WO2018036230A1 - 一种信号测试方法、装置及计算机存储介质 - Google Patents

一种信号测试方法、装置及计算机存储介质 Download PDF

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Publication number
WO2018036230A1
WO2018036230A1 PCT/CN2017/085632 CN2017085632W WO2018036230A1 WO 2018036230 A1 WO2018036230 A1 WO 2018036230A1 CN 2017085632 W CN2017085632 W CN 2017085632W WO 2018036230 A1 WO2018036230 A1 WO 2018036230A1
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Prior art keywords
test
sequence
tested
indicators
signal
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PCT/CN2017/085632
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English (en)
French (fr)
Inventor
蒋凤林
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深圳市中兴微电子技术有限公司
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Priority to RU2019108480A priority Critical patent/RU2710211C1/ru
Publication of WO2018036230A1 publication Critical patent/WO2018036230A1/zh

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/309—Measuring or estimating channel quality parameters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W24/00—Supervisory, monitoring or testing arrangements
    • H04W24/02—Arrangements for optimising operational condition
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W24/00—Supervisory, monitoring or testing arrangements
    • H04W24/04—Arrangements for maintaining operational condition

Definitions

  • the present invention relates to the field of communications, and in particular, to a signal testing method, apparatus, and computer storage medium.
  • the terminal establishes a signaling link with the network side, and then looks at the uplink and downlink indicators; however, using the above method, the measured indicator is to establish a link between the terminal and the network.
  • the RF index is not measurable in many RF operating scenarios. It is impossible to observe the characteristics of all time points of the entire signal lifetime as the oscilloscope observes the baseband signal, and with long-term evolution ( LTE (Long Term Evolution), LTE has a lot of radio frequency indicators. It only runs the basic RF indicator test. One bandwidth runs all the time. It takes half an hour to increase. As the number of bandwidth increases, the LTE signal format also increases.
  • embodiments of the present invention are expected to provide a signal testing method, apparatus, and computer storage medium, which eliminate the test blind spots existing in the testing of the radio frequency index of the mobile terminal, and satisfy the testing requirements.
  • the embodiment of the present invention provides a signal testing method, which is applied to a user equipment (UE, User Equipment) side, and the method includes: receiving, by a control device, sequence parameters corresponding to each to-be-measured indicator; Generating an uplink signal according to the formal parameters included in the sequence parameter, and generating a downlink test sequence according to the test parameters included in the sequence parameter; sending the uplink signal to the test device, triggering the test device to generate a test according to the pre-generated uplink The sequence is tested by the uplink signal, and the downlink signal sent by the test device is tested according to the downlink test sequence, and the test result of each of the indicators to be tested is obtained.
  • UE User Equipment
  • the test device is configured to test the uplink signal according to the pre-generated uplink test sequence, and test the downlink signal sent by the test device according to the downlink test sequence, including: The test device tests the uplink signal according to the correspondence between the time in the uplink test sequence and the indicator type to be tested, and tests the downlink signal according to the correspondence between the time in the downlink test sequence and the indicator type to be tested.
  • the method after the sending the uplink signal to the test device, before obtaining the test result of each of the to-be-measured indicators, includes: a physical layer (PHY, Physical Layer) or a media control access layer (MAC, Media Access Control) performs configuration of the sequence parameters; and/or performs configuration of the sequence parameters on a logical channel or a transmission channel; and/or directly configures radio frame parameters.
  • PHY Physical Layer
  • MAC media control access layer
  • the method further includes: receiving an acquisition instruction of the control device, and returning the test result to the control device.
  • an embodiment of the present invention provides a signal testing method, which is applied to a control device side, where the method includes: receiving each to-be-measured indicator; and generating, according to the to-be-measured indicators, a user equipment (UE)
  • the sequence parameters corresponding to the indicators to be tested are sent to the UE, and sequence parameters corresponding to the indicators to be tested are generated for the test device and sent to the test device.
  • UE user equipment
  • the sequence parameters corresponding to the indicators to be tested are generated for the UE according to the indicators to be tested, and are sent to the UE, and a sequence corresponding to the indicators to be tested is generated for the test device.
  • the method further includes: separately sending an acquisition instruction to the UE and the test device; and acquiring, from the UE and the test device, the indicators to be tested respectively Test Results.
  • the embodiment of the present invention provides a signal testing apparatus, including: a first receiving module, configured to receive a sequence parameter that is sent by a control device and corresponding to each to-be-measured indicator; and a first generating module configured to be configured according to the Generating an uplink signal according to a formal parameter included in the sequence parameter, and generating a downlink test sequence according to the test parameter included in the sequence parameter; the test module is configured to send the uplink signal to the test device, and trigger the test device according to the advance The generated uplink test sequence is used to test the uplink signal.
  • the test module is further configured to test the downlink signal sent by the test device according to the downlink test sequence, and obtain test results of the indicators to be tested.
  • the test module is configured to: send the uplink signal to the test device, and trigger the test device to test the corresponding relationship between the time in the uplink test sequence and the indicator type to be tested.
  • the test module is further configured to test the downlink signal according to the correspondence between the time and the type of the indicator to be tested in the downlink test sequence, and obtain test results of each of the indicators to be tested.
  • the test module is further configured to: after transmitting the uplink signal to the test device, control access to a physical layer (PHY) or media before obtaining the test result of each test indicator Layer (MAC) performs the configuration of the sequence parameters; and/or, on a logical letter
  • PHY physical layer
  • MAC test indicator Layer
  • the channel or transport channel performs the configuration of the sequence parameters; and/or, the radio frame parameters are directly configured.
  • the device further includes: a returning module, configured to: after obtaining the test result of each of the to-be-measured indicators, receive an acquisition instruction of the control device, and return the test result to the control device.
  • a returning module configured to: after obtaining the test result of each of the to-be-measured indicators, receive an acquisition instruction of the control device, and return the test result to the control device.
  • an embodiment of the present invention provides a signal testing apparatus, including: a second receiving module configured to receive each to-be-tested indicator; and a second generating module configured to be a user equipment according to the to-be-measured indicators (The UE generates a sequence parameter corresponding to each of the to-be-measured indicators and sends the sequence parameter to the UE, and generates a sequence parameter corresponding to each of the to-be-measured indicators for the test device and sends the sequence parameter to the test device.
  • the apparatus further includes: an acquiring module, configured to generate a sequence parameter corresponding to the to-be-measured indicator for the UE according to the to-be-measured indicators, and send the sequence parameter to the UE, to generate a test device After the sequence parameters corresponding to the metrics to be tested are sent to the test device, respectively, an acquisition command is sent to the UE and the test device; and the respective devices are obtained from the UE and the test device respectively. Test results of the measured indicators.
  • an acquiring module configured to generate a sequence parameter corresponding to the to-be-measured indicator for the UE according to the to-be-measured indicators, and send the sequence parameter to the UE, to generate a test device
  • an acquisition command is sent to the UE and the test device; and the respective devices are obtained from the UE and the test device respectively. Test results of the measured indicators.
  • the embodiment of the present invention further provides a computer storage medium, where the computer storage medium stores computer executable instructions, and the computer executable instructions are used to perform the application to the user equipment (UE) side according to the foregoing embodiment.
  • Signal test method is used to perform the application to the user equipment (UE) side according to the foregoing embodiment.
  • the embodiment of the present invention further provides a computer storage medium, where the computer storage medium stores computer executable instructions, and the computer executable instructions are used to execute the signal testing method applied to the control device side according to the foregoing embodiment. .
  • the control device issues the sequence parameters of the indicators to be tested, so that the signal testing device can be based on the sequence parameters.
  • the formal parameter and the test parameter respectively generate an uplink signal corresponding to the formal parameter and a downlink test sequence corresponding to the test parameter, so that the letter In the test device and the test device, there are mutually matched uplink signals and uplink test sequences, and the downlink test sequence and the downlink signal are matched with each other.
  • the signal test device and the test device can test each test indicator, so when the signal test device sends an uplink signal To the test device, the signal test device and the test device are synchronized in sequence, and the downlink test sequence and the uplink test sequence are respectively performed.
  • the signal test device can test the downlink signal according to the downlink test sequence matched with the downlink signal, and can also synchronize
  • the trigger test device tests the uplink signal according to the uplink test sequence matched with the uplink signal, thereby obtaining test results of each test indicator, thereby satisfying the test requirement for each test indicator, thereby eliminating the RF for the mobile terminal.
  • the test of indicators In the blind spot test, further testing to meet the demand.
  • FIG. 1 is a schematic structural diagram of a test system according to an embodiment of the present invention.
  • FIG. 2 is an optional schematic structural diagram of a test system according to an embodiment of the present invention.
  • FIG. 3 is a schematic flowchart of a signal testing method according to an embodiment of the present invention.
  • FIG. 4 is a sequence diagram of an LTE uplink and downlink test sequence according to an embodiment of the present invention.
  • FIG. 5 is a schematic structural diagram of a wireless access protocol system according to an embodiment of the present invention.
  • FIG. 6 is an optional schematic flowchart of a signal testing method according to an embodiment of the present invention.
  • FIG. 7 is another schematic flow chart of a signal testing method according to an embodiment of the present invention.
  • FIG. 8 is a schematic structural diagram of an optional signal testing apparatus according to an embodiment of the present invention.
  • FIG. 9 is another schematic structural diagram of a signal testing apparatus according to an embodiment of the present invention.
