WO2018026237A1 - Device for inspecting and correcting defects of printed circuit board and method therefor - Google Patents

Device for inspecting and correcting defects of printed circuit board and method therefor Download PDF

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Publication number
WO2018026237A1
WO2018026237A1 PCT/KR2017/008450 KR2017008450W WO2018026237A1 WO 2018026237 A1 WO2018026237 A1 WO 2018026237A1 KR 2017008450 W KR2017008450 W KR 2017008450W WO 2018026237 A1 WO2018026237 A1 WO 2018026237A1
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WIPO (PCT)
Prior art keywords
component
printed circuit
defect
solder
circuit board
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Application number
PCT/KR2017/008450
Other languages
French (fr)
Korean (ko)
Inventor
박영호
서금호
김반석
신재득
김용
Original Assignee
주식회사 고영테크놀러지
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Publication of WO2018026237A1 publication Critical patent/WO2018026237A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0815Controlling of component placement on the substrate during or after manufacturing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/0404Pick-and-place heads or apparatus, e.g. with jaws
    • H05K13/0408Incorporating a pick-up tool
    • H05K13/0409Sucking devices
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/046Surface mounting
    • H05K13/0465Surface mounting by soldering
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/0486Replacement and removal of components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0817Monitoring of soldering processes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/089Calibration, teaching or correction of mechanical systems, e.g. of the mounting head

Definitions

  • the present invention relates to an apparatus and method for inspecting whether a component mounted on a printed circuit board is defective and correcting the detected defect.
  • the component mounting process of the printed circuit board mounted in an electronic device is as follows. First, solder paste is printed on a pad portion for connecting a component to a circuit on a substrate. The component is mounted on the printed solder paste, and the terminal of the component mounted on the solder paste is electrically connected to the pad part by heat-treating the solder paste through a reflow process.
  • a defect may occur in the component or component mounting for various reasons.
  • a reflow process may be performed on a substrate in a position or orientation different from the position or orientation in which the component is to be mounted, or in a state in which the component does not sufficiently contact the solder paste, thereby providing Poor electrical connections may occur.
  • a failure in mounting a part may occur due to an error generated in the printing process of the solder paste on the substrate.
  • solder is not soldered on the substrate, resulting in poor contact between the component and the pad portion, solder is over-charged, or solder is not printed correctly at the designed location on the substrate, resulting in components or solders mounted on the substrate. Short may occur.
  • AOI automatic optical inspection
  • the AOI technology obtains a two-dimensional or three-dimensional image of a component (for example, a component mounted on a substrate) through optical technology, and recognizes the appearance or state of the component from the acquired image, thereby determining whether the component is defective. It is a skill to judge.
  • the component whose defect is confirmed through optical inspection or the board on which the component is mounted is discarded by an operator or subjected to proper defect correction before being transferred for further processing.
  • the present invention provides a system and method for correcting a defect in component mounting on a solder prior to mounting (or placing) the component on a solder printed on a printed circuit board and securing the component to the solder through a reflow process. It aims to do it.
  • the present invention can provide a system and method for removing or correcting a badly mounted component or solder in a printed circuit board having dense components, while minimizing the effect on components having a normal component mounting state on the solder. .
  • An inspection and failure correcting apparatus for a printed circuit board is an apparatus for inspecting and defect correcting a printed circuit board including a component disposed on a solder paste.
  • An inspection unit for determining the position and type of the defect with respect to the component on the printed circuit board, and based on the position and type of the defect received from the inspection unit, removal of the component for the correction of the defect, direction adjustment of the component, and the component Removing a part on a printed circuit board by using a control unit for generating a control signal relating to at least one calibration operation of the arrangement of parts and a part operating means capable of temporarily holding the part according to the control signal Or a part calibration unit for adjusting the direction of the parts or placing the parts on the printed circuit board.
  • a control unit for generating a control signal relating to at least one calibration operation of the arrangement of parts and a part operating means capable of temporarily holding the part according to the control signal
  • a part calibration unit for adjusting the direction of the parts or placing the parts on the printed circuit board.
  • an inspection and failure correcting apparatus of a printed circuit board may include at least one of the type of the defect including component misalignment, component lifting, component position misalignment, component misalignment, solder nonpayment, and solder overpayment. It features.
  • the inspection and failure correction apparatus of a printed circuit board according to an embodiment of the present invention is characterized in that the component realignment unit separates from the substrate by fixing, adsorbing or adhering the parts associated with the failure according to the control signal. do.
  • the inspection and failure correction apparatus of a printed circuit board may further include a solder removing unit which removes solder remaining in a region where components are separated on the printed circuit board, and wherein the controller controls the residual solder. And further generating a control signal relating to the removing operation and separating the component associated with the defect from the substrate according to the control signal relating to the operation of removing the residual solder. It is characterized by removing the solder remaining in the area where the associated component is removed.
  • An inspection and failure correcting apparatus for a printed circuit board may further include a solder soldering part for soldering a solder to a region in which parts are separated on the printed circuit board, and the controller is configured to hold solder. Further generating a control signal relating to the operation and according to the control signal relating to the operation of replenishing the solder, after the component realignment separates the component associated with the defect from the substrate, the solder payment unit is associated with the defect. It is characterized by soldering solder to this separated region.
  • an inspection and failure correcting apparatus of a printed circuit board may include a component associated with the failure at a position where the component realignment is separated from the component associated with the failure on the printed circuit board according to the control signal. It is characterized by relocating or placing new parts.
  • an inspection and failure correcting apparatus of a printed circuit board may include, when the type of the defect is a component misalignment or a component position defect, the component realignment unit, according to the control signal, to determine a component associated with the defect. Separation from the printed circuit board by fixation, adsorption or adhesion, then repositioning the component to a location where the component associated with the defect is separated, or changing the placement direction after fixing, adsorption or bonding the component associated with the defect It features.
  • the inspection and failure correction method of a printed circuit board includes a inspection and failure correction of a printed circuit board performed by an inspection and failure correction apparatus of a printed circuit board including an inspection unit, a part correction unit, and a control unit.
  • a method comprising: inspecting a printed circuit board comprising a component disposed on solder paste to detect a location and type of a defect with respect to the component on the printed circuit board; Based on the location and type of the defect received from the controller, controlling the component correction to separate the component associated with the defect from the printed circuit board; The component to place a new component in a location where the component associated with the failure is removed from the substrate Characterized by including the step of controlling the government.
  • a method for inspecting and fixing a printed circuit board may include a solder removing unit including the solder removing unit. And separating the solder from the printed circuit board, and removing the solder remaining in the region where the component associated with the defect is removed on the printed circuit board.
  • a method for inspecting and fixing a printed circuit board may include: a solder tester for inspecting and inspecting a printed circuit board further comprising a solder soldering unit, wherein the control unit is configured to associate the defect with the defect. After separating the component from the printed circuit board, the solder holding unit further comprises controlling the solder to be soldered to a region in which the component associated with the defect is removed on the substrate.
  • a computer readable storage medium is characterized by including instructions for performing each step of the method according to the embodiments of the present invention.
  • the inspection and defect correction apparatus of the printed circuit board according to the present invention can automatically execute the correction operation of the defect when the arrangement state of the components on the substrate or the defect of the solder joint occurs.
  • the inspection and defect correction apparatus of the printed circuit board according to the present invention automatically detects and corrects defects, thereby improving the efficiency of the manufacturing process of the printed circuit board and the electronic device including the substrate and increasing the yield. Can be.
  • the inspection and failure correcting apparatus for a printed circuit board automatically removes the solder and resends the solder joint on the solder joint on the substrate, whereby the quality of the solder joint on the substrate is automatically reduced. Can be improved.
  • the inspection and defect correction apparatus of the printed circuit board according to the present invention automatically removes and replenishes the defective solder on the substrate, thereby preventing direct damage to the operator when the operator directly executes the defect correction operation. You can prevent it.
  • the apparatus for inspecting and defect correcting substrates according to the present invention is an environmental pollutant that may occur in solder-related operations by automating the removal and retention of solder during the removal of defective parts on the substrate, thereby performing more accurate solder removal and retention. It reduces the occurrence of, and reduces the capital investment cost to prevent environmental pollution.
  • FIG. 1 is a perspective view of an inspection and defect correction apparatus of a substrate according to an embodiment of the present invention.
  • FIG. 2 is a block diagram illustrating an apparatus for inspecting and correcting a substrate according to another exemplary embodiment of the present invention.
  • FIG. 3 is a block diagram illustrating a device for inspecting and correcting a substrate according to another exemplary embodiment of the present invention.
  • Figure 4 is a block diagram showing the inspection and failure correction apparatus of the substrate according to another embodiment of the present invention.
  • FIG. 5 is a block diagram illustrating an inspection and failure correcting apparatus for a substrate according to another exemplary embodiment of the present invention.
  • Figure 6 shows some examples of printing error forms of the solder to be corrected in the present invention.
  • FIG. 7 is a flowchart illustrating a method of inspecting and inspecting a defect of a substrate according to an exemplary embodiment of the present invention.
  • FIG. 8 is a flowchart illustrating a method of inspecting and correcting a substrate according to another embodiment of the present invention.
  • Embodiments of the present invention are illustrated for the purpose of illustrating the present invention. Embodiments of the invention may be implemented in various forms, it should not be construed that the invention is limited to the embodiments set forth below or the specific description of these embodiments.
  • unit means software, hardware, or a combination of software and hardware implemented to perform a specific function. Functions provided within a component and "part” may be combined into a smaller number of components and “parts” or further separated into additional components and “parts”.
  • a component When a component is said to be “connected” or “connected” to another component, the component may or may not be directly connected to or connected to the other component. It is to be understood that there may be new other components between the other components.
  • the term “substrate” may refer to a substrate on which electrical and electronic circuits are formed that may be used in an electronic device or an electromechanical device, which includes various kinds of components for constructing the electrical and electronic circuits. Can be mounted by soldering.
  • a “substrate” may include a printed circuit board that includes a two-dimensional or three-dimensional array of components that make up electrical and electronic circuits.
  • “substrate”, “circuit board” and “printed circuit board” may be used interchangeably with each other to have the same or similar meanings.
  • solder refers to a material called solder paste, solder cream or cream solder prior to the reflow process, unless the context clearly or explicitly means otherwise.
  • the term "batch” or “mount” refers to a state in which a component is seated, landed, or landed on solder printed on a substrate that has passed through a mounter, and through a reflow process for such a substrate. It refers to a state before the component and the pad on the substrate are fixedly bonded by the metal component of the solder.
  • defects may refer to various kinds of defects related to the placement of a component disposed on a substrate or a component on the substrate. As will be described in detail below, such defects may include uninserted defects, misalignment defects, lifting defects, position defects, component defects, and the like as defects related to components disposed on a substrate. In addition, as defects related to solder printing on a substrate, defects such as misplacement of solder, unsold solder, solder or overpayment, short circuit of circuit due to solder defect, and solder balls may be included. As used herein, the term “defect” is not limited to the above definitions and examples, and may refer to various types of defects generated in a process of mounting a component on a substrate.
  • Figure 1 shows a perspective view of the inspection and failure correction apparatus 10 of the substrate according to an embodiment of the present invention.
  • the inspection and failure correction apparatus 10 of the substrate As shown, the inspection and failure correction apparatus 10 of the substrate, the inspection unit for inspecting the substrate 450 on the transfer unit 900, the transfer unit 900 for transferring the substrate on which the component is placed (or mounted) after solder printing. (100), a part corrector 200 for correcting a defect of a component arrangement detected by the inspector 100, and a control unit for controlling operations of the transfer unit 900, the inspector 100, and the component corrector 200 ( 300).
  • the transfer unit 900 may move the one or more substrates to the inspection position below the inspection unit 100 or the calibration position below the component realignment 200 based on the control signal of the controller 300.
  • the inspection unit 100 may inspect the substrate 450 at the inspection position below based on the control signal of the control unit 300. When a defect is detected in the arrangement state of the component or the component on the substrate 450 by the inspection unit 100, the inspection unit 100 may transmit the defect detection result to the controller 300 and / or the component realignment 200. .
  • the transfer part 900 can transfer the board
  • the parts proofing unit 200 corrects the defects on the substrate transferred to the correction position below the parts proofing unit 200 based on the result of the defect detection from the inspection unit 100 or the control signal of the control unit 300. You can run
  • the transfer unit 900 may transfer the substrate whose defect is not detected or the substrate whose defect has been corrected by the component realignment 200 to a standby position for a subsequent process including a reflow process.
  • the inspection and failure correction apparatus 10 of the substrate may further include a solder removing unit 400 and the solder holding unit 500 for removing and retaining the solder on the substrate.
  • the inspection and failure correction apparatus 10 of the substrate may omit the solder removing portion 400 and the solder holding portion 500 for removing and retaining the solder on the substrate.
  • FIG. 2 shows a block diagram of an inspection and failure correction apparatus 20 of a substrate according to an embodiment of the invention.
  • the apparatus 20 illustrated in FIG. 2 may include an inspection unit 100, a part realignment unit 200, and a control unit 300.
  • the device 20 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively.
  • the apparatus 20 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 800 and corrects the defect on the substrate after the defect is detected. 850).
  • the reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad.
  • the inspection unit 100 performs an inspection on the substrate to determine whether there is a component disposed on the substrate or a defect in the component arrangement.
  • the inspection unit 100 may include a substrate automatic optical inspection (AOI) equipment, and may acquire a two-dimensional optical image or a three-dimensional optical image of the substrate through the AOI equipment.
  • AOI substrate automatic optical inspection
  • the AOI equipment acquires the 3D image
  • the pattern object is irradiated to the inspection object (for example, the substrate on which the component is disposed), the substrate to which the pattern light is irradiated, and the photographed image is processed to process the inspection object.
  • 3D image can be generated.
  • the AOI equipment may be installed inside the inspection unit 100.
  • the AOI equipment may be installed outside the inspection unit 100 and connected to the inspection unit 100 through wired or wireless communication.
  • the inspection unit 100 may receive a 2D or 3D image of the substrate from the AOI equipment.
  • the inspection unit 100 acquires a 2D image of the substrate for inspection of the substrate.
  • the inspection unit 100 may examine an image of the substrate to determine a location of a component having a poor arrangement state and a type of the defect on the substrate.
  • the type of failure may include uninserted defects in which no component is placed on the substrate, misalignment defects that are displaced in a direction different from the direction in which the component placement on the substrate is designed, and a component placed on the substrate without being held in contact with the solder.
  • One or more of various types of components or component placement defects such as lifting defects, position defects that are placed in a different position from where the component is designed, substrate defects such as cracks in the components themselves placed on the substrate, It may include, but is not limited to.
  • the inspection unit 100 may store a predetermined tolerance value used to determine whether or not a component or a component is disposed on the substrate.
