WO2021045135A1 - 振動検出システム - Google Patents
振動検出システム Download PDFInfo
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- WO2021045135A1 WO2021045135A1 PCT/JP2020/033353 JP2020033353W WO2021045135A1 WO 2021045135 A1 WO2021045135 A1 WO 2021045135A1 JP 2020033353 W JP2020033353 W JP 2020033353W WO 2021045135 A1 WO2021045135 A1 WO 2021045135A1
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- vibration
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- detection system
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
- G01H9/002—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means for representing acoustic field distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
- G01H9/008—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means by using ultrasonic waves
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/20—Analysis of motion
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/20—Analysis of motion
- G06T7/246—Analysis of motion using feature-based methods, e.g. the tracking of corners or segments
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/20—Analysis of motion
- G06T7/254—Analysis of motion involving subtraction of images
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10141—Special mode during image acquisition
- G06T2207/10152—Varying illumination
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
Definitions
- the present invention relates to a vibration detection system that detects the vibration of an observation object, particularly a vibration detection system that detects the vibration of an observation object whose surface is non-mirror surface.
- an object of the present invention is to detect the vibration of the observation object on the two-dimensional plane in real time.
- the vibration detection system of the present invention is a vibration detection system that detects the vibration of an observation object whose surface is non-mirror surface, and is a laser light source that irradiates the observation object with laser light and an observation object that is irradiated with the laser light. It is characterized by including a camera having an image pickup element that captures an image of the light source, and an image processing device that processes the image captured by the camera and displays a vibration generation location.
- the vibration generation location is specified based on the two-dimensional image captured by the camera, the vibration on the two-dimensional surface of the observation object can be detected in real time.
- the camera acquires an image including an interference pattern generated by the interference of the laser beam reflected on the surface of the observation object because the exposure time at the time of imaging is longer than the vibration cycle of the observation object.
- the image processing device identifies the vibration generating pixel from the deviation between the image including the non-vibration interference pattern of the observation object acquired by the camera and the image including the vibration interference pattern, and the image of the observation object.
- An observation image including a display corresponding to the vibration generating pixel specified in may be output.
- an interference pattern due to the interference of the laser beam due to non-specular reflection appears on the surface of the image sensor of the camera.
- the image sensor of the camera acquires an image of this interference pattern. Since the exposure time of the camera at the time of imaging is longer than the vibration cycle of the observation object, when the observation object vibrates, the camera acquires an image of a blurred interference pattern. When the image of the interference pattern is blurred, the intensity of the brightness of the pixel changes as compared with the case of non-vibration.
- a pixel whose brightness intensity during vibration changes from the brightness intensity during non-vibration is specified as a vibration generating pixel, and includes a display corresponding to the vibration generating pixel specified in the image of the observation object.
- the image processing apparatus when a predetermined number of other vibration generating pixels are present in a predetermined range around the specified vibration generating pixel, the image processing apparatus maintains the identification of the vibration generating pixel of the pixel. If a predetermined number of vibration-generating pixels do not exist in a predetermined range, the specification of the vibration-generating pixels of the pixels may be cancelled.
- the laser light source may irradiate the observation object with a single wavelength parallel laser beam.
- the present invention can detect vibration of an observation object on a two-dimensional surface in real time.
- the vibration detection system 100 of the embodiment will be described with reference to the drawings.
- the vibration detection system 100 will be described as detecting these vibrations by using the ultrasonic horn 12 and the capillary 13 of the wire bonding device 10 as observation objects.
- the wire bonding apparatus 10 including the ultrasonic horn 12 and the capillary 13 which are the observation objects will be briefly described with reference to FIG.
- the wire bonding apparatus 10 includes a bonding arm 11, an ultrasonic horn 12, a capillary 13, an ultrasonic vibrator 14, and a bonding stage 16.
- the ultrasonic horn 12 has a capillary 13 attached to the tip and an ultrasonic vibrator 14 attached to the rear end.
- the ultrasonic horn 12 is ultrasonically vibrated by the ultrasonic vibration generated by the ultrasonic vibrator 14, and the capillary 13 is ultrasonically vibrated.
- the ultrasonic horn 12 is connected to the bonding arm 11 and is driven in a direction in which the capillary 13 is brought into contact with and separated from the bonding stage 16 by a drive mechanism (not shown).
- the bonding stage 16 attracts and fixes the substrate 18 on which the semiconductor element 17 is mounted on the surface.
