WO2019207737A1 - Spectromètre de masse à temps de vol - Google Patents

Spectromètre de masse à temps de vol Download PDF

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Publication number
WO2019207737A1
WO2019207737A1 PCT/JP2018/017077 JP2018017077W WO2019207737A1 WO 2019207737 A1 WO2019207737 A1 WO 2019207737A1 JP 2018017077 W JP2018017077 W JP 2018017077W WO 2019207737 A1 WO2019207737 A1 WO 2019207737A1
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WIPO (PCT)
Prior art keywords
detector
voltage
peak
time
ions
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PCT/JP2018/017077
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English (en)
Japanese (ja)
Inventor
朝是 大城
大輔 奥村
雄太 宮崎
弘明 小澤
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株式会社島津製作所
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Priority to JP2020515409A priority Critical patent/JP6897870B2/ja
Priority to PCT/JP2018/017077 priority patent/WO2019207737A1/fr
Priority to US17/041,859 priority patent/US11152201B2/en
Publication of WO2019207737A1 publication Critical patent/WO2019207737A1/fr

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/443—Dynamic spectrometers
    • H01J49/446—Time-of-flight spectrometers

Definitions

  • the present invention relates to a time-of-flight mass spectrometer (hereinafter referred to as “TOFMS” as appropriate), and more particularly to a TOFMS using a DC-type detector for measuring an average value or an integrated value of an ion current as a detector.
  • TOFMS time-of-flight mass spectrometer
  • a mass spectrometer In general, in a mass spectrometer, components in a sample are ionized by an ion source, and the generated ions are separated by a mass separator according to a mass-to-charge ratio m / z and then detected by a detector.
  • the detectors used in mass spectrometers can be broadly divided into DC detectors that measure the average value and integral value of the ion current that flows due to the arriving ions, and a pulse count that counts the number of arriving ions as a pulse signal.
  • Type detectors are known (see, for example, Patent Document 1). In particular, when the signal intensity due to ions is low and the chemical noise is small, a pulse count type detector that is advantageous for measuring the amount of minute ions may be used. It's being used.
  • MCP microchannel plate
  • the detector gain using the MCP or secondary electron multiplier can be changed by changing the voltage applied to the detector (hereinafter referred to as “detector voltage”). Changes.
  • the peak value of the pulse signal generated corresponding to the ion incident on the detector changes. If the detector gain is too low, the peak value of the pulse signal will not be counted without exceeding the threshold for counting. Conversely, if the detector gain is too high, elements other than the pulse signal such as noise will be counted. . Therefore, it is necessary to appropriately set the detector voltage in order to accurately count the number of ions incident on the detector.
  • Patent Document 3 When adjusting the detector voltage in a mass spectrometer using a pulse count type detector, the method disclosed in Patent Document 3 is adopted. That is, by repeatedly measuring the standard sample while changing the detector voltage, the relationship between the count value of ions derived from a predetermined component in the standard sample and the detector voltage is examined.
  • the relationship between the detector voltage and the ion count value is generally as shown in FIG. 6, and a region called a plateau region (region indicated by a dotted line in FIG. 6) in which the ion count value becomes substantially constant with respect to a change in the detector voltage. ) Appears. Since the ion count value in this plateau region is considered to be a true value reflecting the number of ions incident on the detector, the detector voltage corresponding to the plateau region, for example, the lowest detector voltage in the plateau region is The optimum voltage is determined.
  • the gain of the detector when the gain of the detector is changed, the magnitude of the signal intensity corresponding to the amount of ions incident on the detector changes. For this reason, if the gain of the detector is too low, the signal sensitivity corresponding to the sample component having a low concentration cannot be sufficiently obtained because the detection sensitivity is low. Conversely, if the gain of the detector is too high, the detection sensitivity is high, so that the signal intensity corresponding to the high concentration sample component is saturated and the dynamic range becomes narrow. For this reason, it is necessary to adjust the detector voltage so as to obtain an appropriate detector gain assuming the concentration range of the sample to be measured.
  • the detector voltage is generally adjusted based on the peak intensity value on the mass spectrum obtained when a standard sample having a constant concentration is measured.
  • the peak intensity value decreases. Therefore, automatic adjustment can be realized by adjusting the detector voltage so that the peak intensity value becomes constant.
