WO2020258644A1 - Microled chip transferring method - Google Patents

Microled chip transferring method Download PDF

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Publication number
WO2020258644A1
WO2020258644A1 PCT/CN2019/115953 CN2019115953W WO2020258644A1 WO 2020258644 A1 WO2020258644 A1 WO 2020258644A1 CN 2019115953 W CN2019115953 W CN 2019115953W WO 2020258644 A1 WO2020258644 A1 WO 2020258644A1
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substrate
wafer
microled
microleds
electrodes
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PCT/CN2019/115953
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French (fr)
Chinese (zh)
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樊勇
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深圳市华星光电半导体显示技术有限公司
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Publication of WO2020258644A1 publication Critical patent/WO2020258644A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/16Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
    • H01L25/167Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/62Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68372Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to support a device or wafer when forming electrical connections thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • H01L2933/0066Processes relating to semiconductor body packages relating to arrangements for conducting electric current to or from the semiconductor body

Definitions

  • This application relates to the field of display technology, and in particular to a method for transferring MicroLED chips.
  • the entire surface of the ACF glue 3' is attached to the TFT substrate 4'.
  • the MicroLED 6' is transferred, the MicroLED 6'is bonded to the TFT by pressure and heating.
  • the electrode 2'of the MicroLED and the electrode 5'of the TFT are aligned.
  • the bonding area of the MicroLED 6'and the TFT substrate 4' only occupies a small part of the pixel display area, and this method requires the ACF glue 3'containing conductive particles 31' to be spread on the entire surface of the TFT substrate 4'. Therefore, this method obviously wastes a lot of materials.
  • the unevenness of the TFT substrate 4' may also cause contamination of the indenter.
  • a method for mass transfer of electronic components as disclosed in the publication number CN107768487A is further proposed in the art. This method first provides wafers and electronic components arranged in a matrix on the surface of the substrate. Next, the wafer is attached to the temporary fixing layer. Subsequently, the wafer is diced so that the wafer is formed into multiple plates. Each board includes at least some electronic components and sub-substrates. The temporary fixing layer is expanded so that the plates on the temporary fixing layer separate from each other as the temporary fixing layer expands.
  • each of the predetermined bonding portions is transferred to the carrier substrate in stages, so that the electronic components in the predetermined bonding portion are bonded to the carrier substrate. Finally, remove the sub-substrates of these plates.
  • the purpose of this application is to provide a MicroLED transfer method with pre-glued ACF. It can not only save the amount of ACF glue used, but also avoid the pollution of the indenter caused by uneven TFT.
  • a method for transferring MicroLED chips which includes the following steps:
  • the wafer includes a substrate and MicroLED chips arranged on the surface of the substrate, and a metal electrode is formed on the MicroLED chip, and ACF glue is glued on the electrode side of the MicroLED chip; wherein, the wafer
  • the substrate is a sapphire substrate, a gallium nitride substrate, an aluminum nitride substrate, a silicon substrate, a gallium arsenide substrate, or a silicon carbide substrate;
  • S4 Dissolve the MicroLED chip from the temporary substrate, transfer the MicroLED chip to the TFT substrate, and align the electrodes of the MicroLED with the electrodes of the TFT; and then heat and pressure the pressure head to make the electrodes of the MicroLED and the TFT Sexual connection; wherein, the MicroLED chip and the temporary substrate are debonded by ultraviolet light irradiation.
  • step S3 a 266 nm laser is irradiated on the wafer substrate to peel off the wafer substrate.
  • step S1 the wafer fabrication of MicroLEDs follows the following steps: First, various crystal layers of MicroLED are prepared on the wafer substrate by metal organic chemical vapor deposition equipment, including: GaN buffer layer/n Type GaN, multi-quantum well layer light-emitting layer/P-type GaN; then form an ITO current spreading layer and a metal electrode layer on the wafer, and fabricate electrodes through an inductively coupled plasma etching process to obtain MicroLEDs wafers with electrodes.
  • metal organic chemical vapor deposition equipment including: GaN buffer layer/n Type GaN, multi-quantum well layer light-emitting layer/P-type GaN; then form an ITO current spreading layer and a metal electrode layer on the wafer, and fabricate electrodes through an inductively coupled plasma etching process to obtain MicroLEDs wafers with electrodes.
  • a method for transferring MicroLED chips is provided.
  • ACF glue containing conductive particles is pre-attached to the MicroLED wafer, and then the MicroLED chip is transferred to the TFT substrate to make the electrodes of the MicroLED and the TFT The electrodes are aligned, and then the electrodes of the MicroLED and the electrodes of the TFT are electrically connected by heating and pressing the indenter.
  • the ACF glue is only located on the lower surface of the MicroLEDs wafer, which can avoid the phenomenon of non-LED bonding due to uneven TFT substrates, thereby contaminating the indenter.
  • the transfer method includes the following specific steps:
  • One of the wafers includes a substrate and MicroLED chips arranged on the surface of the substrate.
  • the MicroLED chips form metal electrodes, and ACF glue is glued on the electrode side of the MicroLED chips;
  • S4 Dissolve the MicroLED chip from the temporary substrate, and transfer the MicroLED chip to the TFT substrate.
  • the anisotropic conductive film is formed on the wafer (chip) first, and then dicing is performed to obtain the MicroLED chip structure with the ACF film, and the subsequent transfer step is performed.
