WO2018044111A2 - Scanner tridimensionnel et procédé de balayage utilisant une aberration chromatique - Google Patents

Scanner tridimensionnel et procédé de balayage utilisant une aberration chromatique Download PDF

Info

Publication number
WO2018044111A2
WO2018044111A2 PCT/KR2017/009584 KR2017009584W WO2018044111A2 WO 2018044111 A2 WO2018044111 A2 WO 2018044111A2 KR 2017009584 W KR2017009584 W KR 2017009584W WO 2018044111 A2 WO2018044111 A2 WO 2018044111A2
Authority
WO
WIPO (PCT)
Prior art keywords
light
chromatic aberration
pattern
image signal
signal data
Prior art date
Application number
PCT/KR2017/009584
Other languages
English (en)
Korean (ko)
Other versions
WO2018044111A3 (fr
Inventor
이영종
Original Assignee
이영종
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 이영종 filed Critical 이영종
Publication of WO2018044111A2 publication Critical patent/WO2018044111A2/fr
Publication of WO2018044111A3 publication Critical patent/WO2018044111A3/fr

Links

Images

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G02B27/005—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration for correction of secondary colour or higher-order chromatic aberrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00

Definitions

  • the present invention relates to a three-dimensional scanner and a scanning method using chromatic aberration, and more particularly, to determine the depth of the object (depth) based on the focal length of the light and to generate three-dimensional shape data, thereby minimizing the number of times to capture the image and efficient data
  • a three-dimensional scanner and a scanning method for performing a process are particularly preferred.
  • 3D modeling technology is a technology for acquiring three-dimensional shape information about a three-dimensional object, and is a core technology of a 3D printer that is recently gaining attention as well as a model of the tooth shape of a patient in a conventional dentistry. Research on modeling techniques for reproduction and reproduction is actively conducted.
  • FIG. 1 is a diagram schematically illustrating a prior art of 3D scanning using chromatic aberrations (Chromatic Confocal).
  • the light irradiated to a measurement target through some pixels of the DMD forms an image at different focal points according to wavelengths (colors) by a chromatic aberration lens, and the light is reflected back to the image sensor. It is concluded.
  • the height of the measurement target is at a specific wavelength (color) focal length
  • light of the corresponding wavelength (color) is received most strongly in the pixel portion of the image sensor corresponding thereto, thereby obtaining distance information using the same.
  • FIG. 2 is a diagram schematically illustrating a pixel lighting method of a DMD applied to the conventional technology.
  • the number of measurement points measured simultaneously in parallel is reduced, and the area of one area block (dotted rectangle) for pixel scanning is greatly increased. shall.
  • An object of the present invention is to compare the sharpness (sharpness) for each wavelength of the light of the image signal data to determine the depth of the object (1) on the basis of the wavelength with the highest sharpness and the focal length for each wavelength of the light and the three-dimensional shape data
  • the present invention provides a three-dimensional scanner and a scanning method using chromatic aberration to obtain fast and accurate three-dimensional stereoscopic shape data by performing efficient data processing while minimizing the number of image capturing.
  • the light irradiation unit 100 including a light source 110 for emitting light; A chromatic aberration lens (200) for generating chromatic aberration according to the refractive index for each wavelength of light emitted from the light irradiation unit (100); An image sensor 400 that passes through the chromatic aberration lens 200 and senses light 20 reflected from an object to obtain image signal data; And comparing the sharpness of each of the light wavelengths among the image signal data to determine the depth of the object 1 based on the wavelength having the highest sharpness and the focal length for each wavelength of the light, and generating three-dimensional shape data. It may include a calculation processing unit 500.
  • the dichroic mirror 300 reflects the light 20 reflected from the object through the chromatic aberration lens 200 to the image sensor 400. mirror) may be further included.
  • the light irradiator 100 further includes a spatial light modulator 120 (SLM) for changing a pattern of the light irradiated onto the object 1, and the image sensor 400 includes: Image signal data when the object 1 is irradiated with the first pattern before the pattern is changed and image signal data when the object 1 is irradiated with the second pattern after the pattern is changed can be obtained.
  • SLM spatial light modulator 120
  • the spatial light modulator 120 includes one of a pattern mask film, a digital micromirror device (DMD), a liquid crystal display (LCD), and a liquid crystal on silicon (LCOS). It may contain the above.
  • DMD digital micromirror device
  • LCD liquid crystal display
  • LCOS liquid crystal on silicon
  • the calculation processor 500 may determine the depth of the object 1 corresponding to each pattern region by calculating the sharpness of each pattern region of the image signal data reflected from the object 1 in response to the pattern.
  • the light source 110 includes two or more individual light sources 111 that emit light having different wavelengths from each other, and the light irradiator 100 overlaps the light having the different wavelengths with or adjacent to the optical path 1. It may further include a reflector 130 for irradiating to.
  • the light irradiation unit 100 further includes an error correction light source 140 that emits light having a single wavelength, and irradiates the error correction light source 140 to the object 1 that has already obtained accurate dimension data.
  • the apparatus may further include an error compensator 600 for comparing the scanned electrical image signal data with the accurate dimension data to correct an optical error including spherical aberration and / or distortion elements of the chromatic aberration lens 200.
