WO2018118095A1 - Support d'enregistrement multiferroïque et capteur de lecture - Google Patents
Support d'enregistrement multiferroïque et capteur de lecture Download PDFInfo
- Publication number
- WO2018118095A1 WO2018118095A1 PCT/US2016/068597 US2016068597W WO2018118095A1 WO 2018118095 A1 WO2018118095 A1 WO 2018118095A1 US 2016068597 W US2016068597 W US 2016068597W WO 2018118095 A1 WO2018118095 A1 WO 2018118095A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- multiferroic
- magnetic
- adjacent
- magnetic recording
- Prior art date
Links
- 230000005291 magnetic effect Effects 0.000 claims abstract description 96
- 239000000463 material Substances 0.000 claims abstract description 80
- 230000007480 spreading Effects 0.000 claims abstract description 11
- 229910052723 transition metal Inorganic materials 0.000 claims abstract description 11
- 150000003624 transition metals Chemical class 0.000 claims abstract description 11
- 239000003302 ferromagnetic material Substances 0.000 claims abstract description 5
- 238000000470 piezoresponse force microscopy Methods 0.000 claims description 20
- 239000000758 substrate Substances 0.000 claims description 19
- 230000005686 electrostatic field Effects 0.000 claims description 18
- 229910052742 iron Inorganic materials 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 15
- 229910016583 MnAl Inorganic materials 0.000 claims description 12
- 229910017034 MnSn Inorganic materials 0.000 claims description 12
- 229910052782 aluminium Inorganic materials 0.000 claims description 12
- 229910052760 oxygen Inorganic materials 0.000 claims description 11
- 239000010702 perfluoropolyether Substances 0.000 claims description 11
- 238000005253 cladding Methods 0.000 claims description 10
- 229910001291 heusler alloy Inorganic materials 0.000 claims description 10
- 229910052797 bismuth Inorganic materials 0.000 claims description 8
- 229910052799 carbon Inorganic materials 0.000 claims description 8
- 239000011810 insulating material Substances 0.000 claims description 8
- 239000012212 insulator Substances 0.000 claims description 8
- SZVJSHCCFOBDDC-UHFFFAOYSA-N iron(II,III) oxide Inorganic materials O=[Fe]O[Fe]O[Fe]=O SZVJSHCCFOBDDC-UHFFFAOYSA-N 0.000 claims description 8
- 229910052759 nickel Inorganic materials 0.000 claims description 8
- 239000000314 lubricant Substances 0.000 claims description 7
- 229910052748 manganese Inorganic materials 0.000 claims description 7
- 229910052594 sapphire Inorganic materials 0.000 claims description 7
- 239000010980 sapphire Substances 0.000 claims description 7
- 229910052718 tin Inorganic materials 0.000 claims description 7
- 229910045601 alloy Inorganic materials 0.000 claims description 6
- 239000000956 alloy Substances 0.000 claims description 6
- -1 Co2FeGeGa Inorganic materials 0.000 claims description 5
- 229910052804 chromium Inorganic materials 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 229910003460 diamond Inorganic materials 0.000 claims description 5
- 239000010432 diamond Substances 0.000 claims description 5
- 229910052733 gallium Inorganic materials 0.000 claims description 5
- 229910052738 indium Inorganic materials 0.000 claims description 5
- 229910003465 moissanite Inorganic materials 0.000 claims description 5
- 229910052763 palladium Inorganic materials 0.000 claims description 5
- 229920000642 polymer Polymers 0.000 claims description 5
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 5
- DZKXDEWNLDOXQH-UHFFFAOYSA-N 1,3,5,2,4,6-triazatriphosphinine Chemical class N1=PN=PN=P1 DZKXDEWNLDOXQH-UHFFFAOYSA-N 0.000 claims description 4
- 229910003396 Co2FeSi Inorganic materials 0.000 claims description 4
- 229910019222 CoCrPt Inorganic materials 0.000 claims description 4
- 229910018301 Cu2MnAl Inorganic materials 0.000 claims description 4
- 229910016964 MnSb Inorganic materials 0.000 claims description 4
- 229910005408 Ni2MnGa Inorganic materials 0.000 claims description 4
- 229910005483 Ni2MnSb Inorganic materials 0.000 claims description 4
- 229910052787 antimony Inorganic materials 0.000 claims description 4
- 229910052731 fluorine Inorganic materials 0.000 claims description 4
- 229910052732 germanium Inorganic materials 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 4
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 229910052720 vanadium Inorganic materials 0.000 claims description 4
- 229910015372 FeAl Inorganic materials 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 229910052727 yttrium Inorganic materials 0.000 claims description 3
- 230000005415 magnetization Effects 0.000 description 30
- 230000006870 function Effects 0.000 description 22
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 15
- 230000005684 electric field Effects 0.000 description 14
- 230000005294 ferromagnetic effect Effects 0.000 description 8
- 230000002093 peripheral effect Effects 0.000 description 8
- 230000001413 cellular effect Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 239000013078 crystal Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 229910017028 MnSi Inorganic materials 0.000 description 3
- 230000005290 antiferromagnetic effect Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000003032 molecular docking Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 229910021632 Barium Tetrafluoronickelate Inorganic materials 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 150000004770 chalcogenides Chemical class 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 230000005307 ferromagnetism Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 150000002910 rare earth metals Chemical class 0.000 description 2
- 239000011029 spinel Substances 0.000 description 2
- 229910052596 spinel Inorganic materials 0.000 description 2
- 229910003321 CoFe Inorganic materials 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- 239000002041 carbon nanotube Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005621 ferroelectricity Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/64—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent
- G11B5/66—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent the record carriers consisting of several layers
- G11B5/672—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent the record carriers consisting of several layers having different compositions in a plurality of magnetic layers, e.g. layer compositions having differing elemental components or differing proportions of elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/72—Protective coatings, e.g. anti-static or antifriction
- G11B5/725—Protective coatings, e.g. anti-static or antifriction containing a lubricant, e.g. organic compounds
- G11B5/7253—Fluorocarbon lubricant
- G11B5/7257—Perfluoropolyether lubricant
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/73—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
- G11B5/7368—Non-polymeric layer under the lowermost magnetic recording layer
- G11B5/7369—Two or more non-magnetic underlayers, e.g. seed layers or barrier layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/73—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
- G11B5/739—Magnetic recording media substrates
- G11B5/73911—Inorganic substrates
- G11B5/73921—Glass or ceramic substrates
Definitions
- Extending density of a recording media is desirable due to the increase in data collection. Sensing the recorded data is also desirable to enable use of denser recording media.
