WO2021166295A1 - Dispositif et procédé de mesure de rayonnement - Google Patents

Dispositif et procédé de mesure de rayonnement Download PDF

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Publication number
WO2021166295A1
WO2021166295A1 PCT/JP2020/034292 JP2020034292W WO2021166295A1 WO 2021166295 A1 WO2021166295 A1 WO 2021166295A1 JP 2020034292 W JP2020034292 W JP 2020034292W WO 2021166295 A1 WO2021166295 A1 WO 2021166295A1
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Prior art keywords
radiation
monochromatic
energy
inspected
photon
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PCT/JP2020/034292
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English (en)
Japanese (ja)
Inventor
克宜 上野
名雲　靖
裕人 中島
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株式会社日立製作所
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20066—Measuring inelastic scatter of gamma rays, e.g. Compton effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors

Definitions

  • the present invention relates to a radiation measuring device and a radiation measuring method.
  • Technology for inspecting these social infrastructures includes a method of imaging the object to be inspected with a camera and evaluating the surface condition by image processing technology, and image processing by irradiating the object to be inspected with a laser and imaging the reflected light.
  • a method of evaluating the surface condition by technology a method of irradiating the object to be inspected with a radar and measuring the reflected wave to evaluate the internal state, and information on the internal density of the object to be inspected using an X-ray or ⁇ -ray source.
  • the method using a camera or a laser can inspect the surface condition of the object to be inspected, but it is difficult to grasp the internal condition. Although it is possible to grasp the internal state by the method using radar, it is difficult to measure the internal direction with high resolution.
  • Patent Document 1 an X-ray beam is irradiated to an inspected object, energy intensity information in the depth direction of Compton scattered X-rays generated from the inspected object is acquired by a plurality of CdTe semiconductor sensors, and two sets of disks are further obtained.
  • a radiation three-dimensional imaging device that detects the energy of Compton scattered X-rays by separating them into two energy bands, high and low, with a riminator and a counter, and obtains information on the structure and material of the inspected object using an image processing unit. ing.
  • Patent Document 2 reduces exposure when using a ⁇ -ray source by irradiating an inspected object with a laser inverse Compton photon having high directivity and monochromaticity and variable photon energy and measuring the transmitted photon.
  • a laser inverse Compton photon having high directivity and monochromaticity and variable photon energy
  • the slit plays the role of a so-called pinhole collimator, and the resolution in the internal direction is determined by the positional relationship between the pinhole collimator and the sensor.
  • the resolution in the internal direction can be improved.
  • it is difficult to increase the resolution in the internal direction because there are processing restrictions in order to reduce the sensor pitch.
  • the light source used is an X-ray source
  • the object to be inspected is generally irradiated with X-rays in a wide energy band. Therefore, even if the energy is measured by the radiation detector, it is difficult to convert the energy information of the Compton scattered photons into the information in the internal direction.
  • Patent Document 2 measures a transmitted image with an object to be inspected sandwiched by using a laser inverse Compton photon having high directivity and monochromaticity and variable photon energy. Since the transmitted light radiated to the object to be inspected is detected, it is difficult to measure the internal direction with high resolution.
  • the present invention has been made in view of such circumstances, and radiation capable of acquiring the internal state of an object to be inspected with high resolution in the internal direction and realizing advanced analysis and monitoring.
  • An object of the present invention is to provide a measuring device and a radiation measuring method.
  • the radiation measuring device of the present invention is a radiation measuring device that detects photons, and comprises a monochromatic photon source that controls the irradiation direction of a monochromatic photon or a quasi-monochromatic photon, and the monochromatic photon source.
  • a radiation detector that detects Compton scattered photons scattered from an object whose relative coordinates are known, an energy measuring device that measures the energy and intensity of the detected Compton scattered photons, and the relative coordinates and the Compton scattered photons.
  • a depth calculation device for calculating the Compton scattered photon intensity distribution in the depth direction of the object to be inspected and an output device for outputting the calculation result of the depth calculation device are provided based on the energy and intensity of the above. It is characterized by.
  • Other aspects of the present invention will be described in embodiments described below.
  • a radiation measuring device and a radiation measuring method capable of acquiring the internal state of an object to be inspected with high resolution in the internal direction and realizing advanced analysis and monitoring based on the result. Can be provided.
  • FIG. 1 is a diagram showing a configuration of a radiation measuring device according to the first embodiment of the present invention.
  • the radiation measuring device and the radiation measuring method of the present embodiment are examples applied to the non-destructive inspection device and the radiation measuring method for grasping the internal state of the object to be inspected with high resolution in the internal direction.
  • the radiation measuring device 100 includes a monochromatic photon source 101, a radiation detector 102, an energy measuring device 103, a depth calculation device 104, and a display device 105 (output device).
  • the monochromatic photon source 101 irradiates a monochromatic or quasi-monochromatic energy monochromatic photon 107 in an arbitrary irradiation direction.
  • the monochromatic photon source 101 controls the irradiation direction of a monochromatic photon or a quasi-monochromatic photon.
