WO2021128643A1 - Semiconductor silicon material consumable growth furnace and preparation method for silicon material - Google Patents

Semiconductor silicon material consumable growth furnace and preparation method for silicon material Download PDF

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WO2021128643A1
WO2021128643A1 PCT/CN2020/082875 CN2020082875W WO2021128643A1 WO 2021128643 A1 WO2021128643 A1 WO 2021128643A1 CN 2020082875 W CN2020082875 W CN 2020082875W WO 2021128643 A1 WO2021128643 A1 WO 2021128643A1
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crucible
heat shield
shaft
silicon material
heater
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PCT/CN2020/082875
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French (fr)
Chinese (zh)
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李辉
秦英谡
穆童
毛瑞川
张熠
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南京晶升能源设备有限公司
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Priority to KR1020217035388A priority Critical patent/KR102387823B1/en
Publication of WO2021128643A1 publication Critical patent/WO2021128643A1/en

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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B11/00Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B11/00Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
    • C30B11/003Heating or cooling of the melt or the crystallised material
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B11/00Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
    • C30B11/007Mechanisms for moving either the charge or the heater
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon

Abstract

Provided are a semiconductor silicon material consumable growth furnace and a preparation method for the silicon material. The growth furnace comprises a furnace body, and a heat shield, a heating device and a crucible which are located in the furnace body. The crucible is supported by a crucible shaft which can be lifted and lowered; by lowering the crucible and the crucible shaft and by means of position cooperation of the crucible shaft and a lower heat shield, the center of the bottom of the crucible is overcooled, avoiding the lifting of the heater or the heat shield, so that a thermal field member above the crucible moves, and the attached deposits are scattered and fall into the crucible, thereby improving the crystal purity. The manner of overcooling the center of the bottom of the crucible in cooperation with a thermal field environment produced by means of multiple segments of heaters can not only maintain the height position of the solid-liquid growth interface relative to the heater unchanged, and ensure the stability of the thermal environment at the growth interface, but also form a growth interface where solid protrudes to liquid, facilitating removal of impurities during crystallization and increasing the crystal purity.

Description

一种半导体硅材料耗材生长炉及硅材料制备方法Semiconductor silicon material consumable growth furnace and silicon material preparation method 技术领域Technical field
本发明属于硅晶体材料生长炉技术领域。The invention belongs to the technical field of a silicon crystal material growth furnace.
背景技术Background technique
硅材料由于具有单方向导电性、热敏特性、光电特性以及掺杂特性等优良性能,可以生长为大尺寸高纯度晶体,故而成为全球应用广泛的重要集成电路基础材料。Silicon materials have excellent properties such as unidirectional conductivity, heat-sensitive properties, optoelectronic properties, and doping properties, and can be grown into large-scale, high-purity crystals. Therefore, they have become an important integrated circuit basic material widely used in the world.
半导体硅材料按照应用场景划分,可以分为芯片用单晶硅材料和蚀刻用硅材料。其中芯片用单晶硅材料是制造半导体器件的基础原材料,芯片用单晶硅材料经过一系列晶圆制造工艺形成极微小的电路结构,再经切割、封装、测试等环节成为芯片,并广泛应用于集成电路下游市场。蚀刻用硅材料则是加工制成半导体级硅部件,用于蚀刻设备上的硅电极,由于硅电极在硅片氧化膜刻蚀等加工工艺过程会逐渐腐蚀并变薄,当硅电极厚度减少到一定程度后,需要更换新的硅电极,因此硅电极是晶圆制造蚀刻环节所需的核心耗材。硅材料耗材中的杂质不仅会降低材料的使用寿命,更严重的是会污染正在加工的晶片,考虑到半导体材料的高纯净度要求,硅材料耗材需求极低的金属杂质及碳氧杂质含量,因此对制备硅材料耗材的生长炉在杂质控制方面提出的更高的要求。Semiconductor silicon materials are classified according to application scenarios, and can be divided into monocrystalline silicon materials for chips and silicon materials for etching. Among them, the monocrystalline silicon material for chips is the basic raw material for manufacturing semiconductor devices. The monocrystalline silicon material for chips forms a very small circuit structure through a series of wafer manufacturing processes, and then becomes a chip through cutting, packaging, testing and other links, and is widely used In the downstream market of integrated circuits. The silicon material used for etching is processed into semiconductor-grade silicon parts, which are used to etch silicon electrodes on equipment. As the silicon electrodes are gradually corroded and thinned during processing processes such as etching of silicon oxide films, when the thickness of the silicon electrodes is reduced to After a certain degree, new silicon electrodes need to be replaced, so silicon electrodes are the core consumables required for the etching process of wafer manufacturing. Impurities in silicon consumables will not only reduce the service life of the material, but more seriously will pollute the wafers being processed. Considering the high purity requirements of semiconductor materials, silicon consumables require extremely low metal impurities and carbon and oxygen impurities. Therefore, higher requirements are put forward on the impurity control of the growth furnace for preparing silicon consumables.
