WO2017107189A1

WO2017107189A1 - Sensor and signal processing method

Info

Publication number: WO2017107189A1
Application number: PCT/CN2015/098928
Authority: WO
Inventors: 唐样洋; 王新入; 张臣雄
Original assignee: 华为技术有限公司
Priority date: 2015-12-25
Filing date: 2015-12-25
Publication date: 2017-06-29
Also published as: CN108369247A

Abstract

A sensor and a signal processing method. The sensor comprises: an input vector generating module (101), a sampling module (102), and an output module (103), wherein the input vector generating module (101) is configured to convert a waveform signal to be detected into an input vector (301); the sampling module (102) is configured to sample the input vector according to a preset delay constant, so as to generate a sampling signal (302); the output module (103) is configured to output a level signal (303) according to a preset variation frequency when the variation degree of the sampling signal exceeds a preset threshold. The sensor comprises only the input vector generating module (101), the sampling module (102), and the output module (103), such that it has simple structure and small chip area.

Description

Sensor and signal processing method

Technical field

The present invention relates to the field of signal processing, and more particularly to sensors and signal processing methods.

Background technique

As the structure of electronic chips becomes more and more complex, the requirements for stable operation of electronic chips are also increasing. In order to eliminate the influence of various unstable factors on the operation of the chip, it is necessary to use the sensor to monitor the waveform signal of the output voltage, temperature and the like of the chip.

In the prior art, a voltage-controlled oscillation sensor is generally used to detect a waveform signal such as an output voltage of an electronic chip. However, when using a voltage-controlled oscillation sensor to detect the waveform signal of the electronic chip, it is not only necessary to use an external clock source to provide a clock signal for the voltage-controlled oscillation sensor, but also an external power supply is required to supply the voltage-controlled oscillation sensor, thereby causing a complicated structure of the sensor. Need to occupy a larger chip area. .

Summary of the invention

The embodiments of the present invention provide a sensor and a signal processing method to solve the problem that the existing sensor structure is complicated and requires a large chip area.

In a first aspect, an embodiment of the present invention provides a sensor, including: an input vector generating module, a sampling module, and an output module; wherein, an input vector generating module, configured to convert a waveform signal to be detected into an input vector a sampling module, configured to sample the input vector according to a preset delay constant to generate a sampling signal, and an output module, configured to output the level signal according to the preset changing frequency when the degree of change of the sampling signal exceeds a preset threshold. The sensor only includes an input vector generation module, a sampling module and an output module, so the structure is simple, and therefore the chip area is small.

With reference to the first aspect, in a first possible implementation manner of the first aspect, the sampling module includes: an operation amplifying circuit and a delay constant setting circuit; wherein the delay constant setting circuit is configured to set the sampling module to sample the input vector Sampling frequency. Since the sensor includes a delay constant setting circuit, it can be adjusted by the delay constant setting circuit to adjust the sampling frequency when the sampling module samples the input vector, so that the application range of the sensor can be wider.

In combination with the first possible implementation manner of the first aspect, in the second possible implementation manner of the first aspect, The amplification circuit is an operational amplifier; the delay constant setting circuit includes: a first resistor and a first capacitor; wherein, one end of the first capacitor is connected to one input end of the operational amplifier, and the other end is connected to an output of the input vector generating module; The other input is grounded. It can be seen that the input vector generation module only includes a small number of circuit structures, so the input vector generation module only needs to occupy a small chip area.

In conjunction with the first or second possible implementation of the first aspect, in a third possible implementation of the first aspect, the operational amplifier is powered by the equivalent potential of the input vector. Since the op amp is powered by the equivalent potential of the input vector, it is no longer necessary to use an external power supply to power the op amp.

With reference to the first aspect, or any one of the first to third possible implementation manners of the first aspect, in the fourth possible implementation manner of the first aspect, the output module includes: a hysteresis comparison circuit and a change frequency setting circuit; The comparison circuit is configured to output a corresponding level signal when the degree of change of the sampling signal exceeds a preset threshold, and the changing frequency setting circuit is configured to determine a frequency of change of the level signal. Since there is a change frequency setting circuit, the change frequency setting circuit can be adjusted as needed, so that the change frequency of the level signal can be adjusted according to actual needs.

