WO2021169713A1 - 一种非线性光学泵浦探测装置及非线性光学吸收截面测量方法 - Google Patents

一种非线性光学泵浦探测装置及非线性光学吸收截面测量方法 Download PDF

Info

Publication number
WO2021169713A1
WO2021169713A1 PCT/CN2021/073912 CN2021073912W WO2021169713A1 WO 2021169713 A1 WO2021169713 A1 WO 2021169713A1 CN 2021073912 W CN2021073912 W CN 2021073912W WO 2021169713 A1 WO2021169713 A1 WO 2021169713A1
Authority
WO
WIPO (PCT)
Prior art keywords
lens
optical
degenerate
collection system
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2021/073912
Other languages
English (en)
French (fr)
Inventor
周志强
丛嘉伟
佟艳群
陈明阳
吕柳
符永宏
任乃飞
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu University
Original Assignee
Jiangsu University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from CN202010127319.6A external-priority patent/CN111220572B/zh
Priority claimed from CN202010127302.0A external-priority patent/CN111308654B/zh
Priority claimed from CN202010127320.9A external-priority patent/CN111220573B/zh
Application filed by Jiangsu University filed Critical Jiangsu University
Priority to US17/781,003 priority Critical patent/US11719629B2/en
Priority to GB2219709.9A priority patent/GB2611908B/en
Publication of WO2021169713A1 publication Critical patent/WO2021169713A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/023—Catoptric systems, e.g. image erecting and reversing system for extending or folding an optical path, e.g. delay lines
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0668—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror having non-imaging properties
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
    • G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
    • G02B19/0009—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only
    • G02B19/0014—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only at least one surface having optical power
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/144—Beam splitting or combining systems operating by reflection only using partially transparent surfaces without spectral selectivity
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces
    • G02B27/146—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces with a tree or branched structure
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/005—Diaphragms
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B2207/00—Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
    • G02B2207/114—Two photon or multiphoton effect
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/205—Neutral density filters

