WO2019062036A1 - Led epitaxial structure, and manufacturing method thereof - Google Patents

Led epitaxial structure, and manufacturing method thereof Download PDF

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Publication number
WO2019062036A1
WO2019062036A1 PCT/CN2018/078656 CN2018078656W WO2019062036A1 WO 2019062036 A1 WO2019062036 A1 WO 2019062036A1 CN 2018078656 W CN2018078656 W CN 2018078656W WO 2019062036 A1 WO2019062036 A1 WO 2019062036A1
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Prior art keywords
layer
island
electron blocking
epitaxial structure
led epitaxial
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PCT/CN2018/078656
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French (fr)
Chinese (zh)
Inventor
程志青
宋长伟
徐志波
林兓兓
蔡吉明
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厦门三安光电有限公司
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Publication of WO2019062036A1 publication Critical patent/WO2019062036A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate

Definitions

  • the present invention belongs to the field of semiconductor technologies, and in particular, to an LED epitaxial structure and a method for fabricating the same.
  • An LED is a semiconductor solid-state light-emitting device that utilizes a semiconductor PN junction as a light-emitting structure.
  • gallium nitride is regarded as a third-generation semiconductor material, and a gallium nitride-based light-emitting diode having an InGaN/GaN active region is regarded as It is the most promising source of light today.
  • a GaN-based blue LED epitaxial structure generally includes a substrate, a buffer layer, a first semiconductor layer, a multiple quantum well light-emitting layer, a final barrier layer, an electron blocking layer, and a second semiconductor layer, and multiple quantum
  • the well light-emitting layer is generally an InGaN/GaN superlattice structure
  • the electron blocking layer is a P-type AlGaN structure.
  • the refractive index of the A1 GaN material is lower than that of GaN and InGaN, the light emitted from the multi-quantum well light-emitting layer is likely to be at the final potential. Total reflection occurs at the interface between the barrier layer and the electron blocking layer, resulting in poor light extraction efficiency.
  • Another common technique for improving the light extraction efficiency is to use a patterned substrate. Although this technology improves the light extraction efficiency to a certain extent without affecting the wire bonding, it cannot completely improve the final barrier layer and the electron blocking. Loss of light extraction efficiency caused by total reflection at the interface of the layer.
  • the present invention first proposes an LED epitaxial structure including a substrate and sequential bits. a first semiconductor layer, a multiple quantum well light emitting layer, a final barrier layer, an electron blocking layer and a second semiconductor layer on the substrate, wherein: a plurality of pixels are interposed between the last barrier layer and the electron blocking layer An island structure that is not continuously arranged.
  • the refractive index of the island structure is greater than the refractive index of the electron blocking layer is less than or equal to the refractive index of the last barrier layer.
  • the discontinuously arranged island-like structures are 3D island-like structures, and the shape is a cone or a truncated cone shape or a yurt shape or a polygonal prism shape or a combination of any two or three or four shapes.
  • the epitaxial structure further includes a plurality of nucleation structures as an island structure forming core between the last barrier layer and the island structure.
  • the island-shaped structure has the same refractive index as the last barrier layer.
  • the island structure is Al x G ai — X N
  • the electron blocking layer is Al y G ai — y N, where 0 ⁇ x
  • the surface of the electron blocking layer is a flat surface.
  • the material of the nucleation structure is a magnesium nitride compound.
  • a buffer layer is further disposed between the substrate and the first semiconductor layer.
  • the present invention also provides a method for preparing an LED epitaxial structure, comprising the following steps:
  • Step 1 first providing a substrate
  • Step 2 sequentially depositing a buffer layer and a first semiconductor layer on the substrate;
  • Step 3 depositing a multi-quantum well light-emitting layer and a final barrier layer on the first semiconductor layer;
  • Step 4 depositing an electron blocking layer on the last barrier layer
  • Step 5 continuing to deposit a second semiconductor layer on the surface of the electron blocking layer
  • the method for preparing the epitaxial structure further comprises a step 3b of depositing a nucleation structure between the last barrier layer and the island structure, wherein the nucleation structure is a nucleation center of the island structure.
  • the nucleation structure has a growth temperature of less than 900 ° C and a reaction pressure of 100 to 500 torr.
  • NH 3 and CP 2 Mg are introduced to form a nucleation structure of the magnesium nitride compound.
  • the island structure has a growth temperature of 700 ° C to 950 ° C.
  • the island structure has a growth temperature of 800 ° C to 900 ° C to facilitate formation of a discontinuous island structure on the nucleation structure of the magnesium nitride compound.
  • the present invention inserts a plurality of nucleation structures of magnesium nitride compounds between the electron blocking layer and the final barrier layer, and uses the nucleation structure as a core to grow a plurality of island structures to reduce light in the electron blocking layer.
  • the phenomenon of total reflection at the interface with the last barrier layer causes the light emitted from the multi-quantum well light-emitting layer to enter the electron blocking layer more, thereby improving the light-emitting efficiency of the LED epitaxial structure, and filling the island-like structure through the electron blocking layer.
  • a planar epitaxial LED epitaxial structure is then obtained.
  • 1 is a schematic diagram of an epitaxial structure of an LED in the prior art.
  • FIG. 2 is a schematic diagram of an epitaxial structure of an LED according to Embodiment 1 of the present invention.
  • FIG. 3 is a flow chart of a method for preparing an epitaxial structure of an LED according to Embodiment 2 of the present invention.
  • FIG. 4 is a schematic diagram of an epitaxial structure of an LED according to Embodiment 3 of the present invention.
  • FIG. 5 is a flow chart of a method for preparing an epitaxial structure of an LED according to Embodiment 4 of the present invention.
  • FIG. 1 substrate; 2: buffer layer; 3: first semiconductor layer; 4: multiple quantum well light-emitting layer; 5: final barrier layer; 6: electron blocking layer; 8: nucleation structure; 9: island structure.
  • Embodiment 1 provides an LED epitaxial structure.
  • the epitaxial structure includes a substrate 1 and a buffer layer 2, a first semiconductor layer 3 , and a multiple quantum well light-emitting layer sequentially disposed on the substrate 1. 4.
  • a final barrier layer 5 a plurality of discontinuously arranged island structures 9, an electron blocking layer 6, and a second semiconductor layer 7.
  • the discontinuously arranged island-like structures 9 are 3D island-like structures 9, which are in the shape of a cone or a truncated cone or a yurt or a polygonal prism or a combination of any two or three or four of the foregoing.
  • the shape of the island-like structure 9 is a combination of a polygonal prism and a polygonal pyramid, and the bottom pitch of the adjacent island-like structures 9 is larger than the top spacing so as to enter the island-like structure 9. Light energy is emitted from different angles.
  • the refractive index of the island structure 9 is greater than the refractive index of the electron blocking layer 6 is less than or equal to the refractive index of the last barrier layer 5, wherein the material of the island structure 9 is Al x G ai — X N, the electron blocking layer 6 The material is Al y G ai — y N, where 0 ⁇ 1, x ⁇ y ⁇ l , preferably, X ranges from 0 to 0.1, and y ranges from: x ⁇ y ⁇ 0.3; optional island
  • the refractive index of the structure 9 is the same as the refractive index of the last barrier layer 5.