  • the wafer substrate is a sapphire substrate.
  • the wafer substrate is a gallium nitride substrate.
  • the wafer substrate is an aluminum nitride substrate.
  • the wafer substrate is a silicon substrate.
  • the wafer substrate is a gallium arsenide substrate.
  • the wafer substrate is a silicon carbide substrate.
  • the stripping of the wafer substrate of MicroLEDs is achieved by irradiating a laser on the side of the wafer substrate to achieve the stripping of the wafer substrate.
  • the temporary substrate is debonded by ultraviolet light irradiation.
  • the wafer in the above-mentioned step of debonding the MicroLED chip and the temporary substrate, is 2 inches or 4 inches.
  • the MicroLED transfer method of the present invention by gluing the ACF glue on the electrode side of the MicroLED chip before bonding the MicroLEDs wafer and the temporary substrate, the amount of ACF glue used can be greatly saved, and the utilization rate of ACF materials can be improved. Avoid waste of materials.
  • the ACF is only located on the lower surface of the MicroLED, it is possible to avoid contamination of the indenter due to uneven terrain of the TFT.
  • FIG. 1 is a schematic diagram of the structure of the MicroLED transferred to the TFT substrate in the prior art
  • FIG. 2 is a schematic flowchart of a MicroLED transfer method according to an embodiment of the present invention.
  • 3A to 3E are schematic diagrams of corresponding structures in the step flow of the MicroLED transfer method shown in FIG. 2.
  • FIG. 2 is a schematic flow diagram of the MicroLED transfer method described in this application;
  • FIGS. 3A to 3E are structural schematic diagrams corresponding to the step flow of the MicroLED transfer method shown in FIG. 2.
  • a method for transferring MicroLEDs including: Step S1: a step of fabricating a MicroLEDs wafer: step S2: a step of bonding the MicroLEDs wafer 1 to a temporary substrate: step S3 : The step of peeling off the wafer substrate of the MicroLEDs; and, step S4: the step of obtaining the MicroLED chip.
  • a MicroLEDs wafer 1 is first fabricated on a substrate S, and electrodes 2 for forming MicroLED chips are provided on the MicroLEDs wafer 1. Subsequently, the ACF glue 3 is glued on the electrode 2.
  • the MicroLEDs wafer 1 is 2 inches or 4 inches, but the invention is not limited to the size of the wafer 1.
  • the substrate S of the MicroLEDs wafer 1 may be, for example, a sapphire substrate (Sapphire Substrate), a gallium nitride substrate (Gallium Nitride Substrate), aluminum nitride substrate (Aluminum Nitride Substrate), silicon substrate (Silicon Substrate), gallium arsenide substrate (Gallium Arsenide Substrate) or silicon carbide substrate (Silicon Carbide Substrate) and so on.
  • a sapphire substrate is used.
  • the manufacturing process of the MicroLEDs wafer 1 includes: first, various crystal layers of MicroLEDs, such as GaN, are prepared on a sapphire (Al2O3) substrate by metal organic chemical vapor deposition equipment. Buffer layer/n-type GaN, multi-quantum well layer (MQW) light-emitting layer/P-type GaN; then an ITO current spreading layer and a metal electrode layer are formed on the wafer, and electrodes are made by ICP (inductively coupled plasma etching) process. Finally, as shown in FIG. 3A, a MicroLEDs wafer 1 with electrodes 2 is obtained, and after the fabrication of the MicroLEDs wafer 1 with electrodes is completed, the ACF glue 3 is glued on the electrode 2 side.
  • MicroLEDs wafer 1 with electrodes 2 is obtained, and after the fabrication of the MicroLEDs wafer 1 with electrodes is completed, the ACF glue 3 is glued on the electrode 2 side.
  • the MicroLEDs wafer 1 is bonded to the temporary substrate 7 through the ACF glue 3 side.
  • the substrate S is irradiated with a 266nm laser to vaporize the GaN at the interface between the substrate S and GaN, thereby peeling off the substrate S .
  • Laser Lift-Off the substrate S is irradiated with a 266nm laser to vaporize the GaN at the interface between the substrate S and GaN, thereby peeling off the substrate S .
  • FIG. 3C only the MicroLEDs wafer 1 with electrodes 2 is adhered to the temporary substrate 7 by the ACF glue 3, and the substrate S is not.
  • the MicroLEDs wafer 1 is cut into a plurality of MicroLED chips 6 by cutting. At this time, all the MicroLED chips 6 are bonded to the temporary substrate 7 through the ACF glue 3. And, as shown in FIG. 3D, the ACF glue 3 is also cut together.
  • the MicroLED chip and the temporary substrate are irradiated by ultraviolet light to de-glue, and then the MicroLED chip 6 can be removed from the temporary substrate 7 by the transfer head of the transfer device. Take and place on a TFT substrate 4.
  • the electrode 2 of the MicroLED chip 6 is aligned with the electrode 5 of a TFT substrate 4 using the ACF glue 3, and then the electrodes 2 of the MicroLED chip 6 are aligned with the electrode 5 of a TFT substrate 4 by heating and pressing the indenter.
  • the electrodes 5 on the TFT substrate 4 are electrically connected.
  • MicroLED in this article refers to LEDs with a size less than 100um, also known as uLED;
  • ACF refers to anisotropic conductive film, which is Anisotropic Abbreviation for Conductive Film.
