WO2022119722A2 - Power and area efficient digital-to-time converter with improved stability - Google Patents
Power and area efficient digital-to-time converter with improved stability Download PDFInfo
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- WO2022119722A2 WO2022119722A2 PCT/US2021/059956 US2021059956W WO2022119722A2 WO 2022119722 A2 WO2022119722 A2 WO 2022119722A2 US 2021059956 W US2021059956 W US 2021059956W WO 2022119722 A2 WO2022119722 A2 WO 2022119722A2
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- 239000003990 capacitor Substances 0.000 claims abstract description 158
- 238000007599 discharging Methods 0.000 claims abstract description 8
- 238000000034 method Methods 0.000 claims description 25
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- 238000010586 diagram Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
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- 238000004891 communication Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
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- 230000007850 degeneration Effects 0.000 description 1
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- 239000007924 injection Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/82—Digital/analogue converters with intermediate conversion to time interval
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/82—Digital/analogue converters with intermediate conversion to time interval
- H03M1/822—Digital/analogue converters with intermediate conversion to time interval using pulse width modulation
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- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F10/00—Apparatus for measuring unknown time intervals by electric means
- G04F10/005—Time-to-digital converters [TDC]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
- H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M1/0607—Offset or drift compensation
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/74—Simultaneous conversion
- H03M1/80—Simultaneous conversion using weighted impedances
- H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
- H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution
Definitions
- This application relates to digital-to-time converters, and more particularly to a power-efficient and area-efficient digital-to-time converter that is robust to process, voltage, and temperature variations.
- Fractional-N phase-locked loops are key building blocks for frequency synthesizers as well as for low jitter clocking applications using a fixed frequency or spreadspectrum.
- DTCs digital-to-time converters
- a DTC converts a digital code or word into a time delay, working as a true fractional frequency divider with high resolution in a PLL.
- DTCs are also basic building blocks suitable for other applications, including sampling oscilloscopes, direct digital frequency synthesis (DDFS), polar transmitters, radar, phased-array systems, and time-interleaved ADC timing calibrations.
- CMOS delay cells are sensitive to process, voltage, and temperature (PVT) variations. Improved supply noise robustness may thus be obtained by implementing a DTC with a capacitor-charging circuit.
- the capacitor-charging circuit charges a capacitor according to a digital word that is being converted by the DTC into the time delay.
- a digital-to- analog converter (DAC) such as a resistive DAC (R-DAC) converts the digital word into an initial voltage (Vinit) for the charging capacitor.
- the Vinit-charged charging capacitor is then further charged with a constant current until the charging capacitor voltage reaches a threshold voltage (Vtrip).
- the time delay equals the delay from charging the Vinit-charged charging capacitor from Vinit to Vtrip.
- the DAC consumes power and semiconductor die area.
- DTCs may suffer from process, voltage, and temperature variations.
- a circuit includes: a capacitive digital-to-analog converter including a common terminal and a plurality of capacitors; a first current source configured to charge the plurality of capacitors through the common terminal with a charging current; and a comparator having a first input terminal coupled to the common terminal.
- a method for a digital-to-time converter includes: charging an array of capacitors in a capacitive digital-to-analog converter responsive to a digital code to form a charged array of capacitors; responsive to a timing signal, further charging the charged array of capacitors through a common terminal with a charging current to form an increasing voltage for the common terminal; and determining when the increasing voltage equals a trip voltage.
- a circuit includes: a voltage-to-current switched capacitor converter configured to convert a reference voltage into a first current; a charging capacitor; a current mirror configured to mirror the first current into a charging current for charging the charging capacitor; and a comparator having a first input coupled to the charging capacitor and a second input configured to receive a trip voltage.
- a circuit includes: a capacitive digital-to-analog converter including a common terminal and a plurality of capacitors; a first current source configured to discharge the plurality of capacitors with a discharging current conducted through the common terminal; and a comparator having a first input terminal coupled to the common terminal.
- FIG. 1 is a diagram of an example DTC in which a capacitive DAC (CDAC) functions as the charging capacitor that is charged during the time delay in accordance with an aspect of the disclosure.
- CDAC capacitive DAC
- FIG. 2 illustrates some example voltage waveforms for the charging of the charging capacitor in the DCT of FIG. 1.