  • the material of the island structure 9 and the material of the last barrier layer 5 are both GaN, which are emitted from the quantum well light-emitting layer 4.
  • the light portion passes through the last barrier layer 5 directly into the island-like structure 9 without changing the propagation path of the light, and then enters the electron blocking layer 6 after being scattered by the island-like structure 9.
  • the electron blocking layer 6 completely covers the island structure 9 and obtains a surface having a relatively flat surface; the substrate 1 is preferably a patterned substrate 1 to increase the scattering effect of the bottom of the epitaxial structure on light, further Improve light extraction efficiency.
  • the first semiconductor layer 3 is electrically opposite to the second conductor layer.
  • the first semiconductor layer 3 is an N-type layer
  • the second semiconductor layer 7 is a P-type layer, and is located at the first semiconductor layer 3 and the second semiconductor layer 7.
  • the multi-quantum well light-emitting layer 4 is a superlattice structure in which GaN quantum barrier layers and InGaN quantum well layers are alternately stacked; the buffer layer 2 may be GaN, AlN or AlGaN.
  • the present invention reduces total light reflection at the interface of the last barrier layer 5 and the electron blocking layer 6 by inserting a plurality of discontinuously arranged island structures 9 between the last barrier layer 5 and the electron blocking layer 6.
  • the probability that the light scatters through the interface between the island structure 9 and the electron blocking layer 6 changes the incident angle of the light entering the electron blocking layer 6, thereby improving the external quantum well efficiency of the LED epitaxial structure.
  • the electron blocking layer 6 is used for filling the island structure 9, so that the surface of the prepared epitaxial structure layer is relatively flat, which facilitates automatic wire bonding of the electrodes and improves the reliability of the device.
  • Embodiments of the present invention provide a method for fabricating an LED epitaxial structure, which is suitable for use in the fabrication example 1.
  • LED epitaxial structure referring to Figure 3, the preparation method comprises:
  • Step 1 first providing a substrate 1, the substrate 1 is a patterned substrate 1, specifically a sapphire patterned substrate 1;
  • Step 2 depositing a buffer layer 2, a first semiconductor layer 3 on the substrate 1 in sequence;
  • the buffer layer 2 is a GaN buffer layer 2 or an A1N buffer layer 2 or an AlGaN buffer layer 2, and the first semiconductor layer 3 is an N-type layer, and is mainly used for supplying electrons.
  • Step 3 depositing a multi-quantum well light-emitting layer 4 and a final barrier layer 5 on the first semiconductor layer 3;
  • the multiple quantum well light-emitting layer 4 is a superlattice structure in which a GaN quantum barrier layer and an InGaN quantum well layer are alternately stacked, and the number of periods is 2 to 50; the growth conditions and materials of the last barrier layer 5 and the GaN quantum barrier layer are formed. All the same.
  • Step 3a depositing a plurality of discontinuously arranged island-like structures 9 on the last barrier layer 5, the refractive index of the island-like structures 9 being greater than the refractive index of the electron blocking layer 6 being less than or equal to the refractive index of the last barrier layer 5. rate.
  • the growth temperature of the island structure 9 is between 700 ° C and 950 ° C, preferably, the growth temperature is 800 ° C to 900 °
  • Step 4 depositing an electron blocking layer 6;
  • the material of the electron blocking layer 6 is Al y G ai — y N
  • the material of the island structure 9 is Al x Ga ⁇ X N, where 0 ⁇ ⁇ 1, x ⁇ y ⁇ l , preferably The range of X is 0 to 0.1, and the range of y is: x ⁇ y ⁇ 0.3.
  • the electron blocking layer 6 completely covers the island structure 9 and is formed into a surface flat structure.
  • Step 5 depositing a second semiconductor layer 7 on the surface of the electron blocking layer 6, the second semiconductor layer 7 is a P-type layer, including a high-temperature P-type GaN layer and a P-type structural layer.
  • the first semiconductor layer 3, the multiple quantum well light-emitting layer 4, the last barrier layer 5, the island-like structure 9, the electron blocking layer 6, and the second semiconductor layer 7 are all prepared by MOCVD, and the epitaxial structure is in the forming process.
  • TMG a or TEGa is used as a gallium source
  • NH 3 is used as a nitrogen source
  • N ⁇ /H 2 is used as a carrier gas
  • CP 2 Mg is used as a P-type impurity
  • SiH 4 is used as an N-type impurity.
  • the present invention reduces total light reflection at the interface of the last barrier layer 5 and the electron blocking layer 6 by depositing a plurality of discontinuously arranged island structures 9 between the last barrier layer 5 and the electron blocking layer 6.
  • the probability that the light scatters through the interface between the island structure 9 and the electron blocking layer 6 changes the incident angle of the light entering the electron blocking layer 6, thereby improving the external quantum well efficiency of the LED epitaxial structure.
  • an LED epitaxial structure provided by this embodiment is different from the LED epitaxial structure provided by the embodiment in that: the last barrier layer 5 and the island-like structure 9 further include an island structure 9 formed.
  • the core has a plurality of nucleation structures 8, and the nucleation structure 8 serves as a nucleation center of the island-like structure 9, and its size is smaller than the size of the island-like structure 9.
  • the LED epitaxial structure provided in this embodiment includes: a substrate 1, a buffer layer 2 on the substrate 1, a first semiconductor layer 3 , a multiple quantum well light-emitting layer 4, and a final barrier layer 5, The nucleation structure 8, the island structure 9, the electron blocking layer 6, and the second semiconductor layer 7.
  • the material of the nucleation structure 8 is a magnesium nitride compound
  • the refractive index of the island structure 9 is greater than the refractive index of the electron blocking layer 6 is smaller than the refractive index of the last barrier layer 5
  • the material of the island structure 9 is Al.
  • the electron blocking layer 6 is Al y G ai — y N, where 0 ⁇ ⁇ 1, x ⁇ y ⁇ l , preferably, x ranges from 0 to 0.1, and the range of y is: x ⁇ y ⁇ 0.3, the electron blocking layer 6 completely covers the island-like structure 9 and is formed to have a surface flat structure, and the magnesium nitride compound is a Mg 3 N 2 structure or a MgN structure.
  • a plurality of magnesium nitride compound nucleation structures 8 are inserted between the electron blocking layer 6 and the last barrier layer 5, and the nucleation structure 8 is used as a core to grow a plurality of discontinuous islands.
  • the structure 9 reduces the total reflection phenomenon of light at the interface between the electron blocking layer 6 and the final barrier layer 5, so that the light emitted from the multiple quantum well light-emitting layer 4 enters the electron blocking layer 6 more, thereby improving the epitaxial structure of the LED.
  • the light-emitting efficiency is filled and the island-like structure 9 is filled by the electron blocking layer 6, and then a surface-flat LED epitaxial structure is obtained.
  • the embodiment of the present invention improves a method for preparing an epitaxial structure of an LED, and is suitable for fabricating the epitaxial structure of the LED provided in Embodiment 3.
  • the preparation method includes:
  • Step 1 first providing a substrate 1, the substrate 1 is a shaped substrate 1, specifically a sapphire patterned substrate 1
  • Step 2 sequentially depositing a buffer layer 2 on the substrate 1 , the first semiconductor layer 3;
  • the buffer layer 2 is a GaN buffer layer 2 or an A1N buffer layer 2 or an AlGaN buffer layer 2, and the first semiconductor layer 3 is an N-type layer mainly used for supplying electrons.
