WO2017212687A1 - Système d'imagerie par déphasage de rayons x, appareil d'imagerie par déphasage de rayons x et procédé d'imagerie par déphasage de rayons x - Google Patents

Système d'imagerie par déphasage de rayons x, appareil d'imagerie par déphasage de rayons x et procédé d'imagerie par déphasage de rayons x Download PDF

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WO2017212687A1
WO2017212687A1 PCT/JP2017/005818 JP2017005818W WO2017212687A1 WO 2017212687 A1 WO2017212687 A1 WO 2017212687A1 JP 2017005818 W JP2017005818 W JP 2017005818W WO 2017212687 A1 WO2017212687 A1 WO 2017212687A1
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Prior art keywords
detection unit
image
grating
ray
diffraction grating
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PCT/JP2017/005818
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English (en)
Japanese (ja)
Inventor
太郎 白井
晃一 田邊
木村　健士
吉牟田　利典
拓朗 和泉
貴弘 土岐
哲 佐野
日明 堀場
弘之 岸原
和田　幸久
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株式会社島津製作所
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Priority to JP2018522311A priority Critical patent/JP6631707B2/ja
Publication of WO2017212687A1 publication Critical patent/WO2017212687A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Definitions

  • the present invention relates to an X-ray phase difference imaging system, an X-ray phase difference imaging apparatus, and an X-ray phase difference imaging method.
  • JP 2012-016370 A discloses an X-ray imaging apparatus (X-ray phase difference imaging system) that images the inside of a subject using the phase difference of the X-rays that have passed through the subject.
  • This X-ray imaging device uses X-ray phase difference instead of X-ray absorption to image the inside of the subject, thereby imaging light element objects and soft tissue that are difficult to absorb X-rays. It is configured to be able to.
  • the X-ray imaging apparatus disclosed in JP 2012-016370 A includes an X-ray source that emits radial X-rays, a grating through which X-rays emitted from the X-ray source pass, and X-rays that pass through the grating. An image detector for detection.
  • the present invention has been made to solve the above-described problems, and one object of the present invention is to correct the sensitivity of the detection unit while suppressing an increase in size and complexity of the apparatus.
  • An X-ray phase difference imaging system, an X-ray phase difference imaging apparatus, and an X-ray phase difference imaging method are provided.
  • an X-ray phase difference imaging system includes an X-ray source, a diffraction grating through which X-rays emitted from the X-ray source pass, and a diffraction grating.
  • a detection unit that detects the detected X-rays and a control unit that corrects the sensitivity of the detection unit.
  • the control unit is configured so that the subject is not positioned between the X-ray source and the detection unit, and the diffraction grating and the detection unit. At least one of them is moved, a correction image using X-rays that has passed through the diffraction grating is captured, and sensitivity correction information is acquired based on the correction image.
  • At least one of the diffraction grating and the detection unit is placed in a state where the subject is not positioned between the X-ray source and the detection unit.
  • a control unit is provided that captures an image for correction using X-rays that have been moved and passed through the diffraction grating, and acquires sensitivity correction information based on the image for correction.
  • the sensitivity of the detection unit can be corrected.
  • it is not necessary to move the diffraction grating to a position where X-rays do not pass through it is possible to suppress an increase in the size of the device and to prevent the device configuration from becoming complicated.
  • the control unit corrects an X-ray image obtained by imaging the subject located between the X-ray source and the detection unit using sensitivity correction information.
  • the phase contrast image is generated based on the self image or the moire fringes. If comprised in this way, since a self-image or a moire fringe can be detected accurately by the sensitivity correction of a detection part, a phase-contrast image can be produced
  • the control unit is at least one of the diffraction grating and the detection unit based on a fringe interval formed by the diffraction grating and detected by the detection unit.
  • the movement direction is set to a direction in which the stripes move in a direction parallel to the direction in which the stripes are arranged, and a correction image is captured by X-rays that have passed through the diffraction grating. If comprised in this way, since the image for a correction
  • the control unit moves at least one of the diffraction grating and the detection unit at a substantially constant speed at which the fringes detected by the detection unit move by substantially an integer multiple of the fringe interval during the imaging time.
