WO2017041249A1 - 一种提高触摸屏容错性的方法及触屏终端 - Google Patents

一种提高触摸屏容错性的方法及触屏终端 Download PDF

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Publication number
WO2017041249A1
WO2017041249A1 PCT/CN2015/089253 CN2015089253W WO2017041249A1 WO 2017041249 A1 WO2017041249 A1 WO 2017041249A1 CN 2015089253 W CN2015089253 W CN 2015089253W WO 2017041249 A1 WO2017041249 A1 WO 2017041249A1
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Prior art keywords
node
abnormal
touch screen
value
nodes
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PCT/CN2015/089253
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English (en)
French (fr)
Inventor
肖文超
胡少武
徐刚
张瑞
姜武爽
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华为技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to PCT/CN2015/089253 priority Critical patent/WO2017041249A1/zh
Priority to CN201580082963.3A priority patent/CN108027692B/zh
Priority to US15/758,602 priority patent/US10712870B2/en
Publication of WO2017041249A1 publication Critical patent/WO2017041249A1/zh

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416—Control or interface arrangements specially adapted for digitisers
    • G06F3/0418—Control or interface arrangements specially adapted for digitisers for error correction or compensation, e.g. based on parallax, calibration or alignment
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes

Definitions

  • the present invention relates to the field of touch display technologies, and in particular, to a method and a touch screen terminal for improving fault tolerance of a touch screen.
  • the multi-touch capacitive touch screen includes an On Cell type touch screen and an In Cell type touch screen, and the nodes for implementing touch can be a Bonding Pad.
  • the On Cell screen uses a large number of nodes, such as a 7-inch liquid crystal display (LCD) with a resolution of 600*1024, which requires 15*26 nodes, ie 390. Due to the complexity of the process, the more nodes there are, the more likely the abnormal nodes are. For example, if the node is in poor contact, the impedance of the node becomes large, and the capacitance of the node cannot be filled, so that the capacitance value of the node fluctuates repeatedly.
  • LCD liquid crystal display
  • the touch screen of the touch screen terminal performs capacitance value detection on each node in the touch screen.
  • the touch screen receives the touch operation of the user, the capacitance value of the corresponding node in the touch area coverage changes, and when the capacitance value changes exceeds
  • the touch screen reports the node to the application processor of the touch screen terminal, and the application processor determines the touch operation according to the coordinates of the node, the reporting time, and the like.
  • the touch screen terminal performs the function corresponding to the touch operation. Such as: screen unlocking and so on.
  • the touch screen Since the capacitance value of the abnormal node repeatedly fluctuates, the touch screen detects that the capacitance value of the abnormal node changes beyond the threshold, and reports the node to the application processor. In fact, the touch screen does not receive the touch operation, but the self-change of the capacitance value of the abnormal node, so there is a problem that the fault tolerance of the touch screen is low.
  • a method for improving fault tolerance of a touch screen including:
  • the abnormal node is the target node determined when a touch operation does not occur on the touch screen;
  • the abnormal node is included in the N target nodes, discarding the row and column values and the capacitance change value of the abnormal node; or
  • the abnormal node is included in the N target nodes, correcting a capacitance change value of the abnormal node; uploading a row and column value of the abnormal node and a corrected capacitance change value.
  • the correcting a capacitance change value of the abnormal node includes:
  • the touch area is an area on a touch screen where a touch operation occurs;
  • the abnormal node is a node in the touch area, determining an average value of a capacitance change value of a node other than the abnormal node in the touch area as a capacitance change value of the abnormal node.
  • the determining whether the abnormal node is a node in a touch area specifically includes:
  • the capacitance value of at least one of the adjacent nodes changes, it is determined that the abnormal node is a node in the touch area.
  • a method for determining a touch screen abnormal node including:
  • the detected capacitance value of each node and the preset power of each node are compared to determine M abnormal nodes; wherein the M is an integer greater than or equal to zero.
  • prompt information is generated to prompt the user of the terminal to replace the touch screen.
  • a detecting unit configured to detect a capacitance value of each node in the touch screen
  • a determining unit configured to compare the detected capacitance value of each node with a preset capacitance value of each node to determine N target nodes; wherein the N is greater than or equal to an integer of zero; The detected capacitance value of the target node and the preset capacitance value of the target node satisfy a preset condition;
  • a determining unit configured to determine whether an abnormal node is included in the N target nodes; the abnormal node is the target node determined when a touch operation does not occur on the touch screen;
  • the determining unit determines that the abnormal node is included in the N target nodes, corrects a capacitance change value of the abnormal node, and uploads a row and column value of the abnormal node and a corrected capacitance change value.
  • the abnormal node is a node in the touch area, determining an average value of a capacitance change value of a node other than the abnormal node in the touch area as a capacitance change value of the abnormal node.
  • the performing unit is configured to determine whether the abnormal node is a node in a touch area, specifically, The execution unit is used to:
  • the capacitance value of at least one of the adjacent nodes changes, it is determined that the abnormal node is a node in the touch area.
  • the detecting unit is further configured to detect a capacitance value of each node in the touch screen when a touch operation does not occur on the touch screen;
  • the determining unit is configured to compare the detected capacitance value of each node with a preset capacitance value of each node to determine M abnormal nodes; wherein the M is an integer greater than or equal to zero .
  • the determining unit is configured to determine, when the M is greater than or equal to 2, whether a distance between any two of the abnormal nodes is less than or equal to a preset distance threshold;
  • a processor configured to detect a capacitance value of each node in the touch screen; compare the detected capacitance value of each node with a preset capacitance value of each node to determine N target nodes; The N is greater than or equal to an integer of zero; the detected capacitance value of the target node and the preset capacitance value of the target node satisfy a preset condition;
  • the processor is configured to determine whether the N target nodes include an abnormal node; the abnormal node is the target node determined when no touch operation occurs on the touch screen; if the N target nodes are included The abnormal node discards the abnormality a row and column value and a capacitance change value of the node; or, if the abnormal node is included in the N target nodes, correcting a capacitance change value of the abnormal node; uploading a row and column value of the abnormal node and a corrected capacitance change value.
  • the processor is configured to: correct a capacitance change value of the abnormal node, where the processor is configured to:
  • the processor is configured to determine whether a capacitance value of a neighboring node of the abnormal node changes
  • the processor is used to:
  • the capacitance value of at least one of the adjacent nodes changes, it is determined that the abnormal node is a node in the touch area.
