WO2022137503A1 - Package - Google Patents

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Publication number
WO2022137503A1
WO2022137503A1 PCT/JP2020/048716 JP2020048716W WO2022137503A1 WO 2022137503 A1 WO2022137503 A1 WO 2022137503A1 JP 2020048716 W JP2020048716 W JP 2020048716W WO 2022137503 A1 WO2022137503 A1 WO 2022137503A1
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WO
WIPO (PCT)
Prior art keywords
region
package
mounting
convex portion
frame
Prior art date
Application number
PCT/JP2020/048716
Other languages
French (fr)
Japanese (ja)
Inventor
淳 間瀬
Original Assignee
Ngkエレクトロデバイス株式会社
日本碍子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Ngkエレクトロデバイス株式会社, 日本碍子株式会社 filed Critical Ngkエレクトロデバイス株式会社
Priority to JP2022570946A priority Critical patent/JPWO2022137503A5/en
Priority to PCT/JP2020/048716 priority patent/WO2022137503A1/en
Publication of WO2022137503A1 publication Critical patent/WO2022137503A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals

Definitions

  • the present invention relates to a package, particularly to a package for electronic components.
  • CMOS complementary, metal, oxide, and semiconductor
  • an image pickup unit having an airtightly sealed solid-state image pickup device for example, an electronic component referred to as a “CMOS / CCD package”
  • the unit typically has a solid-state image sensor, a ceramic package having a cavity for accommodating the solid-state image sensor, and a lid for sealing the cavity.
  • Patent Document 1 discloses a solid-state image sensor.
  • the solid-state image sensor is mounted on a wiring board, a solid-state image sensor having an electrode portion for electrically connecting to the wiring board, and formed around a light receiving portion of the solid-state image sensor. It has a bonded portion and a translucent lid portion that faces the light receiving portion and is bonded via the bonding portion so that a gap is formed between the light receiving portion and the light receiving portion.
  • the electrode portion is arranged outside the adhesive portion. In the solid-state image sensor, the region inside the bonded portion is curved toward the wiring board. The region where the electrode portion is formed is flat.
  • a recess is formed on the mounting surface of the solid-state image sensor in the wiring board.
  • the area inside the adhesive portion is curved along the concave portion.
  • an adhesive portion for adhering the solid-state image sensor and the translucent lid portion is formed around the light receiving portion of the solid-state image sensor. Further, the region inside the adhesive portion of the solid-state image sensor is curved toward the wiring board, and becomes a curved portion. This makes it possible to alleviate defects (out of focus, shading, etc.) that occur at the four corners of the captured image.
  • Patent Document 2 discloses a package for mounting electronic components.
  • the package for electronic components is provided with a substrate having one main surface and another main surface, a substrate provided on the one main surface and having an arcuate concave portion in a vertical cross-sectional view, and a curved electronic component provided in the concave portion. It has a curved electronic component mounting unit.
  • the substrate has a notch on the other main surface so as to overlap the curved electronic component mounting portion when viewed in a plane from the side of the one main surface.
  • the curved electronic component mounting portion is an arc-shaped recess
  • the behavior in thermal expansion or contraction between the curved electronic component mounting portion and the flat portion around the curved electronic component mounting portion, or The direction of stress is different. Therefore, stress is applied to the boundary between the curved electronic component mounting portion and the flat portion around the curved electronic component mounting portion, and there is a concern that the substrate may be deformed, cracked, or cracked.
  • Patent Document 2 even when the package for mounting an electronic component undergoes thermal expansion or thermal contraction, the stress of thermal expansion or thermal contraction from the curved electronic component mounting portion due to the notch is provided. Can be relaxed and absorbed. Therefore, it is possible to reduce the stress applied to the boundary between the curved electronic component mounting portion and the flat portion around the curved electronic component mounting portion, and to reduce the deformation, cracks, or cracks of the substrate.
  • the thickness of the substrate (base portion) may be excessively thin in the notch. Therefore, there is a concern about warpage of the substrate portion due to thermal expansion and contraction.
  • the present invention has been made to solve such a problem, and an object of the present invention is to provide a package capable of suppressing the misalignment of electronic components while relaxing the internal stress of the substrate portion. be.
  • a package according to one aspect of the invention has a cavity that will be sealed by a lid and is surrounded by a frame area surrounding the cavity and a frame area in a planar layout perpendicular to the thickness direction. It has a peripheral area and a mounting area surrounded by the peripheral area and where at least a part of electronic components is arranged.
  • the package has a frame body portion and a substrate portion.
  • the frame body portion is arranged in the frame body region, surrounds the cavity, and has a mounting surface to which the lid body is mounted.
  • the substrate portion is made of ceramics, supports the frame body portion in the frame body region, and has a first surface facing the cavity in the peripheral region and the mounting region, and a second surface opposite to the first surface. ing.
  • the first surface has a first concave portion in the mounting region and a first convex portion in the peripheral region with respect to the first reference surface perpendicular to the thickness direction.
  • the second surface has a second convex portion in the mounting region and a second concave portion in the peripheral region with respect to the second reference surface perpendicular to the thickness direction.
  • the first recess on the first surface may have a first depth dimension of 15 ⁇ m or more.
  • the second convex portion of the second surface may have a first height dimension of 15 ⁇ m or more.
  • the second recess on the second surface may have a second depth dimension of 15 ⁇ m or more.
  • the first convex portion of the first surface may have a second height dimension of 15 ⁇ m or more.
  • At least a part of the second surface in the frame region is arranged at a position protruding to the same degree or more as compared with the position reached by the second convex portion of the second surface protruding. good.
  • the board portion may have a uniform thickness in the mounting area and the peripheral area.
  • the electronic component can be supported on the first recess on the first surface in the mounting area. Further, since the second surface has the second recess in the peripheral region, the internal stress of the substrate portion can be relaxed. Further, the second convex portion and the first convex portion cancel each of the influences of the first concave portion and the second concave portion with respect to the thickness of the substrate portion at least to some extent. This prevents the substrate portion from having a locally excessively thin portion. Therefore, the warp of the substrate portion in the excessively thin portion due to the thermal expansion and contraction is suppressed. Therefore, it is possible to suppress the misalignment of the electronic component due to the warp. From the above, it is possible to suppress the misalignment of electronic components while relaxing the internal stress of the substrate portion.
  • At least a part of the second surface in the frame region is arranged at a position protruding to the same degree or more as compared with the position reached by the second convex portion of the second surface protruding. good.
  • the frame region of the second surface is stably supported without being hindered by the second convex portion of the second surface.
  • the board portion may have a uniform thickness in the mounting area and the peripheral area. In this case, the warp of the substrate portion due to thermal expansion and contraction can be more sufficiently suppressed.
  • FIG. 3 is a cross-sectional view schematically showing the configuration of the electronic device of FIG.
  • FIG. 3 is a cross-sectional view schematically showing the structure of a package included in the electronic device of FIG. 2. It is a top view which shows the structure of the package of FIG. 3 schematically. It is a top view which shows the structure of the substrate part which the package of FIG. 4 has.
  • FIGS. 2 to 5 an XYZ Cartesian coordinate system is shown in order to make it easier to understand the relationship of directions between the drawings.
  • FIG. 1 is a schematic diagram schematically showing the configuration of the electronic device 900 according to the present embodiment.
  • the electronic device 900 (FIG. 1) includes a package 800 having a cavity CV, an electronic component 902 sealed in the cavity CV, a bonding wire 901 (connecting member), and a lid 907.
  • other connecting members may be used together with or in place of the bonding wire 901.
  • the electronic component 902 may be a solid-state image sensor.
  • the solid-state image sensor is, for example, CMOS as shown in FIG.
  • CMOS is generally particularly excellent as a solid-state image sensor having a large image pickup unit as required for a single-lens reflex camera, some surveillance cameras, industrial cameras, and the like.
  • the lid body 907 is mounted on the mounting surface SF of the frame body portion 820, whereby the cavity CV of the package 800 is sealed. This attachment may be performed using, for example, an adhesive layer 906.
  • the adhesive layer 906 is made of, for example, a resin adhesive.
  • the package 800 has an internal terminal 831 provided inside the cavity CV, an external terminal 832 provided outside the cavity CV, and a through wiring 830 for connecting the internal terminal 831 and the external terminal 832 to each other. There is. In order to obtain the connection, the through wiring 830 penetrates the package 800 between the inside of the cavity CV and the outside of the cavity CV.
  • the electronic component 902 has an electrode terminal 902P.
