WO2023103199A1 - 一种电接触探针装置 - Google Patents

一种电接触探针装置 Download PDF

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Publication number
WO2023103199A1
WO2023103199A1 PCT/CN2022/080724 CN2022080724W WO2023103199A1 WO 2023103199 A1 WO2023103199 A1 WO 2023103199A1 CN 2022080724 W CN2022080724 W CN 2022080724W WO 2023103199 A1 WO2023103199 A1 WO 2023103199A1
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WO
WIPO (PCT)
Prior art keywords
probe
electrical contact
hole
contact probe
probe device
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PCT/CN2022/080724
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English (en)
French (fr)
Inventor
邹振东
李兴圣
黄睿
贺建兰
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中兴通讯股份有限公司
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Publication of WO2023103199A1 publication Critical patent/WO2023103199A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
    • Y02T10/00—Road transport of goods or passengers
    • Y02T10/60—Other road transportation technologies with climate change mitigation effect
    • Y02T10/70—Energy storage systems for electromobility, e.g. batteries

Definitions

  • the present application relates to the field of semiconductor technology, and more specifically, relates to an electrical contact probe device.
  • An embodiment of the present application provides an electrical contact probe device.
  • An embodiment of the present application provides an electrical contact probe device, including: a fixing plate, a plurality of installation holes are opened on the fixing plate; a probe is installed in the installation hole, and the probe includes a needle bar and a set A protrusion and an axial annular groove on the needle bar; a spring, one end of the spring is arranged in the annular groove, and the other end is in contact with the fixing plate; the mounting hole includes a The upper half hole and the lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
  • FIG. 1 is a schematic structural diagram of an electrical contact probe device in an embodiment of the present application
  • FIG. 2 is a schematic diagram of the probe structure of the electrical contact probe device in an embodiment of the present application.
  • FIG. 3 is a schematic structural view of the fixing plate of the electrical contact probe device in the embodiment of the present application.
  • FIG. 4 is a schematic diagram of the bushing structure of the electrical contact probe device in the embodiment of the present application.
  • Fig. 5 is an exploded view of the structure of the electrical contact probe device in the embodiment of the present application.
  • Fig. 1-Fig. 5 the reference signs involved in Fig. 1-Fig. 5 are explained as follows: 1-probe, 2-spring, 3-bush, 4-fixing plate, 5-installation hole, 6-installation and fixing hole, 11-wiring structure , 12-protrusion, 13-axial annular groove, 31-semi-through groove, 32-guiding groove, 33-sleeve structure.
  • Electrical contact probes in the field of ICT-PCBA (functional testing of assembled cards), are generally used as contact media for electrical testing, and are high-end precision electronic hardware components.
  • the main job of the electrical contact probe is to realize the conduction of the current and complete the test task.
  • many types of probes have been developed in related fields, such as current needles, positioning needles, switch needles, capacitor needles, high-frequency needle series, etc.
  • the common general-purpose probe structure is generally divided into needle sleeve, needle rod, spring and other parts, wherein the spring is placed in the needle sleeve, the needle rod is inserted into the needle sleeve, and the electrical contact work is completed by compressing the spring through the needle rod during work.
  • the probes used are the common general-purpose probes mentioned above, and such common general-purpose probes can be fixed on the plastic board by welding
  • pressing and pulling the mechanical handle can make the plastic plate of the electrical contact probe device move back and forth, and the probe can contact and separate from the test device with the forward and backward movement of the plastic plate.
  • the shaft hole is an interference fit between the needle bar and the needle sleeve, and there is a spring inside the needle sleeve, the elastic displacement and compression of the needle head during contact can be realized with the compression and elongation of the spring.
  • contacts such as electrical contact probes are affected by many factors, among which many factors such as coating, ambient temperature and humidity, surface shape, load, shock and vibration will affect the use of contacts.
  • there may also be phenomena such as surface fusion and increased contact gaps. Therefore, it is necessary to reduce the resistance of the contacts and the complexity of the overall structure as much as possible, so as to ensure the reliability of the use process.
  • an embodiment of the present application provides an electrical contact probe device, including: a fixed plate, a plurality of mounting holes and probes are opened on the fixed plate, the probes are installed in the mounting holes, the probes include needle rods and are arranged on The protrusion on the needle bar and the axial annular groove; the spring, one end of the spring is set in the annular groove, and the other end is in contact with the fixed plate; the installation hole includes the upper half hole matching with the protrusion and the lower half hole matching with the needle bar, Wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
  • This application transfers the function of elastic expansion and contraction of the probe itself to between the fixed plate and the probe, so that the electrical contact probe device has better reliability, and the probe does not need to be welded on the fixed plate when used ,
  • the probe does not need to be welded on the fixed plate when used .
  • Figure 1 is a schematic structural view of the electrical contact probe device in an embodiment of the present application
  • Figure 2 is a schematic structural view of the probe of the electrical contact probe device in an embodiment of the present application, and in the embodiment of the present application Electrical contact probe assembly, including:
  • the fixed plate 4 has a plurality of mounting holes 5 on the fixed plate 4;
  • the probe 1 is installed in the installation hole 5, and the probe 1 includes a needle bar 14, a protrusion 12 and an axial annular groove 13 arranged on the needle bar 14;
  • Spring 2 one end of the spring 2 is arranged in the annular groove, and the other end is in contact with the fixed plate 4;
  • the mounting hole 5 includes an upper half hole cooperating with the protrusion and a lower half hole cooperating with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
  • the electrical contact probe device in the embodiment of the present application achieves structural improvement through the structural design of the probe itself and the design of the opening structure of the fixing plate.