  • Monochromatic photons are obtained, for example, using radioactive isotopes (see below).
  • Semi-monochromatic photons are obtained using accelerated positrons (see below).
  • monochromatic photons or quasi-monochromatic photons are collectively referred to as monochromatic photons.
  • the monochromatic photon source 101 has an irradiation direction control function for irradiating photons in an arbitrary irradiation direction.
  • the monochromatic photon source 101 irradiates the inspected object 106 with the monochromatic photon 107.
  • the radiation detector 102 detects the scattered photons 108 that are Compton scattered by the object 106 to be inspected.
  • the radiation detector 102 includes semiconductor detectors such as Ge semiconductor, CdTe semiconductor, CdZnTe semiconductor, Si semiconductor, and CsPbCl 3 , CsPbBr 3 , and LiTaO 3 having a Perovskite structure as photon sensitive materials.
  • the radiation detector 102 may be a LaBr 3 scintillator, a CsBr 3 scintillator, a LYSO scintillator, an LSO scintillator, a GAGG scintillator, a CsI scintillator, a NaI scintillator, a BGO scintillator, a GSO scintillator, a GPS scintillator, a La-GPS scintillator, or a LuAG scintillator. , SrI scintillator and the like.
  • a general radiation detector capable of analyzing photon energy is mentioned here, any of the above semiconductor detectors or scintillation detectors can be used as long as it is a radiation detector equipped with a photon sensitive material capable of energy analysis. Is also applicable.
  • the energy measuring device 103 analyzes the signal output from the radiation detector 102, and calculates the energy spectrum given by the scattered photons 108 in the radiation detector 102 as a peak value spectrum.
  • the depth calculation device 104 inputs the relative positions of the monochromatic photon source 101 and the radiation detector 102, the irradiation vector of the photon emitted from the monochromatic photon source 101, and the peak value spectrum, and inputs the relative coordinates and the energy and intensity of the Compton scattered photon.
  • the intensity distribution of Compton scattered photons in the depth direction of the inspected object 106 is calculated from.
  • the display device 105 displays the intensity distribution of Compton scattered photons in the depth direction output from the depth arithmetic unit 104.
  • the display device 105 is an example of an output device, and the output is not limited to the display. That is, it suffices to output the intensity distribution of Compton scattered photons in the depth direction.
  • a printer that outputs the calculation result of the depth calculation device 104, a communication device that transmits the calculation result via a wireless or wired communication path, and a storage device that stores the calculation result are also included.
  • the radiation measuring device 100 knows the relative coordinates between the monochromatic photon source 101 that controls the irradiation direction of the monochromatic photon or the quasi-monochromatic photon and the monochromatic photon source 101, and compton scattering scattered from the inspected object 106.
  • the depth of the inspected object 106 based on the radiation detector 102 that detects photons, the energy measuring device 103 that measures the energy and intensity of the detected Compton scattered photons, and the relative coordinates and the energy and intensity of the Compton scattered photons. It includes a depth calculation device 104 that calculates the Compton scattered photon intensity distribution in the direction, and a display device 105 (output unit) that displays the calculation result.
  • FIG. 2 is a diagram showing the configuration of the monochromatic photon source 101.
  • the monochromatic photon source 101 includes a radioisotope 109 (radioisotope), a collimator 110, and a photon shutter 111.
  • the monochromatic photon source 101 is a laser inverse Compton scattered photon generator that emits a laser inverse Compton photon.
  • Radioisotope 109 has a very high monochromaticity. Radioisotopes 109 having monochromaticity include Cs-137, Zn-65, Be-7, Cr-51, Co-58, Mn-54, Hg-203, Sr-85, F-18, Ga-68. , Al-28, and K-42, at least one selected from the group.
  • X-rays or ⁇ -rays having an emission energy of less than 20 keV are set to be negligible in measuring the intensity distribution of Compton scattered photons in the depth direction inside the inspected object 106.
  • the radioisotope 109 emits photons isotropically, when the radioisotope 109 is used, a collimeter 110 for controlling the irradiation direction of the photons emitted from the radioisotope 109 is provided.
  • the material of the collimator 110 is selected based on the photon shielding efficiency, outer dimensions, weight, and the like. For example, relatively easily available metals such as lead, iron, stainless steel, tungsten, and aluminum are used.
  • the structure of the collimator 110 includes a pinhole type structure for irradiating the object to be inspected 106 with a pencil beam and a fan beam type structure (see FIG. 18).
  • the radioisotope 109 since the radioisotope 109 continuously emits photons, it is provided with a photon shutter 111 for controlling irradiation and non-irradiation.
  • a photon shutter 111 As the material of the photon shutter 111, similarly to the collimator 110, a relatively easily available metal such as lead, iron, stainless steel, tungsten, or aluminum is used.
  • the photon shutter 111 is arranged between the collimator 110 and the object to be inspected 106, or between the collimator 110 and the monochromatic photon source 101.