  • the processor is further configured to detect a capacitance value of each node in the touch screen when a touch operation does not occur on the touch screen; Comparing the detected capacitance value of each node with a preset capacitance value of each of the nodes to determine M abnormal nodes; wherein the M is an integer greater than or equal to zero.
  • the processor is further configured to: when the M is greater than or equal to 2, determine any two Whether the distance between the abnormal nodes is less than or equal to the preset distance threshold; if it is determined that the distance between any two of the abnormal nodes is less than or equal to the preset distance threshold, generating prompt information to prompt the user of the terminal Replace the touch screen
  • the method for improving fault tolerance of a touch screen and the touch screen terminal provided by the embodiments of the present invention detect a capacitance value of each node in the touch screen.
  • the detected each node The capacitance value is compared with a preset capacitance value of each of the nodes to determine N target nodes. Determining the row and column values of the N target nodes. Determining whether an abnormal node is included in the target node.
  • the abnormal node is included in the N target nodes, discarding the row and column values and the capacitance change value of the abnormal node; or if the abnormal node is included in the N target nodes, correcting the abnormal node The value of the capacitance change; uploading the row and column values of the abnormal node and the corrected capacitance change value. In this way, the abnormal node can be shielded when the capacitance value of the touch screen node changes, and the abnormal node does not affect the touch screen, thereby improving the fault tolerance of the touch screen.
  • the capacitance change value of the abnormal node is corrected, and the capacitance change value of the abnormal node is set as the mean value of the capacitance change value of the node other than the abnormal node in the touch area, so that the abnormality The node does not affect the user's use of the touch screen terminal, improving the user experience.
  • FIG. 1 is a schematic flowchart of a method for improving fault tolerance of a touch screen according to Embodiment 1 of the present invention
  • FIG. 2 is a schematic diagram of distribution of abnormal nodes according to Embodiment 1 of the present invention.
  • FIG. 3 is a schematic flowchart of a method for determining an abnormal node according to Embodiment 2 of the present invention.
  • FIG. 4 is a schematic structural diagram of a touch screen terminal according to Embodiment 3 of the present invention.
  • FIG. 5 is a schematic structural diagram of a touch screen terminal according to Embodiment 4 of the present invention.
  • the embodiment of the invention provides a method for improving the fault tolerance of the touch screen. As shown in FIG. 1 , the method includes the following steps:
  • the node may be a bonding pad on the touch screen terminal, the bonding pad is an electrical signal pad bonded to the touch screen, and is additionally pressure bonded to the electrical signal pad on the flexible circuit board (FPC).
  • the bonding pad is an electrical signal pad bonded to the touch screen, and is additionally pressure bonded to the electrical signal pad on the flexible circuit board (FPC).
  • the capacitance value of the preset node is pre-stored in the memory of the touch screen terminal, and the touch screen terminal may set a corresponding preset capacitance value for each node when it leaves the factory, or may be according to the touch screen.
  • the preset capacitance value of each node is determined by the parameters set for each node when the terminal is shipped from the factory.
  • the preset capacitance value of each node may also change with the change of the environment, and the specific change may be adjusted according to the provisions of the prior art, which is not specifically limited in the embodiment of the present invention.
  • the detected capacitance value of the target node and the preset capacitance value of the target node satisfy a preset condition, where the preset condition may be: the detected capacitance value of the target node and the preset The capacitance value of the target node is different, or the detected capacitance value of the target node exceeds a preset percentage of the capacitance value of the target node.
  • determining the target node may be: detecting a capacitance value of each node, and determining that the node is the target node when the detected capacitance value of the node is different from the preset capacitance value of the node; or The node may be determined to be the target node when the detected capacitance value of the node and the preset capacitance value of the node exceed a preset percentage.
  • the N target nodes record the row and column values of the N target nodes.
  • nodes are ordered in the touch screen, and the so-called row and column values represent nodes in Which row is in the touch screen, the coordinates of the node can be determined according to the row and column values of the node.
  • the processor of the touch screen periodically detects the capacitance value of each node in the touch screen, and obtains the measured capacitance value of each node. Calculating a percentage value of the measured capacitance value of each node of the touch screen exceeding a corresponding preset capacitance value; determining a node whose percentage value is greater than a preset ratio as the abnormal node.
  • the preset capacitance value of the node A is 10 ⁇ F, and the preset ratio is 30%.
  • the capacitance value of the node A exceeds 30% of its preset capacitance value, the node A is determined to be an abnormal node, or when the node A is measured.
  • the capacitance value is greater than its preset capacitance value of 3 ⁇ F, it is determined that node A is an abnormal node, that is, when the measured capacitance value of node A is 13 ⁇ F, it is determined to be an abnormal node.
  • the processor of the touch screen needs to record the row and column values of the abnormal nodes, and also needs to ensure that when the capacitance value of each node in the touch screen is detected to determine the abnormal node, no touch operation occurs on the touch screen.
  • the abnormal node may be determined when the user does not touch, and may be a process of turning on the touch screen terminal, a process of restarting, or a process of lighting the touch screen through a lock screen button on the touch screen terminal.
  • the abnormal node is included in the N target nodes, discard the row and column values and the capacitance change value of the abnormal node.
  • the row and column values of the obtained target node are compared with the row and column values of the recorded abnormal node, and it is determined whether the target node includes the abnormal node.
  • the processor of the touch screen discards the coordinates of the abnormal node, and does not report the coordinates of the abnormal node to the application processor of the touch screen terminal.
  • the processor of the touch screen may still report the coordinates of the abnormal node to the application processor of the touch screen terminal, and the application processor of the touch screen terminal discards the coordinates of the abnormal node.
  • step 104 is performed after step 103, or step 104* is performed after step 103.
  • the method of the present invention further provides a method for improving the fault tolerance of the touch screen. As shown in FIG. 1 , the method includes steps 101-103 and step 104*. Among them, 101-103 is the same as steps 101-103 described above.
  • Step 104* is: if the abnormal node is included in the N target nodes, correcting a capacitance change value of the abnormal node; uploading a row and column value of the abnormal node and a corrected capacitance change value.
  • the capacitance change value of the abnormal node may be corrected. Specifically, it is determined whether the abnormal node is a node within a touch area. And if the abnormal node is a node in the touch area, determining an average value of a capacitance change value of a node other than the abnormal node in the touch area as a capacitance change value of the abnormal node.