- existing magnetic recording media and associated sensing element cannot be scaled in size due to reduced magnetic barriers.
- Figs. 1A-B illustrate a three-dimensional (3D) view and corresponding cross- section, respectively, of a magnetic memory hard-disk drive (HDD) having multiferroic recording media, according to some embodiments of the disclosure.
- HDD hard-disk drive
- Fig. 2 illustrates a 3D view of a multiferroic recording cell, according to some embodiments of the disclosure.
- FIG. 3 illustrates a 3D view of a multiferroic recording cell, according to some embodiments of the disclosure.
- FIG. 4 illustrates a 3D view of an apparatus with a multiferroic recording cell and an electrostatic writing electrode, according to some embodiments of the disclosure.
- FIG. 5 illustrates a 3D view of an apparatus with a multiferroic recording cell and an electrostatic and a magnetic writing electrode, according to some embodiments of the disclosure.
- FIG. 6 illustrates a 3D view of an apparatus with a multiferroic recording cell, two electrostatic writing electrodes for front-side and back-side simultaneous writing, and a magnet writing electrode, according to some embodiments of the disclosure.
- Fig. 7 illustrates a 3D view of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes for front-side and back-side simultaneous writing, according to some embodiments of the disclosure.
- Fig. 8 illustrates a 3D view of an apparatus with a multiferroic recording cell and an electrostatic writing electrode for the back-side and a magnetic writing electrode for the front-side, according to some embodiments of the disclosure.
- Fig. 9 illustrates a 3D view of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with piezoresponse force microscopy (PFM) for front-side and back-side simultaneous writing, according to some embodiments of the disclosure.
- PFM piezoresponse force microscopy
- Fig. 10 illustrates a 3D view of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with PFM and with ferroelectric tips for front-side and back-side simultaneous writing, according to some embodiments of the disclosure.
- FIG. 11 illustrates a 3D view of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with PFM for front-side and back-side simultaneous writing, and with ferroelectric readout sensor, according to some embodiments of the disclosure.
- Fig. 12 illustrates a 3D view of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with PFM and with ferroelectric tips for front-side and back-side simultaneous writing, and with ferroelectric readout sensor, according to some embodiments of the disclosure.
- Fig. 13 illustrates a smart device or a computer system or a SoC (System-on-
- Chip with a magnetic memory having multiferroic recording media and associated writing and reading sensors, according to some embodiments.
- the magnetic recording media comprises a ferromagnet (FM) layer coupled to a multiferroic medium such as BFO (e.g., BiFeCb).
- BFO e.g., BiFeCb
- the magnetic recording media can be written to using single or dual writing electrodes. For example, the magnetic recording media can be accessed from the front-side and/or back-side of the magnetic recording media and written to.
- dielectric constant media (with high permittivity) is directly or indirectly coupled to the magnetic recording media to improve electric field localization.
- a multi-sensor is provided which is used for reading the data from the magnetic recording media. As such, read-stability is improved.
- denser recording media can be achieved due to multiferroic stabilization.
- faster writing is achieved by simultaneous writing via multiple writing electrodes.
- Other technical effects will be evident from the various embodiments and figures.
- signals are represented with lines. Some lines may be thicker, to indicate more constituent signal paths, and/or have arrows at one or more ends, to indicate primary information flow direction. Such indications are not intended to be limiting. Rather, the lines are used in connection with one or more exemplary embodiments to facilitate easier understanding of a circuit or a logical unit. Any represented signal, as dictated by design needs or preferences, may actually comprise one or more signals that may travel in either direction and may be implemented with any suitable type of signal scheme.
- connection means a direct connection, such as electrical, mechanical, or magnetic connection between the things that are connected, without any intermediary devices.
- coupled means a direct or indirect connection, such as a direct electrical, mechanical, or magnetic connection between the things that are connected or an indirect connection, through one or more passive or active intermediary devices.
- circuit or “module” may refer to one or more passive and/or active components that are arranged to cooperate with one another to provide a desired function.
- signal may refer to at least one current signal, voltage signal, magnetic signal, or data/clock signal.
- the meaning of "a,” “an,” and “the” include plural references.
- the meaning of "in” includes “in” and "on.”
- phrases “A and/or B” and “A or B” mean (A), (B), or (A and B).
- phrase “A, B, and/or C” means (A), (B), (C), (A and B), (A and C), (B and C), or (A, B and C).
- the terms “left,” “right,” “front,” “back,” “top,” “bottom,” “over,” “under,” and the like in the description and in the claims, if any, are used for descriptive purposes and not necessarily for describing permanent relative positions.
- Figs. 1A-B illustrate a three-dimensional (3D) view 100 and corresponding cross-section 120, respectively, of a magnetic memory hard-disk drive (HDD) having multiferroic recording media, according to some embodiments of the disclosure.
- HDD comprises a substrate 101 (e.g., glass substrate, sapphire substrate, etc.), a heat spreading layer 102, transition metal layer 103, multiferroic recording media 104, and cladding layer 105.
- heat spreading layer 102 is deposited above substrate 101.
- layer 102 has high permittivity.
- permittivity indicates how much electric field or flux is generated per unit charge in the recording media. Permittivity relates to a materials' ability to resist an electric field.
- Permittivity is related to electric susceptibility (e.g., a measure of how easily a dielectric polarizes in response to an electric field).
- layer 102 is formed of Ru and similar materials.
- layer 101 comprises sapphire substrate and layer
- transition metal layer 103 is formed above heat spreading layer 102.
- transition metal layer 103 is formed of strain producing substrates such as BTO (e.g., B112T1O20 or Bi4T Oi 2 .), DySCCb, GaAs, and group III-V substrates.
- BTO e.g., B112T1O20 or Bi4T Oi 2 .
- DySCCb e.g., DySCCb
- GaAs e.g., GaAs, and group III-V substrates.
- transition metal layer 103 is formed of one of: Mo, Pd, Cr, Pt, or CoCrPt.
- transition metal layer 103 is formed of Mo (110) face centered cubic (FCC) lattice.
- magnetic recording layer (or medium) 104 is grown above transition metal layer 103.
- the magnetic recording layer 104 is used for reading and writing data by storing data in magnetic elements or cells arranged in an array (e.g., rows and columns of magnetic elements or components).
- magnetic recording layer 104 comprises multiferroic materials.
