WO2020047881A1

WO2020047881A1 - Device for testing infrared intensities of multiple infrared sensors

Info

Publication number: WO2020047881A1
Application number: PCT/CN2018/104940
Authority: WO
Inventors: 薛永
Original assignee: 南京福碧源环境技术有限公司
Priority date: 2018-09-03
Filing date: 2018-09-11
Publication date: 2020-03-12
Also published as: CN108761566A

Abstract

A device for testing infrared intensities of multiple infrared sensors comprises one or more infrared sensors (3), a rotary shaft (5) and a test object (1). The test object (1) is connected to the rotary shaft (5) and rotates with the rotary shaft (5). The infrared sensors (3) are arranged at one side of the test object (1) and positioned around the rotary shaft (5). The infrared sensors (3) emit infrared rays perpendicular to the test object (1) and sense infrared rays reflected by the test object (1). A vertical distance between the test object (1) and the infrared sensor (3) is adjustable. The the infrared sensors (3) and the test object (1) are all placed in a non-optically transparent box. The device for testing infrared intensities of multiple infrared sensors can simultaneously test multiple infrared sensors and accurately adjust a sensing distance, is highly efficient, and can solve the problem in which a sensing distance is unable to be adjusted when a test object is a consumable or an appended object.

Description

Multi-group infrared sensor infrared intensity debugging device

Technical field

The invention relates to the technical field of infrared intensity debugging of infrared sensors, and in particular to a device for debugging infrared intensity of multiple groups of infrared sensors.

Background technique

At present, the testing methods of infrared manufacturers generally use a single sensor, the sensor emits, a white reflective surface is added to the receiving front end, and the sensor is installed before and after the slide rail to confirm the receiving effect and change. There are two disadvantages to this test method: 1. This test bench needs to be used in open spaces and is susceptible to interference from external light sources. And because the light source size of the test site is different, the test results will be different. 2. Only a small number of tests can be done, and the test results of the remaining sensors can be estimated by calculation.

Summary of the Invention

In view of the above-mentioned shortcomings of the prior art, the present invention provides a multi-group infrared sensor infrared intensity debugging device, which can debug multiple groups of sensors simultaneously, and the debugging of the sensing distance is accurate.

To achieve the above objective, the present invention adopts the following technical solutions:

Multiple groups of infrared sensors infrared intensity debugging device, including more than one infrared sensor, rotating shaft, and simulated sensing objects; the simulated sensing objects are connected to the rotating shaft and rotate with the rotating shaft; the infrared sensors are distributed in the analog sensing One side of the object is around the rotation axis; the infrared light emitted by the infrared sensor is perpendicular to the analog sensor and the infrared light reflected by the analog sensor; the vertical distance between the analog sensor and the infrared sensor is adjustable.

Further, the rotation speed of the rotating shaft is adjustable.

Further, the rotating shaft is driven to rotate by a rotating electric machine, and the rotating speed of the rotating electric machine is adjustable.

Further, the device includes a cabinet, and the infrared sensor and the simulated sensor are both disposed in the cabinet.

Further, a plurality of sensing windows are provided on the top of the box, and the one or more infrared sensors are respectively installed on the sensing windows.

Further, the device further includes a counter, the infrared sensor is connected to the counter, and a sensing signal of the infrared sensor is connected to the counter.

Beneficial effects: 1. The analog sensing object rotates with the rotation axis, and the distances between the infrared sensors are adjustable, so that the sensing distances of multiple infrared sensors can be debugged at the same time, and the test proportion and efficiency are improved;

2. Simultaneous debugging of multiple groups of infrared sensors can ensure accurate and consistent debugging of the sensing distance, and ensure uniform product testing and verification standards;

3. The rotation speed of the rotating shaft is adjustable, and the induction signal of the infrared sensor is connected to the counter, which can simulate and test the induction effect of the infrared sensor on the product's operating speed, and determine the induction frequency of the infrared sensor;

4. Set multiple groups of infrared sensors in the box to debug at the same time, which can ensure the consistent test environment and no light source interference;

5. The present invention is not limited to the presence or absence of sensing objects. Products / equipment can be assembled at any time according to process requirements during assembly.

