WO2022139352A1 - 방향성 전기강판 및 그의 제조방법 - Google Patents
방향성 전기강판 및 그의 제조방법 Download PDFInfo
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- WO2022139352A1 WO2022139352A1 PCT/KR2021/019327 KR2021019327W WO2022139352A1 WO 2022139352 A1 WO2022139352 A1 WO 2022139352A1 KR 2021019327 W KR2021019327 W KR 2021019327W WO 2022139352 A1 WO2022139352 A1 WO 2022139352A1
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- electrical steel
- grain
- coating layer
- oriented electrical
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- 229910001224 Grain-oriented electrical steel Inorganic materials 0.000 title claims abstract description 65
- 238000004519 manufacturing process Methods 0.000 title abstract description 23
- 238000000034 method Methods 0.000 claims abstract description 50
- 239000012535 impurity Substances 0.000 claims abstract description 9
- 239000011247 coating layer Substances 0.000 claims description 100
- 239000013078 crystal Substances 0.000 claims description 67
- 229910000976 Electrical steel Inorganic materials 0.000 claims description 50
- 239000000758 substrate Substances 0.000 claims description 47
- 239000010410 layer Substances 0.000 claims description 36
- 239000011148 porous material Substances 0.000 claims description 29
- 239000002245 particle Substances 0.000 claims description 12
- 229910052787 antimony Inorganic materials 0.000 claims description 7
- 238000000137 annealing Methods 0.000 abstract description 42
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- 238000005098 hot rolling Methods 0.000 abstract description 9
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- 229910000831 Steel Inorganic materials 0.000 description 42
- 239000010959 steel Substances 0.000 description 42
- 230000035882 stress Effects 0.000 description 42
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 29
- 230000000052 comparative effect Effects 0.000 description 19
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 18
- 230000005389 magnetism Effects 0.000 description 14
- 229910052757 nitrogen Inorganic materials 0.000 description 12
- 238000010438 heat treatment Methods 0.000 description 11
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- 230000015572 biosynthetic process Effects 0.000 description 9
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- 238000009413 insulation Methods 0.000 description 9
- 229910052799 carbon Inorganic materials 0.000 description 6
- 229910052748 manganese Inorganic materials 0.000 description 6
- 238000005096 rolling process Methods 0.000 description 6
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 5
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- 239000001257 hydrogen Substances 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- 229910019142 PO4 Inorganic materials 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 229910001566 austenite Inorganic materials 0.000 description 4
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- 239000011254 layer-forming composition Substances 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 4
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- 229910052710 silicon Inorganic materials 0.000 description 4
- 229910052718 tin Inorganic materials 0.000 description 4
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- 230000002411 adverse Effects 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
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- 229910052839 forsterite Inorganic materials 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
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- HCWCAKKEBCNQJP-UHFFFAOYSA-N magnesium orthosilicate Chemical compound [Mg+2].[Mg+2].[O-][Si]([O-])([O-])[O-] HCWCAKKEBCNQJP-UHFFFAOYSA-N 0.000 description 3
- 230000005381 magnetic domain Effects 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000007792 addition Methods 0.000 description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 2
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- 238000003466 welding Methods 0.000 description 2
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- 229910004283 SiO 4 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
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- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
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- 239000006104 solid solution Substances 0.000 description 1
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- 239000011593 sulfur Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D8/00—Modifying the physical properties by deformation combined with, or followed by, heat treatment
- C21D8/12—Modifying the physical properties by deformation combined with, or followed by, heat treatment during manufacturing of articles with special electromagnetic properties
- C21D8/1277—Modifying the physical properties by deformation combined with, or followed by, heat treatment during manufacturing of articles with special electromagnetic properties involving a particular surface treatment
- C21D8/1283—Application of a separating or insulating coating
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D6/00—Heat treatment of ferrous alloys
- C21D6/008—Heat treatment of ferrous alloys containing Si
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D8/00—Modifying the physical properties by deformation combined with, or followed by, heat treatment
- C21D8/12—Modifying the physical properties by deformation combined with, or followed by, heat treatment during manufacturing of articles with special electromagnetic properties
- C21D8/1216—Modifying the physical properties by deformation combined with, or followed by, heat treatment during manufacturing of articles with special electromagnetic properties the working step(s) being of interest
- C21D8/1238—Flattening; Dressing; Flexing
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D9/00—Heat treatment, e.g. annealing, hardening, quenching or tempering, adapted for particular articles; Furnaces therefor
- C21D9/46—Heat treatment, e.g. annealing, hardening, quenching or tempering, adapted for particular articles; Furnaces therefor for sheet metals
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/004—Very low carbon steels, i.e. having a carbon content of less than 0,01%
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/008—Ferrous alloys, e.g. steel alloys containing tin
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/02—Ferrous alloys, e.g. steel alloys containing silicon
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/04—Ferrous alloys, e.g. steel alloys containing manganese
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/06—Ferrous alloys, e.g. steel alloys containing aluminium
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C38/00—Ferrous alloys, e.g. steel alloys
- C22C38/60—Ferrous alloys, e.g. steel alloys containing lead, selenium, tellurium, or antimony, or more than 0.04% by weight of sulfur
-
- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D2201/00—Treatment for obtaining particular effects
- C21D2201/05—Grain orientation
Definitions
- It relates to a grain-oriented electrical steel sheet and a method for manufacturing the same. Specifically, it relates to a method of manufacturing a grain-oriented electrical steel sheet that suppresses the formation of subgrain boundaries by controlling the tension applied to the steel sheet in the process of forming an insulating coating layer and improves magnetism.
