WO2021172290A1 - Procédé d'analyse, dispositif d'analyse d'émission de lumière, tomographie optique diffuse, dispositif d'imagerie, dispositif de mesure de réflectivité, dispositif d'analyse et programme - Google Patents

Procédé d'analyse, dispositif d'analyse d'émission de lumière, tomographie optique diffuse, dispositif d'imagerie, dispositif de mesure de réflectivité, dispositif d'analyse et programme Download PDF

Info

Publication number
WO2021172290A1
WO2021172290A1 PCT/JP2021/006681 JP2021006681W WO2021172290A1 WO 2021172290 A1 WO2021172290 A1 WO 2021172290A1 JP 2021006681 W JP2021006681 W JP 2021006681W WO 2021172290 A1 WO2021172290 A1 WO 2021172290A1
Authority
WO
WIPO (PCT)
Prior art keywords
photon
photons
detection
analyzer
analysis
Prior art date
Application number
PCT/JP2021/006681
Other languages
English (en)
Japanese (ja)
Inventor
維信 松▲崎▼
太平 田原
石井　邦彦
Original Assignee
国立研究開発法人理化学研究所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 国立研究開発法人理化学研究所 filed Critical 国立研究開発法人理化学研究所
Priority to JP2022503618A priority Critical patent/JPWO2021172290A1/ja
Publication of WO2021172290A1 publication Critical patent/WO2021172290A1/fr

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/39—Non-linear optics for parametric generation or amplification of light, infrared or ultraviolet waves

