JPH0598447A - Photo assisted cvd device - Google Patents

Photo assisted cvd device

Info

Publication number
JPH0598447A
JPH0598447A JP25810491A JP25810491A JPH0598447A JP H0598447 A JPH0598447 A JP H0598447A JP 25810491 A JP25810491 A JP 25810491A JP 25810491 A JP25810491 A JP 25810491A JP H0598447 A JPH0598447 A JP H0598447A
Authority
JP
Japan
Prior art keywords
gas
light source
substrate
chamber
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP25810491A
Other languages
Japanese (ja)
Other versions
JP3174787B2 (en
Inventor
Shigefumi Itsudo
成史 五戸
Seiichi Takahashi
誠一 高橋
Koichi Tamagawa
孝一 玉川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ulvac Inc
Original Assignee
Ulvac Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac Inc filed Critical Ulvac Inc
Priority to JP25810491A priority Critical patent/JP3174787B2/en
Publication of JPH0598447A publication Critical patent/JPH0598447A/en
Application granted granted Critical
Publication of JP3174787B2 publication Critical patent/JP3174787B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a stable light intensity and thereby a stable film forming rate by preventing the temp. rise of a light source itself with a relatively simple means. CONSTITUTION:A gaseous reactant inlet 23 and outlet 24 are provided in a reaction chamber 21 contg. a substrate 22 to be treated so that the gaseous reactant flows almost in parallel with the substrate 22 surface. A light- transissive first gas injection plate 27 having many tiny holes 28 for passing an inert gas is arranged between the reaction chamber 21 and a light source chamber 29, the light source chamber 29 is divided by a second gas injection plate 31 having high reflectivity to the UV or vacuum UV and having many tiny holes, and a light-source lamp 30 is arranged between the plates 27 and 31. Since the light source 30 is cooled by the gas introduced from the plate 31, a definite illuminance is reached in a short time, and an effective and stable cycle time is obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体や液晶ディスプ
レイ等の製造に用いられる薄膜形成装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thin film forming apparatus used for manufacturing semiconductors, liquid crystal displays and the like.

【0002】[0002]

【従来の技術】近年、光のエネルギーを用い、シラン、
ジシランなどの化合物ガスを分解し、シリコンウエハや
ガラス基板上に薄膜を形成する、光CVD装置の開発が
積極的になされている。これら光を用いた光CVD装置
は、プロセスの低温化が可能であり、荷電粒子による基
板や形成膜の劣化も発生しないことから、次世代のデバ
イス製造方法として大きく注目されている。しかしなが
ら、このような光CVD装置においては、反応生成物が
光透過窓やランプ表面を汚し、光量が低下するという大
きな問題点があった。このような問題点に対処するため
に、例えば、特開昭60−209248号公報に示すよ
うに、反応室と光源室とを紫外線透過性の多孔板で仕切
り、該多孔板より不活性ガスをパージすることにより、
光透過窓やランプ表面の汚れを防止する提案がなされて
きた。
2. Description of the Related Art In recent years, silane,
Development of an optical CVD apparatus that decomposes a compound gas such as disilane to form a thin film on a silicon wafer or a glass substrate has been actively made. An optical CVD apparatus using such light can be processed at a low temperature and does not cause deterioration of a substrate or a formed film due to charged particles, and thus has attracted a great deal of attention as a next-generation device manufacturing method. However, in such a photo-CVD apparatus, there is a big problem that the reaction product stains the light-transmitting window and the surface of the lamp and the light amount is reduced. In order to deal with such a problem, for example, as shown in JP-A-60-209248, the reaction chamber and the light source chamber are partitioned by a UV-permeable porous plate, and an inert gas is discharged from the porous plate. By purging,
Proposals have been made to prevent contamination of the light transmission window and the lamp surface.