  • FIG. 2 shows, as an example, a configuration in which the photon shutter 111 is arranged between the collimator 110 and the object to be inspected 106. As shown by the arrow in FIG. 2, by moving the photon shutter 111 manually or automatically, it is possible to control the irradiation / non-irradiation of photons relatively easily.
  • FIG. 3 is a diagram showing the output of the energy measuring device 130.
  • the horizontal axis represents the peak value (applied energy) of the output signal of the radiation detector 102
  • the vertical axis represents the count value (intensity) of the output signal of the radiation detector 102.
  • the energy measuring device 103 processes the peak value of the output signal of the radiation detector 102 and outputs it as the peak value spectrum 112.
  • the energy measuring device 103 accumulates the crest value data for an arbitrary time and forms the crest value spectrum 112.
  • the depth calculation device 104 is based on the emitted energy Ein of the monochromatic photon source 101 and each energy Es of the peak value spectrum 112 acquired by the energy measuring device 103, and is inside the inspected object 106 according to the following equation (1).
  • the scattering angle ⁇ s of the generated Compton scattering is calculated.
  • Equation (1) is an equation showing the scattering angle ⁇ s of the scattered photons 108 generated by the Compton effect. Equation (1) shows that the scattering angle ⁇ s can be uniquely calculated if the photon energies before and after Compton scattering are known.
  • the depth arithmetic unit 104 uses the position coordinates of the radiation detector 102 (xdet, ydet, zdet), the position coordinates of the monochromatic photon source 101 (0,0, -zsource), and the scattering angle calculated by the equation (1). Based on ⁇ s, the scattering position corresponding to each energy Es, that is, the depth z (Es) is calculated according to the following equation (2).
  • the depth calculation device 104 calculates the intensity distribution of Compton scattered photons in the depth direction.
  • FIG. 4 is a diagram showing the intensity distribution of Compton scattered photons in the depth direction.
  • the horizontal axis represents the depth of Compton scattered photons, and the vertical axis represents the count value (intensity) of Compton scattered photons.
  • the intensity distribution 113 (see the solid line in FIG. 4) of the Compton scattered photons acquired in the inspected object whose internal state is known
  • the Compton acquired in the inspected object whose internal state is unknown The intensity distribution 114 of the scattered photons (see the dashed line in FIG. 4) is shown.
  • the depth arithmetic unit 104 is obtained in the depth direction of the inspected body whose internal state is known and the inspected body whose internal state is unknown and has the same specifications as the known inspected body. By comparing the intensity distributions of Compton scattered photons, changes in the internal state are observed.
  • FIG. 5 is a diagram showing a relative value (when a positive peak occurs) of the intensity distribution of Compton scattered photons in the depth direction.
  • the horizontal axis is the depth of Compton scattered photons
  • the vertical axis is the count value (relative value) of Compton scattered photons.
  • the count value relative value peak 116 in the positive direction is set at a certain depth. You can check. This suggests that the inside of the object to be inspected has a factor that tends to cause Compton scattering.
  • Compton cross-sectional area generally increases in proportion to the atomic number and density. This suggests that the depth at which the positive count value relative value peak 116 occurs includes a substance having an atomic number or a density higher than that of the object to be inspected whose internal state is known.
  • FIG. 6 is a diagram showing a relative value (when a negative peak occurs) of the intensity distribution of Compton scattered photons in the depth direction.
  • the horizontal axis is the depth of Compton scattered photons
  • the vertical axis is the count value (relative value) of Compton scattered photons.
  • the count value relative value peak 117 in the negative direction is set at a certain depth. You can check. This suggests that at a certain depth, the substance to be inspected whose internal state is known contains a substance having a lower atomic number or density.
  • the display device 105 includes input conditions of the depth calculation device 104 such as the peak value spectrum 112, the scattering angle ⁇ s of Compton scattering, the position coordinates of the radiation detector 102 and the monochromatic photon source 101, and the calculation result executed by the depth calculation device 104.
  • the intensity distribution of Compton scattered photons in the depth direction and their relative values are displayed.
  • the radiation measuring apparatus 100 has known relative coordinates between the monochromatic photon source 101 that controls the irradiation direction of the monochromatic photon or the quasi-monochromatic photon and the monochromatic photon source 101, and is to be inspected.
  • the energy measuring device 103 that measures the energy and intensity of the detected Compton scattered photons, and the relative coordinates and the energy and intensity of Compton scattered photons. It includes a depth calculation device 104 that calculates the Compton scattered photon intensity distribution in the depth direction of the inspected object 106, and a display device 105 that displays the calculation result.
  • the depth calculation device 104 uses the emitted energy Ein of the monochromatic photon source 101 and the respective energies Es of the peak value spectrum 112 acquired by the energy measuring device 103, and the inside of the inspected object 106 according to the equation (1).
  • the scattering angle ⁇ s of the Compton scattering generated in the above was calculated, then the position coordinates of the radiation detector 102 (xdet, ydet, zdet), the position coordinates of the monochromatic photon source 101 (0,0, -zsource), and the calculated scattering.
  • the depth z (Es) which is the scattering position corresponding to each energy Es, is calculated according to the equation (2).