Definitions

  • the present invention relates to an analysis method, a light emission analyzer, a diffuse tomography apparatus, an imaging apparatus, a reflectance measuring apparatus, an analyzer, and a program.
  • Patent Documents 1 and 2 Although the fields and application targets are different, research on the generation and utilization of quantum entangled photons is also progressing (for example, Patent Documents 1 and 2).
  • Japanese Patent Publication Japanese Patent Laid-Open No. 2008-216369 (published on September 18, 2008)
  • Japanese Patent Publication Japanese Patent Publication "Special Table 2012-522883 (published on September 27, 2012)”
  • the scale of the analyzer tends to be large, and the object may be damaged by irradiating the pulsed light. There is a problem. Further, in order to reduce damage to the object, it is conceivable to irradiate the object with continuous light, but such a method has a problem that it is difficult to specify the temporal characteristics of the object.
  • One aspect of the present invention has been made to solve the above-mentioned problems, and realizes a technique capable of analyzing the characteristics of an object including temporal characteristics while reducing damage to the object.
  • the purpose is to do.
  • the analysis method includes a generation step of generating a plurality of photons in a quantum entangled state with each other and a first detection of a first photon among the plurality of photons.
  • a detection step of 1 a second detection step of detecting a third photon obtained by irradiating or incident a second photon of the plurality of photons on an object, and a detection in the first detection step. It includes an analysis step of analyzing the characteristics of the object with reference to the difference between the timing and the detection timing in the second detection step.
  • the analyzer includes a generation unit that generates a plurality of photons in a quantum entangled state with each other, a first detection unit that detects a first photon among the plurality of photons, and the plurality of photons.
  • a second detection unit that detects a third photon obtained by irradiating or incident a second photon on an object, a detection timing by the first detection unit, and the second detection unit. It is provided with an analysis unit that analyzes the characteristics of the object with reference to the difference from the detection timing according to the above.
  • FIG. 5 is a block diagram showing an analysis unit included in the analyzer according to the first embodiment of the present invention together with a first detection unit and a second detection unit. It is a figure which shows the photon pair generated by the analyzer which concerns on Embodiment 1 of this invention, and is generated by spontaneous parametric downward transformation. It is a figure which shows the photon pair generated by the analyzer which concerns on Embodiment 1 of this invention, and is generated by spontaneous parametric downward transformation. It is a flowchart which shows the flow of processing by the analyzer which concerns on Embodiment 1 of this invention.
  • the analyzer according to the present embodiment uses one photon as a reference (reference) and another photon for irradiating or incident on an object (sometimes referred to as measurement) among a plurality of photons. It is a device that analyzes the characteristics of an object.
  • the analyzer 1 can be regarded as an example of a device generally called a TCSPC (Time-Correlated Single Photon Counting) device.
  • the plurality of photons according to the present embodiment are a plurality of single photons in a quantum entangled state with each other.
  • a plurality of single photons in a quantum entangled state are temporally synchronized with each other.
  • the plurality of photons according to the present embodiment are two single photons in a quantum entangled state with each other.
  • the analyzer according to the present embodiment among a plurality of photons, one photon is used as a reference and another photon is used for irradiating or incident on the object to analyze the characteristics of the object.
  • a plurality of photons in a quantum entangled state are generated at random timings. Therefore, unlike the case of using a pulse wave, a large number of photons are not irradiated to the object at the same time, and as a result, the characteristics of the object are analyzed while minimizing the damage to the object. be able to.
  • the analyzer there is no need for an apparatus for generating a pulse wave as compared with the case where a pulse wave is used, so that there is an advantage that the configuration of the entire apparatus can be simplified. There is also.
  • the property that two paired photons are temporally synchronized it is possible to directly measure the temporal characteristics of an object as in the case of using a pulse wave. Even when a plurality of components are present with respect to the temporal characteristics of the object (for example, when a plurality of fluorescence lifetime components are present), the measurement can be performed with only one continuous light source. Therefore, there is an advantage that it is not necessary to modulate the intensity of the light source each time.
  • FIG. 1 is a block diagram showing a configuration example of the analyzer 1 according to the present embodiment.
  • the analyzer 1 includes a light source 10, a first mirror 21, a first lens 22, a first bandpass filter 23-1, and a second bandpass filter 23-2.
  • the light source 10 generates a plurality of photons in a quantum entangled state with each other in time synchronization.
  • the light source 10 includes a continuous light source 11, a light source lens 12, and a crystalline substance 13.
  • the continuous light source 11 is, for example, a laser light source that produces a laser that is continuous light having a specific wavelength, but this is not limited to this embodiment.
  • the continuous light generated by the continuous light source 11 may be referred to as pump light. Further, the light source 10 may be referred to as a generation unit.
  • the crystalline substance 13 generates a plurality of photons in a quantum entangled state with each other in response to the incident of continuous light from the continuous light source 11.
  • the crystalline substance 13 produces two photons (photon pairs) that are in a quantum entangled state with each other.
  • the crystalline substance 13 generates photon pairs at random timings.
  • Non-linear optical crystals can be mentioned as an example of the crystalline substance 13, but this does not limit the present embodiment. Specific examples of the crystalline substance 13 will be described later.
  • the first mirror 21 directs the first photon of the plurality of photons supplied from the light source 10 along the first path, and secondly directs a second photon different from the first photon. Orient along the path of.
  • the specific configuration of the first mirror 21 is not limited to this embodiment, but it is preferably a configuration that preferably reflects the first photon and the second photon.