  • the correction image is captured by the X-rays that have passed through the diffraction grating.
  • the control unit In the configuration in which the control unit is formed of a diffraction grating and moves the at least one of the diffraction grating and the detection unit based on the fringe interval detected by the detection unit, and preferably the control unit captures the correction image.
  • M correction images are taken, and the m correction images taken are averaged to obtain sensitivity correction information.
  • the m correction images stripes can be evenly reflected on each pixel. Therefore, by averaging the m correction images, the X-rays irradiated to the detection unit Can be more easily smoothed between pixels.
  • the diffraction grating includes a first grating for forming a self-image, a source grating for increasing coherence of X-rays emitted from the X-ray source, and And at least one of the second gratings irradiated with the X-rays that have passed through the first grating.
  • a self-image can be formed on a detection part or a 2nd grating
  • a moire fringe can be formed on a detection part.
  • a source grating is provided, X-rays can be easily diffracted in the first grating.
  • the control unit has a diffraction grating in a state in which the subject is not disposed between the X-ray source and the detection unit under the same conditions as when imaging the subject.
  • the detection unit is fixed and the air image is captured, and the air image is corrected using the sensitivity correction information, and the phase is determined based on the air image whose sensitivity is corrected and the image of the subject whose sensitivity is corrected. It is configured to generate a contrast image.
  • the X-ray image having the influence of the positional deviation of the diffraction grating can be corrected using the air image, so that a phase contrast image can be generated with high accuracy.
  • An X-ray phase difference imaging apparatus includes an X-ray source, a diffraction grating through which X-rays emitted from the X-ray source pass, and a detection unit that detects X-rays that have passed through the diffraction grating. And a control unit that corrects the sensitivity of the detection unit, and the control unit moves at least one of the diffraction grating and the detection unit in a state where the subject is not positioned between the X-ray source and the detection unit.
  • At least one of the diffraction grating and the detection unit is provided with the subject not positioned between the X-ray source and the detection unit.
  • a control unit is provided that captures an image for correction using X-rays that have been moved and passed through the diffraction grating, and acquires sensitivity correction information based on the image for correction.
  • the sensitivity of the detection unit can be corrected.
  • it is not necessary to move the diffraction grating to a position where X-rays do not pass through it is possible to suppress an increase in the size of the device and to prevent the device configuration from becoming complicated.
  • An X-ray phase difference imaging method is an X-ray phase difference imaging method in which X-rays irradiated from an X-ray source are passed through a diffraction grating, and the X-rays that have passed through the diffraction grating are detected by a detector.
  • the method in a state where the subject is not positioned between the X-ray source and the detection unit, at least one of the diffraction grating and the detection unit is moved, and an image for correction using X-rays that has passed through the diffraction grating is captured. Then, sensitivity correction information is acquired based on the correction image.
  • the diffraction grating and the detection unit is used in a state where the subject is not positioned between the X-ray source and the detection unit.
  • the image for correction is picked up, and the sensitivity correction information is acquired based on the correction image by the X-rays that have passed through the diffraction grating.
  • an X-ray phase difference imaging method capable of correcting the sensitivity of the detection unit.
  • an image from which noise components due to sensitivity variations have been removed since there is no need to move the diffraction grating to a position where X-rays do not pass therethrough, an X-ray phase difference imaging method capable of suppressing an increase in the size of the device and a complication of the device configuration is provided. can do.
  • FIG. 1 is a diagram illustrating an overall configuration of an X-ray phase difference imaging system according to a first embodiment of the present invention. It is the figure which showed the X-ray source of the X-ray phase difference imaging system of 1st Embodiment of this invention, a source grating
  • the X-ray phase difference imaging system 100 is an apparatus that images the inside of the subject T using the phase difference of the X-rays that have passed through the subject T as shown in FIG.
  • the X-ray phase difference imaging system 100 is an apparatus that images the inside of the subject T using the Talbot effect.
  • the X-ray phase difference imaging system 100 can be used, for example, for imaging inside the subject T as a living body in medical applications.