  • the capacitance value of the node of the touch area changes, so it can be determined whether the capacitance value of the node adjacent to the abnormal node changes, thereby determining whether the abnormal node is a touch operation.
  • the corresponding area of the touch area is a touch operation.
  • determining whether the capacitance value of the adjacent node of the abnormal node changes if the capacitance value of at least one of the adjacent nodes of the abnormal node changes, determining that the abnormal node is a node in the touch area If the capacitance value of the adjacent node of the abnormal node does not change, it is determined that the abnormal node is not a node in the touch area.
  • the nodes in the touch screen terminal are all arranged in a matrix form, so the positions of the abnormal nodes on the touch screen are different, and the number of adjacent nodes is different.
  • the number of adjacent nodes is three.
  • the abnormal node may be determined as Touch the node corresponding to the operation.
  • the number of adjacent nodes is five.
  • the capacitance value of at least one of the five nodes changes, the abnormal node is determined to be a node corresponding to the touch operation. .
  • the neighboring nodes are eight. When the capacitance value of at least one of the eight nodes changes, it can be determined that the abnormal node corresponds to a touch operation. Node.
  • the touch The touch area can be an ellipse, and the nodes on the edge of the ellipse have the same radius of curvature, and their capacitance changes are approximately equal. Therefore, determining an average value of a capacitance change value of a node other than the abnormal node in the touch area as a capacitance change value of the abnormal node may be setting a capacitance change value of the abnormal node to an edge of the ellipse The average value of the capacitance change value of each node.
  • the processor of the touch screen acquires the rank value and the capacitance change value of the node in the touch area, calculates the coordinates of the touch point of the node to be reported according to the calculation formula of the center of gravity, and then touches the touch
  • the coordinates of the point are reported to the processor of the touch screen terminal.
  • the row and column values of the nodes in the touch area need to be converted into coordinates, and the coordinates of the touch points are calculated according to the coordinates and the center of gravity calculation formula of each node in the touch area. If there is an abnormal node, the coordinates of the finally calculated node to be reported are inaccurate.
  • the foregoing steps may be performed by a processor of the touch screen, or may be performed by a processor of the touch screen terminal, which is not limited herein.
  • the embodiment of the present invention only describes the processing manner of the node related to the embodiment of the present invention, that is, the processing manner of the abnormal node, and reports the coordinates of the node for the normal node or according to the prior art scheme.
  • the embodiment of the present invention is not specifically limited.
  • a method for improving fault tolerance of a touch screen detects a capacitance value of each node in the touch screen. Comparing the detected capacitance value of each node with a preset capacitance value of each of the nodes to determine N target nodes. Determining the row and column values of the N target nodes. Determining whether an abnormal node is included in the target node. If the abnormal node is included in the target node, discarding the row and column values and the capacitance change value of the abnormal node; or, if the abnormal node is included in the target node, correcting a capacitance change value of the abnormal node Uploading the rank and value of the abnormal node and the school The value of the capacitance change after the positive.
  • the abnormal node can be shielded when the capacitance value of the touch screen node changes, and the abnormal node does not affect the touch screen, thereby improving the fault tolerance of the touch screen.
  • the capacitance change value of the abnormal node is corrected, and the capacitance change value of the abnormal node is set as the mean value of the capacitance change value of the node other than the abnormal node in the touch area, so that the abnormality The node does not affect the user's use of the touch screen terminal, improving the user experience.
  • An embodiment of the present invention further provides a method for determining an abnormal node of a touch screen. As shown in FIG. 3, the method includes the following steps:
  • the abnormal node needs to be determined when the user does not touch, and may be a process of turning on the touch screen terminal, a process of restarting, or a process of lighting the touch screen through a lock screen button on the touch screen terminal.
  • the processor of the touch screen periodically detects the capacitance value of each node in the touch screen, and obtains the measured capacitance value of each node. Calculating a percentage value of the measured capacitance value of each node of the touch screen exceeding a corresponding preset capacitance value; determining a node whose percentage value is greater than a preset ratio as the abnormal node.
  • the preset capacitance value of the node A is 10 ⁇ F, and the preset ratio is 30%.
  • the capacitance value of the node A exceeds 30% of its preset capacitance value, the node A is determined to be an abnormal node, or when the node A is measured.
  • the capacitance value is greater than its preset capacitance value of 3 ⁇ F, it is determined that node A is an abnormal node, that is, when the measured capacitance value of node A is 13 ⁇ F, it is determined to be an abnormal node.
  • determining M abnormal nodes records the row and column values of the M abnormal nodes.
  • the nodes are arranged in an orderly manner in the touch screen.
  • the so-called row and column values represent which row and column of the node are in the touch screen, and the coordinates of the node can be determined according to the row and column values of the node.
  • the M when the M is greater than or equal to 2, it is determined whether the distance between any two of the abnormal nodes is less than or equal to a preset distance threshold.
  • prompt information is generated to prompt the user of the terminal to replace the touch screen.
  • the preset distance threshold may be 20 mm.
  • the method for determining a touch screen abnormal node detects a capacitance value of each node in the touch screen when a touch operation does not occur on the touch screen; and detects a capacitance value of each node detected The capacitance values of each of the nodes are compared to determine M abnormal nodes. In this way, an abnormal node in the touch screen can be determined, and then the user is prompted to replace the touch screen to prevent the abnormal node from affecting the user experience.
  • the embodiment of the present invention provides a touch screen terminal 30.
  • the terminal 30 includes an obtaining unit 301, a determining unit 302, a determining unit 303, and an executing unit 304.
  • the detecting unit 301 is configured to detect a capacitance value of each node in the touch screen.
  • a determining unit 302 configured to compare the detected capacitance value of each node with a preset capacitance value of each node to determine N target nodes; wherein, the N is greater than or equal to an integer of zero; The detected capacitance value of the target node and the preset capacitance value of the target node satisfy a preset condition.
  • the N target nodes record the row and column values of the N target nodes.
  • the nodes are arranged in an orderly manner in the touch screen.
  • the so-called row and column values represent which row and column of the node are in the touch screen, and the coordinates of the node can be determined according to the row and column values of the node.
  • the determining unit 303 is configured to determine whether an abnormal node is included in the N target nodes, and the abnormal node is the target node determined when a touch operation does not occur on the touch screen.