- grain-oriented electrical steel sheet refers to an electrical steel sheet containing Si component in the steel sheet, having a grain structure aligned in the ⁇ 110 ⁇ ⁇ 001> direction, and having extremely excellent magnetic properties in the rolling direction. It is possible to obtain such a ⁇ 110 ⁇ 001> texture by a combination of several manufacturing processes, and in particular, including the components of the steel slab, heating, hot rolling, hot-rolled sheet annealing, primary recrystallization annealing, and secondary recrystallization annealing A series of processes must be strictly controlled. Specifically, the grain-oriented electrical steel sheet suppresses the growth of primary recrystallized grains and selectively grows grains of ⁇ 110 ⁇ 001> orientation among the growth-inhibited grains to exhibit excellent magnetic properties by the secondary recrystallized structure.
- the growth inhibitor of the primary recrystallized grains is more important. And, in the final annealing process, it is one of the major issues in grain-oriented electrical steel sheet manufacturing technology to allow for preferential growth of grains having a texture of ⁇ 110 ⁇ 001> orientation stably among grains whose growth is suppressed.
- Examples of the growth inhibitors of primary grains that can satisfy the above conditions and are currently widely used industrially include MnS, AlN, and MnSe. Specifically, MnS, AlN, and MnSe contained in the steel slab are reheated at a high temperature for a long time to be dissolved in a solid solution, and then hot rolled, and in the subsequent cooling process, the component having an appropriate size and distribution is made into precipitates and used as the growth inhibitor.
- an insulating film is formed on the steel sheet and a forsterite-based base film, and tensile stress is applied to the steel sheet using the difference in the coefficient of thermal expansion of the insulating film, thereby improving iron loss and magnetostriction.
- a wet coating method is known as a method of reducing the 90° magnetic domain of the grain-oriented electrical steel sheet.
- the 90° magnetic domain refers to a region having a magnetization oriented at right angles to the magnetic field application direction, and the smaller the amount of the 90° magnetic domain, the smaller the magnetostriction.
- the general wet coating method lacks the effect of improving noise due to application of tensile stress, and has disadvantages in that it has to be coated with a thick film, so there is a problem in that the space factor and efficiency of the transformer are deteriorated.
- PVD Physical Vapor Deposition
- CVD Chemical Vapor Deposition
- a method for manufacturing a grain-oriented electrical steel sheet is provided. Specifically, the present invention provides a method of manufacturing a grain-oriented electrical steel sheet in which subgrain boundary formation is suppressed and magnetism is improved by controlling the tension applied to the steel sheet in the process of forming an insulating coating layer.
- a grain-oriented electrical steel sheet includes: Si: 2.0 to 7.0 wt%, and Sb: 0.01 to 0.07 wt%; and an insulating coating layer positioned on the electrical steel sheet substrate, wherein the insulating coating layer includes pores with a particle diameter of 10 nm or more, and the electrical steel sheet substrate is within 1500 ⁇ m in the RD direction from the pore center (A) and from the surface of the electrical steel sheet substrate.
- Sub-crystal grains exist in a region (B) of 50 to 100 ⁇ m in the inner direction of the electrical steel sheet, and the sub-crystal grains have a crystal orientation of 1° to 15° from ⁇ 110 ⁇ ⁇ 001>, and The area fraction is 5% or less.
- the ratio (y/z) of the grain length (y) in the TD direction to the grain length (z) in the ND direction may be 1.5 or less.
- a Goss crystal grain having a crystal orientation of less than 1° from ⁇ 110 ⁇ ⁇ 001> is included, and the average particle diameter of the Goss crystal grains in the ND section
- the ratio ( LS / L G ) of the average grain size (LS ) of the sub-crystal grains to (L G ) may be 0.20 or less.
- the number of pores having a particle diameter of 10 nm or more may be 1 to 300 per 1 mm in the RD direction.
- a fine grain interfacial layer is present from the surface of the electrical steel sheet substrate to the inner direction of the electrical steel sheet substrate, and the fine grain interfacial layer may have an average grain size of 0.1 to 5 ⁇ m.
- the micrograin interface layer may have a residual stress in the RD direction of -10 to -1000 MPa.
- the thickness of the fine-grained interfacial layer may be 0.1 to 5 ⁇ m.
- a base coating layer may be further included between the electrical steel sheet substrate and the insulating coating layer.
- the residual stress in the RD direction of the base coating layer may be -50 to -1500 MPa.
- the thickness of the base coating layer may be 0.1 to 15 ⁇ m.
- the residual stress in the RD direction of the insulating coating layer may be -10 to -1000 MPa.
- the thickness of the insulating coating layer may be 0.1 to 15 ⁇ m.
- the electrical steel sheet substrate may have a residual stress in the RD direction of 1 to 50 MPa.
- Manufacturing of a grain-oriented electrical steel sheet Manufacturing a grain-oriented electrical steel sheet; applying a composition for forming an insulating coating layer on a grain-oriented electrical steel sheet; and heat-treating the oriented electrical steel sheet to form an insulating coating layer on the oriented electrical steel sheet, wherein the tension applied to the steel sheet in the step of forming the insulating coating layer is 0.2 to 0.7 kgf/mm 2 .
- the maximum value (MA) and the minimum value (MI) of the tension may satisfy Equation 2 below.
- Forming the insulating coating layer may be heat-treated at a temperature of 550 to 1100 °C.
- the grain-oriented electrical steel sheet according to an embodiment of the present invention can improve magnetism by suppressing sub-crystal grains that adversely affect magnetism.
- the residual stress of the base coating layer, the insulating coating layer, and the fine-grained interfacial layer increases, thereby improving magnetism.
- FIG. 1 is a schematic diagram of a cross section of a steel plate TD according to an embodiment of the present invention.
- FIG. 2 is an electron backscatter diffraction (EBSD) photograph of the steel sheet manufactured in Example 1.