  • FIG. 1 is a schematic structural diagram of a testing system according to an embodiment of the present invention.
  • the testing system may include: a control device 11 and a user equipment 12 (UE, User equipment) and a test device 13, the control device 11 is connected to the UE 12 and the test device 13, respectively, and the UE 12 establishes a communication connection with the test device 13;
  • UE user equipment
  • the control device 11 is configured to control the UE 12 and the test device 13 during the test of the signal, wherein the control device 11 may include a personal computer (PC, Personal Computer) or a server;
  • PC Personal Computer
  • server a server
  • the UE 12 and the test device 13 are connected by a radio frequency line to establish a connection of the wireless signal, and the UE 12 and the test device 13 obtain the test result of each of the indicators to be tested by testing the wireless signal between the UE 12 and the test device 13 .
  • the UE 12 may include a mobile phone, a tablet, etc., and the test device may be a meter;
  • FIG. 2 is an optional structural diagram of a test system according to an embodiment of the present invention.
  • the test system includes a PC, a UE, and an instrument, wherein the PC and the PC
  • the instrument is connected to the instrument through a General Interface Interface Bus (GPIB, General-Purpose Interface Bus) or Transmission Control Protocol/Internet Protocol (TCP/IP), and between the PC and the UE.
  • GPIB General Interface Interface Bus
  • TCP/IP Transmission Control Protocol/Internet Protocol
  • the PC sends commands to the UE to implement program control of the UE; the antenna interfaces ANT0 and ANT1 of the UE are respectively connected to the RF interfaces RF1COM and RF3COM of the instrument through the RF line, wherein the RF
  • the interface RF1COM is indicated by the reference numeral 5 in Fig. 2
  • the radio frequency interface RF3COM is indicated by the reference numeral 6 in Fig. 2, thereby establishing a wireless signal connection.
  • the UE 12 is configured to: receive the sequence parameters corresponding to the indicators to be tested sent by the control device 11; generate an uplink signal according to the formal parameters included in the sequence parameters, and according to the sequence parameters, The test parameters are included to generate a downlink test sequence; the uplink signal is sent to the test device 13, and the test device 13 is triggered according to the pre-generated uplink test sequence.
  • the column tests the uplink signal, and tests the downlink signal sent by the test device 13 according to the downlink test sequence to obtain test results of the indicators to be tested.
  • the control device 11 is configured to: receive each of the indicators to be tested; generate sequence parameters corresponding to the indicators to be tested for the UE 12 according to the indicators to be tested, and send the sequence parameters to the UE 12, and generate sequence parameters corresponding to the indicators to be tested for the test device 13 And sent to the test device 13.
  • FIG. 3 is a schematic flowchart of a signal testing method according to an embodiment of the present invention. As shown in FIG. 3, the signal testing method includes:
  • the control device receives each of the indicators to be tested, and generates sequence parameters corresponding to the indicators to be tested for the UE according to the indicators to be tested, and sends the sequence parameters to the UE, and generates sequence parameters corresponding to the indicators to be tested for the test device and sends the sequence parameters to the test device.
  • Test Equipment The control device receives each of the indicators to be tested, and generates sequence parameters corresponding to the indicators to be tested for the UE according to the indicators to be tested, and sends the sequence parameters to the UE, and generates sequence parameters corresponding to the indicators to be tested for the test device and sends the sequence parameters to the test device.
  • the foregoing indicators to be tested may include an error vector magnitude (EVM, Error Vector Magnitude), an adjacent channel Leakage Ratio (ACLR), a power (Power), a frequency error (Frequency Error), and an automatic gain control (AGC). , Automatic Gain Control, Received Signal Strength Indicator (RSSI), Reference Signal Receiving Power (RSRP), Block Error Ratio (BLER), System Parameter N0 (for It indicates the received noise) and the like, and the present invention is not specifically limited herein.
  • EVM error vector magnitude
  • ACLR adjacent channel Leakage Ratio
  • Power Power
  • Frequency Error frequency error
  • AGC automatic gain control
  • Automatic Gain Control Received Signal Strength Indicator
  • RSRP Reference Signal Receiving Power
  • BLER Block Error Ratio
  • System Parameter N0 for It indicates the received noise
  • the control device After receiving the indicators to be tested, the control device searches for sequence parameters corresponding to the indicators to be tested, and obtains sequence parameters corresponding to the indicators to be tested, wherein the sequence parameters may include: sequence parameters of the UE and sequence of the test device parameter.
  • the sequence parameters of the UE include a formal parameter and a test parameter, where the formal parameter specifies a form of an uplink signal sent by the UE to the test device, and the formal parameter may include a modulation mode, a bandwidth, a number of resource blocks (RB Number), and a resource block.
  • RB offset, frame configuration, channel form, data content, etc., the above channel form may include: physical uplink Link control channel (PUCCH, Physical Uplink Control Channel) and physical uplink shared channel (PUSCH, Physical Uplink Shared Channel), etc., data content includes all 0 (ALL0), all 1 (ALL1) or random code (PN9), etc.
  • the test parameter specifies the test time of the UE test downlink signal and the indicator type of the test, and the indicator category of the test may include AGC, RSSI, RSRP, BLER, N0, Frequency Error, and the like.
  • the parameter sequence of the test device includes a formal parameter and a test parameter, where the formal parameter specifies a downlink signal form, and the formal parameter may be a cell power, a frequency point, a bandwidth, a modulation mode, etc.; the test parameter specifies The test device tests the test time of the uplink signal and the indicator category of the test, and the indicator categories of the test may include EVM, ACLR, Power, Frequency Error, and the like.
  • control device After determining the sequence parameters for the UE and determining the sequence parameters for the test device, the control device sends the sequence parameters to the UE and the test device, respectively.
  • the UE receives a sequence parameter that is generated by the control device for the UE, and the UE generates an uplink signal according to the formal parameter included in the sequence parameter, and generates a downlink test sequence according to the test parameter included in the sequence parameter.
  • S302 further includes: the test device receiving, by the control device, a sequence parameter corresponding to each to-be-measured indicator generated by the test device, and the test device generates a downlink signal according to the formal parameter included in the sequence parameter, and according to the sequence parameter The included test parameters generate an upstream test sequence.
  • the UE and the test device after receiving the respective sequence parameters, the UE and the test device generate the uplink signal generated by the UE and the uplink generated by the test device, because the sequence parameter of the UE generated by the control device and the sequence parameter of the test device match each other.
  • the test sequences match each other, and the downlink signal generated by the test device matches the downlink test sequence generated by the UE.
  • FIG. 4 is a timing diagram of the LTE uplink and downlink test sequence in the embodiment of the present invention, as shown in FIG. 4 .
  • the test sequence specifies the type of the uplink and downlink test indicators at each time point, and includes the corresponding uplink and downlink form parameters.
  • the downlink traffic RX, Receive
  • the downlink signal of the instrument is configured according to the sequence parameters, and the UE is at Continuously measuring the status and obtaining data of all time points; wherein, for RX, the sequence parameters may include: RSRP, AGC, N0, BLER; for uplink traffic (TX, Transmit), the form of the uplink signal of each time point of the UE is specified.
  • the parameters, corresponding to the meter, are measured by signal using a suitable uplink test sequence, wherein for TX, in the first baseband, the bandwidth is 20M, 10M, 5M over time, and the channel is over time
  • the first test item (Test Item) in the first 20ms of the uplink test sequence, when the uplink test sequence test is all resource blocks (FULL RB)
  • the indicator of the uplink test sequence test Includes: MaxPower, EVM, ACLR, Spectral Emission Mask, Source Offset, Normalized Spectral Flatness (ESF, E Xtended Spectral Flatness) and so on;
  • the second test item, in the next 60ms, the uplink test sequence test is: 1 resource block (1RB), when the resource block start position is Offset 0/49/99, the test indicators include MaxPower , EVM, ACLR, SEM, IQ Offset, ESF;
  • the third test item in the next 60ms, 18 resource blocks (18RB), when the resource block start position is Offset 0
  • the UE sends an uplink signal to the test device, and the test device sends a downlink signal to the UE.
  • the test device tests the uplink signal according to the uplink test sequence, and the UE tests the downlink signal according to the downlink test sequence, and obtains test results of the indicators to be tested. .
  • the UE sends an uplink signal to the test device, triggers the test device to send the downlink signal to the test device, and starts to execute the uplink test sequence and the downlink test sequence, thus completing the series synchronization and ensuring the correct test result. Sex.
  • the test device tests the uplink signal according to the uplink test sequence, including: the test device according to the time in the uplink test sequence and the indicator type to be tested. The corresponding relationship is tested for the uplink signal.
  • the UE tests the downlink signal according to the downlink test sequence, and obtains the test results of the indicators to be tested, including: the UE tests the downlink signal according to the correspondence between the time in the downlink test sequence and the type of the indicator to be tested.
  • the uplink signal is matched with the uplink test sequence, and the downlink signal is matched with the downlink test sequence. Then, after the UE synchronizes with the test device, the UE and the test device perform the downlink test sequence and the uplink test sequence. The test results of each test indicator can be accurately tested.
  • the method includes: Configuring a sequence parameter for a physical layer (PHY) or a Media Control Access Layer (MAC); and/or configuring sequence parameters for a logical channel or a transport channel; and/or configuring the radio frame parameters directly.