  • the driving unit for adjusting the distance between the light source 110 and the chromatic aberration lens 200, or the distance between the light source 110 and the object 1 further. It may include.
  • the light source 110 of the light irradiation unit 100 emits light; Generating, by the chromatic aberration lens, chromatic aberration according to the refractive index for each wavelength of the light emitted from the light irradiation part 100; Acquiring, by the image sensor 400, the light 20 reflected from the object through the chromatic aberration lens 200 to obtain electrical image signal data; And the arithmetic processing unit 500 to determine the depth of the object 1 based on the wavelength having the highest sharpness and the focal length for each wavelength of the light by comparing sharpness for each wavelength of the light among the image signal data. Obtaining stereoscopic shape data.
  • the dichroic mirror 300 passes through the chromatic aberration lens 200 and reflects the light 20 reflected from the object to the image sensor 400. It may further comprise the step of reflecting.
  • the light irradiator 100 further includes a spatial light modulator 120 (SLM) for changing a pattern of the light irradiated onto the object 1, and the image sensor 400 includes: Image signal data when the object 1 is irradiated with the first pattern before the pattern is changed and image signal data when the object 1 is irradiated with the second pattern after the pattern is changed can be obtained.
  • SLM spatial light modulator 120
  • the spatial light modulator 120 includes one of a pattern mask film, a digital micromirror device (DMD), a liquid crystal display (LCD), and a liquid crystal on silicon (LCOS). It may contain the above.
  • DMD digital micromirror device
  • LCD liquid crystal display
  • LCOS liquid crystal on silicon
  • the operation processor 500 determines the depth of the object 1 and generates three-dimensional shape data, and calculates the sharpness of each pattern region of the image signal data reflected from the object 1 in response to the pattern.
  • the depth of the object 1 corresponding to each pattern region may be determined.
  • the light source 110 includes two or more individual light sources 111 that emit light having different wavelengths from each other, and the reflector 130 of the light irradiation unit 100 overlaps or adjacent to the light having two or more different wavelengths.
  • the method may further include irradiating the object 1 with an optical path.
  • the three-dimensional scanning method using chromatic aberration further includes the step of the error correction light source 140 of the light irradiator 100 emits light having a single wavelength, the error correction unit already
  • the spherical aberration and / or distortion elements of the chromatic aberration lens 200 are compared by comparing the accurate dimension data with the electrical image signal data scanned by irradiating the error correction light source 140 to the object 1 having obtained the correct dimension data.
  • the method may further include correcting an optical error that includes the optical error.
  • the image signal data includes a plurality of unit unit grid image signal data generated by light passing through a micro lens array (MLA) 700 in which microscopic lenses 710 are arranged in a lattice form.
  • the operation processor 500 may determine the depth of the object 1 and generate the three-dimensional shape data based on the focal length of the unit grid image signal data passing through the micro lens array 700. You can judge the depth of 1).
  • the error correction light source 140 of the light irradiation unit 100 further comprises the step of emitting a light having a single wavelength, the error correction unit to the error correction light source 140 to the object 1 has already obtained the correct dimensional data
  • the method may further include correcting an optical error including spherical aberration and / or distortion elements of the chromatic aberration lens 200 by comparing the scanned and electrical image signal data with the accurate dimension data.
  • the image signal data includes a plurality of unit unit grid image signal data generated by the light passing through a micro lens array (MLA) 700 in which microscopic lenses 710 are arranged in a lattice form.
  • the operation processor 500 may determine the depth of the object 1 and generate three-dimensional shape data based on the focal length of the unit grid image signal data passing through the micro lens array 700. The depth of (1) can be judged.
  • the operation processor 500 may determine the depth of the object 1 and generate three-dimensional shape data, by using a focal length function that uses a wavelength value of light corresponding to the image signal data as a variable. You can judge the depth of).
  • the present invention by irradiating a pattern (checked pattern, etc.) to the measurement object and sensing it with the image sensor 400, and generating a three-dimensional shape data through a calculation operation, optically the same as a normal camera
  • a pattern checked pattern, etc.
  • the image sensor 400 By doing so, there is no need to consider interference signals from a signal processing point of view such as crosstalk in the related art, and it is possible to obtain fast and accurate three-dimensional stereoscopic shape data by performing efficient data processing while minimizing the number of image captures. have.
  • FIG. 1 is a diagram schematically illustrating a prior art of 3D scanning using chromatic aberrations (Chromatic Confocal).
  • FIG. 2 is a diagram schematically illustrating a pixel lighting method of a DMD applied to the conventional technology.
  • FIG. 3 is a diagram schematically illustrating a 3D scanner using chromatic aberration according to an embodiment of the present invention.
