WO2023125643A1 - 工件检查装置和方法 - Google Patents

工件检查装置和方法 Download PDF

Info

Publication number
WO2023125643A1
WO2023125643A1 PCT/CN2022/142736 CN2022142736W WO2023125643A1 WO 2023125643 A1 WO2023125643 A1 WO 2023125643A1 CN 2022142736 W CN2022142736 W CN 2022142736W WO 2023125643 A1 WO2023125643 A1 WO 2023125643A1
Authority
WO
WIPO (PCT)
Prior art keywords
inspection
workpiece
inspected
support
strategy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2022/142736
Other languages
English (en)
French (fr)
Inventor
李元景
孙尚民
李荐民
宗春光
周合军
刘必成
倪秀琳
宋全伟
高克金
史俊平
喻卫丰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuctech Co Ltd
Original Assignee
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd filed Critical Nuctech Co Ltd
Priority to PL449777A priority Critical patent/PL449777A1/pl
Priority to DE112022005709.2T priority patent/DE112022005709T5/de
Publication of WO2023125643A1 publication Critical patent/WO2023125643A1/zh
Anticipated expiration legal-status Critical
Priority to DKPA202430374A priority patent/DK202430374A1/en
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/226—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/63—Specific applications or type of materials turbine blades
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

Definitions

  • the present disclosure relates to the technical field of defect detection, and in particular to a workpiece inspection device and method.
  • wind power generators are being used more and more widely as a clean energy source.
  • the blades of wind turbines are mainly used to efficiently and safely transmit wind power to the generator power input shaft.
  • the blade is an important part of the wind turbine, and its performance directly affects the quality, life and cost of the wind turbine.
  • the length of the blades of the wind turbine ranges from 50 meters to 90 meters, the height ranges from 3 meters to 6 meters, and the maximum weight is as high as 40-50 tons. All of them are made of composite materials such as carbon fiber and glass fiber bonded by special glue. During the bonding and transfer process of composite fan blades, defects such as pores, cracks, glue seepage, and debonding will inevitably appear, which will affect the quality and life of the blades, and may even cause immeasurable losses. Therefore, it is very necessary and important to inspect the quality of wind turbine blades.
  • the traditional inspection method for large wind turbine blades is to use ultrasonic, infrared thermal imaging technology or single-view X-ray perspective for non-destructive inspection.
  • Ultrasonic scanning methods generally use single-point echo scanning, and the surface area of large blades ranges from 300 to 500 square meters, all using point-by-point scanning, which takes a long time and is labor-intensive, and the obtained waveform signals need further processing and analysis. , the efficiency is very low and the effect is not good.
  • Infrared thermal imaging technology is easily affected by the ambient temperature, and has weak detection ability for small defects. It can only detect the shallow surface defects of the blade, cannot accurately obtain the depth information of the blade, and is powerless to detect internal defects.
  • Single-view X-ray fluoroscopic imaging is divided into traditional film imaging and emerging digital imaging.
  • Film imaging requires industrial film to be placed behind the blade part, and the ray source is emitted from the front, and then developed and fixed after exposure. And drying, so as to obtain a partial perspective photo; the digital imaging method uses a digital detector to replace the film, plus a mechanical moving device, which can obtain a full-length blade perspective image of one viewing angle in one scan. Whether it is a partial image obtained by film photography or a full-length blade image generated by a DR scan, it is a single-angle image information of the blade.
  • the imaging of defects at a single angle will inevitably overlap, and it is impossible to accurately determine the location and location of the defect. size.
  • the existing methods such as ultrasound, infrared imaging, and single-view DR imaging cannot meet the needs of high-speed, high-precision, and high-quality detection.
  • the current luggage CT inspection system or medical CT inspection system can achieve high-precision CT inspection and can be used in the field of defect inspection, due to the small caliber, it cannot be extended to the defect detection of large workpieces with the same principle.
  • Embodiments of the present disclosure provide a workpiece inspection device and method, which can effectively improve the detection effect.
  • a workpiece inspection device including:
  • the inspection body is used to scan and inspect the workpiece to be inspected
  • the inspection unit is signal-connected to the inspection body and is configured to scan and inspect the workpiece to be inspected by the inspection body according to a preset inspection strategy;
  • the comparison unit is connected to the inspection unit by signal, and the quality parameters of the defective workpiece are pre-stored in the comparison unit, and the comparison unit is configured to compare the result of the scanning inspection of the inspection unit with the pre-stored quality parameters;
  • the judging unit is signal-connected to the comparison unit and is configured to judge whether the defect in the workpiece to be inspected can be determined according to the comparison result of the comparison unit;
  • the strategy adjustment unit is connected with the judgment unit and the inspection unit, and is configured to adjust the inspection strategy when the judgment result of the judgment unit is No, so that the inspection unit scans and inspects the workpiece to be inspected again according to the adjusted inspection strategy until it finds the workpiece to be inspected. defects in the workpiece.
  • checking ontologies includes:
  • the inspection component is used for scanning and inspecting the workpiece to be inspected
  • a driving device for driving the inspection component and/or the workpiece to be inspected to move relative to the inspection component and the workpiece to be inspected;
  • the control device is signal-connected with the inspection component and the driving device, and the control device is used to control the inspection component and the driving device to complete preset inspection tasks.
  • the workpiece inspection device further includes a first support and a second support
  • the drive device includes a first drive and a second drive
  • the inspection assembly is installed on the first support
  • the second support is used for The workpiece to be inspected is supported
  • the first drive device drives the first support member and the second support member to rotate relative to each other
  • the second drive device drives the first support member and the second support member to move relative to each other along the axis of the workpiece to be inspected.
  • the first support member includes a first support ring with a through hole in the center
  • the inspection assembly includes a radiation source and a detector
  • both the radiation source and the detector are installed on the first support ring
  • the radiation source and the detector Relatively arranged
  • the second support and the workpiece to be inspected are configured to pass through the through hole
  • the first driving device drives the first support ring to rotate relative to the second support.
  • the workpiece inspection device further includes a first traveling wheel, the first traveling wheel is mounted on the bottom of the first support ring, and the second driving device drives the first support ring along the axis of the workpiece to be inspected relative to the second support Or, the first traveling wheel is mounted on the bottom of the second support, and the second driving device drives the second support to move relative to the first support ring along the axis of the workpiece to be inspected.
  • the second support includes a second support ring for supporting the workpiece to be inspected
  • the inspection assembly includes a radiation source and a detector
  • the first support includes a first support frame and a second support frame
  • the radiation source is installed On the first support frame
  • the detector is installed on the second support frame
  • a channel is provided between the first support frame and the second support frame to allow the second support ring and the workpiece to be inspected to pass through
  • the first driving device drives the first The two support rings rotate relative to the first support member.
  • the workpiece inspection device further includes a second road wheel, the second road wheel is installed on the bottom of the second support ring, and the second driving device drives the second support ring along the axis of the workpiece to be inspected relative to the first support Or, the second traveling wheel is mounted on the bottom of the first support, and the second driving device drives the first support to move relative to the second support ring along the axis of the workpiece to be inspected.
  • the workpiece inspection device further includes a first position sensor for detecting the relative rotation angle of the inspection component and the workpiece to be inspected.
  • the workpiece inspection device further includes a second position sensor for detecting the relative position of the inspection component and the workpiece to be inspected along the axis of the workpiece to be inspected.
  • the workpiece inspection device further includes a numbering device that is signally connected to the inspection unit and the comparison unit, and the numbering device is configured to compare the quality of the non-defective workpieces pre-stored in the comparison unit at multiple different angles or different positions.
  • the parameters and multiple detection results of the inspection unit are respectively numbered, so that the comparison unit compares the result of the inspection unit's scanning inspection with the pre-stored quality parameters of the corresponding number.
  • a workpiece inspection method comprising:
  • Step S1 providing an inspection body for scanning and inspecting the workpiece to be inspected
  • Step S2 pre-store the quality parameters of the non-defective workpiece
  • Step S3 Provide a strategy library containing multiple inspection strategies, select an inspection strategy from the strategy library, and use the inspection ontology to scan and inspect the workpiece to be inspected;
  • Step S4 comparing the result of the scanning inspection with the pre-stored quality parameters
  • Step S5 According to the comparison result, it is judged whether the defect existing in the workpiece to be inspected can be determined;
  • the policy library includes:
  • the first inspection strategy perform DR scanning inspection at multiple angles of the workpiece to be inspected;
  • the second inspection strategy perform CT slice scanning inspection on multiple positions of the workpiece to be inspected;
  • the third inspection strategy performing a three-dimensional image scanning inspection of a part of the workpiece to be inspected.