- FIG. 3 is a circuit diagram of a binary-weighted CDAC for a DTC in accordance with an aspect of the disclosure.
- FIG. 4 is a circuit diagram of a switched capacitor voltage-to-current converter and a current mirror in accordance with an aspect of the disclosure.
- FIG. 5 is a diagram of an example DTC in which a switched capacitor voltage-to- current functions to generate the charging current for a charging capacitor in accordance with an aspect of the disclosure.
- FIG. 6 is a flowchart for an example method of operation for a DTC in accordance with an aspect of the disclosure.
- FIG. 7 illustrates some example electronic systems each incorporating a DTC in accordance with an aspect of the disclosure.
- FIG. 8 is a diagram of an example DTC in which a CD AC functions as the charging capacitor that is discharged during the time delay in accordance with an aspect of the disclosure.
- a digital-to-time converter is disclosed in which a capacitor DAC (CD AC) functions as a digital-controlled voltage generator for a charging capacitor and also the charging capacitor itself.
- a capacitor DAC CD AC
- the resulting DTC has improved power efficiency and occupies a reduced semiconductor die area. This reduction in the die space improves density as more circuits may be integrated into the same die space due to the reduced area for the digital-to-time converter implementation.
- a switched capacitor voltage-to-current converter is also disclosed for the generation of the charging current to the charging capacitor to improve stability with regard to process, voltage, and temperature variations.
- a CD AC 105 includes an array of capacitors sharing a common terminal 145 that is charged to an initial voltage Vinit responsive to a digital DTC code (dtc_code).
- CD AC 105 functions such that Vinit is a fraction of a DAC reference voltage (Vref_dac). The number of different fractions depends upon the resolution of CDAC 105 and its encoding.
- CDAC 105 can convert the DTC code dtc_code into one of eight possible settings for Vinit: 0 V, 1/8 Vref_dac, 1/4 Vref_dac, 3/8 Vref_dac, 1/2 Vref_dac, 5/8 Vref_dac, 3/4 Vref_dac, and 7/8 Vref_dac.
- the capacitors in CDAC 105 are all connected in parallel with respect to common terminal 145 after being charged to Vinit, they function as a single charging capacitor. With the capacitors in CDAC 105 charged to Vinit, an edge (which may be a rising edge or a falling edge) of a timing signal such as an input clock signal (clk_in) triggers a switch S 1 to close so that a current source such as a current mirror 110 begins to charge the capacitors with a constant charging current Ichg.
- a comparator 115 functions to compare the common terminal voltage in CDAC 105 to a threshold voltage Vtrip.
- the output signal from comparator 115 may be inverted by an inverter 120 to form an output clock signal (clk_dtc_out) for DTC 100 that is asserted to a power supply voltage at the end of the time delay.
- the time delay from DTC 100 thus equals the delay between the triggering edge of the input clock edge and the assertion of the output clock signal.
- comparator 115 may be configured such that the output clock signal has a falling edge (discharges to ground) at the end of the time delay.
- the capacitors in CDAC 105 are referred to collectively as the charging capacitor since they are connected in parallel with regard to common terminal 145 in a charge redistribution phase in which the capacitors are charged to Vinit.
- a first waveform 200 the charging capacitor is charged to an initial voltage Vinitl that is greater than an initial voltage Vinit2 for a second waveform 205.
- the triggering edge of the input clock signal occurs at a time tO.
- Both waveforms increase linearly from the constant charging current Ichg.
- waveform 200 reaches Vtrip at a time tl that is sooner than a time t2 when waveform 205 reaches Vtrip due to Vinitl being greater than Vinit2.
- a time delay Atl from time tO to time tl for waveform 200 is thus shorter than a time delay At2 from time tO to time t2 for waveform 205.
- any suitable current source may be used to charge the charging capacitor with the constant charging current Ichg when the switch S 1 is closed.
- a particularly advantageous current source is formed by a switched capacitor voltage-to-current converter 135 that functions to make DTC 100 robust to process, voltage, and temperature variations as will be explained further herein.
- Switched capacitor voltage-to-current converter 135 converts an input reference voltage Vrefp into a first current I.