  • PHY physical layer
  • MAC Media Control Access Layer
  • FIG. 5 is a schematic structural diagram of a radio access protocol system according to an embodiment of the present invention.
  • the architecture of the radio access protocol includes: a first layer (Layer 1) physical layer (PHY, Physical Layer), Layer 2 (Layer 2) Media Access Control (MAC) and Layer 3 Radio Resource Control (RRC), between the PHY layer and the MAC layer are transport channels, MAC and RRC. Between the logical channels (Logical channels);
  • the entire mobile communication architecture consists of three layers. Since the radio frequency indicator is not associated with the RRC layer, the interface between the MAC layer and the RRC layer, the MAC layer, the MAC layer, and the PHY layer are interfaces.
  • the call is made to form a non-signaling test sequence, and the formed non-signaling test sequence can determine the action of the RF signal at each moment by culling the signaling interaction, and can use the meter to scan the signal at each moment, or Fill in different forms of downlink signals; ensure the integrity of the MAC and PHY, and ensure the consistency of the RF indicator test.
  • the interface between the PHY and the MAC and the RRC is used as an entry point to construct a serialization process to implement a non-signaling test sequence.
  • the construction is implemented in hierarchical logic, which is divided into several layers, which is determined by the hardware and software implementation architecture of the entire communication protocol stack and the points to be observed. Here, it can be considered to be implemented in three levels.
  • the first level is: configuring the relevant parameters of the PHY layer procedure/MAC layer procedure defined by the protocol specification to form a non-signaling test sequence for verifying the correctness of the implementation of the PHY/MAC procedure defined by the protocol specification, and the process execution Specific RF performance indicators. For example, configure the data source of ALL0/ALL1/PN9; configure different coding modes and filter coefficients; configure RB, debug mode, subframe ratio, antenna, etc., so that the sequence parameters are configured into the PHY layer/MAC layer. Then, when testing the indicators to be tested at this time, the obtained test results of the indicators to be tested related to the hardware on which the code is run are more accurate.
  • the second level is: configuring the relevant parameters of the logical channel/transport channel to form a non-signaling test sequence; verifying the correctness of the channel implementation and the specific radio frequency performance of the channel-related parameters finally implemented on the radio frequency signal Indicators; for example, the PUSCH channel is removed, only the PUCCH channel is reserved, the signal index of the PUCCH channel is observed; the indicator of the PCFICH channel is observed separately; the specific UCI parameters are configured for the PUSCH or PUCCH, and the RF signal indicators are observed, etc., thus ensuring the PUCCH The accuracy of the indicators to be tested;
  • the second level is: direct configuration of radio frame related parameters to form a non-signaling test sequence; used to verify hardware RF performance indicators; at this time, no longer limited by the physical layer defined by the protocol, is based on radio frequency demonstration (DEMO,
  • the test mode of the board can test the frequency/time domain RF indicators by customizing the frame length, modulation mode, data source, and so on.
  • the non-signaling test sequence of the first/second layer is biased towards the behavior of the entire complete PHY layer/MAC layer as specified in the protocol specification; the third layer of the non-signaling test sequence is more Focus on the inspection of different scenes of the hardware.
  • the control device obtains test results of each to-be-measured indicator from the UE and the test device, respectively.
  • the method may include: the control device separately sends the acquisition instruction to the UE and the test device, the UE sends the test result to the control device, and the test device sends the test result to the control device.
  • the uplink and downlink test sequence is executed during a specified time period, so when the control device is finished, it is predictable. After the sequence ends, the control device queries the instrument, determines the actual state, and then queries the measurement data on the instrument side. Query the measurement data on the UE side.
  • the control device issues sequence parameters of the indicators to be tested, so that the signal testing device can be based on the formal parameters and test parameters in the sequence parameters.
  • An uplink signal corresponding to the formal parameter and a downlink test sequence corresponding to the test parameter are respectively generated, so that in the signal testing device and the test device, there are respectively matched uplink signals and uplink test sequences, and the matched downlink test sequences are matched.
  • the signal testing device And the test device can test each of the indicators to be tested, so when the signal test device sends an uplink signal to the test device, the signal test device and the test device realize the sequence synchronization, respectively performing the downlink test sequence and the uplink test sequence, and thus, the signal
  • the test device can be based on Downlink test sequence matches a downlink signal to the downlink test signals may also be synchronous triggering test equipment uplink signal according to the uplink and the uplink signal test sequence matches to obtain test results of each index, so, satisfying The test requirements for each of the indicators to be tested eliminate the test blind spots existing in the test of the radio frequency indicators of the mobile terminal, and further satisfy the test requirements.
  • the signal test method is described on the UE side.
  • FIG. 6 is a schematic flowchart of an optional signal test according to an embodiment of the present invention. As shown in FIG. 6, the method includes:
  • Step S601 Receive sequence parameters corresponding to each to-be-measured indicator sent by the control device;
  • Step S602 Generate an uplink signal according to a formal parameter included in the sequence parameter, and generate a downlink test sequence according to the test parameter included in the sequence parameter.
  • Step S603 Send an uplink signal to the test device, and trigger the test device to test the uplink signal according to the pre-generated uplink test sequence, and test the downlink signal sent by the test device according to the downlink test sequence, and obtain test results of the indicators to be tested.
  • the trigger test device tests the uplink signal according to the pre-generated uplink test sequence, including: triggering the test device according to the uplink test. Testing the uplink signal according to the correspondence between the time in the sequence and the type of the indicator to be tested; and testing the downlink signal sent by the test device according to the downlink test sequence, including: testing according to the correspondence between the time and the type of the indicator to be tested in the downlink test sequence Downstream signal.
  • the upper method in order to obtain a more accurate test result, in step S603, after transmitting the uplink signal to the test device, before obtaining the test result of each test indicator, the upper method includes: Layer (PHY) or Media Control Access Layer (MAC) for configuration of sequence parameters; and/or configuration of sequence parameters for logical channels or transport channels; and/or direct configuration of radio frame parameters.
  • Layer PHY
  • MAC Media Control Access Layer
  • the method may further include: receiving an acquisition instruction of the control device, and returning the test result to the control device.
  • FIG. 7 is a schematic diagram of another optional process of the signal testing method in the embodiment of the present invention. As shown in FIG. 7, the method includes:
  • Step S701 receiving each indicator to be tested
  • Step S702 Generate sequence parameters corresponding to the indicators to be tested for the user equipment (UE) according to the indicators to be tested, and send the sequence parameters to the UE, and generate sequence parameters corresponding to the indicators to be tested for the test equipment and send the sequence parameters to the test equipment.
  • UE user equipment
  • control device may further include: after the step S702, the method may further include:
  • test results of the indicators to be tested are obtained from the UE and the test device respectively.
  • an embodiment of the present invention provides a signal testing apparatus that is consistent with the UE described in one or more of the foregoing embodiments.
  • FIG. 8 is a schematic structural diagram of a signal testing apparatus according to an embodiment of the present invention.
  • the signal testing apparatus includes: a first receiving module 81, a first generating module 82, and a testing module 83;
  • the first receiving module 81 is configured to receive a sequence parameter that is sent by the control device and that is corresponding to each of the indicators to be tested.
  • the first generating module 82 is configured to generate an uplink signal according to the formal parameters included in the sequence parameter. And generating a downlink test sequence according to the test parameters included in the sequence parameter;
  • the test module 83 is configured to send an uplink signal to the test device, and the trigger test device tests the uplink signal according to the pre-generated uplink test sequence, and is configured to The downlink test sequence tests the downlink signals sent by the test equipment, and obtains test results of the indicators to be tested.
  • the test module 83 in order to obtain the test result of each of the indicators to be tested, is specifically configured to: send an uplink signal to the test device, and trigger the test device according to the uplink.
  • the corresponding relationship between the time in the test sequence and the type of the indicator to be tested is tested for the uplink signal.
  • the specific configuration is as follows: the downlink signal is tested according to the correspondence between the time and the type of the indicator to be tested in the downlink test sequence, and the test results of the indicators to be tested are obtained.
  • the test module 83 is further configured to: after sending the uplink signal to the test device, before obtaining the test result of each test indicator,
  • the physical layer (PHY) or the medium control access layer (MAC) performs configuration of sequence parameters; and/or configures sequence parameters for logical channels or transport channels; and/or directly configures radio frame parameters.
  • the foregoing apparatus may further include: a returning module 84 (not shown in FIG. 8) configured to receive an acquiring instruction of the control device after obtaining the test result of each of the indicators to be tested, Return the test results to the control device.
  • a returning module 84 (not shown in FIG. 8) configured to receive an acquiring instruction of the control device after obtaining the test result of each of the indicators to be tested, Return the test results to the control device.
  • the signal testing device described in this embodiment can be applied to the user equipment side.
  • the first receiving module 81, the first generating module 82, the testing module 83, and the returning module 84 may all be processed by a central processing unit (CPU, Central Processing Unit) located in the UE.
  • CPU Central Processing Unit
  • MPU Microprocessor Unit
  • ASIC Application Specific Integrated Circuit
  • FPGA Field-Programmable Gate Array
  • an embodiment of the present invention provides a signal testing apparatus consistent with the control apparatus described in one or more of the above embodiments.
  • FIG. 9 is a schematic diagram of another optional structure of the signal test in the embodiment of the present invention.