  • Fourth inspection strategy 3D image scanning inspection of the entire workpiece to be inspected.
  • the policy library includes:
  • the fifth inspection strategy scan and inspect the preset parts of the workpiece to be inspected
  • Sixth inspection strategy scan and inspect suspicious parts of the workpiece to be inspected.
  • the seventh inspection strategy scan and inspect the preset parts of the workpiece to be inspected first, and then scan and inspect the suspicious parts of the workpiece to be inspected;
  • the eighth inspection strategy scan and inspect the suspicious parts of the workpiece to be inspected first, and then scan and inspect the preset parts of the workpiece to be inspected.
  • steps S3-S5 include:
  • a three-dimensional image scanning inspection is performed on the preset part of the workpiece to be inspected, and the inspection result is compared with the pre-stored quality parameters at the same position;
  • a three-dimensional image scanning inspection is performed on the entire workpiece to be inspected, and the inspection result is compared with the pre-stored quality parameters at the same position to determine the defect of the workpiece to be inspected.
  • the DR scanning inspection is performed at multiple angles of the preset part of the workpiece to be inspected, and the operation of comparing the inspection results with the pre-stored quality parameters of the same angle includes:
  • the CT slice scanning inspection is performed at multiple positions of the preset parts of the workpiece to be inspected, and the operation of comparing the inspection results with the pre-stored quality parameters of the same positions includes:
  • CT slice scanning inspection is performed at multiple positions of the preset part of the workpiece to be inspected, and the inspection results are numbered according to the positions, and then the inspection results are compared with the corresponding numbered pre-stored quality parameters of the same position.
  • the embodiments of the present disclosure can compare the inspection results with the pre-stored quality parameters by storing the quality parameters of non-defective workpieces in advance, so as to determine whether the defects in the workpiece can be determined; moreover, the embodiments of the present disclosure There is a strategy adjustment step.
  • the inspection strategy By continuously adjusting the inspection strategy, the defects in the workpiece can be gradually determined without directly scanning and inspecting the entire workpiece, which is beneficial to reducing inspection time and improving inspection efficiency.
  • FIG. 1 is a schematic structural diagram of a first embodiment of a workpiece inspection device of the present disclosure.
  • FIG. 2 is a schematic structural diagram of a second embodiment of the workpiece inspection device of the present disclosure.
  • FIG. 3 is a schematic structural diagram of a third embodiment of the workpiece inspection device of the present disclosure.
  • FIG. 4 is a schematic structural diagram of a fourth embodiment of the workpiece inspection device of the present disclosure.
  • the inspection device includes an inspection body, an inspection unit, a comparison unit, a judgment unit and a strategy adjustment unit, and the inspection body is used for the workpiece 10 to be inspected.
  • the inspection unit is connected with the inspection body signal, and the inspection unit is configured to scan and inspect the workpiece 10 to be inspected by using the inspection body according to the preset inspection strategy.
  • the comparison unit is connected with the inspection unit signal, and the comparison unit is pre- The quality parameters of whether there are defective workpieces are stored, the comparison unit is configured to compare the results of the scanning inspection of the inspection unit with the pre-stored quality parameters, the judgment unit is connected to the comparison unit with a signal, and the judgment unit is configured to The comparison result judges whether the existing defect of the workpiece 10 to be inspected can be determined, the strategy adjustment unit is connected with the judgment unit and the inspection unit signal, and the strategy adjustment unit is configured to adjust the inspection strategy when the judgment result of the judgment unit is no, so as to inspect The unit scans and inspects the workpiece 10 to be inspected again according to the adjusted inspection strategy until the defects existing in the workpiece 10 to be inspected are found.
  • the non-defective workpiece is a workpiece that has no quality defects and can be used as a reference standard.
  • the model of the workpiece is the same as that of the workpiece to be inspected, and the parameters of the shape, size, material and manufacturing process of the two are the same.
  • this embodiment by pre-storing the quality parameters of non-defective workpieces, the inspection results can be compared with the pre-stored quality parameters, so as to determine whether the defects in the workpiece can be determined; moreover, this embodiment has a strategy adjustment Unit, by continuously adjusting the inspection strategy, can gradually determine the defects existing in the workpiece, without directly scanning and inspecting the entire workpiece, which is beneficial to reducing inspection time and improving inspection efficiency.
  • the quality parameter of the non-defective workpiece can be the data stored in the comparison unit in advance, and the comparison unit directly compares the result of the scanning inspection of the inspection unit with the pre-stored quality parameter; the quality parameter of the non-defective workpiece can also be stored in the For the data in the database, the comparison unit first calls the quality parameters of the non-defective workpiece from the database, and then compares them with the results of the scanning inspection by the inspection unit.
  • the quality parameters of defect-free workpieces can be obtained by direct measurement of workpieces that have no quality defects and can be used as reference standards, or can be obtained by comparing, splicing, and optimizing the scanning inspection results of multiple potentially defective workpieces.
  • Quality parameters include parameters in various aspects such as size, shape, position, and microstructure.
  • the inspection device gradually determines the defects and defect locations of the workpiece by adjusting different inspection strategies, and the inspection device can perform inspections through various inspection strategies, effectively improving the accuracy of the inspection.
  • the workpiece inspection device may further include a strategy library, which includes multiple inspection strategies, and the inspection unit may select a preset inspection strategy from the strategy library. Moreover, when the policy adjusting unit adjusts the checking policy, it can also select other checking policies from the policy library.
  • the inspection unit selects an inspection strategy, it can choose one type from the strategy library, or two or more types.
  • the strategy adjustment unit adjusts the inspection strategy, it can choose another unselected strategy from the strategy library, or two or more other unselected strategies, or select the selected strategy and the unselected strategy at the same time. Choose a strategy. When multiple strategies are selected, the order of multiple strategies can also be freely adjusted.
  • the policy library includes a first inspection policy, a second inspection policy, a third inspection policy, and a fourth inspection policy.
  • the first inspection strategy is: perform DR scanning inspection at multiple angles of the workpiece 10 to be inspected.
  • the DR scanning inspection is a method of scanning and inspecting the inspection workpiece 10 using digital X-ray photography technology.
  • the DR scanning inspection realizes the inspection by taking an image of the workpiece 10 to be inspected at a preset angle, and the captured image is the projection of the workpiece 10 to be inspected in the shooting direction. Projected images can be taken from multiple directions by performing DR scan checks on multiple angles.
  • the second inspection strategy is: performing CT slice scanning inspection on multiple positions of the workpiece 10 to be inspected.
  • the CT slice scanning inspection is a method of scanning and inspecting a slice layer at a certain position of the workpiece 10 to be inspected by using an X-ray beam. Quality defects within a certain thickness can be checked by performing CT slice scanning inspection on multiple locations. Moreover, CT slice scanning inspection can scan out tomographic images without overlap between parts.
  • the third inspection strategy is: perform a three-dimensional image scanning inspection on a part of the workpiece 10 to be inspected. By performing a three-dimensional image scanning inspection on a part of the workpiece 10 to be inspected, it is possible to more accurately judge whether there is a defect in the quality of the part.
  • the fourth inspection strategy is: perform a three-dimensional image scanning inspection on the entire workpiece 10 to be inspected.
  • the overall three-dimensional image scanning inspection has a higher accuracy of inspection of quality defects.
  • inspection strategies In addition to forming a variety of inspection strategies based on different inspection methods, a variety of inspection strategies can also be derived in terms of inspection methods.
  • the strategy library includes a fifth inspection strategy, a sixth inspection strategy, a seventh inspection strategy, and an eighth inspection strategy.
  • the fifth inspection strategy is: scan and inspect the preset position of the workpiece 10 to be inspected;
  • the sixth inspection strategy is: perform scan inspection on suspicious parts of the workpiece 10 to be inspected;
  • the seventh inspection strategy is: first preset the position of the workpiece 10 to be inspected Carry out scanning inspection, and then scan and inspect the suspicious parts in the preset parts;
  • the eighth inspection strategy is: first scan and check the suspicious parts of the workpiece 10 to be inspected, and then scan and inspect the preset parts of the workpiece 10 to be inspected.
  • the suspicious parts may include some preset parts that will be scanned and checked later, so that the number of checked parts can be reduced in the follow-up inspection, Improve inspection efficiency.
  • the inspection body includes an inspection assembly, a driving device and a control device
  • the inspection assembly is used for scanning inspection of the workpiece 10 to be inspected
  • the driving device is used to drive the inspection assembly and/or the workpiece 10 to be inspected to move, so that the inspection assembly Relative movement occurs with the workpiece 10 to be inspected
  • the control device is connected with the inspection component and the driving device for signals, and the control device is used to control the inspection component and the driving device to complete the preset inspection task.
  • the workpiece inspection device further includes a first support 31 and a second support 32
