WO2022070880A1 - Sputtering target-backing plate assembly, production method therefor, and sputtering target recovery method - Google Patents

Sputtering target-backing plate assembly, production method therefor, and sputtering target recovery method Download PDF

Info

Publication number
WO2022070880A1
WO2022070880A1 PCT/JP2021/033679 JP2021033679W WO2022070880A1 WO 2022070880 A1 WO2022070880 A1 WO 2022070880A1 JP 2021033679 W JP2021033679 W JP 2021033679W WO 2022070880 A1 WO2022070880 A1 WO 2022070880A1
Authority
WO
WIPO (PCT)
Prior art keywords
sputtering target
backing plate
hook
plate
target
Prior art date
Application number
PCT/JP2021/033679
Other languages
French (fr)
Japanese (ja)
Inventor
智弘 丸子
雄 鈴木
将平 大友
紘暢 中村
Original Assignee
株式会社フルヤ金属
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2021024010A external-priority patent/JP7024128B1/en
Priority claimed from JP2021144277A external-priority patent/JP2022104518A/en
Application filed by 株式会社フルヤ金属 filed Critical 株式会社フルヤ金属
Publication of WO2022070880A1 publication Critical patent/WO2022070880A1/en

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K20/00Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/84Processes or apparatus specially adapted for manufacturing record carriers
    • G11B5/851Coating a support with a magnetic layer by sputtering

Definitions

  • the present disclosure relates to a suitable sputtering target-backing plate joint for installation in a sputtering apparatus used in a sputtering apparatus used in a manufacturing process of an HDD (hard disk drive), a semiconductor, etc., a method for manufacturing the same, and a method for recovering the sputtering target.
  • a suitable sputtering target-backing plate joint for installation in a sputtering apparatus used in a sputtering apparatus used in a manufacturing process of an HDD (hard disk drive), a semiconductor, etc.
  • a sputtering target-backing plate junction in which a sputtering target is bonded to a member called a backing plate is generally used.
  • the sputtering target-backing plate joint by fixing the backing plate, the sputtering target is installed in the sputtering apparatus via the backing plate.
  • the backing plate is a member that supports the sputtering target and is a member that is responsible for cooling to suppress an increase in the temperature of the sputtering target due to exposure to plasma, heat of copper-based materials, aluminum-based materials, etc. It is made of a highly conductive material. In addition, the sputtering target and the backing plate must maintain close contact for heat conduction.
  • the bonding between the sputtering target and the backing plate is performed by using a bonding method generally called bonding, which uses a material having a low melting point and a low vapor pressure in vacuum such as indium or tin as an insert material, or a resin having conductivity.
  • bonding which uses a material having a low melting point and a low vapor pressure in vacuum such as indium or tin as an insert material, or a resin having conductivity.
  • the method of joining is done.
  • indium or tin may volatilize and be mixed as impurities in the film formed, which is high. This is a fatal problem in applications where purity is required.
  • Patent Document 1 a material having a proof stress of 15 to 20 kgf / mm 2 , a proof stress of 15 to 20 kgf / mm, a proof stress of 15 to 20 kgf / mm, and a backing plate having a proof stress equal to or higher than that of the sputtering target with respect to a sputtering target consisting of tantalum. It is disclosed that the direction of warpage of the sputtering target caused by thermal expansion and contraction is controlled by forming an assembly in which the sputtering target and the backing plate are diffusion-bonded.
  • Patent Document 2 a target material having a melting point of 1000 ° C. or higher, one or more insert materials selected from a metal or alloy having a melting point lower than the melting point of the target material, and a backing plate are solid-phase diffusion bonded. It is disclosed that a high adhesion with a 100% bonding ratio and a high bonding strength can be obtained.
  • Patent Document 3 after forming a sandwich structure in which the entire surface of the sputtering target is embedded, heat compression is applied to 400-600 ° C. by hot isostatic pressure compression (HIP) or uniaxial hot compression (UHP) for diffusion bonding. Then, a method of making an assembly by carving out a sputtering target and a backing plate is disclosed.
  • HIP hot isostatic pressure compression
  • UHP uniaxial hot compression
  • a sputtering target-backing plate junction which can suppress contamination due to volatilization of impurities and facilitate peeling and recovery of the target material while suppressing the loss of expensive materials used as the target material. It is to provide the manufacturing method and the recovery method of a sputtering target.
  • the present inventors provided either a hook-shaped portion or a hook-receiving portion on the backing plate, provided the hook-shaped portion or the other of the hook-receiving portions on the outer peripheral side surface of the sputtering target, and provided the hook-shaped portion.
  • the present invention has been completed by finding that the above-mentioned problems can be solved by adopting a structure in which the sputtering target is fixed to the backing plate by contacting the hook receiving portion.
  • the sputtering target-backing plate joint is a sputtering target-backing plate joint in which a sputtering target is bonded to a backing plate, and the backing plate has a plate surface, a plate back surface, and a plate side surface.
  • the sputtering target has a target surface, a target back surface facing the plate surface, and an outer peripheral side surface, and one of the backing plate and the sputtering target further has a hook-shaped portion.
  • the other side further has a hook-shaped portion, and the hook-shaped portion and the hook-receiving portion are in contact with each other, and the hook-shaped portion or the hook-receiving portion of the sputtering target is provided on the outer peripheral side surface of the sputtering target. It is characterized in that the sputtering target is fixed to the backing plate by abutting the hook-shaped portion with the hook receiving portion.
  • the backing plate has a convex portion on the plate surface, and the convex portion has the hook-shaped portion or the hook receiving portion.
  • the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
  • the backing plate has a fastener on the plate surface or the side surface of the plate, and the fastener has the hook-shaped portion or the hook receiving portion.
  • the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
  • the fastener penetrates into the outer peripheral side surface leaving a part of the side surface, and the fastener is fixed to the backing plate.
  • the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
  • the side surface of the fastener protrudes from the outer peripheral side surface, and at least the protruding portion of the fastener is fixed to the backing plate.
  • the fastener can be fixed to the backing plate even after the fastener is fixed to the outer peripheral side surface of the sputtering target.
  • the backing plate has a recess in the plate surface
  • the backing plate has a fastener in the recess
  • the fastener is the hook-shaped portion or the hook. It is preferable that the fastener has a receiving portion, at least a part of the sputtering target and at least a part of the fastener are fitted in the recess, and the fastener is fixed in the recess of the backing plate.
  • the fastener can be fixed to the backing plate while adjusting the position of the fastener with respect to the plate surface of the backing plate.
  • the backing plate has a recess on the plate surface, and the backing plate has the hook-shaped portion or the hook receiving portion on the inner peripheral side surface of the recess. It is preferable that a part of the sputtering target is fitted in the recess.
  • the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
  • the hook-shaped portion has a first uneven shape portion
  • the hook receiving portion has a second uneven shape portion that matches the first uneven shape portion. Is preferable.
  • the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
  • the hook-shaped portion has a hook shape in which the tip of the hook in the direction from the backing plate to the sputtering surface is the maximum hooking point, and the hook receiving portion is the hook. It is preferable to have a hook hole that fits the shape.
  • the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
  • the sputtering target-backing plate junction according to the present invention has an intermediate layer of 2.5 mm or less at the interface between the sputtering target and the backing plate, and the intermediate layer is at least one of Ni, Cr, Al, and Cu. It is preferably composed of a plate or powder made of one kind of metal or an alloy containing at least one of Ni, Cr, Al and Cu, or a combination of the plate material and the powder.
  • the intermediate layer By providing the intermediate layer, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. Further, since the intermediate layer is covered with the backing plate and the sputtering target, it is possible to prevent the material of the intermediate layer from volatilizing and becoming impurities and adhering to the substrate.
  • the sputtering target-backing plate junction according to the present invention has an intermediate layer of 10 ⁇ m or less at the interface between the sputtering target and the backing plate, and the intermediate layer is at least one of Ni, Cr, Al, and Cu. It is preferably a thin film made of a metal or an alloy containing at least one of Ni, Cr, Al and Cu.
  • the intermediate layer By providing the intermediate layer, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. Further, since the intermediate layer is covered with the backing plate and the sputtering target, it is possible to prevent the material of the intermediate layer from volatilizing and becoming impurities and adhering to the substrate.
  • the sputtering target-backing plate alloy according to the present invention has an intermediate layer of 1.0 mm or less at the interface between the sputtering target and the backing plate, and the intermediate layer is a metal of at least one of In and Zn, or It is preferably composed of a plate material or powder made of an alloy containing at least one of In and Zn, or a combination of the plate material and the powder.
  • the intermediate layer By providing the intermediate layer, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. Further, since the intermediate layer is covered with the backing plate and the sputtering target, it is possible to prevent the material of the intermediate layer from volatilizing and becoming impurities and adhering to the substrate.
  • the sputtering target-backing plate alloy according to the present invention has two or more intermediate layers at the interface between the sputtering target and the backing plate, and the intermediate layers are Ni, Cr, Al, Cu of 2.5 mm or less.
  • a plate or powder composed of at least one of the metals or an alloy containing at least one of Ni, Cr, Al and Cu, or a combination of the plate and the powder, and at least 10 ⁇ m or less of Ni, Cr, Al and Cu.
  • It is preferably composed of a plate material or powder made of an alloy containing one kind, or a combination of the plate material and the powder.
  • the material of the sputtering target is an Al—Sc alloy, Ru, Ru alloy, Ir, or Ir alloy. Even with a high melting point material of 1000 ° C. or higher, the bonding strength between the sputtering target and the backing plate can be improved while suppressing warpage and cracking of the sputtering target.
  • the material of the sputtering target is Li-based oxide, Co-based oxide, Ti-based oxide or Mg-based oxide. Even with a high melting point material of 1000 ° C. or higher, the bonding strength between the sputtering target and the backing plate can be improved while suppressing warpage and cracking of the sputtering target.
  • the material of the backing plate is Al, Al alloy, Cu, Cu alloy, Fe or Fe alloy, and the linear expansion coefficient of the backing plate is 30.0 ⁇ 10 ⁇ . It is preferably 6 / ° C. or lower.
  • the backing plate expands during heating, and the sputtering target can be inserted into the inner peripheral side surface of the convex or concave portion of the backing plate, and the backing plate can be inserted during cooling. Shrinks, and the inner peripheral side surface of the convex or concave portion of the backing plate is brought into contact with the outer peripheral side surface of the sputtering target to form a bonded body.
  • the method for manufacturing a sputtering target-backing plate joint includes a backing plate having a plate surface, a plate back surface, a plate side surface, and either a hook-shaped portion or a hook receiving portion, and a target surface and a target back surface.
  • a sputtering target-backing plate joint can be easily manufactured by abutting the hook-shaped portion and the hook receiving portion by utilizing thermal expansion and contraction.
  • the sputtering target and the backing plate are cooled and the hook-shaped portion is brought into contact with the hook receiving portion to bring the sputtering target into contact with the hook-shaped portion.
  • the step 4 of fixing to the backing plate pressing the sputtering target from the target surface to the backing plate or heating the sputtering target and the backing plate and pressing the sputtering target from the target surface to the backing plate. It is preferable that the step and the step of cooling the sputtering target and the backing plate are performed once as a set or repeated two or more times.
  • the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be further improved, the adhesion can be improved, and heat conduction can be efficiently performed. ..
  • the sputtering target-backing plate joint includes a backing plate having a plate surface, a plate back surface, and a plate side surface, a fastener having either a hook-shaped portion or a hook receiving portion, and a target surface and a target back surface.
  • the target surface of the sputtering target is transferred to the backing plate.
  • the step of pressing or heating the sputtering target and the backing plate, pressing the sputtering target from the target surface to the backing plate, and cooling the sputtering target and the backing plate are performed once as a set. Alternatively, it is preferable to repeat the process twice or more.
  • the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be further improved, the adhesion can be improved, and heat conduction can be efficiently performed. ..
  • the method for recovering a sputtering target according to the present invention includes a step A in which the sputtering target-backing plate joint according to the present invention is heated and thermally expanded until the hook-shaped portion is separated from the hook receiving portion, and the sputtering target is described above. It is characterized by having a step B of removing the sputtering target from the backing plate and recovering the sputtering target from the sputtering target-backing plate joint.
  • the method for recovering a sputtering target according to the present invention is a method for recovering the sputtering target from a sputtering target-backing plate joint in which the sputtering target is fixed to the backing plate by a fastener, and the fastener is fixed to the backing plate. It is characterized by having a step C of removing the fastener from the backing plate and recovering the sputtering target from the sputtering target-backing plate joint.
  • the present disclosure can suppress breakage and peeling of a sputtering target even when a sputtering target having a low bending strength is used or when the difference in linear expansion coefficient between the sputtering target and the backing plate is significantly different, and impurities are present.
  • Sputtering target-backing plate junction its manufacturing method and capable of suppressing the contamination due to volatilization of the target material and facilitating the peeling recovery of the target material while suppressing the loss of the expensive material used as the target material.
  • a method for recovering a sputtering target can be provided.
  • FIG. 1 is a schematic cross-sectional view taken along the line AA of the first example of FIG. 1, showing the form 1-1. It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG.
  • FIG. 4 is a schematic cross-sectional view taken along the line AA of the first example of FIG. 4, showing the form 1-2. It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG.
  • FIG. 3 is a schematic cross-sectional view of Form 2-1. It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. 7. It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. 7. It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. 7. It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. 7. It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. 7.
  • FIG. 3 is a schematic cross-sectional view of Form 3-1. It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG.
  • FIG. 3 is a schematic cross-sectional view of Form 4-1. It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG. It is a schematic diagram of another form (7) of the part surrounded by the broken line of FIG.
  • FIG. 5 is a schematic cross-sectional view of Form 5-1.
  • FIG. 1 It is a schematic process diagram for demonstrating the tenth example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. It is a schematic process diagram for demonstrating the eleventh example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. It is an image which shows the contact part in Example 1. FIG. It is an image which shows the joining result in the comparative example 1. It is an image which shows the joining result in the comparative example 2. It is an image which shows the joining result in the comparative example 3. It is an image which shows the joining result in the comparative example 4.
  • the backing plate has a hook-shaped portion, and the sputtering target has a hook receiving portion
  • the sputtering target-backing plate junction according to the present embodiment will be described with reference to FIGS. 1 and 2.
  • the sputtering target-backing plate joint 100 according to the present embodiment is a sputtering target-backing plate joint in which the sputtering target 2 is bonded to the backing plate 1, and the backing plate 1 has a plate surface 3 and a plate back surface 4.
  • the plate side surface 5 is provided, the sputtering target 2 has a target surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9, and the backing plate 1 and the sputtering target 2 are backing plates 1. Further has a hook-shaped portion 6, the sputtering target 2 further has a hook receiving portion 10, and the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other. The sputtering target 2 is fixed to the backing plate 1 by being provided on the outer peripheral side surface 9 of the sputtering target 2 and the hook-shaped portion 6 abuts on the hook receiving portion 10.
  • the sputtering target 2 When the hook-shaped portion 6 is in contact with the hook receiving portion 10, the sputtering target 2 is fixed to the side surface direction of the plate surface 3 of the backing plate 1, and the sputtering target 2 is fixed in the thickness direction of the plate surface 3 of the backing plate 1. On the other hand, the sputtering target 2 can be fixed.
  • the backing plate 1 has a convex portion 13 on the plate surface 3, and the convex portion 13 has a hook-shaped portion 6.
  • the backing plate 1 is cut to form the convex portion 13 and the hook-shaped portion 6 is formed inside the convex portion 13. Since the hook-shaped portion 6 is integrated with the backing plate 1, the sputtering target 2 can be fixed.
  • the hook-shaped portion 6 and the hook receiving portion 10 in FIG. 2 it is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2.
  • the annularly shaded portion indicates the top surface of the convex portion 13 provided on the plate surface 3 of the backing plate 1, indicating that the convex portion 13 covers the outer peripheral shape of the sputtering target 2 over the entire circumference.
  • two or more hook-shaped portions 6 and hook receiving portions 10 may be partially formed and brought into contact with each other.
  • the hook-shaped portion 6 and the hook receiving portion 10 in FIG. 2 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 2 (A) to 2 (N).
  • the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured, but in addition to the bonding strength, the backing plate 1 and the sputtering target 2 are in close contact with each other.
  • the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the hook-shaped portion 6 is pressed toward the hook receiving portion 10.
  • FIG. 1 and 2 show a form in which a disk-shaped sputtering target 2 is joined to a disk-shaped backing plate 1.
  • a rectangular sputtering target 2 is attached to a rectangular backing plate 1. May be in the form of being joined.
  • the BB cross section has the same shape as the AA cross section shown in FIG. Further, the rectangular shape includes a square shape. Also in FIG. 3, the annularly shaded portion indicates the top surface of the convex portion 13 provided on the plate surface 3 of the backing plate 1.
  • the backing plate has a hook receiving portion, and the sputtering target has a hook-shaped portion
  • the sputtering target-backing plate joint 101 according to the present embodiment is a sputtering target-backing plate joint in which the sputtering target 2 is bonded to the backing plate 1, and the backing plate 1 has a plate surface 3 and a plate back surface 4.
  • the plate side surface 5 is provided, the sputtering target 2 has a target surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9, and the backing plate 1 and the sputtering target 2 are backing plates 1.
  • the sputtering target 2 further has a hook-shaped portion 6, and the hook-shaped portion 6 and the hook-shaped portion 10 are in contact with each other.
  • the sputtering target 2 is fixed to the backing plate 1 by being provided on the outer peripheral side surface 9 of the sputtering target 2 and the hook-shaped portion 6 abuts on the hook receiving portion 10.
  • the hook-shaped portion 6 abuts on the hook receiving portion 10
  • the sputtering target 2 is fixed to the side surface direction of the plate surface 3 of the backing plate 1
  • the sputtering target 2 is fixed to the thickness direction of the plate surface 3 of the backing plate 1.
  • the sputtering target 2 can be fixed.
  • the backing plate 1 has a convex portion 13 on the plate surface 3, and the convex portion 13 has a hook receiving portion 10.
  • the backing plate 1 is cut to form the convex portion 13, and the hook receiving portion 10 is formed inside the convex portion 13. Since the hook receiving portion 10 is integrated with the backing plate 1, the sputtering target 2 can be fixed.
  • the hook-shaped portion 6 and the hook receiving portion 10 in FIG. 5 it is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but the sputtering target 2 is damaged or peeled off.
  • two or more hook-shaped portions 6 and the hook receiving portions 10 may be partially formed and brought into contact with each other.
  • the hook-shaped portion 6 and the hook receiving portion 10 in FIG. 5 may be brought into contact with each other by using the form of the hook-shaped portion and the hook receiving portion shown in FIGS. 5A to 5L.
  • the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured, but in addition to the bonding strength, the backing plate 1 and the sputtering target 2 are in close contact with each other.
  • the hook-shaped portion 10 is pressed toward the hook-shaped portion 6.
  • FIG. 4 and 5 show a form in which the disk-shaped sputtering target 2 is joined to the disk-shaped backing plate 1, but as shown in FIG. 6, the rectangular sputtering target 2 is attached to the rectangular backing plate 1. May be in the form of being joined.
  • the BB cross section has the same shape as the AA cross section shown in FIG. Further, the rectangular shape includes a square shape.
  • the annularly shaded portion indicates the top surface of the convex portion 13 provided on the plate surface 3 of the backing plate 1.
  • the sputtering target-backing plate joint may be in the shape of a disk, a rectangular plate, or a square plate.
  • Form 2-1 The backing plate has a fastener, and the fastener has a hook-shaped portion
  • the backing plate 1 has a fastener 14 and the fastener 14 has a hook-shaped portion 6.
  • the sputtering target 2 has a hook receiving portion 10, and the hook-shaped portion 6 is in contact with the hook receiving portion 10.
  • the backing plate 1 has the convex portion 13 on the plate surface 3, and the convex portion 13 has the hook-shaped portion 6, whereas in the form 2-1 the convex portion 13 is replaced.
  • the fastener 14 plays the same role as the convex portion 13. Since the backing plate 1 has the fastener 14, the processing can be facilitated and the assembly of the joint can be facilitated.
  • the side surface of the fastener 14 protrudes from the outer peripheral side surface 9, and at least the protruding portion of the fastener 14 is fixed to the backing plate 1. It is preferable that it is. The difference from the form shown in FIG.
  • a fastener is prepared separately from the backing plate 1 and the sputtering target 2
  • a hook-shaped portion 6 is formed on the side of the fastener in contact with the sputtering target 2
  • the outer peripheral side surface of the sputtering target 2 is formed.
  • a hook receiving portion 10 is formed in 9, and the hook-shaped portion 6 of the fastener 14 and the hook receiving portion 10 of the sputtering target 2 are brought into contact with each other.
  • the sputtering target 2 can be fixed to the backing plate 1 by fixing toward. For fixing, for example, it is fixed by screwing at the screwing point 11.
  • the outside of the hook-shaped portion 6 of the backing plate 1 is located outside the outer peripheral side surface 9 of the sputtering target 2, and the hook-shaped portion 6 is in contact with the hook receiving portion 10.
  • the sputtering target 2 can be fixed to the side surface direction of the plate surface 3 of the backing plate 1, and the sputtering target 2 can be fixed to the thickness direction of the plate surface 3 of the backing plate 1.
  • the fastener 14 may be fixed to the backing plate 1 by a joining means such as diffusion joining or welding, in addition to fixing by screwing.
  • FIG. 7 shows a form in which the fastener 14 is fixed to the plate surface 3 of the backing plate 1 by screwing at the screwed portion 11, but not only on the plate surface 3 but also on the side surface or the back surface of the backing plate 1. It may be fixed.
  • the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 2, but the structure may be further as follows. (1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact. (2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 7 (A) to 7 (N) and the like.
  • Form 2-2 The backing plate has a fastener, and the fastener has a hook receiving portion
  • the fastener has a hook receiving portion
  • Form 3-1 The backing plate has a fastener, and the fastener has a hook-shaped portion
  • the fastener 14 enters the outer peripheral side surface 9 leaving a part of the side surface, and the fastener 14 is fixed to the backing plate 1. It is preferable that it is. Since the fastener 14 is included in the shape of the sputtering target 2, the exposure of the corner portion of the fastener 14 can be reduced. Further, with such a structure, when the hook-shaped portion 6 comes into contact with the hook receiving portion 10, the sputtering target 2 is fixed to the side surface direction of the plate surface 3 of the backing plate 1 and the backing is performed.
  • the sputtering target 2 can be fixed to the thickness direction of the plate surface 3 of the plate 1.
  • the fastener 14 may be fixed to the backing plate 1 by a joining means such as diffusion joining or welding, in addition to fixing by screwing.
  • FIG. 8 shows a form in which the fastener 14 is fixed to the plate surface 3 of the backing plate 1 by screwing at the screwed portion 11, but not only on the plate surface 3 but also on the side surface or the back surface of the backing plate 1. It may be fixed.
  • the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 2, but the structure may be further as follows. (1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact. (2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
  • Form 3-2 The backing plate has a fastener, and the fastener has a hook receiving portion
  • the fastener has a hook receiving portion
  • Form 4-1 The backing plate has a recess, and the recess has a hook-shaped portion
  • the backing plate 1 has a recess 17 on the plate surface 3, and the backing plate 1 has a hook shape on the inner peripheral side surface 16 of the recess 17. It is preferable that the portion 6 is provided and a part of the sputtering target 2 is fitted in the recess 17.
  • FIG. 9 In the embodiment of FIG.
  • a hook receiving portion 10 is provided on the outer peripheral side surface 9 of the sputtering target 2, and the hook-shaped portion 6 is brought into contact with the hook receiving portion 10 so as to be in contact with the side surface direction of the plate surface 3 of the backing plate 1.
  • the sputtering target 2 can be fixed, and the sputtering target 2 can be fixed with respect to the thickness direction of the plate surface 3 of the backing plate 1.
  • the difference from the form shown in FIG. 2 is that the bottom of the sputtering target 2 is embedded in the recess 17 by the depth of the recess 17 of the backing plate 1, so that the bottom of the sputtering target 2 is embedded in the recess 17 with respect to the side surface direction of the plate surface 3 of the backing plate 1.
  • the sputtering target 2 can be fixed, and the sputtering target 2 can be fixed with respect to the thickness direction of the plate surface 3 of the backing plate 1.
  • the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 2, but the structure may be further as follows. (1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact. (2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 9 (A) to 9 (N) and the like.
  • Form 4-2 The backing plate has a recess, and the recess has a hook receiving portion
  • the arrangement of the hook-shaped portion and the hook receiving portion is reversed, in the form 4-1 the hook-shaped portion 6 and the hook receiving portion 10
  • Form 5-1 The backing plate has a recess and the fastener has a hook-shaped portion
  • the backing plate 1 has a recess 17 in the plate surface 3, and the backing plate 1 has a fastener 14 in the recess 17.
  • the fastener 14 has a hook-shaped portion 6, at least a part of the sputtering target 2 and at least a part of the fastener 14 are fitted in the recess 17, and the fastener 14 is fixed to the recess 17 of the backing plate 1. It is preferable to have. The difference from the form shown in FIG.
  • a fastener 14 is prepared separately from the backing plate 1 and the sputtering target 2, a hook-shaped portion 6 is formed on the side of the fastener 14 in contact with the sputtering target 2, and the sputtering target 2 is formed.
  • the fastener 14 and the sputtering target 2 are placed in the recess 17 of the backing plate 1.
  • the sputtering target 2 can be fixed to the backing plate 1 by embedding the sputtering target 2 and fixing the fastener 14 toward the backing plate 1 at a portion not covered by the sputtering target 2.
  • the sputtering target 2 can be fixed to the side surface direction of the plate surface 3 of the backing plate 1, and the sputtering target 2 can be fixed to the thickness direction of the plate surface 3 of the backing plate 1.
  • the fastener 14 may be fixed to the backing plate 1 by a joining means such as diffusion joining or welding, in addition to fixing by screwing.
  • the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 9, but the structure may be further as follows. (1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact. (2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 10 (A) to 10 (N) and the like.
  • Form 5-2 The backing plate has a recess and the fastener has a hook receiving portion
  • the fastener has a hook receiving portion
  • the hook-shaped portion 6 has a first uneven shape portion
  • the hook receiving portion 10 has a second uneven shape portion that matches the first uneven shape portion. Is preferable.
  • the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
  • the second uneven shape portion that fits the first uneven shape portion is in a form in which the uneven shape portions are in contact with each other without a gap, and the uneven shape portions are caught by each other even though they have a gap.
  • the hook-shaped portion 6 has a hook shape in which the hook tip in the direction from the backing plate 1 to the sputter surface is the maximum hooking point, and the hook receiving portion 10 has a hook shape. It is preferable to have a hook hole that fits in.
  • the bonding strength between the sputtering target 2 and the backing plate 1 is also improved in the thickness direction of the sputtering target 2.
  • the hook receiving portion has a hook hole that fits the hook shape.
  • the hook hole fits into the hook shape without a gap
  • the hook shape is caught even though it has a gap.
  • the sputtering target-backing plate junction 500 has an intermediate layer 12 of 2.5 mm or less at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12 is Ni. , Cr, Al, Cu, at least one metal or an alloy containing at least one of Ni, Cr, Al, Cu. It is preferable that the plate material, powder, or a combination of the plate material and the powder is used.
  • the bonding strength between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction.
  • the hook-shaped portion 6 of the backing plate 1 is provided on the entire circumference of the outer peripheral side surface 9 of the sputtering target 2, the plate surface 3 of the backing plate 1 and the hook-shaped portion 6 of the backing plate 1 are provided.
  • the intermediate layer 12 is provided at the inner portion and the portion surrounded by the target back surface 8 of the sputtering target 2.
  • the intermediate layer 12 is covered with the sputtering target 2, it is possible to prevent the material of the intermediate layer 12 from volatilizing and becoming impurities and adhering to the substrate.
  • the reason for selecting the elements of Ni, Cr, Al, and Cu for the intermediate layer 12 is that they are suitable from the viewpoints of adhesion, heat conduction, and coefficient of linear expansion.
  • the intermediate layer 12 is a plate material, if the plate material is thicker than 2.5 mm, the height of the portion where the hook-shaped portion 6 of the backing plate 1 is provided must be set higher.
  • the intermediate layer 12 is a powder layer
  • the form in which the powder is melted by heating is similar to the form in which the intermediate layer 12 is a plate material.
  • the intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided.
  • the hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
  • Form 6-2 Form having an intermediate layer
  • the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 12 has been described.
  • the intermediate layer 12 of 2.5 mm or less can be provided in the same manner.
  • the sputtering target-backing plate junction Similar to the embodiment shown in FIG. 11, the sputtering target-backing plate junction according to the present embodiment has an intermediate layer 12 of 10 ⁇ m or less at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12 is Ni. , Cr, Al, Cu at least one kind of metal or an alloy containing at least one kind of Ni, Cr, Al, Cu is preferable.
  • the intermediate layer 12 By relaxing the difference in linear expansion coefficient between the sputtering target 2 and the backing plate 1 by the intermediate layer 12, it is possible to further suppress damage and warpage of the sputtering target 2 due to repeated expansion due to heating and contraction due to cooling.
  • the film thickness of the intermediate layer 12 is thicker than 10 ⁇ m, it only takes time to form the intermediate layer 12, and the effect as the intermediate layer 12 is not so different from that of 10 ⁇ m or less. Further, by providing the intermediate layer 12, the bonding strength between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1 can be improved, and the adhesion can be improved to maintain good heat conduction.
  • the hook-shaped portion 6 of the backing plate 1 is provided on the entire circumference of the outer peripheral side surface 9 of the sputtering target 2, the plate surface 3 of the backing plate 1 and the hook-shaped portion 6 of the backing plate 1 are provided.
  • the intermediate layer 12 is provided at the inner portion and the portion surrounded by the target back surface 8 of the sputtering target 2. As a result, since the intermediate layer 12 is covered with the sputtering target 2, it is possible to prevent the material of the intermediate layer 12 from volatilizing and becoming impurities and adhering to the substrate.
  • the reason for selecting the elements of Ni, Cr, Al, and Cu for the intermediate layer 12 is that they are suitable from the viewpoints of adhesion, heat conduction, and coefficient of linear expansion.
  • the thin film is preferably a thin film produced by sputtering, and is preferably formed on the plate surface 3 of the backing plate 1. Further, a foil having a thickness of 10 ⁇ m or less may be used.
  • the intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
  • Form 7-2 Form having an intermediate layer
  • the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 12 has been described.
  • the intermediate layer 12 of 10 ⁇ m or less can be similarly provided.
  • the sputtering target-backing plate junction Similar to the embodiment shown in FIG. 11, the sputtering target-backing plate junction according to the present embodiment has an intermediate layer 12 of 1.0 mm or less at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12 has an intermediate layer 12 or less.
  • the intermediate layer 12 By relaxing the difference in linear expansion coefficient between the sputtering target 2 and the backing plate 1 by the intermediate layer 12, it is possible to further suppress damage and warpage of the sputtering target 2 due to repeated expansion due to heating and contraction due to cooling.
  • the reason for selecting the In and Zn elements for the intermediate layer 12 is that they are suitable from the viewpoints of adhesion, heat conduction and linear expansion coefficient.
  • the intermediate layer 12 is a plate material, if the plate material is thicker than 1.0 mm, In and Zn are easily oxidized materials, so that the hardness increases and the intermediate layer 12 may crack.
  • the bonding strength between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1 can be improved, and the adhesion can be improved to maintain good heat conduction.
  • the hook-shaped portion 6 of the backing plate 1 is provided on the entire circumference of the outer peripheral side surface 9 of the sputtering target 2, the plate surface 3 of the backing plate 1 and the hook-shaped portion 6 of the backing plate 1 are provided.
  • the intermediate layer 12 is provided at the inner portion and the portion surrounded by the target back surface 8 of the sputtering target 2.
  • the intermediate layer 12 is covered with the sputtering target 2, it is possible to prevent the material of the intermediate layer 12 from volatilizing and becoming impurities and adhering to the substrate.
  • the intermediate layer 12 is a powder layer
  • the form in which the powder is melted by heating is similar to the form in which the intermediate layer 12 is a plate material.
  • the intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
  • Form 8-2 Form having an intermediate layer
  • the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 12 has been described.
  • the intermediate layer 12 of 1.0 mm or less can be similarly provided.
  • the sputtering target-backing plate alloy 600 has two intermediate layers 12 at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12a is 2.5 mm.
  • a plate or powder made of at least one of the following Ni, Cr, Al, and Cu metals or an alloy containing at least one of Ni, Cr, Al, and Cu, or a combination of the plate and the powder, 10 ⁇ m or less.
  • the intermediate layer 12b is made of a plate or powder made of a metal or an alloy containing at least one of In and Zn, or a combination of the plate and the powder, and the intermediate layer 12b is Ni, Cr, Al, Cu of 2.5 mm or less.
  • the intermediate layer 12a installed at the interface with the backing plate 1 is a metal containing at least one of Ni, Cr, Al, and Cu, or an alloy containing at least one of Ni, Cr, Al, and Cu, and at least In and Zn.
  • the reason for forming with various forms of materials made of any one kind of metal or an alloy containing at least one kind of In and Zn is that it is suitable from the viewpoint of adhesion, thermal conductivity and linear expansion coefficient.
  • the intermediate layer 12b installed at the interface with the sputtering target 2 is a metal containing at least one of Ni, Cr, Al and Cu, or an alloy containing at least one of Ni, Cr, Al and Cu, In and Zn.
  • the reason for forming with various forms of materials made of at least one of the above metals or alloys containing at least one of In and Zn is suitable from the viewpoint of adhesion, thermal conductivity and linear expansion coefficient.
  • the intermediate layer is shown in the form of two layers in FIG.
  • the intermediate layer may be in the form of three or more layers as long as the effect of the intermediate layer described above is obtained.
  • the intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
  • Form 9-2 Form having an intermediate layer
  • the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 14 has been described.
  • the intermediate layer 12 can be similarly provided even when the recess 17 is formed on the plate surface 3 of the backing plate 1 as in the backing plate joint body 601.
  • the material of the sputtering target 2 may be an Al—Sc alloy, Ru, Ru alloy, Ir or Ir alloy. Further, Li-based oxides, Co-based oxides, Ti-based oxides, Mg-based oxides and the like can also be used. Even with a high melting point material of 1000 ° C. or higher, the bonding strength between the sputtering target and the backing plate can be improved while suppressing warpage and cracking of the sputtering target.
  • the material of the backing plate 1 is Al, Al alloy, Cu, Cu alloy, Fe or Fe alloy, and the linear expansion coefficient is 30.0 ⁇ 10 -6 / ° C.
  • the linear expansion coefficient is preferably 28.5 ⁇ 10 -6 / ° C or less, and more preferably 27.3 ⁇ 10 -6 / ° C or less. If the coefficient of linear expansion is larger than 30.0 ⁇ 10 -6 / ° C, the coefficient of linear expansion is caused by repeated expansion and contraction of the backing plate 1 due to heating and cooling, resulting in cracking and warping of the sputtering target. Is preferably 30.0 ⁇ 10 -6 / ° C. or lower.
  • the backing plate expands at the time of heating, and the plate surface 3 of the backing plate 1 and the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided.
  • the sputtering target can be inserted into the portion surrounded by the target back surface 8 of the sputtering target 2 or the recess of the backing plate, and the backing plate contracts during cooling, and the hook-shaped portion 6 of the backing plate causes the sputtering target to be inserted.
  • a joint can be formed by abutting or abutting and pressing the hook receiving portion 10.
  • the lower limit of the coefficient of linear expansion is preferably 6.0 ⁇ 10 -6 / ° C. or higher.
  • DTG Distance between contact surfaces in contact with the pair of pressing surfaces (mm) at room temperature.
  • T Temperature (° C) at which the backing plate is thermally expanded to fit the sputtering target (where T> room temperature)
  • T T-room temperature (° C)
  • CTE BP Linear expansion coefficient (1 / ° C.) of the backing plate at temperature
  • T CTE TG : Coefficient of linear expansion of sputtering target at temperature T (1 / ° C)
  • ⁇ D Difference in thermal expansion amount between the backing plate and the sputtering target when the temperature is raised from room temperature to temperature T (mm)
  • the shape of the plane of the backing plate 1 is rectangular, the long side of the sputtering target 2 and the long side of the backing plate 1 are made to correspond, and the short side of the sputtering target 2 and the short side of the backing plate 1 are made to correspond.
  • Equation 1 At room temperature, the distance between the contact surfaces of the sputtering targets 2 is larger than the distance between the pressing surfaces of the backing plate 1, and the sputtering target 2 is placed inside the pressing surfaces of the backing plate 1. You can't put it in.
  • the room temperature is 25 ° C.
  • the form of (1) consider a form in which both the backing plate 1 and the sputtering target 2 are heated to the temperature T. When the backing plate 1 is heated from room temperature to the temperature T at which the backing plate is thermally expanded, the distance between the pressing surfaces of the backing plate 1 is thermally expanded to the length obtained by ( DBP ⁇ ⁇ T ⁇ CTE BP ) . ..
  • the sputtering target 2 can be fitted inside the pressing surface of the backing plate 1. Become. Then, when the temperature is lowered to room temperature, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1 according to the relationship shown in (Equation 1). In the above-described embodiment (1), in order to enable the contact surface of the sputtering target 2 to be pressed by the pressing surface of the backing plate 1, the distance between the pressing surfaces of the backing plate 1 is increased by the thermal expansion of the backing plate 1. The distance between the contact surfaces of the sputtering targets 2 must be reversed.
  • the relationship between the distance between the pressing surfaces of the backing plate 1 at room temperature and the distance between the contact surfaces of the sputtering targets 2 at room temperature can be set as small as possible (Equation 2). ) And (Equation 4).
  • C is a coefficient, but when C is in the range of 0.5 to 4.0, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1.
  • both the backing plate 1 and the sputtering target 2 described above are heated to the temperature T, but also (2) the backing plate 1 is heated to the temperature T and the sputtering target 2 is heated. Includes a form in which the temperature is raised only to a temperature T 1 lower than the temperature T, and (3) a form in which the backing plate 1 is raised to a temperature T and the sputtering target 2 is not raised.
  • T The temperature (° C.) of the backing plate when the backing plate is thermally expanded to fit the sputtering target (where T> room temperature, T> T 1 ).
  • the distance between the pressing surfaces of the backing plate 1 is thermally expanded by the length obtained by ( DBP ⁇ ⁇ T ⁇ CTE BP ) , and the backing is performed. Since the distance between the pressing surfaces of the plate 1 is larger than the distance between the contact surfaces of the sputtering target 2, the sputtering target 2 can be fitted inside the pressing surface of the backing plate 1. Then, when the temperature is lowered to room temperature, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1 according to the relationship shown in (Equation 6).
  • C is a coefficient, but when C is in the range of 0.5 to 4.0, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1.
  • the contact surface of the sputtering target 2 is similarly pressed by the pressing surface of the backing plate 1.
  • Step 1 a method for manufacturing the sputtering target-backing plate junction 100 shown in FIG. 2 will be described with reference to FIG.
  • a sputtering target 2 having a backing plate 1, a target surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 is prepared.
  • the backing plate 1 is formed with a convex portion 13 capable of forming a plate surface 3, a plate back surface 4, a plate side surface 5, and a hook-shaped portion 6.
  • the backing plate 1 can be formed by cutting using a lathe or the like.
  • the plate surface inside the convex portion 13 is also the plate surface 3.
  • the heights of the plate surface 3 inside the convex portion 13 and the plate surface outside the convex portion 13 may be the same or different.
  • FIG. 15B considering the height and width of the convex portion 13 formed on the backing plate 1, the hook-shaped portion 6 formed on the convex portion 13 and the outer peripheral side surface of the sputtering target 2.
  • the lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed in the lower part of the 9 can come into contact with the hook receiving portion 10.
  • a cutting process using a lathe or the like can be performed.
  • the outer circumference of the removed portion is also defined as the outer peripheral side surface 9.
  • a hook-shaped portion 6 is formed on the convex portion 13 formed on the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the convex portion 13 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be partially provided with respect to the side surface 9.
  • a hook receiving portion 10 is formed at a position where the convex portion 13 formed on the backing plate 1 can come into contact with the hook-shaped portion 6 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. do.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. Although it may be partially provided in, it is necessary to provide it at a position where it comes into contact with the hook-shaped portion 6.
  • Step 2 Next, as shown in FIG. 15D, the backing plate 1 is heated and thermally expanded to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the backing plate 1. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the backing plate 1 can be achieved, the sputtering target 2 is heated while the backing plate 1 is being heated. May be good.
  • the heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like.
  • HP hot press sintering method
  • HIP hot isotropic pressure sintering method
  • SPS discharge plasma sintering method
  • Step 3 Next, as shown in FIG. 15 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the backing plate 1, and the target back surface 8 of the sputtering target 2 and the plate of the backing plate 1 are inserted.
  • the surfaces 3 are aligned, and the hook-shaped portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are arranged so as to face each other.
  • pressure may be applied from the target surface 7 of the sputtering target 2 toward the backing plate 1.
  • Step 4 Next, as shown in FIG. 15 (F), the backing plate 1 is cooled and heat-shrinked, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are brought into contact with each other to bring the sputtering target into contact with each other. Since the movement of the backing plate 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured.
  • Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate.
  • a hot press sintering method HP
  • a hot isotropic pressure sintering method HIP
  • a discharge plasma sintering method SPS
  • a heating method using a hot plate a hot plate.
  • the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the position of the convex portion 13 of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted to adjust the hook-shaped portion of the backing plate 1.
  • the pressure may be applied from the 6 side to the hook receiving portion 10 side of the sputtering target 2, or the pressure may be applied from the target back surface 8 of the sputtering target 2 to the plate surface 3 of the backing plate 1.
  • Step 1 a method for manufacturing the sputtering target-backing plate junction 201 shown in FIG. 8 will be described with reference to FIG.
  • a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 16A a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 16A a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target
  • a sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9
  • the lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed in the lower part of the 9 can come into contact with the hook receiving portion 10.
  • a cutting process using a lathe or the like can be performed.
  • the outer periphery of the removed portion is also defined as the outer peripheral side surface 9.
  • the fastener 14 is attached to the plate surface 3 of the backing plate 1.
  • a joining means such as diffusion joining or welding can be used.
  • the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9.
  • a hook receiving portion 10 is formed at a position where the fastener 14 fixed to the backing plate 1 can come into contact with the hook-shaped portion 6 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. do.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
  • Step 2 Next, as shown in FIG. 16D, the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated.
  • the heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like.
  • HP hot press sintering method
  • HIP hot isotropic pressure sintering method
  • SPS discharge plasma sintering method
  • Step 3 Next, as shown in FIG. 16E, the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the plate surface 3 of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2.
  • the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
  • Step 4 Next, as shown in FIG. 16F, the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2.
  • the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate.
  • a hot press sintering method HP
  • a hot isotropic pressure sintering method HIP
  • a discharge plasma sintering method SPS
  • a heating method using a hot plate a hot plate.
  • the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the position of the fastener 14 of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted, and the fastener installed on the backing plate 1 is installed.
  • Pressing may be applied from the hook-shaped portion 6 side of the tool 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the plate surface 3 of the backing plate 1. May be good.
  • Step 1 Next, another embodiment of the method for manufacturing the sputtering target-backing plate junction 201 shown in FIG. 8 will be described with reference to FIG.
  • a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 17A a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 17A a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target
  • a sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer
  • the lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed in the lower part of the 9 can come into contact with the hook receiving portion 10.
  • a cutting process using a lathe or the like can be performed.
  • the outer periphery of the removed portion is also defined as the outer peripheral side surface 9.
  • the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9.
  • a hook receiving portion 10 is formed at the lower portion of the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1. do.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6. Next, as shown in FIG.
  • the fastener 14 is fixed to the plate surface 3 of the backing plate 1.
  • a joining means such as diffusion joining or welding can be used.
  • Step 2 Next, as shown in FIG. 17D, the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated.
  • the heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like.
  • HP hot press sintering method
  • HIP hot isotropic pressure sintering method
  • SPS discharge plasma sintering method
  • Step 3 Next, as shown in FIG. 17 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the plate surface 3 of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2.
  • the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
  • Step 4 Next, as shown in FIG. 17 (F), the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2.
  • the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate.
  • a hot press sintering method HP
  • a hot isotropic pressure sintering method HIP
  • a discharge plasma sintering method SPS
  • a heating method using a hot plate a hot plate.
  • the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the position of the fastener 14 of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted, and the fastener installed on the backing plate 1 is installed.
  • Pressing may be applied from the hook-shaped portion 6 side of the tool 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the plate surface 3 of the backing plate 1. May be good.
  • Step 1 a method for manufacturing the sputtering target-backing plate junction 200 shown in FIG. 7 will be described with reference to FIG.
  • a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 18A a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 18A a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target
  • a sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are
  • the hook formed on the fastener 14 is formed in consideration of the height and width of the fastener 14 whose lower portion of the outer peripheral side surface 9 of the sputtering target 2 is fixed to the backing plate 1.
  • the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can come into contact with the shaped portion 6.
  • a cutting process using a lathe or the like can be performed.
  • the outer periphery of the removed portion is also defined as the outer peripheral side surface 9.
  • the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 of the fastener 14 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be partially provided with respect to the side surface 9.
  • a hook receiving portion 10 is formed at the lower portion of the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1. do.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
  • Step 2 As shown in FIG. 18C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
  • Step 3 Next, as shown in FIG. 18D, the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 are brought into contact with each other.
  • the sputtering target 2 and the fastener are arranged so that the fastener 14 is arranged on the plate surface 3 and the hook receiving portion 10 and the hook-shaped portion 6 face each other. 14 and are arranged.
  • Step 4 Next, in FIG. 18E, by fixing the fastener 14 to the plate surface 3 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed, and the sputtering target 2 is suppressed. Since the movement of the backing plate 1 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • a joining means such as diffusion joining or welding can be used as diffusion joining or welding.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • Step 1 a method for manufacturing the junction 202 having a structure similar to that of the sputtering target-backing plate junction 200 shown in FIG. 7 will be described.
  • the method for manufacturing the sputtering target-backing plate joint 202 according to the present embodiment is as follows: first, as shown in FIG. 19A, a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • the bottom portion of the fastener 14 has a shape capable of covering the target back surface 8 of the sputtering target 2.
  • the hook formed on the fastener 14 is formed in consideration of the height and width of the fastener 14 whose lower portion of the outer peripheral side surface 9 of the sputtering target 2 is fixed to the backing plate 1.
  • the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can come into contact with the shaped portion 6.
  • the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9.
  • a hook receiving portion 10 is formed at a position where the fastener 14 fixed to the backing plate 1 can come into contact with the hook-shaped portion 6 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. do.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
  • Step 2 As shown in FIG. 19C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
  • Step 3 Next, as shown in FIG. 19D, the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 are brought into contact with each other. At this time, it is preferable that the bottom portion of the fastener 14 that covers the target back surface 8 of the sputtering target 2 comes into contact with the back surface 8 of the sputtering target 2.
  • the sputtering target 2 and the fastener are arranged so that the fastener 14 is arranged on the plate surface 3 and the hook receiving portion 10 and the hook-shaped portion 6 face each other. 14 and are arranged.
  • Step 4 Next, in FIG. 19E, by fixing the fastener 14 to the plate surface 3 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed, and the sputtering target 2 is suppressed. Since the movement of the backing plate 1 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • a joining means such as diffusion joining or welding can be used as diffusion joining or welding.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • Step 1 a method for manufacturing the sputtering target-backing plate junction 300 shown in FIG. 9 will be described with reference to FIG. 20.
  • the method for manufacturing the sputtering target-backing plate joint 300 according to the present embodiment is as follows: first, as shown in FIG. 20 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 is prepared. Next, as shown in FIG.
  • a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 into the plate surface 3 of the backing plate 1 is formed.
  • the size of the recessed bottom surface 15 of the backing plate 1 needs to take into consideration the width of the hook-shaped portion 6 formed on the recessed side surface 16 of the backing plate 1.
  • the bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed.
  • the recess of the backing plate 1 is recessed in consideration of the height of the recess side surface 16 of the backing plate 1 and the width of the hook-shaped portion 6 formed on the recess side surface 16 of the backing plate 1.
  • the lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook-shaped portion 6 formed on the side surface 16 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can come into contact with each other.
  • a cutting process using a lathe or the like can be performed.
  • the outer periphery of the removed portion is also defined as the outer peripheral side surface 9.
  • a hook-shaped portion 6 is formed on the recessed side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the recessed side surface 16 of the backing plate 1 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, sputtering may be provided. It may be partially provided with respect to the outer peripheral side surface 9 of the target 2.
  • a hook receiving portion 10 is formed at a position where the backing plate 1 can come into contact with the hook-shaped portion 6 of the concave side surface 16 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. Although it may be partially provided in, it is necessary to provide it at a position where it comes into contact with the hook-shaped portion 6.
  • Step 2 Next, as shown in FIG. 20 (D), the backing plate 1 is heated and thermally expanded to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the backing plate 1. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the backing plate 1 can be achieved, the sputtering target 2 is heated while the backing plate 1 is being heated. May be good.
  • the heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like.
  • HP hot press sintering method
  • HIP hot isotropic pressure sintering method
  • SPS discharge plasma sintering method
  • Step 3 Next, as shown in FIG. 20 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the backing plate 1, and the target back surface 8 of the sputtering target 2 and the recess of the backing plate 1 are recessed.
  • the bottom surfaces 15 are aligned, and the hook-shaped portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are arranged so as to face each other.
  • pressure may be applied from the target surface 7 of the sputtering target 2 toward the backing plate 1.
  • Step 4 Next, as shown in FIG. 20 (F), the backing plate 1 is cooled and heat-shrinked, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are brought into contact with each other to bring the sputtering target into contact with each other. Since the movement of the backing plate 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured.
  • Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate.
  • a hot press sintering method HP
  • a hot isotropic pressure sintering method HIP
  • a discharge plasma sintering method SPS
  • a heating method using a hot plate a hot plate.
  • the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the size of the bottom surface 15 of the recess of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted to form the hook shape of the backing plate 1.
  • the pressure may be applied from the portion 6 side to the hook receiving portion 10 side of the sputtering target 2, or the pressing may be applied from the target back surface 8 of the sputtering target 2 to the concave bottom surface 15 of the backing plate 1.
  • Step 1 a method for manufacturing a joint body 301 having a structure similar to that of the sputtering target-backing plate joint body 300 shown in FIG. 9 and using the fastener 14 will be described. ..
  • the method for manufacturing the sputtering target-backing plate joint 301 according to the present embodiment is as follows: first, as shown in FIG. 21 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate 1, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG.
  • a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1.
  • the bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed.
  • the height and width of the recessed side surface 16 of the backing plate 1 and the height and width of the fastener 14 fixed to the recessed bottom surface 15 or the recessed side surface 16 of the backing plate 1 are taken into consideration.
  • a cutting process using a lathe or the like can be performed.
  • the outer periphery of the removed portion is also defined as the outer peripheral side surface 9.
  • the hook-shaped portion 6 is attached to the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided.
  • the outer periphery of the sputtering target 2 is at a position where it can come into contact with the hook-shaped portion 6 formed on the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1.
  • a hook receiving portion 10 is formed at the lower portion of the side surface 9.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided.
  • the fastener 14 is fixed to the side surface 16.
  • it can be fixed by screwing, diffusion joining, welding or the like.
  • Step 2 Next, as shown in FIG. 21 (D), the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated.
  • the heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like.
  • HP hot press sintering method
  • HIP hot isotropic pressure sintering method
  • SPS discharge plasma sintering method
  • Step 3 Next, as shown in FIG. 21 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the bottom surface 15 of the recess of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2.
  • the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
  • Step 4 Next, as shown in FIG. 21 (F), the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2.
  • the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate.
  • a hot press sintering method HP
  • a hot isotropic pressure sintering method HIP
  • a discharge plasma sintering method SPS
  • a heating method using a hot plate a hot plate.
  • the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the size of the bottom surface 15 of the recess of the backing plate 1, the amount to be removed from the lower part of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like were adjusted and installed on the backing plate 1. Pressing may be applied from the hook-shaped portion 6 side of the fastener 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the recessed bottom surface 15 of the backing plate 1. You may.
  • Step 1 a method for manufacturing a bonded body 401 having a structure similar to that of the sputtering target-backing plate joint body 400 shown in FIG. 10 and without using a fastener will be described.
  • the method for manufacturing the sputtering target-backing plate joint 401 according to the present embodiment is as follows: first, as shown in FIG. 22 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 is prepared. Next, as shown in FIG.
  • a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1.
  • the size of the recessed bottom surface 15 of the backing plate 1 needs to take into consideration the width of the hook-shaped portion 6 formed on the recessed side surface 16 of the backing plate 1.
  • the bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed.
  • a hook-shaped portion 6 is formed on the recessed side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the recessed side surface 16 of the backing plate 1 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, sputtering may be provided. It may be partially provided with respect to the outer peripheral side surface 9 of the target 2.
  • a hook receiving portion 10 is formed at a position where the backing plate 1 can come into contact with the hook-shaped portion 6 of the concave side surface 16 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. Although it may be partially provided in, it is necessary to provide it at a position where it comes into contact with the hook-shaped portion 6.
  • Step 2 Next, as shown in FIG. 22D, the backing plate 1 is heated and thermally expanded to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the backing plate 1. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the backing plate 1 can be achieved, the sputtering target 2 is heated while the backing plate 1 is being heated. May be good.
  • the heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like.
  • HP hot press sintering method
  • HIP hot isotropic pressure sintering method
  • SPS discharge plasma sintering method
  • a hot plate a hot plate
  • the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2
  • Step 3 Next, as shown in FIG. 22 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the backing plate 1, and the target back surface 8 of the sputtering target 2 and the recess of the backing plate 1 are recessed.
  • the bottom surfaces 15 are aligned, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are arranged so as to face each other.
  • pressure may be applied from the target surface 7 of the sputtering target 2 toward the backing plate 1.
  • Step 4 Next, as shown in FIG. 22F, the backing plate 1 is cooled and heat-shrinked, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are brought into contact with each other to bring the sputtering target into contact with each other. Since the movement of the backing plate 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured.
  • Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate.
  • a hot press sintering method HP
  • a hot isotropic pressure sintering method HIP
  • a discharge plasma sintering method SPS
  • a heating method using a hot plate a hot plate.
  • the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the size of the bottom surface 15 of the recess of the backing plate 1, the position of the hook-shaped portion 6, the position of the hook-shaped portion 10, and the like are adjusted, and the hook-shaped portion 6 side of the backing plate 1 to the hook-shaped portion 10 side of the sputtering target 2.
  • the pressure may be applied to the bottom surface 15 of the recess of the backing plate 1 from the back surface 8 of the target of the sputtering target 2.
  • Step 1 a method for manufacturing the sputtering target-backing plate junction 400 shown in FIG. 10 will be described with reference to FIG. 23.
  • the method for manufacturing the sputtering target-backing plate joint 400 according to the present embodiment is as follows: first, as shown in FIG. 23 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG.
  • a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1.
  • the bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed.
  • the hook-shaped portion 6 is attached to the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9.
  • the outer periphery of the sputtering target 2 is at a position where it can come into contact with the hook-shaped portion 6 formed on the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1.
  • a hook receiving portion 10 is formed at the lower portion of the side surface 9.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided.
  • the fastener 14 is fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1.
  • a means for fixing the fastener 14 to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1 it can be fixed by screwing, diffusion joining, welding or the like.
  • Step 2 Next, as shown in FIG. 23 (D), the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated.
  • the heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like.
  • HP hot press sintering method
  • HIP hot isotropic pressure sintering method
  • SPS discharge plasma sintering method
  • Step 3 Next, as shown in FIG. 23 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the bottom surface 15 of the recess of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2.
  • the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
  • Step 4 Next, as shown in FIG. 23 (F), the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2.
  • the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate.
  • a hot press sintering method HP
  • a hot isotropic pressure sintering method HIP
  • a discharge plasma sintering method SPS
  • a heating method using a hot plate a hot plate.
  • the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the size of the bottom surface 15 of the recess of the backing plate 1, the amount to be removed from the lower part of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like were adjusted and installed on the backing plate 1. Pressing may be applied from the hook-shaped portion 6 side of the fastener 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the recessed bottom surface 15 of the backing plate 1. You may.
  • Step 1 Next, another embodiment of the method for manufacturing the sputtering target-backing plate junction 400 shown in FIG. 10 will be described with reference to FIG. 24.
  • a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 24 (A) a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • FIG. 24 (A) a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3,
  • a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1.
  • the bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed.
  • the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 so as to face the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 of the fastener 14 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be partially provided with respect to the side surface 9.
  • a hook receiving portion 10 is formed on the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • the hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
  • Step 2 As shown in FIG. 24C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
  • Step 3 Next, as shown in FIG. 24C, the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target are brought into contact with each other.
  • the sputtering target 2 and the fastener are arranged so that the fastener 14 is arranged on the plate surface 3 and the hook receiving portion 10 and the hook-shaped portion 6 face each other. 14 and are arranged.
  • Step 4 Next, in FIG. 24D, by fixing the fastener 14 to the recessed bottom surface 15 or the recessed side surface 16 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed. Since the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • a joining means such as diffusion joining or welding can be used as diffusion joining or welding.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target and the backing plate may be performed once as a set or repeated twice or more.
  • Step 1 a method for manufacturing the junction 402 having a structure similar to the sputtering target-backing plate junction 400 shown in FIG. 10 will be described.
  • the method for manufacturing the sputtering target-backing plate joint 402 according to the present embodiment is as follows: first, as shown in FIG. 25 (A), a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared.
  • the bottom portion of the fastener 14 has a shape capable of covering the target back surface 8 of the sputtering target 2.
  • a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1.
  • a means for forming the recess 17 of the backing plate 1 it can be performed by cutting using a lathe or the like.
  • the bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed.
  • the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 so as to face the outer peripheral side surface 9 of the sputtering target 2.
  • the hook-shaped portion 6 of the fastener 14 can be formed by cutting using a lathe or the like.
  • the hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9.
  • a hook receiving portion 10 is formed at the lower portion of the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1. do.
  • the hook receiving portion 10 can be formed by cutting using a lathe or the like.
  • Step 2 As shown in FIG. 25C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
  • Step 3 Next, as shown in FIG. 25 (C), the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target are brought into contact with each other. At this time, it is preferable that the bottom portion of the fastener 14 that covers the target back surface 8 of the sputtering target 2 comes into contact with the back surface 8 of the sputtering target 2.
  • the fastener 14 is arranged on the plate surface 3, the fastener 14 is fitted into the recess 17, and the hook receiving portion 10 and the hook-shaped portion 6 face each other. As such, the sputtering target 2 and the fastener 14 are arranged.
  • Step 4 Next, in FIG. 25D, by fixing the fastener 14 to the recessed bottom surface 15 or the recessed side surface 16 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed. Since the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured.
  • a joining means such as diffusion joining or welding can be used as diffusion joining or welding.
  • step 4 If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated.
  • the step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
  • the method for recovering the sputtering target according to the present embodiment includes a step A in which the sputtering target-backing plate joint according to the present embodiment is heated and thermally expanded until the hook-shaped portion 6 is separated from the hook receiving portion 10, and the sputtering target 2.
  • the step B is to remove the sputtering target 2 from the backing plate 1 and recover the sputtering target 2 from the sputtering target-backing plate joint.
  • the form of removing the sputtering target 2 includes a form of removing the sputtering target 2 as it is and a form of removing the sputtering target 2 by applying an impact.
  • the method of recovering the sputtering target in the sputtering target-backing plate joint in which the fastener 14 is fixed to the backing plate 1 is to remove the fastener 14 from the backing plate 1 and remove the sputtering target 2 from the sputtering target-backing plate joint. It has a step C of recovery.
  • the form of removing the sputtering target 2 includes a form of removing the sputtering target 2 as it is and a form of removing the sputtering target 2 by applying an impact.
  • Example 1 A bonded body corresponding to FIG. 9 is produced.
  • a ruthenium sputtering target 2 of ⁇ 156 ⁇ 9t (unit: mm) prepared by a melting method and a brass backing plate 1 of ⁇ 240 ⁇ 20t (unit: mm) were prepared.
  • the coefficient of linear expansion is 6.75 ⁇ 10-6 / ° C for ruthenium and 21.2 ⁇ 10-6 / ° C for brass.
  • a 0.5 mm annular recess serving as a hook receiving portion 10 was formed by a lathe along the circumferential direction of the side surface.
  • annular convex portion that is convex with respect to the bottom surface of the annular recess is formed on the outer peripheral side surface 9 of the sputtering target 2.
  • a recess 17 having a depth of 4 mm, which is 0.4 mm smaller than the diameter of the sputtering target 2 is machined at a position where the sputtering target 2 of the backing plate 1 is installed.
  • a 0.5 mm hook receiving portion 10 is formed on the inner peripheral side surface 16 of the recess of the backing plate at a position corresponding to the hook-shaped portion 6 of the sputtering target 2.
  • the bottom surface 15 of the recess of the backing plate 1 was filled with a 0.1 mm thick Ni plate material and a small amount of In powder. This trace amount of In powder is filled in the gap around the Ni plate material.
  • the sputtering target 2 was installed on the recess 17 of the backing plate 1.
  • the temperature is raised to 250 ° C. in a reduced pressure atmosphere of 10 Pa or less using a discharge plasma sintering machine, and then the sputtering target 2 is filled in the recess 17 of the backing plate.
  • the temperature was further raised to 400 ° C. while pressurizing from the target surface 7 of the sputtering target 2 at 10 MPa, diffusion bonding was performed by holding for 1 hour, and then cooling was performed for contact.
  • the bonded body has a structure in which the uneven portion of the outer peripheral side surface 9 of the sputtering target 2 and the uneven portion of the concave inner peripheral side surface 16 of the backing plate 1 are fitted to each other.
  • the outer peripheral side surface 9 of the sputtering target 2 and the inner peripheral side surface 16 of the recess 17 of the backing plate 1 are fixed by contact with each other, and the target back surface 8 is also filled with Ni and In without gaps to provide heat conduction.
  • diffusion bonding was performed well, cracking of the sputtering target 2 did not occur.
  • FIG. 27 As shown in FIG. 27, the sputtering target and the backing plate are joined, but the difference in the coefficient of linear expansion is large, so that the sputtering target is cracked due to the stress of compression when the backing plate is cooled.
  • the linear expansion coefficient of the sputtering target and the linear expansion coefficient of the backing plate were made closer to each other than in Comparative Example 1, but since there is a difference in the linear expansion coefficient between the sputtering target and the backing plate, the sputtering target 2 was cracked by the stress of compression, and the sputtering target was peeled off from the backing plate due to insufficient bonding to the backing plate.
  • the temperature was raised to 500 ° C., and then CAN was pressurized at 100 MPa to perform diffusion bonding.
  • the container was pressurized from the entire surface, and the container and the sputtering target were diffusion-bonded.
  • the sputtering target 2 and the backing plate were carved out using a lathe. The result is shown in FIG. As shown in FIG. 30, although the diffusion bonding was completed, the sputtering target was subjected to the stress of compression due to the difference in the linear expansion coefficient between the sputtering target and the backing plate, and fine cracks were formed from the central portion toward the outer periphery. It occurred radially and cracked.
  • Sputtering target-backing plate joint 1 backing plate 2 sputtering target 3 plate surface of backing plate 4 Back side of the plate of the backing plate 5 Side of the backing plate 6 Hook-shaped part 7 Target side of the sputtering target 8 Back side of the target of the sputtering target 9 Outer side surface of the sputtering target 10 Hook receiving part 11 Screwing point 12 Intermediate layer 12a Interface with backing plate Intermediate layer 12 installed at the interface with the sputtering target Intermediate layer 13 Convex portion 14 provided on the plate surface of the backing plate Fastener 15 Recessed bottom surface of the backing plate 16 Recessed side surface 17 concave portion of the backing plate