  • the inspection unit 100 compares the arrangement state of the components or components arranged on the substrate with the design criteria, and determines that the arrangement state of the components or components is poor when the comparison result deviates from the tolerance value. For example, if the tolerance value used at the time of determination of a distortion defect is set to 0.1 degree, the inspection part 100 compares the arrangement direction of the components on a board
  • the inspection unit 100 may store CAD data corresponding to the design drawing or the design drawing indicating the arrangement (or layout) of the components on the substrate as a design criterion for determining a failure. In another embodiment, the inspection unit 100 may store image data photographing that the component or the arrangement state of the components is good as a design reference for determining a defect. The inspection unit 100 may receive the design criteria from an external computer device through wired or wireless communication.
  • the inspection unit 100 may also determine the defects regarding the printing state of the solder on the substrate.
  • the defects related to the printing state of the solder may include, but are not limited to, a printing position defect that is not printed at the position where the solder is designed, unpaid or soldered or overpaid solder, short between solders, solder balls, and the like. .
  • the inspection unit 100 may generate data regarding the location and type of the failure on the substrate.
  • the inspection unit 100 may transmit data regarding the location and type of the failure to the controller 300. If no defect is found in the substrate as a result of the inspection of the inspection unit 100, the apparatus 20 may transfer the substrate to the equipment 800 that performs a subsequent process, for example, a reflow process.
  • the part corrector 200 may perform a function of correcting a defect detected by the inspection unit 100 under control from the controller 300.
  • the part realignment 200 may include a part manipulation means 210 that performs a corrective operation for correcting a defect, such as adjusting an arrangement state such as a position and a direction of a component associated with a defect or removing or removing a component from a board. It may include.
  • the component corrector 200 Based on the video image of the substrate received from the control unit 300 and the data on the position and type of the defect, the component corrector 200 temporarily holds the component in which the defect occurs using the component manipulation unit 210. holding to separate from the substrate.
  • the component manipulation means 210 may be implemented using a negative pressure end portion that adsorbs the component at a negative pressure, such as a nozzle. In this case, the component operating means 210 may detach the component from the substrate by pulling the component after absorbing the component by the negative pressure type end portion.
  • the part manipulation means 210 may be implemented using a mechanical fixture of the type, such as tweezers or forceps.
  • the mechanical fixing part of the component operating means 210 may have a sufficiently fine structure so that the mechanical parts of the component operating means 210 do not affect other parts of the surroundings when the defective parts are separated on the substrate on which the minute parts are integrated.
  • the part manipulation means 210 may be configured to separate the parts by means of an adhesive method.
  • the component operating means 210 has an adhesive end portion with an adhesive layer formed thereon, and the adhesive layer of the adhesive end portion can be brought into close contact with the component, and the component adhered to the adhesive layer can be separated from the substrate while moving the adhesive end portion in a direction away from the substrate. have.
  • the specific configuration of the component operating means 210 is not limited to the above listed means, and may be implemented by appropriately selecting any one of known electrical, chemical, and mechanical means used to separate the component from the substrate. .
  • the control unit 300 controls the component realignment 200 to separate the component from the substrate, the control unit 300 precisely performs detailed operations of the component realignment 200 based on the image image of the substrate received from the inspection unit 100. Can be controlled.
  • the controller 300 may be configured based on a three-dimensional image of the substrate. After confirming the position and direction of the part to be separated from the board, and the part realignment unit 200 moves the part operation means 210 according to the position or direction of the part, the part is moved to the negative pressure end portion, the mechanical high. It can be controlled to separate parts by adsorbing to the positive or adhesive end portion.
  • the controller 300 may control the component realignment 200 to arrange a new component at a position where the component is removed on the substrate.
  • the component realignment 200 may receive a new component from the buffer using the component manipulation unit 210 and arrange the component at a position where the component associated with the defect is separated on the substrate.
  • the controller 300 may control the parts realignment 200 using data on the location and type of the defect received from the inspection unit 100.
  • the defects can be corrected by correcting only the arrangement direction of the components associated with the defects, instead of removing the components related to the defects and placing new components on the substrate.
  • the control unit 300 separates the component associated with the defect from the substrate, and then the direction of the corresponding component. It can be controlled to relocate by changing to the designed direction.
  • the controller 300 may control the component realignment 200 to change only the arrangement direction of the corresponding component using the component manipulation unit 210 without separating the component associated with the defect from the substrate. Using this calibration method, it is possible to efficiently correct defects in terms of cost and time as compared with taking new parts out of a buffer and placing them in a new place.
  • the apparatus 20 transfers the substrate back to the inspection unit 100 or executes the retest for retesting the substrate. Rather, it can be transferred to the next equipment, for example reflow equipment 850, for later processing.
  • the part corrector 200 performs a work of correcting defects using a single part operating means 210.
  • the inspection and failure correction apparatus of the substrate according to the present invention is not limited to the embodiments described above, and may include a part correction unit having other various functions and structures.
  • the apparatus 30 may include an inspection unit 100, a part corrector 200, and a controller 300.
  • the device 30 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively.
  • the apparatus 30 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 800, and when the defect is detected, corrects the defect on the substrate, and then reflows the substrate onto the substrate. 850).
  • the reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad.
  • those indicated by the same reference numerals as the components of the apparatus 20 illustrated in FIG. 2 may have mutually similar or identical functions and configurations, and corresponding functions and Some description about a structure is abbreviate
  • Parts repositioning 200 of the device 30, unlike the parts repositioning 200 of Fig. 2 includes a single component operating means 210, separating means 220, which can separate components from the substrate, And component repositioning means 230 capable of relocating the component or other component after the component is removed from the substrate.
  • the part corrector 200 separates the part associated with the defect from the substrate using the part separating means 220 under the control of the controller 300, and uses the part rearranging means 230. New components can be placed on the substrate.
  • the component separating means 220 and the component rearranging means 230 each have a negative pressure end, such as a nozzle used in chip mount equipment, a mechanical end such as a tweezers or tongs, or a separating means using an adhesive end.
  • chip arrangement means but is not limited thereto, and may be implemented by appropriately selecting any one of known electrical, chemical, and mechanical means used to separate a component from a substrate or to place a component on a substrate. Can be.
  • the apparatus 40 may include an inspection unit 100, a part corrector 200, and a controller 300.
  • the device 40 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively.
  • the part realignment 200 of the device 40 unlike the part realignment 200 of FIG. 3, may not include the component rearrangement device 230, it may include only the component separation device 210.
  • the device 40 or parts realignment 200 may be connected to the component placement equipment 800 via a buffer conveyor 700.
  • the device 40 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 800 and corrects the defect on the substrate after the failure is detected. 850).
  • the reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad.
  • those indicated by the same reference numerals as the components of the apparatuses 20 and 30 shown in FIGS. 2 and 3 may have similar or identical functions and configurations.
  • some description regarding the said function and a structure is abbreviate
  • the device 40 removes the substrate from the buffer conveyor 700. It can be transferred back to the component placement equipment 800 through.
  • the device 40 may include a buffer conveyor so that the substrate from which the component associated with the defect is removed remains on the buffer conveyor 700. 700 can be controlled.
  • the buffer conveyor 700 may transfer the substrate from which the component related to the defect is removed to the component placement equipment 800 after the component placement equipment 800 completes the current work.
  • the control unit 300 may transmit data on the location and type of the defect to the component arrangement apparatus 800 together.
  • the component placement apparatus 800 may rearrange the components on the substrate transmitted from the component realignment 200, and then transfer the substrate to the inspection unit 100 of the apparatus 40, or to proceed with a subsequent process. Can be transferred to the next piece of equipment.
  • the inspection and failure correction apparatus of the printed circuit board of the present invention described through the above embodiments when the failure is detected by inspecting the arrangement of the components on the substrate before performing the reflow process for the substrate on which the components are disposed You can do this automatically. Through this, it is possible to lower the defective rate of products including substrates, such as a printed circuit board, and to automate the removal of defective parts of the substrate, which has been performed by hand, to streamline the process and improve the working speed to increase the yield. .
  • the apparatus 50 may include an inspection unit 100, a part corrector 200, and a controller 300.
  • the device 50 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively.
  • the device 50 after the component realignment 200 separates the component from the substrate is detected defective, the solder removal unit 400 and the solder holding unit 500 to perform the solder removal and storage of the substrate. ) May be further included.
  • the apparatus 50 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 850 and corrects the defect on the substrate after the failure is detected. 850).
  • the reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad.
  • components of the apparatus 50 shown in FIG. 5 those denoted by the same reference numerals as the components of the apparatuses 20, 30, and 40 shown in FIGS. 2 to 4 are similar to each other or have the same function and configuration. Some description of the function and configuration is omitted for convenience of description of the present invention.
  • FIG. 6 illustrates examples of printing error forms of the solder to be corrected in the present invention.
  • the solder 612. May remain on the substrate 650 as it is.
  • the component corrector 200 rearranges the components on the solder 612 of the substrate 650, or the apparatus 50.
  • the substrate may be transferred to the component placement apparatus 800 such that the component placement apparatus 800 may rearrange the components over the solder 612 of the substrate 650.
  • solder 622 of FIG. 6 after component 620 is separated from substrate 650, a portion of solder 622 is attached to separated component 620 and substrate 650. And the remaining portion of solder 622 may remain on substrate 650. In this case, in order to reposition the component 620 to the solder 622 on the substrate 650, it is necessary to hold the solder. Alternatively, even when the type of the defect detected by the inspection unit 100 is a defect of the solder instead of a defect of the component, the soldering of the solder is similarly necessary. That is, even when solder according to the design is unpaid or sintered on the substrate, it is necessary to correct such defects by separating the related components from the substrate and then storing the solder having the defects.
  • the solder soldering unit 500 In order to correct the solder defects as described above, the solder soldering unit 500, after the component corrector 200 separates the component from the substrate, solder solder to the solder 622 under the control of the control unit 300. You can run In another example, the solder holding part 500 may store solder when the entire solder is removed while the component is separated from the substrate 650, or when a defect of the type such as non-payment of solder is detected on the substrate 650. Solder can also be retained.
  • the solder holding part 500 may be implemented by using a conventional technique such as a solder dispenser used to apply solder to a substrate to hold solder.
  • the solder 622 remains after removing the component 520 from the substrate 650, or if the defect type of solder is soldered, depending on the current state of the solder on the substrate 650, the solder to be retained The amount of may be inconsistent.
  • the shape of the solder 632 may be changed in the process of separating the component 630 from the substrate 650.
  • the solder defect detected by the inspection unit 100 may include a solder ball or a short due to over soldering or over soldering. In such a case, it is difficult to completely correct a defect only by supplying solder to the substrate 650.
  • the solder removing unit 400 after the component corrector 200 separates the component from the substrate, before the soldering unit 500 is performed by the solder holding unit 500, the control unit 300 ), The remaining solder printed on the separated position of the components on the substrate or the defective solder can be removed.
  • the solder removing unit 400 may be implemented using an inhaler or solder wick, which is conventionally used to remove solder.
  • the solder storage unit 500 may perform solder storage.
  • FIG. 7 is a flowchart illustrating a defect inspection and calibration method of a substrate according to an exemplary embodiment of the present invention.
  • the method illustrated in FIG. 7 may be performed by any one of the defect inspection and correction apparatuses 20, 30, and 40 of the substrate described with reference to FIGS. 2 to 4.
  • the inspection unit of the defect inspection and correction apparatus inspects the substrate on which the component is placed and detects a defect on the substrate from the inspection result.
  • the inspection unit 100 may acquire an image image of a substrate, and detect a defect regarding a component or an arrangement state of the component on the substrate from the obtained image image. have.
  • the inspection unit 100 receives an image image of the substrate photographed by the AOI equipment mounted therein or installed externally, and detects a defect regarding the component or the arrangement state of the component on the substrate from the received image image.
  • step S720 the control unit of the defect inspection and correction apparatus controls the part realignment to separate the component associated with the detected defect from the substrate.
  • the component corrector 200 may remove a component related to the defect on the substrate based on the location and type of the defect received from the inspection unit 100. have.
  • step S730 the control unit of the defect inspection and correction device controls the part realignment to place a new part in the position where the parts are separated on the substrate.
  • the component realignment 200 may arrange a new component or relocate the removed component at a position where a component related to a defect is removed on the substrate.
  • component placement equipment instead of component realignment 200 may relocate the product to a location where the component associated with the defect has been removed from the substrate.
  • FIG. 8 illustrates a defect inspection and correction method of a substrate according to another embodiment of the present invention.
  • the method illustrated in FIG. 8 may be performed by, for example, the defect inspection and correction apparatus 50 of the substrate described with reference to FIG. 5.
  • step S810 the inspection unit of the defect inspection and correction apparatus inspects a substrate on which a component is placed and detects a defect on the substrate from the inspection result.
  • step S820 the control unit of the defect inspection and correction apparatus controls the part calibration, and separates the component associated with the detected defect from the substrate.
  • step S830 the controller of the defect inspection and correction apparatus controls the solder removing unit to remove the solder remaining in the region where the component associated with the defect is removed.
  • the solder removing unit 400 may include a control unit (B) after the component corrector 200 separates the component from the substrate and before the soldering unit 500 performs the soldering. According to the control of 300, the remaining solder printed on the position where the components on the substrate are separated or the solder in which the defect occurs may be removed.
  • step S840 the control unit of the defect inspection and correction device controls the solder holding unit, so that the solder is stored in the region where the component associated with the defect is removed.
  • step S850 a step of relocating an existing or new component to a position where components on the substrate are separated may be performed.
  • the placement of the new component may be performed after the removal and retention process of the solder, depending on the state of the solder at the removed position of the component on the substrate, there is no solder removal process and the retention process after removing the component from the substrate. Placement of new parts may be performed.
  • only soldering in accordance with step S840 may be performed without performing step S830.

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Abstract

A device and a method for inspecting and correcting defects of a printed circuit board are disclosed. The device for inspecting and correcting defects of a printed circuit board inspects a printed circuit board having components arranged therein before a reflow process and detects a defect present on the substrate. The device for inspecting and correcting defects of a printed circuit board separates components associated with the detected defect from the substrate and can rearrange new components. The device for inspecting and correcting defects of a printed circuit board can store a solder or store the solder again after removing residual solder, in the process of separating and rearranging the components.

Description

인쇄 회로 기판의 검사 및 불량 교정 장치와 그 방법Inspection and defect correction device of printed circuit board and its method
본 발명은 인쇄 회로 기판에 실장된 부품의 불량 여부를 검사하고, 감지된 불량을 교정하는 장치 및 방법에 관한 것이다.The present invention relates to an apparatus and method for inspecting whether a component mounted on a printed circuit board is defective and correcting the detected defect.
전자 장치에 장착되는 인쇄 회로 기판의 부품 실장 공정은 다음과 같다. 먼저 기판 상의 회로에 부품을 연결하기 위한 패드부에 솔더 페이스트가 인쇄된다. 인쇄된 솔더 페이스트 위에 부품이 실장되고, 리플로우 공정을 통해 솔더 페이스트를 열처리함으로써 솔더 페이스트 위에 실장된 부품의 단자가 패드부에 전기적으로 접속된다.The component mounting process of the printed circuit board mounted in an electronic device is as follows. First, solder paste is printed on a pad portion for connecting a component to a circuit on a substrate. The component is mounted on the printed solder paste, and the terminal of the component mounted on the solder paste is electrically connected to the pad part by heat-treating the solder paste through a reflow process.
