WO2022082421A1 - Réseau de détecteurs pouvant être épissés, système d'imagerie et procédé d'imagerie - Google Patents

Réseau de détecteurs pouvant être épissés, système d'imagerie et procédé d'imagerie Download PDF

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Publication number
WO2022082421A1
WO2022082421A1 PCT/CN2020/122133 CN2020122133W WO2022082421A1 WO 2022082421 A1 WO2022082421 A1 WO 2022082421A1 CN 2020122133 W CN2020122133 W CN 2020122133W WO 2022082421 A1 WO2022082421 A1 WO 2022082421A1
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WO
WIPO (PCT)
Prior art keywords
flat panel
panel detector
detector
cover plate
imaging
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PCT/CN2020/122133
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English (en)
Chinese (zh)
Inventor
凌骏
符夏颖
刘建强
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江苏康众数字医疗科技股份有限公司
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Priority to PCT/CN2020/122133 priority Critical patent/WO2022082421A1/fr
Publication of WO2022082421A1 publication Critical patent/WO2022082421A1/fr

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity

Definitions

  • the invention relates to the field of detector imaging, in particular to a splicable detector array, an imaging system and an imaging method.
  • a digital flat panel detector is a key component in a digital X-ray imaging system.
  • the flat panel detector converts information-carrying X-rays into digital signals that can be detected and expressed.
  • a flat-panel detector In order to obtain a larger imaging area, in the prior art, a flat-panel detector is usually used for multiple exposures by changing the position, and imaging cannot be formed by a single exposure.
  • the present invention provides a splicable detector array, an imaging system and an imaging method.
  • the specific technical solutions are as follows:
  • a splicable detector array comprising at least a first flat panel detector and a second flat panel detector, wherein the first flat panel detector and the second flat panel detector each include an upper cover plate, a lower cover plate and an imaging part and a circuit board arranged between the upper cover plate and the lower cover plate, the circuit board is electrically connected to the imaging part, the imaging part is used for converting the ray signal into a charge signal, and the circuit board converts the charge The signal is converted into a digital signal;
  • the first flat panel detector has a first inclined side surface inclined inward from the upper cover plate to the lower cover plate
  • the second flat panel detector has a second inclined side surface inclined outward from the upper cover plate to the lower cover plate
  • the imaging part of the second flat panel detector is arranged in an area opposite to the upper cover plate and an area opposite to the second inclined side surface
  • the first oblique side surface of the first flat panel detector is spliced with the second oblique side surface of the second flat panel detector, so that the imaging part of the first flat panel detector and the imaging part of the second flat panel detector are at the splicing place Partially set up and down.
  • each flat panel detector in the array has at least one first inclined side surface inclined inward from the upper cover plate to the lower cover plate and at least one second inclined side surface inclined outward from the upper cover plate to the lower cover plate.
  • the inclination angles of the first oblique side and the second oblique side on the same flat panel detector are complementary angles to each other, and/or the first oblique side of the first flat panel detector and the second flat panel detector
  • the inclination angles of the second inclined sides are complementary angles to each other.
  • the upper cover plate and the lower cover plate of the flat panel detector are both N-shaped, and the flat panel detector further includes n1 first inclined sides and n2 second inclined sides, wherein n1 and/or n2 are A positive integer, N is a positive integer greater than or equal to 3, and the sum of n1 and n2 is less than or equal to N.
  • each flat panel detector in the array there are contacts and/or sensors for communicating with the adjacent flat panel detectors.
  • each flat panel detector in the array is made of a material capable of penetrating radiation.
  • a detector array for three-dimensional imaging comprising a plurality of flat panel detectors arranged vertically, and an optical machine for emitting rays can be arranged between adjacent flat panel detectors, so that each optical machine After the beam is emitted, it is imaged on the corresponding flat panel detector on the opposite side.
  • an imaging system which includes a radiation source, an imaging display unit and the above-mentioned splicable detector array.
  • the radiation emitted by the radiation source is directed to the upper cover plate of the flat panel detector in the array, so the The imaging display unit is electrically connected to all or part of the circuit boards of the flat panel detectors, and each flat panel detector follows a sequence to perform synchronous work.