  • FIG. 4 is a pattern (a) formed by a spatial light modulator (SLM) of a 3D scanner using chromatic aberration according to an embodiment of the present invention, and image signal data (b) acquired by an image sensor when an object is not at a focal length. ) And image signal data (c) acquired by the image sensor when the object is at a focal length.
  • SLM spatial light modulator
  • FIG. 5 schematically illustrates a sharpness curve when the focal length of the image signal data acquired by the image sensor of the 3D scanner using chromatic aberration is correct (a) and not (b). Drawing.
  • FIG. 6 is a view schematically illustrating a case in which a light irradiation part of a 3D scanner using chromatic aberration includes a reflector according to an embodiment of the present invention.
  • FIG. 7A is a diagram schematically illustrating a case in which the light irradiation unit of the 3D scanner using chromatic aberration includes two or more individual light sources emitting light having different wavelengths, according to an embodiment of the present invention.
  • FIG. 7B is a diagram schematically illustrating a case in which the light irradiator of the 3D scanner using chromatic aberration irradiates an object with light having different wavelengths using one light source, according to an embodiment of the present invention.
  • FIG. 8 is a diagram schematically illustrating a method for calibrating a 3D scanner using chromatic aberration according to an embodiment of the present invention.
  • FIG. 9 is a diagram schematically illustrating an example of an image sensor of a 3D scanner using chromatic aberration according to an embodiment of the present invention.
  • FIG. 10 is a view schematically illustrating a three-dimensional scanner including a micro lens array (MLA) using chromatic aberration according to an embodiment of the present invention.
  • MLA micro lens array
  • FIG. 11 is a diagram schematically illustrating a state in which a 3D scanner using chromatic aberration includes a polarizer according to an embodiment of the present invention.
  • FIG. 12 is a diagram schematically illustrating a process of generating a point cloud by acquiring image signal data after irradiating patterned light to an object by a 3D scanner using chromatic aberration according to an embodiment of the present invention.
  • FIG. 13 schematically illustrates a three-dimensional scanning method using chromatic aberration according to an embodiment of the present invention.
  • ... unit described in the specification means a unit for processing one or more functions or operations, which may be implemented in hardware or software or a combination of hardware and software.
  • FIG. 3 is a diagram schematically illustrating a three-dimensional scanner 1000 using chromatic aberration according to an embodiment of the present invention.
  • the 3D scanner 1000 using chromatic aberration includes a light irradiation unit 100, a chromatic aberration lens 200, an image sensor 400, and an operation processing unit 500. Can be configured.
  • the 3D scanner using chromatic aberration shown in FIG. 3 is according to an embodiment, and the components shown in FIG. 3 are not limited to the embodiment shown in FIG. 3, and may be added, changed, or deleted as necessary. . In the present specification, detailed descriptions of well-known components except for the main components will be omitted.
  • the light irradiator 100 may include a light source 110 that emits light.
  • the light source 110 may be one, but may include two or more individual light sources 111 that emit light having different wavelengths.
  • the light irradiator 100 may further include a spatial light modulator 120 (SLM) for changing the pattern of the light irradiated onto the object 1.
  • the spatial light modulator 120 may be a pattern film mask patterned to a certain shape, a pattern mask film, a digital micromirror device (DMD), a liquid crystal display (LCD), and the like. Or one or more of a liquid crystal on silicon (LCOS).
  • DMD digital micromirror device
  • LCD liquid crystal display
  • LCOS liquid crystal on silicon
  • Changing the pattern of light irradiated onto the object by the spatial light modulator 120 includes not only inverting the contrast, but also changing the shape of the pattern, modulating the wavelength distribution of the light, or changing the color.
  • FIG. 6 is a view schematically illustrating a case in which the light irradiation unit 100 of the 3D scanner using chromatic aberration includes the reflector 130 according to an embodiment of the present invention.
  • the light irradiator 100 may further include a reflector 130 for irradiating the object 1 with the overlapping or adjacent optical paths with light having different wavelengths.
  • the reflector 130 may correspond to a mirror, a lens, a prism, or the like as long as it reflects light to form a specific optical path.
  • the chromatic aberration lens 200 may generate chromatic aberration according to the refractive index for each wavelength of the light emitted from the light irradiation part 100.
  • the refractive index is different depending on the wavelength constituting the light. The shorter the wavelength, the higher the refractive index. Therefore, chromatic aberration occurs because the degree of refraction of each wavelength is different according to the refractive index for each wavelength of light.
  • the chromatic aberration lens 200 of the three-dimensional scanner using chromatic aberration plays a role of generating or increasing chromatic aberration.
  • the chromatic aberration lens 200 may be a variable focus lens that may change the degree of chromatic aberration by controlling the focal length.
  • the image sensor 400 may acquire the image signal data by sensing the light 20 that passes through the chromatic aberration lens 200 and is reflected from the object.
  • the image sensor 400 may be one of a charge coupled device (CCD) or a CMOS image sensor 400 (CMOS Image Sensor; CIS).
  • CCD charge coupled device
  • CMOS image sensor 400 CMOS Image Sensor; CIS
  • the image sensor 400 may have a form in which a plurality of transparent image sensor layers are arranged in a layered structure.
  • the image sensor 400 may be a color image sensor 410 capable of recognizing all visible light, or may be a monochrome image sensor 420 capable of recognizing only one color.