위와 같은 인쇄 회로 기판의 부품 실장 공정에서는 다양한 이유로 부품 또는 부품 실장에서 불량이 발생할 수 있다. 예를 들어, 부품의 실장과 관련하여서, 애초에 기판 상에 실장하도록 설계된 것과는 다른 부품이 실장되거나, 설계된 부품이 실장되지 않거나, 실장된 부품에 하자가 발생하는 문제가 발생할 수 있다. 다른 예로써, 기판 상에 부품이 실장되어야 할 위치나 방향과는 다른 위치나 방향으로 실장되거나, 또는 부품이 충분히 솔더 페이스트에 접촉하지 못한 상태에서 리플로우 공정이 수행되어, 부품과 패드부 사이의 전기적 접속에 불량이 발생할 수 있다. 또 다른 예로써, 기판 상에서 솔더 페이스트의 인쇄 과정에서 발생된 에러로 인해, 부품의 실장의 불량이 발생하는 경우도 있다. 즉, 기판 상에 솔더가 미납되어 부품과 패드부 사이의 접촉이 불량해지거나, 솔더가 과납되거나, 또는 솔더가 기판 상의 설계된 위치에 정확히 인쇄되지 않아, 기판 상에 실장된 부품들 또는 솔더들 사이에 쇼트가 발생할 수 있다. In the component mounting process of the printed circuit board as described above, a defect may occur in the component or component mounting for various reasons. For example, with respect to the mounting of components, there may be a problem that components other than the one originally designed to be mounted on a substrate are mounted, the designed component is not mounted, or a defect occurs in the mounted component. As another example, a reflow process may be performed on a substrate in a position or orientation different from the position or orientation in which the component is to be mounted, or in a state in which the component does not sufficiently contact the solder paste, thereby providing Poor electrical connections may occur. As another example, a failure in mounting a part may occur due to an error generated in the printing process of the solder paste on the substrate. That is, solder is not soldered on the substrate, resulting in poor contact between the component and the pad portion, solder is over-charged, or solder is not printed correctly at the designed location on the substrate, resulting in components or solders mounted on the substrate. Short may occur.
이와 같이 기판상에 존재하는 다양한 유형의 불량을 검출하기 위한 방법으로, 자동 광학검사(Automatic Optical Inspection: AOI) 기술이 활용되고 있다. AOI 기술은, 광학기술을 통해 부품(예를 들어, 기판 상에 실장된 부품)의 2차원 또는 3차원 영상을 획득하고, 획득된 영상으로부터 부품의 외관이나 상태를 인식함으로써, 그 부품의 불량 여부를 판단하는 기술이다. 광학검사를 통해 불량이 확인된 부품이나 그 부품이 실장된 기판은, 작업자에 의해 파기되거나 적절한 불량 교정의 과정을 거친 후 이후의 공정을 위하여 이송된다. As a method for detecting various types of defects existing on the substrate as described above, automatic optical inspection (AOI) technology is utilized. The AOI technology obtains a two-dimensional or three-dimensional image of a component (for example, a component mounted on a substrate) through optical technology, and recognizes the appearance or state of the component from the acquired image, thereby determining whether the component is defective. It is a skill to judge. The component whose defect is confirmed through optical inspection or the board on which the component is mounted is discarded by an operator or subjected to proper defect correction before being transferred for further processing.
본 발명은 인쇄 회로 기판에 인쇄된 솔더상에 부품을 장착(또는 배치)하고 리플로우 공정을 통하여 솔더에 부품을 고정시키는 단계에 앞서, 솔더 상의 부품 장착 상태의 불량을 교정하는 시스템 및 방법을 제공하는 것을 목적으로 한다.The present invention provides a system and method for correcting a defect in component mounting on a solder prior to mounting (or placing) the component on a solder printed on a printed circuit board and securing the component to the solder through a reflow process. It aims to do it.
또한, 본 발명은 부품들이 밀집한 인쇄 회로 기판에서, 솔더 상의 부품 장착 상태가 정상인 부품들에 대한 영향을 최소화하면서, 장착 상태가 불량인 부품 또는 솔더를 제거 내지 교정하는 시스템 및 방법을 제공할 수 있다. In addition, the present invention can provide a system and method for removing or correcting a badly mounted component or solder in a printed circuit board having dense components, while minimizing the effect on components having a normal component mounting state on the solder. .
본 발명의 일 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 솔더 페이스트 상에 배치된 부품을 포함하는 인쇄 회로 기판의 검사 및 불량 교정 장치 장치로서, 상기 인쇄 회로 기판을 검사하여, 상기 인쇄 회로 기판 상의 상기 부품에 관한 불량의 위치와 유형을 판정하는 검사부와, 상기 검사부로부터 수신된 상기 불량의 위치 및 유형에 기초하여, 상기 불량의 교정을 위해 부품의 제거, 부품의 방향 조정 및 부품의 배치 중 적어도 하나의 교정 동작에 관한 제어 신호를 생성하는 제어부와, 상기 제어 신호에 따라, 부품을 일시적으로 홀딩(holding)할 수 있는 부품 조작 수단을 이용하여, 인쇄 회로 기판 상의 부품을 제거하거나, 부품의 방향을 조정하거나, 또는 상기 인쇄 회로 기판 상에 부품을 배치하는 부품교정부를 포함하는 것을 특징으로 한다.An inspection and failure correcting apparatus for a printed circuit board according to an embodiment of the present invention is an apparatus for inspecting and defect correcting a printed circuit board including a component disposed on a solder paste. An inspection unit for determining the position and type of the defect with respect to the component on the printed circuit board, and based on the position and type of the defect received from the inspection unit, removal of the component for the correction of the defect, direction adjustment of the component, and the component Removing a part on a printed circuit board by using a control unit for generating a control signal relating to at least one calibration operation of the arrangement of parts and a part operating means capable of temporarily holding the part according to the control signal Or a part calibration unit for adjusting the direction of the parts or placing the parts on the printed circuit board. Shall be.
본 발명의 다른 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 상기 불량의 유형이 부품 틀어짐, 부품 들뜸, 부품 위치 불량, 부품 미배치, 솔더 미납, 솔더 과납 중 적어도 하나를 포함하는 것을 특징으로 한다.According to another embodiment of the present invention, an inspection and failure correcting apparatus of a printed circuit board may include at least one of the type of the defect including component misalignment, component lifting, component position misalignment, component misalignment, solder nonpayment, and solder overpayment. It features.
본 발명의 일 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 상기 부품교정부가, 상기 제어 신호에 따라, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시켜 상기 기판으로부터 분리하는 것을 특징으로 한다.The inspection and failure correction apparatus of a printed circuit board according to an embodiment of the present invention is characterized in that the component realignment unit separates from the substrate by fixing, adsorbing or adhering the parts associated with the failure according to the control signal. do.
본 발명의 일 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 상기 인쇄 회로 기판상에서 부품이 분리된 영역에 잔류하는 솔더를 제거하는 솔더제거부를 더 포함하고, 상기 제어부가, 잔류 솔더를 제거하는 동작에 관한 제어 신호를 더 생성하고, 상기 잔류 솔더를 제거하는 동작에 관한 제어 신호에 따라, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 기판으로부터 분리한 후, 상기 솔더제거부가 상기 불량과 연관된 부품이 제거된 영역에 잔류하는 솔더를 제거하는 것을 특징으로 한다.The inspection and failure correction apparatus of a printed circuit board according to an exemplary embodiment of the present invention may further include a solder removing unit which removes solder remaining in a region where components are separated on the printed circuit board, and wherein the controller controls the residual solder. And further generating a control signal relating to the removing operation and separating the component associated with the defect from the substrate according to the control signal relating to the operation of removing the residual solder. It is characterized by removing the solder remaining in the area where the associated component is removed.
본 발명의 일 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 상기 인쇄 회로 기판상에서 부품이 분리된 영역에 솔더를 보납하는 솔더보납부를 더 포함하고, 상기 제어부가, 솔더를 보납하는 동작에 관한 제어 신호를 더 생성하고, 상기 솔더를 보납하는 동작에 관한 제어 신호에 따라, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 기판으로부터 분리한 후, 상기 솔더보납부가 상기 불량과 연관된 부품이 분리된 영역에 솔더를 보납하는 것을 특징으로 한다.An inspection and failure correcting apparatus for a printed circuit board according to an exemplary embodiment of the present invention may further include a solder soldering part for soldering a solder to a region in which parts are separated on the printed circuit board, and the controller is configured to hold solder. Further generating a control signal relating to the operation and according to the control signal relating to the operation of replenishing the solder, after the component realignment separates the component associated with the defect from the substrate, the solder payment unit is associated with the defect. It is characterized by soldering solder to this separated region.
본 발명의 일 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 상기 부품교정부가, 상기 제어 신호에 따라, 상기 인쇄 회로 기판 상에서 상기 불량과 연관된 부품이 분리된 위치에 상기 불량과 연관된 부품을 재배치하거나 또는 신규 부품을 배치하는 것을 특징으로 한다.According to an embodiment of the present invention, an inspection and failure correcting apparatus of a printed circuit board may include a component associated with the failure at a position where the component realignment is separated from the component associated with the failure on the printed circuit board according to the control signal. It is characterized by relocating or placing new parts.
본 발명의 일 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 상기 불량의 유형이 부품 틀어짐 또는 부품 위치 불량인 경우, 상기 부품교정부가, 상기 제어 신호에 따라, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시켜 상기 인쇄 회로 기판으로부터 분리한 후, 상기 불량과 연관된 부품이 분리된 위치에 상기 부품을 재배치하거나, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시킨 후 배치 방향을 변경하는 것을 특징으로 한다.According to an embodiment of the present invention, an inspection and failure correcting apparatus of a printed circuit board may include, when the type of the defect is a component misalignment or a component position defect, the component realignment unit, according to the control signal, to determine a component associated with the defect. Separation from the printed circuit board by fixation, adsorption or adhesion, then repositioning the component to a location where the component associated with the defect is separated, or changing the placement direction after fixing, adsorption or bonding the component associated with the defect It features.
본 발명의 일 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 방법은, 검사부, 부품교정부 및 제어부를 포함하는 인쇄 회로 기판의 검사 및 불량 교정 장치에 의해 수행되는 인쇄 회로 기판의 검사 및 불량 교정 방법으로서, 상기 검사부가, 솔더 페이스트 상에 배치된 부품을 포함하는 인쇄 회로 기판을 검사하여, 상기 인쇄 회로 기판상의 상기 부품에 관한 불량의 위치와 유형을 검출하는 단계와, 상기 제어부가, 상기 검사부로부터 수신된 상기 불량의 위치 및 유형에 기초하여, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 인쇄 회로 기판에서 분리하도록 상기 부품교정부를 제어하는 단계와, 상기 제어부가, 상기 부품교정부가 상기 인쇄 회로 기판으로부터 상기 불량과 연관된 부품이 제거된 위치에 새로운 부품을 배치하도록 상기 부품교정부를 제어하는 단계를 포함하는 것을 특징으로 한다.The inspection and failure correction method of a printed circuit board according to an embodiment of the present invention includes a inspection and failure correction of a printed circuit board performed by an inspection and failure correction apparatus of a printed circuit board including an inspection unit, a part correction unit, and a control unit. A method, comprising: inspecting a printed circuit board comprising a component disposed on solder paste to detect a location and type of a defect with respect to the component on the printed circuit board; Based on the location and type of the defect received from the controller, controlling the component correction to separate the component associated with the defect from the printed circuit board; The component to place a new component in a location where the component associated with the failure is removed from the substrate Characterized by including the step of controlling the government.
본 발명의 다른 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 방법은, 상기 인쇄 회로 기판의 검사 및 불량 교정 장치가 솔더제거부를 더 포함하고, 상기 제어부가, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리한 후, 상기 솔더제거부가 상기 인쇄 회로 기판 상에서 상기 불량과 연관된 부품이 제거된 영역에 잔류하는 솔더를 제거하도록 제어하는 단계를 더 포함하는 것을 특징으로 한다. According to another embodiment of the present invention, a method for inspecting and fixing a printed circuit board may include a solder removing unit including the solder removing unit. And separating the solder from the printed circuit board, and removing the solder remaining in the region where the component associated with the defect is removed on the printed circuit board.
본 발명의 다른 실시예에 따르는 인쇄 회로 기판의 검사 및 불량 교정 방법은, 상기 인쇄 회로 기판의 검사 및 불량 교정 장치가 솔더보납부를 더 포함하고, 상기 제어부가, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리한 후, 상기 솔더보납부가 상기 기판 상에서 상기 불량과 연관된 부품이 제거된 영역에 솔더를 보납하도록 제어하는 단계를 더 포함하는 것을 특징으로 한다.According to another embodiment of the present invention, a method for inspecting and fixing a printed circuit board may include: a solder tester for inspecting and inspecting a printed circuit board further comprising a solder soldering unit, wherein the control unit is configured to associate the defect with the defect. After separating the component from the printed circuit board, the solder holding unit further comprises controlling the solder to be soldered to a region in which the component associated with the defect is removed on the substrate.
본 발명의 일 실시예에 따르는 컴퓨터 판독 가능 저장 매체는, 본 발명의 실시예들에 따르는 방법의 각 단계를 수행하는 명령어들을 포함하는 것을 특징으로 한다.A computer readable storage medium according to an embodiment of the present invention is characterized by including instructions for performing each step of the method according to the embodiments of the present invention.
본 발명에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 기판 상의 부품의 배치 상태 또는 솔더 조인트의 불량이 발생한 경우, 이 불량의 교정 작업을 자동으로 실행할 수 있다. The inspection and defect correction apparatus of the printed circuit board according to the present invention can automatically execute the correction operation of the defect when the arrangement state of the components on the substrate or the defect of the solder joint occurs.
또한, 본 발명에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 자동으로 불량의 검출 및 교정을 실행함으로써, 인쇄 회로기판 및 그 기판을 포함하는 전자장치의 제조 공정의 효율성을 향상시키고 수율을 높일 수 있다.In addition, the inspection and defect correction apparatus of the printed circuit board according to the present invention automatically detects and corrects defects, thereby improving the efficiency of the manufacturing process of the printed circuit board and the electronic device including the substrate and increasing the yield. Can be.
또한, 본 발명에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 기판 상의 솔더 조인트에 솔더의 과납 또는 소납 불량이 검출된 경우, 자동으로 해당 솔더를 제거하고 다시 보납함으로써, 기판 상의 솔더 조인트의 품질을 개선할 수 있다. In addition, the inspection and failure correcting apparatus for a printed circuit board according to the present invention automatically removes the solder and resends the solder joint on the solder joint on the substrate, whereby the quality of the solder joint on the substrate is automatically reduced. Can be improved.