- magnetic recording layer 104 comprises a ferromagnet layer and one or more layers of multiferroic material (e.g., Bismuth ferrite (BFO)).
- Multiferroic materials are materials that exhibit one or more ferroic order parameters simultaneously (e.g., ferroic order parameters such as ferromagnetism, ferroelectricity, or ferro-elasticit ).
- BFO such as BiFeC is a multiferroic material that has good ferroelectric and antiferromagnetic properties.
- Other examples of multiferroic material include BiMn03, PbV03, magnetic perovskite materials (e.g., PZTFT such as
- PbZro.53Tio.4703)o.6 rare-earth manganite materials (e.g., TbMn03 and HoMmOs), non- perovskite multiferroic oxides (e.g., LuFe204 and L1CU2O3), non-perovskite multiferroic non- oxides (e.g., BaNiF4), spinel chalcogenides (e.g., ZnCr2Se4), h-YMn03, K3Se04, Cs2Cd , M3V2O8, MnW0 4 , and CuO, etc.
- rare-earth manganite materials e.g., TbMn03 and HoMmOs
- non- perovskite multiferroic oxides e.g., LuFe204 and L1CU2O3
- non-perovskite multiferroic non- oxides e.g., BaNiF4
- the magnetic recording layer 104 may not be a continuous layer. Instead, in some examples, as shown in Fig. 1A, the magnetic recording layer 104 comprises magnetic recording cells (or dots) organized in rows and columns. Each dot or cell is akin to a memory bit-cell which stores certain data.
- cladding layer 105 or lubricant 105 is deposited over magnetic recording layer 104 so that a sensor or tip to read and write to magnetic elements can slide over magnetic recording layer 104 smoothly.
- An example of cladding layer 105 or lubricant 105 is a layer of perfluoropoly ether (PFPE) which is a chain polymer of fluorine, carbon, and oxygen atoms.
- PFPE perfluoropoly ether
- cladding layer 105 or lubricant 105 is a layer that includes one of: Z-Type Perfluoro Poly Ether Lubricant Polymers, Z-Dol 4000 or Z-Tetroal, ZDol 7800, or Cyclotriphosphazenes.
- Fig. 2 illustrates 3D view 200 of a multiferroic recording cell, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 2 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- multiferroic recording cell 104 is shown coupled between layers 105 and 103.
- multiferroic recording cell 104 comprises ferromagnet (FM) 201 and multiferroic material 202.
- FM 201 is a free magnet which is also coupled to layer 105.
- the term "free magnet” generally refers to a magnet such as a ferromagnet whose magnetization is not predetermined or pinned, and whose magnetization can be altered by an external stimulus.
- multiferroic material 202 is coupled to layer 103.
- multiferroic material 202 provides exchange coupling with FM 201.
- magnetization of FM 201 is switched by applying an electric field ⁇ ' to multiferroic recording cell 104.
- the electric field ⁇ ' controls the magnetic field. Since the electric field ⁇ ' is stable, the magnetic field becomes stable too. For example, when electric field ⁇ ' does not change in the multiferroic material 202, the magnetic field in FM 201 does not change. As such, the overall stability of the multiferroic recording cell increases compared to traditional magnetic recording cells.
- FM 201 comprises a material selected from a group consisting of: Fe, Ni, Co and their alloys, magnetic insulators, and Heusler alloys of the form X?.YZ.
- the magnetic insulators comprise a material selected from a group consisting of: magnetite Fe 3 0 4 and Y3AI5O12.
- the Heusler alloys comprises one or more of the elements: Mn, Al, Co, Fe, Ge, Ga, Cu, In, Sn, Ni, Sb, Pd, In, Val, or V.
- the Heusler alloys is one of: MmGa, Co2FeAl, Co 2 FeGeGa, Cu 2 MnAl, Cu 2 MnIn, Cu 2 MnSn, Ni 2 MnAl, Ni 2 MnIn, Ni 2 MnSn, Ni 2 MnSb, Ni 2 MnGa, Co 2 MnAl, Co 2 MnSi, Co 2 MnGa, Co 2 MnGe, Pd 2 MnAl, Pd 2 MnIn, Pd 2 MnSn, Pd 2 MnSb, Co 2 FeSi, Fe 2 Val, Mn 2 VGa, and Co 2 FeGe.
- the threshold energy for FM 201 is in the range of 20-60 kT, where 'k' is Boltzmann constant and ' ⁇ ' is temperature. In the following example, the threshold energy for FM 201 is considered to be 40 kT.
- FM 201 is formed with a sufficiently low anisotropy
- Hk to facilitate switching by exchange bias and sufficiently high magnetic saturation (M s ) to ensure sufficient threshold energy and thus stability.
- Magnetic saturation M s is generally the state reached when an increase in applied external magnetic field H cannot increase the magnetization of the material (i.e., total magnetic flux density B substantially levels off).
- Anisotropy Hk generally refers to the material property which is directionally dependent. Materials with anisotropy are materials with material properties that are highly directionally dependent.
- multiferroic material 202 comprises BFO such as
- BiFeC which is a multiferroic material that has good ferroelectric and antiferromagnetic properties: high enough values of saturated ferroelectric polarization P s , antiferromagnetic order parameter L, and uncompensated magnetization M c .
- multiferroic material 202 examples include BiMnCb, PbVCb, magnetic perovskite materials (e.g., PZTFT such as PbZro.53Tio.4703)o.6), rare-earth manganite materials (e.g., TbMn03 and HoMmOs), non- perovskite multiferroic oxides (e.g., LuFe204 and L1CU2O3), non-perovskite multiferroic non- oxides (e.g., BaNiF4), spinel chalcogenides (e.g., ZnCr2Se4), h-YMn03, K3Se04, Cs2Cdl4, N13V2O8, MnW04, and CuO, etc.
- PZTFT such as PbZro.53Tio.4703)o.6
- rare-earth manganite materials e.g., TbMn03 and HoMmOs
- multiferroic material 202 includes one or more of the elements: Bi, Mn, O, Pb, V, Ti, Zr, Tb, Ho, Lu, Cu, Ba, Ni, F, Zn, Cr, Se, Y, K, Cs, and W.
- Fig. 3 illustrates 3D view 300 of a multiferroic recording cell, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 3 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- Multiferroic recording cell 104 of Fig. 3 is similar to multiferroic recording cell 104 of Fig. 2 except that it includes a layer of another multiferroic material 301.
- multiferroic material 301 is formed on top of FM 201 such that multiferroic material 301 couples layer 105.