现有技术方案中,一般是是设计发热均匀的加热体及隔热屏来提供热环境,由上隔热屏进入气管,从坩埚上方吹入惰性气体,加热体和隔热屏可以向上提升,侧屏固定位置开有测温孔,用以控温方式降温。但是该方案也存在若干缺点,包括:1、提升加热器或隔热屏会使坩埚上方的热场件产生运动,附着在上的沉积物会散落进坩埚内,造成污染,导致成品杂质含量高;2、由坩埚上方吹入惰性气体时,气管内沉积的挥发物会掉落进坩埚内,造成污染;3、生长过程无法控制排杂,产品杂质含量较高。In the prior art scheme, generally a heating body and heat shield with uniform heat generation are designed to provide a thermal environment. The upper heat shield enters the air pipe, and inert gas is blown from above the crucible. The heating body and heat shield can be lifted upwards. A temperature measuring hole is opened in a fixed position of the side screen for temperature control and cooling. However, this solution also has several shortcomings, including: 1. Lifting the heater or heat shield will cause movement of the thermal field above the crucible, and the attached deposits will be scattered into the crucible, causing pollution, resulting in high impurity content in the finished product. 2. When the inert gas is blown from the top of the crucible, the volatiles deposited in the gas pipe will fall into the crucible, causing pollution; 3. The growth process cannot be controlled and the impurity content of the product is high.
故,需要一种新的技术方案以解决上述问题。Therefore, a new technical solution is needed to solve the above-mentioned problems.
发明内容Summary of the invention
发明目的:本发明提供一种半导体硅材料耗材生长炉,解决了该材料制备过程中杂质污染问题,提高了材料的纯度,以满足半导体领域对材料超高纯度的要求。Objective of the invention: The present invention provides a semiconductor silicon material consumable growth furnace, which solves the problem of impurity contamination during the preparation of the material, improves the purity of the material, and meets the requirements of the semiconductor field for ultra-high purity of the material.
本发明还提供使用所述半导体硅材料耗材生长炉的硅材料制备方法。The invention also provides a silicon material preparation method using the semiconductor silicon material consumable growth furnace.
技术方案:为达到上述目的,本发明可采用如下技术方案:Technical solution: In order to achieve the above-mentioned purpose, the present invention can adopt the following technical solutions:
一种半导体硅材料耗材生长炉,包括炉体、位于炉体内的隔热屏、加热装置、 坩埚,所述隔热屏内部为隔热腔,所述坩埚及围绕坩埚的加热装置均位于隔热腔内,所述加热装置与隔热屏相互固定,坩埚的下方设有坩埚轴,该坩埚轴自坩埚下方延伸并穿过隔热屏的底壁;所述隔热屏的底壁设有供坩埚轴穿过的轴孔,该轴孔的横截面自上而下逐渐变大;而所述坩埚轴具有与该轴孔配合的轴塞部,该轴塞部的横截面与轴孔对应同样为自上而下逐渐变大;当所述轴塞部上升至最高位置时与轴孔配合而形成封闭状态;A semiconductor silicon material consumable growth furnace, comprising a furnace body, a heat shield located in the furnace body, a heating device, and a crucible. The interior of the heat shield is a heat insulation cavity, and the crucible and the heating device surrounding the crucible are all located in the heat insulation. In the cavity, the heating device and the heat shield are fixed to each other, and a crucible shaft is arranged under the crucible, and the crucible shaft extends from the bottom of the crucible and passes through the bottom wall of the heat shield; the bottom wall of the heat shield is provided with a supply The shaft hole through which the crucible shaft passes, the cross section of the shaft hole gradually increases from top to bottom; and the crucible shaft has a shaft plug part that matches the shaft hole, and the cross section of the shaft plug corresponds to the same shaft hole. To gradually increase from top to bottom; when the shaft plug portion rises to the highest position, it cooperates with the shaft hole to form a closed state;