본 발명에 따르는 인쇄 회로 기판의 검사 및 불량 교정 장치는, 기판 상의 불량 솔더의 제거와 보납을 자동으로 수행함으로써, 작업자가 솔더의 불량 교정 작업을 직접 실행할 때 작업자에게 직접 오염의 피해가 발생되는 것을 방지할 수 있다. The inspection and defect correction apparatus of the printed circuit board according to the present invention automatically removes and replenishes the defective solder on the substrate, thereby preventing direct damage to the operator when the operator directly executes the defect correction operation. You can prevent it.
본 발명에 따르는 기판의 검사 및 불량 교정 장치는, 기판 상의 불량 부품의 제거 과정에서 솔더의 제거와 보납을 자동화하여, 보다 정확한 솔더 제거 및 보납을 수행함으로써, 솔더 관련 작업에서 발생할 수 있는 환경 오염 물질의 발생을 감소시키며, 환경오염 방지를 위한 설비 투자비의 감소 효과를 갖는다.The apparatus for inspecting and defect correcting substrates according to the present invention is an environmental pollutant that may occur in solder-related operations by automating the removal and retention of solder during the removal of defective parts on the substrate, thereby performing more accurate solder removal and retention. It reduces the occurrence of, and reduces the capital investment cost to prevent environmental pollution.
도 1은 본 발명의 일 실시예에 따르는 기판의 검사 및 불량 교정 장치의 사시도이다. 1 is a perspective view of an inspection and defect correction apparatus of a substrate according to an embodiment of the present invention.
도 2는 본 발명의 다른 실시예에 따르는 기판의 검사 및 불량 교정 장치를 나타낸 블록도이다.2 is a block diagram illustrating an apparatus for inspecting and correcting a substrate according to another exemplary embodiment of the present invention.
도 3은 본 발명의 다른 실시예에 따르는 기판의 검사 및 불량 교정 장치를 나타낸 블록도이다.3 is a block diagram illustrating a device for inspecting and correcting a substrate according to another exemplary embodiment of the present invention.
도 4는 본 발명의 다른 실시예에 따르는 기판의 검사 및 불량 교정 장치를 나타낸 블록도이다. Figure 4 is a block diagram showing the inspection and failure correction apparatus of the substrate according to another embodiment of the present invention.
도 5는 본 발명의 다른 실시예에 따르는 기판의 검사 및 불량 교정 장치를 나타낸 블록도이다. 5 is a block diagram illustrating an inspection and failure correcting apparatus for a substrate according to another exemplary embodiment of the present invention.
도 6은 본 발명에서 교정하고자 하는 솔더의 인쇄 오류 형태의 일부 예들을 도시한 것이다. Figure 6 shows some examples of printing error forms of the solder to be corrected in the present invention.
도 7은 본 발명의 일 실시예에 따르는 기판의 검사 및 불량 교정 방법을 도시한 순서도이다. 7 is a flowchart illustrating a method of inspecting and inspecting a defect of a substrate according to an exemplary embodiment of the present invention.
도 8은 본 발명의 다른 실시예에 따르는 기판의 검사 및 불량 교정 방법을 도시한 순서도이다. 8 is a flowchart illustrating a method of inspecting and correcting a substrate according to another embodiment of the present invention.
본 발명의 실시예들은 본 발명을 설명하기 위한 목적으로 예시된 것이다. 본 발명의 실시예들은 다양한 형태로 실시될 수 있으며, 본 발명이 아래 제시된 실시예들이나 이들 실시예들에 대한 구체적 설명으로 한정되는 것으로 해석해서는 아니 된다.Embodiments of the present invention are illustrated for the purpose of illustrating the present invention. Embodiments of the invention may be implemented in various forms, it should not be construed that the invention is limited to the embodiments set forth below or the specific description of these embodiments.
본 실시예에서 사용되는 용어 "부"는 특정한 기능을 수행하기 위해서 구현된 소프트웨어, 하드웨어, 또는 소프트웨어 및 하드웨어의 결합체를 의미한다. 구성요소와 "부" 내에서 제공되는 기능은 더 작은 수의 구성요소 및 "부"로 결합되거나 추가적인 구성요소와 "부"로 더 분리될 수 있다.As used herein, the term “unit” means software, hardware, or a combination of software and hardware implemented to perform a specific function. Functions provided within a component and "part" may be combined into a smaller number of components and "parts" or further separated into additional components and "parts".
본 명세서에서 사용되는 모든 기술적 용어들 및 과학적 용어들은, 다르게 정의되어 있지 않는 한 본 발명이 속하는 기술 분야에서 통상의 지식을 가진 자에게 일반적으로 이해되는 의미를 갖는다. 본 명세서에서 사용되는 모든 용어들은 본 발명을 보다 명확히 설명하기 위한 목적으로 선택된 것이며 본 발명의 범위를 제한하기 위해 선택된 것이 아니다. All technical and scientific terms used herein have the meanings that are commonly understood by one of ordinary skill in the art unless otherwise defined. All terms used herein are selected for the purpose of more clearly describing the present invention and are not selected to limit the scope of the present invention.
본 명세서에서 단수형은 달리 언급하지 않는 이상 복수형도 포함하며, 이는 청구항에서도 마찬가지이다.As used herein, the singular forms "a", "an", and "the" also include the plural unless the context clearly dictates otherwise.
본 발명의 다양한 실시 예에서 사용된 "제1", "제2" 등의 표현들은 구성요소를 구분하기 위해 사용하는 것일 뿐 해당 구성요소의 순서, 중요도 등을 한정하는 것이 아니다.Expressions such as "first" and "second" used in various embodiments of the present invention are used to distinguish the elements, and do not limit the order, importance, etc. of the elements.
본 명세서에서 사용되는 "포함하는" 및 "갖는"은 문구에서 특별히 언급하지 않는 한 개방형 용어(open-ended terms)로 이해되어야 한다. As used herein, "comprising" and "having" should be understood in open-ended terms unless specifically stated in the text.
본 명세서에서 "~에 기초하여"라는 문구는 결정에 영향을 주는 하나 이상의 인자를 기술하는데 사용되고, 이 용어는 결정에 사용되는 추가적인 인자를 배제하지는 않는다. The phrase "based on" is used herein to describe one or more factors that influence the decision, which term does not exclude additional factors used in the decision.
어떤 구성요소가 다른 구성요소에 "연결되어" 있다거나 "접속되어" 있다고 언급된 때에는, 상기 어떤 구성요소가 상기 다른 구성요소에 직접적으로 연결되어 있거나 또는 접속되어 있을 수도 있지만, 상기 어떤 구성요소와 상기 다른 구성요소 사이에 새로운 다른 구성요소가 존재할 수도 있다고 이해되어야 할 것이다.When a component is said to be "connected" or "connected" to another component, the component may or may not be directly connected to or connected to the other component. It is to be understood that there may be new other components between the other components.
본 명세서에서 사용되는 "기판"이라는 용어는, 전자 장치 또는 전자기계장치에 사용될 수 있는 전기 및 전자 회로가 형성된 기판을 의미할 수 있으며, 이 기판에는 전기 및 전자 회로를 구성하기 위한 다양한 종류의 부품들이 솔더에 의해 실장될 수 있다. 본 명세서에서 사용되는 "기판"은, 전기 및 전자 회로를 구성하는 부품들의 2차원 또는 3차원 배열을 포함하는 인쇄 회로 기판을 포함할 수 있다. 본 발명의 다양한 실시예들을 설명하기 위해, "기판", "회로기판"과 "인쇄 회로 기판"은 동일 또는 유사한 의미를 나타내는 것으로 상호 대체되어 사용될 수 있다.As used herein, the term "substrate" may refer to a substrate on which electrical and electronic circuits are formed that may be used in an electronic device or an electromechanical device, which includes various kinds of components for constructing the electrical and electronic circuits. Can be mounted by soldering. As used herein, a "substrate" may include a printed circuit board that includes a two-dimensional or three-dimensional array of components that make up electrical and electronic circuits. To describe various embodiments of the present invention, "substrate", "circuit board" and "printed circuit board" may be used interchangeably with each other to have the same or similar meanings.
본 명세서에서 사용되는 "솔더"라는 용어는, 맥락에 따라 명백하게 또는 명시적으로 다른 의미를 가지는 경우를 제외하고, 리플로우 공정을 거치기 전의 솔더 페이스트, 솔더크림 또는 크림솔더로 불리는 물질을 의미한다.As used herein, the term "solder" refers to a material called solder paste, solder cream or cream solder prior to the reflow process, unless the context clearly or explicitly means otherwise.
또한, 본 명세서에서 사용되는 "배치" 또는 "장착"이라는 용어는, 마운터를 거쳐 나온 기판 상에 인쇄된 솔더 상에 부품이 안착, 착지 또는 랜딩된 상태로서, 이러한 기판에 대한 리플로우 공정을 통해 부품과 기판 상의 패드가 솔더의 금속 성분에 의해 고정적으로 결합되기 전의 상태를 의미한다.In addition, as used herein, the term "batch" or "mount" refers to a state in which a component is seated, landed, or landed on solder printed on a substrate that has passed through a mounter, and through a reflow process for such a substrate. It refers to a state before the component and the pad on the substrate are fixedly bonded by the metal component of the solder.
본 명세서에서 사용되는 "불량"이라는 용어는, 기판에 배치된 부품 또는 기판 상의 부품의 배치 상태와 관련된 다양한 종류의 불량을 나타낼 수 있다. 이하에서 다시 상세히 설명되겠지만, 이러한 불량에는, 기판 상에 배치된 부품과 관련한 불량으로서, 미삽 불량, 틀어짐 불량, 들뜸 불량, 위치 불량, 부품 불량 등을 포함할 수 있다. 또한, 기판 상의 솔더 인쇄와 관련된 불량으로서, 솔더의 위치불량, 솔더의 미납, 소납 또는 과납, 솔더 불량에 의한 회로의 쇼트, 솔더볼 등의 불량이 포함될 수 있다. 본 명세서에서 사용되는 "불량"의 의미는, 위 정의와 예들에 한정되지 않으며, 기판 상에 부품을 실장하는 공정에서 발생되는 다양한 불량의 유형들을 지칭할 수 있다. The term "defect" as used herein may refer to various kinds of defects related to the placement of a component disposed on a substrate or a component on the substrate. As will be described in detail below, such defects may include uninserted defects, misalignment defects, lifting defects, position defects, component defects, and the like as defects related to components disposed on a substrate. In addition, as defects related to solder printing on a substrate, defects such as misplacement of solder, unsold solder, solder or overpayment, short circuit of circuit due to solder defect, and solder balls may be included. As used herein, the term “defect” is not limited to the above definitions and examples, and may refer to various types of defects generated in a process of mounting a component on a substrate.
이하, 첨부한 도면들을 참조하여, 본 발명의 실시예들을 상세하게 설명한다. 도면상의 동일한 구성요소에 대해서는 동일한 참조부호를 사용하고 동일한 구성요소에 대해서 중복된 설명은 생략한다.Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. The same reference numerals are used for the same elements in the drawings, and duplicate descriptions of the same elements are omitted.
도 1은 본 발명의 일 실시예에 따르는 기판의 검사 및 불량 교정 장치(10)의 사시도를 도시한 것이다. 도시된 바와 같이, 기판의 검사 및 불량 교정 장치(10)는, 솔더 인쇄 후 부품이 배치(또는 장착)된 기판을 이송하는 이송부(900), 이송부(900) 상의 기판(450)을 검사하는 검사부(100), 검사부(100)에 의해 검출된 부품 배치의 불량을 교정하는 부품교정부(200), 및 이송부(900), 검사부(100) 및 부품교정부(200)의 동작을 제어하는 제어부(300)를 포함할 수 있다. Figure 1 shows a perspective view of the inspection and failure correction apparatus 10 of the substrate according to an embodiment of the present invention. As shown, the inspection and failure correction apparatus 10 of the substrate, the inspection unit for inspecting the substrate 450 on the transfer unit 900, the transfer unit 900 for transferring the substrate on which the component is placed (or mounted) after solder printing. (100), a part corrector 200 for correcting a defect of a component arrangement detected by the inspector 100, and a control unit for controlling operations of the transfer unit 900, the inspector 100, and the component corrector 200 ( 300).
이송부(900)는, 제어부(300)의 제어 신호에 기초하여, 하나 이상의 기판을 검사부(100)의 하방의 검사 위치 또는 부품교정부(200) 하방의 교정 위치로 이동시킬 수 있다. The transfer unit 900 may move the one or more substrates to the inspection position below the inspection unit 100 or the calibration position below the component realignment 200 based on the control signal of the controller 300.
검사부(100)는, 제어부(300)의 제어 신호에 기초하여, 하방의 검사 위치에 있는 기판(450)을 검사할 수 있다. 검사부(100)에 의해 기판(450)상의 부품 또는 부품의 배치 상태에 불량이 검출된 경우, 검사부(100)는 불량 검출 결과를 제어부(300) 및/또는 부품교정부(200)에 전송할 수 있다. The inspection unit 100 may inspect the substrate 450 at the inspection position below based on the control signal of the control unit 300. When a defect is detected in the arrangement state of the component or the component on the substrate 450 by the inspection unit 100, the inspection unit 100 may transmit the defect detection result to the controller 300 and / or the component realignment 200. .
한편, 이송부(900)는, 제어부(300)의 제어 신호에 기초하여, 불량이 검출된 기판을 부품교정부(200) 하방의 교정 위치로 이송할 수 있다. On the other hand, the transfer part 900 can transfer the board | substrate with which the defect was detected based on the control signal of the control part 300 to the correction position below the part aligning part 200. FIG.
부품교정부(200)는, 검사부(100)로부터의 불량 검출 결과 또는 제어부(300)의 제어 신호에 기초하여, 부품교정부(200) 하방의 교정 위치로 이송된 기판 상의 불량을 교정하는 작업을 실행할 수 있다. The parts proofing unit 200 corrects the defects on the substrate transferred to the correction position below the parts proofing unit 200 based on the result of the defect detection from the inspection unit 100 or the control signal of the control unit 300. You can run
이송부(900)는 불량이 검출되지 않은 기판 또는 부품교정부(200)에 의해 불량이 교정된 기판을 리플로우 공정을 포함하는 후속 공정을 위한 대기 위치로 이송할 수 있다. The transfer unit 900 may transfer the substrate whose defect is not detected or the substrate whose defect has been corrected by the component realignment 200 to a standby position for a subsequent process including a reflow process.
일 실시예에 따르면, 기판의 검사 및 불량 교정 장치(10)는 기판 상의 솔더를 제거 및 보납하기 위한 솔더제거부(400)와 솔더보납부(500)를 추가로 포함할 수 있다. 다른 실시예에 따르면, 기판의 검사 및 불량 교정 장치(10)는 기판 상의 솔더를 제거 및 보납하기 위한 솔더제거부(400)와 솔더보납부(500)를 생략할 수 있다.According to one embodiment, the inspection and failure correction apparatus 10 of the substrate may further include a solder removing unit 400 and the solder holding unit 500 for removing and retaining the solder on the substrate. According to another embodiment, the inspection and failure correction apparatus 10 of the substrate may omit the solder removing portion 400 and the solder holding portion 500 for removing and retaining the solder on the substrate.