  • the signal testing apparatus includes: a second receiving module 91 and a second generating module 92;
  • the second receiving module 91 is configured to receive the to-be-measured indicators.
  • the second generating module 92 is configured to generate sequence parameters corresponding to the to-be-measured indicators for the user equipment (UE) according to the indicators to be tested. And sending to the UE, and generating sequence parameters corresponding to the indicators to be tested for the test device and sending the sequence parameters to the test device.
  • UE user equipment
  • the device further includes: an obtaining module 93 (not shown in FIG. 9) configured to be a user equipment according to each indicator to be tested (UE) Generating a sequence parameter corresponding to the indicator to be tested and transmitting it to the UE, and generating a sequence parameter corresponding to the indicator to be tested for the test device and transmitting the sequence parameter to the test device, respectively, sending an acquisition instruction to the UE and the test device; respectively, from the UE and the test device In the middle, obtain the test results of each indicator to be tested.
  • UE user equipment according to each indicator to be tested
  • the second receiving module 91, the second generating module 92, and the obtaining module 93 can be implemented by a CPU, an MPU, an ASIC, an FPGA, or the like located in the control device.
  • the signal testing device described in this embodiment can be applied to the control device side.
  • This embodiment describes a computer readable medium, which may be a ROM (eg, a read only memory, a FLASH memory, a transfer device, etc.), a magnetic storage medium (eg, a magnetic tape, a disk drive, etc.), an optical storage medium (eg, a CD- ROM, DVD-ROM, paper card, paper tape, etc.) and other well-known types of program memory; computer-readable medium storing computer-executable instructions that, when executed, cause at least one processor to perform operations including:
  • the embodiment further describes a computer readable medium, which may be a ROM (eg, a read only memory, a FLASH memory, a transfer device, etc.), a magnetic storage medium (eg, a magnetic tape, a disk drive, etc.), an optical storage medium (eg, a CD).
  • ROM read only memory
  • FLASH memory FLASH memory
  • magnetic storage medium eg, a magnetic tape, a disk drive, etc.
  • an optical storage medium eg, a CD
  • computer-readable medium storing computer-executable instructions that, when executed, cause at least one processor to perform operations comprising:
  • the control device in order to meet the testing requirements of the indicators to be tested, the control device sends the sequence parameters of the indicators to be tested, so that the signal testing device located at the UE side can be based on the formal parameters in the sequence parameters.
  • test parameters respectively generate an uplink signal corresponding to the formal parameter and a downlink test sequence corresponding to the test parameter, so that in the signal testing device and the test device, there are respectively matched uplink signals and uplink test sequences,
  • the downlink test sequence and the downlink signal that match each other, then, when the uplink signal sent by the signal test device and the uplink test sequence in the test device match each other, the downlink signal sent by the test device and the downlink test sequence in the signal test device are mutually
  • the signal test device and the test device can test each of the indicators to be tested. Therefore, when the signal test device sends an uplink signal to the test device, the signal test device and the test device are synchronized in sequence, and the downlink test sequence and the uplink are respectively performed.
  • Test sequence so, signal measurement
  • the device may test the downlink signal according to the downlink test sequence matched with the downlink signal, and may also synchronously trigger the test device to test the uplink signal according to the uplink test sequence matched with the uplink signal, thereby obtaining test results of the indicators to be tested.
  • the testing requirements for each of the indicators to be tested are satisfied, thereby eliminating the test blind spots existing in the testing of the radio frequency indicators of the mobile terminal, and further satisfying the testing requirements.
  • the disclosed apparatus and method may be implemented in other manners.
  • the device embodiments described above are merely illustrative.
  • the division of the unit is only a logical function division.
  • there may be another division manner such as: multiple units or components may be combined, or Can be integrated into another system, or some features can be ignored or not executed.
  • the coupling, or direct coupling, or communication connection of the components shown or discussed may be indirect coupling or communication connection through some interfaces, devices or units, and may be electrical, mechanical or other forms. of.