  • the driving device includes a first driving device 41 and a second driving device
  • the inspection assembly is installed on the first support 31, and the second The support 32 is used to support the workpiece 10 to be inspected
  • the first drive device 41 drives the first support 31 and the second support 32 to rotate relative to each other
  • the second drive drives the first support 31 and the second support 32 along the The axial direction relative movement of the workpiece 10 is checked.
  • the relative rotation of the first support 31 and the second support 32 is driven by the first driving device 41, and the relative movement of the first support 31 and the second support 32 is driven by the second driving device along the axial direction of the workpiece 10 to be inspected.
  • the three-dimensional image scanning inspection of the workpiece 10 to be inspected is realized.
  • the first support member 31 includes a first support ring with a through hole in the center
  • the inspection assembly includes a radiation source 21 and a detector 22
  • the radiation source 21 and the detector 22 are installed on the first support ring and
  • the radiation source 21 and the detector 22 are arranged oppositely
  • the second support 32 and the workpiece 10 to be inspected are configured to pass through the through hole
  • the first driving device 41 drives the first support ring to rotate relative to the second support 32 .
  • the first support member 31 can be placed on the first support platform 61
  • the second support member 32 can be placed on the second support platform 62 .
  • the workpiece inspection device also includes a first traveling wheel 51, the first traveling wheel 51 is mounted on the bottom of the second support 32, and the second driving device drives the second support 32 relative to The first support ring moves along the axis of the workpiece 10 to be inspected.
  • the workpiece inspection device also includes a first traveling wheel 51, the first traveling wheel 51 is installed on the bottom of the first supporting ring, and the second driving device drives the first supporting ring relative to the second The supporting member 32 moves along the axial direction of the workpiece 10 to be inspected.
  • the second support 32 includes a second support ring for supporting the workpiece 10 to be inspected
  • the inspection assembly includes the radiation source 21 and the detector 22
  • the first support 31 includes a first support frame 311 and a second The support frame 312
  • the ray source 21 is installed on the first support frame 311
  • the detector 22 is installed on the second support frame 312
  • the second support ring and the second support frame 312 are provided between the first support frame 311 and the second support frame
  • the first driving device drives the second support ring to rotate relative to the first support member 31 .
  • the workpiece inspection device also includes a second road wheel 52, the second road wheel 52 is installed on the bottom of the second support ring, and the second driving device drives the second support ring relative to the first The support member 31 moves along the axial direction of the workpiece 10 to be inspected.
  • the workpiece inspection device further includes a second road wheel 52, the second road wheel 52 is mounted on the bottom of the first support 31, and the second driving device drives the first support 31 relative to The second support ring moves along the axis of the workpiece 10 to be inspected.
  • the workpiece inspection device may include two sets of second traveling wheels 52, and a set of second traveling wheels 52 are mounted on the bottoms of the first support frame 311 and the second support frame 312 respectively, so that the radiation source 21 and the detector 22 They can be moved by corresponding second road wheels 52 respectively.
  • the second driving device may be configured to simultaneously drive the first support frame 311 and the second support frame 312 to move, so as to keep the movement of the radiation source 21 and the detector 22 synchronous.
  • the workpiece inspection device further includes a first position sensor for detecting the relative rotation angle of the inspection component and the workpiece 10 to be inspected.
  • a first position sensor for detecting the relative rotation angle of the inspection component and the workpiece 10 to be inspected.
  • the workpiece inspection device further includes a second position sensor for detecting the relative position of the inspection assembly and the workpiece 10 to be inspected along the axis of the workpiece 10 to be inspected.
  • a second position sensor for detecting the relative position of the inspection assembly and the workpiece 10 to be inspected along the axis of the workpiece 10 to be inspected.
  • the workpiece inspection device further includes a numbering device that is signally connected to the inspection unit and the comparison unit, and the numbering device is configured to compare the quality of the non-defective workpieces pre-stored in the comparison unit at multiple different angles or different positions.
  • the parameters and multiple detection results of the inspection unit are respectively numbered, so that the comparison unit compares the result of the inspection unit's scanning inspection with the pre-stored quality parameters of the corresponding number.
  • the numbering device is used in conjunction with the first position sensor and/or the second position sensor, and the numbering device is performed according to the angle or position of the workpiece 10 to be inspected detected by the first position sensor and/or the second position sensor serial number.
  • Different workpieces can be scanned and inspected by different scanning methods. Specifically, the workpieces can be scanned step by step according to the strictness of defect control and inspection time requirements. For example, from simple to easy, from obvious defects or large-size defects that may be found to non-obvious defects or small-size defects.
  • the inspection steps of the inspection device of the present disclosure are:
  • the database establishment of defect-free workpieces is carried out.
  • DR scans at different angles CT slice images of key parts of the blade axis, and 3D reconstruction images of the entire workpiece are performed.
  • CT slice scanning is performed on key parts of the axis, and the obtained CT slice images can be automatically compared with slice images at the same position in the database, and more defects may be found at this time.
  • local multi-slice scanning or spiral CT scanning can be performed on local areas, and then local 3D images can be generated, which can be compared with The corresponding local 3D images in the 3D images of the entire non-defective workpiece in the database are compared.
  • a global multi-slice scan or helical scan can be performed on the entire workpiece 10 to be inspected to generate a three-dimensional image, and then compared with the three-dimensional image of the entire non-defective workpiece in the database, so as to determine the defect position.
  • the embodiments of the present disclosure can realize DR imaging at any angle for the object under inspection, avoid overlapping and dislocation caused by imaging at different angles, and intuitively observe the perspective images of defects from multiple angles; realize CT imaging at any position for the object under inspection, Avoid the overlap of DR images in the ray direction, and accurately determine the type, location, and size of defects; through multi-angle DR images and multi-position CT images, the quality of the inspection object can be analyzed, the process can be improved, the loss in the later period can be reduced, and the Safety accidents; preset positions and automatic positioning can be used for CT scanning of inspected objects, improving scanning efficiency and reducing labor costs.
  • the present disclosure also provides a workpiece inspection method, the method comprising:
  • Step S1 providing an inspection body for scanning and inspecting the workpiece 10 to be inspected;
  • Step S2 pre-store the quality parameters of the non-defective workpiece
  • Step S3 Provide a strategy library containing multiple inspection strategies, select an inspection strategy from the strategy library, and use the inspection ontology to scan and inspect the workpiece 10 to be inspected;
  • Step S4 comparing the result of the scanning inspection with the pre-stored quality parameters
  • Step S5 According to the comparison result, it is judged whether the defect existing in the workpiece 10 to be inspected can be determined;
  • steps S3-S5 include:
  • a three-dimensional image scanning inspection is performed on a preset part of the workpiece 10 to be inspected, and the inspection result is compared with the pre-stored quality parameters at the same position;
  • a three-dimensional image scanning inspection is performed on the entire workpiece 10 to be inspected, and the inspection result is compared with the pre-stored quality parameters at the same position to determine the existence of the workpiece 10 to be inspected. Defects.
  • the comparison operation includes: automatically searching and matching according to the number of the scanned image and the pre-stored or the same number of quality parameters in the database; according to the comparison result, using the control device to drive the inspection unit to automatically locate the defective or suspected defective parts to be checked again.
  • the database can be established for different scanning modes, and standard images can be called in real time according to the location for manual or automatic comparison.
  • the DR scanning inspection is performed at multiple angles of the preset position of the workpiece 10 to be inspected, and the operation of comparing the inspection results with the pre-stored quality parameters of the same angle includes:
  • the DR scan inspection is performed at multiple angles of the preset parts of the workpiece 10 to be inspected, and the inspection results are numbered according to the angles, and then the inspection results are compared with the corresponding numbered pre-stored quality parameters of the same angle.
  • the CT slice scanning inspection is performed at multiple positions of the preset parts of the workpiece 10 to be inspected, and the operation of comparing the inspection results with the pre-stored quality parameters of the same positions includes:
  • CT slice scanning inspection is performed at multiple positions of preset parts of the workpiece 10 to be inspected, and the inspection results are numbered according to the positions, and then the inspection results are compared with the corresponding numbered pre-stored quality parameters of the same position.
  • the workpiece 10 to be inspected may be a blade of a wind power generator, or may be a large workpiece such as an aircraft wing, a blade of a ship unit, or an axle of a train locomotive.
  • the second support member 32 for supporting the fan blade may include at least two rings, and the at least two rings are respectively axially supported on different sides of the fan blade. Axial position for uniform support.

