WO2022267446A1 - Dispositif électroluminescent à semi-conducteurs en alingan - Google Patents

Dispositif électroluminescent à semi-conducteurs en alingan Download PDF

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Publication number
WO2022267446A1
WO2022267446A1 PCT/CN2022/070606 CN2022070606W WO2022267446A1 WO 2022267446 A1 WO2022267446 A1 WO 2022267446A1 CN 2022070606 W CN2022070606 W CN 2022070606W WO 2022267446 A1 WO2022267446 A1 WO 2022267446A1
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layer
type
alingan
semiconductor
thickness
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PCT/CN2022/070606
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English (en)
Chinese (zh)
Inventor
黄小辉
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至芯半导体(杭州)有限公司
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Publication of WO2022267446A1 publication Critical patent/WO2022267446A1/fr

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/04Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/04Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
    • H01L33/06Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/14Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26Materials of the light emitting region
    • H01L33/30Materials of the light emitting region containing only elements of group III and group V of the periodic system
    • H01L33/32Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen

Abstract

La présente invention se rapporte à un dispositif électroluminescent à semi-conducteurs en AlInGaN. Le dispositif électroluminescent à semi-conducteurs en AlInGaN comprend : un substrat, une couche tampon semi-conductrice, une première couche semi-conductrice de type N, une seconde couche semi-conductrice de type N, une couche de puits quantiques multiples, une couche de transport de trous de type P, une couche de blocage d'électrons de type P, une couche de transport semi-conductrice de type P et une couche de contact semi-conductrice de type P. Dans le dispositif électroluminescent à semi-conducteurs en AlInGaN selon la présente invention, au moyen de l'agencement de la couche de transport de trous de type P en tant que couche de matériau en AlInGaN monocouche ou couche de structure de super-réseau en AlInGaN/AlInGaN, le taux de production de trous à proximité des puits quantiques peut être augmenté, de sorte qu'une grande quantité de trous sont fournis en continu aux puits quantiques afin d'améliorer l'efficacité de recombinaison électron-trou dans les puits quantiques en AlInGaN, améliorant la performance de la diode électroluminescente en AlInGaN.
PCT/CN2022/070606 2021-06-25 2022-01-07 Dispositif électroluminescent à semi-conducteurs en alingan WO2022267446A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202110707146.XA CN113257965B (zh) 2021-06-25 2021-06-25 一种AlInGaN半导体发光器件
CN202110707146.X 2021-06-25

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WO2022267446A1 true WO2022267446A1 (fr) 2022-12-29

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WO (1) WO2022267446A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116705942A (zh) * 2023-08-08 2023-09-05 江西兆驰半导体有限公司 发光二极管及其制备方法

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113257965B (zh) * 2021-06-25 2021-10-29 至芯半导体(杭州)有限公司 一种AlInGaN半导体发光器件
CN114068741B (zh) * 2022-01-17 2022-04-19 至善时代智能科技(北京)有限公司 一种紫外探测器芯片
CN115347097B (zh) * 2022-10-18 2023-03-14 江西兆驰半导体有限公司 发光二极管外延片及其制备方法

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CN107275450A (zh) * 2017-07-21 2017-10-20 广东工业大学 一种紫外led外延结构
CN110600591A (zh) * 2019-08-21 2019-12-20 苏州紫灿科技有限公司 具有啁啾超晶格最终势垒结构的深紫外led及制备方法
CN110752279A (zh) * 2019-12-02 2020-02-04 广东省半导体产业技术研究院 一种具有超薄铝铟氮插入层的紫外发光二极管及其制备方法
CN112242464A (zh) * 2020-09-29 2021-01-19 苏州紫灿科技有限公司 一种具有空穴蓄积结构的深紫外led及其制备方法
CN113257965A (zh) * 2021-06-25 2021-08-13 至芯半导体(杭州)有限公司 一种AlInGaN半导体发光器件

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TWI499080B (zh) * 2012-11-19 2015-09-01 Genesis Photonics Inc 氮化物半導體結構及半導體發光元件
KR102264671B1 (ko) * 2014-09-30 2021-06-15 서울바이오시스 주식회사 자외선 발광소자
CN106098880B (zh) * 2016-06-23 2018-08-07 孙月静 一种p区结构的紫外发光二极管
CN111341892B (zh) * 2020-03-17 2021-11-02 厦门乾照半导体科技有限公司 一种led外延结构及其制作方法、led芯片

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CN107275450A (zh) * 2017-07-21 2017-10-20 广东工业大学 一种紫外led外延结构
CN107230738A (zh) * 2017-07-31 2017-10-03 河北工业大学 具有超晶格隧穿结的发光二极管外延结构及其制备方法
CN110600591A (zh) * 2019-08-21 2019-12-20 苏州紫灿科技有限公司 具有啁啾超晶格最终势垒结构的深紫外led及制备方法
CN110752279A (zh) * 2019-12-02 2020-02-04 广东省半导体产业技术研究院 一种具有超薄铝铟氮插入层的紫外发光二极管及其制备方法
CN112242464A (zh) * 2020-09-29 2021-01-19 苏州紫灿科技有限公司 一种具有空穴蓄积结构的深紫外led及其制备方法
CN113257965A (zh) * 2021-06-25 2021-08-13 至芯半导体(杭州)有限公司 一种AlInGaN半导体发光器件

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116705942A (zh) * 2023-08-08 2023-09-05 江西兆驰半导体有限公司 发光二极管及其制备方法
CN116705942B (zh) * 2023-08-08 2023-10-17 江西兆驰半导体有限公司 发光二极管及其制备方法

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CN113257965A (zh) 2021-08-13

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