- multiferroic material 301 is formed of the same material as multiferroic material 202.
- both multiferroic materials 202 and 301 are BFO materials.
- exchange bias is exerted by multiferroic 202 on the bottom surface of FM 201 and by multiferroic 301 on the top surface of FM 201. This exchange bias effectively doubles the torque which switches the magnetization.
- Fig. 4 illustrates three dimensional (3D) view 400 of an apparatus with a multiferroic recording cell and an electrostatic writing electrode, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 4 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such. Fig. 4 is similar to Fig. 2 except that an electrode is added to write to the front-side of multiferroic recording cell 104.
- front-side generally refers to the part of multiferroic recording cell 104 that is coupled to layer 105
- back-side generally refers to the part of multiferroic recording cell 104 that is coupled to layer 103.
- the electrodes include a tip 401 attached to a cantilever
- the shape of tip 401 is configured to provide focused electrostatic field to multiferroic recording cell 104.
- electrostatic field is generated by a voltage applied to cantilever 402.
- cantilever 402 may be attached to a mechanical arm that moves the cantilever to the memory cell that needs to be written to.
- the electrostatic field from tip 401 controls the magnetic field in FM 201.
- the shape of tip 401 can be configured to focus the electric field to multiferroic recording cell 104 such that other multiferroic recording cells in the recording media are not affected.
- a certain magnetization is stored in FM 201.
- FM 201 when electric field is directed towards layer 103, FM 201 may have a magnetization pointing in the North direction. Likewise, when an electric field is directed towards layer 105, FM 201 may have a magnetization pointing in the South direction. In this example, FM 201 is a perpendicular free magnet. However, the same concept can apply to in-plane FM 201.
- Fig. 5 illustrates 3D view 500 of an apparatus with a multiferroic recording cell and an electrostatic and a magnetic writing electrode, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 5 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- Fig. 5 is similar to Fig. 4 except that an additional electrode 501 is provided.
- the additional electrode 501 is a magnetic tip which provides further magnetic field to FM 201 so that it strongly writes data to memory cell 104.
- electrode 501 is a free magnet with
- magnetization set according to the desired magnetization of FM 201 when FM 201 is a perpendicular magnet, magnetic electrode 501 is also magnetized along the same line which is perpendicular to the plane of the substrate. In some embodiments, FM 201 is an in-plane magnet, magnetic electrode 501 is also magnetized in the plane of the substrate. In some embodiments, the magnetization of electrode 501 is set according to the direction of electric field generated by tip 401 so that the magnetic fields produced by the electric field from tip 401 and electrode 501 have the same direction. As such, it becomes easier to cross the energy barrier of FM 201 to change its magnetization to the desired magnetization. The direction of magnetization dictates the value stored in multiferroic recording cell 500.
- Fig. 6 illustrates 3D view 600 of an apparatus with a multiferroic recording cell, two electrostatic writing electrodes for front-side and back-side simultaneous writing, and a magnet writing electrode, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 6 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- Fig. 6 is similar to Fig. 5 except that an additional electrode is provided for writing via the back-side of the HDD.
- the additional electrode includes cantilever 602 and tip 601. Construction wise, cantilever 602 and tip 601 may be similar to cantilever 402 and tip 401.
- tip 401 may be providing electrostatic field to one multiferroic recording cell while tip 601 is providing electrostatic field to another multiferroic recording cell.
- multiple multiferroic recording cells of the same HDD may be written to by two different electrodes,
- the same cell may be written to using three different sources (e.g., tip 401 , magnetic electrode 501 , and tip 601) so that the magnetization of FM 201 is set with high degree of confidence.
- writing speed can increase because FM 201 can be written to faster when compared to the case of writing using one electrode, for example.
- Fig. 7 illustrates 3D view 700 of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes for front-side and back-side simultaneous writing, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 7 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- Fig. 7 is similar to Fig. 6 except magnetic electrode 501 is removed.
- FM 201 can be written to from front-side or back-side of HDD. For example, tip
- tip 601 is used to write to FM 201 via the back-side of HDD.
- Fig. 8 illustrates 3D view 800 of an apparatus with a multiferroic recording cell and an electrostatic writing electrode for the back-side and a magnetic writing electrode for the front-side, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 8 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such. Fig. 8 is similar to Fig. 6 except that electrostatic tip 401 and its cantilever
- FM 201 can be written to from the front-side and/or the back-side of HDD.
- magnetic electrode 501 is used to write to FM 201 via the front-side while tip 601 is used to write to FM 201 via the back-side of HDD.
- an additional layer 801 is sandwiched between multiferroic material 202 and layer 103.
- layer 801 comprises one of Sapphire, SiC, or diamond.
- the shape of tip 601 is enhanced to provide electrostatic field with high numerical aperture (NA).
- Fig. 9 illustrates 3D view 900 of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with PFM for front-side and back-side simultaneous writing, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 9 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- the front-side writing apparatus e.g., tip 401 and cantilever 402
- PFM allows manipulation of ferroelectric materials.
- an alternating current (AC) is applied to tip 901 via cantilever 902 to excite deformation of multiferroic recording cell 104.
- the back-side writing apparatus e.g., tip 601 and cantilever 602
- Material and structure wise, PFM capable tip 903 and cantilever 904 is same as PFM capable tip 901 and cantilever 902, respectively.
- tip 901 may be providing electrostatic field to one multiferroic recording cell while tip 903 is providing electrostatic field to another multiferroic recording cell.
- multiple multiferroic recording cell of the same HDD may be written to by two different electrodes, simultaneously.
- the same cell may be written to using two different sources (e.g., tip 901 and tip 903) so that the magnetization of FM 201 is set with high degree of confidence. As such, writing speed can increase because FM 201 can be written to faster compared to the case when writing using one electrode, for example.
- Fig. 10 illustrates 3D view 1000 of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with PFM and with ferroelectric tips for front- side and back-side simultaneous writing, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 10 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- Fig. 10 is similar to Fig. 9 except that the tips of the writing electrodes are replaced with ferroelectric tips like 1001 (e.g., like 401) and 1003 (e.g., 601).
- Fig. 11 illustrates 3D view 1100 of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with PFM for front-side and back-side simultaneous writing, and with ferroelectric readout sensor, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 11 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such.
- Fig. 11 is similar to Fig. 9 except that a reading sensor is added which comprises free magnet 1101, fixed magnet 1102, and nonmagnetic conductor 1103 (e.g., Cu, Al, Au, Ag, etc.) coupling the two magnets.
