WO2023018055A1 - Dispositif de diagnostic optique multicanal - Google Patents
Dispositif de diagnostic optique multicanal Download PDFInfo
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- WO2023018055A1 WO2023018055A1 PCT/KR2022/010736 KR2022010736W WO2023018055A1 WO 2023018055 A1 WO2023018055 A1 WO 2023018055A1 KR 2022010736 W KR2022010736 W KR 2022010736W WO 2023018055 A1 WO2023018055 A1 WO 2023018055A1
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- laser light
- laser
- channel optical
- pinhole
- diagnostic device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
- G01N21/6404—Atomic fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6486—Measuring fluorescence of biological material, e.g. DNA, RNA, cells
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
- G01N2021/392—Measuring reradiation, e.g. fluorescence, backscatter
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
- G01N2021/637—Lasing effect used for analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/064—Stray light conditioning
- G01N2201/0648—Shutters
Abstract
La présente invention concerne un dispositif de diagnostic optique multicanal, comprenant : une unité de source de lumière laser qui émet des faisceaux laser de différentes longueurs d'onde ; une lentille de condensation qui concentre les faisceaux laser émis de différentes longueurs d'onde vers un échantillon en cours d'analyse ; un substrat à trous d'épingle qui permet aux faisceaux laser, sélectionnés parmi les faisceaux laser émis de différentes longueurs d'onde qui franchissent la lentille de condensation de le traverser par des trous d'épingle ; une unité de commande qui déplace le substrat à trous d'épingle dans la direction du point focal de la lentille de condensation ; et une unité de détection qui reçoit les faisceaux laser, provenant de l'échantillon en cours d'analyse, qui ont traversé les trous d'épingle.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020210105913A KR102576472B1 (ko) | 2021-08-11 | 2021-08-11 | 다채널 광학 진단 장치 |
| KR10-2021-0105913 | 2021-08-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2023018055A1 true WO2023018055A1 (fr) | 2023-02-16 |
Family
ID=85200258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/KR2022/010736 WO2023018055A1 (fr) | 2021-08-11 | 2022-07-21 | Dispositif de diagnostic optique multicanal |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR102576472B1 (fr) |
| WO (1) | WO2023018055A1 (fr) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100495374B1 (ko) * | 2002-01-16 | 2005-06-14 | 가부시키가이샤 히다치 하이테크놀로지즈 | 형광, 인광 측정장치 |
| JP2007033381A (ja) * | 2005-07-29 | 2007-02-08 | Tokyo Seimitsu Co Ltd | 光学式検査装置及びその照明方法 |
| JP2008232742A (ja) * | 2007-03-19 | 2008-10-02 | Fujifilm Corp | 測定装置 |
| KR101577355B1 (ko) * | 2014-09-11 | 2015-12-14 | 경북대학교 산학협력단 | 핀홀 자동 교체 장치, 공간 필터 자동 교체 장치, 공초점 현미경 및 이들의 제조 방법 |
| KR101965803B1 (ko) * | 2018-10-30 | 2019-04-05 | 나노스코프시스템즈 주식회사 | 레이저 출력조정기를 가지는 라만 분광기 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0618057D0 (en) | 2006-09-14 | 2006-10-25 | Perkinelmer Ltd | Improvements in and relating to scanning confocal microscopy |
| KR20110121497A (ko) * | 2010-04-30 | 2011-11-07 | 경북대학교 산학협력단 | Ｐｚｔ 스테이지를 이용한 공초점 현미경 시스템 및 그 스캔방법 |
| WO2016125281A1 (fr) | 2015-02-05 | 2016-08-11 | 株式会社ニコン | Microscope à éclairage structuré, procédé d'observation, et programme de commande |
| KR20190000056A (ko) * | 2017-06-22 | 2019-01-02 | (주)노스트 | 레이저 스캐닝 공초점 현미경 |
-
2021
- 2021-08-11 KR KR1020210105913A patent/KR102576472B1/ko active IP Right Grant
-
2022
- 2022-07-21 WO PCT/KR2022/010736 patent/WO2023018055A1/fr unknown
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100495374B1 (ko) * | 2002-01-16 | 2005-06-14 | 가부시키가이샤 히다치 하이테크놀로지즈 | 형광, 인광 측정장치 |
| JP2007033381A (ja) * | 2005-07-29 | 2007-02-08 | Tokyo Seimitsu Co Ltd | 光学式検査装置及びその照明方法 |
| JP2008232742A (ja) * | 2007-03-19 | 2008-10-02 | Fujifilm Corp | 測定装置 |
| KR101577355B1 (ko) * | 2014-09-11 | 2015-12-14 | 경북대학교 산학협력단 | 핀홀 자동 교체 장치, 공간 필터 자동 교체 장치, 공초점 현미경 및 이들의 제조 방법 |
| KR101965803B1 (ko) * | 2018-10-30 | 2019-04-05 | 나노스코프시스템즈 주식회사 | 레이저 출력조정기를 가지는 라만 분광기 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20230023968A (ko) | 2023-02-20 |
| KR102576472B1 (ko) | 2023-09-11 |
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