Definitions

  • the invention relates to a non-linear optical performance measuring device and method, belonging to the field of non-linear optics and optical detection.
  • Non-linear optical materials have obtained a large number of practical applications in the fields of optical switches, all-optical devices, high-speed optoelectronic devices, high-power laser devices, laser protection and optical limiting.
  • the study of optical nonlinearities of materials is a hot topic in materials science and related fields.
  • Optical nonlinear measurement technology is one of the key technologies in the study of nonlinear optical materials. It is very important to understand the optical nonlinear mechanism of the material and how to accurately determine the important physical parameters of the material for how to apply the material.
  • the commonly used optical nonlinear measurement techniques include degenerate four-wave mixing, three-wave mixing, third harmonic method, nonlinear interferometry, nonlinear ellipsometry, Mach-Zehnder interferometry, 4f phase coherent imaging, Z scan method and so on.
  • Z scanning method see SHEIK-BAHAE, M.; SAID, AA; WEI, TH; HAGAN, DJ; STRYLAND, EWV, Sensitive measurement of optical nonlinearities using a single beam. IEEE J. Quantum Electron. 1990, 26(4) ), 760-769.
  • Z scanning method see SHEIK-BAHAE, M.; SAID, AA; WEI, TH; HAGAN, DJ; STRYLAND, EWV, Sensitive measurement of optical nonlinearities using a single beam. IEEE J. Quantum Electron. 1990, 26(4) ), 760-769.
  • the traditional Z-scan method usually uses a single-wavelength laser, which can only obtain the optical nonlinear characteristics of nonlinear photonics materials at a specific wavelength, and the information that can be provided is very limited.
  • the optical nonlinearity research of nonlinear photonics materials needs to understand the optical nonlinear characteristics of the materials in a wide wavelength range.
  • the traditional nonlinear spectral characteristic measurement devices cannot meet the requirements.
  • the nonlinear optical effect is that under the action of the high-intensity optical field E(r,t) of the laser, the medium will not only produce the linear electric polarization intensity P (1) (r ,t), it will also produce the nonlinear electric polarization intensity P NL (r,t) which is a power relationship with the incident photoelectric field, which can include the second, third and higher power terms of the photoelectric field intensity.
  • P (1) linear electric polarization intensity
  • P NL (r,t) which is a power relationship with the incident photoelectric field, which can include the second, third and higher power terms of the photoelectric field intensity.
  • the most important physical quantity describing the relationship between the electric polarization intensity P(r,t) of the medium and the photoelectric field intensity E(r,t) is the optical polarizability.
  • the polarization of the medium there can be linear optical susceptibility ⁇ (1) and nonlinear optical susceptibility ⁇ (2) , ⁇ (3), etc. They are second, third, and fourth-order complex tensors, reflecting the influence of the medium on the photoelectric
  • the different responses of the field also directly determine the various nonlinear optical effects produced. Its real part determines the linear (non-linear) refractive index of the medium, and its imaginary part determines the linear (non-linear) absorption of the medium.
  • the non-linear absorption of the medium is directly related to the energy level distribution inside the medium. Take the third-order nonlinear effect as an example.
  • Two-photon absorption refers to the process in which a substance molecule absorbs two photons at the same time and transitions from the ground state to the excited state.
  • D-TPA Degenerate two-photon absorption
  • non-degenerate two-photon absorption Compared with degenerate two-photon absorption, non-degenerate two-photon absorption has a smaller absorption area, a larger absorption coefficient and a wider spectral range.
  • it can be used in infrared detection, quantum Counting, optical sampling, and two-color two-photon fluorescence microscopy imaging play an important role.
  • most of the measurement methods can only measure one of degenerate two-photon absorption or non-degenerate two-photon absorption, and the efficiency is low, only single wavelength can be measured point by point, which brings great significance to related research and applications. Great difficulty.
  • the present invention provides a nonlinear optical pumping detection device.
  • the device can simultaneously measure degenerate and non-degenerate two-photon absorption cross-section spectra.
  • the measurement process is automated, and the measurement process is efficient and fast.
  • the working band of the invention is from 380nm to 1064nm near infrared, which can realize the non-linear performance measurement of supercontinuum wide spectrum.
  • the zoom optical system with a larger entrance pupil diameter is used as the weak signal collection lens, which can effectively extract the weak signal from the background noise.
  • the root mean square diameter of the image point on the axis of the zoom optical system is 100 micrometers to 150 micrometers.
  • the divergence angle 2 ⁇ of the upper image point is 30.6 degrees, which matches the fiber coupling conditions well, and improves the coupling efficiency of spatial light coupling into the fiber.
  • the measurement sensitivity of the system is greatly improved.
  • a nonlinear optical pump detection device including a main optical path, a non-degenerate detection system, a non-degenerate excitation system, a degenerate detection system, and a reference system;
  • the main optical path sequentially includes a laser, a first aperture diaphragm, a chopper, a first polarizer, a second polarizer, a first reflector, and a first laser beam splitter;
  • the non-degenerate detection system sequentially includes a second reflector, a first adjustable attenuator, a first converging lens, a heavy tank, a second aperture diaphragm, a neutral filter, a second converging lens, and a second laser beam splitter , A third convergent lens, a sample to be tested, a first optical signal collection system, the first optical signal collection system is connected to an optical multi-channel analyzer via an optical fiber, and the optical multi-channel analyzer is connected to a computer;
  • the non-degenerate excitation system sequentially includes a second adjustable attenuator, a third mirror, a fourth mirror, a fifth mirror, a sixth mirror, a seventh mirror, an eighth mirror, a ninth mirror, and a third mirror.
  • the degenerate detection system sequentially includes a third laser beam splitter, a prism, a fifth converging lens, a sample to be tested, and a second optical signal collection system.
  • the second optical signal collection system is connected to the optical multi-channel analysis via an optical fiber.
  • the optical multi-channel analyzer is connected to the computer;
  • the reference system in turn includes a tenth mirror, a sample to be tested, and a third optical signal collection system.
  • the third optical signal collection system is connected to the optical multichannel analyzer via an optical fiber, and the optical multichannel analyzer Connected to the computer;
  • the third reflector, fourth reflector, seventh reflector and eighth reflector are installed on a high-performance linear translation stage.
  • the first adjustable attenuator sheet, the second adjustable attenuator sheet, the first converging lens, the second converging lens, the third converging lens, the fourth converging lens, the fifth converging lens, the optical power meter, and the first optical signal The collection system, the second optical signal collection system, the third optical signal collection system, and the high-performance linear translation stage are all directly connected to the computer through a control line.
  • the diameter of the first aperture diaphragm is 5mm, the diameter of the second aperture diaphragm is 10mm; the adjustable range of the chopper frequency is 4HZ to 10KHZ; the polarization direction of the second polarizer is Horizontal; the first mirror, the second mirror, the third mirror, the fourth mirror, the fifth mirror, the sixth mirror, the seventh mirror, and the eighth mirror are all aligned with the main optical axis 45°; the first laser beam splitter, the second laser beam splitter, and the third laser beam splitter are all 45° with the main optical axis; the first laser beam splitter has a transmittance of 10% and a reflectance of 90 %; The second laser beam splitter has a transmittance of 50% and a reflectivity of 50%; the third laser beam splitter has a transmittance of 10% and a reflectivity of 90%; the first converging lens, The focal length of the second converging lens, the third converging lens, and the fifth converging lens are all 10 cm, and the focal length of
  • the first optical signal collection system, the second optical signal collection system, and the third optical signal collection system are identical optical systems.
  • the optical system sequentially includes a first lens, a second lens, a third lens, a fourth lens, a fifth lens, a sixth lens, a seventh lens, an eighth lens, a ninth lens, a tenth lens, and an eleventh lens.
  • the first lens is provided with an aperture stop
  • the first lens is a positive lens
  • the second lens is a negative lens
  • the third lens is a positive lens
  • the fourth lens is a positive lens
  • the fifth lens is a negative lens
  • the sixth lens is a positive lens
  • the seventh lens is a negative lens
  • the eighth lens is a negative lens
  • the ninth lens is a positive lens
  • the tenth lens is a positive lens
  • the eleventh lens is a negative lens
  • the twelfth lens is a positive lens
  • the thirteenth lens is a positive lens
  • the first lens is a meniscus concave lens
  • the second lens is a meniscus concave lens
  • the third lens is a biconvex lens
  • the fourth lens is a biconvex lens
  • the fifth lens is a biconcave lens
  • the sixth lens is a biconvex lens
  • the seventh lens is a biconvex lens.
  • the lens is a double concave lens
  • the eighth lens is a meniscus concave lens
  • the ninth lens is a double convex lens
  • the tenth lens is a meniscus concave lens
  • the eleventh lens is a meniscus concave lens
  • the twelfth lens is a double convex lens
  • the tenth lens is a concave meniscus lens.
  • the three lenses are concave meniscus lenses;
  • the second lens and the third lens form a cemented lens, and the cemented surface of the double cemented lens faces the aperture stop;
  • the fourth lens and the fifth lens form a cemented lens, and the cemented surface of the double cemented lens faces away from the aperture stop;
  • the eighth lens and the ninth lens form a cemented lens, and the cemented surface of the double cemented lens faces the aperture stop;
  • the tenth lens and the eleventh lens form a cemented lens, and the cemented surface of the double cemented lens faces away from the aperture stop ;
  • the eleventh lens, the twelfth lens, and the thirteenth lens are all aspherical lenses; the first lens, the second lens, the third lens, the fourth lens, the fifth lens, the sixth lens, and the seventh lens The lens, the eighth lens, the ninth lens, and the tenth lens are all spherical lenses;
  • the combined focal length of the first lens, the second lens, the third lens, the fourth lens, the fifth lens and the sixth lens is f1-6, and the focal length of the seventh lens is f7; and 1.5 ⁇ f1-6/f7 ⁇ 3;
  • the transparent aperture of the first lens is D1, and 45 ⁇ D1 ⁇ 55;
  • the lens material uses Schott’s glass material, the first lens is SF6, the second lens is SF5, the third lens is NLAF34, the fourth lens is NLASF9, the fifth lens is NSF56, the sixth lens is NLAK34, and the seventh lens is SF57, the eighth lens is SF2, the ninth lens is NLAF21, the tenth lens is NLAF21, the eleventh lens is SF2, the twelfth lens is PPK53, and the thirteenth lens is SF5G10;
  • the air gap between the sample to be tested and the first lens is variable, and the range is from 50 to 200 mm;
  • the central thickness of the first lens is 4.678 ⁇ 0.1 mm, and the air gap between the cemented lens composed of the first lens and the second lens and the third lens is 1.0 ⁇ 0.1 mm; the second lens and the third lens
  • the center thickness of the cemented lens is 19.891 ⁇ 0.1 mm, and the air space between the cemented lens composed of the second lens and the third lens and the cemented lens composed of the fourth lens and the fifth lens is 9.986 ⁇ 0.1 mm;
  • the central thickness of the cemented lens formed by the lens and the fifth lens is 21.593 ⁇ 0.1 mm, and the air gap between the cemented lens formed by the fourth lens and the fifth lens and the sixth lens is 1.438 ⁇ 0.1 mm;
  • the center thickness is 10.128 ⁇ 0.1 mm, the air space between the sixth lens and the seventh lens is variable, and the range is from 4.563 ⁇ 0.1 to 69.469 ⁇ 0.1 mm; the center thickness of the seventh lens is 2.0 ⁇ 0.1 mm ,
  • the center thickness of the cemented lens formed by the eleventh lens is 17.276 ⁇ 0.1 mm, and the air gap between the cemented lens formed by the tenth lens and the eleventh lens and the twelfth lens is variable, ranging from 0.930 ⁇ 0.1 to 25.0 ⁇ 0.1 mm; the center thickness of the twelfth lens is 6.614 ⁇ 0.1 mm, and the air gap between the twelfth lens and the thirteenth lens is variable, ranging from 1.438 ⁇ 0.1 to 9.055 ⁇ 0.1 mm;
  • the center thickness of the thirteenth lens is 5.356 ⁇ 0.1 mm, and the air gap between the thirteenth lens and the front end surface of the optical fiber is 18.0 ⁇ 0.1 mm;
  • the working band of the optical system is 380nm to 1064nm near infrared
  • the rear working distance of the optical system is 18.0 mm, and the on-axis image point divergence angle 2 ⁇ is 30.6 degrees;
  • the method for measuring the two-photon absorption cross-section spectrum using the above-mentioned nonlinear optical pumping detection device includes the following steps:
  • the energy threshold at which two-photon absorption occurs in the sample The first converging lens is adjusted to make the laser converge at the center of the heavy water tank, and the first adjustable attenuator is adjusted to make the heavy water tank produce stable white light.
  • the second converging lens is adjusted so that the white light exits in parallel.
  • the third converging lens is adjusted so that the white light is condensed on the sample to be tested, and effectively coincides with the condensed light beam of the fourth converging lens.
  • the high-performance linear translation stage is adjusted to synchronize the non-degenerate excitation light path and the non-degenerate detection light path.
  • the fifth converging lens is adjusted to make the laser converge on the sample to be tested, and the converging point does not coincide with the non-degenerate optical path.
  • the tenth reflector is adjusted so that the reference optical path passes through the sample to be tested, and does not coincide with the degenerate optical path and the non-degenerate optical path.
  • the first optical signal collection system, the second optical signal collection system, and the third optical signal collection system are respectively adjusted to make the signal received by the optical multi-channel analyzer the strongest.
  • Non-linear absorption spectrum is divided into non-degenerate absorption spectrum and degenerate absorption spectrum.
  • the measurement process is carried out at the same time, as follows:
  • the laser light emitted by the third converging lens and the laser light emitted by the fourth converging lens are at a small angle (5°-15 °) coincide.
  • the first adjustable attenuator, the second adjustable attenuator, the first convergent lens, the second convergent lens, the third convergent lens, the fourth convergent lens, the fifth convergent lens, and the The first optical signal collection system, the second optical signal collection system, the third optical signal collection system, and the high-performance linear translation stage are all optimized cycle by cycle through the computer.
  • the sampling integration time and sampling times are set by the computer, and the first optical signal collection system, the second optical signal collection system, and the third optical signal collection system are simultaneously measured by the optical multi-channel analyzer.
  • the optical signal of the sample is collected and stored multiple times, and the non-degenerate transmission spectrum P1, the degenerate transmission spectrum P2, and the reference spectrum P3 of the sample to be tested are obtained respectively.
  • the sample to be tested is taken out of the device, put in a pre-prepared reference sample that does not contain the sample to be tested, and the first optical signal collection system, the first optical signal collection system, the The optical signals of the second optical signal collection system and the third optical signal collection system are collected and stored multiple times to obtain the non-degenerate transmission spectrum P4, the degenerate transmission spectrum P5, and the reference spectrum P6 of the reference sample, respectively.
  • the computer repeatedly collects and stores the optical signal of the third optical signal collection system through the optical multi-channel analyzer in real time.
  • the working status of the device is obtained by real-time analysis of the data. If the data obtained during the measurement process is different from the previous two times, the data measured in this process 2 will be automatically discarded.
  • the computer performs real-time monitoring through the optical power meter in real time. If the power changes during the measurement process, indicating that the laser is unstable, the data measured in this process 2 is automatically discarded.
  • the non-degenerate transmission spectrum P1 and the degenerate transmission spectrum P2 of the sample to be tested obtained in the experiment are respectively normalized point by point with reference to the reference spectrum P3 to obtain the normalized non-degenerate transmission spectrum P1', The normalized degenerate transmission spectrum P2'.
  • the non-degenerate transmission spectrum P4 and the degenerate transmission spectrum P5 of the reference sample obtained in the experiment are respectively normalized point by point with reference to the reference spectrum P6, and the normalized non-degenerate transmission spectrum P4' and the normalized transmission spectrum are obtained. -Simplify and transmit spectrum P5'.
  • the normalized non-degenerate transmission spectrum P1' is subtracted from the normalized non-degenerate transmission spectrum P4' to obtain the relative non-degenerate absorption spectrum X1 of the sample to be tested;
  • the normalized degenerate transmission spectrum is P2' minus the normalized degenerate transmission spectrum P5' to obtain the relative degenerate absorption spectrum X2 of the sample to be tested;
  • erf( ⁇ ) is the error function, which is defined as:
  • ⁇ is the group velocity mismatch parameter between the excitation light and the probe light, which can be obtained from the dispersion relationship:
  • d n is a refractive index change
  • d ⁇ is the wavelength change
  • [lambda] represents the wavelength
  • subscript p represents an excitation light
  • subscript e represents the detection light
  • c denotes the speed of light.
  • L is the thickness of the sample
  • n 1 and n 2 are the linear refractive indices of the excitation light and the probe light (approximately considered to be equal here)
  • I 1 0 is the peak power density of the excitation light at the focal point. The power obtained by the power meter is converted.
  • h Planck's constant
  • v 1 and v 2 for the excitation light and the probe light frequency of the photon
  • N A is the Avogadro constant
  • C is the sample concentration
  • the fitting parameter ⁇ can be obtained, and the non-degenerate two-photon absorption can be obtained from the ⁇ value through equation (4)
  • the coefficient ⁇ ND and then the non-degenerate two-photon absorption cross-section ⁇ ND is obtained from equation (5).
  • the above steps 234 can realize one-key control in the software, so as to realize the automation of the measurement process.
  • the device can also measure the dynamic process of the degenerate and non-degenerate two-photon absorption spectra of the sample.
  • step 5 After adjusting the high-performance linear translation stage in step 1 to synchronize the non-degenerate pump excitation light path and the non-degenerate detection light path, the position is 0 time, and the pump is continuously changed at equal intervals.
  • the optical path difference between the excitation light and the probe light that is, the delay time difference
  • repeat steps 234 for each change in the optical path difference This provides sufficient data for studying the dynamics of materials.
  • the present invention can realize simultaneous measurement of degenerate and non-degenerate nonlinear absorption cross-sectional spectra.
