the first probe 10 and the second probe 20 is constructed by cutting and bending a single metal plate material, and each of the first probe 10 and the second probe 20 is integrally connected to each other. Since each of the first probe 10 and the second probe 20 is a single metal plate material cut and bent, as shown in FIG. 1, it may include portions w1 and w2 where the flat plates meet, and the portion where the flat plates meet is the fastening tube 11 of the first probe 10, the cylinder portion 14, and the length extension portion 15 and the plunger portion 22 of the second probe 20. ) and the expansion part 23, etc. may be present.
  • the first probe 10 has a substantially straight cylindrical shape, but may partially or entirely include a rectangular shape or a polygonal shape.
  • the length of the first probe 10 between the first contact portion 14 and the second contact portion 24 in a state of electrical connection (contact state) with the second probe 20, and thus the entire length of the pogo pin. Can be varied.
  • the first probe 10 is composed of a fastening cylinder 11, a coil spring 12, a cylinder 13, a length extension 15, and a first contact 14 disposed in the longitudinal direction, all of which are integrally connected by cutting and bending a single metal plate.
  • the fastening tube part 11 extends from the coil spring part 12 on the opposite side of the cylinder part 13 with the coil spring part 12 interposed therebetween.
  • At least one protrusion groove 11a in the form of a hole perforated in a plate material is formed in the fastening tube portion 11, for example, two opposing protrusion grooves are formed, and the protrusion 22a protruding from the other side of the plunger portion 22 is seated in the protrusion groove 11a formed in the fastening tube portion 11, so that the fastening tube portion 11 and the plunger 22 are fixed to each other.
  • the coil spring part 12 is connected to the cylinder part 13 on one side and to the fastening tube part 11 on the other side, and functions as a compression spring by winding a narrow and long cut part of a flat plate material into a spiral shape.
  • the metal material of the flat plate material is selected so that the coil spring 12 has appropriate elasticity, and accordingly, plating, which will be described later, can be important in lowering the contact resistance of the contact part and the contact control lever.
  • the coil spring part 12 is manufactured at the same time as the first probe is manufactured, and does not require a separate coil spring, that is, a normal coil spring manufactured by spirally twisting a wire rod such as high carbon steel. Therefore, the manufacturing cost of the pogo pin can be greatly reduced.
  • the cylinder part 13 extends from the coil spring part 12 and has a cylindrical shape, and has, for example, a cylindrical through hole 13a therein.
  • the cylinder part provides a space in which the contact cantilever part 21 can slide while guiding parts of the contact cantilever part 21 and the plunger part 22.
  • the inner surface of the cylinder portion 13 is, for example, cylindrical, and a circle having the same inner diameter extends in the longitudinal direction.
  • the length of the cylinder part 13 is preferably larger than the stroke of the pogo pin, and the length is preferably selected so that the contact control lever part is located inside the cylinder part 12 in both the non-compressed state (free state) and the highest compressed state of the coil spring part 12.
  • the outer diameters of the cylinder portion 13, the coil spring portion 12, and the fastening tube portion 11 are substantially the same. More specifically, it is preferable to make the outer diameters of the cylinder part 13 and the coil spring part 12 substantially the same.
  • the first contact portion 14 is for electrical contact with the outside and is connected to the cylinder portion 13 through the length extension portion 15, and is, for example, a terminal, pin, or pad of a semiconductor package, or a PCB. It may be a portion that directly contacts a conductive pad. Therefore, the shape can be selected according to the shape or characteristics of the contacted portion, and the crown shape of the illustrated example has a shape that makes good contact with the terminal or pad of the semiconductor package.
  • the length extension part 15 is a part that connects the cylinder part 13 and the first contact part 14, and may be configured to have a step d1 between the cylinder part and the cylinder part so as to have a smaller outer diameter than the outer diameter of the cylinder part 13 so that the pogo pin is caught on the socket body when mounted on the socket body (not shown).
  • the second probe 20 has a substantially straight cylindrical shape, but may partially or entirely include a rectangular shape or a polygonal shape.
  • the length of the second probe 20 between the first contact part 14 and the second contact part 24 in a state of being electrically connected (contacted state) with the first probe 10, and thus the entire length of the pogo pin. Can be varied.
