WO2022200161A1 - Pulse shaper circuit - Google Patents

Pulse shaper circuit Download PDF

Info

Publication number
WO2022200161A1
WO2022200161A1 PCT/EP2022/056954 EP2022056954W WO2022200161A1 WO 2022200161 A1 WO2022200161 A1 WO 2022200161A1 EP 2022056954 W EP2022056954 W EP 2022056954W WO 2022200161 A1 WO2022200161 A1 WO 2022200161A1
Authority
WO
WIPO (PCT)
Prior art keywords
integrator
threshold value
output
ray
pulse shaper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2022/056954
Other languages
English (en)
French (fr)
Inventor
Christoph Herrmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Priority to JP2023558172A priority Critical patent/JP7802090B2/ja
Priority to CN202280023742.9A priority patent/CN117043641A/zh
Priority to US18/283,095 priority patent/US20240168179A1/en
Priority to EP22716032.2A priority patent/EP4314901B1/en
Publication of WO2022200161A1 publication Critical patent/WO2022200161A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • G01T1/171Compensation of dead-time counting losses
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/247Detector read-out circuitry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2921Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors

Definitions

  • the reset circuit 230 may include a switch SWi for coupling the output 220 of the integrator 210 to the input of the integrator 210 in order to discharge the integrator 210.
  • the closing of the switch SWi may be controlled by the reset pulse as described in the examples above.
  • the switch SWi may be provided by one or more transistors.
  • the switch SWi may be provided by one or more field effect transistors “FETs” such as a MOSFET or a JFET, or by one or more bipolar transistors.
  • the reset circuit 230 may include a current source.

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
PCT/EP2022/056954 2021-03-22 2022-03-17 Pulse shaper circuit Ceased WO2022200161A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2023558172A JP7802090B2 (ja) 2021-03-22 2022-03-17 パルス整形器回路
CN202280023742.9A CN117043641A (zh) 2021-03-22 2022-03-17 脉冲整形器电路
US18/283,095 US20240168179A1 (en) 2021-03-22 2022-03-17 Pulse shaper circuit
EP22716032.2A EP4314901B1 (en) 2021-03-22 2022-03-17 Pulse shaper circuit

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP21163924.0 2021-03-22
EP21163924.0A EP4063918A1 (en) 2021-03-22 2021-03-22 Pulse shaper circuit

Publications (1)

Publication Number Publication Date
WO2022200161A1 true WO2022200161A1 (en) 2022-09-29

Family

ID=75143499

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2022/056954 Ceased WO2022200161A1 (en) 2021-03-22 2022-03-17 Pulse shaper circuit

Country Status (5)

Country Link
US (1) US20240168179A1 (https=)
EP (2) EP4063918A1 (https=)
JP (1) JP7802090B2 (https=)
CN (1) CN117043641A (https=)
WO (1) WO2022200161A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008155680A2 (en) 2007-06-19 2008-12-24 Koninklijke Philips Electronics N.V. Spectral photon counting detector
WO2018185118A1 (en) 2017-04-06 2018-10-11 Koninklijke Philips N.V. Pulse shaper
US20190378682A1 (en) * 2018-06-08 2019-12-12 Asml Netherlands B.V. Semiconductor charged particle detector for microscopy

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2847676B1 (fr) * 2002-11-25 2005-02-11 Commissariat Energie Atomique Cuircuit de traitement ameliore pour chaine de spectrometrie et chaine de spectrometrie utilisant un tel circuit
US20100193700A1 (en) * 2007-06-01 2010-08-05 Koninklijke Philips Electronics N.V. Spectral photon counting detector
US20090008564A1 (en) * 2007-07-05 2009-01-08 Cmt Medical Technologies Ltd. Modular X-Ray Detector With Single Photon Counting, Energy Sensitivity And Integration Capabilities
KR101871361B1 (ko) * 2011-11-01 2018-08-03 삼성전자주식회사 고해상도 및 고대조도 영상을 동시에 생성하기 위한 광자 계수 검출 장치 및 방법
RU2014143053A (ru) * 2012-03-27 2016-05-20 Конинклейке Филипс Н.В. Обычная визуализация посредством системы визуализации, содержащей детекторы для счета фотонов
CN104220900B (zh) * 2012-03-27 2017-05-17 皇家飞利浦有限公司 高通量光子计数探测器电子器件
JP2014049983A (ja) * 2012-08-31 2014-03-17 Canon Inc 放射線撮像装置、その制御方法及びプログラム
EP2932299B1 (en) * 2012-12-14 2019-03-27 Koninklijke Philips N.V. Detector unit with pulse shaper
JP2015065531A (ja) * 2013-09-24 2015-04-09 株式会社東芝 信号処理装置および信号処理方法
EP3281041B1 (en) * 2015-04-07 2020-06-10 Shenzhen Xpectvision Technology Co., Ltd. Methods of making semiconductor x-ray detector
US9588239B2 (en) * 2015-04-22 2017-03-07 Analogic Corporation Data acquisition system of photon counting detector array
CN107850682B (zh) * 2015-07-13 2021-07-27 皇家飞利浦有限公司 高能量分辨率/高x射线通量光子计数探测器
JP7041079B6 (ja) * 2016-06-16 2022-05-30 コーニンクレッカ フィリップス エヌ ヴェ スペクトル放射線ディテクターにおける改善された光子カウント
US10690448B2 (en) * 2017-01-20 2020-06-23 Raytheon Company Method and apparatus for variable time pulse sampling
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
US11681053B1 (en) * 2020-06-10 2023-06-20 Actev Motors. Inc. Methods, systems, and devices for monitoring cumulative radiation

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008155680A2 (en) 2007-06-19 2008-12-24 Koninklijke Philips Electronics N.V. Spectral photon counting detector
WO2018185118A1 (en) 2017-04-06 2018-10-11 Koninklijke Philips N.V. Pulse shaper
US20190378682A1 (en) * 2018-06-08 2019-12-12 Asml Netherlands B.V. Semiconductor charged particle detector for microscopy

Also Published As

Publication number Publication date
JP2024512009A (ja) 2024-03-18
EP4314901B1 (en) 2025-10-22
EP4314901A1 (en) 2024-02-07
US20240168179A1 (en) 2024-05-23
EP4063918A1 (en) 2022-09-28
JP7802090B2 (ja) 2026-01-19
CN117043641A (zh) 2023-11-10

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