  • FIG. 8 is a diagram schematically illustrating an example of an image sensor of a 3D scanner using chromatic aberration according to an embodiment of the present invention.
  • FIG. 8A illustrates a case of recognizing all visible light using the color image sensor 410
  • FIG. 8B illustrates a monochrome image sensor capable of recognizing only one color.
  • the case of recognizing one color by using 420 is illustrated.
  • a sensing color wheel 430 and a sensing driving motor 440 may be included to selectively transmit only light of a specific color.
  • the light irradiation unit 100 may further include a spatial light modulator 120 (SLM) for changing a pattern of light irradiated onto the object 1, and in this case, an image
  • SLM spatial light modulator 120
  • the sensor 400 may acquire each image signal data before and after the pattern is changed. That is, the image sensor 400 of the image sensor data when the object 1 is irradiated with the first pattern before the pattern is changed and the second pattern when the object 1 is irradiated with the second pattern after the pattern is changed. Image signal data may be obtained.
  • the operation processor 500 compares sharpness for each wavelength of light in the image signal data to determine the depth of the object 1 based on the wavelength with the highest sharpness and the focal length for each wavelength of the light, and the three-dimensional shape data. Can be generated.
  • FIG. 5 is not the case when the focal length of the image signal data acquired by the image sensor 400 of the 3D scanner using chromatic aberration is correct (FIG. 5 (a)).
  • Figure b schematically shows the sharpness curve of b)).
  • the object 1 when white light is irradiated onto the object 1 and the reflected light is received by the image sensor 400 and converted into image signal data, the object 1 may be located at a focal length of the white light. In this case, as shown in FIG. 5 (a), the sharpness is high, but when the object 1 is not at the focal length of the white light, as shown in FIG. 5 (b), the sharpness is low.
  • the light source 110 of the light irradiation unit 100 may use individual light sources 111 that emit light having different wavelengths.
  • FIG. 7A schematically illustrates a case in which the light irradiator 100 of the 3D scanner using chromatic aberration includes two or more individual light sources 111 that emit light having different wavelengths, according to an embodiment of the present invention. Figure is shown.
  • the individual light sources 111 that emit light having different wavelengths refer to light sources that emit light having different wavelength distributions. Except in exceptional cases such as a laser, a light source having only one wavelength is difficult to realize in reality, and since chromatic aberration does not occur, it is difficult to use as a light source of a light irradiation part. Therefore, the light emitted from the light source 110 of the light irradiation unit 100 of the present invention may be a synthesized form of a plurality of wavelengths, and the individual light sources 111 that emit light having different wavelengths are synthesized with various wavelengths. It refers to a light source 110 that emits light having a different state, that is, a wavelength distribution.
  • the light source 110 includes three LED individual light sources 111 having wavelengths of ⁇ 1 , ⁇ 2 , and ⁇ 3 , respectively.
  • the reflector 130 may further include a reflector 130 for irradiating the object 1 with light having ⁇ 1 , ⁇ 2 , and ⁇ 3 overlapping or adjacent to each other.
  • light having a wavelength of ⁇ 1 may be blue light
  • light having a ⁇ 2 may be green light
  • light having a ⁇ 3 may be red light.
  • the number of different wavelengths is three, but the number of different wavelengths may be two or four, and the number of wavelengths and the type of the light source 110 may vary according to specific embodiments. .
  • the operation processor 500 may determine the depth of the object 1 based on the wavelength having the highest sharpness and the focal length for each wavelength of the light by comparing the sharpness for each wavelength of light in the image signal data.
  • the image sensor 400 acquires each image signal data.
  • the calculation unit 500 calculates the sharpness of each of the pattern regions of the three image signal data, so that the depth of the object 1 corresponding to the pattern region is at a focal length of light having wavelengths of ⁇ 1 , ⁇ 2 , and ⁇ 3 , respectively. It can be determined whether or not applicable.
  • the light source 110 may include two or more individual light sources 111 that emit light having different wavelengths.
  • the operation processor 500 may be configured to generate light corresponding to the image signal data.
  • the depth of the object 1 may be determined using a focal length function using the wavelength value as a variable.
  • the focal length function P n can be expressed as follows.
  • the focal length function P n may generate focal lengths of various wavelengths using the wavelengths ⁇ 1 , ⁇ 2 , and ⁇ 3 as variables.
  • the focal length function P n is only a function having ⁇ 1 , ⁇ 2 , and ⁇ 3 as variables, and it is only known through a calibration process that the function is composed of mathematical equations.
  • FIG. 8 is a diagram schematically illustrating a method for calibrating a 3D scanner using chromatic aberration according to an embodiment of the present invention.
  • Calibration utilizes a one-axis precision transfer stage, and the 3D scanner 1000 using the chromatic aberration according to the present invention is placed on one side, and on the opposite side, a calibration target 30 is placed on the pedestal 50.
  • the pedestal 50 is connected to the transfer part 40 to obtain the respective image signal data by irradiating patterned light onto the reference plane specimen while moving by a small distance. If the distance between the three-dimensional scanner using the chromatic aberration and the reference plane specimen 30 according to the present invention is z, the pixels near the pattern boundary of each image signal data acquired while moving a predetermined distance from z 1 to z n are targeted.