  • the traditional probe structure design such as the interference fit between the needle shaft and the needle sleeve through the shaft hole and the spring inside the needle sleeve is cancelled.
  • the spring is arranged between the probe and the fixed plate, and the spring is fixed and pressed by the axial annular groove of the probe structure itself and the fixed plate, and by setting a half-through hole on the fixed plate , cooperate with the protruding structure that the probe is arranged on the needle bar to realize the shuttle of the probe up and down in the installation hole.
  • the probe head is first brought into contact with the corresponding electrical connection point of the module to be tested, and then the fixed plate is forced to move forward, and the spring will be continuously compressed during the movement process , at this moment, the probe moves backward along the half-through groove of the fixed plate, thereby completing the electrical contact between the electrical contact probe and the module to be tested.
  • the spring is mounted on the probe, wherein the circumference of the spring is greater than the circumference of the needle shaft portion with the boss.
  • the natural length of the spring is smaller than the distance between the bottom of the annular groove and the fixed plate, so that when no external force is applied to the fixed plate or the probe, the spring has a certain amount of initial compression, so that the preload of the electrical contact probe device is stable.
  • the electrical contact probe device in the embodiment of the present application transfers the function of elastic expansion and contraction to the fixed plate by sacrificing the expansion and contraction function of the probe in related situations, in exchange for better reliability.
  • the probe with less structural redundancy can use a thicker rod body, and the electrical contact probe device will not cause internal wear after the device is simplified.
  • the electrical contact probe device When the electrical contact probe device is used, it does not need to be welded on the fixed plate as in related cases, and it is directly inserted into the mounting hole and inserted into the half slot through the probe boss, so that the electrical contact probe is stuck in the hole.
  • the shape and structural details of the fixed plate and the shape of the probe shown in Figure 1 do not constitute a limitation to the application, and may include the shape and structural details of the fixed plate and the shape of the probe shown in the illustration.
  • the shape and structural details of other different fixed plates, the shape of the probe, specifically, according to different specific requirements, the shape and structural details of the corresponding fixed plate, and the shape of the probe are also different.
  • the listed shapes and structural details of the above-mentioned fixing plate and the shape of the probes are only for illustration.
  • Fig. 2 is a schematic diagram of the probe structure of the electrical contact probe device in the embodiment of the present application.
  • the probe specifically includes: a needle bar 14, and a Protrusion 12 and axial annular groove 13 on the rod 14.
  • the notch of the axial annular groove 13 on the right part of the shaft shoulder of the middle section of the needle bar 14 is opposite to the protrusion 12 arranged on the left part of the shaft shoulder of the middle section of the needle bar 14, so that after the protrusion 12 enters the mounting hole,
  • the two ends of the spring are fixed by the axial annular groove and the fixed plate, so as to prevent the spring from popping up due to the opening and closing movement of the mechanism and prevent the spring from falling off.
  • the protrusion 12 is arranged so that the probe moves in the half-through hole of the fixed plate during work, and plays a role in preventing the probe from rolling.
  • the shapes of the needle bar 14, protrusion 12 and axial annular groove 13 shown in FIG. Other convex shapes and axial annular groove shapes with different groove shapes.
  • the shapes of the corresponding selected needle rods, protrusions, and axial annular grooves are also different.
  • the embodiment of the present application The shapes of the needle bar, projection and axial annular groove listed above are given as examples only.
  • the probe can be made of common metal materials such as copper or brass.
  • the electrical contact probe adopts a solid needle rod, which greatly reduces the temperature rise when the electrical connection is in normal operation, and avoids the generation of contact resistance during the elastic friction process, improving the stability and service time of the electrical connection test system.
  • one end of the probe has a wiring structure 11 , and the wiring structure 11 is configured to weld electrical connection wires.
  • the wiring structure 11 may be a structure such as a welding groove, a welding hole, etc., which is convenient for fixing the electrical connection wire.
  • the probe head is at least one of the following shapes: flat head, or pointed head, or nine-claw head, or round head, etc., which can be used according to different situations.
  • the probe head when the probe head is flat, the probe head is a contact plane, and it is in the form of surface contact when working; when the probe head is pointed, the probe head has a sharp contact at this time, and the It is in the form of point contact; when the probe head is a round head, the probe head is a contact point or a contact plane, and it can be in the form of line contact or surface contact when working; when the probe head is a nine-claw head , at this time, the probe head has nine sharp contacts, which are in the form of point contact when working.
  • different probe head types can be adopted according to different usage conditions. The number of opening and closing per unit time is less. Time exposure to fever.
  • the nine-claw head When the opening and closing speed and contact time are moderate, the nine-claw head can be used, which has the advantage of stable contact. When the opening and closing speed is fast, the round head can be used, which has a strong ability to avoid the arcing effect caused by the opening and closing discharge. A sharp tip can be used for the on-off test at low current, and its sensitivity to small current is better.
