WO2020115980A1 - Film-forming apparatus and film-forming method - Google Patents
Film-forming apparatus and film-forming method Download PDFInfo
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- WO2020115980A1 WO2020115980A1 PCT/JP2019/035460 JP2019035460W WO2020115980A1 WO 2020115980 A1 WO2020115980 A1 WO 2020115980A1 JP 2019035460 W JP2019035460 W JP 2019035460W WO 2020115980 A1 WO2020115980 A1 WO 2020115980A1
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- Prior art keywords
- film forming
- chamber
- forming apparatus
- top plate
- gas
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 21
- 239000011347 resin Substances 0.000 claims abstract description 66
- 229920005989 resin Polymers 0.000 claims abstract description 66
- 238000004140 cleaning Methods 0.000 claims abstract description 44
- 239000000758 substrate Substances 0.000 claims abstract description 41
- 239000002994 raw material Substances 0.000 claims abstract description 23
- 239000007789 gas Substances 0.000 claims description 99
- 239000001301 oxygen Substances 0.000 claims description 24
- 229910052760 oxygen Inorganic materials 0.000 claims description 24
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 21
- 238000010438 heat treatment Methods 0.000 claims description 16
- 238000001816 cooling Methods 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 12
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 230000008569 process Effects 0.000 description 13
- 239000006200 vaporizer Substances 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000008016 vaporization Effects 0.000 description 3
- 238000009834 vaporization Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000004380 ashing Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000012780 transparent material Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- BSYNRYMUTXBXSQ-UHFFFAOYSA-N Aspirin Chemical compound CC(=O)OC1=CC=CC=C1C(O)=O BSYNRYMUTXBXSQ-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000003505 polymerization initiator Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/60—Deposition of organic layers from vapour phase
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/06—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to radiation
- B05D3/061—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to radiation using U.V.
- B05D3/065—After-treatment
- B05D3/067—Curing or cross-linking the coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/228—Gas flow assisted PVD deposition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/541—Heating or cooling of the substrates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/58—After-treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4405—Cleaning of reactor or parts inside the reactor by using reactive gases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
Definitions
- the present invention relates to a film forming apparatus and a film forming method for forming a resin layer made of an energy ray curable resin.
- an energy ray curable resin such as an ultraviolet curable resin to form a resin layer on a substrate
- the following two steps are typically performed. That is, a step of supporting a substrate by a cooling stage and supplying a source gas containing the resin onto the substrate supported by the cooling stage, and irradiating light such as ultraviolet rays onto the substrate to form a cured resin layer on the substrate. And the step of forming.
- a plurality of such steps are not performed in separate vacuum chambers, but a step of supplying a source gas onto the substrate and a step of forming a resin layer cured on the substrate by ultraviolet rays or the like are performed.
- a film forming apparatus that performs the operation in one vacuum chamber (for example, see Patent Document 1).
- a window for transmitting ultraviolet rays is provided on the top plate of the chamber, and the film forming chamber is irradiated with ultraviolet rays through the window, so that the film is deposited on the substrate on the stage.
- a cured product layer of the ultraviolet curable resin is formed.
- the amount of resin that adheres to the top plate increases, so the amount of ultraviolet light that passes through the window decreases, and it is possible to irradiate the substrate on the stage with a sufficient amount of ultraviolet light. become unable. Therefore, the work of opening the chamber to the atmosphere and cleaning or replacing the top plate becomes frequent, and it is difficult to improve productivity.
- an object of the present invention is to provide a film forming apparatus and a film forming method capable of improving productivity.
- a film forming apparatus includes a chamber, a stage, a light source unit, a gas supply unit, and a cleaning unit.
- the chamber has a chamber main body having a film forming chamber, and a top plate having a window portion and attached to the chamber main body.
- the stage is disposed in the film forming chamber and has a support surface that supports the substrate.
- the light source unit is installed on the top plate and has an irradiation source for irradiating the supporting surface with energy rays through the window.
- the gas supply unit supplies a raw material gas containing an energy ray curable resin that is cured by receiving the energy ray irradiation to the film forming chamber.
- the cleaning unit is connected to the chamber and introduces a cleaning gas for removing the energy ray-curable resin adhering to the top plate into the film forming chamber.
- the film forming apparatus includes the cleaning unit that removes the energy ray curable resin adhering to the top plate, it is possible to clean the top plate without opening the chamber to the atmosphere, which improves productivity. It is possible to improve.