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

一种工件检查装置和方法，装置包括检查本体、检查单元、比对单元、判断单元和策略调整单元，检查本体用于对待检查工件（10）进行扫描检查，检查单元根据预设的检查策略利用检查本体对待检查工件（10）进行扫描检查，比对单元中预先存储有无缺陷工件的质量参数并被配置为将检查单元扫描检查的结果与预先存储的质量参数进行比对，判断单元根据比对单元的比对结果判断是否能够确定待检查工件（10）所存在的缺陷，策略调整单元在判断单元的判断结果为否时调整检查策略，以便检查单元根据调整后的检查策略对待检查工件（10）再次进行扫描检查，直至找到待检查工件（10）所存在的缺陷。

Description

工件检查装置和方法
相关申请的交叉引用
本公开是以申请号为202111669234.1，申请日为2021年12月30日，发明名称为“工件检查装置和方法”的中国专利申请为基础，并主张其优先权，该中国专利申请的公开内容在此作为整体引入本公开中。
技术领域
本公开涉及缺陷检测技术领域，尤其涉及一种工件检查装置和方法。
背景技术
大型工件的尺寸大、重量大，生产制造过程中一旦出现缺陷，很难进行检查。
以风力发电机的叶片为例，风力发电机作为一种清洁能源得到越来越广泛的应用。风力发电机的叶片作为风力发电的第一个环节，主要作用是将风力高效、安全地传送给发电机动力输入轴。叶片是风力发电机的一个重要部件，它的性能好坏直接影响到风力发电机的质量、寿命和使用成本。
风力发电机的叶片长度从50米到90米，高度从3米到6米，最大重量高达40-50吨，全部由碳纤维、玻璃纤维等复合材料通过特种胶粘结而成。复合材料风机叶片在粘合、转运过程中，不可避免地会出现气孔、裂纹、渗胶、脱粘等缺陷，影响叶片的质量和寿命，甚至可能造成不可估量的损失。因此，对风力发电机的叶片进行质量检测显得非常必要和重要。
大型风机叶片传统的检测方法是采用超声波、红外热成像技术或单视角X射线透视进行无损探伤。
超声波扫描方法一般采用单点回波式扫描，而大型叶片的表面积从300到500平米，全部采用逐点扫描的方法，耗时较长，而且劳动强度大，得到的波形信号还需要进一步处理分析，效率很低、效果不佳。
红外热成像技术则容易受到环境温度影响，对细小缺陷的检测能力弱，且只能测到叶片浅表层缺陷，无法准确获取叶片深度信息，对内部缺陷检测无能为力。
单视角X射线透视成像又分为传统的胶片成像和新兴的数字成像两种方式，胶片成像需要将工业胶片放到叶片局部的后面，射线源从正面进行出束，曝光后再进行显 影、定影和烘干，从而得到一幅局部透视照片；数字成像方式则使用数字探测器替换胶片，加上机械移动装置，可以在一次扫描中获取一个视角的全长度叶片透视图像。无论是胶片照相方法获得的局部图像，还是一次DR扫描生成的叶片全长图像，都是叶片单角度图像信息，缺陷在单一角度下的成像会不可避免地产生重叠，无法准确判断缺陷的位置和尺寸。
因此，现有的超声、红外成像、单视角DR成像等方法均不能满足高速、高精度、高质量检测的需要。
目前的行包CT检查系统或者医疗CT检查系统尽管可以实现较高精度的CT检查，可以用在缺陷检查领域，但是由于口径小，无法以相同原理推及大型工件的缺陷检测。
需要说明的是，公开于背景技术部分的信息仅仅旨在增加对本公开的总体背景的理解，而不应当被视为承认或以任何形式暗示该信息构成已为本领域技术人员所公知的现有技术。
发明内容
本公开实施例提供一种工件检查装置和方法，有效提高检测效果。
根据本公开的一个方面，提供一种工件检查装置，包括：
检查本体，用于对待检查工件进行扫描检查；
检查单元，与检查本体信号连接，被配置为根据预设的检查策略，并利用检查本体对待检查工件进行扫描检查；
比对单元，与检查单元信号连接，比对单元中预先存储有无缺陷工件的质量参数，比对单元被配置为将检查单元扫描检查的结果与预先存储的质量参数进行比对；
判断单元，与比对单元信号连接，被配置为根据比对单元的比对结果判断是否能够确定待检查工件所存在的缺陷；和
策略调整单元，与判断单元和检查单元信号连接，被配置为在判断单元的判断结果为否时调整检查策略，以便检查单元根据调整后的检查策略对待检查工件再次进行扫描检查，直至找到待检查工件所存在的缺陷。
在一些实施例中，检查本体包括：
检查组件，用于对待检查工件进行扫描检查；
驱动装置，用于驱动检查组件和/或待检查工件运动，以使检查组件和待检查工件 发生相对运动；和
控制装置，与检查组件和驱动装置信号连接，控制装置用于控制检查组件和驱动装置，以完成预设的检查任务。
在一些实施例中，工件检查装置还包括第一支撑件和第二支撑件，驱动装置包括第一驱动装置和第二驱动装置，检查组件安装于第一支撑件上，第二支撑件用于支撑待检查工件，第一驱动装置驱动第一支撑件和第二支撑件发生相对转动，第二驱动装置驱动第一支撑件和第二支撑件沿待检查工件的轴线方向相对运动。
在一些实施例中，第一支撑件包括中心设有通孔的第一支撑环，检查组件包括射线源和探测器，射线源和探测器均安装于第一支撑环上且射线源和探测器相对布置，第二支撑件和待检查工件被配置为能够穿过通孔，第一驱动装置驱动第一支撑环相对于第二支撑件转动。
在一些实施例中，工件检查装置还包括第一行走轮，第一行走轮安装于第一支撑环的底部，第二驱动装置驱动第一支撑环相对于第二支撑件沿待检查工件的轴线方向运动；或者，第一行走轮安装于第二支撑件的底部，第二驱动装置驱动第二支撑件相对于第一支撑环沿待检查工件的轴线方向运动。
在一些实施例中，第二支撑件包括用于支撑待检查工件的第二支撑环，检查组件包括射线源和探测器，第一支撑件包括第一支撑架和第二支撑架，射线源安装于第一支撑架，探测器安装于第二支撑架，且第一支撑架和第二支撑架之间设有能够使第二支撑环和待检查工件穿过的通道，第一驱动装置驱动第二支撑环相对于第一支撑件转动。
在一些实施例中，工件检查装置还包括第二行走轮，第二行走轮安装于第二支撑环的底部，第二驱动装置驱动第二支撑环相对于第一支撑件沿待检查工件的轴线方向运动；或者，第二行走轮安装于第一支撑件的底部，第二驱动装置驱动第一支撑件相对于第二支撑环沿待检查工件的轴线方向运动。
在一些实施例中，工件检查装置还包括第一位置传感器，第一位置传感器用于检测检查组件和待检查工件相对转动的角度。
在一些实施例中，工件检查装置还包括第二位置传感器，第二位置传感器用于检测检查组件和待检查工件在沿待检查工件的轴线方向上的相对位置。
在一些实施例中，工件检查装置还包括与检查单元和比对单元信号连接的编号装置，编号装置被配置为对比对单元中预先存储的无缺陷工件在多个不同角度或不同位 置处的质量参数和检查单元的多次检测结果分别进行编号，以使比对单元将检查单元扫描检查的结果与对应编号的预先存储的质量参数进行比对。
根据本公开的另一个方面，提供一种工件检查方法，包括：
步骤S1：提供检查本体，用于对待检查工件进行扫描检查；
步骤S2：预先存储无缺陷工件的质量参数；
步骤S3：提供包含多种检查策略的策略库，从策略库中选择检查策略，利用检查本体对待检查工件进行扫描检查；
步骤S4：将扫描检查的结果与预先存储的质量参数进行比对；
步骤S5：根据比对结果，判断是否能够确定待检查工件所存在的缺陷；
若是，检查结束；
若否，调整检查策略，并根据调整后的检查策略，对待检查工件再次进行扫描检查，然后返回步骤S4和S5，直至找到待检查工件所存在的缺陷。
在一些实施例中，策略库包括：
第一检查策略：对待检查工件的多个角度进行DR扫描检查；
第二检查策略：对待检查工件的多个位置进行CT切片扫描检查；
第三检查策略：对待检查工件的局部进行三维图像扫描检查；和
第四检查策略：对待检查工件的整体进行三维图像扫描检查。
在一些实施例中，策略库包括：
第五检查策略：对待检查工件的预设部位进行扫描检查；
第六检查策略：对待检查工件的可疑部位进行扫描检查；和
第七检查策略：先对待检查工件的预设部位进行扫描检查，然后再对待检查工件的可疑部位进行扫描检查；和
第八检查策略：先对待检查工件的可疑部位进行扫描检查，然后再对待检查工件的预设部位进行扫描检查。
在一些实施例中，步骤S3-S5的操作包括：
对待检查工件的预设部位的多个角度进行DR扫描检查，同时将检查结果与预先存储的相同角度的质量参数进行比对；
对待检查工件的预设部位的多个位置进行CT切片扫描检查，同时将检查结果与预先存储的相同位置的质量参数进行比对；
经过比对后，若能够确定待检查工件所存在的缺陷，则检查结束；
若不能确定待检查工件所存在的缺陷，则对待检查工件的预设部位进行三维图像扫描检查，并将检查结果与预先存储的相同位置的质量参数进行比对；
比对后，若能够确定待检查工件所存在的缺陷，则检查结束；
若不能确定待检查工件所存在的缺陷，则对待检查工件的整体进行三维图像扫描检查，并将检查结果与预先存储的相同位置的质量参数进行比对，以确定待检查工件所存在的缺陷。
