WO2017115015A1 - Procédé et agencement permettant d'analyser une propriété d'un joint - Google Patents

Procédé et agencement permettant d'analyser une propriété d'un joint Download PDF

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Publication number
WO2017115015A1
WO2017115015A1 PCT/FI2016/050935 FI2016050935W WO2017115015A1 WO 2017115015 A1 WO2017115015 A1 WO 2017115015A1 FI 2016050935 W FI2016050935 W FI 2016050935W WO 2017115015 A1 WO2017115015 A1 WO 2017115015A1
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WIPO (PCT)
Prior art keywords
seam
arrangement
weld seam
parameters
wavelengths
Prior art date
Application number
PCT/FI2016/050935
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English (en)
Inventor
Perttu SIPILÄ
Kai Niiranen
Original Assignee
Optiweld Oy
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Filing date
Publication date
Application filed by Optiweld Oy filed Critical Optiweld Oy
Publication of WO2017115015A1 publication Critical patent/WO2017115015A1/fr

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K9/00—Arc welding or cutting
    • B23K9/095—Monitoring or automatic control of welding parameters
    • B23K9/0956—Monitoring or automatic control of welding parameters using sensing means, e.g. optical
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/20—Bonding
    • B23K26/21—Bonding by welding
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
    • B23K31/02—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to soldering or welding
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
    • B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
    • B23K31/125—Weld quality monitoring
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K9/00—Arc welding or cutting
    • B23K9/12—Automatic feeding or moving of electrodes or work for spot or seam welding or cutting
    • B23K9/127—Means for tracking lines during arc welding or cutting
    • B23K9/1272—Geometry oriented, e.g. beam optical trading
    • B23K9/1274—Using non-contact, optical means, e.g. laser means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2509—Color coding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/178—Methods for obtaining spatial resolution of the property being measured
    • G01N2021/1782—In-depth resolution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid

