WO2022057978A1 - Vorrichtung, system und verfahren zur plasmaunterstützten chemischen gasphasenabscheidung - Google Patents
Vorrichtung, system und verfahren zur plasmaunterstützten chemischen gasphasenabscheidung Download PDFInfo
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- WO2022057978A1 WO2022057978A1 PCT/DE2021/100759 DE2021100759W WO2022057978A1 WO 2022057978 A1 WO2022057978 A1 WO 2022057978A1 DE 2021100759 W DE2021100759 W DE 2021100759W WO 2022057978 A1 WO2022057978 A1 WO 2022057978A1
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- process chamber
- workpiece carrier
- gas
- plasma
- workpiece
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
- H01J37/32724—Temperature
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
Definitions
- the present invention relates to an apparatus, a system and a method for plasma enhanced chemical vapor deposition.
- CVD chemical vapor deposition
- At least one gas is provided which contains the substance to be separated.
- the substance is deposited on the substrate through the course of a chemical reaction, which can be driven, for example, by temperature.
- Chemical vapor deposition can be used, for example, to produce microelectronic components or optical waveguides.
- the deposition rate can be further increased by generating a plasma based on the gas.
- the deposition reaction can be driven effectively even at lower temperatures.
- This variant of chemical vapor deposition is commonly referred to as plasma enhanced chemical vapor deposition (PECVD).
- reaction chambers In order to reach the required process temperature, workpiece carriers for carrying the substrates, for example semiconductor wafers, are usually introduced into a reaction chamber with heatable walls. Such reaction chambers are sometimes also referred to as warm-wall reactors.
- the heating typically takes place via resistance heating elements that are installed on or in the process chamber wall. It is an object of the present invention to further improve plasma-enhanced chemical vapor deposition, in particular to increase its efficiency.
- a device for plasma-enhanced chemical vapor deposition has a process chamber for accommodating at least one workpiece carrier. According to the invention, the device is set up to heat the process chamber using at least one workpiece carrier that can be accommodated by the process chamber, preferably up to a process temperature for gas phase deposition.
- Heating within the meaning of the invention is active heating, in which at least one component is used specifically for heating. Heating also includes only intermittent heating. When the process chamber is heated using at least one workpiece carrier, the workpiece carrier can be operated as a heating device, for example. In contrast, passive heating, for example via waste heat, is not heating within the meaning of the invention. Heating a process chamber by heating electrodes of a workpiece carrier as a result of plasma generation is therefore not heating within the meaning of the invention.
- One aspect of the invention is based on the approach of designing a device for plasma-enhanced chemical vapor deposition in such a way that a process chamber for accommodating at least one workpiece carrier can be actively heated exclusively via at least one accommodating workpiece carrier.
- the device can be designed in particular in such a way that the process chamber can be heated with the aid of the workpiece carrier independently of a process gas introduced into the process chamber and/or a vacuum generated in the process chamber.
- a vacuum within the meaning of the invention is characterized by a pressure below the air pressure acting on the device.
- a vacuum within the meaning of the invention denotes a negative pressure within the process chamber compared to the surroundings of the device, for example a pressure below essentially 1 bar.
- the device can therefore be set up, for example, to operate the workpiece carrier as a heating device. Due to the fact that the process chamber can be heated using a workpiece carrier accommodated therein, there is no need for a separate heating system for the device, for example in the form of heating elements installed in the area of the process chamber or a heating cassette. As a result, the device can be designed in a simpler way and can be manufactured at lower cost. In addition, the process chamber can be operated as a so-called "cold-wall reactor", which increases operational reliability. Furthermore, by dispensing with the separate heating system, unintentional heating of the process chamber when the workpiece carrier is not inserted can be avoided, or corresponding complex safety mechanisms that prevent heating only allow when the workpiece carrier is picked up.
- the device expediently has a control unit that is set up to control the heating of the process chamber with the aid of the at least one work piece carrier that can be accommodated.
- the control unit can be set up in particular to operate the at least one workpiece carrier held as a heating device.
- the control unit can be set up, for example, to connect the workpiece carrier to a current and/or voltage source, so that a heating current flows through at least part of the workpiece carrier.
- a heating current can be a low-frequency alternating current, for example an alternating current with a frequency of less than 1 kHz, preferably about 50 Hz.
- a part of the workpiece carrier, for example several electrodes connected in series, can serve as a heating resistor .
- the device has a switching device that is set up to selectively connect the at least one workpiece carrier accommodated by the process chamber to at least one heating voltage source or a plasma voltage source.