  • the X-ray phase difference imaging system 100 can be used for imaging the inside of the subject T as an object, for example, in a nondestructive inspection application.
  • the X-ray phase difference imaging system 100 includes an X-ray imaging apparatus 10 and a control unit 20 as shown in FIG.
  • the X-ray imaging apparatus 10 includes an X-ray source 1, a source grid 2, a first grid 3, a second grid 4, a detection unit 5, and a drive unit 6. It has.
  • an X-ray source 1, a source grating 2, a first grating 3, a second grating 4, and a detection unit 5 are used, and a Talbot-Lau interferometer is used. X-ray imaging is performed.
  • the X-ray source 1, the source grid 2, the first grid 3, the second grid 4, and the detection unit 5 are arranged in this order in the X-ray irradiation axis direction (Z direction).
  • the X-ray irradiation axis direction is the Z direction
  • the directions orthogonal to each other in the plane orthogonal to the Z direction are the X direction and the Y direction, respectively.
  • the source grating 2, the first grating 3, and the second grating 4 are examples of the “diffraction grating” in the claims.
  • the X-ray source 1 is configured to generate X-rays and irradiate the generated X-rays when a high voltage is applied.
  • the source grating 2 is a diffraction grating (absorption grating, so-called multi-slit) that changes the intensity of the passing X-ray.
  • the source grid 2 has a plurality of slits 2a arranged at a predetermined period (pitch) in the Y direction orthogonal to the Z direction. Each slit 2a is formed to extend in the X direction orthogonal to the Z direction.
  • the source grid 2 is disposed between the X-ray source 1 and the first grid 3 and is irradiated with X-rays from the X-ray source 1.
  • the source grating 2 is provided in order to enhance the coherence of X-rays emitted from the X-ray source 1 by the Lau effect.
  • the radiation source grid 2 is configured so that the X-rays that have passed through each slit 2a function as a line light source corresponding to the position of each slit 2a. Thereby, it is possible to improve the coherence of the X-rays that have passed through the source grating 2.
  • the first grating 3 is a diffraction grating (phase grating) that changes the phase of X-rays passing therethrough.
  • the first lattice 3 has a plurality of slits 3a arranged with a period (pitch) d1 in the Y direction orthogonal to the Z direction. Each slit 3a is formed to extend in the X direction orthogonal to the Z direction.
  • the first grid 3 is disposed between the source grid 2 and the second grid 4 and is irradiated with X-rays that have passed through the source grid 2.
  • the first grating 3 is arranged at a position away from the radiation source grating 2 by a distance R1 in the Z direction.
  • the first grating 3 is provided for forming a self-image by the Talbot effect.
  • an image of the grating (self-image) is formed at a position away from the grating by a predetermined distance (Talbot distance Zp). This is called the Talbot effect.
  • the self-image is an interference fringe generated by X-ray interference.
  • the self-image of the first grating 3 due to the Talbot effect can be more reliably formed by providing the source grating 2 and enhancing the coherence of X-rays.
  • the first lattice 3 is configured to be rotatable about a rotation axis in the Z direction. Thereby, as shown in FIG. 3, the 1st grating
  • the first lattice 3 is configured to be capable of adjusting the position in the rotational direction around the Z direction at an angular interval of not less than 0.001 degrees and not more than 1 degree, for example.
  • the second grating 4 is a diffraction grating (absorption grating) that changes the intensity of the passing X-ray.
  • the second grating 4 has a plurality of slits 4a arranged with a period (pitch) d2 in the Y direction orthogonal to the Z direction. Each slit 4a is formed to extend in the X direction orthogonal to the Z direction.
  • the second grating 4 is arranged between the first grating 3 and the detection unit 5 and is irradiated with X-rays that have passed through the first grating 3.
  • lattice 4 is provided in order to interfere with the self image of the 1st grating
  • the period d2 of the slit 4a of the second grating 4 is designed to be substantially the same as the period d3 of the self-image of the first grating 3.
  • the subject T is disposed between the source grid 2 and the first grid 3 when the subject T is imaged.
  • the first grating 3 is irradiated with X-rays that have passed through the subject T.