  • the executing unit 304 is configured to determine, by the determining unit, that the abnormal node is included in the N target nodes, and discard the row and column values and the capacitance change value of the abnormal node; or
  • the determining unit 303 determines that the abnormal node is included in the N target nodes Pointing, correcting a capacitance change value of the abnormal node; uploading a row and column value of the abnormal node and a corrected capacitance change value.
  • the performing unit 304 correcting the capacitance change value of the abnormal node specifically includes: determining whether the abnormal node is a node in a touch area; the touch area is an area on a touch screen where a touch operation occurs; And being a node in the touch area, determining an average value of capacitance change values of nodes other than the abnormal node in the touch area as a capacitance change value of the abnormal node.
  • the executing unit 304 is configured to determine whether the abnormal node is a node in the touch area, and the executing unit 304 is configured to:
  • the capacitance value of at least one of the adjacent nodes changes, it is determined that the abnormal node is a node in the touch area.
  • the detecting unit 301 is further configured to detect a capacitance value of each node in the touch screen when a touch operation does not occur on the touch screen.
  • the determining unit 302 is configured to compare the detected capacitance value of each node with a preset capacitance value of each node to determine M abnormal nodes; wherein the M is an integer greater than or equal to zero.
  • determining M abnormal nodes records the row and column values of the M abnormal nodes.
  • the touch screen terminal 30 also includes a generating unit.
  • the generating unit is configured to generate prompt information when the determining unit 303 determines that the distance between any two of the abnormal nodes is less than or equal to the preset distance threshold, and prompt the user of the terminal to replace the touch screen.
  • the preset distance threshold may be 20 mm.
  • the touch screen terminal detects the capacitance value of each node in the touch screen. Comparing the detected capacitance value of each node with a preset capacitance value of each of the nodes to determine N target nodes. Determining the N target nodes Row and column values. Determining whether an abnormal node is included in the target node. If the abnormal node is included in the target node, discarding the row and column values and the capacitance change value of the abnormal node; or, if the abnormal node is included in the target node, correcting a capacitance change value of the abnormal node Uploading the row and column values of the abnormal node and the corrected capacitance change value.
  • the abnormal node can be shielded when the capacitance value of the touch screen node changes, and the abnormal node does not affect the touch screen, thereby improving the fault tolerance of the touch screen.
  • the capacitance change value of the abnormal node is corrected, and the capacitance change value of the abnormal node is set as the mean value of the capacitance change value of the node other than the abnormal node in the touch area, so that the abnormality The node does not affect the user's use of the touch screen terminal, improving the user experience.
  • the embodiment of the present invention provides a touch screen terminal 40.
  • the touch screen terminal 40 includes a processor 401 and a memory 402.
  • the processor 401 may be a processor (CPU) of the touch screen of the touch screen terminal 40, or the touch screen may be a processor of the touch screen terminal 40, by running or executing software programs and/or modules stored in the memory 402, and The data stored in the memory 402 is called to perform various functions and processing data of the touch screen terminal 40.
  • the processor 401 may include one or more processing units; preferably, the processor 401 may integrate an application processor and a modem processor, where the application processor mainly processes an operating system, a user interface, an application, and the like.
  • the modem processor primarily handles wireless communications. It can be understood that the above modem processor may not be integrated into the processor 401.
  • the memory 402 can be used to store software programs and modules, and the processor 401 executes various functional applications and data processing of the touch screen terminal 40 by running software programs and modules stored in the memory 402.
  • the memory 402 can mainly include a storage program area and a storage data area.
  • memory 402 can include high speed random access memory, and can also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid state storage device.
  • the processor 401 is configured to detect a capacitance value of each node in the touch screen; and input the detected capacitance value of each node and a preset capacitance value of each node
  • the row comparison determines N target nodes; wherein, the N is greater than or equal to an integer of zero; the detected capacitance value of the target node and the preset capacitance value of the target node satisfy a preset condition; Whether the abnormal node is included in the N target nodes; the abnormal node is the target node determined when no touch operation occurs on the touch screen; determining the abnormal node in the N target nodes, discarding the a row and column value and a capacitance change value of the abnormal node; or, if the abnormal node is included in the N target nodes, correcting a capacitance change value of the abnormal node; uploading a row and column value of the abnormal node and a corrected capacitance Change value.
  • the N target nodes record the row and column values of the N target nodes.
  • the nodes are arranged in an orderly manner in the touch screen.
  • the so-called row and column values represent which row and column of the node are in the touch screen, and the coordinates of the node can be determined according to the row and column values of the node.
  • the processor 401 is further configured to correct a capacitance change value of the abnormal node, where the processor 401 is further configured to determine whether the abnormal node is a node in a touch area; Determining an area where a touch operation occurs on the touch screen; if the abnormal node is a node in the touch area, determining an average value of a capacitance change value of a node other than the abnormal node in the touch area as the abnormal node The value of the capacitance change.
  • the processor 401 is configured to determine whether the abnormal node is a node in a touch area, and the processor 401 is configured to:
  • the processor 401 is further configured to detect a capacitance value of each node in the touch screen when a touch operation does not occur on the touch screen; and detect the detected capacitance value of each node and each of the preset The capacitance values of the nodes are compared to determine M abnormal nodes; wherein the M is an integer greater than or equal to zero.
  • determining M abnormal nodes records the row and column values of the M abnormal nodes.
  • the processor 401 is configured to determine any two when the M is greater than or equal to 2. Whether the distance between the abnormal nodes is less than or equal to a preset distance threshold; when it is determined that the distance between any two of the abnormal nodes is less than or equal to the preset distance threshold, generating prompt information to prompt the user of the terminal Replace the touch screen.
  • the touch screen terminal detects the capacitance value of each node in the touch screen. Comparing the detected capacitance value of each node with a preset capacitance value of each of the nodes to determine N target nodes. Determining the row and column values of the N target nodes. Determining whether an abnormal node is included in the target node. If the abnormal node is included in the target node, discarding the row and column values and the capacitance change value of the abnormal node; or, if the abnormal node is included in the target node, correcting a capacitance change value of the abnormal node Uploading the row and column values of the abnormal node and the corrected capacitance change value.
  • the abnormal node can be shielded when the capacitance value of the touch screen node changes, and the abnormal node does not affect the touch screen, thereby improving the fault tolerance of the touch screen.