Definitions

  • the invention relates to a method and arrangement for analysing a property of a seam, and in particularly a weld seam.
  • the analysing of a property relates for example to a seam or weld seam quality, cross-sectional profile, toughness, long-term sustainability or fatigue strength or opening angles, curvature, depth, full penetration, seam width, humping, or a degree of asymmetry during welding.
  • Number of methods and techniques are known to analyse properties of a seam and weld seam, such as visually estimating or scanning or imaging by laser or X-ray or other radiating devices.
  • the laser scanner devices are typically based on triangulation measurement, where the weld seam is scanned over with a predefined frequency so that the measurement can be determined for later use.
  • a CMOS camera imaging is used for determining of the weld seam dimensions and shapes. It is also known to use cameras to take images or video-radiographic images of the cross section of the weld joint, for example, and to compare its parameters to a predetermined shape of desired weld in order to provide estimation about the quality.
  • An object of the invention is to alleviate and eliminate the problems relating to the known prior art.
  • Especially the object of the invention is to provide a system for analysing properties of a seam and especially weld seam in a reliable way enough and to get so accurate surface profile of the weld seam that all of the important surface shapes related to the weld seam that makes possible to predict its long-term sustainability or fatigue strength from the profile parameters can be achieved.
  • the invention relates to an arrangement for analysing a property of a seam according to claim 1.
  • the invention relates to a method for analysing a property of a seam according to claim 17, as well as to computer program product according to claim 18.
  • at least one property of a seam and especially weld seam is analysed by providing a spectre of electromagnetic radiation band to an object representing the weld seam so that different wavelengths of said radiation are focused to different depths in a direction of a normal of the object.
  • the object representing the weld seam is either the weld seam to be determined as such or alternatively a casting mould representing the weld seam, such as a silicone casting mould.
  • the electromagnetic radiation band is advantageously continuous spectre and comprises ultraviolet spectral range, visible spectral range and/or infrared spectral range.
  • the wavelength travelled the shortest path is construed to represent the wavelength focused on and reflected from the depth of the surface of the object at a certain location to be determined. This is because no reliable wavelength can be reflected in the area between a device outputting said spectre of electromagnetic radiation band and the object (thus travelling more shorter path), and in other hand the wavelength travelled the longer path will represent wavelength either reflected behind or beyond the surface of the seam or having multiple reflections and being thus non-reliable.
  • the shortest or longest wavelength of said selected wavelengths determines the depth (or Z-coordinate) of the surface of the object at a certain point.
  • the length (or at least relative length) of the path of each wavelength can be deduced based on the wavelength, i.e. the colour of the wavelength, since the shortest and longest wavelengths of the radiation are focused to different depths so that the wavelength between the shortest and longest wavelengths is focused essentially to a depth of a median surface level of the object.
  • the spectre lines of the electromagnetic radiation band can be emitted so that a planar beam cone is provided of the wavelength and again to extend over the weld seam (or object) and further on at least two bodies (typically sheet or plates) to be welded by said weld seam.
  • a planar beam cone By providing a planar beam cone a cross-sectional profile can be better determined by one shot.
  • the planar beam cone is spread wider, a mutual disposition or placing, bending or alignment, such as linear or angular misalignment of the bodies to be welded can be determined based on the received wavelengths of the cone reflected from the bodies.
  • the electromagnetic radiation so typically at least partially visible light from the radiation source (advantageously not a point-like source, but with a circular emission), is divided to different wavelengths (colours), where each colour is focused to a certain own depth.
  • Each colour is additionally spread and "extended” to a planar or line beam.
  • each colours are reflected, at least in principle, in a certain (own) direction (independently of each other wavelength), especially in the question of weld seam.
  • the focused wavelength will be reflected at maximum intensity from a certain focus spot (on the surface of the object or weld seam) and non-focused will be reflected area located somewhere else that said object or weld seam of interest.
  • the receiving unit or detector is advantageously arranged (focused) to receive reflections reflected essentially and optimally from the profile cross-section. Because the non- focused wavelengths will be reflected from the area locating outside the area of the object or the weld seam, they will be reflected and passed by the side of the detector and additionally with smaller intensity than the beams focused on and reflected from the object or the weld seam. Again it might be that numbers of wavelengths focused outside the object or the weld seam (in addition to the desired wavelength focused on the object or the weld seam) may be received by the detector, whereupon the wavelength with the shortest path (top reflected) is selected.
  • a cross-sectional profile, comprising also joint or groove or notch areas, of the weld seam can be determined based on the determined depths. It is to be noted that when the spectre of electromagnetic radiation band (so the arrangement) and the object are moved in relation to each other, multiple images can be captured in real-time during moving and the longitudinal or overall profile or other properties along the length of the seam can be determined.
  • different exposure times can be used in order to achieve information from the points of the surface having e.g. different inclination angle in relation to the emitted spectre, namely with a first short exposure time a surface profile having front surface essentially perpendicular to the radiation beam will be exposed enough but the surface having inclined surface profile will be underexposed, and again with a second long exposure time the surface having inclined surface profile in relation to the radiation beam will be exposed enough but the surface profile having front surface essentially perpendicular will be overexposed.
