WO2020088198A1 - 背散射成像系统、扫描检查系统和背散射图像成像方法 - Google Patents
背散射成像系统、扫描检查系统和背散射图像成像方法 Download PDFInfo
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- WO2020088198A1 WO2020088198A1 PCT/CN2019/109936 CN2019109936W WO2020088198A1 WO 2020088198 A1 WO2020088198 A1 WO 2020088198A1 CN 2019109936 W CN2019109936 W CN 2019109936W WO 2020088198 A1 WO2020088198 A1 WO 2020088198A1
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- backscatter
- signal
- scanning
- imaging system
- backscattered
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
Definitions
- a first aspect of the present disclosure provides a backscatter imaging system, including:
- the backscattered line source is configured to have the first scanning state when performing each column of scanning or to have the first scanning state when continuously performing more than two columns of scanning.
- correcting the second backscatter signal with a correction signal formed from the first backscatter signal to obtain a modified backscatter signal includes subtracting the correction signal and correction from the second backscatter signal The product of the coefficients forms the modified backscatter signal.
- FIG. 6 is a backscattered image without interference removal generated when the backscatter imaging system of the scanning inspection system is disturbed by scattered rays formed by the transmission rays of the transmission imaging system.
- the arc-shaped surface of the sector box 2 is provided with a collimating slit for X-rays.
- the circumferential angle of the collimating slit is the light-emitting angle of the sector box 2.
- Each beam hole can only transmit X-rays when it is in the light-emitting area covered by the light-emitting angle of the sector box 2, and it cannot transmit X-rays when each beam hole is outside the light-emitting area of the sector box 2.
- FIGS. 7 to 9 Comparing FIGS. 7 to 9 with FIGS. 5 and 6, it can be seen that after the backscatter image imaging methods of the embodiments of the present disclosure are used to remove the interference of the scattered rays formed by the transmitted rays of the transmission imaging system, the backscattered image in the second scanning state Closer to the situation of the non-transmission imaging system shown in FIG. 6, the overall image of the backscattered image is clear and the imaging quality is better.
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL437748A PL245844B1 (pl) | 2018-11-01 | 2019-10-08 | Sposób obrazowania rozproszeniem wstecznym |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811291946.2 | 2018-11-01 | ||
| CN201811291946.2A CN109142404B (zh) | 2018-11-01 | 2018-11-01 | 背散射成像系统、扫描检查系统和背散射图像成像方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2020088198A1 true WO2020088198A1 (zh) | 2020-05-07 |
Family
ID=64807443
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/CN2019/109936 Ceased WO2020088198A1 (zh) | 2018-11-01 | 2019-10-08 | 背散射成像系统、扫描检查系统和背散射图像成像方法 |
Country Status (3)
| Country | Link |
|---|---|
| CN (1) | CN109142404B (pl) |
| PL (1) | PL245844B1 (pl) |
| WO (1) | WO2020088198A1 (pl) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116542863A (zh) * | 2022-12-15 | 2023-08-04 | 奕瑞影像科技成都有限公司 | X光背散射图像变形矫正方法、装置、终端以及矫正系统 |
