WO2016197484A1 - 电压暂降监测节点的优化配置方法 - Google Patents

电压暂降监测节点的优化配置方法 Download PDF

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WO2016197484A1
WO2016197484A1 PCT/CN2015/090418 CN2015090418W WO2016197484A1 WO 2016197484 A1 WO2016197484 A1 WO 2016197484A1 CN 2015090418 W CN2015090418 W CN 2015090418W WO 2016197484 A1 WO2016197484 A1 WO 2016197484A1
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short
circuit fault
monitoring node
voltage
fault point
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French (fr)
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陈礼频
王海燕
任志超
曹开江
胥威汀
刘旭娜
马瑞光
汪伟
陈谦
张全明
杜新伟
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Economic and Technological Research Institute of State Grid Sichuan Electric Power Co Ltd
State Grid Corp of China SGCC
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Economic and Technological Research Institute of State Grid Sichuan Electric Power Co Ltd
State Grid Corp of China SGCC
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08Locating faults in cables, transmission lines, or networks

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  • the invention relates to the technical field of power distribution network planning, in particular to an optimized configuration method of a voltage sag monitoring node.
  • the voltage sag or falling refers to the phenomenon that the effective value of the power supply voltage suddenly drops and recovers in a short time. In the power grid, the duration of this phenomenon is mostly 0.5 seconds to 1.5 seconds.
  • the Institute of Electrical and Electronics Engineers defines voltage sag as the effective value of the supply voltage drops rapidly to 90% to 10% of the rated value and then rises back to the normal value; the International Electrotechnical Commission defines it as falling to the rated value of 90. % to 1% for a duration of 10 milliseconds to 1 minute. If the voltage sag is too long, it will cause the equipment to stop abnormally.
  • the optimal configuration method of voltage sag monitoring node is: from the perspective of constructing voltage sag monitoring network, based on system component parameters and network topology, combined with voltage sag generation mechanism and propagation mechanism, with minimum monitoring nodes A monitoring network covering the entire grid.
  • the monitoring reachable area (MRA) refers to the short-circuit fault occurrence area that can trigger the monitoring device to record the voltage sag event.
  • the optimal configuration method of the traditional voltage sag monitoring node is based on the MRA principle, and assumes that all voltage sags occur.
  • the fault resistance value of the short-circuit fault is 0, and the node voltage when the short-circuit fault occurs is compared with the set voltage threshold to construct a voltage sag observability matrix:
  • n is the number of short-circuit fault points set in the grid
  • b is the number of nodes that can be used as monitoring nodes.
  • the voltage amplitude of the corresponding monitoring node j occurs when the t-type short-circuit fault occurs, and the amplitude of the minimum one-phase voltage occurs when the asymmetric short-circuit fault occurs, and V th is a preset voltage threshold.
  • the voltage sag event can be recorded by the monitoring device.
  • the monitoring position decision power D must satisfy the following inequality constraints:
  • the above formula is the inequality constraint, and solving the 0-1 integer linear programming problem can be used to obtain the optimal configuration scheme of the monitoring node of the traditional method.
  • the optimal configuration method of the traditional voltage sag monitoring node can be summarized as shown in FIG. 1 to realize the MRA joint coverage of the entire power grid with a minimum of monitoring nodes, wherein M and N are monitoring nodes, f is a short circuit fault point, and A is a short circuit.
  • M and N are monitoring nodes
  • f is a short circuit fault point
  • A is a short circuit.
  • monitoring the dead zone occurs when the monitoring node is configured in the grid according to the existing method.
  • the problem to be solved by the present invention is that there is a problem of monitoring the blind zone in the existing optimal configuration method of the voltage sag monitoring node.
  • the present invention provides an optimal configuration method for a voltage sag monitoring node, including:
  • obtaining the critical fault resistance matrix based on the grid topology and system parameters includes:
  • the critical fault resistance matrix is constructed according to a critical fault resistance value of the short circuit fault point when a different type of short circuit fault occurs:
  • t is the type of short circuit fault
  • n is the number of set short circuit fault points
  • b is the number of nodes that can be used as monitoring nodes
  • the critical fault resistance matrix Any element The value is the critical fault resistance value of the corresponding monitoring node j when a t-type short-circuit fault occurs at the fault point i.
  • the mutual impedance between the short circuit fault point and the monitoring node is based on Obtained, wherein m is a monitoring node; Is the mutual impedance of each sequence between the short circuit fault point f and the monitoring node m; Is a sequence mutual impedance between the line node u and the monitoring node m; Is the mutual impedance of each sequence between the line node v and the monitoring node m.