- the wire bonding device 10 presses the tip of the capillary 13 onto the electrode of the semiconductor element 17 by a drive mechanism (not shown) to bond the wire 15 to the electrode of the semiconductor element 17, and then the capillary 13 is placed on the electrode of the substrate 18. It is moved and the tip of the capillary 13 is pressed onto the electrode of the substrate 18 to bond the wire 15 to the electrode of the substrate 18.
- the wire bonding apparatus 10 connects the electrode of the semiconductor element 17 and the electrode of the substrate 18 with the loop wire 19. Therefore, during the bonding operation, the ultrasonic horn 12 and the capillary 13 are ultrasonically vibrated.
- the vibration detection system 100 of the embodiment detects and displays vibrations on a two-dimensional surface of the ultrasonic horn 12 and the capillary 13.
- the surfaces of the ultrasonic horn 12 and the capillary 13 are non-mirror surfaces, and the surfaces have fine irregularities.
- the vibration detection system 100 includes a laser light source 20, a camera 30, and an image processing device 40.
- the laser light source 20 converts the single-wavelength laser light output from the laser oscillator by the beam expander into the parallel laser light 21, and irradiates the ultrasonic horn 12 and the capillary 13 with the single-wavelength parallel laser light 21.
- the camera 30 includes an image sensor 31 and captures a two-dimensional image of the ultrasonic horn 12 and the capillary 13 irradiated with the parallel laser beam 21.
- the image processing device 40 processes the two-dimensional image captured by the camera 30 to identify the vibration generation location, and the display of the vibration portion is different from the display of the other portion. 6) is output and displayed on the monitor 50.
- the image processing device 40 is a computer including a processor 41 that processes information internally and a memory 42.
- the parallel laser light 21 is the surface of the capillary 13. It reflects in a random direction at 13a.
- the reflected laser light 22 due to this non-specular reflection interferes with each other, and an interference pattern of the reflected laser light 22 appears on the surface of the image pickup element 31 of the camera 30.
- the image sensor 31 of the camera 30 Since the interference pattern has a bright portion in which light is strengthened and a dark portion in which light is weakened, the image sensor 31 of the camera 30 appears the interference pattern on the surface of the image 13b of the capillary 13 as shown in FIG. It is acquired as an image 13c of a speckled pattern composed of a large number of bright parts 33 and dark parts 34.
- the camera 30 has an image 12b of the ultrasonic horn 12 having a spot pattern and a spot pattern as shown in the field of view 32 of FIG.
- the image 13b of the capillary 13 is acquired.
- the images 12b and 13b are images including an interference pattern.
- the exposure time of the camera 30 at the time of imaging is longer than the vibration period of the ultrasonic vibration of the ultrasonic horn 12 and the capillary 13. Therefore, when the ultrasonic horn 12 and the capillary 13 vibrate ultrasonically, in the region where the vibration peaks, the image 12b of the ultrasonic horn 12 having a spotted pattern on the image pickup element 31 during exposure , Image 13b of the capillary 13 with a speckled pattern is blurred as shown by arrows 91 and 92. On the other hand, in the region of the vibration node, even if the ultrasonic horn 12 and the capillary 13 vibrate ultrasonically, the images 12b and 13b on the image sensor 31 do not deviate during the exposure.
- the intensity of the brightness of the pixel 36 of the image sensor 31 is the intensity of the brightness in the stationary state or the non-vibrating state in which the ultrasonic horn 12 and the capillary 13 are not ultrasonically vibrated. It changes compared to. As an example, in the region where there is a vibration peak, the brightness intensity of the pixel 36 becomes larger than that in the non-vibration region.
- the images 12b and 13b are the images 12a and 13b in which the ultrasonic horn 12 and the capillary 13 are in a stationary state or in a non-vibration state. It is almost the same. Therefore, in the region of the vibration node where the images 12b and 13b do not shake during exposure, the intensity of the brightness of the pixel 36 of the image sensor 31 is in a stationary state where the ultrasonic horn 12 and the capillary 13 are not ultrasonically vibrated. It is almost the same as the intensity of brightness in the non-vibration state.
- the processor 41 of the image processing device 40 changes the brightness intensity when ultrasonically vibrating from the brightness intensity when not ultrasonically vibrating at rest or when not vibrating.
- the pixel 36 is specified as the vibration generating pixel 37.
- the intensity of brightness is the degree of brightness detected by the pixel 36, and may be represented by, for example, 256 gradations from 0 to 255.
- the image processing device 40 identifies the vibration generating pixels 37 by performing the processing as described below for each pixel 36 of the image frame 35, which is one region of the two-dimensional image of the field of view 32 that performs image processing at one time.