- the free magnet 1101 is positioned near the multiferroic recording cell which is to be read. The reading is performed using GMR (Giant magnetoresistance).
- first and second magnets 1101 and 1102 are ferromagnets that are made from CFGG (i.e., Cobalt (Co), Iron (Fe), Germanium (Ge), or Gallium (Ga) or a combination of them).
- first and second magnets 1101 and 1102 are formed from Heusler alloy(s).
- Heusler alloy is ferromagnetic metal alloy based on a Heusler phase.
- Heusler phase is intermetallic with certain composition and face- centered cubic (FCC) crystal structure.
- FCC face- centered cubic
- first and second magnets 1101 and 1102 have out-of-plane magnetization (e.g., pointing in the +/- z-direction). In some embodiments, first and second magnets 1101 and 1102 have in-plane magnetization (e.g., pointing in the +/- x or +/- y direction).
- factors such as surface anisotropy (depending on the adjacent layers or a multi-layer composition of the ferromagnetic layer) and/or crystalline anisotropy (depending on stress and the crystal lattice structure modification such as FCC (face centered cubic) lattice, BCC (body centered cubic) lattice, or Llo-type of crystals, where Llo is a type of crystal class which exhibits perpendicular magnetizations), can also determine the direction of magnetization.
- FCC face centered cubic lattice
- BCC body centered cubic lattice
- Llo-type of crystals where Llo is a type of crystal class which exhibits perpendicular magnetizations
- FM 201 when FM 201 has in-plane magnetization (e.g., point in
- free and fixed magnets 1101 and 1102, respectively also have in-plane magnetizations.
- FM 201 has perpendicular magnetization (e.g., point in +z or -z direction depending on how it is programmed by tips 901/903)
- free and fixed magnets 1101 and 1102, respectively also have perpendicular magnetizations.
- Fig. 12 illustrates 3D view 1200 of an apparatus with a multiferroic recording cell and two electrostatic writing electrodes with PFM and with ferroelectric tips for front- side and back-side simultaneous writing, and with ferroelectric readout sensor, according to some embodiments of the disclosure. It is pointed out that those elements of Fig. 12 having the same reference numbers (or names) as the elements of any other figure can operate or function in any manner similar to that described, but are not limited to such. Fig. 12 is similar to Fig. 10 except with reading sensor of Fig. 11.
- Fig. 13 illustrates a smart device or a computer system or a SoC (System-on-
- the transistors in various circuits and logic blocks described here are metal oxide semiconductor (MOS) transistors or their derivatives, where the MOS transistors include drain, source, gate, and bulk terminals.
- the transistors and/or the MOS transistor derivatives also include Tri-Gate and FinFET transistors, Gate All Around Cylindrical Transistors, Tunneling FET (TFET), Square Wire, or Rectangular Ribbon Transistors, ferroelectric FET (FeFETs), or other devices implementing transistor functionality like carbon nanotubes or spintronic devices.
- MOSFET symmetrical source and drain terminals i.e., are identical terminals and are interchangeably used here.
- a TFET device on the other hand, has asymmetric Source and Drain terminals.
- BJT PNP/NPN Bi-polar junction transistors
- BiCMOS BiCMOS
- CMOS complementary metal oxide semiconductor
- Fig. 13 illustrates a block diagram of an embodiment of a mobile device in which flat surface interface connectors could be used.
- computing device 1600 represents a mobile computing device, such as a computing tablet, a mobile phone or smart-phone, a wireless-enabled e-reader, or other wireless mobile device. It will be understood that certain components are shown generally, and not all components of such a device are shown in computing device 1600.
- computing device 1600 includes first processor 1610 and network interface within 1670 such as a wireless interface so that a system embodiment may be incorporated into a wireless device, for example, cell phone or personal digital assistant.
- processor 1610 and/or processor 1690
- microcontrollers programmable logic devices, or other processing means.
- the processing operations performed by processor 1610 include the execution of an operating platform or operating system on which applications and/or device functions are executed.
- the processing operations include operations related to I/O (input/output) with a human user or with other devices, operations related to power management, and/or operations related to connecting the computing device 1600 to another device.
- the processing operations may also include operations related to audio I/O and/or display I/O.
- computing device 1600 includes audio subsystem
- Audio functions can include speaker and/or headphone output, as well as microphone input. Devices for such functions can be integrated into computing device 1600, or connected to the computing device 1600. In one embodiment, a user interacts with the computing device 1600 by providing audio commands that are received and processed by processor 1610.
- computing device 1600 comprises display subsystem
- Display subsystem 1630 represents hardware (e.g., display devices) and software (e.g., drivers) components that provide a visual and/or tactile display for a user to interact with the computing device 1600.
- Display subsystem 1630 includes display interface 1632, which includes the particular screen or hardware device used to provide a display to a user.
- display interface 1632 includes logic separate from processor 1610 to perform at least some processing related to the display.
- display subsystem 1630 includes a touch screen (or touch pad) device that provides both output and input to a user.
- computing device 1600 comprises I/O controller 1640.
- I/O controller 1640 represents hardware devices and software components related to interaction with a user. I/O controller 1640 is operable to manage hardware that is part of audio subsystem 1620 and/or display subsystem 1630. Additionally, I/O controller 1640 illustrates a connection point for additional devices that connect to computing device 1600 through which a user might interact with the system. For example, devices that can be attached to the computing device 1600 might include microphone devices, speaker or stereo systems, video systems or other display devices, keyboard or keypad devices, or other I/O devices for use with specific applications such as card readers or other devices. [0057] As mentioned above, I/O controller 1640 can interact with audio subsystem
- display subsystem 1630 For example, input through a microphone or other audio device can provide input or commands for one or more applications or functions of the computing device 1600. Additionally, audio output can be provided instead of, or in addition to display output. In another example, if display subsystem 1630 includes a touch screen, the display device also acts as an input device, which can be at least partially managed by I/O controller 1640. There can also be additional buttons or switches on the computing device 1600 to provide I/O functions managed by I/O controller 1640.
- I/O controller 1640 manages devices such as accelerometers, cameras, light sensors or other environmental sensors, or other hardware that can be included in the computing device 1600.
- the input can be part of direct user interaction, as well as providing environmental input to the system to influence its operations (such as filtering for noise, adjusting displays for brightness detection, applying a flash for a camera, or other features).