  • the first lens 22 refracts the first photon and the second photon, and as an example, as shown in FIG. 1, the first photon and the second photon propagate in parallel with each other. Orient the 1st photon and the 2nd photon.
  • the first bandpass filter 23-1 transmits photons having a first angular frequency among the first photons and blocks photons other than those having the first angular frequency. Further, the second bandpass filter 23-2 transmits photons having a second angular frequency among the second photons, and blocks photons other than those having the second angular frequency.
  • the first and second angular frequencies are the light source 10, the object 40, and the first detection under the condition that the sum of the two matches the angular frequency of the continuous light source 11.
  • Appropriate values may be appropriately selected according to the characteristics of the unit 50, the second detection unit 60, and the like.
  • the first photon travels along the first path, passes through the fourth lens 29, is detected by the first detection unit 50, and the detection signal is supplied to the analysis unit 70.
  • the second photon is reflected by the second mirror 24 and the third mirror 25, and then passes through the second lens 26 arranged on the second path. Then, the second photon transmitted through the second lens 26 is irradiated or incident on the object 40.
  • the object 40 emits a third photon in response to being irradiated or incident with the second photon.
  • the third photon may be the same photon as the second photon, or may be a photon different from the second photon, and the matter does not limit the present embodiment. Further, the third photon may be a plurality of single photons.
  • the emitted third photon passes through the fifth lens 30 after passing through the third lens 27 and the long pass filter 28.
  • the long-pass filter 28 transmits photons having an angular frequency equal to or lower than a specific third angular frequency among the third photons, and blocks other photons.
  • the third photon that has passed through the fifth lens 30 is detected by the second detection unit 60, and the detection signal is supplied to the analysis unit 70.
  • a single photon detector can be used as an example. More specifically, a one-photon application type avalanche photodiode can be used, but this does not limit the present embodiment.
  • the first photon reaches the first detection unit 50 and is detected without being irradiated or incident on the object 40.
  • the second photon is irradiated or incident on the object 40, and the third photon obtained accordingly reaches the second detection unit 60 and is detected.
  • the timing at which the third photon is detected by the second detection unit 60 is delayed from the timing at which the first photon is detected by the first detection unit 50.
  • the analysis unit 70 analyzes the characteristics of the object 40 by identifying and referring to this delay time. In other words, the analyzer 1 uses the detection timing of the first photon as a reference for analyzing the characteristics of the object 40.
  • the analysis unit 70 refers to the difference between the detection timing of the first photon by the first detection unit 50 and the detection timing of the third photon by the second detection unit 60, and refers to the object. It is a configuration for analyzing the characteristics related to 40.
  • the analysis unit 70 includes a first acquisition unit 71, a second acquisition unit 72, a first conversion unit 73, a second conversion unit 74, and a calculation unit 75. ..
  • the first acquisition unit 71 acquires the detection signal by the first detection unit 50, performs signal processing, and then supplies the detection signal to the first conversion unit 73.
  • the first conversion unit 73 amplifies the detection signal by the first detection unit 50, and supplies the amplified signal to the first conversion unit 73.
  • the second acquisition unit 72 has the same configuration as the first conversion unit 73, except that the detection signal to be acquired is the detection signal by the first detection unit 50.
  • the first conversion unit 73 converts the signal supplied from the first acquisition unit 71, and supplies the converted signal to the calculation unit 75.
  • the first conversion unit 73 converts the analog signal supplied from the first acquisition unit 71 into a digital signal, and supplies the converted digital signal to the calculation unit 75.
  • the second conversion unit 74 has the same configuration as the first conversion unit 73, except that the signal to be acquired is a signal supplied from the second acquisition unit 72.
  • the calculation unit 75 analyzes the characteristics of the object 40 with reference to the difference between the detection timing of the first photon by the first detection unit 50 and the detection timing of the third photon by the second detection unit 60. do. As shown in FIG. 1, the calculation unit 75 specifies a time difference that specifies a time difference between the detection timing of the first photon by the first detection unit 50 and the detection timing of the third photon by the second detection unit 60. The part 751 is provided.
  • the analyzer 1 configured as described above, among a plurality of photons in a quantum entangled state with each other, the first photon is detected without passing through the object 40, and the second photon is the object 40.
  • the third photon obtained by irradiating or incident on the object is detected with a delay time depending on the object as an example. Then, the analyzer 1 analyzes the characteristics of the object 40 with reference to the difference between the detection timing of the first photon and the detection timing of the third photon, so that the damage to the object is minimized. At the same time, the characteristics of the object can be suitably analyzed.
  • a plurality of photons in a quantum entangled state with each other in the present embodiment will be described in more detail. It should be noted that the following description exemplifies a plurality of photons generated by spontaneous parametric downward conversion in the crystalline substance 13 which is a nonlinear optical crystal as an example, but this is for illustration purposes only. ..
  • the “plurality of photons in a quantum entangled state with each other” in the present embodiment is not limited to those generated by using the crystalline substance 13 which is a nonlinear optical crystal, and is not limited to those produced by various production methods as described later. It may be generated.
  • FIG. 3 is a schematic diagram for explaining an example of generation of photon pairs by the crystalline substance 13.
  • pump light is supplied from the continuous light source 11 to the crystalline substance 13, and a part of the pump light is spontaneously parametric down-conversion (SPDC: Spontaneous Parametric Down-Conversion) in the crystalline substance 13. Is converted into two temporally synchronized single photons (one is also called signal light and the other is sometimes called idler light).
  • FIG. 3 illustrates a Type II SPDC in which the two photons have different polarizations.