  • the photon emitted from the photon source is irradiated to the inspected object 106, and the intensity distribution of the scattered photon in the depth direction of the inspected object 106 is acquired by measuring the photon scattered by Compton.
  • the internal state of the object to be inspected can be grasped with high resolution in the internal direction.
  • advanced analysis and monitoring can be realized.
  • a method of imaging the object to be inspected with a camera and evaluating the surface state by image processing technology, or irradiating the object to be inspected with a laser A method of imaging the reflected light and evaluating the surface state by image processing technology, a method of irradiating the object to be inspected with radiation and measuring the reflected wave to evaluate the internal state, using an X-ray or ⁇ -ray source.
  • This radiation measuring device 100 can be applied to a non-destructive inspection device and a radiation measuring method in place of or in combination with a conventional method such as a method of acquiring density information inside an object to be inspected. For example, in the inspection of social infrastructure such as roads, bridges, tunnels, water services, and power grids, it becomes possible for the public to use the social infrastructure with peace of mind while maintaining the safety and function of the inspected object.
  • the second embodiment is an example of a radiation measuring device and a radiation measuring method using a laser inverse Compton photon.
  • FIG. 7 is a diagram showing a configuration of a radiation measuring device according to a second embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 200 includes a laser inverse Compton scattered photon generator 118 and a laser reverse in addition to the radiation detector 102, the depth calculation device 104 and the display device 105 of the radiation measuring device 100 of FIG. It is configured to include a Compton scattered photon generation control device 119 and an energy measurement device 120 corresponding to the generation timing.
  • the laser inverse Compton scattered photon generator 118 uses an electron source and a laser generator to generate photons with high directivity and high monochromaticity.
  • the laser inverse Compton scattered photon generation control device 119 controls photon generation in the laser inverse Compton scattered photon generation device 118, its generation amount, energy, and irradiation direction, and transmits the photon generation timing to the generation timing corresponding energy measurement device 120.
  • the energy measurement device 120 corresponding to the generation timing controls the photon generation timing of the laser inverse Compton scattered photon generation control device 119 with high accuracy.
  • the generation timing corresponding energy measuring device 120 analyzes the signal output from the radiation detector 102, and calculates the energy spectrum given by the scattered photons 108 in the radiation detector 102 as the peak value spectrum.
  • the radiation measuring device 200 can arbitrarily control the photon generation amount, energy, and irradiation direction, it is possible to acquire the intensity distribution of Compton scattered photons in the depth direction of the inspected object 106 having various specifications. can. Since the internal state can be grasped with high accuracy, it is possible to realize advanced analysis and monitoring based on the result.
  • the third embodiment is an example of a radiation measuring device and a radiation measuring method that utilize a nuclear reaction between a neutron or a charged particle and a target substance.
  • FIG. 8 is a diagram showing a configuration of a radiation measuring device according to a third embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 300 shown in FIG. 8 includes a photon generation target 121, a particle generation source 122, and particles, in addition to the radiation detector 102, the depth calculation device 104, and the display device 105 of the radiation measuring device 100 of FIG.
  • the generation control device 123 and the energy measurement device 124 corresponding to the generation timing are provided.
  • the particle generation source 122 is a photon generator that utilizes a nuclear reaction between a neutron or a charged particle and a target substance.
  • the particle source 122 uses a neutron, a charged particle, or an electron source.
  • a nuclear reaction is generated, and the photons generated there are used.
  • the photon generation target 121 is set to C-12, and 4.4 MeV photons can be generated by irradiating with protons.
  • the radiation measuring device 300 can arbitrarily control the photon generation amount, energy, and irradiation direction, it is possible to acquire the intensity distribution of Compton scattered photons in the depth direction of the inspected object 106 having various specifications. can. Since the internal state of the object to be inspected 106 can be grasped with high accuracy, it is possible to realize advanced analysis and monitoring based on the result.
  • FIG. 9 is a diagram showing a configuration of a radiation measuring device according to a fourth embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 400 shown in FIG. 9 includes a linear arrangement type radiation detector 125, a linear arrangement compatible energy measuring device 126, and a linear arrangement in addition to the monochromatic photon source 101 and the display device 105 of the radiation measuring device 100 of FIG. It is configured to include a corresponding depth calculation device 127.
  • FIG. 10 is a diagram showing a detailed configuration of the linear arrangement type radiation detector 125 and the linear arrangement corresponding energy measuring device 126.
  • the linearly arranged radiation detector 125 is composed of a plurality of linearly arranged radiation detectors 102.
  • the plurality of radiation detectors 102 are arranged linearly in one direction with respect to the surface 106a of the object to be inspected 106.
  • the plurality of radiation detectors 102 are connected to the linear arrangement corresponding energy measuring device 126 corresponding to each output signal.
  • the linearly arranged energy measuring device 126 is composed of a plurality of energy measuring devices 103 linearly arranged corresponding to each radiation detector 102.