  • Step 3 depositing a multi-quantum well light-emitting layer 4 and a final barrier layer 5 on the first semiconductor layer 3;
  • the multi-quantum well light-emitting layer 4 is a superlattice structure in which a GaN quantum barrier layer and an InGaN quantum well layer are alternately stacked, and the number of periods is 2 to 50; the growth conditions and materials of the last barrier layer 5 and the GaN quantum barrier layer are formed. All the same.
  • Step 3b depositing a plurality of nucleation structures 8 on the last barrier layer 5, the nucleation layer material being magnesium nitride Things.
  • Step 3a with the nucleation structure 8 as a core, depositing a plurality of discontinuously arranged island-like structures 9, the refractive index of the island-like structures 9 being greater than the refractive index of the electron blocking layer 6 being smaller than that of the last barrier layer 5. Refractive index.
  • the growth temperature of the island structure 9 is between 700 ° C and 950 ° C, preferably, the growth temperature is 800 ° C to 900 ° C, in order to benefit from the nucleation structure 8 of the magnesium nitride compound.
  • a discontinuous island-like structure 9 is formed, and the magnesium nitride compound is a Mg 3 N 2 structure or a MgN structure.
  • Step 4 depositing an electron blocking layer 6;
  • the material of the electron blocking layer 6 is Al y G ai — y N
  • the material of the island structure 9 is Al x Ga X N, where 0 ⁇ 1, x ⁇ y ⁇ l , preferably, The range of x is 0 to 0.1, and the range of y is: x ⁇ y ⁇ 0.3, and the electron blocking layer 6 completely covers the island-like structure 9 and is formed to have a surface flat structure.
  • Step 5 further depositing a second semiconductor layer 7 on the surface of the electron blocking layer 6, the second semiconductor layer 7 is
  • the P-type layer includes a high-temperature P-type GaN layer and a P-type structural layer.
  • the present invention reduces total light reflection at the interface of the last barrier layer 5 and the electron blocking layer 6 by depositing a plurality of discontinuously arranged island-like structures 9 between the last barrier layer 5 and the electron blocking layer 6.
  • the probability that the light scatters through the interface between the island structure 9 and the electron blocking layer 6 changes the incident angle of the light entering the electron blocking layer 6, thereby improving the external quantum well efficiency of the LED epitaxial structure.

Abstract

An LED epitaxial structure, and manufacturing method thereof. A plurality of magnesium nitride compound-based nucleation structures (8) are inserted between an electron blocking layer (6) and an ultimate barrier layer (5), and the nucleation structures (8) are used as cores to grow a plurality of island structures (9). In this way, total internal reflection at an interface of the electron blocking layer (6) and the ultimate barrier layer (5) is reduced, such that a large portion of light emitted by a multi-quantum well light-emitting layer (4) can enter the electron blocking layer (6), thus improving light-emitting efficiency of the LED epitaxial structure. In addition, the electron blocking layer (6) is used to fill gaps between the island structures (9), thus creating a level surface of the LED epitaxial structure.

Description

技术领域  Technical field
[0001] 本发明属于半导体技术领域, 尤其涉及一种 LED外延结构及其制备方法。  [0001] The present invention belongs to the field of semiconductor technologies, and in particular, to an LED epitaxial structure and a method for fabricating the same.
背景技术  Background technique
[0002] LED是一种半导体固体发光器件, 其利用半导体 P-N结作为发光结构, 目前氮 化镓被视为第三代半导体材料, 具备 InGaN/GaN有源区的氮化镓基发光二极管被 视为当今最有潜力的发光源。  [0002] An LED is a semiconductor solid-state light-emitting device that utilizes a semiconductor PN junction as a light-emitting structure. Currently, gallium nitride is regarded as a third-generation semiconductor material, and a gallium nitride-based light-emitting diode having an InGaN/GaN active region is regarded as It is the most promising source of light today.
[0003] 参看附图 1, 目前 GaN基蓝光 LED外延结构一般包括衬底、 缓冲层、 第一半导 体层、 多量子阱发光层、 最后势垒层、 电子阻挡层和第二半导体层, 多量子阱 发光层一般为 InGaN/GaN超晶格结构, 电子阻挡层为 P型 AlGaN结构, 但由于 A1 GaN材料的折射率较 GaN与 InGaN低, 故在多量子阱发光层发出的光线容易在最 后势垒层与电子阻挡层的界面处发生全反射, 造成光取出效率较差。  Referring to FIG. 1, a GaN-based blue LED epitaxial structure generally includes a substrate, a buffer layer, a first semiconductor layer, a multiple quantum well light-emitting layer, a final barrier layer, an electron blocking layer, and a second semiconductor layer, and multiple quantum The well light-emitting layer is generally an InGaN/GaN superlattice structure, and the electron blocking layer is a P-type AlGaN structure. However, since the refractive index of the A1 GaN material is lower than that of GaN and InGaN, the light emitted from the multi-quantum well light-emitting layer is likely to be at the final potential. Total reflection occurs at the interface between the barrier layer and the electron blocking layer, resulting in poor light extraction efficiency.
[0004] 现有技术中, 为提高出光效率, 也有采用 P型层表面粗化技术, 虽然此技术可 在一定程度上提高出光效率, 但无法改善最后势垒层与电子阻挡层的界面处现 象造成的光取出效率的损失, 且因表面粗化技术因容易有粗化不均良率较差与 造成 LED的 P电极与 N电极有色差, 造成自动打线机辨识困难。  [0004] In the prior art, in order to improve the light extraction efficiency, a P-type layer surface roughening technique is also used. Although this technology can improve the light extraction efficiency to some extent, the interface between the final barrier layer and the electron blocking layer cannot be improved. The resulting light extraction efficiency is lost, and the surface roughening technique is prone to coarsening unevenness, and the color difference between the P electrode and the N electrode of the LED is poor, which makes the automatic wire bonding machine difficult to identify.
[0005] 另一常见的提高出光效率的技术为, 采用图形化衬底, 虽然此技术科在一定程 度上提高出光效率, 且不影响打线, 但亦无法完全改善最后势垒层与电子阻挡 层的界面处全反射现象造成的光取出效率的损失。  [0005] Another common technique for improving the light extraction efficiency is to use a patterned substrate. Although this technology improves the light extraction efficiency to a certain extent without affecting the wire bonding, it cannot completely improve the final barrier layer and the electron blocking. Loss of light extraction efficiency caused by total reflection at the interface of the layer.
[0006] 因此目前, 急需提出一种能够再进一步提高 LED其出光效率, 又不影响其打线 的 LED外延结构及其制备方法。  [0006] Therefore, at present, there is an urgent need to propose an LED epitaxial structure capable of further improving the light-emitting efficiency of an LED without affecting its wire bonding and a preparation method thereof.