  • the (angular frequency, wave vector) of the pump light is expressed as ( ⁇ P , k p ), and the (angular frequency, wave vector) of the two generated photons are ( ⁇ 1 , k 1), respectively.
  • ⁇ P ⁇ 1 + ⁇ 2 ⁇ ⁇ ⁇ (Equation 1)
  • k p k 1 + k 2 ⁇ ⁇ ⁇ (Equation 2) Is satisfied.
  • Equation 1 expresses the law of conservation of energy
  • Equation 2 expresses the law of conservation of momentum.
  • the angular frequency may be simply referred to as a frequency.
  • the two photons generated by the SPDC are paths on two cones that are symmetrically located with respect to the pump light and propagate along the path symmetrical with respect to the pump light. do.
  • FIG. 3 shows a photon pair A as an example of a plurality of photons in a quantum entangled state with each other, and a photon pair B as another example.
  • ⁇ >
  • ⁇ >
  • V and H represent vertically polarized light and horizontally polarized light, respectively, and the subscripts 1 and 2 of Kett
  • the photons A1 and A2 contained in the photon pair A are not entangled with each other in terms of polarization state.
  • FIG. 4 is a schematic diagram for explaining another example of generation of a photon pair by the crystalline substance 13.
  • FIG. 4 illustrates a Type I SPDC in which the polarizations of the two photons are equal to each other.
  • the (angular frequency, wave vector) of the pump light is expressed as ( ⁇ P , k p ), and the (angular frequency, wave vector) of the two generated photons are ( ⁇ 1 , k p, respectively). 1 )
  • the above-mentioned equations 1 and 2 are satisfied as in the case of FIG.
  • the two photons generated by the SPDC are paths on one cone about the pump light and propagate along a path symmetrical to the pump light.
  • Photon C1 and photon C2 contained in the above-mentioned photon pair C may be used as a plurality of photons in a quantum entangled state with each other used in the present embodiment.
  • Equation 8 Is a Dirac delta function, and it can be seen that due to the existence of this delta function, as shown in Equation 9, only the case where the energy conservation law shown in Equation 1 is satisfied needs to be considered.
  • Equation 9 the two-photon state
  • Such a state is expressed in the present specification as "entangled with each other in terms of frequency (angular frequency)".
  • Equation 14 can be rewritten as follows. Furthermore, if the time integral is expressed in sum, ... (Equation 16) To get. As can be seen from Equations 15 and 16, the two-photon state
  • the "plurality of photons in a quantum entangled state" used in the present embodiment is, for example, a plurality of photons that are entangled with each other in terms of frequency (angular frequency) or time.
  • the light source 10 is not limited to the configuration including the crystalline substance 13, but the configuration of the analyzer 1 can be made simpler by configuring the light source 10 to include the crystalline substance 13. There is a merit that it can be done.
  • the crystalline substance 13 is a non-linear optical crystal in which the crystal responds non-linearly to incident light and birefringence exists.
  • this does not limit this embodiment.
  • the crystalline substance 13 examples include BBO ( ⁇ -BaB 2 O 4 ), KDP (KH 2 PO 4 ), ppKTP (Periodically Polled KTIOPO 4 ), ppLN (Periodically Collected LiNbo 3 ) and the like. However, these specific examples do not limit the present embodiment.
  • type I and type II SPDCs may be used.
  • a BBO may be used to generate a photon pair with a type II SPDC
  • a BBO may be used to generate a photon pair with a type I SPDC.
  • the frequency of photon pairs generated by the crystalline substance 13 is not limited to this embodiment, but it may be set to several to several million times per second as an example by adjusting the intensity of the pump light. Can be done.
  • a substance obtained by reversing the spontaneous polarization in the lithium niobate (LiNbO 3 ) crystal in two different cycles may be used.
  • a quantum entangled state in which the polarization and frequency of the photon pair that can be generated in each region are alternately correlated is directly generated. be able to.
  • the photon pair generated in this way can also be used as "a plurality of photons in a quantum entangled state with each other" according to the present embodiment.
  • the configuration example of the light source 10 is not limited to the above example.
  • the light source 10 includes one of a Mach-Zehnder interferometer, a Michaelson-type interferometer, and a Sanyak-type interferometer instead of the crystalline material 13, and is quantum to each other by any of these interferometers. It may be configured to generate a plurality of entangled photons.
  • the third photon according to the present embodiment is obtained by irradiating or incident on the object 40 with the second photon.
  • the object 40 transitions to an excited state by absorbing a second photon in the object 40. Then, a third photon is emitted with the transition from the excited state to the lower energy state. In such an example, it is preferable to interpret that the third photon is a photon different from the second photon.
  • the interpretation that the second photon and the third photon are the same photon is preferably valid.
  • the third photon travels in a different direction from the second photon, and the time width of the photon wave packet may become wider while propagating in the fiber.
  • the physical properties of the second and third photons are generally not exactly the same. Therefore, in that sense, the interpretation that the second photon and the third photon are different photons is also valid.
  • whether the second photon and the third photon are the same or different depends on how the object 40 and the analyzer 1 are applied. It is a matter that includes an interpretation theory as to whether or not to interpret it, and is not essential.
  • FIG. 5 is a flowchart showing the flow of processing by the analyzer 1.
  • Step S11 First, in step S11, the light source 10 generates a plurality of photons in a quantum entangled state with each other.
  • the method already described may be used for the generation of photons by the light source 10.
  • step S12 the first detection unit 50 detects the first photon propagating in the first path among the plurality of photons in the quantum entangled state with each other generated in step S11.
  • step S13 the second detection unit 60 is obtained by irradiating or incident the second photon on the object 40 among the plurality of photons in the quantum entangled state with each other generated in step S11. Detects a third photon.
  • step S14 the analysis unit 70 analyzes the characteristics of the object 40 with reference to the difference between the detection timing by the first detection unit 50 in step S12 and the detection timing by the second detection unit 60 in step S13. do.
  • the first photon is detected without passing through the object 40, and the second photon irradiates or irradiates the object 40.
  • the third photon obtained by incident is detected with a delay time depending on the object as an example.