【0003】図3は、従来用いられてきた光CVD装置
の一例を示す断面図である。図において、1は処理すべ
き基板2を収容する反応室であり、反応ガスの導入系及
び排気系がそれぞれ導入口3及び排気口4に接続されて
いる。この反応室1中には、基板2を装着するステージ
5が設置され、通常、ヒーター6等により一定温度に制
御されている。また、この反応室1は、小孔を多数持っ
た石英製のガス噴出板7を介して光源室9と接続されて
いる。該小孔を多数持った石英製のガス噴出板7は、図
4に示されているように、均一な直径をもった小孔8が
ほぼ全面に一様な密度で分布している。一方、光源室9
には、光化学反応に好適な波長を放出する光源10が設
置されており、基板2上に光を照射できるようになって
いる。また不活性ガスの導入系も導入口11に接続され
ている。
FIG. 3 is a sectional view showing an example of a photo-CVD apparatus which has been conventionally used. In the figure, 1 is a reaction chamber for accommodating a substrate 2 to be processed, and a reaction gas introduction system and an exhaust system are connected to an introduction port 3 and an exhaust port 4, respectively. A stage 5 on which the substrate 2 is mounted is installed in the reaction chamber 1 and is usually controlled to a constant temperature by a heater 6 or the like. The reaction chamber 1 is also connected to a light source chamber 9 via a quartz gas ejection plate 7 having a large number of small holes. As shown in FIG. 4, the quartz gas ejection plate 7 having a large number of small holes has small holes 8 having a uniform diameter distributed almost uniformly over the entire surface. On the other hand, the light source room 9
Is provided with a light source 10 that emits a wavelength suitable for a photochemical reaction so that the substrate 2 can be irradiated with light. An inert gas introducing system is also connected to the introducing port 11.

【0004】作動時、反応ガスは、反応ガス導入系から
導入口3を経て基板2の表面にほぼ平行にシート状に導
入され、好適な波長の光により分解または反応を起こ
し、基板2上に薄膜を堆積する。この時、不活性ガス導
入口11より導入した不活性ガスを、小孔を多数もった
石英製のガス噴出板7を通して基板2の表面に対向する
ように反応室1へ導入し、光源10へ膜付着を防止でき
るように構成されている。
During operation, the reaction gas is introduced in a sheet form from the reaction gas introduction system through the introduction port 3 substantially in parallel to the surface of the substrate 2, decomposes or reacts with light having a suitable wavelength, and is introduced onto the substrate 2. Deposit a thin film. At this time, the inert gas introduced through the inert gas introduction port 11 is introduced into the reaction chamber 1 so as to face the surface of the substrate 2 through the quartz gas ejection plate 7 having a large number of small holes, and then to the light source 10. It is configured to prevent film adhesion.

【0005】[0005]

【発明が解決しようとする課題】ところが、上記のよう
に構成された従来の光CVD装置を用いて長時間の成膜
を行なった場合、成膜時間の増加とともに基板上での照
度が徐々に減少し、実生産を行なう際、一定した成膜時
間が得られないという大きな問題を生じることがわかっ
た。これは光源が真空中に配置されているため、光源冷
却が不十分で、光源自身の温度が上昇するためと推定さ
れる。このような問題を解決する手段として、光源の照
度が常に一定となるように電力を制御することも考えら
れるが、照度計や制御ユニットが必要となり装置の高コ
スト化を招くため、得策ではないと考えられる。
However, when film formation is performed for a long time by using the conventional photo-CVD apparatus configured as described above, the illuminance on the substrate gradually increases as the film formation time increases. It was found that there was a big problem that a constant film formation time could not be obtained during the actual production. It is presumed that this is because the light source is placed in a vacuum, so that the light source is not sufficiently cooled and the temperature of the light source itself rises. As a means to solve such a problem, controlling the electric power so that the illuminance of the light source is always constant can be considered, but it is not a good idea because it requires an illuminance meter and a control unit, which leads to high cost of the device. it is conceivable that.

