WO2019056596A1 - 天线辐射性能的测试方法和测试系统 - Google Patents

天线辐射性能的测试方法和测试系统 Download PDF

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Publication number
WO2019056596A1
WO2019056596A1 PCT/CN2017/115970 CN2017115970W WO2019056596A1 WO 2019056596 A1 WO2019056596 A1 WO 2019056596A1 CN 2017115970 W CN2017115970 W CN 2017115970W WO 2019056596 A1 WO2019056596 A1 WO 2019056596A1
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operating parameter
test
target
operating
parameter
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PCT/CN2017/115970
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English (en)
French (fr)
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韩鹰梅
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深圳市新益技术有限公司
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing

Definitions

  • the present invention relates to the field of antenna testing technology, and more particularly to a test method and test system for antenna radiation performance.
  • the standard OTA test system is SISO (Single Input Single Output), such as mainstream 2G, 3G and WLAN 802.11a/b/g devices
  • the main test indicator is the total radiated power ( Total Radioated Power (TRP) and Total Isotropic Sensitivity (TIS)
  • TRP Total Radioated Power
  • TIS Total Isotropic Sensitivity
  • modern wireless technologies such as LTE, HSPA+, WI-FI and WiMAX have adopted MIMO (Multiple-Input Multiple-Output) to improve data transmission speed. Multiple input / multiple output) technology.
  • MIMO technology utilizes space-time multiplexing to improve the channel capacity of spectrum allocation, intelligently optimize the performance of the communication system according to the channel environment, improve the reliability of wireless transmission and the spectrum efficiency of the wireless communication system, and is a key technology for the future. With the continuous development and application of MIMO technology, the integrity requirements for testing the radiation throughput of MIMO devices are becoming increasingly strict.
  • the two-step test technique provides a low-cost MIMO OTA test solution.
  • the MIMO two-step method based on LTE technology first acquires the direction map of the terminal, and then introduces the direction data into the baseband channel simulator to simulate the real environment, and then the device under test (DUT), such as a mobile phone, etc.
  • DUT device under test
  • Throughput testing while using UXM instrument to achieve two LTE signal transmission, and then achieve two-way I / O MIMO test, which can distinguish the performance of DUT supporting MIMO technology.
  • the test is generally started from a relatively large power value, and the throughput is tested every time a fixed value is dropped.
  • the throughput test curve has a long gentle interval in the initial stage.
  • the target data is mainly concentrated in the fast change interval after the gradual interval, which causes the test method to waste a large amount of test time in the gentle interval of throughput change, and the test efficiency is low.
  • an object of the embodiments of the present invention is to provide a test method and a test system for radiating performance of an antenna, which aim to solve the problem that the existing throughput test method is time-consuming and inefficient.
  • an embodiment of the present invention relates to a method for testing antenna radiation performance, including:
  • the first operating parameter is used as a second initial value
  • the second The policy is to change from the second initial value by a second preset interval, the second quantity being greater than the first quantity
  • the first operating parameter, the second operating parameter, the third operating parameter, and the fourth operating parameter are used to measure radiation performance of the device under test, the first operating parameter and the third operating parameter For power or signal to interference ratio, the second operational parameter and the fourth operational parameter are throughput.
  • the radiation performance of the device under test is reflected by the relationship between the throughput and the power or the relationship between the throughput and the signal-to-interference ratio.
  • the first operating parameter is adjusted from the first initial value, and a near-target is obtained first.
  • the estimated value of the second running parameter is used as the second initial value, and then the third operating parameter is adjusted from the second initial value, thereby obtaining an accurate third operating parameter corresponding to the target fourth operating parameter, and adjusting the first operating parameter.
  • the first preset interval may be relatively large, so that the number of adjustments of the first operating parameter and the third operating parameter may be reduced, thereby greatly improving the testing speed, and at the same time, since the second quantity is larger than the first quantity, The test speed is faster under the test frame condition, further reducing the number of times the first operating parameter is adjusted, thereby further improving the test speed.
  • the first preset interval is changed or unchanged according to the third policy, and when the first preset interval is changed according to the third policy, the third The policy is to decrease the first preset interval value according to a degree of closeness to the target second operating parameter;
  • the second preset interval is changed or unchanged according to the fourth policy, and when the second preset interval is changed according to the fourth policy, the fourth policy is reduced according to the proximity to the target fourth operating parameter.
  • the second preset interval value is used to reduce the fourth policy according to the proximity to the target fourth operating parameter.
  • the lower the first preset interval is adjusted when the target operating parameter is closer to the target, on the one hand, the faster adjustment rate can be maintained in the previous test phase, and the first operating parameter is adjusted more.
  • the number of adjustments is small, in order to achieve the purpose of improving the test speed; on the other hand, the lower adjustment rate in the later test phase can make the test data more accurate and improve the accuracy of the second initial value; similarly, the closer The lower the second preset interval is adjusted when the target fourth operating parameter is on the one hand, the faster adjustment rate can be maintained in the previous test phase, the third operating parameter is adjusted faster, and the number of adjustments is less, to achieve The purpose of improving the test speed; on the other hand, the lower adjustment rate in the later test phase can make the test data more accurate and improve the accuracy of the obtained third operational parameter corresponding to the target fourth operational parameter.
  • the target is second The operating parameter corresponds to the target first operating parameter, and the first operating parameter corresponding to the target second operating parameter satisfies the condition that the deviation rate of the first operating parameter from the target first operating parameter is less than a predetermined threshold.
  • the second initial value obtained can be made closer to the target second operating parameter.
  • the first quantity may be between 1/2 and 1/4 of the second quantity.
  • the above technical solution is implemented such that the process of obtaining the second initial value under the first number of test frames is faster, and the second initial value is also closer to the target fourth operational parameter under the second number of test frames.
  • the target fourth operating parameter may be 95%, 90%, or 70%, and the target fourth operating parameter is 95%. If the actually measured fourth operating parameter is greater than 98%, the second predetermined interval is 1.5-2.5 dB, and if the actually measured fourth operating parameter is less than 98% and greater than 96%, The second preset interval is 1-1.5 dB, and if the actually measured fourth operating parameter is less than 96%, the second preset interval is 0.5-1 dB;
  • the target fourth operating parameter is 90%
  • the second preset interval is 1-1.5 dB, if the actually measured fourth running The parameter is less than 92%, and the second preset interval is 0.5-1dB;
  • the target fourth operating parameter is 70%
  • the actually measured fourth operating parameter is greater than 85%
  • the second preset interval is 1-1.5 dB
  • the actually measured fourth running The parameter is less than 85% and the second preset interval is 0.5-1 dB.
  • the third operating parameter is adjusted at the second preset interval until The fourth operating parameter is less than 95%, and the third operating parameter value corresponding to the target fourth operating parameter is determined by the last two adjusted operating parameter values;
  • the third operating parameter is adjusted at the second preset interval until the fourth operating parameter is less than 90%, and the target fourth operating parameter corresponds to the third running.
  • the parameter value is determined by the last two adjusted operating parameter values;
  • the third operating parameter is adjusted at the second preset interval until the fourth operating parameter is less than 70%, and the target fourth operating parameter corresponds to the third running.
  • the parameter value is determined by the last two adjusted operating parameter values.
  • the target second operating parameter may be 95%, 90%, or 70%, and when the target second operating parameter is 95 %, the predetermined threshold value ranges from 3.3% to 5.3%; when the target second operating parameter is 90%, the predetermined threshold value ranges from 4.64% to 6.64%; when the target When the second operating parameter is 70%, the predetermined threshold value ranges from 13.52% to 15.52%.
