WO2022082421A1

WO2022082421A1 - Spliceable detector array, imaging system and imaging method

Info

Publication number: WO2022082421A1
Application number: PCT/CN2020/122133
Authority: WO
Inventors: 凌骏; 符夏颖; 刘建强
Original assignee: 江苏康众数字医疗科技股份有限公司
Priority date: 2020-10-20
Filing date: 2020-10-20
Publication date: 2022-04-28

Abstract

A spliceable detector array, an imaging system, and an imaging method. The detector array at least comprises a first flat panel detector (61) and a second flat panel detector (62); the first flat panel detector (61) and the second flat panel detector (62) each comprise an upper cover plate (1), a lower cover plate (5), and an imaging portion (2) and a circuit board (3) which are arranged between the upper cover plate (1) and the lower cover plate (5), wherein the circuit board (3) is electrically connected to the imaging portion (2), the imaging portion (2) converts a ray signal into a charge signal, and the circuit board (3) converts the charge signal into a digital signal; the first flat panel detector (61) has a first inclined side face (611) that is inwardly inclined from the upper cover plate (1) to the lower cover plate (5), the second flat panel detector (62) has a second inclined side face (621) that is outwardly inclined from the upper cover plate (1) to the lower cover plate (5), the imaging portion (2) of the second flat panel detector (62) is provided with a flexible substrate, and the imaging portion (2) of the second flat panel detector extends from the upper cover plate (1) to the second inclined side face (621); and the two flat panel detectors are spliced in a forward direction, such that the imaging portions (2) of the two flat panel detectors are arranged up and down at the splicing part of the two inclined side faces.

Description

Stitchable detector array, imaging system and imaging method

technical field

The invention relates to the field of detector imaging, in particular to a splicable detector array, an imaging system and an imaging method.

Background technique

A digital flat panel detector is a key component in a digital X-ray imaging system. In a digital X-ray imaging system, the flat panel detector converts information-carrying X-rays into digital signals that can be detected and expressed.

Most of the digital X-ray flat panel detectors currently on the market are individuals that work independently. Except for data transmission and sharing, there is no other function of cooperation between the detectors. The so-called cooperative work refers to the joint work of several detectors after splicing without changing the original interface and synchronization mechanism. On the application side, it seems as if they are operating a detector with a larger imaging area.

In order to obtain a larger imaging area, in the prior art, a flat-panel detector is usually used for multiple exposures by changing the position, and imaging cannot be formed by a single exposure.

SUMMARY OF THE INVENTION

In order to overcome the deficiencies in the prior art, the present invention provides a splicable detector array, an imaging system and an imaging method. The specific technical solutions are as follows:

In one aspect, a splicable detector array is disclosed, comprising at least a first flat panel detector and a second flat panel detector, wherein the first flat panel detector and the second flat panel detector each include an upper cover plate, a lower cover plate and an imaging part and a circuit board arranged between the upper cover plate and the lower cover plate, the circuit board is electrically connected to the imaging part, the imaging part is used for converting the ray signal into a charge signal, and the circuit board converts the charge The signal is converted into a digital signal;

The first flat panel detector has a first inclined side surface inclined inward from the upper cover plate to the lower cover plate, and the second flat panel detector has a second inclined side surface inclined outward from the upper cover plate to the lower cover plate, The imaging part of the second flat panel detector is arranged in an area opposite to the upper cover plate and an area opposite to the second inclined side surface;

The first oblique side surface of the first flat panel detector is spliced with the second oblique side surface of the second flat panel detector, so that the imaging part of the first flat panel detector and the imaging part of the second flat panel detector are at the splicing place Partially set up and down.

Further, each flat panel detector in the array has at least one first inclined side surface inclined inward from the upper cover plate to the lower cover plate and at least one second inclined side surface inclined outward from the upper cover plate to the lower cover plate. .

Further, the inclination angles of the first oblique side and the second oblique side on the same flat panel detector are complementary angles to each other, and/or the first oblique side of the first flat panel detector and the second flat panel detector The inclination angles of the second inclined sides are complementary angles to each other.

Further, the upper cover plate and the lower cover plate of the flat panel detector are both N-shaped, and the flat panel detector further includes n1 first inclined sides and n2 second inclined sides, wherein n1 and/or n2 are A positive integer, N is a positive integer greater than or equal to 3, and the sum of n1 and n2 is less than or equal to N.

