WO2022168434A1 - 粒子分析装置、粒子分析方法、及び、粒子分析装置用プログラム - Google Patents

粒子分析装置、粒子分析方法、及び、粒子分析装置用プログラム Download PDF

Info

Publication number
WO2022168434A1
WO2022168434A1 PCT/JP2021/045147 JP2021045147W WO2022168434A1 WO 2022168434 A1 WO2022168434 A1 WO 2022168434A1 JP 2021045147 W JP2021045147 W JP 2021045147W WO 2022168434 A1 WO2022168434 A1 WO 2022168434A1
Authority
WO
WIPO (PCT)
Prior art keywords
aggregation
particle
camera
particles
cell
Prior art date
Application number
PCT/JP2021/045147
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
久 秋山
浩行 越川
哲也 森
康弘 立脇
Original Assignee
株式会社堀場製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社堀場製作所 filed Critical 株式会社堀場製作所
Priority to JP2022579366A priority Critical patent/JPWO2022168434A1/ja
Publication of WO2022168434A1 publication Critical patent/WO2022168434A1/ja

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

Definitions

  • the present invention relates to a particle analyzer that irradiates a sample containing particles with light and analyzes the state of the particles based on the captured image.
  • Patent Document 1 proposes calculating entropy for each pixel of a captured image in order to evaluate the dispersed state of particles. Specifically, in the invention described in Patent Document 1, a two-dimensional array detector is arranged so as to face an illumination mechanism, and particles are detected by transmitted light while flowing heterogeneous particles on the two-dimensional array detector in one direction. image is captured.
  • An object of the present invention is to provide a particle analyzer capable of numerically evaluating changes in thickness.
  • the present invention has found that, for example, in the case of a sample with a very small particle diameter such as nanoparticles, light is irradiated from the periphery of the cell and the light scattered by the particles is captured by a camera. This is based on the discovery for the first time that images corresponding to the degree of aggregation and changes in the shape of particles due to aggregation can be obtained by imaging with .
  • the particle analysis apparatus includes a camera that captures an image of a cell in which a sample containing particles is accommodated, and light that travels obliquely to an imaging optical axis of the camera to an irradiation target area of the cell. and an aggregation analysis unit that analyzes aggregation of particles in the sample based on the image captured by the camera.
  • a particle analysis method is a particle analysis method using a camera for capturing an image of a cell in which a sample containing particles is accommodated, wherein an irradiation target area of the cell is aligned with an imaging optical axis of the camera. and analyzing aggregation of particles in the sample based on the image captured by the camera.
  • the transmitted light intensity detected by the camera will change significantly accordingly. For this reason, if the detection sensitivity of the camera is adjusted to the state before agglutination, a saturated region will occur in the image after agglutination, and information about the particles will be lost. On the other hand, if the detection sensitivity of the camera is adjusted so that the saturated part in the image after aggregation becomes too small, the transmitted light intensity detected before aggregation becomes too small, making it impossible to calculate the particle characteristics. It's gone. Also, even if a camera with a wide luminance detection range is used, the change in transmitted light intensity is too large. Therefore, when performing image processing, the threshold value for binarization must be greatly changed according to the process of aggregation. Therefore, it is difficult to guarantee that the settings are appropriate for evaluating changes in particle shape and size due to agglomeration.
  • the scattered light intensity does not change much compared to the transmitted light intensity, so the brightness of each pixel of the image is saturated before and after aggregation. Since it is difficult for particles to become too small, the degree of aggregation of particles can be quantified and evaluated.
  • the aggregation analysis unit calculates an aggregation index indicating the degree of aggregation of particles based on the luminance distribution of the image captured by the camera. Any configuration may be used as long as it is configured to calculate.
  • the aggregation analysis unit uses the first image, which is the luminance distribution of the first image captured at the reference time point.
  • the aggregation index may be calculated by comparing the first luminance distribution with a second luminance distribution, which is the luminance distribution of a second image captured after a predetermined time has elapsed from the reference time point. .
  • correction is performed by multiplying each luminance of the second luminance distribution and the first luminance distribution by a predetermined value, or by adding a predetermined value to each luminance of the first luminance distribution.
  • the aggregation index may be calculated based on the difference luminance distribution obtained by the difference from the second luminance distribution. That is, it is expected that the particles in the second image where particles are not aggregated are in the same dispersed state as the particles in the first image captured at the reference time. Therefore, it can be said that the difference luminance distribution reduces the influence of the luminance of the portion where the particles are dispersed in the second image and emphasizes the luminance of the portion where the particles are aggregated. Therefore, with the difference luminance distribution, the aggregation index can reflect the degree of aggregation of the particles.