- EBSD electron backscatter diffraction
- 3 is a view showing a method of calculating the film tension using the radius of curvature.
- first, second and third etc. are used to describe, but are not limited to, various parts, components, regions, layers and/or sections. These terms are used only to distinguish one part, component, region, layer or section from another part, component, region, layer or section. Accordingly, a first part, component, region, layer or section described below may be referred to as a second part, component, region, layer or section without departing from the scope of the present invention.
- % means weight %, and 1 ppm is 0.0001 weight %.
- the meaning of further including the additional element means that the remaining iron (Fe) is included by replacing the additional amount of the additional element.
- FIG. 1 schematically shows a TD cross-section of a grain-oriented electrical steel sheet according to an embodiment of the present invention.
- the grain-oriented electrical steel sheet (!00) according to an embodiment of the present invention includes an electrical steel sheet substrate 10 and an insulating coating layer 30 positioned on the electrical steel sheet substrate 10 .
- the insulating coating layer 30 is formed by applying an insulating coating layer-forming composition including a solvent on a steel sheet and then heat-treating it. At this time, as the solvent volatilizes at a high temperature, some pores 31 are inevitably formed in the insulating coating layer 30 .
- the stress applied to the steel sheet is concentrated in the lower portions of the pores 31 to form sub-crystal grains 11 .
- the formation of the sub-crystal grains 11 is suppressed as much as possible by analyzing the positional correlation between the pores 31 and the sub-crystal grains 11 and the cause of the sub-crystal grains 11 formation.
- FIG. 1 the pores 31 and the sub-crystal grains 11 are schematically represented.
- sub-crystal grains 11 are present under the pores 31 . All of the sub-crystal grains 11 in the steel plate substrate 10 are present in a specific region under the pores 31 . However, not all of the sub-crystal grains 11 are present in the lower part of the pores 31, and there may be pores 31 in which the sub-crystal grains 11 are not present in the lower part.
- the electrical steel sheet substrate 10 refers to a portion of the grain-oriented electrical steel sheet 100 excluding the base coating layer 20 and the insulating coating layer 30 .
- Electrical steel sheet substrate 10 is Si: 2.0 to 7.0 wt%, Sn: 0.01 to 0.10 wt%, Sb: 0.01 to 0.07 wt%, Al: 0.020 to 0.040 wt%, Mn: 0.01 to 0.20 wt%, C: 0.005 Weight % or less, N: 0.005 wt% or less, and S: 0.005 wt% or less, and the balance may include Fe and other unavoidable impurities
- Si Silicon plays a role in reducing iron loss by increasing the specific resistance of the steel. If the content of Si is too small, the specific resistance of the steel becomes small and the iron loss characteristics deteriorate. Instability issues may arise. If the content of Si is too large, brittleness may increase, which may cause a problem in that cold rolling becomes difficult. Therefore, the content of Si can be adjusted in the above-mentioned range. More specifically, Si may be included in an amount of 2.5 to 5.0% by weight.
- tin (Sn) is a grain boundary segregation element and is an element that interferes with the movement of grain boundaries, it is a grain growth inhibitor that promotes the generation of Goss grains in the ⁇ 110 ⁇ 001> orientation so that secondary recrystallization develops well. It is an important element.
- Sn may be included in an amount of 0.02 to 0.08 wt%.
- Antimony is an element that promotes the generation of Goss grains in the ⁇ 110 ⁇ 001> orientation.
- Sb content is too small, a sufficient effect cannot be expected as a Goss crystal grain formation accelerator, and the Sb content is too high. If too much, it segregates on the surface, inhibits the formation of an oxide layer, and causes surface defects. Therefore, the content of Sb can be adjusted in the above-mentioned range. More specifically, Sb may be included in an amount of 0.02 to 0.04 wt%.
- Aluminum (Al) is an element that finally becomes a nitride in the form of AlN, (Al,Si)N, and (Al,Si,Mn)N and acts as an inhibitor.
- Al content is too small, a sufficient effect as an inhibitor cannot be expected.
- Al content is too large, the effect as an inhibitor is insufficient because Al-based nitrides are precipitated and grown too coarsely. Therefore, the content of Al can be adjusted in the above-mentioned range. More specifically, Al may be included in an amount of 0.020 to 0.030 wt%.
- Manganese (Mn) has the same effect as Si by increasing specific resistance to reduce iron loss, and reacts with nitrogen introduced by nitriding with Si to form (Al,Si,Mn)N precipitates for primary recrystallization It is an important element in inhibiting the growth of grains to cause secondary recrystallization.
- Mn Manganese
- the austenite phase transformation is promoted during hot rolling, so the size of the primary recrystallized grains is reduced, thereby destabilizing the secondary recrystallization.
- the austenite fraction is increased during hot-rolling reheating to increase the high-solution capacity of the precipitates. may be insufficient. Therefore, it is possible to control the content of Mn in the above-mentioned range.
- carbon (C) is a component that does not significantly improve the magnetic properties of the grain-oriented electrical steel sheet in the embodiment according to the present invention, it is preferable to remove it as much as possible. However, when it is contained above a certain level, it promotes the austenite transformation of steel during the rolling process, thereby refining the hot-rolled structure during hot rolling, thereby helping to form a uniform microstructure.
- the C content in the slab is preferably contained in an amount of 0.04% by weight or more. However, if the C content is excessive, coarse carbide is generated and it is difficult to remove when decarburized, so it may be 0.07 wt% or less. Decarburization is performed in the primary recrystallization annealing process, and is included in an amount of 0.005 wt % or less in the grain-oriented electrical steel sheet substrate that is finally manufactured after decarburization.