  • the capacitance change value of the abnormal node is corrected, and the capacitance change value of the abnormal node is set as the mean value of the capacitance change value of the node other than the abnormal node in the touch area, so that the abnormality The node does not affect the user's use of the touch screen terminal, improving the user experience.

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  • Theoretical Computer Science (AREA)
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Abstract

一种提高触摸屏容错性的方法以及触屏终端，涉及触控显示技术领域，用于提高触摸屏的容错性。该方法能够确定异常节点，并屏蔽异常节点，提高触摸屏的容错性。包括：检测所述触摸屏内的每个节点的电容值（101）；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点，其中，所述N大于等于零的整数，所述目标点为电容值存在变化的节点（102）；判断所述N个目标节点中是否包括异常节点，所述异常节点为在所述触摸屏上未发生触摸操作时获得的确定的所述目标节点（103）；若所述N个目标节点中包括异常节点，则丢弃所述异常节点的行列值和电容变化值（104）；或者，若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值，上传所述异常节点的行列值和校正后的电容变化值（104*）。

Description

一种提高触摸屏容错性的方法及触屏终端 技术领域
本发明涉及触控显示技术领域，尤其涉及一种提高触摸屏容错性的方法及触屏终端。
背景技术
多点触控电容式触摸屏包括On Cell式触摸屏和In Cell式触摸屏，二者用于实现触控的节点可以是Bonding Pad(焊垫结构)。其中，On Cell式屏采用的节点的数量很多，如：7寸分辨率为600*1024的液晶显示器(Liquid Crystal Display，LCD)，就需要15*26个节点，即390个。由于工艺复杂，节点数量越多，就越容易出现异常节点，如：节点接触不良，导致该节点的阻抗变大，进而该节点的电容无法充满，使得该节点的电容值反复波动。
通常，触屏终端的触摸屏对触摸屏内的各个节点进行电容值检测，当触摸屏接收到用户的触摸操作时，触摸区域覆盖范围内对应的节点的电容值就会发生变化，当电容值变化值超过阈值时，触摸屏就会向该触屏终端的应用处理器上报该节点，进而应用处理器根据该节点的坐标和上报时间等确定触摸操作，最后，该触屏终端执行该触摸操作对应的功能，如：屏幕解锁等。
由于异常节点的电容值反复波动，触摸屏就会检测到异常节点的电容值变化超过阈值，进而向应用处理器上报该节点。实际上，并触摸屏并未接收到触摸操作，而是由于异常节点的电容值自发变化，因此，存在触摸屏的容错能力较低的问题。
发明内容
本发明的实施例提供一种提高触摸屏容错性的方法及触屏终端，提高触摸屏的容错能力。
为达到上述目的，本发明的实施例采用如下技术方案：
第一方面，公开了一种提高触摸屏容错性的方法，包括：
检测所述触摸屏内的每个节点的电容值；
将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件；
判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点；
若所述N个目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值；或者，
若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
结合第一方面，在第一方面的第一种可能的实现方式中，所述校正所述异常节点的电容变化值，具体包括：
判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；
若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
结合第一方面的第一种可能的实现方式，在第一方面的第二种可能的实现方式中，所述判断所述异常节点是否为触摸区域内的节点具体包括：
判断所述异常节点的相邻节点的电容值是否发生变化；
若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
第二方面，公开了一种确定触摸屏异常节点的方法，包括：
在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；
将检测到的所述每个节点的电容值与预设的所述每个节点的电 容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
结合第二方面，在第二方面的第一种可能的实现方式中，
当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值；
若任意两个所述异常节点之间的距离小于或等于所述预设距离阈值，则生成提示信息，提示终端的使用者更换所述触摸屏。
第三方面，公开了一种触屏终端，所述触屏终端包括触摸屏，包括：
检测单元，用于检测所述触摸屏内的每个节点的电容值；
确定单元用于，用于将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件；
判断单元，用于判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点；
执行单元，用于在所述判断单元判断所述N个目标节点中包括所述异常节点，丢弃所述异常节点的行列值和电容变化值；或者，
在所述判断单元判断所述N个目标节点中包括所述异常节点，校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
结合第三方面，在第三方面的第一种可能的实现方式中，所述执行单元用于，校正所述异常节点的电容变化值，具体为，所述执行单元用于，判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；
若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
结合第三方面的第一种可能的实现方式，在第三方面的第二种可能的实现方式中，所述执行单元用于，判断所述异常节点是否为触摸区域内的节点，具体为，所述执行单元用于：
判断所述异常节点的相邻节点的电容值是否发生变化；
若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
结合第三方面，在第三方面的第三种可能的实现方式中，还包括保存单元，
所述检测单元还用于，在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；
所述确定单元用于，将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
结合第三方面的第三种可能的实现方式，在第三方面的第四种可能的实现方式中，还包括判断单元、生成单元，
所述判断单元用于，当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值；
所述生成单元用于，在所述判断单元判断任意两个所述异常节点之间的距离小于或等于所述预设距离阈值时，生成提示信息，提示终端的使用者更换所述触摸屏。
第四方面，公开了一种触屏终端，包括：
处理器，用于检测所述触摸屏内的每个节点的电容值；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件；
所述处理器用于，判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点；若所述N个目标节点中包括所述异常节点，则丢弃所述异常 节点的行列值和电容变化值；或者，若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
结合第四方面，在第四方的第一种可能的实现方式中，所述处理器用于，校正所述异常节点的电容变化值具体为，所述处理器用于：
