WO2018086419A1 - 一种绝缘子表面等值盐密测量方法及装置 - Google Patents

一种绝缘子表面等值盐密测量方法及装置 Download PDF

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WO2018086419A1
WO2018086419A1 PCT/CN2017/103230 CN2017103230W WO2018086419A1 WO 2018086419 A1 WO2018086419 A1 WO 2018086419A1 CN 2017103230 W CN2017103230 W CN 2017103230W WO 2018086419 A1 WO2018086419 A1 WO 2018086419A1
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density
equivalent
insulator
ion
salt
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PCT/CN2017/103230
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French (fr)
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王希林
洪骁
王晗
陈灿
赵晨龙
叶蔚安
贾志东
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清华大学深圳研究生院
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Publication of WO2018086419A1 publication Critical patent/WO2018086419A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited

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  • the invention relates to a method and a device for measuring the equivalent salt density of an insulator surface.
  • the good external insulation state of the transmission line is an important guarantee for the safe operation of the power system.
  • the silicone rubber materials represented by composite insulators (synthetic insulators), climbing skirts and room temperature vulcanized silicone rubber coatings (RTV coatings) have been significantly used in the field of external insulation of power systems, and the resistance to flashover of external insulation equipment has been significantly improved.
  • the current method for characterizing the surface contamination of insulators is the equivalent salt density method.
  • the equivalent salt density refers to the mass of NaCl corresponding to the content of the conductive substance attached to the contamination per square centimeter of the surface of the insulator, which is referred to as the equivalent salt density.
  • the technical problem to be solved by the present invention is to make up for the deficiencies of the above prior art, and to provide a method and a device for measuring the equivalent salt density of an insulator surface, which can realize the on-line measurement of the pollution component and the equivalent salt density without power-off sampling.
  • the invention relates to an equivalent salt density measuring method for an insulator surface, comprising the steps of: S1, focusing a pulsed laser light source on a dirty surface of an insulator to be detected, and using a laser light source to emit a laser having a pulse width of 20 ns or less to cause a dirty substance on the surface of the insulator; It is induced to form a plasma, and collects spectral information emitted during plasma expansion and cooling; S2, establishes a relationship model between the density of each ion in the common soluble salt in the contamination of the insulator surface and the spectral characteristics after laser excitation generates plasma; S3, input the spectral information collected in step S1 into step S2.
  • An insulator surface equivalent salt density measuring device comprises a pulsed laser light source, an acquisition module, a storage module, an analysis module and a calculation module;
  • the pulsed laser light source is focused on a dirty surface of the insulator to be detected, and is used for emitting a pulse width of less than or equal to A 20 ns laser causes a fouling substance on the surface of the insulator to be vaporized to form a plasma;
  • the acquisition module is configured to collect spectral information emitted during the plasma expansion and cooling process; and the storage module is used to store common impurities on the insulator surface.
  • the analysis module is configured to analyze the surface of the insulator to be detected after the spectral information is input into the relationship model The ionic composition of the contaminated material and the ion density of the various ions; the calculation module is for calculating the equivalent salt density of the contaminated material based on the ion densities of the various ions.
  • the method and device for measuring the surface salt density of the insulator surface of the present invention utilizes a pulsed laser light source to emit a laser having a certain pulse width to focus on the surface of the insulator to be detected, and emit a laser to vaporize the surface of the insulator to be detected to form a plasma.
  • the spectral information emitted during the plasma expansion cooling process is collected. Extracting the spectral characteristics of common salinity under various known contents, and using the correlation between the spectral characteristics of laser plasma and the spectral characteristics of common contamination components, the composition of the pollutant elements and the salt content of the surface of the insulator to be tested are obtained. Calculate the equivalent salt density of the contamination.
  • the quantitative analysis of the induced breakdown spectrum by laser remote excitation can be directly tested under the condition that the insulator is charged during the field operation of the transmission line, thereby realizing the online test.
  • the remote laser induced spectroscopy technique is used to establish a quantitative analysis system, which directly measures the contamination of the surface of the insulator, and then converts it into the standard equivalent salt density (ESDD), which can analyze the contaminated components and equivalence salt density.