还包括位于坩埚上方的气罩,该气罩面对坩埚的下方设有吹气孔;气罩的一端连接进气管,另一端连接出气管,所述进气管自气罩向下弯折延伸,出气管自气罩同样向下延伸;所述隔热屏的底壁固定有贯穿底壁的两个直管;其中一个直管与进气管的下端配合,进气管的下端相对该直管伸缩;另一个直管与出气管的下端配合,出气管的下端同样相对该直管伸缩。It also includes a gas hood located above the crucible, the gas hood facing the bottom of the crucible is provided with blowing holes; one end of the gas hood is connected to an air inlet pipe, and the other end is connected to an air outlet pipe. The air pipe also extends downward from the air hood; the bottom wall of the heat shield is fixed with two straight pipes penetrating the bottom wall; one of the straight pipes is matched with the lower end of the air inlet pipe, and the lower end of the air inlet pipe is telescopic relative to the straight pipe; A straight pipe is matched with the lower end of the air outlet pipe, and the lower end of the air outlet pipe is also telescopic relative to the straight pipe.
进一步的,所述轴孔为圆锥形孔,轴塞为与该圆锥形孔配合的圆锥形轴塞,该圆锥形轴塞围绕坩埚设置且与坩埚轴同轴。Further, the shaft hole is a conical hole, the shaft plug is a conical shaft plug matched with the conical hole, and the conical shaft plug is arranged around the crucible and coaxial with the crucible shaft.
进一步的,所述加热装置包括上加热器、中加热器、下加热器;所述上加热器位于坩埚上方,中加热器及下加热器围绕坩埚设施,中加热器位于下加热器上方。Further, the heating device includes an upper heater, a middle heater, and a lower heater; the upper heater is located above the crucible, the middle heater and the lower heater surround the crucible facility, and the middle heater is located above the lower heater.
进一步的,所述上加热器与上电极连接并通过上电极与隔热屏顶盖固定,上电极穿过隔热屏以及炉体;中加热器与中电极连接并通过中电极与隔热屏顶盖固定,中电极穿过隔热屏以及炉体;下加热器与下电极连接并通过下电极与隔热屏顶盖固定,下电极穿过隔热屏以及炉体。Further, the upper heater is connected to the upper electrode and fixed to the top cover of the heat shield through the upper electrode, the upper electrode passes through the heat shield and the furnace body; the middle heater is connected to the middle electrode and passes through the middle electrode and the heat shield The top cover is fixed, the middle electrode passes through the heat shield and the furnace body; the lower heater is connected with the lower electrode and is fixed to the heat shield top cover through the lower electrode, and the lower electrode passes through the heat shield and the furnace body.
进一步的,所述气罩与坩埚上方固定。Further, the gas hood is fixed above the crucible.
进一步的,所述坩埚包括圆形石墨坩埚以及位于石墨坩埚中的圆形石英坩埚,石墨坩埚由下方坩埚轴支撑。Further, the crucible includes a circular graphite crucible and a circular quartz crucible located in the graphite crucible, and the graphite crucible is supported by the lower crucible shaft.
本发明提供的使用所述半导体硅材料耗材生长炉的硅材料制备方法采用以下技术方案:The method for preparing silicon material using the semiconductor silicon material consumable growth furnace provided by the present invention adopts the following technical solutions:
生长硅材料晶体时坩埚随坩埚轴向下运动;坩埚上方气罩中吹出气体吹到坩埚内的熔体液面上。When growing silicon material crystals, the crucible moves down with the crucible axis; the gas blown from the gas hood above the crucible is blown onto the melt surface in the crucible.
