WO2018129893A1 - 一种基于硬件在环设备的测试系统 - Google Patents

一种基于硬件在环设备的测试系统 Download PDF

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Publication number
WO2018129893A1
WO2018129893A1 PCT/CN2017/093113 CN2017093113W WO2018129893A1 WO 2018129893 A1 WO2018129893 A1 WO 2018129893A1 CN 2017093113 W CN2017093113 W CN 2017093113W WO 2018129893 A1 WO2018129893 A1 WO 2018129893A1
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test
panel
hardware
relay
hil
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PCT/CN2017/093113
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English (en)
French (fr)
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戴荣芬
曾超
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宁德时代新能源科技股份有限公司
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Publication of WO2018129893A1 publication Critical patent/WO2018129893A1/zh

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B17/00—Systems involving the use of models or simulators of said systems
    • G05B17/02—Systems involving the use of models or simulators of said systems electric
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring

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  • the present application relates to the field of automation technologies, and in particular, to a test system based on a hardware-in-the-loop device.
  • HIL simulation test has become a very important part of the development process of automotive ECU (Electronic Control Unit).
  • the HIL simulation test equipment is controlled by real-time processor running simulation model.
  • the running state of the object is connected to the measured object through the I/O interface, and all aspects and systematic tests are performed on the measured object, which can effectively reduce the number of real vehicle tests and shorten the development time.
  • ECU-TEST Electronic Control Unit-TEST
  • the test steps of ECU-TEST software mainly include: sequence construction, parameter configuration, signal configuration, hardware environment construction and software environment setting.
  • step descriptive language is converted into a device action to form a test sequence.
  • the device under test performs numerical feedback, and compares the feedback value with the preset parameter value to complete the test.
  • the HIL device is directly connected to a single test object. After the current test object is tested, the test object needs to be manually dragged and replaced before being able to enter the next round of testing, and the test parameters need to be manually modified multiple times. As a result, the entire test system is less automated and wastes human and material resources.
  • the embodiment of the present application provides a test system based on a hardware-in-the-loop device to solve the problem that the prior art needs to manually replace a test object in a multi-project test process.
  • the embodiment of the present application provides a test system based on a hardware-in-the-loop device, which is applied to a test process of multiple test objects, and the system includes:
  • Multi-switching device respectively connecting a plurality of the test objects
  • the hardware-in-the-loop HIL device is communicatively coupled to the multi-way switching device and configured with test parameters corresponding to the respective test objects.
  • the multi-way switching device is an M-way switching device
  • the number of the test objects is N;
  • M and N are integers greater than 1, and M ⁇ N.
  • the multiplexing device includes a power source, a single chip, a relay, a communication interface panel, a signal input panel, and a plug-in panel;
  • the power source is connected to the single chip microcomputer to provide a driving voltage to the single chip microcomputer;
  • the single chip is connected to a relay
  • a communication module is disposed in the communication interface panel, and the communication module is respectively connected with the HIL device and the single chip microcomputer;
  • the signal input panel is connected to a signal input end of the relay, and the signal input panel is configured to forward the signal received from the HIL device to the relay;
  • the plug-in panel is connected to a signal output end of the relay, and the plug-in panel is further connected with a plurality of The test object.
  • an implementation manner is further provided, in which a metal oxide semiconductor field effect crystal MOS transistor as a driving circuit is connected between the I/O port and the relay of the single chip microcomputer.
  • the aspect and any possible implementations described above further provide an implementation in which the I/O port of the microcontroller provides a driving voltage of 12V.
  • any possible implementation manner further provide an implementation manner, wherein the plug-in panel is provided with a connector for connecting a test object, and the signal output end of the relay sends a signal to the test object through the connector. .
  • the multiplexer device has a circuit board placement panel, and the single chip microcomputer, the driving circuit and the relay are all disposed on the circuit board placement panel.
  • the multi-way switching device has an expansion port panel, and the expansion port panel is connected to other multi-way switching devices through an expansion port.