技术问题 technical problem
问题的解决方案  Problem solution
技术解决方案  Technical solution
[0007] 针对上述问题, 本发明首先提出一种 LED外延结构, 其包括一衬底以及依次位 于所述衬底上第一半导体层、 多量子阱发光层、 最后势垒层、 电子阻挡层和第 二半导体层, 其特征在于: 于所述最后势垒层和电子阻挡层之间插入复数个不 连续排列的岛状结构。 In view of the above problems, the present invention first proposes an LED epitaxial structure including a substrate and sequential bits. a first semiconductor layer, a multiple quantum well light emitting layer, a final barrier layer, an electron blocking layer and a second semiconductor layer on the substrate, wherein: a plurality of pixels are interposed between the last barrier layer and the electron blocking layer An island structure that is not continuously arranged.
[0008] 优选的, 所述岛状结构的折射率大于电子阻挡层的折射率小于等于最后势垒层 的折射率。  [0008] Preferably, the refractive index of the island structure is greater than the refractive index of the electron blocking layer is less than or equal to the refractive index of the last barrier layer.
[0009] 优选的, 所述不连续排列的岛状结构为 3D岛状结构, 形状为锥形或者锥台形或 者蒙古包形或者多棱柱形或者前述任意两种或者三种或者四种形状的组合。  [0009] Preferably, the discontinuously arranged island-like structures are 3D island-like structures, and the shape is a cone or a truncated cone shape or a yurt shape or a polygonal prism shape or a combination of any two or three or four shapes.
[0010] 优选的, 所述外延结构还包括位于所述最后势垒层与所述岛状结构之间的作为 岛状结构形成核心的复数个成核结构。 [0010] Preferably, the epitaxial structure further includes a plurality of nucleation structures as an island structure forming core between the last barrier layer and the island structure.
[0011] 优选的, 所述岛状结构与所述最后势垒层的折射率相同。  [0011] Preferably, the island-shaped structure has the same refractive index as the last barrier layer.
[0012] 优选的, 所述岛状结构为 Al xGa iXN, 所述电子阻挡层为 Al yGa iyN, 其中 0≤x [0012] Preferably, the island structure is Al x G aiX N, and the electron blocking layer is Al y G aiy N, where 0≤x
< 1, x< y < l。  < 1, x < y < l.
[0013] 优选的, 所述电子阻挡层表面为平整表面。 [0013] Preferably, the surface of the electron blocking layer is a flat surface.
[0014] 优选的, 所述成核结构的材料为氮化镁化合物。 [0014] Preferably, the material of the nucleation structure is a magnesium nitride compound.
[0015] 优选的, 所述衬底和第一半导体层之间还具有缓冲层。 [0015] Preferably, a buffer layer is further disposed between the substrate and the first semiconductor layer.
[0016] 本发明还提出一种 LED外延结构的制备方法, 包括如下步骤: [0016] The present invention also provides a method for preparing an LED epitaxial structure, comprising the following steps:
[0017] 步骤 1、 首先提供一衬底; [0017] Step 1, first providing a substrate;
[0018] 步骤 2、 于所述衬底上依次沉积缓冲层、 第一半导体层;  [0018] Step 2, sequentially depositing a buffer layer and a first semiconductor layer on the substrate;
[0019] 步骤 3、 于所述第一半导体层上沉积多量子阱发光层和最后势垒层;  [0019] Step 3, depositing a multi-quantum well light-emitting layer and a final barrier layer on the first semiconductor layer;
[0020] 步骤 4、 于所述最后势垒层上沉积电子阻挡层;  [0020] Step 4, depositing an electron blocking layer on the last barrier layer;
[0021] 步骤 5、 于所述电子阻挡层表面继续沉积第二半导体层;  [0021] Step 5, continuing to deposit a second semiconductor layer on the surface of the electron blocking layer;
[0022] 其特征在于: 所述最后势垒层与所述电子阻挡层沉积步骤之间还包括沉积复数 个不连续的岛状结构的步骤 3a。  And [0022] characterized in that: the step 3a of depositing a plurality of discontinuous island structures between the last barrier layer and the electron blocking layer deposition step.
[0023] 优选的, 所述外延结构的制备方法还包括于最后势垒层与岛状结构之间沉积成 核结构的步骤 3b, 所述成核结构为所述岛状结构的成核中心。 [0023] Preferably, the method for preparing the epitaxial structure further comprises a step 3b of depositing a nucleation structure between the last barrier layer and the island structure, wherein the nucleation structure is a nucleation center of the island structure.
[0024] 优选的, 所述成核结构的生长的温度小于 900°C, 反应压力为 100~500torr。 [0024] Preferably, the nucleation structure has a growth temperature of less than 900 ° C and a reaction pressure of 100 to 500 torr.
[0025] 优选的, 通入NH 3和CP 2Mg, 形成氮化镁化合物的成核结构。 [0025] Preferably, NH 3 and CP 2 Mg are introduced to form a nucleation structure of the magnesium nitride compound.
[0026] 优选的, 所述岛状结构的生长温度为 700°C~950°C。 [0027] 优选的, 所述岛状结构的生长温度为 800°C~900°C, 以利于在氮化镁化合物成 核结构上形成不连续的岛状结构。 [0026] Preferably, the island structure has a growth temperature of 700 ° C to 950 ° C. [0027] Preferably, the island structure has a growth temperature of 800 ° C to 900 ° C to facilitate formation of a discontinuous island structure on the nucleation structure of the magnesium nitride compound.
发明的有益效果  Advantageous effects of the invention
有益效果  Beneficial effect
[0028] 本发明在电子阻挡层与最后势垒层之间插入复数个氮化镁化合物成核结构, 并 以此成核结构为核心, 生长复数个岛状结构, 以减少光在电子阻挡层与最后势 垒层界面处的全反射现象, 使从多量子阱发光层发出的光更多的进入电子阻挡 层, 进而提高 LED外延结构的出光效率, 并通过电子阻挡层填平岛状结构, 继而 得到一表面平整的 LED外延结构。  [0028] The present invention inserts a plurality of nucleation structures of magnesium nitride compounds between the electron blocking layer and the final barrier layer, and uses the nucleation structure as a core to grow a plurality of island structures to reduce light in the electron blocking layer. The phenomenon of total reflection at the interface with the last barrier layer causes the light emitted from the multi-quantum well light-emitting layer to enter the electron blocking layer more, thereby improving the light-emitting efficiency of the LED epitaxial structure, and filling the island-like structure through the electron blocking layer. A planar epitaxial LED epitaxial structure is then obtained.
对附图的简要说明  Brief description of the drawing
附图说明  DRAWINGS
[0029] 附图用来提供对本发明的进一步理解, 并且构成说明书的一部分, 与本发明的 实施例一起用于解释本发明, 并不构成对本发明的限制。 此外, 附图数据是描 述概要, 不是按比例绘制。  The drawings are intended to provide a further understanding of the invention, and are intended to be a part of the description of the invention. In addition, the drawing figures are a summary of the description and are not drawn to scale.
[0030] 图 1为现有技术中 LED外延结构示意图。  1 is a schematic diagram of an epitaxial structure of an LED in the prior art.
[0031] 图 2为本发明实施例 1之 LED外延结构示意图。  2 is a schematic diagram of an epitaxial structure of an LED according to Embodiment 1 of the present invention.
[0032] 图 3为本发明实施例 2之 LED外延结构制备方法流程图。  3 is a flow chart of a method for preparing an epitaxial structure of an LED according to Embodiment 2 of the present invention.