  • the detection unit 5 is configured to detect X-rays and convert the detected X-rays into electric signals (detection signals).
  • the detection unit 5 is configured to output a detection signal to the control unit 20.
  • the detection unit 5 includes, for example, an FPD (Flat Panel Detector).
  • the detection unit 5 includes a plurality of pixel detection elements (not shown). The plurality of detection elements are arranged side by side in the X direction and the Y direction at a predetermined period (pitch).
  • a CdTe semiconductor detector is used as the detection element in order to increase detection efficiency and achieve high resolution.
  • a scintillator such as CsI may be used as the detection element.
  • the period of the detection element is larger than the period d3 of the self-image of the first grating 3, for example. In this case, it is difficult to directly detect the self-image of the first grating 3 by the detection unit 5. Therefore, in the X-ray phase difference imaging system 100, the second grating 4 for forming a moire fringe (see FIG. 3) by interfering with the self-image of the first grating 3 is provided. Moire fringes due to superposition with the second grating 4 are detected by the detection unit 5.
  • the self-image of the first grating 3 and the second grating 4 are overlapped. If it is a moire fringe by matching, it can be detected by the detector 5.
  • the driving unit 6 is configured to move the second grating 4 in the XY plane. Specifically, the drive unit 6 moves the second grating 4 by drive control by the control unit 20. The drive unit 6 is configured to move the second grating 4 along the slit arrangement direction of the second grating 4 (Y direction in FIG. 2). Since the moving distance can be increased by moving the second grating 4 farther from the X-ray source 1 than the first grating 3, it is not necessary to excessively increase the accuracy of movement.
  • the control unit 20 includes a CPU (Central Processing Unit).
  • the control unit 20 includes, for example, a computer.
  • the control unit 20 is connected to the X-ray imaging apparatus 10.
  • the control unit 20 is configured to generate a phase contrast image and an absorption contrast image based on the X-rays detected by the detection unit 5.
  • the control unit 20 is configured to perform control for correcting the sensitivity of the detection unit 5. Specifically, the control unit 20 moves the second grating 4 in a state where the subject T is not located between the X-ray source 1 and the detection unit 5, and moves the first grating 3 and the second grating 4. An image for correction using the passed X-ray is captured, and sensitivity correction information is acquired based on the image for correction.
  • the control unit 20 is configured to generate an X-ray image by correcting the amount of X-rays detected by the detection unit 5 based on the sensitivity correction information. For example, the control unit 20 is configured to perform correction by multiplying or dividing the amount of X-rays in each pixel detected by imaging using sensitivity correction information including sensitivity variations.
  • the control unit 20 is configured to generate an absorption contrast image and a phase contrast image by performing Fourier transform based on the corrected X-ray image.
  • the sensitivity correction information includes the sensitivity of X-ray detection in each pixel of the detection unit 5.
  • control unit 20 corrects an X-ray image obtained by imaging the subject T positioned between the X-ray source 1 and the detection unit 5 using the sensitivity correction information, and based on the moire fringes, the phase contrast image Is configured to generate Further, the control unit 20 changes the second grating 4 to the slit arrangement direction of the second grating 4 based on the stripe interval formed by the first grating 3 and the second grating 4 and detected by the detecting unit 5 (FIG. 2). The image for correction by the X-rays that have passed through the first grating 3 and the second grating 4 is taken.
  • control unit 20 moves the second grating 4 at a substantially constant speed at which the fringes detected by the detecting unit 5 move by an approximately integer multiple of the fringe interval during the imaging time, and the first grating 3 and the second grating 4 are configured to capture a correction image using X-rays.
  • the control unit 20 moves the second grating 4 at a constant speed so that the stripe detected by the detection unit 5 moves by one period during the time T1. Move with. As a result, each pixel of the detection unit 5 is imaged so that one period of stripes is captured, so that an image equivalent to the case where the detection unit 5 is irradiated with uniform X-rays can be captured. . Further, the second grating 4 may be moved at a constant speed so that the fringes detected by the detection unit 5 move by N periods (N is a natural number) during the imaging time T1.