  • the first initial value is an empirical value
  • the experience value is based on a point in the correspondence between the first operating parameter and the second operating parameter that meets the change rate requirement. determine.
  • the above technical solution is implemented, and the first initial value is adjusted as much as possible to the point that meets the change rate requirement, thereby further shortening the test time and improving the test efficiency.
  • the predetermined operational parameter is obtained by the following steps:
  • the test system After the device under test obtains the test signal, the test system processes the direction information of the device under test; and,
  • Correlating demodulation parameters and radiation performance data corresponding to the device under test are obtained according to the pattern information, and the predetermined operating parameters are determined by the correlation demodulation parameters and the radiation performance data.
  • an embodiment of the invention relates to a test system for antenna radiation performance, including:
  • test subsystem for communicating with the device under test
  • control subsystem for controlling the test
  • the control subsystem controls the test subsystem to transmit a first number of test frames according to a first operating parameter that is changed according to a preset first policy, and determines a corresponding one of each first operating parameter. a second operating parameter, wherein the first policy is changed from the first initial value by a first preset interval;
  • control subsystem controls the test to transmit a second quantity of test frames according to a third operating parameter that is changed by a preset second policy, and determines a corresponding one of each third operating parameter.
  • a fourth operating parameter the second policy is changed from the second initial value by a second preset interval, and the second quantity is greater than the first quantity;
  • the first operating parameter, the second operating parameter, the third operating parameter, and the fourth operating parameter are used to measure radiation performance of the device under test, the first operating parameter and the third operating parameter For power or signal to interference ratio, the second operational parameter and the fourth operational parameter are throughput.
  • the radiation performance of the device under test is reflected by the relationship between the throughput and the power or the relationship between the throughput and the signal-to-interference ratio.
  • the first operating parameter is adjusted from the first initial value, and a near-target is obtained first.
  • the estimated value of the second running parameter is used as the second initial value, and then the third operating parameter is adjusted from the second initial value, thereby obtaining an accurate third operating parameter corresponding to the target fourth operating parameter, and adjusting the first operating parameter.
  • the first preset interval may be relatively large, so that the number of adjustments of the first operating parameter and the third operating parameter may be reduced, thereby greatly improving the testing speed, and at the same time, since the second quantity is larger than the first quantity, The test speed is faster under the test frame condition, further reducing the number of times the first operating parameter is adjusted, thereby further improving the test speed.
  • test subsystem includes:
  • a rotatable carrying platform for placing and securing the device under test
  • the control subsystem includes:
  • the map information obtains correlation demodulation parameters and radiation performance data corresponding to the device under test to determine the predetermined operational parameters.
  • the present invention has the following beneficial effects:
  • Embodiments of the present invention provide a test method and a test system for antenna radiation performance, wherein a test method for antenna radiation performance includes: a first operation parameter that changes according to a preset first policy under a predetermined operating parameter condition Transmitting a first number of test frames, and determining a second operating parameter corresponding to each of the first operating parameters, where the first policy is changed from the first initial value by a first preset interval; according to each of the second operating parameters Corresponding relationship with each of the first operating parameters, obtaining the first operating parameter corresponding to the target second operating parameter as a second initial value; and under the predetermined working parameter condition, according to the preset second policy
  • the third operating parameter of the change transmits a second number of test frames, and the fourth operating parameter corresponding to each third operating parameter is determined, and the second policy is changed from the second initial value by a second preset interval.
  • the second quantity is greater than the first quantity; according to the correspondence between each fourth operating parameter and each third operating parameter, a location corresponding to the target fourth operating parameter is obtained.
  • a third operating parameter the first operating parameter, the second operating parameter, the third operating parameter, and the fourth operating parameter are used to measure a radiation performance of the device under test, the first operating parameter and the
  • the third operating parameter is a power or a signal to interference ratio, and the second operating parameter and the fourth operating parameter are throughput;
  • the relationship between the throughput and the power or the relationship between the throughput and the signal-to-interference ratio is used to reflect the radiation performance of the device under test.
  • the first operating parameter is adjusted from the first initial value, and a pre-period of the second operational parameter is obtained first.
  • the evaluation is used as the second initial value, and then the third operating parameter is adjusted from the second initial value, thereby obtaining an accurate third operating parameter corresponding to the target fourth operating parameter, and when adjusting the first operating parameter, the first pre- The interval can be relatively large, so the number of adjustments of the first operating parameter and the third operating parameter can be reduced, thereby greatly improving the testing speed, and at the same time, since the second quantity is larger than the first quantity, due to the small number of test frame conditions The test speed is faster, further reducing the number of times the first operating parameter is adjusted, thereby further improving the test speed.
  • FIG. 1 is a schematic structural diagram of a test system according to an embodiment of the present invention.
  • FIG. 3 is a flowchart of a specific testing method in an embodiment of the present invention.
  • test subsystem 11, bearing platform; 12, test probe; 2, control subsystem; 21, tester; 22, processing center; 3, the device under test.
  • An antenna radiation test system includes: a test subsystem 1 for communicating with a device under test 3; and a control subsystem 2; under a predetermined operating parameter condition, the control subsystem 2 controls the tester
  • the system 1 transmits a first number of test frames according to a first operating parameter that is changed according to a preset first policy, and determines a second operating parameter corresponding to each first operating parameter, where the first policy is from the first initial value.
  • the system 2 controls the test to transmit a second number of test frames according to the third operating parameter of the preset second policy change, and determines a fourth operating parameter corresponding to each third operating parameter, where the second strategy is from the second initial value.
  • the first quantity may be the second quantity between 1/2 and 1/4, the first quantity in the embodiment may be 1/4 of the second quantity; and according to the correspondence relationship between each fourth operating parameter and each third operating parameter, the fourth operating parameter and the target are obtained.
  • the first operating parameter, the second operating parameter, the third operating parameter and the fourth operating parameter are used to measure the radiation performance of the device under test 3, and the first operating parameter and the third operating parameter are power Or the signal to interference ratio, the second operating parameter and the fourth operating parameter are throughput.
  • the test subsystem 1 includes: a rotatable carrying platform 11 for placing and fixing the device under test 3; and a test probe 12 for communicating with the device under test 3 to obtain pattern information of the device under test 3
  • the control subsystem 2 includes: a tester 21 connected to the test probe 12 for transmitting a downlink test signal and obtaining pattern information of the device under test 3; and a processing center 22 connected to the test probe 12 and the tester 21 And obtaining correlation demodulation parameters and radiation performance data corresponding to the device under test 3 according to the obtained direction information to determine a predetermined operating parameter.
  • the device under test 3 is a device having electromagnetic radiation performance, and is commonly used: a mobile phone, a tablet computer, a notebook computer, a palmtop computer, a wearable device, and the like.
  • the carrying platform 11 can be rotated by 360°, so that the radiation performance of the entire spherical surface of the device under test 3 can be achieved.
  • the specific structure is the same as that of the existing bearing platform 11 and will not be described herein.
  • test probes 12 are usually provided in plurality and arranged on a test ring, and distributed in a circumferential array on the test ring.
  • the device under test 3 When the device under test 3 is placed on the support platform 11, its physical center substantially coincides with the center of the test ring.
  • the tester 21 generally selects the UXM tester 21, which can transmit two LTE signals as test signals.
  • the processing center 22 is implemented by using a processor or a computer and a processing software built therein for controlling data transmission and performing data processing.