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

The present disclosure provides a sputtering target-backing plate assembly in which, even in the case where a target having a low flexural strength is used or even in the case where the difference in linear expansion coefficient between a target and a backing plate is significantly large, the target can be inhibited from being damaged or detached, and from being tainted due to volatilization of impurities, and detachment and recovery of a target material can be facilitated while suppressing loss of a high-cost material used as the target material. In the assembly according to the present disclosure, one of a backing plate 1 and a sputtering target 2 has a hook-shaped portion 6, and the other has a hook-receiving portion 10. The hook-shaped portion and the hook-receiving portion abut each other. The hook-shaped portion or hook-receiving portion of the sputtering target 2 is provided on an outer circumferential lateral surface 9, and the sputtering target 2 is fixed to the backing plate 1 when the hook-shaped portion 6 abuts the hook-receiving portion 10.

Description

スパッタリングターゲット‐バッキングプレート接合体、その製造方法及びスパッタリングターゲットの回収方法Sputtering target-backing plate joint, its manufacturing method and recovery method of sputtering target
 本開示は、HDD(ハードディスクドライブ)、半導体等の製造工程で使用されるスパッタリング装置に設置するための好適なスパッタリングターゲット‐バッキングプレート接合体、その製造方法及びスパッタリングターゲットの回収方法に関する。 The present disclosure relates to a suitable sputtering target-backing plate joint for installation in a sputtering apparatus used in a sputtering apparatus used in a manufacturing process of an HDD (hard disk drive), a semiconductor, etc., a method for manufacturing the same, and a method for recovering the sputtering target.
 スパッタリングターゲットをHDD、半導体等の製造工程で使用されるスパッタリング装置に設置するために、一般的には、バッキングプレートと呼ばれる部材にスパッタリングターゲットを接合したスパッタリングターゲット‐バッキングプレート接合体が用いられる。スパッタリングターゲット‐バッキングプレート接合体において、バッキングプレートを固定することによって、バッキングプレートを介してスパッタリングターゲットがスパッタリング装置に設置されることとなる。 In order to install a sputtering target in a sputtering device used in a manufacturing process of HDDs, semiconductors, etc., a sputtering target-backing plate junction in which a sputtering target is bonded to a member called a backing plate is generally used. In the sputtering target-backing plate joint, by fixing the backing plate, the sputtering target is installed in the sputtering apparatus via the backing plate.
 バッキングプレートは、スパッタリングターゲットを支持する部材であり、またプラズマに晒される事によるスパッタリングターゲットの温度の上昇を抑制するための冷却を担う部材であることから、銅系材料、アルミニウム系材料などの熱伝導の高い材料で形成される。また、スパッタリングターゲットとバッキングプレートとは熱伝導のために密着性が維持されていなければならない。 Since the backing plate is a member that supports the sputtering target and is a member that is responsible for cooling to suppress an increase in the temperature of the sputtering target due to exposure to plasma, heat of copper-based materials, aluminum-based materials, etc. It is made of a highly conductive material. In addition, the sputtering target and the backing plate must maintain close contact for heat conduction.
 スパッタリングターゲットとバッキングプレートとの接合は、一般的にボンディングと呼ばれる、インジウムやスズなどの低融点で真空における蒸気圧の低い材料をインサート材として使用する接合方法や、導電性を有する樹脂を用いて接合する方法が行われている。 The bonding between the sputtering target and the backing plate is performed by using a bonding method generally called bonding, which uses a material having a low melting point and a low vapor pressure in vacuum such as indium or tin as an insert material, or a resin having conductivity. The method of joining is done.
 しかし、スパッタリングターゲットの温度が、インサート材として使用しているインジウムやスズなどの融点より上昇してしまうと、インジウムやスズが揮発することにより成膜した膜に不純物として混入することがあり、高純度が要求される用途においては致命的な問題となる。 However, if the temperature of the sputtering target rises above the melting point of indium or tin used as the insert material, indium or tin may volatilize and be mixed as impurities in the film formed, which is high. This is a fatal problem in applications where purity is required.
 ボンディングの問題を解決するために、インサート材となる低融点金属を使用せずにスパッタリングターゲットとバッキングプレートに向かい合わせの圧力を掛け、温度を上げた状態で時間を掛けて拡散接合を行う技術がある(例えば、特許文献1~3を参照。)。 In order to solve the bonding problem, a technology that applies pressure facing the sputtering target and the backing plate without using a low melting point metal as an insert material and takes time to perform diffusion bonding while the temperature is high. (See, for example, Patent Documents 1 to 3).
 特許文献1では、耐力15~20kgf/mmの耐力15~20kgf/mm耐力15~20kgf/mmタンタルからなるスパッタリングターゲットに対してバッキングプレートの耐力がスパッタリングターゲットの耐力よりも同じ又は高い材料とし、スパッタリングターゲットとバッキングプレートとを拡散接合した組立体とすることにより、熱膨張と収縮によって生じるスパッタリングターゲットの反りの方向を制御していることが開示されている。 In Patent Document 1, a material having a proof stress of 15 to 20 kgf / mm 2 , a proof stress of 15 to 20 kgf / mm, a proof stress of 15 to 20 kgf / mm, and a backing plate having a proof stress equal to or higher than that of the sputtering target with respect to a sputtering target consisting of tantalum. It is disclosed that the direction of warpage of the sputtering target caused by thermal expansion and contraction is controlled by forming an assembly in which the sputtering target and the backing plate are diffusion-bonded.
 特許文献2では、1000℃以上の融点を有するターゲット材と、該ターゲット材の融点よりも低い融点を有する金属または合金から選択される1種以上のインサート材と、バッキングプレートとを固相拡散接合することで100%接合率の高い密着性と高い接合強度が得られることが開示されている。 In Patent Document 2, a target material having a melting point of 1000 ° C. or higher, one or more insert materials selected from a metal or alloy having a melting point lower than the melting point of the target material, and a backing plate are solid-phase diffusion bonded. It is disclosed that a high adhesion with a 100% bonding ratio and a high bonding strength can be obtained.
 特許文献3では、スパッタリングターゲットの全面を埋め込むサンドイッチ構造とした後に、熱間等静水圧圧縮(HIP)や単軸熱間圧縮(UHP)で400-600℃に加熱圧縮を施して拡散接合させ、その後、スパッタリングターゲットとバッキングプレートを削り出すことでアセンブリを作製する方法が開示されている。 In Patent Document 3, after forming a sandwich structure in which the entire surface of the sputtering target is embedded, heat compression is applied to 400-600 ° C. by hot isostatic pressure compression (HIP) or uniaxial hot compression (UHP) for diffusion bonding. Then, a method of making an assembly by carving out a sputtering target and a backing plate is disclosed.
特開2015-183258号公報Japanese Unexamined Patent Publication No. 2015-183258 特開平06-108246号公報Japanese Unexamined Patent Publication No. 06-108246 特表2014-511436号公報Japanese Patent Publication No. 2014-511436
 しかし、特許文献1に記載の発明のように、曲げ強度の低い材料で形成されたスパッタリングターゲットの場合、スパッタリングターゲットとバッキングプレートとの線膨張係数の差が大きく異なると、高温で拡散接合したのち冷却して熱収縮したときにスパッタリングターゲットが破損することがある。そのため、拡散接合を低温で行うこともあるが、拡散接合しないか十分な強度が得られない。 However, in the case of a sputtering target made of a material having a low bending strength as in the invention described in Patent Document 1, if the difference in linear expansion coefficient between the sputtering target and the backing plate is significantly different, diffusion bonding is performed at a high temperature. Sputtering targets can be damaged when cooled and thermally shrunk. Therefore, diffusion bonding may be performed at a low temperature, but diffusion bonding is not performed or sufficient strength cannot be obtained.
 また、線膨張係数の差が大きく異なるスパッタリングターゲットとバッキングプレートとを、加熱と加圧によって拡散接合のみ行っても、スパッタリングターゲットの使用時において、温度の上昇下降を繰り返すと接合界面に疲労が蓄積して破壊し、剥離することがある。 In addition, even if only diffusion bonding is performed between a sputtering target and a backing plate, which have significantly different differences in linear expansion coefficient, by heating and pressurizing, fatigue accumulates at the bonding interface when the temperature rises and falls repeatedly when the sputtering target is used. It may be destroyed and peeled off.
 また、特許文献2に記載の発明では、スパッタリングターゲットの使用時において、温度がインサート材の融点まで上昇するとインサート材が溶融されてスパッタリングターゲットが剥離することもある。この様な傾向は、大型のターゲットを使用し、高純度を要求される半導体製造で発生しやすい。 Further, in the invention described in Patent Document 2, when the temperature rises to the melting point of the insert material when the sputtering target is used, the insert material may be melted and the sputtering target may be peeled off. Such a tendency is likely to occur in semiconductor manufacturing where a large target is used and high purity is required.
 また、線膨張係数の差を緩和するためにスパッタリングターゲットとバッキングプレートの中間付近の線膨張係数を持つインサート材を入れるなどの応力を緩和させる手段もあるが、ボンディングによって金属接合したときや導電性樹脂を使用して接合したときと同様に、インサート材が揮発し、不純物の混入の問題が解決されない。 In addition, there is a means to alleviate the stress such as inserting an insert material having a linear expansion coefficient near the middle between the sputtering target and the backing plate in order to alleviate the difference in the linear expansion coefficient. As with the case of joining using resin, the insert material volatilizes and the problem of contamination of impurities cannot be solved.
 また、特許文献3に記載の発明では、スパッタリングターゲットとバッキングプレートは強固な拡散接合が形成されるまで行われるため、スパッタリングターゲットとバッキングプレートとの線膨張係数の差が大きく、かつ、スパッタリングターゲットの材質によっては、スパッタリングターゲットの拡散接合工程において、スパッタリングターゲットの割れが発生することがある。 Further, in the invention described in Patent Document 3, since the sputtering target and the backing plate are performed until a strong diffusion bond is formed, the difference in linear expansion coefficient between the sputtering target and the backing plate is large, and the sputtering target has a large difference. Depending on the material, cracking of the sputtering target may occur in the diffusion bonding step of the sputtering target.
 そこで、本開示の目的は、曲げ強度の低いスパッタリングターゲットを用いた場合や、スパッタリングターゲットとバッキングプレートとの線膨張係数の差が大きく異なる場合であっても、スパッタリングターゲットの破損や剥離が抑制でき、また、不純物の揮発による汚染が抑制でき、さらには、ターゲット材として使われる高価な材料の損失を抑制しながら、ターゲット材の剥離回収を容易にすることができるスパッタリングターゲット‐バッキングプレート接合体、その製造方法及びスパッタリングターゲットの回収方法を提供することである。 Therefore, it is an object of the present disclosure that damage or peeling of the sputtering target can be suppressed even when a sputtering target having a low bending strength is used or when the difference in linear expansion coefficient between the sputtering target and the backing plate is significantly different. In addition, a sputtering target-backing plate junction, which can suppress contamination due to volatilization of impurities and facilitate peeling and recovery of the target material while suppressing the loss of expensive materials used as the target material. It is to provide the manufacturing method and the recovery method of a sputtering target.
 本発明者らは、鋭意検討した結果、バッキングプレートに鉤状部又は鉤受け部のいずれか一方を設け、スパッタリングターゲットの外周側面に鉤状部又は鉤受け部の他方を設け、鉤状部を鉤受け部に当接させ、スパッタリングターゲットをバッキングプレートに固定する構造とすることにより、上記の課題を解決できることを見出し、本発明を完成させた。すなわち、本発明に係るスパッタリングターゲット‐バッキングプレート接合体は、バッキングプレートにスパッタリングターゲットが接合されたスパッタリングターゲット‐バッキングプレート接合体において、前記バッキングプレートは、プレート面と、プレート裏面と、プレート側面と、を有し、前記スパッタリングターゲットは、ターゲット面と、前記プレート面と向かい合うターゲット裏面と、外周側面と、を有し、前記バッキングプレート及び前記スパッタリングターゲットは、いずれか一方がさらに鉤状部を有し、他方がさらに鉤受け部を有し、該鉤状部と該鉤受け部とは当接し合っており、前記スパッタリングターゲットの鉤状部又は鉤受け部は、前記スパッタリングターゲットの外周側面に設けられており、かつ、前記鉤状部が前記鉤受け部に当接することによって、前記スパッタリングターゲットが前記バッキングプレートに固定されることを特徴とする。 As a result of diligent studies, the present inventors provided either a hook-shaped portion or a hook-receiving portion on the backing plate, provided the hook-shaped portion or the other of the hook-receiving portions on the outer peripheral side surface of the sputtering target, and provided the hook-shaped portion. The present invention has been completed by finding that the above-mentioned problems can be solved by adopting a structure in which the sputtering target is fixed to the backing plate by contacting the hook receiving portion. That is, the sputtering target-backing plate joint according to the present invention is a sputtering target-backing plate joint in which a sputtering target is bonded to a backing plate, and the backing plate has a plate surface, a plate back surface, and a plate side surface. The sputtering target has a target surface, a target back surface facing the plate surface, and an outer peripheral side surface, and one of the backing plate and the sputtering target further has a hook-shaped portion. The other side further has a hook-shaped portion, and the hook-shaped portion and the hook-receiving portion are in contact with each other, and the hook-shaped portion or the hook-receiving portion of the sputtering target is provided on the outer peripheral side surface of the sputtering target. It is characterized in that the sputtering target is fixed to the backing plate by abutting the hook-shaped portion with the hook receiving portion.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記バッキングプレートは前記プレート面に凸部を有し、該凸部が前記鉤状部又は前記鉤受け部を有することが好ましい。スパッタリングターゲットの側面方向におけるスパッタリングターゲットとバッキングプレートとの接合強度を向上させることに加え、スパッタリングターゲットの厚さ方向に対してもスパッタリングターゲットとバッキングプレートとの接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。 In the sputtering target-backing plate joint according to the present invention, it is preferable that the backing plate has a convex portion on the plate surface, and the convex portion has the hook-shaped portion or the hook receiving portion. In addition to improving the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target, the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記バッキングプレートは前記プレート面又は前記プレート側面に留め具を有し、該留め具が前記鉤状部又は前記鉤受け部を有することが好ましい。スパッタリングターゲットの側面方向におけるスパッタリングターゲットとバッキングプレートとの接合強度を向上させることに加え、スパッタリングターゲットの厚さ方向に対してもスパッタリングターゲットとバッキングプレートとの接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。 In the sputtering target-backing plate joint according to the present invention, it is preferable that the backing plate has a fastener on the plate surface or the side surface of the plate, and the fastener has the hook-shaped portion or the hook receiving portion. In addition to improving the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target, the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記留め具は側面の一部を残して前記外周側面に入り込んでおり、前記留め具は前記バッキングプレートに固定されていることが好ましい。スパッタリングターゲットの側面方向におけるスパッタリングターゲットとバッキングプレートとの接合強度を向上させることに加え、スパッタリングターゲットの厚さ方向に対してもスパッタリングターゲットとバッキングプレートとの接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。 In the sputtering target-backing plate joint according to the present invention, it is preferable that the fastener penetrates into the outer peripheral side surface leaving a part of the side surface, and the fastener is fixed to the backing plate. In addition to improving the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target, the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記留め具の側面が前記外周側面から突出しており、少なくとも前記留め具の突出した部分が前記バッキングプレートに固定されていることが好ましい。留め具を前記スパッタリングターゲットの外周側面に固定した後でも留め具を前記バッキングプレートに固定することができる。 In the sputtering target-backing plate joint according to the present invention, it is preferable that the side surface of the fastener protrudes from the outer peripheral side surface, and at least the protruding portion of the fastener is fixed to the backing plate. The fastener can be fixed to the backing plate even after the fastener is fixed to the outer peripheral side surface of the sputtering target.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記バッキングプレートは前記プレート面に凹部を有し、前記バッキングプレートは前記凹部に留め具を有し、該留め具が前記鉤状部又は前記鉤受け部を有し、前記スパッタリングターゲットの少なくとも一部と前記留め具の少なくとも一部は前記凹部に嵌め込まれており、前記バッキングプレートの凹部に前記留め具が固定されていることが好ましい。バッキングプレートのプレート面に対して留め具の位置を調整しながら留め具をバッキングプレートに固定することができる。 In the sputtering target-backing plate joint according to the present invention, the backing plate has a recess in the plate surface, the backing plate has a fastener in the recess, and the fastener is the hook-shaped portion or the hook. It is preferable that the fastener has a receiving portion, at least a part of the sputtering target and at least a part of the fastener are fitted in the recess, and the fastener is fixed in the recess of the backing plate. The fastener can be fixed to the backing plate while adjusting the position of the fastener with respect to the plate surface of the backing plate.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記バッキングプレートは前記プレート面に凹部を有し、前記バッキングプレートは前記凹部の内周側面に前記鉤状部又は前記鉤受け部を有し、前記スパッタリングターゲットの一部は前記凹部に嵌め込まれていることが好ましい。スパッタリングターゲットの側面方向におけるスパッタリングターゲットとバッキングプレートとの接合強度を向上させることに加え、スパッタリングターゲットの厚さ方向に対してもスパッタリングターゲットとバッキングプレートとの接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。 In the sputtering target-backing plate joint according to the present invention, the backing plate has a recess on the plate surface, and the backing plate has the hook-shaped portion or the hook receiving portion on the inner peripheral side surface of the recess. It is preferable that a part of the sputtering target is fitted in the recess. In addition to improving the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target, the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記鉤状部は第1の凹凸形状部を有し、前記鉤受け部は前記第1の凹凸形状部に合わさる第2の凹凸形状部を有することが好ましい。スパッタリングターゲットの側面方向におけるスパッタリングターゲットとバッキングプレートとの接合強度を向上させることに加え、スパッタリングターゲットの厚さ方向に対してもスパッタリングターゲットとバッキングプレートとの接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。 In the sputtering target-backing plate joint according to the present invention, the hook-shaped portion has a first uneven shape portion, and the hook receiving portion has a second uneven shape portion that matches the first uneven shape portion. Is preferable. In addition to improving the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target, the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記鉤状部は前記バッキングプレートから前記スパッタ面への方向における鉤先端が最大引っ掛かり箇所となる鉤形を有し、前記鉤受け部は前記鉤形に合わさる鉤穴を有することが好ましい。スパッタリングターゲットの側面方向におけるスパッタリングターゲットとバッキングプレートとの接合強度を向上させることに加え、スパッタリングターゲットの厚さ方向に対してもスパッタリングターゲットとバッキングプレートとの接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。 In the sputtering target-backing plate joint according to the present invention, the hook-shaped portion has a hook shape in which the tip of the hook in the direction from the backing plate to the sputtering surface is the maximum hooking point, and the hook receiving portion is the hook. It is preferable to have a hook hole that fits the shape. In addition to improving the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target, the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記スパッタリングターゲットと前記バッキングプレートの界面に2.5mm以下の中間層を有し、該中間層は、Ni、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることが好ましい。中間層を設けることでスパッタリングターゲットのターゲット裏面とバッキングプレートのプレート面若しくは凹部底面との接合強度を向上させるとともに、密着性が向上して熱伝導を良好に保つことができる。また、バッキングプレートとスパッタリングターゲットで中間層は覆われるため、中間層の材質が揮発して不純物となって基板に付着することを抑制することができる。 The sputtering target-backing plate junction according to the present invention has an intermediate layer of 2.5 mm or less at the interface between the sputtering target and the backing plate, and the intermediate layer is at least one of Ni, Cr, Al, and Cu. It is preferably composed of a plate or powder made of one kind of metal or an alloy containing at least one of Ni, Cr, Al and Cu, or a combination of the plate material and the powder. By providing the intermediate layer, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. Further, since the intermediate layer is covered with the backing plate and the sputtering target, it is possible to prevent the material of the intermediate layer from volatilizing and becoming impurities and adhering to the substrate.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記スパッタリングターゲットと前記バッキングプレートの界面に10μm以下の中間層を有し、該中間層は、Ni、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる薄膜であることが好ましい。中間層を設けることでスパッタリングターゲットのターゲット裏面とバッキングプレートのプレート面若しくは凹部底面との接合強度を向上させるとともに、密着性が向上して熱伝導を良好に保つことができる。また、バッキングプレートとスパッタリングターゲットで中間層は覆われるため、中間層の材質が揮発して不純物となって基板に付着することを抑制することができる。 The sputtering target-backing plate junction according to the present invention has an intermediate layer of 10 μm or less at the interface between the sputtering target and the backing plate, and the intermediate layer is at least one of Ni, Cr, Al, and Cu. It is preferably a thin film made of a metal or an alloy containing at least one of Ni, Cr, Al and Cu. By providing the intermediate layer, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. Further, since the intermediate layer is covered with the backing plate and the sputtering target, it is possible to prevent the material of the intermediate layer from volatilizing and becoming impurities and adhering to the substrate.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記スパッタリングターゲットと前記バッキングプレートの界面に1.0mm以下の中間層を有し、該中間層は、In、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることが好ましい。中間層を設けることでスパッタリングターゲットのターゲット裏面とバッキングプレートのプレート面若しくは凹部底面の接合強度を向上させるとともに、密着性が向上して熱伝導を良好に保つことができる。また、バッキングプレートとスパッタリングターゲットで中間層は覆われるため、中間層の材質が揮発して不純物となって基板に付着することを抑制することができる。 The sputtering target-backing plate alloy according to the present invention has an intermediate layer of 1.0 mm or less at the interface between the sputtering target and the backing plate, and the intermediate layer is a metal of at least one of In and Zn, or It is preferably composed of a plate material or powder made of an alloy containing at least one of In and Zn, or a combination of the plate material and the powder. By providing the intermediate layer, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. Further, since the intermediate layer is covered with the backing plate and the sputtering target, it is possible to prevent the material of the intermediate layer from volatilizing and becoming impurities and adhering to the substrate.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記スパッタリングターゲットと前記バッキングプレートの界面に2層以上の中間層を有し、該中間層は、2.5mm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせ、10μm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる薄膜、または、1.0mm以下のIn、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることが好ましい。中間層を2層以上設けることでスパッタリングターゲットのターゲット裏面とバッキングプレートのプレート面若しくは凹部底面の接合強度を向上させるとともに、密着性が向上して熱伝導を良好に保つことができる。また、バッキングプレートとスパッタリングターゲットで中間層は覆われるため、中間層の材質が揮発して不純物となって基板に付着することを抑制することができる。 The sputtering target-backing plate alloy according to the present invention has two or more intermediate layers at the interface between the sputtering target and the backing plate, and the intermediate layers are Ni, Cr, Al, Cu of 2.5 mm or less. A plate or powder composed of at least one of the metals or an alloy containing at least one of Ni, Cr, Al and Cu, or a combination of the plate and the powder, and at least 10 μm or less of Ni, Cr, Al and Cu. A thin film made of any one metal or an alloy containing at least one of Ni, Cr, Al, and Cu, or at least one of In and Zn of 1.0 mm or less, or at least one of In and Zn. It is preferably composed of a plate material or powder made of an alloy containing one kind, or a combination of the plate material and the powder. By providing two or more intermediate layers, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. Further, since the intermediate layer is covered with the backing plate and the sputtering target, it is possible to prevent the material of the intermediate layer from volatilizing and becoming impurities and adhering to the substrate.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記スパッタリングターゲットの材質がAl-Sc合金、Ru、Ru合金、Ir、又はIr合金であることが好ましい。1000℃以上の高融点材料でもスパッタリングターゲットの反りや割れを抑制しつつ、スパッタリングターゲットとバッキングプレートの接合強度を向上させることができる。 In the sputtering target-backing plate joint according to the present invention, it is preferable that the material of the sputtering target is an Al—Sc alloy, Ru, Ru alloy, Ir, or Ir alloy. Even with a high melting point material of 1000 ° C. or higher, the bonding strength between the sputtering target and the backing plate can be improved while suppressing warpage and cracking of the sputtering target.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記スパッタリングターゲットの材質がLi系酸化物、Co系酸化物、Ti系酸化物又はMg系酸化物であることが好ましい。1000℃以上の高融点材料でもスパッタリングターゲットの反りや割れを抑制しつつ、スパッタリングターゲットとバッキングプレートの接合強度を向上させることができる。 In the sputtering target-backing plate joint according to the present invention, it is preferable that the material of the sputtering target is Li-based oxide, Co-based oxide, Ti-based oxide or Mg-based oxide. Even with a high melting point material of 1000 ° C. or higher, the bonding strength between the sputtering target and the backing plate can be improved while suppressing warpage and cracking of the sputtering target.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体では、前記バッキングプレートの材質がAl、Al合金、Cu、Cu合金、Fe又はFe合金であり、前記バッキングプレートの線膨張係数が30.0×10-6/℃以下であることが好ましい。バッキングプレートの熱伝導性が良いものを用いることで、加熱時においてバッキングプレートが膨張し、バッキングプレートの凸部若しくは凹部の内周側面にスパッタリングターゲットを挿入することができるとともに、冷却時においてバッキングプレートが収縮し、バッキングプレートの凸部若しくは凹部の内周側面とスパッタリングターゲットの外周側面を当接させることにより接合体を形成することができる。 In the sputtering target-backing plate joint according to the present invention, the material of the backing plate is Al, Al alloy, Cu, Cu alloy, Fe or Fe alloy, and the linear expansion coefficient of the backing plate is 30.0 × 10 . It is preferably 6 / ° C. or lower. By using a backing plate with good thermal conductivity, the backing plate expands during heating, and the sputtering target can be inserted into the inner peripheral side surface of the convex or concave portion of the backing plate, and the backing plate can be inserted during cooling. Shrinks, and the inner peripheral side surface of the convex or concave portion of the backing plate is brought into contact with the outer peripheral side surface of the sputtering target to form a bonded body.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法は、プレート面とプレート裏面とプレート側面と鉤状部又は鉤受け部のいずれか一方とを有するバッキングプレート、及び、ターゲット面とターゲット裏面と外周側面と該外周側面に設けられた前記鉤状部又は前記鉤受け部の他方とを有するスパッタリングターゲットを準備する工程1と、前記バッキングプレートを加熱して熱膨張させる工程2と、前記プレート面と前記ターゲット裏面とが向かい合わせになるように、かつ、前記鉤受け部と前記鉤状部とが向かい合わせになるように、前記スパッタリングターゲットと前記バッキングプレートとを配置する工程3と、前記スパッタリングターゲットと前記バッキングプレートとを冷却して、前記鉤受け部に前記鉤状部を当接させることによって、前記スパッタリングターゲットを前記バッキングプレートに固定する工程4と、を有することを特徴とする。熱膨脹及び熱収縮を利用して、鉤状部と鉤受け部とを当接することにより容易にスパッタリングターゲット‐バッキングプレート接合体を製造することができる。 The method for manufacturing a sputtering target-backing plate joint according to the present invention includes a backing plate having a plate surface, a plate back surface, a plate side surface, and either a hook-shaped portion or a hook receiving portion, and a target surface and a target back surface. Step 1 of preparing a sputtering target having the outer peripheral side surface and the hook-shaped portion or the other of the hook receiving portion provided on the outer peripheral side surface, step 2 of heating and thermally expanding the backing plate, and the plate surface. Step 3 of arranging the sputtering target and the backing plate so that the back surface of the target and the back surface of the target face each other and the hook receiving portion and the hook-shaped portion face each other, and the sputtering. It is characterized by having a step 4 of fixing the sputtering target to the backing plate by cooling the target and the backing plate and bringing the hook-shaped portion into contact with the hook receiving portion. A sputtering target-backing plate joint can be easily manufactured by abutting the hook-shaped portion and the hook receiving portion by utilizing thermal expansion and contraction.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法では、前記スパッタリングターゲットと前記バッキングプレートとを冷却して、前記鉤受け部に前記鉤状部を当接させることによって、前記スパッタリングターゲットを前記バッキングプレートに固定する工程4の後に、前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧又は前記スパッタリングターゲット及び前記バッキングプレートの加熱と前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧の工程、及び、前記スパッタリングターゲット及び前記バッキングプレートの冷却の工程を1組として1回行う又は2回以上繰り返し行うことが好ましい。スパッタリングターゲットの反りを抑制しつつ、スパッタリングターゲットのターゲット裏面とバッキングプレートのプレート面若しくは凹部底面との接合強度をより向上させることができ、密着性が向上して熱伝導を効率よく行うことができる。 In the method for manufacturing a sputtering target-backing plate joint according to the present invention, the sputtering target and the backing plate are cooled and the hook-shaped portion is brought into contact with the hook receiving portion to bring the sputtering target into contact with the hook-shaped portion. After the step 4 of fixing to the backing plate, pressing the sputtering target from the target surface to the backing plate or heating the sputtering target and the backing plate and pressing the sputtering target from the target surface to the backing plate. It is preferable that the step and the step of cooling the sputtering target and the backing plate are performed once as a set or repeated two or more times. While suppressing the warp of the sputtering target, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be further improved, the adhesion can be improved, and heat conduction can be efficiently performed. ..
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体は、プレート面とプレート裏面とプレート側面とを有するバッキングプレート、鉤状部又は鉤受け部のいずれか一方を有する留め具、及び、ターゲット面とターゲット裏面と外周側面と該外周側面に前記鉤状部又は前記鉤受け部の他方とを有するスパッタリングターゲットを準備する工程1と、前記プレート面と前記ターゲット裏面とが向かい合わせになるように、前記スパッタリングターゲットと前記バッキングプレートとを配置する工程2と、前記留め具を前記プレート面又は前記プレート側面に配置し、かつ、前記鉤受け部と前記鉤状部とが向かい合わせになるように、前記スパッタリングターゲットと前記留め具とを配置する工程3と、該工程3の配置状態で前記留め具を前記バッキングプレートに固定する工程4と、を有することを特徴とする。鉤状部又は鉤受け部を留め具に設けることで、鉤状部と鉤受け部とを容易に当接することが可能となり、スパッタリングターゲット‐バッキングプレート接合体を容易に製造することができる。 The sputtering target-backing plate joint according to the present invention includes a backing plate having a plate surface, a plate back surface, and a plate side surface, a fastener having either a hook-shaped portion or a hook receiving portion, and a target surface and a target back surface. The step 1 of preparing a sputtering target having the hook-shaped portion or the other of the hook receiving portion on the outer peripheral side surface and the outer peripheral side surface, and the sputtering target so that the plate surface and the back surface of the target face each other. And the step 2 of arranging the backing plate, and the sputtering target so that the fastener is arranged on the plate surface or the plate side surface and the hook receiving portion and the hook-shaped portion face each other. It is characterized by having a step 3 of arranging the fastener and the step 4 of fixing the fastener to the backing plate in the arranged state of the step 3. By providing the hook-shaped portion or the hook receiving portion on the fastener, the hook-shaped portion and the hook receiving portion can be easily brought into contact with each other, and a sputtering target-backing plate joint can be easily manufactured.
 本発明に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法では、前記工程3の配置状態で前記留め具を前記バッキングプレートに固定する工程4の後に、前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧又は前記スパッタリングターゲット及び前記バッキングプレートの加熱と前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧の工程、及び、前記スパッタリングターゲット及び前記バッキングプレートの冷却の工程を1組として1回行う又は2回以上繰り返し行うことが好ましい。スパッタリングターゲットの反りを抑制しつつ、スパッタリングターゲットのターゲット裏面とバッキングプレートのプレート面若しくは凹部底面との接合強度をより向上させることができ、密着性が向上して熱伝導を効率よく行うことができる。 In the method for manufacturing a sputtering target-backing plate joint according to the present invention, after the step 4 of fixing the fastener to the backing plate in the arrangement state of the step 3, the target surface of the sputtering target is transferred to the backing plate. The step of pressing or heating the sputtering target and the backing plate, pressing the sputtering target from the target surface to the backing plate, and cooling the sputtering target and the backing plate are performed once as a set. Alternatively, it is preferable to repeat the process twice or more. While suppressing the warp of the sputtering target, the bonding strength between the back surface of the target of the sputtering target and the plate surface or the bottom surface of the recess of the backing plate can be further improved, the adhesion can be improved, and heat conduction can be efficiently performed. ..
 本発明に係るスパッタリングターゲットの回収方法は、本発明に係るスパッタリングターゲット‐バッキングプレート接合体を加熱して、前記鉤受け部から前記鉤状部を離すまで熱膨脹させる工程Aと、前記スパッタリングターゲットを前記バッキングプレートから取り外して、前記スパッタリングターゲット‐バッキングプレート接合体から前記スパッタリングターゲットを回収する工程Bと、有することを特徴とする。 The method for recovering a sputtering target according to the present invention includes a step A in which the sputtering target-backing plate joint according to the present invention is heated and thermally expanded until the hook-shaped portion is separated from the hook receiving portion, and the sputtering target is described above. It is characterized by having a step B of removing the sputtering target from the backing plate and recovering the sputtering target from the sputtering target-backing plate joint.
 本発明に係るスパッタリングターゲットの回収方法は、留め具によってスパッタリングターゲットをバッキングプレートに固定したスパッタリングターゲット‐バッキングプレート接合体から前記スパッタリングターゲットを回収する方法であって、前記留め具は前記バッキングプレートに固定されており、前記留め具を前記バッキングプレートから取り外して、前記スパッタリングターゲット‐バッキングプレート接合体から前記スパッタリングターゲットを回収する工程Cを有することを特徴とする。 The method for recovering a sputtering target according to the present invention is a method for recovering the sputtering target from a sputtering target-backing plate joint in which the sputtering target is fixed to the backing plate by a fastener, and the fastener is fixed to the backing plate. It is characterized by having a step C of removing the fastener from the backing plate and recovering the sputtering target from the sputtering target-backing plate joint.
 本開示は、曲げ強度の低いスパッタリングターゲットを用いた場合や、スパッタリングターゲットとバッキングプレートとの線膨張係数の差が大きく異なる場合であっても、スパッタリングターゲットの破損や剥離が抑制でき、また、不純物の揮発による汚染が抑制でき、さらには、ターゲット材として使われる高価な材料の損失を抑制しながら、ターゲット材の剥離回収を容易にすることができるスパッタリングターゲット‐バッキングプレート接合体、その製造方法及びスパッタリングターゲットの回収方法を提供することができる。 The present disclosure can suppress breakage and peeling of a sputtering target even when a sputtering target having a low bending strength is used or when the difference in linear expansion coefficient between the sputtering target and the backing plate is significantly different, and impurities are present. Sputtering target-backing plate junction, its manufacturing method and capable of suppressing the contamination due to volatilization of the target material and facilitating the peeling recovery of the target material while suppressing the loss of the expensive material used as the target material. A method for recovering a sputtering target can be provided.