  • the analyzer 1 analyzes the characteristics of the object 40 with reference to the difference between the detection timing of the first photon and the detection timing of the third photon, so that the damage to the object is minimized. At the same time, the characteristics of the object can be suitably analyzed.
  • the case where the first photon is detected in step S12 and then the second photon is detected in step S13 has been given as an example, but this does not limit the present embodiment. ..
  • the second photon may be detected in step S13 before the first photon is detected in step S12. Such an example is also included in this embodiment.
  • the wave function collapse of the other photon may occur by detecting one of the first photon and the second photon first.
  • the analysis method and analyzer described in the present specification generate a plurality of photons in a quantum entangled state with each other as an example, and utilize the generated photons for spectroscopy (for example, molecular spectroscopy). doing.
  • spectroscopy for example, molecular spectroscopy
  • the use of quantum optical objects such as a plurality of photons in a quantum entangled state has been limited to the use in the category of quantum optics, and has not been applied to spectroscopy.
  • the inventor of the present application can come up with the invention described in the present specification only after obtaining a new finding that a quantum optical object called a plurality of photons in a quantum entangled state is applied to spectroscopy. It is an invention.
  • the analysis method and the analysis device described in the present specification have a highly interdisciplinary aspect of fusing two fields that cannot be easily linked even by those skilled in the art.
  • FIG. 6 is a block diagram showing the configuration of the luminescence analyzer 100 according to the present embodiment.
  • the luminescence analyzer 100 includes an analyzer 1a.
  • the analyzer 1a includes a calculation unit 75a instead of the calculation unit 75 included in the analysis device 1 described in the first embodiment.
  • Other configurations of the analyzer 1a are the same as those of the analyzer 1 according to the first embodiment.
  • the luminescence analyzer 100 is a device that analyzes the characteristics of the object 40 having luminescence.
  • the light emission includes fluorescence and phosphorescence (phosphorescence).
  • the luminescence analyzer 100 specifies the luminescence lifetime (for example, fluorescence lifetime, phosphorescence lifetime) of the object 40 as an example.
  • FIG. 7 is a block diagram showing a configuration of a calculation unit 75a included in the analyzer 1a.
  • the calculation unit 75a includes a time difference specifying unit 751 and a light emitting life specifying unit 752.
  • the light emission lifetime specifying unit 752 specifies the light emission life of the object 40 by referring to the detection timing of the first photon and the detection timing of the third photon specified by the time difference specifying unit 751.
  • step S13 of FIG. 5 a photon associated with the light emission phenomenon of the object 40 is detected as a third photon.
  • FIG. 8 plots the difference between the detection timing of the first photon and the detection timing of the third photon detected by the luminescence analyzer 100 in a situation where the object 40 is not arranged on the second path for comparison. This is the result of the experiment.
  • the difference (detection error) between the detection timing of the first photon and the detection timing of the third photon is about 0.23 ns. It is suppressed, and it can be seen that a high degree of simultaneity between the two photons is realized.
  • the detection error shown in FIG. 7 is mainly due to the time resolution of the first detection unit 50 and the second detection unit 60, and the light source 10 has a higher simultaneity than the simultaneity shown in FIG. Has been realized.
  • FIG. 9 shows a fluorescence attenuation curve specified by the emission lifetime specifying unit 752 when a dye molecule (Rhodamine 6G), which is a fluorescent molecule, is used as the object 40.
  • the fluorescence attenuation curve shown in FIG. 9 is a graph obtained by plotting the time difference specified by the time difference specifying unit 751 for each photon pair for a large number of photon pairs by the emission lifetime specifying unit 752.
  • the emission lifetime specifying unit 752 specifies that the fluorescence lifetime of the object 40 is 4.8 ns.
  • the luminescence analyzer 100 it is possible to suitably analyze the characteristics related to the luminescence phenomenon of the object 40 while minimizing the damage to the object 40.
  • the molecule is taken as an example of the object 40, but this does not limit the present embodiment, and the object 40 includes at least one of an atom, a molecule, a solid, and a crystal.
  • Can include.
  • the luminescence analyzer 100 it is possible to suitably analyze the characteristics of the object 40 regarding the luminescence phenomenon while minimizing the damage to the object 40.
  • FIG. 10 shows a configuration example of the diffused light tomography apparatus 200.
  • the diffused light tomography apparatus 200 includes an analyzer 1b.
  • the analyzer 1b includes a calculation unit 75b instead of the calculation unit 75 included in the analysis device 1 described in the first embodiment.
  • Other configurations of the analyzer 1b are the same as those of the analyzer 1 according to the first embodiment.
  • the diffused light tomography device 200 is a device that generates a tomographic image of a transparent object 40.
  • the object 40 is a substance having transparency, but the object 40 is not limited to a substance that transmits visible light, and a substance that transmits far ultraviolet rays and far infrared regions is also the object 40. include.
  • the second photon is incident on the object and the first photon is used as a reference.
  • the third photon according to the present embodiment is a photon obtained as a result of the second photon being repeatedly scattered in the object. It can be said that the third photon is a photon that has undergone repeated scattering processes in the object.
  • FIG. 11 shows the configuration of the calculation unit 75b included in the analyzer 1b of the diffused light tomography apparatus 200.
  • the calculation unit 75b includes a time difference specifying unit 751 and a tomography analysis unit 753.
  • the tomography analysis unit 753 refers to the detection timing of the first photon and the detection timing of the third photon specified by the time difference identification unit 751 and acquires information on how the photons are scattered in the object 40. do. Then, the tomography analysis unit 753 identifies the spatial distribution of the substance in the object 40 by analyzing the acquired information. Then, as an example, a tomographic image of an object showing a specified spatial distribution is generated.
  • step S13 of FIG. 5 a photon associated with the transmission phenomenon of the object 40 is detected as a third photon.