Further, on the first inclined side and/or the second inclined side of each flat panel detector in the array, there are contacts and/or sensors for communicating with the adjacent flat panel detectors.

Further, the upper cover of each flat panel detector in the array is made of a material capable of penetrating radiation.

In another aspect, a detector array for three-dimensional imaging is disclosed, comprising a plurality of flat panel detectors arranged vertically, and an optical machine for emitting rays can be arranged between adjacent flat panel detectors, so that each optical machine After the beam is emitted, it is imaged on the corresponding flat panel detector on the opposite side.

On the other hand, an imaging system is disclosed, which includes a radiation source, an imaging display unit and the above-mentioned splicable detector array. The radiation emitted by the radiation source is directed to the upper cover plate of the flat panel detector in the array, so the The imaging display unit is electrically connected to all or part of the circuit boards of the flat panel detectors, and each flat panel detector follows a sequence to perform synchronous work.

In yet another aspect, an imaging method based on the splicable detector array as described above is disclosed, comprising the following steps:

S1, splicing the first flat-panel detector and the second flat-panel detector in the detector array in a forward direction, and turning on the ray source, the ray source is directed to the upper cover plates of the two flat-panel detectors;

S2, using the first flat-panel detector to obtain first image information, and using the second flat-panel detector to obtain second image information;

S3, performing image feature matching on the first image information and the second image information to obtain a first feature matching area;

S4, splicing the remaining part of the first feature matching area from the first image information and splicing the second image information, or removing the remaining part of the first feature matching area from the second image information Perform splicing with the first image information to obtain a first spliced image.

Further, after obtaining the first stitched image in step S4, it also includes the following steps:

S5. Obtain third image information by using a third flat panel detector in the detector array, wherein the third flat panel detector and the second flat panel detector are spliced in a forward direction;

S6, performing image feature matching on the third image information and the first stitched image information to obtain a second feature matching area;

S7, splicing the remaining part of the second feature matching area from the first spliced image information and splicing the third image information, or removing the third image information from the remaining part of the second feature matching area Part is spliced with the first spliced image information to obtain a second spliced image.

Further, step S3 includes: using SIFT algorithm to extract feature points from the first image and the second image, using feature vectors to describe the feature points, and then calculating the distance between the feature vectors to realize the feature matching, the distance between the feature vectors is Euclidean distance, Hamming distance or cosine distance.

The beneficial effects brought by the technical solution of the present invention include:

(a) The entire detector array can be operated and imaged as a single detector. Several flat panel detectors work together, and on the application side, it looks like they are operating a detector with a larger imaging area;

(b) The appropriate detector splicing method can be flexibly selected according to the application scenario, the system adaptability is enhanced, and the spliced detector array can increase the imaging area;

(c) The imaging areas of the spliced flat-panel detectors have overlapping projections at the splicing point, and seamless splicing can be achieved through image processing.

Description of drawings

In order to illustrate the technical solutions in the embodiments of the present invention more clearly, the following briefly introduces the accompanying drawings used in the description of the embodiments. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can also be obtained from these drawings without creative effort.

1 is a partially enlarged schematic diagram of a splicable detector array provided by an embodiment of the present invention;

2 is a schematic diagram of a single structure of a flat panel detector provided by an embodiment of the present invention;

3 is a schematic diagram of a splicing state of three flat panel detectors that are spliced in a forward direction provided by an embodiment of the present invention;

FIG. 4 is a schematic diagram of splicing of a detector array for three-dimensional imaging according to an embodiment of the present invention.

Wherein, the reference numerals include: 1-upper cover plate, 2-imaging part, 3-circuit board, 4-support frame, 5-lower cover plate, 6-flat panel detector, 61-first flat panel detector, 611- The first inclined side, 62 - the second flat panel detector, 621 - the second inclined side.

Detailed ways

In order to make those skilled in the art better understand the solution of the present invention, and more clearly understand the purpose, technical solution and advantages of the present invention, the technical solutions in the embodiments of the present invention will be clarified below in conjunction with specific embodiments and with reference to the accompanying drawings. full description. Obviously, the described embodiments are only some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention. In addition, the terms "comprising" and "having" and any variations thereof in the description and claims of the present invention are intended to cover non-exclusive inclusion, for example, a process, method, device comprising a series of steps or units , products or devices are not necessarily limited to those steps or units expressly listed, but may include other steps or units not expressly listed or inherent to these processes, methods, products or devices.