  • the three-dimensional scanner using chromatic aberration according to an embodiment of the present invention, even if the individual light source 111 having n different wavelengths does not irradiate the object 1, two or three individual Even using only the light source 111, the depth of the object corresponding to the n focal lengths can be accurately measured.
  • the spatial light modulator 120 to invert the contrast of the light irradiated to the object 1 without using a plurality of individual light sources 111, n
  • the depth of the object corresponding to the focal length of the dog can be accurately measured.
  • the spatial light modulator 120 may change a pattern in which light is irradiated to the object 1, the spatial light modulator 120 may be irradiated to the object 1 by toggling each time so that the contrast of the pattern is reversed.
  • the image sensor 400 may acquire the image signal data when the object 1 is irradiated with the first pattern before the pattern is changed, that is, before the contrast of the pattern is changed.
  • the second pattern which is after the pattern is changed, is irradiated to the object 1
  • image signal data after changing the contrast of the pattern may be acquired.
  • the distance with respect to the bright area of the pattern may be measured, and the distance with respect to the remaining unmeasured area may be measured by inverting the dark area into the bright area.
  • the spatial light modulator 120 may change the shape of the pattern, modulate the wavelength distribution of the light, or change the color, the spatial light modulator 120 may be applied in various embodiments to enable efficient data processing and scanning.
  • the image sensor 400 may change the wavelength distribution of the image signal data and the light before changing the wavelength distribution of the light. Since the image signal data after the change can be obtained, the same image arithmetic processing as when irradiating light of two different wavelengths is possible.
  • the spatial light modulator 120 toggles the pattern one time so that the contrast of the pattern is inverted and irradiates light onto the object 1 so as to image data.
  • the measurement time can be significantly shortened. That is, the depth of the entire object 1 may be determined by using only two frames of image signal data photographed once each by operating the spatial light modulator 120 twice.
  • the dichroic mirror 300 reflects the light 20 reflected from the object through the chromatic aberration lens 200 to the image sensor 400. mirror) may be further included.
  • the dichroic mirror 300 serves to change the optical path in a specific direction by reflecting light, and by using the dichroic mirror 300, the position of the light source 110 and the chromatic aberration lens 200 can be properly disposed, thereby the scanner. Can be made smaller and lighter.
  • optical errors such as spherical aberration, may occur in the lens processing process of the chromatic aberration lens 200. Since such an optical error is a factor that prevents accurate scanning of the object 1, it is very important to scan in consideration of such an optical error in advance.
  • the 3D scanner using chromatic aberration may further include an error correction light source 140 and an error correction unit 600 for optical error correction.
  • the error correction light source 140 is a light source 110 that emits light having a single wavelength.
  • the error correction light source 140 may be a laser.
  • the object 1 that has already obtained accurate dimension data is required. That is, the spherical aberration and / or distortion of the chromatic aberration lens 200 is compared by scanning the error correction light source 140 to the object 1 that has already obtained the correct dimension data and comparing the scanned image data with the correct dimension data. Optical errors involving the element can be corrected.
  • the driving unit for adjusting the distance between the light source 110 and the chromatic aberration lens 200, or the distance between the light source 110 and the object (not shown) May further include).
  • the driving unit may scan the object 1 while moving the object 1 from side to side or in a 3D scanner direction or in a reverse direction using chromatic aberration according to an embodiment of the present invention.
  • the 3D scanner using chromatic aberration may further include a micro lens array 700 (MLA) in which microscopic lenses 710 are arranged in a lattice form.
  • MLA micro lens array 700
  • Micro Lens Array is a technique mainly used for photographing, in which a single image (image) is formed on each of the lens 710 having a small size arranged in a grid form. It is an optical technology that can obtain a clear picture of a subject by selecting and synthesizing only objects (pixels) having the sharpest image in the object at various distances within the image.
  • FIG. 10 is a view schematically illustrating a three-dimensional scanner using a chromatic aberration including a micro lens array (MLA) 700 according to an embodiment of the present invention.
  • MLA micro lens array
  • the micro lens array 700 is positioned between the dichroic mirror 300 and the chromatic aberration lens 200 (FIG. 10 (a)) or between the dichroic mirror 300 and the image sensor 400. It may be located in (Fig. 10 (b)).
  • an image formed by each of the micro-sized lenses 710 is converted into image signal data by the image sensor 400, and is proportional to the number of the micro-sized lenses 710. The more precise depth measurement can be made by using the difference in focal length generated.
  • the operation processor 500 may determine the depth of the object 1 based on the focal lengths of the plurality of unit grid image signal data generated through the micro lens array 700.
  • the 3D scanner using chromatic aberration may further include a polarizer for removing noise or diffraction elements of light irradiated to the object or light reflected from the object.
  • the polarizer may be a polarizer.