有益效果:相对于现有技术,本发明技术方案的优点为:Beneficial effects: Compared with the prior art, the advantages of the technical solution of the present invention are:
以下降坩埚及坩埚轴,通过坩埚轴和下隔热屏的位置配合,造成坩埚底部中心过冷的方式,避免提升加热器或隔热屏的方式,使坩埚上方的热场件产生运动,造成附着的沉积物散落进坩埚,提高了晶体纯度。坩埚底部中心过冷的方式配合多段加热器营造的热场环境,不仅可以维持固液生长界面相对加热器的高度位置不变,保证生长界面处热环境的稳定,还可以形成由固体凸向液体的生长界面, 便于结晶过程中排杂,提高晶体纯度。坩埚上方通过气罩吹气,而进气管的气体为自下而上吹入气罩,使进气管内残留的挥发物不会直接掉落进熔体。By lowering the crucible and the crucible axis, the position of the crucible axis and the lower heat shield is matched to cause the bottom center of the crucible to be too cold, avoiding the way of raising the heater or the heat shield, causing the thermal field above the crucible to move, causing The attached sediments are scattered into the crucible, which improves the purity of the crystal. The supercooling method of the bottom center of the crucible and the thermal field environment created by the multi-stage heater can not only maintain the height position of the solid-liquid growth interface relative to the heater, and ensure the stability of the thermal environment at the growth interface, but also can form a solid convex to the liquid The growth interface facilitates the removal of impurities during the crystallization process and improves the crystal purity. The upper part of the crucible is blown through the gas hood, and the gas in the inlet pipe is blown into the gas hood from bottom to top, so that the volatile matter remaining in the inlet pipe will not directly fall into the melt.
附图说明Description of the drawings
图1是本发明中半导体硅材料耗材生长炉的剖面示意图。Fig. 1 is a schematic cross-sectional view of a semiconductor silicon material consumable growth furnace in the present invention.
图2本发明中半导体硅材料耗材生长炉另一个角度的剖面示意图。Fig. 2 is a schematic cross-sectional view from another angle of the semiconductor silicon material consumable growth furnace of the present invention.
具体实施方式Detailed ways
请结合图1及图2所示,本实施例公开一种半导体硅材料耗材生长炉,包括炉体17、位于炉体17内的隔热屏、加热装置、坩埚,所述隔热屏内部为隔热腔,所述坩埚及围绕坩埚的加热装置均位于隔热腔内。所述坩埚包括圆形石墨坩埚8以及位于石墨坩埚8中的圆形石英坩埚9,石墨坩埚8由下方坩埚轴7支撑。所述加热装置与隔热屏相互固定。炉体17上下分别具有炉体上壁18、炉体底壁19,上述炉体17、炉体上壁18、炉体底壁19都设置有冷却水槽,炉体17开有两个中电极孔和两个下电极孔,炉体上壁18开有两个上电极孔,炉体底壁19开有一个坩埚轴孔,两个气管孔。上述炉体底壁19上放置有溢流盘20,溢流盘20开有一个坩埚轴孔,两个气管孔,所述溢流盘20中装有两根直径50-60mm的支撑柱13,支撑柱13上放置下隔热屏3,下隔热屏3厚度100-200mm,开有两个气管孔。隔热屏包括侧隔热屏1、上隔热屏2、下隔热屏3。上述下隔热屏3上放置侧隔热屏1,侧隔热屏1上开有两个中电极孔和两个下电极孔,侧隔热屏1厚度100-200mm。上述侧隔热屏1上放置上隔热屏2,上隔热屏2上开有两个上电极孔,上隔热屏2厚度100-200mm。上述下隔热屏3、隔热屏1、隔热屏2构成整体隔热屏系统,在所述隔热屏系统内,加热装置包括上加热器4、中加热器5、下加热器6。所述上加热器4位于坩埚上方,中加热器5及下加热器6围绕坩埚设施,中加热器5位于下加热器6上方。上述上加热器4与上隔热屏2的距离50-70mm,由两个上电极14固定,上电极14穿过上隔热屏2、上法兰18的上电极孔,与炉体外电源相连。上述中加热器5与侧隔热屏1的距离80-100mm,由两个中电极16固定,所述中加热器5上开有两个宽槽,方便弯气管11运动不发生干涉,电极16穿过侧隔热屏1、炉体17的中电极孔,与炉体外电源相连。上述下加热器6与侧隔热屏1的距离80-100mm,由两个下电极15固定,下电极15穿过侧隔热屏1、炉体17的下电极孔,与炉体外电源相连。上述中加热器5与下加热器6之间的距离30-50mm。1 and FIG. 2, this embodiment discloses a semiconductor silicon material consumable growth furnace, including a furnace body 17, a heat shield located in the furnace body 17, a heating device, a crucible, the inside of the heat shield is In the heat-insulating cavity, the crucible and the heating device surrounding the crucible are all located in the heat-insulating cavity. The crucible includes a circular graphite crucible 8 and a circular quartz crucible 9 located in the graphite crucible 8. The graphite crucible 8 is supported by the crucible shaft 7 below. The heating device and the heat shield are fixed to each other. The furnace body 17 has a furnace body upper wall 18 and a furnace body bottom wall 19 respectively. The furnace body 17, the furnace body upper wall 18, and the furnace body bottom wall 19 are all provided with cooling water tanks. The furnace body 17 has two middle electrode holes. And two lower electrode holes, the upper wall 18 of the