  • the bonding wire 901 connects the internal terminal 831 of the package 800 and the electrode terminal 902P of the electronic component 902 to each other.
  • FIG. 2 is a cross-sectional view schematically showing the configuration of the electronic device 900 according to the present embodiment.
  • 3 and 4 are cross-sectional views and plan views schematically showing the configuration of the package 800 included in the electronic device 900 (FIG. 2), and the cross-sectional view of FIG. 3 is along lines III-III (FIG. 4).
  • FIG. 5 is a plan view schematically showing the configuration of the substrate portion 810 included in the package 800 (FIG. 4).
  • Package 800 has a cavity CV that will be sealed by a lid 907.
  • the package 800 is surrounded by a frame region R3 surrounding the cavity CV, a peripheral region R2 surrounded by the frame region R3, and a peripheral region R2 in a plane layout (XY plane layout) perpendicular to the thickness direction (Z direction). It has a mounting area R1.
  • the package 800 has a frame body portion 820 and a substrate portion 810 made of ceramics.
  • the frame body portion 820 may also be made of ceramics, and in that case, the boundary between the substrate portion 810 and the frame body portion 820 may be virtual.
  • the material of the frame portion 820 is not particularly limited, and may be ceramics, resin, metal, or a composite material of two or more of these.
  • the through wiring 830 penetrates a configuration including a substrate portion 810 and a frame portion 820, and may be configured by, for example, at least one of an internal electrode layer and a via wiring.
  • the frame body portion 820 is arranged in the frame body region R3 and surrounds the cavity CV.
  • the frame body portion 820 has a mounting surface SF to which the lid body 907 is mounted.
  • the substrate portion 810 supports the frame body portion 820 in the frame body region R3.
  • the substrate portion 810 has a first surface S1 facing the cavity CV in the peripheral region R2 and the mounting region R1, and a second surface S2 opposite to the first surface S1.
  • the mounting area R1 is an area in which at least a part of the electronic component 902 is to be arranged.
  • the electronic component 902 is arranged over the mounting region R1 and a part of the peripheral region R2.
  • the electronic component 902 (FIG. 2) will be mounted on the first surface S1 (FIG. 3) of the substrate portion 810. This attachment may be performed, for example, using an adhesive layer (not shown).
  • the adhesive layer is made of, for example, a resin adhesive.
  • the electrode terminal 902P of the electronic component 902 (not shown in FIG. 2, see FIG. 1) and the internal terminal 831 of the package 800 (not shown in FIG. 2, see FIG. 1) are connected by a bonding wire 901 (FIG. 2).
  • the internal terminal 831 of the package 800 (not shown in FIG. 2, see FIG. 1) is arranged on the stepped portion SB provided in the frame body portion 820.
  • the step portion SB is provided in the middle portion of the frame body portion 820 in the thickness direction (Z direction).
  • the planar layout (XY plane layout) of the electronic component 902 may have a size including a rectangle having a long side of 10 mm or more, for example, a size including a square having a side of 10 mm or more. ..
  • the electronic component 902 is a solid-state image sensor, a relatively large size is often required in terms of image pickup performance as described above.
  • the size and type of the electronic component 902 are not particularly limited.
  • the outer edge of the peripheral region R2 has a size including a rectangle having a long side of 10 mm or more.
  • the outer edge of the peripheral region R2 is a rectangle having a long side of 10 mm or more.
  • the outer edge may have a size including a square having a side of 10 mm or more.
  • a square is a kind of rectangle by definition in geometry.
  • the first surface S1 has a first concave portion C1 in the mounting region R1 and a first convex portion V1 in the peripheral region R2 with respect to the first reference surface PL1.
  • the second surface S2 has a second convex portion V2 in the mounting region R1 and a second concave portion C2 in the peripheral region R2 with respect to the second reference surface PL2.
  • Each of the first reference plane PL1 and the second reference plane PL2 is substantially perpendicular to the thickness direction (Z direction). In other words, each of the first reference plane PL1 and the second reference plane PL2 is substantially parallel to the horizontal plane (XY plane).
  • each of the first concave portion C1 and the first convex portion V1 has one end and the other end (left end and right end in the figure) reaching the first reference plane PL1. Further, each of the second convex portion V2 and the second concave portion C2 has one end and the other end (left end and right end in the figure) reaching the second reference surface PL2.
  • the first concave portion C1 at least partially overlaps with the second convex portion V2 and is preferably included.
  • the second concave portion C2 at least partially overlaps with the first convex portion V1 and is preferably included.
  • the first reference plane PL1 is a plane parallel to the approximate plane of the first plane S1 in the mounting region R1 and the peripheral region R2.
  • the approximate plane may be calculated by fitting the plane to the surface profile of the first surface S1 in the mounting area R1 and the peripheral area R2. Measurement of the surface profile may be made optically.
  • the height position (position in the Z direction) of the first reference surface PL1 may be appropriately selected so that the above-mentioned first concave portion C1 and first convex portion V1 can be defined.
  • the second reference plane PL2 is a plane parallel to the approximate plane of the second plane S2 in the mounting region R1, the peripheral region R2, and the frame region R3.
  • the approximate plane may be calculated by fitting the plane to the surface profile of the second surface S2 in the mounting region R1, the peripheral region R2, and the frame region R3. Measurement of the surface profile may be made optically.
  • the height position (position in the Z direction) of the second reference surface PL2 may be appropriately selected so that the above-mentioned second concave portion C2 and second convex portion V2 can be defined.
  • the substrate portion 810 has a first concave portion C1, a first convex portion V1, a second convex portion V2, and a second concave portion C2 in a surface profile along at least one of the lines CS1 to CS3 (FIG. 5). ..
  • the substrate portion 810 in the plane layout (XY plane layout), has a rectangular shape, the line CS1 is parallel to the long side, and the line CS2 is parallel to the short side. , Line CS3 is parallel to the diagonal. It is preferable that each of the lines CS1 to CS3 passes through the center of the rectangle.
  • the substrate portion 810 has a first concave portion C1, a first convex portion V1, a second convex portion V2 and a second concave portion C2 in a surface profile along at least one of the line CS1 and the line CS3.
  • the configuration in which the substrate portion 810 has the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 in the surface profile along the line CS1 is along the long side direction. Suitable for stress relaxation.
  • the configuration in which the substrate portion 810 has the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 in the surface profile along the line CS2 is such that the first concave portion C1, the first convex portion V1, and the second concave portion C2 are provided along the short side direction. Suitable for stress relaxation.
  • the configuration in which the substrate portion 810 has the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 in the surface profile along the line CS3 is such that the stress is along the diagonal direction. Suitable for relaxation.
  • the substrate portion 810 has a square shape in the plane layout (XY plane layout), the above description is understood by replacing the long side with one side.
  • the first recess C1 of the first surface S1 has a first depth dimension of 15 ⁇ m or more.
  • the second convex portion V2 of the second surface S2 has a first height dimension of 15 ⁇ m or more.
  • the second recess C2 of the second surface S2 has a second depth dimension of 15 ⁇ m or more.
  • the first convex portion V1 of the first surface S1 has a second height dimension of 15 ⁇ m or more.
  • the first recess C1 of the first surface S1 preferably has a first depth dimension of 80 ⁇ m or less.
  • the second convex portion V2 of the second surface S2 preferably has a first height dimension of 80 ⁇ m or less.
  • the second recess C2 of the second surface S2 preferably has a second depth dimension of 80 ⁇ m or less.
  • the first convex portion V1 of the first surface S1 preferably has a second height dimension of 80 ⁇ m or less.
  • At least a part of the second surface S2 in the frame region R3 is equal to or more than the position reached by the second convex portion V2 of the second surface S2 protruding. It is preferably arranged in a protruding position.
  • the second surface is compared to the position reached by the second convex portion V2 of the second surface S2 protruding in the ⁇ Z direction (downward in FIG. 3). It is preferable that at least a part of S2 in the frame region R3 is arranged at a position protruding to the same extent or more.
  • the second surface S2 in the frame region R3 with reference to the position reached by the second convex portion V2 of the second surface S2 protruding. , It has a portion arranged at a position protruding to the same extent, and does not have a portion arranged at a more protruding position.
  • the second surface S2 is composed of a surface arranged at a position that protrudes to the same extent in the frame body region R3, based on the position reached by the second convex portion V2 of the second surface S2 protruding. , This surface may be a horizontal plane.