【0006】本発明は、上記のような問題点を解決し、
比較的簡単な手段で光源自身の温度上昇を防止し、安定
した光強度とそれによる安定した成膜速度を得ることが
できる光CVD装置を提供することを目的としている。
The present invention solves the above problems,
It is an object of the present invention to provide an optical CVD apparatus capable of preventing a temperature rise of a light source itself by a relatively simple means and obtaining a stable light intensity and a stable film forming rate thereby.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するた
め、本発明の光CVD装置は、処理すべき基板を収容す
る反応室と、該反応室内に反応ガスを導入及び排気する
手段と、該反応ガスを光化学反応させ、該基板上に薄膜
を形成させるための光源と、該光源を収容する光源室
と、該反応室と該光源室の間に、多数の小孔を有する光
透過性の第1のガス噴出板を配置し、該反応室内に収容
された基板の表面にほぼ平行にガス導入口より第1のガ
ス流をシート状に導入し、また該基板上の表面に、この
表面に垂直な方向から第2のガス流を、該第1のガス噴
出板より導入して、該基板の表面の近傍に上記第1のガ
ス流を層流状態に保持するようにした光CVD装置にお
いて、該光源室を、紫外光または真空紫外光に対し反射
率が高く、しかも多数の小孔を有する第2のガス噴出板
で仕切り、該第2のガス噴出板と上記第1のガス噴出板
との間に光源を配置し、第2のガス流を第2のガス噴出
板より導入して該光源を第2のガス流によって冷却する
ようにしたことを特徴としている。
In order to achieve the above object, the photo-CVD apparatus of the present invention comprises a reaction chamber for accommodating a substrate to be processed, a means for introducing and exhausting a reaction gas into the reaction chamber, A light source for photochemically reacting a reaction gas to form a thin film on the substrate, a light source chamber for accommodating the light source, and a light-transmitting material having a large number of small holes between the reaction chamber and the light source chamber. A first gas jet plate is arranged, a first gas flow is introduced in a sheet form from a gas inlet port substantially parallel to the surface of the substrate housed in the reaction chamber, and the surface on the substrate is provided with this surface. A photo-CVD apparatus in which a second gas flow is introduced from the direction perpendicular to the above from the first gas jet plate to maintain the first gas flow in a laminar flow state in the vicinity of the surface of the substrate. , The light source chamber has a high reflectance for ultraviolet light or vacuum ultraviolet light, and more It is partitioned by a second gas ejection plate having small holes, a light source is arranged between the second gas ejection plate and the first gas ejection plate, and a second gas flow is generated from the second gas ejection plate. It is characterized in that the light source is introduced and cooled by the second gas flow.

【0008】[0008]

【作用】上記のように構成した本発明による光CVD装
置は、不活性ガスを先ず第2のガス噴出板より導入し、
光源の冷却に使用する。次いで第1のガス噴出板を通し
て反応室内に導入することにより、従来の機能、即ち光
透過性の第1のガス噴出板やランプ表面の汚れをも防止
することができるため、非常に簡単な構成で安定した成
膜条件を得ることができる。
In the photo-CVD apparatus according to the present invention constructed as described above, the inert gas is first introduced from the second gas ejection plate,
Used to cool the light source. Then, by introducing the gas through the first gas jet plate into the reaction chamber, it is possible to prevent the conventional function, that is, the contamination of the light transmissive first gas jet plate and the lamp surface. Thus, stable film forming conditions can be obtained.

【0009】[0009]

【実施例】次に、本発明の実施例を図面と共に説明す
る。図1は、本発明の一実施例を示す光CVD装置の断
面図である。図において、21は、6インチガラス基板
22を収容するアルミ製の反応室であり、反応ガスの導
入系及び排気系が、それぞれ導入口23及び排気口24
に接続されている。この反応室21中には、6インチガ
ラス基板22を装着するステージ25が設置され、赤外
ランプヒーター26により250℃に制御されている。
またこの反応室21は、直径0.6mmの小孔28を多
数持ち、大きさ200mm×250mmで厚さ2mmの
石英製の第1のガス噴出板27を介してアルミ製の光源
室29と接続されている。この光源室29中には、光化
学反応に好適な波長を放出する大面積の低圧水銀ランプ
30が配置されており、ガラス基板22上に均一の照度
で光を照射できるようになっている。
Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a sectional view of an optical CVD apparatus showing an embodiment of the present invention. In the figure, 21 is a reaction chamber made of aluminum for accommodating a 6-inch glass substrate 22, and a reaction gas introduction system and an exhaust system are respectively an introduction port 23 and an exhaust port 24.
It is connected to the. A stage 25 on which a 6-inch glass substrate 22 is mounted is installed in the reaction chamber 21, and the temperature is controlled to 250 ° C. by an infrared lamp heater 26.
The reaction chamber 21 has a large number of small holes 28 having a diameter of 0.6 mm, and is connected to a light source chamber 29 made of aluminum through a first gas ejection plate 27 made of quartz and having a size of 200 mm × 250 mm and a thickness of 2 mm. Has been done. A large-area low-pressure mercury lamp 30 that emits a wavelength suitable for a photochemical reaction is arranged in the light source chamber 29 so that the glass substrate 22 can be irradiated with light with a uniform illuminance.