- the heater voltage The source is expediently set up to provide a low-frequency AC voltage for heating the process chamber, and the plasma voltage source is set up expediently to provide a high-frequency AC voltage for generating the plasma.
- a low-frequency AC voltage has a frequency of 1 kHz or less, for example 50 Hz
- a high-frequency AC voltage has a frequency of 1 kHz or more, for example 40 kHz.
- the switching device is preferably set up to selectively integrate the workpiece carrier accommodated by the process chamber into a plasma circuit for conducting high-frequency alternating current or at least one heating circuit for conducting low-frequency alternating current.
- the switching device can be set up to selectively switch the workpiece carrier accommodated by the process chamber into a single plasma circuit for conducting high-frequency alternating current for operation as a plasma device and into at least two, preferably parallel, heating circuits for conducting low-frequency alternating current for operation as a heating device to integrate.
- different operating modes of the at least one workpiece carrier can be implemented.
- the heating voltage source is set up, for example, to provide the low-frequency AC voltage with an effective voltage of 145 V and an effective current of more than 90 A, for example 120 A.
- the plasma voltage source is set up, for example, to provide the high-frequency AC voltage with an effective voltage of 800 V to 1000 V and an effective current of less than 90 A, for example 75 A
- the switching device has at least two switch arrangements are set up to interrupt electrically conductive connections from the at least one heating voltage source and the plasma voltage source to a power connection to which a workpiece carrier can be connected.
- the switch arrangements can be set up to interrupt electrical lines from the at least one heating voltage source or the plasma voltage source to contact pins, also referred to as current lances, of the power connection.
- Each of the switch arrangements can have at least one switch integrated into one of the lines.
- the control unit for controlling the heating of the process chamber using the at least one work piece carrier that can be accommodated is preferably part of the switching device.
- the control unit is expediently set up to control the at least two switch arrangements.
- the control unit can be set up, for example, to open or to close the switch arrangements.
- the control unit can be set up to disconnect the heating voltage source from the workpiece carrier and to connect the plasma voltage source to the workpiece carrier when a switching signal is present by appropriate activation of the switch arrangements.
- the switching signal can be, for example, a switching signal generated by a user and provided via a user interface.
- the switching signal can also be generated by the control unit, for example when the temperature of the workpiece carrier or its surroundings reaches or exceeds the process temperature.
- the control unit can be connected to a temperature sensor for determining or is set up at least for estimating the workpiece carrier or ambient temperature.
- the device has a power connection to which a workpiece carrier that can be accommodated by the process chamber can be connected.
- the power connection preferably includes at least four contact pins for making electrical contact with a workpiece carrier that can be accommodated in the process chamber.
- the contact pins can, for example, protrude from a wall of the process chamber and be arranged in such a way that they make contact with contact points provided for the electrical connection on the workpiece carrier when it is picked up by the process chamber.
- the contact pins are designed to engage in corresponding, preferably conical, bores on the workpiece carrier.
- the contact pins can slide into the bores when the workpiece carrier is inserted into the process chamber and thereby guide the contact pins into an intended position.
- a particularly reliable electrical connection of the workpiece carrier to the device can thus be achieved.
- the contact pins In order to be able to ensure minimal contact pressure of the contact pins when the at least one workpiece carrier is picked up from the process chamber, it is also conceivable for the contact pins to be spring-loaded within the process chamber.
- the contact pins are arranged in the area of a rear wall of the process chamber. Under a rear wall is the wall of the process chamber on one side which has at least one opening for lead the workpiece carrier in the process chamber opposite to understand.
- the contact pins are preferably arranged in such a way that the contact pins automatically contact the at least one workpiece carrier when picked up by the process chamber.
- the contact pins can be arranged, for example, in such a way that the contact pins come into contact with corresponding contact points of the workpiece carrier at the end of the insertion of the at least one workpiece carrier into the process chamber. This makes it easier to operate the device.
- an additional contacting step can be omitted, in which the at least one workpiece carrier that can be accommodated by the process chamber has to be actively connected to the device.
- the process chamber is set up to accommodate two workpiece carriers, in particular next to one another.
- the process chamber is expediently designed to be correspondingly wide for this purpose, namely at least twice as wide as an individual workpiece carrier.
- the process chamber can also have two power connections for separately connecting each workpiece carrier. Dimensioning the process chamber to accommodate two workpiece carriers allows the throughput to be increased.
- the process chamber has two closable openings arranged next to one another for introducing the at least one workpiece carrier into the process chamber.
- the two openings are through a stop web, for example, doors or Flaps can strike to close the openings, separated from each other. This means that two workpiece carriers can be inserted into the process chamber or removed from the process chamber independently of one another.