  • FIG. 11 is a diagram schematically illustrating a state in which a 3D scanner using chromatic aberration includes a polarizer 900 according to an embodiment of the present invention.
  • the polarizer 900 is shown to be positioned between the dichroic mirror 300 and the chromatic aberration lens 200.
  • the position and number of the polarizer 900 may vary depending on specific embodiments and the necessity of removing the diffraction components. Can be changed.
  • FIG. 12 is a diagram schematically illustrating a process of generating a cloud of points 5 by acquiring image signal data after irradiating patterned light onto an object 1 by a three-dimensional scanner using chromatic aberration according to an embodiment of the present invention. to be.
  • the patterned light when the patterned light is irradiated onto the object 1, the patterned light is reflected and the image sensor 400 acquires image signal data as shown in FIG. 12 (a).
  • the calculation processing unit 500 performs color processing on the boundary surface in such a manner that only the color having the greatest intensity change rate of each color is left in the image signal data, and as shown in FIG. 12B, the focal length corresponding to the depth of the object 1 is determined. Only the color of the wavelength it has remains the most vivid.
  • a point cloud for each bright surface may be obtained.
  • FIG. 12 (d) when each point 5 is meshed and connected, three-dimensional three-dimensional shape data obtained by dataizing the depth of each object (point-by-point) of the object 1 may be obtained.
  • FIG. 13 schematically illustrates a three-dimensional scanning method using chromatic aberration according to an embodiment of the present invention.
  • a three-dimensional scanning method using chromatic aberration may include: emitting light by a light source of a light irradiation unit; Generating, by the chromatic aberration lens, chromatic aberration according to the refractive index for each wavelength of light emitted from the light irradiation unit; An image sensor sensing light reflected from an object through the chromatic aberration lens to obtain electrical image signal data; And calculating a depth of the object based on a wavelength having the highest sharpness and a focal length for each wavelength of the light by comparing the sharpness of each of the light wavelengths in the image signal data to obtain stereoscopic shape data. It may comprise a step.
  • the light emitter selects a light source to emit light (S100)
  • the light passes through the spatial light modulator and is irradiated onto the object in a predetermined pattern (S200).
  • the image sensor senses the light reflected from the object to obtain the image signal data (S300), and the operation processor divides the bright area 2 from the image signal data (S400), and then the wavelength of each partitioned bright area boundary line (For each color)
  • the rate of change of sharpness may be measured (S500).
  • the depth value corresponding to the focal length of the wavelength (color) may be calculated by finding a wavelength (color) having the sharpest change rate (S600).
  • After generating the point cloud for each region (S700), if each point is meshed and connected, three-dimensional three-dimensional shape data in which the depth of each object (point by point) is obtained may be obtained.
  • the dichroic mirror further comprises the step of reflecting the light reflected from the object through the chromatic aberration lens to the image sensor;
  • the image sensor may acquire image signal data when the object is irradiated with the first pattern before the pattern is changed and image signal data when the object is irradiated with the second pattern after the pattern is changed.
  • the spatial light modulator 120 includes one of a pattern mask film, a digital micromirror device (DMD), a liquid crystal display (LCD), and a liquid crystal on silicon (LCOS). It may contain the above.
  • DMD digital micromirror device
  • LCD liquid crystal display
  • LCOS liquid crystal on silicon
  • the operation processor 500 determines the depth of the object and generates three-dimensional shape data, and calculates the sharpness of each pattern region of the image signal data reflected from the object corresponding to the pattern to calculate the sharpness of each pattern region.
  • the depth of the corresponding object may be determined.
  • the light source may include two or more individual light sources that emit light having different wavelengths from each other, and the reflecting mirror of the light irradiating unit may further include irradiating the object with light having the two or more different wavelengths to the object in an overlapping or adjacent optical path. have.
  • the three-dimensional scanning method using chromatic aberration further includes the step of emitting the light having a single wavelength by the error correction light source of the light irradiator, wherein the error correction unit has already obtained accurate dimensional data.
  • the method may further include correcting an optical error including spherical aberration and / or distortion elements of the chromatic aberration lens by comparing the scanned image with the error correcting light source and the accurate dimension data.
  • the image signal data may include a plurality of unit unit grid image signal data generated by passing the light through a micro lens array (MLA) in which microscopic lenses are arranged in a lattice form
  • the calculation processing unit may include:
  • the determining of the depth and generating the three-dimensional shape data may determine the depth of the object based on the focal length of the unit grid image signal data passing through the micro lens array.
  • the operation processor may determine the depth of the object and generate three-dimensional shape data.
  • the depth of the object may be determined by using a focal length function whose wavelength value of light corresponding to the image signal data is a variable.
  • the present invention can be used for the purpose of industrial, medical, etc. as a three-dimensional scanner.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Lenses (AREA)