- a current source such as a current mirror 110 mirrors the first current I into the charging current Ichg that charges the charging capacitor.
- a current source 125 as biased by a bias voltage Vbias drives a reference current Iref into a resistor.
- current source 125 drives the reference current Iref into a pair of resistors R2 and R1 but it will be appreciated that a single resistor (or more than two resistors) may be used in alternative implementations. In an alternative implementation, a voltage reference circuit with a voltage buffer may be used in lieu of current source 125 to generate the input reference voltage Vrefp.
- Resistors R2 and R1 are arranged in series between current source 125 and ground. Resistors R1 and R2 form a voltage divider such that a voltage divider node 140 between resistors R1 and R2 is charged to a reference voltage Vref_dac that equals a divided version of the input reference voltage Vrefp depending upon the resistances for resistors R1 and R2. By an appropriate adjustment of these resistances, the output voltage range of CDAC 105 may be set relative to the input reference voltage Vrefp.
- resistor R2 may be shorted or removed such that the reference voltage Vref_dac equals the input reference voltage Vrefp so that an offset of comparator 115 may be compensated as follows. If comparator 115 were perfect, it would discharge its output signal when its negative terminal input voltage Vn equals Vtrip at its positive input terminal. But due to non-idealities, comparator 115 may instead discharge its output signal when the negative terminal input voltage Vn equals Vtrip plus some offset voltage that may be positive or negative. To compensate for this offset voltage, an auto-zero sampling switch S3 that couples between the output of comparator 115 and its negative input terminal is closed during an auto-zero phase prior to the charging of the charging capacitor.
- a switch S2 that couples from the voltage divider node 140 through an auto-zero capacitor Caz to the negative input terminal of comparator 115 is also closed to couple the reference voltage Vref_dac to a first terminal of the auto-zero capacitor Vac that has a second terminal connected to the negative input terminal of comparator 115. Due to the feedback through autozero switch S3 in the auto-zero phase, the auto-zero capacitor Caz will be charged with the offset voltage during the auto-zero phase. During normal operation, switches S2 and S3 are then opened.
- comparator 115 Due to the pre-charging of the auto-zero capacitor Caz to cancel the offset voltage, comparator 115 will then discharge its output signal and toggle the output of inverter 120 when the common terminal 145 is charged to the trip voltage Vtrip regardless of the offset voltage for comparator 115.
- CDAC 100 may be formed using any suitable encoding of its capacitors.
- An example binary-encoded CDAC 300 is shown in more detail in FIG. 3.
- the reference voltage Vref_dac flows through switch S2 during an initial charging stage to charge the common terminal 145 of an array of capacitors 305.
- CDAC 300 responds a three-bit wide digital code dtc_code so that the array of capacitors has four capacitors including a capacitor 4C, a capacitor 2C, a capacitor 1C, and second (or dummy) capacitor 1C.
- capacitor 4C has twice the capacitance of capacitor 2C, which in turn has twice the capacitance of each of the 1C/1C capacitors.
- Each capacitor has a first plate that couples to the common terminal 145 or ground through a corresponding single-pole-double-throw switch (SPDT).
- SPDT single-pole-double-throw switch
- capacitor 4C has a first plate coupled to an SPDT switch S4
- capacitor 2C has a first plate coupled to an SPDT switch S5
- capacitor 1C has a first plate coupled to an SPDT switch S6
- capacitor 1C has a first plate coupled to an SPDT switch S7.
- a bottom switch S8 that couples between a second plate for each capacitor and ground is closed.
- each SPDT switch determines whether the setting of each SPDT switch during the initial charging stage depends upon the DTC code. As discussed previously, a three-bit DTC code corresponds to eight different values of Vinit that range from, for example, from 0V to 7/8 Vref_dac. For the 0V setting, each SPDT switch selects for ground instead of the common terminal 145. But as DTC code increases, more and more of the SPDT switches select for the common terminal 145 instead of ground to charge their respective capacitor with the DAC reference voltage Vref_dac. For example, a maximum value for the three -bit DTC code may cause switches S4, S5, and S6 to select for the common terminal while switch S7 selects for ground. In that case, capacitors S4, S5, and S6 are all charged to the DAC reference voltage during the initial charging phase.
- a charge redistribution phase occurs.