furnace body is provided with two upper electrode holes, and the bottom wall 19 of the furnace body is provided with a crucible shaft hole and two air pipe holes. An overflow plate 20 is placed on the bottom wall 19 of the furnace body. The overflow plate 20 is provided with a crucible shaft hole and two air pipe holes. The overflow plate 20 is equipped with two support columns 13 with a diameter of 50-60 mm. A lower heat shield 3 is placed on the support column 13, the thickness of the lower heat shield 3 is 100-200mm, and two tracheal holes are opened. The heat shield includes a side heat shield 1, an upper heat shield 2, and a lower heat shield 3. A side heat shield 1 is placed on the lower heat shield 3, two middle electrode holes and two lower electrode holes are opened on the side heat shield 1, and the thickness of the side heat shield 1 is 100-200mm. An upper heat shield 2 is placed on the above-mentioned side heat shield 1, and two upper electrode holes are opened on the upper heat shield 2, and the thickness of the upper heat shield 2 is 100-200 mm. The lower heat shield 3, the heat shield 1, and the heat shield 2 constitute an integral heat shield system. In the heat shield system, the heating device includes an upper heater 4, a middle heater 5, and a lower heater 6. The upper heater 4 is located above the crucible, the middle heater 5 and the lower heater 6 surround the crucible facility, and the middle heater 5 is located above the lower heater 6. The distance between the upper heater 4 and the upper heat shield 2 is 50-70mm, which is fixed by two upper electrodes 14. The upper electrode 14 passes through the upper heat shield 2, the upper electrode hole of the upper flange 18, and is connected to the power supply outside the furnace. . The distance between the middle heater 5 and the side heat shield 1 is 80-100mm, which is fixed by two middle electrodes 16. The middle heater 5 has two wide grooves to facilitate the movement of the elbow pipe 11 without interference. Passes through the side heat shield 1, the middle electrode hole of the furnace body 17, and is connected to the power source outside the furnace body. The distance between the lower heater 6 and the side heat shield 1 is 80-100 mm and is fixed by two lower electrodes 15. The lower electrode 15 passes through the side heat shield 1 and the lower electrode hole of the furnace body 17, and is connected to the power source outside the furnace body. The distance between the middle heater 5 and the lower heater 6 is 30-50 mm.
坩埚的下方设有坩埚轴7,该坩埚轴7自坩埚下方延伸并穿过隔热屏的底壁,即下隔热屏3。所述隔热屏的底壁设有供坩埚轴穿过的轴孔,该轴孔的横截面自上而下逐渐变大;而所述坩埚轴7具有与该轴孔配合的轴塞部71,该轴塞部71 的横截面与轴孔对应同样为自上而下逐渐变大;当所述轴塞部71上升至最高位置时与轴孔配合而形成封闭状态。在本实施方式中,所述轴孔为圆锥形孔,锥角90-120°。轴塞71为与该圆锥形孔配合的圆锥形轴塞,该圆锥形轴塞围绕坩埚设置且与坩埚轴同轴。A crucible shaft 7 is provided below the crucible, and the crucible shaft 7 extends from below the crucible and passes through the bottom wall of the heat shield, that is, the lower heat shield 3. The bottom wall of the heat shield is provided with a shaft hole for the crucible shaft to pass through, and the cross section of the shaft hole gradually increases from top to bottom; and the crucible shaft 7 has a shaft plug portion 71 that matches the shaft hole. The cross section of the shaft plug portion 71 corresponding to the shaft hole also gradually increases from top to bottom; when the shaft plug portion 71 rises to the highest position, it cooperates with the shaft hole to form a closed state. In this embodiment, the shaft hole is a conical hole with a cone angle of 90-120°. The shaft plug 71 is a conical shaft plug fitted with the conical hole, and the conical shaft plug is arranged around the crucible and coaxial with the crucible axis.