Abstract

La présente invention concerne un scanner tridimensionnel utilisant une aberration chromatique et un procédé de balayage l'utilisant. Plus précisément, la présente invention comprend : une lentille chromatique permettant de générer une aberration chromatique en fonction d'indices de réfraction pour chaque longueur d'onde de la lumière ; un capteur d'image permettant d'acquérir des données de signal d'image ; et une unité de traitement arithmétique (500) permettant de déterminer une longueur d'onde ayant la netteté la plus élevée par comparaison de netteté pour les données de signal d'image selon les longueurs d'onde de la lumière et de déterminer la profondeur d'un objet (1) sur la base de longueurs focales en fonction des longueurs d'onde de la lumière, de façon à générer des données de forme tridimensionnelle.
PCT/KR2017/009584 2016-09-02 2017-09-01 Scanner tridimensionnel et procédé de balayage utilisant une aberration chromatique WO2018044111A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2016-0113515 2016-09-02
KR1020160113515A KR101824328B1 (ko) 2016-09-02 2016-09-02 색수차를 이용한 3차원 스캐너 및 스캐닝 방법

Publications (2)

Publication Number Publication Date
WO2018044111A2 true WO2018044111A2 (fr) 2018-03-08
WO2018044111A3 WO2018044111A3 (fr) 2018-08-09

Family

ID=61232177

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2017/009584 WO2018044111A2 (fr) 2016-09-02 2017-09-01 Scanner tridimensionnel et procédé de balayage utilisant une aberration chromatique

Country Status (2)