In one embodiment of the present invention, a splicable detector array is provided. Referring to FIG. 1 , the detector array includes at least a first flat panel detector 61 and a second flat panel detector 62. The first flat panel Both the detector 61 and the second flat panel detector 62 include an upper cover plate 1, a lower cover plate 5, an imaging part 2, a support frame 4 and a circuit board 3 arranged between the upper cover plate 1 and the lower cover plate 5, a support frame 4 and a circuit board 3. The upper cover 1 of each of the flat panel detectors 6 is made of a material capable of penetrating rays. Taking X-rays as an example, in this embodiment, the upper cover 1 is made of an X-ray highly transparent material (this The support frame 4 is used to support the imaging part 2, the circuit board 3 is optionally mounted on the support frame 4, and the support frame 4 adopts snap connection or bonding or locking parts (such as screws, screws or bolts) to be fixed on the inner wall of the detector, or, the support frame 4 can be integrally formed with the inner wall of the detector; the circuit board 3 is installed on the support frame 4 The specific location is not limited, the circuit board 3 is electrically connected with the imaging part 2, the imaging part 2 is used to convert the ray signal into a charge signal, and the circuit board 3 converts the charge signal into a digital signal, to achieve the above The technology of converting the ray signal into the charge signal includes but is not limited to the indirect conversion technology of amorphous silicon or the direct conversion technology of amorphous selenium;

The first flat panel detector 61 has a first inclined side surface 611 inclined inward from the upper cover plate 1 of the first flat panel detector 61 to the lower cover plate 5 , and the second flat panel detector 62 has a detection surface from the second flat panel detector 61 . In this embodiment, the first inclined side 611 of the first flat panel detector 61 and the second flat panel detector 62 The inclination angles of the second inclined side surfaces 621 are complementary angles to each other; the imaging part 2 of the second flat panel detector 62 has a flexible substrate. Since the imaging part 2 is a flexible structure, the second flat panel detector 62 The imaging part 2 can extend from the upper cover plate 1 to the second inclined side 621 , so that imaging can be performed on both the horizontal plane and the inclined plane. Obviously, at least the first inclined side 611 and the first inclined side of the second flat panel detector 62 . The two inclined sides 621 are also made of materials that can penetrate rays; it should be noted that the flexible structure of the imaging portion 2 is only a preferred embodiment. In an embodiment of the present invention, the second flat panel detector The imaging part 2 of 62 may include a first part arranged opposite to the upper cover 1 and a second part arranged opposite to the second inclined side surface 621, and the technical scheme of splicing these two parts of the imaging part 2 can be used as a flexible structure. As an alternative to the imaging portion 2 of the detector, the present invention claims protection regardless of whether the imaging portion 2 of the detector is a flexible structure.

The first oblique side surface 611 of the first flat panel detector 61 is spliced with the second oblique side surface 621 of the second flat panel detector 62, so that the imaging part 2 of the first flat panel detector 61 and the second flat panel detector 61 are connected to each other. The imaging part 2 of the 62 is partially set up and down at the splicing part, and "partially set up and down" should be understood as the imaging part 2 of the first flat panel detector 61 and the imaging part 2 of the second flat panel detector 62 are located at the splicing part. The lower cover 5 The projections on the image have overlapping parts for seamless stitching of subsequent image stitching. At the same time, as a pre-compensation mechanism, the thickness of the X-ray photon absorbing material of the imaging part 2 (such as the scintillator that converts X-rays into visible light in the indirect conversion technology of amorphous silicon) at the main plane and extending to the inclined plane can be adjusted, so that The sensitivities of the main plane and the inclined plane are basically the same, which improves the uniformity of the images obtained on the main plane and the inclined plane. The specific thickness adjustment data can be obtained through experiments.