在一些实施例中，对待检查工件的预设部位的多个角度进行DR扫描检查，同时将检查结果与预先存储的相同角度的质量参数进行比对的操作包括：
对待检查工件的预设部位的多个角度进行DR扫描检查，并将检查结果按照角度进行编号，然后将检查结果与对应编号的预先存储的相同角度的质量参数进行比对。
在一些实施例中，对待检查工件的预设部位的多个位置进行CT切片扫描检查，同时将检查结果与预先存储的相同位置的质量参数进行比对的操作包括：
对待检查工件的预设部位的多个位置进行CT切片扫描检查，并将检查结果按照位置进行编号，然后将检查结果与对应编号的预先存储的相同位置的质量参数进行比对。
基于上述技术方案，本公开实施例通过预先存储无缺陷工件的质量参数，可以将检查结果与预先存储的质量参数进行比对，以便判断是否能够确定工件所存在的缺陷；而且，本公开实施例设有策略调整步骤，通过不断调整检查策略，可以逐步确定工件所存在的缺陷，而不需要直接对工件进行全部地扫描检查，有利于减少检查时间，提高检查效率。
附图说明
此处所说明的附图用来提供对本公开的进一步理解，构成本申请的一部分，本公开的示意性实施例及其说明用于解释本公开，并不构成对本公开的不当限定。在附图中：
图1为本公开工件检查装置第一实施例的结构示意图。
图2为本公开工件检查装置第二实施例的结构示意图。
图3为本公开工件检查装置第三实施例的结构示意图。
图4为本公开工件检查装置第四实施例的结构示意图。
图中：
10、待检查工件；21、射线源；22、探测器；31、第一支撑件；311、第一支撑架；312、第二支撑架；32、第二支撑件；41、第一驱动装置；51、第一行走轮；52、第二行走轮；61、第一支撑台；62、第二支撑台。
具体实施方式
下面将结合本公开实施例中的附图，对实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例仅仅是本公开的一部分实施例，而不是全部的实施例。基于本公开的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本公开保护的范围。
在本公开的描述中，需要理解的是，术语“中心”、“横向”、“纵向”、“前”、“后”、“左”、“右”、“上”、“下”、“竖直”、“水平”、“顶”、“底”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本公开和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本公开保护范围的限制。
参考图1至图4所示，在本公开提供的工件检查装置实施例中，该检查装置包括检查本体、检查单元、比对单元、判断单元和策略调整单元，检查本体用于对待检查工件10进行扫描检查，检查单元与检查本体信号连接，检查单元被配置为根据预设的检查策略，并利用检查本体对待检查工件10进行扫描检查，比对单元与检查单元信号连接，比对单元中预先存储有无缺陷工件的质量参数，比对单元被配置为将检查单元扫描检查的结果与预先存储的质量参数进行比对，判断单元与比对单元信号连接，判断单元被配置为根据比对单元的比对结果判断是否能够确定待检查工件10所存在的缺陷，策略调整单元与判断单元和检查单元信号连接，策略调整单元被配置为在判断单元的判断结果为否时调整检查策略，以便检查单元根据调整后的检查策略对待检查工件10再次进行扫描检查，直至找到待检查工件10所存在的缺陷。
其中，无缺陷工件为没有质量缺陷、可作为参考标准的工件，该工件的型号与待检查工件的型号相同，二者的外形、尺寸、材料和制造工艺等参数均相同。
在上述实施例中，通过预先存储无缺陷工件的质量参数，可以将检查结果与预先存储的质量参数进行比对，以便判断是否能够确定工件所存在的缺陷；而且，该实施例设有策略调整单元，通过不断调整检查策略，可以逐步确定工件所存在的缺陷，而不需要直接对工件进行全部地扫描检查，有利于减少检查时间，提高检查效率。
无缺陷工件的质量参数可以为预先存储于比对单元中的数据，比对单元将检查单元扫描检查的结果直接与预先存储的质量参数进行比对；无缺陷工件的质量参数也可以为存储于数据库中的数据，比对单元先从数据库中调用无缺陷工件的质量参数，然后再与检查单元扫描检查的结果进行比对。
无缺陷工件的质量参数可以通过对没有质量缺陷、可作为参考标准的工件进行直接测量获得，也可以通过对多个可能有缺陷的工件的扫描检查结果进行比对、拼接、优化而获得。质量参数包括尺寸、形状、位置、微结构等多个方面的参数。
在本公开实施例中，检查装置通过调整不同的检查策略，逐步确定工件所存在的缺陷以及缺陷位置，检查装置可以通过多种检查策略进行检查，有效提高检查的准确性。
在一些实施例中，工件检查装置还可以包括策略库，策略库中包括多种检查策略，检查单元可以从策略库中选择预设的检查策略。而且，策略调整单元在调整检查策略时，也可以从策略库中选择其他的检查策略。
通过设置策略库，可以提供多种不同的检查策略，以便逐步确定缺陷位置。
检查单元在选择检查策略时，可以从策略库中任选一种，也可以任选两种或更多种。策略调整单元在调整检查策略时，则可以从策略库中任选另外一种其他未选策略，也可以任选另外两种或更多种其他未选策略，还可以同时选择已选策略和未选策略。在选择了多种策略时，多种策略的顺序也可以进行自由调整。
在一些实施例中，策略库包括第一检查策略、第二检查策略、第三检查策略和第四检查策略。
第一检查策略为：对待检查工件10的多个角度进行DR扫描检查。DR扫描检查为利用数字X射线摄影技术对检查工件10进行扫描检查的方法。DR扫描检查通过对处于预设角度的待检查工件10拍摄图像的方式实现检查，其所拍摄的图像为待检查工件10在拍摄方向的投影。通过对多个角度进行DR扫描检查，可以从多个方向拍摄投影图像。
第二检查策略为：对待检查工件10的多个位置进行CT切片扫描检查。CT切片扫描检查为利用X射线束对待检查工件10的某一位置的切片层进行扫描检查的方法。通过对多个位置进行CT切片扫描检查，可以检查一定厚度内的质量缺陷。而且，CT切片扫描检查可以扫描出断层图像，部位之间无重叠。
第三检查策略为：对待检查工件10的局部进行三维图像扫描检查。通过对待检 查工件10的局部进行三维图像扫描检查，可以更加准确地判断该局部的质量是否存在缺陷。
第四检查策略为：对待检查工件10的整体进行三维图像扫描检查。整体三维图像扫描检查对质量缺陷的检查准确度更高。
除了根据不同的检查手段可以形成多种检查策略之外，在检查方式上，也可以衍生出多种检查策略。
在一些实施例中，策略库包括第五检查策略、第六检查策略、第七检查策略和第八检查策略。第五检查策略为：对待检查工件10的预设部位进行扫描检查；第六检查策略为：对待检查工件10的可疑部位进行扫描检查；第七检查策略为：先对待检查工件10的预设部位进行扫描检查，然后再对预设部位中的可疑部位进行扫描检查；第八检查策略为：先对待检查工件10的可疑部位进行扫描检查，然后再对待检查工件10的预设部位进行扫描检查。
在检查质量缺陷时，可以仅对待检查工件10的预设部位进行扫描检查，预设部位为根据经验确定出现缺陷的概率较高的部位；也可以仅对在工作过程中发现的可疑部位进行扫描检查，以便提高检查效率。
当然，也可以先对预设部位进行扫描检查，然后再对可疑部位进行扫描检查；或者先对可疑部位进行扫描检查，然后再对预设部位进行扫描检查。
在先对预设部位进行扫描检查，然后再对可疑部位进行扫描检查的实施例中，在对预设部位进行扫描检查后，如果发现可能会存在质量缺陷的部位，可以将其列入后续将要进行扫描检查的可疑部位的序列中，以便对可疑部位进行进一步的检查，提高检查的准确性。
在先对可疑部位进行扫描检查，然后再对预设部位进行扫描检查的实施例中，可疑部位可能包含了后续将要进行扫描检查的某些预设部位，因此在后续检查中可以减少检查部位，提高检查效率。
在一些实施例中，检查本体包括检查组件、驱动装置和控制装置，检查组件用于对待检查工件10进行扫描检查，驱动装置用于驱动检查组件和/或待检查工件10运动，以使检查组件和待检查工件10发生相对运动，控制装置，与检查组件和驱动装置信号连接，控制装置用于控制检查组件和驱动装置，以完成预设的检查任务。
在一些实施例中，工件检查装置还包括第一支撑件31和第二支撑件32，驱动装置包括第一驱动装置41和第二驱动装置，检查组件安装于第一支撑件31上，第二支 撑件32用于支撑待检查工件10，第一驱动装置41驱动第一支撑件31和第二支撑件32发生相对转动，第二驱动装置驱动第一支撑件31和第二支撑件32沿待检查工件10的轴线方向相对运动。
通过第一驱动装置41驱动第一支撑件31和第二支撑件32发生相对转动，第二驱动装置驱动第一支撑件31和第二支撑件32沿待检查工件10的轴线方向相对运动，可以实现对待检查工件10的三维图像扫描检查。