  • the foregoing aspect and any possible implementation manner further provide an implementation manner, where the number of the multiplexing devices is K, where K is an integer greater than 1.
  • the communication module includes a controller area network CAN bus and a universal asynchronous transceiver transceiver UART bus, and the communication module passes through the CAN bus and the UART bus. Establish a communication relationship between the HIL device and the multiplex device.
  • a test system based on a hardware-in-the-loop device provided in the embodiment of the present application is applied to a test process of a multi-test object, the system includes: a multi-way switching device, respectively connecting a plurality of the test objects; and, a HIL device, and The multi-way switching device is connected and configured There are test parameters corresponding to each of the test objects.
  • the present application adds a multi-way switching device between the HIL device and the test object, and the HIL device sends a test signal to the multi-way switching device, and the multi-way switching device divides the test signal into multiple After the road is sent to the current test object, after the current test object is completed, the HIL device can automatically switch the test object for the next round of testing, thereby improving the automation of the entire test system and saving manpower and material resources.
  • FIG. 1 is a schematic structural diagram of a test system provided by an embodiment of the present application.
  • FIG. 2 is a schematic structural diagram of a multi-way switching device according to an embodiment of the present application.
  • FIG. 3 is a schematic diagram of a multiplexer device provided by an embodiment of the present application.
  • the word “if” as used herein may be interpreted as “when” or “when” or “in response to determining” or “in response to detecting.”
  • the phrase “if determined” or “if detected (conditions or events stated)” may be interpreted as “when determined” or “in response to determination” or “when detected (stated condition or event) “Time” or “in response to a test (condition or event stated)”.
  • FIG. 1 is a schematic structural diagram of a test system provided by an embodiment of the present application. As shown, the system includes:
  • the hardware is in a ring HIL device, is in communication with the multi-way switching device, and is configured with test parameters corresponding to each test object.
  • the multiplex device is an M-way switching device
  • the number of test objects is N, where M and N are integers greater than 1, and M ⁇ N. That is to say, the number of test objects connected to the system can be the same as the number of channels of the M-way switching device, or the number of test objects is less than the number of channels of the M-way switching device, that is, the M-way switching device can connect up to M test objects.
  • the test parameters corresponding to the N test objects and the test script program need to be configured in advance in the HIL device, and then the test objects are sequentially tested.
  • N test objects do not necessarily correspond to N test parameters, because the test objects connected by the multiplex device are There may be multiple test objects of the same type and the same type. These test objects often have to perform the same test process. At this time, only one test parameter can be configured in the HIL device to perform synchronous test on the test object.
  • test object mentioned in this embodiment is a BMS (Battery Attery Management System).
  • BMS Battery Attery Management System
  • test object can also be other devices and systems, which does not limit the scope of protection of the present application.
  • FIG. 2 is a schematic structural diagram of a multi-way switching device according to an embodiment of the present application.
  • the multiplexer includes a power supply, a microcontroller, a driver circuit, a relay, a board placement panel, a communication interface panel, a signal input panel, a docking panel, and an expansion panel.
  • the single chip microcomputer, the driving circuit and the relay are all arranged on the board placing panel, the expansion interface is provided with an expansion port, the connection panel is connected with a connector, the communication interface panel is connected with a communication module; the HIL device is connected by the communication module.
  • the road switching device performs communication, and the test signal of the HIL device is sent to the multi-way switching device via the signal input panel, and the multi-way switching device connects the test object through the connector.
  • FIG. 3 is a schematic diagram of a multi-way switching device according to an embodiment of the present application.
  • a power supply is connected to a single-chip microcomputer to provide a driving voltage to the single-chip microcomputer, so that the single-chip microcomputer can drive the relay through the I/O port.
  • the microcontroller is connected to the relay to control and drive the relay.
  • the MCU uses the Freescale chip and the Altera FPGA chip.
  • the function of the Freescale chip is mainly the information processing of the communication process.