도 2는, 본 발명의 일 실시예에 따르는 기판의 검사 및 불량 교정 장치(20)를 블록도로 나타낸 것이다. 도 2에 도시된 장치(20)는 검사부(100), 부품교정부(200), 및 제어부(300)를 포함할 수 있다. 또한, 장치(20)는, 부품 배치 장비(800) 및 리플로우 장비(850)와 각각 연결될 수 있다. 이와 같은 구성을 갖는 장치(20)는, 부품 배치 장비(800)에 의해 부품이 배치된 인쇄 회로 기판을 검사하여 불량이 검출된 경우, 기판 상의 불량을 교정한 후, 해당 기판을 리플로우 장비(850)로 전송할 수 있다. 리플로우 장비(850)는, 불량이 교정된 기판에 대해 열처리를 실행함으로써, 기판 상의 부품의 단자가 패드에 접속되도록 한다. 2 shows a block diagram of an inspection and failure correction apparatus 20 of a substrate according to an embodiment of the invention. The apparatus 20 illustrated in FIG. 2 may include an inspection unit 100, a part realignment unit 200, and a control unit 300. In addition, the device 20 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively. The apparatus 20 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 800 and corrects the defect on the substrate after the defect is detected. 850). The reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad.
좀 더 구체적으로, 검사부(100)는, 기판에 대한 검사를 수행하여 기판에 배치된 부품 또는 부품 배치상의 불량 여부를 판단한다. 기판의 검사를 위하여, 검사부(100)는 기판 자동 광학검사(AOI: Automatic Optical Inspection) 장비를 포함할 수 있고, AOI 장비를 통해 기판의 2차원 광학 영상 또는 3차원 광학 영상을 획득할 수 있다. AOI 장비가 3차원 영상을 획득하는 경우에는, 검사 대상물(예를 들면 부품이 배치된 기판)에 대해 패턴 광을 조사하고, 패턴광이 조사된 기판을 촬영하고, 촬영된 영상을 처리하여 검사 대상물의 3차원 영상을 생성할 수 있다. 일 실시예에 따르면, AOI 장비는 검사부(100) 내부에 설치될 수 있다. 다른 실시예에 따르면, AOI 장비는 검사부(100) 외부에 설치되어 검사부(100)와 유무선 통신을 통하여 연결될 수 있다. 이 경우, 검사부(100)는 AOI 장비로부터 기판에 대한 2차원 또는 3차원 영상을 전송받을 수 있다. 설명의 편의를 위하여, 이하에서는 검사부(100)가 기판의 검사를 위해 기판의 2차원 영상을 획득하는 것으로 가정한다. More specifically, the inspection unit 100 performs an inspection on the substrate to determine whether there is a component disposed on the substrate or a defect in the component arrangement. For the inspection of the substrate, the inspection unit 100 may include a substrate automatic optical inspection (AOI) equipment, and may acquire a two-dimensional optical image or a three-dimensional optical image of the substrate through the AOI equipment. When the AOI equipment acquires the 3D image, the pattern object is irradiated to the inspection object (for example, the substrate on which the component is disposed), the substrate to which the pattern light is irradiated, and the photographed image is processed to process the inspection object. 3D image can be generated. According to one embodiment, the AOI equipment may be installed inside the inspection unit 100. According to another embodiment, the AOI equipment may be installed outside the inspection unit 100 and connected to the inspection unit 100 through wired or wireless communication. In this case, the inspection unit 100 may receive a 2D or 3D image of the substrate from the AOI equipment. For convenience of explanation, hereinafter, it is assumed that the inspection unit 100 acquires a 2D image of the substrate for inspection of the substrate.
검사부(100)는, 기판의 영상을 검사하여, 기판 상에서 배치 상태가 불량한 부품의 위치와 불량의 유형을 판단할 수 있다. 예를 들어, 불량의 유형은, 기판 상에 부품이 배치되지 않은 미삽 불량, 기판 상에서 부품의 배치방향이 설계된 방향과는 다른 방향으로 틀어진 틀어짐 불량, 기판 상에서 부품이 솔더에 밀착되지 않고 들뜨게 배치된 들뜸 불량, 기판 상에서 부품이 설계된 위치와 다른 위치에 배치되는 위치 불량, 기판 상에 배치된 부품 자체에 크랙 등 하자가 있는 부품 불량, 그 외의 다양한 유형의 부품 또는 부품 배치상의 불량들 중의 하나 이상을 포함할 수 있으며, 이에 한정되지는 않는다. 검사부(100)는, 기판 상의 부품 또는 부품의 배치 불량 여부를 판정하는데 사용되는 소정의 톨러런스(tolerance) 값을 저장할 수 있다. 검사부(100)는, 기판 상에 배치된 부품 또는 부품의 배치 상태를 설계기준과 비교하고, 그 비교 결과가 톨러런스 값을 벗어나는 경우에는, 해당 부품 또는 부품의 배치 상태가 불량하다고 판정할 수 있다. 예를 들어, 틀어짐 불량의 판정 시에 사용되는 톨러런스 값이 0.1도로 설정되어 있으면, 검사부(100)는 기판 상의 부품의 배치 방향을 설계기준에 따른 방향과 비교하여, 그 차이가 0.1도를 초과한 경우에 해당 부품에 대해서 틀어짐 불량이 발생했다고 판정할 수 있다. The inspection unit 100 may examine an image of the substrate to determine a location of a component having a poor arrangement state and a type of the defect on the substrate. For example, the type of failure may include uninserted defects in which no component is placed on the substrate, misalignment defects that are displaced in a direction different from the direction in which the component placement on the substrate is designed, and a component placed on the substrate without being held in contact with the solder. One or more of various types of components or component placement defects, such as lifting defects, position defects that are placed in a different position from where the component is designed, substrate defects such as cracks in the components themselves placed on the substrate, It may include, but is not limited to. The inspection unit 100 may store a predetermined tolerance value used to determine whether or not a component or a component is disposed on the substrate. The inspection unit 100 compares the arrangement state of the components or components arranged on the substrate with the design criteria, and determines that the arrangement state of the components or components is poor when the comparison result deviates from the tolerance value. For example, if the tolerance value used at the time of determination of a distortion defect is set to 0.1 degree, the inspection part 100 compares the arrangement direction of the components on a board | substrate with the direction based on a design standard, and the difference exceeded 0.1 degree. In this case, it can be determined that a misalignment has occurred for the component.
일 실시예에서, 검사부(100)는, 불량을 판정하기 위한 설계기준으로써, 기판 상의 부품들의 배치(또는 레이아웃)를 나타내는 설계도면 또는 설계도면에 대응하는 캐드 데이터를 저장할 수 있다. 다른 실시예에서, 검사부(100)는, 불량을 판정하기 위한 설계기준으로써, 부품 또는 부품의 배치 상태가 양호한 것을 촬영한 이미지 데이터를 저장할 수 있다. 검사부(100)는, 설계기준을 외부 컴퓨터 장치로부터 유무선 통신을 통하여 전달받을 수 있다.In an embodiment, the inspection unit 100 may store CAD data corresponding to the design drawing or the design drawing indicating the arrangement (or layout) of the components on the substrate as a design criterion for determining a failure. In another embodiment, the inspection unit 100 may store image data photographing that the component or the arrangement state of the components is good as a design reference for determining a defect. The inspection unit 100 may receive the design criteria from an external computer device through wired or wireless communication.
검사부(100)는, 기판 상의 부품배치에 관한 불량 외에도, 기판 상의 솔더의 인쇄 상태에 관한 불량 또한 판정할 수 있다. 솔더의 인쇄 상태에 관한 불량에는, 예를 들어, 솔더가 설계된 위치에 인쇄되지 않은 인쇄위치불량, 솔더의 미납이나 소납 또는 과납, 솔더들 간의 쇼트, 솔더볼 등이 포함될 수 있으나, 이에 한정되지는 않는다. In addition to the defects regarding the arrangement of components on the substrate, the inspection unit 100 may also determine the defects regarding the printing state of the solder on the substrate. The defects related to the printing state of the solder may include, but are not limited to, a printing position defect that is not printed at the position where the solder is designed, unpaid or soldered or overpaid solder, short between solders, solder balls, and the like. .
검사부(100)는, 기판 상의 불량이 발생했음을 판정한 후, 기판 상의 불량이 발생한 위치와 유형에 관한 데이터를 생성할 수 있다. 검사부(100)는, 불량이 발생한 위치와 유형에 관한 데이터를 제어부(300)로 전송할 수 있다. 검사부(100)의 검사 결과 기판에 불량이 발견되지 않으면, 장치(20)는 기판을 이후의 공정, 예를 들면 리플로우 공정을 수행하는 장비(800)로 이송할 수 있다.After determining that a failure has occurred on the substrate, the inspection unit 100 may generate data regarding the location and type of the failure on the substrate. The inspection unit 100 may transmit data regarding the location and type of the failure to the controller 300. If no defect is found in the substrate as a result of the inspection of the inspection unit 100, the apparatus 20 may transfer the substrate to the equipment 800 that performs a subsequent process, for example, a reflow process.
부품교정부(200)는, 제어부(300)로부터의 제어에 따라, 검사부(100)가 검출한 불량을 교정하는 기능을 수행할 수 있다. 부품교정부(200)는, 불량과 연관된 부품의 위치와 방향 등 배치 상태를 조정하거나 또는 부품을 기판으로부터 제거 또는 분리하는 등, 불량을 교정하기 위한 교정 동작을 수행하는 부품 조작 수단(210)을 포함할 수 있다. The part corrector 200 may perform a function of correcting a defect detected by the inspection unit 100 under control from the controller 300. The part realignment 200 may include a part manipulation means 210 that performs a corrective operation for correcting a defect, such as adjusting an arrangement state such as a position and a direction of a component associated with a defect or removing or removing a component from a board. It may include.
부품교정부(200)는, 제어부(300)로부터 전송받은 기판의 영상 이미지 및 불량의 위치와 유형에 관한 데이터에 기초하여, 부품 조작 수단(210)을 사용하여 불량이 발생한 부품을 일시적으로 홀딩(holding)하여 기판으로부터 분리할 수 있다. 부품 조작 수단(210)은, 노즐과 같이, 음압(negative pressure)으로 부품을 흡착하는 음압식 말단부를 사용하여 구현될 수 있다. 이 경우, 부품 조작 수단(210)은 음압식 말단부에 의해 부품을 흡착한 후 부품을 잡아당기는 방식으로 기판으로부터 부품을 분리할 수 있다. 대안적으로, 부품 조작 수단(210)은, 핀셋이나 집게와 같은 유형의 기계식 고정부를 사용하여 구현될 수 있다. 이 경우, 부품 조작 수단(210)의 기계식 고정부는, 미세한 부품들이 집적하여 배치된 기판 상에서 불량 부품을 분리할 때 주변의 다른 부품들에 영향을 끼치지 않도록, 충분히 미세한 구조를 가질 수 있다. 다른 대안으로, 부품 조작 수단(210)은 접착 방식을 통하여 부품을 분리하도록 구성될 수 있다. 이 경우, 부품 조작 수단(210)은 접착층이 형성된 접착식 말단부를 구비하여, 접착식 말단부의 접착층을 부품에 밀착시키고, 기판으로부터 멀어지는 방향으로 접착식 말단부를 이동시키면서 접착층에 밀착된 부품을 기판으로부터 분리할 수 있다. 부품 조작 수단(210)의 구체적인 구성은, 이상 열거된 수단들에 한정되지 않으며, 부품을 기판으로부터 분리하기 위해 사용되는 공지된 전기적, 화학적, 기계적 수단들 중의 어느 하나를 적절히 선택하여 구현될 수 있다. Based on the video image of the substrate received from the control unit 300 and the data on the position and type of the defect, the component corrector 200 temporarily holds the component in which the defect occurs using the component manipulation unit 210. holding to separate from the substrate. The component manipulation means 210 may be implemented using a negative pressure end portion that adsorbs the component at a negative pressure, such as a nozzle. In this case, the component operating means 210 may detach the component from the substrate by pulling the component after absorbing the component by the negative pressure type end portion. Alternatively, the part manipulation means 210 may be implemented using a mechanical fixture of the type, such as tweezers or forceps. In this case, the mechanical fixing part of the component operating means 210 may have a sufficiently fine structure so that the mechanical parts of the component operating means 210 do not affect other parts of the surroundings when the defective parts are separated on the substrate on which the minute parts are integrated. Alternatively, the part manipulation means 210 may be configured to separate the parts by means of an adhesive method. In this case, the component operating means 210 has an adhesive end portion with an adhesive layer formed thereon, and the adhesive layer of the adhesive end portion can be brought into close contact with the component, and the component adhered to the adhesive layer can be separated from the substrate while moving the adhesive end portion in a direction away from the substrate. have. The specific configuration of the component operating means 210 is not limited to the above listed means, and may be implemented by appropriately selecting any one of known electrical, chemical, and mechanical means used to separate the component from the substrate. .
제어부(300)는, 부품교정부(200)를 제어하여 부품을 기판으로부터 분리할 때, 검사부(100)로부터 전달받은 기판에 대한 영상 이미지에 기초하여 부품교정부(200)의 상세한 동작들을 정밀하게 제어할 수 있다. 예를 들어, 부품교정부(200)의 부품 조작 수단(210)이 음압식 말단부, 기계식 고정부 내지 접착식 말단부를 사용하여 구현된 경우, 제어부(300)는, 기판의 3차원 영상 이미지에 기초하여, 기판으로부터 분리해야 할 부품의 위치와 방향을 확인하고, 부품교정부(200)가 해당 부품의 위치 또는 방향에 따라 부품 조작 수단(210)을 이동시킨 후, 해당 부품을 음압식 말단부, 기계식 고정부 내지 접착식 말단부에 흡착시켜 부품을 분리하도록 제어할 수 있다.When the control unit 300 controls the component realignment 200 to separate the component from the substrate, the control unit 300 precisely performs detailed operations of the component realignment 200 based on the image image of the substrate received from the inspection unit 100. Can be controlled. For example, when the component manipulation means 210 of the component corrector 200 is implemented using a negative pressure end portion, a mechanical fixed portion or an adhesive end portion, the controller 300 may be configured based on a three-dimensional image of the substrate. After confirming the position and direction of the part to be separated from the board, and the part realignment unit 200 moves the part operation means 210 according to the position or direction of the part, the part is moved to the negative pressure end portion, the mechanical high. It can be controlled to separate parts by adsorbing to the positive or adhesive end portion.
제어부(300)는, 불량과 연관된 부품이 제거된 후, 부품교정부(200)가 기판 상에서 부품이 제거된 위치에 새로운 부품을 배치하도록 제어할 수 있다. 부품교정부(200)는, 부품 조작 수단(210)을 이용하여, 버퍼로부터 신규한 부품을 공급받아 기판 상에서 불량과 연관된 부품이 분리된 위치에 배치할 수 있다. 이 때, 제어부(300)는, 검사부(100)로부터 전송받은 불량의 위치 및 유형에 대한 데이터를 이용하여 부품교정부(200)를 제어할 수 있다.After the component associated with the defect is removed, the controller 300 may control the component realignment 200 to arrange a new component at a position where the component is removed on the substrate. The component realignment 200 may receive a new component from the buffer using the component manipulation unit 210 and arrange the component at a position where the component associated with the defect is separated on the substrate. At this time, the controller 300 may control the parts realignment 200 using data on the location and type of the defect received from the inspection unit 100.