  • the peak intensity value at this time is different from the ion count value in the pulse count type detector described above, and does not necessarily accurately reflect the number of ions incident on the detector. Therefore, there are the following problems.
  • the relationship between the detector voltage and the ion count value when the pulse count type detector is used is the state of the sample to be measured and the state of the device other than the detector (for example, the state of the ion transport optical system). It is hard to be affected by. For example, even when the state of the sample is poor and the amount of ions derived from the target component is small, the absolute value of the ion count is lowered, but the shape of the curve indicating the relationship between the detector voltage and the ion count value is hardly changed. The same applies to the case where the number of ions reaching the detector decreases because the state of the devices other than the detector is poor. Therefore, it is possible to determine an appropriate detector voltage from the relationship between the detector voltage and the ion count value, and when the voltage range corresponding to the plateau region becomes extremely high, the detector has deteriorated. Can be estimated.
  • the peak intensity value on the mass spectrum obtained when a DC type detector is used varies depending on the state of the sample to be measured and the state of the apparatus other than the detector. For example, when the state of the sample is poor and the amount of ions derived from the target component decreases, the peak intensity value on the mass spectrum decreases. The same applies to the case where the number of ions reaching the detector decreases because the state of the devices other than the detector is poor. Therefore, even if the peak intensity value on the mass spectrum decreases and the detector voltage needs to be increased to maintain a constant peak intensity value, the user can determine whether the cause is in the detector itself or in other cases. Is difficult to judge.
  • the present invention has been made in order to solve the above-mentioned problems, and its main purpose is a time-of-flight mass spectrometer using a DC-type detector, the state of a sample, the state of an apparatus other than the detector, etc. It is an object of the present invention to provide a time-of-flight mass spectrometer that can determine an appropriate detector voltage based on the response characteristics of a single detector without being affected by the above.
  • the present invention which has been made to solve the above-mentioned problems, has an injection part for applying acceleration energy to ions derived from a sample component and injecting the ions into the flight space, and a predetermined state in which the ions injected by the injection part fly.
  • a time-of-flight mass spectrometer comprising: a flight space forming electrode that forms an electric field in the flight space; and a detector that detects ions flying in the flight space.
  • a control unit for controlling a voltage applied to the space forming electrode; b) A given sample is measured under the non-convergence condition, and any of the number, height, or area of peaks observed on the profile spectrum based on the detection signals obtained under different detector voltages.
  • a detector voltage determiner for determining an appropriate detector voltage based on one or more; It is characterized by having.
  • each electrode is performed so that a plurality of ions having the same mass-to-charge ratio ejected almost simultaneously by the ejection unit reach the detector at the same time, that is, so that the time convergence of the ions is satisfied.
  • the voltage is set finely.
  • the control unit adjusts the detector voltage so that, for example, the flight space forming electrode is subjected to a normal measurement so as to be in a non-convergent condition that the ion time convergence is not intentionally satisfied. A voltage different from that is applied.
  • ions derived from a predetermined component in the sample that is, a plurality of ions having the same mass-to-charge ratio, reach the detector with an appropriate time difference. Therefore, in the profile spectrum created based on the detection signal from the detector, a small peak that appears to correspond to each single ion derived from a predetermined component appears. Each peak can be regarded as a pulse signal corresponding to ions obtained in a pulse count type detector.
  • the detector voltage determination unit can detect any of the number, height, or area of peaks estimated to correspond to ions derived from a predetermined component that are observed on profile spectra obtained under different detector voltages. Based on one or more, the detector voltage is determined so as to obtain an adequate, that is, sufficient detection sensitivity and a sufficiently wide dynamic range.
  • the detector voltage determination unit obtains a peak value or area value distribution of peaks observed on profile spectra obtained under different detector voltages, and An appropriate detector voltage can be determined by finding a detector voltage at which a representative value in the distribution is a predetermined value.
  • the representative value here is, for example, an average value or median value in the distribution of peak peak values or area values.