  • the frame region of the second surface S2 is compared with the position reached by the second convex portion V2 of the second surface S2 protruding. At least a part of R3 may be arranged in a more protruding position.
  • the second surface is compared to the position reached by the second convex portion V2 of the second surface S2 protruding in the ⁇ Z direction (downward in FIG. 3). At least a part of S2 in the frame region R3 may be arranged at a more protruding position.
  • the thickness of the substrate portion 810 is, for example, about 1 mm.
  • the substrate portion 810 has a uniform thickness in the mounting region R1 and the peripheral region R2 at the cross-sectional position where the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 can be seen as described above. You can do it.
  • the first reference plane PL1 and the second reference plane PL2 so that the distance between the first reference plane PL1 and the second reference plane PL2 in the thickness direction (Z direction) is the same as the above uniform thickness. And can be defined.
  • the first recess C1 and the second recess C2 are arranged so as not to overlap each other.
  • the wording of "uniform thickness” is defined as allowing a thickness distribution of ⁇ 5% in consideration of usual variations in the manufacture of ceramic parts.
  • the thickness of the substrate portion 810 may be measured using a micrometer.
  • the electronic component 902 can be supported on the first recess C1 of the first surface S1 in the mounting region R1 with reference to FIG. Further, since the second surface S2 has the second recess C2 in the peripheral region R2, the internal stress of the substrate portion 810 can be relaxed. Further, the second convex portion V2 and the first convex portion V1 cancel each of the influences of the first concave portion C1 and the second concave portion C2 with respect to the thickness of the substrate portion 810 at least to some extent. This prevents the substrate portion 810 from having a locally excessively thin portion. Therefore, the warp of the substrate portion 810 in the excessively thin portion due to the thermal expansion and contraction is suppressed.
  • At least a part of the second surface S2 in the frame region R3 is equal to or more than the position reached by the second convex portion V2 of the second surface S2 protruding. It may be arranged in a protruding position. In this case, when the package 800 is mounted on another member, the frame body region R3 of the second surface S2 is stably supported without being hindered by the second convex portion V2 of the second surface S2. ..
  • the substrate portion 810 may have a uniform thickness in the mounting region R1 and the peripheral region R2. In this case, the warp of the substrate portion 810 due to thermal expansion and contraction can be more sufficiently suppressed. In addition, the process of forming the substrate portion 810 is simplified.
  • the package 800 (FIG. 3) having both the substrate portion 810 and the frame portion 820 has been described in detail, but as a modification, a ceramic substrate for electronic components is used without the frame portion 820.
  • the substrate portion 810 may be configured.
  • the frame body portion 820 is not provided in the frame body region R3, the frame body region is understood as a surrounding region surrounding the peripheral region.
  • the ceramic substrate can also suppress the misalignment of electronic components while relaxing the internal stress for the reason described in the above embodiment.

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

A package (800) includes, in a plan layout: frame body regions (R3) that include a cavity (CV); peripheral regions (R2) that are surrounded by the frame body regions (R3); and a mounting region (R1) that is surrounded by the peripheral regions (R2). A substrate part (810) of the package (800) is made from a ceramic material, supports a frame body part (820) in the frame body regions (R3), and includes: a first surface (S1) facing the cavity (CV) in the peripheral regions (R2) and the mounting region (R1); and a second surface (S2) opposing the first surface (S1). The first surface (S1) has, with respect to a first reference plane (PL1) vertical to the thickness direction, a first recessed section (C1) in the mounting region (R1) and first protruding sections (V1) in the peripheral regions (R2). The second surface (S2) has, with respect to a second reference plane (PL2) vertical to the thickness direction, a second protruding section (V2) in the mounting region (R1) and second recessed sections (C2) in the peripheral region (R2).

Description

パッケージpackage
 本発明は、パッケージに関し、特に、電子部品用のパッケージに関するものである。 The present invention relates to a package, particularly to a package for electronic components.
 デジタルカメラ、ビデオカメラ、その他の撮像装置には、電荷結合素子(CCD)または相補型・金属・酸化物・半導体(CMOS)などの固体撮像素子が広く用いられている。撮像装置の製造においては、通常、気密封止された固体撮像素子を有する撮像ユニット(例えば、「CMOS/CCDパッケージ」と称される電子部品)がまず準備され、そして撮像ユニットが撮像装置へ搭載される。当該ユニットは、典型的には、固体撮像素子と、固体撮像素子を収容するキャビティを有するセラミックスパッケージと、当該キャビティを封止する蓋体とを有している。 For digital cameras, video cameras, and other image pickup devices, charge-coupled devices (CCDs) or solid-state image pickup devices such as complementary, metal, oxide, and semiconductor (CMOS) are widely used. In the manufacture of an image pickup device, usually, an image pickup unit having an airtightly sealed solid-state image pickup device (for example, an electronic component referred to as a “CMOS / CCD package”) is first prepared, and then the image pickup unit is mounted on the image pickup device. Will be done. The unit typically has a solid-state image sensor, a ceramic package having a cavity for accommodating the solid-state image sensor, and a lid for sealing the cavity.
 特開2012-28620号公報(特許文献1)は固体撮像装置を開示している。固体撮像装置は、配線基板と、上記配線基板上に実装されており、上記配線基板と電気的に接続するための電極部を有する固体撮像素子と、上記固体撮像素子の受光部の周囲に形成された接着部と、上記受光部と対向するとともに受光部との間に空隙が形成されるように接着部を介して接着された透光性蓋部と、を有している。上記電極部は、上記接着部よりも外側に配置されている。上記固体撮像素子は、上記接着部よりも内側の領域が配線基板側に湾曲している。上記電極部が形成された領域が平坦である。上記配線基板における固体撮像素子の実装面に、凹部が形成されている。上記接着部よりも内側の領域が、上記凹部に沿って湾曲している。上記固体撮像素子の受光面を平面視したとき、上記受光部が上記凹部に内接し、上記接着部が上記凹部に外接している。 Japanese Patent Application Laid-Open No. 2012-28620 (Patent Document 1) discloses a solid-state image sensor. The solid-state image sensor is mounted on a wiring board, a solid-state image sensor having an electrode portion for electrically connecting to the wiring board, and formed around a light receiving portion of the solid-state image sensor. It has a bonded portion and a translucent lid portion that faces the light receiving portion and is bonded via the bonding portion so that a gap is formed between the light receiving portion and the light receiving portion. The electrode portion is arranged outside the adhesive portion. In the solid-state image sensor, the region inside the bonded portion is curved toward the wiring board. The region where the electrode portion is formed is flat. A recess is formed on the mounting surface of the solid-state image sensor in the wiring board. The area inside the adhesive portion is curved along the concave portion. When the light receiving surface of the solid-state image sensor is viewed in a plan view, the light receiving portion is inscribed in the recess and the adhesive portion is circumscribed in the recess.
 上記特許文献1によれば、固体撮像素子の受光部の周囲には、固体撮像素子と透光性蓋部とを接着する接着部が形成されている。さらに、固体撮像素子の接着部よりも内側の領域が配線基板側に湾曲し、湾曲部となっている。これにより、撮像された画像の四隅に生じる不具合(ピンぼけ、またはシェーディングなど)を緩和することができる。 According to Patent Document 1, an adhesive portion for adhering the solid-state image sensor and the translucent lid portion is formed around the light receiving portion of the solid-state image sensor. Further, the region inside the adhesive portion of the solid-state image sensor is curved toward the wiring board, and becomes a curved portion. This makes it possible to alleviate defects (out of focus, shading, etc.) that occur at the four corners of the captured image.
 国際公開第2016/098455号(特許文献2)は電子部品実装用パッケージを開示している。電子部品用パッケージは、一主面および他主面と、前記一主面に設けられ、縦断面視で弧状の凹部とを有する基体と、前記凹部に設けられ、湾曲した曲状電子部品が実装される曲状電子部品実装部とを有している。前記基体は、前記一主面の側から平面透視したときに、前記曲状電子部品実装部と重なるように前記他主面に切り欠きを有している。 International Publication No. 2016/098455 (Patent Document 2) discloses a package for mounting electronic components. The package for electronic components is provided with a substrate having one main surface and another main surface, a substrate provided on the one main surface and having an arcuate concave portion in a vertical cross-sectional view, and a curved electronic component provided in the concave portion. It has a curved electronic component mounting unit. The substrate has a notch on the other main surface so as to overlap the curved electronic component mounting portion when viewed in a plane from the side of the one main surface.