  • the function of the FPGA chip of Altera is mainly the calculation of the secretary.
  • a MOS transistor as a driving circuit is connected between the I/O port and the relay of the single chip microcomputer. First, the MOS transistor is driven by the I/O port of the single chip microcomputer, and then the MOS transistor drives the relay with a driving voltage of 12V, and the driving voltage of the relay driving process is driven. Provided by the power supply.
  • test objects connected to the multiplexer there may be multiple tests of the same type and the same model. Test objects, these test objects often have to perform the same test process.
  • the MCU can control the relay to generate multiple signals based on the original signal input by the HIL device to meet the use of multiple test objects, that is, the relay generates a signal path.
  • the number matches the number of object tests that require the same test procedure. Therefore, for a plurality of test objects mentioned above, only one test parameter can be configured in the HIL device for synchronous test, which effectively saves time required for configuration parameters and improves test efficiency.
  • the communication module in the communication interface panel is respectively connected with the HIL device and the single chip microcomputer, wherein the communication module includes a CAN bus and a UART bus, and the multi-way switching device can exchange information with the HIL device through the CAN bus protocol and the UART bus protocol, and simultaneously The communication module can also perform signal transmission with the microcontroller.
  • the signal input panel is connected to the signal input of the relay, and the signal input panel is used to forward the signal received from the HIL device to the relay.
  • the plug-in panel is connected to the signal output of the relay and is connected to a plurality of test objects.
  • the connector panel is provided with a connector, and a plurality of test objects are connected through the connector, the plug-in panel is connected with the signal output end of the relay, and the signal input panel received at the signal input end of the relay is sent by the HIL device. After the original signal is good, a multi-path signal is generated and sent through its signal input to each test object connected to the connector.
  • each of the sub-multiplexing devices includes an expansion port panel, and the sub-multiplexing device can be connected to other sub-multiplexing devices through the expansion port of the expansion port panel. Therefore, the manner of using a single multi-way switching device or the manner in which multiple sub-multiplexing devices are connected according to the production requirement can be selected, thereby further making the number of test objects more flexible.
  • a HIL device requires three test objects to be tested in a certain period of time, and the HIL device is connected to three test objects through a multi-path device.
  • the time period 1 it is necessary to test based on the fault handling of the test object 1.
  • the test is performed based on the SOC (System-on-a-Chip) of the test object 2, and the test object needs to be based on the test object in the time period 3 3 power limits are tested.
  • the HIL device switches different test environments according to the loaded configuration parameters to test different test objects.
  • the HIL device completes the test object switching based on the program script through the ECU-TEST software, and then starts. Test the test of the next test object, so that the problem of manually switching the test object in the prior art can be solved.
  • the HIL device in this embodiment is also called a hardware-in-the-loop simulation test device, and the device runs ECU-TEST automation software, and ECU-TEST is a set test test specification writing, executing, solving, and archiving. Automated test tool.
  • the test program script is pre-written in the HIL device of the embodiment, and the test parameters corresponding to the test objects are configured, that is, the test parameters are in one-to-one correspondence with the test objects.
  • the HIL device After executing the test sequence based on the test parameters, the HIL device compares the feedback value generated by the current test object with the preset parameter value, and then outputs the test result of the current test object, and then based on the corresponding test according to the test sequence of the test program script. The parameters are tested in sequence on the test object, and all test tasks are automatically completed.
  • the HIL device-based test system is applied to a test process of a multi-test object, the system includes: a multi-way switching device, respectively connecting a plurality of the test objects; and, a HIL device, and the Multi-way switching device communication connection, and configured with Test parameters corresponding to each of the test objects.
  • the present application adds a multi-way switching device between the HIL device and the test object, and the HIL device sends a test signal to the multi-way switching device, and the relay of the multi-way switching device divides the test signal into two. After multiple channels are sent to the current test object respectively, after the current test object test is completed, the HIL device can automatically switch the test object for the next round of testing, thereby improving the automation degree of the entire test system and saving manpower and material resources.