FIG. 2 shows one of the flat panel detectors 6 in the detector array. In one embodiment of the present invention, each flat panel detector 6 in the array has at least one inward inclination from the upper cover plate 1 to the lower cover plate 5 The first inclined side 611 and at least one second inclined side 621 inclined outward from the upper cover 1 to the lower cover 5, the inclination of the first inclined side 611 and the second inclined side 621 on the same flat panel detector 6 The angles are set to be complementary angles to each other, which can be set on opposite sides as shown in Figure 2. One of the positive splicing methods of the multiple flat panel detectors 6 is shown in Figure 3. In addition, the flat panel detectors can also be set. The upper cover plate and the lower cover plate are both N-sided, and the flat panel detector further includes n1 (integer) first inclined sides and n2 (integer) second inclined sides, wherein n1 and/or n2 are positive integers, That is, n1 and n2 may not be zero at the same time. For example, one flat panel detector 6 only has the first inclined side, and the other flat panel detector 6 only has the second inclined side. Then the two flat panel detectors 6 can be spliced. Obviously, Both n1 and n2 may be non-zero; N is a positive integer greater than or equal to 3, and the sum of n1 and n2 is less than or equal to N, that is, the present invention does not limit each surface to be an oblique side, where n1 may be equal to n2, It can also be different. The first oblique side 611 and the second oblique side 621 on the same detector can be arranged on the adjacent side or on the non-adjacent side (not shown), and the present invention is not limited to the array. Different flat panel detectors have the same shape and size, for example, a detector array (not shown) can be obtained by splicing regular octagons and squares.

It should be noted that the present invention does not limit the inclination angles of the first oblique side surface 611 and the second oblique side surface 621 (that is, the angle between the oblique side surface and the horizontal plane) to be complementary angles to each other. The part of the part 2 extending to the second inclined side 621 can be partially overlapped with the projection of the imaging part 2 of the first flat panel detector 61, even if the first inclined side 611 and the second inclined side 621 The angle of inclination (that is, the angle between the inclined side and the horizontal plane) is not complementary, and this structure should also be considered to fall within the protection scope claimed by the present invention.

In an embodiment of the present invention, a detector array for three-dimensional imaging is provided, which is used in a static CT application scenario. As shown in FIG. 4 , the detector array includes a plurality of vertically arranged flat panel detectors 6 , an optical machine for emitting rays can be arranged between adjacent flat panel detectors 6 , so that each optical machine is imaged on the corresponding flat panel detector 6 on the opposite side after emitting a beam.

Specifically, the five flat panel detectors 6 may form a circle, the first inclined side 611 on any one flat panel detector 6 is spliced with the second inclined side 621 on the adjacent flat panel detector 6, and any one flat panel detector 6 The second oblique side surface 621 on the upper panel is spliced with the first oblique side surface 611 on the adjacent flat panel detector 6, as shown in FIG. There is an optomechanical (not shown) between the two flat panel detectors 6. The optomechanical between the

detectors

① and ② is imaged on the detector ④ after the beam is emitted, and the

detectors

② and ③ are imaged. After the optical-mechanical beam between No. 3 and No. ④ is beamed out, it will be imaged on the detector ⑤, the optical-mechanical beam between the No. 3 and No. ④ detectors will be imaged on the No. 1 detector, the light between the No. 4 and No. ⑤ detectors. After the X-ray machine is out of the beam, it will be imaged on the detector ②, and the optical machine between the detectors of ⑤ and ① will be imaged on the detector of ③ after the beam is out. The detectors work together, i.e. acquire images simultaneously, and the imaging on the last five detectors can be used for 3D reconstruction. Obviously, the present invention does not limit the specific number of detectors in the three-dimensional detector array. If the X-ray machine is in ping-pong mode, that is, only one X-ray machine emits light at a certain time, and then the X-ray machine emits light in sequence, and the detectors opposite the light-emitting machine must take pictures. In this case, other detectors may not necessarily It has to work together, and even if they are synchronised, they are only collecting scattered rays.

In one embodiment of the present invention, an imaging system is provided, including a radiation source, an imaging display unit and the above-mentioned splicable detector array, the radiation emitted by the radiation source is directed to the flat panel detector 6 in the array The imaging display unit is electrically connected to the circuit board 3 of all or part of the flat panel detectors 6; /or the second inclined side surface 621 is provided with contacts and/or sensors for communicating with the adjacent flat panel detectors 6, so that each flat panel detector 6 operates synchronously according to a sequence. Wherein, the functions of the physical contacts and/or sensors include at least the following two aspects:

First, the positional relationship between the spliced flat panel detectors 6 can be determined to determine the splicing mode of their respective imaging (the images collected by each of the flat panel detectors 6 can be corresponding to the relative positions of the flat panel detectors 6 . splicing);

Second, realize the cooperative work of all the flat panel detectors 6 in the sensor array, even if each flat panel detector of the detector array follows a time sequence (referred to as time sequence) to work synchronously, to ensure that the subsequent splicing of each image is consistent. Synchronize timing to improve imaging accuracy after splicing.