- the coordinates (x, y) described later in the reference numerals indicate the coordinates (x, y) of the two-dimensional image frame 35, and for example, the pixel 36 (x, y) is the coordinates (x, y).
- the pixel 36 of the above is shown.
- the processor 41 of the image processing apparatus 40 is based on a two-dimensional image at the time of ultrasonic vibration and a two-dimensional image at the time of stationary or non-vibration acquired from the camera 30 stored in the memory 42.
- the image frame 35v at the time of ultrasonic vibration and the image frame 35s at the time of stationary are read out.
- the processor 41 has a brightness intensity Iv (x, y) at the time of ultrasonic vibration and a brightness intensity Is (x, y) at rest in each pixel 36 (x, y).
- the average value Ia (x, y) with y) is calculated.
- Mean value Ia (x, y) [Iv (x, y) + Is (x, y)] / 2
- the processor 41 has a deviation between the intensity Iv (x, y) of the brightness at the time of ultrasonic vibration and the average value Ia (x, y) in each pixel 36 (x, y).
- the average value of the absolute value of the image frame 35 in the image frame 35 is calculated as the absolute deviation average value.
- Absolute deviation mean value
- the processor 41 calculates the normalized pixel intensity NIave (x, y) according to the following (Equation 1).
- NIave (x, y) [
- step S105 of FIG. 5 when the NIave (x, y) is 1 or more, the processor 41 considers that the change in the brightness intensity of the pixel 36 (x, y) is significant. The determination is made, and the process proceeds to step S106 of FIG. 5, the pixel 36 (x, y) is specified as the vibration generating pixel 37 (x, y), and the process proceeds to step S107.
- the processor 41 determines in step S107 that all the pixels 36 (x, y) of the image frame 35 have not been processed, the processor 41 returns to step S104 and processes the next pixel 36 (x, y). .. On the other hand, if the processor 41 determines NO in step S105 of FIG.
- the processor 41 returns to step S104 and performs the processing of the next pixel 36 (x, y).
- the processor 41 calculates NIave (x, y) in all the pixels 36 (x, y) of the image frame 35, and identifies the vibration generating pixels 37 (x, y) in the image frame 35. It is determined that YES in step S107, and the process proceeds to step S108 in FIG.
- step S108 of FIG. 5 the processor 41 confirms whether or not a predetermined number of other vibration generating pixels 37 (x1, y1) exist in a predetermined range around one vibration generating pixel 37 (x, y). For example, a square array of 5 ⁇ 5 pixels 36 centered on the vibration generating pixels 37 (x, y) is set as a predetermined range, and 7 to 8 other vibration generating pixels 37 (x1, y) are set therein. You may check whether y1) exists. If YES is determined in step S108 of FIG. 5, it is determined that the change in the brightness intensity of the pixel 36 (x, y) is due to ultrasonic vibration, and the process proceeds to step S109 of FIG. The identification of the pixel 36 (x, y) as the vibration generating pixel 37 (x, y) is maintained.
- the processor 41 confirms the identification of the vibration generating pixel 37 (x, y).
- the processor 41 performs the above processing in each image frame 35 to determine the identification of the vibration generating pixel 37 (x, y) for all the pixels 36 (x, y) of the image sensor 31.
- the processor 41 outputs the observed images 12e and 13e in which the images of the ultrasonic horn 12 and the capillary 13 include the display corresponding to the specified vibration generating pixel 37 (x, y).
- the vibrations of the ultrasonic horn 12 and the capillary 13 on the two-dimensional surface are visualized and displayed.
- the observed images 12e and 13e can be in various formats, but in FIG. 5, as an example, vibration of a general image obtained by irradiating the ultrasonic horn 12 and the capillary 13 with non-interfering light rays such as an electric lamp.
- a red dot 52 is superimposed and displayed on the portion corresponding to the generated pixel 37.
- many red dots 52 are displayed in the region where the vibration peaks are formed, and almost no red dots are displayed in the portion where the vibration nodes are formed.
- there are vibration peaks at the ultrasonic horn 12 in which many red dots 52 are displayed the intermediate portion where the diameter of the capillary 13 changes, and the tip portion of the capillary 13, and the other portions vibrate. It turns out that it is a section of.
- the vibration detection system 100 of the embodiment processes the two-dimensional images of the ultrasonic horn 12 and the capillary 13 and displays them as the two-dimensional observation images 12e and 13e. Therefore, the ultrasonic horn 12 and the capillary 13 are displayed. Vibrations on the 13 two-dimensional planes can be detected in real time.