  • the function of the voltage magnitude of each phase of the monitoring node m with respect to the fault resistance value at the short-circuit fault point f is:
  • V m, A is the amplitude of the phase A voltage of the monitoring node m
  • V m, B is the amplitude of the phase B voltage of the monitoring node m
  • V m, C is the phase C voltage of the monitoring node m
  • is a rotation factor e j120°
  • R x is the fault resistance value of the short-circuit fault point f.
  • the establishing an inequality constraint according to the fault resistance random distribution characteristic and the critical fault resistance matrix includes:
  • Critical fault resistance matrix Obtaining the voltage sag of the voltage dip caused by the short-circuit fault point i:
  • Is the critical fault resistance matrix of the decision scheme The maximum value of the element in the i-th row, The critical fault resistance matrix
  • R imin is the fault resistance minimum of the short-circuit fault point i
  • f(R ix ) is the probability density function of the fault resistance at the short-circuit fault point i
  • R ix is the short circuit Fault resistance value of fault point i;
  • is the threshold of the voltage sag apparent rate.
  • the objective function that targets the minimum number of monitoring nodes is:
  • the present invention has the following advantages:
  • the optimal configuration method of the voltage sag monitoring node provided by the invention is based on the critical fault resistance matrix, the inequality constraint of the optimal configuration model of the voltage sag monitoring node is established, and the key variable of the fault resistance of the short circuit fault point is introduced into the optimal configuration model of the monitoring node. In this way, the quantitative appropriation of the monitoring node configuration scheme under the non-zero condition of the fault resistance is quantitatively characterized, and the monitoring dead zone of the voltage sag is eliminated.
  • FIG. 1 is a schematic diagram of setting a monitoring node to monitor a voltage sag under ideal conditions by using an optimized configuration method of a conventional voltage sag monitoring node;
  • FIG. 2 is a schematic diagram of setting a monitoring node to monitor a voltage sag under actual conditions by using an optimized configuration method of a conventional voltage sag monitoring node;
  • FIG. 3 is a schematic flow chart of a method for optimally configuring a voltage sag monitoring node according to an embodiment of the present invention
  • FIG. 4 is a schematic structural view of a power grid according to an embodiment of the present invention.
  • the fault resistance is widely and objectively present, and its resistance value is affected by factors such as short-circuit medium type, phase-to-phase distance, and earth conductivity, and often exhibits strong random uncertainty characteristics.
  • the assumption that the optimal configuration of the monitoring node based on the MRA principle is that the fault resistance value of the short circuit fault point must be zero.
  • the fault resistance value has a significant influence on the voltage sag amplitude of the short-circuit fault point.
  • the larger the fault resistance value the smaller the MRA range corresponding to each monitoring node. If the monitoring node is configured on the whole network based on the optimal configuration method of the traditional voltage sag monitoring node, when the non-metallic short circuit fault occurs in the power grid, the MRA range of the monitoring node M and the monitoring node N in FIG. 1 is correspondingly reduced, and a picture will appear. Monitoring blind area shown in 2.
  • the voltage at the adjacent node A of the short-circuit fault point f is lower than the voltage threshold due to the existence of the fault resistance Rf, but the monitoring node M and the monitoring node N The voltage is still above the voltage threshold, so the monitoring device at the monitoring node M and the monitoring node N does not record a voltage sag event.
  • the optimal configuration method of the traditional voltage sag monitoring node does not introduce the critical variable of the fault resistance, which will lead to a large number of monitoring blind spots in the power grid, and ultimately affect the accuracy of the voltage sag monitoring and evaluation results of the whole network.
  • the invention provides an optimal configuration method of a voltage sag monitoring node. Based on a critical fault resistance matrix, an inequality constraint of a voltage sag monitoring node optimization configuration model is established, and a key variable of a fault resistance of a short circuit fault point is introduced to an optimal configuration of a monitoring node. In the model.
  • FIG. 3 is a schematic flowchart of an optimal configuration method of a voltage sag monitoring node according to an embodiment of the present invention, where the optimal configuration method of the voltage sag monitoring node includes:
  • Step S31 obtaining a critical fault resistance matrix based on the grid topology and system parameters
  • Step S32 establishing an inequality constraint according to the random distribution characteristic of the fault resistance and the critical fault resistance matrix
  • Step S33 obtaining an optimal monitoring node configuration scheme that satisfies the inequality constraint with a minimum number of monitoring nodes.
  • a critical fault resistance matrix is obtained based on the grid topology and system parameters as described in step S31.