Based on the imaging principle as described above, the imaging unit 2 outputs a charge signal converted from visible light, and the charge signal is converted into a digital signal by the circuit board 3 and then displayed by the imaging display unit. A central timing control unit can be set up, and under the control of the central timing control unit, each of the flat panel detectors of the detector array follows a time sequence (referred to as timing sequence) for synchronous work. The images collected by the flat panel detector can be time-series marked by the circuit board. Specifically, the timing sequence of the flat panel detectors of the detector array can interact with the external timing sequence through the central timing control unit and the so-called single interface. In the case where multiple flat panel detectors work together, the imaging display unit may be electrically connected to the circuit board 3 of only one of the flat panel detectors 6 (become the master detector) (the other flat panel detectors 6 become slave detectors, all communicate with the main detector), obviously, it can also be electrically connected to the circuit boards 3 of a plurality of or even all of the flat panel detectors 6 .

The features and splicing methods of the detectors in the detector array are as described in the above-mentioned embodiments, and the structural features and array splicing methods of the detector arrays in the above-mentioned embodiments are incorporated into this imaging system embodiment by reference, instead of Repeat.

It should be noted that the electrical connection described above should be considered to include both wired electrical connection and wireless connection.

In one embodiment of the present invention, there is provided an imaging method based on the above-mentioned splicable detector array, comprising the following steps:

S1. Forward splicing of the first flat panel detector and the second flat panel detector in the detector array (for the specific structure and splicing method of the detectors, refer to the above-mentioned embodiment, which will not be repeated here), turn on the ray source, and the ray source Shoots towards the top cover of the two flat panel detectors.

S2. Use the first flat panel detector to acquire first image information, and use the second flat panel detector to acquire second image information.

S3. Perform image feature matching on the first image information and the second image information to obtain a first feature matching area.

Specifically, when the first flat panel detector and the second flat panel detector communicate through side physical contacts or sensors, for example, the positional relationship between the left and right splicing of the first flat panel detector and the second flat panel detector can be known. , correspondingly, the first image information and the second image information are also spliced according to the positional relationship of left and right splicing, because the imaging areas of the respective imaging parts 2 of the first flat panel detector and the second flat panel detector overlap in projection (Refer to the above for details), therefore, the first image information obtained by imaging and the second image information have the same image features at the splicing position, and the same image feature area should be a strip parallel to the oblique side of the detector. The width depends on the width of the overlapping area on the projection. Image feature matching can use conventional image recognition algorithms in the prior art, for example, using SIFT (Scale Invariance Feature Transform, scale invariant feature transform) algorithm to extract key points (or feature points, corner points) from the image, using mathematical The vector describes the feature points, and then the distance between the feature vectors (such as Euclidean distance, Hamming distance, and cosine distance) is calculated to realize feature matching. The present invention does not specifically limit the specific algorithm of image feature matching to be the SIFT algorithm. Like other well-known ORB (Oriented Fast and Rotated Brief) algorithms, methods based on grayscale matching, and so on.

Because the direct splicing of the first image information and the second image information will lead to repeated imaging at the splicing place (that is, the image of the first feature matching area that exists in both the first image information and the second image information), the above two The purpose of the splicing method is to remove an extra piece of image information, that is, the image information of the first feature matching area, from the simple and directly spliced image.

The above is an image imaging method corresponding to the splicing of two detectors. For a detector array spliced with three detectors, the imaging method can perform the following steps after obtaining the first spliced image information according to S4:

S7, splicing the remaining part of the second feature matching area from the first spliced image information and splicing the third image information, or removing the third image information from the remaining part of the second feature matching area Part is spliced with the first spliced image information to obtain a second spliced image, and the specific method for obtaining the second spliced image information is the same as S4.

For a detector array with more than four detectors spliced, in the same way as above, feature matching (see S3) and de-duplication stitching (see S4) between the stitched image and the unstitched detector imaging can be performed repeatedly. Obviously, timing synchronization of each detector of the detector array is necessary, especially when the imaged object is a non-stationary object, it must be ensured that the partial images formed by each detector are formed at the same time.

The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection of the present invention. within the range.