判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；
若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
结合第四方面的第一种可能的实现方式，在第四方面的第二种可能的实现方式中，所述处理器用于，判断所述异常节点的相邻节点的电容值是否发生变化具体为，所述处理器用于：
若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
结合第四方面，在第四方面的第三种可能的实现方式中，所述处理器还用于，在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
结合第四方面的第三种可能的实现方式，在第四方面的第四种可能的实现方式中，所述处理器还用于，当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值；若判断任意两个所述异常节点之间的距离小于或等于所述预设距离阈值时，则生成提示信息，提示终端的使用者更换所述触摸屏
本发明实施例提供的提高触摸屏容错性的方法及触屏终端，检测所述触摸屏内的每个节点的电容值。将检测到的所述每个节点的 电容值与预设的所述每个节点的电容值进行比较确定N个目标节点。确定所述N个目标节点的行列值。判断所述目标节点中是否包括异常节点。若所述N个目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值；或者，若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。这样，可以在触摸屏节点的电容值发生变化时将异常节点屏蔽，异常节点就不会对触摸屏产生影响，提高了触摸屏的容错能力。或者，在异常节点为触摸区域内的节点时，对异常节点的电容变化值进行校正，将异常节点的电容变化值设置为触摸区域内除异常节点外的节点的电容变化值的均值，使得异常节点不会影响用户使用触屏终端，提高用户体验。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为本发明实施例1提供的提高触摸屏容错性的方法的流程示意图；
图2为本发明实施例1提供的异常节点的分布示意图；
图3为本发明实施例2提供的确定异常节点的方法的流程示意图；
图4为本发明实施例3提供的触屏终端的结构示意图；
图5为本发明实施例4提供的触屏终端的结构示意图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他 实施例，都属于本发明保护的范围。
实施例1：
本发明实施例提供一种提高触摸屏容错性的方法，如图1所示，所述方法包括以下步骤：
101、检测所述触摸屏内的每个节点的电容值。
其中，所述节点可以是触屏终端上的bonding pad，所谓bonding pad即与触摸屏粘接的电信号焊盘，另外还与柔性电路板(FPC)上的电信号焊盘压粘合在一起。
102、将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件。
其中，所述预设的节点的电容值是触屏终端预先存储在自身的存储器中的，可以是触屏终端出厂时为每个节点设置了对应的预设电容值，也可以是根据触屏终端出厂时为每个节点设置的参数确定每个节点的预设电容值。另外，每个节点的预设电容值也可能随着环境等的变化会有所变化,具体如何变化可以根据现有技术的规定进行调整，本发明实施例不做具体限定。
所述所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件，这里的预设条件可以是：目标节点的检测到的电容值与预设的所述目标节点的电容值不同，或目标节点的检测到的电容值超过预设的所述目标节点的电容值预设百分比。
具体地，确定目标节点可以是：对每个节点的电容值进行检测，当检测到的节点的电容值与该节点预设的电容值不相同，则确定该节点为所述目标节点；或者，可以当检测到的节点的电容值与该节点预设的电容值的变化超过预设的百分比，则确定该节点为所述目标节点。
具体实现中，确定N个目标节点即记录了N个目标节点的行列值。通常，节点在触摸屏内是有序排列的，所谓行列值代表节点在 触摸屏内处于哪行哪列，根据节点的行列值可以确定出节点的坐标。
103、判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点。
具体实现中，可以是触摸屏的处理器定期对触摸屏内的每个节点的电容值进行检测，获取每个节点的实测电容值。计算所述触摸屏的每个节点的实测电容值超过对应的预设电容值的百分比值；将百分比值大于预设比例的节点确定为所述异常节点。示例的，节点A的预设电容值为10μF，预设比例为30％，则当节点A的实测电容值超过其预设电容值30％时确定节点A为异常节点，或当节点A的实测电容值大于其预设电容值3μF时确定节点A为异常节点，即节点A的实测电容值为13μF时就确定其为异常节点。
另外，触摸屏的处理器需要记录异常节点的行列值，还需要确保对触摸屏内的每个节点的电容值进行检测确定异常节点时，触摸屏上未发生触摸操作。如：在用户一定不会触控时确定异常节点，可以是触屏终端开机的过程，重启的过程，或者通过触屏终端上的锁屏按键点亮触摸屏的过程。
104、若所述N个目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值。
将获取到的目标节点的行列值与记录的异常节点的行列值一一进行比对，判断所述目标节点中是否包括异常节点。
具体实现中，可以是触摸屏的处理器丢弃所述异常节点的坐标，不向触屏终端的应用处理器上报异常节点的坐标。也可以是触摸屏的处理器依旧向触屏终端的应用处理器上报异常节点的坐标，由触屏终端的应用处理器丢弃异常节点的坐标。
需要说明的是，在步骤103之后进行步骤104，或在步骤103之后进行步骤104*。步骤104、104*是并列的方案，即：本发明实施例还提供一种提高触摸屏容错性的方法，如图1所示，所述方法包括：步骤101-103、以及步骤104*。其中，101-103与上述步骤101-103相同。
步骤104*为：若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
具体实现中，为了使得异常节点不影响用户体验，还可以在所述电容值发生变化的节点中包括所述异常节点时，校正所述异常节点的电容变化值。具体地，判断所述异常节点是否为触摸区域内的节点。若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
通常，当手指(或指点物)触摸屏幕时，触摸区域的节点的电容值会发生变化，因此可以判断异常节点相邻的节点的电容值是否发生变化，进而判断所述异常节点是否为触摸操作的触摸区域对应的节点。
具体地，判断所述异常节点的相邻节点的电容值是否发生变化；所述异常节点的相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为触摸区域内的节点；若所述异常节点的相邻节点的电容值未发生变化，则判断所述异常节点不是触摸区域内的节点。
需要说明的是，触屏终端内的节点都是以矩阵形式排列的，因此所述异常节点在触摸屏上的位置不同，其相邻节点的数目是不同的。如图2所示，若所述异常节点处于触摸屏的四角之一，则其相邻节点为3个，当这三个节点中的至少一个的电容值发生变化，就可以确定所述异常节点为触摸操作对应的节点。另外，若所述异常节点处于触摸屏的一个边缘，则其相邻节点为5个，当这5个节点中的至少一个的电容值发生变化，就可以确定所述异常节点为触摸操作对应的节点。若所述异常节点处于触摸屏中除四角、四边之外，则其相邻节点为8个，当这8个节点中的至少一个的电容值发生变化，就可以确定所述异常节点为触摸操作对应的节点。
具体实现中，由于手指类似椭圆，因此在手指触摸屏幕时，触 摸区域可以是一个椭圆，在该椭圆的边缘上的各节点的曲率半径相同，它们的电容变化值大致相等。因此，将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值，可以是将异常节点的电容变化值置为该椭圆的边缘上的各节点的电容变化值的平均值。
通常，当触屏终端的触摸屏上发生触摸时，触摸屏的处理器则获取触摸区域内的节点的行列值和电容变化值，根据重心计算公式计算待上报节点触控点的坐标，再将触控点的坐标上报给触屏终端的处理器。具体地，需要将触摸区域内的节点的行列值转化为坐标，再根据触摸区域内的各个节点的坐标和重心计算公式计算触控点的坐标。若存在异常节点，就会导致最终计算的待上报节点的坐标不准确，因此将异常节点的电容变化值置为触摸区域除异常节点外的节点的电容变化值的均值，就不会影响触控点的坐标的准确性，上报给触屏终端的处理器一个较为精准的触控点，不会因为异常节点影响用户体验。