本実施形態に係る円板状のスパッタリングターゲット‐バッキングプレート接合体の平面概略図である。It is a plan view of the disk-shaped sputtering target-backing plate joint body which concerns on this embodiment. 図1の第1例のA‐A断面概略図であり、形態1-1を示す。FIG. 1 is a schematic cross-sectional view taken along the line AA of the first example of FIG. 1, showing the form 1-1. 図2の破線で囲った部分の別形態(1)の概略図である。It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(2)の概略図である。It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(3)の概略図である。It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(4)の概略図である。It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(5)の概略図である。It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(6)の概略図である。It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(7)の概略図である。It is a schematic diagram of another form (7) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(8)の概略図である。It is a schematic diagram of another form (8) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(9)の概略図である。It is a schematic diagram of another form (9) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(10)の概略図である。It is a schematic diagram of another form (10) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(11)の概略図である。It is a schematic diagram of another form (11) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(12)の概略図である。It is a schematic diagram of another form (12) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(13)の概略図である。It is a schematic diagram of another form (13) of the part surrounded by the broken line of FIG. 図2の破線で囲った部分の別形態(14)の概略図である。It is a schematic diagram of another form (14) of the part surrounded by the broken line of FIG. 本実施形態に係る長方形板状のスパッタリングターゲット‐バッキングプレート接合体の平面概略図である。It is a plan view of the rectangular plate-shaped sputtering target-backing plate joint body which concerns on this embodiment. 本実施形態に係る別形態の円板状のスパッタリングターゲット‐バッキングプレート接合体の平面概略図である。It is a plan view of the disk-shaped sputtering target-backing plate joint of another embodiment which concerns on this embodiment. 図4の第1例のA‐A断面概略図であり、形態1‐2を示す。FIG. 4 is a schematic cross-sectional view taken along the line AA of the first example of FIG. 4, showing the form 1-2. 図5の破線で囲った部分の別形態(1)の概略図である。It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(2)の概略図である。It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(3)の概略図である。It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(4)の概略図である。It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(5)の概略図である。It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(6)の概略図である。It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(7)の概略図である。It is a schematic diagram of another form (7) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(8)の概略図である。It is a schematic diagram of another form (8) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(9)の概略図である。It is a schematic diagram of another form (9) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(10)の概略図である。It is a schematic diagram of another form (10) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(11)の概略図である。It is a schematic diagram of another form (11) of the part surrounded by the broken line of FIG. 図5の破線で囲った部分の別形態(12)の概略図である。It is a schematic diagram of another form (12) of the part surrounded by the broken line of FIG. 本実施形態に係る別形態の長方形板状のスパッタリングターゲット‐バッキングプレート接合体の平面概略図である。It is a plan view of the rectangular plate-shaped sputtering target-backing plate joint of another embodiment which concerns on this embodiment. 形態2-1の断面概略図である。FIG. 3 is a schematic cross-sectional view of Form 2-1. 図7の破線で囲った部分の別形態(1)の概略図である。It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(2)の概略図である。It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(3)の概略図である。It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(4)の概略図である。It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(5)の概略図である。It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(6)の概略図である。It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(7)の概略図である。It is a schematic diagram of another form (7) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(8)の概略図である。It is a schematic diagram of another form (8) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(9)の概略図である。It is a schematic diagram of another form (9) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(10)の概略図である。It is a schematic diagram of another form (10) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(11)の概略図である。It is a schematic diagram of another form (11) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(12)の概略図である。It is a schematic diagram of another form (12) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(13)の概略図である。It is a schematic diagram of another form (13) of the part surrounded by the broken line of FIG. 7. 図7の破線で囲った部分の別形態(14)の概略図である。It is a schematic diagram of another form (14) of the part surrounded by the broken line of FIG. 7. 形態3-1の断面概略図である。FIG. 3 is a schematic cross-sectional view of Form 3-1. 図8の破線で囲った部分の別形態(1)の概略図である。It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(2)の概略図である。It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(3)の概略図である。It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(4)の概略図である。It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(5)の概略図である。It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(6)の概略図である。It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(7)の概略図である。It is a schematic diagram of another form (7) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(8)の概略図である。It is a schematic diagram of another form (8) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(9)の概略図である。It is a schematic diagram of another form (9) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(10)の概略図である。It is a schematic diagram of another form (10) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(11)の概略図である。It is a schematic diagram of another form (11) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(12)の概略図である。It is a schematic diagram of another form (12) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(13)の概略図である。It is a schematic diagram of another form (13) of the part surrounded by the broken line of FIG. 図8の破線で囲った部分の別形態(14)の概略図である。It is a schematic diagram of another form (14) of the part surrounded by the broken line of FIG. 形態4-1の断面概略図である。FIG. 3 is a schematic cross-sectional view of Form 4-1. 図9の破線で囲った部分の別形態(1)の概略図である。It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(2)の概略図である。It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(3)の概略図である。It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(4)の概略図である。It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(5)の概略図である。It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(6)の概略図である。It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(7)の概略図である。It is a schematic diagram of another form (7) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(8)の概略図である。It is a schematic diagram of another form (8) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(9)の概略図である。It is a schematic diagram of another form (9) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(10)の概略図である。It is a schematic diagram of another form (10) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(11)の概略図である。It is a schematic diagram of another form (11) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(12)の概略図である。It is a schematic diagram of another form (12) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(13)の概略図である。It is a schematic diagram of another form (13) of the part surrounded by the broken line of FIG. 図9の破線で囲った部分の別形態(14)の概略図である。It is a schematic diagram of another form (14) of the part surrounded by the broken line of FIG. 形態5-1の断面概略図である。FIG. 5 is a schematic cross-sectional view of Form 5-1. 図10の破線で囲った部分の別形態(1)の概略図である。It is a schematic diagram of another form (1) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(2)の概略図である。It is a schematic diagram of another form (2) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(3)の概略図である。It is a schematic diagram of another form (3) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(4)の概略図である。It is a schematic diagram of another form (4) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(5)の概略図である。It is a schematic diagram of another form (5) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(6)の概略図である。It is a schematic diagram of another form (6) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(7)の概略図である。It is a schematic diagram of another form (7) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(8)の概略図である。It is a schematic diagram of another form (8) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(9)の概略図である。It is a schematic diagram of another form (9) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(10)の概略図である。It is a schematic diagram of another form (10) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(11)の概略図である。It is a schematic diagram of another form (11) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(12)の概略図である。It is a schematic diagram of another form (12) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(13)の概略図である。It is a schematic diagram of another form (13) of the part surrounded by the broken line of FIG. 図10の破線で囲った部分の別形態(14)の概略図である。It is a schematic diagram of another form (14) of the part surrounded by the broken line of FIG. 形態6-1、形態7‐1又は形態8‐1の断面概略図である。6 is a schematic cross-sectional view of Form 6-1 and Form 7-1 or Form 8-1. 形態6-2、形態7‐2又は形態8‐2の断面概略図である。6-2 is a schematic cross-sectional view of Form 6-2, Form 7-2, or Form 8-2. 形態9-1の断面概略図である。It is sectional drawing of the form 9-1. 形態9‐2の断面概略図である。It is sectional drawing of the form 9-2. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第1例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the first example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第2例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the 2nd example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第3例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the 3rd example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第4例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the 4th example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第5例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the 5th example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第6例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the sixth example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第7例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the 7th example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第8例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the 8th example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第9例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the 9th example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第10例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the tenth example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の製造方法の第11例を説明するための概略工程図である。It is a schematic process diagram for demonstrating the eleventh example of the manufacturing method of the sputtering target-backing plate joint which concerns on this embodiment. 実施例1における当接部位を示す画像である。It is an image which shows the contact part in Example 1. FIG. 比較例1における接合結果を示す画像である。It is an image which shows the joining result in the comparative example 1. 比較例2における接合結果を示す画像である。It is an image which shows the joining result in the comparative example 2. 比較例3における接合結果を示す画像である。It is an image which shows the joining result in the comparative example 3. 比較例4における接合結果を示す画像である。It is an image which shows the joining result in the comparative example 4.
 以降、本発明について実施形態を示して詳細に説明するが本発明はこれらの記載に限定して解釈されない。本発明の効果を奏する限り、実施形態は種々の変形をしてもよい。図中、各接合体において、同一名称の部位には、形状によらず、同一の符号を付した。 Hereinafter, the present invention will be described in detail by showing embodiments, but the present invention is not construed as being limited to these descriptions. The embodiments may be modified in various ways as long as the effects of the present invention are exhibited. In the figure, in each of the joints, the parts having the same name are designated by the same reference numerals regardless of the shape.
〈スパッタリングターゲット‐バッキングプレート接合体〉
(形態1-1:バッキングプレートが鉤状部を有し、スパッタリングターゲットが鉤受け部を有する形態)
 図1及び図2を参照して、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体を説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体100は、バッキングプレート1にスパッタリングターゲット2が接合されたスパッタリングターゲット‐バッキングプレート接合体において、バッキングプレート1は、プレート面3と、プレート裏面4と、プレート側面5と、を有し、スパッタリングターゲット2は、ターゲット面7と、プレート面3と向かい合うターゲット裏面8と、外周側面9と、を有し、バッキングプレート1及びスパッタリングターゲット2は、バッキングプレート1がさらに鉤状部6を有し、スパッタリングターゲット2がさらに鉤受け部10を有し、鉤状部6と鉤受け部10とは当接し合っており、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に設けられており、かつ、鉤状部6が鉤受け部10に当接することによって、スパッタリングターゲット2がバッキングプレート1に固定される。鉤状部6が鉤受け部10に当接されることによって、バッキングプレート1のプレート面3の側面方向に対してスパッタリングターゲット2を固定するとともに、バッキングプレート1のプレート面3の厚さ方向に対してスパッタリングターゲット2を固定することができる。
<Sputtering target-backing plate joint>
(Form 1-1: The backing plate has a hook-shaped portion, and the sputtering target has a hook receiving portion)
The sputtering target-backing plate junction according to the present embodiment will be described with reference to FIGS. 1 and 2. The sputtering target-backing plate joint 100 according to the present embodiment is a sputtering target-backing plate joint in which the sputtering target 2 is bonded to the backing plate 1, and the backing plate 1 has a plate surface 3 and a plate back surface 4. The plate side surface 5 is provided, the sputtering target 2 has a target surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9, and the backing plate 1 and the sputtering target 2 are backing plates 1. Further has a hook-shaped portion 6, the sputtering target 2 further has a hook receiving portion 10, and the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other. The sputtering target 2 is fixed to the backing plate 1 by being provided on the outer peripheral side surface 9 of the sputtering target 2 and the hook-shaped portion 6 abuts on the hook receiving portion 10. When the hook-shaped portion 6 is in contact with the hook receiving portion 10, the sputtering target 2 is fixed to the side surface direction of the plate surface 3 of the backing plate 1, and the sputtering target 2 is fixed in the thickness direction of the plate surface 3 of the backing plate 1. On the other hand, the sputtering target 2 can be fixed.
 図1及び図2に示した形態では、バッキングプレート1はプレート面3に凸部13を有し、凸部13が鉤状部6を有する形態である。バッキングプレート1を切削して凸部13を形成して凸部13の内側に鉤状部6を形成する。鉤状部6はバッキングプレート1に一体化されているため、スパッタリングターゲット2を固定することができる。 In the form shown in FIGS. 1 and 2, the backing plate 1 has a convex portion 13 on the plate surface 3, and the convex portion 13 has a hook-shaped portion 6. The backing plate 1 is cut to form the convex portion 13 and the hook-shaped portion 6 is formed inside the convex portion 13. Since the hook-shaped portion 6 is integrated with the backing plate 1, the sputtering target 2 can be fixed.
 図2における鉤状部6と鉤受け部10については、スパッタリングターゲット2の外周形状を全周にわたって鉤状部6と鉤受け部10を当接させることが好ましい。図1において、環状に網掛けをした箇所は、バッキングプレート1のプレート面3に設けた凸部13の天面を示し、凸部13がスパッタリングターゲット2の外周形状を全周にわたってあることを示している。ただし、スパッタリングターゲット2の破損や剥離が抑制でき、不純物の揮発による汚染が抑制できるときは、鉤状部6と鉤受け部10を部分的に2つ以上形成して当接させてもよい。 Regarding the hook-shaped portion 6 and the hook receiving portion 10 in FIG. 2, it is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2. In FIG. 1, the annularly shaded portion indicates the top surface of the convex portion 13 provided on the plate surface 3 of the backing plate 1, indicating that the convex portion 13 covers the outer peripheral shape of the sputtering target 2 over the entire circumference. ing. However, when damage or peeling of the sputtering target 2 can be suppressed and contamination due to volatilization of impurities can be suppressed, two or more hook-shaped portions 6 and hook receiving portions 10 may be partially formed and brought into contact with each other.
 図2における鉤状部6と鉤受け部10については、図2(A)~図2(N)に示される鉤状部、鉤受け部の形態を用いて当接させてもよい。 The hook-shaped portion 6 and the hook receiving portion 10 in FIG. 2 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 2 (A) to 2 (N).
 また、鉤状部6と鉤受け部10が当接されていればバッキングプレート1とスパッタリングターゲット2の接合強度を担保することができるが、接合強度に加え、バッキングプレート1とスパッタリングターゲット2の密着性が必要なときは、鉤状部6と鉤受け部10を当接したときに、鉤状部6から鉤受け部10に向けて押圧していることが好ましい。 Further, if the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured, but in addition to the bonding strength, the backing plate 1 and the sputtering target 2 are in close contact with each other. When the property is required, it is preferable that when the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the hook-shaped portion 6 is pressed toward the hook receiving portion 10.
 図1及び図2では、円板形状のバッキングプレート1に円板形状のスパッタリングターゲット2が接合されている形態を示したが、図3に示すように長方形のバッキングプレート1に長方形のスパッタリングターゲット2が接合されている形態であってもよい。B‐B断面は、図2に示したA-A断面と同様の形状を有する。また、長方形の形状には正方形の形状が包含される。図3においても、環状に網掛けをした箇所は、バッキングプレート1のプレート面3に設けた凸部13の天面を示す。 1 and 2 show a form in which a disk-shaped sputtering target 2 is joined to a disk-shaped backing plate 1. However, as shown in FIG. 3, a rectangular sputtering target 2 is attached to a rectangular backing plate 1. May be in the form of being joined. The BB cross section has the same shape as the AA cross section shown in FIG. Further, the rectangular shape includes a square shape. Also in FIG. 3, the annularly shaded portion indicates the top surface of the convex portion 13 provided on the plate surface 3 of the backing plate 1.
(形態1-2:バッキングプレートが鉤受け部を有し、スパッタリングターゲットが鉤状部を有する形態)
 図4及び図5を参照して、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体の別形態を説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体101は、バッキングプレート1にスパッタリングターゲット2が接合されたスパッタリングターゲット‐バッキングプレート接合体において、バッキングプレート1は、プレート面3と、プレート裏面4と、プレート側面5と、を有し、スパッタリングターゲット2は、ターゲット面7と、プレート面3と向かい合うターゲット裏面8と、外周側面9と、を有し、バッキングプレート1及びスパッタリングターゲット2は、バッキングプレート1がさらに鉤受け部10を有し、スパッタリングターゲット2がさらに鉤状部6を有し、鉤状部6と鉤受け部10とは当接し合っており、スパッタリングターゲット2の鉤状部6は、スパッタリングターゲット2の外周側面9に設けられており、かつ、鉤状部6が鉤受け部10に当接することによって、スパッタリングターゲット2がバッキングプレート1に固定される。鉤状部6が鉤受け部10に当接することによって、バッキングプレート1のプレート面3の側面方向に対してスパッタリングターゲット2を固定するとともに、バッキングプレート1のプレート面3の厚さ方向に対してスパッタリングターゲット2を固定することができる。
(Form 1-2: The backing plate has a hook receiving portion, and the sputtering target has a hook-shaped portion)
Another embodiment of the sputtering target-backing plate junction according to the present embodiment will be described with reference to FIGS. 4 and 5. The sputtering target-backing plate joint 101 according to the present embodiment is a sputtering target-backing plate joint in which the sputtering target 2 is bonded to the backing plate 1, and the backing plate 1 has a plate surface 3 and a plate back surface 4. The plate side surface 5 is provided, the sputtering target 2 has a target surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9, and the backing plate 1 and the sputtering target 2 are backing plates 1. Further has a hook-shaped portion 10, the sputtering target 2 further has a hook-shaped portion 6, and the hook-shaped portion 6 and the hook-shaped portion 10 are in contact with each other. The sputtering target 2 is fixed to the backing plate 1 by being provided on the outer peripheral side surface 9 of the sputtering target 2 and the hook-shaped portion 6 abuts on the hook receiving portion 10. When the hook-shaped portion 6 abuts on the hook receiving portion 10, the sputtering target 2 is fixed to the side surface direction of the plate surface 3 of the backing plate 1, and the sputtering target 2 is fixed to the thickness direction of the plate surface 3 of the backing plate 1. The sputtering target 2 can be fixed.
 図4及び図5に示した形態では、バッキングプレート1はプレート面3に凸部13を有し、凸部13が鉤受け部10を有する形態である。バッキングプレート1を切削して凸部13を形成して凸部13の内側に鉤受け部10を形成する。鉤受け部10はバッキングプレート1に一体化されているため、スパッタリングターゲット2を固定することができる。 In the form shown in FIGS. 4 and 5, the backing plate 1 has a convex portion 13 on the plate surface 3, and the convex portion 13 has a hook receiving portion 10. The backing plate 1 is cut to form the convex portion 13, and the hook receiving portion 10 is formed inside the convex portion 13. Since the hook receiving portion 10 is integrated with the backing plate 1, the sputtering target 2 can be fixed.
 図5における鉤状部6と鉤受け部10については、スパッタリングターゲット2の外周形状を全周にわたって鉤状部6と鉤受け部10を当接させることが好ましいが、スパッタリングターゲット2の破損や剥離が抑制でき、不純物の揮発による汚染が抑制できるときは、鉤状部6と鉤受け部10を部分的に2つ以上形成して当接させてもよい。 Regarding the hook-shaped portion 6 and the hook receiving portion 10 in FIG. 5, it is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but the sputtering target 2 is damaged or peeled off. However, when the contamination due to the volatilization of impurities can be suppressed, two or more hook-shaped portions 6 and the hook receiving portions 10 may be partially formed and brought into contact with each other.
 図5における鉤状部6と鉤受け部10については、図5(A)~図5(L)などに示される鉤状部、鉤受け部の形態を用いて当接させてもよい。 The hook-shaped portion 6 and the hook receiving portion 10 in FIG. 5 may be brought into contact with each other by using the form of the hook-shaped portion and the hook receiving portion shown in FIGS. 5A to 5L.
 また、鉤状部6と鉤受け部10が当接されていればバッキングプレート1とスパッタリングターゲット2の接合強度を担保することができるが、接合強度に加え、バッキングプレート1とスパッタリングターゲット2の密着性が必要なときは、鉤状部6と鉤受け部10を当接したときに、鉤受け部10から鉤状部6に向けて押圧していることが好ましい。 Further, if the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured, but in addition to the bonding strength, the backing plate 1 and the sputtering target 2 are in close contact with each other. When the property is required, it is preferable that when the hook-shaped portion 6 and the hook-shaped portion 10 are in contact with each other, the hook-shaped portion 10 is pressed toward the hook-shaped portion 6.
 図4及び図5では、円板形状のバッキングプレート1に円板形状のスパッタリングターゲット2が接合されている形態を示したが、図6に示すように長方形のバッキングプレート1に長方形のスパッタリングターゲット2が接合されている形態であってもよい。B‐B断面は、図5に示したA-A断面と同様の形状を有する。また、長方形の形状には正方形の形状が包含される。図6において、環状に網掛けをした箇所は、バッキングプレート1のプレート面3に設けた凸部13の天面を示す。 4 and 5 show a form in which the disk-shaped sputtering target 2 is joined to the disk-shaped backing plate 1, but as shown in FIG. 6, the rectangular sputtering target 2 is attached to the rectangular backing plate 1. May be in the form of being joined. The BB cross section has the same shape as the AA cross section shown in FIG. Further, the rectangular shape includes a square shape. In FIG. 6, the annularly shaded portion indicates the top surface of the convex portion 13 provided on the plate surface 3 of the backing plate 1.
 以降、スパッタリングターゲット‐バッキングプレート接合体の断面概略図を種々示しながら、本実施形態についてさらに説明する。スパッタリングターゲット‐バッキングプレート接合体は、円板形状、長方形板状又は正方形板状のいずれであってもよい。 Hereinafter, the present embodiment will be further described while showing various schematic cross-sectional views of the sputtering target-backing plate joint. The sputtering target-backing plate joint may be in the shape of a disk, a rectangular plate, or a square plate.
(形態2‐1:バッキングプレートが留め具を有し、留め具が鉤状部を有する形態)
 図7に示すように、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体200では、バッキングプレート1が留め具14を有し、留め具14が鉤状部6を有することが好ましい。スパッタリングターゲット2は、鉤受け部10を有し、鉤状部6が鉤受け部10に当接している。形態1-1では、バッキングプレート1がプレート面3に凸部13を有し、凸部13が鉤状部6を有する形態であるのに対して、形態2-1では、凸部13の代わりに留め具14を有している。バッキングプレート1が留め具14を有することで留め具14は凸部13と同じ役割を果たす。バッキングプレート1が留め具14を有することで、加工の容易化、接合体の組み立ての容易化を図ることができる。図7に示すように、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体200では、留め具14の側面が外周側面9から突出しており、少なくとも留め具14の突出した部分がバッキングプレート1に固定されていることが好ましい。図2に示す形態と異なるところは、バッキングプレート1とスパッタリングターゲット2とは別に留め具を準備し、留め具のスパッタリングターゲット2と接する側に鉤状部6を形成し、スパッタリングターゲット2の外周側面9に鉤受け部10を形成し、留め具14の鉤状部6とスパッタリングターゲット2の鉤受け部10を当接させた後、スパッタリングターゲット2に覆われていない箇所の留め具からバッキングプレート1に向けて固定を行うことによって、バッキングプレート1にスパッタリングターゲット2を固定することができる。固定は、例えば、ねじ止め箇所11においてねじ止めによって固定する。このような構造とすることで、バッキングプレート1の鉤状部6の外側がスパッタリングターゲット2の外周側面9よりも外側に位置することとなり、鉤状部6が鉤受け部10に当接されると、バッキングプレート1のプレート面3の側面方向に対してスパッタリングターゲット2が固定されるとともに、バッキングプレート1のプレート面3の厚さ方向に対してスパッタリングターゲット2を固定することもできる。留め具14は、バッキングプレート1にねじ止めによる固定の他、拡散接合、溶接などの接合手段によって固定してもよい。図7では、ねじ止め箇所11において、ねじ止めによって、留め具14をバッキングプレート1のプレート面3に固定した形態を示したが、プレート面3だけでなく、バッキングプレート1の側面又は裏面にて固定してもよい。
(Form 2-1: The backing plate has a fastener, and the fastener has a hook-shaped portion)
As shown in FIG. 7, in the sputtering target-backing plate joint 200 according to the present embodiment, it is preferable that the backing plate 1 has a fastener 14 and the fastener 14 has a hook-shaped portion 6. The sputtering target 2 has a hook receiving portion 10, and the hook-shaped portion 6 is in contact with the hook receiving portion 10. In the form 1-1, the backing plate 1 has the convex portion 13 on the plate surface 3, and the convex portion 13 has the hook-shaped portion 6, whereas in the form 2-1 the convex portion 13 is replaced. Has a fastener 14. Since the backing plate 1 has the fastener 14, the fastener 14 plays the same role as the convex portion 13. Since the backing plate 1 has the fastener 14, the processing can be facilitated and the assembly of the joint can be facilitated. As shown in FIG. 7, in the sputtering target-backing plate joint 200 according to the present embodiment, the side surface of the fastener 14 protrudes from the outer peripheral side surface 9, and at least the protruding portion of the fastener 14 is fixed to the backing plate 1. It is preferable that it is. The difference from the form shown in FIG. 2 is that a fastener is prepared separately from the backing plate 1 and the sputtering target 2, a hook-shaped portion 6 is formed on the side of the fastener in contact with the sputtering target 2, and the outer peripheral side surface of the sputtering target 2 is formed. A hook receiving portion 10 is formed in 9, and the hook-shaped portion 6 of the fastener 14 and the hook receiving portion 10 of the sputtering target 2 are brought into contact with each other. The sputtering target 2 can be fixed to the backing plate 1 by fixing toward. For fixing, for example, it is fixed by screwing at the screwing point 11. With such a structure, the outside of the hook-shaped portion 6 of the backing plate 1 is located outside the outer peripheral side surface 9 of the sputtering target 2, and the hook-shaped portion 6 is in contact with the hook receiving portion 10. The sputtering target 2 can be fixed to the side surface direction of the plate surface 3 of the backing plate 1, and the sputtering target 2 can be fixed to the thickness direction of the plate surface 3 of the backing plate 1. The fastener 14 may be fixed to the backing plate 1 by a joining means such as diffusion joining or welding, in addition to fixing by screwing. FIG. 7 shows a form in which the fastener 14 is fixed to the plate surface 3 of the backing plate 1 by screwing at the screwed portion 11, but not only on the plate surface 3 but also on the side surface or the back surface of the backing plate 1. It may be fixed.
 図7に示す形態では、図2に示す形態と同様に、鉤状部6と鉤受け部10を当接させることができるが、さらに、次のような構造としてもよい。
(1)スパッタリングターゲット2の外周形状を全周にわたって鉤状部6と鉤受け部10を当接させることが好ましいが、鉤状部6と鉤受け部10を部分的に2つ以上形成して当接させてもよい。
(2)鉤状部6と鉤受け部10については、図7(A)~図7(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(3)接合強度に加え、バッキングプレート1とスパッタリングターゲット2の密着性が必要なときは、鉤状部6と鉤受け部10を当接したときに、鉤状部6から鉤受け部10に向けて押圧してもよい。
In the form shown in FIG. 7, the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 2, but the structure may be further as follows.
(1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact.
(2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 7 (A) to 7 (N) and the like.
(3) When adhesion between the backing plate 1 and the sputtering target 2 is required in addition to the joining strength, when the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the hook-shaped portion 6 is transferred to the hook receiving portion 10. You may press it toward it.
(形態2‐2:バッキングプレートが留め具を有し、留め具が鉤受け部を有する形態)
 形態1-1と形態1-2との関係、すなわち、鉤状部と鉤受け部との配置が逆関係であることと同様に、形態2‐1において、鉤状部6と鉤受け部10との配置を逆にしてもよい(不図示)。
(Form 2-2: The backing plate has a fastener, and the fastener has a hook receiving portion)
In the same way as the relationship between the form 1-1 and the form 1-2, that is, the arrangement of the hook-shaped portion and the hook receiving portion is reversed, in the form 2-1 the hook-shaped portion 6 and the hook receiving portion 10 The arrangement with and may be reversed (not shown).
(形態3‐1:バッキングプレートが留め具を有し、留め具が鉤状部を有する形態)
 図8に示すように、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体201では、留め具14は側面の一部を残して外周側面9に入り込んでおり、留め具14はバッキングプレート1に固定されていることが好ましい。留め具14がスパッタリングターゲット2の形状に含まれるため、留め具14の角部の露出を少なくすることができる。また、このような構造とすることで、鉤状部6が鉤受け部10に当接されると、バッキングプレート1のプレート面3の側面方向に対してスパッタリングターゲット2が固定されるとともに、バッキングプレート1のプレート面3の厚さ方向に対してスパッタリングターゲット2を固定することができる。留め具14は、バッキングプレート1にねじ止めによる固定の他、拡散接合、溶接などの接合手段によって固定してもよい。図8では、ねじ止め箇所11において、ねじ止めによって、留め具14をバッキングプレート1のプレート面3に固定した形態を示したが、プレート面3だけでなく、バッキングプレート1の側面又は裏面にて固定してもよい。
(Form 3-1: The backing plate has a fastener, and the fastener has a hook-shaped portion)
As shown in FIG. 8, in the sputtering target-backing plate joint 201 according to the present embodiment, the fastener 14 enters the outer peripheral side surface 9 leaving a part of the side surface, and the fastener 14 is fixed to the backing plate 1. It is preferable that it is. Since the fastener 14 is included in the shape of the sputtering target 2, the exposure of the corner portion of the fastener 14 can be reduced. Further, with such a structure, when the hook-shaped portion 6 comes into contact with the hook receiving portion 10, the sputtering target 2 is fixed to the side surface direction of the plate surface 3 of the backing plate 1 and the backing is performed. The sputtering target 2 can be fixed to the thickness direction of the plate surface 3 of the plate 1. The fastener 14 may be fixed to the backing plate 1 by a joining means such as diffusion joining or welding, in addition to fixing by screwing. FIG. 8 shows a form in which the fastener 14 is fixed to the plate surface 3 of the backing plate 1 by screwing at the screwed portion 11, but not only on the plate surface 3 but also on the side surface or the back surface of the backing plate 1. It may be fixed.
 図8に示す形態では、図2に示す形態と同様に、鉤状部6と鉤受け部10を当接させることができるが、さらに、次のような構造としてもよい。
(1)スパッタリングターゲット2の外周形状を全周にわたって鉤状部6と鉤受け部10を当接させることが好ましいが、鉤状部6と鉤受け部10を部分的に2つ以上形成して当接させてもよい。
(2)鉤状部6と鉤受け部10については、図8(A)~図8(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(3)接合強度に加え、バッキングプレート1とスパッタリングターゲット2の密着性が必要なときは、鉤状部6と鉤受け部10を当接したときに、鉤状部6から鉤受け部10に向けて押圧してもよい。
In the form shown in FIG. 8, the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 2, but the structure may be further as follows.
(1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact.
(2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
(3) When adhesion between the backing plate 1 and the sputtering target 2 is required in addition to the joining strength, when the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the hook-shaped portion 6 is transferred to the hook receiving portion 10. You may press it toward it.
(形態3‐2:バッキングプレートが留め具を有し、留め具が鉤受け部を有する形態)
 形態1-1と形態1-2との関係、すなわち、鉤状部と鉤受け部との配置が逆関係であることと同様に、形態3‐1において、鉤状部6と鉤受け部10との配置を逆にしてもよい(不図示)。
(Form 3-2: The backing plate has a fastener, and the fastener has a hook receiving portion)
In the same way as the relationship between the form 1-1 and the form 1-2, that is, the arrangement of the hook-shaped portion and the hook receiving portion is reversed, in the form 3-1 the hook-shaped portion 6 and the hook receiving portion 10 The arrangement with and may be reversed (not shown).
(形態4‐1:バッキングプレートが凹部を有し、凹部が鉤状部を有する形態)
 図9に示すように、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体300では、バッキングプレート1はプレート面3に凹部17を有し、バッキングプレート1は凹部17の内周側面16に鉤状部6を有し、スパッタリングターゲット2の一部は凹部17に嵌め込まれていることが好ましい。図9の形態では、スパッタリングターゲット2の外周側面9に鉤受け部10を設け、鉤状部6が鉤受け部10に当接されることによって、バッキングプレート1のプレート面3の側面方向に対してスパッタリングターゲット2を固定するとともに、バッキングプレート1のプレート面3の厚さ方向に対してスパッタリングターゲット2を固定することができる。図2に示す形態と異なるところは、スパッタリングターゲット2の底部がバッキングプレート1の凹部17の深さ分だけ凹部17内に埋め込まれているため、バッキングプレート1のプレート面3の側面方向に対してスパッタリングターゲット2を固定するとともに、バッキングプレート1のプレート面3の厚さ方向に対してスパッタリングターゲット2を固定することができる。
(Form 4-1: The backing plate has a recess, and the recess has a hook-shaped portion)
As shown in FIG. 9, in the sputtering target-backing plate joint 300 according to the present embodiment, the backing plate 1 has a recess 17 on the plate surface 3, and the backing plate 1 has a hook shape on the inner peripheral side surface 16 of the recess 17. It is preferable that the portion 6 is provided and a part of the sputtering target 2 is fitted in the recess 17. In the embodiment of FIG. 9, a hook receiving portion 10 is provided on the outer peripheral side surface 9 of the sputtering target 2, and the hook-shaped portion 6 is brought into contact with the hook receiving portion 10 so as to be in contact with the side surface direction of the plate surface 3 of the backing plate 1. The sputtering target 2 can be fixed, and the sputtering target 2 can be fixed with respect to the thickness direction of the plate surface 3 of the backing plate 1. The difference from the form shown in FIG. 2 is that the bottom of the sputtering target 2 is embedded in the recess 17 by the depth of the recess 17 of the backing plate 1, so that the bottom of the sputtering target 2 is embedded in the recess 17 with respect to the side surface direction of the plate surface 3 of the backing plate 1. The sputtering target 2 can be fixed, and the sputtering target 2 can be fixed with respect to the thickness direction of the plate surface 3 of the backing plate 1.
 図9に示す形態では、図2に示す形態と同様に、鉤状部6と鉤受け部10を当接させることができるが、さらに、次のような構造としてもよい。
(1)スパッタリングターゲット2の外周形状を全周にわたって鉤状部6と鉤受け部10を当接させることが好ましいが、鉤状部6と鉤受け部10を部分的に2つ以上形成して当接させてもよい。
(2)鉤状部6と鉤受け部10については、図9(A)~図9(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(3)接合強度に加え、バッキングプレート1とスパッタリングターゲット2の密着性が必要なときは、鉤状部6と鉤受け部10を当接したときに、鉤状部6から鉤受け部10に向けて押圧してもよい。
In the form shown in FIG. 9, the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 2, but the structure may be further as follows.
(1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact.
(2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 9 (A) to 9 (N) and the like.
(3) When adhesion between the backing plate 1 and the sputtering target 2 is required in addition to the joining strength, when the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the hook-shaped portion 6 is transferred to the hook receiving portion 10. You may press it toward it.
(形態4‐2:バッキングプレートが凹部を有し、凹部が鉤受け部を有する形態)
 形態1-1と形態1-2との関係、すなわち、鉤状部と鉤受け部との配置が逆関係であることと同様に、形態4‐1において、鉤状部6と鉤受け部10との配置を逆にしてもよい(不図示)。
(Form 4-2: The backing plate has a recess, and the recess has a hook receiving portion)
In the same manner as the relationship between the form 1-1 and the form 1-2, that is, the arrangement of the hook-shaped portion and the hook receiving portion is reversed, in the form 4-1 the hook-shaped portion 6 and the hook receiving portion 10 The arrangement with and may be reversed (not shown).
(形態5‐1:バッキングプレートが凹部を有し、留め具が鉤状部を有する形態)
 図10に示すように、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体400では、バッキングプレート1はプレート面3に凹部17を有し、バッキングプレート1は凹部17に留め具14を有し、留め具14が鉤状部6を有し、スパッタリングターゲット2の少なくとも一部と留め具14の少なくとも一部は凹部17に嵌め込まれており、バッキングプレート1の凹部17に留め具14が固定されていることが好ましい。図9に示す形態と異なるところは、バッキングプレート1とスパッタリングターゲット2とは別に留め具14を準備し、留め具14のスパッタリングターゲット2と接する側に鉤状部6を形成し、スパッタリングターゲット2の外周側面9に鉤受け部10を形成し、留め具14の鉤状部6とスパッタリングターゲット2の鉤受け部10を当接させた後、バッキングプレート1の凹部17に留め具14とスパッタリングターゲット2を埋め込み、スパッタリングターゲット2に覆われていない箇所の留め具14からバッキングプレート1に向けて固定を行うことによって、バッキングプレート1にスパッタリングターゲット2を固定することができる。バッキングプレート1のプレート面3の側面方向に対してスパッタリングターゲット2を固定するとともに、バッキングプレート1のプレート面3の厚さ方向に対して前記スパッタリングターゲット2を固定することができる。留め具14は、バッキングプレート1にねじ止めによる固定の他、拡散接合、溶接などの接合手段によって固定してもよい。
(Form 5-1: The backing plate has a recess and the fastener has a hook-shaped portion)
As shown in FIG. 10, in the sputtering target-backing plate joint 400 according to the present embodiment, the backing plate 1 has a recess 17 in the plate surface 3, and the backing plate 1 has a fastener 14 in the recess 17. The fastener 14 has a hook-shaped portion 6, at least a part of the sputtering target 2 and at least a part of the fastener 14 are fitted in the recess 17, and the fastener 14 is fixed to the recess 17 of the backing plate 1. It is preferable to have. The difference from the form shown in FIG. 9 is that a fastener 14 is prepared separately from the backing plate 1 and the sputtering target 2, a hook-shaped portion 6 is formed on the side of the fastener 14 in contact with the sputtering target 2, and the sputtering target 2 is formed. After forming the hook receiving portion 10 on the outer peripheral side surface 9 and bringing the hook-shaped portion 6 of the fastener 14 into contact with the hook receiving portion 10 of the sputtering target 2, the fastener 14 and the sputtering target 2 are placed in the recess 17 of the backing plate 1. The sputtering target 2 can be fixed to the backing plate 1 by embedding the sputtering target 2 and fixing the fastener 14 toward the backing plate 1 at a portion not covered by the sputtering target 2. The sputtering target 2 can be fixed to the side surface direction of the plate surface 3 of the backing plate 1, and the sputtering target 2 can be fixed to the thickness direction of the plate surface 3 of the backing plate 1. The fastener 14 may be fixed to the backing plate 1 by a joining means such as diffusion joining or welding, in addition to fixing by screwing.
 図10に示す形態では、図9に示す形態と同様に、鉤状部6と鉤受け部10を当接させることができるが、さらに、次のような構造としてもよい。
(1)スパッタリングターゲット2の外周形状を全周にわたって鉤状部6と鉤受け部10を当接させることが好ましいが、鉤状部6と鉤受け部10を部分的に2つ以上形成して当接させてもよい。
(2)鉤状部6と鉤受け部10については、図10(A)~図10(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(3)接合強度に加え、バッキングプレート1とスパッタリングターゲット2の密着性が必要なときは、鉤状部6と鉤受け部10を当接したときに、鉤状部6から鉤受け部10に向けて押圧してもよい。
In the form shown in FIG. 10, the hook-shaped portion 6 and the hook receiving portion 10 can be brought into contact with each other in the same manner as in the form shown in FIG. 9, but the structure may be further as follows.
(1) It is preferable that the hook-shaped portion 6 and the hook receiving portion 10 are brought into contact with each other over the entire circumference of the outer peripheral shape of the sputtering target 2, but two or more hook-shaped portions 6 and the hook receiving portion 10 are partially formed. It may be brought into contact.
(2) The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 10 (A) to 10 (N) and the like.
(3) When adhesion between the backing plate 1 and the sputtering target 2 is required in addition to the joining strength, when the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the hook-shaped portion 6 is transferred to the hook receiving portion 10. You may press it toward it.
(形態5‐2:バッキングプレートが凹部を有し、留め具が鉤受け部を有する形態)
 形態1-1と形態1-2との関係、すなわち、鉤状部と鉤受け部との配置が逆関係であることと同様に、形態5‐1において、鉤状部6と鉤受け部10との配置を逆にしてもよい(不図示)。
(Form 5-2: The backing plate has a recess and the fastener has a hook receiving portion)
In the same way as the relationship between the form 1-1 and the form 1-2, that is, the arrangement of the hook-shaped portion and the hook receiving portion is reversed, in the form 5-1 the hook-shaped portion 6 and the hook receiving portion 10 The arrangement with and may be reversed (not shown).
(鉤状部及び鉤受け部の形状の変形例1)
 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体では、鉤状部6は第1の凹凸形状部を有し、鉤受け部10は第1の凹凸形状部に合わさる第2の凹凸形状部を有することが好ましい。スパッタリングターゲットの側面方向におけるスパッタリングターゲットとバッキングプレートとの接合強度を向上させることに加え、スパッタリングターゲットの厚さ方向に対してもスパッタリングターゲットとバッキングプレートとの接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。ここで、第1の凹凸形状部に合わさる第2の凹凸形状部とは、凹凸形状部同士が隙間なく接面し合っている形態の他、凹凸形状部同士が隙間を有しながらも引っかかり合ってズレない形態を含む。このような形態を有する例として、例えば、図2(L)、図2(M)、図2(N)、図5(J)、図5(K)、図5(L)、図7(L)、図7(M)、図7(N)、図8(L)、図8(M)、図8(N)、図9(L)、図9(M)、図9(N)、図10(L)、図10(M)又は図10(N)に示した。
(Modification example 1 of the shape of the hook-shaped part and the hook receiving part)
In the sputtering target-backing plate joint according to the present embodiment, the hook-shaped portion 6 has a first uneven shape portion, and the hook receiving portion 10 has a second uneven shape portion that matches the first uneven shape portion. Is preferable. In addition to improving the bonding strength between the sputtering target and the backing plate in the lateral direction of the sputtering target, the bonding strength between the sputtering target and the backing plate can also be improved in the thickness direction of the sputtering target, and as a result. , The bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good. Here, the second uneven shape portion that fits the first uneven shape portion is in a form in which the uneven shape portions are in contact with each other without a gap, and the uneven shape portions are caught by each other even though they have a gap. Includes a form that does not shift. As an example having such a form, for example, FIG. 2 (L), FIG. 2 (M), FIG. 2 (N), FIG. 5 (J), FIG. 5 (K), FIG. 5 (L), FIG. 7 ( L), FIG. 7 (M), FIG. 7 (N), FIG. 8 (L), FIG. 8 (M), FIG. 8 (N), FIG. 9 (L), FIG. 9 (M), FIG. 9 (N). , FIG. 10 (L), FIG. 10 (M) or FIG. 10 (N).
(鉤状部及び鉤受け部の形状の変形例2)
 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体では、鉤状部6はバッキングプレート1からスパッタ面への方向における鉤先端が最大引っ掛かり箇所となる鉤形を有し、鉤受け部10は鉤形に合わさる鉤穴を有することが好ましい。スパッタリングターゲット2の側面方向におけるスパッタリングターゲット2とバッキングプレート1との接合強度を向上させることに加え、スパッタリングターゲット2の厚さ方向に対してもスパッタリングターゲット2とバッキングプレート1との接合強度を向上させることができ、その結果、スパッタリングターゲットの使用時の接合強度を保ち、熱伝導を良好に保つことができる。ここで、鉤受け部は鉤形に合わさる鉤穴を有するとは、鉤形に鉤穴が隙間なく嵌っている形態の他、鉤穴に鉤形を差し込んだ時に隙間を有しながらも引っかかり合ってズレない形態を含む。このような形態を有する例として、例えば、図2(D)、図2(F)、図7(D)、図7(F)、図8(D)、図8(F)、図9(D)、図9(F)、図10(D)又は図10(F)に示した。
(Modification example 2 of the shape of the hook-shaped part and the hook receiving part)
In the sputtering target-backing plate joint according to the present embodiment, the hook-shaped portion 6 has a hook shape in which the hook tip in the direction from the backing plate 1 to the sputter surface is the maximum hooking point, and the hook receiving portion 10 has a hook shape. It is preferable to have a hook hole that fits in. In addition to improving the bonding strength between the sputtering target 2 and the backing plate 1 in the side surface direction of the sputtering target 2, the bonding strength between the sputtering target 2 and the backing plate 1 is also improved in the thickness direction of the sputtering target 2. As a result, the bonding strength at the time of use of the sputtering target can be maintained, and the heat conduction can be kept good. Here, the hook receiving portion has a hook hole that fits the hook shape. In addition to the form in which the hook hole fits into the hook shape without a gap, when the hook shape is inserted into the hook hole, the hook shape is caught even though it has a gap. Includes a form that does not shift. As an example having such a form, for example, FIG. 2 (D), FIG. 2 (F), FIG. 7 (D), FIG. 7 (F), FIG. 8 (D), FIG. 8 (F), FIG. 9 ( D), FIG. 9 (F), FIG. 10 (D) or FIG. 10 (F).