  • the measurement process of the present invention can be controlled by one key through software, thereby realizing the automation of the measurement process.
  • the measurement process is efficient and fast.
  • the working band is from 380nm to 1064nm near infrared, which can realize the non-linear performance measurement of supercontinuum wide spectrum.
  • the zoom optical system with a larger entrance pupil diameter is used as the weak signal collection lens, which can effectively extract the weak signal from the background noise.
  • the root mean square diameter of the image point on the zoom optical system axis is 100 microns to 150 microns
  • the on-axis image point divergence angle 2 ⁇ is 30.6 degrees, which matches the fiber coupling conditions well and improves the coupling efficiency of spatial light coupling into the fiber. The measurement sensitivity of the system is greatly improved.
  • the present invention well corrects various aberrations, especially chromatic dispersion, which solves the problem of time delay of different wavelengths in wide-spectrum detection. It ensures the accuracy of the signal and provides a solid foundation for the measurement of dynamic processes and transient processes.
  • Figure 1 is a schematic diagram of a nonlinear optical pump detection device
  • Fig. 2 is a schematic diagram of an optical system S in a nonlinear optical pump detection device.
  • FIG. 3 is a point diagram of two zoom positions of the zoom optical system according to the embodiment of the present invention.
  • FIG. 4 is a vertical axis chromatic aberration diagram of the zoom position 1 of the zoom optical system according to the embodiment of the present invention.
  • Fig. 5 is a vertical axis chromatic aberration diagram of the zoom position 2 of the zoom optical system according to the embodiment of the present invention.
  • FIG. 6 is a light aberration curve of the zoom position 1 of the zoom optical system according to the embodiment of the present invention.
  • FIG. 7 is a light aberration curve at the zoom position 2 of the zoom optical system according to the embodiment of the present invention.
  • FIG. 8 is a field curvature curve of the zoom position 1 of the zoom optical system according to the embodiment of the present invention.
  • FIG. 9 is a field curvature curve of the zoom position 2 of the zoom optical system according to the embodiment of the present invention.
  • Figure 10 is a schematic diagram of the steps of the measurement method of the present invention.
  • Fig. 1 is an optical path structure diagram of an embodiment of a nonlinear optical pumping detection device according to the present invention.
  • the device includes the main optical path, non-degenerate detection system, non-degenerate excitation system, degenerate detection system, and reference system;
  • the main optical path in turn includes the laser 1, the first aperture stop 2, the chopper 3, the first polarizer 4, the second polarizer 5, the first mirror 6, the first laser with an output laser wavelength of 800nm and a pulse width of 130fs.
  • the non-degenerate detection system sequentially includes a second reflector 8, a first adjustable attenuator 9, a first converging lens 10, a heavy tank 11, a second aperture stop 12, a neutral filter 13, and a second converging lens 14.
  • the second laser beam splitter 15, the third condensing lens 16, the sample to be tested 17, the first optical signal collection system 18, the first optical signal collection system 18 is connected to the optical multichannel analyzer 19 via an optical fiber, so The optical multi-channel analyzer 19 is connected to the computer 20;
  • the non-degenerate excitation system sequentially includes a second adjustable attenuator 21, a third mirror 22, a fourth mirror 23, a fifth mirror 24, a sixth mirror 25, a seventh mirror 26, and an eighth mirror 27 ,
  • the degenerate detection system in turn includes a third laser beam splitter 31, a triangular prism 32, a fifth converging lens 33, a sample 17 to be tested, and a second optical signal collection system 34.
  • the second optical signal collection system 34 is connected to the station via an optical fiber.
  • the optical multi-channel analyzer 19, the optical multi-channel analyzer 19 is connected to the computer 20;
  • the reference system in turn includes a tenth mirror 41, a sample 17 to be tested, and a third optical signal collection system 42.
  • the third optical signal collection system 42 is connected to the optical multichannel analyzer 19 via an optical fiber.
  • the optical multichannel analyzer 19 is connected to the computer 20;
  • the third reflector 22, the fourth reflector 23, the seventh reflector 26, and the eighth reflector 27 are mounted on the high-performance linear translation stage A.
  • the power meter 30, the first optical signal collection system 18, the second optical signal collection system 34, the third optical signal collection system 42, and the high-performance linear translation stage A are all directly connected to the computer 20 through a control line (in order to make the schematic diagram) Clear and beautiful, the control lines are not marked in the schematic diagram).
  • the diameter of the first aperture stop 2 is 5 mm, the diameter of the second aperture stop 12 is 10 mm; the adjustable frequency range of the chopper 3 is 4 Hz to 10 KHz; the second polarizer 5 The polarization direction is horizontal; the first mirror 6, the second mirror 8, the third mirror 22, the fourth mirror 23, the fifth mirror 24, the sixth mirror 25, and the seventh mirror 26 , The eighth mirror 27 and the main optical axis are all at 45°; the first laser beam splitter 7, the second laser beam splitter 15, and the third laser beam splitter 31 are all at 45° with the main optical axis; The transmittance of the first laser beam splitter 7 is 10% and the reflectance is 90%; the transmittance of the second laser beam splitter 15 is 50% and the reflectance is 50%; the transmittance of the third laser beam splitter 31 is The focal length of the first condenser lens 10, the second condenser lens 14, the third condenser lens 16, and the fifth condenser lens 33 are all 10 cm, and the focal length of the fourth condenser lens 29 is 10
  • the first optical signal collection system 18, the second optical signal collection system 34, and the third optical signal collection system 42 are identical optical systems S.
  • the optical system S includes a first lens S1, a second lens S2, a third lens S3, a fourth lens S4, a fifth lens S5, a sixth lens S6, a seventh lens S7, and a Eight lens S8, ninth lens S9, tenth lens S10, eleventh lens S11, twelfth lens S12, and thirteenth lens S13;
  • the first lens S1 is provided with an aperture stop
  • the first lens S1 is a positive lens
  • the second lens S2 is a negative lens
  • the third lens S3 is a positive lens
  • the fourth lens S4 is a positive lens
  • the fifth lens S5 is a negative lens
  • the sixth lens S6 is a positive lens
  • the seventh lens S7 is a negative lens
  • the eighth lens S8 is a negative lens
  • the ninth lens S9 is a positive lens
  • the tenth lens S10 is a positive lens
  • the eleventh lens S11 is a negative lens
  • the twelfth lens S12 is a positive lens.
  • the thirteenth lens S13 is a positive lens;
  • the first lens S1 is a meniscus concave lens
  • the second lens S2 is a meniscus concave lens
  • the third lens S3 is a biconvex lens
  • the fourth lens S4 is a biconvex lens
  • the fifth lens S5 is a biconcave lens
  • the sixth lens S6 It is a double convex lens
  • the seventh lens S7 is a double concave lens
  • the eighth lens S8 is a meniscus concave lens
  • the ninth lens S9 is a double convex lens
  • the tenth lens S10 is a meniscus concave lens
  • the eleventh lens S11 is a meniscus concave lens
  • the twelfth lens S12 is a double convex lens
  • the thirteenth lens S13 is a meniscus concave lens
  • the second lens S2 and the third lens S3 form a cemented lens J1, and the cemented surface of the double cemented lens faces the aperture stop;
  • the fourth lens S4 and the fifth lens S5 form a cemented lens J2, and the double cemented lens is cemented Face away from the aperture stop;
  • the eighth lens S8 and the ninth lens S9 form a cemented lens J3, and the cemented surface of the doublet lens faces the aperture stop;
  • the tenth lens S10 and the eleventh lens S11 form a cemented lens J4 , And the cemented surface of the doublet lens is away from the aperture stop;
  • the eleventh lens S11, the twelfth lens S12, and the thirteenth lens S13 are all aspheric lenses;
  • the first lens S1, the second lens S2, the third lens S3, the fourth lens S4, and the fifth lens S5, sixth lens S6, seventh lens S7, eighth lens S8, ninth lens S9, and tenth lens S10 are all spherical lenses;
  • the combined focal length of the first lens S1, the second lens S2, the third lens S3, the fourth lens S4, the fifth lens S5, and the sixth lens S6 is f1-6
  • the focal length of the seventh lens S7 is f7; and 1.5 ⁇ f1-6/f7 ⁇ 3;
  • the transparent aperture of the first lens S1 is D1, and 45 ⁇ D1 ⁇ 55;
  • the lens material uses Schott’s glass material
  • the first lens S1 is SF6, the second lens S2 is SF5, the third lens S3 is NLAF34, the fourth lens S4 is NLASF9, the fifth lens S5 is NSF56, and the sixth lens S6 is NLAK34
  • the seventh lens S7 is SF57
  • the eighth lens S8 is SF2
  • the ninth lens S9 is NLAF21
  • the tenth lens S10 is NLAF21
  • the eleventh lens S11 is SF2
  • the twelfth lens S12 is PPK53
  • the thirteenth lens is S13 is SF5G10;
  • the air distance between the sample 17 to be tested and the first lens S1 is variable, and the range is from 50 to 200 mm;
  • the center thickness of the first lens S1 is 4.678 ⁇ 0.1 mm, and the air gap between the cemented lens J1 composed of the first lens S1, the second lens S2 and the third lens S3 is 1.0 ⁇ 0.1 mm;
  • the central thickness of the cemented lens J1 composed of the lens S2 and the third lens S3 is 19.891 ⁇ 0.1 mm.
  • the second lens S2 and the third lens S3 form a cemented lens J1 and the fourth lens S4 and the fifth lens S5 form a cemented lens J2.
  • the air space between the fourth lens S4 and the fifth lens S5 is 9.986 ⁇ 0.1 mm; the fourth lens S4 and the fifth lens S5 form a cemented lens J2 with a central thickness of 21.593 ⁇ 0.1 mm.
  • the fourth lens S4 and the fifth lens S5 form a cemented lens J2 and
  • the air gap between the sixth lens S6 is 1.438 ⁇ 0.1 mm; the center thickness of the sixth lens S6 is 10.128 ⁇ 0.1 mm, and the air gap between the sixth lens S6 and the seventh lens S7 is variable and varies
  • the range is from 4.563 ⁇ 0.1 to 69.469 ⁇ 0.1 mm; the center thickness of the seventh lens S7 is 2.0 ⁇ 0.1 mm, and the seventh lens S7, the eighth lens S8 and the ninth lens S9 form the air between the cemented lens J3
  • the interval is 1.0 ⁇ 0.1 mm; the eighth lens S8 and the ninth lens S9 form a cemented lens J3 with a central thickness of 6.629 ⁇ 0.1 mm, and the eighth lens S8 and the ninth lens S9 form a cemented lens J3 and a tenth lens
  • the air space between the cemented lens J4 composed of S10 and the eleventh lens S11 is variable, ranging from 1.0 ⁇ 0.1 to 33.162
  • the working band of the optical system S is 380nm to 1064nm near infrared
  • the rear working distance of the optical system S is 18.0 mm, and the on-axis image point divergence angle 2 ⁇ is 30.6 degrees;
  • the actual lens parameters and lens center distance parameters of the optical system S at zoom position 1 are shown in Table 1 below:
  • Table 3 shows the aspheric surface data in the optical system S, where the aspheric surface formula is:
  • Figure 3 shows the spot diagram of the two zoom positions. It can be seen that in the entire zoom range, the root mean square diameter of the image point is 100 microns to 150 microns, that is, the diameter of the spot on the front end of the fiber is the same as that of the ordinary fiber. Basically equal.
  • the back working distance of the optical system S is 18 mm, and the spot diameter on the lens S13 is 4.93 mm, which ensures that the on-axis image point divergence angle 2 ⁇ is 30.6 degrees, which matches the fiber coupling conditions well and improves the spatial optical coupling The coupling efficiency of the incoming fiber.
  • the measurement sensitivity of the system is greatly improved.
  • Figure 4 and Figure 5 show the vertical axis chromatic aberration diagrams of the two zoom positions. It can be seen that in the entire zoom range, the vertical axis chromatic aberration is less than 0.03 mm in the range of 380nm to 1060nm, which solves the problem of wide-spectrum detection. The problem of time delay at different wavelengths. It ensures the accuracy of the signal and provides a solid foundation for the measurement of dynamic processes and transient processes.
  • FIGS 6 to 9 show the imaging performance of the optical system S in this embodiment. The results show that the imaging effect is excellent and can accurately collect and detect signals.
  • the method for measuring the two-photon absorption cross-section spectrum using the above-mentioned nonlinear optical pumping detection device includes the following steps:
  • the chopper 3 According to actual measurement needs, select a suitable laser, and adjust the chopper 3 according to the laser parameters (such as output power, pulse frequency, etc.) to control the laser repetition frequency incident on the sample 17 to be tested. Adjust the polarization direction of the second polarizer 5 to be vertical, adjust the first polarizer 4 to adjust the incident energy of the entire optical path, and ensure that the first adjustable attenuator 9 and the second adjustable attenuator When the transmittance of the attenuating sheet 21 is 100%, the sample 17 to be tested, the optical power meter 30, and the optical multi-channel analyzer 19 will not be damaged.
  • the laser parameters such as output power, pulse frequency, etc.
  • Adjusting the first condensing lens 10 makes the laser converge at the center of the heavy tank 11, and adjusting the first adjustable attenuator 9 makes the heavy tank 11 produce stable white light.
  • the second condensing lens 14 is adjusted so that the white light exits in parallel.
  • the third condensing lens 16 is adjusted so that the white light is condensed on the sample 17 to be tested, and effectively coincides with the condensed light beam of the fourth condensing lens 29.
  • the high-performance linear translation stage A is adjusted to synchronize the non-degenerate excitation light path and the non-degenerate detection light path.
  • the fifth condensing lens 33 is adjusted to make the laser converge on the sample 17 to be tested, and the converging point does not coincide with the non-degenerate optical path.
  • the tenth reflector 41 is adjusted so that the reference optical path passes through the sample to be tested 17 and does not coincide with the degenerate optical path and the non-degenerate optical path.
  • the first optical signal collection system 18, the second optical signal collection system 34, and the third optical signal collection system 42 are respectively adjusted so that the signal received by the optical multi-channel analyzer 19 is the strongest.
  • Non-linear absorption spectrum is divided into non-degenerate absorption spectrum and degenerate absorption spectrum.
  • the measurement process is performed at the same time, as follows:
  • the laser light emitted by the third converging lens 16 and the laser light emitted by the fourth converging lens 29 are at a small angle in the sample 17 to be tested. °Coincident.
  • the fifth convergent lens 33, the first optical signal collection system 18, the second optical signal collection system 34, the third optical signal collection system 42, and the high-performance linear translation stage A are all optimized cycle by cycle through the computer 20.
  • the sampling integration time and sampling times are set by the computer 20, and the first optical signal collection system 18, the second optical signal collection system 34, and the third optical signal collection system 34 are simultaneously measured by the optical multi-channel analyzer 19
  • the optical signal of the optical signal collection system 42 is collected and stored multiple times, and the non-degenerate transmission spectrum P1, the degenerate transmission spectrum P2, and the reference spectrum P3 of the sample 17 to be tested are obtained respectively.
  • the sample 17 to be tested is taken out of the device and placed in a pre-prepared reference sample 50 that does not contain the sample to be tested, and the first optical signal is simultaneously measured by the optical multichannel analyzer 19
  • the optical signals of the collection system 18, the second optical signal collection system 34, and the third optical signal collection system 42 are collected and stored multiple times to obtain the non-degenerate transmission spectrum P4, the degenerate transmission spectrum P5, and the reference sample 50, respectively.
  • Reference spectrum P6 is analyzed for the optical signals of the collection system 18, the second optical signal collection system 34, and the third optical signal collection system 42 are collected and stored multiple times to obtain the non-degenerate transmission spectrum P4, the degenerate transmission spectrum P5, and the reference sample 50, respectively.
  • Reference spectrum P6 is analyzed by the reference spectrum.
  • the computer 20 repeatedly collects and stores the optical signal of the third optical signal collection system 42 through the optical multi-channel analyzer 19 in real time.
  • the working status of the device is obtained by real-time analysis of the data. If the data obtained twice during the measurement process is different, the data measured in the process S2 will be automatically discarded.
  • the computer 20 conducts real-time monitoring through the optical power meter 30 in real time. If the power changes during the measurement process, indicating that the laser is unstable, the data measured in this process S2 will be automatically discarded. And restart the measurement in step S2.
  • the non-degenerate transmission spectrum P1 and the degenerate transmission spectrum P2 of the test sample 17 obtained by the experiment are respectively normalized point by point with reference to the reference spectrum P3 to obtain the normalized non-degenerate transmission spectrum P1' , The normalized reduction and transmission spectrum P2'.
  • the non-degenerate transmission spectrum P4 and the degenerate transmission spectrum P5 of the reference sample 50 obtained in the experiment are respectively normalized point by point with reference to the reference spectrum P6 to obtain the normalized non-degenerate transmission spectrum P4', The normalized and degenerate transmission spectrum P5'.
  • the normalized non-degenerate transmission spectrum P1' is subtracted from the normalized non-degenerate transmission spectrum P4' to obtain the relative non-degenerate absorption spectrum X1 of the test sample 17;
  • the normalized degenerate transmission is subtracted from the spectrum P2' to obtain the relative degenerate absorption spectrum X2 of the sample 17 to be tested;
  • erf( ⁇ ) is the error function, which is defined as:
  • ⁇ is the group velocity mismatch parameter between the excitation light and the probe light, which can be obtained from the dispersion relationship:
  • L is the thickness of the sample
  • n 1 and n 2 are the linear refractive indices of the excitation light and the probe light (approximately considered to be equal here)
  • I 1 0 is the peak power density of the excitation light at the focal point. The power obtained by the power meter 30 is converted.
  • h Planck's constant
  • ⁇ 1 and ⁇ 2 photon excitation light and the probe light frequency N A is the Avogadro constant
  • C is the sample concentration
  • the fitting parameter ⁇ can be obtained, and the non-degenerate two-photon absorption can be obtained from the ⁇ value through equation (4)
  • the coefficient ⁇ ND and then the non-degenerate two-photon absorption cross-section ⁇ ND is obtained from equation (5).
  • the device can also measure the dynamic process of the degenerate and non-degenerate two-photon absorption spectra of the sample.
  • step S5 After adjusting the high-performance linear translation stage A in step S1 to synchronize the non-degenerate pump excitation light path and the non-degenerate detection light path, the position is 0 time, and the changes are continuously at equal intervals.
  • the optical path difference between the pump excitation light and the probe light that is, the delay time difference
  • repeat steps S2, S3, and S4 every time the optical path difference is changed to obtain a set of two-photon absorption cross-section spectra.
  • a series of two-photon absorption cross-section spectra can be obtained under different delay times.
  • the two-photon absorption cross-section spectrum provides sufficient data for studying the dynamics of materials.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Nonlinear Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Lenses (AREA)