- the process chamber is of essentially rectangular design and set up to accommodate at least one workpiece carrier with an essentially rectangular cross section.
- the process space volume is optimally matched to the profile of the workpiece carrier.
- the dead volume in the process chamber can be minimized. This allows an optimal design of a gas discharge system, in particular of vacuum pumps, for generating a vacuum in the process chamber and enables a reduction in the consumption of process gas fed into the process chamber.
- the process chamber has at least one reflection device which is set up to reflect electromagnetic radiation, in particular thermal radiation in the infrared range of the electromagnetic spectrum, emitted by the at least one work piece carrier back onto the work piece carrier.
- the at least one reflection device can comprise, for example, a plurality of, preferably rectangular, metal sheets.
- the at least one reflection device allows an even more efficient operation of the device.
- the at least one reflection device can be used to reduce the time it takes for a predetermined process temperature to be reached in the process chamber, so that the throughput can be increased. At the same time, energy can also be saved.
- the several metal sheets expediently form a stack with which the electromagnetic radiation is reflected particularly effectively.
- the metal sheets can be made from different materials, each of which is particularly suitable for reflecting a specific wavelength. By stacking such metal sheets to form a reflection device, electromagnetic radiation can also be effectively reflected over a wide wavelength range.
- the process chamber has at least three reflection devices which are arranged essentially at right angles to one another such that when the workpiece carrier is received in the process chamber they are positioned above and along two opposite longitudinal sides of the workpiece carrier.
- the process chamber has at least three reflection devices which are arranged essentially at right angles to one another such that when the workpiece carrier is received in the process chamber they are positioned above and along two opposite longitudinal sides of the workpiece carrier.
- the device has a gas feed system for feeding process gas into the process chamber.
- the gas feed system preferably comprises several injectors.
- the injectors are expediently mounted above the workpiece carrier in the area of a ceiling of the process chamber for feeding in process gas when the workpiece carrier has been picked up. arranged so that the process gas can be fed in from above.
- the injectors can be built into the ceiling of the process chamber, for example.
- the multiple injectors are preferably distributed along the ceiling of the process chamber, for example in the form of an injector array.
- the plurality of injectors can be arranged in particular along an insertion direction in which the at least one workpiece carrier can be inserted into the process chamber.
- two parallel such rows of injectors arranged one behind the other are also conceivable in order to be able to introduce two different process gases.
- the injectors in each row are expediently connected in a fluid-conducting manner to one of two process gas supply lines and/or arranged in pairs next to an injector in the other row in order to enable equal distribution of the two different process gases.
- the injectors are preferably designed like nozzles for the targeted injection of the process gas.
- each of the injectors can be shaped, for example, in such a way that process gas can be blown into the process chamber in a jet shape, ie essentially in a straight line with only slight divergence.
- the process gas can be riding parts in which at least one component of the process gas is to be deposited on the surface of a workpiece carried by the workpiece carrier, for example between electrodes of the at least one workpiece carrier.
- the process gas that is fed in can be used particularly efficiently and the consumption of process gas can be reduced accordingly.
- the nozzle-like injectors are arranged in such a way that process gas can be blown in between a plurality of parallel electrodes of the at least one removable workpiece carrier. This can facilitate the generation of a plasma between the electrodes or enables the plasma to be generated even with small amounts of gas fed in.
- the gas that is fed in can thus flow in particular between the electrodes of the workpiece carrier and be sucked off underneath the at least one workpiece carrier that can be accommodated, without it first (unnecessarily) being distributed in the process chamber.
- the device has a gas evacuation system.
- the gas evacuation system preferably comprises a plurality of gas outlets which are arranged in the area of a floor of the process chamber for sucking off gas when the workpiece carrier has been picked up and below the workpiece carrier.
- the gas outlets can be designed, for example, as openings in the process chamber floor.
- the multiple gas outlets are preferably distributed along the floor of the process chamber, for example in the form of a gas outlet array.
- the several gas outlets can in particular be arranged along the direction of insertion.
- one gas outlet provided for each injector, in particular for each injector ejector pair of two parallel rows of injectors. This allows the process gas to be extracted homogeneously from the process chamber. This is particularly advantageous when the gas is fed in homogeneously via a number of injectors, since unwanted differences in concentration can be avoided.
- a system according to a second aspect of the invention for plasma-enhanced chemical vapor deposition has a device according to the first aspect of the invention for plasma-enhanced vapor deposition and a workpiece carrier, by means of which a process chamber of the device can be heated.
- the workpiece carrier is preferably designed to be insertable into the process chamber of the device, in particular to be received by the process chamber.