  • the detector voltage determination unit includes a centroid conversion unit that performs centroid conversion processing on profile spectra obtained under different detector voltages, and a profile spectrum for each profile spectrum.
  • a peak counting unit that counts the number of centroid peaks obtained by the centroid conversion process, and a voltage determination unit that determines an appropriate detector voltage from the relationship between the detector voltage and the peak count value, and can do.
  • the centroid peak is handled in the same manner as the pulse signal corresponding to the ions obtained in the pulse count type detector. Therefore, the voltage determination unit finds a plateau region where the peak count value is almost constant with respect to changes in the detector voltage from the relationship between the detector voltage and the peak count value, and performs appropriate detection from the voltage range corresponding to the plateau region. What is necessary is just to determine a voltage. When a clear plateau region is not seen, the detector voltage may be determined by a method as disclosed in Patent Document 3.
  • the detector voltage determination unit includes a centroid conversion unit that performs centroid conversion processing on profile spectra obtained under different detector voltages, An intensity value summing unit that sums the centroid peak intensity values obtained by the centroid conversion processing, and a voltage determination unit that determines an appropriate detector voltage from the relationship between the detector voltage and the peak intensity summing value. It can be set as the structure containing.
  • centroid peak intensity is the peak top intensity or peak area of the peak on the profile spectrum
  • peak height or area value observed on the profile spectrum is used as it is without performing centroid conversion processing.
  • the same processing as in the third aspect can be performed.
  • the detector voltage determination unit calculates a peak height value or an area value observed on a profile spectrum obtained under a different detector voltage as a profile spectrum.
  • An intensity value summing unit that sums up every time and a voltage determination unit that determines an appropriate detector voltage from the relationship between the detector voltage and the peak intensity summed value may be included.
  • the voltage determination unit finds a voltage at which the peak intensity total value obtained by adding the intensity values of the centroid peaks or the peak intensity total value obtained by adding the peak height value or area value on the profile spectrum increases rapidly, An appropriate detector voltage may be determined based on the voltage.
  • the number of ions incident on the detector does not affect the determination of the detector voltage, elements other than the detector, for example, the state of the sample and the device other than the detector An appropriate detector voltage can be determined with little influence from the state of
  • the non-convergence of ions in TOFMS can be realized by various methods.
  • the convergence is easily lost by adjusting the state of the reflected electric field by the reflector. be able to.
  • the flight space forming electrode includes a reflector
  • the control unit can obtain a non-convergence condition by adjusting a voltage applied to the reflector.
  • the TOFMS preferably, when the detector voltage determined by the detector voltage determining unit is at or near the upper limit of the voltage variable range, an informing unit for informing the user of this is provided. It is good to further provide.
  • the notification unit may perform warning display when displaying the automatically determined detector voltage.
  • the user can reliably recognize that the remaining life of the detector is short, and can quickly take appropriate measures such as preparing replacement parts.
  • the detector voltage can be determined automatically. As a result, measurement with sufficient sensitivity and sufficient dynamic range can always be performed. Further, it is possible to reliably grasp the malfunction of the detector such as the deterioration of the detector.
  • FIG. 1 is a schematic configuration diagram of an orthogonal acceleration type TOFMS (hereinafter referred to as “OA-TOFMS”) that is an embodiment of the present invention.
  • FIG. The flowchart of the process and control at the time of the detector voltage automatic adjustment in OA-TOFMS of a present Example. Schematic of profile spectrum waveform when ion is converged over time (a) and not (b). The figure which shows an example of the peak height distribution calculated
  • FIG. 1 is a schematic configuration diagram of the OA-TOFMS of this embodiment.
  • the OA-TOFMS of this embodiment includes a measurement unit 1, a data processing unit 2, a voltage generation unit 3, an analysis control unit 41, an auto tuning control unit 42, a main control unit 5, an input unit 6, and a display unit 7.
  • the measurement unit 1 includes an injection unit 11 including a flat plate-like extrusion electrode 111 and a grid-like extraction electrode 112 that are disposed to face each other, a flight tube 12 that forms a flight space 13 therein, and a flight tube 12