  • the aggregation analysis unit calculates the aggregation index based on each frequency of brightness equal to or greater than a predetermined value in the differential brightness distribution. Anything is fine.
  • Another aspect of the agglutination analysis unit is to generate a binarized image with a threshold value that is greater by a predetermined value than the peak with the lowest luminance in the luminance distribution of the imaged image, and generate a binarized image based on the binarized image. to calculate the aggregation index. That is, the inventors of the present application have found that when particles are dispersed, the brightness distribution of an image becomes a normal distribution having a peak at a certain brightness, whereas when aggregation occurs, the symmetry of the brightness distribution is lost and the brightness becomes high. It was found that the frequency increases on the luminance side.
  • the binarized image can reflect only the agglomerated portions.
  • the binarized image generated in this way it is easy to create an agglutination index that accurately reflects the degree of agglutination.
  • the threshold value is substantially It may be set based on the average value and standard deviation of the portion forming a normal distribution.
  • the size of aggregated particles can be numerically evaluated.
  • the aggregation analysis unit may calculate the skewness of the brightness distribution as the aggregation index.
  • the illumination mechanism includes a ring having an observation hole. and the camera is arranged to image the cell through the observation hole.
  • the particles contained in the sample are nanoparticles, and the size detectable in one pixel of the image captured by the camera is larger than the particle diameter of the nanoparticles. are mentioned.
  • the cell comprises a pair of light-transmitting plates spaced apart from each other by a predetermined distance, it is easy for the camera to capture an image reflecting the degree of aggregation by the light scattered by the nanoparticles.
  • the light emitted from the illumination mechanism includes a wavelength component that excites the fluorescence of the particles contained in the sample. If it is That is, in the present invention, since an image is captured with light scattered by particles, even light with a low intensity such as fluorescence can be captured as a difference in intensity in the image.
  • a rotating mechanism for rotating the cell or a portion of the cell is further provided to allow application of a shear force to the sample so that the relationship between shear force and aggregation can be evaluated. Anything is fine.
  • a temperature control mechanism for controlling the temperature of the cell should be provided. Just do it.
  • a camera for capturing an image of a cell in which a sample containing particles is accommodated is provided on the same side of the cell as the camera. and an illumination mechanism for irradiating an irradiation target area with light from the surroundings
  • the program used in the particle analysis apparatus for analyzing aggregation of particles in the sample based on the image captured by the camera.
  • a program for a particle analyzer which is characterized by causing a computer to exhibit the mechanisms of the agglutination analysis part and the function of the particle analyzer, may be used.
  • the program for the particle analyzer may be electronically distributed, or may be recorded on a program recording medium such as a CD, DVD, or flash memory.
  • the particle analysis apparatus As described above, with the particle analysis apparatus according to the present invention, it is possible to obtain an image in which the brightness changes according to the degree of aggregation, even for a sample containing particles with a small particle size such as nanoparticles. It is possible to numerically evaluate the degree of aggregation based on.
  • FIG. 2 is a functional block diagram of the particle analyzer of the first embodiment
  • FIG. 4 is an image diagram showing changes in an image captured by aggregation of nanoparticles captured by the particle analyzer of the first embodiment.
  • FIG. 1 A particle analyzer 100 according to the first embodiment of the present invention will be described with reference to FIGS. 1 to 4.
  • FIG. 1 A particle analyzer 100 according to the first embodiment of the present invention will be described with reference to FIGS. 1 to 4.
  • the particle analyzer 100 of the first embodiment analyzes aggregation of particles based on an image of a sample S containing particles.
  • Particles to be analyzed in the first embodiment are nanoparticles having a particle diameter on the order of 100 nm, for example.
  • the particle analysis apparatus 100 is configured as a vertical apparatus in which the imaging optical axis is set along the vertical direction. It has a side mounted camera 2 and an illumination mechanism 3 . That is, the particle analysis apparatus 100 includes an illumination mechanism 3 configured to irradiate light from the periphery of the cell 1 to an irradiation target area set in the cell 1, and an image of the particle using light scattered by the particle. It has a camera 2 for taking an image and a lens barrel 4 in which lenses and the like are accommodated.
  • the cell 1 can be of the type used for measuring a high-concentration sample S, for example.