  • FIG. 4 is a schematic structural diagram of a power grid according to an embodiment of the present invention, assuming that f is a short-circuit fault point on the line uv, l is a distance between the short-circuit fault point f and the line node u, and m is a monitoring node, and the short-circuit fault point f is Self-impedance is:
  • the mutual impedance between the short circuit fault point f and the monitoring node m is:
  • c 0, 1, 2, respectively represent zero sequence, positive sequence and negative sequence; Is the sequence self-impedance of the short circuit fault point f; Is the sequence self-impedance of the line node u; Is the sequence self-impedance of the line node v; Is the mutual impedance of each sequence between the line node u and the line node v; Is the sequence impedance of the line uv; Is the mutual impedance of each sequence between the short circuit fault point f and the monitoring node m; Is a sequence mutual impedance between the line node u and the monitoring node m; Is the mutual impedance of each sequence between the line node v and the monitoring node m.
  • V m A is the amplitude of the phase A voltage of the monitoring node m
  • V m B is the amplitude of the phase B voltage of the monitoring node m
  • V m C is the phase C voltage of the monitoring node m
  • the amplitude, R x is the fault resistance value of the short-circuit fault point f
  • is the rotation factor e j120° .
  • the critical fault resistance value of other short-circuit fault points in the power grid is obtained by the same method as obtaining the critical fault resistance value R x of the short-circuit fault point f.
  • the maximum value of the three-phase critical fault resistance value is taken as the critical fault resistance value of the fault of the short-circuit fault point.
  • the critical fault resistance matrix is constructed according to a critical fault resistance value of the short circuit fault point when a different type of short circuit fault occurs:
  • t is the short-circuit fault type, that is: A-phase ground short-circuit fault, B, C phase-to-phase short-circuit fault, B, C two-phase ground short-circuit fault, three-phase short-circuit fault
  • n is set The number of short-circuit fault points
  • b is the number of nodes that can be used as monitoring nodes.
  • Critical fault resistance matrix Any element The value is the critical fault resistance value of the corresponding monitoring node j when a t-type short-circuit fault occurs at the short-circuit fault point i.
  • step S32 an inequality constraint is established based on the fault resistance random distribution characteristic and the critical fault resistance matrix.
  • a b-dimensional monitoring position decision vector is defined:
  • the critical fault resistance matrix of the decision scheme corresponding to the decision vector D is:
  • I a critical fault resistance matrix of the decision scheme
  • the decision scheme has a critical fault resistance matrix
  • Any element Value d j is any element of the decision vector D.
  • the fault resistance value of the short-circuit fault point has a random uncertainty characteristic. If f(R ix ) is used, the probability density function of the fault resistance at the short-circuit fault point i is represented. Representing the critical fault resistance matrix The maximum value of the element in the i-th row, Representing the critical fault resistance matrix of the decision scheme The maximum value of the i-th row element, R imin represents the minimum value of the fault resistance of the short-circuit fault point i. Treating the fault resistance value R ix of the short-circuit fault point i as a variable according to the critical fault resistance matrix Critical fault resistance matrix Obtaining the voltage sag of the voltage dip caused by the short-circuit fault point i:
  • the decision Vector D corresponds to the probability that the monitoring point configuration scheme can record the voltage sag event.
  • the voltage sag apparent rate threshold ⁇ is set according to the actual demand, and the sag of the voltage sag is greater than that when the arbitrary short-circuit fault occurs at any short-circuit fault point of the whole network.
  • the voltage sag is a threshold value ⁇ , and for any short-circuit fault point i, the voltage sag is calculated according to the short-circuit fault point i Establish inequality constraints:
  • step S33 As described in step S33, with the minimum number of monitoring nodes as the target, an optimal monitoring node configuration scheme that satisfies the inequality constraint is obtained.
  • the objective function that targets the minimum number of monitoring nodes is:
  • the objective function and the inequality constraint form a 0-1 integer linear programming problem with nonlinear constraints.
  • the conventional genetic algorithm is used to solve the planning problem, and the optimal monitoring node configuration scheme can be obtained.