【0010】また、光源室29は、直径0.6mmの小
孔を多数持ち、大きさ300mm×300mmで厚さ2
mmのアルミ製の第2のガス噴出板31を介して、アル
ミ製の不活性ガス導入室32と接続されている。該不活
性ガス導入室32は、不活性ガスの導入口33が設けら
れており、不活性ガスの導入系に接続されている。光源
室29及び不活性ガス導入室32の外表面には冷却水配
管(34)が配置されており、絶えず冷却されている。
The light source chamber 29 has a large number of small holes each having a diameter of 0.6 mm, and has a size of 300 mm × 300 mm and a thickness of 2 mm.
It is connected to an inert gas introduction chamber 32 made of aluminum through a second gas ejection plate 31 made of aluminum of mm. The inert gas introducing chamber 32 is provided with an inert gas introducing port 33, and is connected to an inert gas introducing system. A cooling water pipe (34) is arranged on the outer surfaces of the light source chamber 29 and the inert gas introducing chamber 32, and is constantly cooled.

【0011】次に、作用(操作)について説明すると、
上記のように構成した装置において、不活性ガスにアル
ゴンを用い、流量0.5、10slm(=l/min)
でそれぞれパージを行ない、基板表面上の照度を測定し
た。図2は、上記測定より得られたパージ流量と点灯時
間と相対照度の関係を示したものである。
Next, the operation (operation) will be described.
In the apparatus configured as described above, argon is used as the inert gas, and the flow rate is 0.5 and 10 slm (= 1 / min).
Then, the illuminance on the substrate surface was measured. FIG. 2 shows the relationship between the purge flow rate, the lighting time, and the relative illuminance obtained by the above measurement.

【0012】この図に示すように、流量0slmに比較
しての5、10slmの時は、比較的短時間で一定の照
度に到達し、しかも照度もパージ流量が増加するに従い
大きくなることがわかる。
As shown in this figure, when the flow rate is 5, 10 slm as compared with 0 slm, a certain illuminance is reached in a relatively short time, and the illuminance also increases as the purge flow rate increases. ..

【0013】この実施例によれば、不活性ガスを導入口
33より不活性ガス導入室32へ導き、第2のガス噴出
板31を通して光源室29内の低圧水銀ランプ30をパ
ージするようになっているので、該低圧水銀ランプ30
が冷却され、比較的短時間で一定の照度に到達し、しか
も大きな照度が得られるため、効率のよい安定したサイ
クルタイムが得られる。
According to this embodiment, the inert gas is introduced into the inert gas introduction chamber 32 through the introduction port 33, and the low pressure mercury lamp 30 in the light source chamber 29 is purged through the second gas ejection plate 31. Therefore, the low-pressure mercury lamp 30
Is cooled, a certain illuminance is reached in a relatively short time, and a large illuminance is obtained, so that an efficient and stable cycle time can be obtained.