- the cleaning unit may include a plasma generator that generates oxygen plasma as the cleaning gas.
- the gas supply unit is formed between the top plate and the shower plate, and the raw material gas is introduced between the shower plate and the shower plate that is arranged to face the top plate and is made of a material that transmits the energy rays. And a space part.
- the cleaning unit introduces the cleaning gas into the space. As a result, not only the top plate but also the shower plate can be cleaned.
- the cleaning unit may include a plasma generator that generates oxygen plasma as the cleaning gas.
- the plasma generator may be provided at a plurality of places around the gas supply unit.
- the stage may have a cooling source capable of cooling the support surface.
- the top plate may further include a frame portion that supports the window portion, and a heating source that heats the frame portion.
- the irradiation source may be an ultraviolet lamp.
- a film forming method includes depositing an energy ray curable resin on the substrate by supplying a source gas from the gas supply unit onto the substrate supported by the support surface.
- a cured product layer of the energy ray curable resin is formed by irradiating the energy ray from the irradiation source through the window.
- the energy ray-curable resin attached to the top plate is removed with a cleaning gas.
- FIG. 3 is a schematic plan view of a gas supply unit showing an arrangement example of a plasma generator in the film forming apparatus. It is a schematic sectional drawing which shows the film-forming apparatus which concerns on other embodiment of this invention.
- FIG. 1 is a schematic sectional view showing a film forming apparatus 100 according to an embodiment of the present invention.
- the X-axis direction and the Y-axis direction indicate the horizontal directions orthogonal to each other
- the Z-axis direction indicates the direction orthogonal to the X-axis direction and the Y-axis direction.
- the film forming apparatus 100 is configured as a film forming apparatus for forming a layer made of an ultraviolet ray curable resin which is an energy ray curable resin on a substrate.
- the film forming apparatus 100 is an apparatus for supplying a source gas containing an ultraviolet curable resin onto the substrate W and then irradiating the substrate W with ultraviolet rays to form an ultraviolet curable resin layer.
- the film forming apparatus 100 includes a chamber 10.
- the chamber 10 has a chamber main body 11 and a top plate 12 that hermetically closes the opening 11 a of the chamber main body 11.
- the film forming apparatus 100 further includes a stage 15, a light source unit 20, a gas supply unit 30, and a cleaning unit 40.
- the chamber main body 11 is a metal rectangular parallelepiped vacuum container having an open top, and has a film forming chamber 13 inside.
- the film forming chamber 13 is configured to be able to evacuate or maintain a predetermined reduced pressure atmosphere via a vacuum evacuation system 19 connected to the bottom of the chamber body 11.
- the top plate 12 has a window portion 121 that transmits ultraviolet rays UV and a frame portion 122 that supports the window portion 121.
- the window 121 is made of an ultraviolet-transparent material such as quartz glass, and the frame 122 is made of a metal material such as an aluminum alloy.
- the number of windows 121 is not particularly limited, and may be two or more, or may be singular.
- stage 15 The stage 15 is arranged in the film forming chamber 13.
- the stage 15 has a stage body 151 having a support surface 151 a that supports the substrate W.
- the stage 15 has a cooling source 153 capable of cooling the support surface 151a to a predetermined temperature or lower.
- the cooling source 153 is composed of, for example, a cooling jacket in which a cooling medium such as cooling water contained in the stage body 151 circulates.
- the cooling temperature of the support surface 151a by the cooling source 153 is set to an appropriate temperature sufficient for condensing the ultraviolet curable resin in the raw material gas described later.
- the substrate W cooled to the predetermined temperature or lower may be transported to the film forming chamber 13.
- the substrate W is a glass substrate, but may be a semiconductor substrate.
- the shape and size of the substrate are not particularly limited, and may be rectangular or circular. Elements may be formed in advance on the film formation surface of the substrate W.
- the resin layer formed on the substrate W functions as a protective film for the element.
- the light source unit 20 has a cover 21 and an irradiation source 22.
- the cover 21 is disposed on the top plate 12 and has a light source chamber 23 that houses an irradiation source 22.
- the light source chamber 23 has, for example, an air atmosphere.
- the irradiation source 22 is a light source that irradiates the support surface 151a of the stage 15 with ultraviolet rays UV as energy rays through the window 121 of the top plate 12, and is typically composed of an ultraviolet lamp.