  • a person skilled in the art knows how to solve the 0-1 integer linear programming problem with nonlinear constraints formed by the objective function and the inequality constraint by using a genetic algorithm, and details are not described herein again.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
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Abstract

一种电压暂降监测节点的优化配置方法,包括:基于电网拓扑和系统参数获得临界故障电阻矩阵(S31);根据故障电阻随机分布特性和所述临界故障电阻矩阵建立不等式约束(S32);以监测节点数量最少为目标,获得满足所述不等式约束的最优监测节点配置方案(S33)。该电压暂降监测节点的优化配置方法,将短路故障点的故障电阻引入到监测节点优化配置模型中,消除了电压暂降的监测盲区。

Description

电压暂降监测节点的优化配置方法 技术领域
本发明涉及配电网络规划技术领域,特别涉及一种电压暂降监测节点的优化配置方法。
背景技术
电压暂降或下跌是指供电电压有效值在短时间内突然下降又回升恢复的现象。在电网中,这种现象的持续时间大多为0.5秒至1.5秒。国际电气与电子工程师协会将电压暂降定义为供电电压有效值快速下降到额定值的90%至10%,然后回升至正常值附近;而国际电工委员会则将其定义为下降到额定值的90%至1%,持续时间为10毫秒至1分钟。电压暂降的时间过长,会导致设备非正常停机。随着高新科技的不断发展,大量对电压暂降极为敏感的精密设备被广泛应用于各行各业,为人们生产生活带来了极大便利。与此同时,由电压暂降引起的经济损失和用户抱怨等问题也日益凸显。在电网中准确有效地监测电压暂降事件,是客观反应电力用户受电压暂降扰动程度以及合理制定电压暂降治理措施的必要前提。
考虑到成本约束,不可能在所有母线处安装电压暂降监测装置,由此诞生了针对电压暂降监测节点的优化配置方法。电压暂降监测节点的优化配置方法主要思路为:从构建电压暂降监测网络的角度出发,基于系统元件参数和网络拓扑结构,并结合电压暂降产生机理和传播机理,以最少的监测节点构建覆盖整个电网的监测网络。监测节点可观域(MRA,monitor reach area)是指能触发监测装置记录电压暂降事件的短路故障发生区域,传统电压暂降监测节点的优化配置方法基于MRA原理,并假设发生电压暂降时所有短路故障的故障电阻值均为0,将发生短路故障时的节点电压与设定的电压阈值进行比较,构建电压暂降可观性矩阵:
Figure PCTCN2015090418-appb-000001
其中,t为短路故障类型,n为电网中设定的短路故障点数量,b为可作为监测节点的节点数量。可观性矩阵Pt中任意元素
Figure PCTCN2015090418-appb-000002
取值为:
Figure PCTCN2015090418-appb-000003
其中,
Figure PCTCN2015090418-appb-000004
为短路故障点i发生t类短路故障时对应监测节点j的电压幅值,发生非对称性短路故障时取幅值最小一相电压,Vth为预先设定的电压阈值。
定义b维监测位置决策向量:
D=[d1d2…db],
监测位置决策向量D中任意元素dj取值为:
Figure PCTCN2015090418-appb-000005
为确保电网中任意位置发生短路故障时,电压暂降事件均能被监测装置记录,则对于可观性矩阵Pt中第i行元素,监测位置决策电量D均须满足以下不等式约束:
Figure PCTCN2015090418-appb-000006
以监测节点数量最少为目标,以上式为不等式约束,对该0-1整数线性规划问题进行求解,便能得出传统方法的监测节点优化配置方案。
传统电压暂降监测节点的优化配置方法可概括为如图1所示以最少的监测节点实现其MRA联合覆盖整个电网,其中,M、N为监测节点,f为短路故障点,A为与短路故障点f相邻的节点。然而,按现有方法在电网中配置监测节点,会出现监测盲区。
发明内容
本发明所要解决的是现有的电压暂降监测节点的优化配置方法存在监测盲区的问题。
为解决上述问题,本发明提供一种电压暂降监测节点的优化配置方法,包括:
基于电网拓扑和系统参数获得临界故障电阻矩阵;
根据故障电阻随机分布特性和所述临界故障电阻矩阵建立不等式约束;
以监测节点数量最少为目标,获得满足所述不等式约束的最优监测节点配置方案。
可选的,所述基于电网拓扑和系统参数获得临界故障电阻矩阵包括:
获得短路故障点的自阻抗以及短路故障点和监测节点之间的互阻抗;
根据所述短路故障点的自阻抗以及短路故障点和监测节点之间的互阻抗,获得发生不同类型短路故障时所述监测节点的各相电压幅值关于所述短路故障点处故障电阻值的函数;
以所述监测节点的各相电压幅值等于预设的电压阈值反解所述监测节点的各相电压幅值关于所述短路故障点处故障电阻值的函数,以获得发生不同类型短路故障时所述短路故障点的临界故障电阻值;
根据发生不同类型短路故障时所述短路故障点的临界故障电阻值构建所述临界故障电阻矩阵:
Figure PCTCN2015090418-appb-000007
其中,
Figure PCTCN2015090418-appb-000008
是所述临界故障电阻矩阵,t是短路故障类型,n是设定的短路故障点数量,b是可作为监测节点的节点数量,所述临界故障电阻矩阵
Figure PCTCN2015090418-appb-000009