- computing device 1600 includes power management
- Memory subsystem 1660 includes memory devices for storing information in computing device 1600. Memory can include nonvolatile (state does not change if power to the memory device is interrupted) and/or volatile (state is indeterminate if power to the memory device is interrupted) memory devices. Memory subsystem 1660 can store application data, user data, music, photos, documents, or other data, as well as system data (whether long-term or temporary) related to the execution of the applications and functions of the computing device 1600. In some embodiments, Memory subsystem 1660 includes the scheme of analog in-memory partem matching with the use of resistive memory elements. In some embodiments, memory subsystem includes a magnetic memory HDD using multiferroic recording media (which are read using the sensors described here), according to some embodiments.
- the machine-readable medium may include, but is not limited to, flash memory, optical disks, CD-ROMs, DVD ROMs, RAMs, EPROMs, EEPROMs, magnetic or optical cards, phase change memory (PCM), or other types of machine-readable media suitable for storing electronic or computer- executable instructions.
- embodiments of the disclosure may be downloaded as a computer program (e.g., BIOS) which may be transferred from a remote computer (e.g., a server) to a requesting computer (e.g., a client) by way of data signals via a communication link (e.g., a modem or network connection).
- BIOS a computer program
- a remote computer e.g., a server
- a requesting computer e.g., a client
- a communication link e.g., a modem or network connection
- computing device 1600 comprises connectivity 1670.
- Connectivity 1670 includes hardware devices (e.g., wireless and/or wired connectors and communication hardware) and software components (e.g., drivers, protocol stacks) to enable the computing device 1600 to communicate with external devices.
- the computing device 1600 could be separate devices, such as other computing devices, wireless access points or base stations, as well as peripherals such as headsets, printers, or other devices.
- Connectivity 1670 can include multiple different types of connectivity.
- the computing device 1600 is illustrated with cellular connectivity 1672 and wireless connectivity 1674.
- Cellular connectivity 1672 refers generally to cellular network connectivity provided by wireless carriers, such as provided via GSM (global system for mobile communications) or variations or derivatives, CDMA (code division multiple access) or variations or derivatives, TDM (time division multiplexing) or variations or derivatives, or other cellular service standards.
- Wireless connectivity (or wireless interface) 1674 refers to wireless connectivity that is not cellular, and can include personal area networks (such as Bluetooth, Near Field, etc.), local area networks (such as Wi-Fi), and/or wide area networks (such as WiMax), or other wireless communication.
- computing device 1600 comprises peripheral connections 1680.
- Peripheral connections 1680 include hardware interfaces and connectors, as well as software components (e.g., drivers, protocol stacks) to make peripheral connections.
- the computing device 1600 could both be a peripheral device ("to" 1682) to other computing devices, as well as have peripheral devices ("from” 1684) connected to it.
- the computing device 1600 commonly has a "docking" connector to connect to other computing devices for purposes such as managing (e.g., downloading and/or uploading, changing, synchronizing) content on computing device 1600.
- a docking connector can allow computing device 1600 to connect to certain peripherals that allow the computing device 1600 to control content output, for example, to audiovisual or other systems.
- the computing device 1600 can make peripheral connections 1680 via common or standards-based connectors.
- Common types can include a Universal Serial Bus (USB) connector (which can include any of a number of different hardware interfaces), DisplayPort including MiniDisplayPort (MDP), High Definition Multimedia Interface (HDMI), Firewire, or other types.
- USB Universal Serial Bus
- MDP MiniDisplayPort
- HDMI High Definition Multimedia Interface
- Firewire or other types.
- Example 1 is an apparatus which comprises: a first layer for heat spreading; a second layer comprising a transition metal, wherein the second layer is adjacent to the first layer; and a third layer comprising a magnetic recording medium, wherein the third layer is adjacent to the second layer, wherein the third layer comprises: a fourth layer comprising ferromagnetic material; and a fifth layer comprising multiferroic material, wherein the fourth layer is adjacent to the fifth layer.
- Example 2 includes all features of example 1, wherein the magnetic recording medium comprises a sixth layer comprising multiferroic material, wherein the sixth layer is adjacent to the fourth layer such that the fourth layer is sandwiched between the fifth and sixth layers.
- Example 3 includes all features of example 2, wherein the magnetic recording medium comprises a seventh layer comprising an insulating material sandwiched between the fifth layer and the second layer.
- Example 4 includes all features of example 3, wherein the insulating material comprises a material which includes one of: Al, O, Si, C, sapphire, SiC, or diamond.
- Example 5 includes all features of example 2, wherein the multiferroic material of the fifth and sixth layers comprises a material which includes one of: Bi, Fe, or O.
- Example 6 includes features of any one of examples 1 to 4, wherein the multiferroic material of the fifth layer comprises a material which includes one of: Bi, Fe, or O.
- Example 7 includes features of any one of examples 1 to 5, wherein the second layer comprises a material selected from which includes one of: Mo, Pd, Cr, Pt, or CoCrPt.
- Example 8 includes features of any of examples 1 to 5, wherein the apparatus of example 8 comprises a substrate adjacent to the heat spreading layer.
- Example 9 includes features of example 8, wherein the substrate is a glass substrate.
- Example 10 includes features according to any one of examples 1 to 5, wherein the third layer is written to via a first mechanical tip that is to provide a first electrostatic field to the third layer, wherein the first mechanical tip is closer to the fourth layer than the fifth layer.
- Example 11 includes all features of example 10, wherein the third layer is written to via a magnet that is to provide a magnetic field which is controlled by the first electrostatic field from the first mechanical tip.
- Example 12 includes all features of example 10, wherein the third layer is written to via a second mechanical tip that is to provide a second electrostatic field to the third layer, wherein the second mechanical tip is closer to the fifth layer than the fourth layer.
- Example 13 includes all features of example 12, wherein the first and second mechanical tips apply piezoresponse force microscopy (PFM) to the fourth and fifth layers, respectively.
- PFM piezoresponse force microscopy
- Example 14 includes all features of example 13, wherein the first and second mechanical tips are ferroelectric tips.
- Example 15 includes all features of example 13, wherein the third layer is read from via free magnet coupled to a fixed magnet via a non-magnetic metal.