在一些实施例中，第一支撑件31包括中心设有通孔的第一支撑环，检查组件包括射线源21和探测器22，射线源21和探测器22均安装于第一支撑环上且射线源21和探测器22相对布置，第二支撑件32和待检查工件10被配置为能够穿过通孔，第一驱动装置41驱动第一支撑环相对于第二支撑件32转动。
在一些实施例中，第一支撑件31可以放置于第一支撑台61上，第二支撑件32可以放置于第二支撑台62上。
如图1所示，在一些实施例中，工件检查装置还包括第一行走轮51，第一行走轮51安装于第二支撑件32的底部，第二驱动装置驱动第二支撑件32相对于第一支撑环沿待检查工件10的轴线方向运动。
如图2所示，在一些实施例中，工件检查装置还包括第一行走轮51，第一行走轮51安装于第一支撑环的底部，第二驱动装置驱动第一支撑环相对于第二支撑件32沿待检查工件10的轴线方向运动。
在一些实施例中，第二支撑件32包括用于支撑待检查工件10的第二支撑环，检查组件包括射线源21和探测器22，第一支撑件31包括第一支撑架311和第二支撑架312，射线源21安装于第一支撑架311，探测器22安装于第二支撑架312，且第一支撑架311和第二支撑架312之间设有能够使第二支撑环和待检查工件10穿过的通道，第一驱动装置驱动第二支撑环相对于第一支撑件31转动。
如图3所示，在一些实施例中，工件检查装置还包括第二行走轮52，第二行走轮52安装于第二支撑环的底部，第二驱动装置驱动第二支撑环相对于第一支撑件31沿待检查工件10的轴线方向运动。
如图4所示，在一些实施例中，工件检查装置还包括第二行走轮52，第二行走轮52安装于第一支撑件31的底部，第二驱动装置驱动第一支撑件31相对于第二支撑环沿待检查工件10的轴线方向运动。
在一些实施例中，工件检查装置可以包括两组第二行走轮52，第一支撑架311和 第二支撑架312的底部分别安装一组第二行走轮52，使得射线源21和探测器22可以分别通过对应的第二行走轮52运动。第二驱动装置可以被配置为同时驱动第一支撑架311和第二支撑架312运动，以便保持射线源21和探测器22的运动同步。
在一些实施例中，工件检查装置还包括第一位置传感器，第一位置传感器用于检测检查组件和待检查工件10相对转动的角度。通过设置第一位置传感器，可以对检查组件和待检查工件10相对转动的角度进行检测，便于在检测时记录检查组件和待检查工件10之间的相对角度，同时对不同角度进行编号，方便后续整理和数据调用。
在一些实施例中，工件检查装置还包括第二位置传感器，第二位置传感器用于检测检查组件和待检查工件10在沿待检查工件10的轴线方向上的相对位置。通过设置第二位置传感器，可以对检查组件和待检查工件10在沿待检查工件10的轴线方向上的相对位置进行检测，便于在检测时记录检查组件和待检查工件10在沿待检查工件10的轴线方向上的相对位置，同时对不同位置进行编号，方便后续整理和数据调用。
在一些实施例中，工件检查装置还包括与检查单元和比对单元信号连接的编号装置，编号装置被配置为对比对单元中预先存储的无缺陷工件在多个不同角度或不同位置处的质量参数和检查单元的多次检测结果分别进行编号，以使比对单元将检查单元扫描检查的结果与对应编号的预先存储的质量参数进行比对。
在一些实施例中，编号装置与第一位置传感器和/或第二位置传感器配合使用，编号装置根据第一位置传感器和/或第二位置传感器所检测的待检查工件10的角度或位置来进行编号。
不同的工件可以通过不同的扫描方式进行扫描检查，具体可以根据缺陷控制严格程度、检验时间要求等对工件进行逐步扫描。比如，从简到易，从可能发现的明显缺陷或大尺寸缺陷到不明显缺陷或小尺寸缺陷。
在一些实施例中，本公开检查装置的检查步骤为：
首先，进行无缺陷工件的数据库建立。此时要进行不同角度DR扫描、叶片轴线关键部位的CT切片图像，以及整个工件的三维重建图像。
其次，针对被检查的有潜在缺陷的待检查工件10时，先自动进行多个角度的DR扫描，然后和标准的无缺陷工件在相同位置角度下的DR图像进行比对，此时有可能会发现一些缺陷。
再次，针对轴线关键部位进行CT切片扫描，得到的CT切片图像和数据库中相同位置下的切片图像可以自动进行比对，此时可能会发现更多的缺陷。
针对关键部位或者根据前三个步骤下发现嫌疑缺陷，但是不是特别清晰或明确的情况下，可以针对局部区域分段进行局部多切片扫描或者螺旋CT扫描，然后生成局部三维图像，该图像可以和数据库中整个无缺陷工件三维图像中相应的局部三维图像进行比对。
如果还是不能确定缺陷位置，可以对整个待检查工件10进行全局多切片扫描或者螺旋扫描生成三维图像，然后和数据库中整个无缺陷工件三维图像进行比对，从而确定缺陷位置。
需要说明的是，以上各个步骤是否进行以及进行的顺序可以根据耗时和待检查工件10的缺陷大小等条件进行确定，比如根据要求进行顺序调整或者只进行个别步骤。譬如，如果仅关注某一个部位的细微缺陷，那就不需要进行DR扫描，可以仅对该部位轴向位置前后一定区域内做多切片CT扫描，重建出局部三维图像后与标准的无缺陷工件相应区域的三维图形进行比对。
本公开实施例可以对被检物实现任意角度DR成像，避免由于不同角度成像带来的重叠和错位，可从多角度直观的观察缺陷的透视图像；可以对被检物实现任意位置CT成像，避免DR图像在射线方向上的重叠，可准确判断缺陷的类型、位置、尺寸；通过多角度DR图像和多位置CT图像可分析被检物加工制造的质量，改进工艺流程，降低后期损失，避免安全事故；可预设位置及自动定位进行被检物CT扫描，提高扫描效率，降低人工成本。
本公开还提供一种工件检查方法，该方法包括：
步骤S1：提供检查本体，用于对待检查工件10进行扫描检查；
步骤S2：预先存储无缺陷工件的质量参数；
步骤S3：提供包含多种检查策略的策略库，从策略库中选择检查策略，利用检查本体对待检查工件10进行扫描检查；
步骤S4：将扫描检查的结果与预先存储的质量参数进行比对；
步骤S5：根据比对结果，判断是否能够确定待检查工件10所存在的缺陷；
若是，检查结束；
若否，调整检查策略，并根据调整后的检查策略，对待检查工件10再次进行扫描检查，然后返回步骤S4和S5，直至找到待检查工件10所存在的缺陷。
在一些实施例中，步骤S3-S5的操作包括：
对待检查工件10的预设部位的多个角度进行DR扫描检查，同时将检查结果与预 先存储的相同角度的质量参数进行比对；
对待检查工件10的预设部位的多个位置进行CT切片扫描检查，同时将检查结果与预先存储的相同位置的质量参数进行比对；
经过比对后，若能够确定待检查工件10所存在的缺陷，则检查结束；
若不能确定待检查工件10所存在的缺陷，则对待检查工件10的预设部位进行三维图像扫描检查，并将检查结果与预先存储的相同位置的质量参数进行比对；
比对后，若能够确定待检查工件10所存在的缺陷，则检查结束；
若不能确定待检查工件10所存在的缺陷，则对待检查工件10的整体进行三维图像扫描检查，并将检查结果与预先存储的相同位置的质量参数进行比对，以确定待检查工件10所存在的缺陷。
其中，比对操作包括：根据扫描图像的编号与预先存储的或数据库中相同编号的质量参数进行自动检索并匹配；根据比对结果，利用控制装置驱动检查单元自动定位于有缺陷或疑似有缺陷的部位进行再次检查。数据库可针对不同扫描模式建立，根据位置实时调用标准图像进行人工或自动比对。
在一些实施例中，对待检查工件10的预设部位的多个角度进行DR扫描检查，同时将检查结果与预先存储的相同角度的质量参数进行比对的操作包括：
对待检查工件10的预设部位的多个角度进行DR扫描检查，并将检查结果按照角度进行编号，然后将检查结果与对应编号的预先存储的相同角度的质量参数进行比对。
在一些实施例中，对待检查工件10的预设部位的多个位置进行CT切片扫描检查，同时将检查结果与预先存储的相同位置的质量参数进行比对的操作包括：
对待检查工件10的预设部位的多个位置进行CT切片扫描检查，并将检查结果按照位置进行编号，然后将检查结果与对应编号的预先存储的相同位置的质量参数进行比对。
上述各个实施例中工件检查装置所具有的积极技术效果同样适用于工件检查方法，这里不再赘述。
在本公开各个实施例中，待检查工件10可以为风力发电机的叶片，也可以为飞机机翼、轮船机组叶片、火车机车车轴等大型工件。
在待检查工件10为风机叶片时，由于叶片长度较长，用于支撑风机叶片的第二支撑件32可以包括至少两个环形件，至少两个环形件分别沿轴向支撑于风机叶片的 不同轴向位置，以便进行均匀支撑。
最后应当说明的是：以上实施例仅用以说明本公开的技术方案而非对其限制；尽管参照较佳实施例对本公开进行了详细的说明，所属领域的普通技术人员应当理解：在不脱离本公开原理的前提下，依然可以对本公开的具体实施方式进行修改或者对部分技术特征进行等同替换，这些修改和等同替换均应涵盖在本公开请求保护的技术方案范围当中。

