WO2020083768A3 - Filtervorrichtung für ein optikmodul für ein chiplabor-analysegerät, optikmodul für ein chiplabor-analysegerät und verfahren zum betreiben eines optikmoduls für ein chiplabor-analysegerät - Google Patents

Filtervorrichtung für ein optikmodul für ein chiplabor-analysegerät, optikmodul für ein chiplabor-analysegerät und verfahren zum betreiben eines optikmoduls für ein chiplabor-analysegerät Download PDF

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Publication number
WO2020083768A3
WO2020083768A3 PCT/EP2019/078348 EP2019078348W WO2020083768A3 WO 2020083768 A3 WO2020083768 A3 WO 2020083768A3 EP 2019078348 W EP2019078348 W EP 2019078348W WO 2020083768 A3 WO2020083768 A3 WO 2020083768A3
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WO
WIPO (PCT)
Prior art keywords
optical module
lab
analysis device
chip analysis
filter
Prior art date
Application number
PCT/EP2019/078348
Other languages
English (en)
French (fr)
Other versions
WO2020083768A2 (de
Inventor
Jochen Rupp
Robert SCHREINER
Karsten Seidl
Tino Frank
Genrich Siris
Original Assignee
Robert Bosch Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch Gmbh filed Critical Robert Bosch Gmbh
Priority to KR1020217015362A priority Critical patent/KR20210082206A/ko
Priority to CN201980084893.3A priority patent/CN113167647A/zh
Priority to JP2021546468A priority patent/JP2022508894A/ja
Priority to CA3120147A priority patent/CA3120147A1/en
Priority to EP19790509.4A priority patent/EP3870942A2/de
Priority to US17/286,339 priority patent/US11988605B2/en
Publication of WO2020083768A2 publication Critical patent/WO2020083768A2/de
Publication of WO2020083768A3 publication Critical patent/WO2020083768A3/de

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0294—Multi-channel spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/06—Scanning arrangements arrangements for order-selection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/32—Investigating bands of a spectrum in sequence by a single detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/007—Optical devices or arrangements for the control of light using movable or deformable optical elements the movable or deformable optical element controlling the colour, i.e. a spectral characteristic, of the light
    • G02B26/008—Optical devices or arrangements for the control of light using movable or deformable optical elements the movable or deformable optical element controlling the colour, i.e. a spectral characteristic, of the light in the form of devices for effecting sequential colour changes, e.g. colour wheels
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/006—Filter holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
    • G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
    • G01J2001/242—Filter wheel, i.e. absorption filter series graduated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/06—Scanning arrangements arrangements for order-selection
    • G01J2003/062—Scanning arrangements arrangements for order-selection motor-driven
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1213—Filters in general, e.g. dichroic, band
    • G01J2003/1221—Mounting; Adjustment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1226—Interference filters
    • G01J2003/1243—Pivoting IF or other position variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G01N2021/6419—Excitation at two or more wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G01N2021/6421—Measuring at two or more wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G01N2021/6471—Special filters, filter wheel

