WO2019094929A1 - Linearized energetic radio-frequency plasma ion source - Google Patents
Linearized energetic radio-frequency plasma ion source Download PDFInfo
- Publication number
- WO2019094929A1 WO2019094929A1 PCT/US2018/060728 US2018060728W WO2019094929A1 WO 2019094929 A1 WO2019094929 A1 WO 2019094929A1 US 2018060728 W US2018060728 W US 2018060728W WO 2019094929 A1 WO2019094929 A1 WO 2019094929A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- plasma
- chamber body
- ion source
- plasma chamber
- voltage
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45578—Elongated nozzles, tubes with holes
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/507—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using external electrodes, e.g. in tunnel type reactors
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/3211—Antennas, e.g. particular shapes of coils
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32357—Generation remote from the workpiece, e.g. down-stream
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32422—Arrangement for selecting ions or species in the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/002—Cooling arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/061—Construction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/332—Coating
- H01J2237/3321—CVD [Chemical Vapor Deposition]
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020544376A JP7206286B2 (ja) | 2017-11-13 | 2018-11-13 | 線形化されたエネルギーの無線周波数プラズマイオン供給源、薄膜堆積装置、およびプラズマイオンビーム発生方法 |
CN201880068516.6A CN111247617B (zh) | 2017-11-13 | 2018-11-13 | 线性高能射频等离子体离子源 |
KR1020207015119A KR102389512B1 (ko) | 2017-11-13 | 2018-11-13 | 선형화된 활성 무선 주파수 플라즈마 이온 소스 |
EP18876928.5A EP3711078B1 (de) | 2017-11-13 | 2018-11-13 | Linearisierte energetische hochfrequenz-plasmaionenquelle |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762585126P | 2017-11-13 | 2017-11-13 | |
US62/585,126 | 2017-11-13 | ||
US16/184,177 US10815570B2 (en) | 2017-11-13 | 2018-11-08 | Linearized energetic radio-frequency plasma ion source |
US16/184,177 | 2018-11-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2019094929A1 true WO2019094929A1 (en) | 2019-05-16 |
Family
ID=66431263
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2018/060728 WO2019094929A1 (en) | 2017-11-13 | 2018-11-13 | Linearized energetic radio-frequency plasma ion source |
Country Status (7)
Country | Link |
---|---|
US (1) | US10815570B2 (de) |
EP (1) | EP3711078B1 (de) |
JP (1) | JP7206286B2 (de) |
KR (1) | KR102389512B1 (de) |
CN (1) | CN111247617B (de) |
TW (1) | TWI699812B (de) |
WO (1) | WO2019094929A1 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11037765B2 (en) * | 2018-07-03 | 2021-06-15 | Tokyo Electron Limited | Resonant structure for electron cyclotron resonant (ECR) plasma ionization |
US11189464B2 (en) * | 2019-07-17 | 2021-11-30 | Beijing E-town Semiconductor Technology Co., Ltd. | Variable mode plasma chamber utilizing tunable plasma potential |
CN110712094B (zh) * | 2019-09-06 | 2021-07-23 | 中国兵器科学研究院宁波分院 | 降低离子束抛光光学元件表面污染的方法 |
CN112899639B (zh) * | 2019-12-04 | 2022-08-19 | 江苏菲沃泰纳米科技股份有限公司 | 类金刚石薄膜制备装置和制备方法 |
CN111741584B (zh) * | 2020-05-26 | 2021-12-28 | 中国原子能科学研究院 | 一种d+离子源 |
CN113903644A (zh) * | 2020-06-22 | 2022-01-07 | 江苏鲁汶仪器有限公司 | 一种用于离子束刻蚀腔的挡件 |
KR20220069148A (ko) * | 2020-11-19 | 2022-05-27 | 삼성전자주식회사 | 반도체 소자의 제조 장치 및 반도체 소자의 제조 방법 |
CN113285223B (zh) * | 2021-05-24 | 2023-10-10 | 中国科学院合肥物质科学研究院 | 一种分立式π/2相位差离子回旋共振加热天线 |
US20230083497A1 (en) * | 2021-09-15 | 2023-03-16 | Applied Materials, Inc. | Uniform plasma linear ion source |
US20230102972A1 (en) * | 2021-09-27 | 2023-03-30 | Applied Materials, Inc. | Active temperature control for rf window in immersed antenna source |
KR102399398B1 (ko) * | 2021-09-27 | 2022-05-18 | 아리온주식회사 | 알에프 스플리트 조정 시스템 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US5036252A (en) * | 1988-04-26 | 1991-07-30 | Hauzer Holding Bv | Radio frequency ion beam source |
US20020004309A1 (en) * | 1990-07-31 | 2002-01-10 | Kenneth S. Collins | Processes used in an inductively coupled plasma reactor |
US20140124363A1 (en) * | 2011-07-20 | 2014-05-08 | Canon Anelva Corporation | Ion beam generator and ion beam plasma processing apparatus |