还包括位于坩埚上方的气罩,该气罩面对坩埚的下方设有吹气孔;气罩的一端连接进气管11,另一端连接出气管111,所述进气管11自气罩向下弯折延伸,出气管自气罩同样向下延伸。所述隔热屏的底壁固定有贯穿底壁的两个直管12;其中一个直管12与进气管11的下端配合,进气管11的下端相对该直管12伸缩;另一个直管12与出气管的下端配合,出气管111的下端同样相对该直管12伸缩。在本实施方式中,进气管11及出气管下端与直气管12上端有卡扣连接而可以在直气管12内上下滑动。晶体生长时,一端进气管11通入高纯氩气,出气管抽气,气体在气罩10内流通,吹扫熔体液面,带走挥发物、杂质,提高晶体纯度。进气管11的气体为自下而上吹入气罩,使进气管内残留的挥发物不会直接掉落进熔体。坩埚和坩埚轴7向下运动时,进气管11及出气管111随着石墨坩埚8一起运动,直气管12固定不动。进气管11及出气管111内径40-60mm,管壁厚5-7mm,直气管12内径65-75mm,管壁厚5-7mm。It also includes a gas hood located above the crucible, the gas hood facing the bottom of the crucible is provided with blowing holes; one end of the gas hood is connected to the gas inlet pipe 11, and the other end is connected to the gas outlet pipe 111, which is bent downward from the gas hood Extend, the air outlet pipe also extends downward from the gas hood. The bottom wall of the heat shield is fixed with two straight pipes 12 passing through the bottom wall; one of the straight pipes 12 is matched with the lower end of the air inlet pipe 11, and the lower end of the air inlet pipe 11 is telescopic relative to the straight pipe 12; the other straight pipe 12 Cooperating with the lower end of the air outlet pipe, the lower end of the air outlet pipe 111 is also telescopic relative to the straight pipe 12. In this embodiment, the lower end of the air inlet pipe 11 and the lower end of the air outlet pipe and the upper end of the straight air pipe 12 are snap-connected to be able to slide up and down in the straight air pipe 12. When the crystal is growing, one end of the inlet pipe 11 is introduced with high-purity argon gas, and the outlet pipe is pumped. The gas circulates in the gas hood 10 to sweep the melt surface, take away volatiles and impurities, and improve the purity of the crystal. The gas in the inlet pipe 11 is blown into the gas hood from bottom to top, so that the volatile matter remaining in the inlet pipe will not directly fall into the melt. When the crucible and the crucible shaft 7 move downwards, the air inlet pipe 11 and the air outlet pipe 111 move together with the graphite crucible 8, and the straight air pipe 12 is fixed. The inner diameter of the air inlet pipe 11 and the outlet pipe 111 is 40-60mm, the pipe wall thickness is 5-7mm, the straight air pipe 12 has an inner diameter of 65-75mm, and the pipe wall thickness is 5-7mm.
上述下隔热屏3中心开有,与上述坩埚轴7的圆锥面相配合,在坩埚轴7向下运动时,两个原本贴合的两个锥面逐渐拉开距离,增大相对面积,增加坩埚底部中心漏热,逐渐增大过冷度来提供结晶驱动力,避免提升加热器或隔热屏的方式,使坩埚上方的热场件产生运动,造成附着的沉积物散落进坩埚。随坩埚位置的下降,配合上述多段加热器营造的热场环境,可以维持固液生长界面相对加热器的高度位置不变,保证生长界面处热环境的稳定,可以形成由固体凸向液体的生长界面,便于结晶过程中排杂,提高晶体纯度。The center of the lower heat shield 3 is opened to match the conical surface of the crucible shaft 7. When the crucible shaft 7 moves downwards, the two originally attached conical surfaces gradually separate the distance, increasing the relative area and increasing Heat leakage in the center of the bottom of the crucible, gradually increase the degree of subcooling to provide crystallization driving force, avoid raising the heater or heat shield, causing the thermal field above the crucible to move, causing the attached deposits to fall into the crucible. With the decrease of the crucible position, and the thermal field environment created by the above-mentioned multi-stage heater, the height position of the solid-liquid growth interface relative to the heater can be maintained unchanged, ensuring the stability of the thermal environment at the growth interface, and the growth from solid to liquid can be formed. The interface facilitates the removal of impurities during the crystallization process and improves the crystal purity.