[0033] 图 4为本发明实施例 3之 LED外延结构示意图。  4 is a schematic diagram of an epitaxial structure of an LED according to Embodiment 3 of the present invention.
[0034] 图 5为本发明实施例 4之 LED外延结构制备方法流程图。  5 is a flow chart of a method for preparing an epitaxial structure of an LED according to Embodiment 4 of the present invention.
[0035] 图中标示: 1 : 衬底; 2: 缓冲层; 3: 第一半导体层; 4: 多量子阱发光层; 5 : 最后势垒层; 6: 电子阻挡层; Ί 第二半导体层; 8: 成核结构; 9: 岛状结 构。  [0035] The figure indicates: 1 : substrate; 2: buffer layer; 3: first semiconductor layer; 4: multiple quantum well light-emitting layer; 5: final barrier layer; 6: electron blocking layer; 8: nucleation structure; 9: island structure.
本发明的实施方式 Embodiments of the invention
[0036] 为使本发明的目的, 技术方案和优点更加清楚, 下面将结合附图对本发明实施 方式作进一步地详细描述。  The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.
[0037] 实施例 1 [0038] 本实施了提供的一种 LED外延结构, 参看附图 2, 该外延结构包括一衬底 1以及 依次位于衬底 1上的缓冲层 2、 第一半导体层 3、 多量子阱发光层 4、 最后势垒层 5 、 复数个不连续排列的岛状结构 9、 电子阻挡层 6和第二半导体层 7。 Embodiment 1 [0038] The present invention provides an LED epitaxial structure. Referring to FIG. 2, the epitaxial structure includes a substrate 1 and a buffer layer 2, a first semiconductor layer 3 , and a multiple quantum well light-emitting layer sequentially disposed on the substrate 1. 4. A final barrier layer 5, a plurality of discontinuously arranged island structures 9, an electron blocking layer 6, and a second semiconductor layer 7.
[0039] 不连续排列的岛状结构 9为 3D岛状结构 9, 其形状为锥形或者锥台形或者蒙古包 形或者多棱柱形或者前述任意两种或者三种或者四种形状的组合。 在本实施例 中, 如附图 2所示, 岛状结构 9的形状为多棱柱与多棱椎体的组合, 相邻岛状结 构 9的底部间距大于顶部间距, 以便进入岛状结构 9的光能从不同角度射出。  The discontinuously arranged island-like structures 9 are 3D island-like structures 9, which are in the shape of a cone or a truncated cone or a yurt or a polygonal prism or a combination of any two or three or four of the foregoing. In the present embodiment, as shown in FIG. 2, the shape of the island-like structure 9 is a combination of a polygonal prism and a polygonal pyramid, and the bottom pitch of the adjacent island-like structures 9 is larger than the top spacing so as to enter the island-like structure 9. Light energy is emitted from different angles.
[0040] 岛状结构 9的折射率大于电子阻挡层 6的折射率小于等于最后势垒层 5的折射率 , 其中, 岛状结构 9的材料为 Al xGa iXN, 电子阻挡层 6的材料为 Al yGa iyN, 其 中 0≤χ< 1, x< y < l , 优选的, X的范围为 0~0.1, y的范围为: x<y<0.3; 可选的 岛状结构 9的折射率与最后势垒层 5的折射率相同, 因此, 在本实施例中, 岛状 结构 9的材料与最后势垒层 5的材料均为 GaN, 从量子阱发光层 4发出的光线部分 经过最后势垒层 5在不改变光的传播路径下直接进入岛状结构 9, 然后经过岛状 结构 9的散射后进入电子阻挡层 6。 [0040] The refractive index of the island structure 9 is greater than the refractive index of the electron blocking layer 6 is less than or equal to the refractive index of the last barrier layer 5, wherein the material of the island structure 9 is Al x G aiX N, the electron blocking layer 6 The material is Al y G aiy N, where 0≤χ< 1, x< y < l , preferably, X ranges from 0 to 0.1, and y ranges from: x<y<0.3; optional island The refractive index of the structure 9 is the same as the refractive index of the last barrier layer 5. Therefore, in the present embodiment, the material of the island structure 9 and the material of the last barrier layer 5 are both GaN, which are emitted from the quantum well light-emitting layer 4. The light portion passes through the last barrier layer 5 directly into the island-like structure 9 without changing the propagation path of the light, and then enters the electron blocking layer 6 after being scattered by the island-like structure 9.
[0041] 本实施例中, 电子阻挡层 6完全覆盖岛状结构 9, 并得到一表面较平整的表面; 衬底 1优选为图形化衬底 1, 增加外延结构底部对光的散射作用, 进一步提高出 光效率。 第一半导体层 3与第二导体层的电性相反, 优选的, 第一半导体层 3为 N 型层, 第二半导体层 7为 P型层, 位于第一半导体层 3与第二半导体层 7之间的多 量子阱发光层 4为 GaN量子垒层和 InGaN量子阱层交替层叠的超晶格结构; 缓冲 层 2可以为 GaN、 A1N或者 AlGaN。  [0041] In this embodiment, the electron blocking layer 6 completely covers the island structure 9 and obtains a surface having a relatively flat surface; the substrate 1 is preferably a patterned substrate 1 to increase the scattering effect of the bottom of the epitaxial structure on light, further Improve light extraction efficiency. The first semiconductor layer 3 is electrically opposite to the second conductor layer. Preferably, the first semiconductor layer 3 is an N-type layer, and the second semiconductor layer 7 is a P-type layer, and is located at the first semiconductor layer 3 and the second semiconductor layer 7. The multi-quantum well light-emitting layer 4 is a superlattice structure in which GaN quantum barrier layers and InGaN quantum well layers are alternately stacked; the buffer layer 2 may be GaN, AlN or AlGaN.
[0042] 本发明通过在最后势垒层 5与电子阻挡层 6之间插入复数个不连续排列的岛状结 构 9, 减少光线在最后势垒层 5与电子阻挡层 6的界面处发生全反射的概率, 光线 通过岛状结构 9与电子阻挡层 6界面发生散射, 改变了光进入电子阻挡层 6的入射 角度, 提高 LED外延结构的外量子阱效率。 而且, 电子阻挡层 6用于填平岛状结 构 9, 使得制备的外延结构层表面较平整, 便于电极的自动打线, 提高了器件的 可靠性。  [0042] The present invention reduces total light reflection at the interface of the last barrier layer 5 and the electron blocking layer 6 by inserting a plurality of discontinuously arranged island structures 9 between the last barrier layer 5 and the electron blocking layer 6. The probability that the light scatters through the interface between the island structure 9 and the electron blocking layer 6 changes the incident angle of the light entering the electron blocking layer 6, thereby improving the external quantum well efficiency of the LED epitaxial structure. Moreover, the electron blocking layer 6 is used for filling the island structure 9, so that the surface of the prepared epitaxial structure layer is relatively flat, which facilitates automatic wire bonding of the electrodes and improves the reliability of the device.
