WO2023103743A1

WO2023103743A1 - On/off switching time test method, related system and device, and storage medium

Info

Publication number: WO2023103743A1
Application number: PCT/CN2022/132751
Authority: WO
Inventors: 薛厚; 郭嘉帅
Original assignee: 深圳飞骧科技股份有限公司
Priority date: 2021-12-06
Filing date: 2022-11-18
Publication date: 2023-06-15
Also published as: CN114167274B; CN114167274A

Abstract

An on/off switching time test method, which involves a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier, and a detector. The method comprises the following steps: building a test system, starting the test system, adjusting a test device, and calculating on/off switching time. Also provided are an on/off switching time test system, an on/off switching time test device, and a computer-readable storage medium. The test structure using this technical solution is simple and easy to operate.

Description

Switching time test method, related system and equipment, and storage medium

technical field

The invention relates to the technical field of switch testing, in particular to a switch switching time testing method, a switch switching time testing system, a switch switching time testing device and a computer-readable storage medium.

Background technique

With the rapid increase in the number of instant messaging terminals and the amount of audio and video data, higher requirements are placed on the performance of wireless access points (Access Point, referred to as AP). Among them, in order to meet the growing demand for multi-task data transmission, low-latency task switching is particularly important. Testing the switching time of switches becomes a basic test requirement.

At present, in the prior art, testers conduct tests through different test equipment, and instrument manufacturers do not provide a complete set of solutions. How to provide a set of simple structure, which is convenient for testers to quickly test the switch switching time by using general test equipment has become a technical problem that needs to be solved.

Therefore, it is necessary to provide a new method, related system and equipment to solve the above technical problems.

Contents of the invention

The purpose of the present invention is to overcome the above technical problems, and provide a switch switching time testing method, a switch switching time testing device and a computer-readable storage medium with a simple test structure and easy operation.

In the first aspect, the embodiment of the present invention provides a switch switching time testing method, providing a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier, and a wave detector. The method includes the following steps:

Build a test system, connect the output terminal of the waveform generator to the input terminal of the inverter, the first input terminal of the oscilloscope and the first control terminal of the switch respectively, and connect the The output end is connected to the second control end of the switch, the output end of the signal generator is connected to the input end of the switch after connecting the power amplifier in series, and the output end of the switch is connected to the detection The input end of the wave detector is connected to the second input end of the wave detector shown in the output end of the wave detector;

Start the test system, energize the waveform generator, the inverter, the oscilloscope, the switch, the signal generator, the power amplifier and the wave detector and set them in a working state;

Adjusting the test equipment, adjusting the waveform generator to a preset waveform setting, adjusting the signal generator to a preset output state setting, and adjusting the oscilloscope to a preset resolution reading setting;

Calculate the switching time of the switch, by reading the first waveform output by the waveform generator and the second waveform output by the detector displayed by the oscilloscope, according to the high potential or low potential in one cycle of the first waveform Potential and the low potential or high potential of the initial stable state of the corresponding second waveform in this cycle to obtain the switch start and stop time, and obtain the delay time difference according to the high and low level inversion time of the second waveform, and according to the switch The switching time of the switch is obtained by calculating the start-stop time and the delay time difference, and satisfies the following formula:

Td = Tosc - Tdet,

Wherein, Td is the switching time of the switch, Tosc is the start-stop time of the switch, and Tdet is the delay time difference.

Preferably, the preset waveform is set such that the output waveform of the waveform generator is set at a frequency of 100Khz and an amplitude of 3V.

Preferably, the preset output state is set such that the output waveform of the signal generator is set at a frequency of 1Ghz and a power amplitude of -10dbm.

Preferably, the preset output state settings are adjusted accordingly according to the properties of the power amplifier.

Preferably, the preset output state is set such that the output waveform of the signal generator is set at a frequency of 5Ghz and a power amplitude of -20dbm.