本发明还提供使用上述半导体硅材料耗材生长炉的硅材料制备方法的实施例。The present invention also provides an embodiment of a silicon material preparation method using the above-mentioned semiconductor silicon material consumable growth furnace.
该制备方法包括:生长硅材料晶体时坩埚随坩埚轴向下运动;坩埚上方气罩中吹出气体吹到坩埚内的熔体液面上。在坩埚轴7向下运动时,两个原本贴合的两个锥面逐渐拉开距离,增大相对面积,增加坩埚底部中心漏热,逐渐增大过冷度来提供结晶驱动力,避免提升加热器或隔热屏的方式,使坩埚上方的热场件产生运动,造成附着的沉积物散落进坩埚。随坩埚位置的下降,配合上述多段加热器营造的热场环境,可以维持固液生长界面相对加热器的高度位置不变,保证生长界面处热环境的稳定,可以形成由固体凸向液体的生长界面,便于结晶过程中排杂,提高晶体纯度。The preparation method includes: when the silicon material crystal is grown, the crucible moves downward with the crucible axis; and the gas blown from the gas hood above the crucible is blown onto the melt surface in the crucible. When the crucible axis 7 moves downwards, the two originally attached conical surfaces gradually separate the distance, increase the relative area, increase the heat leakage at the bottom of the crucible, and gradually increase the degree of subcooling to provide crystallization driving force and avoid lifting The heater or heat shield makes the heat field above the crucible move, causing the attached deposits to fall into the crucible. With the decrease of the crucible position, and the thermal field environment created by the above-mentioned multi-stage heater, the height position of the solid-liquid growth interface relative to the heater can be maintained unchanged, ensuring the stability of the thermal environment at the growth interface, and the growth from solid to liquid can be formed. The interface facilitates the removal of impurities during the crystallization process and improves the crystal purity.
本发明具体实现该技术方案的方法和途径很多,以上所述仅是本发明的优选实施方式。应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本发明的保护范围。本实施例中未明确的各组成部分均可用现有技术加以实现。There are many methods and ways to implement the technical solution in the present invention, and the above are only the preferred embodiments of the present invention. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and modifications can be made, and these improvements and modifications should also be regarded as the protection scope of the present invention. All the components that are not clear in this embodiment can be implemented using existing technology.

Claims (7)

  1. 一种半导体硅材料耗材生长炉,包括炉体、位于炉体内的隔热屏、加热装置、坩埚,所述隔热屏内部为隔热腔,所述坩埚及围绕坩埚的加热装置均位于隔热腔内,其特征在于,所述加热装置与隔热屏相互固定,坩埚的下方设有坩埚轴,该坩埚轴自坩埚下方延伸并穿过隔热屏的底壁;所述隔热屏的底壁设有供坩埚轴穿过的轴孔,该轴孔的横截面自上而下逐渐变大;而所述坩埚轴具有与该轴孔配合的轴塞部,该轴塞部的横截面与轴孔对应同样为自上而下逐渐变大;当所述轴塞部上升至最高位置时与轴孔配合而形成封闭状态;A semiconductor silicon material consumable growth furnace, comprising a furnace body, a heat shield located in the furnace body, a heating device, and a crucible. The inside of the heat shield is a heat insulation cavity, and the crucible and the heating device surrounding the crucible are all located in the heat insulation. The cavity is characterized in that the heating device and the heat shield are fixed to each other, and a crucible shaft is arranged under the crucible, and the crucible shaft extends from the bottom of the crucible and passes through the bottom wall of the heat shield; the bottom of the heat shield The wall is provided with a shaft hole for the crucible shaft to pass through, and the cross section of the shaft hole gradually increases from top to bottom; and the crucible shaft has a shaft plug part matched with the shaft hole, and the cross section of the shaft plug part is the same as The corresponding shaft hole is also gradually enlarged from top to bottom; when the shaft plug portion rises to the highest position, it cooperates with the shaft hole to form a closed state;
    还包括位于坩埚上方的气罩,该气罩面对坩埚的下方设有吹气孔;气罩的一端连接进气管,另一端连接出气管,所述进气管自气罩向下弯折延伸,出气管自气罩同样向下延伸;所述隔热屏的底壁固定有贯穿底壁的两个直管;其中一个直管与进气管的下端配合,进气管的下端相对该直管伸缩;另一个直管与出气管的下端配合,出气管的下端同样相对该直管伸缩。It also includes a gas hood located above the crucible, the gas hood facing the bottom of the crucible is provided with blowing holes; The air pipe also extends downward from the air hood; the bottom wall of the heat shield is fixed with two straight pipes penetrating the bottom wall; one of the straight pipes is matched with the lower end of the air inlet pipe, and the lower end of the air inlet pipe is telescopic relative to the straight pipe; A straight pipe is matched with the lower end of the air outlet pipe, and the lower end of the air outlet pipe is also telescopic relative to the straight pipe.