- Example 16 according to any one of examples 1 to 5, wherein the apparatus of example 16 comprises a cladding layer adjacent to the magnetic recording medium, wherein the cladding layer comprises a material which includes one of: F, C, O, perfluoropolyether (PFPE), Z-Type Perfluoro Poly Ether Lubricant Polymer, Z-Dol 4000, Z-Tetroal, ZDol 7800, or Cyclotriphosphazenes,
- PFPE perfluoropolyether
- Z-Type Perfluoro Poly Ether Lubricant Polymer Z-Dol 4000, Z-Tetroal, ZDol 7800, or Cyclotriphosphazenes
- Example 17 according to any one of examples 1 to 5, wherein the magnetic recording medium includes a plurality of magnetic components organized in an array configuration.
- Example 18 according to any one of examples 1 to 5, wherein the fourth layer comprises a material which includes one of: Fe, Ni, Co and their alloys, magnetic insulators, orHeusler alloys of the form XiYZ.
- Example 19 includes all features of example 13, wherein the magnetic insulators comprise a material which includes one of: Fe, O, Y, Al, magnetite Fe 3 0 4 , or
- Example 20 includes all features of example 13, wherein the Heusler alloys includes one of: Mn, Ga, Co, Mn, Ge, Co, Fe, Al, Cu, In, Sn, Ni, Sn, Sb, Si, Pd, V, M Ga, Co 2 FeAl, Co 2 FeGeGa, Cu 2 MnAl, Cu 2 MnIn, Cu 2 MnSn, Ni 2 MnAl, Ni 2 MnIn, Ni 2 MnSn, Ni 2 MnSb, Ni 2 MnGa, Co 2 MnAl, Co 2 MnSi, Co 2 MnGa, Co 2 MnGe, Pd 2 MnAl, Pd 2 MnIn, Pd 2 MnSn, Pd 2 MnSb, Co 2 FeSi, Fe 2 Val, Mn 2 VGa, or Co 2 FeGe.
- the Heusler alloys includes one of: Mn, Ga, Co, Mn, Ge, Co, Fe, Al, Cu, In, Sn, Ni, S
- Example 21 is a system which comprises: a processor; a memory coupled to the processor, the memory including an apparatus according to any one of apparatus examples 1 to 20; and a wireless interface for allowing the processor to communicate with another device.
- Example 22 is a method which comprises: forming a first layer for heat spreading; forming a second layer comprising a transition metal, wherein the second layer is adjacent to the first layer; and forming a third layer comprising a magnetic recording medium, wherein the third layer is adjacent to the second layer, wherein the third layer comprises: a fourth layer comprising ferromagnetic material; and a fifth layer comprising multiferroic material, wherein the fourth layer is adjacent to the fifth layer such that the fifth layer is adjacent to the second layer.
- Example 23 includes all features of example 22, wherein the magnetic recording medium comprises a sixth layer comprising multiferroic material, wherein the sixth layer is adjacent to the fourth layer such that the fourth layer is sandwiched between the fifth and sixth layers.
- Example 24 includes all features of example 23, wherein the magnetic recording medium comprises a seventh layer comprising an insulating material sandwiched between the fifth layer and the second layer, wherein the insulating material comprises a material which comprises: Al, O, Si, C, sapphire, SiC, or diamond.
- Example 25 includes all features of example 23, wherein the multiferroic material of the fifth and sixth layers comprises a material which includes one of: Bi, Fe, or O.
- Example 26 according to any one of examples 21 to 25, wherein the multiferroic material of the fifth layer comprises a material which includes one of: Bi, Fe, or O.
- Example 27 according to any one of examples 21 to 25, wherein the second layer comprises a material selected from a group which includes one of: Mo, Pd, Cr, Pt, or CoCrPt.
- Example 28 according to any one of examples 21 to 25, wherein the method of example 28 comprises forming a substrate adjacent to the heat spreading layer.
- Example 29 which includes features of example 28, wherein the substrate is a glass substrate.
- Example 30 according to any one of example 21 to 25, wherein the method of example 30 comprises writing to the third layer via a first mechanical tip that is to provide a first electrostatic field to the third layer, wherein the first mechanical tip is closer to the fourth layer than the fifth layer.
- Example 31 includes all features of example 21, wherein the method of example 31 comprises writing to the third layer via a magnet that is to provide a magnetic field which is controlled by the first electrostatic field from the first mechanical tip.
- Example 32 includes all features of example 30, wherein the method of example 32 comprises writing to the third layer via a second mechanical tip that is to provide a second electrostatic field to the third layer, wherein the second mechanical tip is closer to the fifth layer than the fourth layer.
- Example 33 includes all features of example 32, wherein the method of example 33 comprises applying via the first and second mechanical tips piezoresponse force microscopy (PFM) to the fourth and fifth layers, respectively.
- PFM piezoresponse force microscopy
- Example 34 includes all features of example 33, wherein the first and second mechanical tips are ferroelectric tips.
- Example 35 includes all features of example 33, wherein the third layer is read from via free magnet coupled to a fixed magnet via a non-magnetic metal.
- Example 36 according to any one of examples 21 to 25, wherein the method of example 36 comprises forming a cladding layer adjacent to the magnetic recording medium, wherein the cladding layer comprises a material which includes one of: F, C, O,
- PFPE perfluoropoly ether
- Z-Type Perfluoro Poly Ether Lubricant Polymer Z-Dol 4000, Z- Tetroal, ZDol 7800, or Cyclotriphosphazenes
- Example 37 according to any one of examples 21 to 25, wherein the magnetic recording medium includes a plurality of magnetic components organized in an array configuration.
- Example 38 according to any one of examples 21 to 25, wherein the fourth layer comprises a material which includes one of: Fe, Ni, Co and their alloys, magnetic insulators, orHeusler alloys of the form XzYZ.
- Example 40 includes all features of example 28, wherein the magnetic insulators comprise a material which includes one of: Fe, O, Y, Al, magnetite Fe 3 0 4 , or
- Example 41 includes all features of example 38, wherein the Heusler alloys includes one of: Mn, Ga, Co, Mn, Ge, Co, Fe, Al, Cu, In, Sn, Ni, Sn, Sb, Si, Pd, V, M Ga, Co 2 FeAl, Co 2 FeGeGa, Cu 2 MnAl, Cu 2 MnIn, Cu 2 MnSn, Ni 2 MnAl, Ni 2 MnIn, Ni 2 MnSn, Ni 2 MnSb, Ni 2 MnGa, Co 2 MnAl, Co 2 MnSi, Co 2 MnGa, Co 2 MnGe, Pd 2 MnAl, Pd 2 MnIn, Pd 2 MnSn, Pd 2 MnSb, Co 2 FeSi, Fe 2 Val, Mn 2 VGa, or Co 2 FeGe.