  • the subject of this application can be manufactured and used in industry and has industrial applicability.

Abstract

A microLED chip transferring method, comprising: adhering an ACF adhesive to a wafer of microLEDs in advance, and then transferring a microLED chip to a TFT substrate, such that electrode of the microLED is aligned with the electrode of the TFT; the electrode of the microLED is electrically connected to the electrode of the TFT by heating and pressing a pressure head. The method of the present application can save the usage amount of the ACF adhesive, and also avoid the contamination of the pressure head due to unevenness of the TFT.

Description

一种MicroLED芯片的转移方法A transfer method of MicroLED chips 技术领域Technical field
本申请涉及显示技术领域,特别涉及一种MicroLED芯片的转移方法。This application relates to the field of display technology, and in particular to a method for transferring MicroLED chips.
背景技术Background technique
在现有技术中,为了将MicroLED 转移到TFT基板上以实现可靠的电性连接。In the prior art, in order to transfer the MicroLED to the TFT substrate to achieve a reliable electrical connection.
如图1所示,通常采用在转移MicroLED 6’前,在TFT基板4’上贴合整面的ACF胶3’,转移完MicroLED 6’后通过加压和加热使MicroLED 6’粘合在TFT基板4’上,使MicroLED的电极2’与TFT的电极5’实现对位。As shown in Figure 1, before transferring the MicroLED 6', the entire surface of the ACF glue 3'is attached to the TFT substrate 4'. After the MicroLED 6'is transferred, the MicroLED 6'is bonded to the TFT by pressure and heating. On the substrate 4', the electrode 2'of the MicroLED and the electrode 5'of the TFT are aligned.
然而,MicroLED 6’与TFT基板4’的贴合面积仅占像素显示区的很小部分,而该方法需要在TFT基板4’的整面上铺满包含导电粒子31’的ACF胶3’,因此,此方式显然存在大量材料的浪费。However, the bonding area of the MicroLED 6'and the TFT substrate 4'only occupies a small part of the pixel display area, and this method requires the ACF glue 3'containing conductive particles 31' to be spread on the entire surface of the TFT substrate 4'. Therefore, this method obviously wastes a lot of materials.
同时,由于TFT基板4’不平坦还会导致污染压头的现象。At the same time, the unevenness of the TFT substrate 4'may also cause contamination of the indenter.
为解决上述MicroLED转移工艺中存在ACF胶用量大所导致的浪费问题及污染问题,本领域中进一步提出了一种如公开号CN107768487A公开的巨量转移电子元件的方法。该方法是首先提供晶圆及以矩阵方式排列于基板表面上的电子元件。接着,将晶圆贴附于暂时性固定层。随后,切割晶圆,以使晶圆形成多个板块。各板块包括至少部分电子元件以及子基板。扩张暂时性固定层,以使暂时性固定层上的这些板块随着暂时性固定层扩张而彼此分离。接着,将这些板块中的至少一部分选定为预定接合部分,将此预定接合部分中的每一板块分次地转移于承载基板,以使在预定接合部分中的这些电子元件接合于承载基板。最后,移除这些板块的子基板。In order to solve the problem of waste and pollution caused by the large amount of ACF glue in the above-mentioned MicroLED transfer process, a method for mass transfer of electronic components as disclosed in the publication number CN107768487A is further proposed in the art. This method first provides wafers and electronic components arranged in a matrix on the surface of the substrate. Next, the wafer is attached to the temporary fixing layer. Subsequently, the wafer is diced so that the wafer is formed into multiple plates. Each board includes at least some electronic components and sub-substrates. The temporary fixing layer is expanded so that the plates on the temporary fixing layer separate from each other as the temporary fixing layer expands. Then, at least a part of these plates is selected as a predetermined bonding portion, and each of the predetermined bonding portions is transferred to the carrier substrate in stages, so that the electronic components in the predetermined bonding portion are bonded to the carrier substrate. Finally, remove the sub-substrates of these plates.
技术问题technical problem
然而,该种改性的方法依然存在各种步骤复杂,TFT不平坦等问题。However, this modification method still has problems such as complicated steps and uneven TFT.
因此,还有必要提供一种新的MicroLED芯片的转移方法,以克服上述缺陷。Therefore, it is necessary to provide a new method for transferring MicroLED chips to overcome the above-mentioned drawbacks.
技术解决方案Technical solutions
本申请的目的在于提供一种预先胶合ACF的MicroLED转移方法。不但可以节省ACF胶的使用量,而且避免由于TFT不平坦导致的污染压头的现象。The purpose of this application is to provide a MicroLED transfer method with pre-glued ACF. It can not only save the amount of ACF glue used, but also avoid the pollution of the indenter caused by uneven TFT.