  • the peak value spectra of the plurality of radiation detectors 102 obtained by the linear arrangement compatible energy measuring device 126 are treated as input values of the linear arrangement compatible depth calculation device 127.
  • the radiation measuring device 400 can capture scattered photons with a plurality of radiation detectors 102, it is possible to acquire the intensity distribution of Compton scattered photons in the depth direction of the inspected object 106 with high sensitivity. can. Since the intensity distribution can be obtained with high sensitivity, the internal state of the object to be inspected 106 can be grasped with high accuracy, and advanced analysis and monitoring based on the result can be realized.
  • FIG. 11 is a diagram showing a configuration of a radiation measuring device according to a fifth embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 500 shown in FIG. 11 includes a two-dimensional arrangement type radiation detector 128, a two-dimensional arrangement compatible energy measurement device 129, and a two-dimensional arrangement compatible energy measurement device 129, in addition to the monochromatic photon source 101 and the display device 105 of the radiation measurement device 100 of FIG. It is configured to include a depth calculation device 130 corresponding to a two-dimensional arrangement.
  • FIG. 12 is a diagram showing a detailed configuration of the two-dimensional arrangement type radiation detector 128 and the two-dimensional arrangement corresponding energy measuring device 129.
  • the two-dimensional arrangement type radiation detector 128 is composed of a plurality of radiation detectors 102.
  • the plurality of radiation detectors 102 are arranged two-dimensionally (array arrangement) with respect to the surface of the object to be inspected 106.
  • the array arrangement of the radiation detector 102 shown in FIG. 12 is an example, and any arrangement may be used as long as it is a two-dimensional arrangement.
  • the two-dimensional arrangement of the radiation detector 102 may be a curved arrangement that matches the curved surface of the surface of the inspected object 106.
  • the plurality of radiation detectors 102 are connected to the energy measuring device 129 corresponding to the two-dimensional arrangement corresponding to each output signal.
  • the energy measuring device 129 corresponding to the two-dimensional arrangement is composed of a plurality of energy measuring devices 103 arranged two-dimensionally corresponding to each radiation detector 102.
  • the peak value spectra of the plurality of radiation detectors 102 obtained by the two-dimensional arrangement compatible energy measuring device 129 are treated as input values of the two-dimensional arrangement compatible depth calculation device 130.
  • the radiation measuring device 500 can capture scattered photons with a plurality of radiation detectors 102 obtained by the energy measuring device 129 corresponding to the two-dimensional arrangement, Compton scattering in the depth direction of the inspected object 106
  • the photon intensity distribution can be obtained with even higher sensitivity. Since the intensity distribution can be obtained with even higher sensitivity, the internal state of the object to be inspected 106 can be grasped with higher accuracy, and advanced analysis and monitoring based on the results can be realized.
  • the sixth embodiment is an example of a radiation measuring device and a radiation measuring method in which a plurality of radiation detectors are arranged in an annular shape.
  • FIG. 13 is a diagram showing a configuration of a radiation measuring device according to a sixth embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 600 shown in FIG. 13 includes, in addition to the monochromatic photon source 101 and the display device 105 of the radiation measuring device 100 of FIG. It is configured to include a depth calculation device 133 corresponding to an annular arrangement.
  • FIG. 14 is a diagram showing a detailed configuration of the ring-arranged radiation detector 131.
  • the annulus-arranged radiation detector 131 includes a plurality of radiation detectors 102 concentrically arranged in an annulus.
  • the plurality of radiation detectors 102 are arranged in an annulus with respect to the surface of the object to be inspected 106.
  • a plurality of radiation detectors 102 are arranged with a plurality of concentric rings at a pitch of 30 ° around the irradiation point 134.
  • the angular pitch at which the plurality of radiation detectors 102 are arranged and the diameter of the annulus are adjusted according to the size of the radiation detector 102 used, the detection efficiency of the intensity distribution of Compton scattered photons, and the like.
  • the plurality of radiation detectors 102 are connected to the energy measuring device 132 corresponding to the ring arrangement corresponding to each output signal (not shown in FIG. 14).
  • the peak value spectra of the plurality of radiation detectors 102 obtained by the energy measuring device 132 corresponding to the annulus arrangement are treated as input values of the depth arithmetic unit 133 corresponding to the annulus arrangement (not shown in FIG. 14).
  • the radiation measuring device 600 can capture scattered photons with a plurality of radiation detectors 102 in a plurality of rings, the intensity distribution of Compton scattered photons in the depth direction of the inspected object 106 can be further improved. Since it can be acquired with higher sensitivity and the internal state of the object to be inspected 106 can be grasped with higher accuracy, it is possible to realize advanced analysis and monitoring based on the result.
  • the radiation measuring device 600 is a radiation detector 102 on the same ring, it can be regarded as the same measurement because the relative coordinates of the monochromatic photon source 101 and the radiation detector 102 do not change. Therefore, in the depth calculation device 133 corresponding to the ring arrangement, the calculation can be shortened.