  • the cell 1 includes a pair of light-transmitting plates 11 separated from each other by a predetermined distance, and spacers 12 provided between the light-transmitting plates 11 .
  • Each light-transmitting plate 11 is formed in the shape of a thin disc, and an annular vapor-deposited film having a thickness of about 1 ⁇ m is formed on the outer peripheral portion of the inner surface of one of the light-transmitting plates 11 .
  • This deposited film functions as the spacer 12 described above, and the sample S containing particles is accommodated in the accommodation space 13 surrounded by the light-transmitting plates 11 and the spacers 12 .
  • At least one of the light-transmitting plates 11 has an introduction hole (not shown) for introducing the sample S into the accommodation space 13 and a lead-out hole for leading the sample S from the accommodation space 13 to the outside. (not shown) are formed.
  • the illumination mechanism 3 is a ring-shaped illumination provided above the cell 1 and near the end of the lens barrel 4 on the cell 1 side.
  • the illumination mechanism 3 is configured to irradiate the cell 1 with light traveling obliquely with respect to the imaging optical axis OA of the camera 2 from the entire circumference.
  • the illumination mechanism 3 includes a ring-shaped housing 31 that has an observation hole 32 in the center and holds a large number of LEDs (not shown).
  • the optical axis of each LED provided in the ring-shaped housing 31 is directed toward the central axis of the observation hole 32, and the surroundings of the irradiation target area set in the cell 1 are irradiated so as to concentrate.
  • the illumination system 3 is configured as ambient illumination, and light with an angle of incidence of a predetermined angular range is incident on each point of the illuminated area over 360°. In other words, when the irradiation target area is viewed from a certain point, the rays are incident so as to concentrate on that point. It should be noted that the reflected component of the light emitted from the illumination mechanism 3 is configured so as not to enter the observation hole 32 or the lens barrel 4 . Therefore, only the light scattered by the particles in the cell 1 passes through the observation hole 32 and the lens barrel 4 to enter the camera 2 .
  • the camera 2 is equipped with a two-dimensional array detector such as a CCD, and a field of view of a predetermined size is set in the irradiation target area of the cell 1. Also, the imaging optical axis OA of the camera 2 is configured to enter the face plate portion of the cell 1 perpendicularly.
  • the size detectable by one pixel of the image captured by the camera 2 is larger than the particle diameter of the nanoparticles. In other words, since the resolution, which is the value obtained by dividing the area of the field of view by the number of pixels, is greater than 100 nm, it is not possible to detect the outline of a nanoparticle that fits in one pixel.
  • the camera 2 of the first embodiment can capture a color or monochrome image, and can detect the brightness of each pixel with, for example, 256 gradations (8 bits).
  • the particle analyzer 100 has a CPU, a memory, an A/D converter, a D/A converter, various input/output devices, and a computer connected to the illumination mechanism 3 and camera 2 .
  • the computer controls the operation of each device as shown in FIG. function as an aggregation analysis unit 52 that analyzes aggregation of particles.
  • the device control unit 51 controls each device such that the illumination mechanism 3 intermittently emits light in synchronization with the shutter timing of the camera 2, for example.
  • the aggregation analysis unit 52 analyzes aggregation of particles in the sample S based on the image captured by the camera 2 .
  • the aggregation analysis unit 52 calculates an aggregation index indicating the degree of particle aggregation based on each luminance distribution in the images of the plurality of samples S captured at different times.
  • the aggregation analysis unit 52 analyzes the first luminance distribution, which is the luminance distribution of the first image captured at the time when the sample S is introduced into the cell 1, which is the reference time, and An aggregation index is calculated from the second luminance distribution, which is the luminance distribution of the captured second image.
  • each bright spot in one image is substantially uniform, and as shown in FIG. Bright spots appear. It is considered that such a change occurs because the intensity of scattered light increases with aggregation. In addition, the number of such large bright spots increases as time elapses.
  • Fig. 4 shows an example of changes in luminance distribution due to aggregation.
  • the histogram of the first luminance distribution forms a normal distribution having a peak at a certain luminance as shown in FIG. 4(a).
  • the peak on the low-luminance side (left side) has a shape similar to a normal distribution similar to the peak shape of FIG. 4A, and the average value is slightly lower. Therefore, the peak on the low-luminance side of the second luminance distribution in FIG. 4B is considered to be the luminance of scattered light due to particles that have not aggregated and are in a dispersed state even after the elapse of a predetermined time.
  • the peak on the high brightness side (right side) of the second brightness distribution in FIG. 4B did not exist at the reference time, it is considered that the peak occurred due to an increase in scattered light intensity due to aggregation.