  • It includes a reflector 14 including a plurality of annular reflecting electrodes arranged on the inside, and a detector 15 for detecting ions.
  • the detector 15 is an MCP, and can detect ions spread two-dimensionally in the YZ plane almost simultaneously. For convenience of explanation, three axes X, Y, and Z orthogonal to each other shown in FIG. 1 are defined in a three-dimensional space in which ions move.
  • the voltage generation unit 3 applies a predetermined voltage to drive each unit of the measurement unit 1, an FT (flight tube) voltage generation unit 31 that applies a voltage to the flight tube 12, an extrusion electrode 111, and an extraction electrode 112. , An accelerating voltage generator 32 for applying a voltage to each electrode, a reflected voltage generator 33 for applying a voltage to each electrode of the reflector 14, and a detector voltage generator 34 for applying a detector voltage to the detector 15. .
  • the data processing unit 2 digitizes and processes the detection signal output from the detector 15, and includes profile data acquisition unit 21, mass spectrum creation unit 22, peak value data acquisition unit 23, peak value as functional blocks. A list creation unit 24 and a detector voltage determination unit 25 are included.
  • the main control unit 5 is responsible for overall control of the entire apparatus and a user interface. Note that the main control unit 5, the data processing unit 2, the analysis control unit 41, and the auto-tuning control unit 42 all or a part thereof execute dedicated processing / control software installed in a personal computer. Thus, the configuration can be achieved.
  • the normal measurement operation in the OA-TOFMS of this example is as follows.
  • an ion source (not shown)
  • a component (compound) in a sample to be measured is ionized, and generated ions or ions generated by dissociation of the ions (collectively referred to as sample component-derived ions) are generated.
  • 1 is introduced into the injection section 11 in the Z-axis direction as indicated by an arrow in FIG.
  • the acceleration voltage generation unit 32 Based on the control signal from the analysis control unit 41, the acceleration voltage generation unit 32 applies a predetermined high voltage pulse to the extrusion electrode 111, the extraction electrode 112, or both the electrodes 111, 112 at a predetermined timing.
  • ions derived from the sample component passing between the extrusion electrode 111 and the extraction electrode 112 are given acceleration energy in the X-axis direction orthogonal to the Z-axis, and are ejected from the ejection unit 11 and sent into the flight space 13. .
  • a predetermined DC voltage is applied to the flight tube 12 from the FT voltage generator 31, and a predetermined DC voltage is applied to each electrode of the reflector 14 from the reflected voltage generator 33.
  • the flight space 13 becomes a non-electric field that is not affected by an external electric field, and a reflected electric field that reflects ions only in a space surrounded by the reflective electrodes that constitute the reflector 14 disposed therein is formed.
  • the ions move almost straight from the emitting portion 11 to the entrance of the reflector 14, are turned inside the reflector 14, and fly almost linearly to reach the detector 15. Fly along an orbit.
  • the detector 15 generates a detection signal corresponding to the amount of ions that have reached and inputs the detection signal to the data processing unit 2.
  • the profile data acquisition unit 21 includes a data storage unit, and stores raw data obtained by digitizing the detection signal obtained by the detector 15 every moment, that is, profile data in the data storage unit.
  • the mass spectrum creation unit 22 sets the time when ions are ejected from the ejection unit 11 as zero flight time and shows the flight time spectrum indicating the relationship between flight time and signal intensity.
  • the mass spectrum is calculated by converting the time of flight into the mass-to-charge ratio based on the mass calibration information obtained in advance.
  • the mass spectrum may be a profile spectrum that is a continuous waveform, or may be a centroid spectrum that has been subjected to centroid conversion.
  • FIG. 2 is a flowchart of processing and control at the time of automatic adjustment of the detector voltage.
  • a standard sample containing a predetermined component is used as a measurement target sample.
  • the auto-tuning control unit 42 that has received this instruction through the main control unit 5 performs the above-described normal measurement on the reflective electrode constituting the reflector 14. Controls the reflected voltage generator 33 so as to apply different predetermined voltages.
  • the applied voltage at this time is a voltage deliberately shifted from the voltage at the time of normal measurement so that time convergence is not performed for the same kind of ions having the same mass-to-charge ratio.
  • the FT voltage generation unit 31 and the acceleration voltage generation unit 32 apply the same voltage to each unit as during normal measurement.
  • the detector voltage generator 34 applies the lower limit voltage of the detector voltage range to the detector 15 as an initial voltage (step S1).