Claims (16)

  1. 一种工件检查装置，包括：
    检查本体，用于对待检查工件(10)进行扫描检查；
    检查单元，与所述检查本体信号连接，被配置为根据预设的检查策略利用所述检查本体对所述待检查工件(10)进行扫描检查；
    比对单元，与所述检查单元信号连接，所述比对单元中预先存储有无缺陷工件的质量参数，所述比对单元被配置为将所述检查单元扫描检查的结果与预先存储的质量参数进行比对；
    判断单元，与所述比对单元信号连接，被配置为根据所述比对单元的比对结果判断是否能够确定所述待检查工件(10)所存在的缺陷；和
    策略调整单元，与所述判断单元和所述检查单元信号连接，被配置为在所述判断单元的判断结果为否时调整所述检查策略，以便所述检查单元根据调整后的所述检查策略对所述待检查工件(10)再次进行扫描检查，直至找到所述待检查工件(10)所存在的缺陷。
  2. 根据权利要求1所述的工件检查装置，其中，所述检查本体包括：
    检查组件，用于对所述待检查工件(10)进行扫描检查；
    驱动装置，用于驱动所述检查组件和/或所述待检查工件(10)运动，以使所述检查组件和所述待检查工件(10)发生相对运动；和
    控制装置，与所述检查组件和所述驱动装置信号连接，所述控制装置用于控制所述检查组件和所述驱动装置，以完成预设的检查任务。
  3. 根据权利要求2所述的工件检查装置，还包括第一支撑件(31)和第二支撑件(32)，所述驱动装置包括第一驱动装置(41)和第二驱动装置，所述检查组件安装于所述第一支撑件(31)上，所述第二支撑件(32)用于支撑所述待检查工件(10)，所述第一驱动装置(41)驱动所述第一支撑件(31)和所述第二支撑件(32)发生相对转动，所述第二驱动装置驱动所述第一支撑件(31)和所述第二支撑件(32)沿所述待检查工件(10)的轴线方向相对运动。
  4. 根据权利要求3所述的工件检查装置，其中，所述第一支撑件(31)包括中心设有通孔的第一支撑环，所述检查组件包括射线源(21)和探测器(22)，所述射线源(21)和所述探测器(22)均安装于所述第一支撑环上且所述射线源(21)和所述探测器(22)相对布置，所述第二支撑件(32)和所述待检查工件(10)被配置为能够穿过所述通孔，所述第一驱动装置(41)驱动所述第一支撑环相对于所述第二支撑件(32)转动。
  5. 根据权利要求4所述的工件检查装置，其中，还包括第一行走轮(51)，所述第一行走轮(51)安装于所述第一支撑环的底部，所述第二驱动装置驱动所述第一支撑环相对于所述第二支撑件(32)沿所述待检查工件(10)的轴线方向运动；或者，所述第一行走轮(51)安装于所述第二支撑件(32)的底部，所述第二驱动装置驱动所述第二支撑件(32)相对于所述第一支撑环沿所述待检查工件(10)的轴线方向运动。
  6. 根据权利要求3所述的工件检查装置，其中，所述第二支撑件(32)包括用于支撑所述待检查工件(10)的第二支撑环，所述检查组件包括射线源(21)和探测器(22)，所述第一支撑件(31)包括第一支撑架(311)和第二支撑架(312)，所述射线源(21)安装于所述第一支撑架(311)，所述探测器(22)安装于所述第二支撑架(312)，且所述第一支撑架(311)和所述第二支撑架(312)之间设有能够使所述第二支撑环和所述待检查工件(10)穿过的通道，所述第一驱动装置(41)驱动所述第二支撑环相对于所述第一支撑件(31)转动。
  7. 根据权利要求6所述的工件检查装置，还包括第二行走轮(52)，所述第二行走轮(52)安装于所述第二支撑环的底部，所述第二驱动装置驱动所述第二支撑环相对于所述第一支撑件(31)沿所述待检查工件(10)的轴线方向运动；或者，所述第二行走轮(52)安装于所述第一支撑件(31)的底部，所述第二驱动装置驱动所述第一支撑件(31)相对于所述第二支撑环沿所述待检查工件(10)的轴线方向运动。
  8. 根据权利要求2至7中任一项所述的工件检查装置，还包括第一位置传感器，所述第一位置传感器用于检测所述检查组件和所述待检查工件(10)相对转动的角度。
  9. 根据权利要求2至8中任一项所述的工件检查装置，还包括第二位置传感器，所述第二位置传感器用于检测所述检查组件和所述待检查工件(10)在沿所述待检查工件(10)的轴线方向上的相对位置。
  10. 根据权利要求1至9任一项所述的工件检查装置，还包括与所述检查单元和所述比对单元信号连接的编号装置，所述编号装置被配置为对所述比对单元中预先存储的无缺陷工件在多个不同角度或不同位置处的质量参数和所述检查单元的多次检测结果分别进行编号，以使所述比对单元将所述检查单元扫描检查的结果与对应编号的预先存储的质量参数进行比对。
  11. 一种工件检查方法，包括：
    步骤S1：提供检查本体，用于对待检查工件(10)进行扫描检查；
    步骤S2：预先存储无缺陷工件的质量参数；
    步骤S3：提供包含多种检查策略的策略库，从所述策略库中选择所述检查策略，利用所述检查本体对所述待检查工件(10)进行扫描检查；
    步骤S4：将扫描检查的结果与预先存储的质量参数进行比对；
    步骤S5：根据比对结果，判断是否能够确定所述待检查工件(10)所存在的缺陷；
    若是，检查结束；
    若否，调整所述检查策略，并根据调整后的所述检查策略，对所述待检查工件(10)再次进行扫描检查，然后返回步骤S4和S5，直至找到所述待检查工件(10)所存在的缺陷。
  12. 根据权利要求11所述的工件检查方法，其中，所述策略库包括：
    第一检查策略：对所述待检查工件(10)的多个角度进行DR扫描检查；
    第二检查策略：对所述待检查工件(10)的多个位置进行CT切片扫描检查；
    第三检查策略：对所述待检查工件(10)的局部进行三维图像扫描检查；和
    第四检查策略：对所述待检查工件(10)的整体进行三维图像扫描检查。
  13. 根据权利要求11或12所述的工件检查方法，其中，所述策略库包括：
    第五检查策略：对所述待检查工件(10)的预设部位进行扫描检查；
    第六检查策略：对所述待检查工件(10)的可疑部位进行扫描检查；
    第七检查策略：先对所述待检查工件(10)的预设部位进行扫描检查，然后再对所述待检查工件(10)的可疑部位进行扫描检查；和
    第八检查策略：先对所述待检查工件(10)的可疑部位进行扫描检查，然后再对所述待检查工件(10)的预设部位进行扫描检查。
  14. 根据权利要求11至13中任一项所述的工件检查方法，其中，所述步骤S3-S5的操作包括：
    对所述待检查工件(10)的预设部位的多个角度进行DR扫描检查，同时将检查结果与预先存储的相同角度的质量参数进行比对；
    对所述待检查工件(10)的预设部位的多个位置进行CT切片扫描检查，同时将检查结果与预先存储的相同位置的质量参数进行比对；
    经过比对后，若能够确定所述待检查工件(10)所存在的缺陷，则检查结束；
    若不能确定所述待检查工件(10)所存在的缺陷，则对所述待检查工件(10)的预设部位进行三维图像扫描检查，并将检查结果与预先存储的相同位置的质量参数进行比对；
    比对后，若能够确定所述待检查工件(10)所存在的缺陷，则检查结束；
    若不能确定所述待检查工件(10)所存在的缺陷，则对所述待检查工件(10)的整体进行三维图像扫描检查，并将检查结果与预先存储的相同位置的质量参数进行比对，以确定所述待检查工件(10)所存在的缺陷。
  15. 根据权利要求14所述的工件检查方法，其中，对所述待检查工件(10)的预设部位的多个角度进行DR扫描检查，同时将检查结果与预先存储的相同角度的质量参数进行比对的操作包括：
    对所述待检查工件(10)的预设部位的多个角度进行DR扫描检查，并将检查结果按照角度进行编号，然后将检查结果与对应编号的预先存储的相同角度的质量参数进行比对。
  16. 根据权利要求14或15所述的工件检查方法，其中，对所述待检查工件(10) 的预设部位的多个位置进行CT切片扫描检查，同时将检查结果与预先存储的相同位置的质量参数进行比对的操作包括：
    对所述待检查工件(10)的预设部位的多个位置进行CT切片扫描检查，并将检查结果按照位置进行编号，然后将检查结果与对应编号的预先存储的相同位置的质量参数进行比对。
PCT/CN2022/142736 2021-12-30 2022-12-28 工件检查装置和方法 Ceased WO2023125643A1 (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
PL449777A PL449777A1 (pl) 2021-12-30 2022-12-28 Urządzenie i sposób kontroli przedmiotu obrabianego
DE112022005709.2T DE112022005709T5 (de) 2021-12-30 2022-12-28 Vorrichtung und Verfahren zur Werkstückprüfung
DKPA202430374A DK202430374A1 (en) 2021-12-30 2024-07-01 Device and method for workpiece inspection