  • the units described above as separate components may or may not be physically separated, and the components displayed as the unit may or may not be physical units; they may be located in one place or distributed on multiple network units; Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of the embodiment.
  • each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may be separately used as one unit, or two or more units may be integrated into one unit;
  • the unit can be implemented in the form of hardware or in the form of hardware plus software functional units.
  • the foregoing program may be stored in a computer readable storage medium, and when executed, the program includes The foregoing steps of the method embodiment; and the foregoing storage medium includes: a removable storage device, a read only memory (ROM), a magnetic disk, or an optical disk, and the like, which can store program codes.
  • ROM read only memory
  • the above-described integrated unit of the present invention may be stored in a computer readable storage medium if it is implemented in the form of a software function module and sold or used as a standalone product.
  • the technical solution of the embodiments of the present invention may be embodied in the form of a software product in essence or in the form of a software product stored in a storage medium, including a plurality of instructions.
  • a computer device (which may be a personal computer, server, or network device, etc.) is caused to perform all or part of the methods described in various embodiments of the present invention.
  • the foregoing storage medium includes various media that can store program codes, such as a mobile storage device, a ROM, a magnetic disk, or an optical disk.
  • the control device sends the sequence parameters of the indicators to be tested, so that the signal testing device on the user equipment side can generate the uplink signals corresponding to the formal parameters according to the formal parameters and the test parameters in the sequence parameters.
  • a downlink test sequence corresponding to the test parameter so that in the signal test device and the test device, there are respectively matched uplink signals and uplink test sequences, and the downlink test sequence and the downlink signal match each other, then only When the uplink signal sent by the signal testing device and the uplink test sequence in the test device match each other, the downlink signal sent by the test device and the downlink test sequence in the signal testing device When the columns match each other, the signal testing device and the testing device can test each of the indicators to be tested.
  • the signal testing device sends an uplink signal to the testing device
  • the signal testing device and the testing device are synchronized.
  • the downlink test sequence and the uplink test sequence are respectively performed, so that the signal test device can test the downlink signal according to the downlink test sequence matched with the downlink signal, and can also synchronously trigger the test device to perform the uplink test according to the uplink signal.
  • the sequence tests the uplink signals to obtain the test results of the indicators to be tested, thus satisfying the test requirements for the indicators to be tested, thereby eliminating the test blind spots existing in the test of the radio frequency indicators of the mobile terminal, and further satisfying Test requirements.

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Abstract

本发明实施例公开了一种信号测试方法，接收控制设备发送的与各待测指标对应的序列参数；根据所述序列参数中包括的形式参数，生成上行信号，且根据所述序列参数中包括的测试参数，生成下行测试序列；发送所述上行信号至测试设备，触发所述测试设备根据预先生成的上行测试序列对所述上行信号进行测试，根据所述下行测试序列对所述测试设备发送的下行信号进行测试，得到所述各待测指标的测试结果。本发明实施例还同时公开了一种信号测试装置及计算机存储介质。

Description

一种信号测试方法、装置及计算机存储介质
相关申请的交叉引用
本申请基于申请号为201610738261.2、申请日为2016年08月26日的中国专利申请提出，并要求该中国专利申请的优先权，该中国专利申请的全部内容在此引入本申请作为参考。
技术领域
本发明涉及通信领域，尤其涉及一种信号测试方法、装置及计算机存储介质。
背景技术
目前，随着移动终端的快速发展，提高移动终端的性能指标势在必行，移动终端的射频指标的测试是其中必不可少的步骤。
现今，在对移动终端的射频指标的测试方法中，仍然是典型的终端与网络侧建立信令链接，然后再看上下行指标；然而，使用上述方法，测量的指标是在终端与网络建立链接后某段时间的射频指标，而很多种射频工作场景下的信号指标是无法测量到的，无法像示波器观测基带信号那样可以观测整个信号生命期所有时刻点的特征，并且，随着长期演进(LTE，Long Term Evolution)的普及，LTE的射频指标非常多，只运行基本射频指标测试，1个带宽全运行下来，需要半个小时的时间，随着带宽数的增加而递增，LTE信号形式也比第二代移动通信系统(2G，2rd-Generation)/第三代移动通信系统(3G，3rd-Generation)更加复杂，例如，带宽、调制方式、资源块(RB，Resource Block)、帧格式、信道形式等等，其中，现有的测试方法无法对某些特定形式的信号进行测试，从而带来的测试盲点较多，如此， 现有的移动终端的射频指标的测试方法中存在较多的测试盲点。
发明内容
有鉴于此，本发明实施例期望提供一种信号测试方法、装置及计算机存储介质，消除了对移动终端的射频指标的测试中存在的测试盲点，满足了测试需求。
为达到上述目的，本发明实施例的技术方案是这样实现的：
第一方面，本发明实施例提供了一种信号测试方法，应用于用户设备(UE，User Equipment)侧，所述方法包括：接收控制设备发送的与各待测指标对应的序列参数；根据所述序列参数中包括的形式参数，生成上行信号，且根据所述序列参数中包括的测试参数，生成下行测试序列；发送所述上行信号至测试设备，触发所述测试设备根据预先生成的上行测试序列对所述上行信号进行测试；根据所述下行测试序列对所述测试设备发送的下行信号进行测试，得到所述各待测指标的测试结果。
在一实施例中，所述触发所述测试设备根据预先生成的上行测试序列对所述上行信号进行测试；根据所述下行测试序列对所述测试设备发送的下行信号进行测试，包括：触发所述测试设备根据所述上行测试序列中时间与待测指标类别的对应关系，测试所述上行信号；根据所述下行测试序列中时间与待测指标类别的对应关系，测试所述下行信号。
在一实施例中，在发送所述上行信号至测试设备之后，在得到所述各待测指标的测试结果之前，所述方法包括：对物理层(PHY，Physical Layer)或者媒体控制接入层(MAC，Media Access Control)进行所述序列参数的配置；和/或，对逻辑信道或者传输信道进行所述序列参数的配置；和/或，对无线帧参数直接进行配置。
在一实施例中，在得到所述各待测指标的测试结果之后，所述方法还包括：接收所述控制设备的获取指令，返回所述测试结果至所述控制设备。