  • the above-mentioned probe selection method does not constitute a limitation to the present application, and may include other options different from the above-mentioned probe selection method. Specifically, according to different specific requirements, the corresponding Probe selection methods are also different, and the above probe selection methods listed in the examples of the present application are only for illustration.
  • FIG. 3 is a schematic structural diagram of a fixing plate of an electrical contact probe device in an embodiment of the present application.
  • the fixing plate is generally a plastic plate, specifically a polypropylene material plate, which has the characteristics of high melting point and low density, and is economical.
  • the fixed plate is also provided with installation and fixing holes 6 around, wherein the installation and fixing holes 6 can be threaded holes, and the four sides of the fixing plate are fixed by the cooperation of bolts and threaded holes.
  • the fixed plate can be a cuboid mechanism
  • the large hole in the middle of the fixed plate shown in Figure 3 is set to install other (original device) components
  • the lower right part of the fixed plate has 13 small holes
  • the above-mentioned small holes are probes The mounting holes 5.
  • the mounting hole 5 comprises an upper half hole matched with the protrusion and a lower half hole matched with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
  • the full through hole runs through the fixing plate and is set to insert the probe during installation; the half through hole is set to ensure the back and forth movement of the thimble when working.
  • a bushing in order to reduce the sliding friction of the probe in the mounting hole and avoid the plastic deformation of the fixing plate after long-term use, a bushing can be provided for the electrical contact probe device, and the bushing is arranged in the mounting hole.
  • Fig. 4 is a schematic diagram of the bush structure of the electrical contact probe device in the embodiment of the present application, and one end of the bush is provided with a half-through groove 31; Correspondingly, the boss of the probe is arranged in the half-through hole and snapped into the half-through groove 31 of the bushing.
  • the boss is embedded in the half-through groove 31, and the two are installed into the mounting hole together.
  • the probe can be replaced The bushings are pulled out together for uniform replacement.
  • one end of the bush is provided with a half-through groove 31; the bush is also provided with a guide groove 32, wherein the guide groove 32 penetrates the bush, and when the probe is installed, the boss passes through After the guide groove passes through the installation hole, the probe is rotated to make the boss enter the half-through groove.
  • the half-through groove 31 of the bush is first aligned with the upper half hole of the installation hole, that is, the half-through hole. After the bush is installed successfully, the boss is guided along the Slot 32 is inserted in the mounting hole, and after insertion, the probe is rotated half a circle to embed in the half-through slot.
  • the main function of the lower half slot is to move forward and backward along the slot when the probe contacts. It is worth noting that the length of the half-through groove 31 can be less than or equal to the length of the upper half hole of the mounting hole, that is, the length of the half-through hole, so as to prevent the boss from colliding with the upper half hole of the mounting hole when the probe shuttles in the mounting hole. That is, the bottom of the half-via.
  • the other end of the bushing is provided with a stopper, which is configured to limit the position of the bushing in the installation hole, and when the guide groove completely enters the installation hole, the stopper can prevent the bushing from moving.
  • the other end of the bushing has a sleeve structure, and when the probe is a cylindrical probe, the sleeve structure can be a thin ring larger than the area of the hole or the like.
  • FIG. 5 is an exploded view of the structure of the electrical contact probe device in the embodiment of the present application.
  • the bushing 3 shown in FIG. The guide groove enters the installation hole 5, and when the boss structure passes through the bushing 3, the probe 1 is rotated so that the boss turns to the half-through groove and embedded in it.
  • the length of the spring 2 is smaller than its natural length, and the natural length Refers to the length of the spring without any pressure, thereby completing the combination of the probe 1 and the fixing plate 4 .
  • the electrical contact probe device in the embodiment of the present application transfers the function of elastic expansion and contraction to the fixed plate by sacrificing the expansion and contraction function of the probe in related situations, in exchange for better reliability.
  • the probe with less structural redundancy can use a thicker rod body, and the electrical contact probe device will not cause internal wear after the device is simplified.
  • the electrical contact probe device When the electrical contact probe device is used, it does not need to be welded on the fixed plate as in related cases, and it is directly inserted into the mounting hole and inserted into the half slot through the probe boss, so that the electrical contact probe is stuck in the hole.
  • the electrical contact probe adopts a solid needle rod, which greatly reduces the temperature rise when the electrical connection works normally, and avoids the generation of contact resistance during the elastic friction process, and improves the stability and service time of the electrical connection test system.
  • the electrical contact probe device in the embodiment of the present application including: a fixing plate, a plurality of mounting holes are opened on the fixing plate, the probes are installed in the mounting holes, the The probe includes a needle bar and a protrusion and an axial annular groove arranged on the needle bar; a spring, one end of which is arranged in the annular groove, and the other end is in contact with the fixing plate; the mounting hole It includes an upper half hole cooperating with the protrusion and a lower half hole cooperating with the needle bar, wherein the upper half hole is a half through hole, and the lower half hole is a full through hole.
  • This application transfers the function of elastic expansion and contraction of the probe itself to between the fixed plate and the probe, so that the electrical contact probe device has better reliability, and the probe does not need to be welded on the fixed plate when used ,
  • the probe does not need to be welded on the fixed plate when used .