(形態6‐1:中間層を有する形態)
 図11に示すように、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体500では、スパッタリングターゲット2とバッキングプレート1の界面に2.5mm以下の中間層12を有し、中間層12は、Ni、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることが好ましい。中間層12によってスパッタリングターゲット2とバッキングプレート1の線膨張係数の差を緩和することで加熱による膨張や冷却による収縮の繰り返しによるスパッタリングターゲット2の破損や反りをより抑制することができる。また、中間層12を設けることでスパッタリングターゲット2のターゲット裏面8とバッキングプレートのプレート面3との接合強度を向上させるとともに、密着性が向上して熱伝導を良好に保つことができる。また、スパッタリングターゲット2の外周側面9の全周にバッキングプレート1の鉤状部6が設けられている場合は、バッキングプレート1のプレート面3とバッキングプレート1の鉤状部6が設けられている内側の箇所とスパッタリングターゲット2のターゲット裏面8に囲まれた箇所に中間層12が設けられていることとなる。その結果、中間層12は、スパッタリングターゲット2で覆われるため、中間層12の材質が揮発して不純物となって基板に付着することを抑制することができる。中間層12についてNi、Cr、Al、Cuの元素を選択した理由は、密着性、熱伝導及び線膨張係数の観点から好適だからである。中間層12が板材である場合、板材が2.5mmより厚いとバッキングプレート1の鉤状部6が設けられている箇所の高さをより高く設けなければならない。中間層12が粉末層である場合、加熱によって、粉末の状態である形態、粉末が焼結した形態、又は粉末が加熱によって溶融した形態がある。なお、粉末が加熱によって溶融した形態は、中間層12が板材である形態と類似する。中間層12は、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3との間に設けることが好ましいが、これに加えてさらに、スパッタリングターゲット2の鉤受け部10を含む外周側面9とバッキングプレート1の鉤状部6が設けられている内側の箇所との界面に設けてもよい。鉤状部6と鉤受け部10については、図8(A)~図8(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(Form 6-1: Form having an intermediate layer)
As shown in FIG. 11, the sputtering target-backing plate junction 500 according to the present embodiment has an intermediate layer 12 of 2.5 mm or less at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12 is Ni. , Cr, Al, Cu, at least one metal or an alloy containing at least one of Ni, Cr, Al, Cu. It is preferable that the plate material, powder, or a combination of the plate material and the powder is used. By relaxing the difference in linear expansion coefficient between the sputtering target 2 and the backing plate 1 by the intermediate layer 12, it is possible to further suppress damage and warpage of the sputtering target 2 due to repeated expansion due to heating and contraction due to cooling. Further, by providing the intermediate layer 12, the bonding strength between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate can be improved, and the adhesion can be improved to maintain good heat conduction. When the hook-shaped portion 6 of the backing plate 1 is provided on the entire circumference of the outer peripheral side surface 9 of the sputtering target 2, the plate surface 3 of the backing plate 1 and the hook-shaped portion 6 of the backing plate 1 are provided. The intermediate layer 12 is provided at the inner portion and the portion surrounded by the target back surface 8 of the sputtering target 2. As a result, since the intermediate layer 12 is covered with the sputtering target 2, it is possible to prevent the material of the intermediate layer 12 from volatilizing and becoming impurities and adhering to the substrate. The reason for selecting the elements of Ni, Cr, Al, and Cu for the intermediate layer 12 is that they are suitable from the viewpoints of adhesion, heat conduction, and coefficient of linear expansion. When the intermediate layer 12 is a plate material, if the plate material is thicker than 2.5 mm, the height of the portion where the hook-shaped portion 6 of the backing plate 1 is provided must be set higher. When the intermediate layer 12 is a powder layer, there are a form in which it is in a powder state by heating, a form in which the powder is sintered, and a form in which the powder is melted by heating. The form in which the powder is melted by heating is similar to the form in which the intermediate layer 12 is a plate material. The intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
(形態6‐2:中間層を有する形態)
 図11に示したスパッタリングターゲット‐バッキングプレート接合体500では、バッキングプレート1のプレート面3上に設置した鉤状部6の形態に中間層12を設けることについて説明したが、図12に示すスパッタリングターゲット‐バッキングプレート接合体501のように、バッキングプレート1のプレート面3に凹部17を形成した場合においても同様に2.5mm以下の中間層12を設けることができる。
(Form 6-2: Form having an intermediate layer)
In the sputtering target-backing plate joint 500 shown in FIG. 11, it has been described that the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 12 has been described. -Even when the recess 17 is formed on the plate surface 3 of the backing plate 1 as in the backing plate joint 501, the intermediate layer 12 of 2.5 mm or less can be provided in the same manner.
(形態7‐1:中間層を有する形態)
 図11に示した形態と同様に、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体は、スパッタリングターゲット2とバッキングプレート1の界面に10μm以下の中間層12を有し、中間層12は、Ni、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる薄膜であることが好ましい。中間層12によってスパッタリングターゲット2とバッキングプレート1の線膨張係数の差を緩和することで加熱による膨張や冷却による収縮の繰り返しによるスパッタリングターゲット2の破損や反りをより抑制することができる。中間層12の膜厚が10μmより厚くても中間層12を形成する時間を要するだけであり、中間層12としての効果は10μm以下のものとあまり効果が変わらない。また、中間層12を設けることでスパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3との接合強度を向上させるとともに、密着性が向上して熱伝導を良好に保つことができる。また、スパッタリングターゲット2の外周側面9の全周にバッキングプレート1の鉤状部6が設けられている場合は、バッキングプレート1のプレート面3とバッキングプレート1の鉤状部6が設けられている内側の箇所とスパッタリングターゲット2のターゲット裏面8に囲まれた箇所に中間層12が設けられていることとなる。その結果、中間層12は、スパッタリングターゲット2で覆われるため、中間層12の材質が揮発して不純物となって基板に付着することを抑制することができる。中間層12についてNi、Cr、Al、Cuの元素を選択した理由は、密着性、熱伝導及び線膨張係数の観点から好適だからである。薄膜は、スパッタリングによる薄膜であることが好ましく、バッキングプレート1のプレート面3に成膜することが好ましい。また、厚さ10μm以下の箔でもよい。中間層12は、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3との間に設けることが好ましいが、これに加えてさらに、スパッタリングターゲット2の鉤受け部10を含む外周側面9とバッキングプレート1の鉤状部6が設けられている内側の箇所との界面に設けてもよい。鉤状部6と鉤受け部10については、図8(A)~図8(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(Form 7-1: Form having an intermediate layer)
Similar to the embodiment shown in FIG. 11, the sputtering target-backing plate junction according to the present embodiment has an intermediate layer 12 of 10 μm or less at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12 is Ni. , Cr, Al, Cu at least one kind of metal or an alloy containing at least one kind of Ni, Cr, Al, Cu is preferable. By relaxing the difference in linear expansion coefficient between the sputtering target 2 and the backing plate 1 by the intermediate layer 12, it is possible to further suppress damage and warpage of the sputtering target 2 due to repeated expansion due to heating and contraction due to cooling. Even if the film thickness of the intermediate layer 12 is thicker than 10 μm, it only takes time to form the intermediate layer 12, and the effect as the intermediate layer 12 is not so different from that of 10 μm or less. Further, by providing the intermediate layer 12, the bonding strength between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1 can be improved, and the adhesion can be improved to maintain good heat conduction. When the hook-shaped portion 6 of the backing plate 1 is provided on the entire circumference of the outer peripheral side surface 9 of the sputtering target 2, the plate surface 3 of the backing plate 1 and the hook-shaped portion 6 of the backing plate 1 are provided. The intermediate layer 12 is provided at the inner portion and the portion surrounded by the target back surface 8 of the sputtering target 2. As a result, since the intermediate layer 12 is covered with the sputtering target 2, it is possible to prevent the material of the intermediate layer 12 from volatilizing and becoming impurities and adhering to the substrate. The reason for selecting the elements of Ni, Cr, Al, and Cu for the intermediate layer 12 is that they are suitable from the viewpoints of adhesion, heat conduction, and coefficient of linear expansion. The thin film is preferably a thin film produced by sputtering, and is preferably formed on the plate surface 3 of the backing plate 1. Further, a foil having a thickness of 10 μm or less may be used. The intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
(形態7‐2:中間層を有する形態)
 図11に示したスパッタリングターゲット‐バッキングプレート接合体500では、バッキングプレート1のプレート面3上に設置した鉤状部6の形態に中間層12を設けることについて説明したが、図12に示すスパッタリングターゲット‐バッキングプレート接合体501のように、バッキングプレート1のプレート面3に凹部17を形成した場合においても同様に10μm以下の中間層12を設けることができる。
(Form 7-2: Form having an intermediate layer)
In the sputtering target-backing plate joint 500 shown in FIG. 11, it has been described that the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 12 has been described. -Even when the recess 17 is formed on the plate surface 3 of the backing plate 1 as in the backing plate joint 501, the intermediate layer 12 of 10 μm or less can be similarly provided.
(形態8‐1:中間層を有する形態)
 図11に示した形態と同様に、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体は、スパッタリングターゲット2とバッキングプレート1の界面に1.0mm以下の中間層12を有し、中間層12は、In、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることが好ましい。中間層12によってスパッタリングターゲット2とバッキングプレート1の線膨張係数の差を緩和することで加熱による膨張や冷却による収縮の繰り返しによるスパッタリングターゲット2の破損や反りをより抑制することができる。中間層12についてIn、Znの元素を選択した理由は、密着性、熱伝導及び線膨張係数の観点から好適だからである。中間層12が板材である場合、板材が1.0mmより厚いとInやZnは酸化しやすい材料であるため硬度が上昇し、割れてしまうことがある。また、中間層12を設けることでスパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3との接合強度を向上させるとともに、密着性が向上して熱伝導を良好に保つことができる。また、スパッタリングターゲット2の外周側面9の全周にバッキングプレート1の鉤状部6が設けられている場合は、バッキングプレート1のプレート面3とバッキングプレート1の鉤状部6が設けられている内側の箇所とスパッタリングターゲット2のターゲット裏面8に囲まれた箇所に中間層12が設けられていることとなる。その結果、中間層12は、スパッタリングターゲット2で覆われるため、中間層12の材質が揮発して不純物となって基板に付着することを抑制することができる。中間層12が粉末層である場合、加熱によって、粉末の状態である形態、粉末が焼結した形態、又は粉末が加熱によって溶融した形態がある。なお、粉末が加熱によって溶融した形態は、中間層12が板材である形態と類似する。中間層12は、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3との間に設けることが好ましいが、これに加えてさらに、スパッタリングターゲット2の鉤受け部10を含む外周側面9とバッキングプレート1の鉤状部6が設けられている内側の箇所との界面に設けてもよい。鉤状部6と鉤受け部10については、図8(A)~図8(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(Form 8-1: Form having an intermediate layer)
Similar to the embodiment shown in FIG. 11, the sputtering target-backing plate junction according to the present embodiment has an intermediate layer 12 of 1.0 mm or less at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12 has an intermediate layer 12 or less. , In, Zn, or at least one of In, Zn, or an alloy containing at least one of In, Zn, preferably a plate material, a powder, or a combination of the plate material and the powder. By relaxing the difference in linear expansion coefficient between the sputtering target 2 and the backing plate 1 by the intermediate layer 12, it is possible to further suppress damage and warpage of the sputtering target 2 due to repeated expansion due to heating and contraction due to cooling. The reason for selecting the In and Zn elements for the intermediate layer 12 is that they are suitable from the viewpoints of adhesion, heat conduction and linear expansion coefficient. When the intermediate layer 12 is a plate material, if the plate material is thicker than 1.0 mm, In and Zn are easily oxidized materials, so that the hardness increases and the intermediate layer 12 may crack. Further, by providing the intermediate layer 12, the bonding strength between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1 can be improved, and the adhesion can be improved to maintain good heat conduction. When the hook-shaped portion 6 of the backing plate 1 is provided on the entire circumference of the outer peripheral side surface 9 of the sputtering target 2, the plate surface 3 of the backing plate 1 and the hook-shaped portion 6 of the backing plate 1 are provided. The intermediate layer 12 is provided at the inner portion and the portion surrounded by the target back surface 8 of the sputtering target 2. As a result, since the intermediate layer 12 is covered with the sputtering target 2, it is possible to prevent the material of the intermediate layer 12 from volatilizing and becoming impurities and adhering to the substrate. When the intermediate layer 12 is a powder layer, there are a form in which it is in a powder state by heating, a form in which the powder is sintered, and a form in which the powder is melted by heating. The form in which the powder is melted by heating is similar to the form in which the intermediate layer 12 is a plate material. The intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
(形態8‐2:中間層を有する形態)
 図11に示したスパッタリングターゲット‐バッキングプレート接合体500では、バッキングプレート1のプレート面3上に設置した鉤状部6の形態に中間層12を設けることについて説明したが、図12に示すスパッタリングターゲット‐バッキングプレート接合体501のように、バッキングプレート1のプレート面3に凹部17を形成した場合においても同様に1.0mm以下の中間層12を設けることができる。
(Form 8-2: Form having an intermediate layer)
In the sputtering target-backing plate joint 500 shown in FIG. 11, it has been described that the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 12 has been described. -Even when the recess 17 is formed on the plate surface 3 of the backing plate 1 as in the backing plate joint 501, the intermediate layer 12 of 1.0 mm or less can be similarly provided.
(形態9‐1:中間層を有する形態)
 図13に示すように、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体600は、スパッタリングターゲット2とバッキングプレート1の界面に2層の中間層12を有し、中間層12aは、2.5mm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせ、10μm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる薄膜、または、1.0mm以下のIn、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせのいずれかからなり、中間層12bは、2.5mm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせ、10μm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる薄膜、または、1.0mm以下のIn、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせのいずれかからなることが好ましい。中間層12によってスパッタリングターゲット2とバッキングプレート1の線膨張係数の差を緩和することで加熱による膨張や冷却による収縮の繰り返しによるスパッタリングターゲット2の破損や反りをより抑制することができる。バッキングプレート1との界面に設置された中間層12aをNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金、In、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる各種形態の材料で形成する理由は、密着性、熱伝導及び線膨張係数の観点から好適だからである。また、スパッタリングターゲット2との界面に設置された中間層12bをNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金、In、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる各種形態の材料で形成する理由は、密着性、熱伝導及び線膨張係数の観点から好適だからである。なお、図13では中間層が2層の形態を示したが、上記で説明した中間層の効果が得られていれば、中間層が3層以上の形態でもよい。中間層12は、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3との間に設けることが好ましいが、これに加えてさらに、スパッタリングターゲット2の鉤受け部10を含む外周側面9とバッキングプレート1の鉤状部6が設けられている内側の箇所との界面に設けてもよい。鉤状部6と鉤受け部10については、図8(A)~図8(N)などに示される鉤状部及び鉤受け部の形態を用いて当接させてもよい。
(Form 9-1: Form having an intermediate layer)
As shown in FIG. 13, the sputtering target-backing plate alloy 600 according to the present embodiment has two intermediate layers 12 at the interface between the sputtering target 2 and the backing plate 1, and the intermediate layer 12a is 2.5 mm. A plate or powder made of at least one of the following Ni, Cr, Al, and Cu metals or an alloy containing at least one of Ni, Cr, Al, and Cu, or a combination of the plate and the powder, 10 μm or less. A thin film made of at least one metal of Ni, Cr, Al, or Cu or an alloy containing at least one of Ni, Cr, Al, or Cu, or at least one of In and Zn of 1.0 mm or less. The intermediate layer 12b is made of a plate or powder made of a metal or an alloy containing at least one of In and Zn, or a combination of the plate and the powder, and the intermediate layer 12b is Ni, Cr, Al, Cu of 2.5 mm or less. A plate or powder composed of at least one of the metals or an alloy containing at least one of Ni, Cr, Al, and Cu, or a combination of the plate and the powder, and at least 10 μm or less of Ni, Cr, Al, and Cu. A thin film made of any one metal or an alloy containing at least one of Ni, Cr, Al, and Cu, or at least one of In and Zn of 1.0 mm or less, or at least one of In and Zn. It is preferably composed of a plate material or powder made of an alloy containing one kind, or a combination of the plate material and the powder. By relaxing the difference in linear expansion coefficient between the sputtering target 2 and the backing plate 1 by the intermediate layer 12, it is possible to further suppress damage and warpage of the sputtering target 2 due to repeated expansion due to heating and contraction due to cooling. The intermediate layer 12a installed at the interface with the backing plate 1 is a metal containing at least one of Ni, Cr, Al, and Cu, or an alloy containing at least one of Ni, Cr, Al, and Cu, and at least In and Zn. The reason for forming with various forms of materials made of any one kind of metal or an alloy containing at least one kind of In and Zn is that it is suitable from the viewpoint of adhesion, thermal conductivity and linear expansion coefficient. Further, the intermediate layer 12b installed at the interface with the sputtering target 2 is a metal containing at least one of Ni, Cr, Al and Cu, or an alloy containing at least one of Ni, Cr, Al and Cu, In and Zn. The reason for forming with various forms of materials made of at least one of the above metals or alloys containing at least one of In and Zn is suitable from the viewpoint of adhesion, thermal conductivity and linear expansion coefficient. Although the intermediate layer is shown in the form of two layers in FIG. 13, the intermediate layer may be in the form of three or more layers as long as the effect of the intermediate layer described above is obtained. The intermediate layer 12 is preferably provided between the target back surface 8 of the sputtering target 2 and the plate surface 3 of the backing plate 1, but in addition to this, the intermediate layer 12 and the outer peripheral side surface 9 including the hook receiving portion 10 of the sputtering target 2. It may be provided at the interface with the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The hook-shaped portion 6 and the hook receiving portion 10 may be brought into contact with each other using the forms of the hook-shaped portion and the hook receiving portion shown in FIGS. 8 (A) to 8 (N) and the like.
(形態9‐2:中間層を有する形態)
 図13に示したスパッタリングターゲット‐バッキングプレート接合体600では、バッキングプレート1のプレート面3上に設置した鉤状部6の形態に中間層12を設けることについて説明したが、図14に示すスパッタリングターゲット‐バッキングプレート接合体601のように、バッキングプレート1のプレート面3に凹部17を形成した場合においても同様に中間層12を設けることができる。
(Form 9-2: Form having an intermediate layer)
In the sputtering target-backing plate joint 600 shown in FIG. 13, it has been described that the intermediate layer 12 is provided in the form of the hook-shaped portion 6 installed on the plate surface 3 of the backing plate 1, but the sputtering target shown in FIG. 14 has been described. -The intermediate layer 12 can be similarly provided even when the recess 17 is formed on the plate surface 3 of the backing plate 1 as in the backing plate joint body 601.
(スパッタリングターゲットの材質)
 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体は、スパッタリングターゲット2の材質がAl-Sc合金、Ru、Ru合金、Ir又はIr合金を用いることができる。また、Li系酸化物、Co系酸化物、Ti系酸化物又はMg系酸化物なども用いることもできる。1000℃以上の高融点材料でもスパッタリングターゲットの反りや割れを抑制しつつ、スパッタリングターゲットとバッキングプレートの接合強度を向上させることができる。
(Material of sputtering target)
In the sputtering target-backing plate joint according to the present embodiment, the material of the sputtering target 2 may be an Al—Sc alloy, Ru, Ru alloy, Ir or Ir alloy. Further, Li-based oxides, Co-based oxides, Ti-based oxides, Mg-based oxides and the like can also be used. Even with a high melting point material of 1000 ° C. or higher, the bonding strength between the sputtering target and the backing plate can be improved while suppressing warpage and cracking of the sputtering target.
 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体は、バッキングプレート1の材質がAl、Al合金、Cu、Cu合金、Fe又はFe合金であり、線膨張係数が30.0×10-6/℃以下であることが好ましい。線膨脹係数は、好ましくは28.5×10-6/℃以下であり、さらに好ましくは27.3×10-6/℃以下である。線膨張係数が30.0×10-6/℃より大きいと、バッキングプレート1の加熱による膨張や冷却による収縮が繰り返し発生することによってスパッタリングターゲットの割れや反りが発生してしまうため、線膨張係数が30.0×10-6/℃以下であることが好ましい。また、バッキングプレートの熱伝導性が良いものを用いることで、加熱時においてバッキングプレートが膨張し、バッキングプレート1のプレート面3とバッキングプレート1の鉤状部6が設けられている内側の箇所とスパッタリングターゲット2のターゲット裏面8に囲まれた箇所、または、バッキングプレートの凹部にスパッタリングターゲットを挿入することができるとともに、冷却時においてバッキングプレートが収縮し、バッキングプレートの鉤状部6によってスパッタリングターゲットの鉤受け部10を当接または当接と押圧をすることにより接合体を形成することができる。線膨張係数の下限は、6.0×10-6/℃以上であることが好ましい。 In the sputtering target-backing plate joint according to the present embodiment, the material of the backing plate 1 is Al, Al alloy, Cu, Cu alloy, Fe or Fe alloy, and the linear expansion coefficient is 30.0 × 10 -6 / ° C. The following is preferable. The linear expansion coefficient is preferably 28.5 × 10 -6 / ° C or less, and more preferably 27.3 × 10 -6 / ° C or less. If the coefficient of linear expansion is larger than 30.0 × 10 -6 / ° C, the coefficient of linear expansion is caused by repeated expansion and contraction of the backing plate 1 due to heating and cooling, resulting in cracking and warping of the sputtering target. Is preferably 30.0 × 10 -6 / ° C. or lower. Further, by using a backing plate having good thermal conductivity, the backing plate expands at the time of heating, and the plate surface 3 of the backing plate 1 and the inner portion where the hook-shaped portion 6 of the backing plate 1 is provided. The sputtering target can be inserted into the portion surrounded by the target back surface 8 of the sputtering target 2 or the recess of the backing plate, and the backing plate contracts during cooling, and the hook-shaped portion 6 of the backing plate causes the sputtering target to be inserted. A joint can be formed by abutting or abutting and pressing the hook receiving portion 10. The lower limit of the coefficient of linear expansion is preferably 6.0 × 10 -6 / ° C. or higher.
[線膨脹係数を含む関係式](ΔTが共通)
 鉤状部6と鉤受け部10が当接しているときに、当接面にてバッキングプレートからスパッタリングターゲットに押圧がかかるようにすることで、前記スパッタリングターゲットを前記バッキングプレートにより強固に固定させてもよい。鉤状部6と鉤受け部10が当接しているときに、バッキングプレートからスパッタリングターゲットに押圧をかけているバッキングプレートの面を押圧面という。また、バッキングプレートから押圧を受けているスパッタリングターゲットの面を接触面という。
 バッキングプレート1の押圧面によってスパッタリングターゲット2の接触面を押圧するとき、前記押圧面は前記接触面を挟んで向かい合わせの位置に配置された対となる面を少なくとも有し、該対となる押圧面同士の距離と、前記対となる押圧面と接触している接触面同士の距離との関係が(数1)~(数5)を満たすことが好ましい。
(数1)DTG>DBP
(数2)DBP=DTG-ΔD×C
(数3)ΔD=DBP×ΔT×CTEBP-DTG×ΔT×CTETG
(数4)DTG-ΔD×4.0≦DBP≦DTG-ΔD×0.5
(数5)CTEBP>CTETG
 ただし、DBP、DTG、ΔD、C、T、ΔT、CTEBP及びCTETGはそれぞれ次のことを意味する。
BP:室温における、前記対となる押圧面同士の距離(mm)
TG:室温における、前記対となる押圧面と接触する接触面同士の距離(mm)
T:バッキングプレートを熱膨張させてスパッタリングターゲットを嵌合させる温度(℃)(ただし、T>室温)
ΔT:T-室温(℃)
CTEBP:温度Tにおけるバッキングプレートの線膨張係数(1/℃)
CTETG:温度Tにおけるスパッタリングターゲットの線膨張係数(1/℃)
C:係数(ただし、C=0.5~4.0)
ΔD:室温から温度Tまで昇温させたときのバッキングプレートとスパッタリングターゲットの熱膨張量の差(mm)
 ここで、バッキングプレート1の平面の形状が長方形であるとき、スパッタリングターゲット2の長辺とバッキングプレート1の長辺を対応させ、スパッタリングターゲット2の短辺とバッキングプレート1の短辺とを対応させる。(数1)に示されるごとく、室温では、スパッタリングターゲット2の接触面同士の距離の方がバッキングプレート1の押圧面同士の距離よりも大きく、スパッタリングターゲット2をバッキングプレート1の押圧面の内側に入れることはできない。ここで、室温は25℃とする。ここで、(1)の形態として、バッキングプレート1とスパッタリングターゲット2の両方を温度Tまで昇温させる形態を考える。バッキングプレート1を室温からバッキングプレートを熱膨張させる温度Tまで昇温させると、バッキングプレート1の押圧面同士の距離は、(DBP×ΔT×CTEBP)で求められる長さの熱膨張をする。また、スパッタリングターゲット2を室温から温度Tまで昇温させると、スパッタリングターゲット2の接触面同士の距離は、(DTG×ΔT×CTETG)で求められる長さの熱膨張をする。したがって、線膨脹係数について(数5)の関係が成立するとき、バッキングプレート1とスパッタリングターゲット2の両方を温度Tまで昇温させると、ΔDの長さ分だけ、バッキングプレート1の押圧面がスパッタリングターゲット2の接触面よりも熱膨張する。この熱膨張によって、バッキングプレート1の押圧面同士の距離がスパッタリングターゲット2の接触面同士の距離と同じ又は大きくなれば、バッキングプレート1の押圧面の内側にスパッタリングターゲット2を嵌め込むことが可能となる。そして、室温まで降温させると、(数1)に示される関係によって、スパッタリングターゲット2の接触面をバッキングプレート1の押圧面で押圧することになる。前記の(1)の形態において、スパッタリングターゲット2の接触面をバッキングプレート1の押圧面で押圧することを可能にするには、バッキングプレート1の熱膨脹によって、バッキングプレート1の押圧面同士の距離がスパッタリングターゲット2の接触面同士の距離を逆転しなければならない。そこで、室温におけるバッキングプレート1の押圧面同士の距離を、室温におけるスパッタリングターゲット2の接触面同士の距離と比較して、どれだけ小さく設定することができるかの関係を示したのが(数2)及び(数4)である。(数2)及び(数4)においてCは係数であるが、Cが0.5~4.0の範囲内であるとき、スパッタリングターゲット2の接触面をバッキングプレート1の押圧面で押圧してスパッタリングターゲットとバッキングプレートとを接合するときに、スパッタリングターゲットの割れや反りを抑制することができる。
[Relational expression including linear expansion coefficient] (ΔT is common)
When the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other, the sputtering target is firmly fixed by the backing plate by pressing the sputtering target from the backing plate at the contact surface. May be good. The surface of the backing plate that presses the sputtering target from the backing plate when the hook-shaped portion 6 and the hook receiving portion 10 are in contact with each other is called a pressing surface. The surface of the sputtering target that is pressed by the backing plate is called the contact surface.
When the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1, the pressing surface has at least a pair of surfaces arranged at positions facing each other across the contact surface, and the pairing pressing is performed. It is preferable that the relationship between the distance between the surfaces and the distance between the contact surfaces in contact with the paired pressing surface satisfies (Equation 1) to (Equation 5).
(Number 1) D TG > D BP
(Number 2) D BP = D TG -ΔD × C
(Equation 3) ΔD = D BP × ΔT × CTE BP −D TG × ΔT × CTE TG
(Number 4) D TG -ΔD × 4.0 ≦ D BP ≦ D TG -ΔD × 0.5
(Number 5) CTE BP > CTE TG
However, D BP , D TG , ΔD, C, T, ΔT, CTE BP and CTE TG mean the following, respectively.
DBP : Distance (mm) between the paired pressing surfaces at room temperature.
DTG : Distance between contact surfaces in contact with the pair of pressing surfaces (mm) at room temperature.
T: Temperature (° C) at which the backing plate is thermally expanded to fit the sputtering target (where T> room temperature)
ΔT: T-room temperature (° C)
CTE BP : Linear expansion coefficient (1 / ° C.) of the backing plate at temperature T
CTE TG : Coefficient of linear expansion of sputtering target at temperature T (1 / ° C)
C: Coefficient (however, C = 0.5 to 4.0)
ΔD: Difference in thermal expansion amount between the backing plate and the sputtering target when the temperature is raised from room temperature to temperature T (mm)
Here, when the shape of the plane of the backing plate 1 is rectangular, the long side of the sputtering target 2 and the long side of the backing plate 1 are made to correspond, and the short side of the sputtering target 2 and the short side of the backing plate 1 are made to correspond. .. As shown in (Equation 1), at room temperature, the distance between the contact surfaces of the sputtering targets 2 is larger than the distance between the pressing surfaces of the backing plate 1, and the sputtering target 2 is placed inside the pressing surfaces of the backing plate 1. You can't put it in. Here, the room temperature is 25 ° C. Here, as the form of (1), consider a form in which both the backing plate 1 and the sputtering target 2 are heated to the temperature T. When the backing plate 1 is heated from room temperature to the temperature T at which the backing plate is thermally expanded, the distance between the pressing surfaces of the backing plate 1 is thermally expanded to the length obtained by ( DBP × ΔT × CTE BP ) . .. Further, when the temperature of the sputtering target 2 is raised from room temperature to the temperature T, the distance between the contact surfaces of the sputtering target 2 undergoes thermal expansion of the length obtained by (D TG × ΔT × CTE TG ). Therefore, when the relationship (Equation 5) with respect to the linear expansion coefficient is established, when both the backing plate 1 and the sputtering target 2 are raised to the temperature T, the pressing surface of the backing plate 1 is sputtered by the length of ΔD. It expands more thermally than the contact surface of the target 2. If the distance between the pressing surfaces of the backing plate 1 is the same as or larger than the distance between the contact surfaces of the sputtering target 2 due to this thermal expansion, the sputtering target 2 can be fitted inside the pressing surface of the backing plate 1. Become. Then, when the temperature is lowered to room temperature, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1 according to the relationship shown in (Equation 1). In the above-described embodiment (1), in order to enable the contact surface of the sputtering target 2 to be pressed by the pressing surface of the backing plate 1, the distance between the pressing surfaces of the backing plate 1 is increased by the thermal expansion of the backing plate 1. The distance between the contact surfaces of the sputtering targets 2 must be reversed. Therefore, the relationship between the distance between the pressing surfaces of the backing plate 1 at room temperature and the distance between the contact surfaces of the sputtering targets 2 at room temperature can be set as small as possible (Equation 2). ) And (Equation 4). In (Equation 2) and (Equation 4), C is a coefficient, but when C is in the range of 0.5 to 4.0, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1. When joining the sputtering target and the backing plate, it is possible to suppress cracking and warpage of the sputtering target.
 本実施形態では、上記で説明した(1)バッキングプレート1とスパッタリングターゲット2の両方を温度Tまで昇温させる形態のみならず、(2)バッキングプレート1を温度Tまで昇温させ、スパッタリングターゲット2を温度Tよりも低い温度Tまでしか昇温させない形態、及び(3)バッキングプレート1を温度Tまで昇温させ、スパッタリングターゲット2を昇温させない形態を包含する。 In this embodiment, not only (1) both the backing plate 1 and the sputtering target 2 described above are heated to the temperature T, but also (2) the backing plate 1 is heated to the temperature T and the sputtering target 2 is heated. Includes a form in which the temperature is raised only to a temperature T 1 lower than the temperature T, and (3) a form in which the backing plate 1 is raised to a temperature T and the sputtering target 2 is not raised.
[線膨脹係数を含む関係式](ΔT(BP)とΔT(TG)で異なる)
 バッキングプレート1の押圧面によってスパッタリングターゲット2の接触面を押圧するとき、前記押圧面は前記接触面を挟んで向かい合わせの位置に配置された対となる面を少なくとも有し、該対となる押圧面同士の距離と、前記対となる押圧面と接触している接触面同士の距離との関係が(数6)~(数10)を満たすことが好ましい。
(数6)DTG>DBP
(数7)DBP=DTG-ΔD×C
(数8)ΔD=DBP×ΔT×CTEBP-DTG×ΔT×CTTG
(数9)DTG-ΔD×4.0≦DBP≦DTG-ΔD×0.5
(数10)CTEBP>CTTG
 ただし、DBP、DTG、ΔD、C、T、ΔT、T、ΔT、CTEBP及びCTTGはそれぞれ次のことを意味する。
BP:室温における、前記対となる押圧面同士の距離(mm)
TG:室温における、前記対となる押圧面と接触する接触面同士の距離(mm)
T:バッキングプレートを熱膨張させてスパッタリングターゲットを嵌合させるときのバッキングプレートの温度(℃)(ただし、T>室温、T>T
ΔT:T-室温(℃)
:バッキングプレートを熱膨張させてスパッタリングターゲットを嵌合させるときのスパッタリングターゲットの温度(℃)(ただし、T≧室温、T>T
ΔT:T-室温(℃)
CTEBP:温度Tにおけるバッキングプレートの線膨張係数(1/℃)
CTTG:温度Tにおけるスパッタリングターゲットの線膨張係数(1/℃)
C:係数(ただし、C=0.5~4.0)
ΔD:室温から温度Tまで昇温させたときのバッキングプレートと室温から温度Tまで昇温させたときのスパッタリングターゲットの熱膨張量の差(mm)
 ここで、(3)の形態について、同様に検討すると、バッキングプレート1を室温からバッキングプレートを熱膨張させる温度Tまで昇温させると、バッキングプレート1の押圧面同士の距離は、(DBP×ΔT×CTEBP)で求められる長さの熱膨張をする。また、スパッタリングターゲット2は室温のままであるから、スパッタリングターゲット2の接触面同士の距離は、熱膨張しない。そうすると、バッキングプレート1のみを温度Tまで昇温することによって熱膨脹させると、バッキングプレート1の押圧面同士の距離は(DBP×ΔT×CTEBP)で求められる長さ分だけ熱膨張し、バッキングプレート1の押圧面同士の距離がスパッタリングターゲット2の接触面同士の距離よりも熱膨張することによってバッキングプレート1の押圧面の内側にスパッタリングターゲット2を嵌め込むことが可能となる。そして、室温まで降温させると、(数6)に示される関係によって、スパッタリングターゲット2の接触面をバッキングプレート1の押圧面で押圧することになる。前記の(3)の形態において、スパッタリングターゲット2の接触面をバッキングプレート1の押圧面で押圧することを可能にするには、バッキングプレート1の熱膨脹によって、バッキングプレート1の押圧面同士の距離がスパッタリングターゲット2の接触面同士の距離を逆転しなければならない。そこで、室温におけるバッキングプレート1の押圧面同士の距離を、室温におけるスパッタリングターゲット2の接触面同士の距離と比較して、どれだけ小さく設定することができるかの関係を示したのが(数7)及び(数9)である。(数7)及び(数9)においてCは係数であるが、Cが0.5~4.0の範囲内であるとき、スパッタリングターゲット2の接触面をバッキングプレート1の押圧面で押圧してスパッタリングターゲットとバッキングプレートとを接合するときに、スパッタリングターゲットの割れや反りを抑制することができる。
[Relational expression including linear expansion coefficient] (Different between ΔT (BP) and ΔT 1 (TG))
When the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1, the pressing surface has at least a pair of surfaces arranged at positions facing each other across the contact surface, and the pairing pressing is performed. It is preferable that the relationship between the distance between the surfaces and the distance between the contact surfaces in contact with the paired pressing surface satisfies (Equation 6) to (Equation 10).
(Number 6) D TG > D BP
(Number 7) D BP = D TG -ΔD × C
(Equation 8) ΔD = D BP × ΔT × CTE BP −D TG × ΔT 1 × CT 1 E TG
(Equation 9) D TG −ΔD × 4.0 ≦ D BP ≦ D TG −ΔD × 0.5
(Number 10) CTE BP > CT 1 ETG
However, D BP , D TG , ΔD, C, T, ΔT, T 1 , ΔT 1 , CTE BP and CT 1 E TG mean the following, respectively.
DBP : Distance (mm) between the paired pressing surfaces at room temperature.
DTG : Distance between contact surfaces in contact with the pair of pressing surfaces (mm) at room temperature.
T: The temperature (° C.) of the backing plate when the backing plate is thermally expanded to fit the sputtering target (where T> room temperature, T> T 1 ).
ΔT: T-room temperature (° C)
T 1 : Temperature (° C.) of the sputtering target when the backing plate is thermally expanded to fit the sputtering target (however, T 1 ≧ room temperature, T> T 1 )
ΔT 1 : T 1 -room temperature (° C)
CTE BP : Linear expansion coefficient (1 / ° C.) of the backing plate at temperature T
CT 1 ETG : Linear expansion coefficient ( 1 / ° C.) of the sputtering target at temperature T1.
C: Coefficient (however, C = 0.5 to 4.0)
ΔD: Difference in thermal expansion amount between the backing plate when the temperature is raised from room temperature to temperature T and the sputtering target when the temperature is raised from room temperature to temperature T 1 (mm)
Here, when the form (3) is similarly examined, when the backing plate 1 is heated from room temperature to the temperature T at which the backing plate is thermally expanded, the distance between the pressing surfaces of the backing plate 1 is ( DBP ×). It undergoes thermal expansion of the length obtained by ΔT × CTE BP ). Further, since the sputtering target 2 remains at room temperature, the distance between the contact surfaces of the sputtering targets 2 does not thermally expand. Then, when only the backing plate 1 is thermally expanded by raising the temperature to the temperature T, the distance between the pressing surfaces of the backing plate 1 is thermally expanded by the length obtained by ( DBP × ΔT × CTE BP ) , and the backing is performed. Since the distance between the pressing surfaces of the plate 1 is larger than the distance between the contact surfaces of the sputtering target 2, the sputtering target 2 can be fitted inside the pressing surface of the backing plate 1. Then, when the temperature is lowered to room temperature, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1 according to the relationship shown in (Equation 6). In the above-described embodiment (3), in order to enable the contact surface of the sputtering target 2 to be pressed by the pressing surface of the backing plate 1, the distance between the pressing surfaces of the backing plate 1 is increased by the thermal expansion of the backing plate 1. The distance between the contact surfaces of the sputtering targets 2 must be reversed. Therefore, the relationship between the distance between the pressing surfaces of the backing plate 1 at room temperature and the distance between the contact surfaces of the sputtering targets 2 at room temperature can be set as small as possible (Equation 7). ) And (Equation 9). In (Equation 7) and (Equation 9), C is a coefficient, but when C is in the range of 0.5 to 4.0, the contact surface of the sputtering target 2 is pressed by the pressing surface of the backing plate 1. When joining the sputtering target and the backing plate, it is possible to suppress cracking and warpage of the sputtering target.
 (2)の形態は、(1)の形態と(3)の形態の中間の形態であるから、同様にスパッタリングターゲット2の接触面をバッキングプレート1の押圧面で押圧することになる。 Since the form (2) is an intermediate form between the form (1) and the form (3), the contact surface of the sputtering target 2 is similarly pressed by the pressing surface of the backing plate 1.
〈スパッタリングターゲット‐バッキングプレート接合体の製造方法〉
[製造方法の第1例]
(工程1)
 次に、図15を参照しながら、図2に示したスパッタリングターゲット‐バッキングプレート接合体100の製造方法について説明する。まず、図15(A)に示すように、バッキングプレート1と、ターゲット面7、バッキングプレートのプレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2を準備する。次に、図15(B)に示すように、バッキングプレート1にプレート面3、プレート裏面4、プレート側面5、鉤状部6を形成できる程度の凸部13を形成する。バッキングプレート1の形成手段としては、旋盤を用いた切削加工などによって行うことができる。なお、凸部13の内側のプレート面もプレート面3とする。スパッタリングターゲット2とバッキングプレート1が接合できれば、凸部13の内側のプレート面3と凸部13の外側のプレート面の高さは一致していてもよく、異なっていてもよい。次に、図15(B)に示すように、バッキングプレート1に形成される凸部13の高さ及び幅を考慮し、凸部13に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10とが当接できる程度までスパッタリングターゲット2の外周側面9の下部を取り除く。スパッタリングターゲット2の外周側面9の下部を取り除く手段としては、旋盤を用いた切削加工などによって行うことができる。なお、取り除かれた箇所の外周も外周側面9とする。次に、図15(C)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1に形成される凸部13に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、凸部13の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図15(C)に示すように、バッキングプレート1に形成される凸部13の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、鉤状部6と当接する位置に設けることが必要である。
<Manufacturing method of sputtering target-backing plate joint>
[First example of manufacturing method]
(Step 1)
Next, a method for manufacturing the sputtering target-backing plate junction 100 shown in FIG. 2 will be described with reference to FIG. First, as shown in FIG. 15A, a sputtering target 2 having a backing plate 1, a target surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 is prepared. Next, as shown in FIG. 15B, the backing plate 1 is formed with a convex portion 13 capable of forming a plate surface 3, a plate back surface 4, a plate side surface 5, and a hook-shaped portion 6. The backing plate 1 can be formed by cutting using a lathe or the like. The plate surface inside the convex portion 13 is also the plate surface 3. As long as the sputtering target 2 and the backing plate 1 can be joined, the heights of the plate surface 3 inside the convex portion 13 and the plate surface outside the convex portion 13 may be the same or different. Next, as shown in FIG. 15B, considering the height and width of the convex portion 13 formed on the backing plate 1, the hook-shaped portion 6 formed on the convex portion 13 and the outer peripheral side surface of the sputtering target 2. The lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed in the lower part of the 9 can come into contact with the hook receiving portion 10. As a means for removing the lower portion of the outer peripheral side surface 9 of the sputtering target 2, a cutting process using a lathe or the like can be performed. The outer circumference of the removed portion is also defined as the outer peripheral side surface 9. Next, as shown in FIG. 15C, a hook-shaped portion 6 is formed on the convex portion 13 formed on the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the convex portion 13 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be partially provided with respect to the side surface 9. Next, as shown in FIG. 15C, a hook receiving portion 10 is formed at a position where the convex portion 13 formed on the backing plate 1 can come into contact with the hook-shaped portion 6 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. do. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. Although it may be partially provided in, it is necessary to provide it at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 次に、図15(D)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1の鉤状部6の内側に挿入できる程度までバッキングプレート1を加熱して熱膨張させる。このとき、バッキングプレート1の鉤状部6の内側にスパッタリングターゲット2の外周側面9の下部を挿入する目的が果たせるのであれば、バッキングプレート1を加熱しているときにスパッタリングターゲット2が加熱されてもよい。加熱は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって行うことができる。なお、バッキングプレート1とスパッタリングターゲット2の界面に中間層を設けるときは、図15(D)の工程内または図15(D)の工程の前後で行うことが好ましく、換言すると図15(C)と図15(D)の間の工程、図15(D)を行っている間または図15(D)と図15(E)の間の工程で中間層を形成することが好ましい(図15では不図示)。
