WO2017107189A1 - Capteur et procédé de traitement de signal - Google Patents

Capteur et procédé de traitement de signal Download PDF

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Publication number
WO2017107189A1
WO2017107189A1 PCT/CN2015/098928 CN2015098928W WO2017107189A1 WO 2017107189 A1 WO2017107189 A1 WO 2017107189A1 CN 2015098928 W CN2015098928 W CN 2015098928W WO 2017107189 A1 WO2017107189 A1 WO 2017107189A1
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WO
WIPO (PCT)
Prior art keywords
output
input vector
module
sampling
input
Prior art date
Application number
PCT/CN2015/098928
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English (en)
Chinese (zh)
Inventor
唐样洋
王新入
张臣雄
Original Assignee
华为技术有限公司
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Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to PCT/CN2015/098928 priority Critical patent/WO2017107189A1/fr
Priority to CN201580085313.4A priority patent/CN108369247A/zh
Publication of WO2017107189A1 publication Critical patent/WO2017107189A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Definitions

  • the present invention relates to the field of signal processing, and more particularly to sensors and signal processing methods.
  • a voltage-controlled oscillation sensor is generally used to detect a waveform signal such as an output voltage of an electronic chip.
  • a voltage-controlled oscillation sensor to detect the waveform signal of the electronic chip, it is not only necessary to use an external clock source to provide a clock signal for the voltage-controlled oscillation sensor, but also an external power supply is required to supply the voltage-controlled oscillation sensor, thereby causing a complicated structure of the sensor. Need to occupy a larger chip area. .
  • the embodiments of the present invention provide a sensor and a signal processing method to solve the problem that the existing sensor structure is complicated and requires a large chip area.
  • an embodiment of the present invention provides a sensor, including: an input vector generating module, a sampling module, and an output module; wherein, an input vector generating module, configured to convert a waveform signal to be detected into an input vector a sampling module, configured to sample the input vector according to a preset delay constant to generate a sampling signal, and an output module, configured to output the level signal according to the preset changing frequency when the degree of change of the sampling signal exceeds a preset threshold.
  • the sensor only includes an input vector generation module, a sampling module and an output module, so the structure is simple, and therefore the chip area is small.
  • the sampling module includes: an operation amplifying circuit and a delay constant setting circuit; wherein the delay constant setting circuit is configured to set the sampling module to sample the input vector Sampling frequency. Since the sensor includes a delay constant setting circuit, it can be adjusted by the delay constant setting circuit to adjust the sampling frequency when the sampling module samples the input vector, so that the application range of the sensor can be wider.
  • the amplification circuit is an operational amplifier;
  • the delay constant setting circuit includes: a first resistor and a first capacitor; wherein, one end of the first capacitor is connected to one input end of the operational amplifier, and the other end is connected to an output of the input vector generating module; The other input is grounded. It can be seen that the input vector generation module only includes a small number of circuit structures, so the input vector generation module only needs to occupy a small chip area.
  • the operational amplifier is powered by the equivalent potential of the input vector. Since the op amp is powered by the equivalent potential of the input vector, it is no longer necessary to use an external power supply to power the op amp.
  • the output module includes: a hysteresis comparison circuit and a change frequency setting circuit;
  • the comparison circuit is configured to output a corresponding level signal when the degree of change of the sampling signal exceeds a preset threshold, and the changing frequency setting circuit is configured to determine a frequency of change of the level signal. Since there is a change frequency setting circuit, the change frequency setting circuit can be adjusted as needed, so that the change frequency of the level signal can be adjusted according to actual needs.
  • the variable frequency setting circuit includes a second resistor and a second capacitor
  • a hysteresis comparison circuit includes a comparator and a third And a fourth resistor; wherein the second capacitor has one end grounded, the other end is connected to one end of the second resistor and one end of the third resistor; the other end of the second resistor is connected to the output end of the comparator; The other end is connected to one input of the comparator; one end of the fourth resistor is connected to the output of the comparator, and the other end is connected to the output of the comparator; the other input of the comparator is connected to the output of the sampling module connection.
  • the output module only includes a small number of circuit structures, so the output module only needs to occupy a small chip area.
  • the comparator is powered by the equivalent potential of the input vector. Since the comparator is powered by the equivalent potential of the input vector, there is no need to use an external power supply to power the comparator.
  • the comparator when one end of the first capacitor is connected to one positive input terminal of the operational amplifier, the comparator is further The negative input is connected to the output of the sampling module. With this connection, the level signal output by the sensor can be made to a negative level.
  • the comparator when one end of the first capacitor is connected to a negative input terminal of the operational amplifier, the comparator is further The positive input is connected to the output of the sampling module. With this connection method, the level signal of the sensor output can be positive. level.
  • the input vector generating module is a resistor, and the resistor is used to detect the voltage to be detected. Convert to an input vector.
  • the sensor can convert the voltage signal change into a level signal.
  • the input vector generating module is a complementary metal oxide semiconductor CMOS, and the CMOS is used for The temperature to be detected is converted into an input vector.
  • the sensor can convert the temperature change into a level signal.
  • an embodiment of the present invention further provides a signal processing method, the method comprising: converting a waveform signal to be detected into an input vector; sampling the input vector according to a preset delay constant to generate a sampling signal; When the degree of change of the signal exceeds the preset threshold, the level signal is output according to the preset change frequency.
  • the signal processing method provided in this embodiment can realize the function of the sensor by using a simple circuit without occupying a large chip area.
  • FIG. 1 is a schematic structural view of an embodiment of a sensor of the present invention
  • FIG. 2 is a schematic structural view of another embodiment of the sensor of the present invention.
  • FIG. 3 is a schematic flow chart of an embodiment of a signal processing method according to the present invention.
  • the sensor includes:
  • the vector generation module 101, the sampling module 102, and the output module 103 are input.
  • the input vector generating module 101 is configured to convert the waveform signal to be detected into an input vector.
  • the sampling module 102 is configured to sample the input vector according to a preset delay constant to generate a sampling signal.
  • the output module 103 is configured to output a level according to a preset change frequency when the degree of change of the sampling signal exceeds a preset threshold signal.
  • the change frequency refers to the refresh frequency when the output module outputs a signal, and the output module 103 can output a discrete level signal according to the time interval corresponding to the change frequency.
  • the circuit structure included in the input vector generation module 101 may also be different depending on the waveform signal to be detected.