 一般的に、曲状電子部品実装部が弧状の凹部となっていることで、曲状電子部品実装部と曲状電子部品実装部の周囲の平坦部との熱膨張または熱収縮における挙動、または応力の方向が異なっている。そのため、曲状電子部品実装部と曲状電子部品実装部の周囲の平坦部との境目にストレスがかかり、基体の変形、クラック、または割れの発生が懸念されている。上記特許文献2の主張によれば、電子部品実装用パッケージが熱膨張または熱収縮を起こした場合においても、切り欠きを有することで、曲状電子部品実装部からの熱膨張または熱収縮の応力を緩和、吸収させることが可能となる。よって、曲状電子部品実装部とその周囲の平坦部との境目にかかるストレスを低減させ、基体の変形、クラック、または割れを低減させることが可能となる。 In general, since the curved electronic component mounting portion is an arc-shaped recess, the behavior in thermal expansion or contraction between the curved electronic component mounting portion and the flat portion around the curved electronic component mounting portion, or The direction of stress is different. Therefore, stress is applied to the boundary between the curved electronic component mounting portion and the flat portion around the curved electronic component mounting portion, and there is a concern that the substrate may be deformed, cracked, or cracked. According to the above-mentioned claim of Patent Document 2, even when the package for mounting an electronic component undergoes thermal expansion or thermal contraction, the stress of thermal expansion or thermal contraction from the curved electronic component mounting portion due to the notch is provided. Can be relaxed and absorbed. Therefore, it is possible to reduce the stress applied to the boundary between the curved electronic component mounting portion and the flat portion around the curved electronic component mounting portion, and to reduce the deformation, cracks, or cracks of the substrate.
特開2012-28620号公報Japanese Unexamined Patent Publication No. 2012-28620 国際公開第2016/098455号International Publication No. 2016/098455
 しかしながら、上記特許文献2に開示されたパッケージにおいては、基体(基板部)の厚みが切り欠きにおいて過度に薄くなり得る。よって、熱膨張収縮に起因しての基板部の反りが懸念される。 However, in the package disclosed in Patent Document 2, the thickness of the substrate (base portion) may be excessively thin in the notch. Therefore, there is a concern about warpage of the substrate portion due to thermal expansion and contraction.
 本発明はこのような課題を解決するためになされたものであり、その目的は、基板部の内部応力を緩和しつつ、電子部品の位置ずれを抑制することができる、パッケージを提供することである。 The present invention has been made to solve such a problem, and an object of the present invention is to provide a package capable of suppressing the misalignment of electronic components while relaxing the internal stress of the substrate portion. be.
 本発明の一の態様に従うパッケージは、蓋体によって封止されることになるキャビティを有しており、厚み方向に垂直な平面レイアウトにおいて、キャビティを囲む枠体領域と、枠体領域に囲まれた周辺領域と、周辺領域に囲まれ、電子部品の少なくとも一部が配置されることになる実装領域と、を有している。パッケージは、枠体部と、基板部とを有している。枠体部は、枠体領域に配置されており、キャビティを囲んでおり、蓋体が取り付けられることになる取付面を有している。基板部は、セラミックスからなり、枠体領域において枠体部を支持しており、周辺領域および実装領域においてキャビティに面する第1面と、第1面と反対の第2面と、を有している。第1面は、厚み方向に垂直な第1基準面に対して、実装領域における第1凹部と、周辺領域における第1凸部と、を有している。第2面は、厚み方向に垂直な第2基準面に対して、実装領域における第2凸部と、周辺領域における第2凹部と、を有している。 A package according to one aspect of the invention has a cavity that will be sealed by a lid and is surrounded by a frame area surrounding the cavity and a frame area in a planar layout perpendicular to the thickness direction. It has a peripheral area and a mounting area surrounded by the peripheral area and where at least a part of electronic components is arranged. The package has a frame body portion and a substrate portion. The frame body portion is arranged in the frame body region, surrounds the cavity, and has a mounting surface to which the lid body is mounted. The substrate portion is made of ceramics, supports the frame body portion in the frame body region, and has a first surface facing the cavity in the peripheral region and the mounting region, and a second surface opposite to the first surface. ing. The first surface has a first concave portion in the mounting region and a first convex portion in the peripheral region with respect to the first reference surface perpendicular to the thickness direction. The second surface has a second convex portion in the mounting region and a second concave portion in the peripheral region with respect to the second reference surface perpendicular to the thickness direction.
 第1面の第1凹部は、15μm以上の第1深さ寸法を有していてよい。第2面の第2凸部は、15μm以上の第1高さ寸法を有していてよい。第2面の第2凹部は、15μm以上の第2深さ寸法を有していてよい。第1面の第1凸部は、15μm以上の第2高さ寸法を有していてよい。 The first recess on the first surface may have a first depth dimension of 15 μm or more. The second convex portion of the second surface may have a first height dimension of 15 μm or more. The second recess on the second surface may have a second depth dimension of 15 μm or more. The first convex portion of the first surface may have a second height dimension of 15 μm or more.
 厚み方向に関して、第2面の第2凸部が突出することによって達する位置に比して、第2面のうち枠体領域における少なくとも一部は、同程度以上に突出した位置に配置されていてよい。 In the thickness direction, at least a part of the second surface in the frame region is arranged at a position protruding to the same degree or more as compared with the position reached by the second convex portion of the second surface protruding. good.
 基板部は実装領域および周辺領域において均一な厚みを有していてよい。 The board portion may have a uniform thickness in the mounting area and the peripheral area.
 本発明の一の態様によれば、実装領域における第1面の第1凹部上で電子部品を支持することができる。さらに、周辺領域において第2面が第2凹部を有することによって、基板部の内部応力を緩和することができる。さらに、基板部の厚みに関して、第1凹部および第2凹部のそれぞれの影響を、第2凸部および第1凸部が、少なくともある程度相殺する。これにより、基板部が局所的に過度に薄い部分を有することが避けられる。よって、熱膨張収縮に起因しての、過度に薄い部分での基板部の反りが抑制される。よって、反りに起因しての電子部品の位置ずれを抑制することができる。以上から、基板部の内部応力を緩和しつつ、電子部品の位置ずれを抑制することができる。 According to one aspect of the present invention, the electronic component can be supported on the first recess on the first surface in the mounting area. Further, since the second surface has the second recess in the peripheral region, the internal stress of the substrate portion can be relaxed. Further, the second convex portion and the first convex portion cancel each of the influences of the first concave portion and the second concave portion with respect to the thickness of the substrate portion at least to some extent. This prevents the substrate portion from having a locally excessively thin portion. Therefore, the warp of the substrate portion in the excessively thin portion due to the thermal expansion and contraction is suppressed. Therefore, it is possible to suppress the misalignment of the electronic component due to the warp. From the above, it is possible to suppress the misalignment of electronic components while relaxing the internal stress of the substrate portion.
 厚み方向に関して、第2面の第2凸部が突出することによって達する位置に比して、第2面のうち枠体領域における少なくとも一部は、同程度以上に突出した位置に配置されていてよい。この場合、パッケージが他の部材上に搭載される際に、第2面の枠体領域が、第2面の第2凸部によって阻害されることなく安定的に支持される。 In the thickness direction, at least a part of the second surface in the frame region is arranged at a position protruding to the same degree or more as compared with the position reached by the second convex portion of the second surface protruding. good. In this case, when the package is mounted on another member, the frame region of the second surface is stably supported without being hindered by the second convex portion of the second surface.
 基板部は実装領域および周辺領域において均一な厚みを有していてよい。この場合、熱膨張収縮に起因しての基板部の反りを、より十分に抑制することができる。 The board portion may have a uniform thickness in the mounting area and the peripheral area. In this case, the warp of the substrate portion due to thermal expansion and contraction can be more sufficiently suppressed.
 この発明の目的、特徴、態様、および利点は、以下の詳細な説明と添付図面とによって、より明白となる。 The objectives, features, embodiments, and advantages of the present invention will be made clearer by the following detailed description and accompanying drawings.
本発明の一実施の形態における電子装置の構成を概略的に示す模式図である。It is a schematic diagram which shows schematic structure of the electronic apparatus in one Embodiment of this invention. 図1の電子装置の構成を概略的に示す断面図である。FIG. 3 is a cross-sectional view schematically showing the configuration of the electronic device of FIG. 図2の電子装置が有するパッケージの構成を概略的に示す断面図である。FIG. 3 is a cross-sectional view schematically showing the structure of a package included in the electronic device of FIG. 2. 図3のパッケージの構成を概略的に示す平面図である。It is a top view which shows the structure of the package of FIG. 3 schematically. 図4のパッケージが有する基板部の構成を概略的に示す平面図である。It is a top view which shows the structure of the substrate part which the package of FIG. 4 has.