- the workpiece carrier is expediently designed as a heating device for operation by the device.
- the heating device can have, for example, several heating circuits formed by electrodes of the workpiece carrier.
- the electrodes preferably serve as heating resistors to which a low-frequency AC voltage can be applied.
- the workpiece carrier is also designed as a plasma device for operation by the device, with which a plasma can be generated in the process chamber.
- a plasma device for operation by the device, with which a plasma can be generated in the process chamber.
- at least two of the heating circuits can be insulated from one another and have electrodes adjacent to one another, so that a high-frequency alternating voltage can be applied between adjacent electrodes.
- a process chamber is heated, specifically, according to the invention, with the aid of at least one workpiece that can be accommodated in the process chamber or workpiece carrier.
- the process chamber can be actively heated by the workpiece or the workpiece carrier.
- a heating current in the form of a low-frequency alternating current is expediently conducted through the workpiece or the workpiece carrier, for example by applying a corresponding alternating voltage to the workpiece or the workpiece carrier.
- the AC voltage with a frequency of less than 1 kHz, for example 50 Hz can be applied to an electrode arrangement, in particular to a plurality of electrodes of the electrode arrangement that are electrically connected in series.
- the electrodes are expediently used as heating resistors. But it is also conceivable that the workpiece serves as a heating resistor. Due to the method according to the invention, it is not necessary to resort to conventional heating systems arranged in the area of the process chamber for heating the process chamber.
- separate heating devices can be omitted and, as a result, devices with more compact process chambers can be used.
- This also makes it possible to shorten a period of time that is necessary to reach a process temperature provided for gas phase deposition.
- the process complexity can be reduced with the process according to the invention. In individual applications, higher separation rates may also be possible.
- the workpiece carrier or the workpiece can be introduced into the process chamber, for example via rollers arranged in the process chamber.
- the workpiece carrier is preferably electrically connected to a switching device of the device, in particular automatically.
- the workpiece carrier can be pushed into the process chamber until contact points on the workpiece carrier are in the area of a rear wall contact pins arranged in the process chamber of a power connection of the device come into contact.
- the workpiece or the workpiece carrier is expediently operated as a plasma device after it has been heated.
- a high-frequency AC voltage with a frequency of 1 kHz or more, for example 40 kHz, can be applied to the workpiece or the workpiece carrier, in particular the electrodes. This allows the workpiece or the workpiece carrier to be used particularly efficiently.
- 1 shows an example of a device for plasma-enhanced gas phase deposition in a side view
- 2 shows an example of a system for plasma-enhanced chemical vapor deposition
- FIG. 4 shows an example of a method for plasma-enhanced chemical vapor deposition.
- FIG. 1 shows an example of a device 1 for plasma-enhanced gas phase deposition in a side view.
- the device 1 has a process chamber 2 for receiving at least one workpiece carrier through a closable opening 17, a gas feed system 3 for feeding at least one process gas into the process chamber 2 and a gas discharge system 4 for generating a vacuum in the process chamber 2 on.
- the device 1 is set up to heat the process chamber 2 using at least one workpiece carrier held by the process chamber 2 .
- the device 1 includes a power connection 5 for electrically connecting the workpiece carrier to the device 1 .
- the power connection 5 preferably has a plurality of contact pins 7, which are sometimes also referred to as power lances.
- the contact pins 7 are preferably arranged in such a way that a workpiece carrier introduced into the process chamber 2 comes into contact with the contact pins 7 on the rear wall 6 .
- the power connection 5 is preferably part of a switching device (see FIG. 3) of the device 1, which is designed for this purpose. is aimed at integrating at least one of the process chamber 2 receivable workpiece carrier for heating the process chamber 2 via the power connection 5 in at least one heating circuit for conducting low-frequency alternating current.
- the switching device can also be set up to integrate the workpiece carrier that can be accommodated via the power connection 5 into a plasma circuit for conducting a high-frequency alternating current in order to generate a plasma in the process chamber 2 .
- Rollers 8 are preferably arranged in the process chamber 2 for introducing the at least one workpiece carrier into the process chamber 2 .
- the rollers 8 can have a concave running surface, for example, through which the rails of the workpiece carrier are guided (see FIG. 2).
- the rollers 8 are arranged along an insertion direction E, in which the at least one workpiece carrier can be inserted into the process chamber 2 .
- the rollers 8 also enable the workpiece carrier to be precisely aligned in the process chamber 2 Reliably contact the end of the workpiece carrier that can be accommodated by the process chamber 2. For reasons of clarity, only one of the rollers 8 is provided with a reference number.