【0014】なお、上記実施例において、不活性ガス
を、導入口33を経て第2のガス噴出板31より光源室
29へ導入し、次いで、第1のガス噴出板27を通して
反応室21へ導入し、排出口24から反応ガスと共に排
気するようにした構造を採用した。しかしながら、低圧
水銀ランプ30からの除熱を効果的に行なうため、大量
のパージガスを用いる場合には、反応室21内における
成膜プロセス、例えば成膜速度や膜厚分布に悪影響を及
ぼすことが考えられる。従ってそのような場合は、第1
のガス噴出板27から吹出すパージ流量を一定に保つた
め、光源室29に設けた差動排気口35を用いて過剰分
を一部排気する構造をとってもよい。そうすることによ
り、光源冷却を効果的に行ない、しかも反応室内のプロ
セスに変化を与えることなく、より安定した照度と成膜
速度を得ることが可能になる。
In the above embodiment, the inert gas is introduced from the second gas ejection plate 31 into the light source chamber 29 through the introduction port 33 and then into the reaction chamber 21 through the first gas ejection plate 27. Then, a structure is adopted in which the exhaust gas is exhausted together with the reaction gas. However, in order to effectively remove heat from the low-pressure mercury lamp 30, when a large amount of purge gas is used, it may adversely affect the film forming process in the reaction chamber 21, for example, the film forming rate and the film thickness distribution. Be done. Therefore, in such cases, the first
In order to keep the purge flow rate blown out from the gas jetting plate 27 constant, a structure may be adopted in which the excess gas is partially exhausted using the differential exhaust port 35 provided in the light source chamber 29. By doing so, the light source can be effectively cooled, and more stable illuminance and film forming speed can be obtained without changing the process in the reaction chamber.

【0015】[0015]

【発明の効果】以上説明したように、本発明によれば、
反応室と光源室の間に、多数の小孔を有する光透過性の
第1のガス噴出板を配置し、該反応室内に収容された基
板の表面にほぼ平行にガス導入口より第1のガス流をシ
ート状に導入し、また該基板上の表面に、この表面に垂
直な方向から第2のガス流を、該第1のガス噴出板より
導入して、該基板の表面の近傍に上記第1のガス流を層
流状態に保持するようにした光CVD装置において、上
記光源室を、紫外光または真空紫外光に対し反射率が高
く、しかも多数の小孔を有する第2のガス噴出板で仕切
り、該第2のガス噴出板と上記第1のガス噴出板との間
に光源を配置したことにより、比較的容易に光源を冷却
することができるため、短時間で、安定した大きな照度
を得ることができる。従って、成膜速度が安定するた
め、装置コストをそれほど高くせず、生産のサイクルタ
イムを安定させることができる。
As described above, according to the present invention,
A light-transmissive first gas jet plate having a large number of small holes is arranged between the reaction chamber and the light source chamber, and the first gas injection port is provided substantially parallel to the surface of the substrate housed in the reaction chamber. A gas flow is introduced in a sheet form, and a second gas flow is introduced into the surface of the substrate from a direction perpendicular to the surface from the first gas ejection plate to bring the gas near the surface of the substrate. In a photo-CVD apparatus adapted to maintain the first gas flow in a laminar state, a second gas having a high reflectance in the light source chamber for ultraviolet light or vacuum ultraviolet light and having a large number of small holes. Since the light source can be cooled relatively easily by partitioning with the ejection plate and arranging the light source between the second gas ejection plate and the first gas ejection plate, the light source can be cooled in a short time and stable. A large illuminance can be obtained. Therefore, since the film forming rate is stable, the apparatus cost is not so high and the production cycle time can be stable.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す光CVD装置の断面図
である。
FIG. 1 is a sectional view of a photo-CVD apparatus showing an embodiment of the present invention.

【図2】本発明の実施例で得られたパージAr流量を変
化させた場合の照度測定結果を示す線図である。
FIG. 2 is a diagram showing an illuminance measurement result when the flow rate of purge Ar obtained in an example of the present invention is changed.

【図3】従来例を示す断面図である。FIG. 3 is a cross-sectional view showing a conventional example.

【図4】従来例のガス噴出板の平面図である。FIG. 4 is a plan view of a conventional gas ejection plate.