- Nitrogen (N) is an element that reacts with Al and the like to refine crystal grains. When these elements are properly distributed, as described above, it can be helpful to ensure an appropriate primary recrystallization grain size by appropriately fine-graining the structure after cold rolling as described above. However, if the content is excessive, the primary recrystallized grains are excessively refined, and as a result, the driving force that causes grain growth during secondary recrystallization is increased due to the fine grains, so that grains in an undesirable orientation may be grown. In addition, if the N content is excessive, it is not preferable because it takes a lot of time to remove it in the final annealing process. Therefore, the upper limit of the nitrogen content may be 0.005% by weight.
- the amount of nitrogen may increase due to quenching in the primary recrystallization process, and in this case, since it is removed again in the secondary recrystallization annealing process, the nitrogen content in the slab and the final grain-oriented electrical steel sheet substrate 10 may be the same.
- the sulfur (S) content is more than 0.005 wt%, it is re-dissolved and finely precipitated when the hot-rolled slab is heated, thereby reducing the size of the primary recrystallization grains and lowering the secondary recrystallization starting temperature to deteriorate the magnetism.
- the productivity of the grain-oriented electrical steel sheet is reduced.
- the S content is as low as 0.005% or less, since the initial grain size before cold rolling has an effect of coarsening, the number of grains having ⁇ 110 ⁇ 001> orientation nucleated in the strain band in the primary recrystallization process is increased. Therefore, in order to reduce the size of the secondary recrystallized grains to improve the magnetism of the final product, the S content is preferably 0.005 wt% or less.
- the remainder contains Fe and unavoidable impurities.
- An unavoidable impurity is an element that is unavoidably added in the steelmaking and grain-oriented electrical steel sheet manufacturing process, and since it is widely known, the unavoidable description will be omitted.
- the addition of elements other than the above-described alloy components is not excluded, and may be included in various ways within the scope of not impairing the technical spirit of the present invention. When additional elements are included, they are included by replacing the remainder of Fe.
- the sub-crystal grains 11 are present in the electrical steel sheet substrate 10 .
- the sub-crystal grains 11 are distinguished from the remaining Goth grains except for the sub-crystal grains in that the crystal orientation forms an angle of 1° to 15° from ⁇ 110 ⁇ ⁇ 001>.
- the Goss grain has a crystal orientation of less than 1° from ⁇ 110 ⁇ ⁇ 001>.
- the crystal orientation is indicated by a Miller index.
- the sub-crystal grains 11 are located below the pores 31 . Specifically, sub-crystal grains 11 are present in a region (A) within 1500 ⁇ m in the RD direction from the pore center and in a region (B) of 50 to 100 ⁇ m in an internal direction from the surface of the electrical steel sheet substrate. In FIG. 1, positions defined by regions A and B are indicated by dotted rectangles. Specifically, all regions of the sub-crystal grains 11 may be included in positions defined by regions A and B. In an embodiment of the present invention, the sub-crystal grains 11 are present only in the above-described region, and the sub-crystal grains 11 are not present in the remaining portions.
- the magnetism can be improved by suppressing the sub-crystal grains 11 .
- the area fraction of the sub-crystal grains in the ND section may be 5% or less. When the area fraction of the sub-crystal grains 11 is too large, the magnetism is deteriorated due to this. More specifically, the area fraction of the sub-crystal grains in the ND section may be 0.1 to 5%. More specifically, it may be 1 to 3%.
- the ND cross section means a plane perpendicular to the ND direction.
- the sub-crystal grains 11 have a grain size of 1 to 500 nm, and can be distinguished from the rest of the Goss grains even by the grain size.
- the average particle diameter of the goth grains excluding the sub grains may be 5 to 100 mm. At this time, it is the grain size in the ND cross section of the crystal grain. More specifically, the grain diameter of the sub-crystal grains 11 may be 10 to 250 nm, and the average grain size of the goth grains excluding the sub-crystal grains may be 10 to 50 mm.
- the ratio (LS / L G ) of the average particle diameter (LS ) of the sub crystal grains to the average particle diameter ( L G ) of the Goss crystal grains on the ND plane may be 0.20 or less. More specifically, it may be 0.10 or less.
- the particle diameter means the diameter of a virtual circle having the same area as the corresponding area.
- the electrical steel sheet substrate 10 may have a residual stress in the RD direction of 1 to 50 MPa.
- the reason that the residual stress in this range exists is because of the base coating layer 20 and the insulating coating layer 30 present on the electrical steel sheet substrate 10 .
- the electrical steel sheet substrate 10 may have a residual stress in the RD direction of 16.0 to 30.0 MPa.
- the residual stress of the electrical steel sheet substrate 10 can be obtained as a value that makes the sum of residual stresses with the fine grain interface layer 12 , the base coating layer 20 , and the insulating coating layer 30 to be described later equal to zero.
- the fine-grained interfacial layer 12 may be present from the surface of the electrical steel sheet substrate 10 to the interior direction of the electrical steel sheet substrate.
- the fine grain interface layer 12 may have an average grain size of 0.1 to 5 ⁇ m.
- the fine grain interface layer 12 is formed due to the influence of non-uniform surface energy.
- the thickness of the fine-grained interfacial layer 12 may be 0.1 to 5 ⁇ m. If the fine grain crystal layer 12 is too thick, it is advantageous to decrease the thickness by degrading the magnetism. More specifically, the thickness of the fine-grained interfacial layer 12 may be 0.5 to 3 ⁇ m.
- the fine grain interface layer 12 may have a residual stress in the RD direction of -10 to -1000 MPa.
- the negative sign means the stress applied by the fine grain interface layer 12 to the electrical steel sheet substrate 10 .
- the micrograin interface layer 12 may have a residual stress in the RD direction of -100 to -500 MPa. More specifically, the micrograin interface layer 12 may have a residual stress in the RD direction of -400 to -500 MPa.