In the second aspect, the embodiment of the present invention also provides a switch switching time test system, the system includes a test module and a calculation module,

The test module includes a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier, and a wave detector; the output terminals of the waveform generator are respectively connected to the input ends of the inverter, the oscilloscope The first input terminal of the switch and the first control terminal of the switch, the output terminal of the inverter is connected to the second control terminal of the switch, and the output terminal of the signal generator is connected to the power amplifier after being connected in series to the input end of the switch, the output end of the switch is connected to the input end of the wave detector, and the output end of the wave detector is connected to the second input end of the wave detector; wherein, the waveform generator, the The inverter, the oscilloscope, the switch, the signal generator, the power amplifier and the detector are energized and set to work, the waveform generator is adjusted to a preset waveform setting, and the signal the generator is adjusted to a preset output state setting, and the oscilloscope is adjusted to a preset resolution reading setting;

The calculation module is used to read the first waveform output by the waveform generator and the second waveform output by the detector displayed by the oscilloscope, according to the high potential or low potential in one cycle of the first waveform Potential and the low potential or high potential of the initial stable state of the corresponding second waveform in this cycle to obtain the switch start and stop time, and obtain the delay time difference according to the high and low level inversion time of the second waveform, and according to the switch The switching time of the switch is obtained by calculating the start-stop time and the delay time difference, and satisfies the following formula:

Td = Tosc - Tdet,

In the third aspect, the embodiment of the present invention also provides a switching time testing device, including a processor and a memory, the processor is used to read the program in the memory, and the processor reads the program in the memory The program executes the steps in the above-mentioned switching time testing method of the embodiment of the present invention.

In a fourth aspect, an embodiment of the present invention also provides a computer-readable storage medium, the computer-readable storage medium stores a computer program, the computer program includes program instructions, and when the program instructions are executed by a processor, the above The steps in the switch switching time test method described in any one.

Compared with the prior art, the switching time testing method of the present invention includes the following steps: building a testing system, starting the testing system, adjusting testing equipment, and calculating the switching time. The implementation of this step builds a test system with a simple structure, which includes a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier, and a wave detector. Test equipment, which is beneficial for testers to test and operate. More preferably, after the tester finishes building the test system, he only needs to power on the relevant equipment and devices, and after making simple adjustments to the waveform generator, the signal generator and the oscilloscope, read the The oscilloscope displays the first waveform output by the waveform generator and the second waveform output by the detector, and performs a simple subtraction calculation to obtain the switching time of the switch. The whole test process is simple and easy to operate. Therefore, the test structure of the switch switching time test method, the switch switch time test system, the switch switch time test equipment and the computer-readable storage medium of the present invention are simple and easy to operate.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings that need to be used in the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings without creative work, wherein,

Fig. 1 is a block flow diagram of a switch switching time testing method provided by an embodiment of the present invention;

FIG. 2 is a schematic structural diagram of a test system of a switch switching time test method provided by an embodiment of the present invention;

Fig. 3 is the output waveform diagram of waveform generator, inverter and detector in Fig. 2;

FIG. 4 is a block diagram of a module structure of a switching time testing system provided by an embodiment of the present invention;

FIG. 5 is a schematic structural diagram of a switching time testing device provided by an embodiment of the present invention.

Detailed ways

The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

The terms "comprising" and "having" and any variations thereof in the specification, claims and descriptions of the drawings of this application are intended to cover a non-exclusive inclusion. The terms "first", "second" and the like in the specification and claims of the present application or in the drawings are used to distinguish different objects, rather than to describe a specific order. Reference herein to "an embodiment or this embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment may be included in at least one embodiment of the present application. The occurrences of this phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is understood explicitly and implicitly by those skilled in the art that the embodiments described herein can be combined with other embodiments.

Please refer to FIG. 1 . FIG. 1 is a flow chart of the switching time testing method of the present invention. The present invention provides a switch switching time testing method, and the switch switching time testing method includes the following steps:

Step S1, building a test system.