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Abstract

一种基于HIL设备的测试系统，包括多路切换设备，分别连接多个所述测试对象；HIL设备，与所述多路切换设备通信连接，并配置有与各所述测试对象对应的测试参数；从而，在针对多测试对象的测试过程时，在HIL设备和测试对象之间接入多路切换设备，在当前测试对象测试完成后，可自动切换测试对象。因此，该技术方案能够有效提升整个测试系统自动化程度，节约人力和物力资源。

Description

一种基于硬件在环设备的测试系统 技术领域
本申请涉及自动化技术领域，尤其涉及一种基于硬件在环设备的测试系统。
背景技术
随着自动化技术领域的日益发展，HIL仿真测试已经成为汽车ECU(Electronic Control Unit，电子控制单元)开发流程中非常重要的一环，HIL仿真测试设备是以实时处理器运行仿真模型来模拟受控对象的运行状态，通过I/O接口与被测对象连接，对被测对象进行全方面的、系统的测试，可以有效减少实车测试的次数，进而缩短开发时间。
目前，通常通过ECU-TEST(Electronic Control Unit-TEST，电子控制单元测试)软件对HIL设备进行状态监测、操作控制、软硬件环境设置和数据记录，其是一种集测试用例规范编写、执行、求解以及归档为一体的自动化测试工具。ECU-TEST软件的测试步骤主要包括：序列搭建、参数配置、信号配置、硬件环境搭建与软件环境设置。首先基于计算机语言和测试用例把步骤描述性语言转化成设备动作以形成测试序列，执行测试序列后，被测设备会进行数值反馈，将反馈的数值与预设参数值进行比较，从而完成测试。
在实现本申请过程中，发明人发现现有技术中至少存在如下问题：
现有技术的测试过程中，HIL设备直接连接单个测试对象，在当前测试对象测试完成后，需手动拖拽测试对象进行更换后才能够进入下一轮测试，同时还需多次手动修改测试参数，导致整个测试系统自动化程度较低，浪费人力物力资源。
申请内容
有鉴于此，本申请实施例提供了一种基于硬件在环设备的测试系统，用以解决现有技术在针对多项目测试过程中需要手动更换测试对象的问题。
一方面，本申请实施例提供了一种基于硬件在环设备的测试系统，应用于多测试对象的测试过程，所述系统包括：
多路切换设备，分别连接多个所述测试对象；
硬件在环HIL设备，与所述多路切换设备通信连接，并配置有与各所述测试对象对应的测试参数。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，
所述多路切换设备为M路切换设备；
所述测试对象的数量为N个；
其中，M和N均为大于1的整数，且M≥N。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述多路切换设备包括电源、单片机、继电器、通信接口面板、信号输入面板和插接面板；
所述电源与单片机相连，以向所述单片机提供驱动电压；
所述单片机与继电器相连接；
所述通信接口面板内设有通信模块，所述通信模块分别与HIL设备以及单片机之间通信连接；
所述信号输入面板与继电器的信号输入端相连接，信号输入面板用于将从HIL设备接收的信号转发至继电器；
所述插接面板与继电器的信号输出端相连，插接面板还连接有多个 所述测试对象。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述单片机的I/O端口和继电器之间接有作为驱动电路的金属氧化物半导体场效应晶体MOS管。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述单片机的I/O端口提供的驱动电压为12V。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述插接面板上设有用于连接测试对象的连接器，继电器的信号输出端通过连接器将信号发送至测试对象。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述多路切换设备具有电路板放置面板，所述单片机、驱动电路和继电器均布设在该电路板放置面板上。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述多路切换设备具有扩展口面板，所述扩展口面板通过扩展端口与其他的多路切换设备进行连接。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述多路切换设备的数量为K个，其中，K为大于1的整数。