Claims

A splicable detector array, characterized in that it comprises at least a first flat panel detector (61) and a second flat panel detector (62), the first flat panel detector (61) and the second flat panel detector (62) ) each includes an upper cover plate (1), a lower cover plate (5), an imaging part (2) and a circuit board (3) arranged between the upper cover plate (1) and the lower cover plate (5), the circuit The board (3) is electrically connected to the imaging part (2), the imaging part (2) is used for converting the ray signal into a charge signal, and the circuit board (3) converts the charge signal into a digital signal;

The first flat panel detector (61) has a first inclined side surface (611) inclined inward from the upper cover plate (1) to the lower cover plate (5), and the second flat panel detector (62) has an upward The cover plate (1) has a second inclined side surface (621) of the lower cover plate (5) inclined outward, and the imaging part (2) of the second flat panel detector (62) is arranged on the upper cover plate (1) ) opposite area and the area opposite to the second inclined side surface (621);

The first oblique side surface (611) of the first flat panel detector (61) is spliced with the second oblique side surface (621) of the second flat panel detector (62), so that the first flat panel detector (61) The imaging part (2) of the second flat panel detector (62) and the imaging part (2) of the second flat panel detector (62) are partially arranged up and down at the splicing part.
The splicable detector array according to claim 1, characterized in that, each flat panel detector (6) in the array has at least one inwardly inclined from the upper cover plate (1) to the lower cover plate (5). A first inclined side surface (611) and at least one second inclined side surface (621) inclined outward from the upper cover plate (1) to the lower cover plate (5).
The splicable detector array according to claim 2, wherein the inclination angles of the first oblique side surface (611) and the second oblique side surface (621) on the same flat panel detector (6) are complementary angles to each other, And/or the inclination angles of the first inclined side surface (611) of the first flat panel detector (61) and the second inclined side surface (621) of the second flat panel detector (62) are complementary angles to each other.
The splicable detector array according to claim 2, wherein the upper cover plate (1) and the lower cover plate (5) of the flat panel detector (6) are both N-sided, and the flat panel detector (6) It also includes n1 first inclined sides (611) and n2 second inclined sides (621), wherein n1 and/or n2 are positive integers, N is a positive integer greater than or equal to 3, and the difference between n1 and n2 and less than or equal to N.
The splicable detector array according to claim 1, characterized in that, the first inclined side (611) and/or the second inclined side (621) of each flat panel detector (6) in the array is provided with a Contacts and/or sensors that communicate with adjacent flat panel detectors (6).
A detector array for three-dimensional imaging, characterized in that it comprises a plurality of flat panel detectors (6) arranged vertically, and an optical machine for emitting rays can be arranged between adjacent flat panel detectors (6), so that After each optical machine emits a beam, an image is formed on the corresponding flat panel detector (6) on the opposite side.
An imaging system, characterized in that it comprises a radiation source, an imaging display unit, and the detector array according to any one of claims 1-6, wherein the radiation emitted by the radiation source is directed to a flat panel detector ( 6) The upper cover plate (1), the imaging display unit is electrically connected to all or part of the circuit boards (3) of the flat panel detectors (6), and each flat panel detector (6) operates synchronously according to a sequence.
An imaging method based on the splicable detector array as claimed in claim 1, characterized in that it comprises the following steps:

S1, splicing the first flat-panel detector and the second flat-panel detector in the detector array in a forward direction, and turning on the ray source, the ray source is directed to the upper cover plates of the two flat-panel detectors;

S2, using the first flat panel detector to acquire first image information, and using the second flat panel detector to acquire second image information;

S3, performing image feature matching on the first image information and the second image information to obtain a first feature matching area;

S4, splicing the remaining part of the first feature matching area from the first image information and splicing the second image information, or removing the remaining part of the first feature matching area from the second image information Perform splicing with the first image information to obtain a first spliced image.
The imaging method according to claim 8, characterized in that, after obtaining the first stitched image in step S4, it further comprises the following steps:

S5. Obtain third image information by using a third flat panel detector in the detector array, wherein the third flat panel detector and the second flat panel detector are spliced in a forward direction;

S6, performing image feature matching on the third image information and the first stitched image information to obtain a second feature matching area;

S7, splicing the remaining part of the second feature matching area from the first spliced image information and splicing the third image information, or removing the third image information from the remaining part of the second feature matching area Part is spliced with the first spliced image information to obtain a second spliced image.
The imaging method according to claim 8, wherein step S3 comprises: extracting feature points from the first image and the second image by using a SIFT algorithm, describing the feature points by using a feature vector, and then describing the feature points by using a feature vector. The distance between feature vectors is calculated to realize feature matching, and the distance between the feature vectors is Euclidean distance, Hamming distance or cosine distance.