  • the different exposure times can also be used for surface points having different degrees of gloss in order to achieve satisfying information. For example shorter exposure time is advantageously used for the glossier surface point in order to avoid overexposure and the longer for a matt surface point.
  • the reflected electromagnetic radiation can be received by number of diodes (or other receiving components, such as pixel in CCD or CMOS device), whereupon the first set of the diodes is used for receiving the reflected electromagnetic radiation for first time set (t- ⁇ ) and the second set of the diodes is used for receiving the reflected electromagnetic radiation for second time set (t 2 ), which is longer than said first time set (t- ⁇ ).
  • diodes or other receiving components, such as pixel in CCD or CMOS device
  • the shorter exposure time is advantageous for a surface essentially perpendicular to the radiation beam and the longer exposure time for a surface having steeper angle in relation to the radiation beam as well as shorter exposure time for the glossier surface and longer exposure time for the more matt surface.
  • different exposure times can be used. Different techniques can naturally be used for implementing different exposure times, such as reading different columns and/or rows of the detector (e.g. CCD or CMOS device) one-by-one or in a certain order or in a certain combination or at once. Additionally the different exposure times can also be mimicked by suitable software. The software can also be used for controlling the reading the detector or different columns and/or rows. Also a dedicated detector with suitable controlling capacity can be used.
  • the different exposure times can also be implemented so to determine the degree of exposure in different pixels (or group of pixels) and whether any overexposure is determined in a certain pixels (or group of pixels), a data reading or gathering from a certain group of pixels, such as a certain row or column, is stopped in order to avoid overexposure of the whole group of pixels.
  • This can be naturally achieved either by a hardware and controlling devices managing the reading of the pixels and/or by a software used for controlling the reading operation.
  • the arrangement may also determine the steepness of the surfaces to be determined and thereby also configured to adjust and control different exposure times.
  • the arrangement can apply and control (so change) the exposure time even for each single pixel based e.g. on the responses detected or received from the detector or receiving component in relation to the exposure, so whether the pixel tends to be overexposured or underexposured.
  • the properties can be determined by comparing measured parameter, such as geometric parameter, like a cross-section profile, to a predetermined corresponding parameter or to respective reference value or respective tolerance interval of a reference weld seam, such as to a cross-section profile the reference weld seam.
  • measured parameters are compared to a predetermined statistical distribution, which represent the corresponding parameters.
  • controlling information is generated to a weld seam manipulating device based on the measured parameters, in order to control the weld seam manipulating device to produce the weld seam so that the quality parameters correspond and match with a certain tolerance to the predetermined reference weld seam parameters.
  • the controlling information can also be used for indicating the determined quality parameters to the user, such as especially indicating if the determined quality parameters does not fulfil the required level.
  • the indication may be implemented e.g. by sound, visually and/or via tactile feedback, for example.
  • the weld seam manipulating welding device is a welding device e.g. in a laser welding process, whereupon the controlling information is data used to controlling welding parameters of the welding device, such as current, length of arc, angle, position or speed, or even ON/OFF -type information to stop or start the welding process.
  • the welding device is advantageously controlled to produce the weld seam so that properties of the weld seams, such as cross-sectional profile, opening angles, curvature, depth, full penetration, seam width, humping, and a degree of asymmetry during welding among other, correspond and match with a certain tolerance to the predetermined reference weld seam parameters.
  • the weld seam manipulating welding device is a marking or painting device, and wherein the generated controlling information is information used to control the marking or painting device to mark or paint a certain point of the weld seam if a certain parameter of said weld seam at said certain point does not correspond or match respective reference values or respective tolerance intervals of a reference weld seam.
  • the weld seam manipulating welding device is a sanding machine and wherein the generated controlling information is information to control said sanding machine to sand or polish a certain point of the weld seam if a certain parameter of said weld seam at said certain point does not correspond or match respective reference values or respective tolerance intervals of a reference weld seam.
  • the seam quality might be assessed as unsatisfactory for example if the geometric parameter determined does not correspond to a respective reference value or lies outside of a respective tolerance interval.
  • the method of the embodiments can be implemented by a handheld device or arrangement, or an arrangement being integrated into a production line (on-line installation) or being a portion of a welding arrangement.
  • at least some of the steps to implement the embodiments, such as especially for analysing the properties of the weld seam can be implemented by running a computer program product on a data processing means.
  • the computer program product code may be stored in a media run on the data processing means, or it may be stored into data cloud system.
  • the computer program product can be used, when run, to provide the control information to weld seam manipulating welding device.
  • the measured data can also be stored into the memory, e.g. to the cloud system, for possible later use or quality inspection purposes.
  • some embodiments of the invention can be implemented by a LCI (Lateral Chromatic Imaging) device which produces at least one light line (planar beam) over the weld seam.
  • the LCI device is capable of creating an accurate line image of the cross section of the weld seam.
  • the three-dimensional course of the weld seam can be accurately detected and its geometrical data measured.
  • the parameters of its shape can be determined, such as opening angles, curvature, depth, width etc.
  • the LCI device can be advantageously moved along the weld seam and similarly taking multiple images in real-time. These images can be transferred to a processing device, which analyses those using specified algorithms and gives an estimation of the weld seam quality. This result can be transferred to the welding robot or available to a person and thereby adjust the weld seam quality even during the welding process.