Specifically: connect the output end of the waveform generator to the input end of the inverter, the first input end of the oscilloscope and the first control end of the switch; the output of the inverter terminal is connected to the second control terminal of the switch; the output terminal of the signal generator is connected to the input terminal of the switch after connecting the power amplifier in series; the output terminal of the switch is connected to the detector the input terminal of the oscilloscope; the output terminal of the oscilloscope is connected to the second input terminal of the oscilloscope shown.

Please refer to Fig. 2, which is a schematic structural diagram of a test system for a switching time test method provided by an embodiment of the present invention. The test system of the switch switching time test method includes a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier and a wave detector.

It should be pointed out that the waveform generator, inverter, oscilloscope, switch, signal generator, power amplifier and wave detector used in the utility model are all commonly used equipment and components in the field, and the corresponding specific selection and parameters Adjustments are made according to actual applications, and details are not described here.

Step S2, start the test system.

Specifically: power on the waveform generator, the inverter, the oscilloscope, the switch, the signal generator, the power amplifier and the wave detector and set them in a working state.

Step S3, adjusting the testing equipment.

Specifically: adjusting the waveform generator to a preset waveform setting, adjusting the signal generator to a preset output state setting, and adjusting the oscilloscope to a preset resolution reading setting.

In the adjustment of the waveform generator to the preset waveform setting, the preset waveform setting is that the output waveform of the waveform generator is set at a frequency of 100Khz and an amplitude of 3V. After adjusting the waveform generator, the tester only needs to confirm whether the waveform state is consistent with the setting.

In adjusting the signal generator to a preset output state setting, the preset output state setting is that the output waveform of the signal generator is set at a frequency of 1Ghz and a power amplitude of -10dbm. After the tester adjusts the signal generator, he only needs to confirm whether the output signal state is consistent with the setting.

Of course, it is not limited thereto. In order to adjust flexibly during the test, the preset output state setting is adjusted accordingly according to the property of the power amplifier. That is to say, the tester can replace the power amplifier of different models during the test and readjust the output waveform of the signal generator. This setting is conducive to flexible adjustment during the test of the switching time of the switch. Easy to operate for testers. For example, in another embodiment, the preset output state setting is adjusted so that the output waveform of the signal generator is set at a frequency of 5Ghz and a power amplitude of -20dbm.

In the setting of adjusting the oscilloscope to a preset resolution reading, the preset resolution reading means that the oscilloscope is adjusted to a suitable reading resolution condition, and the tester checks whether the reading is normal.

Step S4, calculating the switching time of the switch.

Specifically: by reading the first waveform output by the waveform generator and the second waveform output by the detector displayed by the oscilloscope, according to the high potential or low potential and The low potential or high potential of the initial stable state of the second waveform corresponding to this cycle obtains the switch start and end time, obtains the delay time difference according to the high and low level inversion time of the second waveform, and obtains the delay time difference according to the switch start and stop time and the delay time difference to calculate the switching time of the switch, and satisfy the following formula:

Td = Tosc - Tdet,

Wherein, the waveform generator and the inverter are combined into a logic control circuit to quickly switch the switch between two states. For example, the switch shown in FIG. 2 is directly and quickly switched between two connection states of CA and CB.

The signal generator provides a low-power radio frequency signal as a signal input, the signal is amplified by the power amplifier, and then converted by the detector to be used as the oscilloscope as a marker signal for detection, i.e. waveform W3; The oscilloscope also detects the waveform W1 of the waveform generator to determine the switch flipping state.

Combining the switch flip state and the output waveform W3 of the detector to confirm the switch start-stop time Tosc, and quickly read the value from the waveform displayed by the oscilloscope. If the required test switching state changes, you only need to manually change the connection state of the inverter. If you want to see the change of the delay of the switch under different input power and frequency, you only need to change the output frequency of the signal generator. With power you can. Therefore, the test structure of the switch switching time test method is simple and easy to operate.