  • FIG. 15 is a diagram showing a configuration of a radiation measuring device according to a seventh embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 700 shown in FIG. 15 includes a slit collimator 135 in addition to the monochromatic photon source 101, the radiation detector 102, the depth calculation device 104, and the display device 105 of the radiation measuring device 100 of FIG. ..
  • FIG. 16 is a diagram showing a detailed configuration of the slit collimator 135.
  • the radiation measuring device 700 provides a slit collimator 135 between the radiation detector 102 and the object to be inspected 106. This reduces the incident on the radiation detector 102 by the multiple scattered photons 137 due to the multiple Compton scattering generated by the incident of the monochromatic photon 107 on the object to be inspected 106.
  • the scattered photons 108 due to Compton scattering in the field of view 136 are measured by the radiation detector 102.
  • the influence of the multiple scattering photons 137 can be reduced by providing the slit collimator 135 between the radiation detector 102 and the inspected object 106, the depth direction of the inspected object 106 can be reduced.
  • the intensity distribution of Compton scattered photons can be obtained with high accuracy.
  • the internal state of the object to be inspected 106 can be grasped with high accuracy, and advanced analysis and monitoring based on the result can be realized.
  • FIG. 17 is a diagram showing a configuration of a radiation measuring device according to an eighth embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measurement device 800 shown in FIG. 17 includes a fan beam type monochromatic photon source 138, a fan beam compatible radiation detector 139, a multi-channel energy measurement device 140, and many. It is configured to include a channel-compatible depth calculation device 141.
  • FIG. 18 is a diagram showing a detailed configuration of a fan beam type monochromatic photon source 138.
  • the fan beam type collimator 142 shown in FIG. 18 has a structure in which a radioactive isotope 109 is provided inside and can irradiate a monochromatic photon 107 in a one-dimensional direction.
  • the configuration in which the radioisotope 109 is provided inside the fan beam type collimator 142 is shown, but the laser inverse Compton scattered photon generator 118 shown in FIG. 2 and the photon generating target 121 shown in FIG. 3 are used. It may be provided.
  • FIG. 19 and 20 are views for explaining the arrangement of the fan beam compatible radiation detector 139, FIG. 19 shows a layout view seen from the side surface thereof, and FIG. 20 shows a layout view seen from above.
  • the detection unit 143 including the slit collimator 135 and the radiation detector 102 is arranged near the surface of the object to be inspected 106.
  • the detection unit 143 is set so that the visual field range 136 overlaps with the irradiation direction of the monochromatic photon 107.
  • a fan beam compatible radiation detector 139 composed of a plurality of detection unit units 143 is arranged horizontally with respect to the line direction of the irradiation line 144.
  • the fan beam compatible radiation detector 139 measures the irradiation line 144 of the monochromatic photon 107 irradiated by the fan beam type monochromatic photon source 138 (see FIG. 17).
  • each detector unit 143 is arranged so as to include the irradiation line 144 (see FIG. 20).
  • the radiation measuring device 800 can acquire the intensity distribution of Compton scattered photons in the depth direction of the object 106 at one time in a wide range at high speed. As a result, the internal state of the object to be inspected 106 can be grasped at a higher speed, and advanced analysis and monitoring based on the result can be realized.
  • FIG. 21 is a diagram showing a configuration of a radiation measuring device according to a ninth embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 900 shown in FIG. 21 includes a moving mechanism 145 and a moving position specifying mechanism 146 in addition to the monochromatic photon source 101, the radiation detector 102, the energy measuring device 103, and the display device 105 of the radiation measuring device 100 of FIG.
  • a movement control mechanism 147 and a scanning depth calculation device 148 are provided.
  • the moving mechanism 145 mounts a monochromatic photon source 101 and a radiation detector 102, and scans the vicinity of the surface 106a of the inspected object 106.
  • the moving position specifying mechanism 146 calculates the relative coordinates of the moving mechanism 145 and the object to be inspected 106.
  • the movement control mechanism 147 controls the scanning range of the movement mechanism 145. Specifically, the movement control mechanism 147 specifies the position of the movement mechanism 145 based on the relative coordinates calculated by the movement position identification mechanism 146, and controls the relative coordinates of the monochromatic photon source 101 and the radiation detector 102. ..
  • the scanning depth calculation device 148 uses the coordinates of the moving mechanism, that is, the surface coordinates of the inspected object as input values in addition to the peak value spectra and relative coordinates acquired at a plurality of irradiation points, in the depth direction in the scanning range. Calculate the intensity distribution of Compton scattered photons.
  • FIG. 22 is a flowchart showing a radiation measurement process of the radiation measurement device 900.
  • S indicates each step of the measurement flow.
  • the radiation measuring device 900 is set up and measurement is started.
  • the movement control mechanism 147 arranges the monochromatic photon source 101, the radiation detector 102, and the movement mechanism 147 at the initial measurement point.
  • the energy measuring device 103 records the positions of the monochromatic photon source 101 and the radiation detector 102.
  • step S13 the monochromatic photon source 101 irradiates the photon, and the energy measuring device 103 records the peak value spectrum.