- the grain-oriented electrical steel sheet 100 may further include a base coating layer 20 positioned between the electrical steel sheet substrate 10 and the insulating coating layer 30 .
- the base coating layer 20 forms a coating layer by reacting the oxide layer formed in the primary recrystallization process with the components in the annealing separator.
- the base coating layer 20 improves the adhesion between the insulating coating layer 30 and the electrical steel sheet substrate 10 , and also imparts insulation to the grain-oriented electrical steel sheet 100 together with the insulating coating layer 30 .
- the base coating layer 20 component is not particularly limited, but when MgO is included in the annealing separator component, forsterite (Mg 2 SiO 4 ) may be included.
- the base coating layer 20 may be omitted if necessary. That is, the electrical steel sheet substrate 10 and the insulating coating layer 30 may be in direct contact.
- the thickness of the base coating layer 20 may be 0.1 to 15 ⁇ m. If the thickness of the base coating layer 20 is too thin, the above-described insulating role and the role of improving adhesion with the insulating coating layer 30 cannot be sufficiently performed. If the base coating layer 20 is too thick, the space factor may be lowered, and adhesion with the insulating coating layer 30 may be deteriorated. More specifically, the thickness of the base coating layer 20 may be 0.5 to 3 ⁇ m.
- the residual stress in the RD direction of the base coating layer 20 may be -50 to -1500 MPa. More specifically, it may be -500 to -1000 MPa. More specifically, it may be -760 to -1000MPa.
- the insulating coating layer 30 is positioned on the electrical steel sheet substrate 10 .
- the insulating coating layer 30 is positioned on the base coating layer 20 .
- the insulating coating layer 30 serves to provide insulation to the grain-oriented electrical steel sheet 100 , and also to improve iron loss by providing tension to the electrical steel sheet substrate 10 .
- the insulating coating layer 30 may be formed of a material capable of imparting insulation to the surface of the electrical steel sheet 100 . Specifically, it may include a phosphate (H 3 PO 4 ).
- the insulating coating layer 30 is formed by applying an insulating coating layer-forming composition including a solvent on a steel sheet and then heat-treating it. At this time, as the solvent volatilizes at a high temperature, some pores 31 are inevitably formed in the insulating coating layer 30 .
- the pores 31 mean a state in which nothing exists in the corresponding part, that is, an empty space.
- the number of pores having a particle diameter of 10 nm or more may be 1 to 300 per 1 mm in the RD direction. More specifically, there may be 1 to 30 pieces per 1 mm.
- the particle size of the pores can be measured based on the ND surface or the TD surface.
- the number of pores can be measured based on the TD plane.
- sub-crystal grains 11 may not exist in the regions A and B under the pores 31, and it is also possible that two or more sub-crystal grains 11 are present. However, the sub-crystal grains 11 other than the regions A and B under the pores 31 may not exist.
- the thickness of the insulating coating layer 30 may be 0.1 to 15 ⁇ m. If the thickness of the insulating coating layer 30 is too thin, the above-described insulating role cannot be sufficiently performed. If the insulating coating layer 30 is too thick, the space factor may be lowered, and adhesion to the steel plate substrate 10 may be deteriorated. More specifically, the thickness of the insulating coating layer 30 may be 1.0 to 5.0 ⁇ m.
- the residual stress in the RD direction of the insulating coating layer 30 may be -10 to -1000 MPa. More specifically, it may be -70 to -500 MPa.
- a method of manufacturing a grain-oriented electrical steel sheet according to an embodiment of the present invention comprises the steps of manufacturing a grain-oriented electrical steel sheet; applying a composition for forming an insulating coating layer on a grain-oriented electrical steel sheet; and heat-treating the grain-oriented electrical steel sheet to form an insulation coating layer-forming composition on the grain-oriented electrical steel sheet.
- the grain-oriented electrical steel sheet may use a grain-oriented electrical steel sheet in which the base coating layer 20 is formed or not, and only the electrical steel sheet substrate 10 is present.
- the grain-oriented electrical steel sheet on which the base coating layer 20 is not formed can be manufactured by various methods, for example, by adjusting the annealing separator component, or after forming the base coating layer 20, it is removed by a physical or chemical method. method can be used.
- a method of manufacturing a grain-oriented electrical steel sheet comprises the steps of: preparing a hot-rolled sheet by hot-rolling a slab; manufacturing a cold-rolled sheet by cold-rolling the hot-rolled sheet; primary recrystallization annealing of the cold-rolled sheet; and performing secondary recrystallization annealing of the cold-rolled sheet on which the primary recrystallization annealing has been completed.
- the slab is Si: 2.0 to 7.0 wt%, Sn: 0.01 to 0.10 wt%, Sb: 0.01 to 0.07 wt%, Al: 0.020 to 0.040 wt%, Mn: 0.01 to 0.20 wt%, C: 0.04 to 0.07 wt%, N: 10 to 50 ppm by weight, S: 0.001 to 0.005% by weight, the remaining Fe and other unavoidable impurities may be included.
- a hot-rolled sheet is manufactured by hot-rolling a slab.
- the slab alloy component is the same as the alloy component of the electrical steel sheet base 10 except for the content of C, the overlapping description will be omitted.
- This step allows partial solutionization of the precipitate.
- coarse growth of the columnar crystal structure of the slab is prevented, thereby preventing cracks from occurring in the width direction of the plate in the subsequent hot rolling process, thereby improving the real rate.
- the furnace may be repaired by melting the surface of the slab and the furnace life may be shortened. More specifically, it is possible to heat the slab to 1130 to 1200 °C. Without heating the slab, it is also possible to hot-roll the continuously cast slab as it is.