  • the processing software is the same as the existing processing software, and is not described herein.
  • the predetermined working parameters are obtained by the test system, and the steps are as follows:
  • the test system After the test device 3 obtains the test signal sent by the tester 21, the test system processes the direction information of the device under test 3; and obtains the relevant demodulation parameters and radiation performance data corresponding to the device under test 3 according to the direction information.
  • the predetermined operating parameters are determined by the relevant demodulation parameters and the radiation performance data.
  • the embodiment further provides a method for testing antenna radiation performance, including:
  • the first number of test frames are transmitted according to the first operating parameter that is changed according to the preset first policy, and the second operating parameter corresponding to each first operating parameter is determined. Changing from the first initial value at a first predetermined interval;
  • the second operating parameter corresponding to the third operating parameter that is changed according to the preset second policy is used to determine a fourth operating parameter corresponding to each third operating parameter, where the second policy is From the second initial value to the second pre Setting an interval change, the second quantity being greater than the first quantity;
  • the first operating parameter, the second operating parameter, the third operating parameter and the fourth operating parameter are used to measure the radiation performance of the device under test 3, the first operating parameter and the third operating parameter are power or signal to interference ratio, and the second operating parameter And the fourth operating parameter is throughput, the first operating parameter corresponds to the second operating parameter, the third operating parameter corresponds to the fourth operating parameter, and the throughput may be actual throughput, or may be actual throughput and theoretical throughput
  • the ratio of the amount, the throughput referred to in this embodiment is the ratio of the actual throughput to the theoretical throughput.
  • the radiation performance of the device under test 3 is reflected by the relationship between the throughput and the power or the relationship between the throughput and the signal-to-interference ratio.
  • the first operating parameter is adjusted from the first initial value, and a second operational parameter close to the target is obtained first.
  • the estimated value is used as the second initial value, and then the third operating parameter is adjusted from the second initial value, thereby obtaining an accurate third operating parameter corresponding to the target fourth operating parameter, and when adjusting the first operating parameter, the first
  • the preset interval can be relatively large, so the number of adjustments of the first operating parameter and the third operating parameter can be reduced, thereby greatly improving the testing speed, and since the second quantity is greater than the first quantity due to the smaller number of test frame conditions The test speed is faster, further reducing the number of times the first operating parameter is adjusted, thereby further improving the test speed.
  • the first initial value is an empirical value
  • the empirical value is determined according to a point in the correspondence between the first operating parameter and the second operating parameter that meets the change rate requirement, and is generally formed by the first operating parameter and the second operating parameter.
  • the test curve is a flat curve with a longer period in the initial stage, and the rate of change is small.
  • the test curve will change abruptly, the rate of change is higher, and the final target is to be obtained.
  • the data is usually concentrated in the sharply changing curve segment, so the first initial test parameter is selected at a value close to this change node, thereby eliminating the need for a large amount of time to test the gradual interval in the early stage, improving test speed and test efficiency.
  • the first preset interval is changed or changed according to the third policy.
  • the third policy is to decrease the first preset interval value according to the proximity to the target second operating parameter.
  • the second preset interval is changed according to the fourth policy or is unchanged.
  • the fourth policy is to reduce the second preset interval value according to the proximity to the target fourth operating parameter;
  • the first preset interval is adjusted to be lower.
  • the faster adjustment rate can be maintained in the previous test phase, so that the first operating parameter is adjusted faster and the number of adjustments is less.
  • the lower adjustment rate in the later test phase can make the test data more accurate and improve the accuracy of the second initial value; similarly, the closer to the target fourth operating parameter, The lower the second preset interval is adjusted, on the one hand, the faster adjustment rate can be maintained in the previous test phase, the third operating parameter is adjusted faster, and the number of adjustments is less.
  • the lower adjustment rate in the test phase can make the test data more accurate and improve the accuracy of the obtained third operational parameter corresponding to the target fourth operational parameter.
  • the target second operating parameter corresponds to the target first operating parameter
  • the first operating parameter corresponding to the target second operating parameter satisfies the following condition: the deviation rate between the first operating parameter and the target first operating parameter is less than a predetermined threshold, and the first operating parameter The deviation rate from the target first operating parameter (first operating parameter - target first operating parameter) / target first operating parameter.
  • the target second operating parameter may be 95%, 90%, or 70%.
  • the predetermined threshold value ranges from 3.3% to 5.3%, and 4.3% is selected in this embodiment.
  • the target second operating parameter is 90%, the predetermined threshold value ranges from 4.64% to 6.64%, and 5.64% is selected in the embodiment;
  • the target second operating parameter is 70%, the predetermined threshold value ranges. 13.52%-15.52%, 14.52% is selected in this embodiment;
  • the first operating parameter is adjusted, when the obtained second operating parameter is just less than the predetermined threshold, the first operating parameter corresponding to the point is used as the second initial value.
  • the fourth operational parameter of the target may be 95%, 90% or 70%, and when the fourth operational parameter of the target is 95%, if the actually measured fourth operational parameter is greater than 98%, the second preset interval is 1.5-2.5 dB, This embodiment is preferably 2 dB. If the actually measured fourth operating parameter is less than 98% and greater than 96%, the second preset interval is 1-1.5 dB, which is preferably 1 dB in this embodiment, if the fourth operation is actually measured. The parameter is less than 96%, the second preset interval is 0.5-1 dB, and the embodiment is preferably 0.5 dB.
  • the third operating parameter is adjusted at the second preset interval until the fourth operating parameter is less than 95%, and the target fourth operating parameter
  • the corresponding third operating parameter value is determined by the last two adjusted operating parameter values, and is generally determined by the value obtained by obtaining the last two adjusted operating parameter values;
  • the fourth operating parameter of the target is 90%, if the actually measured fourth operating parameter is greater than 92%, the second preset interval is 1-1.5 dB, which is preferably 1 dB in this embodiment, if the actually measured fourth operating parameter is less than 92%, the second preset interval is 0.5-1dB, which is preferably 0.5dB in the embodiment; during the test, the third operating parameter is adjusted at the second preset interval until the fourth operating parameter is less than 90%, and the target fourth operating parameter corresponds to The third operating parameter value is determined by the last two adjusted operating parameter values, and is generally determined by the value obtained by obtaining the last two adjusted operating parameter values;
  • the fourth operating parameter of the target is 70%
  • the second preset interval is 1-1.5 dB, which is preferably 1 dB in this embodiment
  • the second preset interval is 0.5-1 dB, which is preferably 0.5 dB in the embodiment
  • the third operating parameter is adjusted at the second preset interval until the fourth operating parameter is less than 70%, and the target fourth operating parameter corresponds to
  • the third operating parameter value is determined by the last two adjusted operating parameter values, and is typically determined by the value obtained by determining the last two adjusted operating parameter values.
  • test method of this embodiment is detailed in the following by taking the relationship between the throughput and the power as an example. instruction of:
  • the processing center 22 controls the tester 21 to emit two LTE signals as test signals, the test signals are processed by radio frequency and sent to the test probe 12 through the RF line;
  • the processing center 22 controls the bearing platform 11 to rotate and switches the probe polarization, and the device under test 3 receives the test signal in multiple directions within a 360° spherical range, thereby forming an ideal RF environment model, and acquiring the device under test 3 After the test signals in different directions, the direction information of the device under test 3 is tested by using the reporting function of the device under test 3;
  • the processing center 22 receives the dual carrier signal sent by the device under test 3, and performs baseband processing such as frequency conversion and demodulation to obtain relevant demodulation parameters, such as bit error rate and data rate;
  • the processing center 22 obtains the radiation performance data under the arbitrary combination direction model in the range of 3360° of the device under test, and calculates the relationship between the throughput and the power of the device under test 3 in the real working environment.