中任意元素
Figure PCTCN2015090418-appb-000010
取值即为在故障点i处发生t类短路故障时对应监测节点j的临界故障电阻值。
可选的,所述短路故障点的自阻抗根据
Figure PCTCN2015090418-appb-000011
获得,其中,f是位于线路u-v之间短路故障点;c=0、1、2,分别表示零序、正序和负序;
Figure PCTCN2015090418-appb-000012
是所述短路故障点f的各序自阻抗;l是所述短路故障点f与线路节点u之间的距离;
Figure PCTCN2015090418-appb-000013
是线路节点 u的各序自阻抗;
Figure PCTCN2015090418-appb-000014
是线路节点v的各序自阻抗;
Figure PCTCN2015090418-appb-000015
是线路节点u与线路节点v之间的各序互阻抗;
Figure PCTCN2015090418-appb-000016
是线路u-v的各序阻抗。
可选的,所述短路故障点和监测节点之间的互阻抗根据
Figure PCTCN2015090418-appb-000017
获得,其中,m是监测节点;
Figure PCTCN2015090418-appb-000018
是所述短路故障点f和所述监测节点m之间的各序互阻抗;
Figure PCTCN2015090418-appb-000019
是所述线路节点u与所述监测节点m之间的各序互阻抗;
Figure PCTCN2015090418-appb-000020
是所述线路节点v与所述监测节点m之间的各序互阻抗。
可选的,发生A相接地短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000021
发生B、C相间短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000022
发生B、C两相接地短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000023
发生三相短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000024
其中,Vm,A是所述监测节点m的A相电压幅值,Vm,B是所述监测节点m的B相电压幅值,Vm,C是所述监测节点m的C相电压幅值,α是旋转因子ej120°,Rx是所述短路故障点f的故障电阻值。
可选的,所述根据故障电阻随机分布特性和所述临界故障电阻矩阵建立不等式约束包括:
建立与决策向量[d1d2…db]对应的决策方案临界故障电阻矩阵:
Figure PCTCN2015090418-appb-000025
其中,
Figure PCTCN2015090418-appb-000026
是所述决策方案临界故障电阻矩阵,所述决策方案临界故障电阻矩阵
Figure PCTCN2015090418-appb-000027
中任意元素
Figure PCTCN2015090418-appb-000028
取值为
Figure PCTCN2015090418-appb-000029
dj是所述决策向量[d1d2…db]中任意元素,
Figure PCTCN2015090418-appb-000030
根据所述临界故障电阻矩阵
Figure PCTCN2015090418-appb-000031
和所述决策方案临界故障电阻矩阵
Figure PCTCN2015090418-appb-000032
获得短路故障点i引起电压暂降的电压暂降可观率:
Figure PCTCN2015090418-appb-000033
其中,
Figure PCTCN2015090418-appb-000034
是所述短路故障点i引起电压暂降的电压暂降可观率,
Figure PCTCN2015090418-appb-000035
是所述决策方案临界故障电阻矩阵
Figure PCTCN2015090418-appb-000036
中第i行元素的最大值,
Figure PCTCN2015090418-appb-000037
是所述临界故障电阻矩阵
Figure PCTCN2015090418-appb-000038
中第i行元素的最大值,Rimin是所述短路故障点i的故障电阻最小值,f(Rix)是所述短路故障点i处故障电阻的概率密度函数,Rix是所述短路故障点i的故障电阻值;
根据所述短路故障点i对应的电压暂降可观率建立所述短路故障点i的不等式约束:
Figure PCTCN2015090418-appb-000039
其中,β是电压暂降可观率阈值。
可选的,所述以监测节点数量最少为目标的目标函数为:
Figure PCTCN2015090418-appb-000040
与现有技术相比,本发明具有以下优点:
本发明提供的电压暂降监测节点的优化配置方法,基于临界故障电阻矩阵,建立电压暂降监测节点优化配置模型不等式约束,将短路故障点的故障电阻这一关键变量引入到了监测节点优化配置模型中,由此定量刻画并提高了监测节点配置方案在故障电阻非零条件下的工程适用性,消除了电压暂降的监测盲区。
附图说明
图1是采用传统电压暂降监测节点的优化配置方法设置监测节点在理想情况下监测电压暂降的示意图;
图2是采用传统电压暂降监测节点的优化配置方法设置监测节点在实际情况下监测电压暂降的示意图;
图3是本发明实施方式的电压暂降监测节点的优化配置方法的流程示意图;
图4是本发明实施例的电网结构示意图。
具体实施方式
电网元件发生短路故障时,故障电阻广泛客观存在,且其电阻值受短路媒介类型、相间距离以及大地导电率等因素影响,常呈现出较强的随机不确定特性。由背景技术中描述的传统电压暂降监测节点的优化配置方法可知,基于MRA原理进行监测节点优化配置的假设前提是短路故障点的故障电阻值必须为零。