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Immunology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Astronomy & Astrophysics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Die Erfindung betrifft eine Filtervorrichtung (130) für ein Optikmodul für ein Chiplabor-Analysegerät. Das Optikmodul weist einen Lichtpfad auf. Die Filtervorrichtung (130) umfasst ein Trägerelement (205), einen Filterträger (210) und eine Antriebseinrichtung (215). Das Trägerelement (205) ist in dem Optikmodul (100) anordenbar. Der Filterträger (210) ist beweglich an dem Trägerelement (205) angeordnet. Zudem weist der Filterträger (210) einen ersten Filterbereich (220) und einen zweiten Filterbereich (225) auf. Die Antriebseinrichtung (215) ist dazu ausgebildet, den Filterträger (210) zwischen einer ersten Stellung, in der der erste Filterbereich (220) in dem Lichtpfad angeordnet ist, und einer zweiten Stellung, in der der zweite Filterbereich (225) in dem Lichtpfad angeordnet ist, zu bewegen.
PCT/EP2019/078348 2018-10-22 2019-10-18 Filtervorrichtung für ein optikmodul für ein chiplabor-analysegerät, optikmodul für ein chiplabor-analysegerät und verfahren zum betreiben eines optikmoduls für ein chiplabor-analysegerät WO2020083768A2 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
KR1020217015362A KR20210082206A (ko) 2018-10-22 2019-10-18 랩온 어칩 분석 디바이스를 위한 광학 모듈용 필터 디바이스, 랩온 어칩 분석 디바이스용 광학 모듈 및 랩온 어칩 분석 디바이스용 광학 모듈 작동 방법
CN201980084893.3A CN113167647A (zh) 2018-10-22 2019-10-18 用于芯片实验室分析仪器的光学模块的滤波设备、用于芯片实验室分析仪器的光学模块和用于运行芯片实验室分析仪器的光学模块的方法
JP2021546468A JP2022508894A (ja) 2018-10-22 2019-10-18 ラボオンチップ分析装置用の光学モジュールのためのフィルタ装置、ラボオンチップ分析装置用の光学モジュール、及び、ラボオンチップ分析装置用の光学モジュールを動作させるための方法
CA3120147A CA3120147A1 (en) 2018-10-22 2019-10-18 Filter device for an optical module for a lab-on-a-chip analysis device, optical module for a lab-on-a-chip analysis device and method for operating an optical module for a lab-on-a-chip analysis device
EP19790509.4A EP3870942A2 (de) 2018-10-22 2019-10-18 Filtervorrichtung für ein optikmodul für ein chiplabor-analysegerät, optikmodul für ein chiplabor-analysegerät und verfahren zum betreiben eines optikmoduls für ein chiplabor-analysegerät
US17/286,339 US11988605B2 (en) 2018-10-22 2019-10-18 Filter device for an optical module for a lab-on-a-chip analysis device, optical module for a lab-on-a-chip analysis device and method for operating an optical module for a lab-on-a-chip analysis device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102018218046.6 2018-10-22
DE102018218046.6A DE102018218046A1 (de) 2018-10-22 2018-10-22 Filtervorrichtung für ein Optikmodul für ein Chiplabor-Analysegerät, Optikmodul für ein Chiplabor-Analysegerät und Verfahren zum Betreiben eines Optikmoduls für ein Chiplabor-Analysegerät

Publications (2)

Publication Number Publication Date
WO2020083768A2 WO2020083768A2 (de) 2020-04-30
WO2020083768A3 true WO2020083768A3 (de) 2020-06-18

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PCT/EP2019/078348 WO2020083768A2 (de) 2018-10-22 2019-10-18 Filtervorrichtung für ein optikmodul für ein chiplabor-analysegerät, optikmodul für ein chiplabor-analysegerät und verfahren zum betreiben eines optikmoduls für ein chiplabor-analysegerät

Country Status (8)

Country Link
US (1) US11988605B2 (de)
EP (1) EP3870942A2 (de)
JP (1) JP2022508894A (de)
KR (1) KR20210082206A (de)
CN (1) CN113167647A (de)
CA (1) CA3120147A1 (de)
DE (1) DE102018218046A1 (de)
WO (1) WO2020083768A2 (de)

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KR20230131936A (ko) * 2021-03-11 2023-09-14 주식회사 씨젠 광학 신호 검출 장치
DE102021202795A1 (de) 2021-03-23 2022-09-29 Robert Bosch Gesellschaft mit beschränkter Haftung Bauteil zur Aufnahme optischer Komponenten, insbesondere für die Medizintechnik, und Herstellverfahren
KR102360041B1 (ko) * 2021-08-17 2022-02-08 (주)페블아이 시분할 형광과 가시광 측정을 모두 지원하는 광학 측정 시스템

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Also Published As

Publication number Publication date
DE102018218046A1 (de) 2020-04-23
CA3120147A1 (en) 2020-04-30
US20220252513A1 (en) 2022-08-11
KR20210082206A (ko) 2021-07-02
WO2020083768A2 (de) 2020-04-30
CN113167647A (zh) 2021-07-23
JP2022508894A (ja) 2022-01-19
EP3870942A2 (de) 2021-09-01
US11988605B2 (en) 2024-05-21

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