  • test frame value is adjusted to 1/4f, starting from a larger fixed power value, which may be the above empirical value, such as -85dB, adjusting the power value once every interval of 1dB, and testing the corresponding throughput.
  • the power values corresponding to the throughputs close to 95%, 90%, and 70%, respectively, can be recorded as P1, P2, and P3; wherein, P1, P2, and P3 respectively satisfy the following conditions: (test power P1-throughput 95% theoretical power) / throughput of 95% of theoretical power ⁇ 4.28%, (test power P2 - throughput of 90% of theoretical power) / throughput of 90% of theoretical power ⁇ 5.64%, (test power P3-throughput is 70% theoretical power) / throughput is 70% theoretical power ⁇ 14.52%;
  • the throughput is 95% corresponding to the power: adjust from the test power P1, when the test throughput is greater than 98%, the power is reduced by 2dB for each adjustment; when the test throughput is greater than 96% and less than 98%, each adjustment is made.
  • the power is reduced by 1dB; when the test throughput is less than 96%, the power is reduced by 0.5dB for each adjustment; the throughput is tested once every time the power value is adjusted until the test throughput is less than 95%; according to the last two adjusted power values, The corresponding power when the throughput is 95%;
  • the throughput is 95% corresponding to the power: adjust from the test power P2, when the test throughput is greater than 92%, the power is reduced by 1dB for each adjustment; when the test throughput is less than 92%, the power is reduced by 0.5dB for each adjustment. Test the throughput once every time the power value is adjusted until the test throughput is less than 90%; according to the last two adjusted power values, calculate the corresponding power when the throughput is 90%;
  • the power is 70% corresponding to the power: from the test power P3, when the test throughput is greater than 85%, the power is reduced by 1dB for each adjustment; when the test throughput is less than 85%, the power is reduced by 0.5dB for each adjustment. Test the throughput once every time the power value is adjusted until the test throughput is less than 70%; according to the last two adjusted power values, calculate the corresponding power when the throughput is 70%;
  • the test speed can be improved; at the same time, the smaller the interval adjusted when the target throughput is closer, the power adjustment times can be further reduced, and the test speed can be further improved.
  • the disclosed device can be implemented in other manners.
  • the device embodiments described above are merely illustrative.
  • the division of the above units is only a logical function division.
  • multiple units or components may be combined or integrated. Go to another system, or some features can be ignored or not executed.
  • the coupling or communication connections between the various components shown or discussed may be indirect coupling or communication connections between the devices or units, and may be in the form of telecommunications or otherwise.
  • the units described above as separate components may or may not be physically separate, and the components displayed as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of the embodiment.

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Abstract

本发明实施例通过提供一种天线辐射性能的测试方法和测试系统，其中，天线辐射性能的测试方法包括：在预定工作参数条件下，以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，所述第一策略为从第一初始值以第一预设间隔变化，并得到第二初始值；在所述预定工作参数条件下，以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，所述第二策略为从所述第二初始值以第二预设间隔变化，所述第二数量大于所述第一数量；在调整第一运行参数时，第一预设间隔可以相对较大，因此可以减少调整的次数，提高了测试速度。

Description

天线辐射性能的测试方法和测试系统 技术领域
本发明涉及天线测试技术领域，更具体地说，它涉及一种天线辐射性能的测试方法和测试系统。
背景技术