 以下、図面に基づいて本発明の実施の形態について説明する。なお、図2~図5において、図面間での方向の関係を理解しやすくするために、XYZ直交座標系が示されている。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, in FIGS. 2 to 5, an XYZ Cartesian coordinate system is shown in order to make it easier to understand the relationship of directions between the drawings.
 図1は、本実施の形態における電子装置900の構成を概略的に示す模式図である。電子装置900(図1)は、キャビティCVを有するパッケージ800と、キャビティCV内に封止された電子部品902と、ボンディングワイヤ901(接続部材)と、蓋体907とを含む。なお変形例として、ボンディングワイヤ901と共に、またはそれに代わって、他の接続部材が用いられてもよい。 FIG. 1 is a schematic diagram schematically showing the configuration of the electronic device 900 according to the present embodiment. The electronic device 900 (FIG. 1) includes a package 800 having a cavity CV, an electronic component 902 sealed in the cavity CV, a bonding wire 901 (connecting member), and a lid 907. As a modification, other connecting members may be used together with or in place of the bonding wire 901.
 電子部品902は固体撮像素子であってよい。固体撮像素子は、例えば、図1に示されているようにCMOSである。一眼レフ、一部の監視用カメラ、および産業用カメラ等に求められるような大きな撮像部を有する固体撮像素子としては、一般に、CMOSが特に優れている。 The electronic component 902 may be a solid-state image sensor. The solid-state image sensor is, for example, CMOS as shown in FIG. CMOS is generally particularly excellent as a solid-state image sensor having a large image pickup unit as required for a single-lens reflex camera, some surveillance cameras, industrial cameras, and the like.
 蓋体907は、枠体部820の取付面SF上に取り付けられており、これによりパッケージ800のキャビティCVが封止されている。この取付は、例えば、接着層906を用いて行われてよい。接着層906は、例えば、樹脂接着剤からなる。電子部品902が固体撮像素子である場合、蓋体907の少なくとも一部は、撮像される光に関して実質的に透明であり、典型的には蓋体907の全体が、撮像される光に関して実質的に透明である。 The lid body 907 is mounted on the mounting surface SF of the frame body portion 820, whereby the cavity CV of the package 800 is sealed. This attachment may be performed using, for example, an adhesive layer 906. The adhesive layer 906 is made of, for example, a resin adhesive. When the electronic component 902 is a solid-state image sensor, at least a portion of the lid 907 is substantially transparent with respect to the light being imaged, and typically the entire lid 907 is substantially with respect to the light being imaged. Is transparent.
 パッケージ800には、キャビティCV内に設けられた内部端子831と、キャビティCV外に設けられた外部端子832と、内部端子831と外部端子832とを互いに接続する貫通配線830と、を有している。当該接続を得るために、貫通配線830はパッケージ800をキャビティCV内とキャビティCV外との間で貫通している。電子部品902は電極端子902Pを有している。ボンディングワイヤ901は、パッケージ800の内部端子831と、電子部品902の電極端子902Pと、を互いに接続している。 The package 800 has an internal terminal 831 provided inside the cavity CV, an external terminal 832 provided outside the cavity CV, and a through wiring 830 for connecting the internal terminal 831 and the external terminal 832 to each other. There is. In order to obtain the connection, the through wiring 830 penetrates the package 800 between the inside of the cavity CV and the outside of the cavity CV. The electronic component 902 has an electrode terminal 902P. The bonding wire 901 connects the internal terminal 831 of the package 800 and the electrode terminal 902P of the electronic component 902 to each other.
 図2は、本実施の形態における電子装置900の構成を概略的に示す断面図である。図3および図4のそれぞれは、電子装置900(図2)が有するパッケージ800の構成を概略的に示す断面図および平面図であり、図3の断面は線III-III(図4)に沿っている。図5は、パッケージ800(図4)が有する基板部810の構成を概略的に示す平面図である。 FIG. 2 is a cross-sectional view schematically showing the configuration of the electronic device 900 according to the present embodiment. 3 and 4 are cross-sectional views and plan views schematically showing the configuration of the package 800 included in the electronic device 900 (FIG. 2), and the cross-sectional view of FIG. 3 is along lines III-III (FIG. 4). ing. FIG. 5 is a plan view schematically showing the configuration of the substrate portion 810 included in the package 800 (FIG. 4).
 パッケージ800は、蓋体907によって封止されることになるキャビティCVを有している。パッケージ800は、厚み方向(Z方向)に垂直な平面レイアウト(XY面レイアウト)において、キャビティCVを囲む枠体領域R3と、枠体領域R3に囲まれた周辺領域R2と、周辺領域R2に囲まれた実装領域R1とを有している。パッケージ800は、枠体部820と、セラミックスからなる基板部810とを有している。枠体部820もセラミックスからなっていてよく、その場合、基板部810と枠体部820との境界は、仮想的なものであってよい。枠体部820の材料は特に限定されず、セラミックス、樹脂、金属、またはこれらの2つ以上の複合材料であってよい。なお、図2以降においては、貫通配線830(図1)、内部端子831(図1)、および外部端子832(図1)の図示は省略されている。貫通配線830(図1)は、基板部810および枠体部820を含む構成を貫通しており、例えば、内部電極層およびビア配線の少なくともいずれかによって構成され得る。 Package 800 has a cavity CV that will be sealed by a lid 907. The package 800 is surrounded by a frame region R3 surrounding the cavity CV, a peripheral region R2 surrounded by the frame region R3, and a peripheral region R2 in a plane layout (XY plane layout) perpendicular to the thickness direction (Z direction). It has a mounting area R1. The package 800 has a frame body portion 820 and a substrate portion 810 made of ceramics. The frame body portion 820 may also be made of ceramics, and in that case, the boundary between the substrate portion 810 and the frame body portion 820 may be virtual. The material of the frame portion 820 is not particularly limited, and may be ceramics, resin, metal, or a composite material of two or more of these. In addition, in FIG. 2 and later, the illustration of the through wiring 830 (FIG. 1), the internal terminal 831 (FIG. 1), and the external terminal 832 (FIG. 1) is omitted. The through wiring 830 (FIG. 1) penetrates a configuration including a substrate portion 810 and a frame portion 820, and may be configured by, for example, at least one of an internal electrode layer and a via wiring.
 枠体部820は、枠体領域R3に配置されており、キャビティCVを囲んでいる。枠体部820は、蓋体907が取り付けられることになる取付面SFを有している。 The frame body portion 820 is arranged in the frame body region R3 and surrounds the cavity CV. The frame body portion 820 has a mounting surface SF to which the lid body 907 is mounted.
 基板部810は、枠体領域R3において枠体部820を支持している。基板部810は、周辺領域R2および実装領域R1においてキャビティCVに面する第1面S1と、第1面S1と反対の第2面S2と、を有している。 The substrate portion 810 supports the frame body portion 820 in the frame body region R3. The substrate portion 810 has a first surface S1 facing the cavity CV in the peripheral region R2 and the mounting region R1, and a second surface S2 opposite to the first surface S1.
 実装領域R1は、電子部品902の少なくとも一部が配置されることになる領域である。図2に示された例においては、電子部品902は、実装領域R1と、周辺領域R2の一部と、にわたって配置されている。 The mounting area R1 is an area in which at least a part of the electronic component 902 is to be arranged. In the example shown in FIG. 2, the electronic component 902 is arranged over the mounting region R1 and a part of the peripheral region R2.
 電子部品902(図2)は、基板部810の第1面S1(図3)上に取り付けられることになる。この取付は、例えば、接着層(図示せず)を用いて行われてよい。当該接着層は、例えば、樹脂接着剤からなる。電子部品902の電極端子902P(図2において不図示、図1参照)と、パッケージ800の内部端子831(図2において不図示、図1参照)とは、ボンディングワイヤ901(図2)によって接続される。図2に示された例においては、パッケージ800の内部端子831(図2において不図示、図1参照)は、枠体部820に設けられた段部SB上に配置されている。段部SBは、厚み方向(Z方向)における枠体部820の途中部分に設けられている。 The electronic component 902 (FIG. 2) will be mounted on the first surface S1 (FIG. 3) of the substrate portion 810. This attachment may be performed, for example, using an adhesive layer (not shown). The adhesive layer is made of, for example, a resin adhesive. The electrode terminal 902P of the electronic component 902 (not shown in FIG. 2, see FIG. 1) and the internal terminal 831 of the package 800 (not shown in FIG. 2, see FIG. 1) are connected by a bonding wire 901 (FIG. 2). To. In the example shown in FIG. 2, the internal terminal 831 of the package 800 (not shown in FIG. 2, see FIG. 1) is arranged on the stepped portion SB provided in the frame body portion 820. The step portion SB is provided in the middle portion of the frame body portion 820 in the thickness direction (Z direction).