Country Link
KR (1) KR101824328B1 (fr)
WO (1) WO2018044111A2 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190142654A (ko) 2018-06-18 2019-12-27 손재혁 촬영 대상의 3차원 정보 획득 장치 및 방법
KR102659198B1 (ko) 2018-07-04 2024-04-19 삼성전자주식회사 저감된 색수차를 갖는 홀로그래픽 디스플레이 장치
KR102161452B1 (ko) * 2019-07-24 2020-10-05 (주)칼리온 스캐너 움직임에 따른 모션 유효성 검출 장치 및 그 방법
KR102279870B1 (ko) * 2019-07-30 2021-07-21 (주)칼리온 패턴 마스크 및 인버스 패턴 마스크를 이용한 3차원 스캐닝의 프로젝션 시스템 및 그 방법
KR102601271B1 (ko) * 2019-11-19 2023-11-13 주식회사 에스디에이 3d 스캐너의 구현을 위한 dmd 컨트롤러 및 그의 제어 방법
KR102529593B1 (ko) * 2022-10-25 2023-05-08 성형원 대상체에 대한 3d 정보를 획득하는 디바이스 및 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3728032B2 (ja) * 1996-10-31 2005-12-21 三菱レイヨン株式会社 低色収差ロッドレンズアレイ及びそのユニット並びにこれらを用いたイメージスキャナ
JP4715595B2 (ja) * 2006-03-31 2011-07-06 ブラザー工業株式会社 光スキャナおよびそれを備えた画像形成装置
KR101162439B1 (ko) * 2010-05-20 2012-07-04 임용근 3차원 스캐너용 측정 장치
KR101458696B1 (ko) * 2013-04-19 2014-11-05 이기창 고속 전자식 3차원 레이저 스캐너 장치
KR101628730B1 (ko) * 2015-04-30 2016-06-21 주식회사 투아이스펙트라 치과용 3차원 이미징 방법 및 그 시스템

Also Published As

Publication number Publication date
KR101824328B1 (ko) 2018-02-01
WO2018044111A3 (fr) 2018-08-09

Similar Documents

Publication Publication Date Title
WO2018044111A2 (fr) Scanner tridimensionnel et procédé de balayage utilisant une aberration chromatique
US8451456B2 (en) Method and apparatus for colour imaging a three-dimensional structure
US10254111B2 (en) Device for optical 3D measuring of an object
KR100413103B1 (ko) 본딩장치 및 본딩방법
US10588494B2 (en) Camera and method for the three-dimensional measurement of a dental object
WO2016200096A1 (fr) Appareil de mesure de forme tridimensionnelle
WO2019164381A1 (fr) Procédé d'inspection de l'état de montage d'un composant, appareil d'inspection de carte de circuit imprimé et support d'enregistrement lisible par ordinateur
JP3893922B2 (ja) レンズの評価方法およびレンズ評価装置
WO2014035010A1 (fr) Système de scanner intra-oral automatique et procédé de scanner associé
KR101628730B1 (ko) 치과용 3차원 이미징 방법 및 그 시스템
JP2008096439A (ja) 物体の３次元座標を判定するための方法および装置
WO2012023816A9 (fr) Microscope à fluorescence pour observation d'image à fluorescence multiple, procédé d'observation d'image à fluorescence l'utilisant, et système d'observation d'image à fluorescence multiple
WO2020235948A1 (fr) Scanner intra-buccal tridimensionnel
WO2015041506A1 (fr) Appareil de mesure d'épaisseur et procédé de mesure d'épaisseur faisant appel à cet appareil
JP2009510959A (ja) 単色光源により画像センサをスペクトル統合校正するための方法
TW201716876A (zh) 光源裝置、曝光裝置及光源控制方法
WO2020130598A1 (fr) Scanner intrabuccal tridimensionnel et procédé de scannage intrabuccal l'utilisant
JP2005258622A (ja) 三次元情報取得システムおよび三次元情報取得方法
JP2016111689A (ja) 画像読取装置
WO2017183923A1 (fr) Appareil d'inspection de l'aspect d'un article et procédé d'inspection de l'aspect d'un article l'utilisant
WO2014148781A1 (fr) Dispositif de mesure de forme tridimensionnelle susceptible de mesurer des informations de couleurs
JP4502104B2 (ja) 複合プリズム光学系を有する撮像装置
CN111982025A (zh) 用于模具检测的点云数据获取方法及系统
WO2014126401A1 (fr) Procédé et dispositif de tomographie par interférence optique
WO2023121094A1 (fr) Dispositif de mesure de forme tridimensionnelle pour acquisition d'informations d'images multiples

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17847036

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

32PN Ep: public notification in the ep bulletin as address of the adressee cannot be established

Free format text: NOTING OF LOSS OF RIGHTS PURSUANT TO RULE 112(1) EPC (EPO FORM 1205A DATED 15/07/2019)

122 Ep: pct application non-entry in european phase

Ref document number: 17847036

Country of ref document: EP

Kind code of ref document: A2