  • the second grating 4 is moved at a constant speed so that the fringes detected by the detection unit 5 move during the imaging time T1 by N + ⁇ periods (N is a natural number, ⁇ is a fraction between 0 and 1). Also good. In this case, by increasing N, stripes are uniformly reflected in each pixel of the detection unit 5 due to the smoothing effect.
  • the second grating 4 may be moved in one direction or reciprocated.
  • the control unit 20 moves the second lattice 4 so that the stripes detected by the detection unit 5 move by 1 / m (m is a natural number) of the interval between the stripes, It is configured to capture m correction images by X-rays that have passed through the first grid 3 and the second grid 4, and to average the m captured correction images to obtain sensitivity correction information. Yes.
  • the control unit 20 moves the second lattice 4 so as to move the stripe by D / m, and images m correction images. That is, the control unit 20 repeats the control of moving the second grid 4 and performing imaging m times.
  • the second grating 4 may be moved so that the stripes move by m1 / m2 (m1 and m2 are prime natural numbers) of the stripe interval. In this case, m2 correction images are captured.
  • control unit 20 fixes the second grating 4 and the detection unit 5 in a state where the subject T is not disposed between the X-ray source 1 and the detection unit 5 under the same conditions as when imaging the subject T.
  • An air image is captured, and the air image is corrected using the sensitivity correction information, and a phase contrast image is generated based on the air image whose sensitivity is corrected and the image of the subject T whose sensitivity is corrected. It is configured.
  • the imaging process (first operation example) by the X-ray phase difference imaging system 100 of the first embodiment will be described. This imaging process is performed by the control unit 20.
  • step S1 in FIG. 5 the diffraction grating (second grating 4) is moved in a state where the subject T is not positioned between the X-ray source 1 and the detection unit 5, and a correction image is captured.
  • step S2 sensitivity correction information is created based on the correction image.
  • step S3 an X-ray image is taken with the subject T positioned between the X-ray source 1 and the detection unit 5.
  • step S4 the X-ray image obtained by imaging the subject T is corrected using the sensitivity correction image. This eliminates noise due to sensitivity variations.
  • step S5 the X-ray image of the subject T whose sensitivity has been corrected is Fourier transformed to generate an absorption contrast image and a phase contrast image. Thereafter, the imaging process is terminated.
  • the imaging process (second operation example) by the X-ray phase difference imaging system 100 of the first embodiment will be described with reference to FIG. This imaging process is performed by the control unit 20.
  • step S11 in FIG. 6 the diffraction grating (second grating 4) is moved in a state where the subject T is not positioned between the X-ray source 1 and the detection unit 5, and a correction image is captured.
  • step S12 sensitivity correction information is created based on the correction image.
  • step S13 an air image is captured in a state where the subject T is not positioned between the X-ray source 1 and the detection unit 5 and the diffraction grating (second grating 4) is fixed.
  • step S14 the air image is corrected using the sensitivity correction image. Thereby, noise in the air image due to variation in sensitivity is removed.
  • step S15 an X-ray image is taken with the subject T positioned between the X-ray source 1 and the detection unit 5.
  • step S16 the X-ray image obtained by imaging the subject T is corrected using the sensitivity correction image. As a result, noise in the image of the subject T due to sensitivity variations is removed.
  • step S17 the X-ray image and air image of the subject T whose sensitivity has been corrected are Fourier transformed to generate an absorption contrast image and a phase contrast image. Thereafter, the imaging process is terminated.
  • the second grating 4 is moved to capture a correction image, and the first A control unit 20 is provided that acquires sensitivity correction information based on a correction image using X-rays that has passed through the grating 3 and the second grating 4.
  • the first A control unit 20 acquires sensitivity correction information based on a correction image using X-rays that has passed through the grating 3 and the second grating 4.
  • the sensitivity of the detection unit 5 can be corrected. As a result, it is possible to obtain an image from which noise components due to sensitivity variations have been removed.
  • the apparatus since it is not necessary to move the source grating 2, the first grating 3, and the second grating 4 to a position where X-rays do not pass through, the apparatus is prevented from being enlarged and the apparatus configuration from being complicated. be able to.