  • the measurement unit 1 repeats measurement for the same standard sample a predetermined number of times (for example, 10 times) (step S2), and the profile data acquisition unit 21 collects profile data obtained by each measurement. (Step S3).
  • the mass spectrum creation unit 22 creates a profile spectrum obtained by integrating the profile data obtained by the plurality of measurements.
  • the profile spectrum created here does not have to cover the entire time of flight, but only needs to be within the time of flight range in which ions derived from the target component in the standard sample are estimated to be observed (step). S4).
  • ions having the same mass-to-charge ratio ejected from the ejecting unit 11 almost simultaneously reach the detector 15 almost simultaneously. Therefore, in the profile spectrum created based on the detection signal from the detector 15 at this time, as shown in FIG. 3A, ions having the same mass-to-charge ratio have the same flight time t1 (or the same mass-to-charge ratio value). ) Is formed.
  • the peak height and area correspond to the sum of ion currents of a plurality of ions having the same mass-to-charge ratio, but it is practically impossible to grasp the number of ions from this.
  • a plurality of ions may reach the detector 15 and be observed as one peak at the same time, but stochastically, many ions having the same mass-to-charge ratio are observed as individual peaks. That is, the profile spectrum shown in FIG. 3B is ideally formed by peaks of five ions.
  • the peak values (peak top signal intensity) of all the peaks are the same, but in practice, the peak peak values corresponding to one ion vary considerably. In some cases, it is 10 times or more. Therefore, here, the detector voltage is determined based on the profile spectrum by the following procedure.
  • the peak value data acquisition unit 23 detects a peak in the profile spectrum according to a predetermined algorithm. Then, the peak value (maximum intensity value) of each peak is obtained (step S5). As described above, even if each peak corresponds to a single ion, the peak value varies.
  • the peak value list creation unit 24 creates a list of peak values (peak values) for each peak (step S6). Here, based on the created peak value list, the peak value of each peak is identified as belonging to a peak value range divided into multiple stages, and the peak height distribution is calculated by the number of peaks for each peak value range. May be created to visualize the wave height distribution. FIG. 4 is an example of such a peak value histogram.
  • the detector voltage determination unit 25 identifies the median value of peak peak values in the peak value list (step S7). However, instead of the median value, another representative value such as an average value or a predetermined value (an intermediate value, an upper limit value, a lower limit value, an average value, etc.) within a peak value range having the highest frequency in the peak value histogram is used. Also good. Then, it is determined whether or not the median value of the identified peak values is included in a predetermined reference. Specifically, for example, it is determined whether or not the median value is included in a predetermined reference range (step S8). If it is included in the reference range, the process proceeds to step S12, and the detector voltage set at that time is determined as the optimum voltage.
  • a predetermined reference an intermediate value, an upper limit value, a lower limit value, an average value, etc.
  • step S9 the detector voltage is increased by a predetermined voltage
  • step S10 it is determined whether or not the increase is possible.
  • it will return to Step S2 and will perform measurement to a standard sample again. That is, if it is determined No in step S8, it is determined that the detector voltage is too low, the detector voltage is increased by a predetermined voltage, and the measurement for the standard sample is performed again. Then, after newly obtaining profile data, the processes of steps S4 to S8 described above are performed.
  • the detector voltage is increased stepwise until the median value of the specified peak value falls within the reference range by processing using the profile data obtained by measurement after increasing the detector voltage. Then, when the median value of the specified peak values enters the reference range, the process proceeds from step S8 to S12, and the detector voltage at that time is determined as the optimum voltage and stored in the internal memory.
  • the detector voltage determination unit 25 sets the detector voltage.
  • the upper limit voltage value is set (step S11).
  • the main control unit 5 displays the auto-tuning result on the screen of the display unit 7.
  • the determined detector voltage is the upper limit of the voltage variable range
  • a display for alerting the user is added (step S13). That is, when the user views the auto-tuning result on the screen of the display unit 7, the user is made to recognize that the detector voltage has reached the upper limit. Thereby, the user can recognize the deterioration of the detector in use, and can consider the replacement time of the detector.