The following is an example of a test:

The time for the switch to switch from CA to CB, that is, from state 1 to state 2, is measured.

The logical relationship in the test is shown in Table 1 below:

状态state	W1W1	W2W2	连接关系 connection relationship

状态1state 1	11	00	CA CA

状态2state 2	00	11	CBCB

Table 1. Logical relationship in the test

It can be obtained from the test that: the switch start-stop time Tosc is 500ns, and the delay time difference Tdet is 300ns.

The switching time Td of the switch is calculated to be 200 ns.

Wherein, the delay of the inverter itself is about 20 ns.

Please refer to FIG. 4 , which is a block diagram of a module structure of a switching time testing system provided by an embodiment of the present invention. The present invention also provides a switching time testing system 100 .

The switching time test system 100 includes a test module 1 and a calculation module 2 .

The test module 1 includes a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier and a wave detector; the output terminals of the waveform generator are respectively connected to the input terminals of the inverter, the The first input terminal of the oscilloscope and the first control terminal of the switch, the output terminal of the inverter is connected to the second control terminal of the switch, and the output terminal of the signal generator is connected to the input end of the switch, the output end of the switch is connected to the input end of the detector, and the output end of the detector is connected to the second input end of the shown wave detector; wherein, the waveform generator, The inverter, the oscilloscope, the switch, the signal generator, the power amplifier and the detector are powered on and set to work, the waveform generator is adjusted to a preset waveform setting, and the The signal generator is tuned to a preset output state setting and the oscilloscope is tuned to a preset resolution readout setting.

The calculation module 2 is used to read the first waveform output by the waveform generator and the second waveform output by the detector displayed by the oscilloscope, according to the high potential or The low potential and the low potential or high potential corresponding to the initial stable state of the second waveform in this cycle obtain the switch start and stop time, obtain the delay time difference according to the high and low level inversion time of the second waveform, and according to the The switch switching time is obtained by calculating the switching start and stop time and the delay time difference, and satisfies the following formula:

Td = Tosc - Tdet,

Please refer to FIG. 5 , which is a schematic structural diagram of a switching time testing device 1000 of the present invention. The present invention also provides a switching time testing device 1000 .

The switching time testing device 1000 includes a processor 1001, a memory 1002, a network interface 1003 and a computer program stored on the memory 1002 and operable on the processor 1001, and the processor 1001 is used to read the The program in 1002, the processor 1001 implements the steps in the switching time testing method provided by the embodiment when executing the computer program. That is, the processor 1001 executes the steps in the switching time testing method.

Specifically, the processor 1001 is configured to perform the following steps:

Step S1, building a test system. Specifically:

The output terminal of the waveform generator is connected to the input terminal of the inverter, the first input terminal of the oscilloscope and the first control terminal of the switch respectively, and the output terminal of the inverter is connected to The second control terminal of the switch connects the output terminal of the signal generator to the input terminal of the switch after connecting the power amplifier in series, and connects the output terminal of the switch to the input terminal of the detector , connect the output of the detector to the second input of the detector.

Step S2, start the test system. Specifically:

Powering on the waveform generator, the inverter, the oscilloscope, the switch, the signal generator, the power amplifier and the wave detector and setting them in a working state;

Step S3, adjusting the testing equipment. Specifically:

The waveform generator is adjusted to a preset waveform setting, the signal generator is adjusted to a preset output state setting, and the oscilloscope is adjusted to a preset resolution readout setting.