- the process chamber can be evacuated via the gas evacuation system 4 2 located gas can be sucked off.
- the gas discharge system 4 expediently has at least one vacuum pump 9 which, for example is connected to the process chamber 2 via gas discharge lines 10 .
- the gas discharge system 4 preferably has a plurality of gas outlets 11 which emanate from a base 12 of the process chamber 2 and open into the gas discharge lines 10 . Due to the number of multiple gas outlets 11, gas located in the process chamber 2 can be sucked out evenly.
- the uniform suction can be further improved by arranging the gas outlets 11 distributed over the floor 12 of the process chamber 2, for example as shown in Figure 1 in a row parallel to the direction of insertion E. For reasons of clarity, only one of the gas outlets 11 provided with a reference number.
- the at least one process gas can be introduced into the process chamber 2 using the gas feed system 3 .
- the gas feed system 3 has two gas feed lines 13 which can each be connected to a process gas supply, for example to a process gas tank or a process gas supply line.
- the gas supply system 3 preferably also has a plurality of injectors 14 which can blow process gases carried by the gas supply lines 13 into the process chamber 2 .
- the injectors 14, which are expediently arranged within the process chamber 2, in particular in the area of a cover 15 of the process chamber 2, can be connected to the gas supply lines 13 via injector supply lines 16, for example.
- injector supply lines 16 for example.
- only one of the injectors 14 and only one of the injector supply lines 16 is provided with a reference number.
- the plurality of injectors 14 are designed in a preferred manner nozzle-like and arranged such that of the two Process gases guided by gas supply lines 13 can be blown in a targeted manner into the process chamber 2, in particular in the direction of a workpiece carrier held by the process chamber 2.
- the injectors 14 can be lined up in the direction E of introduction, similar to the gas outlets 11 .
- all injectors 14 assigned to a gas supply line 13 and thus to a process gas preferably form a row of their own.
- the injectors 14 on the ceiling 15 of the process chamber 2 and the openings of the gas outlets 11 in the floor 12 of the process chamber 2 are opposite, this can maintain a homogeneous concentration of the process gas introduced in the process chamber 2 considerably easier.
- the resulting homogeneous process conditions can ensure that workpieces processed at the same time have uniform properties.
- the device 1 preferably has at least one reflection device 20 for reflecting electromagnetic radiation, in particular thermal radiation from the infrared range of the electromagnetic spectrum.
- the at least one reflection device 20 is preferably formed by stacked metal sheets.
- the multiple sheets of a stack can be made from different materials for reflecting radiation with different wavelengths, for example to be able to efficiently reflect thermal radiation over a wide wavelength range.
- a reflection device 20 is arranged on the ceiling 15 of the process chamber 2 , in particular parallel to the ceiling 15 , so that emissions are emitted from the workpiece carrier accommodated in the process chamber 2 in the direction of the ceiling 15 electromagnetic radiation is reflected back onto the workpiece carrier. As a result, the process chamber 2 can be heated up more quickly.
- the reflection device 20 preferably has bores in the form of passages through which the injectors 14 pass. It is also conceivable that, unlike in the example shown here, the injectors 14 end flush with the reflection device 20 .
- FIG. 2 shows a system 50 for plasma-assisted vapor deposition.
- the system 50 has a device 1 for plasma-enhanced gas phase deposition with a process chamber 2 from which at least one workpiece carrier 30 can be accommodated, and at least one workpiece carrier 30 .
- the device 1 is shown in FIG. 1 in a front view and is set up to heat the process chamber 2 using the at least one workpiece carrier 30 that is accommodated.
- the device 1 shown here is designed analogously to the device shown in FIG. 1, although the gas evacuation system is not shown for reasons of clarity. Components or groups that are covered by other components or groups are shown in dashed lines here.
- the process chamber 2 is set up to accommodate two workpiece carriers 30 next to one another, ie two workpiece carriers 30 lined up transversely to an insertion direction (see FIG. 1).
- the process chamber 2 expediently has two openings 17 arranged next to one another, which can be closed with the aid of doors 18.
- the example shown is only the shown in Figure 2 left door 18 and thus covers one of the openings 17.
- the right in Figure 2 door 18 is shown transparent.
- the two openings 17 are preferably separated from one another by a stop web 19 for the doors 18 .
- the process chamber 2 extends behind the stop web 19 but expediently behind both openings 17. This means that there is no gas separation between the two areas in which the workpiece carriers 30 are accommodated by the process chamber 2.
- the device 1 is preferably provided with rollers 8 arranged in the process chamber 2 in order to facilitate the introduction of the workpiece carrier 30 .