Abstract

一种非线性光学泵浦探测装置及非线性光学吸收截面测量方法，可以实现同时测量简并和非简并非线性吸收截面谱。测量过程自动化，测量过程高效、快速。工作波段为380nm至近红外1064nm，能实现超连续宽光谱的非线性性能测量。采用了较大入瞳直径的变焦光学系统作为微弱信号采集镜头，能有效的将微弱信号在背景噪声中提取出来，同时变焦光学系统轴上像点均方根直径100微米至150微米，轴上像点发散角2α为30.6度，很好的匹配光纤耦合条件，提高空间光耦合进光纤的耦合效率，测量灵敏度大大提高。

Description

一种非线性光学泵浦探测装置及非线性光学吸收截面测量方法 技术领域
本发明涉及一种非线性光学性能测量装置及方法，属于非线性光学和光学检测领域。
背景技术
随着光通信和光信息处理等技术的飞速发展，非线性光学材料的研究显得日益重要。非线性光学材料在光开关、全光器件、高速光电设备、高功率激光器件、激光防护及光限幅等领域中获得了大量的实际应用。对材料的光学非线性研究是目前材料学及相关领域的研究热点。光学非线性测量技术是研究非线性光学材料的关键技术之一，其中弄清材料的光学非线性机制，如何准确的确定材料重要的物理参量对于如何应用材料是非常重要的。目前，常用的光学非线性测量技术有简并四波混频、三波混频、三次谐波法、非线性干涉法、非线性椭圆偏振法、马赫-曾德干涉法、4f相位相干成像法、Z扫描法等。其中Z扫描方法(参见SHEIK-BAHAE,M.；SAID,A.A.；WEI，T.H.；HAGAN,D.J.；STRYLAND,E.W.V.，Sensitive measurement of optical nonlinearities using a single beam.IEEE J.Quantum Electron.1990,26(4),760-769.)是目前最为常用的测量材料光学非线性的方法，它具有可以同时测量非线性折射和非线性吸收，装置简单，灵敏度高等优点。但传统的Z扫描方法通常使用单波长激光器，只能得到非线性光子学材料在特定波长下的光学非线性特性，所能提供的信息非常有限。而对非线性光子学材料的光学非线性研究需要了解材料在宽波长范围内的光学非线性特性，然而，传统的非线性光谱特性测量装置不能满足要求。
非线性光学效应是在激光的高强度光电场E(r,t)的作用下，介质中不仅会产生与入射场E(r,t)成线性关系的线性电极化强度P (1)(r,t)，还会产生与入射光电场成幂次方关系的非线性电极化强度P NL(r,t)，它可以包括光电场强度的二次、三次及更高的幂次项。这就给非线性光学带来极其丰富的内容。而描述介质的电极化强度P(r,t)与光电场强度E(r,t)关系的最重要的物理量即是光学极化率，与不同幂次的电极化强度相应，介质的极化率可以有线性光学极化率χ (1)及非线性光学极化率χ (2)、χ (3)等，它们分别为二阶、三阶及四阶复数张量，反映了介质对于光电场不同的响应，也直接决定了所产生的多种多样的非线性光学效应。它的实部判定介质的线性(非线性)折射率，而它的虚部判定介质的线性(非线性)吸收。介质的非线性吸收与介质内部能级分布有直接关系。以三阶非线性效应为例，通常情况下，物质分子仅吸收一个光子完成从基态到激发态的跃迁，我们称之为单光子吸收。双光子吸收，是指物质分子同时吸收两个光子，从基态跃迁到激发态的过程。双光子吸收过程中，物质分子均是吸收两个波长相同的光子，我们称之为简并双光子吸收(Degenerate two-photon absorption,D-TPA)。而相反的情况是，物质分子同时吸收两个波长不同的光子完成从基态到激发态的跃迁，我们称之为非简并双光子吸收。相对于简并双光子吸收，非简并双光子吸收具有更小的吸收区域，更大的吸收系数以及更宽的光谱范围，除了可以应用于以上所述的各种应用，在红外探测、量子计数、光学取样以及双色双光子荧光显微成像等方面发挥着重要作用。目前大多测量方法都是只能测量简并双光子吸收或者非简并双光子吸收中的一种，而且效率较低，只能单波长逐点的进行测量，给相关的研究和应用带来很大的困难。
发明内容
针对现有技术的不足，本发明提供了一种非线性光学泵浦探测装置。该装置能够实现同时测量简并和非简并双光子吸收截面谱。测量过程自动化，测量过程高效、快速。本发明中工作波段为380nm至近红外1064nm，能实现超连续宽光谱的非线性性能测量。采用了较大入瞳直径的变焦光学系统作为微弱信号采集镜头，能有效的将微弱信号在背景噪声中提取出来，同时此变焦光学系统轴上像点均方根直径100微米至150微米，轴上像点发散角2α为30.6度，很好的匹配光纤耦合条件，提高空间光耦合进光纤的耦合效率。系统测量灵敏度大大提高。
本发明的技术解决方案如下：
一种非线性光学泵浦探测装置，包括主光路、非简并探测系统、非简并激发系统、简并探测系统、参考系统；
主光路依次包括激光器、第一小孔光阑、斩波器、第一偏振片、第二偏振片、第一反射镜、第一激光分光镜；
非简并探测系统依次包括第二反射镜、第一可调衰减片、第一会聚透镜、重水池、第二小孔光阑、中性滤光片、第二会聚透镜、第二激光分光镜、第三会聚透镜、待测样品、第一光信号收集系统，所述的第一光信号收集系统经光纤连接到光学多道分析仪，所述的光学多道分析仪连接到电脑；
非简并激发系统依次包括第二可调衰减片、第三反射镜、第四反射镜、第五反射镜、第六反射镜、第七反射镜、第八反射镜、第九反射镜、第四会聚透镜、待测样品、光功率计；所述的第三会聚透镜出射的激光与所述的第四会聚透镜出射的激光在所述的待测样品中以小角度(5°-15°)重合；
简并探测系统依次包括第三激光分光镜、三棱镜、第五会聚透镜、待测样品、第二光信号收集系统，所述的第二光信号收集系统经光纤连接到所述的光学多道分析仪，所述的光学多道分析仪连接到电脑；
参考系统依次包括第十反射镜、待测样品、第三光信号收集系统，所述的第三光信号收集系统经光纤连接到所述的光学多道分析仪，所述的光学多道分析仪连接到电脑；
所述的第三反射镜、第四反射镜、第七反射镜、第八反射镜安装在高性能线性平移台上。
所述的第一可调衰减片、第二可调衰减片、第一会聚透镜、第二会聚透镜、第三会聚透镜、第四会聚透镜、第五会聚透镜、光功率计、第一光信号收集系统、第二光信号收集系统、第三光信号收集系统、高性能线性平移台均通过控制线与所述的电脑直接相连。
所述的第一小孔光阑直径为5mm，所述的第二小孔光阑直径10mm；所述的斩波器频率可调范围为4HZ至10KHZ；所述的第二偏振片偏振方向为水平；所述的第一反射镜、第二反射镜、第三反射镜、第四反射镜、第五反射镜、第六反射镜、第七反射镜、第八反射镜与主光轴均成45°；所述的第一激光分光镜、第二激光分光镜、第三激光分光镜与主光轴均成45°；所述的第一激光分光镜透射率为10％，反射率为90％；所述的第二激光分光镜透射率为50％，反射率为50％；所述的第三激光分光镜透射率为10％，反射率为90％；所述的第一会聚透镜、第二会聚透镜、第三会聚透镜、第五会聚透镜焦距均为10cm，所述的第四会聚透镜焦距为50cm。所述的待测样品厚度为10mm。
所述的第一光信号收集系统、第二光信号收集系统、第三光信号收集系统为完全相同的光学系统。所述的光学系统依次包括第一透镜、第二透镜、第三透镜、第四透镜、第五透镜、第六透镜、第七透镜、第八透镜、第九透镜、第十透镜、第十一透镜、第十二透镜、第十三透镜；
所述第一透镜设置有孔径光阑；
所述第一透镜为正透镜、第二透镜为负透镜、第三透镜为正透镜、第四透镜为正透镜、第五透镜为负透镜、第六透镜为正透镜、第七透镜为负透镜、第八透镜为负透镜、第九透镜为正透镜、第十透镜为正透镜、第十一透镜为负透镜、第十二透镜为正透镜、第十三透镜为正透镜；
所述第一透镜为弯月形凹透镜、第二透镜为弯月形凹透镜、第三透镜为双凸透镜、第四透镜为双凸透镜、第五透镜为双凹透镜、第六透镜为双凸透镜、第七透镜为双凹透镜、第八透镜为弯月形凹透镜、第九透镜为双凸透镜、第十透镜为弯月形凹透镜、第十一透镜为弯月形凹透镜、第十二透镜为双凸透镜、第十三透镜为弯月形凹透镜；
所述第二透镜和第三透镜组成胶合透镜，且双胶合透镜的胶合面朝向孔径光阑；所述第四透镜和第五透镜组成胶合透镜，且双胶合透镜的胶合面背离孔径光阑；所述第八透镜和第九透镜组成胶合透镜，且双胶合透镜的胶合面朝向孔径光阑；所述第十透镜和第十一透镜组成胶合透镜，且双胶合透镜的胶合面背离孔径光阑；
所述第十一透镜、第十二透镜、第十三透镜均为非球面透镜；所述第一透镜、第二透镜、第三透镜、第四透镜、第五透镜、第六透镜、第七透镜、第八透镜、第九透镜、第十透镜均为球面透镜；
所述第一透镜、第二透镜、第三透镜、第四透镜、第五透镜和第六透镜的组合焦距为f1-6，第 七透镜的焦距为f7；且1.5<∣f1-6/f7∣<3；
所述的第一透镜的透光孔径为D1，且45<D1<55；
镜片材料采用肖特公司的玻璃材料，第一透镜为SF6，第二透镜为SF5，第三透镜为NLAF34，第四透镜为NLASF9，第五透镜为NSF56，第六透镜为NLAK34，第七透镜为SF57，第八透镜为SF2，第九透镜为NLAF21，第十透镜为NLAF21，第十一透镜为SF2，第十二透镜为PPK53，第十三透镜为SF5G10；
所述的待测样品距离所述的第一透镜的空气间隔为变量，变化范围从50至200毫米；
所述第一透镜的中心厚度为4.678±0.1毫米，所述第一透镜与第二透镜和第三透镜组成胶合透镜之间的空气间隔为1.0±0.1毫米；所述第二透镜和第三透镜组成胶合透镜的中心厚度为19.891±0.1毫米，所述第二透镜和第三透镜组成胶合透镜与第四透镜和第五透镜组成胶合透镜之间的空气间隔为9.986±0.1毫米；所述第四透镜和第五透镜组成胶合透镜的中心厚度为21.593±0.1毫米，所述第四透镜和第五透镜组成胶合透镜与第六透镜之间的空气间隔为1.438±0.1毫米；所述第六透镜的中心厚度为10.128±0.1毫米，所述第六透镜与第七透镜之间的空气间隔为变量，变化范围从4.563±0.1至69.469±0.1毫米；所述第七透镜的中心厚度为2.0±0.1毫米，所述第七透镜与第八透镜和第九透镜组成胶合透镜之间的空气间隔为1.0±0.1毫米；所述第八透镜和第九透镜组成胶合透镜的中心厚度为6.629±0.1毫米，所述第八透镜和第九透镜组成胶合透镜与第十透镜和第十一透镜组成胶合透镜之间的空气间隔为变量，变化范围从1.0±0.1至33.162±0.1毫米；所述第十透镜和第十一透镜组成胶合透镜的中心厚度为17.276±0.1毫米，所述第十透镜和第十一透镜组成胶合透镜与第十二透镜之间的空气间隔为变量，变化范围从0.930±0.1至25.0±0.1毫米；所述第十二透镜的中心厚度为6.614±0.1毫米，所述第十二透镜与第十三透镜之间的空气间隔为变量，变化范围从1.438±0.1至9.055±0.1毫米；所述第十三透镜的中心厚度为5.356±0.1毫米，所述第十三透镜与所述的光纤前端面之间的空气间隔为18.0±0.1毫米；
所述的光学系统工作波段为380nm至近红外1064nm；
所述的光学系统的后工作距离为18.0毫米，轴上像点发散角2α为30.6度；
利用上述一种非线性光学泵浦探测装置进行双光子吸收截面谱的测量方法包括下列步骤：
一、系统初始化：
根据实际测量需要，以及激光器参数设置非线性光学泵浦探测装置中部分器件的初始值，具体如下：
①根据实际测量需要，选择合适激光器，根据激光器自身参数(如输出功率大小，脉冲频率等)调节所述的斩波器来控制入射到所述的待测样品的激光重复频率。调节所述的第二偏振片的偏振方向为竖直，调节所述的第一偏振片来调节整个光路的入射能量，保证在所述的第一可调衰减片、第二可调衰减片透过率为100％的情况下，所述的待测样品、光功率计、光学多道分析仪不会损坏。调节所述的第九反射镜、第四会聚透镜，使激光会聚于所述的待测样品的后表面，调节所述的第二可调衰减片使激光能量略低于在所述的待测样品中产生双光子吸收的能量阈值。调节所述的第一会聚透镜使激光会聚于所述的重水池的中心位置，调节所述的第一可调衰减片使所述的重水池产生稳定的白光。调节所述的第二会聚透镜使所述的白光平行出射。调节所述的第三会聚透镜使所述的白光会聚于所述的待测样品，且与所述的第四会聚透镜会聚光束产生有效重合。调节所述的高性能线性平移台使所述的非简并激发光路和所述的非简并探测光路同步。调节所述的第五会聚透镜使激光会聚于所述的待测样品，且会聚点与所述的非简并光路不重合。调节所述的第十反射镜使所述的参考光路经过所述的待测样品，且不和所述的简并光路和非简并光路重合。分别调节所述的第一光信号收集系统、第二光信号收集系统、第三光信号收集系统使所述的光学多道分析仪接收到的信号最强。