 電子部品902の平面レイアウト(XY面レイアウト)は、10mm以上の長辺を有する長方形を包含するサイズを有していてよく、例えば、10mm以上の辺を有する正方形を包含するサイズを有している。電子部品902が固体撮像素子の場合、撮像性能上、上記のように比較的大きなサイズがしばしば必要とされる。ただし、電子部品902のサイズおよび種類は、特に限定されるものではない。このような、電子部品902の典型的な大きさに対応して、周辺領域R2の外縁は、10mm以上の長辺を有する長方形を包含する大きさを有していることが好ましい。例えば、周辺領域R2の外縁は、10mm以上の長辺を有する長方形である。当該外縁は、10mm以上の辺を有する正方形を包含する大きさを有していてもよい。なお正方形は、幾何学における定義上、長方形の一種である。 The planar layout (XY plane layout) of the electronic component 902 may have a size including a rectangle having a long side of 10 mm or more, for example, a size including a square having a side of 10 mm or more. .. When the electronic component 902 is a solid-state image sensor, a relatively large size is often required in terms of image pickup performance as described above. However, the size and type of the electronic component 902 are not particularly limited. Corresponding to such a typical size of the electronic component 902, it is preferable that the outer edge of the peripheral region R2 has a size including a rectangle having a long side of 10 mm or more. For example, the outer edge of the peripheral region R2 is a rectangle having a long side of 10 mm or more. The outer edge may have a size including a square having a side of 10 mm or more. A square is a kind of rectangle by definition in geometry.
 図3を参照して、第1面S1は、第1基準面PL1に対して、実装領域R1における第1凹部C1と、周辺領域R2における第1凸部V1と、を有している。第2面S2は、第2基準面PL2に対して、実装領域R1における第2凸部V2と、周辺領域R2における第2凹部C2と、を有している。第1基準面PL1および第2基準面PL2の各々は、厚み方向(Z方向)にほぼ垂直である。言い換えれば、第1基準面PL1および第2基準面PL2の各々は、水平面(XY面)にほぼ平行である。第1凹部C1および第1凸部V1の各々は、第1基準面PL1に達する一方端および他方端(図中、左端および右端)を有している。また、第2凸部V2および第2凹部C2の各々は、第2基準面PL2に達する一方端および他方端(図中、左端および右端)を有している。平面レイアウト(XY面レイアウト)において、第1凹部C1は、第2凸部V2と少なくとも部分的に重なっており、好ましくは包含されている。平面レイアウト(XY面レイアウト)において、第2凹部C2は、第1凸部V1と少なくとも部分的に重なっており、好ましくは包含されている。 With reference to FIG. 3, the first surface S1 has a first concave portion C1 in the mounting region R1 and a first convex portion V1 in the peripheral region R2 with respect to the first reference surface PL1. The second surface S2 has a second convex portion V2 in the mounting region R1 and a second concave portion C2 in the peripheral region R2 with respect to the second reference surface PL2. Each of the first reference plane PL1 and the second reference plane PL2 is substantially perpendicular to the thickness direction (Z direction). In other words, each of the first reference plane PL1 and the second reference plane PL2 is substantially parallel to the horizontal plane (XY plane). Each of the first concave portion C1 and the first convex portion V1 has one end and the other end (left end and right end in the figure) reaching the first reference plane PL1. Further, each of the second convex portion V2 and the second concave portion C2 has one end and the other end (left end and right end in the figure) reaching the second reference surface PL2. In the planar layout (XY plane layout), the first concave portion C1 at least partially overlaps with the second convex portion V2 and is preferably included. In the plane layout (XY plane layout), the second concave portion C2 at least partially overlaps with the first convex portion V1 and is preferably included.
 第1基準面PL1は、実装領域R1と周辺領域R2とにおける第1面S1ついての近似平面に平行な面である。当該近似平面は、実装領域R1および周辺領域R2における第1面S1の表面プロファイルへ平面をフィッテイングすることによって算出されてよい。表面プロファイルの測定は光学的に行われてよい。なお、第1基準面PL1の高さ位置(Z方向における位置)は、上述した第1凹部C1および第1凸部V1が定義可能となるように適宜選択されてよい。 The first reference plane PL1 is a plane parallel to the approximate plane of the first plane S1 in the mounting region R1 and the peripheral region R2. The approximate plane may be calculated by fitting the plane to the surface profile of the first surface S1 in the mounting area R1 and the peripheral area R2. Measurement of the surface profile may be made optically. The height position (position in the Z direction) of the first reference surface PL1 may be appropriately selected so that the above-mentioned first concave portion C1 and first convex portion V1 can be defined.
 第2基準面PL2は、実装領域R1と周辺領域R2と枠体領域R3とにおける第2面S2についての近似平面に平行な面である。当該近似平面は、実装領域R1と周辺領域R2と枠体領域R3とにおける第2面S2の表面プロファイルへ平面をフィッテイングすることによって算出されてよい。表面プロファイルの測定は光学的に行われてよい。なお、第2基準面PL2の高さ位置(Z方向における位置)は、上述した第2凹部C2および第2凸部V2が定義可能となるように適宜選択されてよい。 The second reference plane PL2 is a plane parallel to the approximate plane of the second plane S2 in the mounting region R1, the peripheral region R2, and the frame region R3. The approximate plane may be calculated by fitting the plane to the surface profile of the second surface S2 in the mounting region R1, the peripheral region R2, and the frame region R3. Measurement of the surface profile may be made optically. The height position (position in the Z direction) of the second reference surface PL2 may be appropriately selected so that the above-mentioned second concave portion C2 and second convex portion V2 can be defined.
 基板部810は、第1凹部C1、第1凸部V1、第2凸部V2および第2凹部C2を、線CS1~CS3(図5)の少なくともいずれかに沿った表面プロファイルにおいて有している。図5に示された例においては、平面レイアウト(XY面レイアウト)において基板部810は長方形の形状を有しており、線CS1は長辺に平行であり、線CS2は短辺に平行であり、線CS3は対角線に平行である。線CS1~CS3の各々は上記長方形の中心を通っていることが好ましい。好ましくは、基板部810は、第1凹部C1、第1凸部V1、第2凸部V2および第2凹部C2を、少なくとも線CS1および線CS3の少なくともいずれかに沿った表面プロファイルにおいて有している。基板部810が、第1凹部C1、第1凸部V1、第2凸部V2および第2凹部C2を、線CS1に沿った表面プロファイルにおいて有している構成は、長辺方向に沿っての応力緩和に適している。基板部810が、第1凹部C1、第1凸部V1、第2凸部V2および第2凹部C2を、線CS2に沿った表面プロファイルにおいて有している構成は、短辺方向に沿っての応力緩和に適している。基板部810が、第1凹部C1、第1凸部V1、第2凸部V2および第2凹部C2を、線CS3に沿った表面プロファイルにおいて有している構成は、対角線方向に沿っての応力緩和に適している。なお、平面レイアウト(XY面レイアウト)において基板部810が正方形の形状を有している場合、上記説明は、長辺を一辺と読み替えて解される。 The substrate portion 810 has a first concave portion C1, a first convex portion V1, a second convex portion V2, and a second concave portion C2 in a surface profile along at least one of the lines CS1 to CS3 (FIG. 5). .. In the example shown in FIG. 5, in the plane layout (XY plane layout), the substrate portion 810 has a rectangular shape, the line CS1 is parallel to the long side, and the line CS2 is parallel to the short side. , Line CS3 is parallel to the diagonal. It is preferable that each of the lines CS1 to CS3 passes through the center of the rectangle. Preferably, the substrate portion 810 has a first concave portion C1, a first convex portion V1, a second convex portion V2 and a second concave portion C2 in a surface profile along at least one of the line CS1 and the line CS3. There is. The configuration in which the substrate portion 810 has the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 in the surface profile along the line CS1 is along the long side direction. Suitable for stress relaxation. The configuration in which the substrate portion 810 has the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 in the surface profile along the line CS2 is such that the first concave portion C1, the first convex portion V1, and the second concave portion C2 are provided along the short side direction. Suitable for stress relaxation. The configuration in which the substrate portion 810 has the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 in the surface profile along the line CS3 is such that the stress is along the diagonal direction. Suitable for relaxation. When the substrate portion 810 has a square shape in the plane layout (XY plane layout), the above description is understood by replacing the long side with one side.