目前，标准的OTA测试系统是SISO(Single Input Single Output，单输入/单输出)，如主流的2G、3G和WLAN的802.11a/b/g等设备，其主要的测试指标是总辐射功率(Total Radioated Power，TRP)和总全向灵敏度(Total Isotropic Sensitivity，TIS)，现代无线技术如LTE、HSPA+、WI-FI和WiMAX为了提高数据传输速度，都开始采用MIMO(Multiple-Input Multiple-Output，多输入/多输出)技术。MIMO技术利用空时复用的方式提高了频谱分配的信道容量，智能地根据信道环境优化通信系统的性能，提高了无线传输的可靠性及无线通信系统的频谱效率，是面向未来的关键技术，随着MIMO技术的不断发展和应用，对MIMO设备的辐射吞吐量的测试的完整性要求也日趋严格。
两步法测试技术提供了一种低成本的MIMO OTA测试方案。基于LTE技术的MIMO两步法是先获取终端的方向图，再将方向图数据导入到基带信道仿真器中模型模拟真实环境，然后对被测器件(Device under test，DUT)，例如手机等，进行吞吐量测试，同时利用UXM仪器实现两路LTE信号发射，进而实现两路I/O的MIMO测试，从而能甄别出支持MIMO技术的DUT的性能。然而在实际测试吞吐量的过程中，一般会从一个比较大的功率值开始测试，每下降一个固定值测试一次吞吐量，而实际上吞吐量测试曲线在初始阶段有一段较长的平缓区间，目标数据主要集中于平缓区间后的快速变化区间，从而造成该测试方法在吞吐量变化的平缓区间浪费了大量的测试时间，测试效率较低。
发明内容
针对现有技术存在的不足，本发明实施例的目的在于提供一种天线辐射性能的测试方法和测试系统，旨在解决现有的吞吐量测试方法耗时长、效率低的问题。
第一方面，本发明实施例涉及一种天线辐射性能的测试方法，包括：
在预定工作参数条件下，以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，所述第一策略为从第一初始值以第一预设间隔变化；
根据各所述第二运行参数与各所述第一运行参数的对应关系，得到与目标第二运行参数对应 的所述第一运行参数作为第二初始值；
在所述预定工作参数条件下，以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，所述第二策略为从所述第二初始值以第二预设间隔变化，所述第二数量大于所述第一数量；
根据各第四运行参数与各第三运行参数的对应关系，得到与所述目标第四运行参数对应的所述第三运行参数；
所述第一运行参数、所述第二运行参数、所述第三运行参数和所述第四运行参数用于衡量被测器件的辐射性能，所述第一运行参数和所述第三运行参数为功率或信扰比，所述第二运行参数和所述第四运行参数为吞吐量。
实现上述技术方案，通过吞吐量与功率关系或者吞吐量与信扰比的关系来反映被测器件的辐射性能，在测试时先从第一初始值开始调整第一运行参数，先得到一个接近目标第二运行参数的预估值作为第二初始值，再从第二初始值开始调整第三运行参数，进而得到精确的与目标第四运行参数相对应的第三运行参数，在调整第一运行参数时，第一预设间隔可以相对较大，因此可以减少第一运行参数和第三运行参数调整的次数，从而大大提高了测试速度，同时由于第二数量大于第一数量，由于在数量较小的测试帧条件下测试速度更快，进一步减少了第一运行参数调整的次数，从而进一步提高了测试速度。
结合第一方面，在第一种可能实现的方式中，所述第一预设间隔按照第三策略变化或者不变，当所述第一预设间隔按照第三策略变化时，所述第三策略为根据与目标第二运行参数的接近程度降低所述第一预设间隔值；
所述第二预设间隔按照第四策略变化或者不变，当所述第二预设间隔按照第四策略变化时，所述第四策略为根据与目标第四运行参数的接近程度降低所述第二预设间隔值。
实现上述技术方案，在越接近目标第二运行参数时将第一预设间隔调整的越低，一方面，在靠前的测试阶段可以保持较快的调整速率，使第一运行参数调整的更快，调整次数少，以达到提高测试速度的目的；另一方面，在靠后的测试阶段较低调整速率可以使得测试数据更加精确，提高第二初始值的准确性；同样的，在越接近目标第四运行参数时将第二预设间隔调整的越低，一方面，在靠前的测试阶段可以保持较快的调整速率，使第三运行参数调整的更快，调整次数少，以达到提高测试速度的目的；另一方面，在靠后的测试阶段较低调整速率可以使得测试数据更加精确，提高得到的与目标第四运行参数对应的第三运行参数的准确性。
结合第一方面第一种可能实现的方式，在第二种可能实现的方式中，所述目标第二 运行参数与目标第一运行参数对应，与目标第二运行参数对应的第一运行参数满足如下条件：所述第一运行参数与所述目标第一运行参数的偏差率小于预定阈值。
实现上述技术方案，可以使得到的第二初始值更加接近目标第二运行参数。
结合第一方面第二种可能实现的方式，在第三种可能实现的方式中，所述第一数量可以为第二数量的1/2到1/4之间。
实现上述技术方案，使得在第一数量的测试帧下得到第二初始值的过程更加快速，同时也使得到的第二初始值与第二数量的测试帧下的目标第四运行参数更加接近。
结合第一方面第二种可能实现的方式，在第四种可能实现的方式中，所述目标第四运行参数可以为95％、90％或70％，所述目标第四运行参数为95％时，若实际测得的所述第四运行参数大于98％，所述第二预设间隔为1.5-2.5dB，若实际测得的所述第四运行参数小于98％且大于96％，所述第二预设间隔为1-1.5dB,若实际测得的所述第四运行参数小于96％，所述第二预设间隔为0.5-1dB；
所述目标第四运行参数为90％时，若实际测得的所述第四运行参数大于92％，所述第二预设间隔为1-1.5dB,若实际测得的所述第四运行参数小于92％，所述第二预设间隔为0.5-1dB；
所述目标第四运行参数为70％时，若实际测得的所述第四运行参数大于85％，所述第二预设间隔为1-1.5dB,若实际测得的所述第四运行参数小于85％，所述第二预设间隔为0.5-1dB。
实现上述技术方案，通过分阶段采用不同的第二预设间隔，实现减少参数调整的次数、提高测试速度，同时也使得测结果更加精确。
结合第一方面第四种可能实现的方式，在第五种可能实现的方式中，所述目标第四运行参数为95％时，以所述第二预设间隔调整所述第三运行参数直至所述第四运行参数小于95％，所述目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定；
所述目标第四运行参数为90％时，以所述第二预设间隔调整所述第三运行参数直至所述第四运行参数小于90％，所述目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定；
所述目标第四运行参数为70％时，以所述第二预设间隔调整所述第三运行参数直至所述第四运行参数小于70％，所述目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定。
实现上述技术方案，通过最后两次所调整的第三运行参数确定最终的结果，进一步提高了测试结果的精确性。
结合第一方面第二种可能实现的方式，在第六种可能实现的方式中，所述目标第二运行参数可以为95％、90％或70％，当所述目标第二运行参数为95％时，所述预定阈值的取值范围为3.3％-5.3％；当所述目标第二运行参数为90％时，所述预定阈值的取值范围为4.64％-6.64％；当所述目标第二运行参数为70％时，所述预定阈值的取值范围为13.52％-15.52％。
实现上述技术方案，使得得到的第二初始值更加精确。
结合第一方面，在第七种可能实现的方式中，所述第一初始值为一经验值，所述经验值根据第一运行参数与第二运行参数对应关系中满足变化率要求的点来确定。
实现上述技术方案，将第一初始值尽可能的调整至符合变化率要求的点，从而进一步缩短测试时间，提高测试效率。
结合第一方面，在第八种可能实现的方式中，所述预定工作参数通过如下步骤获得：
被测器件获得测试信号后由测试系统处理得到被测器件的方向图信息；以及，
根据所述方向图信息得到与被测器件对应的相关解调参数和辐射性能数据，所述预定工作参数由所述相关解调参数和所述辐射性能数据确定。
实现上述技术方案，可以得到预定工作参数，实现辐射性能的测试。
第二方面，本发明实施例涉及一种天线辐射性能的测试系统，包括：
测试子系统，用于与被测器件通信；以及，控制子系统；
在预定工作参数条件下，所述控制子系统控制所述测试子系统以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，所述第一策略为从第一初始值以第一预设间隔变化；
根据各所述第二运行参数与各所述第一运行参数的对应关系，得到与目标第二运行参数对应的所述第一运行参数作为第二初始值；
在所述预定工作参数条件下，所述控制子系统控制所述测试以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，所述第二策略为从所述第二初始值以第二预设间隔变化，所述第二数量大于所述第一数量；