故障电阻值对短路故障点的电压暂降幅值影响显著,故障电阻值越大,各监测节点对应的MRA范围越小。若基于传统电压暂降监测节点的优化配置方法在全网配置监测节点,当电网中发生非金属性短路故障时,图1中监测节点M和监测节点N的MRA范围相应缩小,将会出现图2所示的监测盲区。在监测盲区中短路故障点f发生非金属性短路故障时,由于故障电阻Rf的存在,短路故障点f的相邻节点A处电压虽已低于电压阈值,但监测节点M和监测节点N处电压仍高于电压阈值,因而监测节点M和监测节点N处的监测装置不会记录电压暂降事件。
由此可见,传统电压暂降监测节点的优化配置方法由于未引入故障电阻这一关键变量,必将导致电网中出现大量监测盲区,最终影响全网电压暂降监测评估结果的准确性。本发明提供一种电压暂降监测节点的优化配置方法,基于临界故障电阻矩阵,建立电压暂降监测节点优化配置模型不等式约束,将短路故障点的故障电阻这一关键变量引入到了监测节点优化配置模型中。
图3是本发明实施方式的电压暂降监测节点的优化配置方法的流程示意图,所述电压暂降监测节点的优化配置方法包括:
步骤S31:基于电网拓扑和系统参数获得临界故障电阻矩阵;
步骤S32:根据故障电阻随机分布特性和所述临界故障电阻矩阵建立不等式约束;
步骤S33:以监测节点数量最少为目标,获得满足所述不等式约束的最优监测节点配置方案。
下面结合实施例及附图,对本发明作进一步地的详细说明,但本发明的实施方式不限于此。
如步骤S31所述,基于电网拓扑和系统参数获得临界故障电阻矩阵。
具体地,获得短路故障点的自阻抗以及短路故障点和监测节点之间的互阻抗。图4是本发明实施例的电网结构示意图,假设f是线路u-v上的短路故障点,l是短路故障点f与线路节点u之间距离,m是监测节点,则所述短路故障点f的自阻抗为:
Figure PCTCN2015090418-appb-000041
所述短路故障点f和监测节点m之间的互阻抗为:
Figure PCTCN2015090418-appb-000042
其中,c=0、1、2,分别表示零序、正序和负序;是所述短路故障点f的各序自阻抗;
Figure PCTCN2015090418-appb-000044
是线路节点u的各序自阻抗;
Figure PCTCN2015090418-appb-000045
是线路节点v的各序自阻抗;
Figure PCTCN2015090418-appb-000046
是线路节点u与线路节点v之间的各序互阻抗;
Figure PCTCN2015090418-appb-000047
是线路u-v的各序阻抗;
Figure PCTCN2015090418-appb-000048
是所述短路故障点f和所述监测节点m之间的各序互阻抗;
Figure PCTCN2015090418-appb-000049
是所述线路节点u与所述监测节点m之间的各序互阻抗;
Figure PCTCN2015090418-appb-000050
是所述线路节点v与所述监测节点m之间的各序互阻抗。
当所述短路故障点f处发生不同类型短路故障时,根据所述短路故障点f的自阻抗以及所述短路故障点f和监测节点m之间的互阻抗,获得发生不同类型短路故障时所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数。
发生A相接地短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000051
发生B、C相间短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000052
发生B、C两相接地短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000053
发生三相短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
Figure PCTCN2015090418-appb-000054
其中,Vm,A是所述监测节点m的A相电压幅值,Vm,B是所述监测节点m的B相 电压幅值,Vm,C是所述监测节点m的C相电压幅值,Rx是所述短路故障点f的故障电阻值,α是旋转因子ej120°
以所述监测节点m的各相电压幅值等于预设的电压阈值反解所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数,以获得发生不同类型短路故障时所述短路故障点f的临界故障电阻值Rx。需要说明的是,所述电压阈值根据实际需求进行设置,本发明实施例对此不作限定。
采用与获得所述短路故障点f的临界故障电阻值Rx相同的方法,获得电网中其他短路故障点的临界故障电阻值。对于非对称性短路故障,取三相临界故障电阻值中的最大值作为该短路故障点该类故障的临界故障电阻值。
根据发生不同类型短路故障时所述短路故障点的临界故障电阻值构建所述临界故障电阻矩阵:
Figure PCTCN2015090418-appb-000055
其中,
Figure PCTCN2015090418-appb-000056
是所述临界故障电阻矩阵;t是短路故障类型,即:A相接地短路故障,B、C相间短路故障,B、C两相接地短路故障,三相短路故障;n是设定的短路故障点数量;b是可作为监测节点的节点数量。所述临界故障电阻矩阵
Figure PCTCN2015090418-appb-000057
中任意元素
Figure PCTCN2015090418-appb-000058
取值即为在短路故障点i处发生t类短路故障时对应监测节点j的临界故障电阻值。
如步骤S32所述,根据故障电阻随机分布特性和所述临界故障电阻矩阵建立不等式约束。