为了达到上述目的,根据本申请的一方面,提供一种MicroLED芯片的转移方法,包括以下步骤:In order to achieve the above objective, according to one aspect of the present application, a method for transferring MicroLED chips is provided, which includes the following steps:
S1:制作MicroLEDs晶圆,所述晶圆包括基板以及排列于该基板表面上的MicroLED芯片,并在MicroLED芯片上形成金属电极,在所述MicroLED芯片电极侧胶合ACF胶;其中,所述晶圆基板为蓝宝石基板、氮化镓基板、氮化铝基板、硅基板、砷化镓基板、或碳化硅基板;S1: Fabricate a MicroLEDs wafer, the wafer includes a substrate and MicroLED chips arranged on the surface of the substrate, and a metal electrode is formed on the MicroLED chip, and ACF glue is glued on the electrode side of the MicroLED chip; wherein, the wafer The substrate is a sapphire substrate, a gallium nitride substrate, an aluminum nitride substrate, a silicon substrate, a gallium arsenide substrate, or a silicon carbide substrate;
S2:将MicroLEDs晶圆通过ACF胶侧粘合到临时基板上;S2: Bond the MicroLEDs wafer to the temporary substrate through the ACF glue side;
S3:剥离MicroLEDs晶圆基板,并将MicroLEDs晶圆切割为MicroLED芯片;其中,通过在所述晶圆基板侧照射激光,剥离所述晶圆基板;以及,S3: peeling off the MicroLEDs wafer substrate and cutting the MicroLEDs wafer into MicroLED chips; wherein, by irradiating the laser on the side of the wafer substrate, the wafer substrate is peeled off; and,
S4:将MicroLED芯片与临时基板解胶,转移MicroLED芯片至TFT基板,使MicroLED的电极与TFT的电极实现对位;再通过对压头的加热和压力,使得MicroLED的电极与TFT的电极的电性连接;其中,通过通过紫外光照射将MicroLED芯片与临时基板解胶。S4: Dissolve the MicroLED chip from the temporary substrate, transfer the MicroLED chip to the TFT substrate, and align the electrodes of the MicroLED with the electrodes of the TFT; and then heat and pressure the pressure head to make the electrodes of the MicroLED and the TFT Sexual connection; wherein, the MicroLED chip and the temporary substrate are debonded by ultraviolet light irradiation.
在一实施例中,在步骤S3中,在所述晶圆基板测照射266nm激光,以剥离所述晶圆基板。In one embodiment, in step S3, a 266 nm laser is irradiated on the wafer substrate to peel off the wafer substrate.
在一实施例中,在步骤S1中,MicroLEDs 晶圆制作按下述步骤:首先,通过金属有机物化学气相沉积设备在晶圆基板上制备出MicroLED的各类晶层,包括:GaN buffer层/n型GaN,、多量子阱层发光层/P型GaN;再在晶圆上形成ITO电流扩展层以及金属电极层,通过感应耦合等离子体蚀刻工艺制作电极,得到具有电极的MicroLEDs晶圆。In one embodiment, in step S1, the wafer fabrication of MicroLEDs follows the following steps: First, various crystal layers of MicroLED are prepared on the wafer substrate by metal organic chemical vapor deposition equipment, including: GaN buffer layer/n Type GaN, multi-quantum well layer light-emitting layer/P-type GaN; then form an ITO current spreading layer and a metal electrode layer on the wafer, and fabricate electrodes through an inductively coupled plasma etching process to obtain MicroLEDs wafers with electrodes.
根据本申请的另一方面,提供一种MicroLED芯片的转移方法,将包含导电粒子的ACF胶预先贴合于MicroLED 晶圆上,再通过转移MicroLED芯片到TFT基板上,使MicroLED的电极与TFT的电极实现对位,随后通过对压头的加热和压力实现MicroLED的电极与TFT的电极的电性连接。According to another aspect of the present application, a method for transferring MicroLED chips is provided. ACF glue containing conductive particles is pre-attached to the MicroLED wafer, and then the MicroLED chip is transferred to the TFT substrate to make the electrodes of the MicroLED and the TFT The electrodes are aligned, and then the electrodes of the MicroLED and the electrodes of the TFT are electrically connected by heating and pressing the indenter.
在本申请的所述转移方法中,使得ACF胶仅位于MicroLEDs晶圆下表面,可以有避免由于TFT基板不平坦问题导致在非LED 绑定(bonding),从而污染压头的现象。In the transfer method of the present application, the ACF glue is only located on the lower surface of the MicroLEDs wafer, which can avoid the phenomenon of non-LED bonding due to uneven TFT substrates, thereby contaminating the indenter.
在一实施例中,所述转移方法包括以下具体步骤:In an embodiment, the transfer method includes the following specific steps:
S1:制作MicroLEDs晶圆,在一所述晶圆包括基板以及排列于该基板的表面上的MicroLED芯片,所述MicroLED芯片形成金属电极,在所述MicroLED芯片电极侧胶合ACF胶;S1: Fabrication of MicroLEDs wafers. One of the wafers includes a substrate and MicroLED chips arranged on the surface of the substrate. The MicroLED chips form metal electrodes, and ACF glue is glued on the electrode side of the MicroLED chips;
S2 :将MicroLEDs晶圆通过ACF胶侧粘合到临时基板上;S2: Adhere the MicroLEDs wafer to the temporary substrate through the ACF glue side;
S3:剥离MicroLEDs晶圆基板,将MicroLEDs晶圆切割为MicroLED芯片;以及,S3: Peel off the MicroLEDs wafer substrate and cut the MicroLEDs wafer into MicroLED chips; and,
S4 :将MicroLED芯片与临时基板解胶,转移MicroLED芯片至TFT基板。S4: Dissolve the MicroLED chip from the temporary substrate, and transfer the MicroLED chip to the TFT substrate.