根据各第四运行参数与各第三运行参数的对应关系，得到与所述目标第四运行参数对应的所述第三运行参数；
所述第一运行参数、所述第二运行参数、所述第三运行参数和所述第四运行参数用于衡量被测器件的辐射性能，所述第一运行参数和所述第三运行参数为功率或信扰比，所述第二运行参数和所述第四运行参数为吞吐量。
实现上述技术方案，通过吞吐量与功率关系或者吞吐量与信扰比的关系来反映被测器件的辐射性能，在测试时先从第一初始值开始调整第一运行参数，先得到一个接近目标第二运行参数的预估值作为第二初始值，再从第二初始值开始调整第三运行参数，进而得到精确的与目标第四运行参数相对应的第三运行参数，在调整第一运行参数时，第一预设间隔可以相对较大，因此可以减少第一运行参数和第三运行参数调整的次数，从而大大提高了测试速度，同时由于第二数量大于第一数量，由于在数量较小的测试帧条件下测试速度更快，进一步减少了第一运行参数调整的次数，从而进一步提高了测试速度。
结合第二方面，在第一种可能实现的方式中，所述测试子系统包括：
可旋转的承载平台，用于放置和固定被测器件；以及，
测试探头，用于与所述被测器件通信以获得所述被测器件的方向图信息；
所述控制子系统包括：
与测试探头相连的测试仪，用于发射下行测试信号，并获得被测器件的方向图信息；以及，处理中心，与所述测试探头和所述测试仪相连，用于根据获得的所述方向图信息得到与被测器件对应的相关解调参数和辐射性能数据以确定所述预定工作参数。
实现上述技术方案，可以得到预定工作参数，实现辐射性能的测试。
综上所述，本发明具有以下有益效果：
本发明实施例通过提供一种天线辐射性能的测试方法和测试系统，其中，天线辐射性能的测试方法，包括：在预定工作参数条件下，以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，所述第一策略为从第一初始值以第一预设间隔变化；根据各所述第二运行参数与各所述第一运行参数的对应关系，得到与目标第二运行参数对应的所述第一运行参数作为第二初始值；在所述预定工作参数条件下，以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，所述第二策略为从所述第二初始值以第二预设间隔变化，所述第二数量大于所述第一数量；根据各第四运行参数与各第三运行参数的对应关系，得到与所述目标第四运行参数对应的所述第三运行参数；所述第一运行参数、所述第二运行参数、所述第三运行参数和所述第四运行参数用于衡量被测器件的辐射性能，所述第一运行参数和所述第三运行参数为功率或信扰比，所述第二运行参数和所述第四运行参数为吞吐量；
通过吞吐量与功率关系或者吞吐量与信扰比的关系来反映被测器件的辐射性能，在测试时先从第一初始值开始调整第一运行参数，先得到一个接近目标第二运行参数的预估值作为第二初始值，再从第二初始值开始调整第三运行参数，进而得到精确的与目标第四运行参数相对应的第三运行参数，在调整第一运行参数时，第一预设间隔可以相对较大，因此可以减少第一运行参数和第三运行参数调整的次数，从而大大提高了测试速度，同时由于第二数量大于第一数量，由于在数量较小的测试帧条件下测试速度更快，进一步减少了第一运行参数调整的次数，从而进一步提高了测试速度。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为本发明实施例中测试系统的结构示意图；
图2为本发明实施例中测试方法的流程图；
图3为本发明实施例中具体的测试方法的流程图。
图中：1、测试子系统；11、承载平台；12、测试探头；2、控制子系统；21、测试仪；22、处理中心；3、被测器件。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分实施例，而不是全部实施例。基于本发明中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
一种天线辐射测试系统，如图1所示，包括：测试子系统1，用于与被测器件3通信；以及，控制子系统2；在预定工作参数条件下，控制子系统2控制测试子系统1以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，第一策略为从第一初始值以第一预设间隔变化；根据各第二运行参数与各第一运行参数的对应关系，得到与目标第二运行参数对应的第一运行参数作为第二初始值；在预定工作参数条件下，控制子系统2控制测试以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，第二策略为从第二初始值以第二预设间隔变化，第二数量大于所述第一数量，通常第一数量可以为第二数量的 1/2到1/4之间，本实施例中第一数量可以为第二数量的1/4；根据各第四运行参数与各第三运行参数的对应关系，得到与目标第四运行参数对应的所述第三运行参数；第一运行参数、第二运行参数、第三运行参数和第四运行参数用于衡量被测器件3的辐射性能，第一运行参数和第三运行参数为功率或信扰比，第二运行参数和第四运行参数为吞吐量。
具体的，测试子系统1包括：可旋转的承载平台11，用于放置和固定被测器件3；以及，测试探头12，用于与被测器件3通信以获得被测器件3的方向图信息；控制子系统2包括：与测试探头12相连的测试仪21，用于发射下行测试信号，并获得被测器件3的方向图信息；以及，处理中心22，与测试探头12和测试仪21相连，用于根据获得的方向图信息得到与被测器件3对应的相关解调参数和辐射性能数据以确定预定工作参数。
被测器件3为具有电磁辐射性能的设备，常见的有：手机、平板电脑、笔记本电脑、掌上电脑、可穿戴设备等。
承载平台11可进行360°的旋转，从而可实现被测器件3整个球面的辐射性能，其具体结构为与现有的承载平台11相同，在此不作赘述。
测试探头12通常设置有多个，并布设在一测试环上，在该测试环上呈圆周阵列分布，被测器件3置于承载平台11上时其物理中心与测试环的中心大致重合。
测试仪21一般选用UXM测试仪21，其可以发射两路LTE信号作为测试信号。
处理中心22采用处理器或电脑及其中内置的处理软件实现，用于控制数据传输并进行数据处理，处理软件与现有的处理软件相同，在此不作赘述。
预定工作参数有测试系统获得，其获得步骤如下：
被测器件3获得有测试仪21发出的测试信号后由测试系统处理得到被测器件3的方向图信息；以及，根据方向图信息得到与被测器件3对应的相关解调参数和辐射性能数据，预定工作参数由相关解调参数和辐射性能数据确定。
相应的，如图2所示，本实施例还提供一种天线辐射性能测试方法，包括：
101，在预定工作参数条件下，以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，第一策略为从第一初始值以第一预设间隔变化；
102，根据各第二运行参数与各第一运行参数的对应关系，得到与目标第二运行参数对应的第一运行参数作为第二初始值；
103，在预定工作参数条件下，以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，第二策略为从第二初始值以第二预 设间隔变化，第二数量大于所述第一数量；
104，根据各第四运行参数与各第三运行参数的对应关系，得到与所述目标第四运行参数对应的所述第三运行参数；
第一运行参数、第二运行参数、第三运行参数和第四运行参数用于衡量被测器件3的辐射性能，第一运行参数和第三运行参数为功率或信扰比，第二运行参数和第四运行参数为吞吐量，第一运行参数与第二运行参数相对应，第三运行参数与第四运行参数相对应，吞吐量可以是实际吞吐量，也可以是实际吞吐量与理论吞吐量的比值，本实施例中所说的吞吐量为实际吞吐量和理论吞吐量的比值。
通过吞吐量与功率关系或者吞吐量与信扰比的关系来反映被测器件3的辐射性能，在测试时先从第一初始值开始调整第一运行参数，先得到一个接近目标第二运行参数的预估值作为第二初始值，再从第二初始值开始调整第三运行参数，进而得到精确的与目标第四运行参数相对应的第三运行参数，在调整第一运行参数时，第一预设间隔可以相对较大，因此可以减少第一运行参数和第三运行参数调整的次数，从而大大提高了测试速度，同时由于第二数量大于第一数量，由于在数量较小的测试帧条件下测试速度更快，进一步减少了第一运行参数调整的次数，从而进一步提高了测试速度。
具体的，第一初始值为一经验值，该经验值根据第一运行参数与第二运行参数对应关系中满足变化率要求的点来确定，通常，由第一运行参数和第二运行参数形成的测试曲线图在初始阶段为较长一段的平缓曲线，变化率较小，当第一运行参数调整至某一数值后，测试曲线图会急剧变化，变化率较高，而最终所要获得的目标数据通常集中在急剧变化的曲线段，因此将第一初始测试参数选定在接近这一变化节点的数值处，从而可以省去前期大量用来测试平缓区间的时间，提高测试速度和测试效率。