- the Heusler alloys includes one of: Mn, Ga, Co, Mn, Ge, Co, Fe, Al, Cu, In, Sn, Ni,
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Semiconductor Memories (AREA)
Abstract
L'invention concerne un appareil qui comprend : une première couche pour un étalement de chaleur; une seconde couche comprenant un métal de transition, la deuxième couche étant adjacente à la première couche; et une troisième couche comprenant un support d'enregistrement magnétique, la troisième couche étant adjacente à la deuxième couche, la troisième couche comprenant : une quatrième couche comprenant un matériau ferromagnétique; et une cinquième couche comprenant un matériau multiferroïque, la quatrième couche étant adjacente à la cinquième couche de sorte que la cinquième couche soit adjacente à la deuxième couche.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2016/068597 WO2018118095A1 (fr) | 2016-12-23 | 2016-12-23 | Support d'enregistrement multiferroïque et capteur de lecture |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2016/068597 WO2018118095A1 (fr) | 2016-12-23 | 2016-12-23 | Support d'enregistrement multiferroïque et capteur de lecture |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2018118095A1 true WO2018118095A1 (fr) | 2018-06-28 |
Family
ID=62627100
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2016/068597 WO2018118095A1 (fr) | 2016-12-23 | 2016-12-23 | Support d'enregistrement multiferroïque et capteur de lecture |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2018118095A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113611795A (zh) * | 2021-06-15 | 2021-11-05 | 北京航空航天大学 | 垂直结构堆叠的磁旋逻辑器件及实现信息存取的方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998000572A1 (fr) * | 1996-07-01 | 1998-01-08 | Alyn Corporation | Substrats de disques magnetiques constitues de composites en ceramique-matrice metallique avec ou sans placage metallique |
US20070008656A1 (en) * | 2005-07-06 | 2007-01-11 | Headway Technologies, Inc. | Thermoelectric cooling of CCP-CPP devices |
US20080024910A1 (en) * | 2006-07-25 | 2008-01-31 | Seagate Technology Llc | Electric field assisted writing using a multiferroic recording media |
US20100188773A1 (en) * | 2009-01-29 | 2010-07-29 | Seagate Technology Llc | Multiferroic Storage Medium |
US8576672B1 (en) * | 2012-05-25 | 2013-11-05 | Seagate Technology Llc | Heat sink layer |
-
2016
- 2016-12-23 WO PCT/US2016/068597 patent/WO2018118095A1/fr active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998000572A1 (fr) * | 1996-07-01 | 1998-01-08 | Alyn Corporation | Substrats de disques magnetiques constitues de composites en ceramique-matrice metallique avec ou sans placage metallique |
US20070008656A1 (en) * | 2005-07-06 | 2007-01-11 | Headway Technologies, Inc. | Thermoelectric cooling of CCP-CPP devices |
US20080024910A1 (en) * | 2006-07-25 | 2008-01-31 | Seagate Technology Llc | Electric field assisted writing using a multiferroic recording media |
US20100188773A1 (en) * | 2009-01-29 | 2010-07-29 | Seagate Technology Llc | Multiferroic Storage Medium |
US8576672B1 (en) * | 2012-05-25 | 2013-11-05 | Seagate Technology Llc | Heat sink layer |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113611795A (zh) * | 2021-06-15 | 2021-11-05 | 北京航空航天大学 | 垂直结构堆叠的磁旋逻辑器件及实现信息存取的方法 |
CN113611795B (zh) * | 2021-06-15 | 2023-09-26 | 北京航空航天大学 | 垂直结构堆叠的磁旋逻辑器件及实现信息存取的方法 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US11575083B2 (en) | Insertion layer between spin hall effect or spin orbit torque electrode and free magnet for improved magnetic memory | |
US11251365B2 (en) | High blocking temperature spin orbit torque electrode | |
US11594270B2 (en) | Perpendicular spin injection via spatial modulation of spin orbit coupling | |
US11476412B2 (en) | Perpendicular exchange bias with antiferromagnet for spin orbit coupling based memory | |
EP3570283A1 (fr) | Mémoire magnétique avec matériau antiferromagnétique chiral pour la commutation d'aimants | |
CN107660304B (zh) | 用于逻辑器件和存储器件的金属自旋超晶格 | |
US11818963B2 (en) | Nano-rod spin orbit coupling based magnetic random access memory with shape induced perpendicular magnetic anisotropy | |
US11600659B2 (en) | Cross-point magnetic random access memory with piezoelectric selector | |
CN107004759B (zh) | 磁电器件和互连件 | |
TW201719945A (zh) | 具有以自旋軌道耦合而切換的磁性絕緣體之自旋邏輯 | |
US20190386203A1 (en) | Spin orbit coupling memory device with top spin orbit coupling electrode and selector | |
US10636840B2 (en) | Quaternary spin hall memory | |
US10998495B2 (en) | Magnetostrictive stack and corresponding bit-cell | |
WO2017105396A1 (fr) | Appareil à réseau neuronal cellulaire oscillant magnétoélectrique et procédé | |
WO2019125383A1 (fr) | Mémoire à base de couplage spin-orbite perpendiculaire avec couche libre composite | |
WO2019125381A1 (fr) | Mémoire à base de couplage spin-orbite avec couple de spin de sous-réseau | |
WO2017222521A1 (fr) | Mémoire à effet hall de spin à base d'anisotropie magnétique perpendiculaire, utilisant l'effet spin-orbite | |
CN109937483B (zh) | 垂直磁电自旋轨道逻辑 | |
WO2018125106A1 (fr) | Capteurs de champ magnétique vectoriel utilisant une lecture de spin-orbite | |
WO2019125384A1 (fr) | Mémoire basée sur un couplage spin-orbite avec aimant isolant | |
WO2019005147A1 (fr) | Mémoire à effet hall de spin à base d'anisotropie à aimant perpendiculaire, utilisant l'effet spin-orbite et le champ d'échange | |
US10910556B2 (en) | Magnetic and spin logic devices based on Jahn-Teller materials | |
WO2018118095A1 (fr) | Support d'enregistrement multiferroïque et capteur de lecture | |
WO2017034564A1 (fr) | Commutation par magnétostriction à impulsion unique par l'intermédiaire d'un empilement de magnétisation hybride | |
WO2019125366A1 (fr) | Mémoire à base de couplage spin-orbite avec modulation de résistivité |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 16924416 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 16924416 Country of ref document: EP Kind code of ref document: A1 |