在本发明实施例提供的提高触摸屏容错性的方法中，上述步骤可以由触摸屏的处理器来执行，也可以由触屏终端的处理器来执行，在此不做限定。
另外，需要说明的是，本发明实施例仅仅说明了与本发明实施例相关的节点的处理方式，即异常节点的处理方式，对于正常节点还是按照现有技术的方案进行节点的坐标的上报和处理，本发明实施例不做具体限定。
本发明实施例提供的提高触摸屏容错性的方法，检测所述触摸屏内的每个节点的电容值。将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点。确定所述N个目标节点的行列值。判断所述目标节点中是否包括异常节点。若所述目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值；或者，若所述目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校 正后的电容变化值。这样，可以在触摸屏节点的电容值发生变化时将异常节点屏蔽，异常节点就不会对触摸屏产生影响，提高了触摸屏的容错能力。或者，在异常节点为触摸区域内的节点时，对异常节点的电容变化值进行校正，将异常节点的电容变化值设置为触摸区域内除异常节点外的节点的电容变化值的均值，使得异常节点不会影响用户使用触屏终端，提高用户体验。
实施例2：
本发明实施例还提供一种确定触摸屏异常节点的方法，如图3所示，所述方法包括以下步骤：
201、在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值。
具体实现中，需要在用户一定不会触控时确定异常节点，可以是触屏终端开机的过程，重启的过程，或者通过触屏终端上的锁屏按键点亮触摸屏的过程。
202、将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
具体实现中，可以是触摸屏的处理器定期对触摸屏内的每个节点的电容值进行检测，获取每个节点的实测电容值。计算所述触摸屏的每个节点的实测电容值超过对应的预设电容值的百分比值；将百分比值大于预设比例的节点确定为所述异常节点。示例的，节点A的预设电容值为10μF，预设比例为30％，则当节点A的实测电容值超过其预设电容值30％时确定节点A为异常节点，或当节点A的实测电容值大于其预设电容值3μF时确定节点A为异常节点，即节点A的实测电容值为13μF时就确定其为异常节点。
具体实现中，确定M个异常节点即记录了M个异常节点的行列值。通常，节点在触摸屏内是有序排列的，所谓行列值代表节点在触摸屏内处于哪行哪列，根据节点的行列值可以确定出节点的坐标。
在本发明的优选实施例中，当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值。
若任意两个所述异常节点之间的距离小于或等于所述预设距离阈值，则生成提示信息，提示终端的使用者更换所述触摸屏。
其中，所述预设距离阈值可以是20mm。
本发明实施例提供的确定触摸屏异常节点的方法，在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点。这样，可以确定出触摸屏内的异常节点，进而提示用户更换触摸屏，避免异常节点影响用户体验。
实施例3：
本发明实施例提供一种触屏终端30，如图4所示，所述终端30包括：获取单元301、确定单元302、判断单元303以及执行单元304。
检测单元301，用于检测所述触摸屏内的每个节点的电容值。
确定单元302，用于将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件。
具体实现中，确定N个目标节点即记录了N个目标节点的行列值。通常，节点在触摸屏内是有序排列的，所谓行列值代表节点在触摸屏内处于哪行哪列，根据节点的行列值可以确定出节点的坐标。
判断单元303，用于判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点。
执行单元304，用于在所述判断单元判断所述N个目标节点中包括所述异常节点，丢弃所述异常节点的行列值和电容变化值；或者，
在所述判断单元303判断所述N个目标节点中包括所述异常节 点，校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
所述执行单元304校正所述异常节点的电容变化值具体包括，判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
所述执行单元304，用于判断所述异常节点是否为触摸区域内的节点具体为，所述执行单元304，用于：
判断所述异常节点的相邻节点的电容值是否发生变化；
若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
另外，所述检测单元301还用于，在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值。
确定单元302用于，将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
具体实现中，确定M个异常节点即记录了M个异常节点的行列值。
所述触屏终端30还包括生成单元。
所述判断单元303用于，当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值；
所述生成单元用于，在所述判断单元303判断任意两个所述异常节点之间的距离小于或等于所述预设距离阈值时，生成提示信息，提示终端的使用者更换所述触摸屏。
其中，所述预设距离阈值可以是20mm。
本发明实施例提供的触屏终端，检测所述触摸屏内的每个节点的电容值。将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点。确定所述N个目标节点的 行列值。判断所述目标节点中是否包括异常节点。若所述目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值；或者，若所述目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。这样，可以在触摸屏节点的电容值发生变化时将异常节点屏蔽，异常节点就不会对触摸屏产生影响，提高了触摸屏的容错能力。或者，在异常节点为触摸区域内的节点时，对异常节点的电容变化值进行校正，将异常节点的电容变化值设置为触摸区域内除异常节点外的节点的电容变化值的均值，使得异常节点不会影响用户使用触屏终端，提高用户体验。
实施例3：
本发明实施例提供一种触屏终端40，如图5所示，所述触屏终端40包括：处理器401以及存储器402。
处理器401可以是触屏终端40的触摸屏的处理器(CPU)，也可以是触屏是触屏终端40的处理器，通过运行或执行存储在存储器402内的软件程序和/或模块，以及调用存储在存储器402内的数据，执行触屏终端40的各种功能和处理数据。可选的，处理器401可包括一个或多个处理单元；优选的，处理器401可集成应用处理器和调制解调处理器，其中，应用处理器主要处理操作系统、用户界面和应用程序等，调制解调处理器主要处理无线通信。可以理解的是，上述调制解调处理器也可以不集成到处理器401中。
存储器402可用于存储软件程序以及模块，处理器401通过运行存储在存储器402的软件程序以及模块，从而执行触屏终端40的各种功能应用以及数据处理。存储器402可主要包括存储程序区和存储数据区。此外，存储器402可以包括高速随机存取存储器，还可以包括非易失性存储器，例如至少一个磁盘存储器件、闪存器件、或其他易失性固态存储器件。
处理器401，用于检测所述触摸屏内的每个节点的电容值；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进 行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件；用于判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点；在判断所述N个目标节点中包括所述异常节点，丢弃所述异常节点的行列值和电容变化值；或者，若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
具体实现中，确定N个目标节点即记录了N个目标节点的行列值。通常，节点在触摸屏内是有序排列的，所谓行列值代表节点在触摸屏内处于哪行哪列，根据节点的行列值可以确定出节点的坐标。
所述处理器401，还用于校正所述异常节点的电容变化值，具体为，所述处理器401，还用于判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
所述处理器401，用于判断所述异常节点是否为触摸区域内的节点具体为，所述处理器401，用于：