- a hot-rolled sheet having a thickness of 1.8 to 2.3 mm may be manufactured by hot rolling.
- the method may further include annealing the hot-rolled sheet.
- the step of annealing the hot-rolled sheet may be performed by heating to a temperature of 950 to 1,100°C, cracking at a temperature of 850 to 1,000°C, and then cooling.
- the hot-rolled sheet is cold-rolled to manufacture a cold-rolled sheet.
- Cold rolling may be performed through one-time strong cold rolling, or may be performed through a plurality of passes. It gives a pass aging effect through warm rolling at a temperature of 200 to 300° C. at least once during rolling, and may be manufactured to a final thickness of 0.14 to 0.25 mm.
- the cold-rolled cold-rolled sheet is subjected to decarburization and recrystallization of the deformed tissue during the primary recrystallization annealing process, and quenching treatment through quenching gas.
- the cold-rolled sheet is subjected to primary recrystallization annealing.
- the primary recrystallization annealing step may be performed at a temperature of 800 to 900 °C. If the temperature is too low, the primary recrystallization may not be made, or the quenching may not be made smoothly. If the temperature is too high, the primary recrystallization grows too large, which may cause inferior magnetism.
- oxidation capacity (PH 2 O/PH 2 ) may be performed in an atmosphere of 0.5 to 0.7.
- the steel sheet may contain carbon in an amount of 0.005 wt% or less, and more specifically, 0.003 wt% or less.
- an annealing separator is applied to the cold-rolled sheet on which the primary recrystallization annealing has been completed, and secondary recrystallization annealing is performed.
- the annealing separator various separators may be used.
- an annealing separator containing MgO as a main component may be applied.
- the base coating layer 20 including forsterite is formed.
- the purpose of secondary recrystallization annealing is to form a ⁇ 110 ⁇ 001> texture by secondary recrystallization and to remove impurities that impair magnetic properties.
- a mixed gas of nitrogen and hydrogen is maintained to protect nitride, which is a grain growth inhibitor, so that secondary recrystallization develops well, and after the secondary recrystallization is completed, 100 % It can be maintained for a long time in a hydrogen atmosphere to remove impurities.
- a planarization annealing process may be included.
- the insulating coating layer forming composition is applied on the grain-oriented electrical steel sheet.
- the composition for forming an insulating coating layer may be used in various ways, and is not particularly limited.
- a composition for forming an insulation coating layer including a phosphate may be used.
- the grain-oriented electrical steel sheet is heat-treated to form an insulating coating layer on the grain-oriented electrical steel sheet.
- the solvent volatilizes at a high temperature during the heat treatment process, some pores 31 are inevitably formed in the insulating coating layer 30 . At this time, the stress applied to the steel sheet is concentrated in the lower portion of the pores 31, so that the sub-crystal grains 11 are formed. In one embodiment of the present invention, the formation of the sub-crystal grains 11 is suppressed as much as possible by adjusting the tension applied to the steel sheet in the process of forming the insulating coating layer.
- the tension applied to the steel sheet in the step of forming the insulating coating layer is 0.20 to 0.70 kgf/mm 2 .
- the tension applied to the steel sheet is too small, scratches may be generated on the surface and a problem may occur due to poor corrosion resistance. If the tension applied to the steel sheet is too large, a large amount of sub-crystal grains 11 are formed, which may adversely affect magnetism. More specifically, it may be 0.20 to 0.50 kgf/mm 2 . More specifically, it may be 0.3 to 0.47 kgf/mm 2 . At this time, the tension is the average tension in the longitudinal direction of the steel sheet measured at the exit side of the heat treatment process.
- the applied tension may be different depending on the longitudinal direction (RD direction) of the steel sheet.
- the residual stress applied to each layer is appropriately controlled by minimizing the difference between the maximum value (MA) and the minimum value (MI) of the tension with respect to the entire length of the steel sheet, and the formation of sub-crystal grains 11 can be suppressed.
- Equation 2 the maximum value (MA) and the minimum value (MI) of the tension satisfy Equation 2 below.
- Equation 2 If Equation 2 is not satisfied and there is a large variation in tension along the longitudinal direction (RD direction) of the steel sheet, the local non-uniformity increases and the residual stress is not properly controlled, and a large amount of sub-crystal grains 11 are formed.
- the speed of the bridle roll control and the heart roll method can be used to control
- the bridle roll control is a method of controlling feedback tension by following a value of a tension meter. More specifically, it is a method of controlling the speed of the bridle roll in order to reduce the difference between the maximum value and the minimum value of tension.
- the hearth roll control is a method of controlling the bridle roll speed following Feedforward Tension.
- the speed of the hearth roll can be increased and the tension can be adjusted by controlling the tension.
- the difference between the maximum value (MA) and the minimum value (MI) can be reduced while adjusting the tension to a specific range.
- the heat treatment temperature may be 550 to 1100 °C. At the above-described temperature, the pores 31 are small, and the residual stress of the insulating coating layer 30 may be appropriately applied.
- Si 3.4 wt%, Sn: 0.05 wt%, Sb: 0.02 wt%, Al: 0.02 wt%, Mn: 0.10 wt%, C: 0.05 wt%, N: 0.002 wt%, and S: 0.001 wt%
- the remaining components were vacuum melted steel containing the remainder Fe and other unavoidably contained impurities to make an ingot, then heated at 1150 ° C. for 210 minutes, and then hot rolled to prepare a 2.0 mm thick hot-rolled sheet. After pickling, it was cold rolled to a thickness of 0.220 mm.
- the cold-rolled sheet is maintained in a wet atmosphere of 50v% hydrogen and 50v% nitrogen and an ammonia mixed gas atmosphere at a temperature of about 800 to 900°C, so that the carbon content is 30ppm or less and the total nitrogen content is increased by 130ppm or more. It was heat-treated.