[0043] 实施例 2  Embodiment 2
[0044] 本发明实施例提出了一种 LED外延结构的制备方法, 适用于制作实施例 1提供 的 LED外延结构, 参看附图 3, 该制备方法包括: [0044] Embodiments of the present invention provide a method for fabricating an LED epitaxial structure, which is suitable for use in the fabrication example 1. LED epitaxial structure, referring to Figure 3, the preparation method comprises:
[0045] 步骤 1、 首先提供一衬底 1, 该衬底 1为图形化衬底 1, 具体为蓝宝石图形化衬底 1; [0045] Step 1, first providing a substrate 1, the substrate 1 is a patterned substrate 1, specifically a sapphire patterned substrate 1;
[0046] 步骤 2、 于所述衬底 1上依次沉积缓冲层 2、 第一半导体层 3 ;  [0046] Step 2, depositing a buffer layer 2, a first semiconductor layer 3 on the substrate 1 in sequence;
[0047] 该缓冲层 2为 GaN缓冲层 2或者 A1N缓冲层 2或者 AlGaN缓冲层 2, 第一半导体层 3 为 N型层, 主要用于提供电子。  The buffer layer 2 is a GaN buffer layer 2 or an A1N buffer layer 2 or an AlGaN buffer layer 2, and the first semiconductor layer 3 is an N-type layer, and is mainly used for supplying electrons.
[0048] 步骤 3、 于所述第一半导体层 3上沉积多量子阱发光层 4和最后势垒层 5 ; [0048] Step 3, depositing a multi-quantum well light-emitting layer 4 and a final barrier layer 5 on the first semiconductor layer 3;
[0049] 多量子阱发光层 4为 GaN量子垒层和 InGaN量子阱层交替层叠的超晶格结构, 其 周期数为 2~50; 最后势垒层 5与 GaN量子垒层的生长条件和材料均相同。 [0049] The multiple quantum well light-emitting layer 4 is a superlattice structure in which a GaN quantum barrier layer and an InGaN quantum well layer are alternately stacked, and the number of periods is 2 to 50; the growth conditions and materials of the last barrier layer 5 and the GaN quantum barrier layer are formed. All the same.
[0050] 步骤 3a、 于最后势垒层 5上沉积复数个不连续排列的岛状结构 9, 该岛状结构 9 的折射率大于电子阻挡层 6的折射率小于等于最后势垒层 5的折射率。 [0050] Step 3a, depositing a plurality of discontinuously arranged island-like structures 9 on the last barrier layer 5, the refractive index of the island-like structures 9 being greater than the refractive index of the electron blocking layer 6 being less than or equal to the refractive index of the last barrier layer 5. rate.
[0051] 该岛状结构 9的成长温度在 700°C~950°C之间, 优选, 其生长温度为 800°C~900[0051] The growth temperature of the island structure 9 is between 700 ° C and 950 ° C, preferably, the growth temperature is 800 ° C to 900 °
°C, 以利形成不连续的岛状结构 9。 °C, to form a discontinuous island structure 9 .
[0052] 步骤 4、 沉积电子阻挡层 6; [0052] Step 4, depositing an electron blocking layer 6;
[0053] 具体地, 电子阻挡层 6的材料为 Al yGa iyN, 岛状结构 9的材料为 Al xGa ^ XN, 其 中 0≤χ < 1, x < y < l , 优选的, X的范围为 0~0.1, y的范围为: x<y<0.3, 电子阻 挡层 6完全覆盖岛状结构 9并形成以表面平整结构。 [0053] Specifically, the material of the electron blocking layer 6 is Al y G aiy N , and the material of the island structure 9 is Al x Ga ^ X N, where 0≤χ < 1, x < y < l , preferably The range of X is 0 to 0.1, and the range of y is: x < y < 0.3. The electron blocking layer 6 completely covers the island structure 9 and is formed into a surface flat structure.
[0054] 步骤 5、 于所述电子阻挡层 6表面继续沉积第二半导体层 7, 该第二半导体层 7为 P型层, 包括高温 P型 GaN层和 P型结构层。  [0054] Step 5, depositing a second semiconductor layer 7 on the surface of the electron blocking layer 6, the second semiconductor layer 7 is a P-type layer, including a high-temperature P-type GaN layer and a P-type structural layer.
[0055] 其中, 第一半导体层 3、 多量子阱发光层 4、 最后势垒层 5、 岛状结构 9、 电子阻 挡层 6和第二半导体层 7均采用 MOCVD法制备, 外延结构在形成过程中, 以 TMG a或者 TEGa作为镓源、 NH 3作为氮源、 N ^/H 2作为载气, CP 2Mg作为 P型杂质 , SiH 4作为 N型杂质。 [0055] wherein, the first semiconductor layer 3, the multiple quantum well light-emitting layer 4, the last barrier layer 5, the island-like structure 9, the electron blocking layer 6, and the second semiconductor layer 7 are all prepared by MOCVD, and the epitaxial structure is in the forming process. Among them, TMG a or TEGa is used as a gallium source, NH 3 is used as a nitrogen source, N ^/H 2 is used as a carrier gas, CP 2 Mg is used as a P-type impurity, and SiH 4 is used as an N-type impurity.
[0056] 本发明通过在最后势垒层 5与电子阻挡层 6之间沉积复数个不连续排列的岛状结 构 9, 减少光线在最后势垒层 5与电子阻挡层 6的界面处发生全反射的概率, 光线 通过岛状结构 9与电子阻挡层 6界面发生散射, 改变了光进入电子阻挡层 6的入射 角度, 提高 LED外延结构的外量子阱效率。  [0056] The present invention reduces total light reflection at the interface of the last barrier layer 5 and the electron blocking layer 6 by depositing a plurality of discontinuously arranged island structures 9 between the last barrier layer 5 and the electron blocking layer 6. The probability that the light scatters through the interface between the island structure 9 and the electron blocking layer 6 changes the incident angle of the light entering the electron blocking layer 6, thereby improving the external quantum well efficiency of the LED epitaxial structure.
[0057] 实施例 3 [0058] 参看附图 4, 本实施例提供的一种 LED外延结构与实施例提供的 LED外延结构 的区别在于: 最后势垒层 5与岛状结构 9之间还包括作为岛状结构 9形成核心的复 数个成核结构 8, 成核结构 8作为岛状结构 9的成核中心, 其尺寸小于岛状结构 9 的尺寸。 Embodiment 3 [0058] Referring to FIG. 4, an LED epitaxial structure provided by this embodiment is different from the LED epitaxial structure provided by the embodiment in that: the last barrier layer 5 and the island-like structure 9 further include an island structure 9 formed. The core has a plurality of nucleation structures 8, and the nucleation structure 8 serves as a nucleation center of the island-like structure 9, and its size is smaller than the size of the island-like structure 9.
[0059] 具体地, 本实施例提供的 LED外延结构依次包括: 衬底 1, 位于衬底 1上的缓冲 层 2、 第一半导体层 3、 多量子阱发光层 4、 最后势垒层 5、 成核结构 8、 岛状结构 9、 电子阻挡层 6和第二半导体层 7。 [0059] Specifically, the LED epitaxial structure provided in this embodiment includes: a substrate 1, a buffer layer 2 on the substrate 1, a first semiconductor layer 3 , a multiple quantum well light-emitting layer 4, and a final barrier layer 5, The nucleation structure 8, the island structure 9, the electron blocking layer 6, and the second semiconductor layer 7.