- the irradiation source 22 may be a light source module in which a plurality of LEDs (Light Emitting Diodes) that emit ultraviolet UV are arranged in a matrix.
- the gas supply unit 30 supplies a raw material gas containing a resin (ultraviolet curable resin) which is cured by being irradiated with ultraviolet rays UV to the film forming chamber 13.
- the gas supply unit 30 can be configured arbitrarily, and has a shower plate 31 and a space 32 in this embodiment.
- the shower plate 31 has a rectangular plate shape and has a plurality of gas supply holes 311 in the plane.
- the plurality of gas supply holes 311 penetrate the shower plate 31 in the thickness direction and allow the space 32 and the film forming chamber 13 to communicate with each other.
- the shower plate 31 is made of an ultraviolet-transparent material such as quartz glass.
- the shower plate 31 is fixed to the inner wall surface of the chamber body 11 via an appropriate fixing member.
- the space 32 is formed between the top plate 12 and the shower plate 31.
- the raw material gas is introduced into the space portion 32 through the raw material gas generation portion 101.
- the ultraviolet curable resin material for example, an acrylic resin can be used. It is also possible to add a polymerization initiator or the like to the above resin and use it.
- the raw material gas containing such a resin is generated by the raw material gas generation unit 101 installed outside the chamber 10.
- the raw material gas generation unit 101 introduces the raw material gas containing the resin into the space 32 of the gas supply unit 30 via the pipe 130.
- the raw material gas generation unit 101 includes a resin material supply line 110, a vaporizer 120, and a pipe 130.
- the resin material supply line 110 has a tank 111 filled with a liquid resin material, and a pipe 112 that conveys the resin material from the tank 111 to the vaporizer 120.
- a carrier gas made of an inert gas such as nitrogen is used to convey the resin material from the tank 111 to the vaporizer 120.
- a valve V1, a liquid flow rate controller (not shown), or the like can be attached to the pipe 112.
- the raw material gas generated in the vaporizer 120 is supplied to the space 32 of the gas supply unit 30 via the pipe 130.
- a valve V2 is attached to the pipe 130, and the flow of gas into the space 32 can be adjusted. Further, it is possible to control the flow rate of the gas flowing into the space 32 by attaching a flow rate controller (not shown).
- the gas supply unit 30 further includes a first heating source 341 that heats the frame portion 122 of the top plate 12 and a second heating source 342 that heats the shower plate 31.
- the first heating source 341 is composed of a hot water passage built in the frame portion 122 of the top plate 12.
- the second heating source 342 is composed of a heater fixed to the surface of the shower plate 31.
- the second heating source 342 may be attached to the surface of the shower plate 31 facing the film forming chamber 13 as illustrated, or may be attached to the surface of the shower plate 31 facing the space 32.
- the first heating source 341 and the second heating source 342 are for preventing the resin material contained in the raw material gas introduced into the space 32 from adhering to the inner wall of the space 32.
- the gas supply unit 30 can be heated to an appropriate temperature equal to or higher than the vaporization temperature of the material.
- a cartridge heater or a hot water passage may be provided as the third heating source 343 in the upper portion (opening 11a) of the chamber 10 close to the gas supply unit 30.
- the gas supply unit 30 is maintained at the vaporization temperature of the resin material in the raw material gas or higher by the first heating source 341, the second heating source 342, and the third heating source 343.
- a window 121 of the top plate 12 or the like which has a relatively low heat transfer efficiency, may not be heated to a sufficient temperature, and the resin component may be condensed and attached.
- the film formation time the number of processed substrates
- the region where the resin adheres to the inner surface of the space 32 and the thickness thereof increase, so that the amount of ultraviolet light that passes through the gas supply unit 30 decreases and the stage 15
- the upper substrate W cannot be irradiated with a sufficient amount of ultraviolet rays. Therefore, in this embodiment, a cleaning unit 40 is provided for removing the resin component in the raw material gas adhering to the top plate 12, the shower plate 31, the opening 11a of the chamber body 11, and the like.
- the cleaning unit 40 is connected to the chamber 10 and introduces a cleaning gas into the space 32.
- the cleaning unit 40 includes a plasma generator 41 that generates oxygen plasma as a cleaning gas.
- the plasma generator 41 is not particularly limited as long as it is a device capable of generating oxygen plasma, such as an ICP plasma device, an ECR plasma device, and a helicon wave plasma generator.