  • the second probe 20 is composed of a contact cantilever part 21, a plunger part 22, an enlarged diameter part 23, and a second contact part 24 disposed in the longitudinal direction, all of which are formed by cutting and bending a single metal flat plate to be integrally connected.
  • the contact cantilever part 21 includes one or a plurality of contact cantilevers 21a, and each contact cantilever 21a is slidable while elastically contacting the inner surface of the cylinder part 13.
  • a plurality of contact cantilevers 21a are connected to the front end of the plunger part 22, and connected at regular intervals from the cylindrical end of the plunger part 22.
  • the contact cantilever part 21 is connected to one side of the plunger part 22, and is integrally connected to the plunger part 22 by cutting and bending a single metal plate member.
  • the contact cantilever 21a is slidable while being in elastic contact with the inner surface of the cylinder part 13, and becomes a main path electrically connected to the first probe.
  • the contact cantilever can slide while having stable contact with the cylinder part.
  • Each of the contact cantilevers 21a in the contact cantilever part 21 has one end connected to one end of the plunger part 22 and the other end as a free end. Therefore, a curved bent part is formed in the middle of each contact cantilever 21a, the bent part or its vicinity is in contact with the inner wall of the cylinder part 13, and the free end end of each contact cantilever 21a is the cylinder bottom 13. Keep a slight distance from the inner wall.
  • the free end end of the full contact cantilever 21a is located on the same circumference, and the bent portion of the full contact cantilever 21a is located on another same circumference with a larger diameter.
  • the outer diameter D of the contact cantilever part 21, that is, the largest outer diameter of the contact cantilever part 21, is approximately greater than the inner diameter d of the cylinder part 13.
  • the outer diameter (D) in the free state is narrowed to the inner diameter (d) of the cylinder part 13, so that each contact cantilever of the contact cantilever comes into elastic contact with the inner wall of the cylinder.
  • the pogo pin of the present invention largely consists of two electrical paths.
  • the first path is a path through [first contact part - length extension part - cylinder part - coil spring part - fastening tube part - plunger part - diameter enlargement part - second contact part]
  • the second path is a path through [first contact part - length extension part - cylinder part - contact contiguous part - plunger part - enlarged diameter part - second contact part].
  • the second path is a path passing through the plunger unit 22 and is not affected by the inductance and resistance of the coil spring unit 22 .
  • the plunger portion 22 has only the plunger portion 22 without the contact tilever portion 21 being configured at the end of the plunger portion 22, a form in which the plunger portion 22 and the cylinder portion 13 directly contact can be considered.
  • the contact area between the plunger part 22 and the cylinder part 13 can be made very large and the contact resistance can be made very small.
  • the outer diameter of the pogo pin is often smaller than 1 mm or around 1 mm, in order for the plunger part 22 to be able to slide smoothly in the cylinder part 13 and have a small contact resistance, a very small tolerance is required in the manufacture of the plunger part 22 and the cylinder part 13.
  • a semiconductor package having a packaging size of 30 mm X 30 mm has 900 1 mm X 1 mm inside, so if the number of pins in the semiconductor package is 900, each pogo pin utilizes a space of 1 mm X 1 mm. Since it must be placed while having a spaced distance from neighboring pogo pins, the outer diameter of the pogo pin must be much smaller than 1 mm.
  • the plunger part 22 and the cylinder part 13 required to have a small contact resistance while smoothly sliding the plunger part 22 in the cylinder part 13 in the pogo pin of the comparative example are very small. Accordingly, high manufacturing cost and low yield are inevitable.
  • the comparative example without the contact cantilever if the inner diameter of the cylinder is smaller than the outer diameter of the plunger, jamming is likely to occur.
  • the contact tilt lever 21 formed at the front end of the plunger 22 allows stable electrical contact and good contact resistance while alleviating the tight tolerance as described above.
  • the contact cantilever elastically contacts the inner wall of the cylinder part, stable electrical contact and good contact resistance can be achieved, and in the manufacture of the contact cantilever part and the cylinder part, the tolerance between the outer diameter of the contact cantilever part and the inner diameter of the cylinder part, or the tolerance between the two can be greatly expanded compared to the case where the contact cantilever part is not formed. In this way, even if the tolerance is larger, it can be buffered by the elastic deformation of the rod-shaped contact control lever.