 第1面S1の第1凹部C1は、15μm以上の第1深さ寸法を有している。第2面S2の第2凸部V2は、15μm以上の第1高さ寸法を有している。第2面S2の第2凹部C2は、15μm以上の第2深さ寸法を有している。第1面S1の第1凸部V1は、15μm以上の第2高さ寸法を有している。第1面S1の第1凹部C1は、80μm以下の第1深さ寸法を有していることが好ましい。第2面S2の第2凸部V2は、80μm以下の第1高さ寸法を有していることが好ましい。第2面S2の第2凹部C2は、80μm以下の第2深さ寸法を有していることが好ましい。第1面S1の第1凸部V1は、80μm以下の第2高さ寸法を有していることが好ましい。 The first recess C1 of the first surface S1 has a first depth dimension of 15 μm or more. The second convex portion V2 of the second surface S2 has a first height dimension of 15 μm or more. The second recess C2 of the second surface S2 has a second depth dimension of 15 μm or more. The first convex portion V1 of the first surface S1 has a second height dimension of 15 μm or more. The first recess C1 of the first surface S1 preferably has a first depth dimension of 80 μm or less. The second convex portion V2 of the second surface S2 preferably has a first height dimension of 80 μm or less. The second recess C2 of the second surface S2 preferably has a second depth dimension of 80 μm or less. The first convex portion V1 of the first surface S1 preferably has a second height dimension of 80 μm or less.
 厚み方向(Z方向)に関して、第2面S2の第2凸部V2が突出することによって達する位置に比して、第2面S2のうち枠体領域R3における少なくとも一部は、同程度以上に突出した位置に配置されていることが好ましい。言い換えれば、Z方向(図3における縦方向)に関して、第2面S2の第2凸部V2が-Z方向(図3における下方向)へ突出することによって達する位置に比して、第2面S2のうち枠体領域R3における少なくとも一部は、同程度以上に突出した位置に配置されていることが好ましい。 In the thickness direction (Z direction), at least a part of the second surface S2 in the frame region R3 is equal to or more than the position reached by the second convex portion V2 of the second surface S2 protruding. It is preferably arranged in a protruding position. In other words, in the Z direction (vertical direction in FIG. 3), the second surface is compared to the position reached by the second convex portion V2 of the second surface S2 protruding in the −Z direction (downward in FIG. 3). It is preferable that at least a part of S2 in the frame region R3 is arranged at a position protruding to the same extent or more.
 特に図3に例示された構成においては、厚み方向(Z方向)に関して、第2面S2の第2凸部V2が突出することによって達する位置を基準として、第2面S2は枠体領域R3において、同程度に突出した位置に配置された部分を有しており、かつ、より突出した位置に配置された部分は有していない。具体的には、第2面S2の第2凸部V2が突出することによって達する位置を基準として、第2面S2は枠体領域R3において、同程度に突出した位置に配置された面からなり、この面は水平面であってよい。 In particular, in the configuration exemplified in FIG. 3, in the thickness direction (Z direction), the second surface S2 is in the frame region R3 with reference to the position reached by the second convex portion V2 of the second surface S2 protruding. , It has a portion arranged at a position protruding to the same extent, and does not have a portion arranged at a more protruding position. Specifically, the second surface S2 is composed of a surface arranged at a position that protrudes to the same extent in the frame body region R3, based on the position reached by the second convex portion V2 of the second surface S2 protruding. , This surface may be a horizontal plane.
 なお、図3の構成の変形例として、厚み方向(Z方向)に関して、第2面S2の第2凸部V2が突出することによって達する位置に比して、第2面S2のうち枠体領域R3における少なくとも一部は、より突出した位置に配置されていてよい。言い換えれば、Z方向(図3における縦方向)に関して、第2面S2の第2凸部V2が-Z方向(図3における下方向)へ突出することによって達する位置に比して、第2面S2のうち枠体領域R3における少なくとも一部は、より突出した位置に配置されていてよい。 As a modification of the configuration of FIG. 3, in the thickness direction (Z direction), the frame region of the second surface S2 is compared with the position reached by the second convex portion V2 of the second surface S2 protruding. At least a part of R3 may be arranged in a more protruding position. In other words, in the Z direction (vertical direction in FIG. 3), the second surface is compared to the position reached by the second convex portion V2 of the second surface S2 protruding in the −Z direction (downward in FIG. 3). At least a part of S2 in the frame region R3 may be arranged at a more protruding position.
 基板部810の厚みは、例えば1mm程度である。基板部810は、上記のように第1凹部C1、第1凸部V1、第2凸部V2および第2凹部C2が見られる断面位置で、実装領域R1および周辺領域R2において均一な厚みを有していてよい。この場合、厚み方向(Z方向)における第1基準面PL1と第2基準面PL2との間の距離が上記の均一な厚みと同じになるように、第1基準面PL1と第2基準面PL2とを定義することができる。当該定義の下、平面レイアウト(XY面レイアウト)において、第1凹部C1と第2凹部C2とは、互いに重ならないように配置されていることが好ましい。なお本明細書において、「均一な厚み」の文言は、セラミックス部品の製造における通常のばらつきを勘案して、±5%の厚み分布を許容するものとして定義される。基板部810の厚み測定は、マイクロメーターを用いて行われてよい。 The thickness of the substrate portion 810 is, for example, about 1 mm. The substrate portion 810 has a uniform thickness in the mounting region R1 and the peripheral region R2 at the cross-sectional position where the first concave portion C1, the first convex portion V1, the second convex portion V2, and the second concave portion C2 can be seen as described above. You can do it. In this case, the first reference plane PL1 and the second reference plane PL2 so that the distance between the first reference plane PL1 and the second reference plane PL2 in the thickness direction (Z direction) is the same as the above uniform thickness. And can be defined. Under this definition, in the plane layout (XY plane layout), it is preferable that the first recess C1 and the second recess C2 are arranged so as not to overlap each other. In addition, in this specification, the wording of "uniform thickness" is defined as allowing a thickness distribution of ± 5% in consideration of usual variations in the manufacture of ceramic parts. The thickness of the substrate portion 810 may be measured using a micrometer.
 本実施の形態によれば、図3を参照して、実装領域R1における第1面S1の第1凹部C1上で電子部品902を支持することができる。さらに、周辺領域R2において第2面S2が第2凹部C2を有することによって、基板部810の内部応力を緩和することができる。さらに、基板部810の厚みに関して、第1凹部C1および第2凹部C2のそれぞれの影響を、第2凸部V2および第1凸部V1が、少なくともある程度相殺する。これにより、基板部810が局所的に過度に薄い部分を有することが避けられる。よって、熱膨張収縮に起因しての、過度に薄い部分での基板部810の反りが抑制される。よって、反りに起因しての電子部品902の位置ずれを抑制することができる。以上から、基板部810の内部応力を緩和しつつ、電子部品902の位置ずれを抑制することができる。特に、電子部品902が固体撮像素子の場合、このような位置ずれは光学的に好ましくない。 According to the present embodiment, the electronic component 902 can be supported on the first recess C1 of the first surface S1 in the mounting region R1 with reference to FIG. Further, since the second surface S2 has the second recess C2 in the peripheral region R2, the internal stress of the substrate portion 810 can be relaxed. Further, the second convex portion V2 and the first convex portion V1 cancel each of the influences of the first concave portion C1 and the second concave portion C2 with respect to the thickness of the substrate portion 810 at least to some extent. This prevents the substrate portion 810 from having a locally excessively thin portion. Therefore, the warp of the substrate portion 810 in the excessively thin portion due to the thermal expansion and contraction is suppressed. Therefore, it is possible to suppress the misalignment of the electronic component 902 due to the warp. From the above, it is possible to suppress the misalignment of the electronic component 902 while relaxing the internal stress of the substrate portion 810. In particular, when the electronic component 902 is a solid-state image sensor, such misalignment is optically unfavorable.