  • an imaging method based on the splicable detector array as described above comprising the following steps:
  • step S4 After obtaining the first stitched image in step S4, it also includes the following steps:
  • step S3 includes: using SIFT algorithm to extract feature points from the first image and the second image, using feature vectors to describe the feature points, and then calculating the distance between the feature vectors to realize the feature matching, the distance between the feature vectors is Euclidean distance, Hamming distance or cosine distance.
  • the entire detector array can be operated and imaged as a single detector.
  • Several flat panel detectors work together, and on the application side, it looks like they are operating a detector with a larger imaging area;
  • the appropriate detector splicing method can be flexibly selected according to the application scenario, the system adaptability is enhanced, and the spliced detector array can increase the imaging area;
  • the imaging areas of the spliced flat-panel detectors have overlapping projections at the splicing point, and seamless splicing can be achieved through image processing.
  • FIG. 1 is a partially enlarged schematic diagram of a splicable detector array provided by an embodiment of the present invention
  • FIG. 2 is a schematic diagram of a single structure of a flat panel detector provided by an embodiment of the present invention.
  • FIG. 3 is a schematic diagram of a splicing state of three flat panel detectors that are spliced in a forward direction provided by an embodiment of the present invention
  • FIG. 4 is a schematic diagram of splicing of a detector array for three-dimensional imaging according to an embodiment of the present invention.
  • the reference numerals include: 1-upper cover plate, 2-imaging part, 3-circuit board, 4-support frame, 5-lower cover plate, 6-flat panel detector, 61-first flat panel detector, 611- The first inclined side, 62 - the second flat panel detector, 621 - the second inclined side.
  • a splicable detector array includes at least a first flat panel detector 61 and a second flat panel detector 62.
  • the first flat panel Both the detector 61 and the second flat panel detector 62 include an upper cover plate 1, a lower cover plate 5, an imaging part 2, a support frame 4 and a circuit board 3 arranged between the upper cover plate 1 and the lower cover plate 5, a support frame 4 and a circuit board 3.
  • the upper cover 1 of each of the flat panel detectors 6 is made of a material capable of penetrating rays.
  • the upper cover 1 is made of an X-ray highly transparent material (this
  • the support frame 4 is used to support the imaging part 2, the circuit board 3 is optionally mounted on the support frame 4, and the support frame 4 adopts snap connection or bonding or locking parts (such as screws, screws or bolts) to be fixed on the inner wall of the detector, or, the support frame 4 can be integrally formed with the inner wall of the detector; the circuit board 3 is installed on the support frame 4
  • the specific location is not limited, the circuit board 3 is electrically connected with the imaging part 2, the imaging part 2 is used to convert the ray signal into a charge signal, and the circuit board 3 converts the charge signal into a digital signal, to achieve the above
  • the technology of converting the ray signal into the charge signal includes but is not limited to the indirect conversion technology of amorphous silicon or the direct conversion technology of amorphous selenium;
  • the first flat panel detector 61 has a first inclined side surface 611 inclined inward from the upper cover plate 1 of the first flat panel detector 61 to the lower cover plate 5
  • the second flat panel detector 62 has a detection surface from the second flat panel detector 61 .
  • the first inclined side 611 of the first flat panel detector 61 and the second flat panel detector 62 The inclination angles of the second inclined side surfaces 621 are complementary angles to each other; the imaging part 2 of the second flat panel detector 62 has a flexible substrate. Since the imaging part 2 is a flexible structure, the second flat panel detector 62 The imaging part 2 can extend from the upper cover plate 1 to the second inclined side 621 , so that imaging can be performed on both the horizontal plane and the inclined plane.
  • the first inclined side 611 and the first inclined side of the second flat panel detector 62 are also made of materials that can penetrate rays; it should be noted that the flexible structure of the imaging portion 2 is only a preferred embodiment.
  • the second flat panel detector The imaging part 2 of 62 may include a first part arranged opposite to the upper cover 1 and a second part arranged opposite to the second inclined side surface 621, and the technical scheme of splicing these two parts of the imaging part 2 can be used as a flexible structure.
  • the present invention claims protection regardless of whether the imaging portion 2 of the detector is a flexible structure.