  • the vector generation module may be a resistor, and the resistor is used to convert the voltage signal to be detected into an input vector;
  • the waveform signal to be detected is a temperature signal
  • the input vector generation module 101 may be a complementary metal.
  • a semiconductor Complementary Metal Oxide Semiconductor, CMOS for short
  • CMOS is used to convert the temperature to be detected into an input vector.
  • the input vector can be a current signal converted from a waveform signal to be detected.
  • the input vector generating module 101 is used for powering the sampling module 102 and the output module 103 by using the equivalent potential of the output vector, in addition to converting the waveform signal to be detected into an input vector.
  • the equivalent potential refers to a potential formed when the input vector generation module 101 is used as a current source and is equivalently converted into a voltage source.
  • the equivalent potential may be the voltage at the output end of the input vector generation module 101.
  • the waveform signal to be detected is a voltage signal
  • the ratio between the potential of the equivalent potential and the voltage signal may be the ratio of the sum of the equivalent resistances of the sampling module 102 and the output module 103 to the equivalent resistance of the sensor.
  • the sampling module 102 can be a high pass amplification circuit.
  • the sampling module 102 can include: an operational amplification circuit and a delay constant setting circuit; wherein the delay constant setting circuit is configured to set a sampling frequency when the sampling module 102 samples the input vector.
  • the operational amplifier circuit can be an operational amplifier that can be powered by the input vector generation module 101, ie, the operational amplifier is powered by the equivalent potential of the input vector.
  • the delay constant setting circuit may include: a first resistor 1021 and a first capacitor 1022; wherein one end of the first capacitor 1022 is connected to one input terminal of the operational amplifier 1023, and the other end is connected to the output of the input vector generating module. Connected; the other input of operational amplifier 1023 is coupled to ground.
  • the magnitude of the delay constant is determined by the size of the first resistor 1021 and the first capacitor 1022.
  • the sampling capacitor 102 samples the sampling frequency of the input vector by the size of the first resistor 1021 and the first capacitor 1022. The larger the delay constant, the lower the sampling frequency at which the sampling module 102 samples the input vector; the smaller the delay constant, the higher the sampling frequency at which the sampling module 102 samples the input vector.
  • the output module 103 can be a low pass filter amplifying circuit.
  • the output module 103 includes: a hysteresis comparison circuit and a change frequency setting circuit; and a hysteresis comparison circuit, configured to output a corresponding level signal and a change frequency setting circuit when the degree of change of the sampling signal exceeds a preset threshold. Used to determine the frequency of change of the level signal. Among them, the size range of the level signal can be set as needed. When the operational amplifier circuit and the hysteresis comparison circuit are both lost When the equivalent potential of the vector is supplied, the magnitude of the level signal can be determined by the size of the input vector.
  • the size range of the level signal is proportional to the size range of the input vector, and the scaling factors of the two can be determined by the equivalent resistance of the input vector generation module 101, the sampling module 102, and the output module 103.
  • the scaling factor may be the ratio of the sum of the equivalent resistances of the sampling module 102 and the output module 103 to the equivalent resistance of the sensor.
  • the change frequency setting circuit includes a second resistor 1031 and a second capacitor 1032.
  • the hysteresis comparison circuit includes a comparator 1033, a third resistor 1034, and a fourth resistor 1035.
  • One end of the second capacitor 1032 Grounded, the other end is connected to one end of the second resistor 1031 and one end of the third resistor 1034; the other end of the second resistor 1031 is connected to the output end of the comparator 1033; the other end of the third resistor 1034 is connected to the comparator 1033
  • One input is connected; one end of the fourth resistor 1035 is connected to the output of the comparator 1033, the other end is connected to the output of the comparator 1033; the other input of the comparator 1033 is connected to the output of the operational amplifier 1023.
  • Comparator 1033 can also be powered by the equivalent potential of the input vector.
  • the threshold is determined by the resistance R1 of the third resistor 1034 and the resistance R2 of the fourth resistor 1035.
  • the magnitude of the threshold can be changed by changing the resistance of the third resistor 1034 and the fourth resistor 1035.
  • the frequency of change of the level signal is determined by the product of the resistance value of the second resistor 1031 and the capacitance value of the second capacitor 1032. The larger the product, the lower the frequency of change of the output signal, and the smaller the product, the higher the frequency of change of the output signal. .
  • the level signal output by the sensor may be a positive level or a negative level depending on the demand.
  • the output of the operational amplifier 1023 can be coupled to the negative input of the comparator 1033, ie, The sampled signal is input to the comparator 1033 through the negative input port.
  • the level signal output by the sensor can be a negative level.
  • the output of the operational amplifier 1023 can be coupled to the positive input of the comparator 1033, ie, The sampled signal is input to the comparator 1033 through the forward input port. That is, when the circuit connection relationship is as shown in FIG. 2, the level signal output by the sensor can be a positive level.
  • the sensor provided in this embodiment can generate a level signal according to a waveform signal to be detected without an external power source and an external clock source, and has a simple structure, and thus can be widely applied to various occasions.
  • FIG. 3 is a schematic flowchart of an embodiment of a signal processing method according to the present invention. As shown in Figure 3, the method can To include:
  • step 301 the waveform signal to be detected is converted into an input vector.
  • Converting the waveform signal to be detected into an input vector can be done by the input vector generation module.
  • the input vector generation module For details of the input vector generation module, refer to the foregoing embodiment, and details are not described herein again.
  • Step 302 The input vector is sampled according to a preset delay constant to generate a sampling signal.
  • the input vector is sampled according to a preset delay constant to generate a sampled signal that can pass through the sampling module.
  • a preset delay constant for details of the sampling module, refer to the foregoing embodiment, and details are not described herein again.
  • Step 303 When the degree of change of the sampling signal exceeds a preset threshold, output a level signal according to a preset change frequency.
  • the output level signal according to the preset change frequency can be realized by the output module.
  • the output module For details of the output module, refer to the foregoing embodiment, and details are not described herein again.
  • the signal processing method provided by this embodiment does not require the use of complicated chips or circuits.
  • the techniques in the embodiments of the present invention can be implemented by means of software plus a necessary general hardware platform. Based on such understanding, the technical solution in the embodiments of the present invention may be embodied in the form of a software product in essence or in the form of a software product, which may be stored in a storage medium such as a ROM/RAM. , a disk, an optical disk, etc., including a number of instructions for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform portions of various embodiments or embodiments of the present invention.
  • a computer device which may be a personal computer, server, or network device, etc.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