  • the plunger part 22 is a cylindrical rod extending through the inside of the coil spring part 12 and connects the contact cantilever part 21 and the enlarged diameter part 23. During compression and extension of the pogo pin, the plunger part 22 guides the coil spring part 12, and at this time, it makes contact with the coil spring part in the middle of the coil spring part 12 to make a short cut in an inductance-free electrical path. In addition, a portion of the plunger portion 22 may be guided as it moves in and out of the cylinder portion 13 . On the other side of the plunger portion 22, which is the side connected to the enlarged diameter portion 230, one or a plurality of protrusions 22a (two opposite in the drawing) protruding from the cylindrical surface of the plunger portion are formed. By being seated in the protrusion groove 11a of the fastening tube portion 11, physical fixation between the plunger portion 22 and the fastening tube portion 11 is performed.
  • the enlarged diameter part 23 extends from the other side of the plunger part 22 while having a step d2, and has an outer diameter larger than the outer diameter of the plunger part 22. In this way, the enlarged diameter part 23 has an enlarged outer diameter compared to the plunger part, so that the end of the fastening tube part 11 is caught on the step d2, and the second probe sinks deeply into the first probe. It prevents errors of the pogo pin during use and prevents damage to the contact control lever part.
  • the second contact portion 24 is connected to the enlarged diameter portion 23 and performs electrical contact with the outside.
  • it may be a terminal, pin, or pad of a semiconductor package, or a portion that directly contacts a conductive pad such as a PCB. Therefore, the shape can be selected according to the shape or characteristics of the contacted portion, and the illustrated bar shape is a shape that makes good contact with the conductive pad of the PCB or the like.
  • FIG. 4 shows the appearance of a low-cost, high-performance pogo pin according to a second embodiment of the present invention.
  • FIG. 4(a) shows a coil spring in a compressed state and
  • FIG. 4(b) shows a coil spring in an uncompressed state (Free state).
  • 5 is a view showing the first probe 10 and the second probe 20 of the pogo pin according to the second embodiment of the present invention separated
  • FIG. 6 is a cross-sectional view of the pogo pin according to the second embodiment of the present invention.
  • the pogo pin according to the second embodiment of the present invention is different in the coil spring part 12' compared to the first embodiment and other components are the same or similar, the description thereof will be omitted.
  • the coil spring part 12 is formed by winding a metal flat plate material formed in a straight line (see FIG. 7) in one direction, but in the pogo pin of the second embodiment, the coil spring part 12 'is formed by winding a metal flat plate cut into a 'V' shape (see Fig. 8) in one direction.
  • the maximum number of turns (or the maximum number of turns that can be easily manufactured) according to the structure of the first embodiment is N max
  • the maximum number of turns that can be manufactured according to the structure of the second embodiment can be increased to about 2 * N max .
  • the number of process steps necessary for manufacturing the structure of the first embodiment is n according to the specific method of manufacturing the coil spring part
  • the number of process steps required for manufacturing the structure of the second embodiment may be reduced to approximately n/2.
  • a metal sheet having outlines and protruding grooves of a developed view as shown in FIG. 7 (for manufacturing pogo pins in the first embodiment) or 8 (for manufacturing pogo pins in the second embodiment) can be formed by cutting a metal plate material. At this time, those for the first probe and the second probe may be separately manufactured.
  • p10 is a development diagram for manufacturing the first probe and p20 is a development diagram for preparing the second probe.
  • p11 is a fastening tube
  • p12 and p12' are coil springs
  • p13 is a cylinder
  • p15 is a length extension
  • p14 is a first contact portion.
  • p21 is the contact cantilever part
  • p22 is the plunger part
  • p23 is the diameter expansion part
  • p24 is the part to be the second contact part.
  • a first probe (which may be unfinished) having a shape such as a fastening cylinder, a coil spring, a cylinder, a length extension, and a first contact portion is prepared by bending the cut metal flat material
  • a second probe (which may be unfinished) having a shape such as a contact contilever portion, a plunger portion, an enlarged diameter portion, and a second contact portion is prepared by bending the cut metal sheet.