二、非线性吸收光谱测量
非线性吸收光谱分为非简并吸收光谱和简并吸收光谱，测量过程同时进行，具体如下：
②非线性吸收光谱测量
装置开机后，待所述的激光器输出稳定后，所述的第三会聚透镜出射的激光与所述的第四会聚透镜出射的激光在所述的待测样品中以小角度(5°-15°)重合。在装置初始化的基础上，所述的第一可调衰减片、第二可调衰减片、第一会聚透镜、第二会聚透镜、第三会聚透镜、第四会聚透镜、第五会聚透镜、第一光信号收集系统、第二光信号收集系统、第三光信号收集系统、高性能线性平移台均通过所述的电脑逐个循环进行优化。直至所述的光学多道分析仪所接收的所述的第一光信号收集系统、第二光信号收集系统、第三光信号收集系统的信号皆为最强为止。此时，通过所述的电脑设置采样积分时间和采样次数，通过所述的光学多道分析仪同时对所述的第一光信号收集系统、第二光信号收集系统、第三光信号收集系统的光信号进行多次采集存储，分别得到所述待测样品的非简并透射光谱P1、简并透射光谱P2、参考光谱P3。然后将所述的待测样品从装置中取出，放入事先配好的不含待测样品的参比样品，通过所述的光学多道分析仪同时对所述的第一光信号收集系统、第二光信号收集系统、第三光信号收集系统的光信号进行多次采集存储，分别得到所述参比样品的非简并透射光谱P4、简并透射光谱P5、参考光谱P6。
三、监测部分
对于测量过程中可能遇到的影响因素进行监测，发现异常及时处理，具体如下：
③测量过程中，所述的电脑实时通过所述的光学多道分析仪对所述的第三光信号收集系统的光信号进行反复采集存储。通过对数据的实时分析得到装置的工作状态，如果测量过程中前后两次得到的数据差别较大，则自动放弃此次过程②所测得数据。所述的电脑实时通过所述的光功率计进行实时监测，如果测量过程中功率发生变化，说明激光器不稳定，则自动放弃此次过程②所测得数据。
四、数据处理
根据实验所得数据进行相应处理，得到所述的待测样品的非简并吸收光谱和简并吸收光谱。具体如下：
④将实验得到的所述的待测样品的非简并透射光谱P1、简并透射光谱P2分别逐点对照参考光谱P3进行归一化处理，分别得到归一化非简并透射光谱P1’、归一化简并透射光谱P2’。
将实验得到的所述的参比样品的非简并透射光谱P4、简并透射光谱P5分别逐点对照参考光谱P6进行归一化处理，分别得到归一化非简并透射光谱P4’、归一化简并透射光谱P5’。
将归一化的非简并透射光谱P1’减去归一化的非简并透射光谱P4’得到所述的待测样品的相对非简并吸收光谱X1；将归一化的简并透射光谱P2’减去归一化的简并透射光谱P5’得到所述的待测样品的相对简并吸收光谱X2；
下面来计算波长λ处的绝对吸收截面：
探测光的归一化透过率Q’(τ d)与归一化延迟时间τ d(延迟时间与激发光脉冲宽度的比值)的关系为：
Figure PCTCN2021073912-appb-000001
其中，W＝w p/w e为探测光脉冲宽度与激发光脉冲宽度的比值，erf(τ)作为误差函数，定义为：
Figure PCTCN2021073912-appb-000002
ρ为激发光和探测光之间的群速度失配参数，可以由色散关系得到：
Figure PCTCN2021073912-appb-000003
其中，d n为折射率变化，d λ为波长变化，λ表示波长，n表示折射率，下标p表示激发光，下标e表示探测光，c表示光速。
在本次研究中，由于溶液色散关系未知，因此将ρ作为拟合参数。另一拟合参数γ和非简并双光子吸收系数β ND的关系表示为：
Figure PCTCN2021073912-appb-000004
其中，L为样品厚度，n 1和n 2为激发光和探测光的线性折射率(在此近似认为是相等的)，I 1 0为焦点处激发光的峰值功率密度，由所述的光功率计得到的功率进行换算。
非简并双光子吸收截面δ ND与非简并双光子吸收系数β ND之间的关系为：
Figure PCTCN2021073912-appb-000005
其中，h为普朗克常数，v 1和v 2为激发光和探测光的光子频率，N A为阿伏伽德罗常数，C为样品浓度。
通过(1)式对实验数据(归一化透过率随延迟时间的变化关系)进行拟合，可以得到拟合参数γ，由γ值通过(4)式可以求得非简并双光子吸收系数β ND，进而由(5)式得到非简并双光子吸收截面δ ND。
将所述的相对非简并吸收光谱X1和相对简并吸收光谱X2在整个光谱区按照相应比例(δ ND除以波长λ处吸收系数)放大，得到相应的绝对非简并双光子吸收截面谱X3和绝对简并双光子吸收截面谱X4。并将结果输出。
所述以上步骤②③④可以在软件中实现一键控制，从而实现测量过程自动化。
五、非线性性能动力学测量过程
本装置还可以测量样品的简并和非简并双光子吸收光谱的动力学过程。
⑤在步骤①中调节所述的高性能线性平移台使所述的非简并泵浦激发光路和所述的非简并探测光路同步后，以此位置为0时刻，连续等间隔的改变泵浦激发光和探测光的光程差(也就是延迟时间差)，每改变一次光程差重复步骤②③④得到一组双光子吸收截面光谱，在不同延迟时间下可以得到一系列的双光子吸收截面谱，这就为研究材料的动力学过程提供了充足的数据。
本发明的有益效果：
1.本发明可以实现同时测量简并和非简并非线性吸收截面谱。
2.本发明测量过程可以通过软件实现一键控制，从而实现测量过程自动化。测量过程高效、快速。
3.本发明中工作波段为380nm至近红外1064nm，能实现超连续宽光谱的非线性性能测量。
4.采用了较大入瞳直径的变焦光学系统作为微弱信号采集镜头，能有效的将微弱信号在背景噪 声中提取出来，同时此变焦光学系统轴上像点均方根直径100微米至150微米，轴上像点发散角2α为30.6度，很好的匹配光纤耦合条件，提高空间光耦合进光纤的耦合效率。系统测量灵敏度大大提高。
5.本发明很好的校正了各类像差，尤其是色散，这就解决了宽光谱检测时不同波长的时间延迟问题。保证了信号的准确性，为动力学过程和瞬态过程的测量提供了坚实的基础。
6.通过调节激发光和探测光的光程差(延迟时间差)，在不同延迟时间下测量样品的透过率，即可研究该材料的非线性动力学过程。
附图说明
图1是一种非线性光学泵浦探测装置示意图；
图2是一种非线性光学泵浦探测装置中光学系统S示意图。
图3是本发明实施例的变焦光学系统的两个变焦位置的点列图。
图4是本发明实施例的变焦光学系统的变焦位置1的垂轴色差图。
图5是本发明实施例的变焦光学系统的变焦位置2的垂轴色差图。
图6是本发明实施例的变焦光学系统的变焦位置1的光线像差曲线。
图7是本发明实施例的变焦光学系统的变焦位置2的光线像差曲线。
图8是本发明实施例的变焦光学系统的变焦位置1的场曲曲线。
图9是本发明实施例的变焦光学系统的变焦位置2的场曲曲线。
图10为本发明测量方法步骤示意图。
具体实施方式
为使得本发明的发明目的、特征、优点能够更加的明显和易懂，下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，下面所描述的实施例仅仅是本发明一部分实施例，而非全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其它实施例，都属于本发明保护的范围。
如图1所示，图1是本发明实现一种非线性光学泵浦探测装置一个实施例的光路结构图。装置包括主光路、非简并探测系统、非简并激发系统、简并探测系统、参考系统；
主光路依次包括输出激光波长800nm，脉冲宽度130fs的激光器1、第一小孔光阑2、斩波器3、第一偏振片4、第二偏振片5、第一反射镜6、第一激光分光镜7；
非简并探测系统依次包括第二反射镜8、第一可调衰减片9、第一会聚透镜10、重水池11、第二小孔光阑12、中性滤光片13、第二会聚透镜14、第二激光分光镜15、第三会聚透镜16、待测样品17、第一光信号收集系统18，所述的第一光信号收集系统18经光纤连接到光学多道分析仪19，所述的光学多道分析仪19连接到电脑20；
非简并激发系统依次包括第二可调衰减片21、第三反射镜22、第四反射镜23、第五反射镜24、第六反射镜25、第七反射镜26、第八反射镜27、第九反射镜28、第四会聚透镜29、待测样品17、光功率计30；所述的第三会聚透镜16出射的激光与所述的第四会聚透镜29出射的激光在所述的待测样品17中以小角度10°重合；
简并探测系统依次包括第三激光分光镜31、三棱镜32、第五会聚透镜33、待测样品17、第二光信号收集系统34，所述的第二光信号收集系统34经光纤连接到所述的光学多道分析仪19，所述的光学多道分析仪19连接到电脑20；
参考系统依次包括第十反射镜41、待测样品17、第三光信号收集系统42，所述的第三光信号收集系统42经光纤连接到所述的光学多道分析仪19，所述的光学多道分析仪19连接到电脑20；
所述的第三反射镜22、第四反射镜23、第七反射镜26、第八反射镜27安装在高性能线性平移台A上。
所述的第一可调衰减片9、第二可调衰减片21、第一会聚透镜10、第二会聚透镜14、第三会聚透镜16、第四会聚透镜29、第五会聚透镜33、光功率计30、第一光信号收集系统18、第二光信号收集系统34、第三光信号收集系统42、高性能线性平移台A均通过控制线与所述的电脑20直接相连(为使示意图清晰美观，所述的各控制线并未在示意图中标出)。
所述的第一小孔光阑2直径为5mm，所述的第二小孔光阑12直径10mm；所述的斩波器3频率可调范围为4Hz至10KHz；所述的第二偏振片5偏振方向为水平；所述的第一反射镜6、第二反射镜8、第三反射镜22、第四反射镜23、第五反射镜24、第六反射镜25、第七反射镜26、第八反射镜27与主光轴均成45°；所述的第一激光分光镜7、第二激光分光镜15、第三激光分光镜31与主光轴均成45°；所述的第一激光分光镜7透射率为10％，反射率为90％；所述的第二激光分光镜15透射率为50％，反射率为50％；所述的第三激光分光镜31透射率为10％，反射率为90％；所述的第一会聚透镜10、第二会聚透镜14、第三会聚透镜16、第五会聚透镜33焦距均为10cm，所述的第四会聚透镜29焦距为50cm。所述的待测样品17厚度为10mm。
所述的第一光信号收集系统18、第二光信号收集系统34、第三光信号收集系统42为完全相同的光学系统S。
如图2所示，所述的光学系统S依次包括第一透镜S1、第二透镜S2、第三透镜S3、第四透镜S4、第五透镜S5、第六透镜S6、第七透镜S7、第八透镜S8、第九透镜S9、第十透镜S10、第十一透镜S11、第十二透镜S12、第十三透镜S13；
所述第一透镜S1设置有孔径光阑；
所述第一透镜S1为正透镜、第二透镜S2为负透镜、第三透镜S3为正透镜、第四透镜S4为正透镜、第五透镜S5为负透镜、第六透镜S6为正透镜、第七透镜S7为负透镜、第八透镜S8为负透镜、第九透镜S9为正透镜、第十透镜S10为正透镜、第十一透镜S11为负透镜、第十二透镜S12为正透镜、第十三透镜S13为正透镜；
所述第一透镜S1为弯月形凹透镜、第二透镜S2为弯月形凹透镜、第三透镜S3为双凸透镜、第四透镜S4为双凸透镜、第五透镜S5为双凹透镜、第六透镜S6为双凸透镜、第七透镜S7为双凹透镜、第八透镜S8为弯月形凹透镜、第九透镜S9为双凸透镜、第十透镜S10为弯月形凹透镜、第十一透镜S11为弯月形凹透镜、第十二透镜S12为双凸透镜、第十三透镜S13为弯月形凹透镜；
所述第二透镜S2和第三透镜S3组成胶合透镜J1，且双胶合透镜的胶合面朝向孔径光阑；所述第四透镜S4和第五透镜S5组成胶合透镜J2，且双胶合透镜的胶合面背离孔径光阑；所述第八透镜S8和第九透镜S9组成胶合透镜J3，且双胶合透镜的胶合面朝向孔径光阑；所述第十透镜S10和第十一透镜S11组成胶合透镜J4，且双胶合透镜的胶合面背离孔径光阑；