(Step 2)
Next, as shown in FIG. 15D, the backing plate 1 is heated and thermally expanded to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the backing plate 1. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the backing plate 1 can be achieved, the sputtering target 2 is heated while the backing plate 1 is being heated. May be good. The heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like. When the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2, it is preferable to provide the intermediate layer in the process of FIG. 15 (D) or before and after the process of FIG. 15 (D), in other words, FIG. 15 (C). It is preferable to form the intermediate layer in the step between FIG. 15 (D), while performing FIG. 15 (D), or in the step between FIGS. 15 (D) and 15 (E) (in FIG. 15). Not shown).
(工程3)
 次に、図15(E)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1の鉤状部6の内側に挿入し、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3を合わせ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1の鉤状部6が向かい合わせになるように配置する。このとき、バッキングプレート1の鉤状部6やスパッタリングターゲット2の鉤受け部10が変形しない程度であれば、スパッタリングターゲット2のターゲット面7からバッキングプレート1に向けて押圧を加えてもよい。
(Step 3)
Next, as shown in FIG. 15 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the backing plate 1, and the target back surface 8 of the sputtering target 2 and the plate of the backing plate 1 are inserted. The surfaces 3 are aligned, and the hook-shaped portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are arranged so as to face each other. At this time, as long as the hook-shaped portion 6 of the backing plate 1 and the hook receiving portion 10 of the sputtering target 2 are not deformed, pressure may be applied from the target surface 7 of the sputtering target 2 toward the backing plate 1.
(工程4)
 次に、図15(F)に示すように、バッキングプレート1を冷却して熱収縮させ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1の鉤状部6を当接させることにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。冷却は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって温度を調整しながら冷却を行うことができるが、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などで行ってきた加熱を停止して自然放冷してもよい。
(Step 4)
Next, as shown in FIG. 15 (F), the backing plate 1 is cooled and heat-shrinked, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are brought into contact with each other to bring the sputtering target into contact with each other. Since the movement of the backing plate 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured. Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate. Although it can be performed, the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。また、バッキングプレート1の凸部13の位置、スパッタリングターゲット2の外周側面9の下部の取り除く量、鉤状部6の位置、鉤受け部10の位置などを調整し、バッキングプレート1の鉤状部6側からスパッタリングターゲット2の鉤受け部10側に押圧が加わるようにしてもよく、スパッタリングターゲット2のターゲット裏面8からバッキングプレート1のプレート面3に押圧が加わるようにしてもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more. Further, the position of the convex portion 13 of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted to adjust the hook-shaped portion of the backing plate 1. The pressure may be applied from the 6 side to the hook receiving portion 10 side of the sputtering target 2, or the pressure may be applied from the target back surface 8 of the sputtering target 2 to the plate surface 3 of the backing plate 1.
[製造方法の第2例]
(工程1)
 次に、図16を参照しながら、図8に示したスパッタリングターゲット‐バッキングプレート接合体201の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体201の製造方法は、まず、図16(A)に示すように、プレート面3、プレート裏面4及びプレート側面5を備えたバッキングプレート1と、ターゲット面7、プレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。次に、図16(B)に示すように、バッキングプレート1に固定される留め具14の高さ及び幅を考慮し、留め具14に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10が当接できる程度までスパッタリングターゲット2の外周側面9の下部を取り除く。スパッタリングターゲット2の外周側面9の下部を取り除く手段としては、旋盤を用いた切削加工などによって行うことができる。なお、前記取り除かれた箇所の外周も外周側面9とする。次に、留め具14に形成される鉤状部6とスパッタリングターゲットの外周側面9の下部に形成される鉤受け部10を当接することを考慮し、バッキングプレート1のプレート面3に留め具14を固定する。バッキングプレート1のプレート面3に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。次に、図16(C)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1に固定される留め具14に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図16(C)に示すように、バッキングプレート1に固定される留め具14の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。
[Second example of manufacturing method]
(Step 1)
Next, a method for manufacturing the sputtering target-backing plate junction 201 shown in FIG. 8 will be described with reference to FIG. In the method of manufacturing the sputtering target-backing plate joint 201 according to the present embodiment, first, as shown in FIG. 16A, a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG. 16B, considering the height and width of the fastener 14 fixed to the backing plate 1, the hook-shaped portion 6 formed on the fastener 14 and the outer peripheral side surface of the sputtering target 2. The lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed in the lower part of the 9 can come into contact with the hook receiving portion 10. As a means for removing the lower portion of the outer peripheral side surface 9 of the sputtering target 2, a cutting process using a lathe or the like can be performed. The outer periphery of the removed portion is also defined as the outer peripheral side surface 9. Next, in consideration of contacting the hook-shaped portion 6 formed on the fastener 14 with the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target, the fastener 14 is attached to the plate surface 3 of the backing plate 1. To fix. As a means for fixing the fastener 14 to the plate surface 3 of the backing plate 1, in addition to fixing by screwing, a joining means such as diffusion joining or welding can be used. Next, as shown in FIG. 16C, the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9. Next, as shown in FIG. 16C, a hook receiving portion 10 is formed at a position where the fastener 14 fixed to the backing plate 1 can come into contact with the hook-shaped portion 6 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. do. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 次に、図16(D)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入できる程度までバッキングプレート1を加熱して熱膨張させる。このとき、バッキングプレート1に設置した留め具14の鉤状部6の内側にスパッタリングターゲット2の外周側面9の下部を挿入する目的が果たせるのであれば、バッキングプレート1を加熱しているときにスパッタリングターゲット2が加熱されてもよい。加熱は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって行うことができる。なお、バッキングプレート1とスパッタリングターゲット2の界面に中間層を設けるときは、図16(D)の工程内または図16(D)の工程の前後で行うことが好ましく、換言すると図16(C)と図16(D)の間の工程、図16(D)を行っている間または図16(D)と図16(E)の間の工程で中間層を形成することが好ましい(図16では不図示)。
(Step 2)
Next, as shown in FIG. 16D, the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated. The heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like. When the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2, it is preferable to provide the intermediate layer in the process of FIG. 16 (D) or before and after the process of FIG. 16 (D), in other words, FIG. 16 (C). It is preferable to form the intermediate layer in the step between FIG. 16 (D), while performing FIG. 16 (D), or in the step between FIGS. 16 (D) and 16 (E) (in FIG. 16). Not shown).
(工程3)
 次に、図16(E)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入し、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3を合わせ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6が向かい合わせになるように配置する。このとき、バッキングプレート1に設置した留め具14の鉤状部6やスパッタリングターゲット2の鉤受け部10が変形しない程度であれば、スパッタリングターゲット2のターゲット面7からバッキングプレート1に向けて押圧を加えてもよい。
(Step 3)
Next, as shown in FIG. 16E, the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the plate surface 3 of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2. At this time, if the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 and the hook receiving portion 10 of the sputtering target 2 are not deformed, the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
(工程4)
 次に、図16(F)に示すように、バッキングプレート1を冷却して熱収縮させ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6を当接させることにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。冷却は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって温度を調整しながら冷却を行うことができるが、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などで行ってきた加熱を停止して自然放冷してもよい。
(Step 4)
Next, as shown in FIG. 16F, the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2. By doing so, the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate. Although it can be performed, the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。また、バッキングプレート1の留め具14の位置、スパッタリングターゲット2の外周側面9の下部の取り除く量、鉤状部6の位置、鉤受け部10の位置などを調整し、バッキングプレート1に設置した留め具14の鉤状部6側からスパッタリングターゲット2の鉤受け部10側に押圧が加わるようにしてもよく、スパッタリングターゲット2のターゲット裏面8からバッキングプレート1のプレート面3に押圧が加わるようにしてもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more. Further, the position of the fastener 14 of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted, and the fastener installed on the backing plate 1 is installed. Pressing may be applied from the hook-shaped portion 6 side of the tool 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the plate surface 3 of the backing plate 1. May be good.
[製造方法の第3例]
(工程1)
 次に、図17を参照しながら、図8に示したスパッタリングターゲット‐バッキングプレート接合体201の製造方法の別形態について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体201の製造方法は、まず、図17(A)に示すように、プレート面3、プレート裏面4及びプレート側面5を備えたバッキングプレート1と、ターゲット面7、前記プレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。次に、図17(B)に示すように、バッキングプレート1に固定される留め具14の高さ及び幅を考慮し、留め具14に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10が当接できる程度までスパッタリングターゲット2の外周側面9の下部を取り除く。スパッタリングターゲット2の外周側面9の下部を取り除く手段としては、旋盤を用いた切削加工などによって行うことができる。なお、前記取り除かれた箇所の外周も外周側面9とする。次に、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1に固定される留め具14に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図17(C)に示すように、バッキングプレート1に固定される留め具14の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。次に、図17(C)に示すように、留め具14に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10を当接することを考慮し、バッキングプレート1のプレート面3に留め具14を固定する。バッキングプレート1のプレート面3に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。
[Third example of manufacturing method]
(Step 1)
Next, another embodiment of the method for manufacturing the sputtering target-backing plate junction 201 shown in FIG. 8 will be described with reference to FIG. In the method for manufacturing the sputtering target-backing plate joint 201 according to the present embodiment, first, as shown in FIG. 17A, a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG. 17B, considering the height and width of the fastener 14 fixed to the backing plate 1, the hook-shaped portion 6 formed on the fastener 14 and the outer peripheral side surface of the sputtering target 2. The lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed in the lower part of the 9 can come into contact with the hook receiving portion 10. As a means for removing the lower portion of the outer peripheral side surface 9 of the sputtering target 2, a cutting process using a lathe or the like can be performed. The outer periphery of the removed portion is also defined as the outer peripheral side surface 9. Next, the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9. Next, as shown in FIG. 17C, a hook receiving portion 10 is formed at the lower portion of the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1. do. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6. Next, as shown in FIG. 17C, considering that the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 are brought into contact with each other. The fastener 14 is fixed to the plate surface 3 of the backing plate 1. As a means for fixing the fastener 14 to the plate surface 3 of the backing plate 1, in addition to fixing by screwing, a joining means such as diffusion joining or welding can be used.
(工程2)
 次に、図17(D)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入できる程度までバッキングプレート1を加熱して熱膨張させる。このとき、バッキングプレート1に設置した留め具14の鉤状部6の内側にスパッタリングターゲット2の外周側面9の下部を挿入する目的が果たせるのであれば、バッキングプレート1を加熱しているときにスパッタリングターゲット2が加熱されてもよい。加熱は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって行うことができる。なお、バッキングプレート1とスパッタリングターゲット2の界面に中間層を設けるときは、図17(D)の工程内または図17(D)の工程の前後で行うことが好ましく、換言すると図17(C)と図17(D)の間の工程、図17(D)を行っている間または図17(D)と図17(E)の間の工程で中間層を形成することが好ましい(図17では不図示)。
(Step 2)
Next, as shown in FIG. 17D, the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated. The heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like. When the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2, it is preferable to provide the intermediate layer in the process of FIG. 17 (D) or before and after the process of FIG. 17 (D), in other words, FIG. 17 (C). It is preferable to form the intermediate layer in the step between FIG. 17 (D), while performing FIG. 17 (D), or in the step between FIGS. 17 (D) and 17 (E) (in FIG. 17). Not shown).
(工程3)
 次に、図17(E)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入し、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1のプレート面3を合わせ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6が向かい合わせになるように配置する。このとき、バッキングプレート1に設置した留め具14の鉤状部6やスパッタリングターゲット2の鉤受け部10が変形しない程度であれば、スパッタリングターゲット2のターゲット面7からバッキングプレート1に向けて押圧を加えてもよい。
(Step 3)
Next, as shown in FIG. 17 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the plate surface 3 of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2. At this time, if the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 and the hook receiving portion 10 of the sputtering target 2 are not deformed, the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
(工程4)
 次に、図17(F)に示すように、バッキングプレート1を冷却して熱収縮させ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6を当接させることにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。冷却は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって温度を調整しながら冷却を行うことができるが、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などで行ってきた加熱を停止して自然放冷してもよい。
(Step 4)
Next, as shown in FIG. 17 (F), the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2. By doing so, the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate. Although it can be performed, the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。また、バッキングプレート1の留め具14の位置、スパッタリングターゲット2の外周側面9の下部の取り除く量、鉤状部6の位置、鉤受け部10の位置などを調整し、バッキングプレート1に設置した留め具14の鉤状部6側からスパッタリングターゲット2の鉤受け部10側に押圧が加わるようにしてもよく、スパッタリングターゲット2のターゲット裏面8からバッキングプレート1のプレート面3に押圧が加わるようにしてもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more. Further, the position of the fastener 14 of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted, and the fastener installed on the backing plate 1 is installed. Pressing may be applied from the hook-shaped portion 6 side of the tool 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the plate surface 3 of the backing plate 1. May be good.
[製造方法の第4例]
(工程1)
 次に、図18を参照しながら、図7に示したスパッタリングターゲット‐バッキングプレート接合体200の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体200の製造方法は、まず、図18(A)に示すように、プレート面3、プレート裏面4及びプレート側面5を備えたバッキングプレート1と、ターゲット面7、前記プレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。次に、図18(B)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に固定される留め具14の高さ及び幅を考慮し、留め具14に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10が当接できる程度までスパッタリングターゲット2の外周側面9の下部を取り除く。スパッタリングターゲット2の外周側面9の下部を取り除く手段としては、旋盤を用いた切削加工などによって行うことができる。なお、前記取り除かれた箇所の外周も外周側面9とする。次に、図18(C)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1に固定される留め具14に鉤状部6を形成する。留め具14の鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図18(C)に示すように、バッキングプレート1に固定される留め具14の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。
[Fourth example of manufacturing method]
(Step 1)
Next, a method for manufacturing the sputtering target-backing plate junction 200 shown in FIG. 7 will be described with reference to FIG. In the method for manufacturing the sputtering target-backing plate joint 200 according to the present embodiment, first, as shown in FIG. 18A, a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG. 18B, the hook formed on the fastener 14 is formed in consideration of the height and width of the fastener 14 whose lower portion of the outer peripheral side surface 9 of the sputtering target 2 is fixed to the backing plate 1. The lower portion of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can come into contact with the shaped portion 6. As a means for removing the lower portion of the outer peripheral side surface 9 of the sputtering target 2, a cutting process using a lathe or the like can be performed. The outer periphery of the removed portion is also defined as the outer peripheral side surface 9. Next, as shown in FIG. 18C, the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 of the fastener 14 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be partially provided with respect to the side surface 9. Next, as shown in FIG. 18C, a hook receiving portion 10 is formed at the lower portion of the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1. do. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 図18(C)に示すように、プレート面3とターゲット裏面8とが向かい合わせになるように、スパッタリングターゲット2とバッキングプレート1とを配置する。
(Step 2)
As shown in FIG. 18C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
(工程3)
 次に、図18(D)に示すように、留め具14に形成された鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成された鉤受け部10を当接する。次に、図18(E)に示すように、留め具14をプレート面3に配置し、かつ、鉤受け部10と鉤状部6とが向かい合わせになるように、スパッタリングターゲット2と留め具14とを配置する。
(Step 3)
Next, as shown in FIG. 18D, the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 are brought into contact with each other. Next, as shown in FIG. 18E, the sputtering target 2 and the fastener are arranged so that the fastener 14 is arranged on the plate surface 3 and the hook receiving portion 10 and the hook-shaped portion 6 face each other. 14 and are arranged.
(工程4)
 次に、図18(E)において、工程3の配置状態で、バッキングプレート1のプレート面3に留め具14を固定することにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。バッキングプレート1のプレート面3に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。
(Step 4)
Next, in FIG. 18E, by fixing the fastener 14 to the plate surface 3 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed, and the sputtering target 2 is suppressed. Since the movement of the backing plate 1 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. As a means for fixing the fastener 14 to the plate surface 3 of the backing plate 1, in addition to fixing by screwing, a joining means such as diffusion joining or welding can be used.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
[製造方法の第5例]
(工程1)
 次に、図19を参照しながら、図7に示したスパッタリングターゲット‐バッキングプレート接合体200に類似する構造を有する接合体202の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体202の製造方法は、まず、図19(A)に示すように、プレート面3、プレート裏面4及びプレート側面5を備えたバッキングプレート1と、ターゲット面7、前記プレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。このとき、留め具14の底部は、スパッタリングターゲット2のターゲット裏面8を覆うことが可能な形状とされている。次に、図19(B)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に固定される留め具14の高さ及び幅を考慮し、留め具14に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10が当接できる程度までスパッタリングターゲット2の外周側面9の下部を取り除く。スパッタリングターゲット2の外周側面9の下部を取り除く手段としては、旋盤を用いた切削加工などによって行うことができる。なお、前記取り除かれた箇所の外周も外周側面9とする。次に、図19(C)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1に固定される留め具14に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図19(C)に示すように、バッキングプレート1に固定される留め具14の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。
[Fifth example of manufacturing method]
(Step 1)
Next, with reference to FIG. 19, a method for manufacturing the junction 202 having a structure similar to that of the sputtering target-backing plate junction 200 shown in FIG. 7 will be described. The method for manufacturing the sputtering target-backing plate joint 202 according to the present embodiment is as follows: first, as shown in FIG. 19A, a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared. At this time, the bottom portion of the fastener 14 has a shape capable of covering the target back surface 8 of the sputtering target 2. Next, as shown in FIG. 19B, the hook formed on the fastener 14 is formed in consideration of the height and width of the fastener 14 whose lower portion of the outer peripheral side surface 9 of the sputtering target 2 is fixed to the backing plate 1. The lower portion of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can come into contact with the shaped portion 6. As a means for removing the lower portion of the outer peripheral side surface 9 of the sputtering target 2, a cutting process using a lathe or the like can be performed. The outer periphery of the removed portion is also defined as the outer peripheral side surface 9. Next, as shown in FIG. 19C, the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9. Next, as shown in FIG. 19C, a hook receiving portion 10 is formed at a position where the fastener 14 fixed to the backing plate 1 can come into contact with the hook-shaped portion 6 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. do. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 図19(C)に示すように、プレート面3とターゲット裏面8とが向かい合わせになるように、スパッタリングターゲット2とバッキングプレート1とを配置する。
(Step 2)
As shown in FIG. 19C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
(工程3)
 次に、図19(D)に示すように、留め具14に形成された鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成された鉤受け部10を当接する。このとき、スパッタリングターゲット2のターゲット裏面8を覆うようにした留め具14の底部は、スパッタリングターゲット2の裏面8と当接することが好ましい。次に、図19(E)に示すように、留め具14をプレート面3に配置し、かつ、鉤受け部10と鉤状部6とが向かい合わせになるように、スパッタリングターゲット2と留め具14とを配置する。
(Step 3)
Next, as shown in FIG. 19D, the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 are brought into contact with each other. At this time, it is preferable that the bottom portion of the fastener 14 that covers the target back surface 8 of the sputtering target 2 comes into contact with the back surface 8 of the sputtering target 2. Next, as shown in FIG. 19E, the sputtering target 2 and the fastener are arranged so that the fastener 14 is arranged on the plate surface 3 and the hook receiving portion 10 and the hook-shaped portion 6 face each other. 14 and are arranged.
(工程4)
 次に、図19(E)において、工程3の配置状態で、バッキングプレート1のプレート面3に留め具14を固定することにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。バッキングプレート1のプレート面3に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。
(Step 4)
Next, in FIG. 19E, by fixing the fastener 14 to the plate surface 3 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed, and the sputtering target 2 is suppressed. Since the movement of the backing plate 1 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. As a means for fixing the fastener 14 to the plate surface 3 of the backing plate 1, in addition to fixing by screwing, a joining means such as diffusion joining or welding can be used.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
[製造方法の第6例]
(工程1)
 次に、図20を参照しながら、図9に示したスパッタリングターゲット‐バッキングプレート接合体300の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体300の製造方法は、まず、図20(A)に示すように、プレート面3、プレート裏面4、プレート側面5を備えたバッキングプレート1と、ターゲット面7、バッキングプレートのプレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2を準備する。次に、図20(B)に示すように、バッキングプレート1のプレート面3にスパッタリングターゲット2のターゲット裏面8を嵌め込むための、凹部底面15と凹部側面16とを有する凹部17を形成する。このとき、バッキングプレート1の凹部底面15の大きさは、バッキングプレート1の凹部側面16に形成される鉤状部6の幅を考慮しておく必要がある。バッキングプレート1の凹部17の形成手段としては、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部底面15は、バッキングプレート1とスパッタリングターゲット2を固定したときに、スパッタリングターゲット2のターゲット裏面8と当接することが好ましい。次に、図20(B)に示すように、バッキングプレート1の凹部側面16の高さ及びバッキングプレート1の凹部側面16に形成される鉤状部6の幅を考慮し、バッキングプレート1の凹部側面16に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10とが当接できる程度までスパッタリングターゲット2の外周側面9の下部を取り除く。スパッタリングターゲット2の外周側面9の下部を取り除く手段としては、旋盤を用いた切削加工などによって行うことができる。なお、前記取り除かれた箇所の外周も外周側面9とする。次に、図20(C)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1の凹部側面16に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部側面16の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図20(C)に示すように、バッキングプレート1の凹部側面16の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、前記鉤状部6と当接する位置に設けることが必要である。
[6th example of manufacturing method]
(Step 1)
Next, a method for manufacturing the sputtering target-backing plate junction 300 shown in FIG. 9 will be described with reference to FIG. 20. The method for manufacturing the sputtering target-backing plate joint 300 according to the present embodiment is as follows: first, as shown in FIG. 20 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 is prepared. Next, as shown in FIG. 20B, a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 into the plate surface 3 of the backing plate 1 is formed. At this time, the size of the recessed bottom surface 15 of the backing plate 1 needs to take into consideration the width of the hook-shaped portion 6 formed on the recessed side surface 16 of the backing plate 1. As a means for forming the recess 17 of the backing plate 1, it can be performed by cutting using a lathe or the like. The bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed. Next, as shown in FIG. 20B, the recess of the backing plate 1 is recessed in consideration of the height of the recess side surface 16 of the backing plate 1 and the width of the hook-shaped portion 6 formed on the recess side surface 16 of the backing plate 1. The lower part of the outer peripheral side surface 9 of the sputtering target 2 is removed to the extent that the hook-shaped portion 6 formed on the side surface 16 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can come into contact with each other. As a means for removing the lower portion of the outer peripheral side surface 9 of the sputtering target 2, a cutting process using a lathe or the like can be performed. The outer periphery of the removed portion is also defined as the outer peripheral side surface 9. Next, as shown in FIG. 20 (C), a hook-shaped portion 6 is formed on the recessed side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the recessed side surface 16 of the backing plate 1 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, sputtering may be provided. It may be partially provided with respect to the outer peripheral side surface 9 of the target 2. Next, as shown in FIG. 20 (C), a hook receiving portion 10 is formed at a position where the backing plate 1 can come into contact with the hook-shaped portion 6 of the concave side surface 16 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. Although it may be partially provided in, it is necessary to provide it at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 次に、図20(D)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1の鉤状部6の内側に挿入できる程度までバッキングプレート1を加熱して熱膨張させる。このとき、バッキングプレート1の鉤状部6の内側にスパッタリングターゲット2の外周側面9の下部を挿入する目的が果たせるのであれば、バッキングプレート1を加熱しているときにスパッタリングターゲット2が加熱されてもよい。加熱は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって行うことができる。なお、バッキングプレート1とスパッタリングターゲット2の界面に中間層を設けるときは、図20(D)の工程内または図20(D)の工程の前後で行うことが好ましく、換言すると図20(C)と図20(D)の間の工程、図20(D)を行っている間または図20(D)と図20(E)の間の工程で中間層を形成することが好ましい(図20では不図示)。
(Step 2)
Next, as shown in FIG. 20 (D), the backing plate 1 is heated and thermally expanded to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the backing plate 1. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the backing plate 1 can be achieved, the sputtering target 2 is heated while the backing plate 1 is being heated. May be good. The heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like. When the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2, it is preferable to provide the intermediate layer in the process of FIG. 20 (D) or before and after the process of FIG. 20 (D), in other words, FIG. 20 (C). It is preferable to form the intermediate layer in the process between FIG. 20 (D), FIG. 20 (D), or the process between FIGS. 20 (D) and 20 (E) (in FIG. 20). Not shown).
(工程3)
 次に、図20(E)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1の鉤状部6の内側に挿入し、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1の凹部底面15を合わせ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1の鉤状部6が向かい合わせになるように配置する。このとき、バッキングプレート1の鉤状部6やスパッタリングターゲット2の鉤受け部10が変形しない程度であれば、スパッタリングターゲット2のターゲット面7からバッキングプレート1に向けて押圧を加えてもよい。
(Step 3)
Next, as shown in FIG. 20 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the backing plate 1, and the target back surface 8 of the sputtering target 2 and the recess of the backing plate 1 are recessed. The bottom surfaces 15 are aligned, and the hook-shaped portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are arranged so as to face each other. At this time, as long as the hook-shaped portion 6 of the backing plate 1 and the hook receiving portion 10 of the sputtering target 2 are not deformed, pressure may be applied from the target surface 7 of the sputtering target 2 toward the backing plate 1.
(工程4)
 次に、図20(F)に示すように、バッキングプレート1を冷却して熱収縮させ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1の鉤状部6を当接させることにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。冷却は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって温度を調整しながら冷却を行うことができるが、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などで行ってきた加熱を停止して自然放冷してもよい。
(Step 4)
Next, as shown in FIG. 20 (F), the backing plate 1 is cooled and heat-shrinked, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are brought into contact with each other to bring the sputtering target into contact with each other. Since the movement of the backing plate 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured. Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate. Although it can be performed, the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。また、バッキングプレート1の凹部底面15の大きさ、スパッタリングターゲット2の外周側面9の下部の取り除く量、鉤状部6の位置、鉤受け部10の位置などを調整し、バッキングプレート1の鉤状部6側からスパッタリングターゲット2の鉤受け部10側に押圧が加わるようにしてもよく、スパッタリングターゲット2のターゲット裏面8からバッキングプレート1の凹部底面15に押圧が加わるようにしてもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more. Further, the size of the bottom surface 15 of the recess of the backing plate 1, the amount to be removed from the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like are adjusted to form the hook shape of the backing plate 1. The pressure may be applied from the portion 6 side to the hook receiving portion 10 side of the sputtering target 2, or the pressing may be applied from the target back surface 8 of the sputtering target 2 to the concave bottom surface 15 of the backing plate 1.
[製造方法の第7例]
(工程1)
 次に、図21を参照しながら、図9に示したスパッタリングターゲット‐バッキングプレート接合体300に類似する構造を有する接合体301であって、留め具14を用いた接合体の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体301の製造方法は、まず、図21(A)に示すように、プレート面3、プレート裏面4、プレート側面5を備えたバッキングプレート1と、ターゲット面7、バッキングプレート1のプレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。次に、図21(B)に示すように、バッキングプレート1のプレート面3にスパッタリングターゲット2のターゲット裏面8を嵌め込むための凹部底面15と凹部側面16とを有する凹部17を形成する。このとき、バッキングプレート1の凹部底面15の大きさは、留め具14の幅を考慮しておく必要がある。バッキングプレート1の凹部17の形成手段としては、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部底面15は、バッキングプレート1とスパッタリングターゲット2を固定したときに、スパッタリングターゲット2のターゲット裏面8と当接することが好ましい。次に、図21(B)に示すように、バッキングプレート1の凹部側面16の高さ、バッキングプレート1の凹部底面15若しくは凹部側面16に固定される留め具14の高さ及び幅を考慮し、バッキングプレート1の凹部17に固定される留め具14に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10とが当接できる程度までスパッタリングターゲット2の外周側面9の下部を取り除く。スパッタリングターゲット2の外周側面9の下部を取り除く手段としては、旋盤を用いた切削加工などによって行うことができる。なお、前記取り除かれた箇所の外周も外周側面9とする。次に、図21(B)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1の凹部底面15若しくは凹部側面16に固定される留め具14に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図21(C)に示すように、バッキングプレート1の凹部底面15若しくは凹部側面16に固定される留め具14に形成された鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。次に、留め具14に形成される鉤状部6とスパッタリングターゲット2の外周側面9の下部に形成される鉤受け部10とを当接することを考慮し、バッキングプレート1の凹部底面15若しくは凹部側面16に留め具14を固定する。バッキングプレート1の凹部底面15若しくは凹部側面16に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。
[7th example of manufacturing method]
(Step 1)
Next, with reference to FIG. 21, a method for manufacturing a joint body 301 having a structure similar to that of the sputtering target-backing plate joint body 300 shown in FIG. 9 and using the fastener 14 will be described. .. The method for manufacturing the sputtering target-backing plate joint 301 according to the present embodiment is as follows: first, as shown in FIG. 21 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate 1, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG. 21B, a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1. At this time, it is necessary to consider the width of the fastener 14 for the size of the recessed bottom surface 15 of the backing plate 1. As a means for forming the recess 17 of the backing plate 1, it can be performed by cutting using a lathe or the like. The bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed. Next, as shown in FIG. 21B, the height and width of the recessed side surface 16 of the backing plate 1 and the height and width of the fastener 14 fixed to the recessed bottom surface 15 or the recessed side surface 16 of the backing plate 1 are taken into consideration. , The sputtering target 2 to the extent that the hook-shaped portion 6 formed on the fastener 14 fixed to the recess 17 of the backing plate 1 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can come into contact with each other. Remove the lower part of the outer peripheral side surface 9. As a means for removing the lower portion of the outer peripheral side surface 9 of the sputtering target 2, a cutting process using a lathe or the like can be performed. The outer periphery of the removed portion is also defined as the outer peripheral side surface 9. Next, as shown in FIG. 21B, the hook-shaped portion 6 is attached to the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. Form. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9. Next, as shown in FIG. 21C, the outer periphery of the sputtering target 2 is at a position where it can come into contact with the hook-shaped portion 6 formed on the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1. A hook receiving portion 10 is formed at the lower portion of the side surface 9. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6. Next, in consideration of contacting the hook-shaped portion 6 formed on the fastener 14 with the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target 2, the concave bottom surface 15 or the concave portion of the backing plate 1 The fastener 14 is fixed to the side surface 16. As a means for fixing the fastener 14 to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1, it can be fixed by screwing, diffusion joining, welding or the like.
(工程2)
 次に、図21(D)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入できる程度までバッキングプレート1を加熱して熱膨張させる。このとき、バッキングプレート1に設置した留め具14の鉤状部6の内側にスパッタリングターゲット2の外周側面9の下部を挿入する目的が果たせるのであれば、バッキングプレート1を加熱しているときにスパッタリングターゲット2が加熱されてもよい。加熱は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって行うことができる。なお、バッキングプレート1とスパッタリングターゲット2の界面に中間層を設けるときは、図21(D)の工程内または図21(D)の工程の前後で行うことが好ましく、換言すると図21(C)と図21(D)の間の工程、図21(D)を行っている間または図21(D)と図21(E)の間の工程で中間層を形成することが好ましい(図21では不図示)。
(Step 2)
Next, as shown in FIG. 21 (D), the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated. The heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like. When the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2, it is preferable to provide the intermediate layer in the process of FIG. 21 (D) or before and after the process of FIG. 21 (D), in other words, FIG. 21 (C). It is preferable to form the intermediate layer in the process between FIG. 21 (D), FIG. 21 (D), or the process between FIGS. 21 (D) and 21 (E) (in FIG. 21). Not shown).
(工程3)
 次に、図21(E)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入し、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1の凹部底面15を合わせ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6が向かい合わせになるように配置する。このとき、バッキングプレート1に設置した留め具14の鉤状部6やスパッタリングターゲット2の鉤受け部10が変形しない程度であれば、スパッタリングターゲット2のターゲット面7からバッキングプレート1に向けて押圧を加えてもよい。
(Step 3)
Next, as shown in FIG. 21 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the bottom surface 15 of the recess of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2. At this time, if the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 and the hook receiving portion 10 of the sputtering target 2 are not deformed, the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
(工程4)
 次に、図21(F)に示すように、バッキングプレート1を冷却して熱収縮させ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6を当接させることにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。冷却は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって温度を調整しながら冷却を行うことができるが、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などで行ってきた加熱を停止して自然放冷してもよい。
(Step 4)
Next, as shown in FIG. 21 (F), the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2. By doing so, the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate. Although it can be performed, the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。また、バッキングプレート1の凹部底面15の大きさ、スパッタリングターゲット2の外周側面9の下部の取り除く量、鉤状部6の位置、鉤受け部10の位置などを調整し、バッキングプレート1に設置した留め具14の鉤状部6側からスパッタリングターゲット2の鉤受け部10側に押圧が加わるようにしてもよく、スパッタリングターゲット2のターゲット裏面8からバッキングプレート1の凹部底面15に押圧が加わるようにしてもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more. Further, the size of the bottom surface 15 of the recess of the backing plate 1, the amount to be removed from the lower part of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like were adjusted and installed on the backing plate 1. Pressing may be applied from the hook-shaped portion 6 side of the fastener 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the recessed bottom surface 15 of the backing plate 1. You may.
[製造方法の第8例]
(工程1)
 次に、図22を参照しながら、図10に示したスパッタリングターゲット‐バッキングプレート接合体400に類似する構造を有する接合体401であって、留め具を用いない接合体の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体401の製造方法は、まず、図22(A)に示すように、プレート面3、プレート裏面4、プレート側面5を備えたバッキングプレート1と、ターゲット面7、バッキングプレートのプレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2を準備する。次に、図22(B)に示すように、バッキングプレート1のプレート面3にスパッタリングターゲット2のターゲット裏面8を嵌め込むための凹部底面15と凹部側面16とを有する凹部17を形成する。このとき、バッキングプレート1の凹部底面15の大きさは、バッキングプレート1の凹部側面16に形成される鉤状部6の幅を考慮しておく必要がある。バッキングプレート1の凹部17の形成手段としては、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部底面15は、バッキングプレート1とスパッタリングターゲット2を固定したときに、スパッタリングターゲット2のターゲット裏面8と当接することが好ましい。次に、図22(C)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1の凹部側面16に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部側面16の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図22(C)に示すように、バッキングプレート1の凹部側面16の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、前記鉤状部6と当接する位置に設けることが必要である。