【符号の説明】[Explanation of symbols]

21 反応室 22 ガラス基板 23 反応ガス導入口 24 排気口 25 ステージ 26 赤外ランプヒータ 27 第1のガス噴出板 28 小孔 29 光源室 30 低圧水銀ランプ 31 第2のガス噴出板 32 不活性ガス導入室 33 不活性ガス導入口 34 冷却水配管 35 差動排気口 21 Reaction Chamber 22 Glass Substrate 23 Reaction Gas Inlet 24 Exhaust Port 25 Stage 26 Infrared Lamp Heater 27 First Gas Ejection Plate 28 Small Hole 29 Light Source Chamber 30 Low Pressure Mercury Lamp 31 Second Gas Ejection Plate 32 Inert Gas Induction Chamber 33 Inert gas inlet 34 Cooling water piping 35 Differential exhaust port

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 基板を収容する反応室と、該反応室内に
反応ガスを導入及び排気するそれぞれの手段と、該反応
ガスを光化学反応させ、該基板上に薄膜を形成させるた
めの光源と、該光源を収容する光源室と、該反応室と該
光源室の間に、多数の小孔を有する光透過性の第1のガ
ス噴出板を配置し、該反応室内に収容された基板の表面
にほぼ平行にガス導入口より第1のガス流をシート状に
導入し、また該基板上の表面に、この表面に垂直な方向
から第2のガス流を、該第1のガス噴出板より導入し
て、該基板の表面の近傍に上記第1のガス流を層流状態
に保持するようにした光CVD装置において、上記光源
室を、紫外光または真空紫外光に対し反射率が高く、し
かも多数の小孔を有する第2のガス噴出板で仕切り、該
第2のガス噴出板と上記第1のガス噴出板との間に上記
光源を配置し、第2のガス流を第2のガス噴出板より導
入して該光源を第2のガス流によって冷却するようにし
たことを特徴とする光CVD装置。
1. A reaction chamber for accommodating a substrate, means for introducing and exhausting a reaction gas into the reaction chamber, and a light source for photochemically reacting the reaction gas to form a thin film on the substrate. A light source chamber for accommodating the light source, and a light-transmitting first gas ejection plate having a large number of small holes between the reaction chamber and the light source chamber, and the surface of the substrate accommodated in the reaction chamber. A first gas flow is introduced in a sheet shape from the gas introduction port substantially parallel to the substrate, and a second gas flow is introduced onto the surface of the substrate from a direction perpendicular to the surface from the first gas ejection plate. In the photo-CVD apparatus in which the first gas flow is maintained in a laminar state near the surface of the substrate, the light source chamber has a high reflectance for ultraviolet light or vacuum ultraviolet light, Moreover, it is partitioned by a second gas ejection plate having a large number of small holes, and is separated from the second gas ejection plate by the upper part. Note that the light source is arranged between the first gas jet plate and the second gas flow is introduced from the second gas jet plate to cool the light source by the second gas flow. Optical CVD equipment.
JP25810491A 1991-10-04 1991-10-04 Optical CVD equipment Expired - Lifetime JP3174787B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25810491A JP3174787B2 (en) 1991-10-04 1991-10-04 Optical CVD equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25810491A JP3174787B2 (en) 1991-10-04 1991-10-04 Optical CVD equipment

Publications (2)

Publication Number Publication Date
JPH0598447A true JPH0598447A (en) 1993-04-20
JP3174787B2 JP3174787B2 (en) 2001-06-11

Family

ID=17315558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25810491A Expired - Lifetime JP3174787B2 (en) 1991-10-04 1991-10-04 Optical CVD equipment

Country Status (1)

Country Link
JP (1) JP3174787B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007088200A (en) * 2005-09-22 2007-04-05 Canon Inc Processing equipment and method
JPWO2013151045A1 (en) * 2012-04-03 2015-12-17 国立研究開発法人物質・材料研究機構 Crystal growth method and crystal growth apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007088200A (en) * 2005-09-22 2007-04-05 Canon Inc Processing equipment and method
JPWO2013151045A1 (en) * 2012-04-03 2015-12-17 国立研究開発法人物質・材料研究機構 Crystal growth method and crystal growth apparatus

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