- a gas for generating oxygen plasma for example, oxygen or a mixed gas of oxygen and argon is used.
- the generated oxygen plasma oxygen radicals
- a valve V3 is attached to the pipe 42, and the valve V3 is closed during the film formation to prevent the raw material gas from entering the plasma generator 41.
- a plurality of plasma generators 41 are installed, but a single plasma generator 41 may be installed.
- the plasma generators 41 are provided at a plurality of places around the gas supply unit 30.
- the number of plasma generators 41 to be installed and the place of installation are not particularly limited, and can be set arbitrarily according to the size and shape of the space 32.
- FIG. 2 is a schematic plan view of the gas supply unit 30 showing an arrangement example of the plasma generator 41.
- the plasma generator 41 includes a pair of first plasma generators 411 arranged along one side of the gas supply unit 30, and a pair of first plasma generators 411 arranged on the other two sides adjacent to the one side. 2 plasma generators 412.
- the first plasma generators 411 are arranged adjacent to each other to irradiate almost the entire region of the space 32 with oxygen plasma.
- the second plasma generators 412 are arranged so as to be offset from each other, so that the oxygen plasma is irradiated to the regions inside the space 32 located on the upstream side and the downstream side of the oxygen plasma from the first plasma generator 41. To do.
- the oxygen plasma emitted from each of the plasma generators 41 has a high rectilinearity, a sufficient amount of oxygen plasma can be introduced into all the regions of the space 32.
- the device configuration can be simplified as compared with the case where oxygen plasma is directly generated inside the space 32. Further, by providing a plurality of plasma generators 41, it is possible to supply a sufficient amount of oxygen plasma to the space 32.
- the film forming apparatus 100 further includes a control unit 50.
- the control unit 50 is typically composed of a computer and controls each unit of the film forming apparatus 100.
- the film forming step includes a step of supplying a raw material gas containing an ultraviolet curable resin and a step of curing the ultraviolet resin layer.
- the film forming chamber 13 is regulated to a predetermined degree of vacuum by the vacuum evacuation system 19, and the substrate W is placed on the support surface 151a cooled to a predetermined temperature or lower.
- the gas supply unit 30 is heated to a temperature equal to or higher than the vaporization temperature of the ultraviolet curable resin by the first to third heating sources 341 to 343.
- the raw material gas containing the ultraviolet curable resin generated in the raw material gas generation unit 101 is introduced into the gas supply unit 30 via the pipe 130.
- the source gas introduced into the gas supply unit 30 diffuses in the space 32 and is supplied to the entire surface of the substrate W on the stage 15 via the plurality of gas supply holes 311 of the shower plate 31.
- the ultraviolet curable resin in the source gas supplied to the surface of the substrate W is condensed and deposited on the surface of the substrate W cooled to a temperature equal to or lower than its condensation temperature.
- the supply of the raw material gas is stopped, and the ultraviolet rays UV are irradiated from the irradiation source 22 of the light source unit 20 toward the supporting surface 151a of the stage 15. Since the gas supply unit 30 is made of a material that transmits ultraviolet light, a sufficient amount of ultraviolet light UV is applied to the substrate W on the support surface 151 a via the gas supply unit 30. Thereby, a cured product layer of the ultraviolet curable resin is formed on the substrate W.
- the substrate W is unloaded from the film forming chamber 13, and a new undeposited substrate W is loaded into the film forming chamber. Then, the above-mentioned steps are similarly performed. Accordingly, the ultraviolet curable resin layer having a predetermined thickness can be formed on the substrate W with one film forming apparatus.
- the resin component in the source gas is gradually deposited in the space 32 of the gas supply unit 30, and the ultraviolet rays of the window 121 of the top plate 12 and the shower plate 31 are irradiated. It may reduce the transmittance. Therefore, in the present embodiment, the cleaning process of the space 32 using the cleaning unit 40 is performed.
- the cleaning process is performed with the supply of the source gas stopped.
- Oxygen plasma oxygen radicals generated in each plasma generator 41 (411, 412) is introduced into the space 32 of the gas supply unit 30 via the pipe 42.
- the carbon of the ultraviolet curable resin attached to the inner surfaces of the space 32 (the top plate 12, the shower plate 31, and the opening 11a of the chamber body 11) is combined with oxygen radicals to be vaporized as CO 2 and decomposed.
- the decomposed ultraviolet curable resin is exhausted by the vacuum exhaust system 19 through the film forming chamber 13.