With reference to the fourth possible implementation manner of the first aspect, in a fifth possible implementation manner of the first aspect, the variable frequency setting circuit includes a second resistor and a second capacitor, and a hysteresis comparison circuit includes a comparator and a third And a fourth resistor; wherein the second capacitor has one end grounded, the other end is connected to one end of the second resistor and one end of the third resistor; the other end of the second resistor is connected to the output end of the comparator; The other end is connected to one input of the comparator; one end of the fourth resistor is connected to the output of the comparator, and the other end is connected to the output of the comparator; the other input of the comparator is connected to the output of the sampling module connection. It can be seen that the output module only includes a small number of circuit structures, so the output module only needs to occupy a small chip area.

In conjunction with the fifth possible implementation of the first aspect, in a sixth possible implementation of the fifth aspect, the comparator is powered by the equivalent potential of the input vector. Since the comparator is powered by the equivalent potential of the input vector, there is no need to use an external power supply to power the comparator.

In conjunction with the fifth or sixth possible implementation of the first aspect, in the seventh possible implementation of the first aspect, when one end of the first capacitor is connected to one positive input terminal of the operational amplifier, the comparator is further The negative input is connected to the output of the sampling module. With this connection, the level signal output by the sensor can be made to a negative level.

In conjunction with the fifth or sixth possible implementation of the first aspect, in a seventh possible implementation of the first aspect, when one end of the first capacitor is connected to a negative input terminal of the operational amplifier, the comparator is further The positive input is connected to the output of the sampling module. With this connection method, the level signal of the sensor output can be positive. level.

With reference to the first aspect, or any one of the first to eighth possible implementation manners of the first aspect, in the ninth possible implementation manner of the first aspect, the input vector generating module is a resistor, and the resistor is used to detect the voltage to be detected. Convert to an input vector. When the input vector generation module is a resistor, the sensor can convert the voltage signal change into a level signal.

With reference to the first aspect, or any one of the first to eighth possible implementation manners of the first aspect, in the ninth possible implementation manner of the first aspect, the input vector generating module is a complementary metal oxide semiconductor CMOS, and the CMOS is used for The temperature to be detected is converted into an input vector. When the vector generation module CMOS is input, the sensor can convert the temperature change into a level signal.

In a second aspect, an embodiment of the present invention further provides a signal processing method, the method comprising: converting a waveform signal to be detected into an input vector; sampling the input vector according to a preset delay constant to generate a sampling signal; When the degree of change of the signal exceeds the preset threshold, the level signal is output according to the preset change frequency. The signal processing method provided in this embodiment can realize the function of the sensor by using a simple circuit without occupying a large chip area.

DRAWINGS

In order to explain the technical solutions in the embodiments of the present invention, the drawings used in the embodiments will be briefly described below. Obviously, for those skilled in the art, without any creative labor, Other drawings can also be obtained from these figures.

1 is a schematic structural view of an embodiment of a sensor of the present invention;

2 is a schematic structural view of another embodiment of the sensor of the present invention;

FIG. 3 is a schematic flow chart of an embodiment of a signal processing method according to the present invention.

detailed description

1 is a schematic structural diagram of an embodiment of a sensor according to the present invention. The sensor includes:

The vector generation module 101, the sampling module 102, and the output module 103 are input.

The input vector generating module 101 is configured to convert the waveform signal to be detected into an input vector. The sampling module 102 is configured to sample the input vector according to a preset delay constant to generate a sampling signal. The output module 103 is configured to output a level according to a preset change frequency when the degree of change of the sampling signal exceeds a preset threshold signal. The change frequency refers to the refresh frequency when the output module outputs a signal, and the output module 103 can output a discrete level signal according to the time interval corresponding to the change frequency.

The circuit structure included in the input vector generation module 101 may also be different depending on the waveform signal to be detected. When the waveform signal to be detected is a voltage signal, the vector generation module may be a resistor, and the resistor is used to convert the voltage signal to be detected into an input vector; when the waveform signal to be detected is a temperature signal, the input vector generation module 101 may be a complementary metal. A semiconductor (Complementary Metal Oxide Semiconductor, CMOS for short), CMOS is used to convert the temperature to be detected into an input vector. The input vector can be a current signal converted from a waveform signal to be detected.

It should be noted that the input vector generating module 101 is used for powering the sampling module 102 and the output module 103 by using the equivalent potential of the output vector, in addition to converting the waveform signal to be detected into an input vector. There is no need to provide external power to the sensor, reducing the complexity of the sensor. The equivalent potential refers to a potential formed when the input vector generation module 101 is used as a current source and is equivalently converted into a voltage source. In general, the equivalent potential may be the voltage at the output end of the input vector generation module 101. For example, when the waveform signal to be detected is a voltage signal, the ratio between the potential of the equivalent potential and the voltage signal may be the ratio of the sum of the equivalent resistances of the sampling module 102 and the output module 103 to the equivalent resistance of the sensor.