  • the present invention offers advantages over the known prior art, such as the possibility to measure very accurately the whole profile of the seam, also the groove or notch areas.
  • LCI technology enables to have ⁇ (micrometer) resolution image over the whole weld seam and all of its noteworthy surface shapes relating to it.
  • the embodiment of the invention also enables imaging a butt joint and T-connected parts (T-joints) because of its imaging technology, accuracy and mechanical size.
  • the embodiments of the invention are also not sensitive to imaged weld seam vibration during measurement.
  • the invention enables measuring, analysing and feedback to the system in real time. Having this accurate image and fast analyse enables higher quality examination of the weld seam than before.
  • the measurement and determination can be done in real-time which allows to produce feedback information to the welding system, for example, to adjust the welding parameters and therefore achieve higher quality weld seam.
  • Figure 1 illustrates a principle of an exemplary arrangement for analysing a property of a weld seam (side view) according to an advantageous embodiment of the invention
  • Figure 2 illustrates an exemplary arrangement for analysing a property of a weld seam (front view) according to an advantageous embodiment of the invention
  • Figure 3 illustrates an exemplary arrangement for analysing a property of a weld seam of t-connected parts (front view) according to an advantageous embodiment of the invention
  • Figure 4 illustrates a principle of reading the reflected beams and providing different exposure times according to an advantageous embodiment of the invention.
  • Figure 1 illustrates a principle of an exemplary arrangement 100 for analysing properties of a weld seam 101 (side view) according to an advantageous embodiment of the invention, wherein the arrangement 100 comprises an optical component 102, such as a prism, lens or optical lattice, for providing a spectre 103 of electromagnetic radiation band to the weld seam 101.
  • the spectre 103 is spread so that different wavelengths 103A, 103B, 103C of the radiation are focused to different depths h- ⁇ , h 2 , h 3 in a direction of a normal 104 of the weld 101.
  • the arrangement comprises also a receiving component 105 for receiving at least a wavelength 106B focused on and reflected from the depth h 2 (level) of the surface of the weld seam 101 at a certain point of the weld seam.
  • the receiving component comprises 105 a detector, such as a line detector, CCD device, or an imaging spectrometer.
  • a source 1 1 1 for generating the electromagnetic radiation band such as a laser source.
  • the arrangement comprises also an analysing unit 107 for analysing the received wavelengths 106A, 106B, 106C and to select wavelengths having intensity over a predetermined threshold value.
  • the analysing unit 107 is also configured to construe the wavelength travelled the shortest path to represent the wavelength 106B focused on and reflected from the depth h 2 of the surface of the weld seam 101 and thereby configured to determine the depth h 2 of the weld seam at said certain point of the weld seam.
  • the arrangement 100 may also provide, advantageously using the optical emitting components, the spectre lines 103 of said electromagnetic radiation band so that a planar line or beam 108 of each wavelength extend over the weld seam (see Fig 2, a front view) at a certain point in a direction of a cross axis line 109, which is perpendicular both to the normal 104 and longitudinal direction 1 10 of the weld seam.
  • the arrangement is additionally configured to receive the reflections of the planar line or beam wavelengths 106A, 106B, 106C focused on and reflected from the different depths h- ⁇ , h 2 , h 3 of the surface of the weld seam along the cross axis line 109.
  • the arrangement is also configured to determine a cross-sectional profile (see the front view in Fig. 2) of the weld seam 101 at said certain point along of the elongated weld seam.
  • the arrangement may also comprise, or is configured to communicate 1 13 with a welding device 1 12, whereupon the arrangement is configured provide controlling information to control the welding device 1 12 to produce the weld seam so that the parameters correspond and match with a certain accuracy to the predetermined reference weld seam parameters.
  • the welding device 1 12 is depicted as an example, the device 1 12 can be also other weld seam manipulating device controlled by the arrangement, as is disclosed elsewhere in this document.
  • Figure 3 illustrates an exemplary arrangement for analysing a property of a weld seam 101 of t-connected parts (front view) according to an advantageous embodiment of the invention.
  • FIG 4 illustrates a principle of reading the reflected beams and providing different exposure times according to an advantageous embodiment of the invention by using an image sensor in connection with the receiving component 105.
  • the receiving component 105 comprises a detector, such as a line detector, CCD or CMOS device as an image sensor, which comprises a pixel array of sensor elements used to create an image from the reflected beams of the measured surface of the object.
  • a detector such as a line detector, CCD or CMOS device as an image sensor, which comprises a pixel array of sensor elements used to create an image from the reflected beams of the measured surface of the object.
  • CCD / CMOS device 1 14 an example of the CCD / CMOS device 1 14 is depicted, where the device is used for providing number of different exposure times.
  • the reflected electromagnetic radiation 106 are received by number of pixels in CCD or CMOS device 1 14.
  • the device 1 14 can be controlled, for providing different exposure times, for example so that a first set of the pixels is used for receiving the reflected beams 106 for first time set (t- ⁇ ) and the second set of the pixels is used for receiving the reflected beams 106 for second time set (t 2 ), which is longer than said first time set (t-i).
  • different columns and/or rows of the device 1 14 can be read in many ways and thereby different exposure times can be achieved. For example every row, column and/or pixel in the array can be read separately, or every row, column and/or pixel in the array can be read at different time (so in practice e.g. every row, column and/or pixel in the array can be turned on/off at different time).
  • the device 1 14 may comprise suitable controller 1 15 for controlling the operation of reading the pixels, or the device 1 14 may comprise additionally also suitable components, such as a row addressing circuit 1 16 and column addressing circuit 1 17.
  • weld seams are discussed in the description, they are only as examples and that the embodiments of the invention can also be used for analysing and determining properties of another seams or object representing also other types of seams.