The above 5 points indicate that this debugging equipment has the advantages of high efficiency and accurate debugging, and also solves the problem that the sensing distance cannot be debugged when the sensing object is a consumable or a post-addition.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic structural diagram of the present invention;

Figure 2 is a schematic diagram of the installation position of the sensor;

Reference numerals in the figure: 1. Analog inductive object; 2. Rotating motor; 3. Infrared sensor; 4. Cylindrical box; 5. Rotating shaft.

detailed description

The present invention will be further explained with reference to the following embodiments.

As shown in FIG. 1, the present invention includes a cylindrical box 4 which is opaque. The top of the cylindrical box 4 is provided with a plurality of through holes as sensing windows, and the infrared sensors 3 with the same sensing range are respectively installed. The rotary electric machine 2 is installed above the cylindrical case 4, and its motor shaft is connected to the rotary shaft 5. The analog sensor 6 has a long shape, and an upper end is provided with a white reflective surface, which is vertically connected to the rotating shaft 5. The height can be adjusted up and down. The vertical distance between the infrared sensor 3 and the analog sensing object 6 is the required sensing distance. The cylindrical box 4 has a door for operation. An illumination lamp can be arranged in the cylindrical box 4. Rotary motor 2 can be connected to a frequency converter to adjust the speed.

As shown in FIG. 2, in this embodiment, there are 8 groups of infrared sensors 3, which are evenly distributed on the top of the cylindrical box 4.

The use steps of the present invention are:

1. Place multiple groups of infrared sensors 3 with the same sensing range in the sensing windows of the cylindrical box 4 respectively;

2. According to the product / equipment sensing distance requirements, adjust the distance from the simulated sensor 1 in the cylindrical box 4 to the sensor 3 on the top of the cylindrical box in advance;

3. The infrared sensor 3 senses the signal access counter;

4. The rotary motor 2 and the infrared sensor 3 are powered on. The rotary motor 2 rotates to drive the analog sensor 1 to rotate. If the infrared sensor 3 can sense each rotation, it counts once.

5. Adjust the knob on the infrared sensor 3 to make the infrared intensity of the infrared sensor 3 moderate; the infrared intensity requirements: the infrared intensity of the sensor is moderate, too strong, the feedback signal is wrong, too weak, there is no feedback signal;

6. Adjust the height of the analog sensor 6 to set different sensing distances, determine the actual sensing distance of the infrared sensor 3, and calculate whether the difference between the actual sensing distance and the sensing distance required by the product / equipment is within the error range. Within the error range, the infrared test distance meets the standard, otherwise it does not meet the standard;

7. Adjust the rotation speed of the rotary electric machine 2 and record the induction effect of the infrared sensor 3 on the running speed of different products through a counter to determine whether its induction frequency meets the standard.

The above is only a preferred embodiment of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the principles of the present invention, several improvements and retouches can be made. These improvements and retouches also It should be regarded as the protection scope of the present invention.

Claims

The infrared intensity debugging device for multiple groups of infrared sensors is characterized in that it includes more than one infrared sensor (3), a rotating shaft (5), and an analog inductive object (1); the analog inductive object (1) is connected to the rotation The axis (5) rotates with the rotation axis (5); the infrared sensor (3) is distributed on one side of the analog sensing object (1) and around the rotation axis (5); the infrared sensor (3) emits The infrared ray is perpendicular to and simulates the infrared ray reflected by the analogue sensible object (1); the vertical distance between the analogue sensible object (1) and the infrared sensor (3) is adjustable.
The infrared intensity debugging device for multiple groups of infrared sensors according to claim 1, characterized in that the rotation speed of the rotating shaft (5) is adjustable.
The infrared intensity debugging device for multiple groups of infrared sensors according to claim 2, characterized in that the rotating shaft (5) is driven to rotate by a rotating electric machine (2), and the rotating speed of the rotating electric machine (2) is adjustable.
The infrared intensity debugging device for a plurality of groups of infrared sensors according to claim 1, characterized in that the device includes a box (4), and the infrared sensors (3) and the analog sensing objects (1) are both arranged in the box Body (4).
The infrared intensity debugging device for multiple groups of infrared sensors according to claim 4, characterized in that a plurality of sensing windows are provided on the top of the box (4), and the one or more infrared sensors (3) are respectively installed on the Induction window.
The infrared intensity debugging device for multiple groups of infrared sensors according to claim 1, characterized in that the device further comprises a counter, the infrared sensor (3) is connected to a counter, and its sensing signal is connected to the counter.