- the workpiece carriers 30 preferably have corresponding running rails 33 which can be guided over a concave running surface of the running rollers 8 .
- other guidance systems for guiding the workpiece carriers 30 in the process chamber 2 are also conceivable.
- the workpiece carriers 30 can also be provided with rollers that can roll on rails in the process chamber 2 .
- sliding elements can also be provided in order to save installation space compared to the variants with rollers.
- the process chamber 2 is preferably of rectangular design.
- rectangular workpiece carriers 30 can be accommodated efficiently, ie unused space, also referred to as dead volume, in the process chamber 2 can be avoided or at least reduced. This in turn makes it easier to create a vacuum in the process chamber 2 and can reduce the consumption of process gas.
- two gas feed lines 13 of a gas feed system 3 run above the process chamber 2.
- injector feed lines 16 branch off from each gas feed line 13 on two opposite sides, preferably in pairs. This allows a particularly uniform supply of process gas for each of the two workpiece carriers 30 accommodated by the process chamber 2.
- Injectors 14 connected to the injector supply lines 16 are preferably arranged in the region of a ceiling 15 of the process chamber 2 in such a way that two injectors 14 each can be used for inflating - sen different process gases for one of the recorded workpiece carrier 30 next to each other.
- trimethylamine TMA
- TMA trimethylamine
- SiH4 monosilane
- NH3 ammonia
- N2O dinitrogen monoxide
- CH4 methane
- more than two gas feed lines 13 with corresponding injector feed lines to other injectors are also conceivable in order to be able to feed in further process gases at the same time.
- at least one compound from a group consisting of monophosphane (PH3), diborane (B2H6) and dioxygen (O2) can be fed in as such further process gases.
- Two reflection devices 20 arranged in the process chamber 2 are also shown in FIG.
- Two of the reflection devices 20 are arranged in the area of the ceiling 15 of the process chamber 2, in particular above the workpiece carriers 30 when the workpiece carriers 30 are accommodated.
- Two further reflection devices 20 are in the area of side walls 21 of the process chamber 2, with workpiece carriers 30 being accommodated, in particular along a side surface of a workpiece. piece carrier 30 arranged.
- FIG. 3 shows an example of a switching device 22.
- the switching device 22 is preferably set up to operate a workpiece carrier 30 that can be accommodated by a process chamber of a device for plasma-assisted vapor deposition in a first operating mode as a heating device for heating the process chamber, and to operate the workpiece carrier 30 in one to operate the second operating mode as a plasma device for generating a plasma from at least one process gas fed into the process chamber.
- the switching device 22 expediently comprises a plurality of switch arrangements 23a, 23b, a plasma voltage source 24 for providing a high-frequency AC voltage in order to be able to generate a plasma, and at least one heating voltage source 25 for providing a low-frequency AC voltage for the process chamber to be able to heat.
- the switching device 22 is preferably designed in such a way that the workpiece carrier 30 is electrically contacted when the workpiece carrier 30 is picked up by the process chamber. This allows the switching device 22 selectively produce an electrical connection between the plasma voltage source 24 or the at least one heating voltage source 25 and the workpiece carrier 30 .
- the switching device 22 can have, for example, a power connection with a plurality of contact pins 7 arranged in the process chamber. With the help of the contact pins 7, for example, corresponding contact points 31 of the workpiece carrier 30 can be contacted. For reasons of clarity, only one of the contact points 31 and only one of the contact pins 7 is provided with a reference number.
- the switching device 22 is preferably set up to first electrically connect the at least one heating voltage source 25 to the workpiece carrier 30 that can be accommodated by the process chamber, for example by closing a first switch arrangement 23a.
- the switching device 22 can in particular be set up to integrate the workpiece carrier 30 into at least one heating circuit by establishing this electrical connection.
- the switching device 22 can, for example, be designed in such a way that when the first switch arrangement 23a (i) is closed, low-frequency electrical alternating current flows between two poles 25a, 25b of the at least one heating voltage source 25 through a first group of electrodes 32a of an electrode arrangement of the process chamber workpiece carrier 30 that can be picked up and (ii) low-frequency electrical alternating current flows between two further poles 25c, 25d of the at least one heating voltage source 25 through a second group of electrodes 32b of the electrode arrangement.
- the electrodes 32a, 32b of a group are each electrically connected in series. With the wiring shown in the example shown and the fact that two poles 54a and 54c are provided, four heating circuits are implemented here.
- the workpiece carrier 30 can therefore be operated as a heating device in a first operating mode.