  • the diffused light tomography apparatus 200 can suitably perform diffused light tomography while suppressing damage to an object.
  • a device that generates pulsed light since there is no need for a device that generates pulsed light as in the prior art, there is an advantage that the configuration of the diffused light tomography device is simplified.
  • FIG. 12 shows a configuration example of the imaging device 300.
  • the imaging device 300 includes an analyzer 1c.
  • the analyzer 1c includes a calculation unit 75c instead of the calculation unit 75 included in the analysis device 1 described in the first embodiment.
  • Other configurations of the analyzer 1c are the same as those of the analyzer 1 according to the first embodiment.
  • the imaging device 300 is a device that generates imaging information in an imaging range including an object 40 having reflexivity.
  • the second photon is emitted toward the object, and the first photon is used as a reference.
  • the third photon according to the present embodiment is a photon obtained by reflecting the second photon by an object.
  • FIG. 13 shows the configuration of the calculation unit 75c included in the analyzer 1c of the imaging device 300.
  • the calculation unit 75c includes a time difference specifying unit 751 and an image generation unit 754.
  • the image generation unit 754 refers to the detection timing of the first photon and the detection timing of the third photon specified by the time difference specifying unit 751, and specifies the distance to the object 40 as a characteristic of the object 40. .. Then, based on the characteristic distance, the imaging information including the distance information to the object 40, which is the imaging information of the imaging range including the object 40, is generated.
  • step S13 of FIG. 5 a photon associated with the reflection phenomenon of the object 40 is detected as a third photon.
  • Lidar Light Imaging Detection and Ringing
  • scattered light with respect to laser irradiation is measured using pulsed light to analyze the distance to a target, the properties of the target, and the like. Since imaging information including distance information is generated using multiple single photons that are in a quantum entangled state with each other, it is possible to analyze the distance to the target, the properties of the target, etc. while reducing damage to the target. can.
  • the imaging information generated by the image generation unit 754 can be, for example, distance information and a two-dimensional captured image, but this does not limit the present embodiment.
  • the image generation unit 754 may be configured to generate a left-eye image and a right-eye image for stereoscopic viewing by referring to the distance information and the two-dimensional captured image.
  • an image for stereoscopic viewing is preferably generated while reducing damage to an object. be able to.
  • there is no need for a device that generates pulsed light as in the prior art there is an advantage that the configuration of the imaging device is simplified.
  • FIG. 14 shows a configuration example of the reflectance measuring device 400.
  • the reflectance measuring device 400 includes an analyzer 1d.
  • the analyzer 1d includes a calculation unit 75d instead of the calculation unit 75 included in the analysis device 1 described in the first embodiment.
  • Other configurations of the analyzer 1d are the same as those of the analyzer 1 according to the first embodiment.
  • the reflectance measuring device 400 is a device that analyzes the characteristics of the object 40 having reflectivity.
  • the object 40 is, for example, an optical fiber.
  • the second photon is incident on the object and the first photon is used as a reference.
  • the third photon according to the present embodiment is a photon obtained by transmitting or reflecting the second photon through an object.
  • the third photon may also include backscattered light obtained by incident of the second photon on the object.
  • FIG. 15 shows the configuration of the calculation unit 75d included in the analyzer 1d of the reflectance measuring device 400.
  • the calculation unit 75d includes a time difference specifying unit 751 and a reflectance measuring unit 755.
  • the reflectance measuring unit 755 detects the reflectivity of the object 40 by referring to the detection timing of the first photon and the detection timing of the third photon specified by the time difference specifying unit 751.
  • step S13 of FIG. 5 a photon associated with the reflection phenomenon of the object 40 is detected as a third photon.
  • the quality of an optical fiber is controlled by backscattered light or the like using pulsed light, but in this embodiment, a plurality of photons in a quantum entangled state are used. Since quality control is performed, damage to the object can be reduced as compared with the case of using pulsed light. In addition, since there is no need for a device that generates pulsed light as in the prior art, there is an advantage that the configuration of the reflectance measuring device is simplified.
  • the application examples of the analyzer described above in the present specification are not limited to the above examples.
  • the analyzer described above may be applied to the pump-probe method. More specifically, the object 40 may be excited by using the first photon, and the object may be observed by using the second photon as the probe light.
  • the analyzer according to this example irradiates the object 40, which is a molecule, with a first photon to initiate a photochemical reaction. Then, after a minute delay time (about femto seconds, pico seconds), the object 40 is irradiated with the second photon as probe light.
  • the analyzer according to this example can measure molecular absorption (infrared light, visible light, ultraviolet light region) and Raman scattering. According to the analyzer according to this example, it is possible to track the progress of the chemical reaction with a time resolution of about femtoseconds and picoseconds in this way.
  • the above-mentioned analyzer may be applied to the pump-dump-probe method.
  • the three photons in a quantum entangled state with each other used in the pump-dump-probe method can be obtained, for example, by the following method. That is, the analyzer is configured to include two nonlinear optical crystals. First, two photons (photon 1 and photon 2) in a quantum entangled state are incident on the first nonlinear optical crystal by SPDC. Call). Then, one of these two photons (for example, photon 1) is irradiated to the second nonlinear optical crystal, and the SPDC in the second nonlinear optical crystal converts it into two photons (referred to as photon 3 and photon 4). do.
  • the three photons (photon 2, photon 3, and photon 4) thus obtained are in a quantum entangled state with each other and are synchronized in time.
  • the analyzer according to this example excites the object 40 by irradiating the object 40, which is a molecule, with the first photon of the three photons in a quantum entangled state with each other.
  • a molecule in a high electron excited state has an equilibrium internuclear distance different from that in the ground state, so that the nuclear wave packet is given momentum and starts to move.