  • the first oblique side surface 611 of the first flat panel detector 61 is spliced with the second oblique side surface 621 of the second flat panel detector 62, so that the imaging part 2 of the first flat panel detector 61 and the second flat panel detector 61 are connected to each other.
  • the imaging part 2 of the 62 is partially set up and down at the splicing part, and "partially set up and down” should be understood as the imaging part 2 of the first flat panel detector 61 and the imaging part 2 of the second flat panel detector 62 are located at the splicing part.
  • the lower cover 5 The projections on the image have overlapping parts for seamless stitching of subsequent image stitching.
  • the thickness of the X-ray photon absorbing material of the imaging part 2 (such as the scintillator that converts X-rays into visible light in the indirect conversion technology of amorphous silicon) at the main plane and extending to the inclined plane can be adjusted, so that The sensitivities of the main plane and the inclined plane are basically the same, which improves the uniformity of the images obtained on the main plane and the inclined plane.
  • the specific thickness adjustment data can be obtained through experiments.
  • FIG. 2 shows one of the flat panel detectors 6 in the detector array.
  • each flat panel detector 6 in the array has at least one inward inclination from the upper cover plate 1 to the lower cover plate 5
  • the angles are set to be complementary angles to each other, which can be set on opposite sides as shown in Figure 2.
  • One of the positive splicing methods of the multiple flat panel detectors 6 is shown in Figure 3.
  • the flat panel detectors can also be set.
  • the upper cover plate and the lower cover plate are both N-sided, and the flat panel detector further includes n1 (integer) first inclined sides and n2 (integer) second inclined sides, wherein n1 and/or n2 are positive integers, That is, n1 and n2 may not be zero at the same time.
  • n1 and/or n2 are positive integers, That is, n1 and n2 may not be zero at the same time.
  • one flat panel detector 6 only has the first inclined side, and the other flat panel detector 6 only has the second inclined side. Then the two flat panel detectors 6 can be spliced.
  • Both n1 and n2 may be non-zero; N is a positive integer greater than or equal to 3, and the sum of n1 and n2 is less than or equal to N, that is, the present invention does not limit each surface to be an oblique side, where n1 may be equal to n2, It can also be different.
  • the first oblique side 611 and the second oblique side 621 on the same detector can be arranged on the adjacent side or on the non-adjacent side (not shown), and the present invention is not limited to the array.
  • Different flat panel detectors have the same shape and size, for example, a detector array (not shown) can be obtained by splicing regular octagons and squares.
  • the present invention does not limit the inclination angles of the first oblique side surface 611 and the second oblique side surface 621 (that is, the angle between the oblique side surface and the horizontal plane) to be complementary angles to each other.
  • the part of the part 2 extending to the second inclined side 621 can be partially overlapped with the projection of the imaging part 2 of the first flat panel detector 61, even if the first inclined side 611 and the second inclined side 621
  • the angle of inclination that is, the angle between the inclined side and the horizontal plane
  • this structure should also be considered to fall within the protection scope claimed by the present invention.
  • a detector array for three-dimensional imaging is provided, which is used in a static CT application scenario.
  • the detector array includes a plurality of vertically arranged flat panel detectors 6 , an optical machine for emitting rays can be arranged between adjacent flat panel detectors 6 , so that each optical machine is imaged on the corresponding flat panel detector 6 on the opposite side after emitting a beam.
  • the five flat panel detectors 6 may form a circle, the first inclined side 611 on any one flat panel detector 6 is spliced with the second inclined side 621 on the adjacent flat panel detector 6, and any one flat panel detector 6
  • the second oblique side surface 621 on the upper panel is spliced with the first oblique side surface 611 on the adjacent flat panel detector 6, as shown in FIG.
  • the optomechanical between the detectors 1 and 2 is imaged on the detector 4 after the beam is emitted, and the detectors 2 and 3 are imaged. After the optical-mechanical beam between No. 3 and No. 4 is beamed out, it will be imaged on the detector 5, the optical-mechanical beam between the No.
  • 3 and No. 4 detectors will be imaged on the No. 1 detector, the light between the No. 4 and No. 5 detectors.
  • the X-ray machine After the X-ray machine is out of the beam, it will be imaged on the detector 2, and the optical machine between the detectors of 5 and 1 will be imaged on the detector of 3 after the beam is out.
  • the detectors work together, i.e. acquire images simultaneously, and the imaging on the last five detectors can be used for 3D reconstruction.