所述第十一透镜S11、第十二透镜S12、第十三透镜S13均为非球面透镜；所述第一透镜S1、第二透镜S2、第三透镜S3、第四透镜S4、第五透镜S5、第六透镜S6、第七透镜S7、第八透镜S8、第九透镜S9、第十透镜S10均为球面透镜；
所述第一透镜S1、第二透镜S2、第三透镜S3、第四透镜S4、第五透镜S5和第六透镜S6的组合焦距为f1-6，第七透镜S7的焦距为f7；且1.5<∣f1-6/f7∣<3；
所述的第一透镜S1的透光孔径为D1，且45<D1<55；
镜片材料采用肖特公司的玻璃材料，第一透镜S1为SF6，第二透镜S2为SF5，第三透镜S3 为NLAF34，第四透镜S4为NLASF9，第五透镜S5为NSF56，第六透镜S6为NLAK34，第七透镜S7为SF57，第八透镜S8为SF2，第九透镜S9为NLAF21，第十透镜S10为NLAF21，第十一透镜S11为SF2，第十二透镜S12为PPK53，第十三透镜S13为SF5G10；
所述的待测样品17距离所述的第一透镜S1的空气间隔为变量，变化范围从50至200毫米；
所述第一透镜S1的中心厚度为4.678±0.1毫米，所述第一透镜S1与第二透镜S2和第三透镜S3组成胶合透镜J1之间的空气间隔为1.0±0.1毫米；所述第二透镜S2和第三透镜S3组成胶合透镜J1的中心厚度为19.891±0.1毫米，所述第二透镜S2和第三透镜S3组成胶合透镜J1与第四透镜S4和第五透镜S5组成胶合透镜J2之间的空气间隔为9.986±0.1毫米；所述第四透镜S4和第五透镜S5组成胶合透镜J2的中心厚度为21.593±0.1毫米，所述第四透镜S4和第五透镜S5组成胶合透镜J2与第六透镜S6之间的空气间隔为1.438±0.1毫米；所述第六透镜S6的中心厚度为10.128±0.1毫米，所述第六透镜S6与第七透镜S7之间的空气间隔为变量，变化范围从4.563±0.1至69.469±0.1毫米；所述第七透镜S7的中心厚度为2.0±0.1毫米，所述第七透镜S7与第八透镜S8和第九透镜S9组成胶合透镜J3之间的空气间隔为1.0±0.1毫米；所述第八透镜S8和第九透镜S9组成胶合透镜J3的中心厚度为6.629±0.1毫米，所述第八透镜S8和第九透镜S9组成胶合透镜J3与第十透镜S10和第十一透镜S11组成胶合透镜J4之间的空气间隔为变量，变化范围从1.0±0.1至33.162±0.1毫米；所述第十透镜S10和第十一透镜S11组成胶合透镜J4的中心厚度为17.276±0.1毫米，所述第十透镜S10和第十一透镜S11组成胶合透镜J4与第十二透镜S12之间的空气间隔为变量，变化范围从0.930±0.1至25.0±0.1毫米；所述第十二透镜S12的中心厚度为6.614±0.1毫米，所述第十二透镜S12与第十三透镜S13之间的空气间隔为变量，变化范围从1.438±0.1至9.055±0.1毫米；所述第十三透镜S13的中心厚度为5.356±0.1毫米，所述第十三透镜S13与所述的光纤前端面之间的空气间隔为18.0±0.1毫米；
所述的光学系统S工作波段为380nm至近红外1064nm；
所述的光学系统S的后工作距离为18.0毫米，轴上像点发散角2α为30.6度；
所述光学系统S变焦位置1的实际镜片参数和镜片中心距参数如下表1所示：
表1(单位mm)：
Figure PCTCN2021073912-appb-000006
Figure PCTCN2021073912-appb-000007
注：表中带*的量为变量
光学系统S中厚度变量的变化范围如表2所示：
表2(单位mm)：
表面 变焦位置1 变焦位置2
物面 50.000 200.000
透镜S6后表面 69.469 4.563
透镜S9后表面 1.000 33.162
透镜S11后表面 25.000 0.9299
透镜S12后表面 9.055 1.438
表3给出了光学系统S中的非球面数据，其中非球面公式为：
Figure PCTCN2021073912-appb-000008
其中，
z：非球面的深度
r：从光轴到透镜面的距离(高度)(mm)
K：离心率
c：近轴曲率
A,B,C,D…….:4,6,8,10阶非球面系数
表3：
Figure PCTCN2021073912-appb-000009
Figure PCTCN2021073912-appb-000010
图3给出了两个变焦位置的点列图，可以看出在整个变焦范围内，像点均方根直径100微米至150微米，也就是在光纤前端面上的光斑直径跟普通光纤的直径基本相等。同时，光学系统S的后工作距离为18毫米，透镜S13上的光斑直径为4.93毫米，这就保证了轴上像点发散角2α为30.6度，很好的匹配光纤耦合条件，提高空间光耦合进光纤的耦合效率。系统测量灵敏度大大提高。
图4和图5给出了两个变焦位置的垂轴色差图，可以看出在整个变焦范围内，在380nm至1060nm波段范围内，垂轴色差都小于0.03毫米，这就解决了宽光谱检测时不同波长的时间延迟问题。保证了信号的准确性，为动力学过程和瞬态过程的测量提供了坚实的基础。
图6至图9，给出了此实施例中光学系统S的成像性能，结果显示，成像效果优异，能准确的进行信号的收集和探测。
利用上述一种非线性光学泵浦探测装置进行双光子吸收截面谱的测量方法包括下列步骤：
S1、系统初始化
根据实际测量需要，以及激光器参数设置非线性光学泵浦探测装置中部分器件的初始值，具体如下：
①根据实际测量需要，选择合适激光器，根据激光器自身参数(如输出功率大小，脉冲频率等)调节所述的斩波器3来控制入射到所述的待测样品17的激光重复频率。调节所述的第二偏振片5的偏振方向为竖直，调节所述的第一偏振片4来调节整个光路的入射能量，保证在所述的第一可调衰减片9、第二可调衰减片21透过率为100％的情况下，所述的待测样品17、光功率计30、光学多道分析仪19不会损坏。调节所述的第九反射镜28、第四会聚透镜29，使激光会聚于所述的待测样品17的后表面，调节所述的第二可调衰减片21使激光能量略低于在所述的待测样品17中产生双光子吸收的能量阈值。调节所述的第一会聚透镜10使激光会聚于所述的重水池11的中心位置，调节所述的第一可调衰减片9使所述的重水池11产生稳定的白光。调节所述的第二会聚透镜14使所述的白光平行出射。调节所述的第三会聚透镜16使所述的白光会聚于所述的待测样品17，且与所述的第四会聚透镜29会聚光束产生有效重合。调节所述的高性能线性平移台A使所述的非简并激发光路和所述的非简并探测光路同步。调节所述的第五会聚透镜33使激光会聚于所述的待测样品17，且会聚点与所述的非简并光路不重合。调节所述的第十反射镜41使所述的参考光路经过所述的待测样品17，且不和所述的简并光路和非简并光路重合。分别调节所述的第一光信号收集系统18、第二光信号收集系统34、第三光信号收集系统42使所述的光学多道分析仪19接收到的信号最强。
S2、非线性吸收光谱测量
非线性吸收光谱分为非简并吸收光谱和简并吸收光谱，测量过程为同时进行，具体如下：
②非线性吸收光谱测量
装置开机后，待所述的激光器1输出稳定后，所述的第三会聚透镜16出射的激光与所述的第四会聚透镜29出射的激光在所述的待测样品17中以小角度10°重合。在装置初始化的基础上，所述的第一可调衰减片9、第二可调衰减片21、第一会聚透镜10、第二会聚透镜14、第三会聚透镜16、第四会聚透镜29、第五会聚透镜33、第一光信号收集系统18、第二光信号收集系统34、第三光信号收集系统42、高性能线性平移台A均通过所述的电脑20逐个循环进行优化。直至所述的光学多道分析仪19所接收的所述的第一光信号收集系统18、第二光信号收集系统34、第三光信号收集系统42的信号皆为最强为止。此时，通过所述的电脑20设置采样积分时间和采样次数，通过所述的光学多道分析仪19同时对所述的第一光信号收集系统18、第二光信号收集系统34、第三光信号收集系统42的光信号进行多次采集存储，分别得到所述待测样品17的非简并透射光谱P1、简并透射光谱P2、参考光谱P3。然后将所述的待测样品17从装置中取出，放入事先配好的不含待测样品的参比样品50，通过所述的光学多道分析仪19同时对所述的第一光信号收集系统18、第二光信号收集系统34、第三光信号收集系统42的光信号进行多次采集存储，分别得到所述参比样品50的非简并透射光谱P4、简并透射光谱P5、参考光谱P6。
S3、监测部分
对于测量过程中可能遇到的影响因素进行监测，发现异常及时处理，具体如下：
③测量过程中，所述的电脑20实时通过所述的光学多道分析仪19对所述的第三光信号收集系统42的光信号进行反复采集存储。通过对数据的实时分析得到装置的工作状态，如果测量过程中前后两次得到的数据差别较大，则自动放弃此次过程S2所测得数据。所述的电脑20实时通过所述的光功率计30进行实时监测，如果测量过程中功率发生变化，说明激光器不稳定，则自动放弃此次过程S2所测得数据。并重新开始步骤S2的测量。
S4、数据处理
根据实验所得数据进行相应处理，得到所述的待测样品17的非简并吸收光谱和简并吸收光谱。具体如下：
④将实验得到的所述的待测样品17的非简并透射光谱P1、简并透射光谱P2分别逐点对照参考光谱P3进行归一化处理，分别得到归一化非简并透射光谱P1’、归一化简并透射光谱P2’。
将实验得到的所述的参比样品50的非简并透射光谱P4、简并透射光谱P5分别逐点对照参考光谱P6进行归一化处理，分别得到归一化非简并透射光谱P4’、归一化简并透射光谱P5’。
将归一化的非简并透射光谱P1’减去归一化的非简并透射光谱P4’得到所述的待测样品17的相对非简并吸收光谱X1；将归一化的简并透射光谱P2’减去归一化的简并透射光谱P5’得到所述的待测样品17的相对简并吸收光谱X2；
下面来计算波长λ处的绝对吸收截面：
探测光的归一化透过率Q’(τ d)与归一化延迟时间τ d(延迟时间与激发光脉冲宽度的比值)的关系为：
Figure PCTCN2021073912-appb-000011
其中，W＝w p/w e为探测光脉冲宽度与激发光脉冲宽度的比值，erf(τ)作为误差函数，定义为：
Figure PCTCN2021073912-appb-000012
ρ为激发光和探测光之间的群速度失配参数，可以由色散关系得到：
Figure PCTCN2021073912-appb-000013
在本次研究中，由于溶液色散关系未知，因此将ρ作为拟合参数。另一拟合参数γ和非简并双光子吸收系数β ND的关系表示为：
Figure PCTCN2021073912-appb-000014
其中，L为样品厚度，n 1和n 2为激发光和探测光的线性折射率(在此近似认为是相等的)，I 1 0为焦点处激发光的峰值功率密度，由所述的光功率计30得到的功率进行换算。
非简并双光子吸收截面δ ND与非简并双光子吸收系数β ND之间的关系为：
Figure PCTCN2021073912-appb-000015
其中，h为普朗克常数，υ1和υ2为激发光和探测光的光子频率，N A为阿伏伽德罗常数，C为样品浓度。
通过(1)式对实验数据(归一化透过率随延迟时间的变化关系)进行拟合，可以得到拟合参数γ，由γ值通过(4)式可以求得非简并双光子吸收系数β ND，进而由(5)式得到非简并双光子吸收截面δ ND。
将所述的相对非简并吸收光谱X1和相对简并吸收光谱X2在整个光谱区按照相应比例(δ ND除以波长λ处吸收系数)放大，得到相应的绝对非简并双光子吸收截面谱X3和绝对简并双光子吸收截面谱X4。并将结果输出。
所述以上步骤S2、S3、S4可以在软件中实现一键控制，从而实现测量过程自动化。其流程图如图10所示。
S5、非线性性能动力学测量过程
本装置还可以测量样品的简并和非简并双光子吸收光谱的动力学过程。
⑤在步骤S1中调节所述的高性能线性平移台A使所述的非简并泵浦激发光路和所述的非简并探测光路同步后，以此位置为0时刻，连续等间隔的改变泵浦激发光和探测光的光程差(也就是延迟时间差)，每改变一次光程差重复步骤S2、S3、S4得到一组双光子吸收截面光谱，在不同延迟时间下可以得到一系列的双光子吸收截面谱，这就为研究材料的动力学过程提供了充足的数据。
上文所列出的一系列的详细说明仅仅是针对本发明的可行性实施方式的具体说明，它们并非用以限制本发明的保护范围，凡未脱离本发明技术所创的等效方式或变更均应包含在本发明的保护范围之内。