  • the control unit 20 corrects an X-ray image obtained by imaging the subject T between the X-ray source 1 and the detection unit 5 using the sensitivity correction information. Then, the phase contrast image is generated based on the moire fringes. Thereby, since the moire fringes can be detected with high accuracy by the sensitivity correction of the detection unit 5, the phase contrast image can be generated with high accuracy.
  • the control unit 20 controls the second grating 4 based on the interval between the stripes formed by the first grating 3 and the second grating 4 and detected by the detection unit 5.
  • the second grating 4 is moved in the slit arrangement direction (Y direction in FIG. 2), and a correction image is captured by X-rays that have passed through the first grating 3 and the second grating 4.
  • a correction image is captured by X-rays that have passed through the first grating 3 and the second grating 4.
  • the control unit 20 causes the second grating 4 to move at a substantially constant speed at which the fringes detected by the detecting unit 5 move by substantially an integer multiple of the fringe interval during the imaging time.
  • the correction image is captured by the X-rays that have passed through the first grating 3 and the second grating 4.
  • stripes can be evenly reflected on each pixel, so that the amount of X-rays applied to the detection unit 5 can be more easily smoothed between pixels. it can.
  • the control unit 20 controls the second grating 4 so that the stripes detected by the detection unit 5 move by 1 / m (m is a natural number) of the stripe interval. It is moved so that m correction images are captured by X-rays that have passed through the first grating 3 and the second grating 4, and the m correction images thus taken are averaged to obtain sensitivity correction information. Configure. As a result, in the m correction images, stripes can be evenly reflected on each pixel. Therefore, by averaging the m correction images, the amount of X-rays irradiated to the detection unit 5 can be reduced. Smoothing between pixels can be performed more easily.
  • the diffraction grating includes the first grating 3 for forming a self-image, the source grating 2 for increasing the coherence of X-rays emitted from the X-ray source 1, and And the second grating 4 irradiated with the X-rays that have passed through the first grating 3.
  • a self-image can be formed on the second grating 4 by the first grating 3.
  • moire fringes can be formed on the detection unit 5 by the second grating 4.
  • the X-ray can be easily diffracted by the first grating 3 and the second grating 4 by the source grating 2.
  • the control unit 20 operates in the state where the subject T is not disposed between the X-ray source 1 and the detection unit 5 under the same conditions as when imaging the subject T.
  • An air image is captured with the two grids 4 and the detection unit 5 fixed, the air image is corrected using sensitivity correction information, and the sensitivity corrected air image and the sensitivity corrected subject T image Is configured to generate a phase contrast image.
  • the phase contrast image can be generated with high accuracy.
  • the X-ray phase difference imaging apparatus 200 includes an X-ray source 1, a source grid 2, a first grid 3, a detection unit 5, and a drive unit 6. And a control unit 20. That is, in the second embodiment, the control unit 20 is provided in the X-ray phase difference imaging apparatus 200 including the X-ray source 1 and the detection unit 5.
  • the source grating 2 and the first grating 3 are examples of the “diffraction grating” in the claims.
  • the drive unit 6 is configured to move the first grating 3 in the XY plane. Specifically, the drive unit 6 moves the first lattice 3 by drive control by the control unit 20. The drive unit 6 is configured to move the first grating 3 along the slit arrangement direction of the first grating 3 (Y direction in FIG. 7).
  • control unit 20 is configured to perform control for correcting the sensitivity of the detection unit 5. Specifically, the control unit 20 moves the first lattice 3 in a state where the subject T is not positioned between the X-ray source 1 and the detection unit 5, and uses the X-rays that have passed through the first lattice 3. A correction image is captured, and sensitivity correction information is acquired based on the correction image.
  • control unit 20 corrects an X-ray image obtained by imaging the subject T positioned between the X-ray source 1 and the detection unit 5 using the sensitivity correction information, and based on the self-image, the phase contrast image Is configured to generate
  • the X-ray that has passed the first grating 3 by moving the first grating 3 while the subject T is not positioned between the X-ray source 1 and the detection unit 5.
  • a control unit 20 is provided that captures a correction image according to the above and acquires sensitivity correction information based on the correction image. Thereby, the sensitivity of the detection unit 5 can be corrected while suppressing the apparatus from becoming large and complicated.
