JP7802090B2 - パルス整形器回路 - Google Patents

パルス整形器回路

Info

Publication number
JP7802090B2
JP7802090B2 JP2023558172A JP2023558172A JP7802090B2 JP 7802090 B2 JP7802090 B2 JP 7802090B2 JP 2023558172 A JP2023558172 A JP 2023558172A JP 2023558172 A JP2023558172 A JP 2023558172A JP 7802090 B2 JP7802090 B2 JP 7802090B2
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JP
Japan
Prior art keywords
integrator
output
threshold
ray
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023558172A
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English (en)
Japanese (ja)
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JP2024512009A (ja
JP2024512009A5 (https=
Inventor
クリストフ ヘルマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
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Publication of JP2024512009A publication Critical patent/JP2024512009A/ja
Publication of JP2024512009A5 publication Critical patent/JP2024512009A5/ja
Application granted granted Critical
Publication of JP7802090B2 publication Critical patent/JP7802090B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G01T1/171—Compensation of dead-time counting losses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2023558172A 2021-03-22 2022-03-17 パルス整形器回路 Active JP7802090B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP21163924.0 2021-03-22
EP21163924.0A EP4063918A1 (en) 2021-03-22 2021-03-22 Pulse shaper circuit
PCT/EP2022/056954 WO2022200161A1 (en) 2021-03-22 2022-03-17 Pulse shaper circuit

Publications (3)

Publication Number Publication Date
JP2024512009A JP2024512009A (ja) 2024-03-18
JP2024512009A5 JP2024512009A5 (https=) 2025-03-24
JP7802090B2 true JP7802090B2 (ja) 2026-01-19

Family

ID=75143499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023558172A Active JP7802090B2 (ja) 2021-03-22 2022-03-17 パルス整形器回路

Country Status (5)

Country Link
US (1) US20240168179A1 (https=)
EP (2) EP4063918A1 (https=)
JP (1) JP7802090B2 (https=)
CN (1) CN117043641A (https=)
WO (1) WO2022200161A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010530535A (ja) 2007-06-19 2010-09-09 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトル光子計数検出器
JP2018512599A (ja) 2015-04-07 2018-05-17 シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド 半導体ｘ線検出器の製造方法
JP2020516878A (ja) 2017-04-06 2020-06-11 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． パルス整形器

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2847676B1 (fr) * 2002-11-25 2005-02-11 Commissariat Energie Atomique Cuircuit de traitement ameliore pour chaine de spectrometrie et chaine de spectrometrie utilisant un tel circuit
US20100193700A1 (en) * 2007-06-01 2010-08-05 Koninklijke Philips Electronics N.V. Spectral photon counting detector
US20090008564A1 (en) * 2007-07-05 2009-01-08 Cmt Medical Technologies Ltd. Modular X-Ray Detector With Single Photon Counting, Energy Sensitivity And Integration Capabilities
KR101871361B1 (ko) * 2011-11-01 2018-08-03 삼성전자주식회사 고해상도 및 고대조도 영상을 동시에 생성하기 위한 광자 계수 검출 장치 및 방법
RU2014143053A (ru) * 2012-03-27 2016-05-20 Конинклейке Филипс Н.В. Обычная визуализация посредством системы визуализации, содержащей детекторы для счета фотонов
CN104220900B (zh) * 2012-03-27 2017-05-17 皇家飞利浦有限公司 高通量光子计数探测器电子器件
JP2014049983A (ja) * 2012-08-31 2014-03-17 Canon Inc 放射線撮像装置、その制御方法及びプログラム
EP2932299B1 (en) * 2012-12-14 2019-03-27 Koninklijke Philips N.V. Detector unit with pulse shaper
JP2015065531A (ja) * 2013-09-24 2015-04-09 株式会社東芝 信号処理装置および信号処理方法
US9588239B2 (en) * 2015-04-22 2017-03-07 Analogic Corporation Data acquisition system of photon counting detector array
CN107850682B (zh) * 2015-07-13 2021-07-27 皇家飞利浦有限公司 高能量分辨率/高x射线通量光子计数探测器
JP7041079B6 (ja) * 2016-06-16 2022-05-30 コーニンクレッカ フィリップス エヌ ヴェ スペクトル放射線ディテクターにおける改善された光子カウント
US10690448B2 (en) * 2017-01-20 2020-06-23 Raytheon Company Method and apparatus for variable time pulse sampling
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
KR20210008044A (ko) * 2018-06-08 2021-01-20 에이에스엠엘 네델란즈 비.브이. 현미경을 위한 반도체 하전 입자 검출기
US11681053B1 (en) * 2020-06-10 2023-06-20 Actev Motors. Inc. Methods, systems, and devices for monitoring cumulative radiation

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010530535A (ja) 2007-06-19 2010-09-09 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトル光子計数検出器
JP2018512599A (ja) 2015-04-07 2018-05-17 シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド 半導体ｘ線検出器の製造方法
JP2020516878A (ja) 2017-04-06 2020-06-11 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． パルス整形器

Also Published As

Publication number Publication date
JP2024512009A (ja) 2024-03-18
EP4314901B1 (en) 2025-10-22
EP4314901A1 (en) 2024-02-07
US20240168179A1 (en) 2024-05-23
WO2022200161A1 (en) 2022-09-29
EP4063918A1 (en) 2022-09-28
CN117043641A (zh) 2023-11-10

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