- the ultraviolet curable resin deposited in the space 32 is removed, or the amount of the ultraviolet curable resin deposited in the space 32 is reduced.
- the resin is effectively prevented from being deposited on a portion such as the window 121 of the top plate 12 which is not directly heated by the heating source, a stable amount of transmitted ultraviolet light can be maintained for a long time. As a result, the number of substrates to be formed is increased, so that a film forming apparatus with excellent productivity can be provided.
- the ceiling plate 12, the shower plate 31, and the cleaning unit capable of removing the ultraviolet curable resin adhering to the opening 11a of the chamber body 11 are provided, so that the gas can be used for a long time. It is possible to secure a sufficient amount of ultraviolet light that passes through the supply unit 30, which can improve productivity.
- the cleaning process of the top plate 12 and the like can be performed while the vacuum state of the film forming chamber 13 is supported, the film forming process can be performed without exposing the film forming chamber 13 to the atmosphere.
- the cleaning process can be performed between the above.
- the work of removing the easily vulnerable parts such as the resin is performed by the ashing process using the plasma of the cleaning gas, the resin can be removed without damaging the surface to which the resin is attached.
- the gas supply unit 30 is composed of the shower plate 31, but the present invention is not limited to this.
- a plurality of gas supply pipes 33 arranged between the top plate 12 and the stage 15 may be adopted as the gas supply unit 30′.
- the gas supply pipes 33 extend in the Y-axis direction and are arranged at equal intervals in the X-axis direction.
- a plurality of gas supply holes for discharging the source gas toward the substrate W on the stage 15 are provided on the peripheral surface of the gas supply pipe 33.
- the plasma generator 41 introduces oxygen plasma as a cleaning gas between the top plate 12 and the gas supply pipe 33.
- the resin attached to the top plate 12 and the gas supply pipe 33 can be removed.
- the plasma generator capable of introducing oxygen plasma into the space 32 of the gas supply unit 30 is used as the cleaning unit, but the present invention is not limited to this, and oxygen plasma is directly generated inside the space 32.
- a plasma source capable of being activated may be provided as a cleaning unit.
- oxygen plasma was adopted as the cleaning gas, but the type of cleaning gas can be set as appropriate depending on the type of energy ray curing resin.
- the energy ray is an ultraviolet ray
- the energy ray is an ultraviolet ray
- the irradiation source may be an oscillator or the like.
- an electron beam as the energy beam and an electron beam source as the irradiation source.
- the film forming apparatus according to the above embodiment is also possible to use as a part of an in-line type or cluster type film forming apparatus having a plurality of chambers.
- a device By using such a device, it becomes easier to manufacture an element having a plurality of layers such as a light emitting element. Further, with such a device, cost reduction, space saving, and further improvement in productivity can be realized.
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Abstract
Description
前記チャンバは、成膜室を有するチャンバ本体と、窓部を有し前記チャンバ本体に取り付けられた天板とを有する。
前記ステージは、前記成膜室に配置され、基板を支持する支持面を有する。
前記光源ユニットは、前記天板に設置され、前記窓部を介してエネルギ線を前記支持面に照射する照射源を有する。
前記ガス供給部は、前記エネルギ線の照射を受けて硬化するエネルギ線硬化樹脂を含む原料ガスを前記成膜室に供給する。
前記クリーニングユニットは、前記チャンバに接続され、前記天板に付着した前記エネルギ線硬化樹脂を除去するクリーニングガスを前記成膜室へ導入する。 In order to achieve the above object, a film forming apparatus according to one embodiment of the present invention includes a chamber, a stage, a light source unit, a gas supply unit, and a cleaning unit.
The chamber has a chamber main body having a film forming chamber, and a top plate having a window portion and attached to the chamber main body.
The stage is disposed in the film forming chamber and has a support surface that supports the substrate.
The light source unit is installed on the top plate and has an irradiation source for irradiating the supporting surface with energy rays through the window.
The gas supply unit supplies a raw material gas containing an energy ray curable resin that is cured by receiving the energy ray irradiation to the film forming chamber.
The cleaning unit is connected to the chamber and introduces a cleaning gas for removing the energy ray-curable resin adhering to the top plate into the film forming chamber.