[0060] 其中, 成核结构 8的材料为氮化镁化合物, 岛状结构 9的折射率大于电子阻挡层 6的折射率小于最后势垒层 5的折射率, 岛状结构 9的材料为 Al xGa iXN, 电子阻挡 层 6为 Al yGa iyN, 其中 0≤χ < 1, x < y < l , 优选的, x的范围为 0~0.1, y的范围为 : x<y<0.3 , 电子阻挡层 6完全覆盖岛状结构 9并形成以表面平整结构, 氮化镁化 合物为 Mg 3N 2结构或者 MgN结构。 [0060] wherein, the material of the nucleation structure 8 is a magnesium nitride compound, the refractive index of the island structure 9 is greater than the refractive index of the electron blocking layer 6 is smaller than the refractive index of the last barrier layer 5, and the material of the island structure 9 is Al. x G aiX N, the electron blocking layer 6 is Al y G aiy N, where 0≤χ < 1, x < y < l , preferably, x ranges from 0 to 0.1, and the range of y is: x <y<0.3, the electron blocking layer 6 completely covers the island-like structure 9 and is formed to have a surface flat structure, and the magnesium nitride compound is a Mg 3 N 2 structure or a MgN structure.
[0061] 本发明实施例先于电子阻挡层 6与最后势垒层 5之间插入复数个氮化镁化合物成 核结构 8, 并以此成核结构 8为核心, 生长复数个不连续的岛状结构 9, 以减少光 在电子阻挡层 6与最后势垒层 5界面处的全反射现象, 使从多量子阱发光层 4发出 的光更多的进入电子阻挡层 6, 进而提高 LED外延结构的出光效率, 并通过电子 阻挡层 6填平岛状结构 9, 继而得到一表面平整的 LED外延结构。  [0061] In the embodiment of the present invention, a plurality of magnesium nitride compound nucleation structures 8 are inserted between the electron blocking layer 6 and the last barrier layer 5, and the nucleation structure 8 is used as a core to grow a plurality of discontinuous islands. The structure 9 reduces the total reflection phenomenon of light at the interface between the electron blocking layer 6 and the final barrier layer 5, so that the light emitted from the multiple quantum well light-emitting layer 4 enters the electron blocking layer 6 more, thereby improving the epitaxial structure of the LED. The light-emitting efficiency is filled and the island-like structure 9 is filled by the electron blocking layer 6, and then a surface-flat LED epitaxial structure is obtained.
[0062] 实施例 4  Example 4
[0063] 本发明实施例提高了一种 LED外延结构的制备方法, 适用于制作实施例 3提供 的 LED外延结构, 参看附图 5, 该制备方法包括:  The embodiment of the present invention improves a method for preparing an epitaxial structure of an LED, and is suitable for fabricating the epitaxial structure of the LED provided in Embodiment 3. Referring to FIG. 5, the preparation method includes:
[0064] 步骤 1、 首先提供一衬底 1, 该衬底 1为形化衬底 1, 具体为蓝宝石图形化衬底 1 [0065] 步骤 2、 于所述衬底 1上依次沉积缓冲层 2、 第一半导体层 3 ; [0064] Step 1, first providing a substrate 1, the substrate 1 is a shaped substrate 1, specifically a sapphire patterned substrate 1 [0065] Step 2, sequentially depositing a buffer layer 2 on the substrate 1 , the first semiconductor layer 3;
[0066] 该缓冲层 2为 GaN缓冲层 2或者 A1N缓冲层 2或者 AlGaN缓冲层 2, 第一半导体层 3 为 N型层, 主要用于提供电子。 [0066] The buffer layer 2 is a GaN buffer layer 2 or an A1N buffer layer 2 or an AlGaN buffer layer 2, and the first semiconductor layer 3 is an N-type layer mainly used for supplying electrons.
[0067] 步骤 3、 于所述第一半导体层 3上沉积多量子阱发光层 4和最后势垒层 5 ; [0067] Step 3, depositing a multi-quantum well light-emitting layer 4 and a final barrier layer 5 on the first semiconductor layer 3;
[0068] 多量子阱发光层 4为 GaN量子垒层和 InGaN量子阱层交替层叠的超晶格结构, 其 周期数为 2~50; 最后势垒层 5与 GaN量子垒层的生长条件和材料均相同。 [0068] The multi-quantum well light-emitting layer 4 is a superlattice structure in which a GaN quantum barrier layer and an InGaN quantum well layer are alternately stacked, and the number of periods is 2 to 50; the growth conditions and materials of the last barrier layer 5 and the GaN quantum barrier layer are formed. All the same.
[0069] 步骤 3b、 于最后势垒层 5上沉积复数个成核结构 8, 该成核层材料为氮化镁化合 物。 [0069] Step 3b, depositing a plurality of nucleation structures 8 on the last barrier layer 5, the nucleation layer material being magnesium nitride Things.
[0070] 步骤 3a、 以成核结构 8为核心, 沉积积复数个不连续排列的岛状结构 9, 该岛状 结构 9的折射率大于电子阻挡层 6的折射率小于最后势垒层 5的折射率。  [0070] Step 3a, with the nucleation structure 8 as a core, depositing a plurality of discontinuously arranged island-like structures 9, the refractive index of the island-like structures 9 being greater than the refractive index of the electron blocking layer 6 being smaller than that of the last barrier layer 5. Refractive index.
[0071] 该岛状结构 9的成长温度在 700°C~950°C之间,优选, 其生长温度为 800°C~900°C , 以利在以氮化镁化合物成核结构 8为核心形成不连续的岛状结构 9, 氮化镁化 合物为 Mg 3N 2结构或者 MgN结构。 [0071] The growth temperature of the island structure 9 is between 700 ° C and 950 ° C, preferably, the growth temperature is 800 ° C to 900 ° C, in order to benefit from the nucleation structure 8 of the magnesium nitride compound. A discontinuous island-like structure 9 is formed, and the magnesium nitride compound is a Mg 3 N 2 structure or a MgN structure.
[0072] 步骤 4、 沉积电子阻挡层 6;  [0072] Step 4, depositing an electron blocking layer 6;
[0073] 具体地, 电子阻挡层 6的材料为 Al yGa iyN, 岛状结构 9的材料为 Al xGa XN, 其 中 0≤χ< 1, x< y < l , 优选的, x的范围为 0~0.1, y的范围为: x<y<0.3, 电子阻 挡层 6完全覆盖岛状结构 9并形成以表面平整结构。 [0073] Specifically, the material of the electron blocking layer 6 is Al y G aiy N, and the material of the island structure 9 is Al x Ga X N, where 0≤χ< 1, x< y < l , preferably, The range of x is 0 to 0.1, and the range of y is: x < y < 0.3, and the electron blocking layer 6 completely covers the island-like structure 9 and is formed to have a surface flat structure.
[0074] 步骤 5、 于所述电子阻挡层 6表面继续沉积第二半导体层 7, 该第二半导体层 7为[0074] Step 5, further depositing a second semiconductor layer 7 on the surface of the electron blocking layer 6, the second semiconductor layer 7 is
P型层, 包括高温 P型 GaN层和 P型结构层。 The P-type layer includes a high-temperature P-type GaN layer and a P-type structural layer.