L'invention concerne un capteur et un procédé de traitement de signal. Le capteur comprend : un module de génération de vecteur d'entrée (101), un module d'échantillonnage (102) et un module de sortie (103), le module de génération de vecteur d'entrée (101) étant conçu pour convertir un signal de forme d'onde à détecter en un vecteur d'entrée (301) ; le module d'échantillonnage (102) étant conçu pour échantillonner le vecteur d'entrée conformément à une constante de retard prédéfinie, de façon à générer un signal d'échantillonnage (302) ; le module de sortie (103) étant conçu pour délivrer un signal de niveau (303) conformément à une fréquence de variation prédéfinie lorsque le degré de variation du signal d'échantillonnage dépasse un seuil prédéfini. Le capteur comprend seulement le module de génération de vecteur d'entrée (101), le module d'échantillonnage (102) et le module de sortie (103), de sorte à présenter une structure simple et une petite surface de puce.
PCT/CN2015/098928 2015-12-25 2015-12-25 Capteur et procédé de traitement de signal WO2017107189A1 (fr)

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PCT/CN2015/098928 WO2017107189A1 (fr) 2015-12-25 2015-12-25 Capteur et procédé de traitement de signal
CN201580085313.4A CN108369247A (zh) 2015-12-25 2015-12-25 传感器及信号处理方法

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PCT/CN2015/098928 WO2017107189A1 (fr) 2015-12-25 2015-12-25 Capteur et procédé de traitement de signal

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