  • the aggregation analysis unit 52 extracts only the peaks on the high brightness side of the second brightness distribution in FIG. 4(b) and calculates the aggregation index in the following procedure.
  • the aggregation analysis unit 52 sets each luminance in the first luminance distribution so that the peak of the first luminance distribution and the peak on the low luminance side of the second luminance distribution overlap within a predetermined error range. Multiplying it, the corrected first luminance distribution is calculated. Then, the aggregation analysis unit 52 calculates a difference luminance distribution obtained by, for example, the difference between the second luminance distribution and the corrected first luminance distribution. The aggregation analysis unit 52 outputs the difference luminance distribution itself calculated in this way, for example, as an aggregation index. Alternatively, the aggregation analysis unit 52 may calculate the average value of the difference luminance distribution or the like as the aggregation index.
  • an image capturing changes in aggregation of particles can be captured by capturing the scattered light of the particles obtained by the illumination mechanism 3 configured as ambient illumination. That is, even if the optical settings of the particle analyzer 100 are not changed before and after agglutination, the pixels of the image are not saturated and the brightness is insufficient for particle analysis. can be done. Therefore, changes in the shape and size of particles due to aggregation can be reflected in each pixel of the image.
  • the aggregation analysis unit 52 detects the occurrence of aggregation by utilizing the fact that the portion representing the dispersed particles in the luminance distribution of the imaged image has a substantially normal distribution.
  • a difference luminance distribution which is the luminance distribution of the portion where the
  • the difference luminance distribution changes with the elapsed time and progress of aggregation, it is possible to calculate an aggregation index that quantifies the aggregation process appearing in each image based on the difference luminance distribution. That is, since it is thought that the magnitude of luminance in the differential luminance distribution correlates with the size of aggregated particles, and that each frequency correlates with the number of aggregated particles, changes in the shape and size of particles due to aggregation can be evaluated numerically.
  • the aggregation analysis unit 52 generates a binarized image by using a brightness that is greater by a predetermined value as a threshold than the peak with the lowest brightness in the brightness distribution of the captured image.
  • An aggregation index is calculated based on the valued image.
  • the aggregation analysis unit 52 determines that light scattered by aggregated particles is caused by a brightness higher than a predetermined value based on the brightness at the peak of the normal distribution, which is the brightness distribution of the particles in the dispersed state.
  • the threshold is set based on the average value and the standard deviation ⁇ of the portion of the luminance distribution that substantially forms a normal distribution.
  • the brightness that is the peak brightness of each normal distribution is used as a reference, and the brightness that is greater by 2 ⁇ is set as a threshold. Part 52 generates.
  • the unevenness that occurs in the part that deviates from the normal distribution is due to the agglomerated particles. Only the group is in the disambiguated state.
  • the first image and the second image shown in FIG. 3 can be converted into binarized images as shown in FIG. 7 in this modified example.
  • the aggregation analysis unit 52 calculates the size of the cluster of particles as an aggregation index from the binarized image.
  • the size of the aggregated particle group which is an index of aggregation, can be easily evaluated using a conventional image analysis algorithm.
  • the wavelength of the light emitted from the illumination mechanism 3 excites particles in the sample S to generate fluorescence.
  • the possibility that the excitation wavelength is included can be increased regardless of the sample, and a fluorescence image in which particles emit fluorescence can be easily obtained.
  • the edge of the target particle can be highlighted in the captured image, and only the target particle can be easily extracted to evaluate its size and shape.
  • the wavelength of the light emitted from the illumination mechanism 3 may be limited to the excitation wavelength of the particles.
  • the wavelength of the light emitted from the illumination mechanism 3 may be limited by using a filter that passes only a specific wavelength, or the light source of the illumination mechanism 3 may emit light of a specific wavelength.
  • an excitation light cut filter may be provided between the lens of the camera 2 and the cell 1 to extract only fluorescence of a specific wavelength.
  • the particle analysis apparatus 100 of the second embodiment is configured to evaluate the characteristics of particles by combining the analysis result of the particle image described in the first embodiment and the analysis result of the particle by laser diffraction.
  • the particle analyzer 100 of the second embodiment includes the first laser 6 that emits a red laser, the second laser 7 that emits a blue laser, and the particles diffracted or scattered by the particle analyzer 100 of the first embodiment.