  • protrusions may be formed through coining or the like.
  • the first probe and the second probe are plated with a metal having high electrical conductivity, for example, gold may be plated, and this plating is plated at least before assembling the first probe and the second probe.
  • a metal having high electrical conductivity for example, gold
  • each part can be separately plated.
  • the contact cantilever part 21 passes through the through hole surrounded by the coil spring part 12, that is, penetrates the inner space of the coil spring part 12 to reach the inside of the cylinder part 13, and since the free end of the contact cantilever is folded inward, the contact cantilever part can easily climb over the coil spring part during the assembly process.
  • the protrusion is fastened to the protrusion groove, the first probe and the second probe are not naturally separated during a subsequent socket manufacturing process or transfer process.
  • Comprising the 2-piece parts of the first and second probes makes it easier to apply plating as described above, compared to the composition of 1-piece parts, and also allows for easy tolerance management, high flexibility in design changes, and optimization of characteristics. It has an advantage.

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  • General Physics & Mathematics (AREA)
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Abstract

Une broche pogo selon la présente invention est une broche pogo qui établit une connexion électrique au moyen d'une première sonde et d'une seconde sonde et dont la longueur est variable avec une élasticité de compression. Dans la première sonde (10), une partie cylindre (13) ayant une forme cylindrique et une partie ressort hélicoïdal (12, 12') fonctionnant comme un ressort de compression, qui sont disposées sous la forme d'un corps connecté unique par découpe et pliage d'un matériau de plaque métallique unique, sont agencées dans la direction longitudinale de celle-ci, et la seconde sonde (20) s'étend à travers l'intérieur de la partie ressort hélicoïdal (12, 12') et est pourvue d'une partie en porte-à-faux de contact (21) avec un ou de multiples porte-à-faux de contact, et le porte-à-faux de contact peut coulisser tout en étant en contact élastique avec la surface interne de la partie cylindre (13) pour se connecter électriquement.
PCT/KR2023/000946 2022-01-21 2023-01-19 Broche pogo haute performance à faible coût WO2023140648A1 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-2022-0008951 2022-01-21
KR20220008951 2022-01-21
KR10-2022-0034427 2022-03-21
KR1020220034427A KR20230113483A (ko) 2022-01-21 2022-03-21 저가형 고성능 포고핀

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WO2023140648A1 true WO2023140648A1 (fr) 2023-07-27

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120032500A (ko) * 2011-12-05 2012-04-05 박상량 탐침부 연결형 포고핀 및 그 제조방법
KR101330995B1 (ko) * 2012-07-10 2013-11-20 박상량 굽은 등 형상의 스프링 프로 브 핀
KR20160085457A (ko) * 2015-01-08 2016-07-18 (주)아이윈 상하 탐침부 연결형 포고핀 및 그 제조방법
KR101951705B1 (ko) * 2017-07-18 2019-02-25 송유선 포고 핀 및 포고 핀의 배열을 구현하는 검사용 소켓
KR101974811B1 (ko) * 2018-06-07 2019-05-03 박상량 일체형 하우징이 가능한 일체형 포고 핀
KR102259074B1 (ko) * 2020-05-22 2021-06-02 (주)아이윈솔루션 초 고전류용 포고핀

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120032500A (ko) * 2011-12-05 2012-04-05 박상량 탐침부 연결형 포고핀 및 그 제조방법
KR101330995B1 (ko) * 2012-07-10 2013-11-20 박상량 굽은 등 형상의 스프링 프로 브 핀
KR20160085457A (ko) * 2015-01-08 2016-07-18 (주)아이윈 상하 탐침부 연결형 포고핀 및 그 제조방법
KR101951705B1 (ko) * 2017-07-18 2019-02-25 송유선 포고 핀 및 포고 핀의 배열을 구현하는 검사용 소켓
KR101974811B1 (ko) * 2018-06-07 2019-05-03 박상량 일체형 하우징이 가능한 일체형 포고 핀
KR102259074B1 (ko) * 2020-05-22 2021-06-02 (주)아이윈솔루션 초 고전류용 포고핀

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