  • the embodiments of the present application may be realized or implemented by computer hardware, a combination of hardware and software, or by computer instructions stored in a non-transitory computer readable memory.
  • the methods can be implemented in a computer program using standard programming techniques - including a non-transitory computer-readable storage medium configured with a computer program, where the storage medium so configured causes the computer to operate in a specific and predefined manner - according to the specific Methods and Figures described in the Examples.
  • Each program can be implemented in a high-level procedural or object-oriented programming language to communicate with the computer system.
  • the programs can be implemented in assembly or machine language, if desired. In any case, the language may be a compiled or interpreted language.
  • the program can be run on an application specific integrated circuit programmed for this purpose.
  • processes described in this embodiment may be performed in any suitable order unless otherwise indicated by this embodiment or otherwise clearly contradicted by context.
  • the processes described in this embodiment can be executed under the control of one or more computer systems configured with executable instructions, and can be executed as code jointly executed on one or more processors (eg, executable instructions, one or more computer programs, or one or more applications), hardware or a combination thereof.
  • the computer program comprises a plurality of instructions executable by one or more processors.
  • the method can be implemented in any type of computing platform operably connected to a suitable one, including but not limited to personal computer, minicomputer, main frame, workstation, network or distributed computing environment, stand-alone or integrated computer platform, or communicate with charged particle tools or other imaging devices, etc.
  • Aspects of the embodiments of the present application may be implemented as machine-readable code stored on a non-transitory storage medium or device, whether removable or integrated into a computing platform, such as a hard disk, optically read and/or written storage
  • the medium, RAM, ROM, etc. such that it is readable by a programmable computer, when the storage medium or device is read by the computer, can be used to configure and operate the computer to perform the processes described herein.