The sampling module 102 can be a high pass amplification circuit. Optionally, the sampling module 102 can include: an operational amplification circuit and a delay constant setting circuit; wherein the delay constant setting circuit is configured to set a sampling frequency when the sampling module 102 samples the input vector. The operational amplifier circuit can be an operational amplifier that can be powered by the input vector generation module 101, ie, the operational amplifier is powered by the equivalent potential of the input vector.

As shown in FIG. 2, the delay constant setting circuit may include: a first resistor 1021 and a first capacitor 1022; wherein one end of the first capacitor 1022 is connected to one input terminal of the operational amplifier 1023, and the other end is connected to the output of the input vector generating module. Connected; the other input of operational amplifier 1023 is coupled to ground. The magnitude of the delay constant is determined by the size of the first resistor 1021 and the first capacitor 1022. The sampling capacitor 102 samples the sampling frequency of the input vector by the size of the first resistor 1021 and the first capacitor 1022. The larger the delay constant, the lower the sampling frequency at which the sampling module 102 samples the input vector; the smaller the delay constant, the higher the sampling frequency at which the sampling module 102 samples the input vector.

The output module 103 can be a low pass filter amplifying circuit. Optionally, the output module 103 includes: a hysteresis comparison circuit and a change frequency setting circuit; and a hysteresis comparison circuit, configured to output a corresponding level signal and a change frequency setting circuit when the degree of change of the sampling signal exceeds a preset threshold. Used to determine the frequency of change of the level signal. Among them, the size range of the level signal can be set as needed. When the operational amplifier circuit and the hysteresis comparison circuit are both lost When the equivalent potential of the vector is supplied, the magnitude of the level signal can be determined by the size of the input vector. The size range of the level signal is proportional to the size range of the input vector, and the scaling factors of the two can be determined by the equivalent resistance of the input vector generation module 101, the sampling module 102, and the output module 103. In general, the scaling factor may be the ratio of the sum of the equivalent resistances of the sampling module 102 and the output module 103 to the equivalent resistance of the sensor.

As shown in FIG. 2, the change frequency setting circuit includes a second resistor 1031 and a second capacitor 1032. The hysteresis comparison circuit includes a comparator 1033, a third resistor 1034, and a fourth resistor 1035. One end of the second capacitor 1032 Grounded, the other end is connected to one end of the second resistor 1031 and one end of the third resistor 1034; the other end of the second resistor 1031 is connected to the output end of the comparator 1033; the other end of the third resistor 1034 is connected to the comparator 1033 One input is connected; one end of the fourth resistor 1035 is connected to the output of the comparator 1033, the other end is connected to the output of the comparator 1033; the other input of the comparator 1033 is connected to the output of the operational amplifier 1023. Comparator 1033 can also be powered by the equivalent potential of the input vector.

The threshold is determined by the resistance R1 of the third resistor 1034 and the resistance R2 of the fourth resistor 1035. The magnitude of the threshold can be changed by changing the resistance of the third resistor 1034 and the fourth resistor 1035. The larger the value of R2/(R2+R1), the larger the threshold value; the smaller the value of R2/(R2+R1), the smaller the threshold value. The frequency of change of the level signal is determined by the product of the resistance value of the second resistor 1031 and the capacitance value of the second capacitor 1032. The larger the product, the lower the frequency of change of the output signal, and the smaller the product, the higher the frequency of change of the output signal. .

It should be noted here that the level signal output by the sensor may be a positive level or a negative level depending on the demand.

When the first capacitor 1022 is coupled to a forward input of the operational amplifier 1023, i.e., the input vector is input to the operational amplifier 1023 from the forward input port, the output of the operational amplifier 1023 can be coupled to the negative input of the comparator 1033, ie, The sampled signal is input to the comparator 1033 through the negative input port. At this time, the level signal output by the sensor can be a negative level.

When the first capacitor 1022 is coupled to a negative input of the operational amplifier 1023, i.e., the input vector is input to the operational amplifier 1023 from the negative input port, the output of the operational amplifier 1023 can be coupled to the positive input of the comparator 1033, ie, The sampled signal is input to the comparator 1033 through the forward input port. That is, when the circuit connection relationship is as shown in FIG. 2, the level signal output by the sensor can be a positive level.