- MgO an annealing separator
- final annealing was performed in a coil shape.
- the final annealing was carried out in a mixed atmosphere of 25 v% nitrogen and 75 v% hydrogen until 1200°C, and after reaching 1200°C, it was maintained in a 100% hydrogen atmosphere for 10 hours or more, followed by furnace cooling.
- An insulating coating layer-forming composition containing phosphate and silica was applied to the steel sheet, and heat treatment was performed at a temperature of about 820° C. for 2 hours to form an insulating coating layer.
- the pores, sub-crystal grains, and other grain characteristics of the prepared grain-oriented electrical steel sheet are summarized in Table 1, and the properties and iron loss of the interfacial layer, base coating layer, and insulating coating layer are summarized in Table 2.
- the sub-grain fraction was measured with respect to the volume per unit area by electron backscattering diffraction (EBSD) method.
- EBSD electron backscattering diffraction
- the iron loss and magnetic flux density were measured immediately after the formation of the insulating coating layer and after heat treatment at 820° C. assuming stress relief annealing for 2 hours.
- the iron loss was measured under the conditions of 1.7 Tesla and 50 Hz using the single sheet measurement method.
- the magnetic flux density induced in a magnetic field of 800A/m was measured.
- the residual stress of the insulating coating layer was measured using a 3D curvature measuring device (ATOS core 45). It was measured by removing only the insulating coating layer on one side and measuring the amount of warpage of the steel sheet.
- Insulation was measured on the top of the coating using a Franklin measuring instrument according to ASTM A717 international standard.
- Corrosion resistance indicates the area of rust generated on the surface under conditions of 35°C, 5% NaCL, and 8 hours according to the JIS Z2371 international standard.
- the diagram below is a method of calculating film tension using the radius of curvature (Reference M. Bielawski et all., Surf. & Coat. Techno., 200 (2006) 2987).
- the film tension can be calculated from the measured image using software dedicated to the 3D scanner.
- the R value for the specimen before (R2) and after (R1) removal of the phosphate coating layer can be measured.
- the residual stresses of the base coating layer and the fine-grained interfacial layer were measured using a radiation XRD instrument.
- the X-ray residual stress measures the peak shift according to the tilting angle ⁇ . Therefore, the X-ray residual stress calculation follows the sin2 ⁇ method and can be expressed as the following formula.
- Example 1 1.4 -480 1.1 -914 1.9 -325 220 20.6
- Example 2 1.4 -477 1.1 -895 1.9 -312 220 2.01
- Example 3 1.4 -441 1.1 -868 1.9 -267 220 18.6
- Example 4 1.4 -414 1.1 -867 1.9 -272 220 18.4
- Example 5 1.4 -481 1.1 -858 1.9 -169 220 17.4
- Example 6 1.4 -467 1.1 -870 1.9 -149 220 16.9
- Example 7 1.4 -454 1.1 -853 1.9 -94 220 15.7
- Example 8 1.4 -454 1.1 -853 1.9 -94 220 15.7
- Example 8 1.4 -454 1.1 -853 1.9 -94 220 15.7
- Example 8 1.4 -454 1.1 -853 1.9 -94 220 15.7
- Example 8 1.4 -454 1.1 -853 1.9 -94 220 15.7
- Example 1 Iron loss (W17/50, W/kg) Magnetic flux density (B8, T) Insulation (mA) corrosion resistance
- Example 1 0.735 1.935 35 - Example 2 0.739 1.935 55 - Example 3 0.752 1.934 30 - Example 4 0.753 1.935 35 - Example 5 0.76 1.933 42 - Example 6 0.761 1.932 32 - Example 7 0.772 1.928 55 - Example 8 0.77 1.93 55 - Example 9 0.782 1.927 42 0.7 Comparative Example 1 0.847 1.921 95 5.5 Comparative Example 2 0.844 1.922 360 8.2 Comparative Example 3 0.843 1.923 277 7.7 Comparative Example 4 0.912 1.915 345 9 Comparative Example 5 0.998 1.88 678 15 Comparative Example 6 1.052 1.876 850 42.3