- the charge redistribution phase begins by opening bottom switch S8. This advantageously prevents the charge on the capacitors in capacitor array 305 from being changed during the charge redistribution phase since the second plate for each capacitor is floating. More generally, ground may be replaced by a constant voltage source such that bottom switch S8 couples between the second plate of each capacitor and the constant voltage source. It will be appreciated that switch S8 may be replaced by a plurality of switches S8 in alternative implementations. With bottom switch S8 opened, switch S2 is also opened to isolate the common terminal from the DAC reference voltage Vref at voltage divider node 140.
- All the SPDT switches are then configured to select for the common terminal 145 such that the first plate for each capacitor is connected to the common terminal 145.
- the charge on the first plates thus redistributes from those capacitors that were charged in the initial charging phase to those capacitors that were grounded in the initial charging phase.
- the switching of the SPDT switches may be staggered or asynchronous due to non-idealities but no charge injection occurs due to the opening of bottom switch S8, which “locks” the total charge on all the capacitors due to the floating of the second plate for each of the capacitors.
- the redistribution phase is then completed by closing bottom switch S8.
- Common terminal 145 is then charged to Vinit such that the input clock may be asserted to trigger the charging of the Vinit-charged charging capacitor through the closing of switch SI.
- FIG. 4 An example switched capacitor voltage-to-current converter 135 with current mirror 110 is shown in FIG. 4.
- a differential amplifier 405 with a feedback capacitor C3 coupled between the output of differential amplifier 405 and its negative input terminal forms an error integrator that integrates a difference between the input reference voltage Vrefp and its negative input terminal voltage.
- Amplifier 405 drives a gate of an NMOS transistor M4 having a source connected to degeneration resistor Rdg (or ground in other implementations) and a drain connected to a drain and gate of a diode-connected PMOS transistor M3.
- Transistor M3 forms a current mirror with a current-mirror PMOS transistor M2.
- transistor M3 forms the current mirror 110 with a current-mirror PMOS transistor Ml.
- the sources of transistors Ml, M2, and M3 connect to a power supply terminal for a power supply voltage.
- the gates of transistors Ml and M2 connect to the gate of diode-connected transistor M3.
- amplifier 405 causes transistor M4 to conduct a current, that current is thus mirrored through transistors M3 and Ml to form a first current I that is mirrored by current mirror 110 to form the charging current Ichg.
- Transistor Ml is sized relative to transistor M2 so that the charging current Ichg is a factor K times the first current I.
- the drain of transistor Ml couples through a switch SI 1 to a first plate of a capacitor Cl and also couples through a switch S9 to ground. A second plate of capacitor Cl connects to ground.
- the first plate of capacitor Cl also couples to ground through a switch S10.
- the first plate of capacitor Cl couples to a first plate of a capacitor C2 through a switch S12.
- a second plate of capacitor C2 connects to ground.
- the first plate of capacitor C2 couples through a switch S13 to the negative input terminal of amplifier 405.
- a clock source such as a crystal oscillator (not illustrated) generates a clock signal to control switches S9, S10, Si l, S12, and S13.
- the clock signal oscillates between two phases at a frequency FCLK-
- a first phase c l of the clock signal may correspond to when the clock signal is charged to a power supply voltage whereas a second phase cp2 may correspond to when the clock signal is discharged although these two phases may be reversed in alternative implementations.
- Switches Sil and S12 close when the clock signal is in phase cpl.
- the current I charges capacitors Cl and C2 through the closed switches Sil and S12.
- Switches S9, S10, and S13 are open during phase cpl. In phase cp2, switches S9, S10 and S13 close whereas switches Sil and S12 open.
- phase cp2 the charge on capacitor C2 drives the negative input terminal on amplifier 405.
- Capacitor Cl is discharged during phase cp2 and the first current I discharges to ground through closed switch S9. Given this clocking of the switches, it can be shown that the first current I equals 2*FcLK*Vrefp*Cl.
- Current mirror transistor Ml mirrors the first current I such that the charging current Ichg equals the proportionality constant K times the first current I. The charging current Ichg thus equals K*2*FcLK*Vrefp*Cl.
- the mismatch errors between transistors Ml, M2 and M3 can be improved by using dynamic element matching (DEM) techniques through a switching matrix 410.