第二方面，本发明实施例提供了一种信号测试方法，应用于控制设备侧，所述方法包括：接收各待测指标；根据所述各待测指标，为用户设备(UE)生成与所述各待测指标对应的序列参数并发送至所述UE，且为测试设备生成与所述各待测指标对应的序列参数并发送至所述测试设备。
在一实施例中，在根据所述各待测指标，为UE生成与所述各待测指标对应的序列参数并发送至所述UE，为测试设备生成与所述各待测指标对应的序列参数并发送至所述测试设备之后，所述方法还包括：分别发送获取指令至所述UE和所述测试设备；分别从所述UE和所述测试设备中，获取所述各待测指标的测试结果。
第三方面，本发明实施例提供了一种信号测试装置，包括：第一接收模块，配置为接收控制设备发送的与各待测指标对应的序列参数；第一生成模块，配置为根据所述序列参数中包括的形式参数，生成上行信号，且根据所述序列参数中包括的测试参数，生成下行测试序列；测试模块，配置为发送所述上行信号至测试设备，触发所述测试设备根据预先生成的上行测试序列对所述上行信号进行测试；所述测试模块还配置为根据所述下行测试序列对所述测试设备发送的下行信号进行测试，得到所述各待测指标的测试结果。
在一实施例中，所述测试模块，具体配置为：发送所述上行信号至所述测试设备，触发所述测试设备根据所述上行测试序列中时间与待测指标类别的对应关系，测试所述上行信号；所述测试模块还具体配置为：根据所述下行测试序列中时间与待测指标类别的对应关系，测试所述下行信号，得到各所述待测指标的测试结果。
在一实施例中，所述测试模块，还配置为：在发送所述上行信号至测试设备之后，在得到所述各待测指标的测试结果之前，对物理层(PHY)或者媒体控制接入层(MAC)进行所述序列参数的配置；和/或，对逻辑信 道或者传输信道进行所述序列参数的配置；和/或，对无线帧参数直接进行配置。
在一实施例中，所述装置还包括：返回模块，配置为在得到所述各待测指标的测试结果之后，接收所述控制设备的获取指令，返回所述测试结果至所述控制设备。
第四方面，本发明实施例提供了一种信号测试装置，包括：第二接收模块，配置为接收各待测指标；第二生成模块，配置为根据所述各待测指标，为用户设备(UE)生成与所述各待测指标对应的序列参数并发送至所述UE，且为测试设备生成与所述各待测指标对应的序列参数并发送至所述测试设备。
在一实施例中，所述装置还包括：获取模块，配置为在根据所述各待测指标，为UE生成与所述待测指标对应的序列参数并发送至所述UE，为测试设备生成与所述待测指标对应的序列参数并发送至所述测试设备之后，分别发送获取指令至所述UE和所述测试设备；分别从所述UE和所述测试设备中，获取所述各待测指标的测试结果。
本发明实施例还提供了一种计算机存储介质，所述计算机存储介质中存储有计算机可执行指令，所述计算机可执行指令用于执行前述实施例所述的应用于用户设备(UE)侧的信号测试方法。
本发明实施例还提供了一种计算机存储介质，所述计算机存储介质中存储有计算机可执行指令，所述计算机可执行指令用于执行前述实施例所述的应用于控制设备侧的信号测试方法。
本发明实施例所提供的信号测试方法、装置及计算机存储介质，为了满足各待测指标的测试需求，由控制设备下发各待测指标的序列参数，使得信号测试装置可以根据序列参数中的形式参数和测试参数，分别生成与形式参数对应的上行信号和与测试参数对应的下行测试序列，这样，在信 号测试装置与测试设备中，就分别存在有互相匹配的上行信号和上行测试序列，互相匹配的下行测试序列与下行信号，那么，只有当信号测试装置下发的上行信号与测试设备中的上行测试序列互相匹配时，测试设备发送的下行信号与信号测试装置中的下行测试序列互相匹配时，信号测试装置与测试设备才能够测试出各待测指标，所以，当信号测试装置下发上行信号至测试设备，使得信号测试装置与测试设备实现序列同步，分别执行下行测试序列和上行测试序列，如此，信号测试装置可以根据与下行信号相匹配的下行测试序列对下行信号进行测试，还可以同步触发测试设备根据与上行信号相匹配的上行测试序列对上行信号进行测试，从而得到各待测指标的测试结果，这样，满足了对各待测指标的测试需求，从而消除了对移动终端的射频指标的测试中存在的测试盲点，进一步地满足了测试需求。
附图说明
图1为本发明实施例中的测试系统的结构示意图；
图2为本发明实施例中的测试系统的一种可选的结构示意图；
图3为本发明实施例中的信号测试方法的流程示意图；
图4为本发明实施例中的LTE上下行测试序列的时序图；
图5为本发明实施例中的无线接入协议体系的结构示意图；
图6为本发明实施例中的信号测试方法的一种可选的流程示意图；
图7为本发明实施例中的信号测试方法的另一种可选的流程示意图；
图8为本发明实施例中的信号测试装置的一种可选的结构示意图；
图9为本发明实施例中的信号测试装置的另一种可选的结构示意图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述。
本发明实施例提供一种信号测试系统，图1为本发明实施例中的测试系统的结构示意图，如图1所示，该测试系统可以包括：一个控制设备11、一个用户设备12(UE，User Equipment)和一个测试设备13，控制设备11分别连接至UE12和测试设备13，UE12与测试设备13建立有通信连接；
其中，在上述图1中，控制设备11主要配置为在信号的测试过程中，对UE12和测试设备13进行控制，其中，上述控制设备11可以包括个人计算机(PC，Personal Computer)或者服务器等；
另外，UE12与测试设备13通过射频线相连接，建立无线信号的连接，UE12与测试设备13，通过测试UE12与测试设备13之间的无线信号来对得到各待测指标的测试结果，其中，UE12可以包括手机和平板电脑等，测试设备可以为仪表；
举例来说，图2为本发明实施例中的测试系统的一种可选的结构示意图，如图2所示，上述测试系统包括一个PC、一个UE和一个仪表(instrument)，其中，PC与仪表之间通过通用接口总线(GPIB，General-Purpose Interface Bus)或者传输控制协议/因特网互联协议(TCP/IP，Transmission Control Protocol/Internet Protocol)连接，实现对仪表的程控；PC机与UE之间通过通用串行总线(USB，Universal Serial Bus)连接，PC向UE发送命令实现对UE的程控；UE的天线接口ANT0和ANT1通过射频线分别连接至与仪表的射频接口RF1COM和RF3COM，其中，射频接口RF1COM在图2中用序号⑤表示，射频接口RF3COM在图2中用序号⑥表示，从而建立无线信号连接。
结合本发明实施例，在上述测试系统中，UE12配置为：接收控制设备11发送的与各待测指标对应的序列参数；根据序列参数中包括的形式参数，生成上行信号，且根据序列参数中包括的测试参数，生成下行测试序列；发送上行信号至测试设备13，触发测试设备13根据预先生成的上行测试序 列对上行信号进行测试，根据下行测试序列对测试设备13发送的下行信号进行测试，得到各待测指标的测试结果。
控制设备11配置为：接收各待测指标；根据各待测指标，为UE12生成与各待测指标对应的序列参数并发送至UE12，且为测试设备13生成与各待测指标对应的序列参数并发送至测试设备13。
下面结合上述系统来对本发明实施例提供的信号测试方法进行说明。
图3为本发明实施例中的信号测试方法的流程示意图；如图3所示，该信号测试方法包括：
S301：控制设备接收各待测指标；根据各待测指标，为UE生成与各待测指标对应的序列参数并发送至UE，且为测试设备生成与各待测指标对应的序列参数并发送至测试设备。
其中，上述各待测指标可以包括误差向量幅度(EVM，Error Vector Magnitude)、邻道干扰比(ACLR，Adjacent Channel Leakage Ratio)、功率(Power)、频率误差(Frequency Error)、自动增益控制(AGC，Automatic Gain Control)、接收信号的强度指示(RSSI，Received Signal Strength Indicator)、参考信号接收功率(RSRP，Reference Signal Receiving Power)、误块率(BLER，Block Error Ratio)、系统参数N0(用于表示接收到的噪声)等等，这里，本发明不做具体限定。
控制设备在接收到各待测指标之后，查找各待测指标对应的序列参数，则得到了各待测指标对应的序列参数，其中，上述序列参数可以包括：UE的序列参数和测试设备的序列参数。
UE的序列参数包括形式参数和测试参数，其中，该形式参数规定UE发送给测试设备的上行信号的形式，该形式参数可以包括调制方式、带宽、资源块的数量(RB Number)、资源块的起始位置(RB offset)、帧结构(Frame Configure)、信道形式和数据内容等等，上述信道形式可以包括：物理上行 链路控制信道(PUCCH，Physical Uplink Control Channel)和物理上行共享信道(PUSCH，Physical Uplink Shared Channel)等等，数据内容包括全0(ALL0)、全1(ALL1)或者随机码(PN9)等等；测试参数规定UE测试下行信号的测试时间和测试的指标类别，该测试的指标类别可以包括AGC、RSSI、RSRP、BLER、N0、Frequency Error等等。
测试设备的参数序列包括形式参数和测试参数，其中，该形式参数规定了下行信号形式，该形式参数可以为小区功率(cell power)、频点、带宽、调制方式等等；该测试参数规定了测试设备测试上行信号的测试时间和测试的指标类别，该测试的指标类别可以包括EVM、ACLR、Power、Frequency Error等等。
控制设备在为UE确定出序列参数和为测试设备确定出序列参数之后，分别发送至UE和测试设备。
S302：UE接收控制设备为UE生成的与各待测指标对应的序列参数，UE根据序列参数中包括的形式参数，生成上行信号，且根据序列参数中包括的测试参数，生成下行测试序列。
作为一种实施方式，S302还包括：测试设备接收控制设备为测试设备生成的与各待测指标对应的序列参数，测试设备根据序列参数中包括的形式参数，生成下行信号，且根据序列参数中包括的测试参数，生成上行测试序列。
具体来说，UE与测试设备在接收到各自的序列参数之后，由于控制设备所生成的UE的序列参数和测试设备的序列参数是互相匹配的，使得UE生成的上行信号与测试设备生成的上行测试序列互相匹配，测试设备生成的下行信号与UE生成的下行测试序列互相匹配。
其中，上述上行测试序列和下行测试序列中规定了各待测指标的测试时间，图4为本发明实施例中的LTE上下行测试序列的时序图，如图4所 示，测试序列规定了每个时刻点的上下行测试指标的类别，同时包含与之对应的上下行形式参数，对于下行流量(RX，Receive)，按序列参数配置好仪表的下行信号，UE处于不断的测量状态，拿到所有时刻点的数据；其中，对于RX，序列参数可以包括：RSRP，AGC，N0，BLER；对于上行流量(TX，Transmit)，规定UE每个时刻点上行信号的形式参数，与之对应的仪表按信号形式采用合适的上行测试序列进行测量，其中，对于TX，第一个基带中，带宽随着时间的推移为20M，10M，5M，信道随着时间的推移由高变中变低，在测试的过程中，第1个测试项目(Test Item)，在上行测试序列的前20ms，上行测试序列测试为全部资源块(FULL RB)时，上行测试序列测试的指标包括：最大功率(MaxPower)，EVM，ACLR，频谱辐射模板(SEM，Spectral Emission Mask)，源点偏移(IQ Offset)，归一化频谱平坦度(ESF，Extended Spectral Flatness)等等；第2个测试项目，在随后的60ms，上行测试序列测试为：1个资源块(1RB)，资源块起始位置为Offset 0/49/99时，测试指标包括MaxPower，EVM，ACLR，SEM，IQ Offset，ESF；第3个测试项目，在随后的60ms，18个资源块(18RB)，资源块起始位置为Offset 0/32/82时，测试指标包括Maxpower，EVM，ACLR，SEM，IQ Offset，ESF；第4个测试项目，在随后的20ms，1个资源块(1RB)，资源块起始位置为Offset 0时，测试指标包括MaxPower，EVM，ACLR，SEM，IQ Offset，ESF；第5个测试项目，在随后的40ms，上行测试序列测试的指标包括：最小功率(MinPower)；第6个测试项目，在随后的40ms，上行测试序列测试的指标为IQ偏移(IQ Offset)；第7个测试项目，在随后的20ms，上行测试序列测试的指标为：时间模板(Time Mask)。