  • machine-readable code may be transmitted over a wired or wireless network.
  • the invention described in this embodiment includes these and other different types of non-transitory computer-readable storage media when such media include instructions or programs for implementing the steps described above in conjunction with a microprocessor or other data processor.
  • the present application also includes the computer itself.
  • Computer programs can be applied to input data to perform the functions described in this embodiment, thereby transforming the input data to generate output data stored to non-volatile memory.
  • Output information may also be applied to one or more output devices such as a display.
  • the transformed data represents physical and tangible objects, including specific visual depictions of physical and tangible objects produced on a display.

Abstract

电接触探针装置，包括固定板(4)，固定板(4)上开有多个安装孔(5)；探针(1)包括针杆(14)以及设置在针杆(14)上的凸起(12)和轴向环形槽(13)，探针(1)安装在安装孔(5)内；弹簧(2)一端设置在轴向环形槽(13)内，另一端与固定板(4)接触；安装孔(5)包括与凸起(12)配合的上半孔和与针杆(14)配合的下半孔，其中上半孔为半通孔，下半孔为全通孔。

Description

一种电接触探针装置
相关申请的交叉引用
本申请基于申请号为202111486172.0，申请日为2021年12月07日的中国专利申请提出，并要求该中国专利申请的优先权，该中国专利申请的全部内容在此引入本申请作为参考。
技术领域
本申请涉及半导体技术领域，更具体来说，涉及一种电接触探针装置。
背景技术
现代生活中离不开各种各样的电器设备以及测试设备，而在这些设备中，电连接装置是必不可少的。复杂的电路环境需要各种各样的器件进行连接，因此，无论是什么用途的电子电器设备，电连接的安全可靠性都是保证电器和测试设备工作可靠性极为重要的部分。随着各种电器设备的小型化，要求用于测试电连接的电接触探针装置承载的电流载荷大，使得探针工作温度高，工作寿命短，因此需要频繁更换探针，而相关的电接触探针装置的结构设计导致更换过程较复杂。
发明内容
以下是对本文详细描述的主题的概述。本概述并非是为了限制权利要求的保护范围。
本申请实施例提供了一种电接触探针装置。
本申请实施例提供一种电接触探针装置，包括：固定板，所述固定板上开有多个安装孔；探针，安装在所述安装孔内，所述探针包括针杆以及设置在所述针杆上的凸起和轴向环形槽；弹簧，所述弹簧一端设置在所述环形槽内，另一端与所述固定板接触；所述安装孔包括与所述凸起配合的上半孔和与所述针杆配合的下半孔，其中所述上半孔为半通孔，下半孔为全通孔。
附图说明
图1为本申请的实施例中电接触探针装置的结构示意图；
图2为本申请的实施例中电接触探针装置的探针结构示意图；
图3为本申请的实施例中电接触探针装置的固定板结构示意图；
图4为本申请的实施例中电接触探针装置的衬套结构示意图；
图5为本申请的实施例中电接触探针装置的结构爆炸图。
其中，图1-图5中涉及的附图标记说明如下：1-探针、2-弹簧、3-衬套、4-固定板、5-安装孔、6-安装固定孔、11-接线结构、12-凸起、13-轴向环形槽、31-半通槽、32-引导槽、33-套筒结构。
具体实施方式
为使本申请的目的、技术方案和优点更加清楚明白，下文中将结合附图对本申请的实施例进行详细说明。需要说明的是，在不冲突的情况下，本申请中的实施例及实施例中的特征可以相互任意组合。
为了使本技术领域的人员更好地理解本申请方案，下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本申请一部分的实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都应当属于本申请保护的范围。
本申请的说明书和权利要求书及所述附图中的术语“第一”、“第二”、“第三”和“第四”等是用于区别不同对象，而不是用于描述特定顺序。此外，术语“包括”和“具有”以及它们任何变形，意图在于覆盖不排他的包含。例如包含了一系列步骤或单元的过程、方法、系统、产品或设备没有限定于已列出的步骤或单元，而是还可包括没有列出的步骤或单元，或还可包括对于这些过程、方法、产品或设备固有的其它步骤或单元。
在本文中提及“实施例”意味着，结合实施例描述的特定特征、结构或特性可以包含在本申请的至少一个实施例中。在说明书中的各个位置出现该短语并不一定均是指相同的实施例，也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是，本文所描述的实施例可以与其它实施例相结合。