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Abstract
Description
출측 장력 | 식 2 만족 여부 | 서브 결정립 면적 분율(%) | |
(kgf/mm2) | |||
실시예 1 | 0.20 | O | 0.01 |
실시예 2 | 0.34 | O | 0.01 |
실시예 3 | 0.42 | O | 0.06 |
실시예 4 | 0.44 | O | 0.22 |
실시예 5 | 0.46 | O | 0.03 |
실시예 6 | 0.48 | O | 0.17 |
실시예 7 | 0.58 | O | 0.50 |
실시예 8 | 0.60 | O | 1.12 |
실시예 9 | 0.70 | O | 1.21 |
비교예 1 | 0.55 | X | 8.82 |
비교예 2 | 0.10 | O | 9.10 |
비교예 3 | 0.77 | O | 9.05 |
비교예 4 | 0.86 | O | 11.52 |
비교예 5 | 0.95 | O | 22.30 |
비교예 6 | 0.70 | X | 33.50 |
미세립 계면층 평균 결정립경 2.5㎛ |
베이스 코팅층 | 절연 코팅층 | 강판 기재 | |||||
두께 (㎛) |
RD 방향 잔류 응력 (MPa) |
두께 (㎛) |
RD 방향 잔류 응력 (MPa) |
두께 (㎛) |
RD 방향 잔류 응력 (MPa) |
두께 (㎛) |
RD 방향 잔류 응력 (MPa) |
|
실시예 1 | 1.4 | -480 | 1.1 | -914 | 1.9 | -325 | 220 | 20.6 |
실시예 2 | 1.4 | -477 | 1.1 | -895 | 1.9 | -312 | 220 | 2.01 |
실시예 3 | 1.4 | -441 | 1.1 | -868 | 1.9 | -267 | 220 | 18.6 |
실시예 4 | 1.4 | -414 | 1.1 | -867 | 1.9 | -272 | 220 | 18.4 |
실시예 5 | 1.4 | -481 | 1.1 | -858 | 1.9 | -169 | 220 | 17.4 |
실시예 6 | 1.4 | -467 | 1.1 | -870 | 1.9 | -149 | 220 | 16.9 |
실시예 7 | 1.4 | -454 | 1.1 | -853 | 1.9 | -94 | 220 | 15.7 |
실시예 8 | 1.4 | -427 | 1.1 | -833 | 1.9 | -82 | 220 | 14 |
실시예 9 | 1.4 | -415 | 1.1 | -780 | 1.9 | -77 | 220 | 14.2 |
비교예 1 | 1.4 | -247 | 1.1 | -523 | 1.9 | -37 | 220 | 8.8 |
비교예 2 | 1.4 | -345 | 1.1 | -752 | 1.9 | -55 | 220 | 9.7 |
비교예 3 | 1.4 | -315 | 1.1 | -524 | 1.9 | -45 | 220 | 9.9 |
비교예 4 | 1.4 | -245 | 1.1 | -447 | 1.9 | -26 | 220 | 7.9 |
비교예 5 | 1.4 | -194 | 1.1 | -398 | 1.9 | -7 | 220 | 6.4 |
비교예 6 | 1.4 | -190 | 1.1 | -225 | 1.9 | -6 | 220 | 4.7 |
철손(W17/50, W/kg) | 자속밀도(B8, T) | 절연(mA) | 내식성 | |
실시예 1 | 0.735 | 1.935 | 35 | - |
실시예 2 | 0.739 | 1.935 | 55 | - |
실시예 3 | 0.752 | 1.934 | 30 | - |
실시예 4 | 0.753 | 1.935 | 35 | - |
실시예 5 | 0.76 | 1.933 | 42 | - |
실시예 6 | 0.761 | 1.932 | 32 | - |
실시예 7 | 0.772 | 1.928 | 55 | - |
실시예 8 | 0.77 | 1.93 | 55 | - |
실시예 9 | 0.782 | 1.927 | 42 | 0.7 |
비교예 1 | 0.847 | 1.921 | 95 | 5.5 |
비교예 2 | 0.844 | 1.922 | 360 | 8.2 |
비교예 3 | 0.843 | 1.923 | 277 | 7.7 |
비교예 4 | 0.912 | 1.915 | 345 | 9 |
비교예 5 | 0.998 | 1.88 | 678 | 15 |
비교예 6 | 1.052 | 1.876 | 850 | 42.3 |
Claims (12)
- Si: 2.0 내지 7.0 중량%, 및 Sb: 0.01 내지 0.07 중량% 포함하고, 잔부 Fe 및 기타 불가피한 불순물을 포함하는 전기강판 기재;상기 전기강판 기재 상에 위치하는 절연 코팅층을 포함하고,상기 절연 코팅층은 입경 10nm 이상의 기공을 포함하고,상기 전기강판 기재는 상기 기공 중심으로부터 RD 방향으로 1500㎛ 이내 영역(A) 및 상기 전기강판 기재 표면으로부터 상기 전기강판 기재 내부 방향으로 50 내지 100㎛ 영역(B)에 서브 결정립이 존재하고,상기 서브 결정립은 결정 방위가 {110} <001>로부터 1° 내지 15° 각도를 이루고,ND 단면에서의 상기 서브 결정립의 면적분율이 5% 이하인 방향성 전기강판.
- 제1항에 있어서,상기 서브 결정립은 ND 방향의 결정립 길이(z)에 대한 TD 방향의 결정립 길이(y)의 비율(y/z)이 1.5 이하인 방향성 전기강판.
- 제1항에 있어서,상기 전기강판 기재 표면으로부터 상기 전기강판 기재 내부 방향으로 50 내지 100㎛ 영역(B)에 결정 방위가 {110} <001>로부터 1° 미만인 고스 결정립을 포함하고,ND 단면에서의 상기 고스 결정립의 평균 입경(LG)에 대한 서브 결정립의 평균 입경(LS)의 비율(LS/LG)이 0.20 이하인 방향성 전기강판.
- 제1항에 있어서,상기 전기강판 표면으로부터 상기 전기강판 기재 내부 방향으로 미세립 계면층이 존재하고,미세립 계면층은 평균 결정립경이 0.1 내지 5㎛인 방향성 전기강판.
- 제4항에 있어서,상기 미세립 계면층은 RD 방향 잔류 응력이 -10 내지 -1000MPa인 방향성 전기강판.
- 제4항에 있어서,상기 미세립 계면층의 두께는 0.1 내지 5㎛인 방향성 전기강판.
- 제1항에 있어서,상기 전기강판 기재 및 상기 절연 코팅층 사이에 베이스 코팅층을 더 포함하는 방향성 전기강판.
- 제7항에 있어서,상기 베이스 코팅층의 RD 방향 잔류 응력이 -50 내지 -1500MPa인 방향성 전기강판.
- 제7항에 있어서,상기 베이스 코팅층의 두께는 0.1 내지 15㎛인 방향성 전기강판.
- 제1항에 있어서,상기 절연 코팅층의 RD 방향 잔류 응력이 -10 내지 -1000MPa인 방향성 전기강판.
- 제1항에 있어서,상기 절연 코팅층의 두께는 0.1 내지 15㎛인 방향성 전기강판.
- 제1항에 있어서,상기 전기강판 기재는 RD 방향 잔류 응력이 1 내지 50MPa인 방향성 전기강판.
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