Step S4, calculating the switching time of the switch. Specifically:

By reading the first waveform output by the waveform generator and the second waveform output by the detector displayed by the oscilloscope, according to the high potential or low potential in one cycle of the first waveform and the cycle According to the low potential or high potential of the initial stable state of the corresponding second waveform, the switch start and stop time is obtained, and the delay time difference is obtained according to the high and low level inversion time of the second waveform, and according to the switch start and stop time and the The delay time difference is calculated to obtain the switching time of the switch, and satisfies the following formula:

Td = Tosc - Tdet,

The switch switching time testing device 1000 provided in the embodiment of the present invention can realize various implementation modes and corresponding beneficial effects in the switch switching time testing method embodiment. To avoid repetition, details are not repeated here.

It should be noted that only 1001-1003 with components are shown in FIG. 5, but it should be understood that it is not required to implement all the components shown, and more or fewer components may be implemented instead. Among them, those skilled in the art can understand that the switching time testing device 1000 here is a device that can automatically perform numerical calculation and/or information processing according to preset or stored instructions, and its hardware includes but not Limited to microprocessors, application specific integrated circuits (Application Specific Integrated Circuit, ASIC), programmable gate arrays (Field-Programmable GateArray, FPGA), digital processors (Digital Signal Processor, DSP), embedded devices, etc.

The memory 1002 includes at least one type of readable storage medium, and the readable storage medium includes flash memory, hard disk, multimedia card, card-type memory (for example, SD or DX memory, etc.), random access memory (RAM), static random access Memory (SRAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), Programmable Read Only Memory (PROM), Magnetic Memory, Magnetic Disk, Optical Disk, etc. In some embodiments, the memory 1002 may be an internal storage unit of the switching time testing device 1000, such as a hard disk or a memory of the switching time testing device 1000. In some other embodiments, the memory 1002 can also be an external storage device of the switching time testing device 1000, such as a plug-in hard disk equipped on the switching time testing device 1000, a smart memory card (Smart Media Card , SMC), Secure Digital (Secure Digital, SD) card, Flash Card (Flash Card), etc. Of course, the memory 1002 may also include both the internal storage unit of the switching time testing device 1000 and its external storage device. In this embodiment, the memory 1002 is generally used to store the operating system and various application software installed in the switching time testing device 1000 , such as the program code of the switching time testing method of the switching time testing device 1000 . In addition, the memory 1002 can also be used to temporarily store various types of data that have been output or will be output.

The processor 1001 may be a central processing unit (Central Processing Unit, CPU), controller, microcontroller, microprocessor, or other data processing chips in some embodiments. The processor 1001 is generally used to control the overall operation of the switching time testing device 1000 . In this embodiment, the processor 1001 is configured to run program codes stored in the memory 1002 or process data, for example, program codes for running a switching time testing method of the switching time testing device 1000 .

The network interface 1003 may include a wireless network interface or a wired network interface, and the network interface 1003 is generally used to establish a communication connection between the switching time testing device 1000 and other electronic devices.

The present invention also provides a computer-readable storage medium, the computer-readable storage medium stores a computer program, the computer program includes program instructions, and when the program instructions are executed by the processor 1001, the switch switching time as described above is realized A step in a test method.

Those of ordinary skill in the art can understand that all or part of the flow in the switching time testing method of the switching time testing device 1000 of the embodiment can be completed by instructing related hardware through a computer program, and the program can be stored in a computer. When the program is read from the storage medium and executed, it may include the processes of the embodiments of the methods. Wherein, the storage medium may be a magnetic disk, an optical disk, a read-only memory (Read-Only Memory, ROM) or a random access memory (Random Access Memory, RAM for short).

The implementation manner mentioned in the embodiments of the present invention is for convenience of description. The above disclosures are only preferred embodiments of the present invention, and certainly cannot limit the scope of rights of the present invention. Therefore, equivalent changes made according to the claims of the present invention still fall within the scope of the present invention.

What has been described above is only the embodiment of the present invention. It should be pointed out that for those of ordinary skill in the art, improvements can be made without departing from the creative concept of the present invention, but these all belong to the present invention. scope of protection.