  • a laser detection mechanism (not shown) for detecting the emitted laser light, a rotation mechanism (not shown) for rotating the entire cell 1 or a part of the cell 1, and a camera 2 are provided on the opposite side of the cell 1. and a transmitted illumination mechanism 8 .
  • one of the light-transmitting plates 11 of the cell 1 is rotated by the rotation mechanism to obtain an image of the particles while applying a shearing force to the sample S. can be done. Therefore, it becomes possible to numerically evaluate the effect of particle aggregation due to shear force.
  • the position of the field of view of the camera 2 on the cell 1 can be changed, and the characteristic evaluation regarding aggregation and the like of the entire sample S can be realized.
  • the particle diameter and shape may be measured, and the amount of transmitted light may be imaged by the camera 2 to calculate the concentration of the sample S and the like.
  • the particle size distribution For particles with a large particle size, it is possible to measure the particle size distribution based on red laser diffraction while evaluating aggregation using the captured image. For particles with a small particle size, the particle size distribution can be measured on the basis of blue laser diffraction while the aggregation is evaluated using the captured image. For example, it is conceivable to correct the influence of aggregation from the calculated particle size distribution.
  • the aggregation analysis unit may calculate the skewness of the luminance distribution as the aggregation index.
  • the degree of agglomeration can be numerically evaluated by utilizing the fact that the luminance distribution deviates from the normal distribution.
  • the corrected first luminance distribution in the first embodiment is not limited to multiplying each luminance of the first luminance distribution by a predetermined value, and may be corrected by adding a predetermined value to each luminance. Further, instead of correcting the first luminance distribution, the difference between the corrected second luminance distribution obtained by correcting the second luminance distribution and the first luminance distribution may be obtained to obtain the difference luminance distribution. Also, the reference time point at which the first luminance distribution is measured is not limited to the time point when the sample is introduced into the cell, and may be any time point. That is, the first luminance distribution and the second luminance distribution may be luminance distributions obtained from images of the same sample taken at different times.
  • the method of setting the threshold is not limited to this.
  • the threshold is set to a brightness that is 2 ⁇ greater than the average ⁇ , but the threshold may be a brightness that is 3 ⁇ greater than the average ⁇ .
  • an arbitrary value may be added to the average ⁇ as the threshold.
  • the threshold value may be set by multiplying the standard deviation ⁇ by the same magnification.
  • the particle analysis device was configured as a vertical device with the imaging optical axis along the vertical direction, but it may be configured as a horizontal device with the imaging optical axis along the horizontal direction.
  • the cell is not limited to the high-concentration sample cell shown in each embodiment. For example, an existing rectangular parallelepiped cell, flow cell, or the like may be used.
  • a temperature control mechanism may be provided to control the temperature of the cell, and the relationship between temperature change and particle aggregation may be numerically evaluated based on the captured image.
  • the temperature control mechanism may include a heater for heating the sample, or may include a cooler for cooling the sample.
  • the temperature control mechanism controls the temperature of the dispersion medium in which the particles are dispersed in the particles to adjust the viscosity of the dispersion medium. can also be done. In other words, it is also possible to evaluate the relationship between the viscosity of the dispersion medium and the aggregation of the particles.
  • the lighting mechanism is not limited to ring lighting, and may be, for example, dome-shaped lighting. That is, the illumination mechanism may irradiate the illumination target area of the cell with light that travels obliquely with respect to the imaging optical axis of the camera.
  • the illumination mechanism is not limited to irradiating light from the entire periphery of the imaging optical axis, and may irradiate light only from a partial range.
  • the illumination mechanism is not limited to being provided on the same side of the cell as the camera, and may be provided on the opposite side of the cell to the camera.
  • the illumination mechanism may be configured as a dark-field illumination, and the light emitted from the illumination mechanism that is reflected by the cell or the sample or transmitted through the cell or the sample does not directly enter the camera. so that only the light scattered by the particles is directly incident on the camera.
  • the light source is not limited to the LED, and may be one that emits light based on other principles.
  • the present invention it is possible to obtain an image in which the brightness changes according to the degree of aggregation even for a sample containing particles with a small particle size such as nanoparticles, and based on this image, the degree of aggregation can be numerically evaluated. It is possible to provide a particle analyzer capable of evaluating