[8th example of manufacturing method]
(Step 1)
Next, with reference to FIG. 22, a method for manufacturing a bonded body 401 having a structure similar to that of the sputtering target-backing plate joint body 400 shown in FIG. 10 and without using a fastener will be described. The method for manufacturing the sputtering target-backing plate joint 401 according to the present embodiment is as follows: first, as shown in FIG. 22 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 is prepared. Next, as shown in FIG. 22B, a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1. At this time, the size of the recessed bottom surface 15 of the backing plate 1 needs to take into consideration the width of the hook-shaped portion 6 formed on the recessed side surface 16 of the backing plate 1. As a means for forming the recess 17 of the backing plate 1, it can be performed by cutting using a lathe or the like. The bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed. Next, as shown in FIG. 22C, a hook-shaped portion 6 is formed on the recessed side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the recessed side surface 16 of the backing plate 1 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, sputtering may be provided. It may be partially provided with respect to the outer peripheral side surface 9 of the target 2. Next, as shown in FIG. 22C, a hook receiving portion 10 is formed at a position where the backing plate 1 can come into contact with the hook-shaped portion 6 of the concave side surface 16 at the lower portion of the outer peripheral side surface 9 of the sputtering target 2. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. Although it may be partially provided in, it is necessary to provide it at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 次に、図22(D)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1の鉤状部6の内側に挿入できる程度までバッキングプレート1を加熱して熱膨張させる。このとき、バッキングプレート1の鉤状部6の内側にスパッタリングターゲット2の外周側面9の下部を挿入する目的が果たせるのであれば、バッキングプレート1を加熱しているときにスパッタリングターゲット2が加熱されてもよい。加熱は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって行うことができる。なお、バッキングプレート1とスパッタリングターゲット2の界面に中間層を設けるときは、図22(D)の工程内または図22(D)の工程の前後で行うことが好ましく、換言すると図22(C)と図22(D)の間の工程、図22(D)を行っている間または図22(D)と図22(E)の間の工程内で中間層を形成することが好ましい(図22では不図示)。
(Step 2)
Next, as shown in FIG. 22D, the backing plate 1 is heated and thermally expanded to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the backing plate 1. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the backing plate 1 can be achieved, the sputtering target 2 is heated while the backing plate 1 is being heated. May be good. The heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like. When the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2, it is preferable to provide the intermediate layer in the process of FIG. 22 (D) or before and after the process of FIG. 22 (D), in other words, FIG. 22 (C). It is preferable to form an intermediate layer in the process between FIG. 22 (D), while performing FIG. 22 (D), or in the process between FIGS. 22 (D) and 22 (E) (FIG. 22). Not shown).
(工程3)
 次に、図22(E)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1の鉤状部6の内側に挿入し、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1の凹部底面15を合わせ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1の鉤状部6が向かい合わせになるように配置する。このとき、バッキングプレート1の鉤状部6やスパッタリングターゲット2の鉤受け部10が変形しない程度であれば、スパッタリングターゲット2のターゲット面7からバッキングプレート1に向けて押圧を加えてもよい。
(Step 3)
Next, as shown in FIG. 22 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the backing plate 1, and the target back surface 8 of the sputtering target 2 and the recess of the backing plate 1 are recessed. The bottom surfaces 15 are aligned, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are arranged so as to face each other. At this time, as long as the hook-shaped portion 6 of the backing plate 1 and the hook receiving portion 10 of the sputtering target 2 are not deformed, pressure may be applied from the target surface 7 of the sputtering target 2 toward the backing plate 1.
(工程4)
 次に、図22(F)に示すように、バッキングプレート1を冷却して熱収縮させ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1の鉤状部6を当接させることにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。冷却は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって温度を調整しながら冷却を行うことができるが、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などで行ってきた加熱を停止して自然放冷してもよい。
(Step 4)
Next, as shown in FIG. 22F, the backing plate 1 is cooled and heat-shrinked, and the hook receiving portion 10 of the sputtering target 2 and the hook-shaped portion 6 of the backing plate 1 are brought into contact with each other to bring the sputtering target into contact with each other. Since the movement of the backing plate 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be ensured. Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate. Although it can be performed, the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。また、バッキングプレート1の凹部底面15の大きさ、鉤状部6の位置、鉤受け部10の位置などを調整し、バッキングプレート1の鉤状部6側からスパッタリングターゲット2の鉤受け部10側に押圧が加わるようにしてもよく、スパッタリングターゲット2のターゲット裏面8からバッキングプレート1の凹部底面15に押圧が加わるようにしてもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more. Further, the size of the bottom surface 15 of the recess of the backing plate 1, the position of the hook-shaped portion 6, the position of the hook-shaped portion 10, and the like are adjusted, and the hook-shaped portion 6 side of the backing plate 1 to the hook-shaped portion 10 side of the sputtering target 2. The pressure may be applied to the bottom surface 15 of the recess of the backing plate 1 from the back surface 8 of the target of the sputtering target 2.
[製造方法の第9例]
(工程1)
 次に、図23を参照しながら、図10に示したスパッタリングターゲット‐バッキングプレート接合体400の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体400の製造方法は、まず、図23(A)に示すように、プレート面3、プレート裏面4、プレート側面5を備えたバッキングプレート1と、ターゲット面7、バッキングプレートのプレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。次に、図23(B)に示すように、バッキングプレート1のプレート面3にスパッタリングターゲット2のターゲット裏面8を嵌め込むための凹部底面15と凹部側面16とを有する凹部17を形成する。このとき、バッキングプレート1の凹部底面15の大きさは、留め具14の幅を考慮しておく必要がある。バッキングプレート1の凹部17の形成手段としては、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部底面15は、バッキングプレート1とスパッタリングターゲット2を固定したときに、スパッタリングターゲット2のターゲット裏面8と当接することが好ましい。次に、図23(B)に示すように、スパッタリングターゲット2の外周側面9の下部と向かい合う箇所でバッキングプレート1の凹部底面15若しくは凹部側面16に固定される留め具14に鉤状部6を形成する。鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図23(B)に示すように、バッキングプレート1の凹部底面15若しくは凹部側面16に固定される留め具14に形成された鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。次に、図23(C)に示すように、留め具14に形成される鉤状部6とスパッタリングターゲットの外周側面9の下部に形成される鉤受け部10とを当接することを考慮し、バッキングプレート1の凹部底面15若しくは凹部側面16に留め具14を固定する。バッキングプレート1の凹部底面15若しくは凹部側面16に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。
[9th example of manufacturing method]
(Step 1)
Next, a method for manufacturing the sputtering target-backing plate junction 400 shown in FIG. 10 will be described with reference to FIG. 23. The method for manufacturing the sputtering target-backing plate joint 400 according to the present embodiment is as follows: first, as shown in FIG. 23 (A), a backing plate 1 having a plate surface 3, a plate back surface 4, and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3 of the backing plate, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG. 23B, a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1. At this time, it is necessary to consider the width of the fastener 14 for the size of the recessed bottom surface 15 of the backing plate 1. As a means for forming the recess 17 of the backing plate 1, it can be performed by cutting using a lathe or the like. The bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed. Next, as shown in FIG. 23B, the hook-shaped portion 6 is attached to the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1 at a position facing the lower portion of the outer peripheral side surface 9 of the sputtering target 2. Form. The hook-shaped portion 6 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9. Next, as shown in FIG. 23B, the outer periphery of the sputtering target 2 is at a position where it can come into contact with the hook-shaped portion 6 formed on the fastener 14 fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1. A hook receiving portion 10 is formed at the lower portion of the side surface 9. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6. Next, as shown in FIG. 23C, considering that the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target are brought into contact with each other. The fastener 14 is fixed to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1. As a means for fixing the fastener 14 to the concave bottom surface 15 or the concave side surface 16 of the backing plate 1, it can be fixed by screwing, diffusion joining, welding or the like.
(工程2)
 次に、図23(D)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入できる程度までバッキングプレート1を加熱して熱膨張させる。このとき、バッキングプレート1に設置した留め具14の鉤状部6の内側にスパッタリングターゲット2の外周側面9の下部を挿入する目的が果たせるのであれば、バッキングプレート1を加熱しているときにスパッタリングターゲット2が加熱されてもよい。加熱は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって行うことができる。なお、バッキングプレート1とスパッタリングターゲット2の界面に中間層を設けるときは、図23(D)の工程内または図23(D)の工程の前後で行うことが好ましく、換言すると図23(C)と図23(D)の間の工程、図23(D)を行っている間または図23(D)と図23(E)の間の工程で中間層を形成することが好ましい(図23では不図示)。
(Step 2)
Next, as shown in FIG. 23 (D), the backing plate 1 is heated to such an extent that the lower portion of the outer peripheral side surface 9 of the sputtering target 2 can be inserted into the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1. And thermally expand. At this time, if the purpose of inserting the lower portion of the outer peripheral side surface 9 of the sputtering target 2 into the inside of the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 can be achieved, sputtering is performed while the backing plate 1 is being heated. The target 2 may be heated. The heating can be performed by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), a heating method using a hot plate, or the like. When the intermediate layer is provided at the interface between the backing plate 1 and the sputtering target 2, it is preferable to provide the intermediate layer in the process of FIG. 23 (D) or before and after the process of FIG. 23 (D), in other words, FIG. 23 (C). It is preferable to form the intermediate layer in the step between FIG. 23 (D), while performing FIG. 23 (D), or in the step between FIGS. 23 (D) and 23 (E) (in FIG. 23). Not shown).
(工程3)
 次に、図23(E)に示すように、スパッタリングターゲット2の外周側面9の下部をバッキングプレート1に設置した留め具14の鉤状部6の内側に挿入し、スパッタリングターゲット2のターゲット裏面8とバッキングプレート1の凹部底面15を合わせ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6が向かい合わせになるように配置する。このとき、バッキングプレート1に設置した留め具14の鉤状部6やスパッタリングターゲット2の鉤受け部10が変形しない程度であれば、スパッタリングターゲット2のターゲット面7からバッキングプレート1に向けて押圧を加えてもよい。
(Step 3)
Next, as shown in FIG. 23 (E), the lower portion of the outer peripheral side surface 9 of the sputtering target 2 is inserted inside the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1, and the back surface 8 of the target of the sputtering target 2 is inserted. And the bottom surface 15 of the recess of the backing plate 1 are aligned with each other, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is arranged so as to face each other with the hook receiving portion 10 of the sputtering target 2. At this time, if the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 and the hook receiving portion 10 of the sputtering target 2 are not deformed, the pressing is applied from the target surface 7 of the sputtering target 2 toward the backing plate 1. May be added.
(工程4)
 次に、図23(F)に示すように、バッキングプレート1を冷却して熱収縮させ、スパッタリングターゲット2の鉤受け部10とバッキングプレート1に設置した留め具14の鉤状部6を当接させることにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。冷却は、例えば、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などによって温度を調整しながら冷却を行うことができるが、ホットプレス焼結法(HP)、熱間等方加圧焼結法(HIP)、放電プラズマ焼結法(SPS)又はホットプレートによる加熱法などで行ってきた加熱を停止して自然放冷してもよい。
(Step 4)
Next, as shown in FIG. 23 (F), the backing plate 1 is cooled and heat-shrinked, and the hook-shaped portion 6 of the fastener 14 installed on the backing plate 1 is brought into contact with the hook receiving portion 10 of the sputtering target 2. By doing so, the movement of the sputtering target 2 in the side surface direction is suppressed and the movement of the sputtering target 2 in the thickness direction is suppressed, so that the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. Cooling is performed while adjusting the temperature by, for example, a hot press sintering method (HP), a hot isotropic pressure sintering method (HIP), a discharge plasma sintering method (SPS), or a heating method using a hot plate. Although it can be performed, the heating performed by the hot press sintering method (HP), the hot isotropic pressure sintering method (HIP), the discharge plasma sintering method (SPS), the heating method using a hot plate, etc. is stopped. Then, it may be naturally cooled.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。また、バッキングプレート1の凹部底面15の大きさ、スパッタリングターゲット2の外周側面9の下部の取り除く量、鉤状部6の位置、鉤受け部10の位置などを調整し、バッキングプレート1に設置した留め具14の鉤状部6側からスパッタリングターゲット2の鉤受け部10側に押圧が加わるようにしてもよく、スパッタリングターゲット2のターゲット裏面8からバッキングプレート1の凹部底面15に押圧が加わるようにしてもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more. Further, the size of the bottom surface 15 of the recess of the backing plate 1, the amount to be removed from the lower part of the outer peripheral side surface 9 of the sputtering target 2, the position of the hook-shaped portion 6, the position of the hook receiving portion 10, and the like were adjusted and installed on the backing plate 1. Pressing may be applied from the hook-shaped portion 6 side of the fastener 14 to the hook receiving portion 10 side of the sputtering target 2, and the pressing is applied from the target back surface 8 of the sputtering target 2 to the recessed bottom surface 15 of the backing plate 1. You may.
[製造方法の第10例]
(工程1)
 次に図24を参照しながら、図10に示したスパッタリングターゲット‐バッキングプレート接合体400の製造方法の別形態について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体400の製造方法は、まず、図24(A)に示すように、プレート面3、プレート裏面4及びプレート側面5を備えたバッキングプレート1と、ターゲット面7、前記プレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。次に、図24(B)に示すように、バッキングプレート1のプレート面3にスパッタリングターゲット2のターゲット裏面8を嵌め込むための凹部底面15と凹部側面16とを有する凹部17を形成する。このとき、バッキングプレート1の凹部底面15の大きさは、留め具14の幅を考慮しておく必要がある。バッキングプレート1の凹部17の形成手段としては、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部底面15は、バッキングプレート1とスパッタリングターゲット2を固定したときに、スパッタリングターゲット2のターゲット裏面8と当接することが好ましい。次に、図24(B)に示すように、スパッタリングターゲット2の外周側面9と向かい合うように、バッキングプレート1に固定される留め具14に鉤状部6を形成する。留め具14の鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図24(B)に示すように、バッキングプレート1に固定される留め具14の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。
[10th example of manufacturing method]
(Step 1)
Next, another embodiment of the method for manufacturing the sputtering target-backing plate junction 400 shown in FIG. 10 will be described with reference to FIG. 24. In the method for manufacturing the sputtering target-backing plate joint 400 according to the present embodiment, first, as shown in FIG. 24 (A), a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared. Next, as shown in FIG. 24B, a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1. At this time, it is necessary to consider the width of the fastener 14 for the size of the recessed bottom surface 15 of the backing plate 1. As a means for forming the recess 17 of the backing plate 1, it can be performed by cutting using a lathe or the like. The bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed. Next, as shown in FIG. 24B, the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 so as to face the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 of the fastener 14 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be partially provided with respect to the side surface 9. Next, as shown in FIG. 24B, a hook receiving portion 10 is formed on the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 図24(C)に示すように、プレート面3とターゲット裏面8とが向かい合わせになるように、スパッタリングターゲット2とバッキングプレート1とを配置する。
(Step 2)
As shown in FIG. 24C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
(工程3)
 次に、図24(C)に示すように、留め具14に形成された鉤状部6とスパッタリングターゲットの外周側面9の下部に形成された鉤受け部10とを当接する。次に、図24(D)に示すように、留め具14をプレート面3に配置し、かつ、鉤受け部10と鉤状部6とが向かい合わせになるように、スパッタリングターゲット2と留め具14とを配置する。
(Step 3)
Next, as shown in FIG. 24C, the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target are brought into contact with each other. Next, as shown in FIG. 24D, the sputtering target 2 and the fastener are arranged so that the fastener 14 is arranged on the plate surface 3 and the hook receiving portion 10 and the hook-shaped portion 6 face each other. 14 and are arranged.
(工程4)
 次に、図24(D)において、工程3の配置状態で、バッキングプレート1の凹部底面15若しくは凹部側面16に留め具14を固定することにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。バッキングプレート1のプレート面3に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。
(Step 4)
Next, in FIG. 24D, by fixing the fastener 14 to the recessed bottom surface 15 or the recessed side surface 16 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed. Since the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. As a means for fixing the fastener 14 to the plate surface 3 of the backing plate 1, in addition to fixing by screwing, a joining means such as diffusion joining or welding can be used.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲットとバッキングプレートの冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target and the backing plate may be performed once as a set or repeated twice or more.
[製造方法の第11例]
(工程1)
 次に図25を参照しながら、図10に示したスパッタリングターゲット‐バッキングプレート接合体400に類似する構造を有する接合体402の製造方法について説明する。本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体402の製造方法は、まず、図25(A)に示すように、プレート面3、プレート裏面4及びプレート側面5を備えたバッキングプレート1と、ターゲット面7、前記プレート面3と向かい合うターゲット裏面8、外周側面9を備えたスパッタリングターゲット2と留め具14を準備する。このとき、留め具14の底部は、スパッタリングターゲット2のターゲット裏面8を覆うことが可能な形状とされている。次に、図25(B)に示すように、バッキングプレート1のプレート面3にスパッタリングターゲット2のターゲット裏面8を嵌め込むための凹部底面15と凹部側面16とを有する凹部17を形成する。このとき、バッキングプレート1の凹部底面15の大きさは、留め具14の幅を考慮しておく必要がある。バッキングプレート1の凹部17の形成手段としては、旋盤を用いた切削加工などによって行うことができる。なお、バッキングプレート1の凹部底面15は、バッキングプレート1とスパッタリングターゲット2を固定したときに、スパッタリングターゲット2のターゲット裏面8と当接することが好ましい。次に、図25(B)に示すように、スパッタリングターゲット2の外周側面9と向かい合うように、バッキングプレート1に固定される留め具14に鉤状部6を形成する。留め具14の鉤状部6の形成は、旋盤を用いた切削加工などによって行うことができる。なお、留め具14の鉤状部6は、スパッタリングターゲット2の外周側面9に対して全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に対して部分的に設けてもよい。次に、図25(B)に示すように、バッキングプレート1に固定される留め具14の鉤状部6と当接できる箇所でスパッタリングターゲット2の外周側面9の下部に鉤受け部10を形成する。鉤受け部10の形成は、旋盤を用いた切削加工などによって行うことができる。なお、スパッタリングターゲット2の鉤受け部10は、スパッタリングターゲット2の外周側面9に全周設けてもよく、バッキングプレート1に対してスパッタリングターゲット2が剥離することがなければスパッタリングターゲット2の外周側面9に部分的に設けてもよいが、留め具14の鉤状部6と当接する位置に設けることが必要である。
[11th example of manufacturing method]
(Step 1)
Next, with reference to FIG. 25, a method for manufacturing the junction 402 having a structure similar to the sputtering target-backing plate junction 400 shown in FIG. 10 will be described. The method for manufacturing the sputtering target-backing plate joint 402 according to the present embodiment is as follows: first, as shown in FIG. 25 (A), a backing plate 1 having a plate surface 3, a plate back surface 4 and a plate side surface 5 and a target. A sputtering target 2 and a fastener 14 having a surface 7, a target back surface 8 facing the plate surface 3, and an outer peripheral side surface 9 are prepared. At this time, the bottom portion of the fastener 14 has a shape capable of covering the target back surface 8 of the sputtering target 2. Next, as shown in FIG. 25B, a recess 17 having a recess bottom surface 15 and a recess side surface 16 for fitting the target back surface 8 of the sputtering target 2 is formed on the plate surface 3 of the backing plate 1. At this time, it is necessary to consider the width of the fastener 14 for the size of the recessed bottom surface 15 of the backing plate 1. As a means for forming the recess 17 of the backing plate 1, it can be performed by cutting using a lathe or the like. The bottom surface 15 of the recess of the backing plate 1 preferably comes into contact with the back surface 8 of the target of the sputtering target 2 when the backing plate 1 and the sputtering target 2 are fixed. Next, as shown in FIG. 25B, the hook-shaped portion 6 is formed on the fastener 14 fixed to the backing plate 1 so as to face the outer peripheral side surface 9 of the sputtering target 2. The hook-shaped portion 6 of the fastener 14 can be formed by cutting using a lathe or the like. The hook-shaped portion 6 of the fastener 14 may be provided on the entire circumference with respect to the outer peripheral side surface 9 of the sputtering target 2, and if the sputtering target 2 does not peel off from the backing plate 1, the outer periphery of the sputtering target 2 may be provided. It may be provided partially with respect to the side surface 9. Next, as shown in FIG. 25 (B), a hook receiving portion 10 is formed at the lower portion of the outer peripheral side surface 9 of the sputtering target 2 at a position where it can come into contact with the hook-shaped portion 6 of the fastener 14 fixed to the backing plate 1. do. The hook receiving portion 10 can be formed by cutting using a lathe or the like. The hook receiving portion 10 of the sputtering target 2 may be provided on the entire outer peripheral side surface 9 of the sputtering target 2. If the sputtering target 2 does not peel off from the backing plate 1, the outer peripheral side surface 9 of the sputtering target 2 may be provided. However, it is necessary to provide the fastener 14 at a position where it comes into contact with the hook-shaped portion 6.
(工程2)
 図25(C)に示すように、プレート面3とターゲット裏面8とが向かい合わせになるように、スパッタリングターゲット2とバッキングプレート1とを配置する。
(Step 2)
As shown in FIG. 25C, the sputtering target 2 and the backing plate 1 are arranged so that the plate surface 3 and the target back surface 8 face each other.
(工程3)
 次に、図25(C)に示すように、留め具14に形成された鉤状部6とスパッタリングターゲットの外周側面9の下部に形成された鉤受け部10を当接する。このとき、スパッタリングターゲット2のターゲット裏面8を覆うようにした留め具14の底部は、スパッタリングターゲット2の裏面8と当接することが好ましい。次に、図25(D)に示すように、留め具14をプレート面3に配置して留め具14を凹部17に嵌め込み、かつ、鉤受け部10と鉤状部6とが向かい合わせになるように、スパッタリングターゲット2と留め具14とを配置する。
(Step 3)
Next, as shown in FIG. 25 (C), the hook-shaped portion 6 formed on the fastener 14 and the hook receiving portion 10 formed on the lower portion of the outer peripheral side surface 9 of the sputtering target are brought into contact with each other. At this time, it is preferable that the bottom portion of the fastener 14 that covers the target back surface 8 of the sputtering target 2 comes into contact with the back surface 8 of the sputtering target 2. Next, as shown in FIG. 25 (D), the fastener 14 is arranged on the plate surface 3, the fastener 14 is fitted into the recess 17, and the hook receiving portion 10 and the hook-shaped portion 6 face each other. As such, the sputtering target 2 and the fastener 14 are arranged.
(工程4)
 次に、図25(D)において、工程3の配置状態で、バッキングプレート1の凹部底面15若しくは凹部側面16に留め具14を固定することにより、スパッタリングターゲット2の側面方向の動きを抑制するとともに、スパッタリングターゲット2の厚さ方向の動きを抑制しているため、バッキングプレート1とスパッタリングターゲット2の接合強度を確保することができる。バッキングプレート1のプレート面3に留め具14を固定する手段としては、ねじ止めによる固定の他、拡散接合、溶接などの接合手段によって行うことができる。
(Step 4)
Next, in FIG. 25D, by fixing the fastener 14 to the recessed bottom surface 15 or the recessed side surface 16 of the backing plate 1 in the arrangement state of the step 3, the movement of the sputtering target 2 in the side surface direction is suppressed. Since the movement of the sputtering target 2 in the thickness direction is suppressed, the bonding strength between the backing plate 1 and the sputtering target 2 can be secured. As a means for fixing the fastener 14 to the plate surface 3 of the backing plate 1, in addition to fixing by screwing, a joining means such as diffusion joining or welding can be used.
(工程4の後の付加工程)
 なお、バッキングプレート1とスパッタリングターゲット2の密着性をより確保したいときは、工程4の後に、スパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧、又は、スパッタリングターゲット2とバッキングプレート1の加熱とスパッタリングターゲット2のターゲット面7からバッキングプレート1への押圧の工程及びスパッタリングターゲット2とバッキングプレート1の冷却の工程を1組として1回行う又は2回以上繰り返し行ってもよい。
(Additional step after step 4)
If it is desired to further secure the adhesion between the backing plate 1 and the sputtering target 2, after the step 4, the target surface 7 of the sputtering target 2 is pressed against the backing plate 1, or the sputtering target 2 and the backing plate 1 are heated. The step of pressing the sputtering target 2 from the target surface 7 to the backing plate 1 and the step of cooling the sputtering target 2 and the backing plate 1 may be performed once as a set or repeated twice or more.
(スパッタリングターゲットの回収方法の第1例)
 本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体がスパッタリング装置に装着され、使用された場合であって、スパッタリングターゲットが消耗した場合について説明する。本実施形態に係るスパッタリングターゲットの回収方法は、本実施形態に係るスパッタリングターゲット‐バッキングプレート接合体を加熱して、鉤受け部10から鉤状部6を離すまで熱膨脹させる工程Aと、スパッタリングターゲット2をバッキングプレート1から取り外して、スパッタリングターゲット‐バッキングプレート接合体からスパッタリングターゲット2を回収する工程Bと、有する。スパッタリングターゲット2を取り外す形態には、スパッタリングターゲット2をそのまま取り外す形態と、スパッタリングターゲット2に衝撃を加えて取り外す形態が含まれる。
(First example of recovery method of sputtering target)
A case where the sputtering target-backing plate joint according to the present embodiment is attached to the sputtering apparatus and used, and the sputtering target is exhausted will be described. The method for recovering the sputtering target according to the present embodiment includes a step A in which the sputtering target-backing plate joint according to the present embodiment is heated and thermally expanded until the hook-shaped portion 6 is separated from the hook receiving portion 10, and the sputtering target 2. The step B is to remove the sputtering target 2 from the backing plate 1 and recover the sputtering target 2 from the sputtering target-backing plate joint. The form of removing the sputtering target 2 includes a form of removing the sputtering target 2 as it is and a form of removing the sputtering target 2 by applying an impact.
(スパッタリングターゲットの回収方法の第2例)
 留め具14がバッキングプレート1に固定されているスパッタリングターゲット‐バッキングプレート接合体におけるスパッタリングターゲットの回収方法は、留め具14をバッキングプレート1から取り外して、スパッタリングターゲット‐バッキングプレート接合体からスパッタリングターゲット2を回収する工程Cを有する。スパッタリングターゲット2を取り外す形態には、スパッタリングターゲット2をそのまま取り外す形態と、スパッタリングターゲット2に衝撃を加えて取り外す形態が含まれる。
(Second example of recovery method of sputtering target)
The method of recovering the sputtering target in the sputtering target-backing plate joint in which the fastener 14 is fixed to the backing plate 1 is to remove the fastener 14 from the backing plate 1 and remove the sputtering target 2 from the sputtering target-backing plate joint. It has a step C of recovery. The form of removing the sputtering target 2 includes a form of removing the sputtering target 2 as it is and a form of removing the sputtering target 2 by applying an impact.
 以下、実施例を示しながら本発明についてさらに詳細に説明するが、本発明は実施例に限定して解釈されない。 Hereinafter, the present invention will be described in more detail with reference to examples, but the present invention is not construed as being limited to the examples.
(実施例1)
 図9に相当する接合体を作製する。まず、熔解法にて作製したΦ156×9t(単位:mm)のルテニウムスパッタリングターゲット2と、Φ240×20t(単位:mm)の黄銅のバッキングプレート1を準備した。線膨張係数は、ルテニウムが6.75×10-6/℃、黄銅が21.2×10-6/℃である。次に、スパッタリングターゲット2の外周側面9に、側面の周方向に沿って鉤受け部10となる0.5mmの環状凹部を旋盤で形成した。これによって、スパッタリングターゲット2の外周側面9に、環状凹部の底面を基準として凸となる環状凸部が形成される。次に、バッキングプレート1のスパッタリングターゲット2を設置する箇所に、スパッタリングターゲット2の直径より0.4mm小さく、深さ4mmの凹部17を旋盤にて加工する。さらにスパッタリングターゲット2の鉤状部6と符合する位置のバッキングプレートの凹部内周側面16に0.5mmの鉤受け部10を形成した。次に、バッキングプレート1の凹部底面15に0.1mm厚のNiの板材及び微量のIn粉末を充填した。この微量のIn粉末は、Niの板材周りの隙間に充填される。次に、バッキングプレート1の凹部17の上にスパッタリングターゲット2を設置した。次に、放電プラズマ焼結機を用いて10Pa以下の減圧雰囲気で250℃に昇温後、スパッタリングターゲット2をバッキングプレートの凹部17に充填する。充填後、10MPaでスパッタリングターゲット2のターゲット面7から加圧しながら、さらに400℃まで昇温し、1時間保持にて拡散接合を行った後、冷却して当接を行った。その結果を図26に示す。接合体は、スパッタリングターゲット2の外周側面9の凹凸部分とバッキングプレート1の凹部内周側面16の凹凸部分とが互いに嵌め込みあう構造を有している。図26に示すようにスパッタリングターゲット2の外周側面9とバッキングプレート1の凹部17の内周側面16とは当接により固定し、ターゲット裏面8も隙間無くNi、Inが充填されて、熱伝導が良く拡散接合が行われながら、スパッタリングターゲット2の割れは発生しなかった。
(Example 1)
A bonded body corresponding to FIG. 9 is produced. First, a ruthenium sputtering target 2 of Φ156 × 9t (unit: mm) prepared by a melting method and a brass backing plate 1 of Φ240 × 20t (unit: mm) were prepared. The coefficient of linear expansion is 6.75 × 10-6 / ° C for ruthenium and 21.2 × 10-6 / ° C for brass. Next, on the outer peripheral side surface 9 of the sputtering target 2, a 0.5 mm annular recess serving as a hook receiving portion 10 was formed by a lathe along the circumferential direction of the side surface. As a result, an annular convex portion that is convex with respect to the bottom surface of the annular recess is formed on the outer peripheral side surface 9 of the sputtering target 2. Next, a recess 17 having a depth of 4 mm, which is 0.4 mm smaller than the diameter of the sputtering target 2, is machined at a position where the sputtering target 2 of the backing plate 1 is installed. Further, a 0.5 mm hook receiving portion 10 is formed on the inner peripheral side surface 16 of the recess of the backing plate at a position corresponding to the hook-shaped portion 6 of the sputtering target 2. Next, the bottom surface 15 of the recess of the backing plate 1 was filled with a 0.1 mm thick Ni plate material and a small amount of In powder. This trace amount of In powder is filled in the gap around the Ni plate material. Next, the sputtering target 2 was installed on the recess 17 of the backing plate 1. Next, the temperature is raised to 250 ° C. in a reduced pressure atmosphere of 10 Pa or less using a discharge plasma sintering machine, and then the sputtering target 2 is filled in the recess 17 of the backing plate. After filling, the temperature was further raised to 400 ° C. while pressurizing from the target surface 7 of the sputtering target 2 at 10 MPa, diffusion bonding was performed by holding for 1 hour, and then cooling was performed for contact. The result is shown in FIG. The bonded body has a structure in which the uneven portion of the outer peripheral side surface 9 of the sputtering target 2 and the uneven portion of the concave inner peripheral side surface 16 of the backing plate 1 are fitted to each other. As shown in FIG. 26, the outer peripheral side surface 9 of the sputtering target 2 and the inner peripheral side surface 16 of the recess 17 of the backing plate 1 are fixed by contact with each other, and the target back surface 8 is also filled with Ni and In without gaps to provide heat conduction. Although diffusion bonding was performed well, cracking of the sputtering target 2 did not occur.
(比較例1)
 曲げ強度が138MPaであるΦ70×7t(単位:mm)のAl-30原子%Scスパッタリングターゲットと、Φ80×8t(単位:mm)のAl合金であるA6061のバッキングプレートを準備した。線膨張係数は、Al-30原子%Scが13.5×10-6/℃、A6061が23.6×10-6/℃である。次に、バッキングプレート1上にAl-30原子%Scスパッタリングターゲットを設置した。次に、放電プラズマ焼結機を用いて、真空雰囲気で500℃に昇温後、10MPaでスパッタリングターゲットのターゲット面から加圧しながら1時間保持にて拡散接合を行った。その結果を図27に示す。図27に示すように、スパッタリングターゲットとバッキングプレートは接合されているが、線膨張係数の差が大きいため、バッキングプレートの冷却時にスパッタリングターゲットが圧縮の応力を受けて割れてしまった。
(Comparative Example 1)
A Φ70 × 7t (unit: mm) Al-30 atomic% Sc sputtering target having a bending strength of 138 MPa and a backing plate of A6061 which is a Φ80 × 8t (unit: mm) Al alloy were prepared. The coefficient of linear expansion is 13.5 × 10-6 / ° C for Al-30 atomic% Sc and 23.6 × 10-6 / ° C for A6061. Next, an Al-30 atomic% Sc sputtering target was placed on the backing plate 1. Next, using a discharge plasma sintering machine, the temperature was raised to 500 ° C. in a vacuum atmosphere, and then diffusion bonding was performed by holding for 1 hour while pressurizing from the target surface of the sputtering target at 10 MPa. The result is shown in FIG. 27. As shown in FIG. 27, the sputtering target and the backing plate are joined, but the difference in the coefficient of linear expansion is large, so that the sputtering target is cracked due to the stress of compression when the backing plate is cooled.
(比較例2)
 曲げ強度が138MPaであるΦ70×7t(単位:mm)のAl-30原子%Scスパッタリングターゲットと、Φ80×8t(単位:mm)のAl合金であるアルミ青銅のバッキングプレートを準備した。線膨張係数は、Al-30原子%Scが13.5×10-6/℃、アルミ青銅が16.5×10-6/℃である。次に、バッキングプレート1上にAl-30原子%Scスパッタリングターゲットを設置した。次に、放電プラズマ焼結機を用いて、真空雰囲気で500℃に昇温後、10MPaでスパッタリングターゲットのターゲット面から加圧しながら1時間保持にて拡散接合を行った。その結果を図28に示す。図28に示すように、比較例1よりもスパッタリングターゲットの線膨張係数とバッキングプレートの線膨張係数を近づけてみたが、スパッタリングターゲットとバッキングプレートとの線膨張係数の差があるため、スパッタリングターゲット2が圧縮の応力を受けて割れるとともに、バッキングプレートへの接合が不十分であるためバッキングプレートからスパッタリングターゲットが剥離した。
(Comparative Example 2)
A Φ70 × 7t (unit: mm) Al-30 atomic% Sc sputtering target having a bending strength of 138 MPa and a backing plate of aluminum bronze which is an Al alloy of Φ80 × 8t (unit: mm) were prepared. The coefficient of linear expansion is 13.5 × 10-6 / ° C for Al-30 atomic% Sc and 16.5 × 10-6 / ° C for aluminum bronze. Next, an Al-30 atomic% Sc sputtering target was placed on the backing plate 1. Next, using a discharge plasma sintering machine, the temperature was raised to 500 ° C. in a vacuum atmosphere, and then diffusion bonding was performed by holding for 1 hour while pressurizing from the target surface of the sputtering target at 10 MPa. The result is shown in FIG. As shown in FIG. 28, the linear expansion coefficient of the sputtering target and the linear expansion coefficient of the backing plate were made closer to each other than in Comparative Example 1, but since there is a difference in the linear expansion coefficient between the sputtering target and the backing plate, the sputtering target 2 Was cracked by the stress of compression, and the sputtering target was peeled off from the backing plate due to insufficient bonding to the backing plate.
(比較例3)
 焼結法にてΦ194×10t(単位:mm)のルテニウムスパッタリングターゲットと、Φ240×20t(単位:mm)の無酸素銅のバッキングプレートを準備した。線膨張係数は、ルテニウムが6.75×10-6/℃、無酸素銅が16.2×10-6/℃である。次に、バッキングプレート上にルテニウムスパッタリングターゲットを設置した。次に、放電プラズマ焼結機を用いて、真空雰囲気で700℃に昇温後、10MPaでスパッタリングターゲットのターゲット面から加圧しながら1時間保持にて拡散接合を行った。その結果を図29に示す。図29に示すように、スパッタリングターゲットとバッキングプレートの線膨張係数の差があるため、スパッタリングターゲットが圧縮の応力を受けて割れてしまった。
(Comparative Example 3)
A ruthenium sputtering target of Φ194 × 10t (unit: mm) and a backing plate of oxygen-free copper of Φ240 × 20t (unit: mm) were prepared by a sintering method. The coefficient of linear expansion is 6.75 × 10-6 / ° C for ruthenium and 16.2 × 10-6 / ° C for oxygen-free copper. Next, a ruthenium sputtering target was placed on the backing plate. Next, using a discharge plasma sintering machine, the temperature was raised to 700 ° C. in a vacuum atmosphere, and then diffusion bonding was performed by holding for 1 hour while pressurizing from the target surface of the sputtering target at 10 MPa. The result is shown in FIG. As shown in FIG. 29, due to the difference in linear expansion coefficient between the sputtering target and the backing plate, the sputtering target was cracked due to the stress of compression.
(比較例4)
 焼結法にてΦ180×5t(単位:mm)のルテニウムスパッタリングターゲットと、バッキングプレートとして用いる無酸素銅で作製したCANと呼ばれる15mm厚の容器にΦ180.1mm、深さ10mmの凹部を形成したものを準備した。線膨張係数は、ルテニウムが6.75×10-6/℃、無酸素銅が16.2×10-6/℃である。次に、CANにスパッタリングターゲットを内包した後、その上から無酸素銅で作製したΦ180×5tの蓋をスパッタリングターゲットの上に乗せ、CAN内を真空にして封止した。次に、HIP装置を用いて、500℃に昇温後、100MPaでCANを加圧して拡散接合を行った。このとき容器が全面から加圧され、容器とスパッタリングターゲットが拡散接合された。拡散接合後に、旋盤を用いてスパッタリングターゲット2とバッキングプレートを削り出した。その結果を図30に示す。図30に示すように、拡散接合は出来ていたが、スパッタリングターゲットとバッキングプレートの線膨張係数の差があるため、スパッタリングターゲットが圧縮の応力を受けて中央部から細かな割れが外周に向けて放射状に発生して割れてしまった。
(Comparative Example 4)
A ruthenium sputtering target of Φ180 × 5t (unit: mm) and a container of 15 mm thick called CAN made of oxygen-free copper used as a backing plate with a recess of Φ180.1 mm and a depth of 10 mm formed by the sintering method. Prepared. The coefficient of linear expansion is 6.75 × 10-6 / ° C for ruthenium and 16.2 × 10-6 / ° C for oxygen-free copper. Next, after the sputtering target was encapsulated in the CAN, a Φ180 × 5t lid made of oxygen-free copper was placed on the sputtering target, and the inside of the CAN was evacuated and sealed. Next, using a HIP device, the temperature was raised to 500 ° C., and then CAN was pressurized at 100 MPa to perform diffusion bonding. At this time, the container was pressurized from the entire surface, and the container and the sputtering target were diffusion-bonded. After diffusion bonding, the sputtering target 2 and the backing plate were carved out using a lathe. The result is shown in FIG. As shown in FIG. 30, although the diffusion bonding was completed, the sputtering target was subjected to the stress of compression due to the difference in the linear expansion coefficient between the sputtering target and the backing plate, and fine cracks were formed from the central portion toward the outer periphery. It occurred radially and cracked.
50,60,100,101,200,201,202,300,301,400,401,402,500,501,600,601 スパッタリングターゲット‐バッキングプレート接合体
1 バッキングプレート
2 スパッタリングターゲット
3 バッキングプレートのプレート面
4 バッキングプレートのプレート裏面
5 バッキングプレートの側面
6 鉤状部
7 スパッタリングターゲットのターゲット面
8 スパッタリングターゲットのターゲット裏面
9 スパッタリングターゲットの外周側面
10 鉤受け部
11 ねじ止め箇所
12 中間層
12a バッキングプレートとの界面に設置された中間層
12b スパッタリングターゲットとの界面に設置された中間層
13 バッキングプレートのプレート面に設けた凸部
14 留め具
15 バッキングプレートの凹部底面
16 バッキングプレートの凹部側面
17 凹部
50,60,100,101,200,201,202,300,301,400,401,402,500,501,600,601 Sputtering target-backing plate joint 1 backing plate 2 sputtering target 3 plate surface of backing plate 4 Back side of the plate of the backing plate 5 Side of the backing plate 6 Hook-shaped part 7 Target side of the sputtering target 8 Back side of the target of the sputtering target 9 Outer side surface of the sputtering target 10 Hook receiving part 11 Screwing point 12 Intermediate layer 12a Interface with backing plate Intermediate layer 12 installed at the interface with the sputtering target Intermediate layer 13 Convex portion 14 provided on the plate surface of the backing plate Fastener 15 Recessed bottom surface of the backing plate 16 Recessed side surface 17 concave portion of the backing plate