如上所述的方面和任一可能的实现方式，进一步提供一种实现方式，所述通信模块包括控制器局域网络CAN总线和通用异步收发传输器UART总线，所述通信模块通过CAN总线与UART总线建立HIL设备与多路切换设备之间的通信关系。
上述技术方案中的一个技术方案具有如下有益效果：
本申请实施例提供的一种基于硬件在环设备的测试系统，应用于多测试对象的测试过程，该系统包括：多路切换设备，分别连接多个所述测试对象；以及，HIL设备，与所述多路切换设备通信连接，并配置 有与各所述测试对象对应的测试参数。与现有技术中的测试系统相比，本申请在HIL设备和测试对象之间增加了多路切换设备，HIL设备向多路切换设备发送测试信号，多路切换设备将该测试信号分为多路后分别发送至当前的测试对象中，在当前测试对象测试完成后，HIL设备可自动切换测试对象进行下一轮测试，从而提升了整个测试系统自动化程度，节约了人力和物力资源。
附图说明
为了更清楚地说明本申请实施例的技术方案，下面将对实施例中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动性的前提下，还可以根据这些附图获得其它的附图。
图1是本申请实施例所提供的测试系统的结构示意图；
图2是本申请实施例所提供的多路切换设备的结构示意图；
图3是本申请实施例所提供的多路切换设备的原理图。
具体实施方式
为了更好的理解本申请的技术方案，下面结合附图对本申请实施例进行详细描述。
应当明确，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其它实施例，都属于本申请保护的范围。
在本申请实施例中使用的术语是仅仅出于描述特定实施例的目的，而非旨在限制本申请。在本申请实施例和所附权利要求书中所使用的 单数形式的“一种”、“所述”和“该”也旨在包括多数形式，除非上下文清楚地表示其他含义。
应当理解，本文中使用的术语“和/或”仅仅是一种描述关联对象的关联关系，表示可以存在三种关系，例如，A和/或B，可以表示：单独存在A，同时存在A和B，单独存在B这三种情况。另外，本文中字符“/”，一般表示前后关联对象是一种“或”的关系。
取决于语境，如在此所使用的词语“如果”可以被解释成为“在……时”或“当……时”或“响应于确定”或“响应于检测”。类似地，取决于语境，短语“如果确定”或“如果检测(陈述的条件或事件)”可以被解释成为“当确定时”或“响应于确定”或“当检测(陈述的条件或事件)时”或“响应于检测(陈述的条件或事件)”。
本申请实施例给出一种基于硬件在环设备的测试系统，请参考图1，其为本申请实施例所提供的测试系统的结构示意图。如图所示，该系统包括：
多路切换设备，分别连接多个测试对象；
硬件在环HIL设备，与多路切换设备通信连接，并配置有与各测试对象对应的测试参数。
需要说明的是，多路切换设备为M路切换设备，测试对象的数量为N个，其中，M和N均为大于1的整数，且M≥N。也就是说，系统连接的测试对象的数量可以和M路切换设备的通道数相同，或者测试对象的数量少于M路切换设备的通道数，即M路切换设备最多可连接M个测试对象。当待测试的N个测试对象与M路切换设备连接完成后，需要预先在HIL设备中配置与该N个测试对象对应的测试参数以及测试脚本程序，然后对测试对象进行依序测试。另外，N个测试对象并不一定对应N种测试参数，因为多路切换设备连接的测试对象中， 可能存在多个同种类同型号的测试对象，这些测试对象往往要进行相同的测试过程，此时，HIL设备中只需配置一种测试参数即可对上述测试对象进行同步测试。