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
PCT/JP2021/045147 2021-02-05 2021-12-08 粒子分析装置、粒子分析方法、及び、粒子分析装置用プログラム WO2022168434A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022579366A JPWO2022168434A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2021-02-05 2021-12-08

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021017699 2021-02-05
JP2021-017699 2021-02-05

Publications (1)

Publication Number Publication Date
WO2022168434A1 true WO2022168434A1 (ja) 2022-08-11

Family

ID=82741106

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2021/045147 WO2022168434A1 (ja) 2021-02-05 2021-12-08 粒子分析装置、粒子分析方法、及び、粒子分析装置用プログラム

Country Status (2)

Country Link
JP (1) JPWO2022168434A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
WO (1) WO2022168434A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024190313A1 (ja) * 2023-03-16 2024-09-19 株式会社堀場製作所 遠心沈降式の測定装置、及び遠心沈降式の測定方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010210318A (ja) * 2009-03-09 2010-09-24 Jfe Steel Corp 粉塵の測定装置および発生源の推定方法
JP2014525583A (ja) * 2011-08-29 2014-09-29 アムジェン インコーポレイテッド 流体中の非溶解粒子の非破壊的検出のための方法および装置
JP2015517677A (ja) * 2012-05-24 2015-06-22 アッヴィ・インコーポレイテッド 有益物質中の粒子の検出のためのシステムおよび方法
WO2020037289A1 (en) * 2018-08-16 2020-02-20 Essenllix Corporation Homogeneous assay with particle aggregation or de-aggregation

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010210318A (ja) * 2009-03-09 2010-09-24 Jfe Steel Corp 粉塵の測定装置および発生源の推定方法
JP2014525583A (ja) * 2011-08-29 2014-09-29 アムジェン インコーポレイテッド 流体中の非溶解粒子の非破壊的検出のための方法および装置
JP2015517677A (ja) * 2012-05-24 2015-06-22 アッヴィ・インコーポレイテッド 有益物質中の粒子の検出のためのシステムおよび方法
WO2020037289A1 (en) * 2018-08-16 2020-02-20 Essenllix Corporation Homogeneous assay with particle aggregation or de-aggregation

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024190313A1 (ja) * 2023-03-16 2024-09-19 株式会社堀場製作所 遠心沈降式の測定装置、及び遠心沈降式の測定方法

Also Published As

Publication number Publication date
JPWO2022168434A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2022-08-11

Similar Documents

Publication Publication Date Title
US9360410B2 (en) Method and particle analyzer for determining a broad particle size distribution
CN107250716B (zh) 动态高速高灵敏度成像装置及成像方法
CN106716125B (zh) 纳米颗粒分析器
WO2015182065A1 (en) Imaging apparatus, imaging method and medical imaging system
EP3786612B1 (en) Particle size distribution measuring device and program for particle size distribution measuring device
US20100226524A1 (en) Apparatus and method for measuring haze of sheet materials or other materials
JP2014025720A (ja) 含水率粒径測定装置
KR20130109365A (ko) 표면결함 검사장치 및 그 제어 방법
JP5920534B2 (ja) 膜厚測定方法、膜厚測定装置及び記録媒体
JP2020060598A (ja) 燃料フィルタデブリ用の光学デバイス
JP7328871B2 (ja) 粒子サイズ測定装置および測定方法
WO2022168434A1 (ja) 粒子分析装置、粒子分析方法、及び、粒子分析装置用プログラム
JP2016020824A (ja) 基板の検査装置及び基板の検査方法
US11448579B2 (en) Particle size distribution measuring device and program for particle size distribution measuring device
CN108369169B (zh) 用于测量胶体颗粒的生长或溶解动力学的装置和方法
US20080170772A1 (en) Apparatus for determining positions of objects contained in a sample
JP5787668B2 (ja) 欠陥検出装置
JP2016205891A (ja) 粒径測定システムおよび粒径測定方法
WO2023095414A1 (ja) 微小粒子の計測方法、微小粒子計測装置及び微小粒子計測システム
CN101583972B (zh) 用于确定在样本中包含的对象的位置的装置
JP7599629B1 (ja) 粒子解析装置、粒子解析システム、及び、粒子解析方法
KR102754092B1 (ko) 반도체 소자의 패턴 불량 검출 시스템 및 방법
JP2006177751A (ja) 色ビーズ判別装置
JP2009222567A (ja) 接触面積測定装置および接触面積測定方法
JP2022072095A (ja) 混入金属識別方法および装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 21924819

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2022579366

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 21924819

Country of ref document: EP

Kind code of ref document: A1