US20160111241A1 (en) * | 2014-10-16 | 2016-04-21 | Varian Semiconductor Equipment Associates, Inc. | Ion Beam Uniformity Control |
WO2018202584A1 (en) * | 2017-05-03 | 2018-11-08 | Agc Glass Europe | Linear plasma source with segmented hollow cathode |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS6394546A (ja) * | 1986-10-09 | 1988-04-25 | Hitachi Ltd | イオン源 |
JP3529445B2 (ja) * | 1994-09-13 | 2004-05-24 | 株式会社東芝 | マイクロ波イオン源 |
US6071372A (en) * | 1997-06-05 | 2000-06-06 | Applied Materials, Inc. | RF plasma etch reactor with internal inductive coil antenna and electrically conductive chamber walls |
JP4032504B2 (ja) * | 1998-05-11 | 2008-01-16 | 日新電機株式会社 | スパッタ装置 |
JP3127892B2 (ja) * | 1998-06-30 | 2001-01-29 | 日新電機株式会社 | 水素負イオンビーム注入方法及び注入装置 |
US7767561B2 (en) * | 2004-07-20 | 2010-08-03 | Applied Materials, Inc. | Plasma immersion ion implantation reactor having an ion shower grid |
JP5105775B2 (ja) * | 2006-06-05 | 2012-12-26 | キヤノン株式会社 | 絶縁配管、プラズマ処理装置及び方法 |
EP2368257A4 (de) * | 2008-12-08 | 2016-03-09 | Gen Plasma Inc | Magnetfeld-ionenquellenvorrichtung mit geschlossener drift und selbstreinigender anode und verfahren zur substratmodifizierung damit |
US8048200B2 (en) * | 2009-04-24 | 2011-11-01 | Peter Gefter | Clean corona gas ionization for static charge neutralization |
US8736177B2 (en) * | 2010-09-30 | 2014-05-27 | Fei Company | Compact RF antenna for an inductively coupled plasma ion source |
JP2013069661A (ja) * | 2012-03-08 | 2013-04-18 | Nissin Ion Equipment Co Ltd | 電極枠体 |
US9232628B2 (en) * | 2013-02-20 | 2016-01-05 | Varian Semiconductor Equipment Associates, Inc. | Method and system for plasma-assisted ion beam processing |
US9024282B2 (en) * | 2013-03-08 | 2015-05-05 | Varian Semiconductor Equipment Associates, Inc. | Techniques and apparatus for high rate hydrogen implantation and co-implantion |
US20160233047A1 (en) * | 2014-03-07 | 2016-08-11 | Advanced Ion Beam Technology, Inc. | Plasma-based material modification with neutral beam |
JP2016134519A (ja) * | 2015-01-20 | 2016-07-25 | 東京エレクトロン株式会社 | Iii−v族半導体のエッチング方法及びエッチング装置 |
US9706634B2 (en) * | 2015-08-07 | 2017-07-11 | Varian Semiconductor Equipment Associates, Inc | Apparatus and techniques to treat substrates using directional plasma and reactive gas |
US20170140900A1 (en) * | 2015-11-13 | 2017-05-18 | Applied Materials, Inc. | Uniform low electron temperature plasma source with reduced wafer charging and independent control over radical composition |
-
2018
- 2018-11-08 US US16/184,177 patent/US10815570B2/en active Active
- 2018-11-13 KR KR1020207015119A patent/KR102389512B1/ko active IP Right Grant
- 2018-11-13 CN CN201880068516.6A patent/CN111247617B/zh active Active
- 2018-11-13 WO PCT/US2018/060728 patent/WO2019094929A1/en unknown
- 2018-11-13 JP JP2020544376A patent/JP7206286B2/ja active Active
- 2018-11-13 EP EP18876928.5A patent/EP3711078B1/de active Active
- 2018-11-13 TW TW107140183A patent/TWI699812B/zh active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5036252A (en) * | 1988-04-26 | 1991-07-30 | Hauzer Holding Bv | Radio frequency ion beam source |
US20020004309A1 (en) * | 1990-07-31 | 2002-01-10 | Kenneth S. Collins | Processes used in an inductively coupled plasma reactor |
US20140124363A1 (en) * | 2011-07-20 | 2014-05-08 | Canon Anelva Corporation | Ion beam generator and ion beam plasma processing apparatus |
US20160111241A1 (en) * | 2014-10-16 | 2016-04-21 | Varian Semiconductor Equipment Associates, Inc. | Ion Beam Uniformity Control |
WO2018202584A1 (en) * | 2017-05-03 | 2018-11-08 | Agc Glass Europe | Linear plasma source with segmented hollow cathode |
Non-Patent Citations (1)
Title |
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See also references of EP3711078A4 * |
Also Published As
Publication number | Publication date |
---|---|
CN111247617B (zh) | 2022-11-18 |
CN111247617A (zh) | 2020-06-05 |
US20190145005A1 (en) | 2019-05-16 |
JP7206286B2 (ja) | 2023-01-17 |
US10815570B2 (en) | 2020-10-27 |
EP3711078B1 (de) | 2023-06-07 |
KR102389512B1 (ko) | 2022-04-22 |
EP3711078A4 (de) | 2021-09-08 |
JP2021502688A (ja) | 2021-01-28 |
EP3711078C0 (de) | 2023-06-07 |
TWI699812B (zh) | 2020-07-21 |
TW201931415A (zh) | 2019-08-01 |
KR20200075868A (ko) | 2020-06-26 |
EP3711078A1 (de) | 2020-09-23 |
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