在一实施例中,先在晶圆(晶片)上形成异方性导电膜,然后再进行切割,以获得具有ACF膜的MicroLED芯片结构,并进行后续的转移步骤。In one embodiment, the anisotropic conductive film is formed on the wafer (chip) first, and then dicing is performed to obtain the MicroLED chip structure with the ACF film, and the subsequent transfer step is performed.
在一实施例中,上述制作MicroLEDs晶圆步骤中,所述晶圆基板是蓝宝石基板。In one embodiment, in the above step of fabricating the MicroLEDs wafer, the wafer substrate is a sapphire substrate.
在一实施例中,上述制作MicroLEDs晶圆步骤中,所述晶圆基板是氮化镓基板。In one embodiment, in the above step of fabricating the MicroLEDs wafer, the wafer substrate is a gallium nitride substrate.
在一实施例中,上述制作MicroLEDs晶圆步骤中,所述晶圆基板是氮化铝基板。In one embodiment, in the above step of fabricating the MicroLEDs wafer, the wafer substrate is an aluminum nitride substrate.
在一实施例中,上述制作MicroLEDs晶圆步骤中,所述晶圆基板是硅基板。In one embodiment, in the above step of fabricating the MicroLEDs wafer, the wafer substrate is a silicon substrate.
在一实施例中,上述制作MicroLEDs晶圆步骤中,所述晶圆基板是砷化镓基板。In one embodiment, in the above step of fabricating the MicroLEDs wafer, the wafer substrate is a gallium arsenide substrate.
在本一实施例中,上述制作MicroLEDs晶圆步骤中,所述晶圆基板是碳化硅基板。In this embodiment, in the step of fabricating a wafer of MicroLEDs, the wafer substrate is a silicon carbide substrate.
在一实施例中,上述剥离MicroLEDs晶圆基板,是通过在所述晶圆基板侧照射激光,实现所述晶圆基板剥离。In one embodiment, the stripping of the wafer substrate of MicroLEDs is achieved by irradiating a laser on the side of the wafer substrate to achieve the stripping of the wafer substrate.
在一实施例中,上述将MicroLED芯片与临时基板解胶步骤中,所述临时基板解胶是通过紫外光照射解胶。In one embodiment, in the above-mentioned step of debonding the MicroLED chip and the temporary substrate, the temporary substrate is debonded by ultraviolet light irradiation.
在一实施例中,上述将MicroLED芯片与临时基板解胶步骤中,晶圆是2吋或4吋。In one embodiment, in the above-mentioned step of debonding the MicroLED chip and the temporary substrate, the wafer is 2 inches or 4 inches.
有益效果Beneficial effect
在本发明的所述MicroLED转移方法中,透过在粘合MicroLEDs晶圆与临时基板前,在MicroLED芯片电极侧胶合ACF胶,因此可以大量节省ACF胶的使用量,提升ACF材料的利用率,避免材料浪费。并且,由于在ACF仅位于MicroLED下表面,可以有避免由于TFT地形不平坦问题导致污染压头的现象。In the MicroLED transfer method of the present invention, by gluing the ACF glue on the electrode side of the MicroLED chip before bonding the MicroLEDs wafer and the temporary substrate, the amount of ACF glue used can be greatly saved, and the utilization rate of ACF materials can be improved. Avoid waste of materials. In addition, since the ACF is only located on the lower surface of the MicroLED, it is possible to avoid contamination of the indenter due to uneven terrain of the TFT.
附图说明Description of the drawings
图1是现有技术中MicroLED 转移到TFT基板上的结构示意图;FIG. 1 is a schematic diagram of the structure of the MicroLED transferred to the TFT substrate in the prior art;
图2是根据本发明一实施例的MicroLED转移方法的流程示意图;FIG. 2 is a schematic flowchart of a MicroLED transfer method according to an embodiment of the present invention;
图3A至图3E是图2所示MicroLED转移方法的步骤流程中对应的结构示意图。3A to 3E are schematic diagrams of corresponding structures in the step flow of the MicroLED transfer method shown in FIG. 2.
本发明的实施方式Embodiments of the invention
以下,结合具体实施方式,对本申请的技术进行详细描述。应当知道的是,以下具体实施方式仅用于帮助本领域技术人员理解本申请,而非对本申请的限制。Hereinafter, the technology of the present application will be described in detail in combination with specific implementations. It should be understood that the following specific implementations are only used to help those skilled in the art understand the application, but not to limit the application.
以下实施例的说明是参考附加的图式,用以例示本申请可用以实施的特定实施例。本申请所提到的方向用语,例如「上」、「下」、「前」、「后」、「左」、「右」、「顶」、「底」等,仅是参考附加图式的方向。因此,使用的方向用语是用以说明及理解本申请,而非用以限制本申请。The description of the following embodiments refers to the attached drawings to illustrate specific embodiments that can be implemented in this application. The directional terms mentioned in this application, such as "up", "down", "front", "rear", "left", "right", "top", "bottom", etc., are only for reference to additional drawings direction. Therefore, the directional terms used are used to illustrate and understand the application, rather than to limit the application.
如图2是本申请所述MicroLED转移方法的流程示意图;图3 A至图3E是与图2所示MicroLED转移方法的步骤流程对应的结构示意图。FIG. 2 is a schematic flow diagram of the MicroLED transfer method described in this application; FIGS. 3A to 3E are structural schematic diagrams corresponding to the step flow of the MicroLED transfer method shown in FIG. 2.