  • the second grid is moved when the correction image is captured
  • the first grid is moved when the correction image is captured.
  • the present invention is not limited to this.
  • the present invention is not limited to this.
  • the subject may be arranged closer to the detection unit than the first lattice.
  • an X-ray phase difference imaging system (X-ray phase difference imaging apparatus) is provided with a source grating for enhancing the coherence of X-rays.
  • the present invention is not limited to this.
  • the X-ray phase difference imaging system (X-ray phase difference imaging apparatus) does not have to be provided with a source grating for enhancing the coherence of X-rays.
  • the source grating need not be provided.
  • the diffraction grating is formed in a stripe shape extending in one direction.
  • the present invention is not limited to this.
  • the diffraction grating may be formed in a two-dimensional shape extending in two or more directions.
  • phase contrast image and an absorption contrast image may be generated from an X-ray image by a method other than Fourier transform.
  • a phase contrast image and an absorption contrast image may be generated from an X-ray image by a spatial fringe scanning method.
  • the processing of the control unit has been described using a flow-driven flow that performs processing in order along the processing flow.
  • the present invention is not limited to this. Absent.
  • the processing of the control unit may be performed by event-driven (event-driven) processing that executes processing in units of events. In this case, it may be performed by a complete event drive type or a combination of event drive and flow drive.

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  • Apparatus For Radiation Diagnosis (AREA)

Abstract

La présente invention concerne un système d'imagerie par déphasage de rayons X (100) qui est conçu en étant pourvu d'une unité de commande (20) qui corrige la sensibilité d'une unité de détection (5), déplace un second réseau (4) dans un état où un objet (T) n'est pas positionné entre une source de rayons X (1) et l'unité de détection (5), capture une image de correction sur la base de rayons X traversant un premier réseau (3) et le second réseau (4), et acquiert des informations de correction de sensibilité sur la base de l'image de correction.
PCT/JP2017/005818 2016-06-10 2017-02-17 Système d'imagerie par déphasage de rayons x, appareil d'imagerie par déphasage de rayons x et procédé d'imagerie par déphasage de rayons x WO2017212687A1 (fr)

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WO2020039655A1 (fr) * 2018-08-22 2020-02-27 株式会社島津製作所 Dispositif d'imagerie en phase à rayons x
JPWO2020188856A1 (ja) * 2019-03-19 2021-10-14 株式会社島津製作所 Ｘ線イメージング装置

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JP2012090944A (ja) * 2010-03-30 2012-05-17 Fujifilm Corp 放射線撮影システム及び放射線撮影方法
WO2012147671A1 (fr) * 2011-04-25 2012-11-01 富士フイルム株式会社 Dispositif de radiographie et procédé de traitement de l'image

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JP4118535B2 (ja) * 2001-07-03 2008-07-16 株式会社日立メディコ Ｘ線検査装置
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JP2014140632A (ja) * 2012-12-27 2014-08-07 Canon Inc 演算装置、画像取得方法、プログラム、及びｘ線撮像システム

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JP2011206490A (ja) * 2010-03-30 2011-10-20 Fujifilm Corp 放射線撮影システム及び放射線撮影方法
JP2012090944A (ja) * 2010-03-30 2012-05-17 Fujifilm Corp 放射線撮影システム及び放射線撮影方法
WO2012147671A1 (fr) * 2011-04-25 2012-11-01 富士フイルム株式会社 Dispositif de radiographie et procédé de traitement de l'image

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020039655A1 (fr) * 2018-08-22 2020-02-27 株式会社島津製作所 Dispositif d'imagerie en phase à rayons x
JPWO2020039655A1 (ja) * 2018-08-22 2021-08-10 株式会社島津製作所 Ｘ線位相イメージング装置
JP7111166B2 (ja) 2018-08-22 2022-08-02 株式会社島津製作所 Ｘ線位相イメージング装置
JPWO2020188856A1 (ja) * 2019-03-19 2021-10-14 株式会社島津製作所 Ｘ線イメージング装置

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