  • the detector voltage is set so that the voltage value corresponding to a single ion becomes a predetermined value as in the case of the pulse count type detector while using the DC type detector. Can be determined.
  • the detector voltage can be determined based on the performance of the detector 15 itself without being affected by the amount of ions generated in the ion source or the amount of ions reaching the detector 15.
  • the detector voltage is determined by the processing of steps S5 to S12 based on profile spectra obtained under different detector voltages.
  • the detector voltage determination method is as follows. It can be replaced with various methods. Hereinafter, this modification will be described.
  • the profile spectrum is a waveform continuous in the time direction (or the mass-to-charge ratio direction when the time axis is converted to the mass-to-charge ratio axis).
  • the unit 22 performs a centroid conversion on the peak detected in the profile spectrum to obtain a linear centroid peak.
  • the mass-to-charge ratio of the centroid peak is the position of the center of gravity of the original peak waveform.
  • the height of the centroid peak is the area or height of the normal original peak waveform, but the height of the centroid peak is not important here.
  • this centroid peak is regarded as a pulse signal corresponding to each ion, and the detector voltage is determined in the same manner as the pulse count type detector.
  • the detector voltage determination unit 25 detects the detector voltage when the centroid peak count value is increased from the state in which the detector voltage increases and becomes constant, that is, in the plateau region. The low detector voltage is determined as the appropriate detector voltage. If it is difficult to find the plateau region, an appropriate detector voltage may be determined using the algorithm described in Patent Document 3.
  • centroid TIC a TIC obtained by adding the intensities of all centroid peaks within a predetermined time-of-flight range (or mass-to-charge ratio range) estimated to correspond to a component in the standard sample is obtained.
  • the centroid TIC is almost zero at a detector voltage at which the signal intensity corresponding to a single ion is below a certain level.
  • the detector voltage determination unit 25 finds a detector voltage (position A in FIG. 4) that suddenly increases from a level at which the centroid TIC is substantially zero, and appropriately applies a voltage that is larger than the detector voltage by a predetermined value, for example. Set as the correct detector voltage.
  • the detector voltage determination unit 25 determines the signal intensity at the peak top of all peaks detected within a predetermined time-of-flight range (or mass-to-charge ratio range) estimated to correspond to the component in the standard sample in the profile spectrum.
  • the TIC is calculated by adding together the values or the peak-top signal strength values of the peaks whose peak-top signal strength values are greater than or equal to a predetermined threshold value.
  • the relationship between the TIC and the detector voltage also has a shape shown in FIG.
  • a detector voltage that suddenly increases from a level at which the TIC is almost zero is found, and for example, a voltage that is larger than the detector voltage by a predetermined value is set to an appropriate detector voltage. Set as.
  • the detector voltage can be determined.
  • the above embodiment and each modification can be modified as appropriate.
  • the voltage applied to the reflector 14 is changed from that during normal measurement in order to prevent the time convergence of ions from being performed.
  • the voltage applied to the extrusion electrode 111 and the extraction electrode 112 of the injection unit 11 is different.
  • the time convergence of ions can also be impaired by changing the applied voltage from that during normal measurement.
  • the voltage applied to the flight tube 12 is a reference potential for the path of the ions flying, but the time convergence of the ions is also impaired by changing the voltage applied to the flight tube 12 from that during normal measurement. .
  • the voltage applied to the flight tube 12 is set as a reference potential, and the voltages applied to the extrusion electrode 111, the extraction electrode 112, the reflector 14 and the like are relatively adjusted. By changing any of them, the time convergence of ions is impaired. Therefore, any voltage may be changed during automatic adjustment of the detector voltage.
  • the present invention is applied to the reflectron type OA-TOFMS.
  • the present invention accelerates ions held in other TOFMS, for example, a three-dimensional quadrupole type or linear type ion trap.
  • the present invention can also be applied to an ion trap time-of-flight mass spectrometer that sends out to the flight space or a time-of-flight mass spectrometer that accelerates ions generated from the sample by a MALDI ion source and sends them to the flight space.
  • the present invention can be applied not only to the reflectron type but also to a TOFMS having a configuration such as a linear type, a multiple circulation type, and a multiple reflection type.