  • ESDD standard equivalent salt density
  • a method for measuring the equivalent salt density of an insulator surface including the following steps:
  • Step 1 Focusing the pulsed laser light source on the dirty surface of the insulator to be detected, and using a laser light source to emit a laser having a pulse width of 20 ns or less, so that the dirty material on the surface of the insulator is vaporized to form a plasma, and the plasma is expanded and cooled. Spectral information emitted.
  • a laser-induced breakdown spectroscopy (LIBS) platform can be used to perform plasma excitation on the surface of the insulator.
  • the remote LIBS platform of this embodiment includes Q-switched Second-pulse laser, charge-coupled device (CCD), three main parts of the spectrometer, and additional optical remote devices such as beam expanders and variable-range fiber focusing systems.
  • the laser pulse having a pulse width of 20 ns or less is emitted by the nanosecond pulse laser source, and after being expanded, the fiber focusing system focuses on the contaminated surface of the insulator to be detected. The laser induces the plasma.
  • the spectrum emitted by the plasma is detected by the fiber probe, and then transmitted to the spectrometer through the optical fiber for splitting.
  • the CCD converts the collected optical signal into a data signal and transmits it to the computer. Data saving and processing.
  • the synchronization process between the modules can be achieved by setting the delay time for the spectrometer and CCD.
  • the above-mentioned platform can realize laser excitation induction, and is especially suitable for remote excitation induction, so that long-distance (0-20 m) focusing can be performed to irradiate the excitation plasma.
  • the laser needs to be a pulsed laser, and the pulse width is less than or equal to 20 ns, so that the energy density is sufficient to cause the contaminated material on the surface of the insulator to be induced to vaporize to form a plasma.
  • Step 2 Establish a model for the relationship between the density of each ion in the common soluble salt in the contamination of the insulator surface and the spectral characteristics after laser excitation.
  • the laser spectral intensity of various major ion densities in the contamination can be manually calibrated, and then a mathematical model is established from the ion density and the spectral intensity to obtain a relationship model between the two.
  • common soluble salts in contamination include CaSO 4 (mass fraction 40% to 90%) and NaCl (mass fraction 10% to 40%), and other components are NaNO 3 , KNO 3 , MgSO 4 , (NH 4 ). 2 SO 4 , Mg(NO 3 ) 2 , CaCl 2 , and the like.
  • the calibrated contamination component can also be determined based on the actual composition of the site contamination, with soluble salts that can be predicted by component analysis of the soil near the insulator line to be tested.
  • i contamination samples were prepared, sample numbers C 1 , ..., C i , containing different amounts of various soluble salts to be calibrated.
  • sample numbers C 1 , ..., C i containing different amounts of various soluble salts to be calibrated.
  • eight soluble salts are included in each sample, and the content of the same soluble salt included in each sample is different. Since the content of each soluble salt is known, the ion density of various ions can be obtained by simple conversion. The ion density of various ions is output as a variable of the model to be modeled.
  • the above-mentioned i samples were plasma-excited using a laser light source (a laser irradiation apparatus without an additional remote device was also used) to measure the spectral signal emitted during the plasma decay process.
  • the i spectral signals are preprocessed, and the spectral line intensity of each spectral signal is normalized to reduce the influence of instrument parameter fluctuation on the line intensity.
  • One or more spectral lines of each ion element are selected as characteristic lines from the spectral lines of the i normalized spectral signals, and the lines without self-absorption and other spectral interference are selected for selection.
  • For the characteristic line record its line intensity.
  • the i samples correspond to i spectral signals, and each ion corresponds to the spectral intensity of the i spectra, and is input as a variable of the model to be modeled.
  • the mathematical relationship model between the two can be calibrated.
  • the specific calibration process can be established by common data processing methods.
  • the partial least squares method is taken as an example for explanation.
  • the cross-validation method is adopted, and C 1 -C i-1 is the calibration sample, and C i is the predicted sample, and the residual square sum of the line intensity of the characteristic line corresponding to each ion in the predicted sample is calculated (PRESS). .
  • C i-1 is selected as the predicted sample
  • C 1 -C i-2 is the calibration sample
  • C i is the calibration sample
  • the PRESS of the spectral line intensity of the characteristic line corresponding to each ion in the predicted sample is calculated.