S303：UE发送上行信号至测试设备，触发测试设备发送下行信号至UE；测试设备根据上行测试序列对上行信号进行测试，UE根据下行测试序列对下行信号进行测试，得到各待测指标的测试结果。
为了实现序列同步，首先，UE发送上行信号至测试设备，触发测试设备发送下行信号至测试设备，同时开始执行上行测试序列和下行测试序列，这样，便完成了系列同步，保障了测试结果的正确性。
进一步地，为了得到各待测指标的测试结果，在一种可选的实施例中，测试设备根据上行测试序列对上行信号进行测试，包括：测试设备根据上行测试序列中时间与待测指标类别的对应关系，测试上行信号；UE根据下行测试序列对下行信号进行测试，得到各待测指标的测试结果，包括：UE根据下行测试序列中时间与待测指标类别的对应关系，测试下行信号。
基于前述提到的，上行信号与上行测试序列相匹配，下行信号与下行测试序列相匹配，那么，当UE与测试设备实现序列同步之后，UE与测试设备执行下行测试序列和上行测试序列，皆可以准确地测试出各待测指标的测试结果。
为了进一步获取到更为精确的各待测指标的测试结果，在一种可选的实施例中，在发送上行信号至测试设备之后，在得到各待测指标的测试结果之前，上述方法包括：对物理层(PHY)或者媒体控制接入层(MAC)进行序列参数的配置；和/或，对逻辑信道或者传输信道进行序列参数的配置；和/或，对无线帧参数直接进行配置。
图5为本发明实施例中的无线接入协议体系的结构示意图，如图5所示，该无线接入协议的体系结构包括：第一层(Layer1)物理层(PHY，Physical Layer)，第二层(Layer2)媒体接入控制(MAC，Media Access Control)和第三层无线资源控制(RRC，Radio Resource Control)，PHY层与MAC层之间为传输信道(Transport channels)，MAC与RRC之间为逻辑信道(Logical channels)；
整个移动通信架构由三层构成，由于射频指标与RRC层无关联，在MAC层与RRC层之间的接口处、MAC层、MAC层与PHY层之间的接口 处进行调用，形成非信令测试序列，形成的非信令测试序列通过剔除信令交互，便可以确定每个时刻点的射频信号的动作，可以使用仪表扫描每个时刻点的信号，也可以灌入不同形式的下行信号；保证MAC和PHY的完整性，可以保证射频指标测试的一致性。
其中，在PHY与MAC、RRC之间的接口作为切入点，构造序列化过程，实现非信令测试序列。
构造按分层逻辑实施，具体分几层，是依赖于整个通信协议栈软硬件实现架构以及想观测的点而决定的，这里，可以考虑分三个层次进行实现。
第一个层次为：对协议规范定义的PHY层过程/MAC层过程的相关参数进行配置，形成非信令测试序列，用于检验协议规范定义的PHY/MAC过程实现的正确性、以及过程执行所表现出的具体射频性能指标。例如，配置ALL0/ALL1/PN9的数据源；配置不同的编码方式、滤波系数；配置RB、调试方式、子帧配比、天线等等，这样，将该序列参数配置至PHY层/MAC层中，那么，此时测试待测指标时，所得到的与运行了代码的硬件相关的待测指标的测试结果更为准确。
第二个层次为：对逻辑信道/传输信道的相关参数进行配置，形成非信令测试序列；用于检验信道的实现正确性以及信道相关参数最终落实到射频信号上所表现出的具体射频性能指标；例如，打掉PUSCH信道，只保留PUCCH信道，观测PUCCH信道的信号指标；单独观测PCFICH信道的指标；对PUSCH或PUCCH配置特定的UCI参数，观测射频信号指标等等，这样保障了针对PUCCH的待测指标的准确性；
第二个层次为：对无线帧相关参数直接配置，形成非信令测试序列；用于检验硬件射频性能指标；此时，不再受限于协议定义的物理层，是基于射频演示(DEMO，demonstration)板的测试方式，可以通过自定义帧长、调制方式、数据源等等，测试频域/时域的射频指标。
三个层次各有侧重，第一层/第二层的非信令测试序列偏重与考察协议规范规定的整个完整的PHY层/MAC层往下的行为；第三层的非信令测试序列更偏重于硬件的不同场景的检查。
S304：控制设备分别从UE与测试设备中获取各待测指标的测试结果。
在一种可选的实施例中，在步骤S304之前，上述方法可以包括：控制设备分别发送获取指令至UE与测试设备，UE发送测试结果至控制设备，测试设备发送测试结果至控制设备。
在实际应用中，上下行测试序列是在指定时间段执行的，所以何时结束控制设备是可以预测的，在序列结束后，控制设备查询仪表，确定实际状态，然后查询仪表侧的测量数据，查询UE侧的测量数据。
至此，便完成了对待测指标的测试，控制设备得到了各待测指标的测试结果。
本发明实施例所提供的信号测试方法，为了满足各待测指标的测试需求，由控制设备下发各待测指标的序列参数，使得信号测试装置可以根据序列参数中的形式参数和测试参数，分别生成与形式参数对应的上行信号和与测试参数对应的下行测试序列，这样，在信号测试装置与测试设备中，就分别存在有互相匹配的上行信号和上行测试序列，互相匹配的下行测试序列与下行信号，那么，只有当信号测试装置下发的上行信号与测试设备中的上行测试序列互相匹配时，测试设备发送的下行信号与信号测试装置中的下行测试序列互相匹配时，信号测试装置与测试设备才能够测试出各待测指标，所以，当信号测试装置下发上行信号至测试设备，使得信号测试装置与测试设备实现序列同步，分别执行下行测试序列和上行测试序列，如此，信号测试装置可以根据与下行信号相匹配的下行测试序列对下行信号进行测试，还可以同步触发测试设备根据与上行信号相匹配的上行测试序列对上行信号进行测试，从而得到各待测指标的测试结果，这样，满足 了对各待测指标的测试需求，从而消除了对移动终端的射频指标的测试中存在的测试盲点，进一步地满足了测试需求。
下面站在基于信号测试系统中各个设备侧对上述通信方法进行说明。
首先，站在UE侧对信号测试方法进行描述。
图6为本发明实施例中的信号测试的一种可选的流程示意图，如图6所示，该方法包括：
步骤S601：接收控制设备发送的与各待测指标对应的序列参数；
步骤S602：根据序列参数中包括的形式参数，生成上行信号，且根据序列参数中包括的测试参数，生成下行测试序列；
步骤S603：发送上行信号至测试设备，触发测试设备根据预先生成的上行测试序列对上行信号进行测试，根据下行测试序列对测试设备发送的下行信号进行测试，得到各待测指标的测试结果。
在一种可选的实施例中，为了得到各待测指标的测试结果，步骤S603中，所述触发测试设备根据预先生成的上行测试序列对上行信号进行测试，包括：触发测试设备根据上行测试序列中时间与待测指标类别的对应关系，测试上行信号；所述根据下行测试序列对测试设备发送的下行信号进行测试，包括：根据下行测试序列中时间与待测指标类别的对应关系，测试下行信号。
在一种可选的实施例中，为了得到更为准确的测试结果，在步骤S603中，在发送上行信号至测试设备之后，在得到各待测指标的测试结果之前，上方法包括：对物理层(PHY)或者媒体控制接入层(MAC)进行序列参数的配置；和/或，对逻辑信道或者传输信道进行序列参数的配置；和/或，对无线帧参数直接进行配置。
在一种可选的实施例中，步骤S603之后，上述方法还可以包括：接收控制设备的获取指令，返回测试结果至控制设备。
其次，站在控制设备侧对信号测试方法进行描述。
图7为本发明实施例中的信号测试方法的另一种可选的流程示意图，如图7所示，该方法包括：
步骤S701：接收各待测指标；
步骤S702：根据各待测指标，为用户设备(UE)生成与各待测指标对应的序列参数并发送至UE，且为测试设备生成与各待测指标对应的序列参数并发送至测试设备。
在一种可选的实施例中，控制设备为了获取到测试结果，步骤S702之后，上述方法还可以包括：
分别发送获取指令至UE和测试设备；
分别从UE和测试设备中，获取各待测指标的测试结果。
基于同一发明构思，本发明实施例提供一种信号测试装置，与上述一个或者多个实施例中所述的UE一致。
图8为本发明实施例中的信号测试装置的一种可选的结构示意图，如图8所示，上述信号测试装置包括：第一接收模块81、第一生成模块82和测试模块83；
其中，所述第一接收模块81，配置为接收控制设备发送的与各待测指标对应的序列参数；所述第一生成模块82，配置为根据序列参数中包括的形式参数，生成上行信号，且根据序列参数中包括的测试参数，生成下行测试序列；所述测试模块83，配置为发送上行信号至测试设备，触发测试设备根据预先生成的上行测试序列对上行信号进行测试，还配置为根据下行测试序列对测试设备发送的下行信号进行测试，得到各待测指标的测试结果。
在一种可选的实施例中，为了得到各待测指标的测试结果，上述测试模块83，具体配置为：发送上行信号至测试设备，触发测试设备根据上行 测试序列中时间与待测指标类别的对应关系，测试上行信号；还具体配置为：根据下行测试序列中时间与待测指标类别的对应关系，测试下行信号，得到各待测指标的测试结果。
在另一种可选的实施例中，为了得到更为准确的测试结果，上述测试模块83，还配置为：在发送上行信号至测试设备之后，在得到各待测指标的测试结果之前，对物理层(PHY)或者媒体控制接入层(MAC)进行序列参数的配置；和/或，对逻辑信道或者传输信道进行序列参数的配置；和/或，对无线帧参数直接进行配置。
在另一种可选的实施例中，上述装置还可以包括：返回模块84(在图8中未示出)，配置为在得到各待测指标的测试结果之后，接收控制设备的获取指令，返回测试结果至控制设备。
本实施例所述的信号测试装置可应用于用户设备侧。
在实际应用中，所述第一接收模块81、所述第一生成模块82、所述测试模块83和所述返回模块84均可由位于UE的中央处理器(CPU，Central Processing Unit)、微处理器(MPU，Microprocessor Unit)、专用集成电路(ASIC，Application Specific Integrated Circuit)或现场可编程门阵列(FPGA，Field-Programmable Gate Array)等实现。
基于同一发明构思，本发明实施例提供一种信号测试装置，与上述一个或者多个实施例中所述的控制设备一致。
图9为本发明实施例中的信号测试的另一种可选的结构示意图，如图9所示，上述信号测试装置包括：第二接收模块91和第二生成模块92；
其中，所述第二接收模块91，配置为接收各待测指标；所述第二生成模块92，配置为根据各待测指标，为用户设备(UE)生成与各待测指标对应的序列参数并发送至UE，且为测试设备生成与各待测指标对应的序列参数并发送至测试设备。
在一种可选的实施例中，控制设备为了获取到测试结果，上述装置还包括：获取模块93(在图9中未示出)，配置为在根据各待测指标，为用户设备(UE)生成与待测指标对应的序列参数并发送至UE，为测试设备生成与待测指标对应的序列参数并发送至测试设备之后，分别发送获取指令至UE和测试设备；分别从UE和测试设备中，获取各待测指标的测试结果。
在实际应用中，所述第二接收模块91、所述第二生成模块92及所述获取模块93均可由位于控制设备的CPU、MPU、ASIC或FPGA等实现。
本实施例所述的信号测试装置可应用于控制设备侧。
本实施例记载一种计算机可读介质，可以为ROM(例如，只读存储器、FLASH存储器、转移装置等)、磁存储介质(例如，磁带、磁盘驱动器等)、光学存储介质(例如，CD-ROM、DVD-ROM、纸卡、纸带等)以及其他熟知类型的程序存储器；计算机可读介质中存储有计算机可执行指令，当执行指令时，引起至少一个处理器执行包括以下的操作：