判断所述异常节点的相邻节点的电容值是否发生变化；
若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
处理器401还用于，在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
具体实现中，确定M个异常节点即记录了M个异常节点的行列值。
处理器401用于，当所述M大于或者等于2时，判断任意两个 所述异常节点之间的距离是否小于或等于预设距离阈值；当判断任意两个所述异常节点之间的距离小于或等于所述预设距离阈值时，生成提示信息，提示终端的使用者更换所述触摸屏。
本发明实施例提供的触屏终端，检测所述触摸屏内的每个节点的电容值。将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点。确定所述N个目标节点的行列值。判断所述目标节点中是否包括异常节点。若所述目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值；或者，若所述目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。这样，可以在触摸屏节点的电容值发生变化时将异常节点屏蔽，异常节点就不会对触摸屏产生影响，提高了触摸屏的容错能力。或者，在异常节点为触摸区域内的节点时，对异常节点的电容变化值进行校正，将异常节点的电容变化值设置为触摸区域内除异常节点外的节点的电容变化值的均值，使得异常节点不会影响用户使用触屏终端，提高用户体验。
以上所述，仅为本发明的具体实施方式，但本发明的保护范围并不局限于此，任何熟悉本技术领域的技术人员在本发明揭露的技术范围内，可轻易想到变化或替换，都应涵盖在本发明的保护范围之内。因此，本发明的保护范围应所述以权利要求的保护范围为准。

Claims (15)

  1. 一种提高触摸屏容错性的方法，其特征在于，包括：
    检测所述触摸屏内的每个节点的电容值；
    将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件；
    判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点；
    若所述N个目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值；或者，
    若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
  2. 根据权利要求1所述的方法，其特征在于，所述校正所述异常节点的电容变化值，具体包括：
    判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；
    若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
  3. 根据权利要求2所述的方法，其特征在于，所述判断所述异常节点是否为触摸区域内的节点具体包括：
    判断所述异常节点的相邻节点的电容值是否发生变化；
    若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
  4. 一种确定触摸屏异常节点的方法，其特征在于，包括：
    在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；
    将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
  5. 根据权利要求4所述的方法，其特征在于，
    当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值；
    若任意两个所述异常节点之间的距离小于或等于所述预设距离阈值，则生成提示信息，提示终端的使用者更换所述触摸屏。
  6. 一种触屏终端，所述触屏终端包括触摸屏，其特征在于，包括：
    检测单元，用于检测所述触摸屏内的每个节点的电容值；
    确定单元用于，用于将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件；
    判断单元，用于判断所述N个目标节点中是否包括异常节点；所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点；
    执行单元，用于在所述判断单元判断所述N个目标节点中包括所述异常节点，丢弃所述异常节点的行列值和电容变化值；或者，
    在所述判断单元判断所述N个目标节点中包括所述异常节点，校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
  7. 根据权利要求6所述的触屏终端，其特征在于，所述执行单元用于，校正所述异常节点的电容变化值具体为，所述执行单元用于：
    判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；
    若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点 的电容变化值。
  8. 根据权利要求7所述的触屏终端，其特征在于，所述执行单元用于，判断所述异常节点是否为触摸区域内的节点具体为，所述执行单元用于：
    判断所述异常节点的相邻节点的电容值是否发生变化；
    若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
  9. 根据权利要求6所述的触屏终端，其特征在于，还包括保存单元：
    所述检测单元还用于，在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；
    所述确定单元用于，将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
  10. 根据权利要求9所述的触屏终端，其特征在于，还包括判断单元、生成单元，
    所述判断单元用于，当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值；
    所述生成单元用于，在所述判断单元判断任意两个所述异常节点之间的距离小于或等于所述预设距离阈值时，生成提示信息，提示终端的使用者更换所述触摸屏。
  11. 一种触屏终端，所述触屏终端包括触摸屏，其特征在于，包括：
    处理器，用于检测所述触摸屏内的每个节点的电容值；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定N个目标节点；其中，所述N大于或等于零的整数；所述目标节点的检测到的电容值与预设的所述目标节点的电容值满足预设条件；
    所述处理器用于，判断所述N个目标节点中是否包括异常节点； 所述异常节点为在所述触摸屏上未发生触摸操作时确定的所述目标节点；若所述N个目标节点中包括所述异常节点，则丢弃所述异常节点的行列值和电容变化值；或者，若所述N个目标节点中包括所述异常节点，则校正所述异常节点的电容变化值；上传所述异常节点的行列值和校正后的电容变化值。
  12. 根据权利要求11所述的触屏终端，其特征在于，所述处理器用于，校正所述异常节点的电容变化值具体为，所述处理器用于：
    判断所述异常节点是否为触摸区域内的节点；所述触摸区域为所述触摸屏上发生触摸操作的区域；
    若所述异常节点是所述触摸区域内的节点，则将所述触摸区域内除所述异常节点外的节点的电容变化值的均值确定为所述异常节点的电容变化值。
  13. 根据权利要求12所述的触屏终端，其特征在于，所述处理器用于，判断所述异常节点是否为触摸区域内的节点具体为，所述处理器用于：
    判断所述异常节点的相邻节点的电容值是否发生变化；
    若所述相邻节点中的至少一个节点的电容值发生变化，则判断所述异常节点为所述触摸区域内的节点。
  14. 根据权利要求11所述的触屏终端，其特征在于，所述处理器还用于，在所述触摸屏上未发生触摸操作时检测所述触摸屏内的每个节点的电容值；将检测到的所述每个节点的电容值与预设的所述每个节点的电容值进行比较确定M个异常节点；其中，所述M为大于或等于零的整数。
  15. 根据权利要求14所述的触屏终端，其特征在于，所述处理器还用于，当所述M大于或者等于2时，判断任意两个所述异常节点之间的距离是否小于或等于预设距离阈值；若判断任意两个所述异常节点之间的距离小于或等于所述预设距离阈值，则生成提示信息，提示终端的使用者更换所述触摸屏。
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