  • the analyzer according to this example irradiates the object 40 with the second photon of the above three photons to dump the wave packet to the ground state.
  • the analyzer according to this example irradiates the object 40 with the third photon of the above three photons as the probe light.
  • the analyzer according to this example determines, for example, the deexcitation efficiency of the object 40, which is a molecule, and the dump light irradiation timing dependence of the deexcitation efficiency. Can be identified. It has been impossible to perform pump-dump-probe measurement using continuous light as a light source, but by using the above-mentioned analyzer, continuous light can be used as a light source by converting it into three entangled photons. Allows pump-dump-probe measurements.
  • the control block of the analyzer 1 (particularly the analyzer 70, the arithmetic unit 75, 75a, 75b, 75c, 75d) may be realized by a logic circuit (hardware) formed in an integrated circuit (IC chip) or the like. , May be realized by software.
  • the analyzer 1 includes a computer that executes the instructions of a program that is software that realizes each function.
  • the computer includes, for example, one or more processors and a computer-readable recording medium that stores the program. Then, in the computer, the processor reads the program from the recording medium and executes it, thereby achieving the object of the present invention.
  • the processor for example, a CPU (Central Processing Unit) can be used.
  • the recording medium in addition to a “non-temporary tangible medium” such as a ROM (Read Only Memory), a tape, a disk, a card, a semiconductor memory, a programmable logic circuit, or the like can be used.
  • a RAM RandomAccessMemory
  • the program may be supplied to the computer via an arbitrary transmission medium (communication network, broadcast wave, etc.) capable of transmitting the program.
  • a transmission medium communication network, broadcast wave, etc.
  • one aspect of the present invention can also be realized in the form of a data signal embedded in a carrier wave, in which the above program is embodied by electronic transmission.
  • the analysis method includes a generation step of generating a plurality of photons in a quantum entangled state with each other, a first detection step of detecting a first photon among the plurality of photons, and the plurality of photons.
  • the analysis step it is preferable to use the detection timing of the first photon as a reference for analyzing the characteristics of the object.
  • the detection timing of the first photon is used as a reference for the analysis of the characteristics related to the object, the characteristics of the object including the temporal characteristics can be analyzed more preferably.
  • the generation step it is preferable to generate the first photon and the second photon using a nonlinear optical crystal.
  • the characteristics of the object can be detected with a simple configuration.
  • the analysis method it is preferable to detect the first photon and the third photon using a single photon detector in the first detection step and the second detection step.
  • the characteristics of the object including the temporal characteristics can be suitably detected.
  • the luminescence analyzer is a luminescence analyzer that executes the above analysis method, and in the second detection step, a photon associated with a luminescence phenomenon of the object is detected as the third photon. It is preferable to do so.
  • the characteristics of the luminescence phenomenon of the object can be suitably analyzed.
  • the object contains at least one of an atom, a molecule, a solid, and a crystal.
  • the characteristics of the luminescence phenomenon of atoms, molecules, solids, and crystals can be suitably analyzed.
  • the diffused light tomography device is a diffused light tomography device that executes the above analysis method, and in the second detection step, the transmitted light transmitted through the object is used as the third photon. It is preferable to detect it.
  • the transmitted light transmitted through the object is detected as the third photon, so that the diffused light tomography can be preferably performed.
  • the imaging device is an imaging device that executes the above analysis method, and detects the reflected light reflected by the object as the third photon in the second detection step. Is preferable.
  • the image pickup apparatus since the reflected light reflected by the object is detected as the third photon, it is possible to suitably generate imaging information reflecting the temporal characteristics of the object.
  • the reflectance measuring device is a reflectance measuring device that executes the above analysis method, and in the second detection step, the light emitted from the optical fiber that is the object is emitted from the third. It is preferable to detect it as a photon.
  • the reflectance measuring device the light emitted from the optical fiber is detected as the third photon, so that the reflectance measurement can be suitably performed.
  • the analyzer includes a generation unit that generates a plurality of photons in a quantum entangled state with each other, a first detection unit that detects a first photon among the plurality of photons, and the plurality of photons.
  • a second detection unit that detects a third photon obtained by irradiating or incident a second photon on an object, a detection timing by the first detection unit, and the second detection unit. It is preferable to have an analysis unit that analyzes the characteristics of the object with reference to the difference from the detection timing according to the above.
  • the program according to one aspect of the present invention is a program for operating a computer as the analysis device, and it is preferable that the computer functions as the analysis unit. According to the above program, the same effect as that of the above method and apparatus is obtained.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Selon la présente invention, les caractéristiques d'un objet comprenant des caractéristiques temporelles sont analysées tout en réduisant l'endommagement de l'objet. Un procédé d'analyse comprend une étape de génération consistant à générer une pluralité de photons, une première étape de détection consistant à détecter un premier photon parmi la pluralité de photons, une seconde étape de détection consistant à détecter un second photon parmi la pluralité de photons, et une étape d'analyse consistant à analyser des caractéristiques se rapportant à un objet en référence à la différence temporelle d'une détection effectuée dans la première étape de détection et la seconde étape de détection.
PCT/JP2021/006681 2020-02-26 2021-02-22 Procédé d'analyse, dispositif d'analyse d'émission de lumière, tomographie optique diffuse, dispositif d'imagerie, dispositif de mesure de réflectivité, dispositif d'analyse et programme WO2021172290A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022503618A JPWO2021172290A1 (fr) 2020-02-26 2021-02-22