- the switching device 22 is preferably also set up to separate the heating voltage source 25 from the workpiece carrier 30 that can be accommodated in the process chamber and to connect the plasma voltage source 24 electrically to the workpiece carrier 30 for this purpose, for example by opening the first switch arrangement 23a and closing a second one switch arrangement 23b.
- the switching device 22 can in particular be set up to integrate the workpiece carrier 30 into a plasma circuit by establishing this electrical connection.
- the switching device 22 can, for example, be designed in such a way that when the second switch arrangement 23b is closed, a high-frequency electrical alternating voltage is present between the electrodes 32a of the first group and the electrodes 32b of the second group.
- the switching device 22 can be designed in particular such that when the second switch arrangement 23b is closed, a first pole 24a of the plasma voltage source 24 can be connected to the electrodes 32a of the first group and a second pole 24b can be connected to the electrodes 32b of the second group.
- the workpiece carrier 30 can therefore be operated in a second operating mode as a plasma device.
- the corresponding control of the switch arrangements 23a, 23b can be carried out by a control unit, which is not shown in FIG. 3 for reasons of clarity.
- FIG. 4 shows an example of a method 100 for plasma-enhanced chemical vapor deposition.
- a workpiece carrier is preferably introduced into a process chamber of a device for plasma-enhanced chemical vapor deposition.
- the workpiece carrier can be pushed through an opening into the process chamber, for example via a guide system, for example rollers arranged in the process chamber.
- the workpiece carrier is preferably electrically connected to a switching device of the device.
- the workpiece carrier can be pushed into the process chamber until contact points on the workpiece carrier are in contact with contact pins of a power connection of the device arranged in the area of a rear wall of the process chamber.
- a vacuum is preferably generated in the process chamber in a further method step S2.
- gas located in the process chamber can be evacuated with the aid of a gas evacuation system, in particular via a number of gas outlets in the process chamber. be sucked off.
- the provision of several gas outlets, in particular the distribution of the gas outlets over the floor of the process chamber, allows particularly efficient evacuation of the process chamber.
- the process chamber is heated using the at least one workpiece carrier.
- the workpiece carrier can be integrated into at least one heating circuit for conducting low-frequency alternating current by the switching device.
- the workpiece carrier is preferably connected to at least one heating voltage source to provide a low-frequency AC voltage.
- a low-frequency electrical alternating current can be passed through at least part of the workpiece carrier, for example through a plurality of electrodes connected in series, so that the workpiece carrier heats up at least in sections.
- At least one process gas for example a silane such as SiH 4 , a trimethyl gas and/or nitrous oxide N 2 O, be fed into the process chamber.
- the at least one process gas can be blown into the process chamber in a homogeneously distributed manner, in particular via a number of injectors, which are preferably arranged in the area of a ceiling of the process chamber.
- the at least one heating voltage source is preferably separated from the at least one workpiece carrier that has been accommodated.
- the workpiece carrier can be integrated into a plasma circuit for conducting high-frequency alternating current by the switching device will.
- the workpiece carrier is preferably connected to a plasma voltage source to provide a high-frequency electrical alternating voltage.
- method steps S2 to S5 are not mandatory. Rather, it is conceivable that, as indicated in FIG. 4, method steps S2 and S3 are carried out simultaneously, at least at times. Likewise, method steps S4 and S5 can also be carried out simultaneously. In this case, method step S2 is preferably carried out, ie the vacuum generated is maintained until the desired deposition has been achieved on a workpiece carried by the workpiece carrier.