한편, 틀어짐 불량과 같은 유형의 불량에 대해서는, 기판 상에서 불량에 관련된 부품을 제거하고 신규 부품을 배치하는 대신, 불량과 관련된 부품의 배치 방향만을 수정함으로써 불량이 교정될 수 있다. 일 실시예에서, 제어부(300)는, 검사부(100)에서 검출된 불량의 유형이 틀어짐 불량인 경우에는, 부품교정부(200)가 불량과 연관된 부품을 기판으로부터 분리한 이후, 해당 부품의 방향을 설계된 방향으로 변경하여 재배치하도록 제어할 수 있다. 다른 실시예에서, 제어부(300)는 부품교정부(200)가 불량과 연관된 부품을 기판으로부터 분리하지 않고, 부품 조작 수단(210)을 이용하여 해당 부품의 배치 방향만을 변경하도록 제어할 수 있다. 이와 같은 교정 방식을 이용하면, 신규 부품을 버퍼로부터 가져와서 새로 배치하는 것에 비교하여, 비용과 시간 면에서 효율적으로 불량을 교정하는 것이 가능하다. On the other hand, for types of defects such as misalignment defects, the defects can be corrected by correcting only the arrangement direction of the components associated with the defects, instead of removing the components related to the defects and placing new components on the substrate. In one embodiment, if the type of the defect detected by the inspection unit 100 is a misalignment failure, the control unit 300 separates the component associated with the defect from the substrate, and then the direction of the corresponding component. It can be controlled to relocate by changing to the designed direction. In another embodiment, the controller 300 may control the component realignment 200 to change only the arrangement direction of the corresponding component using the component manipulation unit 210 without separating the component associated with the defect from the substrate. Using this calibration method, it is possible to efficiently correct defects in terms of cost and time as compared with taking new parts out of a buffer and placing them in a new place.
앞서 설명된 바와 같이, 부품교정부(200)가 기판에서 불량과 연관된 부품을 교정한 후, 장치(20)는 기판의 재검사를 위해 기판을 검사부(100)로 다시 이송시키거나, 또는 재검사를 실행하지 않고 이후 공정을 위해 다음 장비, 예를 들면 리플로우 장비(850)로 이송시킬 수 있다.As described above, after the part corrector 200 corrects the part associated with the defect in the substrate, the apparatus 20 transfers the substrate back to the inspection unit 100 or executes the retest for retesting the substrate. Rather, it can be transferred to the next equipment, for example reflow equipment 850, for later processing.
상기 실시예들에서는 부품교정부(200)가 단일한 부품 조작 수단(210)을 사용하여 불량을 교정하는 작업을 수행하는 것으로 설명되었다. 그러나, 본 발명에 따르는 기판의 검사 및 불량 교정 장치는 이상 설명된 실시예들에 한정되는 것은 아니며, 다른 다양한 기능과 구조를 갖는 부품교정부를 포함할 수 있다. In the above embodiments, it has been described that the part corrector 200 performs a work of correcting defects using a single part operating means 210. However, the inspection and failure correction apparatus of the substrate according to the present invention is not limited to the embodiments described above, and may include a part correction unit having other various functions and structures.
도 3는 본 발명의 다른 실시예에 따른 기판의 검사 및 불량 교정 장치(30)를 도시한다. 장치(30)는, 검사부(100), 부품교정부(200), 및 제어부(300)를 포함할 수 있다. 또한, 장치(30)는, 부품 배치 장비(800) 및 리플로우 장비(850)와 각각 연결될 수 있다. 이와 같은 구성을 갖는 장치(30)는, 부품 배치 장비(800)에 의해 부품이 배치된 인쇄 회로 기판을 검사하여 불량이 검출된 경우, 기판 상의 불량을 교정한 후, 해당 기판을 리플로우 장비(850)로 전송할 수 있다. 리플로우 장비(850)는, 불량이 교정된 기판에 대해 열처리를 실행함으로써, 기판 상의 부품의 단자가 패드에 접속되도록 한다. 도 3에 도시된 장치(30)의 구성요소들 중에서 도 2에 도시된 장치(20)의 구성요소들과 동일한 참조번호로 표시된 것들은, 상호 유사 또는 동일한 기능 및 구성을 가질 수 있으며, 해당 기능 및 구성에 관한 일부 설명은, 본 발명의 설명의 편의상 생략한다.3 shows an apparatus 30 for inspection and failure correction of a substrate according to another embodiment of the present invention. The apparatus 30 may include an inspection unit 100, a part corrector 200, and a controller 300. In addition, the device 30 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively. The apparatus 30 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 800, and when the defect is detected, corrects the defect on the substrate, and then reflows the substrate onto the substrate. 850). The reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad. Among the components of the apparatus 30 illustrated in FIG. 3, those indicated by the same reference numerals as the components of the apparatus 20 illustrated in FIG. 2 may have mutually similar or identical functions and configurations, and corresponding functions and Some description about a structure is abbreviate | omitted for convenience of description of this invention.
장치(30)의 부품교정부(200)는, 도 2의 부품교정부(200)가 단일한 부품 조작 수단(210)을 포함한 것과 달리, 기판으로부터 부품을 분리할 수 있는 분리수단(220), 및 기판에서 부품이 제거된 후 그 부품 또는 다른 부품을 재배치할 수 있는 부품 재배치수단(230)을 포함할 수 있다. 본 실시예에서, 부품교정부(200)는, 제어부(300)의 제어에 따라, 부품 분리수단(220)을 이용하여 기판으로부터 불량과 연관된 부품을 분리하고, 부품 재배치수단(230)을 이용하여 신규 부품을 기판에 배치할 수 있다. 예를 들어, 부품 분리수단(220)과 부품 재배치수단(230) 각각은, 칩 마운트 장비에서 사용되는 것과 같은 노즐과 같은 음압식 말단부, 핀셋이나 집게와 같은 기계식 말단부, 또는 접착식 말단부를 이용한 분리수단 및 칩 배치수단을 이용하여 구현될 수 있으나, 이에 한정되지 않으며, 부품을 기판으로부터 분리하거나 부품을 기판상에 배치하기 위해 사용되는 공지된 전기적, 화학적, 기계적 수단들 중의 어느 하나를 적절히 선택하여 구현될 수 있다.Parts repositioning 200 of the device 30, unlike the parts repositioning 200 of Fig. 2 includes a single component operating means 210, separating means 220, which can separate components from the substrate, And component repositioning means 230 capable of relocating the component or other component after the component is removed from the substrate. In the present embodiment, the part corrector 200 separates the part associated with the defect from the substrate using the part separating means 220 under the control of the controller 300, and uses the part rearranging means 230. New components can be placed on the substrate. For example, the component separating means 220 and the component rearranging means 230 each have a negative pressure end, such as a nozzle used in chip mount equipment, a mechanical end such as a tweezers or tongs, or a separating means using an adhesive end. And chip arrangement means, but is not limited thereto, and may be implemented by appropriately selecting any one of known electrical, chemical, and mechanical means used to separate a component from a substrate or to place a component on a substrate. Can be.
도 4는, 본 발명의 또 다른 실시예에 따른 기판의 검사 및 불량 교정 장치(40)를 도시한다. 장치(40)는, 검사부(100), 부품교정부(200), 및 제어부(300)를 포함할 수 있다. 또한, 장치(40)는, 부품 배치 장비(800) 및 리플로우 장비(850)와 각각 연결될 수 있다. 한편, 장치(40)의 부품교정부(200)는, 도 3의 부품교정부(200)와 달리, 부품 재배치 장치(230)를 포함하지 않고, 부품 분리 장치(210)만을 포함할 수 있다. 또한, 장치(40) 또는 부품교정부(200)는, 버퍼용 컨베이어(700)를 통해 부품 배치 장비(800)에 연결될 수 있다.4 illustrates a substrate inspection and failure correction apparatus 40 according to another embodiment of the present invention. The apparatus 40 may include an inspection unit 100, a part corrector 200, and a controller 300. In addition, the device 40 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively. On the other hand, the part realignment 200 of the device 40, unlike the part realignment 200 of FIG. 3, may not include the component rearrangement device 230, it may include only the component separation device 210. In addition, the device 40 or parts realignment 200 may be connected to the component placement equipment 800 via a buffer conveyor 700.
이와 같은 구성을 갖는 장치(40)는, 부품 배치 장비(800)에 의해 부품이 배치된 인쇄 회로 기판을 검사하여 불량이 검출된 경우, 기판 상의 불량을 교정한 후, 해당 기판을 리플로우 장비(850)로 전송할 수 있다. 리플로우 장비(850)는, 불량이 교정된 기판에 대해 열처리를 실행함으로써, 기판 상의 부품의 단자가 패드에 접속되도록 한다. 도 4에 도시된 장치(40)의 구성요소들 중에서 도 2 및 도 3에 도시된 장치(20, 30)의 구성요소들과 동일한 참조번호로 표시된 것들은, 상호 유사 또는 동일한 기능 및 구성을 가질 수 있으며, 해당 기능 및 구성에 관한 일부 설명은, 본 발명의 설명의 편의상 생략한다.The device 40 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 800 and corrects the defect on the substrate after the failure is detected. 850). The reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad. Among the components of the apparatus 40 shown in FIG. 4, those indicated by the same reference numerals as the components of the apparatuses 20 and 30 shown in FIGS. 2 and 3 may have similar or identical functions and configurations. In addition, some description regarding the said function and a structure is abbreviate | omitted for convenience of description of this invention.
이상 구성을 갖는 본 실시예에서, 부품교정부(200)가 부품 분리 수단(220)을 이용하여 기판으로부터 불량과 관련된 부품을 분리한 이후, 장치(40)는 해당 기판을 버퍼용 컨베이어(700)를 통해 다시 부품 배치 장비(800)로 이송할 수 있다. 부품 배치 장비(800)가 현재 다른 기판에 부품을 배치하는 공정을 처리하고 있는 경우, 장치(40)는 불량과 관련된 부품이 제거된 기판이 버퍼용 컨베이어(700) 상에 머무르도록 버퍼용 컨베이어(700)를 제어할 수 있다. 이 경우, 버퍼용 컨베이어(700)는, 부품 배치 장비(800)가 현재 작업을 완료한 후, 불량과 관련된 부품이 제거된 기판을 부품 배치 장비(800)로 이송할 수 있다. 필요에 따라, 제어부(300)가 부품 배치 장비(800)에 불량의 위치 및 유형에 대한 데이터를 함께 전송할 수 있다. 부품 배치 장비(800)는, 부품교정부(200)로부터 전송된 기판에 부품을 재배치한 후, 해당 기판을 다시 장치(40)의 검사부(100)로 이송하거나, 또는 이후의 공정을 진행하기 위해 다음 장비로 이송할 수 있다.In the present embodiment having the above configuration, after the component realignment 200 separates the parts related to the defect from the substrate by using the component separating means 220, the device 40 removes the substrate from the buffer conveyor 700. It can be transferred back to the component placement equipment 800 through. If the component placement equipment 800 is currently processing a process of placing a component on another substrate, the device 40 may include a buffer conveyor so that the substrate from which the component associated with the defect is removed remains on the buffer conveyor 700. 700 can be controlled. In this case, the buffer conveyor 700 may transfer the substrate from which the component related to the defect is removed to the component placement equipment 800 after the component placement equipment 800 completes the current work. If necessary, the control unit 300 may transmit data on the location and type of the defect to the component arrangement apparatus 800 together. The component placement apparatus 800 may rearrange the components on the substrate transmitted from the component realignment 200, and then transfer the substrate to the inspection unit 100 of the apparatus 40, or to proceed with a subsequent process. Can be transferred to the next piece of equipment.
이상의 실시예들을 통해 설명된 본 발명의 인쇄 회로 기판의 검사 및 불량 교정 장치는, 부품이 배치된 기판에 대한 리플로우 공정을 수행하기 전에, 기판 상의 부품의 배치 상태를 검사하여 불량이 검출된 경우 이를 자동으로 교정하는 기능을 수행할 수 있다. 이를 통해, 인쇄 회로 기판과 같은 기판을 포함하는 제품의 불량률을 낮출 수 있고, 종래 수작업으로 진행되던 기판의 불량부품의 제거 작업을 자동화함으로써 공정을 효율화하고 작업 속도를 개선하여 수율을 높이는 것이 가능하다.The inspection and failure correction apparatus of the printed circuit board of the present invention described through the above embodiments, when the failure is detected by inspecting the arrangement of the components on the substrate before performing the reflow process for the substrate on which the components are disposed You can do this automatically. Through this, it is possible to lower the defective rate of products including substrates, such as a printed circuit board, and to automate the removal of defective parts of the substrate, which has been performed by hand, to streamline the process and improve the working speed to increase the yield. .
도 5는 본 발명의 또 다른 실시예에 따르는 기판의 검사 및 불량 교정 장치(50)를 도시한 것이다. 장치(50)는, 검사부(100), 부품교정부(200), 및 제어부(300)를 포함할 수 있다. 또한, 장치(50)는, 부품 배치 장비(800) 및 리플로우 장비(850)와 각각 연결될 수 있다. 한편, 장치(50)는, 부품교정부(200)가 불량이 검출된 기판으로부터 부품을 분리한 이후, 해당 기판에 대한 솔더 제거 및 보납을 실행하는 솔더제거부(400)와 솔더보납부(500)를 더 포함할 수 있다. 5 shows an apparatus 50 for inspection and failure correction of a substrate according to another embodiment of the present invention. The apparatus 50 may include an inspection unit 100, a part corrector 200, and a controller 300. In addition, the device 50 may be connected to the component placement equipment 800 and the reflow equipment 850, respectively. On the other hand, the device 50, after the component realignment 200 separates the component from the substrate is detected defective, the solder removal unit 400 and the solder holding unit 500 to perform the solder removal and storage of the substrate. ) May be further included.
이와 같은 구성을 갖는 장치(50)는, 부품 배치 장비(850)에 의해 부품이 배치된 인쇄 회로 기판을 검사하여 불량이 검출된 경우, 기판 상의 불량을 교정한 후, 해당 기판을 리플로우 장비(850)로 전송할 수 있다. 리플로우 장비(850)는, 불량이 교정된 기판에 대해 열처리를 실행함으로써, 기판 상의 부품의 단자가 패드에 접속되도록 한다. 도 5에 도시된 장치(50)의 구성요소들 중에서 도 2 내지 도 4에 도시된 장치(20, 30, 40)의 구성요소들과 동일한 부재번호로 표시된 것들은, 상호 유사 또는 동일한 기능 및 구성을 가질 수 있으며, 해당 기능 및 구성에 관한 일부 설명은, 본 발명의 설명의 편의상 생략한다.The apparatus 50 having such a configuration inspects the printed circuit board on which the component is placed by the component placement equipment 850 and corrects the defect on the substrate after the failure is detected. 850). The reflow equipment 850 performs heat treatment on the substrate on which the defect has been corrected, so that the terminal of the component on the substrate is connected to the pad. Among the components of the apparatus 50 shown in FIG. 5, those denoted by the same reference numerals as the components of the apparatuses 20, 30, and 40 shown in FIGS. 2 to 4 are similar to each other or have the same function and configuration. Some description of the function and configuration is omitted for convenience of description of the present invention.