 厚み方向(Z方向)に関して、第2面S2の第2凸部V2が突出することによって達する位置に比して、第2面S2のうち枠体領域R3における少なくとも一部は、同程度以上に突出した位置に配置されていてよい。この場合、パッケージ800が他の部材上に搭載される際に、第2面S2の枠体領域R3が、第2面S2の第2凸部V2によって阻害されることなく安定的に支持される。 In the thickness direction (Z direction), at least a part of the second surface S2 in the frame region R3 is equal to or more than the position reached by the second convex portion V2 of the second surface S2 protruding. It may be arranged in a protruding position. In this case, when the package 800 is mounted on another member, the frame body region R3 of the second surface S2 is stably supported without being hindered by the second convex portion V2 of the second surface S2. ..
 基板部810は実装領域R1および周辺領域R2において均一な厚みを有していてよい。この場合、熱膨張収縮に起因しての基板部810の反りを、より十分に抑制することができる。また、基板部810を形成する工程が簡素化される。 The substrate portion 810 may have a uniform thickness in the mounting region R1 and the peripheral region R2. In this case, the warp of the substrate portion 810 due to thermal expansion and contraction can be more sufficiently suppressed. In addition, the process of forming the substrate portion 810 is simplified.
 なお上記の実施の形態においては、基板部810および枠体部820の両方を有するパッケージ800(図3)について詳述したが、変形例として、電子部品用のセラミックス基板を、枠体部820なしに基板部810が構成してよい。この場合、枠体領域R3には枠体部820が設けられないので、枠体領域は、周辺領域を囲む囲繞領域として理解される。当該セラミックス基板によっても、上記の実施の形態において説明された理由により、内部応力を緩和しつつ、電子部品の位置ずれを抑制することができる。 In the above embodiment, the package 800 (FIG. 3) having both the substrate portion 810 and the frame portion 820 has been described in detail, but as a modification, a ceramic substrate for electronic components is used without the frame portion 820. The substrate portion 810 may be configured. In this case, since the frame body portion 820 is not provided in the frame body region R3, the frame body region is understood as a surrounding region surrounding the peripheral region. The ceramic substrate can also suppress the misalignment of electronic components while relaxing the internal stress for the reason described in the above embodiment.
 上述した実施の形態および変形例は、互いに自由に組み合わされてよい。この発明は詳細に説明されたが、上記した説明は、すべての態様において、例示であって、この発明がそれに限定されるものではない。例示されていない無数の変形例が、この発明の範囲から外れることなく想定され得るものと解される。 The above-described embodiments and modifications may be freely combined with each other. Although the present invention has been described in detail, the above description is exemplary in all embodiments and the invention is not limited thereto. It is understood that innumerable variations not illustrated can be assumed without departing from the scope of the present invention.
 800  :パッケージ
 810  :基板部
 820  :枠体部
 830  :貫通配線
 831  :内部端子
 832  :外部端子
 900  :電子装置
 901  :ボンディングワイヤ
 902  :電子部品
 902P :電極端子
 906  :接着層
 907  :蓋体
 C1   :第1凹部
 C2   :第2凹部
 CV   :キャビティ
 PL1  :第1基準面
 PL2  :第2基準面
 R1   :実装領域
 R2   :周辺領域
 R3   :枠体領域
 S1   :第1面
 S2   :第2面
 SB   :段部
 SF   :取付面
 V1   :第1凸部
 V2   :第2凸部
800: Package 810: Board part 820: Frame body part 830: Through wiring 831: Internal terminal 832: External terminal 900: Electronic device 901: Bonding wire 902: Electronic component 902P: Electrode terminal 906: Adhesive layer 907: Lid body C1: 1st recess C2: 2nd recess CV: Cavity PL1: 1st reference surface PL2: 2nd reference surface R1: Mounting area R2: Peripheral area R3: Frame area S1: 1st surface S2: 2nd surface SB: Step SF: Mounting surface V1: First convex part V2: Second convex part

Claims (7)

  1.  蓋体によって封止されることになるキャビティを有し、厚み方向に垂直な平面レイアウトにおいて、前記キャビティを囲む枠体領域と、前記枠体領域に囲まれた周辺領域と、前記周辺領域に囲まれ、電子部品の少なくとも一部が配置されることになる実装領域と、を有するパッケージであって、
     前記枠体領域に配置され、前記キャビティを囲み、前記蓋体が取り付けられることになる取付面を有する枠体部と、
     セラミックスからなり、前記枠体領域において前記枠体部を支持し、前記周辺領域および前記実装領域において前記キャビティに面する第1面と、前記第1面と反対の第2面と、を有する基板部と、
    を備え、
     前記第1面は、前記厚み方向に垂直な第1基準面に対して、前記実装領域における第1凹部と、前記周辺領域における第1凸部と、を有しており、
     前記第2面は、前記厚み方向に垂直な第2基準面に対して、前記実装領域における第2凸部と、前記周辺領域における第2凹部と、を有している、パッケージ。
    In a planar layout having a cavity to be sealed by a lid and perpendicular to the thickness direction, a frame area surrounding the cavity, a peripheral area surrounded by the frame area, and a peripheral area surrounded by the peripheral area. A package with a mounting area on which at least a portion of an electronic component will be located.
    A frame portion that is disposed in the frame area, surrounds the cavity, and has a mounting surface on which the lid is to be mounted.
    A substrate made of ceramics, supporting the frame body portion in the frame body region, and having a first surface facing the cavity in the peripheral region and the mounting region, and a second surface opposite to the first surface. Department and
    Equipped with
    The first surface has a first concave portion in the mounting region and a first convex portion in the peripheral region with respect to the first reference surface perpendicular to the thickness direction.
    The second surface is a package having a second convex portion in the mounting region and a second concave portion in the peripheral region with respect to a second reference surface perpendicular to the thickness direction.
  2.  前記第1面の前記第1凹部は、15μm以上の第1深さ寸法を有している、請求項1に記載のパッケージ。 The package according to claim 1, wherein the first recess on the first surface has a first depth dimension of 15 μm or more.
  3.  前記第2面の前記第2凸部は、15μm以上の第1高さ寸法を有している、請求項1または2に記載のパッケージ。 The package according to claim 1 or 2, wherein the second convex portion of the second surface has a first height dimension of 15 μm or more.
  4.  前記第2面の前記第2凹部は、15μm以上の第2深さ寸法を有している、請求項1から3のいずれか1項に記載のパッケージ。 The package according to any one of claims 1 to 3, wherein the second recess on the second surface has a second depth dimension of 15 μm or more.
  5.  前記第1面の前記第1凸部は、15μm以上の第2高さ寸法を有している、請求項1から4のいずれか1項に記載のパッケージ。 The package according to any one of claims 1 to 4, wherein the first convex portion of the first surface has a second height dimension of 15 μm or more.
  6.  前記厚み方向に関して、前記第2面の前記第2凸部が突出することによって達する位置に比して、前記第2面のうち前記枠体領域における少なくとも一部は、同程度以上に突出した位置に配置されている、請求項1から5のいずれか1項に記載のパッケージ。 In the thickness direction, at least a part of the second surface in the frame region protrudes to the same extent or more as compared with the position reached by the second convex portion of the second surface protruding. The package according to any one of claims 1 to 5, which is arranged in.
  7.  前記基板部は前記実装領域および前記周辺領域において均一な厚みを有している、請求項1から6のいずれか1項に記載のパッケージ。 The package according to any one of claims 1 to 6, wherein the substrate portion has a uniform thickness in the mounting area and the peripheral area.
PCT/JP2020/048716 2020-12-25 2020-12-25 Package WO2022137503A1 (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006005071A (en) * 2004-06-16 2006-01-05 Matsushita Electric Ind Co Ltd Semiconductor apparatus, package therefor and method of manufacturing the same
JP2015069981A (en) * 2013-09-26 2015-04-13 京セラ株式会社 Wiring board and electronic device
WO2016098455A1 (en) * 2014-12-17 2016-06-23 京セラ株式会社 Package for mounting electronic component and electronic device
JP2016225957A (en) * 2015-06-04 2016-12-28 日本特殊陶業株式会社 Ceramic package

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006005071A (en) * 2004-06-16 2006-01-05 Matsushita Electric Ind Co Ltd Semiconductor apparatus, package therefor and method of manufacturing the same
JP2015069981A (en) * 2013-09-26 2015-04-13 京セラ株式会社 Wiring board and electronic device
WO2016098455A1 (en) * 2014-12-17 2016-06-23 京セラ株式会社 Package for mounting electronic component and electronic device
JP2016225957A (en) * 2015-06-04 2016-12-28 日本特殊陶業株式会社 Ceramic package

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