  2. 根据权利要求1所述的半导体硅材料耗材生长炉,其特征在于:所述轴孔为圆锥形孔,轴塞为与该圆锥形孔配合的圆锥形轴塞,该圆锥形轴塞围绕坩埚设置且与坩埚轴同轴。The semiconductor silicon material consumable growth furnace according to claim 1, wherein the shaft hole is a conical hole, the shaft plug is a conical shaft plug matched with the conical hole, and the conical shaft plug is arranged around the crucible And coaxial with the crucible axis.
  3. 根据权利要求2所述的半导体硅材料耗材生长炉,其特征在于:所述加热装置包括上加热器、中加热器、下加热器;所述上加热器位于坩埚上方,中加热器及下加热器围绕坩埚设施,中加热器位于下加热器上方。The semiconductor silicon material consumable growth furnace according to claim 2, wherein the heating device includes an upper heater, a middle heater, and a lower heater; the upper heater is located above the crucible, and the middle heater and the lower heater The device surrounds the crucible facility and the middle heater is located above the lower heater.
  4. 根据权利要求3所述的半导体硅材料耗材生长炉,其特征在于:所述上加热器与上电极连接并通过上电极与隔热屏顶盖固定,上电极穿过隔热屏以及炉体;中加热器与中电极连接并通过中电极与隔热屏顶盖固定,中电极穿过隔热屏以及炉体;下加热器与下电极连接并通过下电极与隔热屏顶盖固定,下电极穿过隔热屏以及炉体。The semiconductor silicon material consumable growth furnace according to claim 3, wherein the upper heater is connected to the upper electrode and fixed to the top cover of the heat shield through the upper electrode, and the upper electrode passes through the heat shield and the furnace body; The middle heater is connected to the middle electrode and fixed to the top cover of the heat shield through the middle electrode, the middle electrode passes through the heat shield and the furnace body; the lower heater is connected to the bottom electrode and is fixed to the top cover of the heat shield through the bottom electrode, The electrodes pass through the heat shield and the furnace body.
  5. 根据权利要求1所述的半导体硅材料耗材生长炉,其特征在于:所述气罩与坩埚上方固定。The semiconductor silicon material consumable growth furnace according to claim 1, wherein the gas hood is fixed above the crucible.
  6. 根据权利要求1所述的半导体硅材料耗材生长炉,其特征在于:所述坩埚包括圆形石墨坩埚以及位于石墨坩埚中的圆形石英坩埚,石墨坩埚由下方坩埚轴支撑。The semiconductor silicon material consumable growth furnace according to claim 1, wherein the crucible comprises a circular graphite crucible and a circular quartz crucible located in the graphite crucible, and the graphite crucible is supported by the lower crucible shaft.
  7. 一种使用如权利要求1-6中任一项所述半导体硅材料耗材生长炉的硅材料制备方法,其特征在于,生长硅材料晶体时坩埚随坩埚轴向下运动;坩埚上方气罩中吹出气体吹到坩埚内的熔体液面上。A method for preparing silicon material using the semiconductor silicon material consumable growth furnace according to any one of claims 1 to 6, characterized in that the crucible moves downwards with the crucible axis when growing silicon material crystals; blowing out from the gas hood above the crucible The gas is blown onto the melt surface in the crucible.
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