  • This cycle is performed i times, and the sum of squares of i residuals corresponding to each ion is obtained.
  • the average of the sum of the squares of the i residuals is taken as the PRESS value of the overall evaluation.
  • a multivariate linear model of elemental line intensity of Na + ion density with respect to the best factor is calibrated.
  • a linear linear model of the elemental line intensity of the Ca 2+ ion density with respect to the best factor can be calibrated, and the remaining ions, such as K + ion density, Mg 2+ ion density, NH 4 + ion density, Cl - ion density, NO 3 - ion density, SO 4 2- ion density and intensity of spectral lines of a polyhydric linear model can be obtained according to the best respective corresponding calibration factor.
  • Step 3 The laser-induced spectrum corresponding to the contamination of the surface of the insulator to be detected at the site is measured, and the type of each ion in the measured contamination and the density of each ion are obtained by combining the above-mentioned calibration model with the measured spectral intensity.
  • the surface of the insulator on the field power-on operation is plasma-excited by the above-mentioned remote LIBS platform, and the spectrum is measured. After the data is processed, the spectral line intensity parameters of the spectrum are brought into the model calibrated in step two to obtain the kinds of ions in the contamination and the ion density of each ion.
  • Step 4 Convert the measured ion densities to ESDD.
  • the density of ions in a combination of ions with low solubility and high decomposition at high voltage can be corrected, such as CaSO 4 and (NH 4 ) 2 SO 4 .
  • step 2 is used to model the calibration, and the corresponding salts are added to calibrate the relationship between ion density and spectral line intensity.
  • step 3 can be analyzed. When converting in step 4, it can be converted in the equivalent conversion of conductivity.