Claims (22)

  1.  バッキングプレートにスパッタリングターゲットが接合されたスパッタリングターゲット‐バッキングプレート接合体において、
     前記バッキングプレートは、プレート面と、プレート裏面と、プレート側面と、を有し、
     前記スパッタリングターゲットは、ターゲット面と、前記プレート面と向かい合うターゲット裏面と、外周側面と、を有し、
     前記バッキングプレート及び前記スパッタリングターゲットは、いずれか一方がさらに鉤状部を有し、他方がさらに鉤受け部を有し、該鉤状部と該鉤受け部とは当接し合っており、
     前記スパッタリングターゲットの鉤状部又は鉤受け部は、前記スパッタリングターゲットの外周側面に設けられており、かつ、
     前記鉤状部が前記鉤受け部に当接することによって、前記スパッタリングターゲットが前記バッキングプレートに固定されることを特徴とするスパッタリングターゲット‐バッキングプレート接合体。
    In a sputtering target-backing plate junction in which a sputtering target is bonded to a backing plate.
    The backing plate has a plate surface, a plate back surface, and a plate side surface.
    The sputtering target has a target surface, a back surface of the target facing the plate surface, and an outer peripheral side surface.
    One of the backing plate and the sputtering target further has a hook-shaped portion, and the other has a hook receiving portion, and the hook-shaped portion and the hook receiving portion are in contact with each other.
    The hook-shaped portion or the hook receiving portion of the sputtering target is provided on the outer peripheral side surface of the sputtering target, and
    A sputtering target-backing plate joint, wherein the sputtering target is fixed to the backing plate by abutting the hook-shaped portion on the hook receiving portion.
  2.  前記バッキングプレートは前記プレート面に凸部を有し、該凸部が前記鉤状部又は前記鉤受け部を有することを特徴とする請求項1に記載のスパッタリングターゲット‐バッキングプレート接合体。 The sputtering target-backing plate joint according to claim 1, wherein the backing plate has a convex portion on the plate surface, and the convex portion has the hook-shaped portion or the hook receiving portion.
  3.  前記バッキングプレートは前記プレート面又は前記プレート側面に留め具を有し、該留め具が前記鉤状部又は前記鉤受け部を有することを特徴とする請求項1に記載のスパッタリングターゲット‐バッキングプレート接合体。 The sputtering target-backing plate joint according to claim 1, wherein the backing plate has a fastener on the plate surface or the side surface of the plate, and the fastener has a hook-shaped portion or a hook receiving portion. body.
  4.  前記留め具は側面の一部を残して前記外周側面に入り込んでおり、
     前記留め具は前記バッキングプレートに固定されていることを特徴とする請求項3に記載のスパッタリングターゲット‐バッキングプレート接合体。
    The fastener penetrates into the outer peripheral side surface, leaving a part of the side surface.
    The sputtering target-backing plate joint according to claim 3, wherein the fastener is fixed to the backing plate.
  5.  前記留め具の側面が前記外周側面から突出しており、
     少なくとも前記留め具の突出した部分が前記バッキングプレートに固定されていることを特徴とする請求項3に記載のスパッタリングターゲット‐バッキングプレート接合体。
    The side surface of the fastener protrudes from the outer peripheral side surface,
    The sputtering target-backing plate joint according to claim 3, wherein at least the protruding portion of the fastener is fixed to the backing plate.
  6.  前記バッキングプレートは前記プレート面に凹部を有し、
     前記バッキングプレートは前記凹部に留め具を有し、
     該留め具が前記鉤状部又は前記鉤受け部を有し、
     前記スパッタリングターゲットの少なくとも一部と前記留め具の少なくとも一部は前記凹部に嵌め込まれており、
     前記バッキングプレートの凹部に前記留め具が固定されていることを特徴とする請求項1に記載のスパッタリングターゲット‐バッキングプレート接合体。
    The backing plate has a recess on the plate surface and has a recess.
    The backing plate has fasteners in the recesses.
    The fastener has the hook-shaped portion or the hook receiving portion.
    At least a portion of the sputtering target and at least a portion of the fastener are fitted into the recess.
    The sputtering target-backing plate joint according to claim 1, wherein the fastener is fixed to the recess of the backing plate.
  7.  前記バッキングプレートは前記プレート面に凹部を有し、
     前記バッキングプレートは前記凹部の内周側面に前記鉤状部又は前記鉤受け部を有し、
     前記スパッタリングターゲットの一部は前記凹部に嵌め込まれていることを特徴とする請求項1に記載のスパッタリングターゲット‐バッキングプレート接合体。
    The backing plate has a recess on the plate surface and has a recess.
    The backing plate has the hook-shaped portion or the hook receiving portion on the inner peripheral side surface of the recess.
    The sputtering target-backing plate joint according to claim 1, wherein a part of the sputtering target is fitted in the recess.
  8.  前記鉤状部は第1の凹凸形状部を有し、前記鉤受け部は前記第1の凹凸形状部に合わさる第2の凹凸形状部を有することを特徴とする請求項1~7のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 Any of claims 1 to 7, wherein the hook-shaped portion has a first uneven shape portion, and the hook receiving portion has a second uneven shape portion that matches the first uneven shape portion. One of the sputtering target-backing plate joints.
  9.  前記鉤状部は前記バッキングプレートから前記スパッタ面への方向における鉤先端が最大引っ掛かり箇所となる鉤形を有し、前記鉤受け部は前記鉤形に合わさる鉤穴を有することを特徴とする請求項1~7のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 The hook-shaped portion has a hook shape in which the tip of the hook in the direction from the backing plate to the spatter surface is the maximum hooking point, and the hook receiving portion has a hook hole that fits the hook shape. Item 6. The sputtering target-backing plate junction according to any one of Items 1 to 7.
  10.  前記スパッタリングターゲットと前記バッキングプレートの界面に2.5mm以下の中間層を有し、該中間層は、Ni、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることを特徴とする請求項1~9のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 An intermediate layer of 2.5 mm or less is provided at the interface between the sputtering target and the backing plate, and the intermediate layer is a metal of at least one of Ni, Cr, Al, and Cu, or at least Ni, Cr, Al, and Cu. The sputtering target-backing plate joint according to any one of claims 1 to 9, wherein the plate material is made of an alloy containing any one of them, a powder, or a combination of the plate material and the powder.
  11.  前記スパッタリングターゲットと前記バッキングプレートの界面に10μm以下の中間層を有し、該中間層は、Ni、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる薄膜であることを特徴とする請求項1~9のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 An intermediate layer of 10 μm or less is provided at the interface between the sputtering target and the backing plate, and the intermediate layer is at least one of Ni, Cr, Al, and Cu, or at least one of Ni, Cr, Al, and Cu. The sputtering target-backing plate junction according to any one of claims 1 to 9, wherein the thin film is made of an alloy containing one kind.
  12.  前記スパッタリングターゲットと前記バッキングプレートの界面に1.0mm以下の中間層を有し、該中間層は、In、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることを特徴とする請求項1~9のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 An intermediate layer of 1.0 mm or less is provided at the interface between the sputtering target and the backing plate, and the intermediate layer is made of a metal containing at least one of In and Zn or an alloy containing at least one of In and Zn. The sputtering target-backing plate joint according to any one of claims 1 to 9, wherein the plate material, powder, or a combination of the plate material and the powder is used.
  13.  前記スパッタリングターゲットと前記バッキングプレートの界面に2層以上の中間層を有し、該中間層は、
     2.5mm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせ、
     10μm以下のNi、Cr、Al、Cuの少なくともいずれか一種の金属又はNi、Cr、Al、Cuの少なくともいずれか一種を含む合金からなる薄膜、または、
     1.0mm以下のIn、Znの少なくともいずれか一種の金属又はIn、Znの少なくともいずれか一種を含む合金からなる板材、粉末、又は該板材と該粉末の組み合わせからなることを特徴とする請求項1~9のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。
    There are two or more intermediate layers at the interface between the sputtering target and the backing plate, and the intermediate layer is
    A plate or powder made of at least one metal of Ni, Cr, Al or Cu of 2.5 mm or less or an alloy containing at least one of Ni, Cr, Al or Cu, or a combination of the plate material and the powder.
    A thin film made of a metal containing at least one of Ni, Cr, Al, and Cu of 10 μm or less or an alloy containing at least one of Ni, Cr, Al, and Cu, or a thin film.
    The claim is characterized by comprising a plate material, a powder, or a combination of the plate material and the powder, which is made of a metal containing at least one of In and Zn of 1.0 mm or less or an alloy containing at least one of In and Zn. The sputtering target-backing plate junction according to any one of 1 to 9.
  14.  前記スパッタリングターゲットの材質がAl-Sc合金、Ru、Ru合金、Ir、又はIr合金であることを特徴とする請求項1~13のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 The sputtering target-backing plate joint according to any one of claims 1 to 13, wherein the material of the sputtering target is an Al—Sc alloy, Ru, Ru alloy, Ir, or Ir alloy.
  15.  前記スパッタリングターゲットの材質がLi系酸化物、Co系酸化物、Ti系酸化物又はMg系酸化物であることを特徴とする請求項1~13のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 The sputtering target-backing plate according to any one of claims 1 to 13, wherein the material of the sputtering target is a Li-based oxide, a Co-based oxide, a Ti-based oxide, or an Mg-based oxide. Joined body.
  16.  前記バッキングプレートの材質がAl、Al合金、Cu、Cu合金、Fe又はFe合金であり、前記バッキングプレートの線膨張係数が30.0×10-6/℃以下であることを特徴とする請求項1~15のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体。 The claim is that the material of the backing plate is Al, Al alloy, Cu, Cu alloy, Fe or Fe alloy, and the linear expansion coefficient of the backing plate is 30.0 × 10 -6 / ° C. or less. The sputtering target-backing plate alloy according to any one of 1 to 15.
  17.  プレート面とプレート裏面とプレート側面と鉤状部又は鉤受け部のいずれか一方とを有するバッキングプレート、及び、ターゲット面とターゲット裏面と外周側面と該外周側面に設けられた前記鉤状部又は前記鉤受け部の他方とを有するスパッタリングターゲットを準備する工程1と、
     前記バッキングプレートを加熱して熱膨張させる工程2と、
     前記プレート面と前記ターゲット裏面とが向かい合わせになるように、かつ、前記鉤受け部と前記鉤状部とが向かい合わせになるように、前記スパッタリングターゲットと前記バッキングプレートとを配置する工程3と、
     前記スパッタリングターゲットと前記バッキングプレートとを冷却して、前記鉤受け部に前記鉤状部を当接させることによって、前記スパッタリングターゲットを前記バッキングプレートに固定する工程4と、を有することを特徴とするスパッタリングターゲット‐バッキングプレート接合体の製造方法。
    A backing plate having a plate surface, a plate back surface, a plate side surface, a hook-shaped portion, or a hook receiving portion, and the hook-shaped portion or the hook-shaped portion provided on the target surface, the target back surface, the outer peripheral side surface, and the outer peripheral side surface. Step 1 of preparing a sputtering target having the other side of the hook receiving portion,
    Step 2 of heating the backing plate to thermally expand it,
    Step 3 of arranging the sputtering target and the backing plate so that the plate surface and the back surface of the target face each other and the hook receiving portion and the hook-shaped portion face each other. ,
    It is characterized by having a step 4 of fixing the sputtering target to the backing plate by cooling the sputtering target and the backing plate and bringing the hook-shaped portion into contact with the hook receiving portion. A method for manufacturing a sputtering target-backing plate joint.
  18.  前記工程4の後に、前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧又は前記スパッタリングターゲット及び前記バッキングプレートの加熱と前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧の工程、及び、前記スパッタリングターゲット及び前記バッキングプレートの冷却の工程を1組として1回行う又は2回以上繰り返し行うことを特徴とする請求項17に記載のスパッタリングターゲット‐バッキングプレート接合体の製造方法。 After the step 4, the steps of pressing the sputtering target from the target surface to the backing plate or heating the sputtering target and the backing plate and pressing the sputtering target from the target surface to the backing plate, and The method for manufacturing a sputtering target-backing plate joint according to claim 17, wherein the steps of cooling the sputtering target and the backing plate are performed once or twice or more as a set.
  19.  プレート面とプレート裏面とプレート側面とを有するバッキングプレート、鉤状部又は鉤受け部のいずれか一方を有する留め具、及び、ターゲット面とターゲット裏面と外周側面と該外周側面に前記鉤状部又は前記鉤受け部の他方とを有するスパッタリングターゲットを準備する工程1と、
     前記プレート面と前記ターゲット裏面とが向かい合わせになるように、前記スパッタリングターゲットと前記バッキングプレートとを配置する工程2と、
     前記留め具を前記プレート面又は前記プレート側面に配置し、かつ、前記鉤受け部と前記鉤状部とが向かい合わせになるように、前記スパッタリングターゲットと前記留め具とを配置する工程3と、
     該工程3の配置状態で前記留め具を前記バッキングプレートに固定する工程4と、
     を有することを特徴とするスパッタリングターゲット‐バッキングプレート接合体の製造方法。
    A backing plate having a plate surface, a plate back surface, and a plate side surface, a fastener having either a hook-shaped portion or a hook receiving portion, and a hook-shaped portion or the hook-shaped portion on the target surface, the target back surface, the outer peripheral side surface, and the outer peripheral side surface. Step 1 of preparing a sputtering target having the other end of the hook receiving portion, and
    Step 2 of arranging the sputtering target and the backing plate so that the plate surface and the back surface of the target face each other.
    Step 3 of arranging the fastener on the plate surface or the side surface of the plate, and arranging the sputtering target and the fastener so that the hook receiving portion and the hook-shaped portion face each other.
    Step 4 of fixing the fastener to the backing plate in the arrangement state of the step 3 and
    A method for producing a sputtering target-backing plate joint.
  20.  前記工程4の後に、前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧又は前記スパッタリングターゲット及び前記バッキングプレートの加熱と前記スパッタリングターゲットの前記ターゲット面から前記バッキングプレートへの押圧の工程、及び、前記スパッタリングターゲット及び前記バッキングプレートの冷却の工程を1組として1回行う又は2回以上繰り返し行うことを特徴とする請求項19に記載のスパッタリングターゲット‐バッキングプレート接合体の製造方法。 After the step 4, the steps of pressing the sputtering target from the target surface to the backing plate or heating the sputtering target and the backing plate and pressing the sputtering target from the target surface to the backing plate, and The method for manufacturing a sputtering target-backing plate joint according to claim 19, wherein the steps of cooling the sputtering target and the backing plate are performed once or twice or more as a set.
  21.  請求項1~16のいずれか一つに記載のスパッタリングターゲット‐バッキングプレート接合体を加熱して、前記鉤受け部から前記鉤状部を離すまで熱膨脹させる工程Aと、
     前記スパッタリングターゲットを前記バッキングプレートから取り外して、前記スパッタリングターゲット‐バッキングプレート接合体から前記スパッタリングターゲットを回収する工程Bと、有することを特徴とするスパッタリングターゲットの回収方法。
    The step A of heating the sputtering target-backing plate joint according to any one of claims 1 to 16 and thermally expanding the joint until the hook-shaped portion is separated from the hook receiving portion.
    A method for recovering a sputtering target, which comprises a step B of removing the sputtering target from the backing plate and recovering the sputtering target from the sputtering target-backing plate joint.
  22.  請求項3に記載のスパッタリングターゲット‐バッキングプレート接合体の前記留め具は前記バッキングプレートに固定されており、
     前記留め具を前記バッキングプレートから取り外して、前記スパッタリングターゲット‐バッキングプレート接合体から前記スパッタリングターゲットを回収する工程Cを有することを特徴とするスパッタリングターゲットの回収方法。
    The fastener of the sputtering target-backing plate joint according to claim 3 is fixed to the backing plate.
    A method for recovering a sputtering target, which comprises a step C of removing the fastener from the backing plate and recovering the sputtering target from the sputtering target-backing plate joint.
PCT/JP2021/033679 2020-09-30 2021-09-14 Sputtering target-backing plate assembly, production method therefor, and sputtering target recovery method WO2022070880A1 (en)