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Abstract
Description
Claims
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
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KR1020237009783A KR20230067625A (ko) | 2020-09-15 | 2021-09-14 | 플라즈마-강화 화학 기상 증착을 위한 장치, 시스템 및 방법 |
CA3192596A CA3192596A1 (en) | 2020-09-15 | 2021-09-14 | Device, system and method for plasma-enhanced chemical vapor deposition |
CN202180054410.2A CN117120667A (zh) | 2020-09-15 | 2021-09-14 | 用于等离子体辅助的化学气相沉积的设备、系统和方法 |
US18/245,390 US20230349046A1 (en) | 2020-09-15 | 2021-09-14 | Device, system and method for plasma-enhanced chemical vapor deposition |
JP2023516664A JP2023541623A (ja) | 2020-09-15 | 2021-09-14 | プラズマ強化化学気相堆積のための装置、システム及び方法 |
EP21786758.9A EP4214351A1 (de) | 2020-09-15 | 2021-09-14 | Vorrichtung, system und verfahren zur plasmaunterstützten chemischen gasphasenabscheidung |
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DE102020124030.9A DE102020124030B4 (de) | 2020-09-15 | 2020-09-15 | Vorrichtung, System und Verfahren zur plasmaunterstützten chemischen Gasphasenabscheidung |
DE102020124030.9 | 2020-09-15 |
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US (1) | US20230349046A1 (de) |
EP (1) | EP4214351A1 (de) |
JP (1) | JP2023541623A (de) |
KR (1) | KR20230067625A (de) |
CN (2) | CN114182234A (de) |
CA (1) | CA3192596A1 (de) |
DE (1) | DE102020124030B4 (de) |
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Citations (3)
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DE102015004352A1 (de) * | 2015-04-02 | 2016-10-06 | Centrotherm Photovoltaics Ag | Waferboot und Behandlungsvorrichtung für Wafer |
EP3422396A1 (de) * | 2017-06-28 | 2019-01-02 | Meyer Burger (Germany) GmbH | Vorrichtung zum transport eines substrats, behandlungsvorrichtung mit einer an einen substratträger einer solchen vorrichtung angepassten aufnahmeplatte und verfahren zum prozessieren eines substrates unter nutzung einer solchen vorrichtung zum transport eines substrats sowie behandlungsanlage |
DE102018109738B3 (de) * | 2018-04-23 | 2019-10-24 | Hanwha Q Cells Gmbh | Haltevorrichtung für Wafer, Verfahren zur Temperierung einer Haltevorrichtung und Vorrichtung zur Behandlung von Wafern |
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EP1540708A2 (de) | 2002-08-02 | 2005-06-15 | Wafermasters, Incorporated | Batch-ofen |
DE102008044024A1 (de) * | 2008-11-24 | 2010-05-27 | Robert Bosch Gmbh | Beschichtungsverfahren sowie Beschichtungsvorrichtung |
CN101748390A (zh) * | 2008-12-18 | 2010-06-23 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 加热装置及半导体加工设备 |
DE102016111234B4 (de) | 2016-06-20 | 2018-01-25 | Heraeus Noblelight Gmbh | Vorrichtung für die thermische Behandlung eines Substrats sowie Trägerhorde und Substrat-Trägerelement dafür |
DE102017208081B3 (de) * | 2017-05-12 | 2018-10-11 | centrotherm international AG | Kontaktierungsvorrichtung zur Verbindung eines Waferbootes mit einer elektrischen Leistungsversorgung |
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2020
- 2020-09-15 DE DE102020124030.9A patent/DE102020124030B4/de active Active
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2021
- 2021-01-21 CN CN202110084312.5A patent/CN114182234A/zh active Pending
- 2021-09-11 TW TW110133899A patent/TW202214907A/zh unknown
- 2021-09-14 CA CA3192596A patent/CA3192596A1/en active Pending
- 2021-09-14 JP JP2023516664A patent/JP2023541623A/ja active Pending
- 2021-09-14 KR KR1020237009783A patent/KR20230067625A/ko unknown
- 2021-09-14 EP EP21786758.9A patent/EP4214351A1/de active Pending
- 2021-09-14 CN CN202180054410.2A patent/CN117120667A/zh active Pending
- 2021-09-14 WO PCT/DE2021/100759 patent/WO2022057978A1/de unknown
- 2021-09-14 US US18/245,390 patent/US20230349046A1/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102015004352A1 (de) * | 2015-04-02 | 2016-10-06 | Centrotherm Photovoltaics Ag | Waferboot und Behandlungsvorrichtung für Wafer |
EP3422396A1 (de) * | 2017-06-28 | 2019-01-02 | Meyer Burger (Germany) GmbH | Vorrichtung zum transport eines substrats, behandlungsvorrichtung mit einer an einen substratträger einer solchen vorrichtung angepassten aufnahmeplatte und verfahren zum prozessieren eines substrates unter nutzung einer solchen vorrichtung zum transport eines substrats sowie behandlungsanlage |
DE102018109738B3 (de) * | 2018-04-23 | 2019-10-24 | Hanwha Q Cells Gmbh | Haltevorrichtung für Wafer, Verfahren zur Temperierung einer Haltevorrichtung und Vorrichtung zur Behandlung von Wafern |
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TW202214907A (zh) | 2022-04-16 |
EP4214351A1 (de) | 2023-07-26 |
US20230349046A1 (en) | 2023-11-02 |
CN117120667A (zh) | 2023-11-24 |
CN114182234A (zh) | 2022-03-15 |
KR20230067625A (ko) | 2023-05-16 |
CA3192596A1 (en) | 2022-03-24 |
JP2023541623A (ja) | 2023-10-03 |
DE102020124030B4 (de) | 2022-06-15 |
DE102020124030A1 (de) | 2022-03-17 |
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