  • the in-line test of the insulator is performed by the laser remotely induced induced breakdown spectroscopy for quantitative analysis.
  • the remote laser induced spectroscopy technique was used to establish a quantitative analysis system to directly measure the contamination of the insulator surface, and obtain the ion density of each ion in the contamination attached to the surface of the insulator surface per square centimeter, and then convert it into Na + by conductivity equivalent .
  • the ion density, the ion density of Cl - results in the equivalent salt density (ESDD) that is common in the standard.
  • the measuring method of the specific embodiment can not only analyze the constituent components of the pollution, but also the accurate salt density measurement result, which is convenient for real-time monitoring of the current pollution state of the insulator and preventing the occurrence of a pollution flash accident.

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Abstract

一种绝缘子表面等值盐密测量方法及装置，测量方法包括以下步骤：S1，将脉冲激光光源聚焦于待检测的绝缘子的污秽表面，利用激光光源发出脉宽小于等于20ns的激光使得所述绝缘子表面的污秽物质被诱导形成等离子体，采集等离子体膨胀冷却过程中发射的光谱信息；S2，建立绝缘子表面污秽中常见可溶性盐中的各离子的密度与激光激发产生等离子体后的光谱特征之间的关系模型；S3，将步骤S1中采集的光谱信息输入步骤S2中的关系模型中，分析得到所述待检测的绝缘子表面的污秽物质的离子组成和各种离子的离子密度；S4，根据各种离子的离子密度计算污秽物质的等值盐密。该测量方法及装置，不用停电取样，可实现污秽成分以及等值盐密的在线测量。

Description

一种绝缘子表面等值盐密测量方法及装置 【技术领域】
本发明涉及绝缘子表面等值盐密的测量方法及装置。
【背景技术】
输电线路良好的外绝缘状态是电力系统安全运行的重要保障。以复合绝缘子(合成绝缘子)、增爬裙和室温硫化硅橡胶涂料(RTV涂料)为代表的硅橡胶材料在电力系统外绝缘领域大量使用后，外绝缘设备的耐污闪能力才得到显著改善。
近几年来，一方面，环境污染问题日益严重以及复杂，另一方面，交直流输电线路的电压等级不断提高，导致发生了很多起超高压输电线路的污闪事故。可见，在部分环境或者情形下，硅橡胶绝缘子及RTV涂料并不能完全阻止污闪事故的发生。
实际运行中，防污闪关键之一在于监测运行中绝缘子的表面污秽度。在污秽超过限值后及时进行停电清扫或带电水冲洗，可有效减少污闪事故的发生。现行的表征绝缘子表面污秽度的方法是等值盐密法。等值附盐密度是指绝缘子表面每平方厘米的面积上附着的污秽中导电物质的含量所相当的NaCl的质量，简称等值盐密。现有测量等值盐密的方法中，测量前需要对绝缘子进行取样，然后用一定量的蒸馏水，按规定的方法清洗绝缘子上的污秽，最后测量含有污秽的水的电导率来确定ESDD。这种方法需要进行停电取样，影响了电网供电可靠性，因此需要寻找一种实时的污秽成分在线测量方式。
【发明内容】
本发明所要解决的技术问题是：弥补上述现有技术的不足，提出一种绝缘子表面等值盐密测量方法及装置，不用停电取样，可实现污秽成分以及等值盐密的在线测量。
本发明的技术问题通过以下的技术方案予以解决：