具体地,与现有技术中相同,定义b维监测位置决策向量:
D=[d1d2…db]。
监测位置决策向量D中任意元素dj取值为:
Figure PCTCN2015090418-appb-000059
与决策向量D对应的决策方案临界故障电阻矩阵为:
Figure PCTCN2015090418-appb-000060
其中,
Figure PCTCN2015090418-appb-000061
是所述决策方案临界故障电阻矩阵,所述决策方案临界故障电阻矩阵
Figure PCTCN2015090418-appb-000062
中任意元素
Figure PCTCN2015090418-appb-000063
取值为
Figure PCTCN2015090418-appb-000064
dj是所述决策向量D中任意元素。
定义电压暂降可观率为:
Figure PCTCN2015090418-appb-000065
短路故障点的故障电阻值具有随机不确定特性,若用f(Rix)表示所述短路故障点i处故障电阻的概率密度函数,
Figure PCTCN2015090418-appb-000066
表示所述临界故障电阻矩阵
Figure PCTCN2015090418-appb-000067
中第i行元素的最大值,
Figure PCTCN2015090418-appb-000068
表示所述决策方案临界故障电阻矩阵
Figure PCTCN2015090418-appb-000069
中第i行元素的最大值,Rimin表示所述短路故障点i的故障电阻最小值。将所述短路故障点i的故障电阻值Rix看作变量,根据所述临界故障电阻矩阵
Figure PCTCN2015090418-appb-000070
和所述决策方案临界故障电阻矩阵
Figure PCTCN2015090418-appb-000071
获得短路故障点i引起电压暂降的电压暂降可观率:
Figure PCTCN2015090418-appb-000072
其中,
Figure PCTCN2015090418-appb-000073
是所述短路故障点i引起电压暂降的电压暂降可观率。
对于所述短路故障点i,当其故障电阻值大于所述临界故障电阻矩阵
Figure PCTCN2015090418-appb-000074
中第i行元素的最大值
Figure PCTCN2015090418-appb-000075
时,全网所有节点的电压值均大于电压阈值,即所述短路故障点i的电压暂降可观率刻画了所述短路故障点i处发生具有不同故障电阻 值的短路故障时,所述决策向量D对应监测点配置方案能记录到电压暂降事件的概率。
若用β表示电压暂降可观率阈值,所述电压暂降可观率阈值β根据实际需求进行设置,为保证全网任意短路故障点发生任意类型短路故障时的电压暂降可观率均大于所述电压暂降可观率阈值β,则对于任意短路故障点i,根据所述短路故障点i的电压暂降可观率
Figure PCTCN2015090418-appb-000076
建立不等式约束:
Figure PCTCN2015090418-appb-000077
如步骤S33所述,以监测节点数量最少为目标,获得满足所述不等式约束的最优监测节点配置方案。
为使监测节点数量最少,所述以监测节点数量最少为目标的目标函数为:
Figure PCTCN2015090418-appb-000078
所述目标函数和所述不等式约束构成一个具有非线性约束的0-1整数线性规划问题,采用常规遗传算法对该规划问题进行求解,即能得出最优监测节点配置方案。本领域技术人员知晓如何采用遗传算法对所述目标函数和所述不等式约束构成的具有非线性约束的0-1整数线性规划问题求解,在此不再赘述。
以上所述,仅是本发明的较佳实施例,并非对本发明做任何形式上的限制,凡是依据本发明的技术实质对以上实施例所作的任何简单修改、等同变化,均落入本发明的保护范围之内。

Claims (7)

  1. 一种电压暂降监测节点的优化配置方法,其特征在于,包括:
    基于电网拓扑和系统参数获得临界故障电阻矩阵;
    根据故障电阻随机分布特性和所述临界故障电阻矩阵建立不等式约束;
    以监测节点数量最少为目标,获得满足所述不等式约束的最优监测节点配置方案。
  2. 根据权利要求1所述的电压暂降监测节点的优化配置方法,其特征在于,所述基于电网拓扑和系统参数获得临界故障电阻矩阵包括:
    获得短路故障点的自阻抗以及短路故障点和监测节点之间的互阻抗;
    根据所述短路故障点的自阻抗以及短路故障点和监测节点之间的互阻抗,获得发生不同类型短路故障时所述监测节点的各相电压幅值关于所述短路故障点处故障电阻值的函数;
    以所述监测节点的各相电压幅值等于预设的电压阈值反解所述监测节点的各相电压幅值关于所述短路故障点处故障电阻值的函数,以获得发生不同类型短路故障时所述短路故障点的临界故障电阻值;
    根据发生不同类型短路故障时所述短路故障点的临界故障电阻值构建所述临界故障电阻矩阵:
    Figure PCTCN2015090418-appb-100001
    其中,
    Figure PCTCN2015090418-appb-100002
    是所述临界故障电阻矩阵,t是短路故障类型,n是设定的短路故障点数量,b是可作为监测节点的节点数量,所述临界故障电阻矩阵
    Figure PCTCN2015090418-appb-100003
    中任意元素
    Figure PCTCN2015090418-appb-100004
    取值即为在故障点i处发生t类短路故障时对应监测节点j的临界故障电阻值。
  3. 根据权利要求2所述的电压暂降监测节点的优化配置方法,其特征在于,所述短路故障点的自阻抗根据
    Figure PCTCN2015090418-appb-100005