- Switching matrix 410 dynamically switches the drain connections of transistors Ml, M2, and M3 so that the roles of transistors Ml, M2, and M3 are dynamically swapped while the relative mirror ratios among them are kept unchanged.
- the drain of transistor M3 is connected to the drain of transistor M4 as shown in FIG. 4.
- the drain of transistor M3 is instead connected to switch Sil.
- the drain of current mirror transistor M2 may then be connected through the switching matrix 410 to the drain of transistor M4.
- the drain of current mirror transistor Ml normally is coupled to switch SI (FIG. 1) but is dynamically switched through switching matrix 410 in other switching configuration to instead connect either to switch Si l or to the drain of transistor M4.
- the resulting swapping of the current mirror elements can be triggered in phase cp2 with no impact on capacitor charging operations.
- the offset of amplifier 405 can be removed by an autozero technique analogously as discussed with regard to comparator 115.
- a switch S zl that connects between the negative input of amplifier 405 and the output of amplifier 405 as well as a switch Saz2 that connects between a node for the reference voltage Vrefp and a first plate of an auto-zero capacitor Cazl are closed.
- a second plate of the auto-zero capacitor Caz2 connects to the negative input of amplifier 405.
- An auto-zero switch Saz3 that connects between the capacitor C3 and the negative input of amplifier 405 is open during clock phase cpl to preserve the stored charge on capacitor C3.
- An offset voltage for amplifier 405 is thus sampled on the auto-zero capacitor Cazl during the clock phase cp2.
- switches Sazl and Saz2 are opened and switch Saz3 closed so that the offset at the amplifier 405 is cancelled by the pre-charged capacitor Cazl.
- the error signal from capacitor C2 is transferred by closing switch S13 during clock phase cp2, switch Saz3 is also closed to form the integrator with amplifier 405 and capacitor C3. .
- the use of the switched capacitor voltage-to- current converter 135 in the generation of the charging current Ichg is thus quite advantageous with regard to ensuring that the timing delay produced by the DTC is robust to process, voltage, and temperature variations.
- FIG. 5 an example DTC 500 is shown in which the switched capacitor voltage-to-current converter 135 and current mirror 110 function to generate the charging current Ichg as discussed with regard to DTC 100.
- a charging capacitor 505 is not integrated into a CD AC but instead is separately charged with the initial voltage Vinit as set by a DAC 510.
- the remaining component of DTC 500 function as discussed with regard to DTC 100. If a single CD AC were used to form charging capacitor 505 and DAC 510, DTC 500 resolves into DTC 100.
- DTC 500 is still robust to process, voltage, and temperature variations due to the use of the switched capacitor voltage-to-current converter 135 to generate the charging current Ichg.
- the method includes an act 600 of charging an array of capacitors in a capacitive digital-to-analog converter responsive to a digital code to form a charged array of capacitors.
- the charging of common terminal 145 for the array of capacitors to the initial voltage Vinit is an example of act 600.
- the method includes an act 605 that occurs responsive to an edge of a timing signal and includes further charging the charged array of capacitors through a common terminal with a charging current to form an increasing voltage for the common terminal.
- the charging of the CDAC capacitors through common terminal 145 after the triggering edge of the input clock signal is an example of act 605.
- the method includes an act 610 of determining when the increasing voltage equals a trip voltage.
- the comparison in comparator 115 is an example of act 610.
- a DTC as disclosed herein may be advantageously incorporated in any suitable mobile device or electronic system.
- a cellular telephone 700, a laptop computer 705, and a tablet PC 710 may all include a DTC in accordance with the disclosure.
- Other exemplary electronic systems such as a music player, a video player, a communication device, and a personal computer may also be configured with DTCs constructed in accordance with the disclosure.
- DTC 100 the same advantageous density and power enhancements as well as robustness to process, voltage, and temperature variations may be provided in alternative implementations in which the charging capacitor formed by CDAC 105 is instead discharged during the time delay instead of being charged.
- An example discharging DTC 800 is shown in FIG. 8.
- a CDAC 105 functions as discussed with regard to DTC 100 to convert a digital code into an initial voltage Vinit stored by the CDAC capacitors with respect to common terminal 145 during a redistribution phase for CDAC 105.