如图2所示,在本实施例中提供一种MicroLED转移方法包括:步骤S1:制作MicroLEDs晶圆的步骤:步骤S2:将所述MicroLEDs晶圆1粘合到临时基板上的步骤:步骤S3:剥离MicroLEDs晶圆基板的步骤;以及,步骤S4:获得MicroLED芯片的步骤。As shown in FIG. 2, in this embodiment, a method for transferring MicroLEDs is provided, including: Step S1: a step of fabricating a MicroLEDs wafer: step S2: a step of bonding the MicroLEDs wafer 1 to a temporary substrate: step S3 : The step of peeling off the wafer substrate of the MicroLEDs; and, step S4: the step of obtaining the MicroLED chip.
在所述步骤S1中,如图3A所示,首先在一基板S上制作MicroLEDs晶圆1,并在所述MicroLEDs晶圆1上设置用于形成MicroLED芯片的电极2。随后,在所述电极2上胶合ACF胶3。In the step S1, as shown in FIG. 3A, a MicroLEDs wafer 1 is first fabricated on a substrate S, and electrodes 2 for forming MicroLED chips are provided on the MicroLEDs wafer 1. Subsequently, the ACF glue 3 is glued on the electrode 2.
在本实施例中,所述MicroLEDs晶圆1是2吋或4吋,但本发明并不以晶圆1的大小为限制。所述MicroLEDs晶元1的基板S,可以是,例如:蓝宝石基板(Sapphire Substrate)、氮化镓基板(Gallium Nitride Substrate)、氮化铝基板(Aluminum Nitride Substrate)、硅基板(Silicon Substrate)、砷化镓基板(Gallium Arsenide Substrate)或碳化硅基板(Silicon Carbide Substrate)等。在本实施例中采用蓝宝石基板。In this embodiment, the MicroLEDs wafer 1 is 2 inches or 4 inches, but the invention is not limited to the size of the wafer 1. The substrate S of the MicroLEDs wafer 1 may be, for example, a sapphire substrate (Sapphire Substrate), a gallium nitride substrate (Gallium Nitride Substrate), aluminum nitride substrate (Aluminum Nitride Substrate), silicon substrate (Silicon Substrate), gallium arsenide substrate (Gallium Arsenide Substrate) or silicon carbide substrate (Silicon Carbide Substrate) and so on. In this embodiment, a sapphire substrate is used.
所述MicroLEDs晶圆1的制作过程包括:首先通过金属有机物化学气相沉积设备在蓝宝石(Al2O3)衬底上制备出MicroLED的各类晶层,如:GaN buffer层/n型GaN,、多量子阱层(MQW)发光层/P型GaN;再在晶圆上形成ITO电流扩展层以及金属电极层,通过ICP(感应耦合等离子体蚀刻)工艺制作电极。最终,如图3A所示,获得具有电极2的MicroLEDs晶圆1,并在具有电极的MicroLEDs晶圆1制作完成后,在电极2侧胶合ACF胶3。The manufacturing process of the MicroLEDs wafer 1 includes: first, various crystal layers of MicroLEDs, such as GaN, are prepared on a sapphire (Al2O3) substrate by metal organic chemical vapor deposition equipment. Buffer layer/n-type GaN, multi-quantum well layer (MQW) light-emitting layer/P-type GaN; then an ITO current spreading layer and a metal electrode layer are formed on the wafer, and electrodes are made by ICP (inductively coupled plasma etching) process. Finally, as shown in FIG. 3A, a MicroLEDs wafer 1 with electrodes 2 is obtained, and after the fabrication of the MicroLEDs wafer 1 with electrodes is completed, the ACF glue 3 is glued on the electrode 2 side.
在所述步骤S2中,如图2和图3B所示,将所述MicroLEDs晶圆1通过ACF胶3侧粘合到临时基板7上。In the step S2, as shown in FIG. 2 and FIG. 3B, the MicroLEDs wafer 1 is bonded to the temporary substrate 7 through the ACF glue 3 side.
在所述步骤S3中。如图2和图3C所示,利用激光剥离技术(Laser Lift-Off),通过在所述基板S侧照射266nm激光,使处于基板S与GaN界面处的GaN气化,从而剥离所述基板S。此时,如图3C所示,通过所述ACF胶3粘合在临时基板7上的仅为具有电极2的MicroLEDs晶圆1,而没有所述基板S。In the step S3. As shown in Figure 2 and Figure 3C, using laser lift-off technology (Laser Lift-Off), the substrate S is irradiated with a 266nm laser to vaporize the GaN at the interface between the substrate S and GaN, thereby peeling off the substrate S . At this time, as shown in FIG. 3C, only the MicroLEDs wafer 1 with electrodes 2 is adhered to the temporary substrate 7 by the ACF glue 3, and the substrate S is not.
接着,在所述步骤S3中,如图2和图3D所示,通过切割,将所述MicroLEDs晶圆1切割为多个MicroLED芯片6。此时,所有MicroLED芯片6通过所述ACF胶3粘合在临时基板7。并且,如图3D所示,所述ACF胶3也被一并切割。Next, in the step S3, as shown in FIG. 2 and FIG. 3D, the MicroLEDs wafer 1 is cut into a plurality of MicroLED chips 6 by cutting. At this time, all the MicroLED chips 6 are bonded to the temporary substrate 7 through the ACF glue 3. And, as shown in FIG. 3D, the ACF glue 3 is also cut together.