    获得,其中,f是位于线路u-v之间短路故障点;c=0、1、2,分别表示零序、 正序和负序;
    Figure PCTCN2015090418-appb-100006
    是所述短路故障点f的各序自阻抗;l是所述短路故障点f与线路节点u之间的距离;
    Figure PCTCN2015090418-appb-100007
    是线路节点u的各序自阻抗;
    Figure PCTCN2015090418-appb-100008
    是线路节点v的各序自阻抗;
    Figure PCTCN2015090418-appb-100009
    是线路节点u与线路节点v之间的各序互阻抗;
    Figure PCTCN2015090418-appb-100010
    是线路u-v的各序阻抗。
  4. 根据权利要求3所述的电压暂降监测节点的优化配置方法,其特征在于,所述短路故障点和监测节点之间的互阻抗根据
    Figure PCTCN2015090418-appb-100011
    获得,其中,m是监测节点;
    Figure PCTCN2015090418-appb-100012
    是所述短路故障点f和所述监测节点m之间的各序互阻抗;
    Figure PCTCN2015090418-appb-100013
    是所述线路节点u与所述监测节点m之间的各序互阻抗;
    Figure PCTCN2015090418-appb-100014
    是所述线路节点v与所述监测节点m之间的各序互阻抗。
  5. 根据权利要求4所述的电压暂降监测节点的优化配置方法,其特征在于,发生A相接地短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
    Figure PCTCN2015090418-appb-100015
    发生B、C相间短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
    Figure PCTCN2015090418-appb-100016
    发生B、C两相接地短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
    Figure PCTCN2015090418-appb-100017
    发生三相短路故障时,所述监测节点m的各相电压幅值关于所述短路故障点f处故障电阻值的函数为:
    Figure PCTCN2015090418-appb-100018
    其中,Vm,A是所述监测节点m的A相电压幅值,Vm,B是所述监测节点m的B相电压幅值,Vm,C是所述监测节点m的C相电压幅值,α是旋转因子ej120°,Rx是所述短路故障点f的故障电阻值。
  6. 根据权利要求5所述的电压暂降监测节点的优化配置方法,其特征在于,所述根据故障电阻随机分布特性和所述临界故障电阻矩阵建立不等式约束包括:
    建立与决策向量[d1 d2 … db]对应的决策方案临界故障电阻矩阵:
    Figure PCTCN2015090418-appb-100019
    其中,
    Figure PCTCN2015090418-appb-100020
    是所述决策方案临界故障电阻矩阵,所述决策方案临界故障电阻矩阵
    Figure PCTCN2015090418-appb-100021
    中任意元素
    Figure PCTCN2015090418-appb-100022
    取值为
    Figure PCTCN2015090418-appb-100023
    dj是所述决策向量[d1 d2 … db]中任 意元素,
    Figure PCTCN2015090418-appb-100024
    根据所述临界故障电阻矩阵
    Figure PCTCN2015090418-appb-100025
    和所述决策方案临界故障电阻矩阵
    Figure PCTCN2015090418-appb-100026
    获得短路故障点i引起电压暂降的电压暂降可观率:
    Figure PCTCN2015090418-appb-100027
    其中,
    Figure PCTCN2015090418-appb-100028
    是所述短路故障点i引起电压暂降的电压暂降可观率,
    Figure PCTCN2015090418-appb-100029
    是所述决策方案临界故障电阻矩阵
    Figure PCTCN2015090418-appb-100030
    中第i行元素的最大值,
    Figure PCTCN2015090418-appb-100031
    是所述临界故障电阻矩阵
    Figure PCTCN2015090418-appb-100032
    中第i行元素的最大值,Rimin是所述短路故障点i的故障电阻最小值,f(Rix)是所述短路故障点i处故障电阻的概率密度函数,Rix是所述短路故障点i的故障电阻值;
    根据所述短路故障点i对应的电压暂降可观率建立所述短路故障点i的不等式约束:
    Figure PCTCN2015090418-appb-100033
    其中,β是电压暂降可观率阈值。
  7. 根据权利要求6所述的电压暂降监测节点的优化配置方法,其特征在于,所述以监测节点数量最少为目标的目标函数为:
    Figure PCTCN2015090418-appb-100034
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