  • step S14 the energy measuring device 103 determines whether or not the measurement is completed at the measurement point, and if the measurement is not completed (S14: No), the process returns to step S13.
  • the scanning depth calculation device 148 determines in step S15 whether or not the cross-section measurement is completed.
  • the movement control mechanism 147 arranges the monochromatic photon source 101, the radiation detector 102, and the movement mechanism 145 at the measurement point of the inspected object 106 in step S16, and proceeds to step S12. return.
  • the scanning depth calculation device 148 calculates the cross-sectional view of the inside of the object 106 to be inspected in step S17.
  • the display device 105 displays the calculation result.
  • the scanning depth calculation device 148 determines whether or not the cross-section calculation is completed. When the cross-section calculation is not completed (S19: No), the scanning depth calculation device 148 calculates the incomplete measurement point in step S20, and returns to step S16.
  • the scanning depth calculation device 148 determines in step S21 whether or not all the measurements and the calculation are completed. When all the measurements and calculations are not completed (S19: No), the movement control mechanism 147 moves to the next cross-section measurement position in step S22 and returns to step S12.
  • step S23 the display device 105 scans the peak value spectrum, the scattering angle ⁇ s of Compton scattering, the position coordinates of the radiation detector 102 and the monochromatic photon source 101, and the like.
  • the processing of this flow is completed by outputting the input conditions of the arithmetic device 148, the intensity distribution of Compton scattered photons in the depth direction, which is the calculation result executed by the scanning-compatible depth arithmetic device 148, and their relative values.
  • FIG. 23 is a flowchart showing the arithmetic processing of the Compton scattered photon intensity distribution.
  • FIG. 23 is a subroutine in step S14 of FIG. It is started by the subroutine call in step S14 of FIG. 22.
  • the monochromatic photon source 101 controls the irradiation direction of the monochromatic photon of the monochromatic photon source 101.
  • the radiation detector 102 detects Compton scattered photons scattered from the inspected object, whose coordinates relative to the monochromatic photon source 101 are known.
  • the energy measuring device 103 measures the energy and intensity of the detected Compton scattered photons.
  • step S104 the scan-compatible depth arithmetic unit 148 calculates the scattering angle ⁇ s of Compton scattering generated inside the inspected object based on the emission energy Ein of the monochromatic photon source and each energy Es of the acquired peak value spectrum. do.
  • step S105 the scanning depth calculation device 148 is based on the position coordinates of the radiation detector 102, the position coordinates of the monochromatic photon source 101, and the calculated scattering angle ⁇ s, and the scattering position corresponding to each energy Es, that is, the depth z. (Es) is calculated, and the process returns to step S14 in FIG.
  • the moving mechanism 145 mounts the monochromatic photon source 101 and the radiation detector 102, scans the vicinity of the surface 106a of the inspected object 106, and the moving control mechanism 147 identifies the moving position.
  • the position of the moving mechanism 145 is specified by the mechanism 146, and the relative coordinates of the monochromatic photon source 101 and the radiation detector 102 are controlled.
  • the scanning depth calculation device 148 calculates the intensity distribution of Compton scattered photons in the depth direction in the scanning range using the surface coordinates of the object 106 to be inspected as an input value.
  • FIG. 24 is a diagram showing a configuration of a radiation measuring device according to a tenth embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 1000 shown in FIG. 24 includes an optical camera 149 and an image analyzer 150 in addition to the monochromatic photon source 101, the radiation detector 102, the energy measuring device 103, and the display device 105 of the radiation measuring device 100 of FIG. , An image determination database 151, and an image superimposing device 152.
  • the optical camera 149 images the surface of the object to be inspected 106.
  • the image analyzer 150 uses the image determination database 151 to evaluate a state such as the presence or absence of a singular point on the surface of the object to be inspected 106 and its soundness. For state evaluation, machine learning composed of past achievements, experimentally obtained data, and data formed by analysis can be used.
  • the image superimposition device 152 superimposes the surface state of the object to be inspected 106 imaged by the optical camera 149 and the Compton scattered photon intensity distribution in the depth direction obtained by the depth calculation device 104.
  • images are superimposed in multiple dimensions.
  • the display device 105 displays the calculation result calculated by the image superimposing device.
  • the radiation measuring device 1000 visually expresses, for example, the state of the object to be inspected visually confirmed by the workers and the intensity distribution of Compton scattered photons in the depth direction according to the present invention. Can be done. This can contribute to higher efficiency of the entire work and higher accuracy of determination of the object to be inspected. It is possible to realize advanced analysis and monitoring based on the results.
  • the eleventh embodiment is an example of a radiation measuring device and a radiation measuring method having a function of measuring relative position coordinates of a monochromatic photon source, a radiation detector, and an object to be inspected.
  • FIG. 25 is a diagram showing a configuration of a radiation measuring device according to the eleventh embodiment of the present invention. The same components as those in FIG. 1 are designated by the same reference numerals, and the description of overlapping portions will be omitted.