电接触探针，在ICT-PCBA(组装卡的功能测试)领域内，一般作为电测试的接触媒介，是一种高端精密型电子五金元器件。电接触探针的主要工作是实现电流的导通，完成测试任务。作为诸多电子设计领域需要用到的精密器件，相关领域已经发展了很多类型的探针，如电流针、定位针、开关针、电容针、高频针系列等。其中常见通用型探针结构一般分为针套、针杆、弹簧等部分，其中弹簧置于针套内，针杆插入针套，工作时通过针杆压缩弹簧完成电接触工作。
相关情形中的一种电接触测试环境中，原测试环境工作过程如下：其中采用的探针为上文提及的常见通用型探针，这类常见通用型探针可以通过焊接固定在塑料板上，测试工作时按拉机械把手可使电接触探针装置的塑料板前后运动，探针随着塑料板的前后运动实现与测试器件的接触和分离。由于针杆与针套之间为轴孔过盈配合，且针套内部有弹簧，随着弹簧的压缩与伸长可实现接触时针头的弹性位移及压紧作用。
然而对尺寸较小的测试模块进行测试时，例如对长度为4cm或4cm以下的测试模块，需要引出比上文提及的常见通用型探针更多的探针数目，且探针的工作电流最大可承受60A，且实际工作中伴随电流冲击，导致探针要承载电流载荷，而电流载荷作用于探针这类型的小型接触器件会使探针本身工作温度过高，从而导致探针的工作寿命短。因此，探针在工作一段时间后，针套与针头的接触面会难以避免的产生黑色氧化层，且针套与针头之间的气隙增大，从而导致二者之间的过盈配合失效。若不及时更换探针，过盈配合失效的探针在工作中的开合接触过程中产生电弧，严重时会使被测试器件损坏。但由于上文提及的常见通用型探针的探针结构是焊接在塑料板上的，其更换过程较复杂。
另外，这类电接触探针等接触件的电学性能受多种因素的影响，其中镀层、环境温湿度、表面形状、载荷、冲击与振动等多因素都会影响接触件的使用，随着使用时间的增加，还可能会出现表面融焊以及接触间隙增加等现象。所以，需尽可能降低接触件的电阻和整体结构的复杂度，从而保证使用过程的可靠性。
基于此，本申请实施例提供一种电接触探针装置，包括：固定板，固定板上开有多个安装孔和探针，探针安装在安装孔内，探针包括针杆以及设置在针杆上的凸起和轴向环形槽；弹簧，弹簧一端设置在环形槽内，另一端与固定板接触；安装孔包括与凸起配合的上半孔和与针杆配合的下半孔，其中上半孔为半通孔，下半孔为全通孔。本申请将相关情形中探针本身的弹性伸缩的功能转移到了固定板与探针之间，从而使电接触探针装置具有更好的可靠性，且探针使用时不需要焊接在固定板上，安装时直接插入并通过探针凸台嵌入安装孔的上半孔内，探针卡在下半孔内，从而使拆卸更换时更为方便。
参照图1-图2，图1是本申请的实施例中电接触探针装置的结构示意图，图2为本申请的实施例中电接触探针装置的探针结构示意图，本申请实施例中电接触探针装置，包括：
固定板4，固定板4上开有多个安装孔5；
探针1，安装在安装孔5内，探针1包括针杆14以及设置在针杆14上的凸起12和轴向环形槽13；
弹簧2，弹簧2一端设置在环形槽内，另一端与固定板4接触；
安装孔5包括与凸起配合的上半孔和与针杆配合的下半孔，其中上半孔为半通孔，下半孔为全通孔。
本申请实施例中的电接触探针装置通过探针本身的结构设计和固定板的开孔结构设计实现结构的改进。其中，本申请实施例中取消了针杆与针套之间通过轴孔过盈配合，且针套内部有弹簧这样的传统探针结构设计。具体地，本申请实施例将弹簧设置在探针和固定板之间，通过探针结构本身具有的轴向环形槽和固定板对弹簧进行固定和施压，通过在固定板上设置半通孔，配合探针设置在针杆上的凸起结构，实现探针在安装孔内的上下穿梭。本申请实施例的电接触探针装置工作时，首先使探针头部与待测试模块的相应电连接点接触，然后对固定板施力使其向前移动，移动过程中会使弹簧不断压缩，此时探针沿固定板的半通槽向后移动，从而完成电接触探针与待测试模块的电接触。
值得注意的是，弹簧安装于探针上，其中弹簧的周长大于具有凸台的针杆部分的周向长度。弹簧的自然长度小于环形槽底部与固定板之间的距离，从而在没有外力施加于固定板或探针上时，弹簧有一定的初始压缩量，从而使电接触探针装置的预压稳定。
本申请实施例中的电接触探针装置通过牺牲相关情形中探针的伸缩功能，将弹性伸缩的功能转移到了固定板上，换取了更好的可靠性。在原测试环境的小尺寸限制下，结构冗余少的探针可采用更厚的杆体，且电接触探针装置简化后其不会产生内部磨损。该电接触探针装置使用时不需要像相关情形中那样焊接在固定板上，安装时直接插入安装孔并通过探针凸台嵌入半开槽，使电接触探针卡在孔内。
本领域技术人员可以理解，图1中示出的固定板的形状和结构细节、探针的形状并不构成对本申请的限定，可以包括与图示固定板的形状和结构细节、探针的形状不同的其他固定板的形状和结构细节、探针的形状，具体地，可根据具体要求的不同，其对应选择的固定板的形状和结构细节、探针的形状也不同，本申请实施例中列出的上述固定板的形状和结构细节、探针的形状仅作举例说明。
参照图2，图2为本申请的实施例中电接触探针装置的探针结构示意图，本申请实施例中的电接触探针装置中，探针具体包括：针杆14，以及设置在针杆14上的凸起12和轴向环形槽13。其中设置是在针杆14中段轴肩偏右部分的轴向环形槽13的槽口与设置在针杆14中段轴肩偏左部分的凸起12相对，从而在凸起12进入安装孔后，弹簧两端通过轴向环形槽卡和固定板固定，避免弹簧由于机构的开合运动而弹出，防止弹簧脱落。其中凸起12被设置为探针在工作时在固定板的半通孔内移动，且起到防止探针滚转的作用。本领域技术人员可以理解，图2中示出的针杆14、凸起12和轴向环形槽13的形状并不构成对本申请的限定，可以包括与图示针杆、凸起和轴向环形槽的形状不同的其他凸起形状和轴向环形槽的形状， 具体地，可根据具体要求的不同，其对应选择的针杆、凸起和轴向环形槽的形状也不同，本申请实施例中列出的上述针杆、凸起和轴向环形槽的形状仅作举例说明。