| CN119575495A (zh) * | 2024-12-26 | 2025-03-07 | 同方威视技术股份有限公司 | 辐射检查系统 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109142404B (zh) * | 2018-11-01 | 2024-06-11 | 同方威视技术股份有限公司 | 背散射成像系统、扫描检查系统和背散射图像成像方法 |
| CN119575496A (zh) * | 2024-12-30 | 2025-03-07 | 同方威视技术股份有限公司 | 辐射检查系统 |
Citations (8)
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| CN200947086Y (zh) * | 2006-05-19 | 2007-09-12 | 清华大学 | 探测器阵列及设备 |
| CN202929217U (zh) * | 2012-08-21 | 2013-05-08 | 同方威视技术股份有限公司 | 可监测人体携带放射性物质的背散射人体安检系统 |
| US20150117610A1 (en) * | 2013-10-28 | 2015-04-30 | Kla-Tencor Corporation | Methods and apparatus for measuring semiconductor device overlay using x-ray metrology |
| CN105607111A (zh) * | 2014-11-05 | 2016-05-25 | 中国科学院高能物理研究所 | 一种γ核素识别方法 |
| CN106442585A (zh) * | 2016-10-17 | 2017-02-22 | 北京君和信达科技有限公司 | 背散射辐射成像系统 |
| WO2018072074A1 (en) * | 2016-10-18 | 2018-04-26 | Shenzhen Xpectvision Technology Co., Ltd. | Aradiation detector suitable for a pulsed radiation source |
| CN109142404A (zh) * | 2018-11-01 | 2019-01-04 | 同方威视技术股份有限公司 | 背散射成像系统、扫描检查系统和背散射图像成像方法 |
| CN209148568U (zh) * | 2018-11-01 | 2019-07-23 | 同方威视技术股份有限公司 | 背散射成像系统和扫描检查系统 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7099434B2 (en) * | 2002-11-06 | 2006-08-29 | American Science And Engineering, Inc. | X-ray backscatter mobile inspection van |
| WO2008021807A2 (en) * | 2006-08-11 | 2008-02-21 | American Science And Engineering, Inc. | X-ray inspection with contemporaneous and proximal transmission and backscatter imaging |
| US8908831B2 (en) * | 2011-02-08 | 2014-12-09 | Rapiscan Systems, Inc. | Covert surveillance using multi-modality sensing |
| CN105445303B (zh) * | 2015-12-29 | 2019-02-19 | 清华大学 | 手持式背散射成像仪及其成像方法 |
| CN106841256B (zh) * | 2017-02-17 | 2023-11-21 | 清华大学 | 多视角背散射检查系统和多视角背散射检查方法 |
-
2018
- 2018-11-01 CN CN201811291946.2A patent/CN109142404B/zh active Active
-
2019
- 2019-10-08 WO PCT/CN2019/109936 patent/WO2020088198A1/zh not_active Ceased
- 2019-10-08 PL PL437748A patent/PL245844B1/pl unknown
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN200947086Y (zh) * | 2006-05-19 | 2007-09-12 | 清华大学 | 探测器阵列及设备 |
| CN202929217U (zh) * | 2012-08-21 | 2013-05-08 | 同方威视技术股份有限公司 | 可监测人体携带放射性物质的背散射人体安检系统 |
| US20150117610A1 (en) * | 2013-10-28 | 2015-04-30 | Kla-Tencor Corporation | Methods and apparatus for measuring semiconductor device overlay using x-ray metrology |
| CN105607111A (zh) * | 2014-11-05 | 2016-05-25 | 中国科学院高能物理研究所 | 一种γ核素识别方法 |
| CN106442585A (zh) * | 2016-10-17 | 2017-02-22 | 北京君和信达科技有限公司 | 背散射辐射成像系统 |
| WO2018072074A1 (en) * | 2016-10-18 | 2018-04-26 | Shenzhen Xpectvision Technology Co., Ltd. | Aradiation detector suitable for a pulsed radiation source |
| CN109142404A (zh) * | 2018-11-01 | 2019-01-04 | 同方威视技术股份有限公司 | 背散射成像系统、扫描检查系统和背散射图像成像方法 |
| CN209148568U (zh) * | 2018-11-01 | 2019-07-23 | 同方威视技术股份有限公司 | 背散射成像系统和扫描检查系统 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116542863A (zh) * | 2022-12-15 | 2023-08-04 | 奕瑞影像科技成都有限公司 | X光背散射图像变形矫正方法、装置、终端以及矫正系统 |
| CN119575495A (zh) * | 2024-12-26 | 2025-03-07 | 同方威视技术股份有限公司 | 辐射检查系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109142404B (zh) | 2024-06-11 |
| PL245844B1 (pl) | 2024-10-21 |
| CN109142404A (zh) | 2019-01-04 |
| PL437748A1 (pl) | 2022-01-31 |
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