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
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  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Quality & Reliability (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Geometry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

La présente invention se rapporte à un agencement (100) qui permet d'analyser une propriété d'un joint, en particulier un joint de soudure, et qui comprend un élément optique (102) servant à fournir un spectre (103) d'une bande de rayonnement électromagnétique à un joint de soudure (101) de telle sorte que différentes longueurs d'onde (103A, 103B, 103C) dudit rayonnement soient concentrées sur différentes profondeurs (h-i, h2, h3) dans la direction d'une normale (104) dudit joint de soudure. L'agencement comporte également un élément de réception (105) conçu pour recevoir au moins une longueur d'onde (106B) concentrée sur la profondeur (h2) de la surface dudit joint de soudure (101) et réfléchie par cette profondeur. Il inclut également une unité d'analyse (107) qui est prévue pour analyser lesdites longueurs d'onde (106A, 106B, 106C) reçues, pour sélectionner les longueurs d'onde ayant une intensité supérieure à une valeur seuil prédéfinie, et pour considérer la longueur d'onde qui a parcouru le trajet le plus court comme étant la longueur d'onde (106B) concentrée sur la profondeur (h2) de la surface dudit joint de soudure (101) et réfléchie par cette profondeur, et qui est ainsi prévue pour déterminer la profondeur (h2) dudit joint de soudure à un certain point.
PCT/FI2016/050935 2015-12-29 2016-12-29 Procédé et agencement permettant d'analyser une propriété d'un joint WO2017115015A1 (fr)

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FI20156027A FI126900B (en) 2015-12-29 2015-12-29 Method and system for analyzing the properties of a weld
FI20156027 2015-12-29

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CN110059404A (zh) * 2019-04-16 2019-07-26 江铃汽车股份有限公司 一种焊缝疲劳计算方法
SE1930347A1 (sv) * 2019-10-28 2021-04-29 Johan Filip Oscar Jungefeldt Anordning för bestämning av svetsfogs geometri med handhållen laserskanner i kombination med visuell odemetri
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