第一预设间隔按照第三策略变化或者不变，当第一预设间隔按照第三策略变化时，第三策略为根据与目标第二运行参数的接近程度降低第一预设间隔值；第二预设间隔按照第四策略变化或者不变，当第二预设间隔按照第四策略变化时，第四策略为根据与目标第四运行参数的接近程度降低第二预设间隔值；在越接近目标第二运行参数时将第一预设间隔调整的越低，一方面，在靠前的测试阶段可以保持较快的调整速率，使第一运行参数调整的更快，调整次数少，以达到提高测试速度的目的；另一方面，在靠后的测试阶段较低调整速率可以使得测试数据更加精确，提高第二初始值的准确性；同样的，在越接近目标第四运行参数时将第二预设间隔调整的越低，一方面，在靠前的测试阶段可以保持较快的调整速率，使第三运行参数调整的更快，调整次数少，以达到提高测试速度的目的；另一方面，在靠后的 测试阶段较低调整速率可以使得测试数据更加精确，提高得到的与目标第四运行参数对应的第三运行参数的准确性。
目标第二运行参数与目标第一运行参数对应，与目标第二运行参数对应的第一运行参数满足如下条件：第一运行参数与目标第一运行参数的偏差率小于预定阈值，第一运行参数与目标第一运行参数的偏差率为(第一运行参数-目标第一运行参数)/目标第一运行参数。
具体的，目标第二运行参数可以为95％、90％或70％，当目标第二运行参数为95％时，预定阈值的取值范围为3.3％-5.3％，本实施例中选用4.3％；当目标第二运行参数为90％时，预定阈值的取值范围为4.64％-6.64％，本实施例中选用5.64％；当目标第二运行参数为70％时，预定阈值的取值范围为13.52％-15.52％，本实施例中选用14.52％；在调整第一运行参数时，当得到的第二运行参数刚好小于预定阈值时，则该点对应的第一运行参数即作为第二初始值。
目标第四运行参数可以为95％、90％或70％，目标第四运行参数为95％时，若实际测得的第四运行参数大于98％，第二预设间隔为1.5-2.5dB，本实施例优选2dB，若实际测得的第四运行参数小于98％且大于96％，第二预设间隔为1-1.5dB,本实施例优选1dB，若实际测得的所述第四运行参数小于96％，第二预设间隔为0.5-1dB，本实施例优选0.5dB；测试时，以第二预设间隔调整第三运行参数直至第四运行参数小于95％，目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定，通常由求取最后两次所调整的第三运行参数值得到的数值确定；
目标第四运行参数为90％时，若实际测得的第四运行参数大于92％，第二预设间隔为1-1.5dB,本实施例优选1dB，若实际测得的第四运行参数小于92％，第二预设间隔为0.5-1dB，本实施例优选0.5dB；测试时，以第二预设间隔调整第三运行参数直至第四运行参数小于90％，目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定，通常由求取最后两次所调整的第三运行参数值得到的数值确定；
目标第四运行参数为70％时，若实际测得的第四运行参数大于85％，第二预设间隔为1-1.5dB,本实施例优选1dB，若实际测得的第四运行参数小于85％，第二预设间隔为0.5-1dB，本实施例优选0.5dB；测试时，以第二预设间隔调整第三运行参数直至第四运行参数小于70％，目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定，通常由求取最后两次所调整的第三运行参数值得到的数值确定。
如图3所示，下面以吞吐量和功率的变化关系为例对本实施例的测试方法进行详细 的说明：
201，处理中心22控制测试仪21发射作为测试信号的两路LTE信号，测试信号经过射频处理后通过RF线发送至测试探头12；
202，处理中心22控制承载平台11转动并切换探头极化，被测器件3在360°球面范围内的多个方向上接收测试信号，从而形成理想的射频环境模型，在获取到被测器件3不同方向的测试信号后，利用被测器件3的上报功能测试出被测器件3的方向图信息；
203，将获得的方向图信息导入到测试仪21的信号仿真器预设的信道模型中，模拟出包含被测器件3辐射特性的无线信道，再将测试仪21的基站仿真器输出的下行信号与加载了被测器件3方向图信息的无线信道所对应的参数进行卷积，形成双载波信号通过被测器件3发射出；
204，处理中心22接收到被测器件3发出的双载波信号，对其进行变频、解调等基带处理，得出相关解调参数，如误码率、数据速率等；
205，处理中心22获得被测器件3360°范围内任意组合方向模型下的辐射性能数据，并计算得到被测器件3在真实工作环境下吞吐量与功率的变化关系。
其中，计算得到被测器件3在真实工作环境下吞吐量与功率的变化关系时，需获得在测试帧数为f的条件下，吞吐量为95％、90％和70％时所对应的功率值，具体测试过程为：
先将测试帧值调整为1/4f，从一较大的固定功率值开始，该功率值可以是上述的经验值，如-85dB，每间隔1dB调整一次功率值，并测试出对应的吞吐量，得到吞吐量分别接近95％、90％和70％时所对应的功率值，即可记为P1、P2和P3；其中，P1、P2和P3分别满足如下条件：(测试功率P1-吞吐量为95％的理论功率)/吞吐量为95％的理论功率<4.28％，(测试功率P2-吞吐量为90％的理论功率)/吞吐量为90％的理论功率<5.64％，(测试功率P3-吞吐量为70％的理论功率)/吞吐量为70％的理论功率<14.52％；
再将测试帧值调整为f，从P1、P2和P3开始调整，并测试出各调整的功率对应的吞吐量值；
获得吞吐量为95％对应的功率时：从测试功率P1开始调整，当测试吞吐量大于98％时，每调整一次功率降低2dB；当测试吞吐量大于96％且小于98％时，每调整一次功率降低1dB；当测试吞吐量小于96％时,每调整一次功率降低0.5dB；每调整一次功率值测试一次吞吐量，直至测试吞吐量小于95％；根据最后两次的调整的功率值，计算出吞吐量为95％时对应的功率；
获得吞吐量为95％对应的功率时：从测试功率P2开始调整，当测试吞吐量大于92％时，每调整一次功率降低1dB；当测试吞吐量小于92％时,每调整一次功率降低0.5dB；每调整一次功率值测试一次吞吐量，直至测试吞吐量小于90％；根据最后两次的调整的功率值，计算出吞吐量为90％时对应的功率；
获得吞吐量为70％对应的功率时：从测试功率P3开始调整，当测试吞吐量大于85％时，每调整一次功率降低1dB；当测试吞吐量小于85％时,每调整一次功率降低0.5dB；每调整一次功率值测试一次吞吐量，直至测试吞吐量小于70％；根据最后两次的调整的功率值，计算出吞吐量为70％时对应的功率；
最后再根据得到的每组吞吐量和功率值形成吞吐量和功率变化曲线图。
通过上述的测试过程，采用测试帧设为1/4f时的功率值估算出待测吞吐量对应功率的大致范围，可以减少功率调整次数，并且由于测试帧数较小情况下测试速度更快，从而可以提高测试速度；同时在越接近目标吞吐量时调整的间隔越小，可以进一步减少功率调整次数，进一步提高测试速度。
在上述实施例中，对各个实施例的描述各有侧重，某个实施例中没有详述的部分，可以参见其他实施例的相关描述。
需要说明的是，对于前述的各方法实施例，为了简单描述，故将其都表述为一系列的动作组合，但是本领域技术人员应该知悉，本发明并不受所描述的动作顺序的限制，因为依据本发明，某些步骤可能采用其他顺序或者同时进行。其次，本领域技术人员也应该知悉，说明书中所描述的实施例均属于优选实施例，所述涉及的动作和模块并不一定是本发明所必须的。
本申请所提供的几个实施例中，应该理解到，所揭露的装置，可通过其他的方式实现。例如，以上所描述的装置实施例仅仅是示意性的，例如上述单元的划分，仅仅为一种逻辑功能划分，实际实现时可以有另外的划分方式，例如多个单元或组件可以结合或者可以集成到另一个系统，或一些特征可以忽略，或不执行。另一点，所显示或讨论的相互之间的耦合或通信连接可以是通过一些接口，装置或单元之间的间接耦合或通信连接，可以是电信或者其它的形式。
上述作为分离部件说明的单元可以是或者也可以不是物理上分开的，作为单元显示的部件可以是或者也可以不是物理单元，即可以位于一个地方，或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部单元来实现本实施例方案的目的。
以上所述，以上实施例仅用以说明本发明的技术方案，而并非对其限制；尽管参照 前述实施例对本发明进行详细的说明，本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。

Claims (10)

  1. 一种天线辐射性能的测试方法，其特征在于，包括：
    在预定工作参数条件下，以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，所述第一策略为从第一初始值以第一预设间隔变化；