在所述步骤S4中,在转移前,通过紫外光(ultraviolet)照射,实现MicroLED芯片与临时基板解胶,即可通过转移设备的转移头把所述MicroLED芯片6从临时基板7上取下并取放到一TFT基板4上。从而,如图3E所示,利用ACF胶3将MicroLED芯片6的电极2与一TFT基板4的电极5实现对位,再通过对压头的加热和压力,实现MicroLED芯片6的电极2与所述TFT基板4上的电极5电气连接。In the step S4, prior to the transfer, the MicroLED chip and the temporary substrate are irradiated by ultraviolet light to de-glue, and then the MicroLED chip 6 can be removed from the temporary substrate 7 by the transfer head of the transfer device. Take and place on a TFT substrate 4. Thus, as shown in FIG. 3E, the electrode 2 of the MicroLED chip 6 is aligned with the electrode 5 of a TFT substrate 4 using the ACF glue 3, and then the electrodes 2 of the MicroLED chip 6 are aligned with the electrode 5 of a TFT substrate 4 by heating and pressing the indenter. The electrodes 5 on the TFT substrate 4 are electrically connected.
本领域技术人员可以理解的是,本文中术语MicroLED指示尺寸小于100um的LED,又称uLED;术语ACF是指异方性导电胶膜,是Anisotropic Conductive Film的缩写。Those skilled in the art can understand that the term MicroLED in this article refers to LEDs with a size less than 100um, also known as uLED; the term ACF refers to anisotropic conductive film, which is Anisotropic Abbreviation for Conductive Film.
本申请已由上述相关实施例加以描述,然而上述实施例仅为实施本申请的范例。必需指出的是,已公开的实施例并未限制本申请的范围。相反地,包含于权利要求书的精神及范围的修改及均等设置均包括于本申请的范围内。This application has been described by the above-mentioned related embodiments, but the above-mentioned embodiments are only examples for implementing this application. It must be pointed out that the disclosed embodiments do not limit the scope of the application. On the contrary, modifications and equivalent arrangements included in the spirit and scope of the claims are all included in the scope of the present application.
工业实用性Industrial applicability
本申请的主题可以在工业中制造和使用,具备工业实用性。The subject of this application can be manufactured and used in industry and has industrial applicability.

Claims (13)

  1. 一种MicroLED芯片的转移方法,包括以下步骤:A method for transferring MicroLED chips includes the following steps:
    S1:制作MicroLEDs晶圆,所述晶圆包括基板以及排列于该基板表面上的MicroLED芯片,并在MicroLED芯片上形成金属电极,在所述MicroLED芯片电极侧胶合ACF胶;其中,所述晶圆基板为蓝宝石基板、氮化镓基板、氮化铝基板、硅基板、砷化镓基板、或碳化硅基板;S1: Fabricate a MicroLEDs wafer, the wafer includes a substrate and MicroLED chips arranged on the surface of the substrate, and a metal electrode is formed on the MicroLED chip, and ACF glue is glued on the electrode side of the MicroLED chip; wherein, the wafer The substrate is a sapphire substrate, a gallium nitride substrate, an aluminum nitride substrate, a silicon substrate, a gallium arsenide substrate, or a silicon carbide substrate;
    S2:将MicroLEDs晶圆通过ACF胶侧粘合到临时基板上;S2: Bond the MicroLEDs wafer to the temporary substrate through the ACF glue side;
    S3:剥离MicroLEDs晶圆基板,并将MicroLEDs晶圆切割为MicroLED芯片;其中,通过在所述晶圆基板侧照射激光,剥离所述晶圆基板;以及,S3: peeling off the MicroLEDs wafer substrate and cutting the MicroLEDs wafer into MicroLED chips; wherein, by irradiating the laser on the side of the wafer substrate, the wafer substrate is peeled off; and,
    S4:将MicroLED芯片与临时基板解胶,转移MicroLED芯片至TFT基板,使MicroLED的电极与TFT的电极实现对位;再通过对压头的加热和压力,使得MicroLED的电极与TFT的电极的电性连接;其中,通过通过紫外光照射将MicroLED芯片与临时基板解胶。S4: Dissolve the MicroLED chip from the temporary substrate, transfer the MicroLED chip to the TFT substrate, and align the electrodes of the MicroLED with the electrodes of the TFT; and then heat and pressure the pressure head to make the electrodes of the MicroLED and the TFT Sexual connection; wherein, the MicroLED chip and the temporary substrate are debonded by ultraviolet light irradiation.
  2. 如权利要求1所述的转移方法,其中,在步骤S3中,在所述晶圆基板测照射266nm激光,以剥离所述晶圆基板。The transfer method according to claim 1, wherein in step S3, a 266 nm laser is irradiated on the wafer substrate to peel off the wafer substrate.