  • the present invention does not limit the specific number of detectors in the three-dimensional detector array.
  • the X-ray machine is in ping-pong mode, that is, only one X-ray machine emits light at a certain time, and then the X-ray machine emits light in sequence, and the detectors opposite the light-emitting machine must take pictures.
  • other detectors may not necessarily It has to work together, and even if they are synchronised, they are only collecting scattered rays.
  • an imaging system including a radiation source, an imaging display unit and the above-mentioned splicable detector array, the radiation emitted by the radiation source is directed to the flat panel detector 6 in the array
  • the imaging display unit is electrically connected to the circuit board 3 of all or part of the flat panel detectors 6; /or the second inclined side surface 621 is provided with contacts and/or sensors for communicating with the adjacent flat panel detectors 6, so that each flat panel detector 6 operates synchronously according to a sequence.
  • the functions of the physical contacts and/or sensors include at least the following two aspects:
  • the positional relationship between the spliced flat panel detectors 6 can be determined to determine the splicing mode of their respective imaging (the images collected by each of the flat panel detectors 6 can be corresponding to the relative positions of the flat panel detectors 6 . splicing);
  • the imaging unit 2 Based on the imaging principle as described above, the imaging unit 2 outputs a charge signal converted from visible light, and the charge signal is converted into a digital signal by the circuit board 3 and then displayed by the imaging display unit.
  • a central timing control unit can be set up, and under the control of the central timing control unit, each of the flat panel detectors of the detector array follows a time sequence (referred to as timing sequence) for synchronous work.
  • the images collected by the flat panel detector can be time-series marked by the circuit board.
  • the timing sequence of the flat panel detectors of the detector array can interact with the external timing sequence through the central timing control unit and the so-called single interface.
  • the imaging display unit may be electrically connected to the circuit board 3 of only one of the flat panel detectors 6 (become the master detector) (the other flat panel detectors 6 become slave detectors, all communicate with the main detector), obviously, it can also be electrically connected to the circuit boards 3 of a plurality of or even all of the flat panel detectors 6 .
  • an imaging method based on the above-mentioned splicable detector array comprising the following steps:
  • the positional relationship between the left and right splicing of the first flat panel detector and the second flat panel detector can be known.
  • the first image information and the second image information are also spliced according to the positional relationship of left and right splicing, because the imaging areas of the respective imaging parts 2 of the first flat panel detector and the second flat panel detector overlap in projection (Refer to the above for details), therefore, the first image information obtained by imaging and the second image information have the same image features at the splicing position, and the same image feature area should be a strip parallel to the oblique side of the detector.
  • the width depends on the width of the overlapping area on the projection.
  • Image feature matching can use conventional image recognition algorithms in the prior art, for example, using SIFT (Scale Invariance Feature Transform, scale invariant feature transform) algorithm to extract key points (or feature points, corner points) from the image, using mathematical The vector describes the feature points, and then the distance between the feature vectors (such as Euclidean distance, Hamming distance, and cosine distance) is calculated to realize feature matching.
  • SIFT Scale Invariance Feature Transform, scale invariant feature transform
  • the vector describes the feature points, and then the distance between the feature vectors (such as Euclidean distance, Hamming distance, and cosine distance) is calculated to realize feature matching.
  • the present invention does not specifically limit the specific algorithm of image feature matching to be the SIFT algorithm.
  • ORB Oriented Fast and Rotated Brief
  • the direct splicing of the first image information and the second image information will lead to repeated imaging at the splicing place (that is, the image of the first feature matching area that exists in both the first image information and the second image information)
  • the above two The purpose of the splicing method is to remove an extra piece of image information, that is, the image information of the first feature matching area, from the simple and directly spliced image.
  • the imaging method can perform the following steps after obtaining the first spliced image information according to S4:

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Abstract

Réseau de détecteurs pouvant être épissés, système d'imagerie et procédé d'imagerie. Le réseau de détecteurs comprend au moins un premier détecteur plan (61) et un second détecteur plan (62) ; le premier détecteur plan (61) et le second détecteur plan (62) comprenant chacun une plaque de recouvrement supérieure (1), une plaque de recouvrement inférieure (5), et une partie d'imagerie (2) et une carte de circuit imprimé (3) qui sont disposées entre la plaque de recouvrement supérieure (1) et la plaque de recouvrement inférieure (5), la carte de circuit imprimé (3) est électriquement connectée à la partie d'imagerie (2), la partie d'imagerie (2) convertit un signal de rayonnement en un signal de charge, et la carte de circuit imprimé (3) convertit le signal de charge en un signal numérique ; le premier détecteur plan (61) présente une première face latérale inclinée (611) qui est inclinée vers l'intérieur à partir de la plaque de recouvrement supérieure (1) jusqu'à la plaque de recouvrement inférieure (5), le second détecteur plan (62) présente une seconde face latérale inclinée (621) qui est inclinée vers l'extérieur à partir de la plaque de recouvrement supérieure (1) jusqu'à la plaque de recouvrement inférieure (5), la partie d'imagerie (2) du second détecteur plan (62) est pourvue d'un substrat flexible, et la partie d'imagerie (2) du second détecteur plan s'étend à partir de la plaque de recouvrement supérieure (1) jusqu'à la seconde face latérale inclinée (621) ; et les deux détecteurs plans sont épissés dans une direction avant, de telle sorte que les parties d'imagerie (2) des deux détecteurs plans sont disposés vers le haut et vers le bas au niveau de la partie d'épissage des deux faces latérales inclinées.
PCT/CN2020/122133 2020-10-20 2020-10-20 Réseau de détecteurs pouvant être épissés, système d'imagerie et procédé d'imagerie WO2022082421A1 (fr)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115083296A (zh) * 2022-06-20 2022-09-20 湖北长江新型显示产业创新中心有限公司 显示装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102445703A (zh) * 2010-10-12 2012-05-09 上海生物医学工程研究中心 基于无缝拼接的光电传感探测器及制备方法
CN106153648A (zh) * 2016-06-22 2016-11-23 深圳先进技术研究院 一种静态高分辨显微ct成像系统及应用其的成像方法
US20180070899A1 (en) * 2014-11-17 2018-03-15 Carestream Health, Inc. Tiled digital radiography detectors for long-length imaging
CN108577876A (zh) * 2018-02-28 2018-09-28 西安交通大学 一种多边形静止ct及其工作方法
US10278655B2 (en) * 2015-03-17 2019-05-07 Toshiba Medical Systems Corporation Photographing device
CN110267033A (zh) * 2019-07-18 2019-09-20 江苏康众数字医疗科技股份有限公司 拼接平板探测器及其拼接方法、成像系统及其成像方法
CN110664422A (zh) * 2019-09-09 2020-01-10 东软医疗系统股份有限公司 探测器模块、探测器及医疗成像设备

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102445703A (zh) * 2010-10-12 2012-05-09 上海生物医学工程研究中心 基于无缝拼接的光电传感探测器及制备方法
US20180070899A1 (en) * 2014-11-17 2018-03-15 Carestream Health, Inc. Tiled digital radiography detectors for long-length imaging
US10278655B2 (en) * 2015-03-17 2019-05-07 Toshiba Medical Systems Corporation Photographing device
CN106153648A (zh) * 2016-06-22 2016-11-23 深圳先进技术研究院 一种静态高分辨显微ct成像系统及应用其的成像方法
CN108577876A (zh) * 2018-02-28 2018-09-28 西安交通大学 一种多边形静止ct及其工作方法
CN110267033A (zh) * 2019-07-18 2019-09-20 江苏康众数字医疗科技股份有限公司 拼接平板探测器及其拼接方法、成像系统及其成像方法
CN110664422A (zh) * 2019-09-09 2020-01-10 东软医疗系统股份有限公司 探测器模块、探测器及医疗成像设备

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115083296A (zh) * 2022-06-20 2022-09-20 湖北长江新型显示产业创新中心有限公司 显示装置
CN115083296B (zh) * 2022-06-20 2023-09-15 湖北长江新型显示产业创新中心有限公司 显示装置

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