[0075] 本发明通过在最后势垒层 5与电子阻挡层 6之间沉积复数个不连续排列的岛状结 构 9, 减少光线在最后势垒层 5与电子阻挡层 6的界面处发生全反射的概率, 光线 通过岛状结构 9与电子阻挡层 6界面发生散射, 改变了光进入电子阻挡层 6的入射 角度, 提高 LED外延结构的外量子阱效率。 [0075] The present invention reduces total light reflection at the interface of the last barrier layer 5 and the electron blocking layer 6 by depositing a plurality of discontinuously arranged island-like structures 9 between the last barrier layer 5 and the electron blocking layer 6. The probability that the light scatters through the interface between the island structure 9 and the electron blocking layer 6 changes the incident angle of the light entering the electron blocking layer 6, thereby improving the external quantum well efficiency of the LED epitaxial structure.
[0076] 应当理解的是, 上述具体实施方案为本发明的优选实施例, 本发明的范围不限 于该实施例, 凡依本发明所做的任何变更, 皆属本发明的保护范围之内。 It is to be understood that the above-described embodiments are a preferred embodiment of the present invention, and the scope of the present invention is not limited to the embodiment, and any modifications made in accordance with the present invention are within the scope of the present invention.

Claims

权利要求书 Claim
[权利要求 1] 一种 LED外延结构, 包括一衬底以及依次位于所述衬底上第一半导体 层、 多量子阱发光层、 最后势垒层、 电子阻挡层和第二半导体层, 其 特征在于: 于所述最后势垒层和电子阻挡层之间插入复数个不连续排 列的岛状结构。  [Claim 1] An LED epitaxial structure comprising a substrate and a first semiconductor layer, a multiple quantum well light-emitting layer, a final barrier layer, an electron blocking layer, and a second semiconductor layer sequentially disposed on the substrate, characterized in that The method comprises: inserting a plurality of discontinuous island structures between the last barrier layer and the electron blocking layer.
[权利要求 2] 根据权利要求 1所述的一种 LED外延结构, 其特征在于: 所述岛状结 构的折射率大于电子阻挡层的折射率, 小于等于最后势垒层的折射率  [Claim 2] An LED epitaxial structure according to claim 1, wherein: the island structure has a refractive index greater than a refractive index of the electron blocking layer and less than or equal to a refractive index of the last barrier layer
[权利要求 3] 根据权利要求 1所述的一种 LED外延结构, 其特征在于: 所述不连续 排列的岛状结构为 3D岛状结构, 其形状为锥形或者锥台形或者蒙古 包形或者多棱柱形或者前述任意两种或者三种或者四种形状的组合。 [Claim 3] The LED epitaxial structure according to claim 1, wherein: the discontinuously arranged island-like structure is a 3D island-like structure having a shape of a cone or a truncated cone or a yurt or more Prismatic or any combination of the two or three or four of the foregoing.
[权利要求 4] 根据权利要求 1所述的一种 LED外延结构, 其特征在于: 所述外延结 构还包括位于所述最后势垒层与所述岛状结构之间的作为岛状结构形 成核心的复数个成核结构。 [Claim 4] The LED epitaxial structure according to claim 1, wherein: the epitaxial structure further comprises an island structure forming core between the last barrier layer and the island structure Multiple nucleation structures.
[权利要求 5] 根据权利要求 2所述的一种 LED外延结构, 其特征在于: 所述岛状结 构与所述最后势垒层的折射率相同。 [Claim 5] An LED epitaxial structure according to claim 2, wherein: the island-like structure has the same refractive index as the last barrier layer.
[权利要求 6] 根据权利要求 1所述的一种 LED外延结构, 其特征在于: 所述岛状结 构材料为 Al xGa !_XN, 所述电子阻挡层材料为 Al yGa ^ yN, 其中 0≤x< 1[Claim 6] The LED epitaxial structure according to claim 1, wherein: the island-shaped structural material is Al x Ga ! X N N, and the electron blocking layer material is Al y Ga ^ y N Where 0≤x< 1
, x< y < l。 , x< y < l.
[权利要求 7] 根据权利要求 1所述的一种 LED外延结构, 其特征在于: 所述电子阻 挡层表面为平整表面。  [Claim 7] An LED epitaxial structure according to claim 1, wherein: the surface of the electron blocking layer is a flat surface.
[权利要求 8] 根据权利要求 4所述的一种 LED外延结构, 其特征在于: 所述成核结 构的材料为氮化镁化合物。  [Claim 8] An LED epitaxial structure according to claim 4, wherein: the material of the nucleation structure is a magnesium nitride compound.
[权利要求 9] 一种 LED外延结构的制备方法, 包括如下步骤: [Claim 9] A method for preparing an LED epitaxial structure, comprising the following steps:
步骤 1、 提供一衬底;  Step 1. providing a substrate;
步骤 2、 于所述衬底上依次沉积缓冲层、 第一半导体层;  Step 2, sequentially depositing a buffer layer and a first semiconductor layer on the substrate;
步骤 3、 于所述第一半导体层上沉积多量子阱发光层和最后势垒层; 步骤 4、 于所述最后势垒层上沉积电子阻挡层; 步骤 5、 于所述电子阻挡层表面继续沉积第二半导体层; 其特征在于: 所述最后势垒层与所述电子阻挡层沉积步骤之间还包括 沉积复数个不连续的岛状结构的步骤 3a。 Step 3, depositing a multi-quantum well light-emitting layer and a final barrier layer on the first semiconductor layer; Step 4, depositing an electron blocking layer on the last barrier layer; Step 5, further depositing a second semiconductor layer on the surface of the electron blocking layer; wherein: the step of depositing a plurality of discontinuous island structures between the final barrier layer and the electron blocking layer deposition step 3a.
[权利要求 10] 根据权利要求 9所述的一种 LED外延结构的制备方法, 其特征在于: 所述外延结构的制备方法还包括于最后势垒层与岛状结构之间沉积成 核结构的步骤 3b, 所述成核结构为所述岛状结构的成核中心。 [Claim 10] The method for fabricating an LED epitaxial structure according to claim 9, wherein: the method for preparing the epitaxial structure further comprises depositing a nucleation structure between the last barrier layer and the island structure. Step 3b, the nucleation structure is a nucleation center of the island structure.
[权利要求 11] 根据权利要求 10所述的一种 LED外延结构的制备方法, 其特征在于: 所述成核结构的生长的温度小于 900°C, 反应压力为 100~500torr。 [Claim 11] A method for fabricating an LED epitaxial structure according to claim 10, wherein: the nucleation structure has a growth temperature of less than 900 ° C and a reaction pressure of 100 to 500 torr.
[权利要求 12] 根据权利要求 10所述的一种 LED外延结构的制备方法, 其特征在于: 通入 NH
Figure imgf000011_0001
2Mg, 形成氮化镁化合物的成核结构。
[Claim 12] A method for fabricating an LED epitaxial structure according to claim 10, wherein:
Figure imgf000011_0001
2 Mg, forming a nucleation structure of the magnesium nitride compound.
[权利要求 13] 根据权利要求 9所述的一种 LED外延结构的制备方法, 其特征在于: 所述岛状结构的生长温度为 700°C~950°C。 [Claim 13] The method for fabricating an LED epitaxial structure according to claim 9, wherein the island structure has a growth temperature of 700 ° C to 950 ° C.
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