前記照射源から前記窓部を介してエネルギ線を照射することで、前記エネルギ線硬化樹脂の硬化物層が形成される。
前記天板に付着したエネルギ線硬化樹脂がクリーニングガスで除去される。 A film forming method according to an aspect of the present invention includes depositing an energy ray curable resin on the substrate by supplying a source gas from the gas supply unit onto the substrate supported by the support surface.
A cured product layer of the energy ray curable resin is formed by irradiating the energy ray from the irradiation source through the window.
The energy ray-curable resin attached to the top plate is removed with a cleaning gas.
成膜装置100は、チャンバ10を備える。チャンバ10は、チャンバ本体11と、チャンバ本体11の開口部11aを気密に閉塞する天板12とを有する。
成膜装置100は、ステージ15と、光源ユニット20と、ガス供給部30と、クリーニングユニット40とをさらに備える。 [Film forming equipment]
The
The
チャンバ本体11は、上部が開口する金属製の直方体形状の真空容器であり、内部に成膜室13を有する。成膜室13は、チャンバ本体11の底部に接続された真空排気系19を介して所定の減圧雰囲気に排気または維持することが可能に構成される。 (Chamber)
The chamber
ステージ15は、成膜室13に配置される。ステージ15は、基板Wを支持する支持面151aを有するステージ本体151を有する。 (stage)
The
光源ユニット20は、カバー21と、照射源22とを有する。カバー21は、天板12の上に配置され、照射源22を収容する光源室23を有する。光源室23は、例えば、大気雰囲気である。照射源22は、ステージ15の支持面151aに向けて、天板12の窓部121を介してエネルギ線としての紫外線UVを照射する光源であり、典型的には、紫外線ランプで構成される。これに限られず、照射源22には、紫外線UVを発光する複数のLED(Light Emitting Diode)がマトリクス状に配列された光源モジュールが採用されてもよい。 (Light source unit)
The
ガス供給部30は、紫外線UVの照射を受けて硬化する樹脂(紫外線硬化樹脂)を含む原料ガスを成膜室13へ供給する。ガス供給部30は任意に構成可能であり、本実施形態ではシャワープレート31と、空間部32とを有する。 (Gas supply unit)
The
そこで本実施形態では、天板12、シャワープレート31、チャンバ本体11の開口部11a等に付着した原料ガス中の樹脂成分を除去するためのクリーニングユニット40を備える。 As described above, the
Therefore, in this embodiment, a
クリーニングユニット40は、チャンバ10に接続され、空間部32にクリーニングガスを導入する。本実施形態においてクリーニングユニット40は、クリーニングガスとして酸素プラズマを発生させるプラズマ発生器41を含む。 (Cleaning unit)
The
続いて、以上のように構成される本実施形態の成膜装置100を用いた成膜方法について説明する。 [Film forming method]
Next, a film forming method using the
成膜工程では、紫外線硬化樹脂を含む原料ガスの供給工程と、紫外線樹脂層の硬化工程とを有する。 (Film forming process)
The film forming step includes a step of supplying a raw material gas containing an ultraviolet curable resin and a step of curing the ultraviolet resin layer.
クリーニング工程は、原料ガスの供給が停止した状態で実施される。各プラズマ発生器41(411,412)において発生した酸素プラズマ(酸素ラジカル)は、配管42を介してガス供給部30の空間部32へ導入される。空間部32の内面(天板12、シャワープレート31、チャンバ本体11の開口部11a)に付着した紫外線硬化樹脂の炭素は、酸素ラジカルと結合してCO2として気化し、分解される。分解した紫外線硬化樹脂は、成膜室13を介して真空排気系19により排気される。 (Cleaning process)
The cleaning process is performed with the supply of the source gas stopped. Oxygen plasma (oxygen radicals) generated in each plasma generator 41 (411, 412) is introduced into the
以上の実施形態では、ガス供給部30をシャワープレート31で構成したが、これに限られない。例えば図3に示すように、ガス供給部30'として、天板12とステージ15との間に配置された複数のガス供給配管33が採用されてもよい。 [Other Embodiments]
In the above embodiment, the
11…チャンバ本体
12…天板
13…成膜室
15…ステージ
20…光源ユニット
22…照射源
30,30'…ガス供給部
31…シャワープレート
32…空間部
40…クリーニングユニット
41,411,412…プラズマ発生器
100…成膜装置
151a…支持面
121…窓部
122…枠部
311…ガス供給孔
341…第1の加熱源 DESCRIPTION OF
Claims (8)
- 成膜室を有するチャンバ本体と、窓部を有し前記チャンバ本体に取り付けられた天板とを有するチャンバと、
前記成膜室に配置され、基板を支持する支持面を有するステージと、
前記天板に設置され、前記窓部を介してエネルギ線を前記支持面に照射する照射源を有する光源ユニットと、
前記エネルギ線の照射を受けて硬化するエネルギ線硬化樹脂を含む原料ガスを前記成膜室に供給するガス供給部と、
前記チャンバに接続され、前記天板に付着した前記エネルギ線硬化樹脂を除去するクリーニングガスを前記成膜室へ導入するクリーニングユニットと
を具備する成膜装置。 A chamber having a chamber main body having a film forming chamber, and a top plate having a window and attached to the chamber main body;