Applications Claiming Priority (10)

Application Number Priority Date Filing Date Title
JP2020165872 2020-09-30
JP2020-165872 2020-09-30
JP2020218600 2020-12-28
JP2020-218600 2020-12-28
JP2021013676 2021-01-29
JP2021-013676 2021-01-29
JP2021024010A JP7024128B1 (en) 2020-09-30 2021-02-18 Sputtering target-backing plate joint, its manufacturing method and recovery method of sputtering target
JP2021-024010 2021-02-18
JP2021144277A JP2022104518A (en) 2020-12-28 2021-09-03 Sputtering target-backing plate bonded body, method for manufacturing the same and method for collecting sputtering target
JP2021-144277 2021-09-03

Publications (1)

Publication Number Publication Date
WO2022070880A1 true WO2022070880A1 (en) 2022-04-07

Family

ID=80951405

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2021/033679 WO2022070880A1 (en) 2020-09-30 2021-09-14 Sputtering target-backing plate assembly, production method therefor, and sputtering target recovery method

Country Status (2)

Country Link
TW (1) TW202225434A (en)
WO (1) WO2022070880A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02243760A (en) * 1988-11-25 1990-09-27 Tokyo Electron Ltd Electrode structure
JP2017002355A (en) * 2015-06-09 2017-01-05 株式会社高純度化学研究所 Sputtering target assembly
JP2019056138A (en) * 2017-09-20 2019-04-11 Jx金属株式会社 Sputtering target assembly and method for manufacturing the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02243760A (en) * 1988-11-25 1990-09-27 Tokyo Electron Ltd Electrode structure
JP2017002355A (en) * 2015-06-09 2017-01-05 株式会社高純度化学研究所 Sputtering target assembly
JP2019056138A (en) * 2017-09-20 2019-04-11 Jx金属株式会社 Sputtering target assembly and method for manufacturing the same

Also Published As

Publication number Publication date
TW202225434A (en) 2022-07-01

Similar Documents

Publication Publication Date Title
WO2022070878A1 (en) Sputtering target-backing plate assembly, manufacturing method therefor, and recovery method for sputtering target
US6071389A (en) Diffusion bonded sputter target assembly and method of making
JP5103911B2 (en) Cylindrical sputtering target and manufacturing method thereof
TW412595B (en) Method of making sputter target/backing plate assembly
JP2006100770A (en) Manufacturing method of substrate base plate, substrate base plate and substrate using base plate
KR20180044435A (en) Method for bonding components of a sputtering target, a bonded assembly of sputtering target components and the use thereof
US20120228131A1 (en) Method for consolidating and diffusion-bonding powder metallurgy sputtering target
CN109664015B (en) Method for manufacturing target assembly
CN107511599A (en) The welding method of tantalum target component
JP3525348B2 (en) Manufacturing method of diffusion bonded sputtering target assembly
JPH06268115A (en) Manufacture of heat radiating substrate for semiconductor device
WO2022070880A1 (en) Sputtering target-backing plate assembly, production method therefor, and sputtering target recovery method
CN103492608A (en) Diffusion-bonded sputtering target assembly and method of manufacturing
JP2022104518A (en) Sputtering target-backing plate bonded body, method for manufacturing the same and method for collecting sputtering target
JP4017198B2 (en) Joining method of sputtering target and backing plate
WO2022070881A1 (en) Sputtering target-backing plate assembly, method for manufacturing the same, and sputtering target recovery method
TWI658885B (en) Coating source and process for producing the same
TW201925505A (en) Attaching and manufacturing method of target material capable of preventing the hot-melted solder from being overflowed due to the temperature during the post-sputtering process of target material
JP7024128B1 (en) Sputtering target-backing plate joint, its manufacturing method and recovery method of sputtering target
US20140014710A1 (en) Method For Hermetically Joining Ceramic Materials Using Brazing Of Pre-Metallized Regions
JP2022117405A (en) Joint body of sputtering target and backing plate, manufacturing method of the same, and recovery method of sputtering target
JPH0243362A (en) Joined body of sputtering target and backing plate
JP4803716B2 (en) Backing plate and manufacturing method thereof
JP2016078283A (en) Metal-resin composite and method for producing the same
JPH069907B2 (en) Method for producing composite material composed of graphite and metal

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 21875182

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 21875182

Country of ref document: EP

Kind code of ref document: A1