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020030796 2020-02-26
JP2020-030796 2020-02-26

Publications (1)

Publication Number Publication Date
WO2021172290A1 true WO2021172290A1 (fr) 2021-09-02

Family

ID=77490480

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2021/006681 WO2021172290A1 (fr) 2020-02-26 2021-02-22 Procédé d'analyse, dispositif d'analyse d'émission de lumière, tomographie optique diffuse, dispositif d'imagerie, dispositif de mesure de réflectivité, dispositif d'analyse et programme

Country Status (2)

Country Link
JP (1) JPWO2021172290A1 (fr)
WO (1) WO2021172290A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116593138A (zh) * 2023-07-19 2023-08-15 广州市虹烨光电有限公司 一种光学扩散片检测设备及其检测方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH055698A (ja) * 1990-08-15 1993-01-14 Hitachi Ltd 光計測装置および光学的計測方法
US20160356917A1 (en) * 2015-06-08 2016-12-08 Halliburton Energy Services, Inc. Chemical sensing using quantum entanglement between photons
US20170153435A1 (en) * 2009-03-13 2017-06-01 Robert Alfano Supercontinuum microscope for resonance and non-resonance enhanced linear and nonlinear images and time resolved microscope for tissues and materials
US20170371105A1 (en) * 2016-06-27 2017-12-28 The Governing Council Of The University Of Toronto System and method for dispersion-enabled quantum state control of photons

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5796477A (en) * 1997-02-27 1998-08-18 Trustees Of Boston University Entangled-photon microscopy, spectroscopy, and display
JP4249103B2 (ja) * 2003-08-08 2009-04-02 オリンパス株式会社 蛍光寿命測定装置
DE102011055945A1 (de) * 2011-12-01 2013-06-06 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Untersuchen einer Probe
JP7431429B2 (ja) * 2019-09-02 2024-02-15 学校法人日本大学 分光画像生成装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH055698A (ja) * 1990-08-15 1993-01-14 Hitachi Ltd 光計測装置および光学的計測方法
US20170153435A1 (en) * 2009-03-13 2017-06-01 Robert Alfano Supercontinuum microscope for resonance and non-resonance enhanced linear and nonlinear images and time resolved microscope for tissues and materials
US20160356917A1 (en) * 2015-06-08 2016-12-08 Halliburton Energy Services, Inc. Chemical sensing using quantum entanglement between photons
US20170371105A1 (en) * 2016-06-27 2017-12-28 The Governing Council Of The University Of Toronto System and method for dispersion-enabled quantum state control of photons

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116593138A (zh) * 2023-07-19 2023-08-15 广州市虹烨光电有限公司 一种光学扩散片检测设备及其检测方法
CN116593138B (zh) * 2023-07-19 2023-09-19 广州市虹烨光电有限公司 一种光学扩散片检测设备及其检测方法

Also Published As

Publication number Publication date
JPWO2021172290A1 (fr) 2021-09-02

Similar Documents

Publication Publication Date Title
Parzuchowski et al. Setting bounds on entangled two-photon absorption cross sections in common fluorophores
JP5329449B2 (ja) 顕微鏡イメージングを実行する方法
JP4280654B2 (ja) マルチチャンネルテラヘルツ波スペクトル測定法及び測定装置
JP6692103B2 (ja) テラヘルツ画像の高コントラスト／準リアルタイム取得用のシステム及び方法
JP5736325B2 (ja) 光学装置
US8693004B2 (en) Dual-etalon cavity ring-down frequency-comb spectroscopy with broad band light source
US20120287428A1 (en) Nonlinear raman spectroscopic apparatus, microspectroscopic apparatus, and microspectroscopic imaging apparatus
US9494522B2 (en) Device and method for stimulated Raman detection
US8207501B2 (en) Apparatus and method for measuring terahertz wave
US10267739B2 (en) Laser system for standoff detection
JP6073484B2 (ja) Ｃａｒｓ顕微鏡
KR102414411B1 (ko) 원자 앙상블에서 주파수 간격 얽힘과 편광 얽힘 광자쌍 생성 시스템 및 생성 방법
US8064064B2 (en) Apparatus and method for obtaining images using coherent anti-stokes Raman scattering
NL2021205B1 (en) Method and system for performing terahertz near-field measurements
WO2021172290A1 (fr) Procédé d'analyse, dispositif d'analyse d'émission de lumière, tomographie optique diffuse, dispositif d'imagerie, dispositif de mesure de réflectivité, dispositif d'analyse et programme
Ito et al. Invited article: Spectral focusing with asymmetric pulses for high-contrast pump–probe stimulated raman scattering microscopy
Masters et al. On the simultaneous scattering of two photons by a single two-level atom
US9829379B2 (en) Two-dimensional spectroscopy system and two-dimensional spectroscopic analysis method
US9897536B2 (en) Differential infra red nanoscopy system and method
Sparapassi et al. Transient measurement of phononic states with covariance-based stochastic spectroscopy
Gomidze et al. To the problems of fluorescence excitation spectrums
Martin Coherent Spectroscopy at the Diffraction Limit
Khajisvili et al. 3D fluorescence spectroscopy of liquid media via internal reference method
JP2013174513A (ja) 電磁波検出方法及び電磁波検出装置
Barak et al. Measuring dispersion of biphotons

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 21759896

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2022503618

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 21759896

Country of ref document: EP

Kind code of ref document: A1