A stage disposed in the film forming chamber and having a supporting surface for supporting the substrate;
A light source unit that is installed on the top plate and has an irradiation source that irradiates the supporting surface with energy rays through the window portion;
A gas supply unit that supplies a raw material gas containing an energy ray curable resin that is cured by receiving the energy ray irradiation to the film forming chamber;
A film forming apparatus comprising a cleaning unit connected to the chamber and introducing a cleaning gas for removing the energy ray-curable resin adhering to the top plate into the film forming chamber. - 請求項1に記載の成膜装置であって、
前記ガス供給部は、前記天板に対向して配置され前記エネルギ線を透過させる材料で構成されたシャワープレートと、前記天板と前記シャワープレートとの間に形成され前記原料ガスが導入される空間部とを有し、
前記クリーニングユニットは、前記クリーニングガスを前記空間部へ導入する
成膜装置。 The film forming apparatus according to claim 1, wherein
The gas supply unit is formed between the top plate and the shower plate, and the shower plate is disposed between the top plate and the shower plate, and the shower plate is arranged to face the top plate and is made of a material that transmits the energy rays. Has a space part,
The film forming apparatus, wherein the cleaning unit introduces the cleaning gas into the space. - 請求項1又は2に記載の成膜装置であって、
前記クリーニングユニットは、前記クリーニングガスとして酸素プラズマを発生させるプラズマ発生器を含む
成膜装置。 The film forming apparatus according to claim 1 or 2, wherein
The film forming apparatus, wherein the cleaning unit includes a plasma generator that generates oxygen plasma as the cleaning gas. - 請求項1~3のいずれか1つに記載の成膜装置であって、
前記プラズマ発生器は、前記チャンバの周囲の複数個所に設けられる
成膜装置。 The film forming apparatus according to any one of claims 1 to 3,
The plasma generator is provided in a plurality of places around the chamber. - 請求項1~4のいずれか1つに記載の成膜装置であって、
前記ステージは、前記支持面を冷却可能な冷却源を有する
成膜装置。 The film forming apparatus according to any one of claims 1 to 4,
The film forming apparatus, wherein the stage has a cooling source capable of cooling the supporting surface. - 請求項1~5のいずれか1つに記載の成膜装置であって、
前記天板は、前記窓部を支持する枠部と、前記枠部を加熱する加熱源をさらに有する
成膜装置。 The film forming apparatus according to any one of claims 1 to 5,
The film forming apparatus, wherein the top plate further includes a frame portion that supports the window portion, and a heating source that heats the frame portion. - 請求項1~6のいずれか1つに記載の成膜装置であって、
前記照射源は、紫外線ランプである
成膜装置。 The film forming apparatus according to any one of claims 1 to 6,
The irradiation source is an ultraviolet lamp. - 請求項1~7のいずれか1つに記載の成膜装置を用いた成膜方法であって、
前記ガス供給部から前記支持面に支持された基板上に原料ガスを供給することで、前記基板上にエネルギ線硬化樹脂を堆積させ、
前記照射源から前記窓部を介してエネルギ線を照射することで、前記エネルギ線硬化樹脂の硬化物層を形成し、
前記天板に付着したエネルギ線硬化樹脂をクリーニングガスで除去する
成膜方法。 A film forming method using the film forming apparatus according to claim 1.
By supplying a source gas from the gas supply unit onto the substrate supported by the support surface, the energy ray curable resin is deposited on the substrate,
By irradiating an energy ray from the irradiation source through the window portion, a cured product layer of the energy ray curable resin is formed,
A film forming method of removing the energy ray curable resin adhering to the top plate with a cleaning gas.
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