Claims (18)

  1. 一种非线性光学泵浦探测装置，其特征在于，包括主光路、非简并探测系统、非简并激发系统、简并探测系统、参考系统；
    主光路依次包括激光器(1)、第一小孔光阑(2)、斩波器(3)、第一偏振片(4)、第二偏振片(5)、第一反射镜(6)、第一激光分光镜(7)；
    非简并探测系统依次包括第二反射镜(8)、第一可调衰减片(9)、第一会聚透镜(10)、重水池(11)、第二小孔光阑(12)、中性滤光片(13)、第二会聚透镜(14)、第二激光分光镜(15)、第三会聚透镜(16)、待测样品(17)、第一光信号收集系统(18)，所述的第一光信号收集系统(18)经光纤连接到光学多道分析仪(19)，所述的光学多道分析仪(19)连接到电脑(20)；
    非简并激发系统依次包括第二可调衰减片(21)、第三反射镜(22)、第四反射镜(23)、第五反射镜(24)、第六反射镜(25)、第七反射镜(26)、第八反射镜(27)、第九反射镜(28)、第四会聚透镜(29)、待测样品(17)、光功率计(30)；所述的第三会聚透镜(16)出射的激光与所述的第四会聚透镜(29)出射的激光在所述的待测样品(17)中以角度5°-15°重合；
    简并探测系统依次包括第三激光分光镜(31)、三棱镜(32)、第五会聚透镜(33)、待测样品(17)、第二光信号收集系统(34)，所述的第二光信号收集系统(34)经光纤连接到所述的光学多道分析仪(19)，所述的光学多道分析仪(19)连接到电脑(20)；
    参考系统依次包括第十反射镜(41)、待测样品(17)、第三光信号收集系统(42)，所述的第三光信号收集系统(42)经光纤连接到所述的光学多道分析仪(19)，所述的光学多道分析仪(19)连接到电脑(20)。
  2. 根据权利要求1所述的非线性光学泵浦探测装置，其特征在于，
    所述的第三反射镜(22)、第四反射镜(23)、第七反射镜(26)、第八反射镜(27)安装在高性能线性平移台(A)上；
    所述的第一可调衰减片(9)、第二可调衰减片(21)、第一会聚透镜(10)、第二会聚透镜(14)、第三会聚透镜(16)、第四会聚透镜(29)、第五会聚透镜(33)、光功率计(30)、第一光信号收集系统(18)、第二光信号收集系统(34)、第三光信号收集系统(42)、高性能线性平移台(A)均通过控制线与所述的电脑(20)直接相连；
    所述的第一小孔光阑(2)直径为5mm，所述的第二小孔光阑(12)直径10mm；所述的斩波器(3)频率可调范围为4HZ至10KHZ；所述的第二偏振片(5)偏振方向为水平；所述的第一反射镜(6)、第二反射镜(8)、第三反射镜(22)、第四反射镜(23)、第五反射镜(24)、第六反射镜(25)、第七反射镜(26)、第八反射镜(27)与主光轴均成45°；所述的第一激光分光镜(7)、第二激光分光镜(15)、第三激光分光镜(31)与主光轴均成45°；所述的第一激光分光镜(7)透射率为10％，反射率为90％；所述的第二激光分光镜(15)透射率为50％，反射率为50％；所述的第三激光分光镜(31)透射率为10％，反射率为90％；所述的第一会聚透镜(10)、第二会聚透镜(14)、第三会聚透镜(16)、第五会聚透镜(33)焦距均为10cm，所述的第四会聚透镜(29)焦距为50cm；所述的待测样品(17)厚度为10mm；所述的第一光信号收集系统(18)、第二光信号收集系统(34)、第三光信号收集系统(42)为完全相同的光学系统(S)。
  3. 根据权利要求1所述的非线性光学泵浦探测装置，其特征在于，
    所述的光学系统(S)依次包括第一透镜(S1)、第二透镜(S2)、第三透镜(S3)、第四透镜(S4)、第五透镜(S5)、第六透镜(S6)、第七透镜(S7)、第八透镜(S8)、第九透镜(S9)、第十透镜(S10)、第十一透镜(S11)、第十二透镜(S12)、第十三透镜(S13)。
  4. 根据权利要求3所述的非线性光学泵浦探测装置，其特征在于，
    所述第一透镜(S1)设置有孔径光阑；
    所述第一透镜(S1)为正透镜、第二透镜(S2)为负透镜、第三透镜(S3)为正透镜、第四透镜(S4)为正透镜、第五透镜(S5)为负透镜、第六透镜(S6)为正透镜、第七透镜(S7)为负透镜、第八透镜(S8)为负透镜、第九透镜(S9)为正透镜、第十透镜(S10)为正透镜、第十一透镜(S11)为负透镜、第十二透镜(S12)为正透镜、第十三透镜(S13)为正透镜。
  5. 根据权利要求3所述的非线性光学泵浦探测装置，其特征在于，
    所述第一透镜(S1)为弯月形凹透镜、第二透镜(S2)为弯月形凹透镜、第三透镜(S3)为双凸透镜、第四透镜(S4)为双凸透镜、第五透镜(S5)为双凹透镜、第六透镜(S6)为双凸透镜、第七透镜(S7)为双凹透镜、第八透镜(S8)为弯月形凹透镜、第九透镜(S9)为双凸透镜、第十透镜(S10)为弯月形凹透镜、第十一透镜(S11)为弯月形凹透镜、第十二透镜(S12)为双凸透镜、第十三透镜(S13)为弯月形凹透镜；
    所述第二透镜(S2)和第三透镜(S3)组成胶合透镜((J1))，且双胶合透镜的胶合面朝向孔径光阑；所述第四透镜(S4)和第五透镜(S5)组成胶合透镜((J2))，且双胶合透镜的胶合面背离孔径光阑；所述第八透镜(S8)和第九透镜(S9)组成胶合透镜((J3))，且双胶合透镜的胶合面朝向孔径光阑；所述第十透镜(S10)和第十一透镜(S11)组成胶合透镜((J4))，且双胶合透镜的胶合面背离孔径光阑；
    所述第十一透镜(S11)、第十二透镜(S12)、第十三透镜(S13)均为非球面透镜；所述第一透镜(S1)、第二透镜(S2)、第三透镜(S3)、第四透镜(S4)、第五透镜(S5)、第六透镜(S6)、第七透镜(S7)、第八透镜(S8)、第九透镜(S9)、第十透镜(S10)均为球面透镜。
  6. 根据权利要求3所述的非线性光学泵浦探测装置，其特征在于，
    所述第一透镜(S1)、第二透镜(S2)、第三透镜(S3)、第四透镜(S4)、第五透镜(S5)和第六透镜(S6)的组合焦距为f1-6，第七透镜(S7)的焦距为f7；且1.5<∣f1-6/f7∣<3；
    所述的第一透镜(S1)的透光孔径为D1，且45<D1<55。
  7. 根据权利要求3所述的非线性光学泵浦探测装置，其特征在于，
    镜片材料采用肖特公司的玻璃材料，第一透镜(S1)为SF6，第二透镜(S2)为SF5，第三透镜(S3)为NLAF34，第四透镜(S4)为NLASF9，第五透镜(S5)为NSF56，第六透镜(S6)为NLAK34，第七透镜(S7)为SF57，第八透镜(S8)为SF2，第九透镜(S9)为NLAF21，第十透镜(S10)为NLAF21，第十一透镜(S11)为SF2，第十二透镜(S12)为PPK53，第十三透镜(S13)为SF5G10。
  8. 根据权利要求3所述的非线性光学泵浦探测装置，其特征在于，
    所述的待测样品(17)距离所述的第一透镜(S1)的空气间隔为变量，变化范围从50至200毫米；
    所述第一透镜(S1)的中心厚度为4.678±0.1毫米，所述第一透镜(S1)与第二透镜(S2)和第三透镜(S3)组成胶合透镜(J1)之间的空气间隔为1.0±0.1毫米；所述第二透镜(S2)和第三透镜(S3)组成胶合透镜(J1)的中心厚度为19.891±0.1毫米，所述第二透镜(S2)和第三透镜(S3)组成胶合透镜(J1)与第四透镜(S4)和第五透镜(S5)组成胶合透镜(J2)之间的空气间隔为9.986±0.1毫米；所述第四透镜(S4)和第五透镜(S5)组成胶合透镜(J2)的中心厚度为21.593±0.1毫米，所述第四透镜(S4)和第五透镜(S5)组成胶合透镜(J2)与第六透镜(S6)之间的空气间隔为1.438±0.1 毫米；所述第六透镜(S6)的中心厚度为10.128±0.1毫米，所述第六透镜(S6)与第七透镜(S7)之间的空气间隔为变量，变化范围从4.563±0.1至69.469±0.1毫米；所述第七透镜(S7)的中心厚度为2.0±0.1毫米，所述第七透镜(S7)与第八透镜(S8)和第九透镜(S9)组成胶合透镜(J3)之间的空气间隔为1.0±0.1毫米；所述第八透镜(S8)和第九透镜(S9)组成胶合透镜(J3)的中心厚度为6.629±0.1毫米，所述第八透镜(S8)和第九透镜(S9)组成胶合透镜(J3)与第十透镜(S10)和第十一透镜(S11)组成胶合透镜(J4)之间的空气间隔为变量，变化范围从1.0±0.1至33.162±0.1毫米；所述第十透镜(S10)和第十一透镜(S11)组成胶合透镜(J4)的中心厚度为17.276±0.1毫米，所述第十透镜(S10)和第十一透镜(S11)组成胶合透镜(J4)与第十二透镜(S12)之间的空气间隔为变量，变化范围从0.930±0.1至25.0±0.1毫米；所述第十二透镜(S12)的中心厚度为6.614±0.1毫米，所述第十二透镜(S12)与第十三透镜(S13)之间的空气间隔为变量，变化范围从1.438±0.1至9.055±0.1毫米；所述第十三透镜(S13)的中心厚度为5.356±0.1毫米，所述第十三透镜(S13)与所述的光纤前端面之间的空气间隔为18.0±0.1毫米。
  9. 根据权利要求3所述的非线性光学泵浦探测装置，其特征在于，
    所述的光学系统(S)工作波段为380nm至近红外1064nm。
  10. 根据权利要求3所述的非线性光学泵浦探测装置，其特征在于，
    所述的光学系统(S)的后工作距离为18.0毫米，轴上像点发散角2α为30.6度。
  11. 一种非线性光学吸收截面测量方法，其特征在于，包括如下：
    S1、系统初始化：根据实际测量需要，以及激光器参数设置非线性光学泵浦探测装置中部分器件的初始值；
    S2、测量非线性吸收光谱：非线性吸收光谱包括非简并吸收光谱和简并吸收光谱，测量过程同时进行；
    S3、监测：对于测量过程中可能遇到的影响因素进行监测，发现异常及时处理；
    S4、数据处理：根据实验所得数据进行相应处理，得到所述的待测样品(17)的非简并吸收光谱和简并吸收光谱。
  12. 根据权利要求11所述的一种非线性光学吸收截面测量方法，其特征在于，
    所述S1的具体实现如下：
    根据实际测量需要，选择合适激光器，根据激光器自身参数调节所述的斩波器(3)来控制入射到所述的待测样品(17)的激光重复频率；调节所述的第二偏振片(5)的偏振方向为竖直，调节所述的第一偏振片(4)来调节整个光路的入射能量，保证在所述的第一可调衰减片(9)、第二可调衰减片(21)透过率为100％的情况下，所述的待测样品(17)、光功率计(30)、光学多道分析仪(19)不会损坏；调节所述的第九反射镜(28)、第四会聚透镜(29)，使激光会聚于所述的待测样品(17)的后表面，调节所述的第二衰减片21使激光能量略低于在所述的待测样品(17)中产生双光子吸收的能量阈值；调节所述的第一会聚透镜(10)使激光会聚于所述的重水池(11)的中心位置，调节所述的第一可调衰减片(9)使所述的重水池(11)产生稳定的白光；调节所述的第二会聚透镜(14)使所述的白光平行出射；调节所述的第三会聚透镜(16)使所述的白光会聚于所述的待测样品(17)，且与所述的第四会聚透镜(29)会聚光束产生有效重合；调节所述的高性能线性平移台(A)使所述的非简并激发光路和所述的非简并探测光路同步；调节所述的第五会聚透镜(33)使激光会聚于所述的待测样品(17)，且会聚点与所述的非简并光路不重合；调节所述的第十反射镜(41)使所述的参考光路经过所述的待测样品(17)，且不和所述的简并光路和非简并 光路重合；分别调节所述的第一光信号收集系统(18)、第二光信号收集系统(34)、第三光信号收集系统(42)使所述的光学多道分析仪(19)接收到的信号最强。
  13. 根据权利要求12所述的一种非线性光学吸收截面测量方法，其特征在于，
    所述激光器自身参数包括输出功率大小，脉冲频率。
  14. 根据权利要求12所述的一种非线性光学吸收截面测量方法，其特征在于，
    所述S2的具体实现如下：
    非线性吸收光谱测量
    装置开机后，待所述的激光器1输出稳定后，所述的第三会聚透镜(16)出射的激光与所述的第四会聚透镜(29)出射的激光在所述的待测样品(17)中以小角度重合；在装置初始化的基础上，所述的第一可调衰减片(9)、第二可调衰减片(21)、第一会聚透镜(10)、第二会聚透镜(14)、第三会聚透镜(16)、第四会聚透镜(29)、第五会聚透镜(33)、第一光信号收集系统(18)、第二光信号收集系统(34)、第三光信号收集系统(42)、高性能线性平移台(A)均通过所述的电脑(20)逐个循环进行优化；直至所述的光学多道分析仪(19)所接收的所述的第一光信号收集系统(18)、第二光信号收集系统(34)、第三光信号收集系统(42)的信号皆为最强为止；此时，通过所述的电脑(20)设置采样积分时间和采样次数，通过所述的光学多道分析仪(19)同时对所述的第一光信号收集系统(18)、第二光信号收集系统(34)、第三光信号收集系统(42)的光信号进行多次采集存储，分别得到所述待测样品(17)的非简并透射光谱P1、简并透射光谱P2、参考光谱P3；然后将所述的待测样品(17)从装置中取出，放入事先配好的不含待测样品的参比样品(50)，通过所述的光学多道分析仪(19)同时对所述的第一光信号收集系统(18)、第二光信号收集系统(34)、第三光信号收集系统(42)的光信号进行多次采集存储，分别得到所述参比样品(50)的非简并透射光谱P4、简并透射光谱P5、参考光谱P6。
  15. 根据权利要求14所述的一种非线性光学吸收截面测量方法，其特征在于，
    所述小角度为5°～15°。
  16. 根据权利要求14所述的一种非线性光学吸收截面测量方法，其特征在于，
    所述S3的具体实现如下：
    测量过程中，所述的电脑(20)实时通过所述的光学多道分析仪(19)对所述的第三光信号收集系统(42)的光信号进行反复采集存储；通过对数据的实时分析得到装置的工作状态，如果测量过程中前后两次得到的数据差别较大，则自动放弃步骤2所测得数据；所述的电脑(20)实时通过所述的光功率计(30)进行实时监测，如果测量过程中功率发生变化，说明激光器不稳定，则自动放弃步骤2所测得数据。
  17. 根据权利要求16所述的一种非线性光学吸收截面测量方法，其特征在于，
    所述S4的具体如下：
    将实验得到的所述的待测样品(17)的非简并透射光谱P1、简并透射光谱P2分别逐点对照参考光谱P3进行归一化处理，分别得到归一化非简并透射光谱P1’、归一化简并透射光谱P2’；
    将实验得到的所述的参比样品(50)的非简并透射光谱P4、简并透射光谱P5分别逐点对照参考光谱P6进行归一化处理，分别得到归一化非简并透射光谱P4’、归一化简并透射光谱P5’；
    将归一化的非简并透射光谱P1’减去归一化的非简并透射光谱P4’得到所述的待测样品(17)的相对非简并吸收光谱X1；将归一化的简并透射光谱P2’减去归一化的简并透射光谱P5’得到所述的待测样品(17)的相对简并吸收光谱X2；
    下面计算波长λ处的绝对吸收截面：
    探测光的归一化透过率Q’(τ d)与归一化延迟时间τ d(延迟时间与激发光脉冲宽度的比值)的关系为：
    Figure PCTCN2021073912-appb-100001
    其中，W＝w p/w e为探测光脉冲宽度与激发光脉冲宽度的比值，erf(τ)作为误差函数，定义为：
    Figure PCTCN2021073912-appb-100002
    ρ为激发光和探测光之间的群速度失配参数，可以由色散关系得到：
    Figure PCTCN2021073912-appb-100003
    其中，d n为折射率变化，d λ为波长变化，λ表示波长，n表示折射率，下标p表示激发光，下标e表示探测光，c表示光速；
    针对溶液色散关系未知，因此将ρ作为拟合参数；另一拟合参数γ和非简并双光子吸收系数β ND的关系表示为：
    Figure PCTCN2021073912-appb-100004
    其中，L为样品厚度，n 1和n 2为激发光和探测光的线性折射率(在此近似认为是相等的)，I 1 0为焦点处激发光的峰值功率密度，由所述的光功率计(30)得到的功率进行换算；
    非简并双光子吸收截面δ ND与非简并双光子吸收系数β ND之间的关系为：
    Figure PCTCN2021073912-appb-100005
    其中，h为普朗克常数，v 1和v 2为激发光和探测光的光子频率，N A为阿伏伽德罗常数，C为样品浓度；
    通过(1)式对实验数据(归一化透过率随延迟时间的变化关系)进行拟合，得到拟合参数γ，由γ值通过(4)式求得非简并双光子吸收系数β ND，进而由(5)式得到非简并双光子吸收截面δ ND；
    将所述的相对非简并吸收光谱X1和相对简并吸收光谱X2在整个光谱区按照相应比例(δ ND除以波长λ处吸收系数)放大，得到相应的绝对非简并双光子吸收截面谱X3和绝对简并双光子吸收截面谱X4,并将结果输出。
  18. 根据权利要求17所述的一种非线性光学吸收截面测量方法，其特征在于，
    所述步骤S2、S3、S4的具体实现可以在软件中实现一键控制，实现测量过程自动化。
PCT/CN2021/073912 2020-02-28 2021-01-27 一种非线性光学泵浦探测装置及非线性光学吸收截面测量方法 Ceased WO2021169713A1 (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US17/781,003 US11719629B2 (en) 2020-02-28 2021-01-27 Non-linear optical pumping detection apparatus and non-linear optical absorption cross-section measurement method
GB2219709.9A GB2611908B (en) 2020-02-28 2021-01-27 Non-linear optical pumping detection apparatus and non-linear optical absorption cross-section measurement method