  3. 如权利要求1所述的转移方法,其中,在步骤S1中,MicroLEDs 晶圆制作按下述步骤:首先,通过金属有机物化学气相沉积设备在晶圆基板上制备出MicroLED的各类晶层,包括:GaN buffer层/n型GaN,、多量子阱层发光层/P型GaN;再在晶圆上形成ITO电流扩展层以及金属电极层,通过感应耦合等离子体蚀刻工艺制作电极,得到具有电极的MicroLEDs晶圆。The transfer method according to claim 1, wherein, in step S1, MicroLEDs wafer fabrication is as follows: firstly, various crystal layers of MicroLEDs are prepared on the wafer substrate by metal organic chemical vapor deposition equipment, including : GaN buffer layer/n-type GaN, multi-quantum well layer light-emitting layer/P-type GaN; then form an ITO current spreading layer and a metal electrode layer on the wafer, and fabricate electrodes through an inductively coupled plasma etching process to obtain electrodes with electrodes MicroLEDs wafers.
  4. 一种MicroLED芯片的转移方法,是将ACF胶预先贴合于MicroLEDs 晶圆上,再通过转移MicroLED芯片到TFT基板上,使MicroLED的电极与TFT的电极实现对位;再通过对压头的加热和压力,使得MicroLED的电极与TFT的电极的电性连接。A method for transferring MicroLED chips is to pre-attach the ACF glue to the MicroLEDs wafer, and then transfer the MicroLED chip to the TFT substrate to align the electrodes of the MicroLED and the TFT; and then heat the pressure head And pressure makes the electrode of MicroLED and the electrode of TFT electrical connection.
  5. 根据权利要求4所述的转移方法,具体步骤如下:According to the transfer method of claim 4, the specific steps are as follows:
    S1:制作MicroLEDs晶圆,所述晶圆包括基板以及排列于该基板表面上的MicroLED芯片,并在MicroLED芯片上形成金属电极,在所述MicroLED芯片电极侧胶合ACF胶;S1: Fabricating a MicroLEDs wafer, the wafer including a substrate and MicroLED chips arranged on the surface of the substrate, forming a metal electrode on the MicroLED chip, and bonding ACF glue on the electrode side of the MicroLED chip;
    S2 :将MicroLEDs晶圆通过ACF胶侧粘合到临时基板上;S2: Adhere the MicroLEDs wafer to the temporary substrate through the ACF glue side;
    S3:剥离MicroLEDs晶圆基板,将MicroLEDs晶圆切割为MicroLED芯片;S3: Peel off the MicroLEDs wafer substrate and cut the MicroLEDs wafer into MicroLED chips;
    S4 :将MicroLED芯片与临时基板解胶,转移MicroLED芯片至TFT基板。S4: Dissolve the MicroLED chip from the temporary substrate, and transfer the MicroLED chip to the TFT substrate.
  6. 根据权利要求4所述的转移方法,其中,MicroLED 晶圆制作按下述步骤:首先,通过金属有机物化学气相沉积设备在晶圆基板上制备出MicroLED的各类晶层,包括:GaN buffer层/n型GaN,、多量子阱层发光层/P型GaN;再在晶圆上形成ITO电流扩展层以及金属电极层,通过感应耦合等离子体蚀刻工艺制作电极,得到具有电极的MicroLEDs晶圆;然后,MicroLEDs晶圆中每个MicroLED的电极侧胶合ACF胶。4. The transfer method according to claim 4, wherein the MicroLED wafer production is as follows: first, various crystal layers of MicroLED are prepared on the wafer substrate by metal organic chemical vapor deposition equipment, including: GaN buffer layer/ n-type GaN, multi-quantum well layer light-emitting layer/P-type GaN; then form an ITO current spreading layer and a metal electrode layer on the wafer, and fabricate electrodes through an inductively coupled plasma etching process to obtain MicroLEDs wafers with electrodes; then , The electrode side of each MicroLED in the MicroLEDs wafer is glued with ACF glue.
  7. 根据权利要求6所述的转移方法,其中,所述晶圆基板是Al 2O 3衬底。 The transfer method according to claim 6, wherein the wafer substrate is an Al 2 O 3 substrate.
  8. 根据权利要求6所述的转移方法,其中,所述晶圆基板是氮化镓基板、氮化铝基板,或硅基板。The transfer method according to claim 6, wherein the wafer substrate is a gallium nitride substrate, an aluminum nitride substrate, or a silicon substrate.
  9. 根据权利要求6所述的转移方法,其中,所述晶圆基板是砷化镓基板。The transfer method according to claim 6, wherein the wafer substrate is a gallium arsenide substrate.
  10. 根据权利要求6所述的转移方法,其中,在S1步骤中,所述晶圆基板是碳化硅基板。The transfer method according to claim 6, wherein, in the step S1, the wafer substrate is a silicon carbide substrate.
  11. 根据权利要求5所述的转移方法,其中,在S3步骤中,所述剥离MicroLEDs晶圆基板是通过在晶圆基板侧照射激光,实现晶圆基板剥离。The transfer method according to claim 5, wherein, in the step S3, the stripping of the MicroLEDs wafer substrate is achieved by irradiating a laser on the side of the wafer substrate to achieve the stripping of the wafer substrate.
  12. 根据权利要求5所述的转移方法,其中,在S4步骤中,所述临时基板解胶是通过紫外光照射解胶。The transfer method according to claim 5, wherein, in step S4, the temporary substrate is debonded by ultraviolet light irradiation.
  13. 根据权利要求4所述的转移方法,其中,所述晶圆是2吋或4吋。The transfer method of claim 4, wherein the wafer is 2 inches or 4 inches.
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