- the vibration detection system 100 has been described as detecting the vibration of the ultrasonic horn 12 and the capillary 13 of the wire bonding device 10, but it is also applied to the detection of the vibration of other parts of the wire bonding device 10. be able to.
- the semiconductor element 17 can be irradiated with a parallel laser beam 21 to detect the vibration of the semiconductor element 17.
- the vibration of the semiconductor element 17 is large, it can be determined that the vibration energy from the capillary 13 is consumed for the vibration other than the bonding, and the bonding is not performed well.
- the vibration detection system 100 can be applied to the detection of vibration of each part of a device other than the wire bonding device 10, for example, another semiconductor manufacturing device such as a die bonding device.
- the laser light source 20 has been described as irradiating the observation target with the parallel laser light 21 having a single wavelength. It is also possible to irradiate no laser beam. Further, the laser beam may have some unevenness in intensity. Further, in the above description, the image of the interference pattern has been described as a speckled pattern including a large number of bright portions 33 and dark portions 34, but the present invention is not limited to this, and other patterns such as a striped pattern may be used.
- the vibration direction of the observation target is not one direction
- a plurality of laser light sources 20 and cameras 30 are prepared, the observation target is irradiated with laser light from multiple directions, and the plurality of cameras 30 are used in multiple directions. By capturing an image from the light source, vibration in multiple directions can be detected.
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Abstract
Description
平均値Ia(x,y)=[Iv(x,y)+Is(x,y)]/2
絶対偏差平均値=|Iv(x,y)-Ia(x,y)|の画像フレーム35での平均値
NIave(x,y)=
[|Iv(x,y)-Ia(x,y)|/絶対偏差平均値]4 ---- (式1)
Claims (4)
- 表面が非鏡面の観測対象物の振動を検出する振動検出システムであって、
前記観測対象物にレーザ光を照射するレーザ光源と、
前記レーザ光が照射された前記観測対象物を撮像して画像を取得する撮像素子を有するカメラと、
前記カメラが撮像した画像を処理して振動発生個所を表示する画像処理装置と、を含む振動検出システム。 - 請求項1に記載の振動検出システムであって、
前記カメラは、撮像の際の露光時間が前記観測対象物の振動周期よりも長く、前記観測対象物の前記表面で反射した前記レーザ光の干渉により発生する干渉パターンを含む画像として取得し、
前記画像処理装置は、前記カメラが取得した前記観測対象物の非振動時の干渉パターンを含む画像と振動時の干渉パターンを含む画像との偏差から、振動発生画素を特定し前記観測対象物の画像に特定した振動発生画素に対応する表示を含ませた観測画像を出力すること、
を特徴とする振動検出システム。 - 請求項2に記載の振動検出システムであって、
前記画像処理装置は、特定した振動発生画素の周囲の所定範囲に所定個数の他の振動発生画素が存在する場合には、その画素の振動発生画素の特定を維持し、所定範囲に所定個数の振動発生画素が存在しない場合には、その画素の振動発生画素の特定を取り消すこと、
を特徴とする振動検出システム。 - 請求項2又は3に記載の振動検出システムであって、
前記レーザ光源は、前記観測対象物に単一波長の平行レーザ光を照射すること、
を特徴とする振動検出システム。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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EP20861869.4A EP4027119A4 (en) | 2019-09-03 | 2020-09-03 | VIBRATION DETECTION SYSTEM |
CN202080039076.9A CN113892015A (zh) | 2019-09-03 | 2020-09-03 | 振动检测系统 |
KR1020227007729A KR20220043202A (ko) | 2019-09-03 | 2020-09-03 | 진동 검출 시스템 |
JP2021544016A JP7219990B2 (ja) | 2019-09-03 | 2020-09-03 | 振動検出システム |
US17/626,490 US20220283020A1 (en) | 2019-09-03 | 2020-09-03 | Vibration detection system |
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JP2019160471 | 2019-09-03 | ||
JP2019-160471 | 2019-09-03 |
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WO2021045135A1 true WO2021045135A1 (ja) | 2021-03-11 |
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US (1) | US20220283020A1 (ja) |
EP (1) | EP4027119A4 (ja) |
JP (1) | JP7219990B2 (ja) |
KR (1) | KR20220043202A (ja) |
CN (1) | CN113892015A (ja) |
TW (1) | TWI756811B (ja) |
WO (1) | WO2021045135A1 (ja) |
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