一种绝缘子表面等值盐密测量方法，包括以下步骤：S1，将脉冲激光光源聚焦于待检测的绝缘子的污秽表面，利用激光光源发出脉宽小于等于20ns的激光使得所述绝缘子表面的污秽物质被诱导形成等离子体，采集等离子体膨胀冷却过程中发射的光谱信息；S2，建立绝缘子表面污秽中常见可溶性盐中的各离子的密度与激光激发产生等离子体后的光谱特征之间的关系模型；S3，将步骤S1中采集的光谱信息输入步骤S2 中的关系模型中，分析得到所述待检测的绝缘子表面的污秽物质的离子组成和各种离子的离子密度；S4，根据步骤S3得到的各种离子的离子密度计算污秽物质的等值盐密。
一种绝缘子表面等值盐密测量装置，包括脉冲激光光源、采集模块、存储模块、分析模块和计算模块；所述脉冲激光光源聚焦于待检测的绝缘子的污秽表面，用于发出脉宽小于等于20ns的激光使得所述绝缘子表面的污秽物质被气化形成等离子体；所述采集模块用于采集所述等离子体膨胀冷却过程中发射的光谱信息；所述存储模块用于存储绝缘子表面污秽中常见可溶性盐中的各离子的密度与激光激发产生等离子后的光谱特征之间的关系模型；所述分析模块用于在所述光谱信息输入所述关系模型中后分析得到所述待检测的绝缘子表面的污秽物质的离子组成和各种离子的离子密度；所述计算模块用于根据所述各种离子的离子密度计算污秽物质的等值盐密。
本发明与现有技术对比的有益效果是：
本发明的绝缘子表面等值盐密测量方法及装置，利用脉冲激光光源发出一定脉宽的激光聚焦于待检测的绝缘子污秽表面，发出激光使得待检测的绝缘子污秽表面部分被气化形成等离子体，采集等离子体膨胀冷却过程中发射的光谱信息。提取常见污秽各种盐分在已知含量下的光谱特征指标，利用激光等离子体光谱特征指标与常见污秽成分含量的光谱特征指标的关联性，得到待测绝缘子表面的污秽元素组成和盐分含量，从而计算污秽的等值盐密。本发明的方法中，通过激光远程激发诱导击穿光谱进行定量分析，可针对输电线路现场运行时，绝缘子带电情形下直接测试，从而实现在线测试。利用远程激光诱导光谱技术建立定量分析体系，对绝缘子表面污秽的成分进行直接测量，然后换算成标准中通用的等值盐密(ESDD)，既能分析得到污秽的组成成分，同时等值盐密测量结果精确，利于实时监测绝缘子当前的污秽状态，防止污闪事故的发生。
【具体实施方式】
本具体实施方式中提供一种绝缘子表面等值盐密的测量方法，包括以下步骤：
步骤一：将脉冲激光光源聚焦于待检测的绝缘子的污秽表面，利用激光光源发出脉宽小于等于20ns的激光使得所述绝缘子表面的污秽物质被气化形成等离子体，采集等离子体膨胀冷却过程中发射的光谱信息。
该步骤中，可搭建激光诱导击穿光谱(Laser-induced Breakdown Spectroscopy，LIBS)平台对绝缘子表面进行等离子体激发。本具体实施方式的远程LIBS平台包含调Q纳 秒脉冲激光器、电荷耦合器件(CCD)、光谱仪三个主体部分，以及扩束器、可变距光纤聚焦系统等附加的光学远程设备。通过纳秒脉冲激光源发射脉宽小于等于20ns的激光脉冲，进行扩束后由光纤聚焦系统聚焦至待检测的绝缘子的污秽表面。激光诱导激发出等离子体，等离子体衰减过程中，等离子体发出的光谱被光纤探头探测后，通过光纤传递至光谱仪进行分光，同时CCD将采集的光信号转化为数据信号传入计算机，由计算机进行数据保存和处理。各模块之间的同步过程可通过对光谱仪和CCD设置延迟时间来实现。
上述平台即可实现激光激发诱导，尤其适合远程激发诱导，从而可实现远距离(0～20m)聚焦后进行照射激发等离子体。需说明的是，激光需为脉冲激光，且脉宽小于等于20ns，从而具备足够能量密度使得绝缘子表面的污秽物质被诱导气化形成等离子体。
步骤二：建立绝缘子表面污秽中常见可溶性盐中的各离子的密度与激光激发产生等离子体后的光谱特征之间的关系模型。
该步骤中，可先通过人工标定污秽中各种主要离子密度的激光光谱强度，然后由离子密度和光谱强度建立数学模型，得到两者之间的关系模型。
一般地，污秽中的常见可溶性盐包括CaSO4(质量分数40％～90％)和NaCl(质量分数10％～40％)，其他成分还有NaNO3、KNO3、MgSO4、(NH4)2SO4、Mg(NO3)2、CaCl2等。标定的污秽成分还可以根据现场污秽的实际成分确定，具有可通过待测的绝缘子线路附近的土壤进行成分分析后预测会包含的可溶性盐。
确定出待标定的多种可溶性盐后，制备i个污秽样品，样品编号为C1，……，Ci，包含不同含量的多种待标定的可溶性盐。如以上述8种可溶性盐为例，则每一样品中均包括8种可溶性盐，且各样品中包括的同一可溶性盐的含量不相同。由于各可溶性盐的含量已知，通过简单的换算可以得到各种离子的离子密度。将各种离子的离子密度作为待建模模型的变量输出。
使用激光光源(也可采用不带附加远程设备的激光照射仪器)对上述i个样品进行等离子体激发，测量等离子衰减过程中发出的光谱信号。