需要说明的是，本实施例所提及的测试对象为BMS(Battery Attery Management System，电池管理系统)，当然，测试对象还可以为其他的设备与系统，这均不限制本申请的保护范围。
图2为本申请实施例所提供的多路切换设备的结构示意图。如图所示，该多路切换设备包括电源、单片机、驱动电路、继电器、电路板放置面板、通信接口面板、信号输入面板、插接面板与扩展口面板。
如图2所示，单片机、驱动电路和继电器均布设在电路板放置面板上，扩展接口设有扩展端口，连接面板连接有连接器，通信接口面板连接有通信模块；HIL设备通过通信模块与多路切换设备进行通信，HIL设备的测试信号经信号输入面板发送至多路切换设备，多路切换设备通过连接器连接测试对象。
图3为本申请实施例所提供的多路切换设备的原理图，如图所示，电源与单片机相连，以向单片机提供驱动电压，从而单片机可通过I/O端口驱动继电器的工作。
单片机与继电器相连接，以控制并驱动继电器工作。
具体的，单片机采用Freescale芯片和Altera的FPGA芯片，Freescale芯片的功能主要是通信过程的信息处理，Altera的FPGA芯片功能主要是书记计算。另外，单片机的I/O端口和继电器之间接有作为驱动电路的MOS管，首先通过单片机的I/O端口驱动MOS管，然后MOS管以12V的驱动电压来驱动继电器，继电器驱动过程的驱动电压由电源所提供。
多路切换设备连接的测试对象中，可能存在多个同种类同型号的测 试对象，这些测试对象往往要进行相同的测试过程，此时，单片机可以控制继电器基于HIL设备输入的原始信号生成多路信号，以满足多各测试对象的使用，也就是说，继电器生成信号路数和需要采用相同测试过程的对象测试数量相匹配。故对于上述的多个测试对象，HIL设备中只需配置一种测试参数即可进行同步测试，有效节约了配置参数所需时间，提高了测试效率。
通信接口面板内的通信模块分别与HIL设备以及单片机之间通信连接，其中，通信模块包括CAN总线和UART总线，多路切换设备可通过CAN总线协议和UART总线协议与HIL设备进行信息交互，同时通信模块还可以与单片机之间进行信号传递。
信号输入面板与继电器的信号输入端相连接，信号输入面板用于将从HIL设备接收的信号转发至继电器。
插接面板与继电器的信号输出端相连，并连接有多个测试对象。其中，插接面板上设有连接器，并通过该连接器连接多个测试对象，插接面板与继电器的信号输出端相连，在继电器的信号输入端接收到信号输入面板转发的由HIL设备发送的原始信号好后，生成多路信号并通过其信号输入端发送至与连接器相连接的各个测试对象。
需要说明的是，为了解决单个多路切换设备的规模过于庞大，可以设置为多个子多路切换设备相连接的方式，子多路切换设备的数量为K个，其中，K为大于1的整数。具体的，每个子多路切换设备均包括扩展口面板，子多路切换设备可通过扩展口面板的扩展端口与其他的子多路切换设备进行连接。从而，可以根据生产需求选择采用单个多路切换设备的方式，或者多个子多路切换设备相连接的方式，进而，使得测试对象的个数更具灵活性。
为进一步说明本申请实施例的技术方案，现举例对其工作原理进行 说明。
例如，HIL设备需要某个时间段内测试三个测试对象，HIL设备通过多通路设备连接有三个测试对象。在时间段1内需要基于测试对象1的故障处理进行测试，时间段2内需要基于测试对象2的SOC(System-on-a-Chip，芯片系统)进行测试，时间段3内需要基于测试对象3的功率限制进行测试。则首先需要在HIL设备内编写程序脚本以控制切换测试对象，然后分别配置每个测试对象对应的测试参数。
在测试过程中，HIL设备根据加载的配置参数切换不同的测试环境来测试不同的测试对象，当一个测试对象结束后，HIL设备通过ECU-TEST软件基于程序脚本来完成测试对象的切换，进而开始测试下一个测试对象的测试，这样就可以解决现有技术中在切换测试对象需要人工去插拔的问题。
