PL449777A1 - Urządzenie i sposób kontroli przedmiotu obrabianego - Google Patents

Urządzenie i sposób kontroli przedmiotu obrabianego

Info

Publication number
PL449777A1
PL449777A1 PL449777A PL44977722A PL449777A1 PL 449777 A1 PL449777 A1 PL 449777A1 PL 449777 A PL449777 A PL 449777A PL 44977722 A PL44977722 A PL 44977722A PL 449777 A1 PL449777 A1 PL 449777A1
Authority
PL
Poland
Prior art keywords
inspection
workpiece
unit
strategy
inspected
Prior art date
Application number
PL449777A
Other languages
English (en)
Inventor
Yuanjing Li
Shangmin Sun
Jianmin Li
Chunguang ZONG
Hejun Zhou
Bicheng LIU
Xiulin NI
Quanwei Song
Kejin Gao
Junping Shi
Weifeng Yu
Original Assignee
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Company Limited filed Critical Nuctech Company Limited
Publication of PL449777A1 publication Critical patent/PL449777A1/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/226—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/63—Specific applications or type of materials turbine blades
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Niniejsze ujawnienie dotyczy urządzenia i sposobu kontroli przedmiotu obrabianego (10), przy czym urządzenie do kontroli przedmiotu obrabianego zawiera korpus do kontroli, jednostkę do kontroli, jednostkę do oceniania i jednostkę do dostosowywania strategii, przy czym korpus do kontroli skanuje i kontroluje przedmiot obrabiany, który ma zostać poddany kontroli; jednostka do kontroli skanuje i kontroluje przedmiot obrabiany, stosując korpus do kontroli zgodnie z ustaloną strategią kontroli; jednostka do porównywania, parametry jakościowe niewadliwego przedmiotu obrabianego są wstępnie przechowywane w jednostce do porównywania oraz skonfigurowana do porównywania wyników kontroli za pomocą skanowania jednostki kontrolującej ze wstępnie zapisanymi parametrami jakościowymi; jednostka do oceniania ocenia, czy wady istniejące w kontrolowanym przedmiocie można określić na podstawie wyniku porównania jednostki do porównywania; a jednostka do dostosowywania strategii dostosowuje strategię kontroli, gdy wynik oceny jednostki do oceniania jest negatywny, tak że jednostka do kontroli skanuje i kontroluje ponownie przedmiot obrabiany, który ma zostać poddany kontroli, zgodnie z dostosowaną strategią kontroli, aż do wystąpienia wad istniejących w przedmiocie obrabianym, który ma zostać poddany kontroli.
PL449777A 2021-12-30 2022-12-28 Urządzenie i sposób kontroli przedmiotu obrabianego PL449777A1 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202111669234.1A CN116413823B (zh) 2021-12-30 2021-12-30 工件检查装置和方法
PCT/CN2022/142736 WO2023125643A1 (zh) 2021-12-30 2022-12-28 工件检查装置和方法

Publications (1)

Publication Number Publication Date
PL449777A1 true PL449777A1 (pl) 2025-08-04

Family

ID=86997971

Family Applications (1)

Application Number Title Priority Date Filing Date
PL449777A PL449777A1 (pl) 2021-12-30 2022-12-28 Urządzenie i sposób kontroli przedmiotu obrabianego

Country Status (5)

Country Link
CN (1) CN116413823B (pl)
DE (1) DE112022005709T5 (pl)
DK (1) DK202430374A1 (pl)
PL (1) PL449777A1 (pl)
WO (1) WO2023125643A1 (pl)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4803639A (en) * 1986-02-25 1989-02-07 General Electric Company X-ray inspection system
CN1321884A (zh) * 2001-06-08 2001-11-14 清华同方核技术股份有限公司 用于检查大型工件缺陷的断层实时重建检查方法
CN108414549A (zh) * 2018-03-07 2018-08-17 中国科学院高能物理研究所 一种用于汽车定损的射线检测方法
US20210041377A1 (en) * 2018-03-06 2021-02-11 Tohoku University Radiographic phase imaging device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7253908B2 (en) * 2004-07-22 2007-08-07 The Boeing Company Non-destructive inspection using laser profiling and associated method
WO2013002805A1 (en) * 2011-06-30 2013-01-03 Analogic Corporation Iterative image reconstruction
CN102636575B (zh) * 2012-03-27 2015-11-11 深圳职业技术学院 一种用于超声成像检测仪器的优化锯齿覆盖扫查装置及方法
GB201421837D0 (en) * 2014-12-09 2015-01-21 Reishig Peter A method of generating a fingerprint for a gemstone using X-ray imaging
CN105902279B (zh) * 2016-06-02 2019-02-19 沈阳东软医疗系统有限公司 一种扫描图像重建的方法和装置
CN206583832U (zh) * 2017-03-29 2017-10-24 江苏至上检测科技有限公司 X射线检测器
CN108819256B (zh) * 2018-06-15 2020-09-11 湖南华曙高科技有限责任公司 扫描控制方法、装置、计算机设备和存储介质
CN210056054U (zh) * 2018-09-26 2020-02-14 昆山市中医医院 一种移动式ct扫描设备
CN112649775B (zh) * 2019-10-10 2023-02-28 上海联影医疗科技股份有限公司 磁共振成像控制方法、装置
CN112720409B (zh) * 2020-12-23 2022-05-27 青岛泰克博思电工技术有限公司 多工位ct环形扫描行走无损检测智能机器人及控制方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4803639A (en) * 1986-02-25 1989-02-07 General Electric Company X-ray inspection system
CN1321884A (zh) * 2001-06-08 2001-11-14 清华同方核技术股份有限公司 用于检查大型工件缺陷的断层实时重建检查方法
US20210041377A1 (en) * 2018-03-06 2021-02-11 Tohoku University Radiographic phase imaging device
CN108414549A (zh) * 2018-03-07 2018-08-17 中国科学院高能物理研究所 一种用于汽车定损的射线检测方法

Also Published As

Publication number Publication date
DE112022005709T5 (de) 2024-09-12
DK202430374A8 (en) 2024-08-08
WO2023125643A1 (zh) 2023-07-06
CN116413823A (zh) 2023-07-11
DK202430374A1 (en) 2024-08-06
CN116413823B (zh) 2026-03-17

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