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
CN202010127319.6A CN111220572B (zh) 2020-02-28 2020-02-28 一种非线性光学泵浦探测装置
CN202010127302.0A CN111308654B (zh) 2020-02-28 2020-02-28 一种用于微弱光信号收集的变焦光学系统
CN202010127320.9A CN111220573B (zh) 2020-02-28 2020-02-28 一种非线性光学吸收截面测量方法
CN202010127319.6 2020-02-28
CN202010127320.9 2020-02-28
CN202010127302.0 2020-02-28

Publications (1)

Publication Number Publication Date
WO2021169713A1 true WO2021169713A1 (zh) 2021-09-02

Family

ID=77489863

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2021/073912 Ceased WO2021169713A1 (zh) 2020-02-28 2021-01-27 一种非线性光学泵浦探测装置及非线性光学吸收截面测量方法

Country Status (3)

Country Link
US (1) US11719629B2 (zh)
GB (1) GB2611908B (zh)
WO (1) WO2021169713A1 (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114486739A (zh) * 2022-01-25 2022-05-13 山东大学 一种测量非线性光学系数的z扫描测量装置及测量方法
CN116879242A (zh) * 2023-06-03 2023-10-13 北京工业大学 一种全波段可调偏振的非线性光学特性原位检测装置
CN119470362A (zh) * 2024-10-10 2025-02-18 中国科学院上海光学精密机械研究所 共轴简并与非简并式超快载流子动力学的材料测量系统及方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116087156B (zh) * 2023-04-12 2023-06-20 南京诺派激光技术有限公司 一种高信噪比的简并泵浦探测装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1945342A (zh) * 2006-09-15 2007-04-11 江苏大学 双光束－两角度超短脉冲激光抽运探测方法及其装置
CN101109703A (zh) * 2007-08-06 2008-01-23 苏州大学 基于4f相位相干成像的泵浦探测方法
US20140051191A1 (en) * 2011-11-23 2014-02-20 University Of Central Florida Research Foundation Inc. Extremely non-degenerate two photon absorption optical sensing method, apparatus and applications
CN107449738A (zh) * 2017-06-20 2017-12-08 江苏大学 一种双光束泵浦探测实验系统
CN109406454A (zh) * 2018-09-11 2019-03-01 江苏大学 一种改进的z扫描装置
CN111220572A (zh) * 2020-02-28 2020-06-02 江苏大学 一种非线性光学泵浦探测装置
CN111220573A (zh) * 2020-02-28 2020-06-02 江苏大学 一种非线性光学吸收截面测量方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6982431B2 (en) * 1998-08-31 2006-01-03 Molecular Devices Corporation Sample analysis systems
JP2014092682A (ja) * 2012-11-02 2014-05-19 Olympus Corp 顕微鏡用照明装置及びそれを備えた顕微鏡
US9733124B2 (en) * 2013-04-18 2017-08-15 BMG LABTECH, GmbH Microplate reader with linear variable filter
JP7037277B2 (ja) * 2017-03-01 2022-03-16 オリンパス株式会社 観察装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1945342A (zh) * 2006-09-15 2007-04-11 江苏大学 双光束－两角度超短脉冲激光抽运探测方法及其装置
CN101109703A (zh) * 2007-08-06 2008-01-23 苏州大学 基于4f相位相干成像的泵浦探测方法
US20140051191A1 (en) * 2011-11-23 2014-02-20 University Of Central Florida Research Foundation Inc. Extremely non-degenerate two photon absorption optical sensing method, apparatus and applications
CN107449738A (zh) * 2017-06-20 2017-12-08 江苏大学 一种双光束泵浦探测实验系统
CN109406454A (zh) * 2018-09-11 2019-03-01 江苏大学 一种改进的z扫描装置
CN111220572A (zh) * 2020-02-28 2020-06-02 江苏大学 一种非线性光学泵浦探测装置
CN111220573A (zh) * 2020-02-28 2020-06-02 江苏大学 一种非线性光学吸收截面测量方法

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
SHUI MIN, ZHONG-GUO LI, XIAO JIN, JUN-YI YANG, ZHONG-QUAN NIE, GUANG SHI, X. WU, KUN YANG, XUERU ZHANG, YUXIAO WANG, YINGLIN SONG: "Measurements of dynamics of nondegenerate optical nonlinearity in ZnS with pulses from optical parameter generation", OPTICS COMMUNICATIONS, vol. 285, 7 December 2011 (2011-12-07), pages 1940 - 1944, XP055841444, DOI: 10.1016/j.optcom.2011.11.061 *
XU HUANTIAN: "Master Thesis", 1 April 2018, ZHENGZHOU UNIVERSITY, CN, article XU HUANTIAN: "Nondegenerate Two-photon Absorption Properties of Fluorescent Dyes", pages: 1 - 75, XP055841614 *
YAMAGUCHI, S. ; TAHARA, T.: "Observation of an optically forbidden state of C"6"0 by nondegenerate two-photon absorption spectroscopy", CHEMICAL PHYSICS LETTERS, ELSEVIER BV, NL, vol. 390, no. 1-3, 21 May 2004 (2004-05-21), NL, pages 136 - 139, XP027108577, ISSN: 0009-2614, DOI: 10.1016/j.cplett.2004.03.146 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114486739A (zh) * 2022-01-25 2022-05-13 山东大学 一种测量非线性光学系数的z扫描测量装置及测量方法
CN114486739B (zh) * 2022-01-25 2024-06-11 山东大学 一种测量非线性光学系数的z扫描测量装置及测量方法
CN116879242A (zh) * 2023-06-03 2023-10-13 北京工业大学 一种全波段可调偏振的非线性光学特性原位检测装置
CN119470362A (zh) * 2024-10-10 2025-02-18 中国科学院上海光学精密机械研究所 共轴简并与非简并式超快载流子动力学的材料测量系统及方法

Also Published As

Publication number Publication date
US11719629B2 (en) 2023-08-08
GB202219709D0 (en) 2023-02-08
GB2611908B (en) 2024-05-15
GB2611908A (en) 2023-04-19
US20220412882A1 (en) 2022-12-29

Similar Documents

Publication Publication Date Title
WO2021169713A1 (zh) 一种非线性光学泵浦探测装置及非线性光学吸收截面测量方法
CN111220572B (zh) 一种非线性光学泵浦探测装置
CN102937573B (zh) Z扫描光学非线性测量装置和测量方法
CN101608999B (zh) 实时观察的单束双模参数可调z扫描装置和测量方法
CN103033488B (zh) 可实时观察监测z扫描光学非线性测量装置和方法
CN101806723B (zh) 双束多功能z扫描光学非线性测量装置和方法
CN108120702B (zh) 一种基于并行探测的超分辨荧光寿命成像方法和装置
CN205301164U (zh) 一种实时高效的非线性光谱特性测量装置
CN111220573B (zh) 一种非线性光学吸收截面测量方法
CN108007571B (zh) 基于光纤耦合的cars光束空间稳定性测试控制系统和方法
CN101308091B (zh) 测量光学非线性的4f相位相干成像方法
CN101819086A (zh) 光纤色散测量系统及其使用方法
CN105067528B (zh) 二维共焦显微非线性强度扫描系统和测量方法
CN109406453B (zh) 一种自动确定最优入射光强的z扫描测量方法
CN103499562B (zh) 一种正置与倒置联用的共聚焦激光光镊拉曼光谱测试装置
CN108414443B (zh) 一种实现超短单脉冲时间分辨泵浦探测的方法及系统
CN103884659B (zh) 角分辨微纳光谱分析装置
CN105737995A (zh) 基于积分球的高功率激光多参数测量装置
CN119334922A (zh) 一种激光诱导拉曼、荧光光谱测试系统
CN107357112B (zh) 基于共线切割双折射晶体的量子行走装置
CN204903381U (zh) 非线性薄膜材料的光学非线性测量装置
Liao et al. Off-axis co-optical path large-range line scanning chromatic confocal sensor
CN100554942C (zh) 消除非线性吸收影响的非线性折射性质测量方法
CN110567934A (zh) 一种基于微结构光纤的拉曼测试辅助调节耦合的实时成像系统及测试方法
CN202002885U (zh) 双t-po技术测量材料光学非线性的装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 21760400

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

ENP Entry into the national phase

Ref document number: 202219709

Country of ref document: GB

Kind code of ref document: A

Free format text: PCT FILING DATE = 20210127

WWE Wipo information: entry into national phase

Ref document number: 2219709.9

Country of ref document: GB

122 Ep: pct application non-entry in european phase

Ref document number: 21760400

Country of ref document: EP

Kind code of ref document: A1

WWP Wipo information: published in national office

Ref document number: 2219709.9

Country of ref document: GB

122 Ep: pct application non-entry in european phase

Ref document number: 21760400

Country of ref document: EP

Kind code of ref document: A1

WWG Wipo information: grant in national office

Ref document number: 2219709.9

Country of ref document: GB