对i个光谱信号进行预处理，对各光谱信号的谱线强度进行面积归一化，从而减小仪器参数波动对谱线强度的影响。从i个归一化后的光谱信号的谱线中选取各离子元素的一条或者多条谱线作为特征谱线，选取时选择无自吸收以及其他谱线干扰的谱线作 为特征谱线，记录其谱线强度。该i个样品对应i个光谱信号，则各离子均对应i个光谱的谱线强度，将其作为待建模模型的变量输入。
基于上述变量输入和变量输出，可标定两者之间的数学关系模型。具体标定过程，可通过常见的数据处理方法建立数学模型。如下以偏最小二乘法为例进行说明。
标定时，采用交互验证法，令C1-Ci-1为定标样品，Ci为预测样品，计算预测样品中各离子对应的特征谱线的谱线强度的残差平方和(PRESS)。然后再选取Ci-1为预测样品，C1-Ci-2，Ci为定标样品，计算预测样品中各离子对应的特征谱线的谱线强度的PRESS。如此循环i次，得到各离子对应的i个残差平方和。最后取i个残差平方和的平均值为总体评价的PRESS值。利用不同数量的PLS因子进行偏最小二乘法计算，当PLS因子过多或过少，PRESS值都会偏大，据此确定出使评价值最小的PLS因子作为最佳因子。
以Na+为例，根据Na+离子对应的最佳因子，标定出Na+离子密度关于最佳因子的元素谱线强度多元一次线性模型。同样地，根据Ca2+离子对应的最佳因子，也可以标定出Ca2+离子密度关于最佳因子的元素谱线强度多元一次线性模型，其余离子，例如K+离子密度、Mg2+离子密度、NH4 +离子密度、Cl-离子密度、NO3 -离子密度、SO4 2-离子密度等与光谱谱线强度的多元一次线性模型也可以根据各自对应的最佳因子标定得到。
步骤三：实测现场待检测的绝缘子表面的污秽对应的激光诱导光谱，将上述标定的模型与实测的光谱强度进行结合参考即可得到实测的污秽中各离子的种类以及各离子密度。
具体地，通过上述带远程的LIBS平台对现场通电运行的绝缘子表面污秽进行等离子激发，测其光谱。数据处理后，将光谱的谱线强度参数带入步骤二标定的模型中即可得到污秽中各种离子的种类以及各离子的离子密度。
步骤四：将测得的各种离子密度换算成ESDD。
换算前，可先将一些溶解度较低、高电压下易分解的离子组合中的离子的密度进行修正，如CaSO4、(NH4)2SO4等。
换算时，将步骤三得到的除Na+以外的阳离子与Na+进行导电性等价，则污秽中的等值Na+的离子密度＝Na++1.15×Ca2++1.917×Mg2++1.278×NH4 +(等式右边均为离子密度，所有变量的单位均为mg/cm2)。
将骤三得到的除Cl-以外的阴离子与Cl-进行导电性等价，则污秽的等值Cl-的离子 密度＝Cl-+0.573×NO3 -+0.740×SO4 2-(同上式说明)。
最终，污秽成分的ESDD＝等值Na+的离子密度+等值Cl-的离子密度。
需说明的是，如实际的地区环境中导致污秽中含有其他离子时，也可以采用上述方法进行测量。相应地，步骤二建模标定时，加入相应的盐类，标定出离子密度与光谱谱线强度的关系模型。步骤三进行分析即可。步骤四中进行换算时，在导电性等价换算时作相应的换算即可。
本具体实施方式中，通过激光远程激发诱导击穿光谱进行定量分析，可实现绝缘子带电进行在线测试。利用远程激光诱导光谱技术建立定量分析体系，对绝缘子表面污秽的成分进行直接测量，得到绝缘子表面每平方厘米的面积上附着的污秽中各离子的离子密度，然后通过导电性等价换算成Na+的离子密度，Cl-的离子密度，从而得到标准中通用的等值盐密(ESDD)。本具体实施方式的测量方法，既能分析得到污秽的组成成分，同时等值盐密测量结果精确，利于实时监测绝缘子当前的污秽状态，防止污闪事故的发生。
以上内容是结合具体的优选实施方式对本发明所作的进一步详细说明，不能认定本发明的具体实施只局限于这些说明。对于本发明所属技术领域的普通技术人员来说，在不脱离本发明构思的前提下做出若干替代或明显变型，而且性能或用途相同，都应当视为属于本发明的保护范围。

Claims (9)

  1. 一种绝缘子表面等值盐密测量方法，其特征在于：包括以下步骤：S1，将脉冲激光光源聚焦于待检测的绝缘子的污秽表面，利用激光光源发出脉宽小于等于20ns的激光使得所述绝缘子表面的污秽物质被诱导形成等离子体，采集等离子体膨胀冷却过程中发射的光谱信息；S2，建立绝缘子表面污秽中常见可溶性盐中的各离子的密度与激光激发产生等离子体后的光谱特征之间的关系模型；S3，将步骤S1中采集的光谱信息输入步骤S2中的关系模型中，分析得到所述待检测的绝缘子表面的污秽物质的离子组成和各种离子的离子密度；S4，根据步骤S3得到的各种离子的离子密度计算污秽物质的等值盐密。