在本申请实施例中，针杆14为实心针杆；根据电阻公式R＝ρl/s，其中R为探针电阻，ρ表示电阻的电阻率，是由其本身性质决定，L表示电阻的长度，S表示电阻的横截面积；要使电接触探针的整体电阻减小，在同样的长度和电阻材料的情况下，实心结构比套壳结构的等效横截面积大，因此等效电阻更小。在一些实施例中，探针可以选择常见的铜或黄铜等金属材料制作。电接触探针采用了实心针杆，电连接正常工作时的温升大大降低，且避免了弹性摩擦过程中接触电阻的产生，提高了电连接测试系统稳定性及使用时间。
参照图2，在本申请实施例中，探针的一端具有接线结构11，接线结构11被设置为焊接电连接线。其中接线结构11可以为焊接槽、焊接孔等便于电连接线固定的结构。
在本申请实施例中，现代各种电子设备之间的电接触装置种类繁多，按接触面形式有面接触、点接触、线接触等，一些固定式电接触可以通过螺纹连接，例如卡扣、推拉、直插等多种形式。由此，探针的另一端为探针头部，上述探针头部至少为以下形状之一：平头、或尖头、或九爪头、或圆头等，可根据不同情况使用。其中当探针头部为平头时，探针头部为一个接触平面，工作时为面接触形式；当探针头部为尖头，此时探针头部具有1个尖触点，工作时为点接触形式；当探针头部为圆头时，探针头部为一个接触点或一个接触平面，工作时为可以为线接触形式或面接触形式；当探针头部为九爪头，此时探针头部具有九个尖触点，工作时为点接触形式。其中，根据使用情况的不同可采取不同的探针头型，单位时间开合次数较少，一次接触时间较长时，可采用平头，因为接触面积较大时的接触电阻较小，可降低长时间接触的发热。开合速度和接触时间适中时，可采用九爪头，其优点是接触稳定。开合速度较快时可采取圆头，其避免开合放电产生燃弧效应的能力较强。小电流时的通断测试可采用尖头，其小电流敏感性较好。本领域技术人员可以理解，上文提及的探针选择方式并不构成对本申请的限定，可以包括与上述探针选择方式不同的其他选择，具体地，可根据具体要求的不同，其对应的探针选择方式也不同，本申请实施例中列出的上述探针选择方式仅作举例说明。
参照图3，图3为本申请的实施例中电接触探针装置的固定板结构示意图。其中固定板一般为塑料板，具体可以为聚丙烯材料板，这种材料板具有高熔点低密度的特点，且经济性较好。固定板的四周还设有安装固定孔6，其中安装固定孔6可以为螺纹孔，固定板的四周通过螺栓与螺纹孔的配合实现固定。
在一些实施例中，采用电接触探针装置对4厘米长的测试模块测试时，共需引出13根探针。其中固定板可以为长方体机构，图3中示出的固定板上中部的大孔被设置为安装其他(原 装置)元件，固定板的右下部分有13个小孔，上述小孔为探针的安装孔5。其中安装孔5包括与凸起配合的上半孔和与针杆配合的下半孔，其中上半孔为半通孔，下半孔为全通孔。其中全通孔贯穿所述固定板，被设置为安装时探针插入；半通孔被设置为确保顶针工作时的前后移动。
在一些实施例中，为了减少探针在安装孔中产生的滑动摩擦，避免长期使用下固定板的塑性形变，可以为电接触探针装置设置一衬套，上述衬套设置在安装孔内，参照图4，图4为本申请的实施例中电接触探针装置的衬套结构示意图，衬套一端设有半通槽31；工作状态时，半通槽31与安装孔的半通孔位置相对应，探针的凸台设置在半通孔内并卡嵌在上述衬套的半通槽31内。其中本实施例在探针的安装过程中，将探针和衬套组合后，其中凸台卡嵌在半通槽31内，二者一起安装入安装孔，更换探针时可以将探针连同衬套一起拔出进行统一更换。
在一些实施例中，参照图4，衬套一端设有半通槽31；衬套还设有引导槽32，其中引导槽32贯通衬套，在所述探针安装时，所述凸台通过所述引导槽穿过所述安装孔后，旋转所述探针使所述凸台进入所述半通槽内。具体地，本实施例在探针的安装过程中，首先将衬套的半通槽31对齐安装孔的上半孔即半通孔，衬套安装成功后，接着探针安装时凸台沿引导槽32插入安装孔内，插入后将探针旋转半圈，嵌入半通槽，下部半开槽主要作用是探针接触时沿该槽前后移动。值得注意的是，半通槽31的长度可以小于或等于该安装孔的上半孔即半通孔的长度，从而防止探针在安装孔内穿梭运动时，凸台碰撞安装孔的上半孔即半通孔的底部。
衬套的另一端设有止挡部，被设置为限定所述衬套在所述安装孔内的位置，当引导槽完全进入安装孔内，止挡部可以阻止衬套的移动。在一些实施例中，参照图4，衬套另一端具有套筒结构，当探针为圆柱形探针，该套筒结构可以为大于孔面积的薄圆环等。
参照图5，图5为本申请的实施例中电接触探针装置的结构爆炸图。在一实施例中，首先，可以将图4所示的衬套3安装入固定板4的安装孔内，然后将弹簧2置于探针的环形槽内，探针1沿着衬套3的引导槽进入安装孔5内，当凸台结构穿过衬套3后，旋转探针1使凸台转至半通槽处并嵌入其中，此时弹簧2的长度小于其自然长度，其中自然长度指弹簧没有任何压力时的长度，从而完成探针1与固定板4的结合。
本申请实施例中的电接触探针装置通过牺牲相关情形中探针的伸缩功能，将弹性伸缩的功能转移到了固定板上，换取了更好的可靠性。在原测试环境的小尺寸限制下，结构冗余少的探针可采用更厚的杆体，且电接触探针装置简化后其不会产生内部磨损。该电接触探针装置使用时不需要像相关情形中那样焊接在固定板上，安装时直接插入安装孔并通过探针凸台嵌入半开槽，使电接触探针卡在孔内。电接触探针采用了实心针杆，电连接正常工作时的温 升大大降低，且避免了弹性摩擦过程中接触电阻的产生，提高了电连接测试系统稳定性及使用时间。
本申请实施例的有益效果包括：本申请实施例中的电接触探针装置，包括：固定板，所述固定板上开有多个安装孔，探针，安装在所述安装孔内，所述探针包括针杆以及设置在所述针杆上的凸起和轴向环形槽；弹簧，所述弹簧一端设置在所述环形槽内，另一端与所述固定板接触；所述安装孔包括与所述凸起配合的上半孔和与所述针杆配合的下半孔，其中所述上半孔为半通孔，下半孔为全通孔。本申请将相关情形中探针本身的弹性伸缩的功能转移到了固定板与探针之间，从而使电接触探针装置具有更好的可靠性，且探针使用时不需要焊接在固定板上，安装时直接插入并通过探针凸台嵌入安装孔的上半孔内，探针卡在下半孔内，从而使拆卸更换时更为方便。