    根据各所述第二运行参数与各所述第一运行参数的对应关系，得到与目标第二运行参数对应的所述第一运行参数作为第二初始值；
    在所述预定工作参数条件下，以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，所述第二策略为从所述第二初始值以第二预设间隔变化，所述第二数量大于所述第一数量；
    根据各第四运行参数与各第三运行参数的对应关系，得到与所述目标第四运行参数对应的所述第三运行参数；
    所述第一运行参数、所述第二运行参数、所述第三运行参数和所述第四运行参数用于衡量被测器件(3)的辐射性能，所述第一运行参数和所述第三运行参数为功率或信扰比，所述第二运行参数和所述第四运行参数为吞吐量。
  2. 根据权利要求1所述的天线辐射性能的测试方法，其特征在于，所述第一预设间隔按照第三策略变化或者不变，当所述第一预设间隔按照第三策略变化时，所述第三策略为根据与目标第二运行参数的接近程度降低所述第一预设间隔值；
    所述第二预设间隔按照第四策略变化或者不变，当所述第二预设间隔按照第四策略变化时，所述第四策略为根据与目标第四运行参数的接近程度降低所述第二预设间隔值。
  3. 根据权利要求2所述的天线辐射性能的测试方法，其特征在于，所述目标第二运行参数与目标第一运行参数对应，与目标第二运行参数对应的第一运行参数满足如下条件：所述第一运行参数与所述目标第一运行参数的偏差率小于预定阈值。
  4. 根据权利要求3所述的天线辐射性能的测试方法，其特征在于，所述第一数量可以为第二数量的1/2到1/4之间。
  5. 根据权利要求3所述的天线辐射性能的测试方法，其特征在于，所述目标第四运行参数可以为95％、90％或70％，所述目标第四运行参数为95％时，若实际测得的所述第四运行参数大于98％，所述第二预设间隔为1.5-2.5dB，若实际测得的所述第四运行参数小于98％且大于96％，所述第二预设间隔为1-1.5dB,若实际测得的所述第四运行参数小于96％，所述第二预设间隔为0.5-1dB；
    所述目标第四运行参数为90％时，若实际测得的所述第四运行参数大于92％，所述第二预 设间隔为1-1.5dB,若实际测得的所述第四运行参数小于92％，所述第二预设间隔为0.5-1dB；
    所述目标第四运行参数为70％时，若实际测得的所述第四运行参数大于85％，所述第二预设间隔为1-1.5dB,若实际测得的所述第四运行参数小于85％，所述第二预设间隔为0.5-1dB。
  6. 根据权利要求5所述的天线辐射性能的测试方法，其特征在于，所述目标第四运行参数为95％时，以所述第二预设间隔调整所述第三运行参数直至所述第四运行参数小于95％，所述目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定；
    所述目标第四运行参数为90％时，以所述第二预设间隔调整所述第三运行参数直至所述第四运行参数小于90％，所述目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定；
    所述目标第四运行参数为70％时，以所述第二预设间隔调整所述第三运行参数直至所述第四运行参数小于70％，所述目标第四运行参数对应的第三运行参数值由最后两次所调整的第三运行参数值确定。
  7. 根据权利要求3所述的天线辐射性能的测试方法，其特征在于，所述目标第二运行参数可以为95％、90％或70％，当所述目标第二运行参数为95％时，所述预定阈值的取值范围为3.3％-5.3％；当所述目标第二运行参数为90％时，所述预定阈值的取值范围为4.64％-6.64％；当所述目标第二运行参数为70％时，所述预定阈值的取值范围为13.52％-15.52％。
  8. 根据权利要求1所述的天线辐射性能的测试方法，其特征在于，所述第一初始值为一经验值，所述经验值根据第一运行参数与第二运行参数对应关系中满足变化率要求的点来确定；或者，
    所述预定工作参数通过如下步骤获得：
    被测器件(3)获得测试信号后由测试系统处理得到被测器件(3)的方向图信息；以及，
    根据所述方向图信息得到与被测器件(3)对应的相关解调参数和辐射性能数据，所述预定工作参数由所述相关解调参数和所述辐射性能数据确定。
  9. 一种天线辐射性能的测试系统，其特征在于，包括：
    测试子系统(1)，用于与被测器件(3)通信；以及，控制子系统(2)；
    在预定工作参数条件下，所述控制子系统(2)控制所述测试子系统(1)以按照预设的第一策略变化的第一运行参数传输第一数量的测试帧，测定每一第一运行参数所对应的第二运行参数，所述第一策略为从第一初始值以第一预设间隔变化；
    根据各所述第二运行参数与各所述第一运行参数的对应关系，得到与目标第二运行参数对应的所述第一运行参数作为第二初始值；
    在所述预定工作参数条件下，所述控制子系统(2)控制所述测试以按照预设的第二策略变化的第三运行参数传输第二数量的测试帧，测定每一第三运行参数所对应的第四运行参数，所述第二策略为从所述第二初始值以第二预设间隔变化，所述第二数量大于所述第一数量；根据各第四运行参数与各第三运行参数的对应关系，得到与所述目标第四运行参数对应的所述第三运行参数；
    所述第一运行参数、所述第二运行参数、所述第三运行参数和所述第四运行参数用于衡量被测器件(3)的辐射性能，所述第一运行参数和所述第三运行参数为功率或信扰比，所述第二运行参数和所述第四运行参数为吞吐量。
  10. 根据权利要求9所述的天线辐射性能的测试系统，其特征在于，所述测试子系统(1)包括：
    可旋转的承载平台(11)，用于放置和固定被测器件(3)；以及，
    测试探头(12)，用于与所述被测器件(3)通信以获得所述被测器件(3)的方向图信息；
    所述控制子系统(2)包括：
    与测试探头(12)相连的测试仪(21)，用于发射下行测试信号，并获得被测器件(3)的方向图信息；以及，
    处理中心(22)，与所述测试探头(12)和所述测试仪(21)相连，用于根据获得的所述方向图信息得到与被测器件(3)对应的相关解调参数和辐射性能数据以确定所述预定工作参数。
PCT/CN2017/115970 2017-09-19 2017-12-13 天线辐射性能的测试方法和测试系统 WO2019056596A1 (zh)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103336181A (zh) * 2013-05-28 2013-10-02 惠州Tcl移动通信有限公司 一种gps ota测试方法及系统
WO2014176846A1 (zh) * 2013-05-02 2014-11-06 惠州Tcl移动通信有限公司 一种终端天线总辐射功率的快速测试方法
CN104283624A (zh) * 2014-10-02 2015-01-14 工业和信息化部电信研究院 一种基于信道仿真器的多探头mimo-ota测试系统下行信号相位校准方法
CN104902504A (zh) * 2015-06-08 2015-09-09 北京邮电大学 一种多天线移动终端的吞吐量的测试系统及测试方法

Family Cites Families (3)

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KR20130062764A (ko) * 2011-12-05 2013-06-13 엘지전자 주식회사 이동 단말기의 ｍｉｍ ｏ ｏｔａ 성능 측정 시스템 및 그 방법
CN103856272B (zh) * 2012-12-03 2017-09-05 深圳市通用测试系统有限公司 Mimo无线终端的无线性能测试方法
CN105764087A (zh) * 2014-12-15 2016-07-13 中国移动通信集团公司 终端性能测试方法及测试系统

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014176846A1 (zh) * 2013-05-02 2014-11-06 惠州Tcl移动通信有限公司 一种终端天线总辐射功率的快速测试方法
CN103336181A (zh) * 2013-05-28 2013-10-02 惠州Tcl移动通信有限公司 一种gps ota测试方法及系统
CN104283624A (zh) * 2014-10-02 2015-01-14 工业和信息化部电信研究院 一种基于信道仿真器的多探头mimo-ota测试系统下行信号相位校准方法
CN104902504A (zh) * 2015-06-08 2015-09-09 北京邮电大学 一种多天线移动终端的吞吐量的测试系统及测试方法

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