  2. 根据权利要求1所述的绝缘子表面等值盐密测量方法，其特征在于：步骤S2中包括如下步骤：a，制备i个包含常见可溶性盐的样品，样品编号为C1，……，Ci，各样品中可溶性盐的含量不同；b，使用激光光源照射所述i个样品进行等离子激发，测量等离子体在膨胀冷却过程中发射的光谱信号；c，对i个光谱信号进行归一化处理，从i个归一化后的光谱信号的谱线中选取各离子元素的对应的一条或者多条谱线作为特征谱线，记录特征谱线的谱线强度；d，根据步骤a中各可溶性盐的含量与步骤c中的特征谱线强度，标定得到各离子的密度与谱线强度之间的多元一次线性关系模型。
  3. 根据权利要求2所述的绝缘子表面等值盐密测量方法，其特征在于：步骤d中，采用偏最小二乘法标定得到离子的密度与谱线强度之间的多元一次线性关系模型。
  4. 根据权利要求3所述的绝缘子表面等值盐密测量方法，其特征在于：标定时，以C1～Ci-1为定标样品，Ci为预测样品，计算预测样品中各离子对应的特征谱线的谱线强度的残差平方和；再以Ci-1为预测样品，C1～Ci-2，Ci为定标样品，计算预测样品中各离子对应的特征谱线的谱线强度的残差平方和；依次循环i次，得到各离子对应的i个残差平方和，取各离子对应的i个残差平方和的平均值为评价值；利用不同数量的PLS因子进行偏最小二乘法计算，确定出使评价值最小的PLS因子作为最佳因子；标定时，根据各离子对应的最佳因子，标定出各离子的密度与谱线强度的多元一次线性关系模型。
  5. 根据权利要求2所述的绝缘子表面等值盐密测量方法，其特征在于：步骤a中，常见可溶性盐中包括根据待检测的绝缘子所在的地区的土壤进行成分分析后预测的可 溶性盐。
  6. 根据权利要求2所述的绝缘子表面等值盐密测量方法，其特征在于：步骤a中，常见可溶性盐包括CaSO4、NaCl、NaNO3、KNO3、MgSO4、(NH4)2SO4、Mg(NO3)2、CaCl2。
  7. 根据权利要求1所述的绝缘子表面等值盐密测量方法，其特征在于：步骤S4中包括以下步骤：将除Na+以外的阳离子与Na+进行导电性等价得到等价Na+密度，将等价Na+密度与Na+的密度相加得到污秽物质的等值Na+密度；将除Cl-以外的阴离子与Cl-进行导电性等价得到等价Cl-密度，将等价Cl-密度与Cl-的密度相加得到污秽物质的等值Cl-密度；将污秽物质的等值Na+密度与污秽物质的等值Cl-密度相加得到污秽物质的等值盐密。
  8. 一种绝缘子表面等值盐密测量装置，其特征在于：包括脉冲激光光源、采集模块、存储模块、分析模块和计算模块；所述脉冲激光光源聚焦于待检测的绝缘子的污秽表面，用于发出脉宽小于等于20ns的激光使得所述绝缘子表面的污秽物质被气化形成等离子体；所述采集模块用于采集所述等离子体膨胀冷却过程中发射的光谱信息；所述存储模块用于存储绝缘子表面污秽中常见可溶性盐中的各离子的密度与激光激发产生等离子后的光谱特征之间的关系模型；所述分析模块用于在所述光谱信息输入所述关系模型中后分析得到所述待检测的绝缘子表面的污秽物质的离子组成和各种离子的离子密度；所述计算模块用于根据所述各种离子的离子密度计算污秽物质的等值盐密。
  9. 根据权利要求8所述的绝缘子表面等值盐密测量装置，其特征在于：所述计算模块包括阳离子换算模块，第一相加模块，阴离子换算模块，第二相加模块和第三相加模块；所述阳离子换算模块用于将除Na+以外的阳离子与Na+进行导电性等价得到等价Na+密度；所述第一相加模块用于将等价Na+密度与Na+的密度相加得到污秽物质的等值Na+密度；所述阴离子换算模块用于将除Cl-以外的阴离子与Cl-进行导电性等价得到等价Cl-密度；所述第二相加模块用于将等价Cl-密度与Cl-的密度相加得到污秽物质的等值Cl-密度；所述第三相加模块用于将污秽物质的等值Na+密度与污秽物质的等值Cl-密度相加得到污秽物质的等值盐密。
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CN113095499A (zh) * 2021-03-26 2021-07-09 云南电网有限责任公司电力科学研究院 一种绝缘子等值附盐密度的预测方法
CN114166895A (zh) * 2021-12-03 2022-03-11 国网山西省电力公司电力科学研究院 用于测量绝缘电阻率表征外绝缘表面污秽度等级的方法
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CN117517335A (zh) * 2023-12-27 2024-02-06 国网辽宁省电力有限公司电力科学研究院 变电设备绝缘子污秽监测系统及方法
CN117517335B (zh) * 2023-12-27 2024-03-29 国网辽宁省电力有限公司电力科学研究院 变电设备绝缘子污秽监测系统及方法

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