  • the radiation measuring device 1100 shown in FIG. 25 includes a position calculation device 153 and a depth corresponding to position coordinates in addition to the monochromatic photon source 101, the radiation detector 102, the energy measuring device 103, and the display device 105 of the radiation measuring device 100 of FIG. It is configured to include an arithmetic device 154.
  • the position calculation device 153 measures the position coordinates of the monochromatic photon source 101, the radiation detector 102, and the object to be inspected 106.
  • the position calculation device 153 includes, for example, a distance measurement device that uses an optical camera, a laser, an ultrasonic wave, a radar, or the like after determining a certain initial value as a means for measuring the position coordinates.
  • the radiation measuring device 1100 places the monochromatic photon source 101 and the radiation detector 102 on a fixed jig and fixes the relative position coordinates of the monochromatic photon source 101 and the radiation detector 102, so that the radiation measuring device 1100 is relative to the inspected object 106.
  • the coordinates can be calculated relatively easily.
  • the relative position coordinates obtained by the position calculation device 153 are input to the position coordinate corresponding depth calculation device 154 using these coordinates as an input value.
  • the radiation measuring device 1100 can grasp the relative position coordinates with high accuracy, it is possible to acquire the intensity distribution of Compton scattered photons in the depth direction of the inspected object 106 with high accuracy. It is possible to grasp the internal state of the object to be inspected 106 with high accuracy and realize advanced analysis and monitoring based on the result.
  • [Modification example] (1) The radiation measuring apparatus and the radiation measuring method of the first to eleventh embodiments are combined and integrated. By integrating the radiation measuring device and the radiation measuring method according to each of the above embodiments, the intensity distribution of Compton scattered photons in the depth direction of the object to be inspected 106 (see, for example, FIG. 1) is optimized according to various execution environments. Can be executed. It is possible to grasp the internal state of the object to be inspected 106 with high accuracy, high speed, and high sensitivity, and to realize advanced analysis and monitoring based on the result.
  • the radiation measuring device of the first embodiment to the eleventh embodiment is a position coordinate measuring device (position calculation device) that measures the position coordinates of the monochromatic photon source 106 and the radiation detector 102 (see, for example, FIG. 1). ), The depth calculation device uses the position coordinates of the monochromatic photon source 101 and the radiation detector 102 obtained by the position calculation device as input values.
  • position calculation device position coordinate measuring device
  • the radiation measuring apparatus of the first embodiment to the eleventh embodiment executes machine learning including AI (Artificial Intelligence), a singular point database that accumulates singular points in the Compton scattered photon intensity distribution. It is equipped with a singular point extraction device.
  • the singular point extraction device uses a singular point database and machine learning to extract singular points in the Compton scattered photon intensity distribution in the depth direction.
  • the present invention is not limited to the configuration described in each of the above embodiments, and the configuration can be appropriately changed as long as it does not deviate from the gist of the present invention described in the claims.
  • Radiation measuring device 101 Monochromatic photon source 102 Radiation detector 103 Energy measuring device 104 Depth calculation device 105 Display device (output device) 106 Inspected object 107 Monochromatic photon 108 Scattered photon 109 Radioisotope (radioisotope) 110 Collimeter 111 Photon shutter 112 Peak spectrum 118 Laser inverse Compton scattered photon generator 119 Laser inverse Compton scattered photon generation control device 120 Generation timing compatible energy measurement device 121 Photon generation target 122 Particle generation source 123 Particle generation control device 124 Generation timing Corresponding energy measuring device 125 Linear arrangement type radiation detector 126 Linear arrangement compatible energy measuring device 127 Linear arrangement compatible depth calculation device 128 Two-dimensional arrangement type radiation detector 129 Two-dimensional arrangement compatible energy measurement device 130 Two-dimensional arrangement compatible depth calculation Equipment 131 Ring-arranged radiation detector 132 Ring-arranged energy measuring device 133 Ring-arranged depth calculation device 134 Irradiation point 135 Slit

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Abstract

L'invention concerne un dispositif et un procédé de mesure de rayonnement qui permettent d'acquérir l'état interne d'un sujet à inspecter à haute résolution par rapport à une direction interne, et de mettre en œuvre une analyse et une surveillance de haut niveau. L'invention concerne également un dispositif de mesure de rayonnement (100) comprenant : une source de photons monochromes (101) qui commande la direction d'émission de photons monochromes ou de photons quasi monochromes ; un détecteur de rayonnement (102) qui détecte les photons de diffusion Compton qui ont été diffusés par un sujet à inspecter (106), les coordonnées relatives du détecteur de rayonnement (102) par rapport à la source de photons monochromes (101) étant connues ; un dispositif de mesure d'énergie (103) qui mesure l'énergie et l'intensité des photons de diffusion Compton détectés ; un dispositif de calcul de profondeur (104) qui, sur la base des coordonnées relatives et de l'énergie et de l'intensité des photons de diffusion Compton, calcule la distribution d'intensité pour les photons de diffusion Compton dans la direction de la profondeur du sujet à inspecter (106) ; et un dispositif d'affichage (105) qui affiche le résultat du calcul.
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