接收控制设备发送的与各待测指标对应的序列参数；根据序列参数中包括的形式参数，生成上行信号，且根据序列参数中包括的测试参数，生成下行测试序列；发送上行信号至测试设备，触发测试设备根据预先生成的上行测试序列对上行信号进行测试，根据下行测试序列对测试设备发送的下行信号进行测试，得到各待测指标的测试结果。
本实施例还记载一种计算机可读介质，可以为ROM(例如，只读存储器、FLASH存储器、转移装置等)、磁存储介质(例如，磁带、磁盘驱动器等)、光学存储介质(例如，CD-ROM、DVD-ROM、纸卡、纸带等)以及其他熟知类型的程序存储器；计算机可读介质中存储有计算机可执行指令，当执行指令时，引起至少一个处理器执行包括以下的操作：
接收各待测指标；根据所述各待测指标，为用户设备(UE)生成与所述各待测指标对应的序列参数并发送至所述UE，且为测试设备生成与所述 各待测指标对应的序列参数并发送至所述测试设备。
本发明实施例所提供的信号测试方法，为了满足各待测指标的测试需求，由控制设备下发各待测指标的序列参数，使得位于UE侧的信号测试装置可以根据序列参数中的形式参数和测试参数，分别生成与形式参数对应的上行信号和与测试参数对应的下行测试序列，这样，在所述信号测试装置与测试设备中，就分别存在有互相匹配的上行信号和上行测试序列，互相匹配的下行测试序列与下行信号，那么，只有当信号测试装置下发的上行信号与测试设备中的上行测试序列互相匹配时，测试设备发送的下行信号与信号测试装置中的下行测试序列互相匹配时，信号测试装置与测试设备才能够测试出各待测指标，所以，当信号测试装置下发上行信号至测试设备，使得信号测试装置与测试设备实现序列同步，分别执行下行测试序列和上行测试序列，如此，信号测试装置可以根据与下行信号相匹配的下行测试序列对下行信号进行测试，还可以同步触发测试设备根据与上行信号相匹配的上行测试序列对上行信号进行测试，从而得到各待测指标的测试结果，这样，满足了对各待测指标的测试需求，从而消除了对移动终端的射频指标的测试中存在的测试盲点，进一步地满足了测试需求。
这里需要指出的是：以上装置实施例项的描述，与上述方法描述是类似的，具有同方法实施例相同的有益效果，因此不做赘述。对于本发明装置实施例中未披露的技术细节，本领域的技术人员请参照本发明方法实施例的描述而理解，为节约篇幅，这里不再赘述。
这里需要指出的是：
应理解，说明书通篇中提到的“一个实施例”或“一实施例”意味着与实施例有关的特定特征、结构或特性包括在本发明的至少一个实施例中。因此，在整个说明书各处出现的“在一个实施例中”或“在一实施例中”未必一定指相同的实施例。此外，这些特定的特征、结构或特性可以任意 适合的方式结合在一个或多个实施例中。应理解，在本发明的各种实施例中，上述各过程的序号的大小并不意味着执行顺序的先后，各过程的执行顺序应以其功能和内在逻辑确定，而不应对本发明实施例的实施过程构成任何限定。上述本发明实施例序号仅仅为了描述，不代表实施例的优劣。
需要说明的是，在本文中，术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含，从而使得包括一系列要素的过程、方法、物品或者装置不仅包括那些要素，而且还包括没有明确列出的其他要素，或者是还包括为这种过程、方法、物品或者装置所固有的要素。在没有更多限制的情况下，由语句“包括一个……”限定的要素，并不排除在包括该要素的过程、方法、物品或者装置中还存在另外的相同要素。
在本申请所提供的几个实施例中，应该理解到，所揭露的设备和方法，可以通过其它的方式实现。以上所描述的设备实施例仅仅是示意性的，例如，所述单元的划分，仅仅为一种逻辑功能划分，实际实现时可以有另外的划分方式，如：多个单元或组件可以结合，或可以集成到另一个系统，或一些特征可以忽略，或不执行。另外，所显示或讨论的各组成部分相互之间的耦合、或直接耦合、或通信连接可以是通过一些接口，设备或单元的间接耦合或通信连接，可以是电性的、机械的或其它形式的。
上述作为分离部件说明的单元可以是、或也可以不是物理上分开的，作为单元显示的部件可以是、或也可以不是物理单元；既可以位于一个地方，也可以分布到多个网络单元上；可以根据实际的需要选择其中的部分或全部单元来实现本实施例方案的目的。
另外，在本发明各实施例中的各功能单元可以全部集成在一个处理单元中，也可以是各单元分别单独作为一个单元，也可以两个或两个以上单元集成在一个单元中；上述集成的单元既可以采用硬件的形式实现，也可以采用硬件加软件功能单元的形式实现。
本领域普通技术人员可以理解：实现上述方法实施例的全部或部分步骤可以通过程序指令相关的硬件来完成，前述的程序可以存储于计算机可读取存储介质中，该程序在执行时，执行包括上述方法实施例的步骤；而前述的存储介质包括：移动存储设备、只读存储器(Read Only Memory，ROM)、磁碟或者光盘等各种可以存储程序代码的介质。
或者，本发明上述集成的单元如果以软件功能模块的形式实现并作为独立的产品销售或使用时，也可以存储在一个计算机可读取存储介质中。基于这样的理解，本发明实施例的技术方案本质上或者说对现有技术做出贡献的部分可以以软件产品的形式体现出来，该计算机软件产品存储在一个存储介质中，包括若干指令用以使得一台计算机设备(可以是个人计算机、服务器、或者网络设备等)执行本发明各个实施例所述方法的全部或部分。而前述的存储介质包括：移动存储设备、ROM、磁碟或者光盘等各种可以存储程序代码的介质。
以上所述，仅为本发明的具体实施方式，但本发明的保护范围并不局限于此，任何熟悉本技术领域的技术人员在本发明揭露的技术范围内，可轻易想到变化或替换，都应涵盖在本发明的保护范围之内。因此，本发明的保护范围应以所述权利要求的保护范围为准。
工业实用性
本发明实施例的技术方案，由控制设备下发各待测指标的序列参数，使得用户设备侧的信号测试装置可以根据序列参数中的形式参数和测试参数，分别生成与形式参数对应的上行信号和与测试参数对应的下行测试序列，这样，在所述信号测试装置与测试设备中，就分别存在有互相匹配的上行信号和上行测试序列，互相匹配的下行测试序列与下行信号，那么，只有当所述信号测试装置下发的上行信号与测试设备中的上行测试序列互相匹配时，测试设备发送的下行信号与所述信号测试装置中的下行测试序 列互相匹配时，所述信号测试装置与测试设备才能够测试出各待测指标，所以，当所述信号测试装置下发上行信号至测试设备，使得所述信号测试装置与测试设备实现序列同步，分别执行下行测试序列和上行测试序列，如此，所述信号测试装置可以根据与下行信号相匹配的下行测试序列对下行信号进行测试，还可以同步触发测试设备根据与上行信号相匹配的上行测试序列对上行信号进行测试，从而得到各待测指标的测试结果，这样，满足了对各待测指标的测试需求，从而消除了对移动终端的射频指标的测试中存在的测试盲点，进一步地满足了测试需求。

Claims (14)

  1. 一种信号测试方法，所述方法包括：
    接收控制设备发送的与各待测指标对应的序列参数；
    根据所述序列参数中包括的形式参数，生成上行信号，且根据所述序列参数中包括的测试参数，生成下行测试序列；
    发送所述上行信号至测试设备，触发所述测试设备根据预先生成的上行测试序列对所述上行信号进行测试，根据所述下行测试序列对所述测试设备发送的下行信号进行测试，得到所述各待测指标的测试结果。
  2. 根据权利要求1所述的方法，其中，所述触发所述测试设备根据预先生成的上行测试序列对所述上行信号进行测试，包括：
    触发所述测试设备根据所述上行测试序列中时间与待测指标类别的对应关系，测试所述上行信号；
    所述根据所述下行测试序列对所述测试设备发送的下行信号进行测试，包括：
    根据所述下行测试序列中时间与待测指标类别的对应关系，测试所述下行信号。
  3. 根据权利要求1所述的方法，其中，在发送所述上行信号至测试设备之后，在得到所述各待测指标的测试结果之前，所述方法包括：
    对物理层PHY或者媒体控制接入层MAC进行所述序列参数的配置；
    和/或，对逻辑信道或者传输信道进行所述序列参数的配置；
    和/或，对无线帧参数直接进行配置。
  4. 根据权利要求1所述的方法，其中，在得到所述各待测指标的测试结果之后，所述方法还包括：
    接收所述控制设备的获取指令，返回所述测试结果至所述控制设备。
  5. 一种信号测试方法，所述方法还包括：
    接收各待测指标；
    根据所述各待测指标，为用户设备UE生成与所述各待测指标对应的序列参数并发送至所述UE，且为测试设备生成与所述各待测指标对应的序列参数并发送至所述测试设备。
  6. 根据权利要求5所述的方法，在根据所述各待测指标，为UE生成与所述各待测指标对应的序列参数并发送至所述UE，为测试设备生成与所述各待测指标对应的序列参数并发送至所述测试设备之后，所述方法还包括：
    分别发送获取指令至所述UE和所述测试设备；
    分别从所述UE和所述测试设备中，获取所述各待测指标的测试结果。
  7. 一种信号测试装置，所述装置包括：
    第一接收模块，配置为接收控制设备发送的与各待测指标对应的序列参数；
    第一生成模块，配置为根据所述序列参数中包括的形式参数，生成上行信号，且根据所述序列参数中包括的测试参数，生成下行测试序列；
    测试模块，配置为发送所述上行信号至测试设备，触发所述测试设备根据预先生成的上行测试序列对所述上行信号进行测试，根据所述下行测试序列对所述测试设备发送的下行信号进行测试，得到所述各待测指标的测试结果。
  8. 根据权利要求7所述的装置，其中，所述测试模块，具体配置为：
    发送所述上行信号至所述测试设备，触发所述测试设备根据所述上行测试序列中时间与待测指标类别的对应关系，测试所述上行信号；
    还具体配置为：根据所述下行测试序列中时间与待测指标类别的对应关系，测试所述下行信号，得到各所述待测指标的测试结果。
  9. 根据权利要求7所述的装置，其中，所述测试模块，还配置为：
    在发送所述上行信号至测试设备之后，在得到所述各待测指标的测试结果之前，对物理层PHY或者媒体控制接入层MAC进行所述序列参数的配置；和/或，对逻辑信道或者传输信道进行所述序列参数的配置；和/或，对无线帧参数直接进行配置。
  10. 根据权利要求7所述的装置，其中，所述装置还包括：
    返回模块，配置为在得到所述各待测指标的测试结果之后，接收所述控制设备的获取指令，返回所述测试结果至所述控制设备。
  11. 一种信号测试装置，所述装置包括：
    第二接收模块，配置为接收各待测指标；
    第二生成模块，配置为根据所述各待测指标，为用户设备UE生成与所述各待测指标对应的序列参数并发送至所述UE，且为测试设备生成与所述各待测指标对应的序列参数并发送至所述测试设备。
  12. 根据权利要求11所述的装置，其中，所述装置还包括：
    获取模块，配置为在根据所述各待测指标，为UE生成与所述待测指标对应的序列参数并发送至所述UE，为测试设备生成与所述待测指标对应的序列参数并发送至所述测试设备之后，分别发送获取指令至所述UE和所述测试设备；分别从所述UE和所述测试设备中，获取所述各待测指标的测试结果。
  13. 一种计算机存储介质，所述计算机存储介质中存储有计算机可执行指令，所述计算机可执行指令用于执行权利要求1至4任一项所述的信号测试方法。
  14. 一种计算机存储介质，所述计算机存储介质中存储有计算机可执行指令，所述计算机可执行指令用于执行权利要求5或6所述的信号测试方法。
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CN110350987A (zh) * 2019-06-25 2019-10-18 成都九洲迪飞科技有限责任公司 一种基于qt的跨平台射频指标自动化测试系统及测试方法
CN115499350A (zh) * 2021-06-03 2022-12-20 大唐移动通信设备有限公司 下行链路的测试方法及装置
CN115499350B (zh) * 2021-06-03 2023-10-20 大唐移动通信设备有限公司 下行链路的测试方法及装置

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