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202111669234.1A CN116413823B (zh) 2021-12-30 2021-12-30 工件检查装置和方法
CN202111669234.1 2021-12-30

Publications (1)

Publication Number Publication Date
WO2023125643A1 true WO2023125643A1 (zh) 2023-07-06

Family

ID=86997971

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2022/142736 Ceased WO2023125643A1 (zh) 2021-12-30 2022-12-28 工件检查装置和方法

Country Status (5)

Country Link
CN (1) CN116413823B (zh)
DE (1) DE112022005709T5 (zh)
DK (1) DK202430374A1 (zh)
PL (1) PL449777A1 (zh)
WO (1) WO2023125643A1 (zh)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1321884A (zh) * 2001-06-08 2001-11-14 清华同方核技术股份有限公司 用于检查大型工件缺陷的断层实时重建检查方法
CN102636575A (zh) * 2012-03-27 2012-08-15 深圳职业技术学院 一种用于超声成像检测仪器的优化锯齿覆盖扫查装置及方法
US20140140601A1 (en) * 2011-06-30 2014-05-22 Andrew Litvin Iterative image reconstruction
CN206583832U (zh) * 2017-03-29 2017-10-24 江苏至上检测科技有限公司 X射线检测器
US20170343493A1 (en) * 2014-12-09 2017-11-30 Serjeants Llp A method of generating a fingerprint for a gemstone using x-ray imaging
CN112649775A (zh) * 2019-10-10 2021-04-13 上海联影医疗科技股份有限公司 磁共振成像控制方法、装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4803639A (en) * 1986-02-25 1989-02-07 General Electric Company X-ray inspection system
US7253908B2 (en) * 2004-07-22 2007-08-07 The Boeing Company Non-destructive inspection using laser profiling and associated method
CN105902279B (zh) * 2016-06-02 2019-02-19 沈阳东软医疗系统有限公司 一种扫描图像重建的方法和装置
WO2019171920A1 (ja) * 2018-03-06 2019-09-12 国立大学法人東北大学 放射線位相撮像装置
CN108414549A (zh) * 2018-03-07 2018-08-17 中国科学院高能物理研究所 一种用于汽车定损的射线检测方法
CN108819256B (zh) * 2018-06-15 2020-09-11 湖南华曙高科技有限责任公司 扫描控制方法、装置、计算机设备和存储介质
CN210056054U (zh) * 2018-09-26 2020-02-14 昆山市中医医院 一种移动式ct扫描设备
CN112720409B (zh) * 2020-12-23 2022-05-27 青岛泰克博思电工技术有限公司 多工位ct环形扫描行走无损检测智能机器人及控制方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1321884A (zh) * 2001-06-08 2001-11-14 清华同方核技术股份有限公司 用于检查大型工件缺陷的断层实时重建检查方法
US20140140601A1 (en) * 2011-06-30 2014-05-22 Andrew Litvin Iterative image reconstruction
CN102636575A (zh) * 2012-03-27 2012-08-15 深圳职业技术学院 一种用于超声成像检测仪器的优化锯齿覆盖扫查装置及方法
US20170343493A1 (en) * 2014-12-09 2017-11-30 Serjeants Llp A method of generating a fingerprint for a gemstone using x-ray imaging
CN206583832U (zh) * 2017-03-29 2017-10-24 江苏至上检测科技有限公司 X射线检测器
CN112649775A (zh) * 2019-10-10 2021-04-13 上海联影医疗科技股份有限公司 磁共振成像控制方法、装置

Also Published As

Publication number Publication date
PL449777A1 (pl) 2025-08-04
DE112022005709T5 (de) 2024-09-12
DK202430374A8 (en) 2024-08-08
CN116413823A (zh) 2023-07-11
DK202430374A1 (en) 2024-08-06
CN116413823B (zh) 2026-03-17

Similar Documents

Publication Publication Date Title
KR102755685B1 (ko) 구조체의 검사 방법 및 제조 방법, 구조체의 검사 장치 및 제조 장치
CN103954637A (zh) 一种管道焊缝检测系统
CN103234953A (zh) 激光扫描热波层析成像系统与方法
US6873680B2 (en) Method and apparatus for detecting defects using digital radiography
CN115165888A (zh) 一种管道表面及亚表面缺陷的采集装置、检测装置、检测方法
CN110736752A (zh) 一种表面缺陷检测的光照方式、光照结构及检测装置
CN108844978A (zh) 一种用于检测蜂窝内部缺陷的新方法
CN212872271U (zh) 一种用于检测器件缺陷的检测设备
CN104422715B (zh) 基于动态子窗口技术的激光扫描热波成像方法及装置
CN108593710B (zh) 一种高反射率材料表面缺陷的热成像检测系统和方法
CN203203927U (zh) 一种激光扫描热波层析成像装置
CN104155321A (zh) X射线舱机械手无损检测方法
CN105628721A (zh) 背反射结构数字化x射线晶体定向仪及其x射线探测器
CN116413823A (zh) 工件检查装置和方法
CN114018960B (zh) 一种基于x射线探伤图像的缺陷分析装置
CN211669108U (zh) 一种可见光和x射线影像融合的x光装置
CN116840238A (zh) 一种硅棒检测设备、检测方法及切割方法
JP2005049340A (ja) 原子炉用燃料棒の外観検査装置及び検査方法
RU2815652C1 (ru) Способ автоматизации визуально-измерительного контроля труб и устройство для его осуществления
CN108662986A (zh) 一种自由曲面在线实时检测方法及装置
CN115508443A (zh) 一种钢丝圈焊接质量的超声波检测装置
CN115184386A (zh) 车载式数字化快速智能无损检测系统、方法及装置
CN113533384A (zh) 一种具备位姿自检测功能的x射线机夹具
Johnston et al. Investigation of Non‐Destructive Evaluation Methods Applied to Oxide/Oxide Fiber Reinforced Ceramic Matrix Composite
CN221419683U (zh) 一种用于数字射线检测的管板两用承载装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 22914895

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: P.449777

Country of ref document: PL

122 Ep: pct application non-entry in european phase

Ref document number: 22914895

Country of ref document: EP

Kind code of ref document: A1

WWP Wipo information: published in national office

Ref document number: P.449777

Country of ref document: PL