도 6은 본 발명에서 교정하고자 하는 솔더의 인쇄 오류 형태의 예들을 도시한 것이다 일 예에서, 도 6에 도시된 바와 같이, 부품(610)이 기판(650)으로부터 분리되었을 때, 솔더(612)가 기판(650) 상에 그대로 잔존할 수 있다. 이러한 경우 솔더(612)에 대해 특별한 처리가 행해질 필요는 없고, 제어부(300)의 제어에 따라 부품교정부(200)가 기판(650)의 솔더(612) 위에 부품을 재배치하거나, 장치(50)가 부품 배치 장치(800)로 기판을 이송하여, 부품 배치 장치(800)가 기판(650)의 솔더(612) 위에 부품을 재배치하도록 할 수 있다. FIG. 6 illustrates examples of printing error forms of the solder to be corrected in the present invention. In one example, as shown in FIG. 6, when the component 610 is separated from the substrate 650, the solder 612. May remain on the substrate 650 as it is. In this case, no special processing needs to be performed on the solder 612, and according to the control of the controller 300, the component corrector 200 rearranges the components on the solder 612 of the substrate 650, or the apparatus 50. The substrate may be transferred to the component placement apparatus 800 such that the component placement apparatus 800 may rearrange the components over the solder 612 of the substrate 650.
다른 예에서, 도 6의 솔더(622)와 같이, 부품(620)이 기판(650)으로부터 분리된 후에, 솔더(622)의 일부는 분리된 부품(620)에 부착된 상태로 기판(650)으로부터 분리되고 솔더(622)의 나머지 일부는 기판(650)에 잔존할 수 있다. 이 경우, 기판(650) 상의 솔더(622)에 부품(620)을 다시 배치하기 위해서는 솔더를 보납할 필요가 있다. 또는, 검사부(100)에서 검출한 불량의 유형이, 부품의 불량이 아닌 솔더의 불량인 경우에도, 마찬가지로 해당 솔더의 보납이 필요하다. 즉, 기판 상에 설계에 따른 솔더가 미납 또는 소납된 경우에도, 관련 부품을 기판으로부터 분리한 이후, 불량이 발생한 솔더를 보납함으로써 이와 같은 불량을 수정할 필요가 있다. In another example, as with solder 622 of FIG. 6, after component 620 is separated from substrate 650, a portion of solder 622 is attached to separated component 620 and substrate 650. And the remaining portion of solder 622 may remain on substrate 650. In this case, in order to reposition the component 620 to the solder 622 on the substrate 650, it is necessary to hold the solder. Alternatively, even when the type of the defect detected by the inspection unit 100 is a defect of the solder instead of a defect of the component, the soldering of the solder is similarly necessary. That is, even when solder according to the design is unpaid or sintered on the substrate, it is necessary to correct such defects by separating the related components from the substrate and then storing the solder having the defects.
상기와 같은 솔더 불량들을 교정하기 위해, 솔더보납부(500)는, 부품교정부(200)가 부품을 기판으로부터 분리한 이후에, 제어부(300)의 제어에 따라 솔더(622)에 대한 솔더 보납을 실행할 수 있다. 다른 예에서, 솔더보납부(500)는 기판(650)으로부터 부품이 분리되면서 솔더 전체가 제거된 경우에 솔더를 보납하거나, 기판(650) 상에 솔더의 미납과 같은 유형의 불량이 검출된 경우에도 솔더를 보납할 수 있다. 솔더보납부(500)는 솔더를 보납하기 위해, 기판에 솔더를 도포하기 위해 사용되는 솔더 디스펜서와 같은 종래의 기술을 활용하여 구현될 수 있다.In order to correct the solder defects as described above, the solder soldering unit 500, after the component corrector 200 separates the component from the substrate, solder solder to the solder 622 under the control of the control unit 300. You can run In another example, the solder holding part 500 may store solder when the entire solder is removed while the component is separated from the substrate 650, or when a defect of the type such as non-payment of solder is detected on the substrate 650. Solder can also be retained. The solder holding part 500 may be implemented by using a conventional technique such as a solder dispenser used to apply solder to a substrate to hold solder.
한편, 기판(650)으로부터 부품(520)을 분리한 후 솔더(622)가 잔존하거나, 또는 솔더의 불량 유형이 소납인 경우에는, 현재 기판(650) 상의 솔더의 상태에 따라, 보납하여야 하는 솔더의 양이 일정치 않을 수 있다. 다른 예에서, 도 6의 솔더(632)와 같이, 기판(650)으로부터 부품(630)을 분리하는 과정에서 솔더(632)의 형상이 변경될 수 있다. 다른 예에서, 검사부(100)에 의해 검출된 솔더 불량에는, 솔더의 과납이나 과납으로 인한 쇼트, 또는 솔더볼이 포함될 수 있다. 이러한 경우에는, 기판(650)에 대한 솔더의 보납만으로는 불량을 완전히 교정하기 어렵다. On the other hand, if the solder 622 remains after removing the component 520 from the substrate 650, or if the defect type of solder is soldered, depending on the current state of the solder on the substrate 650, the solder to be retained The amount of may be inconsistent. In another example, as in the solder 632 of FIG. 6, the shape of the solder 632 may be changed in the process of separating the component 630 from the substrate 650. In another example, the solder defect detected by the inspection unit 100 may include a solder ball or a short due to over soldering or over soldering. In such a case, it is difficult to completely correct a defect only by supplying solder to the substrate 650.
상기와 같은 솔더 불량들을 교정하기 위해, 솔더제거부(400)는, 부품교정부(200)가 부품을 기판으로부터 분리한 이후, 솔더보납부(500)에 의한 보납이 실행되기 전에, 제어부(300)의 제어에 따라 기판 상의 부품이 분리된 위치에 인쇄된 잔존 솔더 또는 불량이 발생한 솔더를 제거할 수 있다. 솔더제거부(400)는 솔더를 제거하기 위해 종래 사용되는 흡입기나 솔더윅(solder wick) 등을 사용하여 구현될 수 있다. 솔더가 제거된 기판에 대해, 솔더보납부(500)가 솔더 보납을 수행할 수 있다.In order to correct the solder defects as described above, the solder removing unit 400, after the component corrector 200 separates the component from the substrate, before the soldering unit 500 is performed by the solder holding unit 500, the control unit 300 ), The remaining solder printed on the separated position of the components on the substrate or the defective solder can be removed. The solder removing unit 400 may be implemented using an inhaler or solder wick, which is conventionally used to remove solder. For the substrate from which the solder has been removed, the solder storage unit 500 may perform solder storage.
도 7은 본 발명의 일 실시예에 따르는 기판의 불량 검사 및 교정 방법을 도시한 순서도이다. 도 7에 도시된 방법은, 도 2 내지 도 4를 참조하여 설명된 기판의 불량 검사 및 교정 장치(20, 30, 40) 중의 어느 하나에 의해서 수행될 수 있다. 7 is a flowchart illustrating a defect inspection and calibration method of a substrate according to an exemplary embodiment of the present invention. The method illustrated in FIG. 7 may be performed by any one of the defect inspection and correction apparatuses 20, 30, and 40 of the substrate described with reference to FIGS. 2 to 4.
먼저, 단계(S710)에서, 불량 검사 및 교정 장치의 검사부가 부품이 배치된 기판을 검사하고 검사 결과로부터 기판 상의 불량을 검출한다. 예를 들어, 도 2 내지 도 4를 참조하여 설명된 바와 같이, 검사부(100)는 기판의 영상 이미지를 획득하고, 획득된 영상 이미지로부터 기판상의 부품 또는 부품의 배치 상태에 관한 불량을 검출할 수 있다. 일 실시예에서, 검사부(100)는 그 내부에 장착되거나 외부에 설치된 AOI 장비가 촬영한 기판의 영상 이미지를 전송 받고, 수신된 영상 이미지로부터 기판상의 부품 또는 부품의 배치 상태에 관한 불량을 검출할 수 있다First, in step S710, the inspection unit of the defect inspection and correction apparatus inspects the substrate on which the component is placed and detects a defect on the substrate from the inspection result. For example, as described with reference to FIGS. 2 to 4, the inspection unit 100 may acquire an image image of a substrate, and detect a defect regarding a component or an arrangement state of the component on the substrate from the obtained image image. have. In one embodiment, the inspection unit 100 receives an image image of the substrate photographed by the AOI equipment mounted therein or installed externally, and detects a defect regarding the component or the arrangement state of the component on the substrate from the received image image. Can
다음으로, 단계(S720)에서, 불량 검사 및 교정 장치의 제어부가 부품교정부를 제어하여, 검출된 불량과 연관된 부품을 기판에서 분리한다. 예를 들어, 도 2 내지 도 4를 참조하여 설명된 바와 같이, 부품교정부(200)는 검사부(100)로부터 수신된 불량의 위치 및 유형에 기초하여, 기판 상에서 불량과 관련된 부품을 제거할 수 있다. Next, in step S720, the control unit of the defect inspection and correction apparatus controls the part realignment to separate the component associated with the detected defect from the substrate. For example, as described with reference to FIGS. 2 to 4, the component corrector 200 may remove a component related to the defect on the substrate based on the location and type of the defect received from the inspection unit 100. have.
단계(S730)에서, 불량 검사 및 교정 장치의 제어부가 부품교정부를 제어하여, 기판 상에서 부품이 분리된 위치에 새로운 부품을 배치한다. 예를 들어, 도 2 내지 도 5를 참조하여 설명된 바와 같이, 부품교정부(200)는 기판 상에서 불량에 관련된 부품이 제거된 위치에 새로운 부품을 배치하거나, 제거된 부품을 재배치할 수 있다. 다른 예에서, 부품교정부(200) 대신 부품 배치 장비가 기판 상에서 불량에 관련된 부품이 제거된 위치에 해당 제품을 재배치할 수 있다. In step S730, the control unit of the defect inspection and correction device controls the part realignment to place a new part in the position where the parts are separated on the substrate. For example, as described with reference to FIGS. 2 to 5, the component realignment 200 may arrange a new component or relocate the removed component at a position where a component related to a defect is removed on the substrate. In another example, component placement equipment instead of component realignment 200 may relocate the product to a location where the component associated with the defect has been removed from the substrate.
도 8은 본 발명의 다른 실시예에 따르는 기판의 불량 검사 및 교정 방법을 도시한 것이다. 도 8에 도시된 방법은, 예를 들어, 도 5을 참조하여 설명한 기판의 불량 검사 및 교정 장치(50)에 의해 수행될 수 있다. 8 illustrates a defect inspection and correction method of a substrate according to another embodiment of the present invention. The method illustrated in FIG. 8 may be performed by, for example, the defect inspection and correction apparatus 50 of the substrate described with reference to FIG. 5.
먼저, 단계(S810)에서, 불량 검사 및 교정 장치의 검사부가 부품이 배치된 기판을 검사하고 검사 결과로부터 기판 상의 불량을 검출한다. 다음으로, 단계(S820)에서, 불량 검사 및 교정 장치의 제어부가 부품교정부를 제어하여, 검출된 불량과 연관된 부품을 기판에서 분리한다. First, in step S810, the inspection unit of the defect inspection and correction apparatus inspects a substrate on which a component is placed and detects a defect on the substrate from the inspection result. Next, in step S820, the control unit of the defect inspection and correction apparatus controls the part calibration, and separates the component associated with the detected defect from the substrate.
단계(S820)를 실행한 후 단계(S830)에서, 불량 검사 및 교정 장치의 제어부가 솔더제거부를 제어하여, 불량과 연관된 부품이 제거된 영역에 잔류하는 솔더를 제거한다. 예를 들어, 도 5 및 도 6을 참조하여 설명된 바와 같이, 기판(650)으로부터 부품(630)을 분리하는 과정에서 솔더(632)의 형상이 변경된 경우, 솔더의 과납이나 과납으로 인한 쇼트, 또는 솔더볼 등과 같은 솔더 불량들을 교정하기 위해, 솔더제거부(400)는, 부품교정부(200)가 부품을 기판으로부터 분리한 이후, 솔더보납부(500)에 의한 보납이 실행되기 전에, 제어부(300)의 제어에 따라 기판 상의 부품이 분리된 위치에 인쇄된 잔존 솔더 또는 불량이 발생한 솔더를 제거할 수 있다.After executing step S820, in step S830, the controller of the defect inspection and correction apparatus controls the solder removing unit to remove the solder remaining in the region where the component associated with the defect is removed. For example, as described with reference to FIGS. 5 and 6, when the shape of the solder 632 is changed in the process of separating the component 630 from the substrate 650, a short due to over or over solder, Alternatively, in order to correct solder defects such as solder balls, the solder removing unit 400 may include a control unit (B) after the component corrector 200 separates the component from the substrate and before the soldering unit 500 performs the soldering. According to the control of 300, the remaining solder printed on the position where the components on the substrate are separated or the solder in which the defect occurs may be removed.
다음으로, 단계(S840)에서, 불량 검사 및 교정 장치의 제어부가 솔더보납부를 제어하여, 불량과 연관된 부품이 제거된 영역에 솔더를 보납한다. 솔더의 보납이 이루어진 이후, 단계(S850)에서, 기판 상의 부품이 분리된 위치에 기존 또는 신규 부품이 재배치되는 단계가 수행될 수 있다. 다만, 앞서 설명된 바와 같이, 솔더의 제거 및 보납 공정 후에 새로운 부품의 배치가 실행될 수도 있지만, 기판 상의 부품의 제거된 위치의 솔더의 상태에 따라, 기판으로부터 부품 제거 후 솔더 제거 공정 및 보납 공정 없이 새로운 부품의 배치가 실행될 수도 있다. 또한, 기판 상에서 검출된 불량의 유형에 따라, 단계(S830)의 실행 없이 단계(S840)에 따른 솔더의 보납만이 실행될 수도 있다. Next, in step S840, the control unit of the defect inspection and correction device controls the solder holding unit, so that the solder is stored in the region where the component associated with the defect is removed. After the solder is replenished, in step S850, a step of relocating an existing or new component to a position where components on the substrate are separated may be performed. However, as described above, although the placement of the new component may be performed after the removal and retention process of the solder, depending on the state of the solder at the removed position of the component on the substrate, there is no solder removal process and the retention process after removing the component from the substrate. Placement of new parts may be performed. In addition, depending on the type of defect detected on the substrate, only soldering in accordance with step S840 may be performed without performing step S830.
본 발명은 바람직한 실시예를 통해 설명되고 예시되었으나, 당업자라면 첨부한 청구 범위의 사항 및 범주를 벗어나지 않고 여러 가지 변형 및 변경이 이루어질 수 있음을 알 수 있을 것이다.While the invention has been described and illustrated by way of preferred embodiments, it will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the appended claims.