Abstract

Selon la présente invention, lors d'un réglage automatique d'une tension de détecteur, un générateur de tension de réflexion (33) sous la commande d'un dispositif de commande de réglage automatique (42) applique une tension différente d'une tension de mesure normale à laquelle des ions ne sont pas concentrés temporellement sur un réflecteur (14) pour mesurer un échantillon standard. Une pluralité d'ions ayant le même m/z éjecté simultanément à partir d'un éjecteur (11) est diffusée dans le sens du temps pour atteindre un détecteur (15). Parce que ceci permet d'observer une pluralité de petits pics correspondant à chaque ion à observer dans un profil spectral, une unité d'acquisition de données de valeur de pic (23) acquiert la valeur de hauteur d'onde de chaque pic et une unité de préparation de liste de valeurs de hauteur d'onde (24) prépare une liste de valeurs de hauteur d'onde. Une unité de détermination de tension de détecteur (25) recherche une tension de détecteur de telle sorte que la médiane des valeurs de hauteur d'onde dans la liste de valeurs de hauteur d'onde se situe dans une plage de référence. La tension de détecteur déterminée de telle manière n'est pas affectée par le nombre d'ions générés et reflète donc de manière précise les performances d'un détecteur.
PCT/JP2018/017077 2018-04-26 2018-04-26 Spectromètre de masse à temps de vol WO2019207737A1 (fr)

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JP2020515409A JP6897870B2 (ja) 2018-04-26 2018-04-26 飛行時間型質量分析装置
PCT/JP2018/017077 WO2019207737A1 (fr) 2018-04-26 2018-04-26 Spectromètre de masse à temps de vol
US17/041,859 US11152201B2 (en) 2018-04-26 2018-04-26 Time-of-flight mass spectrometer

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WO2022162754A1 (fr) * 2021-01-27 2022-08-04 三菱電機株式会社 Chargeur embarqué et procédé d'obtention d'une valeur de crête d'un signal cplt

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GB2608352A (en) 2021-05-14 2023-01-04 Thermo Fisher Scient Bremen Gmbh Method of gain calibration

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003525515A (ja) * 1999-06-11 2003-08-26 パーセプティブ バイオシステムズ，インコーポレイテッド 衝突室中での減衰を伴うタンデム飛行時間型質量分析計およびその使用のための方法
JP2015118887A (ja) * 2013-12-20 2015-06-25 株式会社島津製作所 飛行時間型質量分析装置
JP2015185306A (ja) * 2014-03-24 2015-10-22 株式会社島津製作所 飛行時間型質量分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2339958B (en) * 1998-07-17 2001-02-21 Genomic Solutions Ltd Time-of-flight mass spectrometer
WO2000036633A1 (fr) * 1998-12-17 2000-06-22 Jeol Usa, Inc. Spectrometre de masse a temps de vol a reflechissement lineaire destine a l'analyse moleculaire structurelle au moyen de dissociation induite par collision
JP2006118176A (ja) 2004-10-20 2006-05-11 Taisei Corp 水中トンネルの施工方法
JP4665517B2 (ja) 2004-12-28 2011-04-06 株式会社島津製作所 質量分析装置
JP2011014481A (ja) 2009-07-06 2011-01-20 Shimadzu Corp 質量分析装置
US10515789B2 (en) * 2017-03-28 2019-12-24 Thermo Finnigan Llc Reducing detector wear during calibration and tuning

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003525515A (ja) * 1999-06-11 2003-08-26 パーセプティブ バイオシステムズ，インコーポレイテッド 衝突室中での減衰を伴うタンデム飛行時間型質量分析計およびその使用のための方法
JP2015118887A (ja) * 2013-12-20 2015-06-25 株式会社島津製作所 飛行時間型質量分析装置
JP2015185306A (ja) * 2014-03-24 2015-10-22 株式会社島津製作所 飛行時間型質量分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022162754A1 (fr) * 2021-01-27 2022-08-04 三菱電機株式会社 Chargeur embarqué et procédé d'obtention d'une valeur de crête d'un signal cplt

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