需要说明的是，如无特殊说明，当某一特征被称为“固定”、“连接”在另一个特征，它可以直接固定、连接在另一个特征上，也可以间接地固定、连接在另一个特征上。此外，本申请中所使用的上、下、左、右等描述仅仅是相对于附图中本申请各组成部分的相互位置关系来说的。在本申请中所使用的单数形式的“一种”、“所述”和“该”也旨在包括多数形式，除非上下文清楚地表示其他含义。此外，除非另有定义，本实施例所使用的所有的技术和科学术语与本技术领域的技术人员通常理解的含义相同。本实施例说明书中所使用的术语只是为了描述具体的实施例，而不是为了限制本申请。本实施例所使用的术语“和/或”包括一个或多个相关的所列项目的任意的组合。
应当理解，尽管在本申请可能采用术语第一、第二、第三等来描述各种元件，但这些元件不应限于这些术语。这些术语仅用来将同一类型的元件彼此区分开。例如，在不脱离本申请范围的情况下，第一元件也可以被称为第二元件，类似地，第二元件也可以被称为第一元件。本实施例所提供的任何以及所有实例或示例性语言(“例如”、“如”等)的使用仅意图更好地说明本申请的实施例，并且除非另外要求，否则不会对本申请的范围施加限制。
应当认识到，本申请的实施例可以由计算机硬件、硬件和软件的组合、或者通过存储在非暂时性计算机可读存储器中的计算机指令来实现或实施。所述方法可以使用标准编程技术-包括配置有计算机程序的非暂时性计算机可读存储介质在计算机程序中实现，其中如此配置的存储介质使得计算机以特定和预定义的方式操作——根据在具体实施例中描述的方法和附图。每个程序可以以高级过程或面向对象的编程语言来实现以与计算机系统通信。然而，若需要，该程序可以以汇编或机器语言实现。在任何情况下，该语言可以是编译或解释的语言。此外，为此目的该程序能够在编程的专用集成电路上运行。
此外，可按任何合适的顺序来执行本实施例描述的过程的操作，除非本实施例另外指示或以其他方式明显地与上下文矛盾。本实施例描述的过程(或变型和/或其组合)可在配置有可执行指令的一个或多个计算机系统的控制下执行，并且可作为共同地在一个或多个处理器上执行的代码(例如，可执行指令、一个或多个计算机程序或一个或多个应用)、由硬件或其组合来实现。所述计算机程序包括可由一个或多个处理器执行的多个指令。
进一步，所述方法可以在可操作地连接至合适的任何类型的计算平台中实现，包括但不限于个人电脑、迷你计算机、主框架、工作站、网络或分布式计算环境、单独的或集成的计算机平台、或者与带电粒子工具或其它成像装置通信等等。本申请实施例的各方面可以以存储在非暂时性存储介质或设备上的机器可读代码来实现，无论是可移动的还是集成至计算平台，如硬盘、光学读取和/或写入存储介质、RAM、ROM等，使得其可由可编程计算机读取，当存储介质或设备由计算机读取时可用于配置和操作计算机以执行在此所描述的过程。此外，机器可读代码，或其部分可以通过有线或无线网络传输。当此类媒体包括结合微处理器或其他数据处理器实现上文所述步骤的指令或程序时，本实施例所述的发明包括这些和其他不同类型的非暂时性计算机可读存储介质。当根据本申请实施例所述的方法和技术编程时，本申请还包括计算机本身。
计算机程序能够应用于输入数据以执行本实施例所述的功能，从而转换输入数据以生成存储至非易失性存储器的输出数据。输出信息还可以应用于一个或多个输出设备如显示器。在本申请若干实施例中，转换的数据表示物理和有形的对象，包括显示器上产生的物理和有形对象的特定视觉描绘。
以上所述，只是本申请的若干实施例而已，本申请并不局限于上述实施方式，只要其以相同的手段达到本申请的技术效果，凡在本申请的精神和原则之内，所做的任何修改、等同替换、改进等，均应包含在本申请保护的范围之内。在本申请的保护范围内其技术方案和/或实施方式可以有各种不同的修改和变化。

Claims (10)

  1. 一种电接触探针装置，包括：
    固定板，所述固定板上开有多个安装孔；
    探针，安装在所述安装孔内，所述探针包括针杆以及设置在所述针杆上的凸起和轴向环形槽；
    弹簧，所述弹簧一端设置在所述轴向环形槽内，另一端与所述固定板接触；
    所述安装孔包括与所述凸起配合的上半孔和与所述针杆配合的下半孔，其中所述上半孔为半通孔，下半孔为全通孔。
  2. 根据权利要求1所述电接触探针装置，其中，所述探针一端具有接线结构，被设置为焊接电连接线。
  3. 根据权利要求1所述电接触探针装置，其中，所述探针一端为探针头部，所述探针头部至少为以下形状之一：平头、或尖头、或九爪头、或圆头。
  4. 根据权利要求1-3任一项所述电接触探针装置，其中所述针杆为实心针杆。
  5. 根据权利要求1所述电接触探针装置，其中所述固定板为聚丙烯材料板，其上还设有安装固定孔。
  6. 根据权利要求1所述电接触探针装置，其中所述安装孔的数量为13个。
  7. 根据权利要求1所述电接触探针装置，其中，所述安装孔内设有衬套，所述衬套一端设有半通槽；所述凸起设置在所述半通槽内。
  8. 根据权利要求7所述电接触探针装置，其中，所述衬套还设有引导槽，所述引导槽贯通所述衬套。
  9. 根据权利要求7所述电接触探针装置，其中，所述衬套另一端具有止挡结构。
  10. 根据权利要求1所述电接触探针装置，其中所述弹簧的自然长度小于所述轴向环形槽底部与所述固定板之间的距离。
PCT/CN2022/080724 2021-12-07 2022-03-14 一种电接触探针装置 WO2023103199A1 (zh)

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