[부호의 설명][Description of the code]
10, 20, 30, 40, 50: 기판 검사 및 불량 교정 장치10, 20, 30, 40, 50: board inspection and defect correction device
100: 검사부100: inspection unit
200: 부품교정부200: parts correction
300: 제어부300: control unit
400: 솔더제거부400: solder removal part
500: 솔더보납부500: solder joint

Claims (18)

  1. 솔더 페이스트 상에 배치된 부품을 포함하는 인쇄 회로 기판의 검사 및 불량 교정 장치 장치로서,An apparatus for inspecting and calibrating a printed circuit board including a component disposed on a solder paste, the apparatus comprising:
    상기 인쇄 회로 기판을 검사하여, 상기 인쇄 회로 기판 상의 상기 부품에 관한 불량의 위치와 유형을 판정하는 검사부; An inspection unit for inspecting the printed circuit board to determine the location and type of the defect with respect to the component on the printed circuit board;
    상기 검사부로부터 수신된 상기 불량의 위치 및 유형에 기초하여, 상기 불량의 교정을 위해 부품의 제거, 부품의 방향 조정 및 부품의 배치 중 적어도 하나의 교정 동작에 관한 제어 신호를 생성하는 제어부; 및A controller configured to generate a control signal for at least one calibration operation of removing a part, adjusting a part's direction, and arranging the part for correcting the defect based on the position and type of the defect received from the inspecting unit; And
    상기 제어 신호에 따라, 부품을 일시적으로 홀딩(holding)할 수 있는 부품 조작 수단을 이용하여, 상기 인쇄 회로 기판 상의 부품을 제거하거나, 부품의 방향을 조정하거나, 또는 상기 인쇄 회로 기판 상에 부품을 배치하는 부품교정부According to the control signal, by using a component operating means capable of temporarily holding a component, the component on the printed circuit board is removed, the component is oriented, or the component is placed on the printed circuit board. Posted by
    를 포함하는,Including,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  2. 제1항에 있어서,The method of claim 1,
    상기 불량의 유형은 부품 틀어짐, 부품 들뜸, 부품 위치 불량, 부품 미배치,솔더 미납, 솔더 소납, 솔더 과납 중 적어도 하나를 포함하는,The type of failure includes at least one of component misalignment, component lifting, component location failure, component misplacement, solder non-lead, solder solder, solder solder,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  3. 제1항에 있어서,The method of claim 1,
    상기 부품교정부는, 상기 제어 신호에 따라, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시켜 상기 인쇄 회로 기판으로부터 분리하는,The component realignment unit, according to the control signal, to fix, attract or bond the components associated with the failure to separate from the printed circuit board,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  4. 제3항에 있어서,The method of claim 3,
    상기 인쇄 회로 기판상에서 부품이 분리된 영역에 잔류하는 솔더를 제거하는 솔더제거부를 더 포함하고,Further comprising a solder removal portion for removing the solder remaining in the region separated parts on the printed circuit board,
    상기 제어부는, 잔류 솔더를 제거하는 동작에 관한 제어 신호를 더 생성하고, The control unit further generates a control signal for the operation of removing the residual solder,
    상기 잔류 솔더를 제거하는 동작에 관한 제어 신호에 따라, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리한 후, 상기 솔더제거부가 상기 인쇄 회로 기판 상에서 상기 불량과 연관된 부품이 제거된 영역에 잔류하는 솔더를 제거하는, According to a control signal relating to the operation of removing the residual solder, after the component realignment separates the component associated with the defect from the printed circuit board, the solder removal unit removes the component associated with the defect on the printed circuit board. To remove the solder remaining in the area,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  5. 제3항에 있어서,The method of claim 3,
    상기 인쇄 회로 기판상에서 부품이 분리된 영역에 솔더를 보납하는 솔더보납부를 더 포함하고,Further comprising a solder soldering portion for soldering the solder to the separated region on the printed circuit board,
    상기 제어부는, 솔더를 보납하는 동작에 관한 제어 신호를 더 생성하고, The control unit further generates a control signal for the operation of soldering solder,
    상기 솔더를 보납하는 동작에 관한 제어 신호에 따라, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리한 후, 상기 솔더보납부가 상기 불량과 연관된 부품이 분리된 영역에 솔더를 보납하는,According to a control signal relating to the operation of holding the solder, after the component realignment separates the component associated with the defect from the printed circuit board, the solder holding unit delivers the solder to an area where the component associated with the defect is separated. doing,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  6. 제1항에 있어서,The method of claim 1,
    상기 부품 조작 수단은, 음압(negative pressure)으로 상기 불량과 연관된 부품을 흡착하여 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리하는 음압식 말단부를 포함하는,The component manipulation means includes a negative pressure end portion for adsorbing the component associated with the defect at negative pressure to separate the component associated with the defect from the printed circuit board.
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  7. 제1항에 있어서,The method of claim 1,
    상기 부품 조작 수단은, 핀셋 또는 집게에 상기 불량과 연관된 부품을 고정시켜 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리하는 기계식 고정부를 포함하는, The component operating means includes a mechanical fixing portion for fixing the component associated with the defect to the tweezers or tongs to separate the component associated with the defect from the printed circuit board,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  8. 제1항에 있어서,The method of claim 1,
    상기 부품 조작 수단은, 접착층을 상기 불량과 연관된 부품에 밀착시켜 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리하는 접착식 말단부를 포함하는,The component manipulation means comprises an adhesive end portion which adheres the adhesive layer to the component associated with the defect and separates the component associated with the defect from the printed circuit board,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  9. 제1항에 있어서,The method of claim 1,
    상기 부품교정부는, 상기 제어 신호에 따라, 상기 인쇄 회로 기판 상에서 상기 불량과 연관된 부품이 분리된 위치에 상기 불량과 연관된 부품을 재배치하거나 또는 신규 부품을 배치하는,According to the control signal, the component realignment may relocate a component associated with the defect or place a new component in a position where the component associated with the defect is separated on the printed circuit board.
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  10. 제1항에 있어서,The method of claim 1,
    상기 불량의 유형이 부품 틀어짐 또는 부품 위치 불량인 경우, 상기 부품교정부는, 상기 제어 신호에 따라, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시켜 상기 인쇄 회로 기판으로부터 분리한 후, 상기 불량과 연관된 부품이 분리된 위치에 상기 부품을 재배치하거나, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시킨 후 배치 방향을 변경하는,When the type of the defect is a component misalignment or a component position defect, the component corrector, according to the control signal, separates from the printed circuit board by fixing, adsorbing or adhering the component associated with the defect, and then associated with the defect. Relocating the part to a location where the part is separated, or fixing, adsorbing, or gluing the part associated with the defect, and then changing the placement direction,
    인쇄 회로 기판의 검사 및 불량 교정 장치.Device for inspection and defect correction of printed circuit boards.
  11. 검사부, 부품교정부 및 제어부를 포함하는 인쇄 회로 기판의 검사 및 불량 교정 장치에 의해 수행되는 인쇄 회로 기판의 검사 및 불량 교정 방법으로서, An inspection and failure correction method of a printed circuit board performed by an inspection and failure correction apparatus of a printed circuit board including an inspection unit, a part correction unit, and a control unit,
    상기 검사부가, 솔더 페이스트 상에 배치된 부품을 포함하는 인쇄 회로 기판을 검사하여, 상기 인쇄 회로 기판상의 상기 부품에 관한 불량의 위치와 유형을 판정하는 단계;Inspecting, by the inspection unit, a printed circuit board comprising a component disposed on solder paste to determine a location and type of a defect with respect to the component on the printed circuit board;
    상기 제어부가, 상기 검사부로부터 수신된 상기 불량의 위치 및 유형에 기초하여, 상기 불량의 교정을 위해 부품의 제거, 부품의 방향 조정 및 부품의 배치 중 적어도 하나의 교정 동작에 관한 제어 신호를 생성하는 단계;The control unit generates a control signal for at least one calibration operation of removing a part, adjusting a part's direction, and arranging a part to correct the defect, based on the position and type of the defect received from the inspecting unit. step;
    상기 부품 교정부가, 상기 제어 신호에 따라, 부품을 일시적으로 홀딩할 수 있는 부품 조작 수단을 이용하여, 상기 인쇄 회로 기판 상의 부품을 제거하거나, 부품의 방향을 조정하거나, 또는 상기 인쇄 회로 기판 상에 부품을 배치하는 단계The component corrector removes the component on the printed circuit board, adjusts the direction of the component, or uses the component operating means capable of temporarily holding the component according to the control signal. Steps to Place Parts
    를 포함하는,Including,
    인쇄 회로 기판의 검사 및 불량 교정 방법.Method of inspection and bad calibration of printed circuit boards.
  12. 제11항에 있어서,The method of claim 11,
    상기 불량의 유형은 부품 틀어짐, 부품 들뜸, 부품 위치 불량, 부품 미배치, 솔더 미납, 솔더 소납, 솔더 과납 중 적어도 하나를 포함하는,The type of failure includes at least one of component misalignment, component lifting, component placement failure, component misplacement, solder non-lead, solder solder, solder over solder,
    인쇄 회로 기판의 검사 및 불량 교정 방법.Method of inspection and bad calibration of printed circuit boards.
  13. 제11항에 있어서,The method of claim 11,
    상기 인쇄 회로 기판 상의 부품을 제거하거나, 부품의 방향을 조정하거나, 또는 상기 인쇄 회로 기판 상에 부품을 배치하는 단계는, 상기 부품교정부가, 상기 제어 신호에 따라, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시켜 상기 인쇄 회로 기판으로부터 분리하는 단계를 포함하는,Removing the component on the printed circuit board, or adjusting the orientation of the component, or placing the component on the printed circuit board, the component realignment, in accordance with the control signal, to fix the component associated with the failure, Adsorbing or adhering to separate from the printed circuit board,
    인쇄 회로 기판의 검사 및 불량 교정 방법.Method of inspection and bad calibration of printed circuit boards.
  14. 제11항에 있어서,The method of claim 11,
    상기 인쇄 회로 기판의 검사 및 불량 교정 장치는 솔더제거부를 더 포함하고, The inspection and failure correction apparatus of the printed circuit board further includes a solder removal portion,
    상기 방법은, The method,
    상기 제어부가, 잔류 솔더를 제거하는 동작에 관한 제어 신호를 더 생성하는 단계; 및Generating, by the control unit, a control signal relating to an operation of removing residual solder; And
    상기 잔류 솔더를 제거하는 동작에 관한 제어 신호에 따라, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리한 후, 상기 솔더제거부가 상기 인쇄 회로 기판 상에서 상기 불량과 연관된 부품이 제거된 영역에 잔류하는 솔더를 제거하는 단계를 더 포함하는,According to a control signal relating to the operation of removing the residual solder, after the component realignment separates the component associated with the defect from the printed circuit board, the solder removal unit removes the component associated with the defect on the printed circuit board. Further comprising removing solder remaining in the region,
    인쇄 회로 기판의 검사 및 불량 교정 방법. Method of inspection and bad calibration of printed circuit boards.
  15. 제11항에 있어서,The method of claim 11,
    상기 인쇄 회로 기판의 검사 및 불량 교정 장치는 솔더보납부를 더 포함하고, The inspection and failure correction apparatus of the printed circuit board further includes a solder holding portion,
    상기 방법은, The method,
    상기 제어부가, 솔더를 보납하는 동작에 관한 제어 신호를 더 생성하는 단계; 및Generating, by the control unit, a control signal relating to an operation of holding solder; And
    상기 솔더를 보납하는 동작에 관한 제어 신호에 따라, 상기 부품교정부가 상기 불량과 연관된 부품을 상기 인쇄 회로 기판으로부터 분리한 후, 상기 솔더보납부가 상기 인쇄 회로 기판 상에서 상기 불량과 연관된 부품이 제거된 영역에 솔더를 보납하는 단계를 더 포함하는,According to a control signal relating to the operation of soldering the solder, after the component realignment separates the component associated with the defect from the printed circuit board, the solder holder is removed from the component associated with the defect on the printed circuit board. Further comprising soldering the region to the region,
    인쇄 회로 기판의 검사 및 불량 교정 방법.Method of inspection and bad calibration of printed circuit boards.
  16. 제11항에 있어서,The method of claim 11,
    상기 인쇄 회로 기판 상의 부품을 제거하거나, 부품의 방향을 조정하거나, 또는 상기 인쇄 회로 기판 상에 부품을 배치하는 단계는, 상기 부품교정부가, 상기 제어 신호에 따라, 상기 인쇄 회로 기판 상에서 상기 불량과 연관된 부품이 분리된 위치에 상기 불량과 연관된 부품을 재배치하거나 또는 신규 부품을 배치하는 단계를 포함하는,Removing a component on the printed circuit board, adjusting a direction of the component, or arranging the component on the printed circuit board may include the component realignment on the printed circuit board according to the control signal. Relocating the part associated with the defect or placing a new part at a location where an associated part is separated;
    인쇄 회로 기판의 검사 및 불량 교정 방법.Method of inspection and bad calibration of printed circuit boards.
  17. 제11항에 있어서,The method of claim 11,
    상기 인쇄 회로 기판 상의 부품을 제거하거나, 부품의 방향을 조정하거나, 또는 상기 인쇄 회로 기판 상에 부품을 배치하는 단계는, 상기 불량의 유형이 부품 틀어짐 또는 부품 위치 불량인 경우, 상기 부품교정부가, 상기 제어 신호에 따라, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시켜 상기 인쇄 회로 기판으로부터 분리한 후, 상기 불량과 연관된 부품이 분리된 위치에 상기 부품을 재배치하거나, 상기 불량과 연관된 부품을 고정, 흡착 또는 접착시킨 후 배치 방향을 변경하는 단계를 포함하는,Removing the component on the printed circuit board, orienting the component, or arranging the component on the printed circuit board may include: when the type of the defect is component misalignment or component position defect, According to the control signal, after fixing the component associated with the defect, by adsorbing or adhering to remove it from the printed circuit board, repositioning the component in a position where the component associated with the defect is separated, or fixing the component associated with the defect Changing the placement direction after adsorption or adhesion,
    인쇄 회로 기판의 검사 및 불량 교정 방법.Method of inspection and bad calibration of printed circuit boards.
  18. 제11항 내지 제17항 중 어느 하나에 따르는 인쇄 회로 기판의 검사 및 불량 교정 방법의 각 단계를 수행하는 명령어들을 포함하는 컴퓨터 판독 가능 저장 매체.A computer readable storage medium comprising instructions for performing each step of a method for inspecting and calibrating a printed circuit board according to any one of claims 11 to 17.
PCT/KR2017/008450 2016-08-04 2017-08-04 Device for inspecting and correcting defects of printed circuit board and method therefor WO2018026237A1 (en)

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TWI819395B (en) * 2020-12-03 2023-10-21 日商Ckd股份有限公司 Substrate foreign matter inspection device and substrate foreign matter inspection method

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