需要说明的是，本实施例中的HIL设备也叫做硬件在环仿真测试设备，设备中运行有ECU-TEST自动化软件，ECU-TEST是一种集测试用例规范编写、执行、求解以及归档为一体的自动化测试工具。本实施例的HIL设备中预先编写有测试程序脚本，并配置有与各测试对象对应的测试参数，即测试参数与测试对象是一一对应的。在执行完基于测试参数的测试序列后，HIL设备将当前测试对象生成的反馈值与预设参数值进行比较，进而输出当前测试对象的测试结果，然后根据测试程序脚本的测试顺序基于对应的测试参数对测试对象进行依序测试，进而自动完成全部测试任务。
本申请实施例的技术方案具有以下有益效果：
本申请实施例提供的一种基于HIL设备的测试系统，应用于多测试对象的测试过程，该系统包括：多路切换设备，分别连接多个所述测试对象；以及，HIL设备，与所述多路切换设备通信连接，并配置有 与各所述测试对象对应的测试参数。与现有技术中的测试系统相比，本申请在HIL设备和测试对象之间增加了多路切换设备，HIL设备向多路切换设备发送测试信号，多路切换设备的继电器将测试信号分为多路后分别发送至当前的测试对象中，在当前测试对象测试完成后，HIL设备可自动切换测试对象进行下一轮测试，从而提升了整个测试系统自动化程度，节约了人力和物力资源。
以上所述仅为本申请的较佳实施例而已，并不用以限制本申请，凡在本申请的精神和原则之内，所做的任何修改、等同替换、改进等，均应包含在本申请保护的范围之内。

Claims (10)

  1. 一种基于硬件在环设备的测试系统，其特征在于，应用于多测试对象的测试过程，所述系统包括：
    多路切换设备，分别连接多个所述测试对象；
    硬件在环HIL设备，与所述多路切换设备通信连接，并配置有与各所述测试对象对应的测试参数。
  2. 根据权利要求1所述的基于硬件在环设备的测试系统，其特征在于，
    所述多路切换设备为M路切换设备；
    所述测试对象的数量为N个；
    其中，M和N均为大于1的整数，且M≥N。
  3. 根据权利要求1所述的基于硬件在环设备的测试系统，其特征在于，所述多路切换设备包括电源、单片机、继电器、通信接口面板、信号输入面板和插接面板；
    所述电源与单片机相连，以向所述单片机提供驱动电压；
    所述单片机与继电器相连接；
    所述通信接口面板内设有通信模块，所述通信模块分别与HIL设备以及单片机之间通信连接；
    所述信号输入面板与继电器的信号输入端相连接，信号输入面板用于将从HIL设备接收的信号转发至继电器；
    所述插接面板与继电器的信号输出端相连，插接面板还连接有多个所述测试对象。
  4. 根据权利要求3所述的基于硬件在环设备的测试系统，其特征在于，所述单片机的I/O端口和继电器之间设置有作为驱动电路的金属氧化物半导体场效应晶体MOS管。
  5. 根据权利要求4所述的基于硬件在环设备的测试系统，其特征在于，所述单片机的I/O端口提供的驱动电压为12V。
  6. 根据权利要求3所述的基于硬件在环设备的测试系统，其特征在于，所述插接面板上设有用于连接测试对象的连接器，继电器的信号输出端通过连接器将信号发送至测试对象。
  7. 根据权利要求3所述的基于硬件在环设备的测试系统，其特征在于，所述多路切换设备具有电路板放置面板，所述单片机、驱动电路和继电器均布设在该电路板放置面板上。
  8. 根据权利要求3所述的基于硬件在环设备的测试系统，其特征在于，所述多路切换设备具有扩展口面板，所述扩展口面板通过扩展端口与其他的多路切换设备进行连接。
  9. 根据权利要求8所述的基于硬件在环设备的测试系统，其特征在于，所述多路切换设备的数量为K个，其中，K为大于1的整数。
  10. 根据权利要求3所述的基于硬件在环设备的测试系统，其特征在于，所述通信模块包括控制器局域网络CAN总线和通用异步收发传输器UART总线，所述通信模块通过CAN总线与UART总线建立HIL设备与多路切换设备之间的通信关系。
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