Claims

A switch switching time testing method, providing a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier and a wave detector, is characterized in that the method comprises the following steps:

Build a test system, connect the output terminal of the waveform generator to the input terminal of the inverter, the first input terminal of the oscilloscope and the first control terminal of the switch respectively, and connect the The output end is connected to the second control end of the switch, the output end of the signal generator is connected to the input end of the switch after connecting the power amplifier in series, and the output end of the switch is connected to the detection The input end of the wave detector is connected to the second input end of the wave detector shown in the output end of the wave detector;

Start the test system, energize the waveform generator, the inverter, the oscilloscope, the switch, the signal generator, the power amplifier and the wave detector and set them in a working state;

Adjusting the test equipment, adjusting the waveform generator to a preset waveform setting, adjusting the signal generator to a preset output state setting, and adjusting the oscilloscope to a preset resolution reading setting;

Calculate the switching time of the switch, by reading the first waveform output by the waveform generator and the second waveform output by the detector displayed by the oscilloscope, according to the high potential or low potential in one cycle of the first waveform Potential and the low potential or high potential of the initial stable state of the corresponding second waveform in this cycle to obtain the switch start and stop time, and obtain the delay time difference according to the high and low level inversion time of the second waveform, and according to the switch The switching time of the switch is obtained by calculating the start-stop time and the delay time difference, and satisfies the following formula:

Td = Tosc - Tdet,

Wherein, Td is the switching time of the switch, Tosc is the start-stop time of the switch, and Tdet is the delay time difference.
The switching time testing method according to claim 1, characterized in that, the preset waveform is set such that the output waveform of the waveform generator is set at a frequency of 100Khz and an amplitude of 3V.
The switching time testing method according to claim 2, wherein the preset output state is set to the output waveform of the signal generator at a frequency of 1Ghz and a power amplitude of -10dbm.
The method for testing switching time of a switch according to claim 2, wherein the preset output state setting is adjusted accordingly according to the property of the power amplifier.
The switching time testing method according to claim 4, wherein the preset output state is set to the output waveform of the signal generator set at a frequency of 5Ghz and a power amplitude of -20dbm.
A switch switching time test system is characterized in that the system includes a test module and a calculation module,

The test module includes a waveform generator, an inverter, an oscilloscope, a switch, a signal generator, a power amplifier, and a wave detector; the output terminals of the waveform generator are respectively connected to the input ends of the inverter, the oscilloscope The first input terminal of the switch and the first control terminal of the switch, the output terminal of the inverter is connected to the second control terminal of the switch, and the output terminal of the signal generator is connected to the power amplifier after being connected in series to the input end of the switch, the output end of the switch is connected to the input end of the wave detector, and the output end of the wave detector is connected to the second input end of the wave detector; wherein, the waveform generator, the The inverter, the oscilloscope, the switch, the signal generator, the power amplifier and the detector are energized and set to work, the waveform generator is adjusted to a preset waveform setting, and the signal the generator is adjusted to a preset output state setting, and the oscilloscope is adjusted to a preset resolution reading setting;

The calculation module is used to read the first waveform output by the waveform generator and the second waveform output by the detector displayed by the oscilloscope, according to the high potential or low potential in one cycle of the first waveform Potential and the low potential or high potential of the initial stable state of the corresponding second waveform in this cycle to obtain the switch start and stop time, and obtain the delay time difference according to the high and low level inversion time of the second waveform, and according to the switch The switching time of the switch is obtained by calculating the start-stop time and the delay time difference, and satisfies the following formula:

Td = Tosc - Tdet,

Wherein, Td is the switching time of the switch, Tosc is the start-stop time of the switch, and Tdet is the delay time difference.
A switch switching time testing device, characterized in that it includes a processor and a memory, the processor is used to read the program in the memory, and execute the switch switching time test according to any one of claims 1 to 5 steps in the method.
A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program, the computer program includes program instructions, and when the program instructions are executed by a processor, any of claims 1-5 can be implemented. A step in the switching time test method described in one item.