- a current mirror 810 mirrors a first current from a switched capacitor voltage-to-current converter 805 to form a discharging current Idischarge.
- Current mirror 810 connects to the common terminal 145 through switch SI analogously as discussed for DTC 100 so that when switch SI is closed responsive to a triggering clock signal edge to start the time delay, the voltage Vinit begins to discharge as the discharging current Idischarge discharges the CDAC capacitors.
- a comparator 815 also functions analogously as discussed with regard to comparator 115 to determine when the initial voltage Vinit has decreased to equal a trip voltage Vtripl. However, whereas the trip voltage Vtrip for DTC 100 was greater than the initial voltage Vinit, the trip voltage Vtriplis less than the initial voltage Vinit. Since the output (clk_dtc_out) of comparator 815 will go high at the end of the time delay when the CDAC capacitors have been discharged to be less than the trip voltage Vtripl, there is no need for an inverter equivalent to inverter 120 in DTC 800. The remainder of DTC 800 functions as discussed with regard to DTC 100.
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- General Physics & Mathematics (AREA)
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Abstract
Description
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Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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CN202180070908.8A CN116325506A (en) | 2020-12-03 | 2021-11-18 | Power and area efficient digital-to-time converter with improved stability |
JP2023527767A JP2023543337A (en) | 2020-12-03 | 2021-11-18 | Power- and area-efficient digital-to-time converter with improved stability |
KR1020237018043A KR20230084318A (en) | 2020-12-03 | 2021-11-18 | Power and Area Efficient DIGITAL-TO-TIME CONVERTER with Improved Reliability |
EP21827463.7A EP4256708A2 (en) | 2020-12-03 | 2021-11-18 | Power and area efficient digital-to-time converter with improved stability |
JP2024007988A JP2024056716A (en) | 2020-12-03 | 2024-01-23 | Power- and area-efficient digital-to-time converter with improved stability - Patents.com |
Applications Claiming Priority (4)
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US17/111,208 US11177819B1 (en) | 2020-12-03 | 2020-12-03 | Power and area efficient digital-to-time converter with improved stability |
US17/111,208 | 2020-12-03 | ||
US17/449,250 US11626883B2 (en) | 2020-12-03 | 2021-09-28 | Power and area efficient digital-to-time converter with improved stability |
US17/449,250 | 2021-09-28 |
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WO2022119722A2 true WO2022119722A2 (en) | 2022-06-09 |
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JP (2) | JP2023543337A (en) |
KR (1) | KR20230084318A (en) |
CN (1) | CN116325506A (en) |
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US9362936B1 (en) * | 2015-06-22 | 2016-06-07 | Silicon Laboratories Inc. | Digital-to-time converter |
US9673835B1 (en) * | 2015-12-04 | 2017-06-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Pipelined SAR with TDC converter |
US9678481B1 (en) * | 2016-06-17 | 2017-06-13 | Integrated Device Technologies, Inc. | Fractional divider using a calibrated digital-to-time converter |
WO2018068847A1 (en) * | 2016-10-12 | 2018-04-19 | Huawei Technologies Co., Ltd. | Highly linear digital-to-time converter for low noise all-digital phase locked loop |
US10122378B2 (en) * | 2017-03-16 | 2018-11-06 | Samsung Electronics Co., Ltd. | Digital-to-time converter and operating method thereof |
US11251797B2 (en) * | 2018-01-25 | 2022-02-15 | Sony Semiconductor Solutions Corporation | Time-to-digital converter and phase locked loop |
US10601431B2 (en) * | 2018-06-28 | 2020-03-24 | Silicon Laboratories Inc. | Time-to-voltage converter using correlated double sampling |
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2021
- 2021-11-18 JP JP2023527767A patent/JP2023543337A/en active Pending
- 2021-11-18 KR KR1020237018043A patent/KR20230084318A/en not_active Application Discontinuation
- 2021-11-18 WO PCT/US2021/059956 patent/WO2022119722A2/en active Application Filing
- 2021-11-18 EP EP21827463.7A patent/EP4256708A2/en active Pending
- 2021-11-18 CN CN202180070908.8A patent/CN116325506A/en active Pending
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