The sensor provided in this embodiment can generate a level signal according to a waveform signal to be detected without an external power source and an external clock source, and has a simple structure, and thus can be widely applied to various occasions.

3 is a schematic flowchart of an embodiment of a signal processing method according to the present invention. As shown in Figure 3, the method can To include:

In step 301, the waveform signal to be detected is converted into an input vector.

Converting the waveform signal to be detected into an input vector can be done by the input vector generation module. For details of the input vector generation module, refer to the foregoing embodiment, and details are not described herein again.

Step 302: The input vector is sampled according to a preset delay constant to generate a sampling signal.

The input vector is sampled according to a preset delay constant to generate a sampled signal that can pass through the sampling module. For details of the sampling module, refer to the foregoing embodiment, and details are not described herein again.

Step 303: When the degree of change of the sampling signal exceeds a preset threshold, output a level signal according to a preset change frequency.

When the degree of change of the sampling signal exceeds the preset threshold, the output level signal according to the preset change frequency can be realized by the output module. For details of the output module, refer to the foregoing embodiment, and details are not described herein again.

The signal processing method provided by this embodiment does not require the use of complicated chips or circuits.

It will be apparent to those skilled in the art that the techniques in the embodiments of the present invention can be implemented by means of software plus a necessary general hardware platform. Based on such understanding, the technical solution in the embodiments of the present invention may be embodied in the form of a software product in essence or in the form of a software product, which may be stored in a storage medium such as a ROM/RAM. , a disk, an optical disk, etc., including a number of instructions for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform portions of various embodiments or embodiments of the present invention.

The same or similar parts of the various embodiments in the present specification may be referred to each other. The above embodiments of the present invention do not constitute a limitation of the scope of the present invention.

Claims

A sensor characterized in that

The method includes: an input vector generation module, a sampling module, and an output module;

among them,

The input vector generating module is configured to convert a waveform signal to be detected into an input vector;

The sampling module is configured to sample the input vector according to a preset delay constant to generate a sampling signal;

The output module is configured to output a level signal according to a preset change frequency when a degree of change of the sampling signal exceeds a preset threshold.
The sensor of claim 1 wherein said sampling module comprises:

An operational amplifier circuit and a delay constant setting circuit;

The delay constant setting circuit is configured to set a sampling frequency when the sampling module samples the input vector.
The sensor of claim 2 wherein:

The operational amplifier circuit is an operational amplifier;

The delay constant setting circuit includes: a first resistor and a first capacitor;

among them,

One end of the first capacitor is connected to one input end of the operational amplifier, and the other end is connected to an output of the input vector generating module;

The other input of the operational amplifier is grounded.
The sensor according to claim 2 or 3, wherein

The operational amplifier is powered by the equivalent potential of the input vector.
The sensor according to any one of claims 1 to 4, wherein the output module comprises:

Hysteresis comparison circuit and change frequency setting circuit;

The hysteresis comparison circuit is configured to output a corresponding level signal when the degree of change of the sampling signal exceeds a preset threshold.

The change frequency setting circuit is configured to determine a frequency of change of the level signal.
The sensor of claim 5 wherein:

The change frequency setting circuit includes a second resistor and a second capacitor;

The hysteresis comparison circuit includes a comparator, a third resistor, and a fourth resistor;

among them,

One end of the second capacitor is grounded, and the other end is connected to one end of the second resistor and one end of the third resistor;

The other end of the second resistor is connected to the output end of the comparator;

The other end of the third resistor is connected to an input end of the comparator;

One end of the fourth resistor is connected to an output of the comparator, and the other end is connected to the output end of the comparator;

The other input of the comparator is coupled to the output of the sampling module.
The sensor of claim 6 wherein:

The comparator is powered by the equivalent potential of the input vector.
The sensor according to claim 6 or 7, wherein

When one end of the first capacitor is connected to a forward input of the operational amplifier, the other negative input of the comparator is coupled to the output of the sampling module.
The sensor according to claim 6 or 7, wherein

When one end of the first capacitor is connected to a negative input of the operational amplifier, the other positive input of the comparator is coupled to the output of the sampling module.
The sensor according to any one of claims 1 to 9, wherein

The input vector generation module is a resistor for converting a voltage to be detected into the input vector.
A signal processing method, comprising:

Converting the waveform signal to be detected into an input vector;

Sampling the input vector according to a preset delay constant to generate a sampling signal;

When the degree of change of the sampling signal exceeds a preset threshold, the level signal is output according to a preset change frequency.